TWI887455B - 從處理追蹤預測裝備故障模式 - Google Patents
從處理追蹤預測裝備故障模式 Download PDFInfo
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- TWI887455B TWI887455B TW110127131A TW110127131A TWI887455B TW I887455 B TWI887455 B TW I887455B TW 110127131 A TW110127131 A TW 110127131A TW 110127131 A TW110127131 A TW 110127131A TW I887455 B TWI887455 B TW I887455B
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
- G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
- G05B23/0278—Qualitative, e.g. if-then rules; Fuzzy logic; Lookup tables; Symptomatic search; FMEA
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0766—Error or fault reporting or storing
- G06F11/0778—Dumping, i.e. gathering error/state information after a fault for later diagnosis
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/079—Root cause analysis, i.e. error or fault diagnosis
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0793—Remedial or corrective actions
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
- G06F11/3452—Performance evaluation by statistical analysis
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
- G06F11/3466—Performance evaluation by tracing or monitoring
- G06F11/348—Circuit details, i.e. tracer hardware
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Biomedical Technology (AREA)
- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Mathematical Physics (AREA)
- Automation & Control Theory (AREA)
- Life Sciences & Earth Sciences (AREA)
- Probability & Statistics with Applications (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Biology (AREA)
- Fuzzy Systems (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- Testing And Monitoring For Control Systems (AREA)
- Debugging And Monitoring (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Computational Linguistics (AREA)
- Data Mining & Analysis (AREA)
- Databases & Information Systems (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202063055893P | 2020-07-23 | 2020-07-23 | |
| US63/055,893 | 2020-07-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202211341A TW202211341A (zh) | 2022-03-16 |
| TWI887455B true TWI887455B (zh) | 2025-06-21 |
Family
ID=79688227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110127131A TWI887455B (zh) | 2020-07-23 | 2021-07-23 | 從處理追蹤預測裝備故障模式 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11640328B2 (https=) |
| EP (1) | EP4162395A4 (https=) |
| JP (1) | JP7703011B2 (https=) |
| KR (1) | KR20230042041A (https=) |
| CN (1) | CN116113942A (https=) |
| TW (1) | TWI887455B (https=) |
| WO (1) | WO2022020642A1 (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11436072B2 (en) * | 2020-02-27 | 2022-09-06 | Hewlett Packard Enterprise Development Lp | System and method for collecting contextual log files from a computing system |
| CN114764550B (zh) * | 2021-01-12 | 2025-09-30 | 联华电子股份有限公司 | 失效检测与分类模型的运作方法与运作装置 |
| US12372952B2 (en) * | 2022-05-19 | 2025-07-29 | Applied Materials, Inc. | Guardbands in substrate processing systems |
| US12019507B2 (en) * | 2022-05-19 | 2024-06-25 | Applied Materials, Inc. | Guardbands in substrate processing systems |
| US12566660B2 (en) * | 2022-05-19 | 2026-03-03 | Applied Materials, Inc | Guardbands in substrate processing systems |
| US20240169215A1 (en) * | 2022-11-21 | 2024-05-23 | Disney Enterprises, Inc. | Machine Learning Model-Based Anomaly Prediction and Mitigation |
| KR20240083695A (ko) * | 2022-12-05 | 2024-06-12 | 세메스 주식회사 | 심층 학습 기반 분석 시스템 및 그의 동작 방법 |
| CN116629707B (zh) * | 2023-07-20 | 2023-10-20 | 合肥喆塔科技有限公司 | 基于分布式并行计算的fdc溯因分析方法及存储介质 |
| US20250157271A1 (en) * | 2023-11-14 | 2025-05-15 | Mercedes-Benz Group AG | Method, electronic device, and autonomous driving system for error event analysis |
Citations (6)
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| TW201732690A (zh) * | 2015-12-22 | 2017-09-16 | 應用材料以色列公司 | 半導體試樣的基於深度學習之檢查的方法及其系統 |
| US20180025483A1 (en) * | 2016-07-19 | 2018-01-25 | Globalfoundries Inc. | Methods of detecting faults in real-time for semiconductor wafers |
| TW201842457A (zh) * | 2017-04-12 | 2018-12-01 | 美商諳科半導體有限公司 | 以圖案為中心之製程控制 |
| TW201941328A (zh) * | 2018-03-20 | 2019-10-16 | 日商東京威力科創股份有限公司 | 結合整合式半導體處理模組的自我察知及修正異質平台及其使用方法 |
| US20200104639A1 (en) * | 2018-09-28 | 2020-04-02 | Applied Materials, Inc. | Long short-term memory anomaly detection for multi-sensor equipment monitoring |
| TW202015858A (zh) * | 2018-10-30 | 2020-05-01 | 台灣積體電路製造股份有限公司 | 化學機械拋光設備與不規律機械運動預測系統及方法 |
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| US20160026915A1 (en) * | 2001-01-05 | 2016-01-28 | In-Depth Test Llc | Methods and Apparatus for Data Analysis |
| WO2005054968A1 (en) * | 2003-11-26 | 2005-06-16 | Tokyo Electron Limited | Intelligent system for detection of process status, process fault and preventive maintenance |
| JP2006099249A (ja) * | 2004-09-28 | 2006-04-13 | Fujitsu Ltd | 障害管理装置および障害管理方法 |
| US20080228338A1 (en) * | 2007-03-15 | 2008-09-18 | Honeywell International, Inc. | Automated engine data diagnostic analysis |
| US8046637B2 (en) * | 2009-03-06 | 2011-10-25 | Oracle America, Inc. | Telemetry data filtering through sequential analysis |
| ES2427645B1 (es) * | 2011-11-15 | 2014-09-02 | Telefónica, S.A. | Método para gestionar el rendimiento en aplicaciones de múltiples capas implantadas en una infraestructura de tecnología de información |
| US9298538B2 (en) * | 2012-08-16 | 2016-03-29 | Vmware, Inc. | Methods and systems for abnormality analysis of streamed log data |
| KR102195070B1 (ko) * | 2014-10-10 | 2020-12-24 | 삼성에스디에스 주식회사 | 시계열 데이터의 분석을 통한 이상 감지 및 예측 시스템 및 방법 |
| US10275303B2 (en) * | 2015-10-23 | 2019-04-30 | Oracle International Corporation | Mechanism for running diagnostic rules across multiple nodes |
| JP6847590B2 (ja) * | 2016-05-18 | 2021-03-24 | 株式会社日立システムズ | 統合監視運用システムおよび方法 |
| JP6860406B2 (ja) * | 2017-04-05 | 2021-04-14 | 株式会社荏原製作所 | 半導体製造装置、半導体製造装置の故障予知方法、および半導体製造装置の故障予知プログラム |
| US10685159B2 (en) * | 2018-06-27 | 2020-06-16 | Intel Corporation | Analog functional safety with anomaly detection |
| US11568198B2 (en) * | 2018-09-12 | 2023-01-31 | Applied Materials, Inc. | Deep auto-encoder for equipment health monitoring and fault detection in semiconductor and display process equipment tools |
| CN111291096B (zh) * | 2020-03-03 | 2023-07-28 | 腾讯科技(深圳)有限公司 | 数据集构建方法、装置和存储介质及异常指标检测方法 |
| CN111353482B (zh) * | 2020-05-25 | 2020-12-08 | 天津开发区精诺瀚海数据科技有限公司 | 一种基于lstm的疲劳因子隐性异常检测及故障诊断方法 |
-
2021
- 2021-07-22 EP EP21845272.0A patent/EP4162395A4/en active Pending
- 2021-07-22 JP JP2023504511A patent/JP7703011B2/ja active Active
- 2021-07-22 CN CN202180058614.3A patent/CN116113942A/zh active Pending
- 2021-07-22 US US17/383,334 patent/US11640328B2/en active Active
- 2021-07-22 KR KR1020237005035A patent/KR20230042041A/ko active Pending
- 2021-07-22 WO PCT/US2021/042842 patent/WO2022020642A1/en not_active Ceased
- 2021-07-23 TW TW110127131A patent/TWI887455B/zh active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201732690A (zh) * | 2015-12-22 | 2017-09-16 | 應用材料以色列公司 | 半導體試樣的基於深度學習之檢查的方法及其系統 |
| US20180025483A1 (en) * | 2016-07-19 | 2018-01-25 | Globalfoundries Inc. | Methods of detecting faults in real-time for semiconductor wafers |
| TW201842457A (zh) * | 2017-04-12 | 2018-12-01 | 美商諳科半導體有限公司 | 以圖案為中心之製程控制 |
| TW201941328A (zh) * | 2018-03-20 | 2019-10-16 | 日商東京威力科創股份有限公司 | 結合整合式半導體處理模組的自我察知及修正異質平台及其使用方法 |
| US20200104639A1 (en) * | 2018-09-28 | 2020-04-02 | Applied Materials, Inc. | Long short-term memory anomaly detection for multi-sensor equipment monitoring |
| TW202015858A (zh) * | 2018-10-30 | 2020-05-01 | 台灣積體電路製造股份有限公司 | 化學機械拋光設備與不規律機械運動預測系統及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP4162395A1 (en) | 2023-04-12 |
| JP7703011B2 (ja) | 2025-07-04 |
| JP2023535721A (ja) | 2023-08-21 |
| US20220027230A1 (en) | 2022-01-27 |
| EP4162395A4 (en) | 2024-03-27 |
| WO2022020642A1 (en) | 2022-01-27 |
| CN116113942A (zh) | 2023-05-12 |
| KR20230042041A (ko) | 2023-03-27 |
| TW202211341A (zh) | 2022-03-16 |
| US11640328B2 (en) | 2023-05-02 |
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