TWI838769B - Array ultrasonic transceiver - Google Patents

Array ultrasonic transceiver Download PDF

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TWI838769B
TWI838769B TW111122212A TW111122212A TWI838769B TW I838769 B TWI838769 B TW I838769B TW 111122212 A TW111122212 A TW 111122212A TW 111122212 A TW111122212 A TW 111122212A TW I838769 B TWI838769 B TW I838769B
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scanning
probe
axis direction
array probe
coordinate
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TW202317985A (en
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岸本卓弥
北見薫
郡司浩行
黛高明
宮部昇三
中嶋巖
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日商日立電力解決方案股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/225Supports, positioning or alignment in moving situation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/26Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/341Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/0289Internal structure, e.g. defects, grain size, texture
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/10Number of transducers
    • G01N2291/102Number of transducers one emitter, one receiver

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  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Transducers For Ultrasonic Waves (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)

Abstract

本發明之目的在於提供一種縮短檢查時間之超音波收發裝置。 本發明之具備具有直線狀配置之複數個超音波振子之陣列探針4之陣列式超音波收發裝置1,係於被檢體上方之與被檢體平行之掃描平面中,將超音波振子之配置方向設為掃描平面之Y軸方向,將與配置方向垂直之方向設為掃描平面之X軸方向,且基於預設之掃描條件,使陣列探針不靜止地於X軸方向移動,陣列探針於X軸方向之移動期間,進行對被檢體之複數個照射點依序發送超音波光束並接收其反射波之電子掃描。 The purpose of the present invention is to provide an ultrasonic transceiver that shortens the inspection time. The array type ultrasonic transceiver 1 of the present invention has an array probe 4 with a plurality of ultrasonic transducers arranged in a straight line. In a scanning plane above the object and parallel to the object, the arrangement direction of the ultrasonic transducers is set as the Y-axis direction of the scanning plane, and the direction perpendicular to the arrangement direction is set as the X-axis direction of the scanning plane. Based on the preset scanning conditions, the array probe is moved in the X-axis direction non-stationarily. During the movement of the array probe in the X-axis direction, the ultrasonic beams are sequentially sent to a plurality of irradiation points of the object and the reflected waves thereof are received for electronic scanning.

Description

陣列式超音波收發裝置Array ultrasonic transceiver

本發明係關於一種陣列式超音波收發裝置。 The present invention relates to an array-type ultrasonic transceiver.

有對半導體等被檢體照射超音波,基於其之反射波產生被檢體內部之圖像資訊,而檢測被檢體內部之缺陷之超音波收發裝置。根據該超音波收發裝置,可進行非破壞之高分解能檢查,可確保電子零件之可靠性。 There is an ultrasonic transceiver that irradiates an object to be inspected, such as a semiconductor, with ultrasonic waves, generates image information of the interior of the object based on the reflected waves, and detects defects inside the object. This ultrasonic transceiver can perform non-destructive high-resolution inspections to ensure the reliability of electronic components.

謀求縮短近年來伴隨半導體晶圓之高密度安裝化之檢查時間。為實現此,必須縮短超音波之收發處理。 The goal is to shorten the inspection time that has accompanied the high-density mounting of semiconductor wafers in recent years. To achieve this, the ultrasonic transmission and reception process must be shortened.

因此,研究有由直線狀配置之複數個超音波振子構成,使用使該等超音波振子進行電子掃描(電子scan)之陣列探針之超音波檢查裝置(參考專利文獻1)。 Therefore, research has been conducted on an ultrasonic inspection device that is composed of a plurality of ultrasonic transducers arranged in a straight line and uses an array probe that enables the ultrasonic transducers to perform electronic scanning (electronic scanning) (see Patent Document 1).

於該超音波檢查裝置中,構成為於使陣列探針靜止之狀態下以一次電子掃描掃描特定寬度。詳細而言,單探針藉由一個超音波振子進行處理,相對於此,藉由構成陣列探針之複數個超音波振子進行電子掃描處理,由此實現高速處理。 In the ultrasonic inspection device, a specific width is scanned by one electronic scan while the array probe is stationary. Specifically, a single probe is processed by one ultrasonic oscillator, whereas a plurality of ultrasonic oscillators constituting the array probe are used to perform electronic scanning, thereby achieving high-speed processing.

[先前技術文獻] [Prior Art Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開昭63-177056號公報 [Patent document 1] Japanese Patent Publication No. 63-177056

於上述先行技術中,揭示有於結束陣列探針靜止之狀態下之電子掃描處理後,移動至下一個檢查位置,再次使陣列探針靜止而進行電子掃描處理之方法。即,係一種於進行電子掃描時使陣列探針靜止之方法。 In the above-mentioned prior art, there is disclosed a method of moving to the next inspection position after the electronic scanning process is completed in the state where the array probe is stationary, and then stationary the array probe again to perform the electronic scanning process. That is, it is a method of stationary the array probe during electronic scanning.

詳細而言,於某檢查位置發送超音波,直至於下一個檢查位置發送超音波所需之時間為電子掃描之時間與探針之移動時間之和之時間。 To be specific, the time required from sending ultrasound at a certain examination position to sending ultrasound at the next examination position is the sum of the electronic scanning time and the probe movement time.

為縮短超音波收發裝置中之檢查時間,而需要進一步之高速處理。 In order to shorten the inspection time in the ultrasound transceiver, further high-speed processing is required.

本發明之目的在於提供一種縮短檢查時間之超音波收發裝置。 The purpose of the present invention is to provide an ultrasonic transceiver that shortens the inspection time.

為解決上述問題,本發明之陣列式超音波收發裝置係具備具有直線狀配置之複數個超音波振子之陣列探針者;且於被檢體上方之與上述被檢體平行之掃描平面中,將上述超音波振子之配置方向設為上述掃描平面之Y軸方向,將與上述配置方向垂直之方向設為上述掃描平面之X軸方向;基於預設之掃描條件,使上述陣列探針不靜止地於X軸方向移動;上述陣 列探針於X軸方向之移動期間,進行對上述被檢體之複數個照射點依序發送超音波光束並接收其反射波之電子掃描;於該陣列式超音波收發裝置中,將上述被檢體照射超音波光束之最初之電子掃描開始時之上述陣列探針之位置設為上述陣列探針之掃描平面之原點;於Y軸方向上,將電子掃描之開始時之陣列探針之位置之Y座標設為Yl時,將移動之上述陣列探針之下一個Y軸方向之Y座標Yl+1設為對Yl加上電子掃描之掃描寬度之值之位置時,於朝離開上述原點之方向移動時,上述陣列探針之X座標自Xk移動至Xk+1之位置,於朝接近上述原點之方向移動時將上述陣列探針之X座標自Xk移動至Xk-1之位置;且交替重複正向移動掃描動作與反向移動掃描動作對上述掃描平面進行電子掃描,上述正向移動掃描動作包含一面進行電子掃描一面使陣列探針之X座標於X軸方向自Xk移動至Xk+1之動作、及於X軸方向之移動終端,使陣列探針之Y座標於Y軸方向以自Yl成為Yl+1之方式移動電子掃描之掃描寬度量之動作,上述反向移動掃描動作包含一面進行電子掃描一面使陣列探針之X座標於X軸方向自Xk移動至Xk-1之動作、及於X軸方向之移動終端,使陣列探針之Y座標於Y軸方向以自Yl成為Yl+1之方式移動電子掃描之掃描寬度量的動作。 To solve the above problem, the array type ultrasonic transceiver of the present invention is provided with an array probe having a plurality of ultrasonic transducers arranged in a straight line; and in a scanning plane above the subject and parallel to the subject, the arrangement direction of the ultrasonic transducers is set as the Y-axis direction of the scanning plane, and the direction perpendicular to the arrangement direction is set as the X-axis direction of the scanning plane; based on the preset scanning conditions, the array probe is moved non-stationarily in the X-axis direction. During the movement of the array probe in the X-axis direction, the array probe sequentially transmits ultrasonic beams to the plurality of irradiation points of the object and receives the reflected waves thereof by electronic scanning; in the array ultrasonic wave transceiver, the position of the array probe at the beginning of the initial electronic scanning of the object irradiated with the ultrasonic beam is set as the origin of the scanning plane of the array probe; in the Y-axis direction, the Y coordinate of the position of the array probe at the beginning of the electronic scanning is set as the Y coordinate of the array probe at the beginning of the electronic scanning. l , the Y coordinate Y l+1 of the array probe in the Y-axis direction is set to the position of the value of the scanning width of the electronic scan added to Y l , when moving in the direction away from the origin, the X coordinate of the array probe is moved from X k to the position of X k+1 , and when moving in the direction approaching the origin, the X coordinate of the array probe is moved from X k to the position of X k-1 ; and the forward scanning action and the reverse scanning action are alternately repeated to perform electronic scanning on the scanning plane, and the forward scanning action includes performing electronic scanning while moving the X coordinate of the array probe in the X-axis direction from X k to X k -1. The reverse scanning motion includes a motion of moving the X coordinate of the array probe from X k to X k-1 in the X axis direction while performing electronic scanning, and a motion of moving the Y coordinate of the array probe from Y l to Y l+1 in the Y axis direction at the end of the movement in the X axis direction. The reverse scanning motion includes a motion of moving the X coordinate of the array probe from X k to X k-1 in the X axis direction while performing electronic scanning, and a motion of moving the Y coordinate of the array probe from Y l to Y l+1 in the Y axis direction at the end of the movement in the X axis direction.

根據本發明,可縮短超音波收發裝置之檢查時間。 According to the present invention, the inspection time of the ultrasonic transceiver can be shortened.

1:超音波收發裝置 1: Ultrasonic transceiver

2:3軸掃描器 2:3 axis scanner

3:感測器 3: Sensor

4:探針(陣列探針) 4: Probe (array probe)

8:被檢體 8: Subjects

10:控制裝置 10: Control device

11:機械控制部 11: Mechanical control department

12:收發指令部 12: Send and receive command department

14:振子動作信號產生部 14: Oscillator motion signal generating unit

15:反射波信號處理部 15: Reflection wave signal processing unit

16:反射波圖像產生部 16: Reflection wave image generation unit

17:顯示部 17: Display unit

18:控制部 18: Control Department

21:X軸掃描器 21: X-axis scanner

22:Y軸掃描器 22: Y-axis scanner

23:Z軸掃描器 23: Z-axis scanner

24:保持器 24: Retainer

42:鍔部 42: Braid

91:水槽 91: Sink

92:台 92: Taiwan

a~g:振子/照射點 a~g: oscillator/irradiation point

Dm:移動距離 D m : moving distance

Vm:移動速度 V m : moving speed

X:方向 X: Direction

X0,Xk,Xk+1,Xk-1,Xn:座標 X 0 ,X k ,X k+1 ,X k-1 ,X n : coordinates

Y0,Yl,Yl+1,Ym:座標 Y 0 ,Y l ,Y l+1 ,Y m : coordinates

Y:方向 Y: Direction

Z:方向 Z: Direction

圖1係顯示實施形態之超音波收發裝置之整體構成之圖。 Figure 1 is a diagram showing the overall structure of an ultrasonic transceiver in an implementation form.

圖2係說明超音波收發裝置中之探針之平面掃描之動作內容之圖。 Figure 2 is a diagram illustrating the plane scanning action of the probe in the ultrasonic transceiver.

圖3A係對探針之超音波光束之照射點進行說明之圖。 Figure 3A is a diagram illustrating the irradiation point of the ultrasonic beam of the probe.

圖3B係顯示探針之平面掃描中之超音波光束之照射點之位置之圖。 FIG3B is a diagram showing the position of the irradiation point of the ultrasonic beam in the plane scanning of the probe.

圖4係說明掃描器控制部使探針進行平面掃描之座標系之圖。 Figure 4 is a diagram illustrating the coordinate system used by the scanner control unit to enable the probe to perform plane scanning.

以下,對本發明之實施形態,一面參考圖式一面詳細地進行說明。 The following is a detailed description of the implementation of the present invention with reference to the drawings.

圖1係顯示實施形態之超音波收發裝置之整體構成之圖。 Figure 1 is a diagram showing the overall structure of an ultrasonic transceiver in an implementation form.

超音波收發裝置1具備3軸掃描器2(掃描機構)、與超音波陣列探針(以下,記為探針)。該3軸掃描器2使探針4對平面狀之被檢體8以X軸方向與Y軸方向之二維進行掃描(平面掃描)。藉此,超音波收發裝置1可藉由超音波將平面狀之被檢體8影像化。 The ultrasonic transceiver 1 has a three-axis scanner 2 (scanning mechanism) and an ultrasonic array probe (hereinafter referred to as a probe). The three-axis scanner 2 enables the probe 4 to scan the planar subject 8 in two dimensions in the X-axis direction and the Y-axis direction (planar scanning). In this way, the ultrasonic transceiver 1 can image the planar subject 8 by ultrasound.

探針4為將多個振子短條狀排列之相控陣列超音波探針(超音波陣列探針)。詳細而言,藉由控制多個振子中之一部分之複數個振子(振子群)各者之振盪時序製作超音波收斂光束(超音波光束),並對振子群進行電子切換,改變照射位置而照射超音波光束,對被檢體8進行一維掃描。於本說明書中,將相控陣列超音波探針之電子超音波光束之掃描記為電子掃描。 The probe 4 is a phased array ultrasound probe (ultrasound array probe) in which multiple transducers are arranged in short strips. Specifically, the ultrasound convergence beam (ultrasound beam) is produced by controlling the oscillation timing of a plurality of transducers (transducer group) in a part of the multiple transducers, and the transducer group is electronically switched to change the irradiation position to irradiate the ultrasound beam, thereby performing a one-dimensional scan on the subject 8. In this specification, the scanning of the electronic ultrasound beam of the phased array ultrasound probe is described as electronic scanning.

超音波光束之反射波之接收控制亦控制振子群而進行。 The reception control of the reflected wave of the ultrasonic beam is also carried out by controlling the vibrator group.

又,探針4可將由單一之振子產生之超音波以聲透鏡(acoustic lens)聚焦而照射至被檢體,並將複數個該振子構成為短條狀。於該構成中,亦 藉由對振子進行電子切換,而改變超音波光束之照射位置,進行被檢體8之電子掃描。 In addition, the probe 4 can focus the ultrasound generated by a single vibrator with an acoustic lens and irradiate the object, and a plurality of the vibrators are configured into a short strip. In this configuration, the irradiation position of the ultrasound beam is changed by electronically switching the vibrators, and the object 8 is electronically scanned.

探針4配置為浸漬於注滿水槽91之水中,探針4之前端與被檢體8對向。探針4藉由保持器24安裝於3軸掃描器2。 The probe 4 is configured to be immersed in the water filled in the water tank 91, and the front end of the probe 4 faces the subject 8. The probe 4 is mounted on the three-axis scanner 2 via the holder 24.

水槽91載置於台92上。 The water tank 91 is placed on the table 92.

該3軸掃描器2於使探針4二維掃描時,基於藉由內置之檢測位置變化之編碼器檢測出之直線位置或旋轉位置(角度位置),檢測其之掃描位置。藉此,超音波收發裝置1可將被檢體8之各掃描位置(掃描點)與回波之關係二維影像化。 When the three-axis scanner 2 performs two-dimensional scanning on the probe 4, the scanning position is detected based on the linear position or rotational position (angle position) detected by the built-in encoder for detecting position changes. In this way, the ultrasonic transceiver 1 can two-dimensionally image the relationship between each scanning position (scanning point) of the subject 8 and the echo.

3軸掃描器2具備使探針4進行掃描之X軸掃描器21及Y軸掃描器22、可改變探針4與被檢體8之間隔之Z軸掃描器23、及固持探針4之保持器24。 The 3-axis scanner 2 has an X-axis scanner 21 and a Y-axis scanner 22 for scanning the probe 4, a Z-axis scanner 23 that can change the distance between the probe 4 and the subject 8, and a holder 24 that holds the probe 4.

又,探針4於檢查前藉由台92調整高度,且藉由Z軸掃描器23調整與被檢體8之間隔。 In addition, the height of the probe 4 is adjusted by the stage 92 before the inspection, and the distance between the probe 4 and the object 8 is adjusted by the Z-axis scanner 23.

探針4於與複數個振子直線排設之方向垂直之方向(以下,將該方向稱為X軸方向)上,藉由3軸掃描器2之X軸掃描器21以特定速度連續移動(掃描動作),即,使探針4不靜止地於X軸方向移動,其後,藉由3軸掃描器2之Y軸掃描器22,與複數個振子之排設方向並行地進行電子掃描之掃描寬度量之移動(移位動作)。 The probe 4 is continuously moved (scanning action) at a specific speed by the X-axis scanner 21 of the three-axis scanner 2 in a direction perpendicular to the direction in which the plurality of vibrators are arranged in a straight line (hereinafter referred to as the X-axis direction), that is, the probe 4 is moved in the X-axis direction without being stationary, and then the Y-axis scanner 22 of the three-axis scanner 2 is moved (shift action) by the scanning width of the electronic scanning in parallel with the arrangement direction of the plurality of vibrators.

該保持器24支持設置於探針4之上部之鍔部42,於對該探針4施加朝上之力時順利地朝上方向移動。於保持器24設置有感測器3,檢測探針4朝上方向移動之情況。 The holder 24 supports the butt 42 disposed on the upper part of the probe 4, and moves smoothly upward when an upward force is applied to the probe 4. A sensor 3 is disposed on the holder 24 to detect the upward movement of the probe 4.

控制裝置10具備控制部18、收發指令部12、振子動作信號產生部14、反射波信號處理部15、反射波圖像產生部16及顯示部17,且進行3軸掃描器2之控制、探針4之收發控制及來自被檢體8之回波之顯示控制。 The control device 10 includes a control unit 18, a transceiver command unit 12, a transducer motion signal generator 14, a reflection wave signal processor 15, a reflection wave image generator 16, and a display unit 17, and performs control of the three-axis scanner 2, transceiver control of the probe 4, and display control of the echo from the subject 8.

機械控制部11為用以依據後述之掃描條件,基於X軸掃描器21及Y軸掃描器22內置之編碼器輸出,驅動X軸掃描器21及Y軸掃描器22,而使探針4於被檢體8上方之與被檢體8平行之掃描平面移動之控制部。 The mechanical control unit 11 is a control unit for driving the X-axis scanner 21 and the Y-axis scanner 22 based on the output of the encoder built into the X-axis scanner 21 and the Y-axis scanner 22 according to the scanning conditions described later, so as to move the probe 4 in the scanning plane above the subject 8 and parallel to the subject 8.

收發指令部12為指示振子動作信號產生部14產生振子動作信號,而開始探針4之電子掃描之控制部。 The command receiving and transmitting unit 12 is a control unit that instructs the vibrator motion signal generating unit 14 to generate a vibrator motion signal and start the electronic scanning of the probe 4.

振子動作信號產生部14依據由收發指令部12選擇之振子群與掃描順序產生振子動作信號,並於每個掃描點,將其發送至探針4。 The vibrator motion signal generating unit 14 generates a vibrator motion signal according to the vibrator group and scanning sequence selected by the transceiver command unit 12, and sends it to the probe 4 at each scanning point.

探針4根據振子動作信號產生部14之振子動作信號照射超音波光束。 The probe 4 irradiates the ultrasonic beam according to the oscillator motion signal of the oscillator motion signal generating unit 14.

反射波信號處理部15係於每個掃描點自探針4接收超音波光束之反射波之信號,設置與要測定之被檢體8之深度對應之閘極進行閘極處理,藉此求出反射波之位移(振幅),並根據該位移算出信號強度。 The reflected wave signal processing unit 15 receives the reflected wave signal of the ultrasonic beam from the probe 4 at each scanning point, sets a gate corresponding to the depth of the subject 8 to be measured to perform gate processing, thereby obtaining the displacement (amplitude) of the reflected wave, and calculates the signal intensity based on the displacement.

反射波圖像產生部16例如將由反射波信號處理部15算出之每個掃描點之反射波之信號強度轉換為0~255之灰階度。於被檢體8與水槽91之水之邊界或被檢體8內部之材料邊界、剝離部、空隙部等聲阻抗(密度)變化之邊界面,產生超音波光束之反射波。反射波圖像產生部16將無超音波光束之反射波之點設為灰階度0,反射波之信號強度越大,灰階度越大。 The reflection wave image generation unit 16 converts the signal strength of the reflection wave of each scanning point calculated by the reflection wave signal processing unit 15 into a grayscale of 0 to 255. The reflection wave of the ultrasonic beam is generated at the boundary between the specimen 8 and the water in the water tank 91 or the boundary of the material, peeling part, gap part and other interfaces with acoustic impedance (density) changes inside the specimen 8. The reflection wave image generation unit 16 sets the point without the reflection wave of the ultrasonic beam to grayscale 0. The greater the signal strength of the reflection wave, the greater the grayscale.

顯示部17顯示由反射波圖像產生部16求出之超音波光束之反射波之信號強度,來作為被檢體8之平面掃描之濃淡圖像。具體而言,於灰階度為0之情形時顯示黑色,於灰階度為最大值之情形時顯示白色,於灰階度為中間值之情形時根據灰階度顯示灰色。 The display unit 17 displays the signal intensity of the reflected wave of the ultrasonic beam obtained by the reflected wave image generating unit 16 as a blurred image of the plane scan of the subject 8. Specifically, black is displayed when the grayscale is 0, white is displayed when the grayscale is the maximum value, and gray is displayed according to the grayscale when the grayscale is an intermediate value.

因此,超音波收發裝置1將經平面掃描之被檢體8之空洞(與周圍之密度差較大),顯示為白色圖像。 Therefore, the ultrasonic transceiver 1 displays the cavity (with a large density difference from the surrounding area) of the subject 8 scanned by the plane scan as a white image.

控制部18控制機械控制部11,且與自機械控制部11通知之X軸掃描器21之編碼器輸出同步,控制收發指令部12。即,控制部18與探針4之掃描動作同步開始電子掃描。因此,藉由探針4之電子掃描所產生之被檢體8之X軸方向之掃描間距,與X軸掃描器21之編碼器輸出之間距相等。 The control unit 18 controls the mechanical control unit 11, and controls the command receiving unit 12 in synchronization with the encoder output of the X-axis scanner 21 notified from the mechanical control unit 11. That is, the control unit 18 starts the electronic scanning in synchronization with the scanning action of the probe 4. Therefore, the scanning interval of the X-axis direction of the subject 8 generated by the electronic scanning of the probe 4 is equal to the interval of the encoder output of the X-axis scanner 21.

接著,藉由圖2,說明超音波收發裝置1中之探針4之平面掃描之動作內容。 Next, the plane scanning action of the probe 4 in the ultrasonic transceiver 1 is explained with reference to FIG. 2.

探針4係例如由192個振子直線設置而構成,但於圖2中,顯示探針4由振子a、b、c、d、e、f、g之7個振子構成之情形。 The probe 4 is composed of, for example, 192 vibrators arranged in a straight line, but FIG. 2 shows that the probe 4 is composed of 7 vibrators, vibrators a, b, c, d, e, f, and g.

超音波收發裝置1將被檢體8被設定之位置設為掃描之原點(圖2之掃描區域之左上方),指定掃描區域之大小,進行探針4之平面掃描。 The ultrasonic transceiver 1 sets the position of the subject 8 as the origin of the scan (the upper left corner of the scan area in Figure 2), specifies the size of the scan area, and performs a plane scan of the probe 4.

首先,以探針4之電子掃描之開始點位於平面掃描之原點之方式,驅動3軸掃描器2,來移動探針4。詳細而言,由於電子掃描係於探針4之移動期間進行,故以探針4通過電子掃描之開始點時之移動速度成為特定值之方式,包含助跑部分而移動。 First, the three-axis scanner 2 is driven to move the probe 4 in such a way that the starting point of the electronic scanning of the probe 4 is located at the origin of the plane scanning. In detail, since the electronic scanning is performed during the movement of the probe 4, the probe 4 is moved in such a way that the moving speed when passing the starting point of the electronic scanning becomes a specific value, including the run-up portion.

於平面掃描之原點,探針4利用振子a、b、c、d、e、f、g進行電子掃描,且藉由3軸掃描器2之X軸掃描器21,於與振子之排設方向垂直之方向移動。且,探針4與X軸掃描器21之編碼器輸出同步,進行下一個電子掃描。探針4係於掃描區域之寬度量(X軸方向之大小量),重複上述動作。 At the origin of the plane scan, the probe 4 uses the vibrators a, b, c, d, e, f, and g to perform electronic scanning, and moves in a direction perpendicular to the arrangement direction of the vibrators through the X-axis scanner 21 of the three-axis scanner 2. In addition, the probe 4 synchronizes with the encoder output of the X-axis scanner 21 to perform the next electronic scan. The probe 4 repeats the above action in the width of the scanned area (the size in the X-axis direction).

探針4如上所述,一面不靜止地進行X軸方向之探針4之連續移動(掃描動作1),一面重複電子掃描,對Y軸方向之長度為電子掃描之掃描寬度量、且X軸方向之長度為所設定之掃描區域之寬度量之帶狀之掃描區域照射超音波光束,檢測來自被檢體8之反射波。 As described above, the probe 4 continuously moves in the X-axis direction (scanning action 1) while repeating electronic scanning, irradiating the ultrasonic beam to a strip-shaped scanning area whose length in the Y-axis direction is the scanning width of the electronic scanning and whose length in the X-axis direction is the width of the set scanning area, and detecting the reflected wave from the subject 8.

此時,控制裝置10將以探針4之一次電子掃描檢測出之來自被檢體8之反射波,設為X軸方向之位置(掃描行)相同之超音波光束之反射波,算出反射波之信號強度,並顯示為濃淡圖像。 At this time, the control device 10 sets the reflected wave from the subject 8 detected by the probe 4 in a single electronic scan as the reflected wave of the ultrasonic beam at the same position (scanning line) in the X-axis direction, calculates the signal intensity of the reflected wave, and displays it as a faint image.

接著,探針4藉由3軸掃描器2之Y軸掃描器22,與複數個振子之排設 方向並行地進行電子掃描之掃描寬度量之移動(移位動作)。且,以探針4之電子掃描之開始點與上述掃描動作1之最後之電子掃描之開始點於X軸方向上成為相同之位置之方式,藉由X軸掃描器21移動探針4。 Next, the probe 4 is moved (displacement action) by the scanning width of the electronic scanning in parallel with the arrangement direction of the plurality of vibrators by the Y-axis scanner 22 of the three-axis scanner 2. Furthermore, the probe 4 is moved by the X-axis scanner 21 in such a way that the starting point of the electronic scanning of the probe 4 and the starting point of the last electronic scanning of the above-mentioned scanning action 1 become the same position in the X-axis direction.

探針4利用振子a、b、c、d、e、f、g進行電子掃描,且藉由3軸掃描器2之X軸掃描器21,於與掃描動作1為相反方向之垂直於振子之排設方向之方向移動。且,探針4與X軸掃描器21之編碼器輸出同步,進行下一個電子掃描。探針4係於掃描區域之寬度量(X軸方向之大小量),重複上述動作。 The probe 4 uses the vibrators a, b, c, d, e, f, and g to perform electronic scanning, and moves in a direction perpendicular to the arrangement direction of the vibrators, which is opposite to the scanning action 1, through the X-axis scanner 21 of the three-axis scanner 2. In addition, the probe 4 synchronizes with the encoder output of the X-axis scanner 21 to perform the next electronic scan. The probe 4 repeats the above action in the width of the scanning area (the size in the X-axis direction).

探針4如上所述,一面進行X軸方向之探針4之連續移動(掃描動作2),一面重複電子掃描,而對Y軸方向之長度為電子掃描之掃描寬度量,且X軸方向之長度為設定之掃描區域之寬度量之帶狀之掃描區域照射超音波光束,檢測來自被檢體8之反射波。 As described above, the probe 4 continuously moves in the X-axis direction (scanning action 2) while repeating electronic scanning, and irradiates the ultrasonic beam to the strip-shaped scanning area whose length in the Y-axis direction is the scanning width of the electronic scanning and whose length in the X-axis direction is the width of the set scanning area, to detect the reflected wave from the subject 8.

控制裝置10係若可藉由上述探針4之掃描動作1與掃描動作2,覆蓋指定之掃描區域,則結束平面掃描,但於不足之情形時,使探針4進行電子掃描之掃描寬度量之移位動作而移動,並與進行電子掃描之同時進行與先前之動作同樣之掃描動作3、移位動作、掃描動作4。 The control device 10 ends the plane scanning if the designated scanning area can be covered by the scanning action 1 and scanning action 2 of the probe 4. However, if the area is not covered enough, the probe 4 is moved by performing a shifting action of the scanning width of the electronic scanning, and simultaneously performs the same scanning action 3, shifting action, and scanning action 4 as the previous action while performing the electronic scanning.

控制裝置10重複上述動作直至覆蓋指定之掃描區域為止,進行被檢體8之平面掃描。 The control device 10 repeats the above actions until the designated scanning area is covered, and performs a plane scan of the subject 8.

於本說明書中,將探針4之掃描動作1、掃描動作3……記為正向移動 掃描動作,將探針4之掃描動作2、掃描動作4……記為反向移動掃描動作。 In this manual, scanning actions 1, 3, etc. of the probe 4 are recorded as forward movement scanning actions, and scanning actions 2, 4, etc. of the probe 4 are recorded as reverse movement scanning actions.

由於探針4於上述掃描動作1、2、3、4中,一面連續移動,一面進行電子掃描,故詳細而言,因超音波光束之照射時序,超音波光束之照射點之X軸方向之位置產生偏移。接著,對超音波光束之照射時序與照射點之關係進行說明。 Since the probe 4 continuously moves and performs electronic scanning in the above scanning actions 1, 2, 3, and 4, in detail, the position of the irradiation point of the ultrasonic beam in the X-axis direction is offset due to the irradiation timing of the ultrasonic beam. Next, the relationship between the irradiation timing of the ultrasonic beam and the irradiation point is explained.

圖3A係對探針4之超音波光束之照射點進行說明之圖。 FIG3A is a diagram illustrating the irradiation point of the ultrasonic beam of the probe 4.

照射點a、b、c、d、e、f、g為探針4之振子a、b、c、d、e、f、g之電子掃描之超音波光束之照射點。尤其,照射點a為與掃描區域之原點對應之照射點,且為於掃描動作時,與X軸掃描器21之編碼器輸出同步之電子掃描之最初之超音波光束之照射點。 Irradiation points a, b, c, d, e, f, g are irradiation points of ultrasonic beams of electronic scanning of oscillators a, b, c, d, e, f, g of the probe 4. In particular, irradiation point a is an irradiation point corresponding to the origin of the scanning area, and is the irradiation point of the first ultrasonic beam of electronic scanning synchronized with the encoder output of the X-axis scanner 21 during the scanning operation.

探針4之電子掃描於掃描動作之連續移動期間進行。圖3A之實線之矩形表示最初照射超音波光束時之探針4之位置,虛線之矩形表示最後照射超音波光束時之探針4之位置。 The electronic scanning of the probe 4 is performed during the continuous movement of the scanning action. The solid rectangle in Figure 3A represents the position of the probe 4 when the ultrasonic beam is first irradiated, and the dashed rectangle represents the position of the probe 4 when the ultrasonic beam is last irradiated.

於探針4中,自照射點a向探針4另一端依序照射超音波光束。因此,照射點b、c、d、e、f、g成為於掃描方向上逐漸偏移之位置。 In the probe 4, the ultrasonic beam is sequentially irradiated from the irradiation point a to the other end of the probe 4. Therefore, the irradiation points b, c, d, e, f, and g become positions gradually shifted in the scanning direction.

圖3B係顯示探針4之掃描動作1與掃描動作2之平面掃描中之超音波光束之照射點之位置的圖。 FIG3B is a diagram showing the position of the irradiation point of the ultrasonic beam in the plane scanning of the scanning action 1 and the scanning action 2 of the probe 4.

由於探針4之照射點a與X軸掃描器21之編碼器輸出同步進行電子掃 描,故X軸方向之位置於掃描動作1與掃描動作2中一致。但,照射點b、c、d、e、f、g成為根據掃描方向而逐漸偏移之位置。 Since the irradiation point a of the probe 4 is electronically scanned synchronously with the encoder output of the X-axis scanner 21, the position in the X-axis direction is consistent in scanning action 1 and scanning action 2. However, the irradiation points b, c, d, e, f, and g become positions that gradually shift according to the scanning direction.

接著,詳細地說明控制裝置10之探針4之平面掃描之處理。 Next, the processing of plane scanning of the probe 4 of the control device 10 is described in detail.

圖4係說明控制裝置10使探針4進行平面掃描之控制座標系之圖。 FIG4 is a diagram illustrating the control coordinate system of the control device 10 for enabling the probe 4 to perform plane scanning.

機械控制部11規定座標系,該座標系將與探針4之超音波振子之配置方向垂直之方向設為掃描平面之X軸方向,將超音波振子之配置方向設為掃描平面之Y軸方向,將對被檢體8照射超音波光束之最初之電子掃描開始時之探針4之位置設為掃描平面之原點。 The mechanical control unit 11 specifies a coordinate system, which sets the direction perpendicular to the arrangement direction of the ultrasonic transducer of the probe 4 as the X-axis direction of the scanning plane, sets the arrangement direction of the ultrasonic transducer as the Y-axis direction of the scanning plane, and sets the position of the probe 4 at the beginning of the initial electronic scanning of the ultrasonic beam irradiating the subject 8 as the origin of the scanning plane.

座標(Xk,Yl)係於探針4之每次電子掃描之照射點a(電子掃描之最初之照射點)照射超音波光束時之探針4之位置。以下,每次電子掃描之照射點a之位置,代表探針4之位置。 The coordinates (X k , Y l ) are the positions of the probe 4 when the probe 4 irradiates the ultrasonic beam at the irradiation point a (the first irradiation point of the electronic scan) of each electronic scan. Hereinafter, the position of the irradiation point a of each electronic scan represents the position of the probe 4 .

Xk座標之下標k為表示超音波光束之照射點之X軸方向之照射點之序號,為0至n之任一值。X0座標、Xn座標表示探針4之X軸方向之移動之端部位置,n+1表示掃描平面之X軸方向之照射點數。 The subscript k of the X k coordinate represents the serial number of the irradiation point of the ultrasonic beam in the X-axis direction, which is any value from 0 to n. The X 0 coordinate and the X n coordinate represent the end position of the movement of the probe 4 in the X-axis direction, and n+1 represents the number of irradiation points in the X-axis direction of the scanning plane.

Yl座標之下標l為表示超音波光束之照射點之Y軸方向之照射點之序號,為0至m之任一值。Y0座標、Ym座標表示探針4之Y軸方向之移動之端部位置,m+1表示掃描平面之Y軸方向之照射點數。 The subscript l of the Y l coordinate represents the serial number of the irradiation point in the Y axis direction of the ultrasonic beam, which is any value from 0 to m. The Y 0 coordinate and the Y m coordinate represent the end position of the movement of the probe 4 in the Y axis direction, and m+1 represents the number of irradiation points in the Y axis direction of the scanning plane.

將進行平面掃描之區域(掃描區域)之X軸方向之長度,除以超音波收發裝置1之分解能之一半而求出n。即,n為將掃描區域之X軸方向之長 度,除以Xk座標間之距離即移動距離Dm而得之值。 n is obtained by dividing the length of the area to be scanned in the X-axis direction (scanning area) by half the resolution of the ultrasonic transceiver 1. That is, n is the value obtained by dividing the length of the scanning area in the X-axis direction by the distance between the X k coordinates, that is, the moving distance D m .

又,將進行平面掃描之區域(掃描區域)之Y軸方向之長度,除以探針4之電子掃描之掃描寬度而求出m。 Furthermore, m is obtained by dividing the length of the area (scanning area) in the Y-axis direction where the plane scanning is performed by the scanning width of the electronic scanning of the probe 4.

如上所述,機械控制部11係規定控制座標系,該控制座標系將對被檢體8照射超音波光束之最初之電子掃描開始時之探針4之位置,設為掃描平面之原點,於Y軸方向上,將電子掃描開始時之探針4之位置之Y座標設為Yl時,將移動之探針4之下一個Y軸方向之位置Yl+1設為對Yl加上電子掃描之掃描寬度之位置,於X軸方向上,將電子掃描開始時之探針4之位置之X座標設為XkAs described above, the mechanical control unit 11 defines a control coordinate system, which sets the position of the probe 4 at the start of the initial electronic scanning of irradiating the object 8 with an ultrasonic beam as the origin of the scanning plane, sets the Y coordinate of the position of the probe 4 at the start of the electronic scanning as Y1 in the Y-axis direction, sets the next Y-axis position Y1 +1 of the moving probe 4 as the position obtained by adding the scanning width of the electronic scanning to Y1 , and sets the X coordinate of the position of the probe 4 at the start of the electronic scanning as Xk in the X-axis direction.

且,於進行圖2與圖3B所說明之掃描動作1或掃描動作3中之探針4之移動控制,即,朝離開原點之方向移動探針4時,機械控制部11藉由X軸掃描器21,將探針4自座標(Xk,Yl)連續移動至座標(Xk+1,Yl)(k為0至n)。又,於進行掃描動作2或掃描動作4中之探針4之移動控制,即,朝接近原點之方向移動探針4時,機械控制部11藉由X軸掃描器21,將探針4自座標(Xk,Yl)連續移動至座標(Xk-1,Yl)(k為n至0)。 Furthermore, when the probe 4 is moved in the scanning operation 1 or scanning operation 3 illustrated in FIG. 2 and FIG. 3B , that is, when the probe 4 is moved in the direction away from the origin, the mechanical control unit 11 continuously moves the probe 4 from the coordinate (X k , Y l ) to the coordinate (X k+1 , Y l ) (k is 0 to n) through the X-axis scanner 21. Furthermore, when the probe 4 is moved in the scanning operation 2 or scanning operation 4 , that is, when the probe 4 is moved in the direction approaching the origin, the mechanical control unit 11 continuously moves the probe 4 from the coordinate (X k , Y l ) to the coordinate (X k-1 , Y l ) (k is n to 0) through the X-axis scanner 21.

將Xk座標間之距離即移動距離Dm,除以自座標(Xk,Yl)向座標(Xk+1,Yl)之移動時間Tm、或自座標(Xk,Yl)向座標(Xk-1,Yl)之移動時間Tm,來求出探針4之自座標(Xk,Yl)向座標(Xk+1,Yl)之移動速度Vm、及自座標(Xk,Yl)向座標(Xk-1,Yl)之移動速度VmThe distance between the Xk coordinates, i.e., the moving distance Dm , is divided by the moving time Tm from the coordinates ( Xk , Yl ) to the coordinates (Xk +1 , Yl ) or the moving time Tm from the coordinates ( Xk , Yl ) to the coordinates (Xk -1 , Yl ) to obtain the moving speed Vm of the probe 4 from the coordinates ( Xk , Yl ) to the coordinates (Xk +1 , Yl ) and the moving speed Vm from the coordinates ( Xk , Yl ) to the coordinates (Xk -1 , Yl ).

移動時間Tm係以可於探針4之X軸方向之移動期間進行1次之電子掃 描之方式,設定為與電子掃描之複數個照射點之收發時間之和即掃描時間Ts相等。 The moving time Tm is set to be equal to the sum of the transmission and reception times of a plurality of irradiation points of the electronic scanning, that is, the scanning time Ts, in such a manner that the electronic scanning can be performed once during the movement of the probe 4 in the X-axis direction.

藉此,於本發明中,於Xk座標開始電子掃描,於該電子掃描結束而於下一個Xk+1座標開始電子掃描處理時,陣列探針之最初之振子已位於Xk+1座標。如周知技術般,於一個電子掃描結束後自Xk座標移動至Xk+1座標所需之時間為0。 Thus, in the present invention, electronic scanning starts at the Xk coordinate, and when the electronic scanning is completed and the electronic scanning process starts at the next Xk +1 coordinate, the initial vibrator of the array probe is already located at the Xk +1 coordinate. As is known in the art, the time required to move from the Xk coordinate to the Xk +1 coordinate after an electronic scanning is completed is 0.

又,於探針4移動時,有時會於浸漬之水中產生波動或氣泡,而對超音波光束及/或反射波之行進造成影響。因此,探針4之移動速度Vm必須為不產生水之波動或氣泡等外部干擾要因之範圍之最大速度(Vmax)以下。 Also, when the probe 4 moves, waves or bubbles may be generated in the immersed water, which may affect the travel of the ultrasonic beam and/or the reflected wave. Therefore, the moving speed Vm of the probe 4 must be below the maximum speed (Vmax) within the range that does not generate external interference factors such as water waves or bubbles.

具體而言,若將水中之音速設為1500m/秒,將探針4之振子至被檢體之檢查面之距離設為10mm,將探針4之振子數設為192,則每1次之電子掃描之掃描時間為0.0025536秒。於欲獲得擷取0.4mm之缺陷之解析度之情形時,將移動距離Dm設定為0.2mm,且根據移動距離Dm與移動時間Tm(=Ts)之關係,移動速度Vm為78.320802mm/秒。由於移動速度之最大值(Vmax)自目前為止之實驗結果來看為300mm/秒,移動速度Vm為Vmax以內,故不會產生水之波動或氣泡等外部干擾要因。 Specifically, if the speed of sound in water is set to 1500m/sec, the distance from the vibrator of the probe 4 to the inspection surface of the object to be inspected is set to 10mm, and the number of vibrators of the probe 4 is set to 192, the scanning time of each electronic scan is 0.0025536 seconds. When the resolution of capturing a defect of 0.4mm is to be obtained, the moving distance Dm is set to 0.2mm, and according to the relationship between the moving distance Dm and the moving time Tm (=Ts), the moving speed Vm is 78.320802mm/sec. Since the maximum value (Vmax) of the moving speed is 300mm/sec according to the experimental results so far, the moving speed Vm is within Vmax, so external interference factors such as water waves or bubbles will not be generated.

機械控制部11將該移動速度Vm記憶為掃描條件。且,機械控制部11藉由X軸掃描器21之編碼器輸出管理Xk座標,並以移動速度Vm移動探針4。 The mechanical control unit 11 memorizes the moving speed V m as a scanning condition. Furthermore, the mechanical control unit 11 manages the X k coordinates through the encoder output of the X axis scanner 21 and moves the probe 4 at the moving speed V m .

機械控制部11於X軸方向之移動終端,自座標(Xk+1,Yl)向座標(Xk+1,Yl+1),或自座標(Xk-1,Yl)向座標(Xk-1,Yl+1)地驅動Y軸掃描器22,進行探針4之Y軸方向移動。 At the end of the movement in the X-axis direction, the mechanical control unit 11 drives the Y-axis scanner 22 from the coordinate (X k+1 , Y l ) to the coordinate (X k+1 , Y l+1 ) or from the coordinate (X k-1 , Y l ) to the coordinate (X k-1 , Y l+1 ) to move the probe 4 in the Y-axis direction.

如上所述,超音波收發裝置1交替重複正向移動掃描動作與反向移動掃描動作對掃描平面進行電子掃描,上述正向移動掃描動作包含一面進行探針4之電子掃描一面使探針4之X座標於X軸方向上自Xk移動至Xk+1之動作、及於X軸方向之移動終端,使探針4之Y座標於Y軸方向上自Yl移動至Yl+1之動作,上述反向移動掃描動作包含一面進行電子掃描一面使探針4之X座標於X軸方向上自Xk移動至Xk-1之動作、與於X軸方向之移動終端,使探針4之Y座標於Y軸方向上自Yl移動至Yl+1之動作。 As described above, the ultrasonic transceiver 1 electronically scans the scanning plane by alternately repeating the forward scanning motion and the reverse scanning motion. The forward scanning motion includes the motion of moving the X coordinate of the probe 4 from X k to X k+1 in the X-axis direction while performing the electronic scanning of the probe 4, and the motion of moving the Y coordinate of the probe 4 from Y l to Y l+1 in the Y-axis direction at the end of the movement in the X-axis direction. The reverse scanning motion includes the motion of moving the X coordinate of the probe 4 from X k to X k-1 in the X-axis direction while performing the electronic scanning, and the motion of moving the Y coordinate of the probe 4 from Y l to Y l+1 in the Y-axis direction at the end of the movement in the X-axis direction.

本發明並非限定於上述之實施例者,而包含各種變化例。上述實施形態係係為了易於理解地說明本發明而詳細說明者,並非限定於必須具備說明之所有構成者。 The present invention is not limited to the above-mentioned embodiments, but includes various variations. The above-mentioned embodiments are described in detail for easy understanding of the present invention, and are not limited to all the components that must be described.

a,g:照射點 a,g: irradiation point

X:方向 X: Direction

Y:方向 Y: Direction

Claims (4)

一種陣列式超音波收發裝置,其係包含陣列探針者,該陣列探針具有直線狀配置之複數個超音波振子;且 於被檢體上方之與上述被檢體平行之掃描平面中,將上述超音波振子之配置方向設為上述掃描平面之Y軸方向,將與上述配置方向垂直之方向設為上述掃描平面之X軸方向, 基於預設之掃描條件,使上述陣列探針不靜止地於X軸方向移動, 上述陣列探針於X軸方向之移動期間,進行對上述被檢體之複數個照射點依序發送超音波光束並接收其反射波之電子掃描,且該陣列式超音波收發裝置之特徵在於: 將對上述被檢體照射超音波光束之最初之電子掃描開始時之上述陣列探針之位置,設為上述陣列探針之掃描平面之原點, 於Y軸方向上,將電子掃描開始時之陣列探針之位置之Y座標設為Y l時,且將移動之上述陣列探針之下一個Y軸方向之Y座標Y l+1設為對Y l加上電子掃描之掃描寬度之值之位置時, 於朝離開上述原點之方向移動時,上述陣列探針之X座標自X k移動至X k+1之位置,於朝接近上述原點之方向移動時,上述陣列探針之X座標自X k移動至X k-1之位置,且 交替重複以下動作而對上述掃描平面進行電子掃描︰ 正向移動掃描動作,其包含一面進行電子掃描一面使陣列探針之X座標於X軸方向自X k移動至X k+1之動作、及於X軸方向之移動終端,使陣列探針之Y座標於Y軸方向以自Y l成為Y l+1之方式移動電子掃描之掃描寬度量的動作;及 反向移動掃描動作,其包含一面進行電子掃描一面使陣列探針之X座標於X軸方向自X k移動至X k-1之動作、及於X軸方向之移動終端,使陣列探針之Y座標於Y軸方向以自Y l成為Y l+1之方式移動電子掃描之掃描寬度量的動作。 An array type ultrasonic transceiver includes an array probe, the array probe has a plurality of ultrasonic transducers arranged in a straight line; and in a scanning plane above a subject and parallel to the subject, the arrangement direction of the ultrasonic transducers is set as the Y-axis direction of the scanning plane, and the direction perpendicular to the arrangement direction is set as the X-axis direction of the scanning plane. Based on a preset scanning condition, the array probe is moved in the X-axis direction non-stationarily. During the movement in the X-axis direction, the array probe performs electronic scanning to sequentially send ultrasonic beams to a plurality of irradiation points of the subject and receive their reflected waves. The array type ultrasonic transceiver is characterized in that: The position of the array probe at the start of the initial electronic scanning of irradiating the object with an ultrasonic beam is set as the origin of the scanning plane of the array probe. In the Y-axis direction, the Y coordinate of the position of the array probe at the start of the electronic scanning is set as Y l , and the Y coordinate Y l+1 of the next Y-axis direction of the moved array probe is set as the position of Y l plus the value of the scanning width of the electronic scanning. When moving in a direction away from the origin, the X coordinate of the array probe moves from X k to the position of X k+1 , and when moving in a direction approaching the origin, the X coordinate of the array probe moves from X k to the position of X k-1 , and the following actions are alternately repeated to perform electronic scanning on the scanning plane: The forward scanning motion includes the motion of moving the X coordinate of the array probe from X k to X k+1 in the X-axis direction while performing electronic scanning, and the motion of moving the Y coordinate of the array probe from Y l to Y l+1 in the Y-axis direction by the scanning width of the electronic scanning at the end of the movement in the X-axis direction; and the reverse scanning motion includes the motion of moving the X coordinate of the array probe from X k to X k-1 in the X-axis direction while performing electronic scanning, and the motion of moving the Y coordinate of the array probe from Y l to Y l+1 in the Y-axis direction by the scanning width of the electronic scanning at the end of the movement in the X-axis direction. 如請求項1之陣列式超音波收發裝置,其中 於將上述電子掃描開始時之上述陣列探針之位置之X座標設為X k時, 將自上述X k到達下一個電子掃描開始時之上述陣列探針之位置之X座標即X k-1或X k+1之上述陣列探針的移動速度V m,設為上述掃描條件。 In the array ultrasonic transceiver of claim 1, when the X coordinate of the position of the array probe at the start of the electronic scan is set to X k , the moving speed V m of the array probe from X k to the X coordinate of the position of the array probe at the start of the next electronic scan, i.e., X k-1 or X k+1 , is set as the scanning condition. 如請求項2之陣列式超音波收發裝置,其中 將自上述X k到達下一個電子掃描開始時之上述陣列探針之位置之X座標即X k-1或X k+1之移動時間T m,設定為與上述電子掃描之複數個照射點之收發時間之和即掃描時間T s相等, 根據上述移動時間T m、及上述X k至上述X k-1或X k+1之上述陣列探針之移動距離D m,求出上述移動速度V mIn the array ultrasonic transceiver of claim 2, the moving time T m from X k to the X coordinate of the position of the array probe at the start of the next electronic scan, i.e., X k-1 or X k+1 , is set equal to the sum of the transceiver times of the plurality of irradiation points of the electronic scan, i.e., the scanning time T s . The moving speed V m is calculated based on the moving time T m and the moving distance D m of the array probe from X k to X k-1 or X k+1 . 如請求項2之陣列式超音波收發裝置,其中 上述移動速度V m係在上述陣列探針於上述X軸方向移動時,不會產生對上述超音波光束及/或上述反射波之行進造成影響之波動或氣泡之外部干擾要因之範圍內之最大速度(300 mm/秒)。 As in claim 2, the array ultrasonic transceiver, wherein the moving speed V m is the maximum speed (300 mm/sec) within a range where no external interference factors such as ripples or bubbles that affect the movement of the ultrasonic beam and/or the reflected wave are generated when the array probe moves in the X-axis direction.
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