TWI836814B - USB Type-C port functional testing method and system - Google Patents

Abstract

The present invention discloses a USB Type-C port function test method and system, wherein the system includes: a mobile end, a test end and a function test circuit board, wherein the mobile end, the function test circuit board and the test end are connected in sequence; the function test circuit board includes: a first switch chip; and a second switch chip connected in reverse series to the first switch chip; and a control end for controlling the conduction state of the front or back side of the Type-C port with the first switch chip. The communication signal with the conductive side of the first switch chip is sent to the test end via the first switch chip and the second switch chip, and the test end tests the communication signal. This system can complete the Type-C test without plugging and unplugging through the function test circuit board, saving the tester's time for plugging and unplugging the Type-C.

Description

USB Type-C port function testing method and system

The present invention relates to the technical field of port testing, and further relates to a USB Type-C port function testing method and system.

USB type-C is a USB interface standard that includes at least the following features: 1. There is no difference between the forward and reverse directions of the connection port, and it supports forward and reverse plugging and unplugging; 2. The transmission power is high, and the connection port can pass 3A current, supporting up to The transmission power of 100W greatly increases the charging speed; 3. The transmission speed is fast and supports the USB 3.1 standard. According to tests, the maximum transmission rate of USB Type-C can reach 10Gbps; 4. It has video transmission function and supports USB Type-C external devices. C's interface also supports the DP Altmode video output protocol.

Existing USB type-C testing methods include client mode testing and host mode testing. In client mode testing, the tester connects one end of the Type-C data cable to the mobile phone and the other end to the computer for testing. In host mode testing, The tester connected one end of the Type-C data cable to the mobile phone and the other end to the USB end for testing. However, because there are communication signals between the front and back sides of the USB Type-C itself, the tester needs to plug in the USB end and the computer in addition to testing. In addition to unplugging, you also need to plug in and unplug the USB Type-C and change the USB Type-C side to complete the test. It is time-consuming and easy for testers to make mistakes when plugging in, pulling out, and changing sides multiple times.

In order to solve the above technical problems, the present invention provides a USB Type-C port function test method and system to solve the time waste caused by multiple plugging and unplugging during USB Type-C interface function testing and the risk of defective products being missed due to incorrect face-changing. Specifically, the technical solution of the present invention is as follows:

In a first aspect, the present invention discloses a USB Type-C port function testing system, including:

Mobile terminal, test terminal and functional test circuit board,

The mobile terminal, the functional test circuit board and the test terminal are connected in sequence;

The functional test circuit board includes:

The first exchange chip;

A second switch chip, wherein the first switch chip and the second switch chip are connected in reverse series;

The control end is used to control the communication signal on the front or back of the Type-C port and the first switching chip;

When the Type-C port front test is performed, the control end controls the front communication signal of the Type-C port to be connected to the first switch chip, so that the front communication signal is transmitted to the second switch chip via the first switch chip, and then transmitted to the test end by the second switch chip for testing;

When performing the reverse test of the Type-C port, the control end switches the reverse communication signal of the Type-C port to connect with the first switch chip, so that the reverse communication signal is transmitted to the second switch chip via the first switch chip, and then transmitted to the test end by the second switch chip for testing.

In this system, the Type-C is connected to the test end through the functional circuit board designed by this system, which realizes the function of testing the front and back of the Type-C without plugging and unplugging and flipping the Type-C, saving the tester's time for testing the Type-C.

In some implementations of the USB Type-C port functional test system, the first switching chip and the second switching chip both include:

A first pin set, used to receive the front communication signal of the Type-C port;

The second pin group is used to receive the communication signal from the Type-C port;

The third pin set is used to transmit the front communication signal or the back communication signal from the first switch chip to the second switch chip.

The first pin group, the second pin group and the third pin group are communication link nodes for signal transmission between the mobile end, the first switch chip, the second switch chip and the test end, so that the first switch chip and the second switch chip can divide different communication links according to the test end required by the test and the front and back sides of the Type-C required.

In some embodiments of the USB Type-C port functional test system, the control terminal also controls the control end by switching the conduction state of the first pin group and the second pin group connected to the Type-C port. The Type-C port front and back switching is used for the first switching chip to receive front or back Type-C port communication signals.

As a part of the functional test board, the control end switches the conductive state between the functional test board and the front or back of the Type-C, so that the front or back of the Type-C can be tested without plugging and unplugging. The control end can switch the front and back sides through a fixed procedure, or it can switch by receiving the tester's command, which improves the convenience of the tester in testing Type-C.

In some implementations of the USB Type-C port functional test system, it also includes,

When the Type-C port is tested positively, the positive communication signal is sequentially transmitted through the first pin group of the first switch chip, the third pin group of the first switch chip, and the third pin group of the second switch chip to the first pin group or the second pin group of the second switch chip, and then transmitted from the first pin group or the second pin group of the second switch chip to the test end for testing;

When the back side of the Type-C port is tested, the back side communication signal is sequentially transmitted through the second pin group of the first switch chip, the third pin group of the first switch chip, and the third pin group of the second switch chip to the first pin group or the second pin group of the second switch chip, and then transmitted from the first pin group or the second pin group of the second switch chip to the test end for testing.

The implementation method of the system provides a specific scheme for transmitting communication signals between a mobile terminal, a first switching chip, a second switching chip and a test terminal.

In some implementations of the USB Type-C port function test system, the test end further includes: a PC end and a USB end,

The PC is used to perform a host mode test on the Type-C.

The USB terminal is used to perform client mode testing on the Type-C.

The test end can choose different test devices to test at the same time, which can improve the tester's testing efficiency.

In some implementations of the USB Type-C port functional test system, the functional test circuit board is further provided with:

A first port, wherein the first port is used to connect the mobile terminal and the first switch chip;

A second port, the second port is used to connect the PC end and the first pin set of the second switch chip;

A third port, the third port is used to connect the USB port and the second pin group of the second switching chip.

The first port, the second port and the third port serve as the connection between the mobile terminal, the functional test circuit board and the test terminal, making it convenient for the tester to replace different mobile terminals and test terminals.

In a second aspect, the present invention discloses a USB Type-C port function testing method, which includes a mobile terminal, a test terminal and a functional test circuit board. The functional test circuit board includes a first switching chip, a second switching chip, and a control terminal. The first switching chip and the second switching chip are connected in reverse series,

Includes steps:

Connect the mobile terminal, functional test circuit board and test terminal in sequence;

When the Type-C port front test is performed, the control end controls the front communication signal of the Type-C port to be connected to the first switch chip, so that the front communication signal is transmitted to the second switch chip through the first switch chip, and then transmitted to the test end by the second switch chip for testing;

When performing the reverse test of the Type-C port, the control end switches the reverse communication signal of the Type-C port to connect with the first switch chip, so that the reverse communication signal is transmitted to the second switch chip via the first switch chip, and then transmitted to the test end by the second switch chip for testing.

In this method, the Type-C is connected to the test end through the functional circuit board designed by the system, so that the front and back sides of the Type-C can be tested without plugging and unplugging the Type-C and flipping it, which saves the time of the tester in testing the Type-C.

In some implementations of the USB Type-C port function testing method, the first switching chip is provided with a first pin group, a second pin group and a third pin group, and also includes:

When performing the step of testing the front side or the back side of the Type-C port, the control end controls the connection between the communication signal on the front side or the back side of the Type-C port and the first switch chip by using the first pin group to receive the communication signal on the front side of the Type-C port and using the second pin group to receive the communication signal on the back side of the Type-C port;

The third pin group is used to transmit the front or back communication signal received by the first switching chip from the first switching chip to the second switching chip.

The first pin group, the second pin group and the third pin group provided inside the first switching chip and the second switching chip are communication signals at the mobile terminal, the first switching chip, the second switching chip and the test terminal. The communication link nodes for signal transmission facilitate the selection of communication links between different test terminals, Type-C front side and Type-C back side.

In some implementations of the USB Type-C port function testing method, it also includes:

When the control end controls the communication signal on the front or back side of the Type-C port to connect to the first switch chip, the control end switches the conduction state of the Type-C port connected to the first pin group or the second pin group to achieve the control of switching the front and back sides of the Type-C port.

As part of the functional test board, the control terminal switches the conduction state between the functional test board and the Type-C on the front or back, allowing the front or back of Type-C to be tested without plugging or unplugging. The control terminal can be switched internally through a fixed switch The front and back programs can also be switched by receiving instructions from the tester, which improves the convenience of testers testing Type-C.

In some implementations of USB Type-C port function testing, the test end includes: a PC end and a USB end,

After receiving the signal sent by the second switching chip to the test end, the PC end performs a host end mode test on the Type-C.

After receiving the signal sent by the second switching chip to the test terminal, the USB terminal performs client mode testing on the Type-C.

The test end can choose different test devices to test at the same time, which can improve the tester's testing efficiency.

Compared with the prior art, the present invention has at least one of the following beneficial effects:

1. In this application, the control end is switched to read the signal from the front or back of USB Type-C to the first switching chip, so as to directly test the front and back of USB Type-C without plugging or unplugging. USB Type-C passes two The switching chips connected in reverse series connect USB Type-C to multiple test devices to test multiple test devices at the same time. This eliminates the need to plug and unplug USB Type-C for different test devices and avoids the need for testers to plug and unplug USB. Type-C is a waste of time and the leakage of defective products caused by testers’ misoperation of plugging and unplugging.

2. In this application, the first switching chip and the second switching chip in the functional test circuit board each include a first pin group, a second pin group and a third pin group. The first pin of the first switching chip The pins of the pin group and the second pin group serve to obtain the signals on both sides of the USB Type-C after being inserted into it. The third pin group of the first switching chip plays the role of transmitting signals to the second switching chip. The pins of the third pin group of the second exchange chip function to receive the signal transmitted by the first exchange chip, and the first pin group and the second pin group of the second exchange chip function to transmit the signal to different test devices. , through this method of signal transmission between pins within the chip, the first switching chip and the second switching chip realize the sending and receiving of Type-C communication signals on both sides to different devices without the need for plugging and unplugging.

3. In this application, the test device can choose a client device or a host device to connect to the second switching chip to better meet different testing needs and conduct tests simultaneously, and USB Type-C can be connected to multiple devices at the same time through the second switching chip. Each client or host device also avoids the waste of time caused by plugging and unplugging USB Type-C when the tester switches different devices for testing in different modes, and the leakage of defective products caused by the tester's misoperation of plugging and unplugging.

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the specific implementation of the present invention will be described below with reference to the drawings. Obviously, the drawings described below are only some embodiments of the present invention, and for those with ordinary knowledge in the field, other drawings and other implementations can be obtained based on these drawings without making any progressive efforts.

In order to keep the drawings concise, only the parts related to the invention are schematically shown in each figure, and they do not represent the actual structure of the product. In addition, in order to make the drawings concise and easy to understand, in some drawings, only one of the components with the same structure or function is schematically illustrated or labeled. In this article, "a" not only means "only one", but can also mean "more than one".

It should be further understood that the term "and/or" used in this application specification and the appended patent application refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

In this article, it should be noted that, unless otherwise clearly stated and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense. For example, it can be a fixed connection or a detachable connection, or Integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be an internal connection between two components. For those with ordinary knowledge in the art, the specific meanings of the above terms in the present invention can be understood in specific situations.

In addition, in the description of the present application, the terms "first", "second", etc. are only used to differentiate the description and cannot be understood as indicating or implying relative importance.

In one embodiment, referring to FIG. 1 of the specification, the present invention provides a USB Type-C port function test system, which includes a mobile terminal 10, a test terminal 60, and a function test circuit board 20. The mobile terminal 10, the function test circuit board 20, and the test terminal 60 are connected in sequence, and the mobile terminal 10 and the function test circuit board 20 use a USB Type-C connection for testing, and the type of data line used for the connection between the function test circuit board and the test terminal is not specified.

The mobile terminal 10 is used to send a communication signal to the functional test circuit board 20, so that the functional test circuit board 20 forwards the communication signal to the test terminal 60 for testing.

The first switching chip 40, the second switching chip 50 and the control terminal 30 are installed on the functional test circuit board 20, wherein the first switching chip 40 and the second switching chip 50 are connected in reverse series to each other; the control terminal 30 is used to control Type- The communication signals on the front or back of the C port are connected to the first switching chip 40 so that the tester can read the communication signals on the front or back of the Type-C port without plugging or unplugging Type-C.

When performing the Type-C port front-side test, the control terminal 30 controls the front side of the Type-C port to connect with the first switching chip 40 to receive the front-side communication signal of the Type-C port. The front-side communication signal is then transmitted to the Type-C port through the first switching chip 40 The second switching chip 50 is then transferred to the test terminal 60 for testing;

When performing the Type-C port backside test, the control end 30 controls the backside of the Type-C port to be connected to the first switching chip 40 to receive the backside communication signal of the Type-C port, and then the backside communication signal is transmitted to the first switch chip 40 through the first switch chip 40 . The second switching chip 50 is then transferred to the test terminal 60 for testing.

In this system, Type-C is connected to the test terminal through the functional circuit board designed by this system. It realizes the function of testing the front and back of Type-C without plugging, unplugging and flipping Type-C, which saves the tester's time in testing Type-C. It also avoids the tester from manually inserting and unplugging the front and back of Type-C for testing, and forgetting to flip the Type-C, resulting in testing the same test surface Type-C twice. Therefore, the device is used to test Type-C on the production line. , which can reduce the missed detection rate of Type-C defective products.

Based on the previous embodiment, this embodiment provides a USB Type-C port function test system with reference to Figure 3 of the specification. One side of the Type-C data line is defined as side A, and the other side is defined as side B. The first The switching chip 40 and the second switching chip 50 are SWITCH IC 1 and SWITCH IC 2 in Figure 3 respectively. There is a first pin group inside, including a pair of HSB pins and two pairs of SSB pins, for receiving Type-C Port A side communication signal; the second pin group includes a pair of HSC pins and two pairs of SSC pins, used to receive communication signals from the other side B of the Type-C port; the third pin group includes a pair of HSA pins and two pairs of SSA pins, used to pass the A-side communication signal or B-side communication signal from SWITCH IC 1 to SWITCH IC 2.

In the system of the present embodiment, the first pin group, the second pin group and the third pin group provided inside SWITCH IC 1 and SWITCH IC 2 are communication link nodes for signal transmission between the mobile end, the first switch chip, the second switch chip and the test end, so that the first switch chip and the second switch chip can divide different communication links according to the test end required by the test and the front and back sides of the Type-C required.

In some implementations, the first exchange chip and the second exchange chip can also be designed with chips with corresponding numbers of pin groups according to the number of test devices required for production line testing. The first exchange chip and the second exchange chip are still reversely connected in series through a set of the same pin groups (pin group A of the first exchange chip and pin group B of the second exchange chip). The first exchange chip selects two sets of pin groups from multiple sets of pin groups, which are designed to transmit communication signals with pin group A. They are used to receive communication signals from the front and back of Type-C respectively. The communication signals are transmitted to the test devices connected to the multiple sets of pin groups of the second exchange chip via pin group A and pin group B.

Based on the above embodiment, this embodiment provides a USB Type-C port function test system, which uses an MCU controller as the control end and switches the first pin group and the second pin connected to the Type-C port through the MCU controller. The conduction state of the group controls the switching of Type-C port A and B. It is used for SWITCH IC 1 to receive the Type-C port communication signal from side A or B. The MCU controller switches to the first pin according to the preset program. The group and the second pin group set a fixed conduction sequence, and the corresponding Type-C front and back communication signals are obtained according to this sequence.

For example, the program sequence is to first set the first pin group to be conductive and the second pin group to be non-conductive, then the test end receives the communication signal of side A through SWITCH IC 1 and SWITCH IC 2, and then set the first pin group to be non-conductive and the second pin group to be conductive, then the test end receives the communication signal of side B through SWITCH IC 1 and SWITCH IC 2. Since the test sequence is determined by the MCU preset program, the test end can directly determine that the first received signal is the communication signal of side A and the later received signal is the communication signal of side B according to the MCU controller preset program, which improves the test efficiency of the tester in testing Type-C.

This embodiment provides a USB Type-C port function test system based on the above embodiment. The MCU controller also includes an external port for receiving a signal from a tester to manually select and read the Type-C front or back communication signal. The MCU controller sets the corresponding conduction state for the first pin group and the second pin group according to the signal sent by the tester, thereby obtaining the Type-C A side or B side communication signal required by the tester.

When the tester detects the defective side A or B of Type-C, the retest only needs to test the defective side of Type-C again. For example, when the tester detects the defective side A of Type-C, the first lead The pin group is set to conduction, and the second pin group is set to non-conduction. The test end only tests the Type-C side A communication signal. Using this external port can improve the tester's efficiency in retesting defective products.

This embodiment provides a USB Type-C port function test system based on the above embodiment. When testing the A side of the Type-C port, the communication signal of the A side is sequentially transmitted through the first pin group of SWITCH IC 1, the third pin group of SWITCH IC 1, and the third pin group of SWITCH IC 2 to the first pin group or the second pin group of SWITCH IC 2, and then transmitted from the first pin group or the second pin group of SWITCH IC 2 to the test terminal 60 for testing.

When the Type-C port is tested on the back side, the back side communication signal is passed through the second pin group of SWITCH IC 1, the third pin group of SWITCH IC 1, and the third pin group of SWITCH IC 2 to the SWITCH IC 2. The first pin group or the second pin group is then passed from the first pin group or the second pin group of SWITCH IC 2 to the test terminal for testing.

Based on the above embodiment, this embodiment provides a USB Type-C port function test system. The test terminal includes: PC terminal and USB terminal. The PC terminal is connected to the first pin group of SWITCH IC 2 for receiving The received communication signal of SWITCH IC 2 is used to test Type-C in host mode; the USB end is connected to the second pin group of SWITCH IC 2, which is used to perform client mode test on Type-C through the received communication signal of SWITCH IC 2. End mode test. The test end uses a variety of devices to connect to SWITCH IC 2, which can test Type-C communication data connected to multiple devices at the same time, saving testing time.

In some implementations, the test end can also choose to test test devices of different port types, for example, using any one or more of the test ends of USB1.0, USB2.0, USB3.0 and DisplayPort ports for testing to ensure that the tested Type-C can communicate normally with test devices of different port types.

In one embodiment, referring to Figure 2 of the specification, the present invention provides a USB Type-C port functional testing method, including a mobile terminal, a testing terminal and a functional testing circuit board. The functional testing circuit board includes a first switching chip, a second switching chip The chip, the control terminal, the first switching chip and the second switching chip are connected in reverse series. The method includes the steps:

S101: Connect the mobile terminal, functional test circuit board and test terminal in sequence. The mobile terminal and functional test circuit board are connected using USB Type-C for testing. There are no regulations on the type of data cable connected between the functional test circuit board and the test terminal;

S102: Choose whether to test the front side of USB Type-C through the control terminal, so that you can flexibly switch the front and back sides of USB Type-C for testing. There is no need to plug in, pull out and flip USB Type-C, which saves the tester's time. Specifically, you can Use MCU controller as the control terminal;

S103: When performing a front test of the Type-C port, the control end controls the front communication signal of the Type-C port to be connected to the first switch chip;

S104: When performing the Type-C port backside test, the control end switches the backside communication signal of the Type-C port to connect to the first switching chip;

S105: Transfer the front or back communication signal received by the first switching chip from the first switching chip to the second switching chip;

S106: The front or back communication signal is then transmitted from the second switch chip to the test end to test whether the current Type-C is a defective product.

In this method, Type-C is connected to the test end through a functional circuit board, so that the front and back sides of Type-C can be tested without plugging and unplugging and flipping Type-C, which saves the tester's time for testing Type-C and avoids the tester forgetting to flip Type-C when manually plugging and unplugging the front and back sides of Type-C for testing, resulting in testing the same test side Type-C twice. Therefore, using this equipment to test Type-C on the production line can reduce the missed detection rate of Type-C defective products.

Based on the previous embodiment, this embodiment provides a USB Type-C port function testing method with reference to Figure 3 of the specification. In this method, the first switching chip and the second switching chip specifically use SWITCH IC 1 and SWITCH IC 2. , it has a first pin group inside, including a pair of HSB pins and two pairs of SSB pins, used to receive Type-C port A side communication signals; the second pin group includes a pair of HSC pins and two pairs of SSB pins. The SSC pin is used to receive Type-C port B side communication signals; and the third pin group includes a pair of HSA pins and two pairs of SSA pins, used to transmit the front communication signal or the back communication signal from the SWITCH IC 1 is passed to SWITCH IC 2, the method includes:

When performing the front-side test or the back-side test of the Type-C port, the control end switches the conduction status of the first pin group and the second pin group to control the selection of communication signals and signals on one of the front and back sides of the Type-C port. The connection status of the first switching chip. Specifically, the control end connects the first pin to Type-C, disconnects the second pin from Type-C, and SWITCH IC 1 receives the Type-C port front communication. signal; the control end disconnects the first pin from Type-C, connects the second pin with Type-C, and SWITCH IC 1 receives the communication signal from the Type-C port;

To transmit the front or back communication signal received by SWITCH IC 1 to SWITCH IC 2, SWITCH IC 1 and SWITCH IC 2 are connected in reverse series through the third pin of SWITCH IC 1 and SWITCH IC 2, so that they can communicate with each other.

In the method of this embodiment, the first pin group, the second pin group and the third pin group provided inside SWITCH IC 1 and SWITCH IC 2 are used for communication signals on the mobile terminal, the first switching chip, and the third pin group. The communication link node for signal transmission between the two switching chips and the test terminal facilitates the first switching chip and the second switching chip to divide different communication links according to the test terminal required for testing and the required Type-C front and back sides. This method provides a communication link through which the first switching chip and the second switching chip transmit communication signals on the front or back sides, enabling the chip on the front and back of Type-C to be read without plugging or unplugging, saving testers time when testing Type-C. C time.

This embodiment provides a USB Type-C port function test method based on the above embodiment, in which the test end includes: a PC end and a USB end. After receiving the signal sent by the second switching chip to the test end, the PC end performs a host mode test on the Type-C, and after receiving the signal sent by the second switching chip to the test end, the USB end performs a client mode test on the Type-C, thereby avoiding the waste of time caused by plugging and unplugging the USB Type-C when the tester switches different devices to perform different mode tests, and the outflow of defective products caused by the tester accidentally turning it over when plugging and unplugging. The test end can also select other port type test devices according to needs to meet the test requirements for different port tests.

It should be noted that the above embodiments can be freely combined as needed. The above are only preferred embodiments of the present invention. It should be pointed out that for those with ordinary knowledge in the technical field, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be regarded as the protection scope of the present invention.

10: Mobile terminal 20: Functional test circuit board 30: Control terminal 40: First switching chip 50: Second switching chip 60: Test terminal S101-S106: Steps

The preferred embodiments will be described below in a clear and easy-to-understand manner with reference to the drawings, and the above-mentioned characteristics, technical features, advantages and implementation methods of the present invention will be further explained.

FIG1 is a block diagram of some embodiments of a USB Type-C port function test system; FIG2 is a flow chart of some embodiments of a USB Type-C port function test method; FIG3 is a specification diagram of some embodiments of a USB Type-C port function test method and system.

S101-S106: Steps

Claims (3)

A USB Type-C port function test system, characterized in that it includes: a mobile end, a test end and a function test circuit board, wherein the mobile end, the function test circuit board and the test end are connected in sequence; the function test circuit board includes: a first switch chip; a second switch chip, wherein the first switch chip and the second switch chip are connected in reverse series; a control end, used to control the connection between a communication signal on the front or back side of the Type-C port and the first switch chip; when performing a front test on the Type-C port, the control end controls the front communication signal of the Type-C port to be connected to the first switch chip, so that the front communication signal is transmitted to the second switch chip via the first switch chip, and then transmitted to the test end by the second switch chip for testing. When the Type-C port back test is performed, the control end switches the back communication signal of the Type-C port to connect with the first switch chip, so that the back communication signal is transmitted to the second switch chip through the first switch chip, and then transmitted to the test end by the second switch chip for testing; wherein the first switch chip and the second switch chip both include: a first pin group for receiving the front communication signal of the Type-C port; a second pin group for receiving the back communication signal of the Type-C port; a third pin group for transmitting the front communication signal or the back communication signal from the first switch chip to the second switch chip; wherein the control end switches the Type-C port to connect The conductive state of the first pin group and the second pin group of the Type-C port is controlled to switch the front and back sides of the Type-C port, and is used for the first switching chip to receive the front or back communication signal of the Type-C port; wherein, when the front side of the Type-C port is tested, the front communication signal is sequentially transmitted through the first pin group of the first switching chip, the third pin group of the first switching chip, and the third pin group of the second switching chip to the first pin group or the second pin group of the second switching chip, and then transmitted from the first pin group or the second pin group of the second switching chip to the test end for testing; when the back side of the Type-C port is tested, the back communication signal is sequentially transmitted through the second pin group of the first switching chip The first pin group of the second switch chip, the third pin group of the first switch chip, and the third pin group of the second switch chip are transmitted to the first pin group or the second pin group of the second switch chip, and then transmitted from the first pin group or the second pin group of the second switch chip to the test end for testing; wherein the test end includes: a PC end and a USB end, the PC end is used to perform a host mode test on the Type-C port, and the USB end is used to perform a client mode test on the Type-C port; wherein the first pin group of the second switch chip is connected to the PC end of the test end for host mode testing, and the second pin group of the second switch chip is connected to the USB end of the test end for client mode testing. According to the USB Type-C port function test system described in claim 1, the function test circuit board is provided with: a first port, the first port is used to connect the mobile end and the first switch chip; a second port, the second port is used to connect the PC end and the first pin group of the second switch chip; a third port, the third port is used to connect the USB end and the second pin group of the second switch chip. A USB Type-C port functional testing method, characterized by including a mobile terminal, a test terminal and a functional test circuit board, the functional test circuit board including a first switching chip, a second switching chip, a control terminal, the first switching chip and the second switching chip are connected in reverse series, including the steps of: connecting the mobile terminal, the functional test circuit board and the test terminal in sequence; when performing the Type- During the front-side test of the C port, the control end controls a front-side communication signal of the Type-C port to be connected to the first switching chip, so that the front-side communication signal is transmitted to the second switching chip through the first switching chip. Exchange chips, and then transfer the second exchange chip to the test terminal for testing; when performing the Type-C port reverse test, the control end switches a reverse communication signal of the Type-C port and the The first switching chip is connected, so that the reverse communication signal is transmitted to the second switching chip through the first switching chip, and then transmitted from the second switching chip to the test terminal for testing; wherein, the The first switching chip is provided with a first pin group, a second pin group and a third pin group, and also includes: when performing the Type-C port front test or back test, the control terminal controls After the front or back communication signal of the Type-C port is connected to the first switching chip, the front communication signal of the Type-C port is received by using the first pin group and using The second pin group receives the back communication signal of the Type-C port; the third pin group is used to transfer the front or back communication signal received by the first switching chip from the The first switching wafer is transferred to the second switching wafer; wherein the method further includes: When the control terminal controls the front or back communication signal of the Type-C port to connect to the first switching chip, the control terminal switches the Type-C port to connect to the third switching chip. The conduction state of a pin group or the second pin group controls the switching of the front and back sides of the Type-C port; wherein, the test terminal includes: a PC terminal and a USB terminal, and the PC terminal receives After receiving the signal sent by the second switching chip to the test terminal, the Type-C is tested in host mode. The USB terminal receives the signal sent by the second switching chip to the test terminal. Finally, perform a client mode test on the Type-C; wherein the first pin group of the second switching chip is connected to the PC end of the test end for host mode testing, and the third The second pin group of the two switching chips is connected to the USB terminal of the test terminal to perform client mode testing.

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