CN107543994A - The test system of Type C interface - Google Patents
The test system of Type C interface Download PDFInfo
- Publication number
- CN107543994A CN107543994A CN201710772175.8A CN201710772175A CN107543994A CN 107543994 A CN107543994 A CN 107543994A CN 201710772175 A CN201710772175 A CN 201710772175A CN 107543994 A CN107543994 A CN 107543994A
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Abstract
The invention discloses a kind of test system of Type C interface, including transferring device and controller；The transferring device is provided with the Peripheral Interface of different transport-types, and for connecting the peripheral hardware with corresponding transport-type, different peripheral interface is used for the different pins for connecting the Type C interface of Devices to test；The controller communicates to connect with the transferring device, for sending switching command to the transferring device, control the transferring device to switch different Peripheral Interface pins different from Type C interface to be attached, tested with the different pins to Type C interface.The present invention is by increasing transferring device and controller, when testing Type C interface, without plugging Type C external equipment, without the positive and negative of switching peripheral hardware, you can complete test, be also beneficial to automatic test while saving manpower.
Description
Technical field
The present invention relates to a kind of test system of Type-C interfaces.
Background technology
Type-C is a kind of connecting interface of USB (USB) interface, can be inserted into, supports regardless of front and back
The functions such as charging, data transfer, display output, can be with the previous generation interfaces such as compatible USB3.0, USB2.0, to electronic equipment
When the Type-C interfaces of (including mobile phone, tablet personal computer and notebook computer etc.) carry out batch testing, the front of Type-C interfaces
Multiple compatible equipments are tested respectively with the back side, needing tester repeatedly to plug in test process, Type-C is external to be set
It is standby to complete the test of Type-C interfaces, it is unfavorable for automated production.
The content of the invention
The technical problem to be solved in the present invention is that the Type-C interfaces of electronic equipment are carried out in the prior art in order to overcome
A kind of the defects of needing operating personnel repeatedly to plug Type-C external equipments during test to complete test, there is provided Type-C interfaces
Test system.
The present invention is that solve above-mentioned technical problem by following technical proposals：
A kind of test system of Type-C interfaces, including transferring device and controller；
The transferring device is provided with the Peripheral Interface of different transport-types, for connecting with the outer of corresponding transport-type
If different peripheral interface is used for the different pins for connecting the Type-C interfaces of Devices to test；
The controller communicates to connect with the transferring device, for sending switching command, control to the transferring device
The transferring device switches different Peripheral Interface pins different from Type-C interfaces and is attached, with to Type-C interfaces
Different pins are tested.
In this programme, 24 pins of Type-C interfaces are drawn using transferring device, the difference of Type-C interfaces is drawn
Pin is connected to the corresponding Peripheral Interface of transferring device according to the demand of different transport-types, and connection is controlled not by controller
Same Peripheral Interface, so as to realize the test to Type-C interface difference in functionalitys.
It is preferred that the transferring device includes PCB, the Peripheral Interface is arranged in the PCB.
It is preferred that the Peripheral Interface includes USB2.0 interfaces, USB3.1 interfaces and Audio interfaces.
It is preferred that the test system also includes test cell, the test cell is used to draw to what is currently connected
Pin is tested, and test result is generated after the completion of test.
It is preferred that the test cell is additionally operable to generate feedback command and sent to the controller, the feedback command
The test for characterizing the current pin connected is completed；
The controller generates the switching command according to the feedback command.
In this programme, after the completion of test cell is tested the pin currently connected, generation feedback command is sent to
Controller, controller receives to be switched next Peripheral Interface pin corresponding with Type-C interfaces after feedback command and is connected again
Connect.
It is preferred that the test cell is connected with the controller by data wire, the data wire is described for transmitting
Feedback command.
It is preferred that the test cell includes the first wireless communication module, the controller includes the second radio communication mold
Block；
The test cell is additionally operable to that the feedback command is passed through into first radio communication by Radio Transmission Technology
Module is sent to second wireless communication module；
The controller is additionally operable to receive the feedback command by second wireless communication module.
It is preferred that the Radio Transmission Technology includes any one in 2G, 3G, 4G and Wi-Fi.
It is preferred that the test system also includes display unit, the display unit communicates to connect with the test cell；
The test cell is additionally operable to send the test result to the display unit；
The display unit is used to receive and show the test result.
It is preferred that the test system also includes scanning element, the scanning element electrically connects with the controller；
The display unit is additionally operable to generate Quick Response Code according to the test result and shows the Quick Response Code；
The scanning element is used to identify the Quick Response Code and generates the switching command.
The positive effect of the present invention is：According to the test mode of determinand Type-C interfaces, controller generation is cut
Signal is changed, the different pins of switching Type-C interfaces connect the different peripheral on transferring device, to complete to Type-C interfaces
Test, by increasing transferring device and controller, when testing Type-C interfaces, sets without plugging the external of Type-C
It is standby, without the positive and negative of switching external equipment, you can complete test, be also beneficial to automatic test while saving manpower.
Brief description of the drawings
Fig. 1 is the structured flowchart of the test system of the Type-C interfaces of the embodiment of the present invention 1.
Fig. 2 is the structured flowchart of the test system of the Type-C interfaces of the embodiment of the present invention 3.
Fig. 3 is the structured flowchart of the test system of the Type-C interfaces of the embodiment of the present invention 4.
Fig. 4 is the structured flowchart of the test system of the Type-C interfaces of the embodiment of the present invention 5.
Embodiment
The present invention is further illustrated below by the mode of embodiment, but does not therefore limit the present invention to described reality
Apply among a scope.
Embodiment 1
A kind of test system of Type-C interfaces, specifically as shown in figure 1, including transferring device 1 and controller 2；
The transferring device 1 is provided with the Peripheral Interface of different transport-types, for connecting with the outer of corresponding transport-type
If different peripheral interface is used for the different pins for connecting the Type-C interfaces of Devices to test；
The controller 2 communicates to connect with the transferring device 1, for sending switching command, control to the transferring device 1
Make the transferring device 1 and switch different Peripheral Interfaces pin different from Type-C interfaces and be attached, to be connect to Type-C
The different pins of mouth are tested.
In the present embodiment, 24 pins of Type-C interfaces are drawn using transferring device, table 1 shows Type-C interfaces
24 pins, the different pins of Type-C interfaces are connected to corresponding to transferring device according to the demand of different transport-types
Peripheral Interface, different Peripheral Interfaces is connected to control by controller, so as to realize the survey to Type-C interface difference in functionalitys
Examination.
Table 1
Embodiment 2
The test system of the Type-C interfaces of the present embodiment is further improved on the basis of embodiment 1, the transfer
Device includes PCB, and the Peripheral Interface is arranged in the PCB, and the Peripheral Interface connects including USB2.0
Mouth, USB3.1 interfaces and Audio interfaces, table 2 show positive back side USB2.0 interfaces, positive back side USB3.1 interfaces and the positive back side
The corresponding relation of Audio interfaces pin different from Type-C interfaces, the front and back in table 2 correspond to same type of respectively
External equipment is just inserting Peripheral Interface and anti-plug enters the situation of Peripheral Interface.In addition, the type of Peripheral Interface is not limited to USB2.0
Interface, USB3.1 interfaces and Audio interfaces, can also accordingly expand the interface of other functions, on demand with the difference of Type-C interfaces
Pin connects.
Table 2
| Peripheral Interface | The pin of the Type-C interfaces of corresponding connection | |
| USB2.0 | A1、A4、A6、A7、A9、A12、CC1 | Front |
| USB2.0 | B1、B4、B6、B7、B9、B12、CC2 | The back side |
| USB3.1 | A1、A2、A3、A4、A9、A10、A11、A12、CC1 | Front |
| USB3.1 | B1、B2、B3、B4、B9、B10、B11、B12、CC2 | The back side |
| Audio | A1、A6、A7、A8、A12、B1、B6、B7、B8、B12、CC1 | Front |
| Audio | A1、A6、A7、A8、A12、B1、B6、B7、B8、B12、CC2 | The back side |
Specifically, working as needs be connected with the external equipment for possessing USB2.0 functions (such as mobile hard disk) to Type-C interfaces
When being tested, need respectively just inserting mobile hard disk and two kinds of situations of anti-plug are tested, when aligning reeve row test, controller
Switching transferring device cause A1, A4, A6, A7, A9, A12, CC1 pin in 24 pins being drawn by Type-C interfaces with it is right
The external equipment on the positive Peripheral Interfaces of USB2.0 is answered to connect, so as to carry out the USB2.0 of Type-C interfaces tests, accordingly,
When testing anti-plug, controller switching transferring device cause B1, B4 in 24 pins being drawn by Type-C interfaces,
B6, B7, B9, B12, CC2 pin are tested with the external equipment connection at the corresponding USB2.0 back sides.
It is corresponding, it is necessary to connect just the inserting and when anti-plug is tested of different external connection equipment to Type-C interfaces, only need to be by
Controller control transferring device switches corresponding pin in 24 pins for causing the extraction of Type-C interfaces and connect with corresponding peripheral hardware
External equipment connection on mouth can be completed to test.
Wherein, 24 pins of Type-C interfaces are communicated in PCB, controller is by controlling each pin
Connection, so as to realize the connection from the external equipment of different Peripheral Interfaces, to complete to the different pins of Type-C interfaces
Test；Or, the different pins of Type-C interfaces are connected to pair of transferring device according to the demand of different transport-types in advance
The Peripheral Interface answered, and in Peripheral Interface set switch, controller by switch the switch in Peripheral Interface realize with it is right
The connection for the Peripheral Interface answered, to complete the test to the different pins of Type-C interfaces.
Embodiment 3
The test system of the Type-C interfaces of the present embodiment is further improved on the basis of embodiment 1, specific such as Fig. 2
Shown, the test system also includes test cell 3, and the test cell 3 is used to survey the pin currently connected
Examination, generates test result and generates feedback command and send to the controller 2 after the completion of test, the feedback command characterizes current
The test of the pin connected is completed；
The controller 2 generates the switching command according to the feedback command.
Further, test cell 3 is connected with controller 2 by data wire, and the data wire refers to for transmitting the feedback
Order；
In the present embodiment, after the completion of test cell is tested the pin currently connected, generation feedback command is sent
To controller, controller switches the pin progress corresponding with Type-C interfaces of next Peripheral Interface again after receiving feedback command
Connection, can setting needs the Peripheral Interface type tested and test on demand in test cell during actual test
Sequentially, such as when the Type-C interfaces to non-smart mobile phone are tested, can selectivity to USB2.0 interfaces and
USB3.1 interfaces are tested, at the same in test cell limit according to positive USB2.0, back side USB2.0, positive USB3.1 and
Back side USB3.1 order is tested successively.
Embodiment 4
As shown in figure 3, the test system of the Type-C interfaces of the present embodiment is roughly the same with embodiment 3, difference is,
The test cell 3 includes first communication module 31, and the controller 2 includes second communication module 21, it is specific as shown in figure 3,
The test cell is additionally operable to send out the feedback command by first wireless communication module 31 by Radio Transmission Technology
Deliver to second wireless communication module 21；
The controller 2 is additionally operable to receive the feedback command by second wireless communication module 21.
The Radio Transmission Technology includes any one in 2G, 3G, 4G and Wi-Fi.
In the present embodiment, communication module is respectively equipped with test cell and controller, is transmitted by Radio Transmission Technology
The feedback command.
Embodiment 5
As shown in figure 4, the test system of the Type-C interfaces of the present embodiment is further changed on the basis of embodiment 3
Enter, the test system also includes display unit 4, and the display unit 4 communicates to connect with the test cell 3；
The test cell 3 is additionally operable to send the test result to the display unit 4；
The display unit 4 is used to receive and show the test result.
Further, the test system also includes scanning element 5, and the display unit 4 is additionally operable to be tied according to the test
Fruit generates Quick Response Code and shows the Quick Response Code；
The scanning element 5 is used to identify the Quick Response Code and generates the switching command.
In the present embodiment, consider that the external equipment of a type is at least inserted in the test of Type-C interfaces, transferring device is extremely
Switch the situation that a Peripheral Interface corresponds to the insertion of external equipment front and back side insertion respectively less, test cell is to current connection
Pin test after the completion of the feedback command that terminates of generation characterization test to controller, the feedback command needs in time and stably
The test for being transferred to controller, could effectively ensuring test system, by data wire or Radio Transmission Technology, believed
Number interference the problems such as when may result in the not smooth of test process, can be subtracted by way of two-dimensional code scanning in the present embodiment
Less or avoid above-mentioned interference problem.
Wherein, display unit receive test cell transmission test result after, according to test result generate Quick Response Code, two
The information that the test of the current pin connected is completed is contained in dimension code, scanning means, which identifies Quick Response Code and generates switching, to be referred to
Order, controller further switch another Peripheral Interface according to switching command and connected with the corresponding pin of Type-C interfaces.
Although the foregoing describing the embodiment of the present invention, it will be appreciated by those of skill in the art that these
It is merely illustrative of, protection scope of the present invention is defined by the appended claims.Those skilled in the art is not carrying on the back
On the premise of principle and essence from the present invention, various changes or modifications can be made to these embodiments, but these are changed
Protection scope of the present invention is each fallen within modification.
Claims (10)
1. a kind of test system of Type-C interfaces, it is characterised in that the test system includes transferring device and controller；
The transferring device is provided with the Peripheral Interface of different transport-types, for connecting the peripheral hardware with corresponding transport-type, no
It is used for the different pins of Type-C interfaces for connecting Devices to test with Peripheral Interface；
The controller and the transferring device communicate to connect, for sending switching command to the transferring device, described in control
Transferring device switches different Peripheral Interface pins different from Type-C interfaces and is attached, with the difference to Type-C interfaces
Pin is tested.
2. test system as claimed in claim 1, it is characterised in that the transferring device includes PCB, the peripheral hardware
Interface is arranged in the PCB.
3. test system as claimed in claim 1, it is characterised in that the Peripheral Interface includes USB2.0 interfaces, USB3.1
Interface and Audio interfaces.
4. test system as claimed in claim 1, it is characterised in that the test system also includes test cell, the survey
Examination unit is used to test the pin currently connected, and test result is generated after the completion of test.
5. test system as claimed in claim 4, it is characterised in that it is concurrent that the test cell is additionally operable to generation feedback command
The controller is delivered to, the test that the feedback command characterizes the current pin connected is completed；
The controller generates the switching command according to the feedback command.
6. test system as claimed in claim 5, it is characterised in that the test cell passes through data wire with the controller
Connection, the data wire are used to transmit the feedback command.
7. test system as claimed in claim 5, it is characterised in that the test cell includes the first wireless communication module,
The controller includes the second wireless communication module；
The test cell is additionally operable to that the feedback command is passed through into first wireless communication module by Radio Transmission Technology
Send to second wireless communication module；
The controller is additionally operable to receive the feedback command by second wireless communication module.
8. test system as claimed in claim 7, it is characterised in that the Radio Transmission Technology includes 2G, 3G, 4G and Wi-
Any one in Fi.
9. the test system as described in any one in claim 4-8, it is characterised in that the test system also includes display
Unit, the display unit communicate to connect with the test cell；
The test cell is additionally operable to send the test result to the display unit；
The display unit is used to receive and show the test result.
10. test system as claimed in claim 9, it is characterised in that the test system also includes scanning element, described to sweep
Unit is retouched to electrically connect with the controller；
The display unit is additionally operable to generate Quick Response Code according to the test result and shows the Quick Response Code；
The scanning element is used to identify the Quick Response Code and generates the switching command.
Priority Applications (1)
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| CN201710772175.8A CN107543994A (en) | 2017-08-31 | 2017-08-31 | The test system of Type C interface |
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|---|---|---|---|
| CN201710772175.8A CN107543994A (en) | 2017-08-31 | 2017-08-31 | The test system of Type C interface |
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Family
ID=60959187
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| CN110446029A (en) * | 2019-08-12 | 2019-11-12 | 深圳创维－Rgb电子有限公司 | Automated inspection method, system and the computer readable storage medium of electronic equipment |
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| WO2022252647A1 (en) * | 2021-05-31 | 2022-12-08 | 荣耀终端有限公司 | Charging test apparatus and method |
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