TWI823722B - Die ejector, and die suppying module and die bonding equipment including the same - Google Patents
Die ejector, and die suppying module and die bonding equipment including the same Download PDFInfo
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- TWI823722B TWI823722B TW111149045A TW111149045A TWI823722B TW I823722 B TWI823722 B TW I823722B TW 111149045 A TW111149045 A TW 111149045A TW 111149045 A TW111149045 A TW 111149045A TW I823722 B TWI823722 B TW I823722B
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H01—ELECTRIC ELEMENTS
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- H01L21/67005—Apparatus not specifically provided for elsewhere
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- H01L21/67005—Apparatus not specifically provided for elsewhere
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H01L2221/68336—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
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- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
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Abstract
Description
本發明涉及晶粒推出器和具備其的晶粒供應模組以及晶粒接合設備。The present invention relates to a die ejector, a die supply module equipped with the same, and a die bonding equipment.
半導體製程是製造能夠處理電信號的半導體產品的製程,包括在晶圓上通過氧化、曝光、蝕刻、離子植入、沉積等處理過程形成圖案的處理製程(前段製程)和對形成有圖案的晶圓通過進行切割、晶粒接合、佈線、注塑成型、標記、測試等之類過程而製造成成品形態的半導體封裝體的封裝製程(後段製程)。The semiconductor process is a process for manufacturing semiconductor products that can process electrical signals, including the process of forming patterns on the wafer through oxidation, exposure, etching, ion implantation, deposition and other processes (front-end process) and the processing of patterned wafers. The packaging process (back-end process) in which semiconductor packages are manufactured into finished products through processes such as cutting, die bonding, wiring, injection molding, marking, and testing.
晶粒接合是將通過切斷(切割)從晶圓單個化的晶粒(Die)附著於基板(例如:PCB(Printed Circuit Board;印刷電路板))的製程,大體包括從晶圓分離晶粒的過程和將晶粒接合於基板的過程。分離晶粒的過程包括擴大晶粒之間的間隔的擴張過程和將晶粒從切割帶分離的推出過程。Die bonding is a process of attaching die (die) individualized from a wafer by cutting (cutting) to a substrate (for example: PCB (Printed Circuit Board; printed circuit board)), and generally includes separating the die from the wafer. The process of bonding the die to the substrate. The process of separating the grains includes an expansion process to expand the distance between the grains and a push-out process to separate the grains from the cutting zone.
另一方面,隨著因半導體製造技術的發展而晶粒的厚度變薄,發生晶粒推出過程中晶粒不能順暢地從切割帶分離的情況。因此,需要用於將晶粒從切割帶有效分離的技術。On the other hand, as the thickness of the crystal grain becomes thinner due to the development of semiconductor manufacturing technology, there are cases where the crystal grain cannot be smoothly separated from the dicing tape during the grain push-out process. Therefore, there is a need for techniques for efficient separation of grains from the dicing tape.
因此,本發明的實施例提供用於將晶粒從切割帶有效分離的晶粒推出器和具備其的晶粒供應模組以及晶粒接合設備。Therefore, embodiments of the present invention provide a die ejector for effectively separating die from a dicing tape, a die supply module and a die bonding apparatus provided with the same.
本發明的解決課題不限於以上提及的,本領域技術人員可以從下面的記載中明確地理解未提及的其它解決課題。The problems to be solved by the present invention are not limited to those mentioned above, and those skilled in the art can clearly understand other problems to be solved that are not mentioned from the following description.
根據本發明用於在晶粒接合設備中使晶粒從切割帶分離的晶粒推出器包括:推出器固定座,形成有具有一定面積的開口部以及形成在開口部周邊用於真空吸附切割帶的下部面的真空孔;推出器主體,配置為通過開口部升降而推開切割帶上的晶粒;升降驅動部,使所述推出器主體上升或者下降;以及照明單元,配置為在所述推出器主體以及所述升降驅動部的內部空間能夠升降,並朝向所述切割帶照射光。According to the present invention, a die ejector used to separate dies from a dicing tape in a die bonding equipment includes: an ejector fixed base formed with an opening with a certain area and formed around the opening for vacuum adsorption of the dicing tape. The vacuum hole on the lower surface of the ejector body; the ejector body is configured to push away the crystal grains on the cutting belt by lifting and lowering the opening; the lifting drive part makes the ejector body rise or fall; and a lighting unit is configured to The inner space of the ejector body and the lifting drive part can be raised and lowered, and the light can be irradiated toward the cutting tape.
根據本發明的實施例,照明單元可以是配置於在推出器主體以及升降驅動部的中心部形成的貫通孔的內部空間。According to an embodiment of the present invention, the lighting unit may be disposed in an internal space of a through hole formed in the center of the ejector body and the lifting drive unit.
根據本發明的實施例,照明單元包括:升降軸,位於貫通孔的內部空間,並構成為進行升降;升降主體,固定結合於升降軸的端部;以及發光部,結合於升降主體的上部。According to an embodiment of the present invention, the lighting unit includes: a lifting shaft located in the inner space of the through hole and configured to lift; a lifting body fixedly coupled to the end of the lifting shaft; and a light emitting part coupled to the upper part of the lifting body.
根據本發明的實施例,發光部可以是配置為照射紫外線(ultra-violet,UV)光。According to an embodiment of the present invention, the light-emitting part may be configured to irradiate ultraviolet (ultra-violet, UV) light.
根據本發明的實施例,發光部可以是由LED(light emitting diode;發光二極管)、鹵素燈或者雷射光源構成。According to embodiments of the present invention, the light-emitting part may be composed of an LED (light emitting diode; light-emitting diode), a halogen lamp or a laser light source.
根據本發明的實施例,晶粒推出器還可以包括:加熱部件,設置於所述貫通孔的內部空間而向所述切割帶施加熱能。According to an embodiment of the present invention, the die pusher may further include a heating component disposed in an internal space of the through hole to apply thermal energy to the cutting belt.
根據本發明的實施例,在貫通孔的內部壁可以塗布有用於反射所述照明單元的光的高反射物質。According to an embodiment of the present invention, the inner wall of the through hole may be coated with a highly reflective substance for reflecting light of the lighting unit.
根據本發明的在晶粒接合設備中供應用於安裝到基板的晶粒的晶粒供應模組包括:晶圓擴張器,用於支承附著有多個晶粒的切割帶,並擴張所述多個晶粒之間的間隔;以及晶粒推出器,使所述晶粒從所述切割帶分離。所述晶粒推出器包括:推出器固定座,形成有具有一定面積的開口部,以及形成在開口部的周邊用於真空吸附切割帶的下部面的真空孔;推出器主體,配置為通過開口部升降而推開所述切割帶上的所述晶粒;升降驅動部,使推出器主體上升或者下降;以及照明單元,配置為在推出器主體以及升降驅動部的內部空間能夠升降,並朝向切割帶照射光。A die supply module for supplying dies for mounting to a substrate in a die bonding apparatus according to the present invention includes a wafer expander for supporting a dicing tape attached with a plurality of dies and expanding the plurality of dies. a space between the die; and a die pusher to separate the die from the cutting tape. The die ejector includes: an ejector fixed seat formed with an opening having a certain area, and a vacuum hole formed around the opening for vacuum adsorption of the lower surface of the cutting tape; an ejector body configured to pass through the opening The lifting part lifts and pushes away the die on the cutting belt; the lifting driving part makes the ejector body rise or fall; and the lighting unit is configured to be able to lift and lower in the internal space of the ejector body and the lifting driving part, and toward The cutting strip is illuminated with light.
根據本發明的晶粒接合設備包括:晶粒供應模組,供應用於安裝到基板的晶粒;晶粒輸送模組,從晶粒供應模組輸送晶粒;晶粒台,被從晶粒輸送模組安放晶粒;晶粒接合模組,從晶粒台拾取晶粒而將晶粒接合到基板;以及接合台,輸送基板,並將接合完的基板傳送到料盒。晶粒供應模組包括:晶圓擴張器,用於支承附著有多個晶粒的切割帶,並擴張多個晶粒之間的間隔;以及晶粒推出器,使晶粒從切割帶分離。晶粒推出器包括:推出器固定座,形成有具有一定面積的開口部,以及形成在開口部的周邊用於真空吸附所述切割帶的下部面的真空孔;推出器主體,配置為通過開口部升降而推開切割帶上的所述晶粒;升降驅動部,使推出器主體上升或者下降;以及照明單元,配置為在推出器主體以及升降驅動部的內部空間能夠升降,並朝向所述切割帶照射紫外線光。The die bonding apparatus according to the present invention includes: a die supply module that supplies die for mounting to a substrate; a die transport module that transports die from the die supply module; and a die stage that is loaded from the die. The conveying module places the die; the die bonding module picks up the die from the die stage and joins the die to the substrate; and the bonding station transports the substrate and transfers the bonded substrate to the material box. The die supply module includes: a wafer expander, which is used to support a dicing belt attached with multiple dies and expand the distance between the multiple dies; and a die ejector, which separates the dies from the dicing tape. The die ejector includes: an ejector fixed base formed with an opening having a certain area, and a vacuum hole formed around the opening for vacuum adsorption of the lower surface of the dicing tape; an ejector body configured to pass through the opening The lifting part lifts to push away the die on the dicing belt; the lifting driving part makes the ejector body rise or fall; and the lighting unit is configured to be able to rise and fall in the internal space of the ejector body and the lifting driving part, and toward the The cutting tape is exposed to UV light.
根據本發明,由在推出器主體內配置為能夠升降的照明單元進行照射,從而可以減弱晶粒和切割帶之間的粘著力而使晶粒順暢地分離。According to the present invention, irradiation is performed by a lighting unit configured to be able to move up and down in the ejector body, thereby weakening the adhesion between the die and the dicing tape and allowing the die to be smoothly separated.
本發明的效果不限於以上提及的,本領域技術人員可以從下面的記載中明確地理解其它未提及的效果。The effects of the present invention are not limited to those mentioned above, and those skilled in the art can clearly understand other unmentioned effects from the following description.
以下,參照所附的附圖詳細地說明本發明的實施例,以使得本發明所屬技術領域中具有通常知識的人能夠容易地實施。本發明可以以各種不同方式實現,不限於在此說明的實施例。Hereinafter, embodiments of the present invention are described in detail with reference to the attached drawings so that those with ordinary knowledge in the technical field to which the present invention belongs can easily implement it. The invention can be implemented in various ways and is not limited to the embodiments described here.
為了清楚地說明本發明,省略了與說明無關的部分,整體說明書中對相同或類似的構成要件標注相同的附圖標記。In order to clearly explain the present invention, parts irrelevant to the description are omitted, and the same or similar components are given the same reference numerals throughout the entire specification.
另外,在多個實施例中,對具有相同結構的構成要件,使用相同的附圖標記來僅說明代表性實施例,在其它實施例中僅說明與代表性實施例不同的結構。In addition, in a plurality of embodiments, the same reference numerals are used for constituent elements having the same structure, and only representative embodiments are described. In other embodiments, only structures different from the representative embodiments are described.
在說明書整體中,當表述某部分與其它部分“連接(或者結合)”時,其不僅是“直接連接(或者結合)”的情況,還包括隔著其它部件而“間接連接(或者結合)”的情況。另外,當表述某部分“包括”某構成要件時,只要沒有特別相反記載,其意指可以還包括其它構成要件而不是排除其它構成要件。Throughout this specification, when it is stated that a certain part is "connected (or combined)" to another part, it does not only mean "directly connected (or combined)", but also includes "indirect connection (or combined)" through other components. situation. In addition, when it is stated that a certain part "includes" a certain constituent element, as long as there is no special statement to the contrary, it means that other constituent elements may also be included rather than excluded.
只要沒有不同的定義,包括技術或科學術語在內在此使用的所有術語具有與本發明所屬技術領域中具有通常知識者一般所理解的含義相同的含義。在通常使用的詞典中定義的術語之類術語應解釋為具有與相關技術文脈上具有的含義一致的含義,只要在本申請中沒有明確定義,不會理想性或過度地解釋為形式性含義。Unless otherwise defined, all terms including technical or scientific terms used herein have the same meaning as commonly understood by a person of ordinary skill in the technical field to which this invention belongs. Terms such as terms defined in commonly used dictionaries should be interpreted to have meanings consistent with the meanings in the relevant technical context, and will not be ideally or excessively interpreted as formal meanings as long as they are not clearly defined in this application.
圖1示出能夠適用本發明的晶粒接合設備1的概要佈局。晶粒接合設備1是用於執行將通過切割製程從晶圓單個化的晶粒(Die)附著於基板(例如:PCB(Printed Circuit Board;印刷電路板))的晶粒接合製程的設備。由單個化的晶粒構成的晶圓W投放到晶粒接合設備1,各晶粒接合到裝載於料盒MZ1的基板S後,完成接合的基板S裝載到料盒MZ2。FIG. 1 shows a schematic layout of a die bonding equipment 1 to which the present invention can be applied. The die bonding apparatus 1 is an apparatus for performing a die bonding process of attaching dies (Dies) singulated from a wafer through a dicing process to a substrate (for example, a PCB (Printed Circuit Board; printed circuit board)). The wafer W composed of individualized dies is put into the die bonding equipment 1. After each die is bonded to the substrate S loaded in the magazine MZ1, the bonded substrate S is loaded into the magazine MZ2.
根據本發明的晶粒接合設備1包括:晶粒供應模組10,供應用於安裝到基板S的晶粒D;晶粒輸送模組20,從晶粒供應模組10輸送晶粒D;晶粒台30,被從晶粒輸送模組20安放晶粒D;晶粒接合模組40,從晶粒台30拾取晶粒D而接合於基板S;以及接合台50,輸送基板S,並將完成接合的基板S傳送到料盒MZ2。The die bonding apparatus 1 according to the present invention includes: a die
參照圖1,單個化成多個晶粒D的晶圓W從匣盒(未圖示)輸送到晶粒供應模組10,單個晶粒D通過晶粒供應模組10從晶圓W分離。從晶圓W分離的晶粒D通過晶粒輸送模組20輸送到晶粒台30。在此,晶粒輸送模組20可以通過龍門架25沿著水平方向(y方向)移動。Referring to FIG. 1 , a wafer W singulated into a plurality of die D is transported from a cassette (not shown) to a
通過位於上方或者下方的視頻檢查模組(未圖示),在晶粒台30執行對晶粒D的檢查,通過晶粒接合模組40,晶粒D從晶粒台30拾取之後接合到位於接合台50的基板S。同樣,晶粒接合模組40設置於龍門架35而構成為能夠沿著水平方向(y方向)移動。另外,為了確定精密的接合位置,視頻單元(未圖示)可以設置於上方。Through the video inspection module (not shown) located above or below, the inspection of the die D is performed on the die stage 30 . Through the die bonding module 40 , the die D is picked up from the die stage 30 and then bonded to the die stage 30 . The substrate S of the bonding stage 50 is bonded. Similarly, the die bonding module 40 is installed on the gantry 35 and is configured to be movable in the horizontal direction (y direction). In addition, in order to determine the precise joint position, the video unit (not shown) can be disposed above.
另一方面,晶粒接合設備1可以包括:料盒裝載機60,裝載收納有基板S的料盒MZ1,並將基板S從料盒MZ1提供到接合台50;以及料盒卸載機70,儲存並卸下對完成接合的基板S進行收納的料盒MZ2。從料盒裝載機60向接合台50供應基板S,接合台50沿著導軌45在水平方向(x方向)上移動,晶粒D通過晶粒接合模組40接合到基板S上。將晶粒D全部接合完的基板S收納到料盒MZ2。On the other hand, the die bonding apparatus 1 may include: a cassette loader 60 that loads a cassette MZ1 housing the substrate S and supplies the substrate S from the cassette MZ1 to the bonding stage 50; and a cassette unloader 70 that stores the substrate S. And remove the magazine MZ2 that stores the bonded substrate S. The substrate S is supplied from the cassette loader 60 to the bonding stage 50 , the bonding stage 50 moves in the horizontal direction (x direction) along the guide rail 45 , and the die D is bonded to the substrate S through the die bonding module 40 . The substrate S with all the dies D bonded is stored in the magazine MZ2.
以下,參照圖2對晶粒供應模組10的詳細結構進行說明。Hereinafter, the detailed structure of the
圖2示出能夠適用本發明的晶粒供應模組10的概要結構。晶粒供應模組10將單個化成多個晶粒D的晶粒D從晶圓W分離,通過晶粒輸送模組20拾取被分離的晶粒D。晶圓W通過切割製程單個化成多個晶粒D,以在下部附著有切割帶DT的狀態供應到晶粒供應模組10。雖然未具體圖示,可以是,在晶粒D的下部附著有晶粒附著膜DAF,晶粒D通過晶粒附著膜DAF臨時附著於切割帶DT。在此,切割帶DT的外廓部以通過晶圓環260固定的狀態供應到晶粒供應模組10。晶粒供應模組10可以將晶粒D從切割帶DT分離而使得晶粒輸送模組20能夠拾取。FIG. 2 shows a schematic structure of a
晶粒供應模組10包括:晶圓擴張器200,支承附著有多個晶粒D的切割帶DT,並擴張多個晶粒D之間的間隔;以及晶粒推出器100,使晶粒D從切割帶DT分離。The die
如圖2所示,晶圓擴張器200可以包括:擴張環270,固定結合於使得切割帶DT的外廓部固定的晶圓環260;以及基座環280,支承擴張環270和切割帶DT的下部。As shown in FIG. 2 , the wafer expander 200 may include: an
擴張環270結合於下方的升降機275而能夠升降,若擴張環270下降,則切割帶DT一起伸長而晶粒D之間的間隔一起張開。若晶粒D之間的間隔張開,則晶粒D可以通過晶粒推出器100從切割帶DT分離。The
圖3是根據本發明的晶粒推出器100的截面圖。晶粒推出器100是使得單個化的晶粒D從切割帶DT分離而被晶粒輸送模組20拾取的裝置。Figure 3 is a cross-sectional view of the
根據本發明的晶粒推出器100包括:推出器固定座110,形成有具有一定面積的開口部112A,以及形成在開口部112A周邊,用於真空吸附切割帶DT的下部面的真空孔112B;推出器主體120,配置為通過開口部112A升降而推開切割帶DT上的晶粒D;升降驅動部130,使推出器主體120上升或者下降;以及照明單元140,配置為能夠在推出器主體120以及升降驅動部130的內部空間升降,並朝向切割帶DT照射光。另外,可以是,晶粒推出器100包括容納升降驅動部130的圓筒形的推出器殼體150,推出器固定座110結合於推出器殼體150。The
推出器固定座110可以具有用於容納推出器主體120的內部空間。推出器固定座110可以包括:上板112,形成有使推出器主體120能夠在垂直方向上移動的貫通孔122和真空孔112B;以及固定座殼體114,具有從上板112向下方延伸的下部。在圖3中示出推出器固定座110劃分為上板112和固定座殼體114,但推出器固定座110也可以一體地構成。The ejector holder 110 may have an inner space for receiving the ejector body 120 . The ejector holder 110 may include: an upper plate 112 formed with a through hole 122 and a vacuum hole 112B that enable the ejector body 120 to move in a vertical direction; and a holder housing 114 having a hole extending downward from the upper plate 112 lower part. In FIG. 3 , the ejector holder 110 is shown to be divided into an upper plate 112 and a holder housing 114 , but the ejector holder 110 may also be formed integrally.
推出器主體120通過將晶圓W的晶粒中位於推出器主體120的上方的晶粒D向上推起來選擇性地使其分離。升降驅動部130可以包括:頭部132,結合於推出器主體120;以及驅動軸134,用於向頭部132傳送驅動力。雖未具體圖示,驅動軸134可以結合於提供驅動力的動力提供部(未圖示),動力提供部可以包括馬達、汽缸等。The ejector body 120 selectively separates the die D located above the ejector body 120 by pushing upward among the die of the wafer W. The lifting driving part 130 may include: a head 132 coupled to the ejector body 120; and a driving shaft 134 for transmitting driving force to the head 132. Although not specifically shown, the drive shaft 134 may be coupled to a power supply unit (not shown) that provides driving force, and the power supply unit may include a motor, a cylinder, or the like.
固定座殼體114的開放下部可以與推出器殼體150結合,升降驅動部130的頭部132和驅動軸134可以在推出器殼體150的內部在垂直方向上移動。推出器殼體150的上部可以插入到固定座殼體114。作為範例,如圖3所示,在推出器殼體150的上部外側面可以具備用於限制推出器殼體150插入程度的卡台。另外,可以是,在推出器主體120和頭部132之間介有密封部件172,在固定座殼體114和推出器殼體150之間介有密封部件160。The open lower part of the holder housing 114 can be combined with the ejector housing 150 , and the head 132 and the drive shaft 134 of the lifting driving part 130 can move in the vertical direction inside the ejector housing 150 . The upper portion of the ejector housing 150 can be inserted into the holder housing 114 . As an example, as shown in FIG. 3 , the upper outer surface of the ejector housing 150 may be provided with a clamping platform for limiting the insertion degree of the ejector housing 150 . In addition, the sealing member 172 may be interposed between the ejector body 120 and the head 132, and the sealing member 160 may be interposed between the holder housing 114 and the ejector housing 150.
固定座殼體114和推出器殼體150可以提供為圓筒形或者管狀,但不僅可以構成為圓形,也可以構成為多邊形。The holder housing 114 and the ejector housing 150 may be provided in a cylindrical or tubular shape, but may be configured not only in a circular shape but also in a polygonal shape.
另一方面,在固定座殼體114的內側面可以具備用於限制推出器主體120下方移動的阻擋器116。容納於推出器固定座110內的推出器主體120被設置於上板112的開口部112A限制水平方向上的移動而能夠僅在垂直方向上移動,尤其,向上方的移動被上板112限制而向下方的移動被阻擋器116限制。結果,容許推出器主體120在推出器固定座110內僅在垂直方向上移動預定距離,必要時可以一起更換推出器主體120和推出器固定座110。On the other hand, the inner surface of the holder housing 114 may be provided with a stopper 116 for restricting the downward movement of the ejector body 120 . The ejector body 120 accommodated in the ejector holder 110 is restricted from horizontal movement by the opening 112A provided in the upper plate 112 and can only move in the vertical direction. In particular, upward movement is restricted by the upper plate 112 . Movement downward is limited by blocker 116 . As a result, the ejector body 120 is allowed to move only a predetermined distance in the vertical direction within the ejector holder 110 , and the ejector body 120 and the ejector holder 110 can be replaced together when necessary.
根據本發明的實施例,當為了應對晶粒D的形狀變化而需要更換推出器主體120時,可以一起更換推出器固定座110和推出器主體120。可以預先準備由與各晶粒D的形狀對應的推出器主體120和推出器固定座110組成的更換用套件,並根據相應晶粒D的形狀來選擇推出器固定座110和推出器主體120。According to embodiments of the present invention, when the ejector body 120 needs to be replaced in order to cope with the shape change of the die D, the ejector fixing base 110 and the ejector body 120 can be replaced together. A replacement kit composed of the ejector body 120 and the ejector holder 110 corresponding to the shape of each die D can be prepared in advance, and the ejector holder 110 and the ejector body 120 can be selected according to the shape of the corresponding die D.
如圖4所示,推出器固定座110的上板112可以根據晶粒D的大小以及形狀構成為多種樣式,並可以根據需要容易地更換。可以提供如圖4的(a)、(b)那樣形成有具有彼此不同大小的正方形形狀的開口部112A的上板112,另外,可以構成為如(c)、(d)那樣形成有縱橫比彼此不同的長方形形狀的開口部112A的上板112。As shown in FIG. 4 , the upper plate 112 of the ejector holder 110 can be configured in various styles according to the size and shape of the die D, and can be easily replaced as needed. The upper plate 112 may be provided with a square-shaped opening 112A having a mutually different size as shown in (a) and (b) of FIG. 4 , and may be configured to have an aspect ratio as shown in (c) and (d). The upper plate 112 of the opening portion 112A has a rectangular shape different from each other.
另一方面,根據本發明的實施例,朝向切割帶DT照射光的照明單元140配置為能夠在推出器主體120以及升降驅動部130的內部空間升降。切割帶DT的粘著物具有在特定波長的光能夠下粘著力減弱的特性,因此照明單元140朝向切割帶DT進行照射光,從而使得切割帶DT和晶粒D之間的粘著力減弱。於是,晶粒D可以從切割帶DT更順暢地分離。On the other hand, according to the embodiment of the present invention, the lighting unit 140 that irradiates light toward the cutting tape DT is configured to be able to move up and down in the internal space of the ejector body 120 and the lifting drive unit 130 . The adhesive of the dicing tape DT has the characteristic that the adhesion force is weakened by light of a specific wavelength. Therefore, the lighting unit 140 irradiates light toward the dicing tape DT, thereby weakening the adhesion force between the dicing tape DT and the die D. Therefore, the die D can be separated from the dicing tape DT more smoothly.
另外,根據本發明的實施的照明單元140配置為在推出器主體120以及升降驅動部130的內部空間能夠升降,因此可以調節向切割帶DT施加的光的強度。如圖5所示,根據照射距離的不同施加於特定位置的光的強度發生變化,根據物質特性或製程條件,可以調節照明單元140的升降位置,從而調節照射到切割帶DT的光的強度。In addition, the lighting unit 140 according to the embodiment of the present invention is configured to be able to move up and down in the internal space of the ejector body 120 and the lifting drive part 130, so that the intensity of light applied to the cutting tape DT can be adjusted. As shown in FIG. 5 , the intensity of light applied to a specific position changes depending on the irradiation distance. According to material characteristics or process conditions, the lifting position of the lighting unit 140 can be adjusted to adjust the intensity of the light irradiated to the cutting tape DT.
另外,照明單元140配置為能夠升降,因此從作業者的角度來看能夠更容易地更換或維護照明單元140。In addition, since the lighting unit 140 is arranged to be able to move up and down, the lighting unit 140 can be replaced or maintained more easily from an operator's perspective.
根據本發明的實施例,照明單元140可以配置於在推出器主體120以及升降驅動部130的中心部形成的貫通孔122的內部空間。如圖3所示,照明單元140可以配置於在推出器主體120以及升降驅動部130的中心部形成的貫通孔122,並沿著貫通孔122的內部空間上升或者下降。可以通過上升以及下降驅動,調節從照明單元140朝向切割帶DT照射的光的強度。According to an embodiment of the present invention, the lighting unit 140 may be disposed in the inner space of the through hole 122 formed at the center of the ejector body 120 and the lifting drive part 130 . As shown in FIG. 3 , the lighting unit 140 may be disposed in the through hole 122 formed at the center of the ejector body 120 and the lifting drive part 130 , and may move up or down along the inner space of the through hole 122 . The intensity of the light irradiated from the lighting unit 140 toward the cutting tape DT can be adjusted by raising and lowering driving.
根據本發明的實施例,照明單元140可以包括:升降軸142,位於貫通孔122的內部空間,並配置為進行升降;升降主體144,固定結合於升降軸142的端部;以及發光部146,結合於升降主體144的上部。雖未具體圖示,升降軸142可以結合於提供驅動力的動力提供部(未圖示),動力提供部可以包括馬達、汽缸等。升降主體144可以形成於升降軸142的端部而提供設置發光部146的空間。According to an embodiment of the present invention, the lighting unit 140 may include: a lifting shaft 142 located in the inner space of the through hole 122 and configured to lift; a lifting body 144 fixedly coupled to the end of the lifting shaft 142; and a light emitting part 146, Combined with the upper part of the lifting body 144. Although not specifically shown, the lifting shaft 142 may be coupled to a power supply part (not shown) that provides driving force, and the power supply part may include a motor, a cylinder, etc. The lifting body 144 may be formed at an end of the lifting shaft 142 to provide a space for disposing the light emitting part 146 .
發光部146可以照射光來減弱切割帶DT和晶粒D之間的粘著力。雖未具體圖示,發光部146既可以通過電線接收供電,也可以使用內置電池的電力。另外,也可以具備用於調節通過發光部146進行的光的開/關或者光強度的控制裝置。The light emitting part 146 may irradiate light to weaken the adhesion between the dicing tape DT and the die D. Although not specifically shown in the figure, the light-emitting unit 146 may receive power through a wire or use power from a built-in battery. In addition, a control device for adjusting on/off of light or light intensity by the light emitting unit 146 may be provided.
根據本發明的實施例,發光部146可以配置為照射紫外線(ultra-violet,UV)光。實驗證明具有相當於紫外線波段的波長的光的照射下切割帶DT的粘著物硬化,因此,本發明的發光部146可以照射紫外線光來減弱切割帶DT的粘著力,使晶粒D從切割帶DT順暢地分離,防止晶粒D的損傷(裂紋)。According to an embodiment of the present invention, the light emitting part 146 may be configured to irradiate ultraviolet (ultra-violet, UV) light. Experiments have proven that the adhesive of the dicing tape DT hardens under the irradiation of light with a wavelength corresponding to the ultraviolet band. Therefore, the light-emitting part 146 of the present invention can irradiate ultraviolet light to weaken the adhesion of the dicing tape DT, so that the die D can be removed from the dicing tape DT. The tape DT is separated smoothly to prevent damage (cracks) to the die D.
根據本發明的實施例,發光部146可以由LED(light emitting diode;發光二極體)、鹵素燈或者雷射光源構成。According to an embodiment of the present invention, the light emitting part 146 may be composed of an LED (light emitting diode; light emitting diode), a halogen lamp or a laser light source.
根據本發明的實施例,還可以包括:加熱部件170,設置於貫通孔122的內部空間而向切割帶DT施加熱能。例如,如圖6所示,加熱部件170可以在推出器主體120以及升降驅動部130的中心部形成的貫通孔122的內部空間以線圈形態的熱線構成。加熱部件170向切割帶DT施加熱能,從而可以與照明單元140的光一起減弱切割帶DT的粘著力。According to an embodiment of the present invention, a heating component 170 may be further included, which is disposed in the inner space of the through hole 122 to apply thermal energy to the cutting tape DT. For example, as shown in FIG. 6 , the heating member 170 may be composed of a coil-shaped hot wire in the inner space of the through hole 122 formed at the center of the ejector body 120 and the lifting drive unit 130 . The heating member 170 applies thermal energy to the cutting tape DT, so that the adhesive force of the cutting tape DT can be weakened together with the light of the lighting unit 140 .
根據本發明的實施例,可以在貫通孔122的內部壁塗布有用於反射來自照明單元140的光的高反射物質180。例如,如圖7所示,可以在推出器主體120以及升降驅動部130的中心部形成的貫通孔122的內部壁塗布反射率高的物質。來自照明單元140的光可以以更高的比率傳送到切割帶DT。According to an embodiment of the present invention, the inner wall of the through hole 122 may be coated with a highly reflective substance 180 for reflecting light from the lighting unit 140 . For example, as shown in FIG. 7 , a substance with a high reflectivity may be coated on the inner walls of the through holes 122 formed in the center portions of the ejector body 120 and the lifting drive unit 130 . The light from the lighting unit 140 can be transmitted to the cutting tape DT at a higher rate.
另一方面,包括前面說明的照明單元140的晶粒推出器100可以適用於圖1以及圖2的晶粒供應模組10以及晶粒接合設備1。On the other hand, the
根據本發明的實施例的晶粒接合設備1包括:晶粒供應模組10,供應用於安裝到基板S的晶粒D;晶粒輸送模組20,從晶粒供應模組10輸送晶粒D;晶粒台30,被從晶粒輸送模組20安裝晶粒D;晶粒接合模組40,從晶粒台30拾取晶粒D而將其接合到基板S;以及接合台50,輸送基板S,並將接合完的基板S傳送到料盒。The die bonding apparatus 1 according to the embodiment of the present invention includes: a
晶粒供應模組10包括:晶圓擴張器200,用於支承附著有多個晶粒D的切割帶DT並擴張多個晶粒D之間的間隔;以及晶粒推出器100,使晶粒D從切割帶DT分離。The
晶粒推出器100包括:推出器固定座110,形成有具有一定的面積的開口部112A以及形成在開口部112A周邊用於吸附切割帶DT的下部面的真空孔112B;推出器主體120,配置為通過開口部112A升降而推開切割帶DT上的晶粒D;升降驅動部130,使推出器主體120上升或者下降;以及照明單元140,配置為能夠在推出器主體120以及升降驅動部130的內部空間升降,並朝向切割帶DT照射光。The
根據本發明的實施例,照明單元140可以配置於在推出器主體120以及升降驅動部130的中心部形成的貫通孔122的內部空間。According to an embodiment of the present invention, the lighting unit 140 may be disposed in the inner space of the through hole 122 formed at the center of the ejector body 120 and the lifting drive part 130 .
根據本發明的實施例,照明單元140可以包括:升降軸142,位於貫通孔122的內部空間並配置為進行升降;升降主體144,固定結合於升降軸142的端部;以及發光部146,結合於升降主體144的上部。According to an embodiment of the present invention, the lighting unit 140 may include: a lifting shaft 142 located in the inner space of the through hole 122 and configured to lift; a lifting body 144 fixedly coupled to an end of the lifting shaft 142; and a light emitting part 146 coupled to on the upper part of the lifting body 144.
根據本發明的實施例,發光部146可以配置為照射紫外線(UV)光。According to an embodiment of the present invention, the light emitting part 146 may be configured to irradiate ultraviolet (UV) light.
根據本發明的實施例,發光部146可以由LED、鹵素燈或者雷射光源構成。According to embodiments of the present invention, the light emitting part 146 may be composed of an LED, a halogen lamp, or a laser light source.
根據本發明的實施例,可以還包括:加熱部件170,設置於貫通孔122的內部空間而向切割帶DT施加熱能。According to the embodiment of the present invention, a heating component 170 may be further included, which is disposed in the inner space of the through hole 122 and applies thermal energy to the cutting tape DT.
根據本發明的實施例,可以在貫通孔122的內部壁塗布用於反射來自照明單元140的光的高反射物質180。According to an embodiment of the present invention, a highly reflective substance 180 for reflecting light from the lighting unit 140 may be coated on the inner wall of the through hole 122 .
本實施例以及說明書中所附的圖式只不過明確表示包括在本發明中的技術構思的一部分,顯而易見由本領域技術人員能夠在包括在本發明的說明書以及附圖中的技術構思的範圍內容易導出的變形例和具體實施例均包括在本發明的申請專利範圍中。The drawings attached to the present embodiment and the description only clearly illustrate a part of the technical concept included in the present invention. It is obvious that those skilled in the art can easily understand the technical concept included in the description and the drawings of the present invention. The derived modifications and specific embodiments are all included in the patentable scope of the present invention.
因此,本發明的構思不應局限於所說明的實施例,不僅是所附的申請專利範圍,與申請專利範圍等同或等價變形的所有構思屬本發明的範疇。Therefore, the concept of the present invention should not be limited to the illustrated embodiments. Not only the appended patent scope, but also all concepts that are equivalent to or equivalent to the patent scope belong to the scope of the present invention.
1:晶粒接合設備 10:晶粒供應模組 20:晶粒輸送模組 25:龍門架 30:晶粒台 35:龍門架 40:晶粒接合模組 45:導軌 50:接合台 60:料盒裝載機 70:料盒卸載機 100:晶粒推出器 110:推出器固定座 112A:開口部 112B:真空孔 112:上板 114:固定座殼體 116:阻擋器 120:推出器主體 122:貫通孔 130:升降驅動部 132:頭部 134:驅動軸 140:照明單元 142:升降軸 144:升降主體 146:發光部 150:推出器殼體 160:密封部件 170:加熱部件 172:密封部件 180:高反射物質 200:晶圓擴張器 260:晶圓環 270:擴張環 275:升降機 280:基座環 D:晶粒 DT:切割帶 MZ1:料盒 MZ2:料盒 S:基板 W:晶圓 1:Die bonding equipment 10: Die supply module 20:Die transport module 25:Gantry 30:Granule table 35:Gantry 40:Die bonding module 45: Guide rail 50:Jointing table 60:Box loader 70:Box unloader 100:Die ejector 110:Ejector holder 112A:Opening part 112B: Vacuum hole 112:On the board 114:Fixed seat shell 116:Blocker 120:Ejector body 122:Through hole 130:Lifting drive part 132:Head 134:Drive shaft 140:Lighting unit 142:Lifting shaft 144: Lifting body 146:Lighting Department 150:Ejector housing 160:Sealing parts 170: Heating parts 172:Sealing parts 180: Highly reflective material 200:Wafer expander 260:wafer ring 270: Expanding ring 275: Lift 280: base ring D: grain DT: cutting tape MZ1: Material box MZ2: Material box S:Substrate W:wafer
圖1示出能夠適用本發明的晶粒接合設備的概要佈局。FIG. 1 shows a schematic layout of a die bonding equipment to which the present invention can be applied.
圖2示出能夠適用本發明的晶粒供應模組的概要結構。FIG. 2 shows the schematic structure of a die supply module to which the present invention can be applied.
圖3示出根據本發明的晶粒推出器的截面圖。Figure 3 shows a cross-sectional view of a die ejector according to the present invention.
圖4示出根據本發明實施例的晶粒夾頭。Figure 4 illustrates a die chuck according to an embodiment of the invention.
圖5示出基於照明單元的照射距離的光強度的分佈。FIG. 5 shows the distribution of light intensity based on the irradiation distance of the lighting unit.
圖6示出根據本發明實施例的具有加熱部件的晶粒推出器。Figure 6 shows a die ejector with a heating component according to an embodiment of the present invention.
圖7示出根據本發明實施例的光反射性物質塗布於貫通孔的內壁的晶粒推出器。FIG. 7 shows a die pusher in which a light reflective material is coated on the inner wall of a through hole according to an embodiment of the present invention.
100:晶粒推出器 100:Die ejector
110:推出器固定座 110:Ejector holder
112A:開口部 112A:Opening part
112B:真空孔 112B: Vacuum hole
112:上板 112:On the board
114:固定座殼體 114:Fixed seat shell
116:阻擋器 116:Blocker
120:推出器主體 120:Ejector body
122:貫通孔 122:Through hole
130:升降驅動部 130:Lifting drive part
132:頭部 132:Head
134:驅動軸 134:Drive shaft
140:照明單元 140:Lighting unit
142:升降軸 142:Lifting shaft
144:升降主體 144: Lifting body
146:發光部 146:Lighting Department
150:推出器殼體 150:Ejector housing
160:密封部件 160:Sealing parts
172:密封部件 172:Sealing parts
Claims (17)
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KR10-2021-0189167 | 2021-12-28 | ||
KR1020210189167A KR20230100765A (en) | 2021-12-28 | 2021-12-28 | Die ejectro, and die suppying module and die bonding equipment including the same |
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TW202326909A TW202326909A (en) | 2023-07-01 |
TWI823722B true TWI823722B (en) | 2023-11-21 |
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JP (1) | JP2023098635A (en) |
KR (1) | KR20230100765A (en) |
CN (1) | CN116364579A (en) |
TW (1) | TWI823722B (en) |
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TW202139273A (en) * | 2020-03-23 | 2021-10-16 | 日商捷進科技有限公司 | Manufacturing method of chip bonding device, stripping jig and semiconductor device characterized by reducing chip cracks and defects during pickup period |
TW202207342A (en) * | 2020-07-09 | 2022-02-16 | 南韓商細美事有限公司 | Die ejector and die bonding apparatus including the same |
CN217788345U (en) * | 2022-06-29 | 2022-11-11 | 深圳市卓兴半导体科技有限公司 | Non-contact wafer stripping off device and solid brilliant machine |
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2021
- 2021-12-28 KR KR1020210189167A patent/KR20230100765A/en not_active Application Discontinuation
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2022
- 2022-12-01 CN CN202211532231.8A patent/CN116364579A/en active Pending
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TW202139273A (en) * | 2020-03-23 | 2021-10-16 | 日商捷進科技有限公司 | Manufacturing method of chip bonding device, stripping jig and semiconductor device characterized by reducing chip cracks and defects during pickup period |
TW202207342A (en) * | 2020-07-09 | 2022-02-16 | 南韓商細美事有限公司 | Die ejector and die bonding apparatus including the same |
CN217788345U (en) * | 2022-06-29 | 2022-11-11 | 深圳市卓兴半导体科技有限公司 | Non-contact wafer stripping off device and solid brilliant machine |
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TW202326909A (en) | 2023-07-01 |
JP2023098635A (en) | 2023-07-10 |
CN116364579A (en) | 2023-06-30 |
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