TWI822279B - Detection method - Google Patents
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Abstract
Description
本發明係有關一種光學檢測方法,尤指依據灰階值差異對反射之光學信號進行運算的一種光學檢測方法。 The present invention relates to an optical detection method, in particular to an optical detection method that calculates reflected optical signals based on differences in gray scale values.
現有技術之物質光學檢測方法大多是採用人工方式判讀可視化檢測內容,且判讀之結果亦多半由人工方式進行查找及運算。 Most of the existing material optical detection methods use manual methods to interpret visual detection content, and most of the interpretation results are searched and calculated manually.
然而,以人工方式對可視化檢測內容進行判讀、查找或運算等程序存在有一定程度的誤判風險,尤其是具風險性的醫學用途檢測、或法理相關的鑑識證據等,可能會因為操作者的疏忽而導致錯誤結果。 However, there is a certain degree of risk of misjudgment in manually interpreting, searching, or calculating visual test content, especially for risky medical tests or legal-related forensic evidence, which may be caused by the operator's negligence. and lead to erroneous results.
為此,如何提出一種光學檢測方法,乃為本案發明人所研究的重要課題。 For this reason, how to propose an optical detection method is an important topic studied by the inventor of this case.
本發明之目的在於提供一種光學檢測方法,藉由對可視化檢測內容進行光學之投射、反射及運算之後,自動地將與可視化檢測內容相應之檢測結果讀出,達到節約人力且提升檢測正確性之目的。 The purpose of the present invention is to provide an optical detection method that automatically reads out the detection results corresponding to the visual detection content after performing optical projection, reflection and calculation on the visual detection content, thereby saving manpower and improving detection accuracy. Purpose.
為了達到所述目的,本發明所提出的光學檢測方法包含下述步驟:提供檢測載體以及至少一查找表,檢測載體包含基準顯示區以及至少一待測顯示區;輸出檢測光至檢測載體,且使檢測光投射至基準顯示區 以及待測顯示區;接收反射自基準顯示區的基準信號以及反射自待測顯示區的待測信號且藉由判斷程序確認基準顯示區以及待測顯示區,基準信號包含基準顯示區的第一灰階值,且待測信號包含待測顯示區的第二灰階值;對該第一灰階值以及該第二灰階值經一運算後獲得一比較值;依據查找表讀取對應於比較值的內容。 In order to achieve the above object, the optical detection method proposed by the present invention includes the following steps: providing a detection carrier and at least one lookup table, the detection carrier includes a reference display area and at least one display area to be tested; outputting detection light to the detection carrier, and Project the detection light to the reference display area and a display area to be tested; receiving a reference signal reflected from the reference display area and a signal to be measured reflected from the display area to be measured, and confirming the reference display area and the display area to be tested through a judgment program, where the reference signal includes the first signal of the reference display area The grayscale value, and the signal to be measured includes the second grayscale value of the display area to be measured; a comparison value is obtained after performing an operation on the first grayscale value and the second grayscale value; and the corresponding value is read according to the lookup table. The content of the comparison value.
在某些實施例中,檢測光係依序或同時接觸該基準顯示區以及該待測顯示區。 In some embodiments, the detection light system contacts the reference display area and the display area to be tested sequentially or simultaneously.
在某些實施例中,所述之光學檢測方法更包含下述步驟:將感測第一灰階值所獲的第一電壓準位差作為基準信號;以及將感測第二灰階值所獲的第二電壓準位差作為待測信號;第一電壓準位差大於或等於第二電壓準位差。 In some embodiments, the optical detection method further includes the following steps: using the first voltage level difference obtained by sensing the first gray scale value as a reference signal; and using the first voltage level difference obtained by sensing the second gray scale value. The obtained second voltage level difference is used as the signal to be measured; the first voltage level difference is greater than or equal to the second voltage level difference.
在某些實施例中,基準顯示區於檢測載體的位置係鄰近檢測載體的其中一端部而設置。 In some embodiments, the reference display area is disposed adjacent to one end of the detection carrier at a position of the detection carrier.
在某些實施例中,判斷程序包含下述步驟:接收反射自檢測載體的多數個灰階信號;判斷該等灰階信號中具最強信號強度差之一者,作為背景信號;判斷該等灰階信號中背景信號之外的其他信號,最接近最強信號強度差之一者,作為基準信號;以及判斷該等灰階信號中背景信號以及基準信號之外的其他信號,作為待測信號。 In some embodiments, the judgment procedure includes the following steps: receiving a plurality of gray-scale signals reflected from the detection carrier; judging the one with the strongest signal intensity difference among the gray-scale signals as the background signal; judging the gray-scale signals. The signal other than the background signal in the gray-scale signal, which is closest to one of the strongest signal strength differences, is used as the reference signal; and the background signal and other signals other than the reference signal in the gray-scale signal are determined as the signal to be measured.
在某些實施例中,所述之光學檢測方法更包含下述步驟:將對基準信號以及待測信號傳輸至控制器,且控制器執行所述運算。 In some embodiments, the optical detection method further includes the following steps: transmitting the reference signal and the signal to be measured to the controller, and the controller performs the operation.
在某些實施例中,檢測光呈線型或面型,且覆設於基準顯示區的至少一部份或全部以及待測顯示區的至少一部份或全部。 In some embodiments, the detection light is in the form of a line or a surface, and covers at least part or all of the reference display area and at least part or all of the display area to be measured.
在某些實施例中,檢測光之顏色與基準顯示區以及待測顯示區之顏色皆不相同。 In some embodiments, the color of the detection light is different from the colors of the reference display area and the display area to be tested.
在某些實施例中,檢測光之顏色為基準顯示區之顏色以及待測顯示區受待測物反應後之顏色的互補色。 In some embodiments, the color of the detection light is the complementary color of the color of the reference display area and the color of the display area to be measured after being reacted by the substance to be measured.
在某些實施例中,查找表儲存於雲端伺服器。 In some embodiments, the lookup table is stored on a cloud server.
綜上所述,本發明之光學檢測方法係在檢測載體施予待測物之後,以光學方式來擷取檢測載體與待測物作用之後的可視化結果,尤其是,檢測載體上可以是採用多數個顯示區來呈現所述可視化結果,例如,用以作為對照基準之基準顯示區以及用以判讀待測物之檢測結果的待測顯示區等。繼而,可將檢測光依序或同時地投射至基準顯示區以及待測顯示區,且可依序或同時地接收反射自基準顯示區的基準信號以及反射自待測顯示區的待測信號。 To sum up, the optical detection method of the present invention is to optically capture the visual results after the interaction between the detection carrier and the object to be tested after the detection carrier is applied to the object to be tested. In particular, the detection carrier can use a plurality of A display area is used to present the visualization result, for example, a reference display area used as a reference and a test display area used to interpret the test results of the object to be tested. Then, the detection light can be projected to the reference display area and the display area to be tested sequentially or simultaneously, and the reference signal reflected from the reference display area and the test signal reflected from the display area to be tested can be received sequentially or simultaneously.
值得一提的是,所述可視化結果可以是包含灰階值差異的多數個同色或異色區塊,且檢測光的顏色可以是相對於檢測載體所呈現之待測顯示區受待測物反應後之顏色的互補色(或可稱之為對比色),用以加強對於各顯示區之灰階值差異的判讀靈敏度或解析度等。 It is worth mentioning that the visualization result can be a plurality of blocks of the same color or different colors containing differences in gray scale values, and the color of the detection light can be the result of the reaction of the test object with respect to the display area to be tested presented by the detection carrier. The complementary color (or contrasting color) of the color is used to enhance the sensitivity or resolution of the interpretation of the difference in gray scale values in each display area.
最後,對第一灰階值以及第二灰階值經運算後獲得對應於灰階值差異的比較值,且依據查找表讀取對應於比較值的內容,以做為對應待測物的檢測結果。 Finally, the first grayscale value and the second grayscale value are calculated to obtain a comparison value corresponding to the difference in grayscale value, and the content corresponding to the comparison value is read according to the lookup table to detect the corresponding object to be measured. result.
為此,本發明所述之光學檢測方法,藉由對可視化檢測內容進行光學之投射、反射及運算之後,自動地將與可視化檢測內容相應之檢測結果讀出,達到節約人力且提升檢測正確性之目的。 To this end, the optical detection method of the present invention automatically reads out the detection results corresponding to the visual detection content after performing optical projection, reflection and calculation on the visual detection content, thereby saving manpower and improving detection accuracy. purpose.
為了能更進一步瞭解本發明為達成預定目的所採取之技術、手段及功效,請參閱以下有關本發明之詳細說明與附圖,相信本發明特徵與特點,當可由此得一深入且具體之瞭解,然而所附圖式僅提供參考與說明用,並非用來對本發明加以限制者。 In order to further understand the technology, means and effects adopted by the present invention to achieve the intended purpose, please refer to the following detailed description and drawings of the present invention. I believe that the features and characteristics of the present invention can be obtained from this in-depth and specific understanding. , however, the attached drawings are only for reference and illustration, and are not intended to limit the present invention.
10:檢測載體 10:Detection carrier
11:檢測殼體 11: Detection shell
20:檢測模組 20:Detection module
21:光源 21:Light source
22:傳感器 22: Sensor
23:控制器 23:Controller
30:雲端伺服器 30:Cloud server
100:線型光 100: linear light
101:面型光 101: Surface light
102:基準信號 102: Reference signal
103:待測信號 103: Signal to be measured
A:基準顯示區 A: Reference display area
B:待測顯示區 B: Display area to be tested
C:待測顯示區 C: Display area to be tested
T:支架 T: Bracket
X0:電壓準位差 X 0 : Voltage level difference
X1:電壓準位差 X 1 : Voltage level difference
X2:電壓準位差 X 2 : Voltage level difference
X3:電壓準位差 X 3 : Voltage level difference
S1~S6、S11~S14:步驟 S1~S6, S11~S14: steps
圖1為本發明光學檢測方法之第一實施例的架構示意圖;圖2為本發明光學檢測方法之功能方塊示意圖;圖3為本發明光學檢測方法之對應檢測載體的信號反射強度示意圖;圖4為本發明光學檢測方法之第二實施例的架構示意圖;圖5為本發明光學檢測方法之流程示意圖;以及圖6為本發明光學檢測方法之判斷程序示意圖。 Figure 1 is a schematic structural diagram of the first embodiment of the optical detection method of the present invention; Figure 2 is a functional block diagram of the optical detection method of the present invention; Figure 3 is a schematic diagram of the signal reflection intensity of the corresponding detection carrier of the optical detection method of the present invention; Figure 4 is a schematic structural diagram of the second embodiment of the optical detection method of the present invention; FIG. 5 is a schematic flow chart of the optical detection method of the present invention; and FIG. 6 is a schematic diagram of the judgment procedure of the optical detection method of the present invention.
以下係藉由特定的具體實施例說明本發明之實施方式,熟悉此技術之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。本發明亦可藉由其他不同的具體實例加以施行或應用,本發明說明 書中的各項細節亦可基於不同觀點與應用在不悖離本發明之精神下進行各種修飾與變更。 The following describes the implementation of the present invention through specific embodiments. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples. The present invention illustrates Various modifications and changes in the details in the book can also be made based on different viewpoints and applications without departing from the spirit of the present invention.
須知,本說明書所附圖式繪示之結構、比例、大小、元件數量等,均僅用以配合說明書所揭示之內容,以供熟悉此技術之人士瞭解與閱讀,並非用以限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功效及所能達成之目的下,均應落在本發明所揭示之技術內容得能涵蓋之範圍內。 It should be noted that the structure, proportion, size, number of components, etc. shown in the drawings attached to this specification are only used to match the content disclosed in the specification and are for the understanding and reading of those familiar with this technology. They are not intended to limit the scope of the present invention. Any structural modifications, changes in proportions, or adjustments in size shall fall within the scope of this invention as long as it does not affect the effects that can be produced and the purposes that can be achieved. The technical content disclosed by the invention must be within the scope that can be covered.
茲有關本發明之技術內容及詳細說明,配合圖式說明如下。 The technical content and detailed description of the present invention are as follows with reference to the drawings.
圖1為本發明光學檢測方法之第一實施例的架構示意圖;圖2為本發明光學檢測方法之功能方塊示意圖;圖3為本發明光學檢測方法之對應檢測載體的信號反射強度示意圖。 Figure 1 is a schematic structural diagram of the first embodiment of the optical detection method of the present invention; Figure 2 is a functional block diagram of the optical detection method of the present invention; Figure 3 is a schematic diagram of the signal reflection intensity of the corresponding detection carrier of the optical detection method of the present invention.
如圖1所示,本發明所提出的光學檢測方法所使用之硬體架構可包含檢測載體10以及檢測模組20。
As shown in FIG. 1 , the hardware architecture used in the optical detection method proposed by the present invention may include a
檢測載體10用以承接待測物(圖中未示),可包含基準顯示區A以及待測顯示區B、待測顯示區C。
The
在所述第一實施例中,基準顯示區A於檢測載體10的位置可以是鄰近檢測載體10的其中一端部而設置(例如,最左端的顯示區或最右端的顯示區等);此外,基準顯示區A於檢測載體10的位置亦可以是依據檢測載體10上所顯示之多數個灰階的最大值(例如,任一顏色之明度最淺者或明度最深者)而設置。
In the first embodiment, the position of the reference display area A on the
值得一提的是,關於基準顯示區A位於檢測載體10上之位置的判斷程序,可參閱後續關於步驟S4之說明書內容詳述。
It is worth mentioning that for the determination procedure of the position of the reference display area A on the
如圖1及圖4所示,在所述第一實施例中,所述檢測載體10可以是構成一檢測棒的檢測殼體11所裸露出的其中一個顯示區或顯示窗,在實際操作時可以整個檢測殼體11進行檢測操作,或可僅單獨以檢測載體10進行檢測操作,為方便後續詳述,以下將採用單獨以檢測載體10進行檢測操作之實施態樣詳述。
As shown in Figures 1 and 4, in the first embodiment, the
在所述第一實施例中,基準顯示區A係用以作為檢測之可視化結果的對照基準,例如,以數位8位元之256個灰階的色彩深度為例,若基準顯示區A顯示為最接近L255灰階(即是,當檢測載體10相對於顯示區A、B、C之外的其他部分之底色為白色時,代表任一顏色之明度最深者)之可視化結果。
In the first embodiment, the reference display area A is used as a reference for the visual results of the detection. For example, taking the color depth of 256 grayscales of 8 bits as an example, if the reference display area A displays: The visualization result closest to the L255 gray scale (that is, when the background color of the
值得一提的是,所述第一實施例中,所使用之檢測載體10的顏色可以呈現為紅色系之任一色,且基準顯示區A將預設顯示為最接近第L255灰階之紅色,而各待測顯示區B、C將依據待測物與其反應之結果而呈現介於L0(即是,代表任一顏色之明度最淺者)至L255之間的具任一灰階之紅色。
It is worth mentioning that in the first embodiment, the color of the
在所述第一實施例中,基準顯示區A以及各待測顯示區B、C可以是依灰階變化呈連續或不連續地並列設置;在其中一實施態樣中,基準顯示區A的明度比待測顯示區B的明度還深,且待測顯示區B的明度比待測顯示區C的明度還深。 In the first embodiment, the reference display area A and the display areas B and C to be tested may be arranged side by side continuously or discontinuously according to gray scale changes; in one implementation, the reference display area A The brightness is deeper than the brightness of the display area B to be tested, and the brightness of the display area B to be tested is deeper than the brightness of the display area C to be tested.
在所述第一實施例中,檢測載體10之相對兩側(例如,圖1顯示之左右兩側)可進一步地具有厚度差異,以作為檢測方向或位置之防呆機構,避免在檢驗時,因為錯置方向或位置而導致讀取錯誤之檢測結果,所述防呆機構可改善檢測結果之正確性與可靠度。 In the first embodiment, the opposite sides of the detection carrier 10 (for example, the left and right sides shown in FIG. 1 ) may further have a thickness difference as a foolproof mechanism for detecting the direction or position, so as to avoid the detection during inspection. If incorrect detection results are read due to misalignment of direction or position, the anti-fool mechanism can improve the accuracy and reliability of the detection results.
值得一提的是,當以整個檢測殼體11進行檢測操作時,如前所述之防呆機構係於檢測殼體11上之相對兩側形成有厚度差異來達成;而當僅單獨以檢測載體10進行檢測操作時,如前所述之防呆機構係於基準顯示區A以及待測顯示區B、C之外的其他區域之檢測載體10的相對兩側形成有厚度差異來達成。
It is worth mentioning that when the
特別說明,本發明所界定明度的定義方式可依據實際需要採用與第一實施例所揭示的完全相反的規範,例如以L0為明度最深者,且以L255為明度最淺者。 In particular, the brightness defined in the present invention can be defined in a completely opposite specification to that disclosed in the first embodiment according to actual needs. For example, L0 is the deepest brightness, and L255 is the lightest brightness.
檢測模組20可包含光源21、傳感器22以及控制器23,且可鄰近設置於檢測載體10之一側。
The
光源21係用以發出檢測光至檢測載體10。
The
在所述第一實施例中,光源21可包括一般的發光二極體或雷射二極體(laser diode,LD)(即是,用以輸出雷射光的半導體雷射元件),且發光二極體可包含可見光範疇之紅光發光二極體(例如:鋁砷化鎵(AlGaAs)、砷化鎵磷化物(GaAsP)、磷化銦鎵鋁(AlGaInP)、磷化鎵摻雜氧化鋅(GaP:ZnO))、橙光發光二極體(例如:砷化鎵磷化物(GaAsP)、磷化銦鎵鋁(AlGaInP)、磷化鎵摻雜X(GaP:X))、黃光發光二極體(例如:砷化鎵磷化物(GaAsP)、磷化銦鎵鋁(AlGaInP)、磷化鎵摻雜氮(GaP:N))、綠光發
光二極體(例如:銦氮化鎵(InGaN)、氮化鎵(GaN)、磷化鎵(GaP)、磷化銦鎵鋁(AlGaInP)、鋁磷化鎵(lGaP))、藍光發光二極體(例如:硒化鋅(ZnSe)、銦氮化鎵(InGaN)、碳化矽(SiC))、紫光發光二極體(例如:銦氮化鎵(InGaN)),以及可包含不可見光範疇的紅外光發光二極體(例如:砷化鎵(GaAs)、鋁砷化鎵(AlGaAs))或紫外光二極體(例如:鑽石(diamond)、氮化鋁(AlN)、鋁鎵氮化物(AlGaN)、氮化鋁鎵銦(AlGaInN))等或白光二極體,且發光二極體之形式亦可包括有機發光二極體(organic light-emitting diode,OLED)。進一步而言,所述光源21可以是紅光雷射二極體、綠光雷射二極體或藍光雷射二極體之其中一者。
In the first embodiment, the light source 21 may include a general light-emitting diode or a laser diode (LD) (that is, a semiconductor laser element used to output laser light), and the light-emitting diode The polar body may include a red light-emitting diode in the visible light range (for example, aluminum gallium arsenide (AlGaAs), gallium arsenide phosphide (GaAsP), aluminum indium gallium phosphide (AlGaInP), gallium phosphide doped zinc oxide ( GaP: ZnO)), orange light-emitting diodes (for example: gallium arsenide phosphide (GaAsP), aluminum indium gallium phosphide (AlGaInP), gallium doped X phosphide (GaP: X)), yellow light-emitting diodes Polar body (for example: gallium arsenide phosphide (GaAsP), aluminum indium gallium phosphide (AlGaInP), gallium phosphide doped with nitrogen (GaP:N)), green light emitting
Photodiodes (such as indium gallium nitride (InGaN), gallium nitride (GaN), gallium phosphide (GaP), aluminum indium gallium phosphide (AlGaInP), aluminum gallium phosphide (lGaP)), blue light-emitting diodes body (such as zinc selenide (ZnSe), indium gallium nitride (InGaN), silicon carbide (SiC)), violet light-emitting diodes (such as: indium gallium nitride (InGaN)), and those that can include the invisible light range Infrared light emitting diodes (such as gallium arsenide (GaAs), aluminum gallium arsenide (AlGaAs)) or ultraviolet light diodes (such as diamond, aluminum nitride (AlN), aluminum gallium nitride (AlGaN) ), aluminum gallium indium nitride (AlGaInN), etc. or white light diodes, and the form of light-emitting diodes may also include organic light-emitting diodes (OLED). Furthermore, the
在所述第一實施例中,光源21所輸出的檢測光可包含如圖1所示之線型光100亦或是如圖4所示之面型光101,本實施例以線型光100為例。
In the first embodiment, the detection light output by the
進一步而言,當光源21輸出之檢測光為線型光100時,光源21可以是邊射型雷射(edge emitting laser,EEL);當光源21輸出之檢測光為面型光101時,光源21可以是發光二極體或面射型雷射(surface emitting laser,SEL),且所述面射型雷射可以是垂直共振腔面射型雷射(veitical cavity surface emitting laser,VCSEL),所述VCSEL亦可藉由透鏡組(圖中未示)調整投射至檢測載體10之檢測光的光型,使檢測光覆蓋基準顯示區A及待測顯示區B、C的僅一部份或全部;當然,本發明亦可使用一般發光二極體結合所述透鏡組而調整投射至檢測載體10之檢測光的光型,使檢測光覆蓋基準顯示區A及待測顯示區B、C的僅一部份或全部,以上僅示例性說明。
Furthermore, when the detection light output by the
進一步而言,可藉由調整為線型光100而減少蒐集檢測結果的資料量(例如,以反射光涵蓋於傳感器22之像素的數量作為依據),減少後端演算之負擔或加快演算速度;又或是可調整為面型光101以有限度地增加所蒐集的資料量,又兼顧不會增加後端演算過多的負擔或過於拖慢演算速度等(相對於檢測光覆蓋整個檢測載體10而言)。
Furthermore, by adjusting to the
在所述第一實施例中,光源21亦可搭配透鏡組(圖中未示)來調整投射至檢測載體10之光型,所述光型可包含線型或面型,且覆設於基準顯示區A的至少一部份或全部以及待測顯示區B、C的至少一部份或全部。
In the first embodiment, the
在所述第一實施例中,所述檢測光可同時投射在基準顯示區A、待測顯示區B以及待測顯示區C上;亦可以分次且依序地投射至基準顯示區A、待測顯示區B以及待測顯示區C上;又或可以是先投射至基準顯示區A以及待測顯示區C上,然後再投射至待測顯示區B上,藉此達到空間與時間的各種控制方式。 In the first embodiment, the detection light can be projected onto the reference display area A, the display area to be tested B, and the display area to be tested C at the same time; it can also be projected onto the reference display area A, the reference display area A, and the display area to be tested sequentially. On the display area B and the display area C to be tested; or it can be projected on the reference display area A and the display area C to be tested first, and then projected on the display area B to be tested, thereby achieving space and time Various control methods.
傳感器22用以接收反射自檢測載體10的光(包含基準信號102以及待測信號103)。
The
在所述第一實施例中,傳感器22可包含電荷耦合元件(charge-coupled device,CCD)、互補式金屬氧化物半導體(complementary metal-oxide-semiconductor,CMOS)影像感測器、攝影機或其他可擷取可見光影像之硬體,用以接收反射自基準顯示區A的基準信號102以及反射自待測顯示區B、C的待測信號103。
In the first embodiment, the
在所述第一實施例中,傳感器22的數量可以是多數個,且可排列成線型或面型之陣列形式,例如,所述陣列形式可對應檢測載體10或檢測光的形狀而變異。
In the first embodiment, the number of
值得一提的是,在所述第一實施例中,所述控制器23可利用傳感器22所感測到的對應灰階值差異之電壓準位(亦可稱之為電位)的變化來做為基準信號102以及待測信號103,即是,傳感器22可藉由接收反射自檢測載體10之反射光對傳感器22之各像素(pixel)產生的電位變化,供控制器23運算並判斷基準信號102以及待測信號103。
It is worth mentioning that in the first embodiment, the
在所述第一實施例中,控制器23與光源21以及傳感器22電性連接並提供控制信號進行操控運作,所述控制器23可包含電子電路與韌體(firmware),具體而言控制器23可為微控制器(Microcontroller,MCU)或其他具同功能之元件,並用以對應於具灰階值差異的可視化結果,對基準信號102以及待測信號103經運算後獲得比較值,所述運算將在如下關於圖3及圖5之方法流程說明中詳述。
In the first embodiment, the
進一步而言,所述傳感器22係對基準信號102中的第一灰階值以及待測信號103中的第二灰階值進行感應而產生訊號波型,而於控制器23對訊號波型進行雜訊處理後再進行所述運算,藉由不同灰階值之交互運算來獲得所述比較值。
Furthermore, the
在所述第一實施例中,傳感器22對於灰階值差異之感測係依據所接收到反射自檢測載體10的光強度差異來達成,當不同顯示區(例如,A、B、C)具有灰階值差異時,傳感器22的接收訊號即不同,控制器23係藉由不同光強度所對應之電位與檢測載體10之該等顯示區之外的其
他部分的電壓準位差(例如,X0)進行比較,而獲得對應不同顯示區的電壓準位差(例如,X1、X2、X3),來作為對應不同顯示區的信號(例如,基準信號102、待測信號103),至於X0、X1、X2、X3的獲得方式將在以下關於步驟S5之內容中詳述。
In the first embodiment, the
值得一提的是,所述可視化結果可以是包含灰階值差異的多數個同色或異色區塊,且線型光100的顏色可以是相對於檢測載體10所呈現之各顯示區(例如,待測顯示區B、待測顯示區C受待測物反應後之顏色的互補色(或可稱之為對比色)。例如,在本發明之所述第一實施例中,所使用之檢測載體10的顏色可以呈現為紅色系之任一色,且線型光100的顏色可以呈現為與紅色系呈對比或互補之綠色或青色,用以加強傳感器22對於各顯示區之灰階值差異的判讀靈敏度或解析度等。
It is worth mentioning that the visualization result can be a plurality of blocks of the same color or different colors containing differences in grayscale values, and the color of the
在所述第一實施例中,可更包含雲端伺服器30,雲端伺服器30可自檢測模組20接收所述比較值,且將比較值與存於雲端伺服器30上之查找表(look-up table,LUT)進行比對,用以找出對應比較值之內容。
In the first embodiment, a
進一步而言,待測顯示區B、C受待測物反應後之顏色與線型光100的顏色可以是其他對應之成對互補色,例如,綠色與洋紅色、藍色與黃色、黃色與紫色、藍色與橘色等。
Furthermore, the color of the display areas B and C to be tested after being reacted by the object to be tested and the color of the
在所述第一實施例中,所述傳感器22可同時接收反射自基準顯示區A的基準信號102、反射自待測顯示區B的待測信號103以及反射自待測顯示區C的待測信號103;亦可以分次且依序地接收反射自基準顯示區A的基準信號102、反射自待測顯示區B的待測信號103以及
反射自待測顯示區C的待測信號103;又或可以是接收反射自基準顯示區A的基準信號102、反射自待測顯示區C的待測信號103,然後再接收反射自待測顯示區B的待測信號103,藉此達到空間與時間的各種控制方式。
In the first embodiment, the
在所述第一實施例中,檢測模組20可更包含儲存查找表(LUT)的儲存單元(圖中未示),控制器23可連接儲存單元並讀取所述LUT用以作為判讀比較值之依據。所述儲存單元可包含EEPROM或NAND Flash等其他非揮發性可儲存資料之媒介,且可透過I2C之有線燒錄方式或空中編程(over-the-air programming,OTA)之無線傳輸方式更新儲存單元所儲存之LUT。除此之外,儲存查找表(LUT)亦可儲存於控制器23內。
In the first embodiment, the
如圖3所示,為本發明光學檢測方法之對應檢測載體的信號反射強度示意圖。 As shown in Figure 3, it is a schematic diagram of the signal reflection intensity of the corresponding detection carrier according to the optical detection method of the present invention.
在所述第一實施例中,控制器23是對傳感器22所測得的電壓準位(亦可稱之為電位)進行運算而產生之差值作為各顯示區的信號。例如,代表基準顯示區A之基準顯示區A則顯示為第L255灰階(即是,代表任一顏色之明度最深者)之可視化結果,控制器23所量測到對應基準顯示區A的第一電壓準位差為X1,即代表所有顯示區(包含A、B、C等)中,基準顯示區A具有最高之電壓準位差(其中,基準顯示區A之電位仍小於各顯示區之外的區域(例如,對應X0之部分)之電位,如圖3之對應基準顯示區A左側的電位略高於X1),而其他的待測顯示區B、待測顯示區C等將依據待測物與其反應之結果而呈現介於L0(即是,代表任一顏色之明度最淺者)至L255之間的具任一灰階,其所對應之第二電壓準位差X2、X3均小於或等於X1,即X1≧X2且X1≧X3。
In the first embodiment, the
圖4為本發明光學檢測方法之第二實施例的架構示意圖。 Figure 4 is a schematic structural diagram of the second embodiment of the optical detection method of the present invention.
在所述第二實施例中,所採用之硬體架構與所述第一實施例大致相同,惟光源21所輸出的檢測光是如圖3所示之面型光101。
In the second embodiment, the hardware structure used is substantially the same as that in the first embodiment, except that the detection light output by the
進一步而言,待測顯示區B、C受待測物反應後之顏色與面型光101的顏色可以是其他對應之成對互補色,例如,綠色與洋紅色、藍色與黃色、黃色與紫色、藍色與橘色等。
Furthermore, the color of the display areas B and C to be tested after being reacted by the object to be tested and the color of the
為此,面型光101相對於線型光100係以有限度地增加所蒐集的資料量,又兼顧不會增加後端演算過多的負擔或過於拖慢演算速度等(相對於檢測光覆蓋整個檢測載體10而言)。
For this reason, the
圖5為本發明光學檢測方法之流程示意圖。圖6為本發明光學檢測方法之判斷程序示意圖。 Figure 5 is a schematic flow chart of the optical detection method of the present invention. Figure 6 is a schematic diagram of the judgment procedure of the optical detection method of the present invention.
請一併參閱圖1至圖6,本發明所提出的光學檢測方法包含步驟S1至步驟S6,如下詳述。 Please refer to FIGS. 1 to 6 together. The optical detection method proposed by the present invention includes steps S1 to S6, as described in detail below.
步驟S1係提供檢測載體10以及至少一查找表(LUT),檢測載體10可包含基準顯示區A以及待測顯示區B、待測顯示區C。
Step S1 provides a
檢測載體10用以承接待測物,且可以吸收、填裝、抵靠、夾持、卡掣等方式承接。
The
步驟S2係對檢測載體10施予待測物(圖中未示),且使待測物與待測顯示區B以及待測顯示區C進行反應(例如,改變顏色、灰階等)。
Step S2 is to apply the object to be tested (not shown in the figure) to the
值得一提的是,所述傳感器22係依據所感測到的對應灰階值差異之電壓準位(亦可稱之為電位)的變化來做為所接收到的基準信號102以及待測信號103,即是,傳感器22可藉由接收反射自檢測載體10之反射光對傳感器22之各像素(pixel)產生的電位變化,作為基準信號102以及待測信號103。
It is worth mentioning that the
所使用之檢測載體10的顏色可以呈現為紅色系之任一色,且線型光100的顏色可以呈現為與紅色系呈對比或互補之綠色或青色,用以加強傳感器22對於各顯示區之灰階值差異的判讀靈敏度或解析度等。
The color of the
待測顯示區B、C受待測物反應後之顏色與線型光100的顏色可以是其他對應之成對互補色,例如,綠色與洋紅色、藍色與黃色、黃色與紫色、藍色與橘色等。
The color of the display areas B and C to be tested after being reacted by the object to be tested and the color of the
步驟S3係光源21輸出線型光100或101至檢測載體10,且使線型光100或101投射至基準顯示區A、待測顯示區B以及待測顯示區C。
Step S3 is when the
檢測光係同時接觸基準顯示區A、待測顯示區B以及待測顯示區C等,以確保在一特定時間範圍內的變化是所需的,進而排除產生其他偏差結果之可能(例如,反應時間過長導致顏色變化反應的準確率下降等)的現象。 The detection light system simultaneously contacts the reference display area A, the display area to be tested B, and the display area to be tested C, etc., to ensure that the changes within a specific time range are required, thereby eliminating the possibility of producing other biased results (for example, reaction If the time is too long, the accuracy of the color change response will decrease, etc.).
步驟S4係傳感器22接收反射自基準顯示區A的基準信號102以及反射自待測顯示區B、C的待測信號103,基準信號102包含基準顯示區A的第一灰階值,且待測信號103包含待測顯示區B與待測顯示區C的第二灰階值。
Step S4 is when the
值得一提的是,步驟S4更包含下述步驟:將感測第一灰階值所獲的第一電壓準位差作為基準信號102;以及將感測第二灰階值所獲的第二電壓準位差作為待測信號103。
It is worth mentioning that step S4 further includes the following steps: using the first voltage level difference obtained by sensing the first gray scale value as the
如圖3所示,在對檢測載體10進行檢測程序時,檢測載體10的相對兩端可被支架T(亦可稱之為托盤,tray)所托持、黏附、吸附或夾持著。進一步而言,如圖3所示信號反射強度之示意圖中,為使詳細論述聚焦於X0、X1、X2、X3,圖3並未顯示對應支架T的反射信號,即支架T之顏色或灰階不受限制。
As shown in FIG. 3 , when the detection process is performed on the
基準信號102以及待測信號103係同時被傳感器22接收,以確保在一特定時間範圍內的變化是所需的,進而排除產生其他偏差結果之可能(例如,反應時間過長導致顏色變化反應的準確率下降等)的現象。
The
步驟S5係控制器23藉由一判斷程序確認該基準顯示區A以及該待測顯示區B、C並對第一灰階值以及第二灰階值經運算後獲得比較值。
In step S5, the
第一電壓準位差大於或等於第二電壓準位差。進一步而言,控制器23是以對所測得的電壓準位差(亦可稱之為電位差)作為各顯示區的信號。例如,基準顯示區A顯示為第L255灰階(即是,代表任一顏色之明度最深者)之可視化結果,控制器23對傳感器22所量測到對應基準顯示區A的基準信號102進行運算後獲得第一電壓準位差為X1,即代表在檢測載體10中,基準顯示區A具有最高之電壓準位差,而待測顯示區B與待測顯示區C將依據待測物與其反應之結果呈現介於L0(即是,代表任一顏色之明度最淺者)至L255之間的具任一灰階,其控制器23對其所
反射的待測信號103進行運算而所獲得之二個第二電壓準位差X2、X3將小於或等於X1,即X1≧X2且X1≧X3。
The first voltage level difference is greater than or equal to the second voltage level difference. Furthermore, the
值得一提的是,所述運算可包含控制器23將任一個第二電壓準位差除以第一電壓準位差,且獲得比較值。並且,比較值可以百分比呈現,例如X1=2,X2=0.9,則比較值為X2/X1=45%。
It is worth mentioning that the operation may include the
特別說明,在步驟S5中所稱用以確認基準顯示區A以及待測顯示區B、C係指為控制器23針對傳感器22所傳遞的多個待測區反射信號中,辨識何者為基準顯示區A、待測顯示區B以及待測顯示區C,如圖6所示,所述判斷程序可包含下述步驟:步驟S11,控制器23接收反射自檢測載體10的多數個灰階信號並進行運算以獲得多個電壓準位差(例如,包含X0、X1、X2、X3等);步驟S12,判斷該等灰階信號中具最強信號強度差即電壓準位差者(例如,對應電壓準位差X0的部分),作為背景信號;進一步而言,所述電壓準位差X0的獲得方式,係控制器23藉由所述傳感器22所預設提供的一信號基準電壓準位,並將其與檢測載體10上該等顯示區(例如,A、B、C)之外的其他部分(例如,白色)之電壓值之數值相減,而獲得所述最強信號強度差,即X0>X1、X2、X3等,X0具最強信號強度差,並將X0作為背景信號;步驟S13,判斷該等灰階信號中背景信號之外的其他信號,最接近最強信號強度差(即X0)者(例如,對應電壓準位差X1的部分),作為基準信號102;進一步而言,所述電壓準位差X1的獲得方式,係藉由所述控制器23對基準顯示區A所感測到之電壓值,並將其與檢測載體10
上該等顯示區之外的其他部分(例如,白色)之電壓值之數值相減,而獲得所述電壓準位差X1,並且基於電壓準位差X1為最接近背景信號X0具最大信號強度差,將X1作為基準信號102,即X0>X1≧X2、X3,且X1最接近X0;以及步驟S14,判斷該等灰階信號中背景信號以及基準信號102之外的其他信號(例如,對應電壓準位差X2、X3的部分),作為待測信號103;進一步而言,所述電壓準位差X2、X3的獲得方式,係藉由所述控制器23對待測顯示區B與待測顯示區C所感測到之電壓值,並將其與檢測載體10上該等顯示區之外的其他部分(例如,白色)之電壓值之數值相減,而獲得所述電壓準位差X2、X3,即X0>X1≧X2、X3等,並將X2、X3作為待測信號103。
In particular, the step S5 for confirming the reference display area A and the display areas B and C to be measured refers to identifying which one is the reference display among the multiple reflection signals of the areas to be measured transmitted by the
其中,本發明以電壓準位之差值(例如,X0、X1、X2、X3)來做所述運算的好處在於,可以在經由控制器23獲得不同電壓準位之差值的同時,並進一步有效地減去或消弭其可能所包含的雜訊等不必要的或具干擾性的內容,可以使得後續進行運算所獲得之比較值具有更好的可靠度與再現性。 Among them, the advantage of using the differences in voltage levels (for example, X 0 , X 1 , , and further effectively subtract or eliminate unnecessary or interfering content such as noise that it may contain, so that the comparison value obtained by subsequent operations can have better reliability and reproducibility.
進一步而言,控制器23可藉由基準信號102與待測信號103的方向與順序,確認基準顯示區A位於該檢測載體10上的位置,例如藉由電壓準位差X1、X2、X3判斷基準信號102位於所有待測信號103左側,故判斷所對應之最左側的顯示區為基準顯示區A,而對應電壓準位差X2、X3之待測顯示區B、C則依序列於基準顯示區A之右側。
Furthermore, the
步驟S6係控制器23依據查找表(LUT)讀取對應於比較值的內容。
In step S6, the
所述查找表(LUT)係預先儲存於檢測模組20,所述LUT用以作為判讀比較值之依據。
The look-up table (LUT) is stored in the
綜上所述,本發明之光學檢測方法係在檢測載體10施予待測物之後,以光學方式來擷取檢測載體10與待測物作用之後的可視化結果,尤其是,檢測載體10上可以是採用多數個顯示區來呈現所述可視化結果,例如,用以作為對照基準之基準顯示區A以及用以判讀待測物之檢測結果的待測顯示區B、C等。繼而,可將檢測光依序或同時地投射至基準顯示區A以及待測顯示區B、C,且可依序或同時地接收反射自基準顯示區A的基準信號102以及反射自待測顯示區B、C的待測信號103。
To sum up, the optical detection method of the present invention is to optically capture the visual results after the
值得一提的是,所述可視化結果可以是包含灰階值差異的多數個同色或異色區塊,且檢測光的顏色可以是基準顯示區A的互補色以及相對於待測顯示區B、C受待測物反應後所呈現之各顯示區之顏色的互補色(或可稱之為對比色),用以加強對於各顯示區之灰階值差異的判讀靈敏度或解析度等。 It is worth mentioning that the visualization result can be a plurality of blocks of the same color or different colors containing differences in gray scale values, and the color of the detection light can be the complementary color of the reference display area A and the color relative to the display areas B and C to be tested. The complementary color (or contrasting color) of the color of each display area displayed after being reacted by the substance to be tested is used to enhance the sensitivity or resolution of the interpretation of the difference in gray scale values of each display area.
最後,對第一灰階值以及第二灰階值經運算後獲得對應於灰階值差異的比較值,且依據查找表讀取對應於比較值的內容,以做為對應待測物的檢測結果。 Finally, the first grayscale value and the second grayscale value are calculated to obtain a comparison value corresponding to the difference in grayscale value, and the content corresponding to the comparison value is read according to the lookup table to detect the corresponding object to be measured. result.
為此,本發明所述之光學檢測方法,藉由對可視化檢測內容進行光學之投射、反射及運算之後,自動地將與可視化檢測內容相應之檢測結果讀出,達到節約人力且提升檢測正確性之目的。 To this end, the optical detection method of the present invention automatically reads out the detection results corresponding to the visual detection content after performing optical projection, reflection and calculation on the visual detection content, thereby saving manpower and improving detection accuracy. purpose.
以上所述,僅為本發明較佳具體實施例之詳細說明與圖式,惟本發明之特徵並不侷限於此,並非限制本發明,本發明之所有範圍應以下述之申請專利範圍為準,凡合於本發明申請專利範圍之精神與其類似變化之實施例,皆應包含於本發明之範疇中,任何熟悉該項技藝者在本發明之領域內,可輕易思及之變化或修飾皆可涵蓋在以下本案之專利範圍。 The above are only detailed descriptions and drawings of preferred specific embodiments of the present invention. However, the characteristics of the present invention are not limited thereto, nor do they limit the present invention. The entire scope of the present invention shall be subject to the following patent application scope. , all embodiments that are within the spirit of the patentable scope of the present invention and similar modifications thereof shall be included in the scope of the present invention. Anyone familiar with the art can easily think of changes or modifications in the field of the present invention. It can be covered by the following patent scope of this case.
10:檢測載體 10:Detection carrier
11:檢測殼體 11: Detection shell
20:檢測模組 20:Detection module
21:光源 21:Light source
22:傳感器 22: Sensor
100:線型光 100: linear light
A:基準顯示區 A: Reference display area
B:待測顯示區 B: Display area to be tested
C:待測顯示區 C: Display area to be tested
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