TWI814282B - Adhesive Film Applied to Wafer Fat Edge Removal and Its Removal Method - Google Patents

Adhesive Film Applied to Wafer Fat Edge Removal and Its Removal Method Download PDF

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TWI814282B
TWI814282B TW111109935A TW111109935A TWI814282B TW I814282 B TWI814282 B TW I814282B TW 111109935 A TW111109935 A TW 111109935A TW 111109935 A TW111109935 A TW 111109935A TW I814282 B TWI814282 B TW I814282B
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wafer
coating
application section
preset
coating layer
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TW111109935A
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TW202339042A (en
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黃秋逢
張志安
徐啟敏
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陽程科技股份有限公司
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本發明為有關一種應用於晶圓肥邊去除之膠膜及其去除方法,包括:一膠膜捲,其包括一出料側、一收料側及一應用段,於該應用段中切割形成有一容置孔,且其所切割出且呈圓形之一裁切廢料予以移除;一工作平台,於其表面定位有一晶圓,而該工作平台底側透過一預設動力裝置及一升降推桿推升並使該晶圓穿置於該容置孔中形成定位;一塗刀,位於該晶圓一側邊緣上方並以水平方向朝著該晶圓另一側移動,直到該塗刀之塗布液完全覆蓋於該晶圓表面後停止,且於該晶圓表面及該應用段表面形成有一未固化塗布層;一真空腔蓋,罩覆於該工作平台上,並對腔蓋內部進行抽真空並形成加速乾燥狀態,以使該未固化塗布層快速形成一已固化塗布層後,以使該應用段表面殘留有一塗布廢料,且於該晶圓表面保留該已固化塗布層,以形成該晶圓表面之肥邊現象大幅降低構造。 The invention relates to a film applied to wafer fat edge removal and its removal method, which includes: a film roll, which includes a discharge side, a rewind side and an application section, which is cut and formed in the application section There is a receiving hole, and the circular cutting waste cut out by it is removed; a working platform has a wafer positioned on its surface, and the bottom side of the working platform passes through a preset power device and a lifting device The push rod pushes up and inserts the wafer into the receiving hole to form a position; a coating knife is located above one edge of the wafer and moves in a horizontal direction toward the other side of the wafer until the coating knife The coating liquid stops after completely covering the wafer surface, and an uncured coating layer is formed on the wafer surface and the application section surface; a vacuum chamber cover is covered on the work platform, and the inside of the chamber cover is Evacuate and form an accelerated drying state, so that the uncured coating layer quickly forms a cured coating layer, so that a coating waste remains on the surface of the application section, and the cured coating layer remains on the surface of the wafer to form The fat edge phenomenon on the wafer surface significantly reduces the structure.

Description

應用於晶圓肥邊去除之膠膜及其去除方法 Adhesive film used in wafer fat edge removal and its removal method

本發明係提供一種應用於晶圓肥邊去除之膠膜及其去除方法,尤指一種於晶圓之邊緣圍設有膠膜捲之應用段,透過呈一字型塗刀同時塗覆應用段之部分區域及晶圓表面以形成未固化塗布層,並利用膠膜捲之應用段破除晶圓於邊緣之表面張力,再透過真空腔蓋之抽真空過程來使未固化塗布層快速形成已固化塗布層,續透過工作平台之升降來分離晶圓與膠膜捲,以確保晶圓表面塗布層厚度統一,即可防止晶圓表面之肥邊現象。 The present invention provides an adhesive film for removing the fat edge of a wafer and a removal method thereof. In particular, it refers to an application section with an adhesive film roll surrounding the edge of the wafer, and the application section is simultaneously coated by a straight-line coating knife. Partial areas and the surface of the wafer are used to form an uncured coating layer, and the application section of the film roll is used to break the surface tension of the wafer edge, and then the uncured coating layer is quickly formed and cured through the vacuum process of the vacuum chamber cover. The coating layer continues to separate the wafer and the film roll through the lifting and lowering of the work platform to ensure a uniform thickness of the coating layer on the wafer surface, thereby preventing the fat edge phenomenon on the wafer surface.

按,晶圓上薄膜塗布常見技術為旋轉塗布(Spin Coatin),而旋轉塗布優點在於:可以得到極薄且膜厚均勻度極佳的塗布層。但旋轉塗布亦存在有其缺點:在於難以製作出厚膜。而原因在於旋轉時中心處與外圈的旋轉速度差異頗大,故導致難以得到厚且均勻的塗布膜層。更進一步來瞭解,於塗料塗布尚薄時,塗料層大部分都會透過表面張力與晶圓表面緊密黏著;但於塗料塗布形成厚膜時,雖然塗料底層同樣受到表面張力與晶圓表面緊密黏著,但塗料上層將受到離心力而向外滑動。因此,晶圓採用旋轉塗布時,因中心與外圈的離心力不同,故隨著旋轉速度的變化,導致難以得到均勻的厚膜。 According to reports, a common technology for thin film coating on wafers is spin coating. The advantage of spin coating is that it can obtain an extremely thin coating layer with excellent film thickness uniformity. However, spin coating also has its disadvantages: it is difficult to produce a thick film. The reason is that the rotation speed of the center and the outer ring is quite different during rotation, so it is difficult to obtain a thick and uniform coating film layer. To further understand, when the coating is thin, most of the coating layer will adhere closely to the wafer surface through surface tension; but when the coating forms a thick film, although the bottom layer of the coating is also tightly adhered to the wafer surface due to surface tension, However, the upper layer of paint will be subject to centrifugal force and slide outward. Therefore, when the wafer is spin-coated, due to the different centrifugal forces between the center and the outer ring, it is difficult to obtain a uniform thick film as the rotation speed changes.

承上述,塗料在晶圓最外圈邊緣受到的表面張力影響尤為嚴重,已經甩到最外圈位置塗料受到晶圓邊緣表面張力影響而不易被離心力甩掉,所以塗料堆積在晶圓外圈邊緣效應會更加嚴重。為了得到較厚且均勻的塗層,需要預塗更多的塗料在晶圓上並慢速旋轉,以達到預期的膜厚均勻度,甚至需要透過複數次的旋轉塗布製程來達到較厚且均勻的塗層之目的,但是於製程中所浪費的材料會更為增加。 Following the above, the paint is particularly affected by surface tension at the outermost edge of the wafer. It has been thrown to the outermost position. The paint is affected by the surface tension of the wafer edge and is not easily thrown away by centrifugal force. Therefore, the paint accumulates at the outer edge of the wafer. The effects will be more severe. In order to obtain a thicker and more uniform coating, more paint needs to be pre-coated on the wafer and rotated slowly to achieve the expected film thickness uniformity. It may even require multiple spin coating processes to achieve a thicker and more uniform coating. The purpose of coating, but the material wasted in the process will increase even more.

關於上述晶圓採用旋轉塗布製程的種種缺失,有待從事此行業者加以研發改進。 Regarding the various shortcomings of the spin coating process for the above-mentioned wafers, those in this industry need to develop and improve them.

故,發明人有鑑於上述之問題與缺失,乃蒐集相關資料,經由多方評估及考量,始設計出此種應用於晶圓肥邊去除之膠膜及其去除方法之發明誕生。 Therefore, in view of the above-mentioned problems and deficiencies, the inventor collected relevant information, and after multiple evaluations and considerations, he came up with the invention of this adhesive film for wafer fat edge removal and its removal method.

本發明之主要目的在於提供一種應用於晶圓肥邊去除之膠膜,包括:一膠膜捲,其包括一出料側、一收料側及一應用段,於該應用段中切割形成有一容置孔,且其所切割出且呈圓形之一裁切廢料予以移除;一工作平台,於其表面定位有一晶圓,而該工作平台底側透過一預設動力裝置及一升降推桿推升並使該晶圓穿置於該容置孔中形成定位;一塗刀,位於該晶圓一側邊緣上方並以水平方向朝著該晶圓另一側移動,直到該塗刀之塗布液完全覆蓋於該晶圓表面後停止,且於該晶圓表面及該應用段表面形成有一未固化塗布層;一真空腔蓋,罩覆於該工作平台上,並對腔蓋內部進行抽真空並形成加速乾燥狀態,以使該未固化塗布層快速形成一已固化塗布層後,以使該應用段表面殘留有一塗布廢料,且於該晶圓表面 保留該已固化塗布層,以形成該晶圓表面之肥邊現象大幅降低構造。藉由前述晶圓之邊緣圍設有膠膜捲之應用段,透過呈一字型塗刀同時塗覆應用段之部分區域及晶圓表面以形成未固化塗布層,並利用膠膜捲之應用段破除晶圓於邊緣之表面張力,再透過真空腔蓋之抽真空過程來使未固化塗布層快速形成已固化塗布層,續透過工作平台之升降來分離晶圓與膠膜捲,以確保晶圓表面塗布層厚度統一,即可防止晶圓表面之肥邊現象,同時,膠膜捲係為一種成本較低之抛棄式耗材,故不需利用溶劑來做清潔處理,也正因缺少清潔的流程,而可使晶圓肥邊去除之生產程序速度加快,有利於晶圓的製造時間大幅縮短。 The main purpose of the present invention is to provide a film used for wafer fat edge removal, including: a film roll, which includes a discharge side, a rewind side and an application section, and is cut to form a The hole is accommodated, and the circular cutting waste cut out by it is removed; a working platform has a wafer positioned on its surface, and the bottom side of the working platform passes through a preset power device and a lifting pusher The rod pushes up and inserts the wafer into the receiving hole to form a position; a coating knife is located above one edge of the wafer and moves in a horizontal direction toward the other side of the wafer until the coating knife reaches the other side of the wafer. The coating liquid stops after completely covering the wafer surface, and an uncured coating layer is formed on the wafer surface and the application section surface; a vacuum chamber cover is covered on the work platform, and the inside of the chamber cover is evacuated Vacuum and form an accelerated drying state, so that the uncured coating layer quickly forms a cured coating layer, so that a coating waste remains on the surface of the application section, and on the surface of the wafer The cured coating layer is retained to form a structure that significantly reduces fat edges on the wafer surface. By surrounding the edge of the wafer with an application section of the film roll, a linear coating knife is used to simultaneously coat part of the application section and the wafer surface to form an uncured coating layer, and the application of the film roll is used The surface tension of the wafer at the edge is broken in several stages, and then the uncured coating layer is quickly formed into a cured coating layer through the vacuum process of the vacuum chamber cover, and the wafer and the film roll are separated by lifting and lowering the work platform to ensure that the wafer is The uniform thickness of the coating layer on the circular surface can prevent the fat edge phenomenon on the wafer surface. At the same time, the film roll is a low-cost disposable consumable, so there is no need to use solvents for cleaning. This is also due to the lack of cleaning tools. The process can speed up the production process of removing the fat edge of the wafer, which is beneficial to significantly shortening the manufacturing time of the wafer.

本發明之另一目的在於該預設動力裝置係指具有供氣設備之一氣壓缸、具有供油設備之一油壓缸或一馬達,且於該氣壓缸、該油壓缸或該馬達中設有可做往復伸縮之升降推桿。 Another object of the present invention is that the preset power device refers to a pneumatic cylinder with air supply equipment, a hydraulic cylinder with oil supply equipment, or a motor, and in the pneumatic cylinder, the hydraulic cylinder, or the motor Equipped with a lifting push rod that can reciprocate and telescope.

本發明之再一目的在於該晶圓表面所形成之該已固化塗布層係指一光阻層或一絕緣層,而構成該絕緣層材料係為一聚醯亞胺。 Another object of the present invention is that the cured coating layer formed on the wafer surface refers to a photoresist layer or an insulating layer, and the material constituting the insulating layer is polyimide.

本發明之再一目的在於該預設裁切治具係指一雷射模組、一圓形切刀或一熱熔切割裝置,而該預設吸附治具係指具有真空吸附力之一吸盤。 Another object of the present invention is that the preset cutting fixture refers to a laser module, a circular cutter or a hot melt cutting device, and the preset adsorption fixture refers to a suction cup with vacuum adsorption force .

本發明之再一目的在於該塗刀與該噴嘴係呈一字型外觀。 Another object of the present invention is that the coating knife and the nozzle have a straight appearance.

1:膠膜捲 1: Film roll

10:容置孔 10: Accommodation hole

11:出料側 11: Discharge side

12:收料側 12: Receiving side

13:應用段 13:Application section

14:裁切廢料 14: Cutting scraps

15:吸附治具 15: Adsorption fixture

2:晶圓 2:wafer

3:工作平台 3:Working platform

31:升降推桿 31: Lifting push rod

4:塗刀 4:Painting knife

41:噴嘴 41:Nozzle

42:塗布液 42:Coating liquid

43:未固化塗布層 43: Uncured coating layer

44:已固化塗布層 44: Cured coating layer

45:塗布廢料 45: Coating waste

5:真空腔蓋 5: Vacuum chamber cover

51:管體 51:tube body

61:提供一膠膜捲,於其出料側及收料側之間具有攤平之一應用段,於該應用段中形成有利用一預設裁切治具所切割出且呈圓形之一容置孔,且其所切割出且呈圓形之一裁切廢料透過一預設吸附治具移除 61: Provide a film roll with a flat application section between the discharge side and the take-up side, and a circular shape cut out by a preset cutting jig is formed in the application section. A receiving hole, and the circular cutting waste material cut out by it is removed through a preset adsorption fixture

62:提供定位於一工作平台上之一晶圓,驅使該工作平台上升以使該晶圓穿置於該膠膜捲之該容置孔中形成定位 62: Provide a wafer positioned on a working platform, and drive the working platform to rise so that the wafer can be inserted into the accommodating hole of the film roll to form a positioning

63:驅動位於該晶圓一側邊緣上方之一塗刀以水平方向朝著該晶圓另一側移動,直到該塗刀之塗布液完全覆蓋於該晶圓表面後停止,且於該晶圓表面及該應用段表面形成有一未固化塗布層 63: Drive the coating knife located above one edge of the wafer to move in a horizontal direction toward the other side of the wafer until the coating liquid of the coating knife completely covers the surface of the wafer and then stops, and the coating liquid on the wafer stops. An uncured coating layer is formed on the surface and the surface of the application section.

64:驅動一真空腔蓋自一預設位置移動對位於該晶圓及該應用段上方後向下罩覆於該工作平台上,並對腔蓋內部進行抽真空並形成加速乾燥狀態,以使該未固化塗布層快速形成一已固化塗布層後,移動該真空腔蓋回歸至該預設位置 64: Drive a vacuum chamber cover to move from a preset position to be positioned above the wafer and the application section and then cover the work platform downwards, and evacuate the inside of the chamber cover to form an accelerated drying state, so that After the uncured coating layer quickly forms a cured coating layer, the vacuum chamber cover is moved back to the preset position.

65:驅使該工作平台下降至原來位置,以使該應用段表面殘留有一塗布廢料,且於該晶圓表面保留該已固化塗布層,以形成該晶圓表面之肥邊現象大幅降低構造 65: Drive the work platform down to the original position so that a coating waste remains on the surface of the application section, and the cured coating layer is retained on the surface of the wafer to form a structure that greatly reduces the fat edge phenomenon on the surface of the wafer.

〔第1圖〕係為本發明於工作平台上設有膠膜捲之示意圖。 [Figure 1] is a schematic diagram of the present invention with a film roll on the working platform.

〔第2圖〕係為本發明於膠膜捲中切割出一容置孔之示意圖。 [Figure 2] is a schematic diagram of the present invention cutting a receiving hole in the film roll.

〔第3圖〕係為本發明利用吸附治具將裁切廢料移除之示意圖。 [Figure 3] is a schematic diagram of the invention using an adsorption jig to remove cutting waste.

〔第4圖〕係為本發明將晶圓穿置於容置孔前之示意圖。 [Figure 4] is a schematic diagram of inserting the wafer in front of the accommodating hole according to the present invention.

〔第5圖〕係為本發明將晶圓穿置於容置孔後之示意圖。 [Figure 5] is a schematic diagram of the present invention after the wafer is inserted into the receiving hole.

〔第6圖〕係為本發明晶圓一側邊緣上方設有塗刀之示意圖。 [Figure 6] is a schematic diagram of a coating knife located above one edge of the wafer of the present invention.

〔第7圖〕係為本發明塗刀由晶圓一側朝向另一側塗布前之示意圖。 [Figure 7] is a schematic diagram of the coating knife of the present invention before coating from one side of the wafer to the other side.

〔第8圖〕係為本發明塗刀由晶圓一側朝向另一側塗布後之示意圖。 [Figure 8] is a schematic diagram of the present invention after the coating blade is applied from one side of the wafer to the other side.

〔第9圖〕係為本發明真空腔蓋罩覆於工作平台前之示意圖。 [Figure 9] is a schematic diagram of the vacuum chamber cover of the present invention before it is covered with the working platform.

〔第10圖〕係為本發明真空腔蓋罩覆於工作平台後之示意圖。 [Figure 10] is a schematic diagram of the vacuum chamber cover of the present invention after it is covered with the working platform.

〔第11圖〕係為本發明透過工作平台下降以使晶圓與膠膜捲分離之示意圖。 [Figure 11] is a schematic diagram of the present invention in which the working platform is lowered to separate the wafer and the film roll.

〔第12圖〕係為本發明應用於晶圓肥邊之去除步驟流程圖。 [Figure 12] is a flow chart of the removal steps of the present invention applied to the wafer fat edge.

為達成上述目的及功效,本發明所採用之技術手段及其構造,茲繪圖就本發明之較佳實施例詳加說明其特徵與功能如下,俾利完全瞭解。 In order to achieve the above objects and effects, the technical means and structures adopted by the present invention are described in detail below with respect to the preferred embodiments of the present invention, so as to facilitate a complete understanding.

請參閱第1至11圖所示,各為本發明於工作平台上設有膠膜捲之示意圖、於膠膜捲中切割出一容置孔之示意圖、利用吸附治具將裁切廢料移除之示意圖、晶圓穿置於容置孔前之示意圖、晶圓穿置於容置孔後之示意圖、晶圓一側邊緣上方設有塗刀之示意圖、塗刀由晶圓一側朝向另一側塗布前之示意圖、塗刀由晶圓一側朝向另一側塗布後之示意圖、真空腔蓋罩覆於工作平台前之示意圖、真空腔蓋罩覆於工作平台後之示意圖及透過工作平台下降以使晶圓與膠膜捲分離之示意圖,由圖中可清楚看出本 發明晶圓肥邊去除裝置主要包括:膠膜捲1、晶圓2、工作平台3、塗刀4、真空腔蓋5,而各組件之連接關係與詳細結構如下: Please refer to Figures 1 to 11, which are schematic diagrams of the present invention in which a film roll is provided on the work platform, a receiving hole is cut in the film roll, and the cutting waste is removed using an adsorption jig. The schematic diagram of the wafer passing through the accommodating hole, the schematic diagram of the wafer passing through the accommodating hole, the schematic diagram of the wafer having a coating knife above the edge of one side of the wafer, the coating knife facing from one side of the wafer to the other The schematic diagram before side coating, the schematic diagram after the coating knife is coated from one side of the wafer to the other side, the schematic diagram before the vacuum chamber cover is covered on the work platform, the schematic diagram after the vacuum chamber cover is covered on the work platform and lowered through the work platform The schematic diagram of separating the wafer from the film roll can be clearly seen from the figure. The invented wafer fat edge removal device mainly includes: film roll 1, wafer 2, working platform 3, coating knife 4, and vacuum chamber cover 5. The connection relationship and detailed structure of each component are as follows:

該膠膜捲1(Dummy Film)包括一出料側11與一收料側12,於該出料側11與該收料側12之間具有攤平之一應用段13,於該應用段13中形成有利用一預設裁切治具(圖中未示)所切割出且呈圓形之一容置孔10,且其所切割出且呈圓形之一裁切廢料14透過一預設吸附治具15移除。前述該預設裁切治具係指一雷射模組、一圓形切刀或一熱熔切割裝置,而該預設吸附治具15係指具有真空吸附力之一吸盤。 The film roll 1 (Dummy Film) includes a discharge side 11 and a take-up side 12. There is a flat application section 13 between the discharge side 11 and the take-up side 12. The application section 13 There is a circular receiving hole 10 cut out by a preset cutting jig (not shown in the figure), and the circular cutting waste material 14 is cut through a preset cutting jig (not shown in the figure). The adsorption fixture 15 is removed. The aforementioned preset cutting jig refers to a laser module, a circular cutter or a hot melt cutting device, and the preset adsorption jig 15 refers to a suction cup with vacuum adsorption force.

一工作平台3,於其表面透過真空吸附技術定位有一晶圓2,而該工作平台3底側設有連接於一預設動力裝置(圖中未示)的一升降推桿31,該預設動力裝置驅動該升降推桿31上升並使該晶圓2穿置於該膠膜捲1之該容置孔10中形成定位。 A working platform 3 has a wafer 2 positioned on its surface through vacuum adsorption technology, and the bottom side of the working platform 3 is provided with a lifting push rod 31 connected to a preset power device (not shown in the figure). The preset The power device drives the lifting push rod 31 to rise and insert the wafer 2 into the accommodating hole 10 of the film roll 1 to position it.

該塗刀4具有供一塗布液42流出之一噴嘴41,且該塗刀4與其噴嘴41係呈一字型外觀,且塗布液42亦以一字型朝向一預設方向移動進行塗布,而較佳的實施例為一字型之塗布液42之長度略大於晶圓2之圓形直徑,且初始位置在該晶圓2一側邊緣上方,並以水平方向朝著該晶圓2另一側移動,直到該塗布液42完全覆蓋於該晶圓2表面後停止,且於該晶圓2表面及該應用段13表面形成有一未固化塗布層43。 The coating knife 4 has a nozzle 41 for a coating liquid 42 to flow out, and the coating knife 4 and its nozzle 41 are in a straight shape, and the coating liquid 42 also moves in a straight shape toward a preset direction for coating, and A preferred embodiment is that the length of the straight-shaped coating liquid 42 is slightly larger than the circular diameter of the wafer 2, and its initial position is above the edge of one side of the wafer 2 and facing the other side of the wafer 2 in a horizontal direction. Move sideways until the coating liquid 42 completely covers the surface of the wafer 2 and then stops, and an uncured coating layer 43 is formed on the surface of the wafer 2 and the surface of the application section 13 .

該真空腔蓋5自一預設位置(圖中未示)移動對位於該晶圓2及該應用段13上方後向下罩覆於該工作平台3上,並對腔蓋內部進行抽真空並形成加速乾燥狀態,並透過該真空腔蓋5所設置一管體51將氣體向外部排出,以使該未固化塗布層43快速形成一已固化塗布層44後,移動該真 空腔蓋5回歸至該預設位置,並驅動該升降推桿31以使該工作平台3下降至原來位置,以使該應用段13表面殘留有一塗布廢料45,且於該晶圓2表面保留該已固化塗布層44並移至下一加工站做後續處理,以形成該晶圓2表面之肥邊現象大幅降低構造。前述具有塗布廢料45之應用段13之後續處理為:將膠膜捲1由出料側11朝向收料側12方向捲動,並使具有塗布廢料45之應用段13被捲收於收料側12內部,同時由出料側11所移出未使用過之應用段13置於工作平台3上方,並等待下一片待加工晶圓2置入工作平台3上且重覆執行所有工序。 The vacuum chamber cover 5 moves from a preset position (not shown in the figure) to be positioned above the wafer 2 and the application section 13 and then covers the work platform 3 downward, and evacuates the inside of the chamber cover. An accelerated drying state is formed, and the gas is discharged to the outside through a tube 51 provided on the vacuum chamber cover 5, so that the uncured coating layer 43 quickly forms a cured coating layer 44, and then the vacuum chamber cover 5 is moved. The cavity cover 5 returns to the preset position, and drives the lifting push rod 31 to lower the work platform 3 to the original position, so that a coating waste 45 remains on the surface of the application section 13 and remains on the surface of the wafer 2 The cured coating layer 44 is moved to the next processing station for subsequent processing to form a structure that greatly reduces fat edges on the surface of the wafer 2 . The subsequent processing of the aforementioned application section 13 with coating waste 45 is: rolling the film roll 1 from the discharging side 11 toward the receiving side 12, and allowing the application section 13 with coating waste 45 to be rolled up on the receiving side. 12, at the same time, the unused application section 13 removed from the discharge side 11 is placed above the work platform 3, and waits for the next wafer 2 to be processed to be placed on the work platform 3 and all processes are repeated.

上述膠膜捲1為了提升塗布液42附著性及固化成膜之特性,而有前置處理程序,具體做法為將電漿(Plasma)、電暈或改質劑利用物理性製程附著於膠膜捲1表面。除此之外,可透過超聲波震盪吸除或黏塵輪沾附方式去處理膠膜捲1表面不潔物或髒污,於髒污去除過程中,膠膜捲1可能受到機構摩擦、分離或空氣流動摩擦而產生靜電,所以需於預設清潔機構(圖中未示)上配置靜電消除裝置(例如:吹氣式靜電消除器或光照輻射式靜電消除器),即可中和膠膜捲1表面所殘留靜電。同時,膠膜捲1係為一種成本較低之抛棄式耗材,故不需利用溶劑來做清潔處理,也正因缺少清潔的流程,而可使晶圓肥邊去除之生產程序速度加快,有利於晶圓的製造時間大幅縮短。 The above-mentioned film roll 1 has a pre-treatment procedure in order to improve the adhesion of the coating liquid 42 and the characteristics of curing film formation. The specific method is to attach plasma, corona or modifier to the film using a physical process. Volume 1 surface. In addition, the surface of the film roll 1 can be treated with ultrasonic vibration suction or dust wheel adhesion to remove impurities or dirt on the surface of the film roll 1. During the dirt removal process, the film roll 1 may be subject to mechanical friction, separation or air Static electricity is generated by flow friction, so it is necessary to configure a static elimination device (such as an air blowing static eliminator or a light radiation static eliminator) on the preset cleaning mechanism (not shown in the figure) to neutralize the film roll 1 Static electricity remaining on the surface. At the same time, the film roll 1 is a low-cost disposable consumable, so there is no need to use solvents for cleaning. Due to the lack of a cleaning process, the production process of removing the wafer fat edge can be accelerated, which is beneficial The wafer manufacturing time is significantly shortened.

上述該預設動力裝置係指具有供氣設備之一氣壓缸、具有供油設備之一油壓缸或一馬達,且於該氣壓缸、該油壓缸或該馬達中設有可做往復伸縮之該升降推桿31,但前述氣壓缸、油壓缸或馬達之動力裝置僅為舉例,而其他形式可配合升降推桿31產生往復動作之動力裝置,亦在 本發明的保護範圍內。 The above-mentioned preset power device refers to a pneumatic cylinder with air supply equipment, a hydraulic cylinder with oil supply equipment, or a motor, and the pneumatic cylinder, the hydraulic cylinder, or the motor is equipped with a reciprocating telescopic device. The lifting push rod 31, but the aforementioned pneumatic cylinder, hydraulic cylinder or motor power device is only an example, and other forms of power devices that can cooperate with the lifting push rod 31 to produce reciprocating motion are also used. within the protection scope of the present invention.

上述該晶圓2表面所形成之該已固化塗布層44係指可藉由紫外線照射固化之一光阻層或一絕緣層,而構成該絕緣層材料係為一聚醯亞胺(Polyimide,PI)。 The cured coating layer 44 formed on the surface of the wafer 2 refers to a photoresist layer or an insulating layer that can be cured by ultraviolet irradiation, and the material constituting the insulating layer is polyimide (PI). ).

根據上述第1至11圖所揭露應用於晶圓肥邊去除之膠膜,並請參閱第12圖所示,係為本發明應用於晶圓肥邊之去除步驟流程圖,包括有下列步驟: According to the above-mentioned Figures 1 to 11, the adhesive film applied to the wafer fat edge removal is disclosed, and please refer to Figure 12, which is a flow chart of the steps for removing the wafer fat edge of the present invention, including the following steps:

步驟61:提供一膠膜捲,於其出料側及收料側之間具有攤平之一應用段,於該應用段中形成有利用一預設裁切治具所切割出且呈圓形之一容置孔,且其所切割出且呈圓形之一裁切廢料透過一預設吸附治具移除。 Step 61: Provide a film roll with a flat application section between the discharge side and the take-up side, and a circular shape cut out by a preset cutting jig is formed in the application section. a receiving hole, and the circular cutting waste material cut out by it is removed through a preset adsorption fixture.

步驟62:提供定位於一工作平台上之一晶圓,驅使該工作平台上升以使該晶圓穿置於該膠膜捲之該容置孔中形成定位,而工作平台係透過真空吸附技術將晶圓進行定位。 Step 62: Provide a wafer positioned on a working platform, drive the working platform up so that the wafer is inserted into the receiving hole of the film roll to form a position, and the working platform uses vacuum adsorption technology to position the wafer. The wafer is positioned.

步驟63:驅動位於該晶圓一側邊緣上方之一塗刀以水平方向朝著該晶圓另一側移動,直到該塗刀之塗布液完全覆蓋於該晶圓表面後停止,且於該晶圓表面及該應用段表面形成有一未固化塗布層。 Step 63: Drive a coating knife located above one edge of the wafer to move in a horizontal direction toward the other side of the wafer until the coating liquid of the coating knife completely covers the surface of the wafer and then stop. An uncured coating layer is formed on the circular surface and the surface of the application section.

步驟64:驅動一真空腔蓋自一預設位置移動對位於該晶圓及該應用段上方後向下罩覆於該工作平台上,並對腔蓋內部進行抽真空並形成加速乾燥狀態,以使該未固化塗布層快速形成一已固化塗布層後,移動該真空腔蓋回歸至該預設位置。 Step 64: Drive a vacuum chamber cover to move from a preset position to be positioned above the wafer and the application section and then cover it downward on the work platform, and evacuate the inside of the chamber cover to form an accelerated drying state, so as to After the uncured coating layer is quickly formed into a cured coating layer, the vacuum chamber cover is moved back to the preset position.

步驟65:驅使該工作平台下降至原來位置,以使該應用段表面殘留有一塗布 廢料,且於該晶圓表面保留該已固化塗布層,以形成該晶圓表面之肥邊現象大幅降低構造。 Step 65: Drive the working platform down to the original position so that there is a coating remaining on the surface of the application section Waste material is used, and the cured coating layer is retained on the surface of the wafer to form a structure that greatly reduces the fat edge phenomenon on the surface of the wafer.

本發明之較為詳細動作流程在於:膠膜捲1透過捲對捲(Roll to Roll)或單薄片(Sheet)方式供料,雖然上述未提出單薄片的實施例,但此簡易的實施變化應納入本發明的保護範圍內。而膠膜捲1透過真空吸附方式定位於晶圓2製程預定位置,透過雷射模組、一圓形切刀或一熱熔切割裝置之預設裁切治具在應用段13上切割出一容置孔10(圓形缺口),而容置孔10等於或略小於晶圓2尺寸,而切割下來的廢膜透過預設吸附治具15(例如:具有真空吸附力之吸盤)進行去除。晶圓2放置於膠膜捲1所切出的容置孔10中央,晶圓2透過底部的工作平台3利用真空吸附方式進行固定,續使用一預設測距感測器量測晶圓2表面高度,並依據預設測距感測器之量測值自動調整晶圓2與塗刀4之高度間距。透過呈一字型塗刀4與其噴嘴41進行矩形塗布,並使塗布面積之短邊大於或等於晶圓2直徑,待完成晶圓2塗布後,將晶圓2與膠膜捲1以上、下方向進行分離,而分離方式可能為晶圓2向上或膠膜捲1向下進行分離,亦可能為將晶圓2及膠膜捲1同時進行上、下反向移動分離。待塗布完成後,晶圓2透過一預設移載裝置自工作平台3移出,再將已承載塗布廢料45之膠膜捲1移出工作平台3的加工範圍之外,進行拋棄而不再重複使用,並等待下一片待加工晶圓2置入工作平台3上且重覆執行所有工序。 The more detailed operation process of the present invention is as follows: the film roll 1 is fed through a roll-to-roll (Roll to Roll) or a single sheet (Sheet) method. Although the above-mentioned embodiment of a single sheet is not proposed, this simple implementation change should be included. within the protection scope of the present invention. The film roll 1 is positioned at a predetermined position of the wafer 2 process through vacuum adsorption, and a laser module, a circular cutter or a preset cutting jig of a hot melt cutting device is used to cut out a piece of the application section 13 The accommodating hole 10 (circular notch) is equal to or slightly smaller than the size of the wafer 2, and the cut waste film is removed through a preset adsorption fixture 15 (for example, a suction cup with vacuum adsorption force). The wafer 2 is placed in the center of the receiving hole 10 cut out of the film roll 1. The wafer 2 is fixed by vacuum adsorption through the working platform 3 at the bottom, and a preset distance sensor is used to measure the wafer 2. The surface height is determined, and the height distance between the wafer 2 and the coating knife 4 is automatically adjusted based on the measurement value of the preset distance sensor. Apply rectangular coating through the straight-shaped coating knife 4 and its nozzle 41, and make the short side of the coating area greater than or equal to the diameter of the wafer 2. After the coating of the wafer 2 is completed, move the wafer 2 and the film roll 1 up and down. The separation method may be to separate the wafer 2 upward or the film roll 1 downward, or it may be to separate the wafer 2 and the film roll 1 by moving up and down in opposite directions at the same time. After the coating is completed, the wafer 2 is moved out of the work platform 3 through a preset transfer device, and the film roll 1 carrying the coating waste 45 is moved out of the processing range of the work platform 3 and discarded without reuse. , and wait for the next wafer 2 to be processed to be placed on the work platform 3 and repeat all processes.

藉由上述第1至12圖揭露,即可瞭解本發明為一種應用於晶圓肥邊去除之膠膜,包括:一膠膜捲,其包括一出料側、一收料側及一應用段,於該應用段中切割形成有一容置孔,且其所切割出且呈圓形之一裁 切廢料予以移除;一工作平台,於其表面定位有一晶圓,而該工作平台底側透過一預設動力裝置及一升降推桿推升並使該晶圓穿置於該容置孔中形成定位;一塗刀,位於該晶圓一側邊緣上方並以水平方向朝著該晶圓另一側移動,直到該塗刀之塗布液完全覆蓋於該晶圓表面後停止,且於該晶圓表面及該應用段表面形成有一未固化塗布層;一真空腔蓋,罩覆於該工作平台上,並對腔蓋內部進行抽真空並形成加速乾燥狀態,以使該未固化塗布層快速形成一已固化塗布層後,以使該應用段表面殘留有一塗布廢料,且於該晶圓表面保留該已固化塗布層,以形成該晶圓表面之肥邊現象大幅降低構造。藉由前述晶圓之邊緣圍設有膠膜捲之應用段,透過呈一字型塗刀同時塗覆應用段之部分區域及晶圓表面以形成未固化塗布層,並利用膠膜捲之應用段破除晶圓於邊緣之表面張力,再透過真空腔蓋之抽真空過程來使未固化塗布層快速形成已固化塗布層,續透過工作平台之升降來分離晶圓與膠膜捲,以確保晶圓表面塗布層厚度統一,即可防止晶圓表面之肥邊現象,同時,膠膜捲係為一種成本較低之抛棄式耗材,故不需利用溶劑來做清潔處理,也正因缺少清潔的流程,而可使晶圓肥邊去除之生產程序速度加快,有利於晶圓的製造時間大幅縮短。本發明應用於晶圓加工製造領域中,具有極佳的實用性,故提出專利申請以尋求專利權之保護。 From the above figures 1 to 12, it can be understood that the present invention is a film used for wafer fat edge removal, including: a film roll, which includes a discharge side, a take-up side and an application section , a receiving hole is cut in the application section, and it is cut into a circular shape. The cutting waste is removed; a working platform has a wafer positioned on its surface, and the bottom side of the working platform is pushed up through a preset power device and a lifting push rod to insert the wafer into the receiving hole Positioning is formed; a coating knife is located above one edge of the wafer and moves in a horizontal direction toward the other side of the wafer until the coating liquid of the coating knife completely covers the surface of the wafer and then stops, and stops at the edge of the wafer. An uncured coating layer is formed on the circular surface and the surface of the application section; a vacuum chamber cover is covered on the working platform, and the inside of the chamber cover is evacuated and formed into an accelerated drying state, so that the uncured coating layer is quickly formed After a cured coating layer, a coating waste remains on the surface of the application section, and the cured coating layer is retained on the surface of the wafer, so as to form a structure that greatly reduces the fat edge phenomenon on the surface of the wafer. By surrounding the edge of the wafer with an application section of the film roll, a linear coating knife is used to simultaneously coat part of the application section and the wafer surface to form an uncured coating layer, and the application of the film roll is used The surface tension of the wafer at the edge is broken in several stages, and then the uncured coating layer is quickly formed into a cured coating layer through the vacuum process of the vacuum chamber cover, and the wafer and the film roll are separated by lifting and lowering the work platform to ensure that the wafer is The uniform thickness of the coating layer on the circular surface can prevent the fat edge phenomenon on the wafer surface. At the same time, the film roll is a low-cost disposable consumable, so there is no need to use solvents for cleaning. This is also due to the lack of cleaning tools. The process can speed up the production process of removing the fat edge of the wafer, which is beneficial to significantly shortening the manufacturing time of the wafer. This invention is applied in the field of wafer processing and manufacturing and has excellent practicability. Therefore, a patent application is filed to seek protection of patent rights.

上述僅為本發明之較佳實施例而已,非因此即侷限本發明之專利範圍,故舉凡運用本發明說明書及圖式內容所為之簡易修飾及等效結構變化,均應同理包含於本發明之專利範圍內,合予陳明。 The above are only preferred embodiments of the present invention, and do not limit the patent scope of the present invention. Therefore, any simple modifications and equivalent structural changes made by using the description and drawings of the present invention should be included in the present invention. Within the scope of the patent, we will make it clear.

綜上所述,本發明上述應用於晶圓肥邊去除之膠膜及其去除方法於使用時,為確實能達到其功效及目的,故本發明誠為一實用性優 異之發明,為符合發明專利之申請要件,爰依法提出申請,盼 審委早日賜准本案,以保障發明人之辛苦研發,倘若 鈞局審委有任何稽疑,請不吝來函指示,發明人定當竭力配合,實感德便。 In summary, the above-mentioned adhesive film for wafer fat edge removal of the present invention and its removal method can indeed achieve its effect and purpose when used, so the present invention is a practical and excellent method. In order to meet the application requirements for invention patents, I have submitted a unique invention in accordance with the law. I hope that the review committee will approve the case as soon as possible to protect the inventor's hard work on research and development. If the review committee of the Jun Bureau has any doubts, please feel free to write to the inventor. We must try our best to cooperate and feel that it is beneficial.

1:膠膜捲 1: Film roll

10:容置孔 10: Accommodation hole

11:出料側 11: Discharge side

12:收料側 12: Receiving side

13:應用段 13:Application section

2:晶圓 2:wafer

3:工作平台 3:Working platform

31:升降推桿 31: Lifting push rod

44:塗布廢料 44: Coating waste

45:已固化塗布層 45: Cured coating layer

Claims (10)

一種應用於晶圓肥邊去除之膠膜,包括: An adhesive film used for wafer fat edge removal, including: 一膠膜捲,其包括一出料側與一收料側,於該出料側與該收料側之間具有攤平之一應用段,於該應用段中形成有利用一預設裁切治具所切割出且呈圓形之一容置孔,且其所切割出且呈圓形之一裁切廢料透過一預設吸附治具移除; A film roll, which includes a discharge side and a take-up side, has a flat application section between the discharge side and the take-up side, and is formed in the application section using a preset cutting A circular receiving hole is cut out by the jig, and the circular cutting waste material is removed through a preset adsorption jig; 一工作平台,於其表面定位有一晶圓,而該工作平台底側設有連接於一預設動力裝置的一升降推桿,該預設動力裝置驅動該升降推桿上升並使該晶圓穿置於該膠膜捲之該容置孔中形成定位; A work platform has a wafer positioned on its surface, and the bottom side of the work platform is provided with a lift push rod connected to a preset power device. The preset power device drives the lift push rod to rise and penetrate the wafer. Placed in the receiving hole of the film roll to form a position; 一塗刀,其具有供一塗布液流出之一噴嘴,且初始位置在該晶圓一側邊緣上方,並以水平方向朝著該晶圓另一側移動,直到該塗布液完全覆蓋於該晶圓表面後停止,且於該晶圓表面及該應用段表面形成有一未固化塗布層;以及 A coating knife has a nozzle for a coating liquid to flow out, and its initial position is above the edge of one side of the wafer, and moves in a horizontal direction toward the other side of the wafer until the coating liquid completely covers the wafer. Stop after the circular surface, and form an uncured coating layer on the surface of the wafer and the surface of the application section; and 一真空腔蓋,其自一預設位置移動對位於該晶圓及該應用段上方後向下罩覆於該工作平台上,並對腔蓋內部進行抽真空並形成加速乾燥狀態,以使該未固化塗布層快速形成一已固化塗布層後,移動該真空腔蓋回歸至該預設位置,並驅動該升降推桿以使該工作平台下降至原來位置,以使該應用段表面殘留有一塗布廢料,且於該晶圓表面保留該已固化塗布層,以形成該晶圓表面之肥邊現象大幅降低構造。 A vacuum chamber cover moves from a preset position to be positioned above the wafer and the application section and then covers the work platform downwards, and evacuates the inside of the chamber cover and creates an accelerated drying state, so that the After the uncured coating layer quickly forms a cured coating layer, the vacuum chamber cover is moved back to the preset position, and the lifting push rod is driven to lower the working platform to the original position, so that a coating remains on the surface of the application section. Waste material is used, and the cured coating layer is retained on the surface of the wafer to form a structure that greatly reduces the fat edge phenomenon on the surface of the wafer. 如請求項1所述之應用於晶圓肥邊去除之膠膜,其中該預設動力裝置係指具有供氣設備之一氣壓缸、具有供油設備之一油壓缸或 一馬達,且於該氣壓缸、該油壓缸或該馬達中設有可做往復伸縮之該升降推桿。 The adhesive film used for wafer fat edge removal as described in claim 1, wherein the preset power device refers to a pneumatic cylinder with air supply equipment, a hydraulic cylinder with oil supply equipment, or A motor, and the pneumatic cylinder, the hydraulic cylinder or the motor is provided with the lift push rod that can reciprocate and telescope. 如請求項1所述之應用於晶圓肥邊去除之膠膜,其中該晶圓表面所形成之該已固化塗布層係指一光阻層或一絕緣層,而構成該絕緣層材料係為一聚醯亞胺。 The adhesive film used for wafer fat edge removal as described in claim 1, wherein the cured coating layer formed on the wafer surface refers to a photoresist layer or an insulating layer, and the material constituting the insulating layer is A polyimide. 如請求項1所述之應用於晶圓肥邊去除之膠膜,其中該預設裁切治具係指一雷射模組、一圓形切刀或一熱熔切割裝置,而該預設吸附治具係指具有真空吸附力之一吸盤。 The adhesive film used for wafer fat edge removal as described in claim 1, wherein the preset cutting fixture refers to a laser module, a circular cutter or a hot melt cutting device, and the preset cutting fixture The adsorption fixture refers to a suction cup with vacuum adsorption force. 如請求項1所述之應用於晶圓肥邊去除之膠膜,其中該塗刀與該噴嘴係呈一字型外觀。 The adhesive film used for wafer fat edge removal as described in claim 1, wherein the applicator knife and the nozzle have a straight appearance. 一種應用於晶圓肥邊之去除方法,包括有下列步驟: A method for removing fat edges on wafers, including the following steps: (A)提供一膠膜捲,於其出料側及收料側之間具有攤平之一應用段,於該應用段中形成有利用一預設裁切治具所切割出且呈圓形之一容置孔,且其所切割出且呈圓形之一裁切廢料透過一預設吸附治具移除; (A) Provide a film roll with a flat application section between the discharge side and the take-up side, and a circular shape cut out by a preset cutting jig is formed in the application section a receiving hole, and the circular cutting waste material cut out by it is removed through a preset adsorption fixture; (B)提供定位於一工作平台上之一晶圓,驅使該工作平台上升以使該晶圓穿置於該膠膜捲之該容置孔中形成定位; (B) Provide a wafer positioned on a working platform, driving the working platform up so that the wafer can be inserted into the accommodating hole of the film roll to form a position; (C)驅動位於該晶圓一側邊緣上方之一塗刀以水平方向朝著該晶圓另一側移動,直到該塗刀之塗布液完全覆蓋於該晶圓表面後停止,且於該晶圓表面及該應用段表面形成有一未固化塗布層; (C) Drive a coating blade located above one edge of the wafer to move in a horizontal direction toward the other side of the wafer until the coating liquid of the coating blade completely covers the surface of the wafer and then stop, and stop when the coating liquid of the coating blade completely covers the surface of the wafer. An uncured coating layer is formed on the circular surface and the surface of the application section; (D)驅動一真空腔蓋自一預設位置移動對位於該晶圓及該應用段上方後向下罩覆於該工作平台上,並對腔蓋內部進行抽真空並形成加 速乾燥狀態,以使該未固化塗布層快速形成一已固化塗布層後,移動該真空腔蓋回歸至該預設位置;以及 (D) Driving a vacuum chamber cover to move from a preset position to position it above the wafer and the application section and then cover it downward on the work platform, and evacuate the inside of the chamber cover to form a vacuum In a quick-drying state, the uncured coating layer quickly forms a cured coating layer, and then the vacuum chamber cover is moved back to the preset position; and (E)驅使該工作平台下降至原來位置,以使該應用段表面殘留有一塗布廢料,且於該晶圓表面保留該已固化塗布層,以形成該晶圓表面之肥邊現象大幅降低構造。 (E) Driving the work platform down to its original position, so that a coating waste remains on the surface of the application section, and the cured coating layer is retained on the surface of the wafer, so as to form a structure that greatly reduces the fat edge phenomenon on the surface of the wafer. 如請求項6所述之應用於晶圓肥邊去除方法,其中該工作平台底側設有連接於一預設動力裝置的一升降推桿,以使該工作平台具有升降功能,該預設動力裝置係指具有供氣設備之一氣壓缸、具有供油設備之一油壓缸或一馬達,且於該氣壓缸、該油壓缸或該馬達中設有可做往復伸縮之該推桿。 The method for removing fat edges of wafers as described in claim 6, wherein the bottom side of the working platform is provided with a lifting push rod connected to a preset power device, so that the working platform has a lifting function, and the preset power The device refers to a pneumatic cylinder with air supply equipment, a hydraulic cylinder with oil supply equipment, or a motor, and the pneumatic cylinder, the hydraulic cylinder, or the motor is provided with a reciprocating telescopic push rod. 如請求項6所述之應用於晶圓肥邊去除方法,其中該晶圓表面所形成之該已固化塗布層係指一光阻層或一絕緣層,而構成該絕緣層材料係為一聚醯亞胺。 The method for removing fat edges from wafers as described in claim 6, wherein the cured coating layer formed on the surface of the wafer refers to a photoresist layer or an insulating layer, and the material constituting the insulating layer is a polymer acyl imine. 如請求項6所述之應用於晶圓肥邊去除方法,其中該預設裁切治具係指一雷射模組或一熱熔切割裝置,而該預設吸附治具係指具有真空吸附力之一吸盤。 The method for removing fat edges from wafers as described in claim 6, wherein the preset cutting fixture refers to a laser module or a hot melt cutting device, and the preset adsorption fixture refers to a device with vacuum adsorption One of the forces is the sucker. 如請求項6所述之應用於晶圓肥邊去除方法,其中該塗刀具有供一塗布液流出之一噴嘴,且該塗刀與該噴嘴係呈一字型外觀。 The method for removing fat edges on wafers as described in claim 6, wherein the coating knife has a nozzle for a coating liquid to flow out, and the coating knife and the nozzle have a straight appearance.
TW111109935A 2022-03-17 2022-03-17 Adhesive Film Applied to Wafer Fat Edge Removal and Its Removal Method TWI814282B (en)

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Citations (2)

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Publication number Priority date Publication date Assignee Title
TW202135201A (en) * 2019-10-17 2021-09-16 日商東京威力科創股份有限公司 Substrate processing device, substrate processing method, and storage medium
TWM629553U (en) * 2022-03-17 2022-07-11 陽程科技股份有限公司 Film for wafer excess edge removal

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202135201A (en) * 2019-10-17 2021-09-16 日商東京威力科創股份有限公司 Substrate processing device, substrate processing method, and storage medium
TWM629553U (en) * 2022-03-17 2022-07-11 陽程科技股份有限公司 Film for wafer excess edge removal

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