TWI808703B - Photosensitive laminate, and method of manufacturing a circuit board using the same - Google Patents

Photosensitive laminate, and method of manufacturing a circuit board using the same Download PDF

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TWI808703B
TWI808703B TW111112289A TW111112289A TWI808703B TW I808703 B TWI808703 B TW I808703B TW 111112289 A TW111112289 A TW 111112289A TW 111112289 A TW111112289 A TW 111112289A TW I808703 B TWI808703 B TW I808703B
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photosensitive
less
bubbles
photosensitive resin
photosensitive laminate
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TW111112289A
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TW202244618A (en
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石想勳
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南韓商可隆工業股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/30Layered products comprising a layer of synthetic resin comprising vinyl (co)polymers; comprising acrylic (co)polymers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/30Layered products comprising a layer of synthetic resin comprising vinyl (co)polymers; comprising acrylic (co)polymers
    • B32B27/306Layered products comprising a layer of synthetic resin comprising vinyl (co)polymers; comprising acrylic (co)polymers comprising vinyl acetate or vinyl alcohol (co)polymers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/06Interconnection of layers permitting easy separation
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/12Esters of monohydric alcohols or phenols
    • C08F220/16Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms
    • C08F220/18Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms with acrylic or methacrylic acids
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F222/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
    • C08F222/10Esters
    • C08F222/12Esters of phenols or saturated alcohols
    • C08F222/20Esters containing oxygen in addition to the carboxy oxygen
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/032Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
    • G03F7/033Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/06Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/06Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
    • H05K3/061Etching masks
    • H05K3/064Photoresists
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Laminated Bodies (AREA)
  • Materials For Photolithography (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)

Abstract

The present disclosure relates to a photosensitive laminate comprising: a barrier layer having a haze of 2% or less; and a photosensitive resin layer which comprises a photopolymerizable compound containing a phthalate derivative, and a binder resin, wherein bubbles having a diameter of less than 1 μm are present at 5 bubbles/mm 2or less within the photosensitive resin layer, and a method of manufacturing the circuit board.

Description

光敏疊層以及使用其製備電路板之方法Photosensitive laminate and method for preparing circuit board using same

[相關申請案的交叉參考] [CROSS-REFERENCE TO RELATED APPLICATIONS]

本申請案主張2021年3月31日向韓國智慧財產局申請的韓國專利申請案第10-2021-0042141號的權益,所述韓國專利申請案的內容以全文引用的方式併入本文中。This application claims the benefit of Korean Patent Application No. 10-2021-0042141 filed with the Korean Intellectual Property Office on March 31, 2021, the content of which is incorporated herein by reference in its entirety.

本發明是關於一種光敏疊層以及一種製備電路板的方法。The invention relates to a photosensitive laminate and a method for preparing a circuit board.

光敏樹脂組成物以用於印刷電路板(printed circuit board;PCB)或引線框的乾膜光阻劑(dry film photoresist;DFR)、液體光阻劑油墨以及其類似物的形式使用。The photosensitive resin composition is used in the form of a dry film photoresist (DFR) for a printed circuit board (PCB) or a lead frame, a liquid photoresist ink, and the like.

最近,連同朝向更輕、更薄、更短且更緊密的半導體裝置及多級封裝的趨勢,需要高密度電路板,且亦廣泛使用應用超高壓汞燈或雷射直接曝光的製程或使用包含支撐膜及光敏樹脂層的光敏疊層製備電路板的方法以及其類似製程。Recently, along with the trend toward lighter, thinner, shorter, and more compact semiconductor devices and multilevel packaging, high-density circuit boards are required, and processes using ultra-high pressure mercury lamps or laser direct exposure or methods of preparing circuit boards using photosensitive laminations including support films and photosensitive resin layers and similar processes are also widely used.

因此,持續需要研發一種實現高密度及靈敏度同時確保較高可靠性且能夠形成更精細佈線的方法及製程。 [先前技術文獻] [專利文獻] (專利文獻1)日本未審查專利申請公開案第2006-106287號(2006年4月20日公開) Therefore, there is a continuing need to develop a method and process for achieving high density and sensitivity while ensuring high reliability and capable of forming finer wiring. [Prior Art Literature] [Patent Document] (Patent Document 1) Japanese Unexamined Patent Application Publication No. 2006-106287 (published on April 20, 2006)

本發明的一個目標為提供一種光敏疊層,所述光敏疊層可減少精細佈線形成中的缺陷,確保顯影期間的高可靠性且形成高密度電路。An object of the present invention is to provide a photosensitive laminate that can reduce defects in fine wiring formation, ensure high reliability during development, and form high-density circuits.

本發明的另一目標為提供一種使用光敏疊層製備電路板的方法。Another object of the present invention is to provide a method for preparing a circuit board using a photosensitive laminate.

根據本發明的一個態樣,可提供一種光敏疊層,包括:障壁層,具有2%或小於2%的混濁度;及光敏樹脂層,包括光可聚合化合物及黏合劑樹脂,所述光可聚合化合物含有鄰苯二甲酸酯衍生物,其中直徑小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於光敏樹脂層內。According to one aspect of the present invention, there is provided a photosensitive laminate comprising: a barrier layer having a haze of 2% or less; and a photosensitive resin layer including a photopolymerizable compound and a binder resin, the photopolymerizable compound containing phthalate derivatives, wherein bubbles with a diameter of less than 1 micron exist in the photosensitive resin layer at 5 bubbles/mm2 or less than 5 bubbles/mm2.

根據本發明的另一態樣,可提供一種使用光敏疊層製備電路板的方法。According to another aspect of the present invention, a method of preparing a circuit board using a photosensitive laminate may be provided.

下文中,將更詳細地描述根據本發明的特定實施例的光敏疊層及製備電路板的方法。Hereinafter, a photosensitive laminate and a method of manufacturing a circuit board according to certain embodiments of the present invention will be described in more detail.

如本文所用,重量平均分子量意謂藉由GPC方法相對於聚苯乙烯量測的重量平均分子量。在測定藉由GPC方法相對於聚苯乙烯量測的重量平均分子量的製程中,可使用普遍已知的分析裝置、諸如折射率偵測器的偵測器以及分析型管柱。可使用常用於溫度、溶劑以及流動速率的條件。As used herein, the weight average molecular weight means the weight average molecular weight measured by the GPC method relative to polystyrene. In the process of determining the weight-average molecular weight measured by the GPC method relative to polystyrene, commonly known analytical devices, detectors such as refractive index detectors, and analytical columns can be used. Common conditions for temperature, solvent, and flow rate can be used.

量測條件的特定實例如下:將鹼性可顯影黏合劑樹脂溶解於四氫呋喃中以便在THF中具有1.0 (w/w)%的濃度(按固體含量計,約0.5 (w/w)%),使用具有0.45微米孔徑的針筒過濾器過濾,且接著將20微升注入GPC中。GPC的移動相使用以1.0毫升/分鐘的流速進料的四氫呋喃(THF),管柱串聯連接一個Agilent PLgel 5 μm Guard(7.5×50毫米)及兩個Agilent PLgel 5 μm Mixed D(7.5×300毫米),Agilent 1260 Infinity Ⅱ系統,RI偵測器用作偵測器,且在40℃下進行量測。 A specific example of the measurement conditions is as follows: an alkaline developable binder resin was dissolved in tetrahydrofuran so as to have a concentration of 1.0 (w/w)% in THF (about 0.5 (w/w)% in terms of solid content), filtered using a syringe filter having a pore size of 0.45 μm, and then 20 microliters were injected into the GPC. The mobile phase of GPC used tetrahydrofuran (THF) fed at a flow rate of 1.0 ml/min. The column was connected in series with one Agilent PLgel 5 μm Guard (7.5×50 mm) and two Agilent PLgel 5 μm Mixed D (7.5×300 mm), Agilent 1260 Infinity II system, RI detector was used as a detector, and the measurement was performed at 40°C.

如下文所示,將聚苯乙烯標準樣本(STD A、B、C、D)(其中具有不同分子量的聚苯乙烯以0.1 (w/w)%的濃度溶解於四氫呋喃中)用具有0.45微米孔徑的針筒過濾器過濾,且接著注入GPC中,且使用所形成的校準曲線測定鹼性可顯影黏合劑樹脂的重量平均分子量(Mw)的值。 STD A(Mp):791,000 / 27,810 / 945 STD B(Mp):282,000 / 10,700 / 580 STD C(Mp):126,000 / 4,430 / 370 STD D(Mp):51,200 / 1,920 / 162 As shown below, polystyrene standard samples (STD A, B, C, D) in which polystyrenes having different molecular weights were dissolved in tetrahydrofuran at a concentration of 0.1 (w/w)% were filtered with a syringe filter having a pore size of 0.45 μm, and then injected into a GPC, and the value of the weight average molecular weight (Mw) of the alkaline developable binder resin was determined using the formed calibration curve. STD A (Mp): 791,000 / 27,810 / 945 STD B (Mp): 282,000 / 10,700 / 580 STD C (Mp): 126,000 / 4,430 / 370 STD D (Mp): 51,200 / 1,920 / 162

如本文所使用,術語「(光)固化產物」或「(光)固化」意謂不僅包含化學結構中具有可固化或可交聯不飽和基團的組分完全固化、交聯或聚合的情況,且亦包含此類組分部分固化、交聯或聚合的情況。As used herein, the term "(photo)cured product" or "(photo)cured" means not only the case where components having curable or crosslinkable unsaturated groups in the chemical structure are completely cured, crosslinked or polymerized, but also the case where such components are partially cured, crosslinked or polymerized.

根據本發明的另一實施例,可提供一種光敏疊層,包括:障壁層,具有2%或小於2%的混濁度;及光敏樹脂層,包括光可聚合化合物及黏合劑樹脂,所述光可聚合化合物含有鄰苯二甲酸酯衍生物,其中直徑小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於光敏樹脂層內。According to another embodiment of the present invention, there may be provided a photosensitive laminate comprising: a barrier layer having a haze of 2% or less; and a photosensitive resin layer including a photopolymerizable compound containing a phthalate derivative, wherein bubbles with a diameter of less than 1 micron exist in the photosensitive resin layer at 5 bubbles/mm2 or less than 5 bubbles/mm2.

本發明人新研發出一種光敏疊層,包含具有2%或小於2%的混濁度的障壁層及光敏樹脂層,其中直徑小於1微米或0.001微米或大於0.001微米且小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在,且經由實驗發現,當此類光敏疊層用於電路板的製備製程中時,有可能實現對曝光的高靈敏度,增加顯影期間的可靠性,在確保高可靠性的同時實現高密度及靈敏度,且使得能夠形成更精細的佈線,從而完成本發明。The present inventor has newly developed a photosensitive laminate, comprising a barrier layer with a turbidity of 2% or less and a photosensitive resin layer, wherein bubbles with a diameter of less than 1 micron or 0.001 micron or greater than 0.001 micron and less than 1 micron exist at 5 bubbles/mm2 or less than 5 bubbles/mm2, and found through experiments that when such a photosensitive laminate is used in the manufacturing process of a circuit board, it is possible to achieve high sensitivity to exposure, increase reliability during development, and achieve high reliability while ensuring high reliability. density and sensitivity, and enables the formation of finer wiring, thereby completing the present invention.

本發明人已發現,藉由包含具有2%或小於2%的混濁度且具有極佳光學特性的障壁層,有可能使用光敏疊層在乾膜光阻劑製備製程中實現極佳電路圖案解析度。特定而言,本發明人已發現,藉由包含具有2%或小於2%的混濁度的障壁層,障壁層可充當阻斷氧自由基反應的氧障壁膜,因此最小化外來物質或氣泡在光敏樹脂層中的形成,且改良最終製備的乾膜光阻劑的解析度及可靠性,從而完成本發明。The present inventors have found that it is possible to achieve excellent circuit pattern resolution in a dry film photoresist fabrication process using a photosensitive stack by including a barrier layer having a haze of 2% or less and having excellent optical properties. Specifically, the present inventors have found that by including a barrier layer having a haze of 2% or less, the barrier layer can serve as an oxygen barrier film that blocks oxygen radical reactions, thereby minimizing the formation of foreign substances or air bubbles in the photosensitive resin layer, and improving the resolution and reliability of the finally prepared dry film photoresist, thereby completing the present invention.

特定而言,在一個實施例的光敏疊層中,障壁層可具有2%或小於2%、0.001%或大於0.001%且2%或小於2%或0.1%或大於0.1%且2%或小於2%的混濁度。In particular, in the photosensitive stack of one embodiment, the barrier layer may have a haze of 2% or less, 0.001% or greater and 2% or less, or 0.1% or greater and 2% or less.

用於量測混濁度的方法不受特定限制,但其可根據ASTM D1003的量測方法使用混濁度儀(HAZE METER)(模型名稱:NDH7000,日本電色工業株式會社(Nippon Denshoku Corp.))來量測。The method for measuring the turbidity is not particularly limited, but it can be measured using a HAZE METER (model name: NDH7000, Nippon Denshoku Corp.) according to the measurement method of ASTM D1003.

待量測混濁度的障壁層的厚度可為0.1微米至10微米或1微米至3微米。當障壁層的厚度增加或減少特定值時,自障壁層量測的物理性質亦可改變特定值。The thickness of the barrier layer to be measured for turbidity may be 0.1 micron to 10 micron or 1 micron to 3 micron. When the thickness of the barrier layer increases or decreases by a certain value, the physical properties measured from the barrier layer may also change by a certain value.

當障壁層的混濁度超過2%時,可存在電路性質及解析度劣化的問題。When the turbidity of the barrier layer exceeds 2%, there may be a problem of degradation of circuit properties and resolution.

在一個實施例的光敏疊層中,障壁層可具有10立方公分/平方公尺/天或小於10立方公分/平方公尺/天、5立方公分/平方公尺/天或小於5立方公分/平方公尺/天、4立方公分/平方公尺/天或小於4立方公分/平方公尺/天、0.01立方公分/平方公尺/天或大於0.01立方公分/平方公尺/天且10立方公分/平方公尺/天或小於10立方公分/平方公尺/天、0.01立方公分/平方公尺/天或大於0.01立方公分/平方公尺/天且5立方公分/平方公尺/天或小於5立方公分/平方公尺/天或0.01立方公分/平方公尺/天或大於0.01立方公分/平方公尺/天且4立方公分/平方公尺/天或小於4立方公分/平方公尺/天的透氧性。用於量測透氧性的方法不受特定限制,但舉例而言,其可根據ASTM F1927的量測方法使用OX-Tran(模型2/61,美國膜康公司(Mocon Inc.))來量測。In one embodiment of the photosensitive laminate, the barrier layer may have a thickness of 10 cm3/m2/day or less, 5 cm3/m2/day or less than 5 cm3/m2/day, 4 cm3/m2/day or less than 4 cm3/m2/day, 0.01 cm3/m2/day or greater than 0.01 cm3/m2/day day and 10 cubic centimeters/square meter/day or less than 10 cubic centimeters/square meter/day, 0.01 cubic centimeters/square meter/day or greater than 0.01 cubic centimeters/square meter/day and 5 cubic centimeters/square meter/day or less than 5 cubic centimeters/square meter/day or 0.01 cubic centimeters/square meter/day or greater than 0.01 cubic centimeters/square meter/day and 4 cubic centimeters/square m/day or an oxygen permeability of less than 4 cm3/m2/day. The method for measuring the oxygen permeability is not particularly limited, but for example, it can be measured using OX-Tran (model 2/61, Mocon Inc.) according to the measurement method of ASTM F1927.

待量測透氧性的障壁層的厚度可為0.1微米至10微米或1微米至3微米。當障壁層的厚度增加或減少特定值時,自障壁層量測的物理性質亦可改變特定值。The thickness of the barrier layer to be measured for oxygen permeability can be 0.1 micron to 10 micron or 1 micron to 3 micron. When the thickness of the barrier layer increases or decreases by a certain value, the physical properties measured from the barrier layer may also change by a certain value.

由於障壁層具有10立方公分/平方公尺/天或小於10立方公分/平方公尺/天的透氧性,障壁層可充當阻斷氧自由基反應的氧障壁膜,因此最小化外來物質或氣泡在光敏樹脂層中的形成,且改良最終製備的乾膜光阻劑的解析度及可靠性。Since the barrier layer has an oxygen permeability of 10 cm3/m2/day or less than 10 cm3/m2/day, the barrier layer can serve as an oxygen barrier film that blocks oxygen free radical reactions, thereby minimizing the formation of foreign substances or bubbles in the photosensitive resin layer, and improving the resolution and reliability of the final dry film photoresist.

障壁層可由用於形成障壁層的組成物形成,且用於形成障壁層的組成物可包含聚乙烯醇樹脂。The barrier layer may be formed of a composition for forming a barrier layer, and the composition for forming a barrier layer may include a polyvinyl alcohol resin.

亦即,障壁層可包含重量平均分子量為5,000公克/莫耳至1,000,000公克/莫耳、7,000公克/莫耳至750,000公克/莫耳、7,000 g/mol至700,000公克/莫耳、7,000公克/莫耳至50,000公克/莫耳、7,000公克/莫耳至30,000公克/莫耳或10,000公克/莫耳至30,000公克/莫耳的聚乙烯醇樹脂。由於障壁層包含重量平均分子量為10,000公克/莫耳至1,000,000公克/莫耳的聚乙烯醇樹脂,因此障壁層的混濁度可滿足2%或小於2%。That is, the barrier layer may comprise a weight average molecular weight of 5,000 g/mol to 1,000,000 g/mol, 7,000 g/mol to 750,000 g/mol, 7,000 g/mol to 700,000 g/mol, 7,000 g/mol to 50,000 g/mol, 7,000 g/mol to 30, 000 grams/mole or 10,000 grams/mole to 30,000 grams/mole of polyvinyl alcohol resin. Since the barrier layer includes polyvinyl alcohol resin with a weight average molecular weight of 10,000 g/mol to 1,000,000 g/mol, the haze of the barrier layer may be 2% or less.

更特定而言,聚乙烯醇樹脂可具有1.0厘泊至10.0厘泊、3.0厘泊至10.0厘泊、3.0厘泊至5.0厘泊的黏度。由於聚乙烯醇樹脂的黏度滿足1.0厘泊至10.0厘泊,因此障壁層的混濁度可滿足2%或小於2%。More specifically, the polyvinyl alcohol resin may have a viscosity of 1.0 centipoise to 10.0 centipoise, 3.0 centipoise to 10.0 centipoise, 3.0 centipoise to 5.0 centipoise. Since the viscosity of the polyvinyl alcohol resin satisfies 1.0 centipoise to 10.0 centipoise, the turbidity of the barrier layer can satisfy 2% or less than 2%.

此外,用於形成障壁層的組成物可包含沸點為115℃或高於115℃的高沸點溶劑。In addition, the composition for forming the barrier layer may include a high boiling point solvent having a boiling point of 115°C or higher.

沸點為115℃或高於115℃的高沸點溶劑的實例可包含丁醇、二甲基甲醯胺、N-甲基-2-吡咯啶酮、γ丁內酯、丁基卡必醇(butyl capitol)、丁基賽路蘇(butyl cellosolve)、甲基賽路蘇(methyl cellosolve)、乙酸丁酯、二乙二醇甲乙醚、二乙二醇二甲醚、二乙二醇乙醚、二丙二醇二甲醚、3-甲氧基丙酸甲酯、3-乙氧基丙酸乙酯、丙二醇甲醚丙酸酯、二丙二醇二甲醚、環己酮、丙二醇單甲醚乙酸酯(propylene glycol monomethyl ether acetate;PGMEA)以及其一或多者的混合溶劑。Examples of the high-boiling solvent having a boiling point of 115° C. or higher may include butanol, dimethylformamide, N-methyl-2-pyrrolidone, γ-butyrolactone, butyl capitol, butyl cellosolve, methyl cellosolve, butyl acetate, diethylene glycol methyl ethyl ether, diethylene glycol dimethyl ether, diethylene glycol ethyl ether, Dipropylene glycol dimethyl ether, 3-methoxymethyl propionate, 3-ethoxy ethyl propionate, propylene glycol methyl ether propionate, dipropylene glycol dimethyl ether, cyclohexanone, propylene glycol monomethyl ether acetate (PGMEA) and a mixed solvent of one or more thereof.

特定而言,按聚乙烯醇樹脂的100重量份計,用於形成障壁層的組成物可包含呈60重量份或大於60重量份、60重量份或大於60重量份且200重量份或小於200重量份、70重量份或大於70重量份且200重量份或小於200重量份、80重量份或大於80重量份且200重量份或小於200重量份、80重量份或大於80重量份且100重量份或小於100重量份或90重量份或大於90重量份且100重量份或小於100重量份的量的沸點為115℃或高於115℃的高沸點溶劑。Specifically, based on 100 parts by weight of the polyvinyl alcohol resin, the composition for forming the barrier layer may include 60 parts by weight or more, 60 parts by weight or more and 200 parts by weight or less, 70 parts by weight or more and 200 parts by weight or less, 80 parts by weight or more than 80 parts by weight and 200 parts by weight or less, 80 parts by weight or more than 80 parts by weight and 1 00 parts by weight or less or 90 parts by weight or more and 100 parts by weight or less of a high boiling point solvent having a boiling point of 115°C or higher.

由於用於形成障壁層的組成物含有按聚乙烯醇樹脂的100重量份計60重量份或大於60重量份的沸點為115℃或高於115℃的高沸點溶劑,因此障壁層的混濁度可滿足2%或小於2%,且當用於形成障壁層的組成物含有按100聚乙烯醇樹脂的重量份計小於60重量份的沸點為115℃或高於115℃的高沸點溶劑時,可能存在障壁層的混濁度急劇增加的技術問題。Since the composition for forming the barrier layer contains 60 parts by weight or more of a high-boiling solvent having a boiling point of 115° C. or higher based on 100 parts by weight of the polyvinyl alcohol resin, the turbidity of the barrier layer may be 2% or less, and when the composition for forming the barrier layer contains less than 60 parts by weight of a high-boiling solvent having a boiling point of 115° C. or higher based on 100 parts by weight of the polyvinyl alcohol resin. Technical problem with sharp increase in turbidity.

光敏疊層中的障壁層及光敏樹脂層的厚度不受特定限制,但作為一特定實例,障壁層可具有0.1微米至10微米或1微米至3微米的厚度,且光敏樹脂層的厚度可為1微米至100微米或5微米至50微米。The thicknesses of the barrier layer and the photosensitive resin layer in the photosensitive laminate are not particularly limited, but as a specific example, the barrier layer may have a thickness of 0.1 micron to 10 microns or 1 micron to 3 microns, and the thickness of the photosensitive resin layer may be 1 micron to 100 microns or 5 microns to 50 microns.

一個實施例的光敏疊層可更包含形成於障壁層上且具有1微米至100微米的厚度的支撐基板。作為一特定實例,支撐基板的厚度可為1微米至100微米或5微米至50微米。亦即,一個實施例的光敏疊層可具有其中支撐基板、障壁層及光敏樹脂層依序層壓的層壓結構。支撐基板可在製備光敏疊層的製程中充當一種載體。此外,視塗覆光敏疊層的半導體製備製程或最終製備的產物而定,支撐基板視需要可含於光敏疊層中或可不含於光敏疊層中。The photosensitive stack of one embodiment may further include a supporting substrate formed on the barrier layer and having a thickness of 1 μm to 100 μm. As a specific example, the supporting substrate may have a thickness of 1 micron to 100 microns or 5 microns to 50 microns. That is, the photosensitive laminate of one embodiment may have a laminated structure in which a support substrate, a barrier layer, and a photosensitive resin layer are sequentially laminated. The support substrate acts as a carrier during the process of making the photosensitive stack. In addition, depending on the semiconductor manufacturing process or the final product to be coated with the photosensitive stack, the support substrate may or may not be included in the photosensitive stack as needed.

另外,一個實施例的光敏疊層可更包含形成於光敏樹脂層上且具有0.01微米至1公尺的厚度的釋放層。作為一特定實例,釋放層的厚度可為0.01微米至1公尺、1微米至100微米或5微米至50微米。亦即,一個實施例的光敏疊層可具有其中支撐基板、障壁層、光敏樹脂層及釋放層依序層壓的層壓結構。In addition, the photosensitive laminate in one embodiment may further include a release layer formed on the photosensitive resin layer and having a thickness of 0.01 μm to 1 meter. As a specific example, the release layer may have a thickness of 0.01 microns to 1 meter, 1 micron to 100 microns, or 5 microns to 50 microns. That is, the photosensitive laminate of one embodiment may have a laminated structure in which a support substrate, a barrier layer, a photosensitive resin layer, and a release layer are sequentially laminated.

如上文所描述,在使用光敏疊層的乾膜光阻劑製備製程中,可移除支撐基板及釋放層。由於光敏疊層包含混濁度為2%或小於2%的障壁層,因此即使移除支撐基板,最終製備的乾膜光阻劑亦可實現極佳可靠性及解析度。As described above, during the dry film photoresist fabrication process using photosensitive lamination, the support substrate and release layer may be removed. Since the photosensitive stack includes a barrier layer with a haze of 2% or less, the resulting dry film photoresist can achieve excellent reliability and resolution even when the support substrate is removed.

特定而言,在一個實施例的光敏疊層中,由於直徑小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於光敏樹脂層內或氣泡實質上不存在,因此在僅形成混濁度為2%或小於2%的障壁層的狀態下,仍適用於半導體製備製程,由此即使在較薄厚度的情況下,有可能實現與習知地已知光敏疊層相比相同水準或更高水準的可靠性及靈敏度。Specifically, in the photosensitive laminate of one embodiment, since bubbles with a diameter of less than 1 micron exist in the photosensitive resin layer at a rate of 5 bubbles/mm2 or less than 5 bubbles/mm2 or the bubbles are substantially absent, only a barrier layer with a turbidity of 2% or less is formed, which is still applicable to the semiconductor manufacturing process, so that even in the case of a thinner thickness, it is possible to achieve the same level or higher level of reliability and sensitivity than conventionally known photosensitive laminates.

此外,由於一個實施例的光敏疊層適用於剝離諸如聚對苯二甲酸伸乙酯(polyethylene terephthalate;PET)膜的支撐基板的狀態下的半導體製備製程,因此可消除在半導體製備製程中單獨剝離支撐基板。此外,在諸如聚對苯二甲酸伸乙酯(PET)膜的支撐基板交錯或層壓的結構中,有可能改良支撐基板對光學特性、曝光、顯影、靈敏度實現以及其類似者具有限制的點。In addition, since the photosensitive laminate of one embodiment is applicable to a semiconductor manufacturing process in a state where a supporting substrate such as a polyethylene terephthalate (PET) film is peeled off, separate peeling of the supporting substrate in the semiconductor manufacturing process can be eliminated. In addition, in a structure in which support substrates such as polyethylene terephthalate (PET) films are interleaved or laminated, it is possible to improve points where support substrates have limitations on optical characteristics, exposure, development, sensitivity realization, and the like.

同時,本發明人已持續進行研究及研發以移除可能出於製備製程中的各種原因出現的痕量微細氣泡或精細副產物。如上文所描述,在稍後描述的用於製備光敏疊層的方法中,本發明人已使用樹脂組成物,所述樹脂組成物包含:含有沸點為115℃或高於115℃的高沸點溶劑及沸點為100℃或低於100℃的低沸點溶劑的混合溶劑;黏合劑樹脂、含有鄰苯二甲酸酯衍生物的光可聚合化合物;以及光起始劑,且使得直徑小於1微米的氣泡有可能以5個氣泡/平方毫米或小於5個氣泡/平方毫米或3個氣泡/平方毫米或小於3個氣泡/平方毫米存在於光敏樹脂層內。Meanwhile, the present inventors have continuously conducted research and development to remove traces of fine air bubbles or fine by-products that may occur due to various reasons in the manufacturing process. As described above, in the method for producing a photosensitive laminate described later, the present inventors have used a resin composition comprising: a mixed solvent containing a high-boiling solvent having a boiling point of 115° C. or higher and a low-boiling solvent having a boiling point of 100° C. or lower; a binder resin; a photopolymerizable compound containing a phthalate derivative; /mm2 or 3 bubbles/mm2 or less than 3 bubbles/mm2 exist in the photosensitive resin layer.

此外,在光敏疊層的製備方法中,除使用含有沸點為115℃或高於115℃的高沸點溶劑及沸點為100℃或低於100℃的低沸點溶劑的混合溶劑以外,形成於光敏樹脂層中的精細氣泡的體積可藉由調節乾燥速率及/或乾燥溫度而顯著降低或實質上不存在。In addition, in the preparation method of the photosensitive laminate, in addition to using a mixed solvent containing a high-boiling solvent having a boiling point of 115°C or higher and a low-boiling solvent having a boiling point of 100°C or lower, the volume of fine air bubbles formed in the photosensitive resin layer can be significantly reduced or substantially absent by adjusting the drying rate and/or drying temperature.

同時,直徑小於1微米的氣泡可以5個氣泡/平方毫米或小於5個氣泡/平方毫米或3個氣泡/平方毫米或小於3個氣泡/平方毫米存在於光敏樹脂層內。特定而言,直徑小於1微米的氣泡可以痕量存在或實質上不存在於在支撐基板與光敏樹脂層之間的界面的相對表面上或朝向光敏樹脂層的外表面。在自障壁層與光敏樹脂層之間的界面的相對表面開始的光敏樹脂層的總厚度的50%內,直徑小於1微米的氣泡可以3個氣泡/平方毫米或小於3個氣泡/平方毫米存在。Meanwhile, bubbles with a diameter of less than 1 micron may exist in the photosensitive resin layer at or below 5 bubbles/mm2 or 3 bubbles/mm2 or less. In particular, air bubbles having a diameter of less than 1 micrometer may exist in a trace amount or substantially not exist on the opposite surface of the interface between the support substrate and the photosensitive resin layer or toward the outer surface of the photosensitive resin layer. Within 50% of the total thickness of the photosensitive resin layer from the opposite surface of the interface between the barrier layer and the photosensitive resin layer, bubbles with a diameter of less than 1 μm may exist at or below 3 bubbles/mm2.

由於直徑小於1微米的氣泡可以痕量存在或實質上不存在於障壁層與光敏樹脂層之間的界面的相對表面上或朝向光敏樹脂層的外表面,因此其可增強顯影期間的可靠性,使得能夠形成高密度電路且減少精細佈線形成中的缺陷,由此當使用光敏疊層時,其可實現對曝光的高靈敏度且改良高密度印刷電路板的製備良率。Since air bubbles with a diameter of less than 1 micrometer may exist in trace amounts or substantially not exist on the opposite surface of the interface between the barrier layer and the photosensitive resin layer or toward the outer surface of the photosensitive resin layer, it can enhance reliability during development, enable formation of high-density circuits and reduce defects in fine wiring formation, thereby enabling high sensitivity to exposure and improving production yield of high-density printed circuit boards when using a photosensitive laminate.

此外,如上文所描述,光敏疊層不僅可以痕量含有或實質上不含有直徑小於1微米的氣泡,且亦可不含有直徑為1微米或大於1微米且5微米或小於5微米的氣泡。In addition, as described above, the photosensitive laminate may not only contain traces or substantially no bubbles with a diameter of less than 1 micron, but also may not contain bubbles with a diameter of 1 micron or more and 5 microns or less.

當藉由使用如上文所描述的其中直徑小於1微米的氣泡以痕量存在於光敏樹脂層內的光敏疊層製備電路板時,在確保高可靠性的同時實現高密度及靈敏度,且可形成更精細的佈線。When a circuit board is prepared by using a photosensitive laminate in which air bubbles having a diameter of less than 1 micron exist in a trace amount in a photosensitive resin layer as described above, high density and sensitivity are achieved while ensuring high reliability, and finer wiring can be formed.

更特定而言,即使光敏樹脂層曝光於紫外線且用鹼性溶液顯影,缺陷亦可能不會出現於整個區域上方,或即使其出現,亦可以極小量出現。特定而言,缺陷實質上不存在於光敏樹脂層的上部表面上,且在顯影之後,精細大小的缺陷可存在於光敏樹脂層的下表面或內部上。More specifically, even if the photosensitive resin layer is exposed to ultraviolet rays and developed with an alkaline solution, defects may not appear over the entire area, or even if they appear, they may appear in an extremely small amount. Specifically, defects do not substantially exist on the upper surface of the photosensitive resin layer, and after development, fine-sized defects may exist on the lower surface or inside of the photosensitive resin layer.

特定而言,在用紫外線曝光光敏樹脂層且用鹼性溶液對其顯影之後,可在3個缺陷/平方毫米或小於3個缺陷/平方毫米或1個缺陷/平方毫米或小於1個缺陷/平方毫米下觀測到橫截面直徑為0.3微米至4微米或0.5微米或大於0.5微米且3微米或小於3微米的缺陷,或可實質上不存在。缺陷的橫截面直徑可定義為在光敏樹脂層上沿一個方向的橫截面中限定的缺陷直徑中的最大直徑。Specifically, after exposing the photosensitive resin layer with ultraviolet rays and developing it with an alkaline solution, defects having a cross-sectional diameter of 0.3 μm to 4 μm or 0.5 μm or greater than 0.5 μm and 3 μm or less may be observed at 3 defects/mm2 or less or 1 defect/mm2 or less or may be substantially absent. The cross-sectional diameter of a defect may be defined as the largest diameter among defect diameters defined in a cross-section along one direction on the photosensitive resin layer.

曝光及顯影的條件不受特定限制。舉例而言,用範圍介於340奈米至420奈米的光波長照射光敏疊層,且在使用來自Stouffer Graphic Arts Equipment的41階段式曝光表(41-step tablet),量測的剩餘級的級數變為15級時的能量的量下,曝光可進行1分鐘至60分鐘。此外,可藉由諸如噴霧噴射方法的方法用諸如Na 2CO 3的濃度為0.1重量%至3.0重量%的鹼性水溶液進行顯影。 The conditions of exposure and development are not particularly limited. For example, the photosensitive stack is irradiated with light wavelengths in the range of 340 nm to 420 nm, and the exposure can be performed for 1 minute to 60 minutes at the amount of energy at which the number of remaining steps becomes 15 steps measured using a 41-step tablet from Stouffer Graphic Arts Equipment. In addition, development can be performed with an alkaline aqueous solution such as Na 2 CO 3 at a concentration of 0.1% by weight to 3.0% by weight by a method such as a spray spray method.

此外,當使用光敏疊層時,即使在使用較低能量時,仍可實現較高密度及靈敏度。更特定而言,用範圍介於340奈米至420奈米的光波長照射光敏疊層,且使用來自Stouffer Graphic Arts Equipment的41階段式曝光表,量測的剩餘級的級數變為15級時的能量的量可為300毫焦/平方公分或小於300毫焦/平方公分或100毫焦/平方公分或小於100毫焦/平方公分,且顯影後的解析度可在15微米或小於15微米、或10微米或小於10微米、或7微米或小於7微米、或5微米或小於5微米下實現。Furthermore, when using photosensitive stacks, higher densities and sensitivities can be achieved even at lower energies. More specifically, the photosensitive stack is irradiated with a wavelength of light in the range of 340 nm to 420 nm, and using a 41-step exposure meter from Stouffer Graphic Arts Equipment, the measured amount of energy at which the number of steps of the remaining steps becomes 15 steps can be 300 mJ/cm2 or less or 100 mJ/cm2 or less, and the resolution after development can be Achieved at 15 microns or less, or 10 microns or less, or 7 microns or less, or 5 microns or less.

同時,光敏疊層的特性或其中直徑小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於光敏樹脂層內的結構特性可歸因於上文所描述的製備方法,且可歸因於光敏樹脂層的特性。Meanwhile, the characteristics of the photosensitive laminate or the structural characteristics in which bubbles with a diameter of less than 1 micron exist in the photosensitive resin layer at or below 5 bubbles/mm2 are attributable to the above-described manufacturing method and are attributable to the properties of the photosensitive resin layer.

特定而言,光敏樹脂層可包含含有羧基的鹼性可顯影黏合劑樹脂。鹼性可顯影黏合劑在分子中含有至少一個羧基且可在顯影製程期間與鹼反應。Specifically, the photosensitive resin layer may include an alkaline developable binder resin containing a carboxyl group. Alkaline developable binders contain at least one carboxyl group in the molecule and can react with a base during the development process.

鹼性可顯影黏合劑的特定實例不受限制,但可為含有至少一個由以下所組成的族群中選出的重複單元的聚合物或共聚物:由以下化學式4表示的重複單元、由以下化學式5表示的重複單元以及由以下化學式6表示的重複單元。 [化學式4] 其中,在化學式4中,R 3為氫或具有1個至10個碳原子的烷基, [化學式5] 其中,在化學式5中,R 4為氫或具有1個至10個碳原子的烷基,且R 5為具有1個至10個碳原子的烷基 [化學式6] 其中,在化學式6中,Ar為具有6個至20個碳原子的芳基。 Specific examples of the alkali-developable binder are not limited, but may be polymers or copolymers containing at least one repeating unit selected from the group consisting of a repeating unit represented by the following Chemical Formula 4, a repeating unit represented by the following Chemical Formula 5, and a repeating unit represented by the following Chemical Formula 6. [chemical formula 4] Wherein, in Chemical Formula 4, R 3 is hydrogen or an alkyl group having 1 to 10 carbon atoms, [Chemical Formula 5] Wherein, in Chemical Formula 5, R 4 is hydrogen or an alkyl group having 1 to 10 carbon atoms, and R 5 is an alkyl group having 1 to 10 carbon atoms [Chemical Formula 6] Wherein, in Chemical Formula 6, Ar is an aryl group having 6 to 20 carbon atoms.

在化學式4至化學式6中,R 3與R 4彼此相同或不同且各自獨立地為氫或具有1個至10個碳原子的烷基,R 5為具有1個至10個碳原子的烷基,且Ar為具有6個至20個碳原子的芳基。 In Chemical Formula 4 to Chemical Formula 6, R3 and R4 are the same or different from each other and each independently is hydrogen or an alkyl group having 1 to 10 carbon atoms, R5 is an alkyl group having 1 to 10 carbon atoms, and Ar is an aryl group having 6 to 20 carbon atoms.

在化學式2至化學式4中,R 3與R 4彼此相同或不同且可各自獨立地為氫或具有1個至10個碳原子的烷基中的任一者,其中具有1個至10個碳原子的烷基的特定實例包含甲基。 In Chemical Formula 2 to Chemical Formula 4, R3 and R4 are the same or different from each other and may each independently be any of hydrogen or an alkyl group having 1 to 10 carbon atoms, wherein specific examples of the alkyl group having 1 to 10 carbon atoms include a methyl group.

R 5為具有1個至10個碳原子的烷基,且具有1個至10個碳原子的烷基的特定實例包含甲基。 R 5 is an alkyl group having 1 to 10 carbon atoms, and specific examples of the alkyl group having 1 to 10 carbon atoms include methyl.

Ar為具有6個至20個碳原子的芳基,且具有6個至20個碳原子的芳基的特定實例包含苯基。Ar is an aryl group having 6 to 20 carbon atoms, and specific examples of the aryl group having 6 to 20 carbon atoms include phenyl.

由化學式4表示的重複單元可為衍生自由以下化學式4-1表示的單體的重複單元。 [化學式4-1] 其中,在化學式4-1中,R 3為氫或具有1個至10個碳原子的烷基。在化學式4-1中,關於R 3的內容與上文在化學式4中所描述的彼等相同。由化學式4-1表示的單體的特定實例包含丙烯酸(acrylic acid;AA)及甲基丙烯酸(methacrylic acid;MAA)。 The repeating unit represented by Chemical Formula 4 may be a repeating unit derived from a monomer represented by the following Chemical Formula 4-1. [chemical formula 4-1] Wherein, in Chemical Formula 4-1, R 3 is hydrogen or an alkyl group having 1 to 10 carbon atoms. In Chemical Formula 4-1, the contents regarding R 3 are the same as those described in Chemical Formula 4 above. Specific examples of the monomer represented by Chemical Formula 4-1 include acrylic acid (AA) and methacrylic acid (MAA).

由化學式5表示的重複單元可為衍生自由以下化學式5-1表示的單體的重複單元。 [化學式5-1] 其中,在化學式5-1中,R 4為氫或具有1個至10個碳原子的烷基,且R 5為具有1個至10個碳原子的烷基。在化學式5-1中,R 4及R 5與上文在化學式5中所描述相同。由化學式5-1表示的單體的特定實例包含甲基丙烯酸甲酯(methyl methacrylate;MMA)及丙烯酸丁酯(butyl acrylate;BA)。 The repeating unit represented by Chemical Formula 5 may be a repeating unit derived from a monomer represented by the following Chemical Formula 5-1. [chemical formula 5-1] Wherein, in Chemical Formula 5-1, R 4 is hydrogen or an alkyl group having 1 to 10 carbon atoms, and R 5 is an alkyl group having 1 to 10 carbon atoms. In Chemical Formula 5-1, R 4 and R 5 are the same as described above in Chemical Formula 5. Specific examples of the monomer represented by Chemical Formula 5-1 include methyl methacrylate (MMA) and butyl acrylate (BA).

由化學式6表示的重複單元可為衍生自由以下化學式6-1表示的單體的重複單元。 [化學式6-1] 其中,在化學式6-1中,Ar為具有6個至20個碳原子的芳基。在化學式6-1中,關於Ar的內容與上文在化學式4中所描述的彼等相同。由化學式6-1表示的單體的特定實例可包含苯乙烯(styrene;SM)。 The repeating unit represented by Chemical Formula 6 may be a repeating unit derived from a monomer represented by the following Chemical Formula 6-1. [chemical formula 6-1] Wherein, in Chemical Formula 6-1, Ar is an aryl group having 6 to 20 carbon atoms. In Chemical Formula 6-1, the contents regarding Ar are the same as those described in Chemical Formula 4 above. A specific example of the monomer represented by Chemical Formula 6-1 may include styrene (SM).

同時,黏合劑樹脂可充當光敏樹脂層的基板,且因此必須具有最小分子量。舉例而言,其可具有20,000公克/莫耳至300,000公克/莫耳、30,000公克/莫耳至300,000公克/莫耳、30,000公克/莫耳至250,000公克/莫耳、30,000公克/莫耳至200,000公克/莫耳或30,000公克/莫耳至150,000公克/莫耳的重量平均分子量。Meanwhile, the binder resin may serve as a substrate for the photosensitive resin layer, and thus must have a minimum molecular weight. For example, it can have 20,000 grams/mole to 300,000 grams/mole, 30,000 grams/mole to 300,000 grams/mole, 30,000 grams/mole to 250,000 grams/mole, 30,000 grams/mole to 200,000 grams/mole or 30,000 grams/mole to 150 ,000 g/mole weight average molecular weight.

此外,黏合劑樹脂應具有至少某一水準的耐熱性,且因此可具有20℃以上且150℃以下、50℃以上且150℃以下、70℃以上且150℃以下、70℃以上且120℃以下、80℃以上且120℃以下或100℃以上且120℃以下的玻璃轉化溫度。In addition, the binder resin should have at least a certain level of heat resistance, and thus may have a glass transition temperature of 20°C to 150°C, 50°C to 150°C, 70°C to 150°C, 70°C to 120°C, 80°C to 120°C, or 100°C to 120°C.

此外,考慮到光敏樹脂層的可顯影性,黏合劑樹脂可具有100 mgKOH/g以上且300 mgKOH/g以下、120 mgKOH/g以上且300 mgKOH/g以下、120 mgKOH/g以上且250 mgKOH/g以下、120 mgKOH/g以上且200 mgKOH/g以下或150 mgKOH/g以上且200 mgKOH/g以下的酸值。In addition, the binder resin may have 100 mgKOH/g to 300 mgKOH/g, 120 mgKOH/g to 300 mgKOH/g, 120 mgKOH/g to 250 mgKOH/g, 120 mgKOH/g to 200 mgKOH/g, or 150 mgKOH/g to 200 mgKOH/g in consideration of the developability of the photosensitive resin layer. Acid value below mgKOH/g.

同時,黏合劑樹脂可包含兩種或大於兩種具有不同類型或不同性質的鹼性可顯影黏合劑。特定而言,黏合劑樹脂可包含第一鹼性可顯影黏合劑樹脂及第二鹼性可顯影黏合劑樹脂。Meanwhile, the binder resin may contain two or more alkali-developable binders having different types or different properties. Specifically, the binder resin may include a first alkali-developable binder resin and a second alkali-developable binder resin.

第一鹼性可顯影黏合劑樹脂及第二鹼性可顯影黏合劑樹脂可具有20,000公克/莫耳至300,000公克/莫耳、30,000公克/莫耳至300,000公克/莫耳、30,000公克/莫耳至250,000公克/莫耳、30,000公克/莫耳至200,000公克/莫耳或30,000公克/莫耳至150,000公克/莫耳的重量平均分子量以及20℃以上且150℃以下、50℃以上且150℃以下、70℃以上且150℃以下、70℃以上且120℃以下、80℃以上且120℃以下或100℃以上且120℃以下的玻璃轉化溫度。此等可分別具有不同的重量平均分子量、玻璃轉化溫度或酸值。The first alkaline developable binder resin and the second alkaline developable binder resin can have 20,000 grams/mole to 300,000 grams/mole, 30,000 grams/mole to 300,000 grams/mole, 30,000 grams/mole to 250,000 grams/mole, 30,000 grams/mole to 200,000 grams/mole, or 3 A weight average molecular weight of 0,000 g/mol to 150,000 g/mol and a glass transition temperature of 20°C to 150°C, 50°C to 150°C, 70°C to 150°C, 70°C to 120°C, 80°C to 120°C, or 100°C to 120°C. These may each have a different weight average molecular weight, glass transition temperature or acid number.

舉例而言,第一鹼性可顯影黏合劑樹脂可具有140 mgKOH/g以上且160 mgKOH/g以下的酸值。同樣,第二鹼性可顯影黏合劑樹脂可具有160 mgKOH/g以上且200 mgKOH/g以下的酸值。For example, the first alkali-developable binder resin may have an acid value of not less than 140 mgKOH/g and not more than 160 mgKOH/g. Also, the second alkali-developable binder resin may have an acid value of not less than 160 mgKOH/g and not more than 200 mgKOH/g.

此外,第一鹼性可顯影黏合劑樹脂與第二鹼性可顯影黏合劑樹脂的玻璃轉化溫度的比率可為1:1.5或大於1:1.5且1:5或小於1:5、1:1.5或大於1:1.5且1:3或小於1:3、1:1.5或大於1:1.5且1:2或小於1:2、1:1.5或大於1:1.5且1:1.8或小於1:1.8、1:1.5或大於1:1.5且1:75或小於1:75或1:1.6或大於1:1.6且1:7或小於1:7。In addition, the ratio of the glass transition temperature of the first alkaline developable binder resin to the second alkaline developable binder resin may be 1:1.5 or greater than 1:1.5 and 1:5 or less than 1:5, 1:1.5 or greater than 1:1.5 and 1:3 or less, 1:1.5 or greater than 1:1.5 and 1:2 or less than 1:2, 1:1.5 or greater than 1:1.5 and 1:1.8 or less than 1:1.8, 1:1.5 or greater 1.5 or greater than 1:1.5 and 1:75 or less than 1:75 or 1:1.6 or greater than 1:1.6 and 1:7 or less than 1:7.

此外,第一鹼性可顯影黏合劑樹脂與第二鹼性可顯影黏合劑樹脂的酸值比可為1:1.01或大於1:1.01且1:1.5或小於1:1.5、1:1.1或大於1:1.1且1:1.5或小於1:1.5、1:1.25或大於1:1.25且1:1.5或小於1:1.5或1:1.4或大於1:1.4且1:1.5或小於1:1.5。In addition, the acid value ratio of the first alkaline-developable binder resin to the second alkaline-developable binder resin may be 1:1.01 or greater than 1:1.01 and 1:1.5 or less than 1:1.5, 1:1.1 or greater than 1:1.1 and 1:1.5 or less than 1:1.5, 1:1.25 or greater than 1:1.25 and 1:1.5 or less than 1:1.5 or 1:1.4 or greater than 1:1.4 and 1 :1.5 or less than 1:1.5.

同時,光敏樹脂層可包含黏合劑樹脂與含有鄰苯二甲酸酯衍生物的光可聚合化合物之間的交聯共聚物。Meanwhile, the photosensitive resin layer may include a cross-linked copolymer between a binder resin and a photopolymerizable compound containing a phthalate derivative.

含有鄰苯二甲酸酯衍生物的光可聚合化合物可充當用於增加光敏樹脂層的機械強度及其類似者或用以增加對顯影劑的抗性且賦予固化膜的可撓性的交聯劑。The photopolymerizable compound containing a phthalate derivative may serve as a crosslinking agent for increasing the mechanical strength of the photosensitive resin layer and the like or for increasing resistance to a developer and imparting flexibility to a cured film.

鄰苯二甲酸酯衍生物可包含衍生自鄰苯二甲酸酯的中央基團及與其鍵結的反應性官能基。鄰苯二甲酸酯衍生物可包含1個或大於1個、或2個或大於2個、或3個或大於3個、或10個或小於10個反應性官能基。反應性官能基的特定實例可包含鹵素、羥基、醚鍵(-O-)、酯鍵(-COO-或O-CO-)、醯胺鍵(-NHCO-或CONH-)、乙烯基、(甲基)丙烯酸酯基或芳基。因為鄰苯二甲酸酯衍生物具有上文所提及的結構,所以可增強對電鍍溶液及蝕刻溶液的抗性且可更易於實現精細圖案。The phthalate derivative may comprise a central group derived from a phthalate and a reactive functional group bonded thereto. The phthalate derivative may contain 1 or more, or 2 or more, or 3 or more, or 10 or less reactive functional groups. Specific examples of the reactive functional group may include a halogen, a hydroxyl group, an ether bond (-O-), an ester bond (-COO- or O-CO-), an amide bond (-NHCO- or CONH-), a vinyl group, a (meth)acrylate group, or an aryl group. Since the phthalate derivative has the above-mentioned structure, resistance to plating solutions and etching solutions may be enhanced and fine patterns may be more easily realized.

鄰苯二甲酸酯衍生物的重量平均分子量不受特定限制,但例如其可具有50公克/莫耳至10,000公克/莫耳、或70公克/莫耳至5,000公克/莫耳、或80公克/莫耳至1,200公克/莫耳、或100公克/莫耳至1,000公克/莫耳、或150公克/莫耳至500公克/莫耳的重量平均分子量。The weight average molecular weight of the phthalate derivative is not particularly limited, but for example, it may have a weight average of 50 g/mol to 10,000 g/mol, or 70 g/mol to 5,000 g/mol, or 80 g/mol to 1,200 g/mol, or 100 g/mol to 1,000 g/mol, or 150 g/mol to 500 g/mol. molecular weight.

同時,鄰苯二甲酸酯衍生物的特定實例可包含以下化學式1的化合物。 [化學式1] 其中,在化學式1中,R1及R2各自獨立地為氫或具有1至20個碳原子的脂族烴基,且脂族烴基可視需要包括鹵素原子、羥基、醚鍵(-O-)、酯鍵(-COO-或O-CO-)、醯胺鍵(-NHCO-或CONH-)、(甲基)丙烯酸酯基或芳基。 Meanwhile, specific examples of phthalate derivatives may include compounds of Chemical Formula 1 below. [chemical formula 1] Wherein, in Chemical Formula 1, R1 and R2 are each independently hydrogen or an aliphatic hydrocarbon group having 1 to 20 carbon atoms, and the aliphatic hydrocarbon group may optionally include a halogen atom, a hydroxyl group, an ether bond (-O-), an ester bond (-COO- or O-CO-), an amide bond (-NHCO- or CONH-), a (meth)acrylate group or an aryl group.

此外,鄰苯二甲酸酯衍生物或化學式1的化合物的更特定實例可包含以下化學式2的化合物或以下化學式3的化合物: [化學式2] [化學式3] In addition, more specific examples of the phthalate derivative or the compound of Chemical Formula 1 may include the compound of the following Chemical Formula 2 or the compound of the following Chemical Formula 3: [Chemical Formula 2] [chemical formula 3]

同時,含有鄰苯二甲酸酯衍生物的光可聚合化合物的含量可根據光敏樹脂層的特定用途或特性進行調節。舉例而言,按鹼性可顯影黏合劑樹脂的100重量份計,可含有呈1重量份至80重量份、1重量份至50重量份、1重量份至30重量份、1重量份至20重量份、1重量份至10重量份、2重量份至50重量份、2重量份至30重量份、2重量份至20重量份、2重量份至10重量份、5重量份至50重量份、5重量份至30重量份、5重量份至20重量份、5重量份至10重量份的量的含有鄰苯二甲酸酯衍生物的光可聚合化合物。Meanwhile, the content of the photopolymerizable compound containing phthalate derivatives may be adjusted according to specific uses or characteristics of the photosensitive resin layer. For example, based on 100 parts by weight of the alkaline developable binder resin, 1 to 80 parts by weight, 1 to 50 parts by weight, 1 to 30 parts by weight, 1 to 20 parts by weight, 1 to 10 parts by weight, 2 to 50 parts by weight, 2 to 30 parts by weight, 2 to 20 parts by weight, 2 to 10 parts by weight, 5 to 50 parts by weight, 5 to 30 parts by weight , 5 parts by weight to 20 parts by weight, 5 parts by weight to 10 parts by weight of photopolymerizable compounds containing phthalate derivatives.

亦即,由於實施例的光敏疊層藉由混合如稍後描述的製備方法中所描述的具有不同沸點的兩種或大於兩種類型的溶劑來使用,且視含有鄰苯二甲酸酯衍生物的光可聚合化合物的選擇而定,精細氣泡可以痕量存在或實質上不存在於光敏樹脂層內。That is, since the photosensitive laminate of Example is used by mixing two or more types of solvents having different boiling points as described in the production method described later, and depending on the selection of the photopolymerizable compound containing phthalate derivatives, fine air bubbles may exist in a trace amount or substantially not exist in the photosensitive resin layer.

特定而言,歸因於含有鄰苯二甲酸酯衍生物的光可聚合化合物的結構及特性,直徑為1微米或小於1微米的氣泡可以痕量存在於光敏樹脂層內,由此有可能提供可減少精細佈線形成中的缺陷、可確保顯影期間的高可靠性且因此使得能夠形成高密度電路的光敏疊層。In particular, due to the structure and characteristics of the photopolymerizable compound containing a phthalate derivative, air bubbles having a diameter of 1 micrometer or less can exist in a trace amount in the photosensitive resin layer, thereby making it possible to provide a photosensitive laminate that can reduce defects in fine wiring formation, can ensure high reliability during development, and thus enables the formation of high-density circuits.

同時,光可聚合化合物可更包含單官能或多官能(甲基)丙烯酸酯單體或寡聚物。作為光可聚合化合物,可使用通常已知的單官能或多官能(甲基)丙烯酸酯單體或寡聚物。Meanwhile, the photopolymerizable compound may further include monofunctional or polyfunctional (meth)acrylate monomers or oligomers. As the photopolymerizable compound, generally known monofunctional or polyfunctional (meth)acrylate monomers or oligomers can be used.

可另外使用的光可聚合化合物的實例不受特定限制,但可包含乙二醇二(甲基)丙烯酸酯、二乙二醇二(甲基)丙烯酸酯、四乙二醇二(甲基)丙烯酸酯、丙二醇二(甲基)丙烯酸酯、聚乙二醇二(甲基)丙烯酸酯、聚丙二醇二(甲基)丙烯酸酯、丁二醇二(甲基)丙烯酸酯、新戊二醇二(甲基)丙烯酸酯、1,6-己烷乙二醇二(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、三羥甲基丙烷三丙烯酸酯、丙三醇二(甲基)丙烯酸酯、新戊四醇二(甲基)丙烯酸酯、新戊四醇三(甲基)丙烯酸酯、二新戊四醇戊(甲基)丙烯酸酯、2,2-雙(4-甲基丙烯醯氧基二乙氧基苯基)丙烷、2,2-雙(4-甲基丙烯醯氧基聚乙氧基苯基)丙烷、(甲基)丙烯酸2-羥基-3-甲基丙烯醯氧基丙酯、乙二醇二縮水甘油醚二(甲基)丙烯酸酯、二乙二醇二縮水甘油醚二(甲基)丙烯酸酯、鄰苯二甲酸二縮水甘油基酯二(甲基)丙烯酸酯、丙三醇聚縮水甘油基醚聚(甲基)丙烯酸酯、含有胺甲酸酯基團的多官能(甲基)丙烯酸酯以及其類似物。Examples of photopolymerizable compounds that may be additionally used are not particularly limited, but may include ethylene glycol di(meth)acrylate, diethylene glycol di(meth)acrylate, tetraethylene glycol di(meth)acrylate, propylene glycol di(meth)acrylate, polyethylene glycol di(meth)acrylate, polypropylene glycol di(meth)acrylate, butylene glycol di(meth)acrylate, neopentyl glycol di(meth)acrylate, 1,6-hexaneethylene glycol di(meth)acrylate, trimethylol Propane Tri(meth)acrylate, Trimethylolpropane Triacrylate, Glycerol Di(meth)acrylate, Neopentylthritol Di(meth)acrylate, Neopentylthritol Tri(meth)acrylate, Dipentylthritol Penta(meth)acrylate, 2,2-Bis(4-methacryloxydiethoxyphenyl)propane, 2,2-Bis(4-methacryloxypolyethoxyphenyl)propane, 2-Hydroxy-3-methacryloxypropane (meth)acrylate esters, ethylene glycol diglycidyl ether di(meth)acrylate, diethylene glycol diglycidyl ether di(meth)acrylate, diglycidyl phthalate di(meth)acrylate, glycerol polyglycidyl ether poly(meth)acrylate, polyfunctional (meth)acrylates containing urethane groups, and the like.

單官能(甲基)丙烯酸酯化合物或多官能(甲基)丙烯酸酯化合物的含量可根據光敏樹脂層的特定用途或特性進行調節。舉例而言,按鄰苯二甲酸酯衍生物的100重量份計,光可聚合化合物可包含呈50重量份至1500重量份、100重量份至1500重量份、110重量份至1500重量份、110重量份至1000重量份、110重量份至900重量份、50重量份至500重量份的量的單官能(甲基)丙烯酸酯化合物或多官能(甲基)丙烯酸酯化合物。The content of the monofunctional (meth)acrylate compound or the polyfunctional (meth)acrylate compound can be adjusted according to the specific use or characteristics of the photosensitive resin layer. For example, according to the 100 weights of phthalate derivatives, optical concentrated compounds can include 50 to 1500 weights, 100 weights to 1500 weights, 110 to 1500 weights, 110 to 1,000 weights, 110 weights to 900 weights, 50 to 500 weights. The volume of the single -off -level (methyl) acrylic compound or multi -official (methyl) acrylic compound.

同時,可使用各種塑膠膜作為基板膜,且其實例包含一或多種由以下所組成的族群中選出的塑膠膜:丙烯酸膜、聚對苯二甲酸伸乙酯(PET)膜、三乙醯纖維素(triacetyl cellulose;TAC)膜、聚降冰片烯(polynorbornene;PNB)膜、環烯聚合物(cycloolefin polymer;COP)膜以及聚碳酸酯(polycarbonate;PC)膜。Meanwhile, various plastic films can be used as the substrate film, and examples thereof include one or more plastic films selected from the group consisting of acrylic film, polyethylene terephthalate (PET) film, triacetyl cellulose (TAC) film, polynorbornene (PNB) film, cycloolefin polymer (COP) film, and polycarbonate (polycarbonate) film. ; PC) film.

同時,釋放層可包含保護膜。Meanwhile, the release layer may contain a protective film.

亦即,光敏疊層可更包含經形成以便面向光敏樹脂層的中心處的支撐基板的保護膜。保護膜充當預防在處理期間對抗蝕劑的損壞且保護光敏樹脂層免受諸如灰塵的外來物質的保護蓋,且可層壓於其上未形成障壁層的光敏樹脂層的背面上。That is, the photosensitive laminate may further include a protective film formed so as to face the supporting substrate at the center of the photosensitive resin layer. The protective film serves as a protective cover that prevents damage to the resist during handling and protects the photosensitive resin layer from foreign substances such as dust, and may be laminated on the back side of the photosensitive resin layer on which the barrier layer is not formed.

保護膜用以保護光敏樹脂層免受外部影響,且其需要具有適當的分離性及黏合性以使得其在乾膜光阻劑應用於後處理(post-process)時容易地剝離,且其在儲存及分配期間不脫模。The protective film is used to protect the photosensitive resin layer from external influences, and it needs to have proper separation and adhesiveness so that it can be easily peeled off when the dry film photoresist is applied to post-process, and it is not released during storage and distribution.

各種塑膠膜可用作保護膜,且其實例包含至少一種由以下所組成的族群中選出的塑膠膜:丙烯酸膜、聚乙烯(polyethylene;PE)膜、聚對苯二甲酸伸乙酯(PET)膜、三乙醯纖維素(TAC)膜、聚降冰片烯(PNB)膜、環烯聚合物(COP)膜以及聚碳酸酯(PC)膜。保護膜的厚度不受特定限制,但可在例如0.01微米至1公尺內自由調節。Various plastic films can be used as the protective film, and examples thereof include at least one plastic film selected from the group consisting of acrylic film, polyethylene (PE) film, polyethylene terephthalate (PET) film, triacetyl cellulose (TAC) film, polynorbornene (PNB) film, cycloolefin polymer (COP) film, and polycarbonate (PC) film. The thickness of the protective film is not particularly limited, but can be freely adjusted within, for example, 0.01 micron to 1 meter.

根據本發明的另一實施例,可提供一種製備光敏疊層的方法,所述方法包括以下步驟:在障壁層上塗覆且乾燥樹脂組成物,所述樹脂組成物包含:含有沸點為115℃或高於115℃的高沸點溶劑及沸點為100℃或低於100℃的低沸點溶劑的混合溶劑;黏合劑樹脂;含有鄰苯二甲酸酯衍生物的光可聚合化合物;以及光起始劑。According to another embodiment of the present invention, there may be provided a method for preparing a photosensitive laminate, the method comprising the steps of: coating and drying a resin composition on a barrier layer, the resin composition comprising: a mixed solvent containing a high-boiling solvent having a boiling point of 115° C. or higher and a low-boiling solvent having a boiling point of 100° C. or lower; a binder resin; a photopolymerizable compound containing a phthalate derivative; and a photoinitiator.

根據製備方法,可提供上文在一個實施例中描述的光敏疊層。Depending on the method of preparation, the photosensitive laminate described above in one embodiment may be provided.

如上文所描述,光敏疊層包含:障壁層,具有2%或小於2%的混濁度;及光敏樹脂層,包括光可聚合化合物及黏合劑樹脂,所述光可聚合化合物含有鄰苯二甲酸酯衍生物,其中直徑小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於光敏樹脂層內。As described above, the photosensitive laminate includes: a barrier layer having a haze of 2% or less; and a photosensitive resin layer including a photopolymerizable compound containing a phthalate derivative, wherein bubbles having a diameter of less than 1 micrometer exist in the photosensitive resin layer at 5 bubbles/mm2 or less than 5 bubbles/mm2.

在形成光敏樹脂層的製程中,出於諸如在光敏樹脂組成物的溶液製備製程或組成物的溶液乾燥製程期間產生的氣泡的原因,直徑小於1微米的氣泡可形成於光敏樹脂層內。在製備光敏疊層的方法中,由於使用包含沸點為115℃或高於115℃的高沸點溶劑及沸點為100℃或低於100℃的低沸點溶劑的混合溶劑,有可能延遲光敏樹脂組成物的溶液的蒸發時間且防止氣泡截留於樹脂層中,由此直徑小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於光敏樹脂層內。During the process of forming the photosensitive resin layer, bubbles having a diameter of less than 1 micron may be formed in the photosensitive resin layer due to reasons such as bubbles generated during a solution preparation process of the photosensitive resin composition or a solution drying process of the composition. In the method for preparing a photosensitive laminate, since a mixed solvent comprising a high-boiling solvent having a boiling point of 115° C. or higher and a low-boiling solvent having a boiling point of 100° C. or lower is used, it is possible to delay the evaporation time of the solution of the photosensitive resin composition and prevent bubbles from being trapped in the resin layer. Thus, bubbles with a diameter of less than 1 micron exist in the photosensitive resin layer at 5 bubbles/mm2 or less than 5 bubbles/mm2.

更特定而言,直徑小於1微米的氣泡可以5個氣泡/平方毫米或小於5個氣泡/平方毫米或3個氣泡/平方毫米或小於3個氣泡/平方毫米存在於光敏樹脂層內。More specifically, bubbles with a diameter of less than 1 micrometer may exist in the photosensitive resin layer at 5 bubbles/mm2 or less or 3 bubbles/mm2 or less.

此外,在自障壁層與光敏樹脂層之間的界面的相對表面開始的光敏樹脂層的總厚度的50%內,直徑小於1微米的氣泡可以3個氣泡/平方毫米或小於3個氣泡/平方毫米存在。In addition, within 50% of the total thickness of the photosensitive resin layer from the opposite surface of the interface between the barrier layer and the photosensitive resin layer, bubbles having a diameter of less than 1 μm may exist at or below 3 bubbles/mm2.

由於直徑小於1微米的氣泡可以痕量存在或實質上不存在於障壁基板與光敏樹脂層之間的界面的相對表面上或朝向光敏樹脂層的外表面,其可增強顯影期間的可靠性,使得能夠形成高密度電路且減少精細佈線形成中的缺陷,由此當使用光敏疊層時,可實現對曝光的高靈敏度,且可改良高密度印刷電路板的製備良率。Since air bubbles with a diameter of less than 1 micrometer may exist in trace amounts or substantially not exist on the opposite surface of the interface between the barrier substrate and the photosensitive resin layer or toward the outer surface of the photosensitive resin layer, it can enhance reliability during development, enable formation of high-density circuits and reduce defects in formation of fine wiring, whereby high sensitivity to exposure can be achieved when a photosensitive laminate is used, and production yield of high-density printed circuit boards can be improved.

如上文所描述,沸點為115℃或大於115℃的高沸點溶劑可用以延遲光敏樹脂組成物的液體組分的蒸發時間且防止氣泡截留於樹脂層中。藉此,直徑小於1微米的氣泡可以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於光敏樹脂層內。As described above, a high boiling point solvent having a boiling point of 115° C. or greater may be used to delay the evaporation time of the liquid components of the photosensitive resin composition and prevent air bubbles from being trapped in the resin layer. Thereby, bubbles with a diameter of less than 1 micron may exist in the photosensitive resin layer at or below 5 bubbles/mm2.

混合溶劑可包含沸點為115℃或高於115℃的呈某一量或大於某一量的高沸點溶劑。舉例而言,相對於100重量份的混合溶劑,沸點為115℃或高於115℃的高沸點溶劑的含量可為3重量份或大於3重量份、或5重量份或大於5重量份、或3重量份至50重量份、或5重量份至40重量份。The mixed solvent may contain a high boiling point solvent having a boiling point of 115°C or higher in a certain amount or more. For example, relative to 100 parts by weight of the mixed solvent, the content of the high boiling point solvent having a boiling point of 115° C. or higher may be 3 parts by weight or greater, or 5 parts by weight or greater than 5 parts by weight, or 3 to 50 parts by weight, or 5 to 40 parts by weight.

由於沸點為100℃或低於100℃的低沸點溶劑與沸點為115℃或高於115℃的高沸點溶劑一起使用,因此可增強光敏樹脂組成物的溶解能力。Since a low boiling point solvent having a boiling point of 100°C or lower is used together with a high boiling point solvent having a boiling point of 115°C or higher, the dissolving ability of the photosensitive resin composition can be enhanced.

混合溶劑可以比沸點為115℃或大於115℃的高沸點溶劑更高的含量含有沸點為100℃或低於100℃的低沸點溶劑。The mixed solvent may contain a low boiling point solvent having a boiling point of 100°C or lower in a higher content than a high boiling point solvent having a boiling point of 115°C or higher.

更特定而言,混合溶劑可以1:2至1:18、或1:3至1:15、或1:5至1:10、或1:6至1:8的重量比含有沸點為115℃或高於115℃的高沸點溶劑:沸點為100℃或低於100℃的低沸點溶劑。由於以上述含量中含有沸點為115℃或高於115℃的高沸點溶劑:沸點為100℃或低於100℃的低沸點溶劑,因此可增強光敏樹脂組成物的溶解能力。More specifically, the mixed solvent may contain a high boiling point solvent with a boiling point of 115°C or higher: a low boiling point solvent with a boiling point of 100°C or lower in a weight ratio of 1:2 to 1:18, or 1:3 to 1:15, or 1:5 to 1:10, or 1:6 to 1:8. Since the above content contains a high boiling point solvent with a boiling point of 115° C. or higher than 115° C. and a low boiling point solvent with a boiling point of 100° C. or lower than 100° C., the solubility of the photosensitive resin composition can be enhanced.

沸點為115℃或高於115℃的高沸點溶劑的實例包含丁醇、二甲基甲醯胺、N-甲基-2-吡咯啶酮、γ丁內酯、丁基卡必醇、丁基賽路蘇、甲基賽路蘇、乙酸丁酯、二乙二醇甲乙醚、二乙二醇二甲醚、二乙二醇乙醚、二丙二醇二甲醚、3-甲氧基丙酸甲酯、3-乙氧基丙酸乙酯、丙二醇甲醚丙酸酯、二丙二醇二甲醚、環己酮、丙二醇單甲醚乙酸酯(PGMEA)以及一種或更多種其混合溶劑。Examples of high-boiling solvents having a boiling point of 115° C. or higher include butanol, dimethylformamide, N-methyl-2-pyrrolidone, γ-butyrolactone, butyl carbitol, butyl celuso, methyl celuso, butyl acetate, diethylene glycol methyl ethyl ether, diethylene glycol dimethyl ether, diethylene glycol ethyl ether, dipropylene glycol dimethyl ether, 3-methoxymethyl propionate, 3-ethoxy ethyl propionate, propylene glycol Alcohol methyl ether propionate, dipropylene glycol dimethyl ether, cyclohexanone, propylene glycol monomethyl ether acetate (PGMEA), and one or more of their mixed solvents.

沸點為100℃或低於100℃的低沸點溶劑的實例包含甲基乙基酮、甲醇、乙醇、丙酮、四氫呋喃、異丙醇以及一種或更多種其混合溶劑。Examples of low-boiling solvents having a boiling point of 100° C. or lower include methyl ethyl ketone, methanol, ethanol, acetone, tetrahydrofuran, isopropanol, and one or more mixed solvents thereof.

考慮到特定用途或應用領域,可調節樹脂組成物的固體含量,所述樹脂組成物包含:含有沸點為115℃或高於115℃的高沸點溶劑及沸點為100℃或低於100℃的低沸點溶劑的混合溶劑;黏合劑樹脂;含有鄰苯二甲酸酯衍生物的光可聚合化合物;以及光起始劑,且舉例而言,樹脂組成物可含有10重量%至99重量%的混合溶劑。The solid content of the resin composition including: a mixed solvent containing a high boiling point solvent having a boiling point of 115° C. or higher and a low boiling point solvent having a boiling point of 100° C. or lower; a binder resin; a photopolymerizable compound containing a phthalate derivative;

同時,可在將樹脂組成物塗覆且乾燥於障壁層上的步驟中使用的方法或裝置不受特定限制,且舉例而言,可使用習知塗佈方法將樹脂組成物塗佈於障壁層上,且接著經乾燥以製備乾膜。Meanwhile, the method or device that can be used in the step of coating and drying the resin composition on the barrier layer is not particularly limited, and for example, the resin composition can be coated on the barrier layer using a conventional coating method, and then dried to prepare a dry film.

塗佈樹脂組成物的方法不受特定限制,且舉例而言,可使用諸如塗佈棒的方法。The method of coating the resin composition is not particularly limited, and for example, a method such as a coating bar may be used.

在製備光敏疊層的方法中,除使用包含沸點為115℃或高於115℃的高沸點溶劑及沸點為100℃或低於100℃的低沸點溶劑的混合溶劑以外,形成於光敏樹脂層中的精細氣泡的體積可藉由調節乾燥速率及/或乾燥溫度而顯著減小或實質上不存在。In the method for preparing a photosensitive laminate, in addition to using a mixed solvent comprising a high-boiling solvent having a boiling point of 115°C or higher and a low-boiling solvent having a boiling point of 100°C or lower, the volume of fine air bubbles formed in the photosensitive resin layer can be significantly reduced or substantially absent by adjusting the drying rate and/or drying temperature.

更特定而言,可藉由諸如熱空氣烘箱、熱板、熱空氣循環鍋爐、紅外鍋爐的加熱裝置進行乾燥經塗佈樹脂組成物的步驟,且可在50℃至100℃的溫度或60℃至90℃的溫度以及70℃至85℃的溫度下進行乾燥。More specifically, the step of drying the coated resin composition may be performed by a heating device such as a hot air oven, a hot plate, a hot air circulation boiler, an infrared boiler, and may be dried at a temperature of 50°C to 100°C, or a temperature of 60°C to 90°C, and a temperature of 70°C to 85°C.

進行乾燥的時間可視乾燥溫度而變化,且例如可為30秒至20分鐘,更特定而言1分鐘至10分鐘或3分鐘至7分鐘。The time for drying may vary depending on the drying temperature, and may be, for example, 30 seconds to 20 minutes, more specifically 1 minute to 10 minutes or 3 minutes to 7 minutes.

關於包含於樹脂組成物中的黏合劑樹脂的內容包含上文在一個實施例的光敏疊層中所描述的內容。The content about the binder resin contained in the resin composition includes the content described above in the photosensitive laminate of one embodiment.

黏合劑樹脂可具有20,000公克/莫耳至300,000公克/莫耳、30,000公克/莫耳至300,000公克/莫耳、30,000公克/莫耳至250,000公克/莫耳、30,000公克/莫耳至200,000公克/莫耳或30,000公克/莫耳至150,000公克/莫耳的重量平均分子量以及20℃以上且150℃以下、50℃以上且150℃以下、70℃以上且150℃以下、70℃以上且120℃以下、80℃以上且120℃以下或100℃以上且120℃以下的玻璃轉化溫度。The binder resin can have 20,000 grams/mole to 300,000 grams/mole, 30,000 grams/mole to 300,000 grams/mole, 30,000 grams/mole to 250,000 grams/mole, 30,000 grams/mole to 200,000 grams/mole, or 30,000 grams/mole to 150 grams/mole 1,000 g/mole weight average molecular weight and a glass transition temperature of 20°C to 150°C, 50°C to 150°C, 70°C to 150°C, 70°C to 120°C, 80°C to 120°C, or 100°C to 120°C.

黏合劑樹脂可具有100 mgKOH/g以上且300 mgKOH/g以下、120 mgKOH/g以上且300 mgKOH/g以下、120 mgKOH/g以上且250 mgKOH/g以下、120 mgKOH/g以上且200 mgKOH/g以下或150 mgKOH/g以上且200 mgKOH/g以下的酸值。The binder resin may have an acid value of 100 mgKOH/g to 300 mgKOH/g, 120 mgKOH/g to 300 mgKOH/g, 120 mgKOH/g to 250 mgKOH/g, 120 mgKOH/g to 200 mgKOH/g, or 150 mgKOH/g to 200 mgKOH/g.

樹脂組成物可包含含有鄰苯二甲酸酯衍生物的光可聚合化合物以及鹼性可顯影黏合劑樹脂。The resin composition may include a photopolymerizable compound containing phthalate derivatives and an alkaline developable binder resin.

按鹼性可顯影黏合劑樹脂的100重量份計,樹脂組成物可包含呈1重量份至80重量份、1重量份至50重量份、1重量份至30重量份、1重量份至20重量份、1重量份至10重量份、2重量份至50重量份、2重量份至30重量份、2重量份至20重量份、2重量份至10重量份、3重量份至50重量份、3重量份至30重量份、或3重量份至20重量份、3重量份至10重量份的量的含有鄰苯二甲酸酯衍生物的光可聚合化合物。Based on 100 parts by weight of the alkaline developable binder resin, the resin composition may include 1 to 80 parts by weight, 1 to 50 parts by weight, 1 to 30 parts by weight, 1 to 20 parts by weight, 1 to 10 parts by weight, 2 to 50 parts by weight, 2 to 30 parts by weight, 2 to 20 parts by weight, 2 to 10 parts by weight, 3 to 50 parts by weight, 3 to 30 parts by weight, Or 3 parts by weight to 20 parts by weight, or 3 parts by weight to 10 parts by weight of the photopolymerizable compound containing a phthalate derivative.

關於光可聚合化合物的內容包含上文在一個實施例的光敏疊層中所描述的內容。Concerning the photopolymerizable compound includes what is described above in the photosensitive laminate of one embodiment.

特定而言,鄰苯二甲酸酯衍生物的特定實例可包含化學式1的化合物。以及,化學式1的化合物的更特定實例可包含化學式2的化合物或化學式3的化合物。In particular, specific examples of phthalate derivatives may include the compound of Chemical Formula 1. And, more specific examples of the compound of Chemical Formula 1 may include the compound of Chemical Formula 2 or the compound of Chemical Formula 3.

含有鄰苯二甲酸酯衍生物的光可聚合化合物可充當用於增加光敏樹脂層的機械強度及其類似者或用以增加對顯影劑的抗性且賦予固化膜的可撓性的交聯劑。此外,視鄰苯二甲酸酯衍生物的特定化學結構而定,有可能增加對電鍍溶液或蝕刻溶液抗性且因此更易於實現精細圖案。The photopolymerizable compound containing a phthalate derivative may serve as a crosslinking agent for increasing the mechanical strength of the photosensitive resin layer and the like or for increasing resistance to a developer and imparting flexibility to a cured film. Furthermore, depending on the specific chemical structure of the phthalate derivative, it is possible to increase the resistance to plating solution or etching solution and thus it is easier to achieve fine patterns.

更特定而言,歸因於鄰苯二甲酸酯衍生物的結構及特性,直徑為1微米或小於1微米的氣泡可以痕量存在於光敏樹脂層內,由此有可能提供可減少精細佈線形成中的缺陷、可確保顯影期間的高可靠性且因此使得能夠形成高密度電路的光敏疊層。More specifically, due to the structure and characteristics of the phthalate derivative, air bubbles having a diameter of 1 micron or less can exist in a trace amount in the photosensitive resin layer, thereby making it possible to provide a photosensitive laminate that can reduce defects in fine wiring formation, can ensure high reliability during development, and thus enables the formation of high-density circuits.

同時,光可聚合化合物可更包含單官能(甲基)丙烯酸酯化合物或多官能(甲基)丙烯酸酯化合物。Meanwhile, the photopolymerizable compound may further include a monofunctional (meth)acrylate compound or a multifunctional (meth)acrylate compound.

單官能(甲基)丙烯酸酯化合物或多官能(甲基)丙烯酸酯化合物的含量可根據光敏樹脂層的特定用途或特性進行調節。舉例而言,按鄰苯二甲酸酯衍生物的100重量份計,光可聚合化合物可包含呈50重量份至1500重量份、100重量份至1500重量份、110重量份至1500重量份、110重量份至1000重量份、110重量份至900重量份、50重量份至500重量份的量的單官能(甲基)丙烯酸酯化合物或多官能(甲基)丙烯酸酯化合物。The content of the monofunctional (meth)acrylate compound or the polyfunctional (meth)acrylate compound can be adjusted according to the specific use or characteristics of the photosensitive resin layer. For example, according to the 100 weights of phthalate derivatives, optical concentrated compounds can include 50 to 1500 weights, 100 weights to 1500 weights, 110 to 1500 weights, 110 to 1,000 weights, 110 weights to 900 weights, 50 to 500 weights. The volume of the single -off -level (methyl) acrylic compound or multi -official (methyl) acrylic compound.

光起始劑為藉由UV及其他輻射起始光可聚合單體的鏈反應的物質,且在光敏疊層的樹脂組成物及光敏樹脂層中起重要作用。The photoinitiator is a substance that initiates the chain reaction of photopolymerizable monomers by UV and other radiation, and plays an important role in the resin composition and photosensitive resin layer of the photosensitive laminate.

可用作光起始劑的化合物包含蒽醌衍生物,諸如2-甲基蒽醌及2-乙基蒽醌;安息香(benzoin)衍生物,諸如安息香甲醚;苯甲酮;菲醌(phenanthrene quinone);以及4,4'-雙(二甲胺基)苯甲酮。Compounds useful as photoinitiators include anthraquinone derivatives, such as 2-methylanthraquinone and 2-ethylanthraquinone; benzoin derivatives, such as benzoin methyl ether; benzophenone; phenanthrene quinone; and 4,4'-bis(dimethylamino)benzophenone.

此外,選自2,2'-雙(2-氯苯基)-4,4'-5,5'-四苯基雙咪唑、1-羥基環己基苯基酮、2,2-二甲氧基-1,2-二苯基乙-1-酮、2-甲基-1-[4-(甲硫基)苯基]-2-嗎啉基丙-1-酮、2-苯甲基-2-二甲基胺基-1-[4-嗎啉基苯基]丁-1-酮、2-羥基-2-甲基-1-苯基丙-1-酮、2,4,6-三甲基苯甲醯基二苯基氧化膦、1-[4-(2-羥基甲氧基)苯基]-2-羥基-2-甲基丙-1-酮、2,4-二乙基噻噸酮、2-氯噻噸酮、2,4-二甲基噻噸酮、3,3-二甲基-4-甲氧基二苯基酮、苯甲酮(benzophenone)、1-氯-4-丙氧基噻噸酮、1-(4-異丙基苯基)2-羥基-2-甲基丙-1-酮、1-(4-十二烷基苯基)-2羥基-2-甲基丙-1-酮、4-苯甲醯基-4'-甲基二甲基硫醚、4-二甲基胺基苯甲酸、4-二甲基胺基苯甲酸甲酯、4-二甲基胺基苯甲酸乙酯、4-二甲基胺基苯甲酸丁酯4-二甲基胺基苯甲酸2-乙基己酯、4-二甲基胺基苯甲酸2-異戊酯、2,2-二乙氧基苯乙酮、苯甲基酮二甲縮醛、苯甲基酮β-甲氧基二乙醇縮乙醛、1-苯基-1,2-丙基二肟-o,o'-(2-羰基)乙氧基醚、鄰苯甲醯基苯甲酸甲酯、雙[4-二甲胺基苯基)酮、4,4'-雙(二乙胺基)苯甲酮、4,4'-二氯二苯甲酮、苯甲基、安息香、甲氧基安息香(methoxybenzoin)、乙氧基安息香(ethoxybenzoin)、異丙氧基安息香(isopropoxybenzoin)、正丁氧基安息香(n-butoxybenzoin)、異丁氧基安息香(isobutoxybenzoin)、三級丁氧基安息香(tert-butoxybenzoin)、對二甲胺基苯乙酮(p-dimethylaminoacetophenone)、對三級丁基三氯苯乙酮(p-tert-butyltrichloroacetophenone)、對三級丁基二氯苯乙酮(p-tert-butyldichloroacetophenone)、噻噸酮(thioxanthone)、2-甲基噻噸酮、2-異丙基噻噸酮、二苯并環庚酮(dibenzosuberone)、α,α-二氯-4-苯氧基苯乙酮及4-二甲基胺基苯甲酸戊酯的化合物可用作光起始劑,但不限於此。In addition, selected from 2,2'-bis(2-chlorophenyl)-4,4'-5,5'-tetraphenylbisimidazole, 1-hydroxycyclohexyl phenyl ketone, 2,2-dimethoxy-1,2-diphenylethan-1-one, 2-methyl-1-[4-(methylthio)phenyl]-2-morpholinopropan-1-one, 2-benzyl-2-dimethylamino-1-[4-morpholinophenyl]butan-1-one, 2-hydroxy-2 -Methyl-1-phenylpropan-1-one, 2,4,6-trimethylbenzoyldiphenylphosphine oxide, 1-[4-(2-hydroxymethoxy)phenyl]-2-hydroxy-2-methylpropan-1-one, 2,4-diethylthioxanthone, 2-chlorothioxanthone, 2,4-dimethylthioxanthone, 3,3-dimethyl-4-methoxybenzophenone, benzophenone, 1-chloro-4-propoxythioxanone Xanthone, 1-(4-isopropylphenyl) 2-hydroxy-2-methylpropan-1-one, 1-(4-dodecylphenyl)-2-hydroxy-2-methylpropan-1-one, 4-benzoyl-4'-methyl dimethyl sulfide, 4-dimethylaminobenzoic acid, 4-dimethylaminobenzoic acid methyl ester, 4-dimethylaminobenzoic acid ethyl ester, 4-dimethylaminobenzoic acid butyl ester 4-dimethylaminobenzoic acid 2-ethyl 2-ylhexyl ester, 2-isoamyl 4-dimethylaminobenzoate, 2,2-diethoxyacetophenone, benzophenone dimethyl acetal, benzophenone β-methoxydiethanol acetal, 1-phenyl-1,2-propyldioxime-o,o'-(2-carbonyl)ethoxyether, methyl phthalate, bis[4-dimethylaminophenyl)ketone, 4,4'-bis(diethylamino)benzophenone, 4,4 '-Dichlorobenzophenone, benzyl, benzoin, methoxybenzoin, ethoxybenzoin, isopropoxybenzoin, n-butoxybenzoin, isobutoxybenzoin, tert-butoxybenzoin, p-dimethylene P-dimethylaminoacetophenone, p-tert-butyltrichloroacetophenone, p-tert-butyldichloroacetophenone, thioxanthone, 2-methylthioxanthone, 2-isopropylthioxanthone, dibenzosuberone, Compounds of α,α-dichloro-4-phenoxyacetophenone and amyl 4-dimethylaminobenzoate can be used as photoinitiators, but are not limited thereto.

相對於樹脂組成物的總重量,按固體含量計,含有呈0.1重量%至20重量%或1重量%或大於1重量%且10重量%或小於10重量%的量的光起始劑。當光起始劑的含量在以上範圍內時,可獲得足夠的靈敏度。The photoinitiator is contained in an amount of 0.1 wt % to 20 wt % or 1 wt % or more and 10 wt % or less in terms of solid content relative to the total weight of the resin composition. When the content of the photoinitiator is within the above range, sufficient sensitivity can be obtained.

當光起始劑的含量過低時,由於光效率低且因此需要大量曝光,生產效率可能大大地降低。當光起始劑的含量過高時,存在膜變得脆性且顯影溶液的污染增加的缺點,此可能會產生諸如短路的缺陷。When the content of the photoinitiator is too low, production efficiency may be greatly reduced due to low light efficiency and thus requiring a large amount of light exposure. When the content of the photoinitiator is too high, there are disadvantages that the film becomes brittle and the contamination of the developing solution increases, which may cause defects such as short circuit.

另外,視需要,樹脂組成物可更包含其他添加劑。可使用的其他添加劑包含呈鄰苯二甲酸酯形式的鄰苯二甲酸二丁酯、鄰苯二甲酸二庚酯、鄰苯二甲酸二辛酯、鄰苯二甲酸二烯丙酯作為塑化劑;呈乙二醇酯形式的三乙二醇二乙酸酯、四乙二醇二乙酸酯;呈醯胺形式的對甲苯磺醯胺、苯磺醯胺、正丁基苯磺醯胺;磷酸三苯酯;以及其類似物。In addition, the resin composition may further contain other additives as needed. Other additives that can be used include phthalinate diaceromes, dysteenate dietteramite, dihaxenate diloder, phenyl -measopate as plasticizer in the form of ethylene glycolitate in the form of ethylene glycol, and ethylene glycol, and ethylene glycol. The toluene sulfurine, phenylsulfine, orthophytic benzenezate amine; trigestyl phosphate; and its analogs.

為改良樹脂組成物的操作性,亦可添加隱色染料或著色物質。隱色染料可包含三(4-二甲基胺基-2-甲基苯基)甲烷、三(4-二甲基胺基-2甲基苯基)甲烷、熒烷染料以及其類似物。尤其,當使用隱色結晶紫(Leuco Crystal Violet)時,對比度為有利的且因此較佳。當含有隱色染料時,光敏樹脂組成物中的含量可為0.1重量%或大於0.1重量%且10重量%或小於10重量%。自表現對比度的觀點來看,0.1重量%或大於0.1重量%為較佳的,且自維持儲存穩定性的觀點來看,10重量%或小於10重量%為較佳的。In order to improve the workability of the resin composition, leuco dyes or coloring substances may also be added. Leuco dyes may include tris(4-dimethylamino-2-methylphenyl)methane, tris(4-dimethylamino-2methylphenyl)methane, fluoran dyes, and the like. In particular, the contrast is favorable and therefore preferred when Leuco Crystal Violet is used. When a leuco dye is contained, the content in the photosensitive resin composition may be 0.1% by weight or more and 10% by weight or less. From the viewpoint of expressing contrast, 0.1% by weight or more is preferable, and from the viewpoint of maintaining storage stability, 10% by weight or less is preferable.

著色物質的實例包含單水合甲苯磺酸、品紅、酞菁綠(Phthalocyanine green)、金胺鹼(Auramine base)、順洋紅(paramagenta)、結晶紫(Crystal violet)、甲基橙(Methyl orange)、尼羅藍2B(Nile blue 2B)、維多利亞藍(victoria blue)、孔雀綠(Malachite green)、鑽石綠(Diamond green)、鹼性藍20(Basic blue 20)以及其類似者。Examples of coloring substances include toluenesulfonic acid monohydrate, magenta, phthalocyanine green, auramine base, paramagenta, crystal violet, methyl orange, Nile blue 2B, victoria blue, malachite green, diamond green ( Diamond green), Basic blue 20, and the like.

當含有著色物質時,光敏樹脂組成物的添加量可為0.001%重量%或大於0.001%重量%且1重量%或小於1重量%。0.001%重量%或大於0.001%重量%的含量具有改良操作性的效果,且1重量%或小於1重量%的含量具有維持儲存穩定性的效果。When a coloring substance is contained, the photosensitive resin composition may be added in an amount of 0.001% by weight or more and 1% by weight or less. A content of 0.001% by weight or more has an effect of improving handleability, and a content of 1% by weight or less has an effect of maintaining storage stability.

另外,其他添加劑可更包含熱聚合抑制劑、染料、褪色劑、增黏劑以及其類似物。In addition, other additives may further include thermal polymerization inhibitors, dyes, decolorizers, tackifiers and the like.

同時,根據本發明的另一實施例,可提供一種使用實施例的光敏疊層製備電路板的方法。Meanwhile, according to another embodiment of the present invention, a method for preparing a circuit board using the photosensitive laminate of the embodiment may be provided.

實施例的光敏疊層可用於層壓於銅包覆的疊層上。The photosensitive stacks of the embodiments may be used for lamination on copper clad stacks.

作為電路板或印刷電路板(PCB)的製備製程的一實例,首先執行預處理製程以便層壓銅包覆的疊層,所述銅包覆的疊層為PCB的原材料。預處理製程在外層製程中以鑽孔、修邊、擦洗以及其類似者的次序進行。在內部層製程中,進行擦洗或浸洗。在擦洗製程中,主要使用刷毛刷及噴氣浮石(jet pumice)製程,且可藉由軟性蝕刻及硫酸浸洗進行浸洗。As an example of a manufacturing process for a circuit board or printed circuit board (PCB), a pretreatment process is first performed to laminate a copper-clad stack, which is a raw material for the PCB. The pretreatment process is performed in the order of drilling, trimming, scrubbing and the like in the outer layer process. During internal layer processing, scrubbing or dipping is performed. In the scrubbing process, bristle brushes and jet pumice processes are mainly used, and dipping can be performed by soft etching and sulfuric acid dipping.

為在已進行預處理製程的銅包覆的疊層上形成電路,通常可將光敏疊層或乾膜光阻劑(下文中稱為DFR)層壓於銅包覆的疊層的銅層上。在此製程中,DFR的光阻劑層層壓於銅表面上,同時使用層壓機剝離DFR的保護膜。一般而言,其可以0.5公尺/分鐘至3.5公尺/分鐘的層壓速度、100℃至130℃的溫度以及10磅/平方吋至90磅/平方吋的輥壓及加熱輥壓。 To form circuits on the pre-processed copper-clad stack, a photosensitive stack or dry film photoresist (hereinafter referred to as DFR) is typically laminated on the copper layer of the copper-clad stack. In this process, the photoresist layer of DFR is laminated on the copper surface, and at the same time, the protective film of DFR is peeled off using a laminator. Generally, it can be laminated at a lamination speed of 0.5 m/min to 3.5 m/min, at a temperature of 100° C. to 130° C., and at a rolling pressure of 10 psi to 90 psi and heated rolling.

已進行層壓製程的印刷電路板可靜置15分鐘或大於15分鐘以穩定基板,且接著使用其上形成所需電路圖案的光罩曝光於DFR的光阻劑。當在此製程中用紫外線照射光罩時,用紫外線照射的光阻劑可藉由照射部分中含有的光起始劑起始聚合。首先,在初始階段中消耗光阻劑中的氧,接著聚合活化單體以引起交聯反應,且接著可在消耗大量單體的同時進行聚合反應,且未曝光部分可以其中交聯反應尚未進行的狀態存在。 The printed circuit board that has undergone the lamination process may be left for 15 minutes or more to stabilize the substrate, and then exposed to the photoresist of the DFR using a photomask on which the desired circuit pattern is formed. When the photomask is irradiated with ultraviolet rays in this process, the photoresist irradiated with ultraviolet rays can initiate polymerization by the photoinitiator contained in the irradiated portion. First, oxygen in the photoresist is consumed in the initial stage, then the monomer is polymerized and activated to cause a crosslinking reaction, and then the polymerization reaction may proceed while consuming a large amount of monomer, and unexposed portions may exist in a state where the crosslinking reaction has not yet proceeded.

接著,執行移除光阻劑的未曝光部分的顯影製程。在鹼性可顯影DFR的情況下,0.8重量%至1.2重量%碳酸鉀及碳酸鈉水溶液可用作顯影溶液。在此方法中,藉由黏合劑聚合物的羧酸與顯影溶液內的顯影劑之間的皂化反應洗掉未曝光部分的光阻劑,且固化的光阻劑可保留於銅表面上。 Next, a developing process is performed to remove the unexposed portion of the photoresist. In the case of alkaline developable DFR, 0.8% to 1.2% by weight aqueous solutions of potassium carbonate and sodium carbonate can be used as the developing solution. In this method, unexposed portions of the photoresist are washed away by a saponification reaction between the carboxylic acid of the binder polymer and the developer in the developing solution, and the cured photoresist may remain on the copper surface.

接下來,可經由不同製程根據內層及外層製程形成電路。在內層製程中,可藉由腐蝕及剝離製程在基板上形成電路,且在外層製程中,在經歷電鍍及封孔(tenting)製程之後,可進行蝕刻及焊料剝離以形成預定電路。 Next, circuits can be formed through different processes according to the inner layer and outer layer processes. In the inner layer process, circuits can be formed on the substrate by etching and stripping processes, and in the outer layer process, after electroplating and tenting processes, etching and solder stripping can be performed to form predetermined circuits.

對於曝光,可使用通常已知的光源,更特定而言,超高壓汞燈或雷射直接曝光設備或類似物。 For the exposure, generally known light sources, more specifically, an ultra-high pressure mercury lamp or a laser direct exposure apparatus or the like can be used.

根據本發明,可提供一種能夠減少精細佈線形成中的缺陷、增強顯影期間的可靠性且使得能夠形成高密度電路的光敏疊層;一種製備光敏疊層的方法;以及一種製備電路板的方法。According to the present invention, there can be provided a photosensitive laminate capable of reducing defects in formation of fine wiring, enhancing reliability during development, and enabling formation of high-density circuits; a method of producing the photosensitive laminate; and a method of producing a circuit board.

在下文中,將參考實例較詳細地描述本發明。然而,以下實例僅用於說明的目的,且本發明的範疇並不意欲藉此受限。 製備實例 製備實例1:製備鹼性可顯影黏合劑樹脂 Hereinafter, the present invention will be described in more detail with reference to Examples. However, the following examples are for illustrative purposes only, and the scope of the present invention is not intended to be limited thereby. < Preparation Example > Preparation Example 1: Preparation of Alkaline Developable Binder Resin

將機械攪拌器及回流裝置安裝至四頸圓底燒瓶,且接著用氮氣吹掃燒瓶的內部。將170公克的甲基乙基酮(methyl ethyl ketone;MEK)及12.5公克的甲醇(MeOH)添加至用氮氣吹掃的燒瓶中,且接著添加2.25公克的偶氮二異丁腈(AIBN)且完全溶解。向其中添加作為單體的甲基丙烯酸(MAA)60公克、甲基丙烯酸苯甲酯(BzMA)100公克、甲基丙烯酸甲酯(MMA)15公克以及苯乙烯(SM)75公克的單體混合物,且加熱至80℃且接著聚合6小時,以製備鹼性可顯影黏合劑樹脂(重量平均分子量:40,000公克/莫耳,玻璃轉化溫度:102℃,固體含量:50重量%,酸值:156 mgKOH/g)。A mechanical stirrer and reflux device were installed to a four-neck round bottom flask, and then the interior of the flask was purged with nitrogen. 170 grams of methyl ethyl ketone (MEK) and 12.5 grams of methanol (MeOH) were added to the flask purged with nitrogen, and then 2.25 grams of azobisisobutyronitrile (AIBN) were added and completely dissolved. A monomer mixture of 60 g of methacrylic acid (MAA), 100 g of benzyl methacrylate (BzMA), 15 g of methyl methacrylate (MMA), and 75 g of styrene (SM) was added thereto as monomers, and heated to 80° C. and then polymerized for 6 hours to prepare an alkaline developable binder resin (weight average molecular weight: 40,000 g/mol, glass transition temperature: 102° C., solid content: 50% by weight, acid value: 156 mgKOH/g).

將製備實例1中製備的鹼性可顯影黏合劑樹脂溶解於四氫呋喃中以便在THF中具有1.0 (w/w)%的濃度(按固體含量計,約0.5 (w/w)%),使用具有0.45微米孔徑的針筒過濾器過濾,且接著將20微升注入GPC中。GPC的移動相使用以1.0毫升/分鐘的流速進料的四氫呋喃(THF),且在40℃下進行分析。管柱串聯連接一個Agilent PLgel 5 μm Guard(7.5×50毫米)及兩個Agilent PLgel 5 μm Mixed D(7.5×300毫米)。Agilent 1260 Infinity Ⅱ系統,RI偵測器用作偵測器,且在40℃下進行量測。 The alkaline developable binder resin prepared in Preparation Example 1 was dissolved in tetrahydrofuran so as to have a concentration of 1.0 (w/w)% in THF (about 0.5 (w/w)% in terms of solid content), filtered using a syringe filter having a pore size of 0.45 μm, and then 20 microliters were injected into the GPC. The mobile phase of GPC used tetrahydrofuran (THF) fed at a flow rate of 1.0 ml/min, and the analysis was performed at 40°C. One Agilent PLgel 5 μm Guard (7.5×50 mm) and two Agilent PLgel 5 μm Mixed D (7.5×300 mm) were connected in series. Agilent 1260 Infinity II system, RI detector was used as detector, and measurements were performed at 40°C.

如下文所示,將聚苯乙烯標準樣本(STD A、B、C、D)(其中具有不同分子量的聚苯乙烯以0.1 (w/w)%的濃度溶解於四氫呋喃中)用具有0.45微米孔徑的針筒過濾器過濾,且接著注入GPC中,且使用所形成的校準曲線測定鹼性可顯影黏合劑樹脂的重量平均分子量(Mw)的值。 STD A(Mp):791,000 / 27,810 / 945 STD B(Mp):282,000 / 10,700 / 580 STD C(Mp):126,000 / 4,430 / 370 STD D(Mp):51,200 / 1,920 / 162 製備實例2:製備用於形成障壁層的組成物 As shown below, polystyrene standard samples (STD A, B, C, D) in which polystyrenes having different molecular weights were dissolved in tetrahydrofuran at a concentration of 0.1 (w/w)% were filtered with a syringe filter having a pore size of 0.45 μm, and then injected into a GPC, and the value of the weight average molecular weight (Mw) of the alkaline developable binder resin was determined using the formed calibration curve. STD A (Mp): 791,000 / 27,810 / 945 STD B (Mp): 282,000 / 10,700 / 580 STD C (Mp): 126,000 / 4,430 / 370 STD D (Mp): 51,200 / 1,920 / 162 Preparation Example 2: Preparation of a composition for forming a barrier layer

將機械攪拌器及回流裝置安裝至四頸圓底燒瓶,且接著用氮氣吹掃燒瓶的內部。將200公克的蒸餾水及20公克的丁基賽路蘇(butyl cellosolve;BC)置放於用氮氣吹掃的燒瓶中,且完全溶解。向其中添加20公克的PVA-205(KURARAY,聚乙烯醇,黏度:3.5厘泊,重量平均分子量:22,000公克/莫耳)及1.5公克的BYK-349(BYK)以製備用於形成障壁層的組成物。 製備實例3:製備用於形成障壁層的組成物 A mechanical stirrer and reflux device were installed to a four-neck round bottom flask, and then the interior of the flask was purged with nitrogen. 200 grams of distilled water and 20 grams of butyl cellosolve (BC) were placed in a flask purged with nitrogen and completely dissolved. 20 grams of PVA-205 (KURARAY, polyvinyl alcohol, viscosity: 3.5 centipoise, weight average molecular weight: 22,000 grams/mole) and 1.5 grams of BYK-349 (BYK) were added thereto to prepare a composition for forming a barrier layer. Preparation Example 3: Preparation of a composition for forming a barrier layer

將機械攪拌器及回流裝置安裝至四頸圓底燒瓶,且接著用氮氣吹掃燒瓶的內部。將200公克的蒸餾水及10公克的丁基賽路蘇(BC)置放於用氮氣吹掃的燒瓶中,且完全溶解。向其中添加20公克的PVA-205(KURARAY,聚乙烯醇,黏度:3.5 cP,重量平均分子量:22,000公克/莫耳)及1.5公克的BYK-349(BYK化學(BYK Chemie))以製備用於形成障壁層的組成物。 實例及比較實例 製備光敏樹脂組成物及乾膜光阻劑 實例 1 至實例 3 A mechanical stirrer and reflux device were installed to a four-neck round bottom flask, and then the interior of the flask was purged with nitrogen. 200 grams of distilled water and 10 grams of butyl celuso (BC) were placed in a nitrogen-purged flask and completely dissolved. 20 g of PVA-205 (KURARAY, polyvinyl alcohol, viscosity: 3.5 cP, weight average molecular weight: 22,000 g/mol) and 1.5 g of BYK-349 (BYK Chemie) were added thereto to prepare a composition for forming a barrier layer. < Example and Comparative Example : Preparation of Photosensitive Resin Composition and Dry Film Photoresist > Example 1 to Example 3

使用塗佈棒將製備實例2中獲得的用於形成障壁層的組成物塗佈於25微米PET膜上。使用熱空氣烘箱乾燥經塗佈障壁層,其中乾燥溫度為80℃,乾燥時間為10分鐘,乾燥之後的障壁層的厚度為2微米至3微米,障壁層的混濁度值為1%,且透氧性為3.5立方公分/平方公尺/天。The composition for forming a barrier layer obtained in Preparation Example 2 was coated on a 25 micron PET film using a coating bar. The coated barrier layer was dried in a hot air oven, wherein the drying temperature was 80° C., and the drying time was 10 minutes. The thickness of the dried barrier layer was 2 μm to 3 μm, the turbidity value of the barrier layer was 1%, and the oxygen permeability was 3.5 cubic centimeters/square meter/day.

接著,根據下表1中所示的組成物,將光起始劑溶解於有機溶劑中,接著添加光可聚合化合物及鹼性可顯影黏合劑樹脂,且使用機械攪拌器混合約1小時,以製備光敏樹脂組成物。Next, according to the composition shown in Table 1 below, the photoinitiator was dissolved in an organic solvent, then a photopolymerizable compound and an alkaline developable binder resin were added, and mixed using a mechanical stirrer for about 1 hour to prepare a photosensitive resin composition.

使用塗佈棒將獲得的光敏樹脂組成物塗佈於障壁層上。使用熱空氣烘箱乾燥經塗佈光敏樹脂組成物層。此時,乾燥溫度為80℃,乾燥時間為5分鐘,且乾燥之後的光敏樹脂組成物層的厚度為25微米。The obtained photosensitive resin composition was coated on the barrier layer using a coating bar. The coated photosensitive resin composition layer was dried using a hot air oven. At this time, the drying temperature was 80° C., the drying time was 5 minutes, and the thickness of the dried photosensitive resin composition layer was 25 μm.

使保護膜(聚乙烯)層壓於乾燥的光敏樹脂組成物層上,以製備光敏疊層(乾膜光阻劑)。A protective film (polyethylene) was laminated on the dried photosensitive resin composition layer to prepare a photosensitive laminate (dry film photoresist).

藉由剝離PET膜且在剝離PET膜之後根據ASTM D1003測試方法使用混濁度儀(模型名稱:NDH7000,日本電色工業株式會社)進行量測來獲得障壁層的混濁度。The haze of the barrier layer layer was obtained by peeling off the PET film and measuring using a haze meter (model name: NDH7000, Nippon Denshoku Kogyo Co., Ltd.) according to the ASTM D1003 test method after peeling off the PET film.

障壁層的透氧性為3.5立方公分/平方公尺/天,且根據ASTM F1927測試方法使用OX-Tran(模型2/61,美國膜康公司)儀器來量測。 比較實例 1 The oxygen permeability of the barrier layer was 3.5 cm3/m2/day, and was measured using an OX-Tran (Model 2/61, Mocon, Inc.) instrument according to ASTM F1927 test method. Comparative Example 1

根據下表1中的實例1中所描述的組成物,將光起始劑溶解於有機溶劑中,且接著向其添加光可聚合化合物及鹼性可顯影黏合劑樹脂,且使用機械攪拌器混合約1小時,以製備光敏樹脂組成物。According to the composition described in Example 1 in Table 1 below, a photoinitiator was dissolved in an organic solvent, and then a photopolymerizable compound and an alkaline developable binder resin were added thereto and mixed for about 1 hour using a mechanical stirrer to prepare a photosensitive resin composition.

使用塗佈棒將所獲得光敏樹脂組成物塗佈至25微米PET膜上。使用熱空氣烘箱乾燥塗佈的光敏樹脂組成物層,其中乾燥溫度為80℃,乾燥時間為5分鐘,且乾燥之後的光敏樹脂層的厚度為25微米。The obtained photosensitive resin composition was coated on a 25 micron PET film using a coating bar. The coated photosensitive resin composition layer was dried using a hot air oven, wherein the drying temperature was 80° C., the drying time was 5 minutes, and the thickness of the photosensitive resin layer after drying was 25 μm.

使保護膜(聚乙烯)層壓於乾燥的光敏樹脂組成物層上,以製備光敏疊層(乾膜光阻劑)。 比較實例 2 A protective film (polyethylene) was laminated on the dried photosensitive resin composition layer to prepare a photosensitive laminate (dry film photoresist). Comparative example 2

除使用製備實例3中獲得的用於形成障壁層的組成物代替製備實例2中獲得的用於形成障壁層的組成物以外,以與實例1中相同的方式製備光敏疊層(乾膜光阻劑)。A photosensitive laminate (dry film photoresist) was prepared in the same manner as in Example 1 except that the composition for forming a barrier layer obtained in Preparation Example 3 was used instead of the composition for forming a barrier layer obtained in Preparation Example 2.

所製備障壁層的混濁度為5%,且障壁層的混濁度為藉由在塗覆光敏樹脂組成物且根據ASTM D1003測試方法使用混濁度儀(模型名稱:NDH7000,日本電色工業株式會社)進行量測之前剝離PET膜而獲得的值。The haze of the prepared barrier layer was 5%, and the haze of the barrier layer was a value obtained by peeling off the PET film before coating the photosensitive resin composition and measuring according to ASTM D1003 test method using a haze meter (model name: NDH7000, Nippon Denshoku Kogyo Co., Ltd.).

所製備障壁層的透氧性為4.0立方公分/平方公尺/天,且根據ASTM F1927測試方法使用OX-Tran(模型2/61,美國膜康公司)儀器來量測。 比較實例 3 The oxygen permeability of the prepared barrier layer was 4.0 cm 3 /m 2 /day, and was measured using an OX-Tran (Model 2/61, Mocon Corporation, USA) instrument according to ASTM F1927 test method. Comparative example 3

除根據下表1中所示的組成物製備光敏樹脂組成物以外,以與以上實例中相同的方式製備光敏疊層(乾膜光阻劑)。 [表1] 組分 產品名稱 (或組分名稱) 含量(重量%) 實例1 實例2 實例3 比較實例3 鹼性可顯影黏合劑樹脂 製備實例1 55 55 55 55 光可聚合化合物 鄰苯二甲酸酯衍生物 2 3 3    M-2101 14 14 12 14 M-241 3 1 3 3 T063    1 1    A040 1 1 1 3 光聚合起始劑 BCIM 3.5 3.5 3.5 3.5 9,10-二丁氧基蒽 0.5 0.5 0.5 0.5 添加劑 N,N-二乙基丁胺 0.2 0.2 0.2 0.2 隱色結晶紫 (日本保土谷化學株式會社(Hodogaya Co., Japan)) 0.5 0.5 0.5 0.5 鑽石綠GH(日本保土谷化學株式會社) 0.3 0.3 0.3 0.3 溶劑 MEK(甲基乙基酮,沸點:約80℃) 15 15 15 18 甲醇(約64.7℃) 2 2 2 2 丙二醇單甲醚乙酸酯(PGMEA,沸點:約146.4℃) 3 3 3    *鄰苯二甲酸酯衍生物:(2-[(2-甲基-1-側氧基烯丙基)氧基]乙基氫3-氯-2-羥丙基鄰苯二甲酸酯) (1)M2101:雙酚A(EO) 10二(甲基)丙烯酸酯(美源特殊化學(Miwon Specialty Chemical)) (2)M241:雙酚A(乙氧化物) 4二(甲基)丙烯酸酯(美源特殊化學) (3)T063:三羥甲基丙烷[EO] 6三丙烯酸酯 (4)A040:甲氧基丙二醇[400]丙烯酸酯  (n=9) (5)BCIM:2,2'-雙(2-氯苯基-4,5,4',5'-四苯基雙咪唑,奧德里奇化學(Aldrich Chemical) 比較實例 4 A photosensitive laminate (dry film photoresist) was prepared in the same manner as in the above example except that a photosensitive resin composition was prepared according to the composition shown in Table 1 below. [Table 1] components Product name (or component name) Content (weight%) Example 1 Example 2 Example 3 Comparative example 3 Alkaline developable binder resin Preparation Example 1 55 55 55 55 photopolymerizable compound Phthalate Derivatives 2 3 3 M-2101 14 14 12 14 M-241 3 1 3 3 T063 1 1 A040 1 1 1 3 Photopolymerization initiator BCIM 3.5 3.5 3.5 3.5 9,10-Dibutoxyanthracene 0.5 0.5 0.5 0.5 additive N,N-Diethylbutylamine 0.2 0.2 0.2 0.2 Leuco crystal violet (Hodogaya Co., Japan) 0.5 0.5 0.5 0.5 Diamond Green GH (Japan Hodogaya Chemical Co., Ltd.) 0.3 0.3 0.3 0.3 solvent MEK (methyl ethyl ketone, boiling point: about 80°C) 15 15 15 18 Methanol (about 64.7°C) 2 2 2 2 Propylene glycol monomethyl ether acetate (PGMEA, boiling point: about 146.4°C) 3 3 3 *Phthalate derivatives: (2-[(2-methyl-1-oxoallyl)oxy]ethylhydrogen 3-chloro-2-hydroxypropyl phthalate) (1) M2101: bisphenol A (EO) 10 di(meth)acrylate (Miwon Specialty Chemical) (2) M241: bisphenol A (ethoxylate) 4 di(meth)acrylate (Miwon Specialty Chemical) ( 3) T063: Trimethylolpropane [EO] 6 Triacrylate (4) A040: Methoxypropylene glycol [400] acrylate (n=9) (5) BCIM: 2,2'-bis(2-chlorophenyl-4,5,4',5'-tetraphenylbiimidazole, Aldrich Chemical) Comparative Example 4

除基於專利文獻1的實例4的描述,關於在本發明的製備實例1中獲得的300重量份的「鹼性可顯影黏合劑樹脂」,使用機械攪拌器將以下組分混合約1小時以製備光敏樹脂組成物以外,以與以上實例中相同的製備方式光敏疊層(乾膜光阻劑)。 <光敏樹脂組成物的組分> (1)100重量份的2,2-雙(4-(甲基丙烯醯氧基五乙氧基)苯基)丙烷 (2)50重量份的EO、PO改質的胺甲酸酯二(甲基)丙烯酸酯 (3)50重量份的聚丙二醇二丙烯酸酯(丙二醇鏈的數目:7) (4)光起始劑:25質量份的苯甲酮、1.0質量份的2-(鄰氯苯基)-4,5-二苯基咪唑二聚體以及1.0質量份的二乙胺基苯并苯乙酮 (5)5.0質量份的光致變色劑 (6)0.15質量份的染料 (7)混合溶劑: 477質量份的丙酮(沸點:56℃)、26.5質量份的甲苯(沸點:110℃)及26.5質量份的丙二醇單甲醚(沸點:146.4℃)[沸點為100℃或低於100℃的低沸點溶劑:沸點為115℃或高於115℃的高沸點溶劑的重量比=19:1] 實驗實例 Except that based on the description of Example 4 of Patent Document 1, with respect to 300 parts by weight of the "alkaline developable binder resin" obtained in Preparation Example 1 of the present invention, the following components were mixed for about 1 hour using a mechanical stirrer to prepare a photosensitive resin composition, and a photosensitive lamination (dry film photoresist) was prepared in the same manner as in the above example. <光敏樹脂組成物的組分> (1)100重量份的2,2-雙(4-(甲基丙烯醯氧基五乙氧基)苯基)丙烷(2)50重量份的EO、PO改質的胺甲酸酯二(甲基)丙烯酸酯(3)50重量份的聚丙二醇二丙烯酸酯(丙二醇鏈的數目:7) (4)光起始劑:25質量份的苯甲酮、1.0質量份的2-(鄰氯苯基)-4,5-二苯基咪唑二聚體以及1.0質量份的二乙胺基苯并苯乙酮(5)5.0質量份的光致變色劑(6)0.15質量份的染料(7)混合溶劑: 477質量份的丙酮(沸點:56℃)、26.5質量份的甲苯(沸點:110℃)及26.5質量份的丙二醇單甲醚(沸點:146.4℃)[沸點為100℃或低於100℃的低沸點溶劑:沸點為115℃或高於115℃的高沸點溶劑的重量比=19:1] 實驗實例

藉由以下方法來量測實例及比較實例中製備的乾膜光阻劑的物理性質,且結果展示於下表2中。 1. 量測曝光量(單位:毫焦 / 平方公分) The physical properties of the dry film photoresists prepared in Examples and Comparative Examples were measured by the following methods, and the results are shown in Table 2 below. 1. Measure exposure (unit: mJ / cm2)

將實例及比較實例中製備的乾膜光阻劑層壓於經受刷拋光處理的1.6毫米厚的銅包覆的疊層上。此時,使用HAKUTO MACH 610i在120℃的基板預加熱輥溫度、115℃的層壓機輥溫度、4.0公斤力/平方公分的輥壓以及2.0分鐘/公尺的輥速度下進行層壓。The dry film photoresists prepared in the Examples and Comparative Examples were laminated on a 1.6 mm thick copper clad stack subjected to a brush polish treatment. At this time, lamination was performed using HAKUTO MACH 610i at a substrate preheating roll temperature of 120°C, a laminator roll temperature of 115°C, a roll pressure of 4.0 kgf/cm2, and a roll speed of 2.0 min/m.

移除層壓於銅包覆的層壓板上的乾膜光阻劑的PET膜,使用ORC FDi-3,使用來自Stouffer Graphic Arts Equipment的41階段式曝光表,且以剩餘級的級數變為15級時的曝光量照射波長為405 nm的紫外線並保持15分鐘。此後,在噴霧噴射方法的顯影條件下,用1.0重量%Na 2CO 3水溶液進行顯影。此時,量測確定的剩餘級階段的數目變為15級時的能量的量。 The PET film of the dry film photoresist laminated on the copper-clad laminate was removed, using an ORC FDi-3, using a 41-step exposure meter from Stouffer Graphic Arts Equipment, and irradiating ultraviolet light at a wavelength of 405 nm for 15 minutes at an exposure amount at which the number of remaining steps was changed to 15 steps. Thereafter, development was performed with a 1.0% by weight Na 2 CO 3 aqueous solution under the development conditions of the spray jet method. At this time, the amount of energy when the determined number of remaining stages becomes 15 stages is measured.

對於比較實例1,在層壓於銅包覆的層壓板上的乾膜光阻劑的PET膜上,使用ORC FDi-3,使用來自Stouffer Graphic Arts Equipment的41階段式曝光表,且以剩餘級的級數變為15級時的曝光量照射波長為405 nm的紫外線並保持15分鐘。此後,在噴霧噴射方法的顯影條件下,用1.0重量%Na 2CO 3水溶液進行顯影。此時,量測確定的剩餘級階段的數目變為15級時的能量的量。 2. 量測 1:1 解析度(單位:微米) For Comparative Example 1, on a PET film of a dry film photoresist laminated on a copper-clad laminate, using ORC FDi-3, a 41-step exposure meter from Stouffer Graphic Arts Equipment was used, and ultraviolet light at a wavelength of 405 nm was irradiated for 15 minutes at an exposure amount at which the number of remaining steps was changed to 15 steps. Thereafter, development was performed with a 1.0% by weight Na 2 CO 3 aqueous solution under the development conditions of the spray jet method. At this time, the amount of energy when the determined number of remaining stages becomes 15 stages is measured. 2. Measurement 1:1 resolution (unit: micron)

將實例及比較實例中製備的乾膜光阻劑層壓於經受刷拋光處理的1.6毫米厚的銅包覆的疊層上。此時,使用HAKUTO MACH 610i在120℃的基板預加熱輥溫度、115℃的層壓機輥溫度、4.0公斤力/平方公分的輥壓以及2.0分鐘/公尺的輥速度下進行層壓。The dry film photoresists prepared in the Examples and Comparative Examples were laminated on a 1.6 mm thick copper clad stack subjected to a brush polish treatment. At this time, lamination was performed using HAKUTO MACH 610i at a substrate preheating roll temperature of 120°C, a laminator roll temperature of 115°C, a roll pressure of 4.0 kgf/cm2, and a roll speed of 2.0 min/m.

在移除疊層的PET膜且使其在障壁層上顯影之後,藉由使用自4微米至20微米以0.5微米的間隔形成的資料以使得電路線寬度及電路線之間的間距間隔可為1:1,使用ORC FDi-3、Stouffer Graphic Arts Equipment的41級階段式曝光表,以使得剩餘級階段的數目為15的曝光量照射波長為405奈米的紫外線,且保持15分鐘。此後,在噴霧噴射方法的顯影條件下,用1.0重量%Na 2CO 3水溶液進行顯影。 After removing the laminated PET film and developing it on the barrier layer, by using data formed at intervals of 0.5 μm from 4 μm to 20 μm so that the circuit line width and the pitch interval between the circuit lines can be 1:1, using ORC FDi-3, a 41-level step exposure table of Stouffer Graphic Arts Equipment, irradiated ultraviolet rays with a wavelength of 405 nm for 15 minutes so that the number of remaining steps was 15. Thereafter, development was performed with a 1.0% by weight Na 2 CO 3 aqueous solution under the development conditions of the spray jet method.

接著,使用ZEISS AXIOPHOT顯微鏡藉由用如1:1的電路線與非電路線之間的間距量測的值來確定解析度。Then, the resolution is determined by using a ZEISS AXIOPHOT microscope by measuring the value with the spacing between the circuit line and the non-circuit line as 1:1.

對於比較實例1,在層壓於銅包覆的層壓板上的乾膜光阻劑的PET膜上使用ORC FDi-3,使用來自Stouffer Graphic Arts Equipment的41階段式曝光表,且以剩餘級的級數變為15級時的曝光量照射波長為405 nm的紫外線並保持15分鐘。此後,在噴霧噴射方法的顯影條件下,用1.0重量%Na 2CO 3水溶液進行顯影。此時,量測確定的剩餘級階段的數目變為15級時的能量的量。 3. 確認氣泡(單元:數目 / 平方毫米) For Comparative Example 1, using ORC FDi-3 on a PET film of a dry film photoresist laminated on a copper-clad laminate, a 41-step exposure meter from Stouffer Graphic Arts Equipment was used, and ultraviolet light at a wavelength of 405 nm was irradiated for 15 minutes at an exposure amount at which the number of remaining steps was changed to 15 steps. Thereafter, development was performed with a 1.0% by weight Na 2 CO 3 aqueous solution under the development conditions of the spray jet method. At this time, the amount of energy when the determined number of remaining stages becomes 15 stages is measured. 3. Confirm the air bubbles (unit: number / square millimeter)

對於實例及比較實例中製備的乾膜光阻劑,移除PET膜及PE膜,且接著使用偏光顯微鏡確認存在於光敏樹脂層(單位面積(1毫米*1毫米))內的直徑小於1微米的氣泡的數目(數目/平方毫米)。 4. 確認曝光 / 顯影之後的基板缺陷 單位 數目 / 平方毫米 For the dry film photoresists prepared in Examples and Comparative Examples, the PET film and the PE film were removed, and then the number (number/square millimeter) of bubbles with a diameter of less than 1 micron existing in the photosensitive resin layer (unit area (1 mm*1 mm)) was confirmed using a polarizing microscope. 4. Confirm substrate defects after exposure / development ( unit : number / square millimeter )

將實例及比較實例中製備的乾膜光阻劑層壓於經受刷拋光處理的1.6毫米厚的銅包覆的疊層上。此時,使用HAKUTO MACH 610i在120℃的基板預加熱輥溫度、115℃的層壓機輥溫度、4.0公斤力/平方公分的輥壓以及2.0分鐘/公尺的輥速度下進行層壓。The dry film photoresists prepared in the Examples and Comparative Examples were laminated on a 1.6 mm thick copper clad stack subjected to a brush polish treatment. At this time, lamination was performed using HAKUTO MACH 610i at a substrate preheating roll temperature of 120°C, a laminator roll temperature of 115°C, a roll pressure of 4.0 kgf/cm2, and a roll speed of 2.0 min/m.

在移除疊層的PET膜且使其在障壁層上顯影之後,使用ORC FDi -3、Stouffer Graphic Arts Equipment的41級階段式曝光表,以使得剩餘級階段的數目為15的曝光量照射波長為405奈米的紫外線,使得電路線寬度及電路線之間的間距間隔可為14微米:14微米,且保持15分鐘。此後,在噴霧噴射方法的顯影條件下,用1.0重量%Na 2CO 3水溶液進行顯影。 After removing the laminated PET film and developing it on the barrier layer, using ORC FDi-3, a 41-level stage exposure meter of Stouffer Graphic Arts Equipment, the number of remaining stages was 15 to irradiate ultraviolet rays with a wavelength of 405 nm, so that the circuit line width and the spacing interval between circuit lines could be 14 μm:14 μm, and kept for 15 minutes. Thereafter, development was performed with a 1.0% by weight Na 2 CO 3 aqueous solution under the development conditions of the spray jet method.

對於顯影實例及比較實例中製備的乾膜光阻劑中的每一者,使用電子顯微鏡在單位面積(1毫米*1毫米)中觀測到抗蝕劑的上表面及下表面,且確認存在0.5微米或大於0.5微米且3微米或小於3微米的缺陷的數目(數目/平方毫米)。使用場發射掃描電子顯微鏡(FE-SEM,日立(Hitachi),放大倍數3000倍)觀測實例及比較實例中的每一者中獲得的光敏樹脂層的表面及橫截面。For each of the dry film photoresists prepared in the development example and the comparative example, the upper surface and the lower surface of the resist were observed in a unit area (1 mm*1 mm) using an electron microscope, and the number (number/square millimeter) of defects of 0.5 μm or more and 3 μm or less was confirmed to exist. The surface and cross section of the photosensitive resin layer obtained in each of Examples and Comparative Examples were observed using a field emission scanning electron microscope (FE-SEM, Hitachi, magnification 3000 times).

對於比較實例1,在層壓於銅包覆的層壓板上的乾膜光阻劑的PET膜上,使用ORC FDi-3,使用來自Stouffer Graphic Arts Equipment的41階段式曝光表,且以剩餘級的級數變為15級時的曝光量照射波長為405 nm的紫外線並保持15分鐘。此後,在噴霧噴射方法的顯影條件下,用1.0重量%Na 2CO 3水溶液進行顯影。此時,量測確定的剩餘級階段的數目變為15級時的能量的量。 [表2] 類別 曝光量 [毫焦/平方公分] 1:1解析度 [微米] 直徑小於1微米的氣泡[數目/平方毫米] 在曝光/顯影之後的基板缺陷[數目/平方毫米] 實例1 50 5 0 0 實例2 50 5 0 0 實例3 50 5 0 0 比較實例1 50 6 1 0 比較實例2 50 8 11 7 比較實例3 50 11 28 12 比較實例4 350 14 17 7 For Comparative Example 1, on a PET film of a dry film photoresist laminated on a copper-clad laminate, using ORC FDi-3, a 41-step exposure meter from Stouffer Graphic Arts Equipment was used, and ultraviolet light at a wavelength of 405 nm was irradiated for 15 minutes at an exposure amount at which the number of remaining steps was changed to 15 steps. Thereafter, development was performed with a 1.0% by weight Na 2 CO 3 aqueous solution under the development conditions of the spray jet method. At this time, the amount of energy when the determined number of remaining stages becomes 15 stages is measured. [Table 2] category Exposure [mJ/cm2] 1:1 resolution [microns] Bubbles less than 1 micron in diameter [number/mm2] Substrate defects after exposure/development [number/mm²] Example 1 50 5 0 0 Example 2 50 5 0 0 Example 3 50 5 0 0 Comparative Example 1 50 6 1 0 Comparative example 2 50 8 11 7 Comparative example 3 50 11 28 12 Comparative Example 4 350 14 17 7

如表2及圖1中所確認,證實直徑小於1微米的氣泡以1個氣泡/平方毫米或小於1個氣泡/平方毫米存在於實例的光敏疊層的光敏樹脂層內。此外,確認在實例的光敏樹脂層中,甚至在曝光於紫外光且用鹼性溶液顯影之後,直徑為0.5微米或大於0.5微米且3微米或小於3微米的缺陷實質上不產生或以1個氣泡/平方毫米或小於1個氣泡/平方毫米產生。As confirmed in Table 2 and FIG. 1 , it was confirmed that bubbles with a diameter of less than 1 μm existed in the photosensitive resin layer of the photosensitive laminate of the example at 1 bubble/mm2 or less. Furthermore, it was confirmed that in the photosensitive resin layer of Example, even after exposure to ultraviolet light and development with an alkaline solution, defects having a diameter of 0.5 μm or more and 3 μm or less were substantially not generated or were generated at 1 bubble/mm2 or less.

亦即,由於直徑小於1微米的氣泡以痕量存在且混濁度為2%或小於2%的障壁層含於實例的光敏樹脂層內,亦觀測到,當藉由使用光敏疊層製備電路板時,可在雖然高可靠性的同時實現高密度及靈敏度,且可形成更精細的佈線。That is, since air bubbles having a diameter of less than 1 micron exist in a trace amount and a barrier layer having a turbidity of 2% or less is contained in the photosensitive resin layer of the example, it was also observed that when a circuit board is prepared by using a photosensitive lamination, high density and sensitivity can be achieved while high reliability, and finer wiring can be formed.

在另一方面,確認在對比實例的光敏樹脂疊層中,即使當使用與實例中相同水準的能量時不僅難以實現實例水準的解析度,而且直徑小於1微米的氣泡以10個氣泡/平方毫米或大於10個氣泡/平方毫米存在於光敏樹脂層內。On the other hand, it was confirmed that in the photosensitive resin laminate of the comparative example, even when the same level of energy as in the example was used, not only was it difficult to achieve the resolution of the example level, but also bubbles with a diameter of less than 1 μm existed in the photosensitive resin layer at 10 bubbles/mm2 or more than 10 bubbles/mm2.

此外,如圖2至圖4中所示,確認在對比實例中獲得的光敏樹脂層曝光且用鹼性溶液顯影之後,出現直徑為0.5微米或大於0.5微米且3微米或小於3微米的大量缺陷。Furthermore, as shown in FIGS. 2 to 4 , it was confirmed that after the photosensitive resin layer obtained in Comparative Example was exposed and developed with an alkaline solution, a large number of defects with a diameter of 0.5 μm or more and 3 μm or less occurred.

none

圖1為使用偏光顯微鏡藉由場發射掃描電子顯微鏡(field-emission scanning electron microscope;FE-SEM,800倍)確認實例1的光敏樹脂層的表面及橫截面的相片。 圖2為使用偏光顯微鏡藉由場發射掃描電子顯微鏡(FE-SEM,800倍)確認比較實例1的光敏樹脂層的表面及橫截面的相片。 圖3為使用偏光顯微鏡藉由場發射掃描電子顯微鏡(FE-SEM,800倍)確認比較實例2的光敏樹脂層的表面及橫截面的相片。 圖4為使用偏光顯微鏡藉由場發射掃描電子顯微鏡(FE-SEM,800倍)確認比較實例3的光敏樹脂層的表面及橫截面的相片。 1 is a photo of the surface and cross section of the photosensitive resin layer of Example 1 confirmed by a field-emission scanning electron microscope (FE-SEM, 800 times) using a polarizing microscope. 2 is a photograph of the surface and cross section of the photosensitive resin layer of Comparative Example 1 confirmed by a field emission scanning electron microscope (FE-SEM, magnification 800) using a polarizing microscope. 3 is a photograph of the surface and cross section of the photosensitive resin layer of Comparative Example 2 confirmed by a field emission scanning electron microscope (FE-SEM, magnification 800) using a polarizing microscope. 4 is a photograph of the surface and cross section of the photosensitive resin layer of Comparative Example 3 confirmed by a field emission scanning electron microscope (FE-SEM, magnification 800) using a polarizing microscope.

Claims (17)

一種光敏疊層,包括:障壁層,具有2%或小於2%的混濁度;以及光敏樹脂層,包括光可聚合化合物及黏合劑樹脂,所述光可聚合化合物含有鄰苯二甲酸酯衍生物,其中直徑小於1微米的氣泡以5個氣泡/平方毫米或小於5個氣泡/平方毫米存在於所述光敏樹脂層內。 A photosensitive laminate comprising: a barrier layer having a haze of 2% or less; and a photosensitive resin layer including a photopolymerizable compound containing a phthalate derivative, wherein bubbles having a diameter of less than 1 micron exist in the photosensitive resin layer at 5 bubbles/mm2 or less than 5 bubbles/mm2, and a binder resin. 如請求項1所述的光敏疊層,其中:所述障壁層具有10立方公分/平方公尺/天或小於10立方公分/平方公尺/天的透氧性。 The photosensitive laminate according to claim 1, wherein: the barrier layer has an oxygen permeability of 10 cm3/m2/day or less than 10 cm3/m2/day. 如請求項1所述的光敏疊層,其中:所述障壁層包括重量平均分子量為5,000公克/莫耳至1,000,000公克/莫耳的聚乙烯醇樹脂。 The photosensitive laminate as claimed in claim 1, wherein: the barrier layer comprises a polyvinyl alcohol resin having a weight average molecular weight of 5,000 g/mol to 1,000,000 g/mol. 如請求項3所述的光敏疊層,其中:所述聚乙烯醇樹脂具有1.0厘泊至10.0厘泊的黏度。 The photosensitive laminate according to claim 3, wherein: the polyvinyl alcohol resin has a viscosity of 1.0 centipoise to 10.0 centipoise. 如請求項1所述的光敏疊層,其中:所述障壁層具有0.1微米至10微米的厚度,以及所述光敏樹脂層具有1微米至100微米的厚度。 The photosensitive laminate according to claim 1, wherein: the barrier layer has a thickness of 0.1 micron to 10 microns, and the photosensitive resin layer has a thickness of 1 micron to 100 microns. 如請求項1所述的光敏疊層,所述光敏疊層更包括形成於所述障壁層上且具有1微米至100微米的厚度的支撐基板。 The photosensitive laminate as claimed in claim 1, further comprising a supporting substrate formed on the barrier layer and having a thickness of 1 μm to 100 μm. 如請求項1所述的光敏疊層,所述光敏疊層更包括形成於所述光敏樹脂層上且具有0.01微米至1公尺的厚度的釋放層。 The photosensitive laminate according to claim 1, further comprising a release layer formed on the photosensitive resin layer and having a thickness of 0.01 μm to 1 meter. 如請求項1所述的光敏疊層,其中:在自所述障壁層與所述光敏樹脂層之間的界面的相對表面開始的所述光敏樹脂層的總厚度的50%內,直徑小於1微米的所述氣泡以3個氣泡/平方毫米或小於3個氣泡/平方毫米存在。 The photosensitive laminate as claimed in claim 1, wherein: within 50% of the total thickness of the photosensitive resin layer from the opposite surface of the interface between the barrier layer and the photosensitive resin layer, the bubbles with a diameter of less than 1 micron exist at 3 bubbles/mm2 or less than 3 bubbles/mm2. 如請求項1所述的光敏疊層,其中:所述光敏樹脂層不含直徑為1微米至5微米的氣泡。 The photosensitive laminate according to claim 1, wherein: the photosensitive resin layer does not contain air bubbles with a diameter of 1 micron to 5 microns. 如請求項1所述的光敏疊層,其中:在紫外線曝光及鹼顯影之後橫截面直徑為0.3微米至4微米的缺陷以3個缺陷/平方毫米或小於3個缺陷/平方毫米存在於所述光敏樹脂層內。 The photosensitive laminate according to claim 1, wherein after ultraviolet exposure and alkali development, defects with a cross-sectional diameter of 0.3 microns to 4 microns exist in the photosensitive resin layer at or below 3 defects/mm2. 如請求項1所述的光敏疊層,其中:所述鄰苯二甲酸酯衍生物包括至少一個反應性官能基,及所述反應性官能基包括鹵素、羥基、醚鍵、酯鍵、醯胺鍵、乙烯基、(甲基)丙烯酸酯基或芳基,其中所述醚鍵為-O-,所述酯鍵為-COO-或O-CO-,所述醯胺鍵為-NHCO-或CONH-。 The photosensitive laminate according to Claim 1, wherein: the phthalate derivative includes at least one reactive functional group, and the reactive functional group includes a halogen, a hydroxyl group, an ether bond, an ester bond, an amide bond, a vinyl group, a (meth)acrylate group or an aryl group, wherein the ether bond is -O-, the ester bond is -COO- or O-CO-, and the amide bond is -NHCO- or CONH-. 如請求項1所述的光敏疊層,其中:所述鄰苯二甲酸酯衍生物包括以下化學式1的化合物:
Figure 111112289-A0305-02-0043-1
其中,在化學式1中,R1以及R2各自獨立地為氫或具有1至20個碳原子的脂族烴基,以及所述脂族烴基可視需要包括鹵素原子、羥基、醚鍵、酯鍵、醯胺鍵、(甲基)丙烯酸酯基或芳基,其中所述醚鍵為-O-,所述酯鍵為-COO-或O-CO-,所述醯胺鍵為-NHCO-或CONH-。
The photosensitive laminate as claimed in item 1, wherein: the phthalate derivatives include compounds of the following chemical formula 1:
Figure 111112289-A0305-02-0043-1
Wherein, in Chemical Formula 1, R1 and R2 are each independently hydrogen or an aliphatic hydrocarbon group having 1 to 20 carbon atoms, and the aliphatic hydrocarbon group may optionally include a halogen atom, a hydroxyl group, an ether bond, an ester bond, an amide bond, a (meth)acrylate group or an aryl group, wherein the ether bond is -O-, the ester bond is -COO- or O-CO-, and the amide bond is -NHCO- or CONH-.
如請求項1所述的光敏疊層,其中:所述鄰苯二甲酸酯衍生物包括以下化學式2的化合物或以下化學式3的化合物:
Figure 111112289-A0305-02-0044-3
Figure 111112289-A0305-02-0044-4
The photosensitive laminate as claimed in item 1, wherein: the phthalate derivatives include the compound of the following chemical formula 2 or the compound of the following chemical formula 3:
Figure 111112289-A0305-02-0044-3
Figure 111112289-A0305-02-0044-4
如請求項1所述的光敏疊層,其中:所述光可聚合化合物更包括單官能(甲基)丙烯酸酯化合物或多官能(甲基)丙烯酸酯化合物。 The photosensitive laminate as claimed in claim 1, wherein: the photopolymerizable compound further comprises a monofunctional (meth)acrylate compound or a multifunctional (meth)acrylate compound. 如請求項14所述的光敏疊層,其中:按所述鄰苯二甲酸酯衍生物的100重量份計,所述光可聚合化合物包括50重量份至500重量份的所述單官能(甲基)丙烯酸酯化合物或所述多官能(甲基)丙烯酸酯化合物。 The photosensitive laminate according to claim 14, wherein: based on 100 parts by weight of the phthalate derivative, the photopolymerizable compound includes 50 to 500 parts by weight of the monofunctional (meth)acrylate compound or the multifunctional (meth)acrylate compound. 如請求項1所述的光敏疊層,其中:所述黏合劑樹脂具有20,000公克/莫耳至300,000公克/莫耳的重量平均分子量以及20℃以上且150℃以下的玻璃轉化溫度。 The photosensitive laminate according to claim 1, wherein: the binder resin has a weight average molecular weight of 20,000 g/mole to 300,000 g/mole and a glass transition temperature of not less than 20°C and not more than 150°C. 一種製備電路板的方法,所述方法使用如請求項1所述的光敏疊層。 A method of preparing a circuit board using the photosensitive laminate as claimed in Claim 1.
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