TWI804164B - Leveling device and leveling method - Google Patents
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- 238000000034 method Methods 0.000 title claims description 29
- 239000000758 substrate Substances 0.000 claims abstract description 122
- 238000003825 pressing Methods 0.000 claims abstract description 74
- 238000007789 sealing Methods 0.000 claims abstract description 46
- 230000002093 peripheral effect Effects 0.000 claims description 50
- 230000000694 effects Effects 0.000 description 8
- 238000001514 detection method Methods 0.000 description 7
- 238000012546 transfer Methods 0.000 description 7
- 238000007689 inspection Methods 0.000 description 6
- 239000013013 elastic material Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 238000001179 sorption measurement Methods 0.000 description 3
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 238000004026 adhesive bonding Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
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Abstract
Description
本發明是有關於一種整平裝置,特別是指一種用於整平基板的整平裝置及整平方法。The invention relates to a leveling device, in particular to a leveling device and a leveling method for leveling a substrate.
自動光學檢測設備欲對一如晶圓的半導體基板進行檢測時,需將晶圓放置於一載台上,載台透過真空吸附方式吸附晶圓,以供一檢測裝置進行檢測。由於晶圓經過多道半導體加工製程後很容易產生翹曲的情形,因此,常會造成載台無法穩固地吸附住晶圓而造成晶圓晃動,以及檢測裝置所拍攝的晶圓影像因前述晶圓翹曲與晃動因素導致失真進而影響檢測精準度。When the automatic optical inspection equipment intends to inspect a semiconductor substrate such as a wafer, the wafer needs to be placed on a stage, and the stage absorbs the wafer through a vacuum suction method for inspection by an inspection device. Since the wafer is prone to warping after passing through multiple semiconductor processing processes, it often causes the stage to be unable to firmly absorb the wafer, causing the wafer to shake, and the wafer image taken by the inspection device is due to the aforementioned wafer Warping and shaking factors cause distortion and affect detection accuracy.
本發明之其中一目的,即在提供一種能夠克服先前技術的至少一個缺點的整平裝置。It is an object of the present invention to provide a leveling device that overcomes at least one of the disadvantages of the prior art.
本發明的整平裝置,適於整平一基板。The leveling device of the present invention is suitable for leveling a substrate.
整平裝置包括一載台、一壓制件及一彈性密封環。載台用以承載並吸附基板。壓制件設置於載台上方,用以向下壓制基板,以使基板的一外周緣靠近載台。彈性密封環設置於載台並能被載台吸附。當壓制件壓制基板且彈性密封環被載台吸附時,彈性密封環緊密貼附於載台及基板的外周緣,以使彈性密封環、載台及基板之間形成一氣密室。氣密室進而被載台抽氣而形成真空狀態以吸附基板,使基板完整地平貼於載台。The leveling device includes a carrier, a pressed part and an elastic sealing ring. The stage is used for carrying and absorbing the substrate. The pressing part is arranged above the stage for pressing down the substrate so that an outer peripheral edge of the substrate is close to the stage. The elastic sealing ring is arranged on the stage and can be absorbed by the stage. When the pressing part presses the substrate and the elastic sealing ring is absorbed by the carrier, the elastic sealing ring is closely attached to the outer peripheral edges of the carrier and the substrate, so that an airtight chamber is formed between the elastic sealing ring, the carrier and the substrate. The airtight chamber is further evacuated by the stage to form a vacuum state to absorb the substrate, so that the substrate is completely flat on the stage.
本發明之另一目的,即在提供一種能夠克服先前技術的至少一個缺點的整平方法。Another object of the present invention is to provide a leveling method that overcomes at least one of the disadvantages of the prior art.
本發明的整平方法,適於整平一基板,整平方法包含以下步驟:The leveling method of the present invention is suitable for leveling a substrate, and the leveling method comprises the following steps:
放置基板於一載台上;驅動一壓制件向下壓制基板,以使基板的一外周緣靠近載台並且被一彈性密封環環繞;驅動載台吸附彈性密封環,使彈性密封環緊密貼附於載台及外周緣,進而使彈性密封環、載台及基板之間形成一氣密室;及透過載台對氣密室抽氣以使氣密室形成真空狀態,進而基板被吸附而完整地平貼於載台。Place the substrate on a stage; drive a pressing part to press the substrate downward, so that an outer peripheral edge of the substrate is close to the stage and surrounded by an elastic sealing ring; drive the stage to absorb the elastic sealing ring, so that the elastic sealing ring is tightly attached An airtight chamber is formed between the elastic sealing ring, the stage and the substrate on the stage and the outer periphery; and the airtight chamber is pumped through the stage to form a vacuum state in the airtight chamber, and the substrate is absorbed and completely flat on the carrier tower.
本發明至少具有以下功效:藉由壓制件下壓基板,能起到初步整平基板的功效,以降低基板的翹曲程度及外周緣高度;藉由壓制件不直接壓平基板而是使外周緣與承載頂面之間相間隔距離,藉此,能避免壓制件在下壓基板的過程中造成基板受損;以及藉由壓制件、載台、真空機構及彈性密封環相互配合,能起到進一步整平基板的功效,使基板能平貼並穩固地定位於承載頂面。The present invention has at least the following effects: the base plate is pressed down by the pressed part, which can initially level the base plate to reduce the warping degree of the base plate and the height of the outer periphery; the pressed part does not directly flatten the substrate but makes the outer periphery There is a distance between the edge and the top surface of the load, thereby preventing the substrate from being damaged during the process of pressing down the substrate by the pressed part; Further leveling the effect of the substrate, so that the substrate can be flat and firmly positioned on the top surface of the load.
在本發明被詳細描述之前,應當注意在以下的說明內容中,類似的元件是以相同的編號來表示。Before the present invention is described in detail, it should be noted that in the following description, similar elements are denoted by the same numerals.
參閱圖1,本發明整平裝置200的第一實施例,應用於一光學檢測設備(圖未示)上用以整平一基板1,使光學檢測設備對基板1進行檢測。在本第一實施例中,基板1是以一待測晶圓為例,但不以此為限,基板1也可以是一呈圓形的待測電路基板或待測面板。基板1具有一底面11、一相反於底面11的頂面12,及一連接於底面11與頂面12之間的外周緣13。基板1的外周緣13朝上翹曲,使得頂面12界定出一開口朝上的凹部14。整平裝置200包含一載台2、一真空機構3(如圖4所示)、一彈性密封環4,及一壓制機構5。Referring to FIG. 1 , a first embodiment of a
參閱圖2、圖3及圖4,載台2為一真空吸附載台並包括一下表面21,及一相反於下表面21的上表面22。載台2界定一由上表面22朝下表面21方向凹陷用以供彈性密封環4容置的定位環槽23。載台2包括一位於定位環槽23內側且被定位環槽23所圍繞的盤體24。盤體24呈圓盤狀並具有一呈圓形用以承載基板1的承載頂面241,及一圍繞面242。Referring to FIG. 2 , FIG. 3 and FIG. 4 , the
載台2還界定出一形成於下表面21、承載頂面241與圍繞面242之間的吸氣流道25。吸氣流道25具有一中心槽251、多個內環溝槽252、一外環溝槽253、多個長溝槽254,及多個氣孔255。中心槽251由承載頂面241中心處向下凹陷,用以吸附基板1的底面11。多個內環溝槽252及外環溝槽253各自呈圓環形且分別具有不同直徑,多個內環溝槽252及外環溝槽253由承載頂面241向下凹陷且呈同心圓狀地沿徑向相間隔排列並位於中心槽251外周圍,每一個內環溝槽252用以吸附基板1的底面11。外環溝槽253延伸至圍繞面242並緊鄰圍繞面242且與定位環槽23連通,用以吸附基板1的底面11及位於定位環槽23內的彈性密封環4。多個長溝槽254由承載頂面241向下凹陷且等角度相間隔排列並呈放射線狀。每一個長溝槽254由中心槽251徑向朝外延伸至外環溝槽253並且連通中心槽251、內環溝槽252及外環溝槽253,每一個長溝槽254用以吸附基板1的底面11。每一個氣孔255由下表面21延伸至對應的長溝槽254並與對應的長溝槽254連通,用以連接真空機構3。在本第一實施例中,長溝槽254數量是以四個為例,氣孔255數量是以八個為例,但不以此為限,也可視需求進行調整。The
真空機構3包括一真空源31及一連接管路32。真空源31例如為一真空泵,但不以此為限。連接管路32連接於真空源31與多個氣孔255之間。當真空源31運轉時會透過連接管路32及氣孔255對長溝槽254抽氣,使得長溝槽254、中心槽251、內環溝槽252及外環溝槽253產生吸力以吸附基板1及彈性密封環4。The
彈性密封環4是由可變形的彈性材質製成。前述彈性材質例如可為橡膠或矽膠等彈性材質。彈性密封環4包括一定位環體41及一可動環體42。定位環體41容置於定位環槽23內,並可透過如緊配合方式或是黏膠黏固方式定位於定位環槽23,使得定位環體41環繞於盤體24的圍繞面242。定位環體41與定位環槽23之間的定位方式不以前述方式為限,也可透過其他定位方式來達成。定位環體41具有一環頂面411及一內周面412。The
可動環體42由定位環體41的環頂面411鄰近內周面412處一體地朝上並朝遠離圍繞面242方向傾斜延伸,可動環體42環繞於盤體24的承載頂面241及圍繞面242,以及吸氣流道25的外環溝槽253。可動環體42具有一內環面421及一頂端422,內環面421面向吸氣流道25的外環溝槽253。可動環體42能相對於定位環體41彎折變形以在一初始位置(如圖4放大區塊所示)及一貼附位置(如圖8的放大區塊所示)之間樞轉。在初始位置時,可動環體42呈傾斜狀,內環面421與圍繞面242及外環溝槽253相間隔,且頂端422高度高於外環溝槽253高度。在貼附位置時,可動環體42呈直立狀,內環面421緊密貼附於圍繞面242且封閉外環溝槽253外側。藉由可動環體42的內環面421面向外環溝槽253並與外環溝槽253位置對應,使得可動環體42能被外環溝槽253吸附而由初始位置樞轉至貼附位置。The
壓制機構5包括一承載環51,及一壓制件52。承載環51與一移載機構(圖未示)連接並形成有一朝向下方用以供壓制件52容置的定位環槽511。本第一實施例的壓制件52是一呈環形狀的壓制條,例如為一O形環。壓制件52是由彈性材質所製成,例如可為聚醚醚酮(PEEK)或橡膠等彈性材質。壓制件52容置於定位環槽511且部分凸伸出承載環51底端,用以壓制基板1的頂面12鄰近於外周緣13的部位。壓制件52可透過如緊配合方式或是黏膠黏固方式定位於定位環槽511。壓制件52與定位環槽511之間的定位方式不以前述方式為限,也可透過其他定位方式來達成。The
移載機構用以驅動壓制機構5移動至一待壓制位置(如圖4所示)或移離待壓制位置。當壓制機構5在待壓制位置時,壓制件52位於載台2上方並且對齊於盤體24的承載頂面241及圍繞面242,且壓制件52能對齊於基板1的頂面12鄰近外周緣13的部位。移載機構還用以驅動壓制機構5在待壓制位置及一壓制位置(如圖6所示)之間升降移動。當壓制機構5在壓制位置時,壓制件52向下壓制基板1的頂面12鄰近外周緣13的部位以使基板1的外周緣13靠近載台2的承載頂面241。The transfer mechanism is used to drive the
以下針對整平裝置200使用本案第一實施例的整平方法來運作的方式進行詳細說明:The following is a detailed description of how the leveling
圖5是本第一實施例的整平方法的一整平步驟流程圖,包含下述步驟:步驟S1:放置基板於載台、步驟S2:驅動壓制件壓制基板、步驟S3:驅動載台吸附彈性密封環,及步驟S4:透過載台對氣密室抽氣。5 is a flow chart of the leveling steps of the leveling method of the first embodiment, which includes the following steps: Step S1: placing the substrate on the carrier, step S2: driving the pressing part to press the substrate, step S3: driving the carrier to absorb The elastic sealing ring, and step S4: pumping air through the carrier to the airtight chamber.
參閱圖4及圖5,在步驟S1中,透過一取放裝置(圖未示)移載基板1並將基板1放置於盤體24的承載頂面241,使基板1的底面11局部接觸承載頂面241。Referring to FIG. 4 and FIG. 5, in step S1, the
參閱圖4、圖5及圖6,在步驟S2中,移載機構會先驅動壓制機構5移動至圖4所示的待壓制位置,使壓制件52對齊於基板1的頂面12鄰近外周緣13處。隨後,移載機構驅動壓制機構5由待壓制位置沿一下壓方向D向下移動,當壓制件52接觸到基板1的頂面12並將頂面12下壓時,壓制件52施加於頂面12的下壓力使底面11接觸承載頂面241的部位逐漸增加,以及外周緣13逐漸靠近承載頂面241。當壓制機構5下降到圖6所示的壓制位置時,移載機構即停止驅動壓制機構5下移。此時,壓制件52向下壓制基板1的頂面12鄰近外周緣13的部位,並使外周緣13與承載頂面241之間相間隔一距離d。於本第一實施例中,距離d的數值是例如介於1mm至2mm之間的任一數值,於其他實施例中,距離d的數值可依實際需求變更。Referring to FIG. 4, FIG. 5 and FIG. 6, in step S2, the transfer mechanism will first drive the
參閱圖6及圖7,藉由壓制件52在前述下壓基板1的過程中使底面11接觸承載頂面241的部位逐漸增加以及外周緣13逐漸靠近承載頂面241,能起到初步整平基板1的功效,以降低基板1的翹曲程度及外周緣13高度。藉此,使得位在初始位置的可動環體42的內環面421能環繞基板1的外周緣13並與外周緣13相間隔,以及頂端422的高度能高於外周緣13高度。此外,壓制機構5下降到壓制位置時,壓制件52不直接壓平基板1而是使外周緣13與承載頂面241之間相間隔距離d,藉此,能避免壓制件52將基板1壓平時的下壓力道過大造成底面11撞擊摩擦承載頂面241進而產生受損的情形。Referring to Fig. 6 and Fig. 7, during the process of pressing down the
參閱圖5、圖8及圖9,在步驟S3中,驅動真空機構3的真空源31運轉,真空源31運轉時會透過連接管路32及氣孔255對長溝槽254抽氣,使得長溝槽254、中心槽251、內環溝槽252及外環溝槽253產生吸力。其中,長溝槽254、中心槽251、內環溝槽252及外環溝槽253所產生的由上朝下的縱向吸力會吸附基板1的底面11,而外環溝槽253所產生的由外朝內的徑向吸力(如圖9所示的箭頭方向)則會吸附彈性密封環4的可動環體42,以帶動可動環體42相對於定位環體41朝內彎折變形並樞轉至圖8所示的貼附位置。同時,可動環體42因相對於定位環體41彎折變形而蓄積復位彈力。Referring to Fig. 5, Fig. 8 and Fig. 9, in step S3, the
由於可動環體42在初始位置時,頂端422高度高於外環溝槽253高度以及外周緣13高度,因此,能確保可動環體42樞轉至貼附位置時,內環面421同時緊密地貼附於盤體24的圍繞面242及基板1的外周緣13,並且密封外環溝槽253外側。藉此,使得彈性密封環4的可動環體42、載台2的盤體24以及基板1之間形成一呈氣密狀態的氣密室6,從而能防止外部環境的空氣被吸入氣密室6內以及氣密室6內的空氣向外洩漏。Since the height of the
藉由可動環體42由定位環體41的環頂面411鄰近內周面412處朝上並朝遠離圍繞面242方向傾斜延伸的設計方式,使得可動環體42被外環溝槽253所產生的徑向吸力吸附時是由下朝上地依序貼附於圍繞面242、密封外環溝槽253外側以及貼附於外周緣13。藉此,能增進內環面421貼附於圍繞面242及外周緣13的服貼性,使內環面421能緊密地貼附於圍繞面242及外周緣13而增進密封外環溝槽253的效果。The
藉由可動環體42以內環面421面向外環溝槽253並供外環溝槽253所產生的徑向吸力吸附的方式,使得可動環體42能受吸力吸附的受力面積大。由於外環溝槽253呈圓環形,因此,外環溝槽253所產生的徑向吸力能施力均勻地吸附可動環體42的內環面421。藉由前述設計方式,使得可動環體42被外環溝槽253所產生的徑向吸力吸附時能順暢且迅速地相對於定位環體41彎折變形而由初始位置樞轉至貼附位置。By making the
參閱圖5、圖9及圖10,在步驟S4中,藉由真空源31的持續運轉,吸氣流道25會透過中心槽251、內環溝槽252、外環溝槽253及長溝槽254對氣密室6抽氣,以使氣密室6成真空狀態。藉由中心槽251、內環溝槽252、外環溝槽253及長溝槽254透過真空吸附方式吸附基板1的底面11,能將基板1鄰近外周緣13處的翹曲部位往下拉使外周緣13沿著內環面421下移,以起到進一步整平基板1的功效。藉此,能將翹曲的基板1整平並使底面11完整地平貼在承載頂面241,以及能使整平後的基板1穩固地定位於承載頂面241。Referring to Fig. 5, Fig. 9 and Fig. 10, in step S4, by the continuous operation of the
基板1被整平後,移載機構會先驅動壓制機構5上升並回復至待壓制位置,隨後再驅動壓制機構5移離待壓制位置,使壓制機構5不會遮蔽住基板1。接著,便能透過一檢測裝置(圖未示)對整平後的基板1進行檢測。由於檢測裝置所拍攝的是穩固地定位於承載頂面241且被整平後的基板1影像,因此,能有效提升檢測裝置的檢測精準度。After the
當檢測裝置檢測完成時,真空源31停止運轉以解除中心槽251、內環溝槽252、外環溝槽253及長溝槽254的真空吸附狀態。此時,彈性密封環4的可動環體42藉由蓄積的復位彈力自動回彈並復位至圖4所示的初始位置。When the detection by the detection device is completed, the
藉由彈性密封環4以一體成型的製造方式成型出定位環體41及可動環體42,使得可動環體42受吸力吸附時能蓄積復位彈力,而不受吸力吸附時能藉由蓄積的復位彈力自動回彈復位。藉此,可動環體42不需額外透過如彈簧等構件的輔助便能達到自動復位的功效。The
參閱圖11及圖12,本發明整平裝置200的第二實施例,其整體結構大致與第一實施例相同,不同處在於壓制機構5的壓制件52'結構。Referring to FIG. 11 and FIG. 12 , the overall structure of the second embodiment of the
在本第二實施例中,壓制件52'包括多個等角度相間隔地排列成環形狀且容置於定位環槽511內的壓制條521。每一個壓制條521呈弧條狀用以壓制於基板1的頂面12鄰近於外周緣13的部位。藉此,同樣能達到壓制基板1以初步整平基板1的功效。In the second embodiment, the
綜上所述,各實施例的整平裝置200,藉由壓制件52、52'下壓基板1,能起到初步整平基板1的功效以降低基板1的翹曲程度及外周緣13高度。藉由壓制件52、52'不直接壓平基板1而是使外周緣13與承載頂面241之間相間隔距離d,藉此,能避免壓制件52在下壓基板1的過程中造成基板1受損。藉由壓制件52、52'、載台2、真空機構3及彈性密封環4相互配合,能起到進一步整平基板1的功效,使基板1能平貼並穩固地定位於承載頂面241,故確實能達成本發明之目的。To sum up, the
惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。But what is described above is only an embodiment of the present invention, and should not limit the scope of the present invention. All simple equivalent changes and modifications made according to the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of the present invention.
1:基板1: Substrate
11:底面11: bottom surface
12:頂面12: top surface
13:外周緣13: Outer periphery
14:凹部14: Concave
200:整平裝置200: leveling device
2:載台2: carrier
21:下表面21: lower surface
22:上表面22: Upper surface
23:定位環槽23: positioning ring groove
24:盤體24: Disk body
241:承載頂面241: Load top surface
242:圍繞面242: around the surface
25:吸氣流道25: Inhalation channel
251:中心槽251: Center slot
252:內環溝槽252: Inner ring groove
253:外環溝槽253: Outer ring groove
254:長溝槽254: long groove
255:氣孔255: stomata
3:真空機構3: Vacuum mechanism
31:真空源31: Vacuum source
32:連接管路32: Connect the pipeline
4:彈性密封環4: Elastic sealing ring
41:定位環體41: positioning ring body
411:環頂面411: ring top surface
412:內周面412: inner peripheral surface
42:可動環體42: Movable ring body
421:內環面421: inner ring surface
422:頂端422: top
5:壓制機構5: Press mechanism
51:承載環51: Bearing ring
511:定位環槽511: positioning ring groove
52、52':壓制件52, 52': pressed parts
521:壓制條521: pressed bar
6:氣密室6: Airlock
d:距離d: distance
D:下壓方向D: Down direction
S1~S4:整平步驟S1~S4: Leveling steps
本發明之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是本發明整平裝置的第一實施例與一基板的一立體分解圖; 圖2是第一實施例的一立體分解圖; 圖3是第一實施例由另一視角觀看的一立體分解圖; 圖4是第一實施例與基板的一不完整剖視圖; 圖5是第一實施例的整平方法的一整平步驟流程圖; 圖6是第一實施例與基板的一不完整剖視圖; 圖7是第一實施例與基板的一不完整俯視圖; 圖8是第一實施例與基板的一不完整剖視圖; 圖9是第一實施例與基板的一不完整俯視圖; 圖10是第一實施例與基板的一不完整剖視圖; 圖11是本發明整平裝置的第二實施例的一壓制機構的一立體分解圖;及 圖12是第二實施例與基板的一剖視圖。 Other features and effects of the present invention will be clearly presented in the implementation manner with reference to the drawings, wherein: Fig. 1 is a three-dimensional exploded view of the first embodiment of the leveling device of the present invention and a base plate; Fig. 2 is a three-dimensional exploded view of the first embodiment; Fig. 3 is a three-dimensional exploded view of the first embodiment viewed from another perspective; Fig. 4 is an incomplete sectional view of the first embodiment and the substrate; Fig. 5 is a flow chart of a leveling step of the leveling method of the first embodiment; Fig. 6 is an incomplete sectional view of the first embodiment and the substrate; Fig. 7 is an incomplete top view of the first embodiment and the substrate; Fig. 8 is an incomplete sectional view of the first embodiment and the substrate; Fig. 9 is an incomplete top view of the first embodiment and the substrate; Fig. 10 is an incomplete sectional view of the first embodiment and the substrate; Fig. 11 is a three-dimensional exploded view of a pressing mechanism of the second embodiment of the leveling device of the present invention; and FIG. 12 is a cross-sectional view of the second embodiment and the substrate.
1:基板 1: Substrate
11:底面 11: bottom surface
12:頂面 12: top surface
13:外周緣 13: Outer periphery
14:凹部 14: Concave
200:整平裝置 200: leveling device
2:載台 2: carrier
25:吸氣流道 25: Inhalation channel
253:外環溝槽 253: Outer ring groove
254:長溝槽 254: long groove
4:彈性密封環 4: Elastic sealing ring
42:可動環體 42: Movable ring body
5:壓制機構 5: Press mechanism
51:承載環 51: Bearing ring
Claims (18)
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CN118380370A (en) * | 2024-06-21 | 2024-07-23 | 上海果纳半导体技术有限公司 | Substrate bearing device and film pasting equipment |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US20170062246A1 (en) * | 2015-09-02 | 2017-03-02 | E&R Engineering Corp. | Wafer leveling device |
TW201917383A (en) * | 2017-10-23 | 2019-05-01 | 由田新技股份有限公司 | A semiconductor wafer leveling device and method thereof |
TW202137391A (en) * | 2020-03-27 | 2021-10-01 | 由田新技股份有限公司 | A semiconductor wafer leveling device and leveling method thereof |
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US20170062246A1 (en) * | 2015-09-02 | 2017-03-02 | E&R Engineering Corp. | Wafer leveling device |
TW201917383A (en) * | 2017-10-23 | 2019-05-01 | 由田新技股份有限公司 | A semiconductor wafer leveling device and method thereof |
TW202137391A (en) * | 2020-03-27 | 2021-10-01 | 由田新技股份有限公司 | A semiconductor wafer leveling device and leveling method thereof |
Cited By (1)
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CN118380370A (en) * | 2024-06-21 | 2024-07-23 | 上海果纳半导体技术有限公司 | Substrate bearing device and film pasting equipment |
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