TWI804164B - Leveling device and leveling method - Google Patents

Leveling device and leveling method Download PDF

Info

Publication number
TWI804164B
TWI804164B TW111102015A TW111102015A TWI804164B TW I804164 B TWI804164 B TW I804164B TW 111102015 A TW111102015 A TW 111102015A TW 111102015 A TW111102015 A TW 111102015A TW I804164 B TWI804164 B TW I804164B
Authority
TW
Taiwan
Prior art keywords
substrate
ring
elastic sealing
stage
carrier
Prior art date
Application number
TW111102015A
Other languages
Chinese (zh)
Other versions
TW202331880A (en
Inventor
賴憲平
Original Assignee
由田新技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 由田新技股份有限公司 filed Critical 由田新技股份有限公司
Priority to TW111102015A priority Critical patent/TWI804164B/en
Priority to CN202211533835.4A priority patent/CN116469795A/en
Application granted granted Critical
Publication of TWI804164B publication Critical patent/TWI804164B/en
Publication of TW202331880A publication Critical patent/TW202331880A/en

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/12Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Soil Working Implements (AREA)
  • Looms (AREA)
  • Beans For Foods Or Fodder (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

A leveling device is adapted to level a substrate. The leveling device includes a carrier, a pressing member and an elastic sealing ring. The carrier is disposed for carrying and absorbing the substrate. The pressing member is disposed above the carrier, and is disposed for downwardly pressing the substrate, so as to make the outer periphery of the substrate close to the carrier. The elastic sealing ring is disposed on the carrier and can be absorbed by the carrier. When the pressing member presses the substrate and the elastic sealing ring is absorbed by the carrier, the elastic sealing ring is closely attached to the carrier and the outer periphery of the substrate, so that an airtight chamber is formed among the elastic sealing ring, the carrier and the substrate. The airtight chamber is following evacuated by the carrier to form a vacuum state, so as to absorb the substrate, so that the substrate is completely absorbed on the carrier.

Description

整平裝置及整平方法Leveling device and leveling method

本發明是有關於一種整平裝置,特別是指一種用於整平基板的整平裝置及整平方法。The invention relates to a leveling device, in particular to a leveling device and a leveling method for leveling a substrate.

自動光學檢測設備欲對一如晶圓的半導體基板進行檢測時,需將晶圓放置於一載台上,載台透過真空吸附方式吸附晶圓,以供一檢測裝置進行檢測。由於晶圓經過多道半導體加工製程後很容易產生翹曲的情形,因此,常會造成載台無法穩固地吸附住晶圓而造成晶圓晃動,以及檢測裝置所拍攝的晶圓影像因前述晶圓翹曲與晃動因素導致失真進而影響檢測精準度。When the automatic optical inspection equipment intends to inspect a semiconductor substrate such as a wafer, the wafer needs to be placed on a stage, and the stage absorbs the wafer through a vacuum suction method for inspection by an inspection device. Since the wafer is prone to warping after passing through multiple semiconductor processing processes, it often causes the stage to be unable to firmly absorb the wafer, causing the wafer to shake, and the wafer image taken by the inspection device is due to the aforementioned wafer Warping and shaking factors cause distortion and affect detection accuracy.

本發明之其中一目的,即在提供一種能夠克服先前技術的至少一個缺點的整平裝置。It is an object of the present invention to provide a leveling device that overcomes at least one of the disadvantages of the prior art.

本發明的整平裝置,適於整平一基板。The leveling device of the present invention is suitable for leveling a substrate.

整平裝置包括一載台、一壓制件及一彈性密封環。載台用以承載並吸附基板。壓制件設置於載台上方,用以向下壓制基板,以使基板的一外周緣靠近載台。彈性密封環設置於載台並能被載台吸附。當壓制件壓制基板且彈性密封環被載台吸附時,彈性密封環緊密貼附於載台及基板的外周緣,以使彈性密封環、載台及基板之間形成一氣密室。氣密室進而被載台抽氣而形成真空狀態以吸附基板,使基板完整地平貼於載台。The leveling device includes a carrier, a pressed part and an elastic sealing ring. The stage is used for carrying and absorbing the substrate. The pressing part is arranged above the stage for pressing down the substrate so that an outer peripheral edge of the substrate is close to the stage. The elastic sealing ring is arranged on the stage and can be absorbed by the stage. When the pressing part presses the substrate and the elastic sealing ring is absorbed by the carrier, the elastic sealing ring is closely attached to the outer peripheral edges of the carrier and the substrate, so that an airtight chamber is formed between the elastic sealing ring, the carrier and the substrate. The airtight chamber is further evacuated by the stage to form a vacuum state to absorb the substrate, so that the substrate is completely flat on the stage.

本發明之另一目的,即在提供一種能夠克服先前技術的至少一個缺點的整平方法。Another object of the present invention is to provide a leveling method that overcomes at least one of the disadvantages of the prior art.

本發明的整平方法,適於整平一基板,整平方法包含以下步驟:The leveling method of the present invention is suitable for leveling a substrate, and the leveling method comprises the following steps:

放置基板於一載台上;驅動一壓制件向下壓制基板,以使基板的一外周緣靠近載台並且被一彈性密封環環繞;驅動載台吸附彈性密封環,使彈性密封環緊密貼附於載台及外周緣,進而使彈性密封環、載台及基板之間形成一氣密室;及透過載台對氣密室抽氣以使氣密室形成真空狀態,進而基板被吸附而完整地平貼於載台。Place the substrate on a stage; drive a pressing part to press the substrate downward, so that an outer peripheral edge of the substrate is close to the stage and surrounded by an elastic sealing ring; drive the stage to absorb the elastic sealing ring, so that the elastic sealing ring is tightly attached An airtight chamber is formed between the elastic sealing ring, the stage and the substrate on the stage and the outer periphery; and the airtight chamber is pumped through the stage to form a vacuum state in the airtight chamber, and the substrate is absorbed and completely flat on the carrier tower.

本發明至少具有以下功效:藉由壓制件下壓基板,能起到初步整平基板的功效,以降低基板的翹曲程度及外周緣高度;藉由壓制件不直接壓平基板而是使外周緣與承載頂面之間相間隔距離,藉此,能避免壓制件在下壓基板的過程中造成基板受損;以及藉由壓制件、載台、真空機構及彈性密封環相互配合,能起到進一步整平基板的功效,使基板能平貼並穩固地定位於承載頂面。The present invention has at least the following effects: the base plate is pressed down by the pressed part, which can initially level the base plate to reduce the warping degree of the base plate and the height of the outer periphery; the pressed part does not directly flatten the substrate but makes the outer periphery There is a distance between the edge and the top surface of the load, thereby preventing the substrate from being damaged during the process of pressing down the substrate by the pressed part; Further leveling the effect of the substrate, so that the substrate can be flat and firmly positioned on the top surface of the load.

在本發明被詳細描述之前,應當注意在以下的說明內容中,類似的元件是以相同的編號來表示。Before the present invention is described in detail, it should be noted that in the following description, similar elements are denoted by the same numerals.

參閱圖1,本發明整平裝置200的第一實施例,應用於一光學檢測設備(圖未示)上用以整平一基板1,使光學檢測設備對基板1進行檢測。在本第一實施例中,基板1是以一待測晶圓為例,但不以此為限,基板1也可以是一呈圓形的待測電路基板或待測面板。基板1具有一底面11、一相反於底面11的頂面12,及一連接於底面11與頂面12之間的外周緣13。基板1的外周緣13朝上翹曲,使得頂面12界定出一開口朝上的凹部14。整平裝置200包含一載台2、一真空機構3(如圖4所示)、一彈性密封環4,及一壓制機構5。Referring to FIG. 1 , a first embodiment of a leveling device 200 of the present invention is applied to an optical inspection device (not shown) to level a substrate 1 so that the optical inspection device can inspect the substrate 1 . In the first embodiment, the substrate 1 is an example of a wafer to be tested, but it is not limited thereto. The substrate 1 may also be a circular circuit substrate to be tested or a panel to be tested. The substrate 1 has a bottom surface 11 , a top surface 12 opposite to the bottom surface 11 , and an outer peripheral edge 13 connected between the bottom surface 11 and the top surface 12 . The outer peripheral edge 13 of the substrate 1 is warped upward, so that the top surface 12 defines a concave portion 14 with an upward opening. The leveling device 200 includes a stage 2 , a vacuum mechanism 3 (as shown in FIG. 4 ), an elastic sealing ring 4 , and a pressing mechanism 5 .

參閱圖2、圖3及圖4,載台2為一真空吸附載台並包括一下表面21,及一相反於下表面21的上表面22。載台2界定一由上表面22朝下表面21方向凹陷用以供彈性密封環4容置的定位環槽23。載台2包括一位於定位環槽23內側且被定位環槽23所圍繞的盤體24。盤體24呈圓盤狀並具有一呈圓形用以承載基板1的承載頂面241,及一圍繞面242。Referring to FIG. 2 , FIG. 3 and FIG. 4 , the stage 2 is a vacuum adsorption stage and includes a lower surface 21 and an upper surface 22 opposite to the lower surface 21 . The platform 2 defines a positioning ring groove 23 recessed from the upper surface 22 toward the lower surface 21 for accommodating the elastic sealing ring 4 . The stage 2 includes a disc body 24 located inside the positioning ring groove 23 and surrounded by the positioning ring groove 23 . The disk body 24 is disc-shaped and has a circular top surface 241 for carrying the substrate 1 and a surrounding surface 242 .

載台2還界定出一形成於下表面21、承載頂面241與圍繞面242之間的吸氣流道25。吸氣流道25具有一中心槽251、多個內環溝槽252、一外環溝槽253、多個長溝槽254,及多個氣孔255。中心槽251由承載頂面241中心處向下凹陷,用以吸附基板1的底面11。多個內環溝槽252及外環溝槽253各自呈圓環形且分別具有不同直徑,多個內環溝槽252及外環溝槽253由承載頂面241向下凹陷且呈同心圓狀地沿徑向相間隔排列並位於中心槽251外周圍,每一個內環溝槽252用以吸附基板1的底面11。外環溝槽253延伸至圍繞面242並緊鄰圍繞面242且與定位環槽23連通,用以吸附基板1的底面11及位於定位環槽23內的彈性密封環4。多個長溝槽254由承載頂面241向下凹陷且等角度相間隔排列並呈放射線狀。每一個長溝槽254由中心槽251徑向朝外延伸至外環溝槽253並且連通中心槽251、內環溝槽252及外環溝槽253,每一個長溝槽254用以吸附基板1的底面11。每一個氣孔255由下表面21延伸至對應的長溝槽254並與對應的長溝槽254連通,用以連接真空機構3。在本第一實施例中,長溝槽254數量是以四個為例,氣孔255數量是以八個為例,但不以此為限,也可視需求進行調整。The platform 2 also defines an air suction channel 25 formed between the lower surface 21 , the carrying top surface 241 and the surrounding surface 242 . The suction channel 25 has a central groove 251 , a plurality of inner ring grooves 252 , an outer ring groove 253 , a plurality of long grooves 254 , and a plurality of air holes 255 . The central groove 251 is recessed downward from the center of the carrying top surface 241 for absorbing the bottom surface 11 of the substrate 1 . A plurality of inner ring grooves 252 and outer ring grooves 253 each have a circular shape and have different diameters. The plurality of inner ring grooves 252 and outer ring grooves 253 are recessed downward from the bearing top surface 241 and are concentric. are arranged radially at intervals and located around the central groove 251 , and each inner ring groove 252 is used for absorbing the bottom surface 11 of the substrate 1 . The outer ring groove 253 extends to the surrounding surface 242 and is adjacent to the surrounding surface 242 and communicates with the positioning ring groove 23 for absorbing the bottom surface 11 of the substrate 1 and the elastic sealing ring 4 located in the positioning ring groove 23 . A plurality of long grooves 254 are recessed downward from the bearing top surface 241 and are arranged at equal angles and in a radial shape. Each long groove 254 extends radially outward from the central groove 251 to the outer ring groove 253 and communicates with the central groove 251, the inner ring groove 252 and the outer ring groove 253, and each long groove 254 is used to adsorb the bottom surface of the substrate 1 11. Each air hole 255 extends from the lower surface 21 to the corresponding long groove 254 and communicates with the corresponding long groove 254 for connecting with the vacuum mechanism 3 . In the first embodiment, the number of long grooves 254 is four as an example, and the number of air holes 255 is eight as an example, but it is not limited thereto, and can also be adjusted according to requirements.

真空機構3包括一真空源31及一連接管路32。真空源31例如為一真空泵,但不以此為限。連接管路32連接於真空源31與多個氣孔255之間。當真空源31運轉時會透過連接管路32及氣孔255對長溝槽254抽氣,使得長溝槽254、中心槽251、內環溝槽252及外環溝槽253產生吸力以吸附基板1及彈性密封環4。The vacuum mechanism 3 includes a vacuum source 31 and a connecting pipeline 32 . The vacuum source 31 is, for example, a vacuum pump, but not limited thereto. The connection pipeline 32 is connected between the vacuum source 31 and the plurality of air holes 255 . When the vacuum source 31 is running, it will pump air through the connecting pipeline 32 and the air hole 255 to the long groove 254, so that the long groove 254, the central groove 251, the inner ring groove 252 and the outer ring groove 253 generate suction to absorb the substrate 1 and the elastic Sealing ring 4.

彈性密封環4是由可變形的彈性材質製成。前述彈性材質例如可為橡膠或矽膠等彈性材質。彈性密封環4包括一定位環體41及一可動環體42。定位環體41容置於定位環槽23內,並可透過如緊配合方式或是黏膠黏固方式定位於定位環槽23,使得定位環體41環繞於盤體24的圍繞面242。定位環體41與定位環槽23之間的定位方式不以前述方式為限,也可透過其他定位方式來達成。定位環體41具有一環頂面411及一內周面412。The elastic sealing ring 4 is made of deformable elastic material. The elastic material mentioned above can be elastic material such as rubber or silicon rubber, for example. The elastic sealing ring 4 includes a positioning ring body 41 and a movable ring body 42 . The positioning ring body 41 is accommodated in the positioning ring groove 23 , and can be positioned in the positioning ring groove 23 by means of tight fit or adhesive bonding, so that the positioning ring body 41 surrounds the surrounding surface 242 of the disc body 24 . The positioning method between the positioning ring body 41 and the positioning ring groove 23 is not limited to the aforementioned method, and can also be achieved through other positioning methods. The positioning ring 41 has a ring top surface 411 and an inner peripheral surface 412 .

可動環體42由定位環體41的環頂面411鄰近內周面412處一體地朝上並朝遠離圍繞面242方向傾斜延伸,可動環體42環繞於盤體24的承載頂面241及圍繞面242,以及吸氣流道25的外環溝槽253。可動環體42具有一內環面421及一頂端422,內環面421面向吸氣流道25的外環溝槽253。可動環體42能相對於定位環體41彎折變形以在一初始位置(如圖4放大區塊所示)及一貼附位置(如圖8的放大區塊所示)之間樞轉。在初始位置時,可動環體42呈傾斜狀,內環面421與圍繞面242及外環溝槽253相間隔,且頂端422高度高於外環溝槽253高度。在貼附位置時,可動環體42呈直立狀,內環面421緊密貼附於圍繞面242且封閉外環溝槽253外側。藉由可動環體42的內環面421面向外環溝槽253並與外環溝槽253位置對應,使得可動環體42能被外環溝槽253吸附而由初始位置樞轉至貼附位置。The movable ring body 42 integrally extends upward from the ring top surface 411 of the positioning ring body 41 adjacent to the inner peripheral surface 412 and extends obliquely away from the surrounding surface 242. The movable ring body 42 surrounds the bearing top surface 241 of the disc body 24 and surrounds surface 242, and the outer ring groove 253 of the suction channel 25. The movable ring body 42 has an inner ring surface 421 and a top end 422 , and the inner ring surface 421 faces the outer ring groove 253 of the suction channel 25 . The movable ring 42 can be bent and deformed relative to the positioning ring 41 to pivot between an initial position (shown in the enlarged block of FIG. 4 ) and an attaching position (shown in the enlarged block of FIG. 8 ). At the initial position, the movable ring body 42 is inclined, the inner ring surface 421 is spaced apart from the surrounding surface 242 and the outer ring groove 253 , and the height of the top end 422 is higher than that of the outer ring groove 253 . In the attaching position, the movable ring body 42 is in an upright shape, and the inner ring surface 421 is closely attached to the surrounding surface 242 and closes the outside of the outer ring groove 253 . With the inner ring surface 421 of the movable ring body 42 facing the outer ring groove 253 and corresponding to the position of the outer ring groove 253, the movable ring body 42 can be absorbed by the outer ring groove 253 and pivot from the initial position to the attaching position .

壓制機構5包括一承載環51,及一壓制件52。承載環51與一移載機構(圖未示)連接並形成有一朝向下方用以供壓制件52容置的定位環槽511。本第一實施例的壓制件52是一呈環形狀的壓制條,例如為一O形環。壓制件52是由彈性材質所製成,例如可為聚醚醚酮(PEEK)或橡膠等彈性材質。壓制件52容置於定位環槽511且部分凸伸出承載環51底端,用以壓制基板1的頂面12鄰近於外周緣13的部位。壓制件52可透過如緊配合方式或是黏膠黏固方式定位於定位環槽511。壓制件52與定位環槽511之間的定位方式不以前述方式為限,也可透過其他定位方式來達成。The pressing mechanism 5 includes a bearing ring 51 and a pressing part 52 . The bearing ring 51 is connected with a transfer mechanism (not shown in the figure) and forms a positioning ring groove 511 facing downward for accommodating the pressed part 52 . The pressing part 52 of the first embodiment is a ring-shaped pressing strip, such as an O-ring. The pressed part 52 is made of elastic material, such as polyetheretherketone (PEEK) or rubber. The pressing part 52 is accommodated in the positioning ring groove 511 and partially protrudes from the bottom of the bearing ring 51 for pressing the top surface 12 of the substrate 1 adjacent to the outer peripheral edge 13 . The pressed part 52 can be positioned in the positioning ring groove 511 through a tight fit method or an adhesive bonding method. The positioning method between the pressing part 52 and the positioning ring groove 511 is not limited to the aforementioned method, and can also be achieved by other positioning methods.

移載機構用以驅動壓制機構5移動至一待壓制位置(如圖4所示)或移離待壓制位置。當壓制機構5在待壓制位置時,壓制件52位於載台2上方並且對齊於盤體24的承載頂面241及圍繞面242,且壓制件52能對齊於基板1的頂面12鄰近外周緣13的部位。移載機構還用以驅動壓制機構5在待壓制位置及一壓制位置(如圖6所示)之間升降移動。當壓制機構5在壓制位置時,壓制件52向下壓制基板1的頂面12鄰近外周緣13的部位以使基板1的外周緣13靠近載台2的承載頂面241。The transfer mechanism is used to drive the pressing mechanism 5 to move to a position to be pressed (as shown in FIG. 4 ) or to move away from the position to be pressed. When the pressing mechanism 5 is in the position to be pressed, the pressing part 52 is located above the stage 2 and aligned on the carrying top surface 241 and the surrounding surface 242 of the disc body 24, and the pressing part 52 can be aligned on the top surface 12 of the substrate 1 adjacent to the outer peripheral edge 13 parts. The transfer mechanism is also used to drive the pressing mechanism 5 to move up and down between the position to be pressed and a pressing position (as shown in FIG. 6 ). When the pressing mechanism 5 is in the pressing position, the pressing member 52 presses down the top surface 12 of the substrate 1 adjacent to the peripheral edge 13 so that the peripheral edge 13 of the substrate 1 is close to the loading top surface 241 of the stage 2 .

以下針對整平裝置200使用本案第一實施例的整平方法來運作的方式進行詳細說明:The following is a detailed description of how the leveling device 200 operates using the leveling method of the first embodiment of the present case:

圖5是本第一實施例的整平方法的一整平步驟流程圖,包含下述步驟:步驟S1:放置基板於載台、步驟S2:驅動壓制件壓制基板、步驟S3:驅動載台吸附彈性密封環,及步驟S4:透過載台對氣密室抽氣。5 is a flow chart of the leveling steps of the leveling method of the first embodiment, which includes the following steps: Step S1: placing the substrate on the carrier, step S2: driving the pressing part to press the substrate, step S3: driving the carrier to absorb The elastic sealing ring, and step S4: pumping air through the carrier to the airtight chamber.

參閱圖4及圖5,在步驟S1中,透過一取放裝置(圖未示)移載基板1並將基板1放置於盤體24的承載頂面241,使基板1的底面11局部接觸承載頂面241。Referring to FIG. 4 and FIG. 5, in step S1, the substrate 1 is transferred through a pick-and-place device (not shown) and placed on the carrier top surface 241 of the tray 24, so that the bottom surface 11 of the substrate 1 partially contacts the carrier. Top surface 241 .

參閱圖4、圖5及圖6,在步驟S2中,移載機構會先驅動壓制機構5移動至圖4所示的待壓制位置,使壓制件52對齊於基板1的頂面12鄰近外周緣13處。隨後,移載機構驅動壓制機構5由待壓制位置沿一下壓方向D向下移動,當壓制件52接觸到基板1的頂面12並將頂面12下壓時,壓制件52施加於頂面12的下壓力使底面11接觸承載頂面241的部位逐漸增加,以及外周緣13逐漸靠近承載頂面241。當壓制機構5下降到圖6所示的壓制位置時,移載機構即停止驅動壓制機構5下移。此時,壓制件52向下壓制基板1的頂面12鄰近外周緣13的部位,並使外周緣13與承載頂面241之間相間隔一距離d。於本第一實施例中,距離d的數值是例如介於1mm至2mm之間的任一數值,於其他實施例中,距離d的數值可依實際需求變更。Referring to FIG. 4, FIG. 5 and FIG. 6, in step S2, the transfer mechanism will first drive the pressing mechanism 5 to move to the position to be pressed as shown in FIG. 13 places. Subsequently, the transfer mechanism drives the pressing mechanism 5 to move downward from the position to be pressed along the pressing direction D. When the pressing piece 52 contacts the top surface 12 of the substrate 1 and presses down the top surface 12, the pressing piece 52 is applied to the top surface. The downward force of 12 gradually increases the portion where the bottom surface 11 contacts the bearing top surface 241 , and the outer peripheral edge 13 gradually approaches the bearing top surface 241 . When the pressing mechanism 5 descends to the pressing position shown in FIG. 6 , the transfer mechanism stops driving the pressing mechanism 5 to move down. At this time, the pressing part 52 presses down the portion of the top surface 12 of the substrate 1 adjacent to the outer peripheral edge 13 , and makes a distance d between the outer peripheral edge 13 and the supporting top surface 241 . In the first embodiment, the value of the distance d is, for example, any value between 1 mm and 2 mm. In other embodiments, the value of the distance d can be changed according to actual requirements.

參閱圖6及圖7,藉由壓制件52在前述下壓基板1的過程中使底面11接觸承載頂面241的部位逐漸增加以及外周緣13逐漸靠近承載頂面241,能起到初步整平基板1的功效,以降低基板1的翹曲程度及外周緣13高度。藉此,使得位在初始位置的可動環體42的內環面421能環繞基板1的外周緣13並與外周緣13相間隔,以及頂端422的高度能高於外周緣13高度。此外,壓制機構5下降到壓制位置時,壓制件52不直接壓平基板1而是使外周緣13與承載頂面241之間相間隔距離d,藉此,能避免壓制件52將基板1壓平時的下壓力道過大造成底面11撞擊摩擦承載頂面241進而產生受損的情形。Referring to Fig. 6 and Fig. 7, during the process of pressing down the substrate 1, the portion where the bottom surface 11 contacts the top surface 241 gradually increases and the outer peripheral edge 13 gradually approaches the top surface 241, thereby achieving preliminary leveling. The effect of the substrate 1 is to reduce the degree of warpage of the substrate 1 and the height of the outer peripheral edge 13 . Thereby, the inner ring surface 421 of the movable ring body 42 at the initial position can surround the outer peripheral edge 13 of the substrate 1 and be spaced apart from the outer peripheral edge 13 , and the height of the top end 422 can be higher than that of the outer peripheral edge 13 . In addition, when the pressing mechanism 5 descends to the pressing position, the pressing part 52 does not directly flatten the substrate 1 but keeps the distance d between the outer peripheral edge 13 and the carrying top surface 241, thereby preventing the pressing part 52 from pressing the substrate 1 Usually, the excessive downforce path causes the bottom surface 11 to collide with the friction-bearing top surface 241 to cause damage.

參閱圖5、圖8及圖9,在步驟S3中,驅動真空機構3的真空源31運轉,真空源31運轉時會透過連接管路32及氣孔255對長溝槽254抽氣,使得長溝槽254、中心槽251、內環溝槽252及外環溝槽253產生吸力。其中,長溝槽254、中心槽251、內環溝槽252及外環溝槽253所產生的由上朝下的縱向吸力會吸附基板1的底面11,而外環溝槽253所產生的由外朝內的徑向吸力(如圖9所示的箭頭方向)則會吸附彈性密封環4的可動環體42,以帶動可動環體42相對於定位環體41朝內彎折變形並樞轉至圖8所示的貼附位置。同時,可動環體42因相對於定位環體41彎折變形而蓄積復位彈力。Referring to Fig. 5, Fig. 8 and Fig. 9, in step S3, the vacuum source 31 of the vacuum mechanism 3 is driven to operate. When the vacuum source 31 operates, the long groove 254 will be pumped through the connecting pipeline 32 and the air hole 255, so that the long groove 254 , the central groove 251 , the inner ring groove 252 and the outer ring groove 253 generate suction. Wherein, the upward and downward vertical suction force produced by the long groove 254, the central groove 251, the inner ring groove 252 and the outer ring groove 253 will adsorb the bottom surface 11 of the substrate 1, while the outer ring groove 253 is produced by the outer ring groove 253. The inward radial suction force (the direction of the arrow shown in FIG. 9 ) will absorb the movable ring body 42 of the elastic sealing ring 4, so as to drive the movable ring body 42 to bend and deform inwardly relative to the positioning ring body 41 and pivot to Attachment locations shown in Figure 8. At the same time, the movable ring body 42 is bent and deformed relative to the positioning ring body 41 to accumulate restoring elastic force.

由於可動環體42在初始位置時,頂端422高度高於外環溝槽253高度以及外周緣13高度,因此,能確保可動環體42樞轉至貼附位置時,內環面421同時緊密地貼附於盤體24的圍繞面242及基板1的外周緣13,並且密封外環溝槽253外側。藉此,使得彈性密封環4的可動環體42、載台2的盤體24以及基板1之間形成一呈氣密狀態的氣密室6,從而能防止外部環境的空氣被吸入氣密室6內以及氣密室6內的空氣向外洩漏。Since the height of the top end 422 of the movable ring body 42 is higher than the height of the outer ring groove 253 and the height of the outer peripheral edge 13 when the movable ring body 42 is in the initial position, it can be ensured that when the movable ring body 42 pivots to the attachment position, the inner ring surface 421 is simultaneously tightly It is attached to the surrounding surface 242 of the disc body 24 and the outer peripheral edge 13 of the substrate 1 , and seals the outside of the outer ring groove 253 . Thereby, an airtight airtight chamber 6 is formed between the movable ring body 42 of the elastic sealing ring 4, the disk body 24 of the stage 2, and the substrate 1, thereby preventing air from the external environment from being sucked into the airtight chamber 6 And the air in the airtight chamber 6 leaks outwards.

藉由可動環體42由定位環體41的環頂面411鄰近內周面412處朝上並朝遠離圍繞面242方向傾斜延伸的設計方式,使得可動環體42被外環溝槽253所產生的徑向吸力吸附時是由下朝上地依序貼附於圍繞面242、密封外環溝槽253外側以及貼附於外周緣13。藉此,能增進內環面421貼附於圍繞面242及外周緣13的服貼性,使內環面421能緊密地貼附於圍繞面242及外周緣13而增進密封外環溝槽253的效果。The movable ring body 42 is designed to extend upward from the ring top surface 411 of the positioning ring body 41 adjacent to the inner peripheral surface 412 and obliquely extend away from the surrounding surface 242, so that the movable ring body 42 is formed by the outer ring groove 253 When adsorbed by the radial suction force, it is attached to the surrounding surface 242, the outside of the sealing outer ring groove 253, and the outer peripheral edge 13 sequentially from bottom to top. In this way, the compliance of the inner ring surface 421 attached to the surrounding surface 242 and the outer peripheral edge 13 can be improved, so that the inner ring surface 421 can be closely attached to the surrounding surface 242 and the outer peripheral edge 13 to improve the sealing of the outer ring groove 253 Effect.

藉由可動環體42以內環面421面向外環溝槽253並供外環溝槽253所產生的徑向吸力吸附的方式,使得可動環體42能受吸力吸附的受力面積大。由於外環溝槽253呈圓環形,因此,外環溝槽253所產生的徑向吸力能施力均勻地吸附可動環體42的內環面421。藉由前述設計方式,使得可動環體42被外環溝槽253所產生的徑向吸力吸附時能順暢且迅速地相對於定位環體41彎折變形而由初始位置樞轉至貼附位置。By making the inner ring surface 421 of the movable ring body 42 face the outer ring groove 253 and being absorbed by the radial suction force generated by the outer ring groove 253 , the force bearing area of the movable ring body 42 that can be absorbed by the suction force is large. Since the outer ring groove 253 has a circular shape, the radial suction force generated by the outer ring groove 253 can apply force to evenly absorb the inner ring surface 421 of the movable ring body 42 . With the aforementioned design, the movable ring body 42 can be smoothly and quickly bent and deformed relative to the positioning ring body 41 to pivot from the initial position to the attaching position when attracted by the radial suction force generated by the outer ring groove 253 .

參閱圖5、圖9及圖10,在步驟S4中,藉由真空源31的持續運轉,吸氣流道25會透過中心槽251、內環溝槽252、外環溝槽253及長溝槽254對氣密室6抽氣,以使氣密室6成真空狀態。藉由中心槽251、內環溝槽252、外環溝槽253及長溝槽254透過真空吸附方式吸附基板1的底面11,能將基板1鄰近外周緣13處的翹曲部位往下拉使外周緣13沿著內環面421下移,以起到進一步整平基板1的功效。藉此,能將翹曲的基板1整平並使底面11完整地平貼在承載頂面241,以及能使整平後的基板1穩固地定位於承載頂面241。Referring to Fig. 5, Fig. 9 and Fig. 10, in step S4, by the continuous operation of the vacuum source 31, the suction channel 25 will pass through the central groove 251, the inner ring groove 252, the outer ring groove 253 and the long groove 254 The airtight chamber 6 is evacuated so that the airtight chamber 6 becomes a vacuum state. By means of the central groove 251, the inner ring groove 252, the outer ring groove 253, and the long groove 254, the bottom surface 11 of the substrate 1 is adsorbed by means of vacuum adsorption, so that the warped part near the outer peripheral edge 13 of the substrate 1 can be pulled down to make the outer peripheral edge 13 moves down along the inner ring surface 421 to further level the substrate 1 . In this way, the warped substrate 1 can be leveled and the bottom surface 11 can be completely attached to the top surface 241 , and the flattened substrate 1 can be firmly positioned on the top surface 241 .

基板1被整平後,移載機構會先驅動壓制機構5上升並回復至待壓制位置,隨後再驅動壓制機構5移離待壓制位置,使壓制機構5不會遮蔽住基板1。接著,便能透過一檢測裝置(圖未示)對整平後的基板1進行檢測。由於檢測裝置所拍攝的是穩固地定位於承載頂面241且被整平後的基板1影像,因此,能有效提升檢測裝置的檢測精準度。After the substrate 1 is leveled, the transfer mechanism will firstly drive the pressing mechanism 5 to rise and return to the position to be pressed, and then drive the pressing mechanism 5 to move away from the position to be pressed, so that the pressing mechanism 5 will not cover the substrate 1 . Then, the flattened substrate 1 can be detected by a detection device (not shown in the figure). Since what the detection device captures is the image of the substrate 1 firmly positioned on the carrying top surface 241 and leveled, the detection accuracy of the detection device can be effectively improved.

當檢測裝置檢測完成時,真空源31停止運轉以解除中心槽251、內環溝槽252、外環溝槽253及長溝槽254的真空吸附狀態。此時,彈性密封環4的可動環體42藉由蓄積的復位彈力自動回彈並復位至圖4所示的初始位置。When the detection by the detection device is completed, the vacuum source 31 stops to release the vacuum adsorption state of the central groove 251 , the inner ring groove 252 , the outer ring groove 253 and the long groove 254 . At this time, the movable ring body 42 of the elastic sealing ring 4 automatically rebounds and resets to the initial position shown in FIG. 4 by the accumulated reset elastic force.

藉由彈性密封環4以一體成型的製造方式成型出定位環體41及可動環體42,使得可動環體42受吸力吸附時能蓄積復位彈力,而不受吸力吸附時能藉由蓄積的復位彈力自動回彈復位。藉此,可動環體42不需額外透過如彈簧等構件的輔助便能達到自動復位的功效。The positioning ring body 41 and the movable ring body 42 are molded by the elastic sealing ring 4 in a one-piece manufacturing method, so that the movable ring body 42 can accumulate reset elastic force when it is absorbed by suction, and can be reset by the accumulation when it is not absorbed by suction. Elastic automatic rebound reset. In this way, the movable ring body 42 can achieve the effect of automatic reset without the assistance of additional components such as springs.

參閱圖11及圖12,本發明整平裝置200的第二實施例,其整體結構大致與第一實施例相同,不同處在於壓制機構5的壓制件52'結構。Referring to FIG. 11 and FIG. 12 , the overall structure of the second embodiment of the leveling device 200 of the present invention is substantially the same as that of the first embodiment, except for the structure of the pressing part 52 ′ of the pressing mechanism 5 .

在本第二實施例中,壓制件52'包括多個等角度相間隔地排列成環形狀且容置於定位環槽511內的壓制條521。每一個壓制條521呈弧條狀用以壓制於基板1的頂面12鄰近於外周緣13的部位。藉此,同樣能達到壓制基板1以初步整平基板1的功效。In the second embodiment, the pressing part 52 ′ includes a plurality of pressing strips 521 arranged in a ring shape at equiangular intervals and accommodated in the positioning ring groove 511 . Each pressing bar 521 is in the shape of an arc and is used for pressing on the portion of the top surface 12 of the substrate 1 adjacent to the outer peripheral edge 13 . In this way, the effect of pressing the substrate 1 to initially level the substrate 1 can also be achieved.

綜上所述,各實施例的整平裝置200,藉由壓制件52、52'下壓基板1,能起到初步整平基板1的功效以降低基板1的翹曲程度及外周緣13高度。藉由壓制件52、52'不直接壓平基板1而是使外周緣13與承載頂面241之間相間隔距離d,藉此,能避免壓制件52在下壓基板1的過程中造成基板1受損。藉由壓制件52、52'、載台2、真空機構3及彈性密封環4相互配合,能起到進一步整平基板1的功效,使基板1能平貼並穩固地定位於承載頂面241,故確實能達成本發明之目的。To sum up, the leveling device 200 of each embodiment can initially level the substrate 1 by pressing down the substrate 1 through the pressing parts 52 and 52 ′, so as to reduce the degree of warping of the substrate 1 and the height of the outer peripheral edge 13 . The pressing parts 52, 52' do not directly flatten the substrate 1 but keep the distance d between the outer peripheral edge 13 and the carrying top surface 241, thereby preventing the pressing part 52 from causing damage to the substrate 1 in the process of pressing down on the substrate 1. damaged. By cooperating with the pressing parts 52, 52', the stage 2, the vacuum mechanism 3 and the elastic sealing ring 4, the effect of further leveling the substrate 1 can be achieved, so that the substrate 1 can be flattened and firmly positioned on the carrier top surface 241 , so the purpose of the present invention can really be achieved.

惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。But what is described above is only an embodiment of the present invention, and should not limit the scope of the present invention. All simple equivalent changes and modifications made according to the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of the present invention.

1:基板1: Substrate

11:底面11: bottom surface

12:頂面12: top surface

13:外周緣13: Outer periphery

14:凹部14: Concave

200:整平裝置200: leveling device

2:載台2: carrier

21:下表面21: lower surface

22:上表面22: Upper surface

23:定位環槽23: positioning ring groove

24:盤體24: Disk body

241:承載頂面241: Load top surface

242:圍繞面242: around the surface

25:吸氣流道25: Inhalation channel

251:中心槽251: Center slot

252:內環溝槽252: Inner ring groove

253:外環溝槽253: Outer ring groove

254:長溝槽254: long groove

255:氣孔255: stomata

3:真空機構3: Vacuum mechanism

31:真空源31: Vacuum source

32:連接管路32: Connect the pipeline

4:彈性密封環4: Elastic sealing ring

41:定位環體41: positioning ring body

411:環頂面411: ring top surface

412:內周面412: inner peripheral surface

42:可動環體42: Movable ring body

421:內環面421: inner ring surface

422:頂端422: top

5:壓制機構5: Press mechanism

51:承載環51: Bearing ring

511:定位環槽511: positioning ring groove

52、52':壓制件52, 52': pressed parts

521:壓制條521: pressed bar

6:氣密室6: Airlock

d:距離d: distance

D:下壓方向D: Down direction

S1~S4:整平步驟S1~S4: Leveling steps

本發明之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是本發明整平裝置的第一實施例與一基板的一立體分解圖; 圖2是第一實施例的一立體分解圖; 圖3是第一實施例由另一視角觀看的一立體分解圖; 圖4是第一實施例與基板的一不完整剖視圖; 圖5是第一實施例的整平方法的一整平步驟流程圖; 圖6是第一實施例與基板的一不完整剖視圖; 圖7是第一實施例與基板的一不完整俯視圖; 圖8是第一實施例與基板的一不完整剖視圖; 圖9是第一實施例與基板的一不完整俯視圖; 圖10是第一實施例與基板的一不完整剖視圖; 圖11是本發明整平裝置的第二實施例的一壓制機構的一立體分解圖;及 圖12是第二實施例與基板的一剖視圖。 Other features and effects of the present invention will be clearly presented in the implementation manner with reference to the drawings, wherein: Fig. 1 is a three-dimensional exploded view of the first embodiment of the leveling device of the present invention and a base plate; Fig. 2 is a three-dimensional exploded view of the first embodiment; Fig. 3 is a three-dimensional exploded view of the first embodiment viewed from another perspective; Fig. 4 is an incomplete sectional view of the first embodiment and the substrate; Fig. 5 is a flow chart of a leveling step of the leveling method of the first embodiment; Fig. 6 is an incomplete sectional view of the first embodiment and the substrate; Fig. 7 is an incomplete top view of the first embodiment and the substrate; Fig. 8 is an incomplete sectional view of the first embodiment and the substrate; Fig. 9 is an incomplete top view of the first embodiment and the substrate; Fig. 10 is an incomplete sectional view of the first embodiment and the substrate; Fig. 11 is a three-dimensional exploded view of a pressing mechanism of the second embodiment of the leveling device of the present invention; and FIG. 12 is a cross-sectional view of the second embodiment and the substrate.

1:基板 1: Substrate

11:底面 11: bottom surface

12:頂面 12: top surface

13:外周緣 13: Outer periphery

14:凹部 14: Concave

200:整平裝置 200: leveling device

2:載台 2: carrier

25:吸氣流道 25: Inhalation channel

253:外環溝槽 253: Outer ring groove

254:長溝槽 254: long groove

4:彈性密封環 4: Elastic sealing ring

42:可動環體 42: Movable ring body

5:壓制機構 5: Press mechanism

51:承載環 51: Bearing ring

Claims (18)

一種整平裝置,適於整平一基板,該整平裝置包含: 一載台,用以承載並吸附該基板; 一壓制件,設置於該載台上方,用以向下壓制該基板,以使該基板的一外周緣靠近該載台;及 一彈性密封環,設置於該載台並能被該載台吸附,當該壓制件壓制該基板且該彈性密封環被該載台吸附時,該彈性密封環緊密貼附於該載台及該基板的該外周緣,以使該彈性密封環、該載台及該基板之間形成一氣密室,該氣密室進而被該載台抽氣而形成真空狀態以吸附該基板,使該基板完整地平貼於該載台。 A leveling device suitable for leveling a substrate, the leveling device comprising: a stage for carrying and absorbing the substrate; a pressing part, arranged above the stage, for pressing down the substrate so that an outer peripheral edge of the substrate is close to the stage; and An elastic sealing ring is arranged on the carrier and can be absorbed by the carrier. When the pressed part presses the substrate and the elastic sealing ring is absorbed by the carrier, the elastic sealing ring is closely attached to the carrier and the carrier. The outer peripheral edge of the substrate, so that an airtight chamber is formed between the elastic sealing ring, the stage and the substrate, and the airtight chamber is then evacuated by the stage to form a vacuum state to absorb the substrate, so that the substrate is completely flat on the platform. 如請求項1所述的整平裝置,其中,該載台具有一圍繞面,該載台並界定出一呈圓環形且緊鄰該圍繞面的外環溝槽,該彈性密封環具有一環繞該圍繞面與該外環溝槽的可動環體,當該壓制件壓制該基板時,該可動環體環繞該基板的該外周緣,當該彈性密封環被該載台吸附時,該可動環體緊密貼附該圍繞面與該外周緣。The leveling device as described in claim 1, wherein the platform has a surrounding surface, and the platform defines an annular outer ring groove adjacent to the surrounding surface, and the elastic sealing ring has a surrounding surface The movable ring body surrounding the surface and the outer ring groove, when the pressing part presses the substrate, the movable ring body surrounds the outer peripheral edge of the substrate, and when the elastic sealing ring is absorbed by the carrier, the movable ring The body is closely attached to the surrounding surface and the outer peripheral edge. 如請求項2所述的整平裝置,其中,該可動環體在一初始位置及一貼附位置之間樞轉,當該可動環體在該初始位置時,該可動環體與該圍繞面、該外環溝槽及該外周緣相間隔,當該可動環體被該外環溝槽吸附而由該初始位置樞轉至該貼附位置時,該可動環體緊密貼附於該圍繞面及該外周緣且密封該外環溝槽。The leveling device according to claim 2, wherein the movable ring pivots between an initial position and an attached position, and when the movable ring is at the initial position, the movable ring and the surrounding surface , the outer ring groove and the outer peripheral edge are spaced apart, when the movable ring body is absorbed by the outer ring groove and pivoted from the initial position to the attaching position, the movable ring body is closely attached to the surrounding surface and the outer peripheral edge and seal the outer ring groove. 如請求項3所述的整平裝置,其中,該彈性密封環還具有一設置於該載台的定位環體,該定位環體具有一環頂面及一內周面,該可動環體由該環頂面鄰近該內周面處一體地朝上並朝遠離該載台的該圍繞面方向傾斜延伸,該可動環體能相對於該定位環體彎折變形以在該初始位置及該貼附位置之間樞轉。The leveling device according to claim 3, wherein the elastic sealing ring also has a positioning ring body arranged on the platform, the positioning ring body has a ring top surface and an inner peripheral surface, and the movable ring body is formed by the The top surface of the ring adjacent to the inner peripheral surface integrally faces upwards and extends obliquely away from the surrounding surface of the carrier. The movable ring body can be bent and deformed relative to the positioning ring body so as to be in the initial position and the attached position. pivot between. 如請求項4所述的整平裝置,其中,該可動環體具有一頂端,當該可動環體在該初始位置時,該頂端高度高於該外環溝槽以及該外周緣的高度。The leveling device as claimed in claim 4, wherein the movable ring body has a top end, and when the movable ring body is at the initial position, the height of the top end is higher than the height of the outer ring groove and the outer peripheral edge. 如請求項2至5其中任一項所述的整平裝置,其中,該可動環體具有一面向該外環溝槽並能被該外環溝槽吸附的內環面,該內環面用以緊密地貼附於該載台的該圍繞面與該基板的該外周緣,進而密封該外環溝槽。The leveling device according to any one of claims 2 to 5, wherein the movable ring body has an inner ring surface facing the outer ring groove and capable of being absorbed by the outer ring groove, and the inner ring surface is used for The outer ring groove is tightly attached to the surrounding surface of the stage and the outer peripheral edge of the substrate. 如請求項1所述的整平裝置,其中,該載台界定一呈圓環形並用以吸附該彈性密封環的外環溝槽,該彈性密封環具有一面向該外環溝槽並能被該外環溝槽吸附的內環面,該內環面用以緊密地貼附於該載台與該基板的該外周緣,進而密封該外環溝槽。The leveling device as claimed in claim 1, wherein the platform defines an outer ring groove that is circular and is used to absorb the elastic sealing ring, and the elastic sealing ring has a groove facing the outer ring and can be The outer ring groove is adsorbed by the inner ring surface, and the inner ring surface is used to closely adhere to the carrier and the outer peripheral edge of the substrate, thereby sealing the outer ring groove. 如請求項1所述的整平裝置,其中,該載台具有一用以承載該基板的承載頂面,在該壓制件壓制該基板時,該基板的該外周緣與該承載頂面之間相間隔一距離。The flattening device as claimed in claim 1, wherein the stage has a top surface for carrying the substrate, and when the pressed part presses the substrate, there is a gap between the outer peripheral edge of the substrate and the top surface separated by a distance. 如請求項8所述的整平裝置,其中,該距離介於1mm至2mm之間。The leveling device as claimed in claim 8, wherein the distance is between 1mm and 2mm. 如請求項1所述的整平裝置,其中,該壓制件包括一呈環形狀的壓制條,用以壓制該基板。The flattening device as claimed in claim 1, wherein the pressing piece comprises a ring-shaped pressing bar for pressing the substrate. 如請求項1所述的整平裝置,其中,該壓制件包括多個壓制條,該等壓制條以等角度、相間隔地排列成環形狀,並用以壓制該基板。The flattening device as claimed in claim 1, wherein the pressed piece comprises a plurality of pressed strips, and the pressed strips are arranged at equal angles and spaced apart in a ring shape, and are used to press the substrate. 一種整平方法,適於整平一基板,該整平方法包含以下步驟: 放置該基板於一載台上; 驅動一壓制件向下壓制該基板,以使該基板的一外周緣靠近該載台並且被一彈性密封環環繞; 驅動該載台吸附該彈性密封環,使該彈性密封環緊密貼附於該載台及該外周緣,進而使該彈性密封環、該載台及該基板之間形成一氣密室;及 透過該載台對該氣密室抽氣以使該氣密室形成真空狀態,進而該基板被吸附而完整地平貼於該載台。 A leveling method suitable for leveling a substrate, the leveling method comprising the following steps: placing the substrate on a stage; driving a pressing member to press down the substrate so that an outer peripheral edge of the substrate is close to the stage and surrounded by an elastic sealing ring; driving the stage to absorb the elastic sealing ring, so that the elastic sealing ring is closely attached to the stage and the outer peripheral edge, so that an airtight chamber is formed between the elastic sealing ring, the stage and the substrate; and The airtight chamber is evacuated through the stage to form a vacuum state in the airtight chamber, and then the substrate is sucked and flatly attached to the stage completely. 如請求項12所述的整平方法,其中,該彈性密封環透過一可動環體環繞於該載台的一圍繞面,該載台透過一緊鄰該圍繞面並呈圓環形的外環溝槽吸附該可動環體的一內環面,使該內環面緊密地貼附於該圍繞面及該外周緣,且密封該外環溝槽。The leveling method according to claim 12, wherein the elastic sealing ring surrounds a surrounding surface of the carrier through a movable ring body, and the carrier passes through a circular outer ring groove adjacent to the surrounding surface The groove absorbs an inner ring surface of the movable ring body, so that the inner ring surface is closely attached to the surrounding surface and the outer peripheral edge, and seals the outer ring groove. 如請求項13所述的整平方法,其中,該彈性密封環透過一定位環體設置於該載台,該定位環體具有一環頂面及一內周面,該可動環體由該環頂面鄰近該內周面處一體地朝上並朝遠離該載台的該圍繞面方向傾斜延伸,該可動環體能相對於該定位環體彎折變形以在一初始位置及一貼附位置之間樞轉。The leveling method according to claim 13, wherein the elastic sealing ring is arranged on the platform through a positioning ring body, the positioning ring body has a ring top surface and an inner peripheral surface, and the movable ring body is formed by the ring top The surface adjacent to the inner peripheral surface is integrally upward and extends obliquely away from the surrounding surface of the carrier, and the movable ring can be bent and deformed relative to the positioning ring to be between an initial position and an attached position pivot. 如請求項12所述的整平方法,其中,在該壓制件壓制該基板時,該外周緣與該載台承載該基板的一承載頂面之間相間隔一距離。The leveling method as claimed in claim 12, wherein when the pressed part presses the substrate, there is a distance between the outer peripheral edge and a carrying top surface of the stage carrying the substrate. 如請求項15所述的整平方法,其中,該距離介於1mm至2mm之間。The leveling method according to claim 15, wherein the distance is between 1mm and 2mm. 如請求項12所述的整平方法,其中,驅動該壓制件向下壓制該基板是透過該壓制件的一呈環形狀的壓制條壓制該基板。The flattening method as claimed in claim 12, wherein driving the pressing part to press down the substrate is pressing the substrate through a ring-shaped pressing bar of the pressing part. 如請求項12所述的整平方法,其中,驅動該壓制件向下壓制該基板是透過該壓制件的多個壓制條壓制該基板,該等壓制條以等角度、相間隔地排列成環形狀。The flattening method as claimed in claim 12, wherein driving the pressing part to press the substrate downward is to press the substrate through a plurality of pressing bars of the pressing part, and the pressing bars are arranged in a ring at equal angles and spaced apart shape.
TW111102015A 2022-01-18 2022-01-18 Leveling device and leveling method TWI804164B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW111102015A TWI804164B (en) 2022-01-18 2022-01-18 Leveling device and leveling method
CN202211533835.4A CN116469795A (en) 2022-01-18 2022-12-02 Leveling device and leveling method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW111102015A TWI804164B (en) 2022-01-18 2022-01-18 Leveling device and leveling method

Publications (2)

Publication Number Publication Date
TWI804164B true TWI804164B (en) 2023-06-01
TW202331880A TW202331880A (en) 2023-08-01

Family

ID=87174099

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111102015A TWI804164B (en) 2022-01-18 2022-01-18 Leveling device and leveling method

Country Status (2)

Country Link
CN (1) CN116469795A (en)
TW (1) TWI804164B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170062246A1 (en) * 2015-09-02 2017-03-02 E&R Engineering Corp. Wafer leveling device
TW201917383A (en) * 2017-10-23 2019-05-01 由田新技股份有限公司 A semiconductor wafer leveling device and method thereof
TW202137391A (en) * 2020-03-27 2021-10-01 由田新技股份有限公司 A semiconductor wafer leveling device and leveling method thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170062246A1 (en) * 2015-09-02 2017-03-02 E&R Engineering Corp. Wafer leveling device
TW201917383A (en) * 2017-10-23 2019-05-01 由田新技股份有限公司 A semiconductor wafer leveling device and method thereof
TW202137391A (en) * 2020-03-27 2021-10-01 由田新技股份有限公司 A semiconductor wafer leveling device and leveling method thereof

Also Published As

Publication number Publication date
TW202331880A (en) 2023-08-01
CN116469795A (en) 2023-07-21

Similar Documents

Publication Publication Date Title
CN108074856B (en) Single substrate processing apparatus
JP4468893B2 (en) Vacuum suction head
JP3312163B2 (en) Vacuum suction device
TWI566325B (en) A substrate holding device and a close contact exposure device and a proximity exposure device
JP6978840B2 (en) Board processing equipment and board holding equipment
KR20040086365A (en) Substrate sucking device
CN108666251B (en) Silicon wafer adsorption device, silicon wafer conveying device, silicon wafer transmission system and silicon wafer transmission method
TWI804164B (en) Leveling device and leveling method
CN107452648B (en) Die pick-up method
KR100718017B1 (en) Vacuum Chuck
JP6376871B2 (en) Contact exposure system
KR20100118558A (en) Sticking method and sticking device of sticking material
JPH03270048A (en) Vacuum chuck
JP2004055833A (en) Device for absorbing thin-plate like member
JPH08229866A (en) Suction pad
JP2017220483A (en) Vacuum chuck and manufacturing method of vacuum chuck
KR102556329B1 (en) Vacuum chuck supporting semiconductor substrate
TWI790725B (en) Apparatus and method for substrate handling
CN211614566U (en) Vacuum adsorption disc
TWI552262B (en) Bearing device
CN210732492U (en) Adsorption device and assembly robot with same
JP3164629B2 (en) Vacuum chuck stage for semiconductor wafer
CN107180783B (en) Bearing disc assembly and mechanical arm with same
CN213752671U (en) Bearing device and semiconductor processing equipment
JP4173170B2 (en) Collet for film mounting and film mounting method