TWI795528B - Processing device - Google Patents

Processing device Download PDF

Info

Publication number
TWI795528B
TWI795528B TW108105366A TW108105366A TWI795528B TW I795528 B TWI795528 B TW I795528B TW 108105366 A TW108105366 A TW 108105366A TW 108105366 A TW108105366 A TW 108105366A TW I795528 B TWI795528 B TW I795528B
Authority
TW
Taiwan
Prior art keywords
processing
cutting
line
movable
pair
Prior art date
Application number
TW108105366A
Other languages
Chinese (zh)
Other versions
TW201935550A (en
Inventor
宮田諭
Original Assignee
日商迪思科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商迪思科股份有限公司 filed Critical 日商迪思科股份有限公司
Publication of TW201935550A publication Critical patent/TW201935550A/en
Application granted granted Critical
Publication of TWI795528B publication Critical patent/TWI795528B/en

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/2409Arrangements for indirect observation of the working space using image recording means, e.g. a camera
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23BTURNING; BORING
    • B23B27/00Tools for turning or boring machines; Tools of a similar kind in general; Accessories therefor
    • B23B27/06Profile cutting tools, i.e. forming-tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/2414Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves for indicating desired positions guiding the positioning of tools or workpieces
    • B23Q17/2419Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves for indicating desired positions guiding the positioning of tools or workpieces by projecting a single light beam
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Dicing (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

提供一種不會搞混切割道的偏差之修正、與包含切削溝、分割溝的加工溝的偏差之修正的加工裝置。 加工裝置(12),至少具備:保持手段(14),保持晶圓(2);及加工手段(16),在被保持於保持手段(14)之晶圓(2)的切割道(4)形成加工溝(54);及X軸饋送手段,將保持手段(14)與加工手段(16)於X軸方向相對地加工饋送;及Y軸饋送手段,將保持手段(14)與加工手段(16)於和X軸方向正交之Y軸方向相對地分度饋送;及拍攝手段(18),具有顯微鏡(36),該顯微鏡(36)拍攝被保持於保持手段(14)的晶圓(2)而具備檢測切割道(4)及加工溝(54)之基準線(L);及顯示手段(20)。在顯示手段(20),係顯示:圖像顯示部(38),顯示拍攝手段(18)拍攝到的圖像;及切割道修正按鈕(40),用來將切割道(4)與基準線(L)之偏差量予以記憶作為修正值;及加工溝修正按鈕(42),用來將加工溝(54)與基準線(L)之偏差量予以記憶作為修正值;及Y軸作動部(46),將Y軸饋送手段作動;及一對可動線(48),包夾基準線(L)而保持線對稱而接近及遠離基準線(L);及可動線作動部(50),將一對可動線(48)作動。一對可動線(48)的間隔,在當被設定成會被辨識為切割道(4)的寬幅之間隔的情形下、和在當被設定成會被辨識為加工溝(54)的寬幅之間隔的情形下,一對可動線(48)的顏色會變化。切割道修正按鈕(40)的顏色,是被設定成和當被設定成會被辨識為切割道(4)的寬幅之間隔的情形下之一對可動線(48)的顏色同色。加工溝修正按鈕(42)的顏色,是被設定成和當被設定成會被辨識為加工溝(54)的寬幅之間隔的情形下之一對可動線(48)的顏色同色。Provided is a processing device that does not confuse the correction of the deviation of the cutting line and the correction of the deviation of the processing groove including the cutting groove and the dividing groove. The processing device (12) is at least equipped with: holding means (14) for holding the wafer (2); Form processing ditch (54); And X-axis feeding means, will keep means (14) and processing means (16) in X-axis direction processing feed relatively; And Y-axis feeding means, will keep means (14) and processing means ( 16) Relatively graded feeding in the Y-axis direction orthogonal to the X-axis direction; and the photographing means (18) has a microscope (36), and the microscope (36) photographs the wafer held in the holding means (14) ( 2) It has a reference line (L) for detecting the cutting line (4) and the processing groove (54); and a display means (20). In the display means (20), it is displayed: the image display part (38), which displays the image captured by the shooting means (18); and the cutting line correction button (40), which is used to align the cutting line (4) with the reference line The deviation of (L) is memorized as a correction value; and the processing groove correction button (42) is used to memorize the deviation of the processing groove (54) and the reference line (L) as a correction value; and the Y-axis actuating part ( 46), actuate the Y-axis feeding means; and a pair of movable wires (48), sandwich the reference line (L) and keep the line symmetry and approach and stay away from the reference line (L); and the movable wire actuating part (50), will A pair of movable wires (48) act. The interval between a pair of movable lines (48) is set to be recognized as the width of the cutting line (4), and when set to be recognized as the width of the processing groove (54). In the case of an interval between frames, the color of a pair of movable lines (48) changes. The color of the kerf correction button (40) is set to be the same color as the color of a pair of movable lines (48) when it is set to be recognized as the width interval of the kerf (4). The color of the processing groove correction button (42) is set to be the same color as the color of a pair of movable lines (48) when it is set to be recognized as the width interval of the processing groove (54).

Description

加工裝置Processing device

本發明有關形成加工溝之加工裝置,該加工溝是將複數個元件(device)藉由切割道(street)被區隔而形成於表面之晶圓予以分割成一個個元件。 The present invention relates to a processing device for forming a processing groove. The processing groove divides a plurality of devices (devices) separated by dicing streets (streets) to divide a wafer formed on the surface into individual devices.

IC、LSI等的元件藉由切割道(分割預定線)被區隔而形成於表面之晶圓,會藉由切削裝置而切割道被切削而被分割成一個個元件,分割出的各元件被利用於行動電話、個人電腦等電子機器。 Components such as IC and LSI are separated by dicing lines (segmentation planning lines) and formed on the surface of the wafer. The dicing lines are cut by the cutting device to be divided into individual components, and the separated components are divided into individual components. Used in electronic devices such as mobile phones and personal computers.

切削裝置,至少具備:保持手段,保持晶圓;及切削手段,具備將被保持於保持手段的晶圓的切割道予以切削之切削刀而可將該切削刀旋轉;及X軸饋送手段,將保持手段與切削手段於X軸方向相對地切削饋送;及Y軸饋送手段,將保持手段與切削手段於和X軸方向正交之Y軸方向相對地分度饋送;及拍攝手段,具有顯微鏡,該顯微鏡拍攝被保持於保持手段的晶圓而具備檢測切割道及切削溝之基準線;及顯示手段;而能夠高精度地切削晶圓的切割道(例如參照專利文獻1)。 A cutting device at least includes: holding means for holding a wafer; and a cutting means for cutting a dicing line of a wafer held by the holding means with a cutting blade capable of rotating the cutting blade; and an X-axis feeding means for The holding means and the cutting means are cut and fed relative to the X-axis direction; and the Y-axis feeding means are indexed and fed by the holding means and the cutting means in the Y-axis direction perpendicular to the X-axis direction; and the photographing means has a microscope, This microscope photographs the wafer held by the holding means and is provided with reference lines for detecting dicing lines and cutting grooves; and display means; and can cut the dicing lines of the wafer with high precision (for example, refer to Patent Document 1).

也就是說,在顯示手段,係顯示:圖像顯示 部,將拍攝手段拍攝到的圖像予以顯示;及切割道修正按鈕,用來將切割道與基準線之偏差量記憶作為修正值;及切削溝修正按鈕,用來將切削溝與基準線之偏差量記憶作為修正值;及X軸作動部,將X軸饋送手段作動;及Y軸作動部,將Y軸饋送手段作動;及一對可動線,包夾基準線而保持線對稱而接近及遠離基準線;及可動線作動部,將一對可動線作動;當將Y軸作動部作動而切割道的中央被置放於基準線並且一對可動線的間隔被置放於切割道的寬幅之情形下,若觸碰切割道修正按鈕則切割道的移動距離會被記憶成Y軸方向的修正值,於下次的切割道的分度饋送中會被修正成基準線和切割道的中央一致。 That is, in display means, the system displays: image display part, to display the image captured by the shooting means; and the cutting line correction button, used to store the deviation between the cutting line and the reference line as a correction value; The deviation amount memory is used as a correction value; and the X-axis actuating part is used to actuate the X-axis feeding means; and the Y-axis actuating part is used to actuate the Y-axis feeding means; away from the reference line; and the movable line actuating part, actuating a pair of movable lines; when the Y-axis actuating part is actuated, the center of the cutting line is placed on the reference line and the distance between the pair of movable lines is placed on the width of the cutting line In the case of the frame, if you touch the cutting line correction button, the moving distance of the cutting line will be memorized as the correction value in the Y-axis direction, and will be corrected as the reference line and the cutting line in the next indexing feed of the cutting line. Central unanimity.

此外,當將Y軸作動部作動而切削溝的中央被置放於基準線並且一對可動線的間隔被置放於切削溝的寬幅之情形下,若觸碰切削溝修正按鈕則切削溝的Y軸方向的移動距離會被記憶成Y軸方向的修正值,於下次的切割道的分度饋送中會被修正成基準線和切削溝的中央一致並且切削溝會被形成於切割道的中央。 In addition, when the Y-axis actuating part is actuated so that the center of the cutting groove is placed on the reference line and the distance between a pair of movable lines is placed on the width of the cutting groove, the cutting groove will be cut when the cutting groove correction button is touched. The moving distance in the Y-axis direction will be memorized as the correction value in the Y-axis direction, and will be corrected so that the reference line coincides with the center of the cutting groove in the next indexing feed of the cutting road and the cutting groove will be formed on the cutting road the central.

[先前技術文獻] [Prior Art Literature] [專利文獻] [Patent Document]

[專利文獻1]日本特開2014-113669號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2014-113669

但,當將Y軸作動部作動而切割道的中央被置放於基準線並且一對可動線的間隔被置放於切割道的寬幅之情形下,若觸碰切削溝修正按鈕則切割道的修正值會被記憶成切削溝的修正值,而有無法做高精度的分度饋送而無法將切割道高精度地切削之問題。 However, when the Y-axis actuating part is actuated so that the center of the cutting line is placed on the reference line and the distance between a pair of movable lines is placed on the width of the cutting line, if the cutting groove correction button is touched, the cutting line The correction value of the cutting groove will be memorized as the correction value of the cutting groove, but there is a problem that the cutting track cannot be cut with high precision because of the high-precision index feeding.

此外,當將Y軸作動部作動而切削溝的中央被置放於基準線並且一對可動線的間隔被置放於切削溝的寬幅之情形下,若觸碰切割道修正按鈕則切削溝的修正值會被記憶成切割道的修正值,而有無法將切割道的中央高精度地切削之問題。 In addition, when the Y-axis actuating part is actuated so that the center of the cutting groove is placed on the reference line and the distance between a pair of movable lines is placed on the width of the cutting groove, the cutting groove will be cut when the kerf correction button is touched. The correction value will be memorized as the correction value of the cutting line, but there is a problem that the center of the cutting line cannot be cut with high precision.

上述問題,在對切割道照射雷射光線而形成分割溝之雷射加工裝置亦可能發生。 The above-mentioned problem may also occur in a laser processing device that irradiates a laser beam to a scribe line to form a dividing groove.

有鑑於上述事實而研發之本發明的待解問題,在於提供一種不會搞混切割道的偏差之修正、與包含切削溝、分割溝的加工溝的偏差之修正的加工裝置。 The problem to be solved of the present invention developed in view of the above facts is to provide a processing device that does not confuse the correction of the deviation of the cutting line and the correction of the deviation of the processing groove including the cutting groove and the dividing groove.

為解決上述待解決問題,本發明提供者為以下的加工裝置。也就是說,一種加工裝置,係形成加工溝之加工裝置,該加工溝是將複數個元件藉由切割道(street)被區隔而形成於表面之晶圓予以分割成一個個元件,該加工裝置,至少具備:保持手段,保持晶圓;及加工手段,在被保持於該保持手段之晶圓的切割道形成加工溝;及X軸饋送手段,將該保持手段與該加工手段於X軸方向相對 地加工饋送;及Y軸饋送手段,將該保持手段與該加工手段於和X軸方向正交之Y軸方向相對地分度饋送;及拍攝手段,具有顯微鏡,該顯微鏡拍攝被保持於該保持手段的晶圓而具備檢測切割道及加工溝之基準線;及顯示手段;在該顯示手段,係顯示:圖像顯示部,顯示該拍攝手段拍攝到的圖像;及切割道修正按鈕,用來將切割道與該基準線之偏差量予以記憶作為修正值;及加工溝修正按鈕,用來將加工溝與該基準線之偏差量予以記憶作為修正值;及Y軸作動部,將該Y軸饋送手段作動;及一對可動線,包夾該基準線而保持線對稱而接近及遠離該基準線;及可動線作動部,將該一對可動線作動;該一對可動線的間隔,在當被設定成會被辨識為切割道的寬幅之間隔的情形下、和在當被設定成會被辨識為加工溝的寬幅之間隔的情形下,該一對可動線的顏色會變化,該切割道修正按鈕的顏色,是被設定成和當被設定成會被辨識為切割道的寬幅之間隔的情形下之該一對可動線的顏色同色,該加工溝修正按鈕的顏色,是被設定成和當被設定成會被辨識為加工溝的寬幅之間隔的情形下之該一對可動線的顏色同色。 In order to solve the above-mentioned problem to be solved, the present invention provides the following processing apparatus. That is to say, a processing device is a processing device that forms a processing groove. The processing groove divides a wafer formed on the surface of a plurality of components by dicing streets (streets) into individual components. The device at least has: holding means, holding the wafer; and processing means, forming a processing groove on the dicing lane of the wafer held by the holding means; opposite direction ground processing feeding; and Y-axis feeding means, the holding means and the processing means are indexed and fed relative to the Y-axis direction perpendicular to the X-axis direction; The wafer of the means has the reference line for detecting the scribe line and the processing groove; and the display means; in the display means, it is displayed: the image display part displays the image captured by the shooting means; and the scribe line correction button is used for To store the deviation between the cutting line and the reference line as a correction value; and the processing groove correction button is used to store the deviation between the processing groove and the reference line as a correction value; and the Y-axis actuating part, the Y Axis feeding means is actuated; and a pair of movable wires sandwiches the reference line to maintain line symmetry and approaches and moves away from the reference line; and a movable wire actuating part operates the pair of movable wires; the distance between the pair of movable wires, The color of the pair of movable lines changes when it is set to be the interval between the widths that will be recognized as the slit and when it is set to the interval between the widths that will be recognized as the processing groove. , the color of the kerf correction button is set to be the same color as the color of the pair of movable lines when it is set to be recognized as the interval between the widths of the kerf, the color of the processing groove correction button, It is set to be the same color as the color of the pair of movable lines when it is set to be recognized as the interval between the widths of the processing grooves.

較佳是,當該一對可動線的間隔不是被設定成會被辨識為切割道的寬幅之間隔的情形下,若觸碰該切割道修正按鈕則會報知錯誤,當該一對可動線的間隔不是被設定成會被辨識為加工溝的寬幅之間隔的情形下,若觸碰該加工溝修正按鈕則會報知錯誤。合適是,當將該Y軸作動部作動而將被顯示於該圖像顯示部的切割道的位置移 動至該基準線並且將該可動線作動部作動而使該一對可動線一致於切割道的寬幅之情形下,若觸碰該切割道修正按鈕則切割道的移動距離會被記憶作為切割道的修正值,當將該Y軸作動部作動而將被顯示於該圖像顯示部的加工溝的位置移動至該基準線並且將該可動線作動部作動而使該一對可動線一致於加工溝的寬幅之情形下,若觸碰該加工溝修正按鈕則加工溝的移動距離會被記憶作為加工溝的修正值。該加工手段,為具備切削刀而可將該切削刀旋轉之切削手段,該加工溝為切削溝則為便利。 Preferably, when the interval between the pair of movable lines is not set to be recognized as the interval between the widths of the cutting lines, an error will be reported if the cutting line correction button is touched, and when the pair of movable lines If the interval of is not set to be recognized as the width interval of the processing groove, an error will be reported if the processing groove correction button is touched. Suitably, when the Y-axis actuating part is actuated to move the position of the cutting line displayed on the image display part to When moving to the reference line and actuating the movable wire actuating part to make the pair of movable wires coincide with the width of the cutting line, if the cutting line correction button is touched, the moving distance of the cutting line will be memorized as the cutting The correction value of the track, when the Y-axis actuating part is actuated to move the position of the processing groove displayed on the image display part to the reference line and the movable line actuating part is actuated to make the pair of movable lines coincide with In the case of the width of the processing groove, if the processing groove correction button is touched, the moving distance of the processing groove will be memorized as the correction value of the processing groove. The processing means is a cutting means provided with a cutting blade and the cutting blade can be rotated, and it is convenient if the processing groove is a cutting groove.

本發明提供之加工裝置,至少具備:保持手段,保持晶圓;及加工手段,在被保持於該保持手段之晶圓的切割道形成加工溝;及X軸饋送手段,將該保持手段與該加工手段於X軸方向相對地加工饋送;及Y軸饋送手段,將該保持手段與該加工手段於和X軸方向正交之Y軸方向相對地分度饋送;及拍攝手段,具有顯微鏡,該顯微鏡拍攝被保持於保持手段的晶圓而具備檢測切割道及切削溝之基準線;及顯示手段;在該顯示手段,係顯示:圖像顯示部,顯示該拍攝手段拍攝到的圖像;及切割道修正按鈕,用來將切割道與該基準線之偏差量予以記憶作為修正值;及加工溝修正按鈕,用來將加工溝與該基準線之偏差量予以記憶作為修正值;及Y軸作動部,將該Y軸饋送手段作動;及一對可動線,包夾該基準線而保持線對稱而接 近及遠離該基準線;及可動線作動部,將該一對可動線作動;該一對可動線的間隔,在當被設定成會被辨識為切割道的寬幅之間隔的情形下、和在當被設定成會被辨識為加工溝的寬幅之間隔的情形下,該一對可動線的顏色會變化,該切割道修正按鈕的顏色,是被設定成和當被設定成會被辨識為切割道的寬幅之間隔的情形下之該一對可動線的顏色同色,該加工溝修正按鈕的顏色,是被設定成和當被設定成會被辨識為加工溝的寬幅之間隔的情形下之該一對可動線的顏色同色,故不會將切割道與基準線之偏差量記憶作為加工溝的修正值,並且不會將加工溝與基準線之偏差量記憶作為切割道的修正值,能夠高精度地做分度饋送而對切割道形成高精度的加工溝。 The processing device provided by the present invention has at least: a holding means for holding the wafer; and a processing means for forming a processing groove on the dicing lane of the wafer held by the holding means; and an X-axis feeding means for connecting the holding means to the wafer The processing means is processed and fed relatively in the X-axis direction; and the Y-axis feed means is used to index and feed the holding means and the processing means in the Y-axis direction perpendicular to the X-axis direction; and the photographing means has a microscope, the The microscope photographs the wafer held by the holding means and has a reference line for detecting the dicing line and the cutting groove; and the display means; on the display means, it is displayed: the image display part displays the image captured by the imaging means; and The cutting line correction button is used to store the deviation between the cutting line and the reference line as a correction value; and the processing groove correction button is used to store the deviation between the processing groove and the reference line as a correction value; and the Y axis an actuating part for actuating the Y-axis feeding means; and a pair of movable wires sandwiching the reference line to maintain line symmetry and connect close to and away from the reference line; and the movable wire actuating part, which actuates the pair of movable wires; the interval between the pair of movable wires is set to be recognized as the interval between the width of the cutting line; and When it is set to be recognized as the gap between the width of the processing groove, the color of the pair of movable lines changes, and the color of the kerf correction button is set to be recognized when it is set to The color of the pair of movable lines is the same color when the width interval of the cutting line is the same color, and the color of the processing groove correction button is set to be recognized as the width interval of the processing groove when it is set. In this case, the pair of movable lines have the same color, so the deviation between the cutting line and the reference line will not be stored as the correction value of the processing groove, and the deviation between the processing groove and the reference line will not be stored as the correction of the cutting line value, it is possible to perform indexing feeding with high precision and form high-precision processing grooves on the cutting track.

2:晶圓 2: Wafer

4:切割道 4: Cutting Road

12:切削裝置(加工裝置) 12: Cutting device (processing device)

14:保持手段 14: Keep Means

16:切削手段(加工手段) 16: Cutting means (processing means)

18:拍攝手段 18: Shooting means

20:顯示手段 20: Display means

34:切削刀 34: Cutter

36:顯微鏡 36: Microscope

38:圖像顯示部 38: Image display unit

40:切割道修正按鈕 40: Cutting path correction button

42:加工溝修正按鈕 42: Processing groove correction button

46:Y軸作動部 46: Y-axis actuating part

48:可動線 48: Movable line

50:可動線作動部 50: Movable wire moving part

54:切削溝(加工溝) 54: cutting groove (processing groove)

L:基準線 L: baseline

[圖1]晶圓的立體圖。 [Fig. 1] A perspective view of a wafer.

[圖2]遵照本發明而構成之加工裝置的立體圖。 [ Fig. 2 ] A perspective view of a processing device constructed in accordance with the present invention.

[圖3]進行修正時之拍攝手段及晶圓的立體圖。 [Fig. 3] A perspective view of the imaging means and the wafer during correction.

[圖4]顯示於圖2所示顯示手段之圖像的模型圖。 [ Fig. 4 ] A model diagram showing an image of the display means shown in Fig. 2 .

[圖5]進行修正前之圖像的模型圖。 [Fig. 5] Model diagram of the image before correction.

[圖6]從圖5所示狀態將切割道的位置移動至基準線為止之狀態下的圖像的模型圖。 [ Fig. 6] Fig. 6 is a model diagram of an image in a state where the position of the scribe line is moved to the reference line from the state shown in Fig. 5 .

[圖7]從圖6所示狀態使一對可動線一致於切割道的寬幅之狀態下的圖像的模型圖。 [ Fig. 7 ] A model diagram of an image in a state where a pair of movable lines are aligned with the width of the scribe line from the state shown in Fig. 6 .

[圖8]從圖7所示狀態將加工溝的位置移動至基準線為止之狀態下的圖像的模型圖。 [ Fig. 8] Fig. 8 is a model diagram of an image in a state where the position of the processing groove is moved to the reference line from the state shown in Fig. 7 .

[圖9]從圖8所示狀態使一對可動線一致於加工溝的寬幅之狀態下的圖像的模型圖。 [ Fig. 9 ] A model diagram of an image in a state where a pair of movable lines are aligned with the width of the processing groove from the state shown in Fig. 8 .

以下參照圖面,說明遵照本發明而構成之加工裝置的實施形態。 Embodiments of the processing apparatus constructed in accordance with the present invention will be described below with reference to the drawings.

圖1中,揭示可藉由遵照本發明而構成之加工裝置而被施以加工之圓盤狀的晶圓2。此晶圓2的表面2a,藉由形成為格子狀的複數個切割道4而被區隔成複數個矩形區域,在複數個矩形區域的各者形成有IC、LSI等的複數個元件6。圖示的實施形態中的晶圓2,被貼附於周緣被固定於環狀框8之黏著膠帶10。 In FIG. 1 there is shown a disk-shaped wafer 2 which can be processed by a processing device constructed in accordance with the present invention. The surface 2a of the wafer 2 is partitioned into a plurality of rectangular areas by a plurality of dicing lines 4 formed in a lattice, and a plurality of elements 6 such as ICs and LSIs are formed in each of the plurality of rectangular areas. The wafer 2 in the illustrated embodiment is attached to an adhesive tape 10 whose peripheral edge is fixed to a ring frame 8 .

圖2所示之切削裝置12,為遵照本發明而構成之加工裝置的一例,至少具備:保持手段14,保持晶圓2;及切削手段16,作為在被保持於保持手段14的晶圓2的切割道4形成加工溝之加工手段;及X軸饋送手段(未圖示),將保持手段14與切削手段16於X軸方向(圖1中箭頭X所示方向)相對地加工饋送;及Y軸饋送手段(未圖示),將保持手段14與切削手段16於和X軸方向正交之Y軸方向(圖1中箭頭Y所示方向)相對地分度饋送;及拍攝手段18;及顯示手段20。另,X軸方向及Y軸方向所規範之平面係實質上水平。此外,圖1中箭頭Z所示之Z軸方向為和X軸方 向及Y軸方向正交之上下方向。 The cutting device 12 shown in FIG. 2 is an example of a processing device configured according to the present invention, and at least possesses: a holding means 14 for holding a wafer 2; The cutting road 4 forms the processing means of processing groove; And X-axis feeding means (not shown), will keep means 14 and cutting means 16 in X-axis direction (direction shown by arrow X among Fig. 1) processing feed relatively; And Y-axis feeding means (not shown), will keep means 14 and cutting means 16 in the Y-axis direction (direction shown by arrow Y among Fig. 1) that is perpendicular to X-axis direction with holding means 14 and relatively index feed; And photographing means 18; and display means 20 . In addition, the planes specified by the X-axis direction and the Y-axis direction are substantially horizontal. In addition, the direction of the Z axis shown by the arrow Z in Figure 1 is the same as the direction of the X axis. and the Y-axis direction are perpendicular to the up-down direction.

保持手段14,包含旋轉自如且於X軸方向移動自如地被安裝於裝置罩殼22之圓形狀的夾盤平台(chuck table)24。此夾盤平台24,藉由裝置罩殼22中內藏的夾盤平台用馬達(未圖示),以朝Z軸方向延伸之軸線為中心而被旋轉。圖示的實施形態中的上述X軸饋送手段,由連結至夾盤平台24而朝X軸方向延伸之滾珠螺桿(未圖示)、及令此滾珠螺桿旋轉之馬達(未圖示)所構成,相對於切削手段16將夾盤平台24於X軸方向相對地加工饋送。在夾盤平台24的上端部分,配置連接至吸引手段(未圖示)之多孔質的圓形狀吸附夾盤26,夾盤平台24中,藉由吸引手段在吸附夾盤26生成吸引力,藉此吸引保持承載於上面之晶圓2。此外,在夾盤平台24的周緣,於周方向相距間隔配置有用來固定環狀框8之複數個夾具(clamp)28。 The holding means 14 includes a circular chuck table 24 mounted on the device case 22 to be rotatable and movable in the X-axis direction. The chuck table 24 is rotated around an axis extending in the Z-axis direction by a chuck table motor (not shown) incorporated in the device case 22 . The above-mentioned X-axis feeding means in the illustrated embodiment is composed of a ball screw (not shown) that is connected to the chuck table 24 and extends in the X-axis direction, and a motor (not shown) that rotates the ball screw. , relative to the cutting means 16, the chuck platform 24 is processed and fed in the X-axis direction. On the upper end portion of the chuck platform 24, a porous circular adsorption chuck 26 connected to a suction means (not shown) is arranged. This attraction holds the wafer 2 carried thereon. In addition, a plurality of clamps (clamps) 28 for fixing the annular frame 8 are arranged at intervals in the circumferential direction on the periphery of the chuck platform 24 .

切削手段16,包含:心軸罩殼30,於Y軸方向移動自如且於Z軸方向移動自如(升降自如)地受到裝置罩殼22支撐;及心軸32,以Y軸方向為軸心而可旋轉地受到心軸罩殼30支撐;及馬達(未圖示),令心軸32旋轉;及切削刀34,被固定於心軸32的先端。像這樣,作為在晶圓2的切割道4形成加工溝之加工手段的切削手段16,係具備切削刀34而可將該切削刀34旋轉,圖示的實施形態中形成於晶圓2之加工溝,為藉由切削刀34而形成之切削溝。上述Y軸饋送手段,由連結至心軸罩殼30而朝Y軸方向延伸之滾珠螺桿(未圖示)、及令此滾珠螺桿旋轉之馬達(未圖 示)所構成,相對於保持手段14將心軸罩殼30於Y軸方向相對地分度饋送。此外,心軸罩殼30,藉由由朝Z軸方向延伸之滾珠螺桿(未圖示)、及令此滾珠螺桿旋轉之馬達(未圖示)所構成的Z軸饋送手段,而於Z軸方向被切入饋送(升降)。 The cutting means 16 includes: a mandrel cover 30, which is supported by the device cover 22 freely movable in the Y-axis direction and freely movable (lifting freely) in the Z-axis direction; rotatably supported by the mandrel housing 30 ; and a motor (not shown) to rotate the mandrel 32 ; and a cutting knife 34 fixed to the tip of the mandrel 32 . In this way, the cutting means 16, which is a processing means for forming processing grooves on the scribe line 4 of the wafer 2, is provided with a cutting blade 34, and the cutting blade 34 can be rotated. The groove is a cutting groove formed by the cutting blade 34 . The above-mentioned Y-axis feeding means is composed of a ball screw (not shown) that is connected to the spindle housing 30 and extends toward the Y-axis direction, and a motor (not shown) that makes the ball screw rotate. As shown), the mandrel housing 30 is indexed and fed relative to the holding means 14 in the Y-axis direction. In addition, the spindle housing 30 is rotated in the Z-axis by a Z-axis feeding means composed of a ball screw (not shown) extending in the Z-axis direction and a motor (not shown) that rotates the ball screw. The direction is cut into the feed (lift).

如圖2所示,拍攝手段18,設於夾盤平台24的移動路徑的上方。參照圖3及圖4說明之,拍攝手段18,具有顯微鏡36,該顯微鏡36拍攝被保持於保持手段14的晶圓2而具備檢測切割道4及加工溝(圖示的實施形態中為切削溝)之基準線L(參照圖4)。朝X軸方向延伸之基準線L,形成於顯微鏡36的透鏡或CCD等的拍攝元件(未圖示)。此外,顯微鏡36,受到心軸罩殼30支撐,和心軸罩殼30一起藉由Y軸饋送手段而於Y軸方向被移動,且藉由Z軸饋送手段而於Z軸方向被移動。 As shown in FIG. 2 , the photographing means 18 is disposed above the moving path of the chuck platform 24 . 3 and 4, the photographing means 18 has a microscope 36, and the microscope 36 photographs the wafer 2 held in the holding means 14 and is equipped with a detection scribe line 4 and a processing groove (cutting groove in the illustrated embodiment). ) of the reference line L (refer to Figure 4). The reference line L extending in the X-axis direction is formed on a lens of the microscope 36 or an imaging element (not shown) such as a CCD. In addition, the microscope 36, supported by the spindle housing 30, is moved in the Y-axis direction by the Y-axis feeding means together with the spindle housing 30, and is moved in the Z-axis direction by the Z-axis feeding means.

圖示的實施形態中的顯示手段20,由設於裝置罩殼22的前面上部之觸控面板所構成。如圖4所示,在顯示手段20,係顯示:圖像顯示部38,顯示拍攝手段18拍攝到的圖像;及切割道修正按鈕40,用來將切割道4與基準線L之偏差量予以記憶作為修正值;及加工溝修正按鈕42,用來將加工溝與基準線L之偏差量予以記憶作為修正值;及X軸作動部44,將X軸饋送手段作動;及Y軸作動部46,將Y軸饋送手段作動;及一對可動線48,包夾基準線L而保持線對稱而接近及遠離基準線L;及可動線作動部50,將一對可動線48作動;及修正值顯示部52。 The display means 20 in the illustrated embodiment is constituted by a touch panel provided on the upper front surface of the device cover 22 . As shown in Figure 4, on the display means 20, it is displayed: an image display part 38, which displays the image captured by the photographing means 18; To be memorized as a correction value; and the processing groove correction button 42 is used to memorize the deviation between the processing groove and the reference line L as a correction value; and the X-axis actuating part 44 is used to actuate the X-axis feeding means; and the Y-axis actuating part 46, actuating the Y-axis feeding means; and a pair of movable wires 48, sandwiching the reference line L to maintain line symmetry and approaching and away from the reference line L; and a movable wire actuating part 50, actuating a pair of movable wires 48; and correcting Value display section 52.

將橫軸訂為X軸方向、將縱軸訂為Y軸方向而顯示拍攝手段18拍攝到的圖像之圖像顯示部38,係和拍攝手段18的基準線L一起將以基準線L為對稱軸之線對稱的一對可動線48平行於X軸方向予以顯示。設計成,當此一對可動線48的間隔,在被設定成會被辨識為切割道4的寬幅(例如50~60μm)之間隔(例如45μm以上)的情形下,和在被設定成會被辨識為加工溝的寬幅(例如25~35μm)之間隔(例如未滿45μm)的情形下,顯示於圖像顯示部38之一對可動線48的顏色會變化。例如,當一對可動線48的間隔被設定成會被辨識為切割道4的寬幅之間隔的情形下一對可動線48的顏色呈紅色,當一對可動線48的間隔被設定成會被辨識為加工溝的寬幅之間隔的情形下一對可動線48的顏色呈藍色。此外,切割道修正按鈕40的顏色,是被設定成和當被設定成會被辨識為切割道4的寬幅之間隔的情形下之一對可動線48的顏色同色(例如紅色),加工溝修正按鈕42的顏色,是被設定成和當被設定成會被辨識為加工溝的寬幅之間隔的情形下之一對可動線48的顏色同色(例如藍色)。 The image display part 38, which sets the horizontal axis as the X-axis direction and the vertical axis as the Y-axis direction to display the image captured by the photographing means 18, is set with the reference line L of the photographing means 18 as A pair of movable lines 48 that are line-symmetrical to the axis of symmetry are shown parallel to the X-axis direction. It is designed that when the interval between the pair of movable wires 48 is set to be recognized as the interval (for example, 45 μm or more) between the width (for example, 50 to 60 μm) of the cutting line 4, and when it is set to be When the interval (for example, less than 45 μm) is recognized as the width (for example, 25 to 35 μm) of the processing groove, the color of the pair of movable lines 48 displayed on the image display unit 38 changes. For example, when the interval between a pair of movable lines 48 is set to be recognized as the interval between the widths of the cutting lines 4, the color of the pair of movable lines 48 is red, and when the interval between the pair of movable lines 48 is set to be The color of the pair of movable wires 48 is blue when it is recognized as the gap between the widths of the processing grooves. In addition, the color of the kerf correction button 40 is set to be the same color (for example, red) as the color of the pair of movable lines 48 when it is set to be recognized as the interval between the widths of the kerf 4 , and the groove is processed. The color of the correction button 42 is set to be the same color (for example, blue) as the color of a pair of movable lines 48 when it is set to be recognized as the interval between the widths of the processing grooves.

切割道修正按鈕40,為用來將切割道4與基準線L之偏差量作為修正值而記憶於切削裝置12的記憶手段(未圖示)之按鈕,當將Y軸作動部46作動而將顯示於圖像顯示部38之切割道4的位置移動至基準線L,並且將可動線作動部50作動而使一對可動線48一致於切割道4的寬幅之情形下,若觸碰切割道修正按鈕40則切割道4的移動距 離會作為切割道4的修正值而被記憶於上述記憶手段。圖示的實施形態中如上述般,切割道修正按鈕40的顏色,是被設定成和當被設定成會被辨識為切割道4的寬幅之間隔的情形下之一對可動線48的顏色同色,因此當將切割道4與基準線L之偏差量記憶作為修正值時,一對可動線48的顏色和切割道修正按鈕40的顏色呈同色,因此作業員不會誤觸碰加工溝修正按鈕42。 The cutting line correction button 40 is a button for storing the deviation between the cutting line 4 and the reference line L as a correction value in the memory means (not shown) of the cutting device 12. When the Y-axis actuating part 46 is actuated, the When the position of the cutting line 4 displayed on the image display part 38 is moved to the reference line L, and the movable line actuating part 50 is actuated to make the pair of movable lines 48 coincide with the width of the cutting line 4, if the touch cut Road correction button 40 then cuts the moving distance of road 4 The distance is stored in the above-mentioned memory means as a correction value of the slit 4 . In the illustrated embodiment, as described above, the color of the kerf correction button 40 is set to the color of the movable line 48 when it is set to be recognized as the interval between the widths of the kerf 4 . The same color, so when the deviation between the cutting line 4 and the reference line L is memorized as the correction value, the color of the pair of movable lines 48 and the color of the cutting line correction button 40 are the same color, so the operator will not mistakenly touch the processing groove correction button 42.

加工溝修正按鈕42,為用來將加工溝與基準線L之偏差量作為修正值而記憶於上述記憶手段之按鈕,當將Y軸作動部46作動而將顯示於圖像顯示部38之加工溝的位置移動至基準線L,並且將可動線作動部50作動而使一對可動線48一致於加工溝的寬幅之情形下,若觸碰加工溝修正按鈕42則加工溝的移動距離會作為加工溝的修正值而被記憶於上述記憶手段。圖示的實施形態中如上述般,加工溝修正按鈕42的顏色,是被設定成和當被設定成會被辨識為加工溝的寬幅之間隔的情形下之一對可動線48的顏色同色,因此當將加工溝與基準線L之偏差量記憶作為修正值時,一對可動線48的顏色和加工溝修正按鈕42的顏色呈同色,因此作業員不會誤觸碰切割道修正按鈕40。 The processing groove correction button 42 is a button for storing the deviation amount between the processing groove and the reference line L as a correction value in the above-mentioned memory means. When the Y-axis actuating part 46 is actuated, the processing displayed on the image display part 38 When the position of the groove is moved to the reference line L, and the movable wire actuating part 50 is actuated to make the pair of movable wires 48 coincide with the width of the processing groove, if the processing groove correction button 42 is touched, the moving distance of the processing groove will be It is memorized in the above-mentioned memory means as a correction value of the processing groove. In the illustrated embodiment, as described above, the color of the processing groove correction button 42 is set to be the same color as the color of a pair of movable lines 48 when it is set to be recognized as the interval between the widths of the processing groove. Therefore, when the deviation between the processing groove and the reference line L is stored as the correction value, the color of the pair of movable lines 48 and the color of the processing groove correction button 42 are the same color, so the operator will not accidentally touch the cutting line correction button 40 .

此外,圖示的實施形態中,設計成當一對可動線48的間隔不是被設定成會被辨識為切割道4的寬幅之間隔的情形下,若觸碰切割道修正按鈕40則會報知錯誤,當一對可動線48的間隔不是被設定成會被辨識為加工溝的寬幅之間隔的情形下,若觸碰加工溝修正按鈕42則會報知 錯誤。是故,當將切割道4與基準線L之偏差量記憶作為修正值時,即使作業員誤觸碰加工溝修正按鈕42,切割道4的修正值也不會作為加工溝的修正值而被記憶於上述記憶手段。此外,當將加工溝與基準線L之偏差量記憶作為修正值時,即使作業員誤觸碰切割道修正按鈕40,加工溝的修正值也不會作為切割道4的修正值而被記憶於上述記憶手段。另,作為錯誤的報知,能夠舉出對於顯示手段20之錯誤顯示、警告燈(未圖示)的閃爍或點燈、警告音所致之報知等。 In addition, in the illustrated embodiment, it is designed so that when the distance between the pair of movable lines 48 is not set to be recognized as the wide distance between the cutting lines 4, when the cutting line correction button 40 is touched, a notification will be given. Error, when the interval between a pair of movable lines 48 is not set to be recognized as the interval between the width of the processing groove, if the processing groove correction button 42 is touched, it will be reported mistake. Therefore, when the deviation between the cutting line 4 and the reference line L is stored as a correction value, even if the operator accidentally touches the processing groove correction button 42, the correction value of the cutting line 4 will not be used as the correction value of the processing groove. Memory in the above memory means. In addition, when the deviation between the processing groove and the reference line L is stored as a correction value, even if the operator touches the cutting line correction button 40 by mistake, the correction value of the processing groove will not be stored as the correction value of the cutting line 4 in the the above memory means. In addition, as notification of an error, an error display on the display means 20 , flickering or lighting of a warning lamp (not shown), notification by a warning sound, etc. can be mentioned.

X軸作動部44,具有將X軸饋送手段作動而使拍攝手段18所致之拍攝區域朝圖4中的右方向移動之右方向作動部44a、及將X軸饋送手段作動而使拍攝手段18所致之拍攝區域朝圖4中的左方向移動之左方向作動部44b。此外,Y軸作動部46,具有將Y軸饋送手段作動而使拍攝手段18朝圖4中的上方向移動之上方向作動部46a、及將Y軸饋送手段作動而使拍攝手段18朝圖4中的下方向移動之下方向作動部46b。此外,可動線作動部50,具有一面保持以基準線L為對稱軸之線對稱的關係一面使一對可動線48朝向基準線L接近之可動線接近部50a、及一面保持以基準線L為對稱軸之線對稱的關係一面使一對可動線48從基準線L遠離之可動線遠離部50b。 The X-axis actuating part 44 has a right direction actuating part 44a that actuates the X-axis feeding means to move the imaging area caused by the imaging means 18 to the right in FIG. 4, and actuates the X-axis feeding means to make the imaging means 18 The resulting shooting area moves to the left direction actuating part 44b in the left direction in FIG. 4 . In addition, the Y-axis actuating part 46 has an upward direction actuating part 46a for actuating the Y-axis feeding means to move the imaging means 18 upward in FIG. In the downward direction, the downward direction actuating part 46b is moved. In addition, the movable wire actuating part 50 has a movable wire approaching part 50a that makes the pair of movable wires 48 approach toward the reference line L while maintaining a line-symmetrical relationship with the reference line L as the axis of symmetry, and a movable wire approaching part 50a that keeps the reference line L as the axis of symmetry. The line-symmetric relationship between the symmetry axes makes the pair of movable wires 48 farther away from the reference line L than the movable wire distance part 50b.

當使用如上述般的切削裝置12在晶圓2的切割道4形成切削溝時,首先,將晶圓2的表面2a朝上,使晶圓2吸引保持於夾盤平台24的上面。此外,藉由複數個夾 具28將環狀框8固定。接下來,藉由拍攝手段18從上方拍攝晶圓2,基於藉由拍攝手段18拍攝到的晶圓2的圖像,將X軸饋送手段、Y軸饋送手段及夾盤平台用馬達作動,使切割道4對齊X軸方向,並且將切削刀34置放於被對齊於X軸方向之切割道4的上方。接下來,藉由馬達使切削刀34和心軸32一起旋轉。接下來,藉由Z軸饋送手段使心軸罩殼30下降,使切削刀34的刀尖切入被對齊於X軸方向之切割道4,並且將X軸饋送手段作動而對於切削手段16將夾盤平台24相對地朝X軸方向加工饋送,藉此施以沿著切割道4形成用來將晶圓2分割成一個個元件6的切削溝之切削加工。接下來,以恰好事先設定好的分度饋送量的份量(被施以切削加工之前的狀態下的切割道4的Y軸方向間隔),對於夾盤平台24將切削手段16藉由Y軸饋送手段朝Y軸方向做分度饋送。然後,交互反覆做切削加工與分度饋送,藉此對被對齊於X軸方向之切割道4的全部施以切削加工時,若依上述般藉由切削裝置12形成切削溝的當中,會發生切削加工伴隨之切割道4的Y軸方向的偏差、或心軸32的熱膨脹所致之切削刀34的Y軸方向的偏差。在發生了這樣的偏差的狀態下,若藉由事先設定好的分度饋送量一面做分度饋送一面反覆做切削加工,則恐會切削到從切割道4脫離之位置而使元件6損傷。鑑此,當藉由切削裝置12形成切削溝時,於進行了數次切削加工後會進行加工位置的修正(也就是說,切割道4與切削溝之偏差的修正)。加工位置的修正中,首先,實施求出切割道4與基準線L之Y軸 方向的偏差量而記憶作為切割道的修正值之切割道修正,接下來實施求出切削溝與基準線L之Y軸方向的偏差量而記憶作為切削溝的修正值之加工溝修正。另,將沿著切割道4形成的切削溝在圖3中以符號54表示。 When cutting trenches are formed on the dicing lines 4 of the wafer 2 using the above-mentioned cutting device 12 , firstly, the surface 2 a of the wafer 2 faces upward, and the wafer 2 is sucked and held on the chuck table 24 . In addition, with multiple clips Tool 28 fixes the ring frame 8. Next, the wafer 2 is photographed from above by the photographing means 18, based on the image of the wafer 2 photographed by the photographing means 18, the X-axis feeding means, the Y-axis feeding means, and the chuck table are motorized to make The scribe line 4 is aligned in the X-axis direction, and the cutting blade 34 is placed above the scribe line 4 aligned in the X-axis direction. Next, the cutter 34 is rotated together with the spindle 32 by a motor. Next, the mandrel housing 30 is lowered by the Z-axis feeding means, the tip of the cutting knife 34 is cut into the cutting line 4 aligned in the X-axis direction, and the X-axis feeding means is actuated to clamp the cutting means 16. The disk table 24 is relatively processed and fed in the direction of the X axis, thereby performing cutting processing along the dicing lane 4 to form cutting grooves for dividing the wafer 2 into individual components 6 . Next, the cutting means 16 is fed to the chuck platform 24 by the Y-axis by the amount of the pre-set index feeding amount (the interval in the Y-axis direction of the cutting line 4 in the state before being applied to the cutting process). Means to do index feed in Y axis direction. Then, when the cutting process and the index feeding are repeated alternately so as to perform the cutting process on the entire cutting line 4 aligned in the X-axis direction, if the cutting groove is formed by the cutting device 12 as described above, the cutting process will occur. The cutting process is accompanied by a deviation in the Y-axis direction of the cutting line 4 or a deviation in the Y-axis direction of the cutting blade 34 caused by the thermal expansion of the mandrel 32 . In the state where such a deviation has occurred, if the index feed is performed while performing the cutting process repeatedly with the index feed amount set in advance, the element 6 may be damaged by cutting to a position away from the scribe line 4 . In view of this, when the cutting groove is formed by the cutting device 12, the machining position correction (that is, the correction of the deviation between the cutting road 4 and the cutting groove) will be performed after several times of cutting. In the correction of the processing position, firstly, the Y-axis between the cutting line 4 and the reference line L is obtained. Then, the machining groove correction is performed to obtain the deviation amount between the cutting groove and the reference line L in the Y-axis direction and store it as the correction value of the cutting groove. In addition, the cutting groove formed along the scribe line 4 is indicated by reference numeral 54 in FIG. 3 .

切割道修正中,首先如圖3所示般,將X軸饋送手段及Y軸饋送手段作動來進行晶圓2與拍攝手段18之對位,藉由拍攝手段18拍攝最近形成了切削溝54之切割道4。藉由拍攝手段18拍攝到的圖像,例如如圖5所示,被顯示於顯示手段20的圖像顯示部38。此時被顯示於圖像顯示部38之圖像中,一對可動線48的間隔,是被設定成會被辨識為切割道4的寬幅之間隔(例如45μm以上),一對可動線48的顏色和切割道修正按鈕40的顏色為同色(例如紅色)。另,當在切割道4周期性地設有稱為TEG(Test Element Group;測試元件群)之金屬圖樣的情形下,在將TEG切斷之處的切削溝而產生金屬毛邊等,若拍攝到此處的切削溝則恐將金屬毛邊等誤認作為切削溝,因此在這樣的情形下會藉由將X軸作動部44作動來調整藉由拍攝手段18拍攝之切割道4的位置,而拍攝未設有TEG之處的切削溝。接下來,基於拍攝出的圖像,如圖6所示般,將Y軸作動部46作動,將被顯示於圖像顯示部38之切割道4的Y軸方向中央位置朝向基準線L移動。此時,作業者是看著拍攝出的圖像,以肉眼抓份量來調整切割道4的位置使得切割道4的Y軸方向中央位置和基準線L一致,故難以藉由Y軸作動部46的1次的作動來將切割道4的Y軸方向中央位置正確地置 放於基準線L。因此,會將可動線作動部50作動而將一對可動線48的間隔貼合切割道4的寬幅,來確認切割道4的Y軸方向中央位置是否和基準線L一致。如上述般,一對可動線48,是一面保持以基準線L為對稱軸之線對稱的關係一面接近及遠離,故若一對可動線48的間隔和切割道4的寬幅一致,則切割道4的Y軸方向的中央位置和基準線L便會一致。然後,適當地反覆做Y軸作動部46之作動與可動線作動部50之作動,當如圖7所示般一對可動線48的間隔一致於切割道4的寬幅時,便觸碰切割道修正按鈕40。這樣一來,從修正前的位置起算之切割道4的Y軸方向的移動距離(切割道4與基準線L之偏差量)便會作為切割道4的Y軸方向的修正值而被記憶於切削裝置12的上述記憶手段。此切割道4的修正值會被顯示於顯示手段20的修正值顯示部52(圖示的實施形態中為-5.5μm)。另,圖7中,為求簡便,以比切割道4的寬幅還稍寬的間隔來記載一對可動線48。 In the kerf correction, firstly, as shown in FIG. 3 , the X-axis feeding means and the Y-axis feeding means are actuated to align the wafer 2 and the imaging means 18, and the imaging means 18 captures the area where the cutting groove 54 has recently been formed. Cutting lane 4. The image captured by the imaging means 18 is displayed on the image display unit 38 of the display means 20 as shown in FIG. 5 , for example. In the image displayed on the image display unit 38 at this time, the distance between the pair of movable lines 48 is set to be recognized as the wide distance between the scribe lines 4 (for example, 45 μm or more), and the pair of movable lines 48 The color of and the color of the cutting line correction button 40 are the same color (for example, red). In addition, when a metal pattern called TEG (Test Element Group; test element group) is periodically provided on the dicing line 4, metal burrs and the like are generated in the cutting groove where the TEG is cut. The cutting groove here is likely to be mistaken for the metal burr as the cutting groove. Therefore, in such a case, the position of the cutting road 4 photographed by the photographing means 18 will be adjusted by actuating the X-axis actuating part 44. Cutting groove where TEG is installed. Next, based on the captured image, the Y-axis actuator 46 is actuated to move the Y-axis central position of the scribe line 4 displayed on the image display section 38 toward the reference line L as shown in FIG. 6 . At this time, the operator looks at the captured image and adjusts the position of the cutting line 4 with the naked eye so that the central position of the cutting line 4 in the Y-axis direction coincides with the reference line L. One action to set the central position of the cutting line 4 in the Y-axis direction correctly Put it on the reference line L. Therefore, the movable wire actuating part 50 is actuated to fit the distance between the pair of movable wires 48 to the width of the scribe line 4 to check whether the central position of the scribe line 4 in the Y-axis direction coincides with the reference line L. As mentioned above, a pair of movable wires 48 approach and stay away from each other while keeping the relationship of line symmetry with the reference line L as the axis of symmetry. The central position of the track 4 in the Y-axis direction coincides with the reference line L. Then, the action of the Y-axis actuating part 46 and the action of the movable wire actuating part 50 are repeated appropriately. When the distance between a pair of movable wires 48 is consistent with the width of the cutting line 4 as shown in FIG. track correction button 40 . In this way, the moving distance of the scribe line 4 in the Y-axis direction from the position before correction (the amount of deviation between the scribe line 4 and the reference line L) will be stored as the correction value of the scribe line 4 in the Y-axis direction. The above-mentioned memory means of the cutting device 12. The correction value of the scribe line 4 is displayed on the correction value display part 52 of the display means 20 (-5.5 μm in the illustrated embodiment). In addition, in FIG. 7 , for simplicity, a pair of movable wires 48 are described with an interval slightly wider than the width of the scribe line 4 .

接著說明加工溝修正。加工溝修正,是從使切割道4的Y軸方向中央位置一致於基準線L之狀態開始,首先,如圖8所示般,將Y軸作動部46作動,將被顯示於圖像顯示部38之切削溝54的Y軸方向中央位置朝向基準線L移動。接下來,會將可動線作動部50作動而將一對可動線48的間隔貼合切削溝54的寬幅,來確認切削溝54的Y軸方向中央位置是否和基準線L一致。此時,一對可動線48的顏色會變化而和加工溝修正按鈕42的顏色呈同色(例如藍色)。然後,適當地反覆做Y軸作動部46之作動與可動線作 動部50之作動,當如圖9所示般一對可動線48的間隔一致於切削溝54的寬幅時,便觸碰加工溝修正按鈕42。這樣一來,從使切割道4的Y軸方向中央位置一致於基準線L之狀態起算之切削溝54的Y軸方向的移動距離,便會作為切削溝54的Y軸方向的修正值而被記憶於切削裝置12的上述記憶手段。此切削溝54的修正值會被顯示於顯示手段20的修正值顯示部52(圖示的實施形態中為+1.2μm)。另,圖9中,為求簡便,以比切削溝54的寬幅還稍寬的間隔來記載一對可動線48。 Next, processing groove correction will be described. The machining groove correction starts from the state where the central position of the cutting line 4 in the Y-axis direction coincides with the reference line L. First, as shown in FIG. The central position of the cutting groove 54 in the Y-axis direction at 38 moves toward the reference line L. Next, the movable wire actuating part 50 is actuated to fit the distance between the pair of movable wires 48 to the width of the cutting groove 54 to confirm whether the central position of the cutting groove 54 in the Y-axis direction coincides with the reference line L. At this time, the color of the pair of movable wires 48 changes to be the same color (for example, blue) as the color of the processing groove correction button 42 . Then, the action of the Y-axis action part 46 and the action of the movable line are repeated appropriately. When the action of the moving part 50 is as shown in FIG. 9 , when the distance between a pair of movable wires 48 is consistent with the width of the cutting groove 54, the processing groove correction button 42 is touched. In this way, the movement distance of the cutting groove 54 in the Y-axis direction calculated from the state where the central position of the scribe line 4 in the Y-axis direction coincides with the reference line L is calculated as a correction value in the Y-axis direction of the cutting groove 54. It is memorized in the above-mentioned memory means of the cutting device 12 . The correction value of the cutting groove 54 is displayed on the correction value display part 52 of the display means 20 (+1.2 μm in the illustrated embodiment). In addition, in FIG. 9 , for simplicity, a pair of movable wires 48 are described with an interval slightly wider than the width of the cutting groove 54 .

如上述般加工位置之修正中,首先於切割道修正中,求出從修正前的位置起算之切割道4的Y軸方向的移動距離(切割道4與基準線L之偏差量),接下來於加工溝修正中,求出從使切割道4的Y軸方向中央位置一致於基準線L之狀態起算之切削溝54的Y軸方向的移動距離(切削溝54與基準線L之偏差量),藉此便能使用基準線L正確地求出切割道4與切削溝54之偏差量。然後,藉由對事先設定好的分度饋送量加入切削溝54的修正值而成之修正後的分度饋送量來做分度饋送,藉此便能在切割道4的Y軸方向中央位置形成切削溝54。 In the correction of the machining position as described above, first in the correction of the cutting line, the moving distance of the cutting line 4 in the Y-axis direction (the deviation between the cutting line 4 and the reference line L) from the position before correction is obtained, and then In the processing groove correction, the movement distance of the cutting groove 54 in the Y-axis direction (the amount of deviation between the cutting groove 54 and the reference line L) calculated from the state where the central position of the scribe line 4 in the Y-axis direction coincides with the reference line L is obtained. Therefore, the amount of deviation between the scribe line 4 and the cutting groove 54 can be accurately calculated using the reference line L. Then, by adding the correction value of cutting groove 54 to the index feed amount set in advance, the index feed amount after correction is used for index feed, so that the center position in the Y-axis direction of the cutting line 4 can be Cut grooves 54 are formed.

如以上般圖示的實施形態中,當一對可動線48的間隔,在被設定成會被辨識為切割道4的寬幅之間隔的情形下、及被設定成會被辨識為切削溝54的寬幅之間隔的情形下,一對可動線48的顏色會變化,切割道修正按鈕40的顏色是被設定成和當被設定成會被辨識為切割道4的 寬幅之間隔的情形下之一對可動線48的顏色同色,故於切割道修正中作業員藉由觸碰和一對可動線48的顏色為同色之切割道修正按鈕40便能遂行切割道修正,而不會誤觸碰加工溝修正按鈕42。此外,圖示的實施形態中,加工溝修正按鈕42的顏色是被設定成和當被設定成會被辨識為切削溝54的寬幅之間隔的情形下之一對可動線48的顏色同色,故於加工溝修正中作業員藉由觸碰和一對可動線48的顏色同色之加工溝修正按鈕42便能遂行加工溝修正,而作業員不會誤觸碰切割道修正按鈕40。是故,圖示的實施形態中,不會將切割道4與基準線L之偏差量記憶作為切削溝54的修正值,並且不會將切削溝54與基準線L之偏差量記憶作為切割道4的修正值,能夠高精度地做分度饋送而對切割道4形成高精度的切削溝54。 In the embodiment shown above, when the distance between the pair of movable wires 48 is set to be recognized as the width distance of the scribe line 4 and is set to be recognized as the cutting groove 54 In the case of intervals between widths, the color of a pair of movable lines 48 will change, and the color of the line correction button 40 is set to and when set to be recognized as the line 4 In the case of a wide interval, the color of a pair of movable lines 48 is the same color, so the operator can carry out the cutting line by touching the line correction button 40 with the same color as the pair of movable lines 48 during the line correction Correction without accidentally touching the processing groove correction button 42. In addition, in the illustrated embodiment, the color of the processing groove correction button 42 is set to be the same color as the color of the movable line 48 when it is set to be recognized as the interval between the widths of the cutting groove 54, Therefore, during the processing groove correction, the operator can perform the processing groove correction by touching the processing groove correction button 42 of the same color as the pair of movable lines 48 , and the operator will not accidentally touch the cutting line correction button 40 . Therefore, in the illustrated embodiment, the deviation between the cutting line 4 and the reference line L is not stored as the correction value of the cutting groove 54, and the deviation between the cutting line 54 and the reference line L is not stored as the cutting line. With a correction value of 4, it is possible to perform index feeding with high precision and form a high-precision cutting groove 54 on the cutting road 4 .

另,圖示的實施形態中,雖說明了具備將被保持於保持手段14的晶圓2的切割道4予以切削之切削刀34而可將該切削刀34旋轉的切削手段16之切削裝置12,但亦可為具備對被保持於保持手段的晶圓2的切割道4照射雷射光線而形成分割溝的雷射光線照射手段之雷射加工裝置。 In addition, in the illustrated embodiment, although the cutting device 12 provided with the cutting blade 34 for cutting the scribe line 4 of the wafer 2 held by the holding means 14 and the cutting means 16 capable of rotating the cutting blade 34 has been described. , but may also be a laser processing apparatus including laser beam irradiation means for forming division grooves by irradiating laser beams to the dicing lines 4 of the wafer 2 held by the holding means.

4‧‧‧切割道 4‧‧‧Cutting Road

20‧‧‧顯示手段 20‧‧‧display means

38‧‧‧圖像顯示部 38‧‧‧Image display unit

40‧‧‧切割道修正按鈕 40‧‧‧Cutting line correction button

42‧‧‧加工溝修正按鈕 42‧‧‧Processing groove correction button

44‧‧‧X軸作動部 44‧‧‧X-axis actuator

44a‧‧‧右方向作動部 44a‧‧‧Right direction actuating part

44b‧‧‧左方向作動部 44b‧‧‧Left direction actuating part

46‧‧‧Y軸作動部 46‧‧‧Y-axis actuator

46a‧‧‧上方向作動部 46a‧‧‧upward actuating part

46b‧‧‧下方向作動部 46b‧‧‧Down direction actuating part

48‧‧‧可動線 48‧‧‧movable line

50‧‧‧可動線作動部 50‧‧‧Moveable wire moving part

50a‧‧‧可動線接近部 50a‧‧‧Moveable wire close part

50b‧‧‧可動線遠離部 50b‧‧‧movable line away from the part

52‧‧‧修正值顯示部 52‧‧‧Correction value display part

54‧‧‧切削溝(加工溝) 54‧‧‧Cutting groove (processing groove)

L‧‧‧基準線 L‧‧‧base line

Claims (4)

一種加工裝置,係形成加工溝之加工裝置,該加工溝是將複數個元件藉由切割道(street)被區隔而形成於表面之晶圓予以分割成一個個元件,該加工裝置,至少具備:保持手段,保持晶圓;及加工手段,在被保持於該保持手段之晶圓的切割道形成加工溝;及X軸饋送手段,將該保持手段與該加工手段於X軸方向相對地加工饋送;及Y軸饋送手段,將該保持手段與該加工手段於和X軸方向正交之Y軸方向相對地分度饋送;及拍攝手段,具有顯微鏡,該顯微鏡拍攝被保持於該保持手段的晶圓而具備檢測切割道及加工溝之基準線;及顯示手段;在該顯示手段,係顯示:圖像顯示部,顯示該拍攝手段拍攝到的圖像;及切割道修正按鈕,用來將切割道與該基準線之偏差量予以記憶作為修正值;及加工溝修正按鈕,用來將加工溝與該基準線之偏差量予以記憶作為修正值;及Y軸作動部,將該Y軸饋送手段作動;及一對可動線,包夾該基準線而保持線對稱而接近及遠離該基準線;及可動線作動部,將該一對可動線作動;該一對可動線的間隔,在當被設定成會被辨識為切割道的寬幅之間隔的情形下、和在當被設定成會被辨識為加工溝的寬幅之間隔的情形下,該一對可動線的顏色會變化,該切割道修正按鈕的顏色,是被設定成和當被設定成 會被辨識為切割道的寬幅之間隔的情形下之該一對可動線的顏色同色,該加工溝修正按鈕的顏色,是被設定成和當被設定成會被辨識為加工溝的寬幅之間隔的情形下之該一對可動線的顏色同色。 A processing device is a processing device that forms a processing groove. The processing groove is to divide a wafer formed on the surface of a plurality of components by dicing streets (streets) into individual components. The processing device has at least : holding means, holding the wafer; and processing means, forming a processing groove in the dicing lane of the wafer held by the holding means; and X-axis feeding means, processing the holding means and the processing means in the X-axis direction feeding; and Y-axis feeding means, the holding means and the processing means are indexed and fed relative to the Y-axis direction perpendicular to the X-axis direction; The wafer has reference lines for detecting scribe lines and processing grooves; and display means; in the display means, it is displayed: an image display part, which displays images captured by the shooting means; and a scribe line correction button, which is used to change the The deviation between the cutting line and the reference line is memorized as a correction value; and the processing groove correction button is used to store the deviation between the processing groove and the reference line as a correction value; and the Y-axis actuating part feeds the Y-axis means to actuate; and a pair of movable wires, which surround the reference line and keep the lines symmetrical and approach and stay away from the reference line; and a movable wire actuating part, which actuates the pair of movable wires; The color of the pair of movable lines changes when the interval between the widths is set to be recognized as the cutting line and when the interval between the widths is set to be recognized as the processing groove. The color of the kerf correction button, is set to and when set to When the color of the pair of movable lines is the same color when it is recognized as the interval between the width of the cutting line, the color of the processing groove correction button is set to and when it is set to be recognized as the width of the processing groove The color of the pair of movable lines is the same color when there is a gap between them. 如申請專利範圍第1項所述之加工裝置,其中,當該一對可動線的間隔不是被設定成會被辨識為切割道的寬幅之間隔的情形下,若觸碰該切割道修正按鈕則會報知錯誤,當該一對可動線的間隔不是被設定成會被辨識為加工溝的寬幅之間隔的情形下,若觸碰該加工溝修正按鈕則會報知錯誤。 The processing device described in claim 1 of the scope of the patent application, wherein, when the distance between the pair of movable lines is not set to be recognized as the wide distance between the cutting lines, if the cutting line correction button is touched An error will be reported. When the interval between the pair of movable lines is not set to be recognized as the interval between the width of the processing groove, an error will be reported if the processing groove correction button is touched. 如申請專利範圍第1項所述之加工裝置,其中,當將該Y軸作動部作動而將被顯示於該圖像顯示部的切割道的位置移動至該基準線並且將該可動線作動部作動而使該一對可動線一致於切割道的寬幅之情形下,若觸碰該切割道修正按鈕則切割道的移動距離會被記憶作為切割道的修正值,當將該Y軸作動部作動而將被顯示於該圖像顯示部的加工溝的位置移動至該基準線並且將該可動線作動部作動而使該一對可動線一致於加工溝的寬幅之情形下,若觸碰該加工溝修正按鈕則加工溝的移動距離會被記憶作為加工 溝的修正值。 The processing device described in Claim 1, wherein when the Y-axis actuating part is actuated, the position of the cutting line displayed on the image display part is moved to the reference line and the movable line actuating part When actuating to make the pair of movable lines consistent with the width of the cutting line, if the cutting line correction button is touched, the moving distance of the cutting line will be memorized as the correction value of the cutting line. When the Y-axis actuating part When actuating to move the position of the processing groove displayed on the image display part to the reference line and actuating the movable line actuating part to make the pair of movable lines coincide with the width of the processing groove, if the touch If the processing groove correction button is used, the moving distance of the processing groove will be memorized as the processing Groove correction value. 如申請專利範圍第1項所述之加工裝置,其中,該加工手段,為具備切削刀而可將該切削刀旋轉之切削手段,該加工溝為切削溝。 The processing device described in Claim 1, wherein the processing means is a cutting means provided with a cutting blade and the cutting blade can be rotated, and the processing groove is a cutting groove.
TW108105366A 2018-02-20 2019-02-19 Processing device TWI795528B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018-027608 2018-02-20
JP2018027608A JP6998231B2 (en) 2018-02-20 2018-02-20 Processing equipment

Publications (2)

Publication Number Publication Date
TW201935550A TW201935550A (en) 2019-09-01
TWI795528B true TWI795528B (en) 2023-03-11

Family

ID=67689119

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108105366A TWI795528B (en) 2018-02-20 2019-02-19 Processing device

Country Status (4)

Country Link
JP (1) JP6998231B2 (en)
KR (1) KR102654624B1 (en)
CN (1) CN110176409B (en)
TW (1) TWI795528B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011125870A (en) * 2009-12-15 2011-06-30 Disco Abrasive Syst Ltd Laser beam machining apparatus
TW201632285A (en) * 2015-01-21 2016-09-16 Disco Corp Laser machining apparatus
TW201701977A (en) * 2015-04-09 2017-01-16 Disco Corp Laser processing device capable of effectively applying proper laser processing to the object to be processed along a designed and predetermined cutting line

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2955937B2 (en) * 1998-03-16 1999-10-04 株式会社東京精密 Method and apparatus for controlling groove cutting of dicing machine
JP2001297999A (en) * 2000-04-12 2001-10-26 Disco Abrasive Syst Ltd Cutting device
JP4813985B2 (en) * 2006-06-23 2011-11-09 株式会社ディスコ Wafer processing conditions setting method
JP2010137309A (en) * 2008-12-10 2010-06-24 Disco Abrasive Syst Ltd Cutting method for cutting device at start of operation
JP5389580B2 (en) * 2009-09-17 2014-01-15 株式会社ディスコ Cutting equipment
JP5686545B2 (en) * 2010-07-26 2015-03-18 株式会社ディスコ Cutting method
JP5762005B2 (en) * 2011-01-13 2015-08-12 株式会社ディスコ Processing position adjustment method and processing apparatus
JP6013166B2 (en) 2012-12-11 2016-10-25 株式会社ディスコ Cutting equipment
JP6125377B2 (en) * 2013-08-29 2017-05-10 株式会社ディスコ Cutting groove detection method
JP6228044B2 (en) * 2014-03-10 2017-11-08 株式会社ディスコ Processing method of plate
JP6935168B2 (en) * 2016-02-12 2021-09-15 株式会社ディスコ Processing equipment
JP6998232B2 (en) * 2018-02-20 2022-01-18 株式会社ディスコ Processing equipment

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011125870A (en) * 2009-12-15 2011-06-30 Disco Abrasive Syst Ltd Laser beam machining apparatus
TW201632285A (en) * 2015-01-21 2016-09-16 Disco Corp Laser machining apparatus
TW201701977A (en) * 2015-04-09 2017-01-16 Disco Corp Laser processing device capable of effectively applying proper laser processing to the object to be processed along a designed and predetermined cutting line

Also Published As

Publication number Publication date
CN110176409B (en) 2023-08-22
JP6998231B2 (en) 2022-01-18
KR20190100026A (en) 2019-08-28
JP2019145636A (en) 2019-08-29
TW201935550A (en) 2019-09-01
KR102654624B1 (en) 2024-04-03
CN110176409A (en) 2019-08-27

Similar Documents

Publication Publication Date Title
TW201639054A (en) Processing apparatus
TWI657494B (en) Wafer processing method
TWI738816B (en) Cutting method of workpiece
TWI821500B (en) Cutting method of workpiece
TW202008440A (en) Alignment method including a plurality of memorizing steps for directional distance information
TWI811407B (en) Alignment method
TWI675430B (en) Calibration method
TWI776021B (en) Processing device
TWI795528B (en) Processing device
JP2015103752A (en) Dicing device and cutting method thereof
TWI785207B (en) Processing device
JP5372429B2 (en) How to divide a plate
TW201517205A (en) Processing method
TWI547333B (en) Laser cut apparatus
CN111564381A (en) Confirmation method
JP7222733B2 (en) Alignment method
TWI761609B (en) Wafer processing method
US20230141691A1 (en) Processing method
TW202339887A (en) Laser processing method
JP2004158822A (en) Precise cutting apparatus and cutting method