TWI793040B - Detachable testing device and holder thereof - Google Patents

Abstract

The present invention provides a detachable testing device and a holder thereof. The holder includes a circuit board, an outer frame, a connection layer, and a space transformer module. The outer frame is assembled to the circuit board so as to jointly form an accommodating space. The connection layer is disposed on the circuit board and includes a plurality of conductive pillars spaced apart from each other, and one end portion of each of the conductive pillars is abutted against and electrically coupled to the circuit board. The space transformer module is arranged in the accommodating space and includes a fan-out structure and a housing that is assembled to the circuit board and that presses against the fan-out structure. Another end portion of each of the conductive pillars is abutted against and electrically coupled to a wide pitch connection surface of the fan-out structure, and a narrow pitch connection surface of the fan-out structure is exposed from the housing.

Description

Detachable test device and its holder

The invention relates to a test device, in particular to a detachable test device and its holding seat.

The plurality of conductive probes included in the existing probe card testing device is connected to an adapter board, and then welded to a circuit board through the adapter board, so that the plurality of conductive probes can be electrically coupled connected to the circuit board. However, the manufacturing cost of the adapter board and the circuit board is high, so the welding method adopted by the existing probe card testing device is not conducive to the subsequent use of the adapter board and the circuit board (such as: maintenance and replacement) ).

Therefore, the inventor believes that the above-mentioned defects can be improved, Naite devoted himself to research and combined with the application of scientific principles, and finally proposed an invention with reasonable design and effective improvement of the above-mentioned defects.

The embodiment of the present invention provides a detachable testing device and its holding base, which can effectively improve the possible defects of the existing probe card testing device.

The embodiment of the present invention discloses a detachable test device, which includes: a holding seat, including: a circuit board; an outer frame, installed on the circuit board and surrounding together to form an accommodating space; a connecting layer, including There are a plurality of conductive adhesive posts spaced apart from each other, and each of the conductive adhesive posts has a first end and a second end on opposite sides; wherein, the connecting layer is arranged on the circuit board and Located in the accommodating space, the first ends of the plurality of conductive adhesive columns are abutted against and electrically coupled to the circuit board; and a turntable module is located in the accommodating space and It includes: a line fan-out structure, which has a wide-distance connection surface on the opposite side and a narrow-distance connection surface electrically coupled to the wide-distance connection surface; wherein, the plurality of conductive adhesive columns The second end abuts against and is electrically coupled to the wide-distance connecting surface; and a housing, installed on the circuit board and pressed against the circuit fan-out structure, and the narrow-distance connecting surface is exposed on the said wide-distance connecting surface. Outside the housing; and a probe head, including a positioning plate set and a plurality of conductive probes installed on the positioning plate set; wherein, the positioning plate set of the probe head is installed on the outer frame, and a plurality of the conductive probes are abutted against and electrically coupled to the narrow-pitch connection surface, and then electrically coupled to the circuit through the circuit fan-out structure and the plurality of conductive adhesive posts plate.

The embodiment of the present invention also discloses a holding seat for a detachable test device, which includes: a circuit board; an outer frame, which is installed on the circuit board and surrounds together to form an accommodating space; a connecting layer, including A plurality of conductive adhesive columns are provided, and each of the conductive adhesive columns has a first end and a second end on opposite sides; wherein, the connection layer is arranged on the circuit board and is located on the In the accommodating space, the first ends of the plurality of conductive glue columns are abutted against and electrically coupled to the circuit board; and a turntable module is located in the accommodating space and includes: A line fan-out structure has a wide-distance connection surface on the opposite side and a narrow-distance connection surface electrically coupled to the wide-distance connection surface; wherein, the second ends of the plurality of conductive adhesive columns part abutting against and electrically coupled to the wide-distance connection surface; and a housing, mounted on the circuit board and pressed against the circuit fan-out structure, and the narrow-distance connection surface is exposed to the housing outside.

To sum up, the detachable test device and its holding seat disclosed in the embodiments of the present invention electrically couple the rotating board module and the circuit board through the plurality of conductive adhesive columns on the connecting layer. , so that the existing welding method is replaced by the detachable connecting layer between the transfer plate module and the circuit board, so as to realize detachability for subsequent use (such as: maintenance and replacement or transferred to other components).

In order to further understand the characteristics and technical content of the present invention, please refer to the following detailed description and drawings related to the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than to make any statement on the scope of protection of the present invention. limit.

The following is a description of the implementation of the "detachable test device and its holder" disclosed in the present invention through specific specific examples. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are only for simple illustration, and are not drawn according to the actual size, which is stated in advance. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present invention.

It should be understood that although terms such as "first", "second", and "third" may be used herein to describe various elements or signals, these elements or signals should not be limited by these terms. These terms are mainly used to distinguish one element from another element, or one signal from another signal. In addition, the term "or" used herein may include any one or a combination of more of the associated listed items depending on the actual situation.

[Example 1]

Please refer to FIG. 1 to FIG. 6 , which are the first embodiment of the present invention. As shown in FIGS. 1 to 3 , the present embodiment discloses a detachable testing device, which includes a holding base 100 and a probe head 200 installed on the holding base 100 . It should be noted that although the holding base 100 is described as collaborating with the probe head 200 in this embodiment, the present invention is not limited thereto. For example, in other embodiments not shown in the present invention, the holding seat 100 can be used alone (for example: sold) or used in conjunction with other components according to design requirements. The structure of the holding base 100 and the probe head 200 will be introduced first, and then the connection relationship between them will be described in due course.

As shown in Figures 2 to 5, the holding base 100 includes a circuit board 1, an outer frame 2 mounted on the circuit board 1, a connection layer 3 arranged on the circuit board 1, and a The connecting layer 3 is a turntable module 4 located inside the outer frame 2 . Wherein, the circuit board 1 is electrically coupled to a test instrument (not shown in the figure), and the circuit board 1 and the outer frame 2 jointly surround and form an accommodating space S, which communicates with the outer frame 2 A box mouth 21 .

The connection layer 3 is located in the accommodating space S, and the connection layer 3 includes a bottom gasket 31 arranged on the circuit board 1 in this embodiment, a bottom gasket 31 arranged on the bottom gasket 31 A carrier sheet 32 , a plurality of conductive glue columns 33 disposed in the carrier sheet 32 , and a filling body 34 on the carrier sheet 32 , but the present invention is not limited thereto. For example, in other unillustrated embodiments of the present invention, at least one of the bottom gasket 31, the bearing sheet 32, and the filling body 34 can be omitted according to design requirements or be replaced by other methods. Component Replacement.

In more detail, the bottom gasket 31 is annular and has elasticity, and the outer part of the bearing piece 32 is disposed on the bottom gasket 31; that is, the bottom gasket 31 is clamped on the bearing piece 32 and the circuit board 1 , so that the carrier 32 , the circuit board 1 , and the bottom gasket 31 together enclose a sealed space.

Furthermore, a plurality of the conductive glue pillars 33 are elastic and arranged at intervals from each other, and each of the conductive glue pillars 33 has a first end portion 331 and a second end portion 332 on opposite sides. Wherein, the first end portion 331 and the second end portion 332 of each conductive glue column 33 respectively protrude from opposite sides of the carrier sheet 32 (such as: the carrier sheet in FIG. 2 32 bottom side and top side); that is to say, the central part between the first end 331 and the second end 332 of each conductive glue column 33 is embedded in the bearing Sheet 32 inside.

Further, the first ends 331 of the plurality of conductive glue columns 33 are located in the sealed space (that is, the bottom gasket 31 surrounds the first ends 331 of the plurality of conductive glue columns 33 ). one end 331 ), and the first ends 331 of the plurality of conductive glue pillars 33 abut and are electrically coupled to the circuit board 1 . Furthermore, the filling body 34 has elasticity and is located on the top side of the carrier sheet 32 and surrounds at least part of the plurality of second end portions 332. The height of the filling body 34 is preferably not greater than the height of any one of the second end portions 332 surrounded by it.

The turntable module 4 is located in the accommodating space S, and includes a housing 41 and a circuit fan-out structure 42 located in the housing 41 . Wherein, the housing 41 is installed on the circuit board 1 and pressed against the circuit fan-out structure 42, and in this embodiment, the housing 41 is installed on the circuit board 1 by screw locking, so as to The carrying sheet 32 (and the bottom gasket 31 ) is clamped between the housing 41 and the circuit board 1 , but the present invention is not limited thereto.

In this embodiment, the line fan-out structure 42 has an intermediary board 421, a fan-out adapter board 422 arranged on the intermediary board 421, and a top board arranged on the fan-out adapter board 422. Gasket 423, but the present invention is not limited thereto. For example, in other embodiments not shown in the present invention, at least one of the intermediate plate 421 and the top gasket 423 can be omitted or replaced by other components according to design requirements.

The intermediary board 421 has a wide-distance connection surface 4211 and a wide-distance inner connection surface 4212 located on opposite sides (such as: the bottom side and the top side of the intermediary board 421 in FIG. 2 ) and electrically coupled to each other; wherein , the spacing and arrangement between the plurality of first internal contact points 4213 of the wide-distance internal connection surface 4212 are approximately equal to the spacing and arrangement between the multiple contact points (not marked) of the wide-distance connecting surface 4211 cloth. Furthermore, the second end portions 332 of the plurality of conductive adhesive posts 33 are abutted against and electrically coupled to the wide-distance connection surface 4211, and the filling body 34 is located between the carrier sheet 32 and the Wide distance between the connecting surfaces 4211.

The fan-out adapter plate 422 has a narrow-distance connection surface 4221 and a fan-out adapter plate 4221 located on opposite sides (such as: the top side and the bottom side of the fan-out adapter plate 422 in FIG. 2 ) and electrically coupled to each other. Inner connection surface 4222; wherein, the spacing and arrangement between the plurality of second inner contact points 4223 of the fan-out inner connection surface 4222 are compared with the multiple contacts (not marked) of the narrow-pitch connection surface 4221 It is wider and dispersed, and it is roughly equal to the spacing and arrangement of the plurality of first internal contact points 4213 of the wide-distance internal contact surface 4212 .

Furthermore, in this embodiment, the intermediary board 421 and the fan-out adapter board 422 are respectively connected (for example: welded) through a plurality of the first internal contact points 4213 of the wide-distance internal contact surface 4212 A plurality of second internal contact points 4223 on the fan-out internal connection surface 4222 are used to electrically couple the wide-pitch connection surface 4211 and the narrow-pitch connection surface 4221 to each other.

Furthermore, the wide-distance connection surface 4211 and the narrow-distance connection surface 4221 are respectively located on opposite sides of the circuit fan-out structure 42 (such as: the bottom side and the top side of the circuit fan-out structure 42 in FIG. 2 ), and the narrow-distance connection surface 4221 is exposed outside the housing 41 . Wherein, the top washer 423 is ring-shaped and has elasticity, and is arranged on the outer part of the narrow-distance connection surface 4221 (such as: a plurality of the contacts of the narrow-distance connection surface 4221 are held by the top washer 423 surrounding and exposed outside the housing 41); that is to say, the top gasket 423 is clamped between the housing 41 and the fan-out adapter plate 422 (for example: the narrow-distance connecting surface 4221) between.

Accordingly, in this embodiment, the holding base 100 electrically couples the transfer board module 4 and the circuit board 1 through the plurality of conductive adhesive columns 33 of the connecting layer 3, so that The detachable connecting layer 3 is used to replace the existing welding method between the transfer plate module 4 and the circuit board 1, so as to realize mutual detachment for subsequent use (such as maintenance, replacement or transfer). to other components).

Furthermore, in this embodiment, the turntable module 4 clamps the fan-out adapter plate 422 by using the intermediate plate 421 and the housing 41, so that the detachable test device After the assembly is completed, the fan-out adapter plate 422 can reduce its horizontal deformation (that is, maintain a better levelness).

Furthermore, in this embodiment, the holding seat 100 can also be provided with elastic members (such as: the bottom washer 31, the filling body 34, the top washer 423, etc.) ), so that the corresponding components can produce expected deformation due to force balance, so that after the assembly of the detachable test device is completed, the horizontal deformation of the fan-out adapter plate 422 can be effectively reduced (that is, maintain a better level), and enable the multiple conductive adhesive columns 33 of the connection layer 3 to be stably connected to the turntable module 4 .

It should be noted that each of the conductive adhesive columns 33 in this embodiment can be further defined as an anisotropic conductive adhesive column, which can be indirectly controlled by the housing 41 through the circuit fan-out structure 42 A signal transmission path is formed between the circuit board 1 and the wide-distance connecting surface 4211, but the present invention is not limited thereto.

The probe head 200 includes a positioning plate set 201 and a plurality of conductive probes 202 installed on the positioning plate set 201, and a plurality of the conductive probes 202 are vertical probes ( vertical probe), but not limited to this. Wherein, the positioning plate group 201 of the probe head 200 is installed on the outer frame 2 (such as: the positioning plate group 201 is installed on the frame opening 21 of the outer frame 2, thereby approximately closing the accommodating space S), a plurality of conductive probes 202 abut and electrically coupled to the narrow-distance connecting surface 4221 of the turntable module 4 (a plurality of the contacts), and then pass through the The circuit fan-out structure 42 and the plurality of conductive adhesive posts 33 are electrically coupled to the circuit board 1 . It should be noted that the distance between any two of the second internal contacts 4223 of the fan-out adapter plate 422 is greater than the two electrically coupled points (through the narrow-distance connection surface 4221 ). The distance between the conductive probes 202 .

More specifically, the positioning plate group 201 includes a partition plate 2011 mounted on the outer frame 2, an upper guide plate 2012 disposed outside the partition plate 2011, and an upper guide plate 2012 disposed inside the partition plate 2011. The click guide 2013. Wherein, the lower guide plate 2013 is matched with the upper guide plate 2012 and its positions correspond to the rotating plate modules 4 respectively.

Furthermore, the upper guide plate 2012 and the lower guide plate 2013 that match each other are fixed with a plurality of the conductive probes 202 for abutting against and electrically coupled to the transfer plate module 4 . The narrow-distance connection surface 4221, but the present invention is not limited thereto. For example, as shown in FIG. 6 , the transfer board module 4 can be multiplied into multiples, and a plurality of the transfer board modules 4 are also arranged on the joint between the circuit board 1 and the outer frame 2 In the surrounding accommodating space S, the probe head 200 and the connection layer 3 are correspondingly adjusted.

[Example 2]

Please refer to FIG. 7 , which is the second embodiment of the present invention. Since this embodiment is similar to the first embodiment above, the similarities between the two embodiments will not be repeated, and the differences between this embodiment and the first embodiment above are roughly described as follows:

In this embodiment, the inner edge of the housing 41 has a first annular step surface 411 and a second annular step surface 412 located inside the first annular step surface 411, and the first ring The shaped stepped surface 411 presses against (the outer part of) the wide-distance inscribed surface 4212 of the intermediate plate 421 , and the second annular stepped surface 412 presses against the top gasket 423 . In addition, in other embodiments not shown in the present invention, if the top gasket 423 is not used in the line fan-out structure 42, the second annular stepped surface 412 of the housing 41 is pressed against the The fan-out adapter plate 422 (the outer part).

Accordingly, in this embodiment, the turntable module 4 can pass through the first annular step surface 411 and the second annular step surface 412 formed by the casing 41, so that the circuit fan The components in the output structure 42 (such as: the intermediate board 421, the fan-out adapter plate 422, and the top gasket 423) can be precisely positioned on the connection layer 3, thereby ensuring electrical connection with each other .

[Embodiment three]

Please refer to FIG. 8 , which is the third embodiment of the present invention. Since this embodiment is similar to the first embodiment above, the similarities between the two embodiments will not be repeated, and the differences between this embodiment and the first embodiment above are roughly described as follows:

In this embodiment, the circuit fan-out structure 42 does not include the intermediary board 421 described in Embodiment 1; that is to say, the circuit fan-out structure 42 may be only a single board (such as: The fan-out adapter plate 422) or only includes the fan-out adapter plate 422 and the top gasket 423, but not limited thereto.

Specifically, the circuit fan-out structure 42 has the wide-distance connection surface 4211 on the opposite side and the narrow-distance connection surface 4221 electrically coupled to the wide-distance connection surface 4211 . That is to say, the fan-out internal connection surface 4222 of the fan-out adapter board 422 in the first embodiment is used as the wide-distance connection surface 4211 of the circuit fan-out structure 42 here. Wherein, the second ends 332 of the plurality of conductive adhesive posts 33 are abutted against and electrically coupled to the wide-distance connecting surface 4211, and the plurality of conductive probes 202 are abutted against and electrically coupled to The narrow-pitch connecting surface 4221 is further electrically coupled to the circuit board 1 through the circuit fan-out structure 42 and the plurality of conductive glue posts 33 .

In addition, in this embodiment, the housing 41 is formed with a plurality of first positioning columns 413 penetrating the connection layer 3 and the circuit board 1 , and a plurality of positioning columns 413 penetrating the rotating plate module 4 . A second positioning post 414 is provided so that the connection layer 3 and the turntable module 4 can be accurately arranged on the circuit board 1 through the housing 41 .

[Technical effects of the embodiments of the present invention]

To sum up, the detachable test device and its holding seat disclosed in the embodiments of the present invention electrically couple the rotating board module and the circuit board through the plurality of conductive adhesive columns on the connecting layer. , so that the existing welding method is replaced by the detachable connecting layer between the transfer plate module and the circuit board, so as to realize detachability for subsequent use (such as: maintenance and replacement or transferred to other components).

Furthermore, the turntable module clamps the fan-out adapter board by using the intermediate board and the housing, so that after the assembly of the detachable test device is completed, the fan-out The adapter plate can reduce its horizontal deformation (that is, maintain a better levelness).

Furthermore, the holding seat can also be provided with elastic members (such as: the bottom washer, the filling body, the top washer) at appropriate positions between multiple members, so that the corresponding members can be force balance to produce expected deformation, so that after the assembly of the detachable test device is completed, the horizontal deformation of the fan-out adapter plate can be effectively reduced (that is, to maintain a better levelness), and The plurality of conductive glue columns of the connection layer can be stably connected to the transfer plate module.

The content disclosed above is only a preferred feasible embodiment of the present invention, and does not limit the patent scope of the present invention, so all equivalent technical changes made by using the description and drawings of the present invention are included in the patent scope of the present invention Inside.

100: holding seat 1: circuit board 2: Outer frame 21: frame mouth 3: Connection layer 31: Bottom washer 32: Carrier sheet 33: Conductive adhesive column 331: first end 332: second end 34: filling body 4: Transfer board module 41: shell 411: The first annular step surface 412: Second annular step surface 413: The first positioning column 414: The second positioning column 42: Line fan-out structure 421:Intermediate board 4211: wide distance connecting surface 4212: Wide distance inner joint surface 4213: The first inner contact point 422: Fan-out adapter board 4221: narrow distance connection surface 4222: Fan-out internal interface 4223: The second inner contact point 423: top washer S: storage space 200: probe head 201: Positioning plate group 2011: Partition board 2012: Upper guide 2013: Bottom guide 202: Conductive probe

FIG. 1 is a three-dimensional schematic diagram of a detachable testing device according to Embodiment 1 of the present invention.

FIG. 2 is a schematic cross-sectional view of FIG. 1 along the section line II-II.

FIG. 3 is an exploded schematic view of FIG. 1 .

FIG. 4 is an exploded schematic diagram of the connection layer and the transfer plate module in FIG. 3 .

FIG. 5 is an exploded view from another perspective of the connection layer and the transfer plate module in FIG. 3 .

FIG. 6 is a schematic cross-sectional view of another form of the detachable testing device according to Embodiment 1 of the present invention.

FIG. 7 is a schematic cross-sectional view of a detachable testing device according to Embodiment 2 of the present invention.

FIG. 8 is a schematic cross-sectional view of a detachable testing device according to Embodiment 3 of the present invention.

100: holding seat

1: circuit board

2: Outer frame

21: frame mouth

3: Connection layer

31: Bottom washer

32: Carrier sheet

33: Conductive adhesive column

331: first end

332: second end

34: filling body

4: Transfer board module

41: Shell

42: Line fan-out structure

421:Intermediate board

4211: wide distance connecting surface

4212: Wide distance inner joint surface

4213: The first inner contact point

422: Fan-out adapter board

4221: narrow distance connection surface

4222: Fan-out internal interface

4223: The second internal contact point

423: top washer

S: storage space

200: probe head

201: Positioning plate group

2011: Partition board

2012: Upper guide

2013: Bottom guide

202: Conductive probe

Claims (10)

A detachable test device, which includes: a holding seat, including: a circuit board; an outer frame, installed on the circuit board and together to form an accommodating space; a connecting layer, including: a plurality of conductive Adhesive pillars are spaced apart from each other, and each of the conductive adhesive pillars has a first end and a second end on opposite sides; and a carrier sheet, in which a plurality of the conductive adhesive pillars are arranged, and The first end and the second end of each of the conductive adhesive posts respectively protrude from opposite sides of the carrier sheet; wherein, the connecting layer is arranged on the circuit board and located on the In the accommodating space, the first ends of the plurality of conductive glue columns are abutted against and electrically coupled to the circuit board; and a turntable module is located in the accommodating space and includes : A line fan-out structure, having a wide-distance connection surface and a narrow-distance connection surface on opposite sides, and the narrow-distance connection surface is electrically coupled to the wide-distance connection surface; wherein, a plurality of the conductive The second end of the glue column abuts against and is electrically coupled to the wide-distance connecting surface; and a housing is installed on the circuit board and pressed against the circuit fan-out structure, and the narrow-distance The connection surface is exposed outside the housing; and a probe head includes a positioning plate set and a plurality of conductive probes installed on the positioning plate set; wherein, the positioning plate set of the probe head Installed on the outer frame, and a plurality of the conductive probes are abutted against and electrically coupled to the narrow-distance connecting surface, and then electrically coupled with the plurality of conductive adhesive posts through the circuit fan-out structure catch on the circuit board. The detachable test device according to claim 1, wherein the connecting layer includes: a bottom gasket clamped between the carrier sheet and the circuit board, and the bottom gasket is surrounded by a plurality of The outer side of the first end of the conductive glue column; wherein, the bearing sheet and the bottom gasket are clamped between the housing and the circuit board. The detachable test device according to claim 1, wherein the carrier sheet is clamped between the housing and the circuit board, and the connection layer includes: a filling body located on the carrier sheet Between the wide-distance connection surface; wherein, the filling body surrounds at least part of the plurality of second end portions. The detachable testing device according to claim 3, wherein the height of the filling body is not greater than the height of any one of the second ends it surrounds. The detachable test device according to claim 1, wherein the circuit fan-out structure includes: an interposer having the wide-distance connection surfaces and a wide-distance inner plane located on opposite sides and electrically coupled to each other and a fan-out adapter plate, which has the narrow-pitch connection surface and a fan-out internal connection surface located on opposite sides and electrically coupled to each other, and a plurality of first internal connection surfaces of the wide-distance internal connection surface The contacts are respectively connected to a plurality of second internal contacts on the fan-out internal contact surface. The detachable test device according to claim 5, wherein the circuit fan-out structure includes a top pad clamped between the housing and the fan-out adapter plate lock up. The detachable test device according to claim 6, wherein the inner edge of the housing has a first annular step surface and a second annular step surface, and the first annular step surface is pressed against the The wide-distance internal contact surface of the intermediate plate, and the second annular step surface is pressed against the top gasket. The detachable test device according to claim 1, wherein each of the conductive adhesive columns is further defined as an anisotropic conductive adhesive column, which is pressed by the housing through the fan-out structure of the line to the A signal transmission path is formed between the circuit board and the wide-distance connecting surface. A holding seat for a detachable test device, which includes: a circuit board; an outer frame, which is installed on the circuit board and surrounds together to form an accommodating space; a connecting layer, including: a plurality of conductive glue columns, connected to each other arranged at intervals, and each of the conductive glue columns has a first end and a second end on opposite sides; and a carrier sheet, in which a plurality of the conductive glue columns are arranged, and each of the The first end and the second end of the conductive adhesive column respectively protrude from opposite sides of the carrier sheet; wherein, the connection layer is arranged on the circuit board and located in the accommodating space Inside, the first ends of the plurality of conductive glue columns are abutted against and electrically coupled to the circuit board; and a turntable module is located in the accommodation space and includes: a circuit fan Out structure, with a wide connection surface on the opposite side and a narrow and the narrow-pitch connection surface is electrically coupled to the wide-pitch connection surface; wherein, the second ends of the plurality of conductive adhesive posts abut against and are electrically coupled to the wide-pitch connection surface. a connection surface; and a housing, installed on the circuit board and pressed against the circuit fan-out structure, and the narrow-distance connection surface is exposed outside the housing. The holding seat of the detachable test device according to claim 9, wherein the connection layer includes: a bottom gasket, clamped between the carrier sheet and the circuit board, and the bottom gasket surrounds On the outside of the first ends of the plurality of conductive glue posts; wherein, the bearing sheet and the bottom gasket are clamped between the housing and the circuit board; and a filling body is located Between the carrying sheet and the wide-distance connection surface; wherein, the filling body surrounds at least part of the plurality of second end portions, and the height of the filling body is not greater than any one of the surrounding parts the height of the second end.

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