TWI772011B - Vacuum reflow method and device - Google Patents
Vacuum reflow method and device Download PDFInfo
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- TWI772011B TWI772011B TW110115991A TW110115991A TWI772011B TW I772011 B TWI772011 B TW I772011B TW 110115991 A TW110115991 A TW 110115991A TW 110115991 A TW110115991 A TW 110115991A TW I772011 B TWI772011 B TW I772011B
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Abstract
本發明提供一種真空式回焊方法,步驟包含:準備具有焊墊的載板,在焊墊上設置焊料塊;將載板放入一真空式回焊裝置的容置空間;進行抽真空程序,在維持容置空間的真空狀態之情形下對焊料塊進行鐳射加溫程序,以對焊料塊進行回焊;真空式回焊裝置的殼體具有容置空間及一容置平台,殼體上還具有連通容置空間且以一透光封板封閉的第一開口及密合設置真空吸嘴的第二開口,真空吸嘴供連接抽真空設備;在真空中進行焊料回焊,排除焊料中的氣泡、避免氣體流動造成焊料偏移,且鐳射加溫效率高,避免載板因反覆加溫影響穩定性及連接品質。The invention provides a vacuum type reflow soldering method. The steps include: preparing a carrier board with solder pads, and arranging solder blocks on the solder pads; placing the carrier board in an accommodating space of a vacuum type reflow soldering device; Under the condition of maintaining the vacuum state of the accommodating space, a laser heating process is performed on the solder block to reflow the solder block; A first opening that communicates with the accommodating space and is closed by a light-transmitting sealing plate and a second opening that is closely arranged with a vacuum suction nozzle, the vacuum suction nozzle is used for connecting vacuum equipment; solder reflow is performed in a vacuum to remove air bubbles in the solder , Avoid the solder offset caused by gas flow, and the laser heating efficiency is high, avoiding the stability and connection quality of the carrier board due to repeated heating.
Description
一種回焊方法及裝置,尤指一種在真空環境下進行真空式回焊的方法及用於該方法的裝置。 A reflow method and device, especially a method for vacuum reflow in a vacuum environment and a device used for the method.
一封裝完成的晶片成品主要包含有封裝外殼、晶片本體(裸晶)與載板。該晶片本體設置於該載板的其中一表面上,晶片的接腳藉由錫球連接於該載板的該表面上的焊墊,並通過內埋於該載板中的線路電性連接設置於該載板相對的另一表面的另一焊墊。其中,該載板的該等焊墊上需先設置錫球,再藉由該錫球連接晶片的接腳或將該晶片成品連接至電路板。 A packaged chip product mainly includes a package shell, a chip body (bare die) and a carrier. The chip body is disposed on one surface of the carrier board, and the pins of the chip are connected to the pads on the surface of the carrier board by solder balls, and are electrically connected to the circuit embedded in the carrier board. Another bonding pad on the opposite surface of the carrier board. Wherein, solder balls need to be disposed on the solder pads of the carrier board, and then the solder balls are used to connect the pins of the chip or connect the finished chip to the circuit board.
而為了確保晶片本體、載板與電路板之間的固定及電性連接效果,如何有效率且高品質的在用於電性連接外部接點的焊墊上設置錫球是一關鍵製程。習知的錫球設置製程中,可先在載板的焊墊上藉由印刷方式設置錫膏(Solder Print)或者進行錫球植球(Ball Mount);接著,將暫時黏合有該錫膏或錫球的該載板置入回焊爐進行回焊程序(Reflow),以對在該載板及其上的錫膏或錫球進行加溫,將錫膏或錫球熔化;最後,冷卻(Cooling)該載板,使焊墊上的錫膏或錫球固定成型。 In order to ensure the effect of fixation and electrical connection between the chip body, the carrier board and the circuit board, how to efficiently and high-quality arrange solder balls on the pads for electrically connecting external contacts is a key process. In the conventional solder ball placement process, solder paste (Solder Print) or solder ball mounting (Ball Mount) can be placed on the pads of the carrier first by printing; then, the solder paste or tin is temporarily adhered. The carrier of the balls is placed in a reflow oven to perform a reflow process (Reflow) to heat the carrier and the solder paste or solder balls on it to melt the solder paste or solder balls; finally, cooling (Cooling) ) the carrier board to fix the solder paste or solder balls on the pads.
然而,請參閱圖4A所示,以錫球63為例,在焊墊62上進行錫球植球時,錫球63內通常會有微小氣泡63A存在;請進一步參閱圖4B所示,當進行回焊程序使得固態的錫球63熔化為液態時,該等微小氣泡63A在液化錫球內
會流動並聚集成較大的氣泡,並在冷卻後,如圖4B所示,該回焊後錫球63’保留了較大氣泡63B
However, please refer to FIG. 4A , taking the
所述較大氣泡63B在後續製程或者完成品使用中容易造成焊接結構不穩定的問題,例如在反覆溫度變化中因熱脹冷縮導致焊錫產生裂隙。因此,現有的載板錫球設置製程有待進一步改良。
The
有鑑於現有的錫球設置方法容易造成錫球內殘留氣泡的問題,本發明提供一種真空式回焊方法,該方法包含以下步驟:準備一載板,該載板上具有一焊墊;在該載板的焊墊上設置一焊料塊;準備一真空式回焊裝置,該真空式回焊裝置具有一容置空間,且該容置空間內有一容置平台;將該載板置入該真空式回焊裝置中的該容置平台上,並使該焊墊外露於該容置空間;對該容置空間進行一抽真空程序,使該真空式回焊裝置的容置空間內維持一真空狀態;對該焊墊上的焊料塊進行一鐳射加溫程序以對該焊料塊進行回焊。 In view of the problem that the existing solder ball setting method is easy to cause residual bubbles in the solder ball, the present invention provides a vacuum type reflow method, the method includes the following steps: preparing a carrier board with a solder pad; A solder block is arranged on the solder pad of the carrier board; a vacuum type reflow device is prepared, the vacuum type reflow device has an accommodating space, and an accommodating platform is located in the accommodating space; the carrier board is placed in the vacuum type reflow soldering device on the accommodating platform in the reflow device, and expose the solder pad to the accommodating space; perform a vacuuming procedure on the accommodating space to maintain a vacuum state in the accommodating space of the vacuum type reflow device ; Perform a laser heating process on the solder block on the pad to reflow the solder block.
此外,本發明提供用於該真空式回焊方法的真空式回焊裝置,包含有:一殼體,具有一容置空間與一容置平台,該殼體上具有分別連通該容置空間的一第一開口及一第二開口;一透光封板,設置於該殼體的該第一開口並封閉該第一開口;以及一真空吸嘴,密合設置於該殼體的該第二開口。 In addition, the present invention provides a vacuum type reflow device for the vacuum type reflow method, which includes: a casing having an accommodating space and an accommodating platform, and the casing is provided with accommodating spaces respectively communicating with the accommodating space. a first opening and a second opening; a light-transmitting sealing plate disposed on the first opening of the casing and closing the first opening; and a vacuum suction nozzle tightly disposed on the second opening of the casing Open your mouth.
真空式回焊裝置用於容置進行回焊程序的載板。該容置平台用於放置該載板,並使得該載板設置焊料塊的一面外露於該容置空間中並朝向該第一開口。該第一開口由該透光封板封閉,以供鐳射光源通過該第一開口照射於該載板上的焊料塊以進行加溫。該真空吸嘴設置於該第二開口中,用於連接一外部的抽真空設備。當載板放置於該容置空間中的容置平台上後,該抽真空機台連接至該真空吸嘴,以對該容置空間進行抽真空,並維持其真空狀態。 The vacuum type reflow unit is used to accommodate the carrier board for the reflow process. The accommodating platform is used for placing the carrier board, and the side of the carrier board on which the solder bumps are disposed is exposed in the accommodating space and faces the first opening. The first opening is closed by the light-transmitting sealing plate, so that the laser light source irradiates the solder block on the carrier board through the first opening for heating. The vacuum suction nozzle is arranged in the second opening and is used for connecting to an external vacuuming device. After the carrier plate is placed on the accommodating platform in the accommodating space, the vacuuming machine is connected to the vacuum suction nozzle to evacuate the accommodating space and maintain its vacuum state.
本發明的真空式回焊方法係將要進行回焊程序的載板連同預先設置於焊墊上的焊料塊一併置入該真空式回焊裝置的容置空間內,進行一抽真空程序,並在維持該容置空間的真空狀態的情形下,以鐳射加溫程序直接對焊墊上的焊料塊進行加溫。在真空的容置空間中,當該焊料塊熔化為液態時,由於容置空間中為真空而具有較低氣壓,焊料塊中的氣泡會向焊料塊表面移動並逸散至容置空間中。如此一來,當完成鐳射加溫程序時,由於液態焊料中的氣泡被排出,焊料塊溫度降低而凝固後,焊料塊中的氣泡比例會大幅降低,使得完成回焊程序的焊料塊結構穩定,降低在後續製程或使用中因溫度變化,焊料塊及氣泡膨脹係數不同而導致焊料塊出現裂隙之風險。此外,由於係使用鐳射直接對焊墊上的焊料塊進行加溫,而非傳統回焊程序對整塊載板進行烘烤,鐳射熱能主要集中於焊料塊上,載板本身不會受到大範圍或整體加熱,減少載板本身被加溫及降溫之次數,並降低載板因溫度變化而導致翹曲或線路受損之風險。 In the vacuum reflow method of the present invention, the carrier to be reflowed together with the solder blocks pre-set on the solder pads are placed into the accommodating space of the vacuum reflow device, and a vacuum process is performed, and the maintenance When the accommodating space is in a vacuum state, the solder bumps on the solder pads are directly heated by a laser heating procedure. In a vacuum accommodating space, when the solder block is melted into a liquid state, the air bubbles in the solder block will move to the surface of the solder block and escape into the accommodating space due to the vacuum in the accommodating space having a lower air pressure. In this way, when the laser heating process is completed, the air bubbles in the liquid solder are discharged, and after the temperature of the solder block decreases and solidifies, the proportion of air bubbles in the solder block will be greatly reduced, so that the solder block structure after the reflow process is completed is stable. Reduce the risk of cracks in the solder bumps due to temperature changes, different expansion coefficients of solder bumps and bubbles in subsequent processes or use. In addition, since the laser is used to directly heat the solder bumps on the solder pads, rather than the traditional reflow process to bake the entire carrier board, the laser heat energy is mainly concentrated on the solder bumps, and the carrier board itself will not be affected by large-scale or Overall heating reduces the number of times the carrier itself is heated and cooled, and reduces the risk of warpage or circuit damage caused by temperature changes.
11:載板 11: Carrier board
12:焊墊 12: Solder pads
20:焊料塊 20: Solder bumps
20’:液態焊料塊 20': Liquid solder bump
20A:微小氣泡 20A: Micro bubbles
20B:氣泡 20B: Bubbles
30:真空式回焊裝置 30: Vacuum reflow device
31:殼體 31: Shell
300:容置空間 300: accommodating space
311:容置平台 311: accommodating platform
312:第一開口 312: The first opening
313:第二開口 313: Second Opening
32:透光封板 32: Translucent sealing plate
33:真空吸嘴 33: Vacuum nozzle
40:真空設備 40: Vacuum equipment
50:鐳射設備 50: Laser equipment
61:載板 61: carrier board
62:焊墊 62: Solder pad
63:錫球 63: Tin Ball
63’:液態錫球 63': liquid solder ball
63A:微小氣泡 63A: Micro bubbles
63B:較大的氣泡 63B: Larger bubbles
圖1A至1H係本發明的真空式回焊方法的流程示意圖。 1A to 1H are schematic flowcharts of the vacuum reflow method of the present invention.
圖2A至2C係本發明的真空式回焊方法中載板及焊料塊的局部剖面示意圖。 2A to 2C are partial cross-sectional schematic views of the carrier board and the solder bump in the vacuum reflow method of the present invention.
圖3係本發明的真空式回焊裝置的一較佳實施例的剖面示意圖 3 is a schematic cross-sectional view of a preferred embodiment of the vacuum type reflow device of the present invention
圖4A及4B習知技術的回焊製程中載板及錫球的局部剖面示意圖。 4A and 4B are schematic partial cross-sectional views of the carrier board and the solder balls in the reflow process of the prior art.
請參閱圖1A至1F所示,本發明的真空式回焊方法包含以下步驟::如圖1A所示,準備一載板11,該載板11的一表面上設置有至少一焊墊12,圖1A是以複數焊墊12為例;如圖1B所示,在該載板11的焊墊12上設置一焊料塊20;較佳的,該焊料塊20係以一印刷成型製程或一植球製程設置於該載板11的焊墊12上,該焊料塊20例如為錫塊或錫球;如圖1C所示,準備一真空式回焊裝置30,該真空式回焊裝置30具有一容置空間300,且該容置空間300內有一容置平台311;如圖1D所示,將該載板11置入該真空式回焊裝置30中的該容置平台311上,使該焊墊12外露於該容置空間300;如圖1E所示,對該容置空間300進行一抽真空程序,使該真空式回焊裝置30的容置空間300內維持一真空狀態;如圖1F所示,對該焊墊12上的焊料塊20進行一鐳射加溫程序,以對該焊料塊20進行回焊,使該焊料塊20熔化為液態並能附著於該焊墊12上;此一步驟較佳係使用一鐳射設備50產生一鐳射光束,通過該真空式回焊裝置30的一透光封板32對該容置空間300中的載板10的焊墊12上的焊料塊20進行加溫。
Referring to FIGS. 1A to 1F , the vacuum reflow method of the present invention includes the following steps: as shown in FIG. 1A , prepare a
回焊後,如圖1G所示,解除該容置空間300的真空狀態;再如圖1H所示,將該載板11由該容置空間300中取出。
After reflow, as shown in FIG. 1G , the vacuum state of the
請參閱圖1C所示,本發明的真空式回焊裝置30可包含有一殼體31、一透光封板32及一真空吸嘴33。該殼體31內有一容置空間300,且該殼體
31內有一容置平台311。該殼體31上具有分別連通該容置空間300的一第一開口312及一第二開口313,且該容置平台311的一設置面可面向該第一開口312,該設置面用於放置該載板11,使得該載板11設置有焊料塊20的表面朝向該第一開口312。該透光封板32設置在第一開口312以用於封閉該第一開口312,並供鐳射光通過以照射於容置平台311上的載板1。較佳的,該透光封板32與該第一開口312之間係設置有一密封環或一密封膠條等,以達到緊密封閉該第一開口321並維持容置空間300中的真空狀態之目的。該真空吸嘴33係密合地設置於該殼體31的第二開口313,用於連接一真空設備40。
Referring to FIG. 1C , the vacuum
在一實施例中,該透光封板32係開闔式的設置於該第一開口321,以供開啟時置入或取出該載板11,閉合時封閉該第一開口321以保證該容置空間300的真空狀態。在另一實施例中,該透光封板32係固接式的設置於該第一開口321以封閉該第一開口312,該殼體31上另設有一取放開口(圖未示)以供置入及取出該載板11。該取放開口可根據治具或製程機台需求設置,本發明對此不加以限制。
In one embodiment, the light-transmitting
須注意的是,本發明所述的「真空狀態」係指該容置空間300中的氣壓小於大氣壓力之狀態,只要能夠達到使得熔解狀態之焊料塊12中的氣泡因壓力差而向表面移動即可,本發明對此不加以限制。較佳的,本發明的真空狀態係真空度為0.3atm(標準大氣壓)~0.5atm。
It should be noted that the "vacuum state" in the present invention refers to a state in which the air pressure in the
請參閱圖2A所示,當焊料塊20設置於該焊墊12上時,其中會包含多數微小氣泡20A。如圖2B所示,當該載板11置於真空狀態的容置空間300中,並以鐳射加溫進行熔化時,由於該容置空間300中的低壓真空狀態,該等微小氣泡20A根據壓力差向焊料塊20表面移動,並逸入該容置空間300中。當完成鐳射加溫程序的液態焊料塊20’冷卻後,如圖2C所示,焊料塊20中將僅有比
例非常低的氣泡或沒有明顯氣泡,使得該焊料塊20在後續進行焊接及使用中具有穩定的品質。
Referring to FIG. 2A , when the
請參閱圖3所示,較佳的,該真空式回焊裝置30還包含有一隔熱墊34,設置於該容置平台311上,而該載板11係設置於該隔熱墊34上。當進行鐳射加溫程序時,該隔熱墊34隔絕載板11與該殼體31的容置平台311,避免熱能由焊料塊20通過焊墊12及載板11本體傳導至殼體31,進一步提高鐳射加溫程序的效能。
Referring to FIG. 3 , preferably, the vacuum
本發明的真空式回焊方法及其裝置除了具有排除焊料塊中的氣泡、降低載板受熱之優點外,更具有以下效益:鐳射光束僅對需要熔化的焊料塊部分加熱,溫度控制容易,且由於非烘烤加溫整塊載板,減少能源浪費提高能源使用效益;真空環境下進行回焊,而非傳統回焊技術中在氮氣環境下進行回焊,因此無須耗用氮氣,降低回焊製程成本;且由於是在真空環境下回焊,避免了環境氣體流動導致焊料塊偏移之風險。 In addition to the advantages of removing air bubbles in the solder block and reducing the heating of the carrier, the vacuum reflow method and device of the present invention have the following advantages: the laser beam only heats the part of the solder block that needs to be melted, the temperature control is easy, and Due to the non-baking and heating of the entire carrier board, energy waste is reduced and energy efficiency is improved; reflow is performed in a vacuum environment, rather than in a nitrogen environment in traditional reflow technology, so there is no need to consume nitrogen, reducing reflow soldering Process cost; and because it is reflowed in a vacuum environment, the risk of solder bumps shifting due to ambient gas flow is avoided.
綜上所述,本發明的真空式回焊方法解決了焊料塊在焊墊上進行回焊後殘留氣泡的問題,更進一步降低了載板本身反覆受熱之風險,同時減少了回焊製程中所需的耗能,以及提高完成回焊製程的焊料塊之穩定度。 To sum up, the vacuum reflow method of the present invention solves the problem of residual air bubbles after the solder bumps are reflowed on the pads, further reduces the risk of repeated heating of the carrier itself, and reduces the reflow process. energy consumption, and improve the stability of the solder bumps that complete the reflow process.
上所述僅是本發明的較佳實施例而已,並非對本發明做任何形式上的限制,雖然本發明已以較佳實施例揭露如上,然而並非用以限定本發明,任何熟悉本專業的技術人員,在不脫離本發明技術方案的範圍內,當可利用上述揭示的技術內容做出些許更動或修飾為等同變化的等效實施例,但凡是未脫離本發明技術方案的內容,依據本發明的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾,均仍屬於本發明技術方案的範圍內。 The above are only preferred embodiments of the present invention, and are not intended to limit the present invention in any form. Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Personnel, within the scope of not departing from the technical solution of the present invention, can make some changes or modifications to equivalent examples of equivalent changes by using the technical content disclosed above, but all content that does not depart from the technical solution of the present invention, according to the present invention Any simple modifications, equivalent changes and modifications made to the above embodiments still fall within the scope of the technical solutions of the present invention.
11:載板 11: Carrier board
12:焊墊 12: Solder pads
20:焊料塊 20: Solder bumps
31:殼體 31: Shell
300:容置空間 300: accommodating space
311:容置平台 311: accommodating platform
312:第一開口 312: The first opening
32:透光封板 32: Translucent sealing plate
33:真空吸嘴 33: Vacuum nozzle
40:真空設備 40: Vacuum equipment
50:鐳射設備 50: Laser equipment
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TW110115991A TWI772011B (en) | 2021-05-04 | 2021-05-04 | Vacuum reflow method and device |
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TW110115991A TWI772011B (en) | 2021-05-04 | 2021-05-04 | Vacuum reflow method and device |
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TWI772011B true TWI772011B (en) | 2022-07-21 |
TW202243782A TW202243782A (en) | 2022-11-16 |
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Citations (6)
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TW201017786A (en) * | 2008-06-30 | 2010-05-01 | Hitachi Plant Technologies Ltd | Solder ball check and repair device and solder ball check and repair method |
TW201018340A (en) * | 2008-10-30 | 2010-05-01 | Nan Ya Printed Circuit Board | Method for improving yield of solder bumps |
CN103311204A (en) * | 2012-03-06 | 2013-09-18 | 特里奎恩特半导体公司 | Flip-chip packaging techniques and configurations |
CN107734869A (en) * | 2017-11-16 | 2018-02-23 | 无锡市同步电子制造有限公司 | Superposing type BGA Rework Technics |
US20200075522A1 (en) * | 2016-10-19 | 2020-03-05 | International Business Machines Corporation | Fabrication of solder balls with injection molded solder |
US20200084893A1 (en) * | 2018-09-07 | 2020-03-12 | Lumileds Holding B.V. | Method for applying electronic components |
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2021
- 2021-05-04 TW TW110115991A patent/TWI772011B/en active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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TW201017786A (en) * | 2008-06-30 | 2010-05-01 | Hitachi Plant Technologies Ltd | Solder ball check and repair device and solder ball check and repair method |
TW201018340A (en) * | 2008-10-30 | 2010-05-01 | Nan Ya Printed Circuit Board | Method for improving yield of solder bumps |
CN103311204A (en) * | 2012-03-06 | 2013-09-18 | 特里奎恩特半导体公司 | Flip-chip packaging techniques and configurations |
US20200075522A1 (en) * | 2016-10-19 | 2020-03-05 | International Business Machines Corporation | Fabrication of solder balls with injection molded solder |
CN107734869A (en) * | 2017-11-16 | 2018-02-23 | 无锡市同步电子制造有限公司 | Superposing type BGA Rework Technics |
US20200084893A1 (en) * | 2018-09-07 | 2020-03-12 | Lumileds Holding B.V. | Method for applying electronic components |
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