TWI763861B - Grinding device - Google Patents
Grinding deviceInfo
- Publication number
- TWI763861B TWI763861B TW107119151A TW107119151A TWI763861B TW I763861 B TWI763861 B TW I763861B TW 107119151 A TW107119151 A TW 107119151A TW 107119151 A TW107119151 A TW 107119151A TW I763861 B TWI763861 B TW I763861B
- Authority
- TW
- Taiwan
- Prior art keywords
- grinding
- water
- grinding water
- grindstone
- wafer
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
- B24B37/107—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/02—Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
- B24B55/03—Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant designed as a complete equipment for feeding or clarifying coolant
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/02—Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Abstract
[課題]提供一種易於將磨削水排出到環狀地配置的磨石的外側的磨削裝置。 [解決手段]磨削裝置具備磨削水供給機構,磨削水供給機構具備貫通路及磨削水噴嘴,該貫通路是貫通於主軸與安裝座、該磨削水噴嘴是配設於安裝座的裝設面側的中心且連通於貫通路來放出磨削水,磨削水噴嘴具備從安裝座垂下的筒體、形成於筒體的自由端部的放水部、及將於貫通路流下之磨削水誘導成順沿於筒體的內壁而流動,放水部因為具備有使磨削水以逐漸擴展的方式放出的倒角部,所以可以朝向環狀地配置的磨石的全周的前端部分均勻地供給磨削水,而變得易於從晶圓的被磨削面與磨石之間的細微的間隙將磨削水排出到磨石的外側。[Problem] To provide a grinding device that can easily discharge grinding water to the outside of an annularly arranged grindstone. [Solution] The grinding device includes a grinding water supply mechanism, the grinding water supply mechanism includes a through passage that penetrates through the spindle and the mount, and the grinding water nozzle is arranged on the mount The center of the mounting surface side is connected to the through passage to discharge grinding water, and the grinding water nozzle includes a cylindrical body suspended from the mounting seat, a water discharge portion formed on the free end of the cylindrical body, and a through passage flowing down. Grinding water is induced to flow along the inner wall of the cylindrical body, and the water discharge portion has a chamfered portion that discharges grinding water gradually, so it can be directed toward the entire circumference of the annularly arranged grindstone. The tip portion is uniformly supplied with grinding water, and it becomes easy to discharge the grinding water to the outside of the grindstone from the fine gap between the surface to be ground of the wafer and the grindstone.
Description
發明領域 Field of Invention
本發明是有關於一種磨削晶圓的磨削裝置。 The present invention relates to a grinding device for grinding wafers.
發明背景 Background of the Invention
當進行磨削而使晶圓變薄時,因為有晶圓的剛性降低而在後續的步驟中使晶圓的操作處理變得困難的問題,所以已有例如下述的磨削方法被提出:使用直徑比晶圓的直徑更小且將磨石環狀地配置的磨削輪,在晶圓的背面當中,於對應於形成有複數個元件的元件區域之區域形成凹部,並且在對應於元件區域之外周側的外周剩餘區域之區域形成環狀的凸部(參照例如下述的專利文獻1)。 When the wafer is thinned by grinding, there is a problem that the rigidity of the wafer decreases and the handling of the wafer becomes difficult in the subsequent steps. Therefore, for example, the following grinding methods have been proposed: Using a grinding wheel whose diameter is smaller than the diameter of the wafer and in which the grinding stones are arranged annularly, in the back surface of the wafer, a concave portion is formed in a region corresponding to an element region where a plurality of elements are formed, and a concave portion is formed in an area corresponding to the element An annular convex portion is formed in the region of the outer peripheral remaining region on the outer peripheral side of the region (for example, refer to the following Patent Document 1).
先前技術文獻 prior art literature
專利文獻 Patent Literature
專利文獻1:日本專利特開2013-165287號公報 Patent Document 1: Japanese Patent Laid-Open No. 2013-165287
發明概要 Summary of Invention
但是,在上述磨削方法中,是將磨削輪配置在晶圓的表面內,且一邊對晶圓及磨石供給磨削水,一邊讓環狀地 配置於磨削輪的下部的半周量的磨石接觸於晶圓的背面而進行磨削。此時,因為剩餘的半周量的磨石的磨削面與晶圓的背面之間的間隙較小,所以供給到磨石的內側的磨削水難以排放到磨石的外側。因此,有磨削水滯留在磨石的內側,而無法充分地進行磨石的冷卻,並因包含在所滯留的磨削水中的磨削屑而也有對磨削面造成損傷之問題、或加快磨石的消耗的問題。此外,當以已消耗的磨石進行磨削時,會有下述問題:因為在晶圓所形成的凹部的邊角部分形成為圓形而非形成為直角,所以不能將晶圓的最外周部分的晶片平坦化。 However, in the above-mentioned grinding method, the grinding wheel is arranged on the surface of the wafer, and grinding water is supplied to the wafer and the grindstone, and the ring-shaped A half-circumference of the grindstone arranged at the lower part of the grinding wheel is brought into contact with the back surface of the wafer to perform grinding. At this time, since the gap between the grinding surface of the grindstone and the back surface of the wafer for the remaining half-circle is small, the grinding water supplied to the inside of the grindstone is difficult to discharge to the outside of the grindstone. Therefore, there is a problem that the grinding water remains inside the grinding stone, and the cooling of the grinding stone cannot be sufficiently performed, and there is a problem that the grinding surface is damaged or accelerated by the grinding chips contained in the accumulated grinding water. The problem of the consumption of the grindstone. In addition, when the grinding stone is used for grinding, there is a problem in that the outermost periphery of the wafer cannot be adjusted because the corner portions of the concave portions formed in the wafer are rounded instead of right angles. Part of the wafer is planarized.
本發明是有鑒於上述的情況而作成的發明,其目的在於提供一種易於將磨削水排出到環狀地配置於磨削輪的下部的磨石的外側。 The present invention has been made in view of the above-mentioned circumstances, and an object thereof is to provide a grinding stone that can easily discharge grinding water to the outside of a grindstone disposed annularly at a lower portion of a grinding wheel.
本發明是一種磨削裝置,該磨削裝置具備:保持台:保持晶圓;磨削機構,可旋轉地裝設有磨削輪且將已保持於該保持台的晶圓的外周部留下而磨削中央部,其中該磨削輪是直徑比晶圓的直徑更小且環狀地配置有磨石;及磨削水供給機構,對該磨石及晶圓供給磨削水,該磨削機構具備:安裝座,具有裝設該磨削輪的裝設面;主軸,使該安裝座的中心與軸心一致來連結一端;支撐機構,可旋轉地支撐該主軸;及馬達,使該主軸旋轉,該磨削水供給機構具備:貫通路,貫通於該主軸與連結於該主軸之該安裝座;及磨削水噴嘴,配設於該安裝座的該裝設面側 的中心且連通於該貫通路來放出該磨削水,該磨削水噴嘴具備:筒體,從該安裝座垂下;放水部,形成於該筒體的自由端部;及誘導部,配設於該貫通路與該放水部之間,且將於該貫通路流下之該磨削水誘導成順沿於該筒體的內壁而流動,該放水部具備使該磨削水以逐漸擴展的方式放出的倒角部。 The present invention is a grinding apparatus comprising: a holding table: holding a wafer; and a grinding mechanism that is rotatably mounted with a grinding wheel and leaves the outer peripheral portion of the wafer held on the holding table. For grinding the central part, the grinding wheel has a diameter smaller than the diameter of the wafer and a grindstone is arranged in an annular shape; and a grinding water supply mechanism supplies grinding water to the grindstone and the wafer, and the grinding The grinding mechanism is provided with: a mounting seat having a mounting surface on which the grinding wheel is mounted; a main shaft, one end of which is connected so that the center of the mounting seat is aligned with the axis; a supporting mechanism, which rotatably supports the main shaft; The main shaft rotates, and the grinding water supply mechanism includes: a through passage that penetrates through the main shaft and the mounting seat connected to the main shaft; and a grinding water nozzle arranged on the mounting surface side of the mounting seat The grinding water nozzle is provided with a cylindrical body suspended from the mounting seat, a water discharge portion formed on a free end portion of the cylindrical body, and an induction portion provided with Between the through passage and the water discharge portion, and the grinding water that will flow down the through passage is induced to flow along the inner wall of the cylinder, the water discharge portion is provided with a mechanism for gradually expanding the grinding water. way to release the chamfered part.
本發明之磨削裝置因為具備對磨石及晶圓供給磨削水之磨削水供給機構,磨削水供給機構具備貫通於主軸與連結於主軸之安裝座的貫通路、及配設於安裝座的裝設面側的中心且連通於貫通路來放出磨削水的磨削水噴嘴,該磨削水噴嘴具備從安裝座垂下的筒體、形成於筒體的自由端部的放水部、及配設於貫通路與放水部之間並將於貫通路流下之磨削水誘導成順沿於筒體的內壁而流動的誘導部,放水部具備有使磨削水以逐漸擴展的方式放出的倒角部,所以可以朝向環狀地配置的磨石全周的前端部分均勻地供給磨削水,且變得易於將磨削水從晶圓的被磨削面與磨石之間的細微的間隙排出到磨石的外側。因為可將磨削屑或脫落磨粒與磨削水一起排出到磨石的外側,所以可以防止對晶圓的被磨削面造成損傷之情形。又,因為可將磨削水充分地供給到環狀地配置的磨石的全周的前端部分,所以可以提高磨石的冷卻效果並且減少磨石的消耗量。 The grinding apparatus of the present invention includes a grinding water supply mechanism for supplying grinding water to the grindstone and the wafer, and the grinding water supply mechanism includes a through passage penetrating through the main shaft and the mounting seat connected to the main shaft, and is arranged in the mounting base. The center of the mounting surface side of the base communicates with the through passage to discharge grinding water. and a guide portion arranged between the through passage and the water discharge portion to induce the grinding water flowing down the through passage to flow along the inner wall of the cylinder, and the water discharge portion is provided with a way to gradually expand the grinding water Since the chamfered portion is released, the grinding water can be uniformly supplied to the front end portion of the entire circumference of the grindstone arranged annularly, and it becomes easy to remove the grinding water from the fine particles between the surface to be ground of the wafer and the grindstone. The gap is discharged to the outside of the grindstone. Since the grinding chips or the detached abrasive grains can be discharged to the outside of the grinding stone together with the grinding water, it is possible to prevent damage to the ground surface of the wafer. In addition, since the grinding water can be sufficiently supplied to the tip portion of the entire circumference of the annularly arranged grindstone, the cooling effect of the grindstone can be improved and the consumption of the grindstone can be reduced.
1:磨削裝置 1: Grinding device
2:裝置基座 2: Device base
2a:上表面 2a: upper surface
3:支柱 3: Pillar
4:移動基台 4: Mobile abutment
5:保持台 5: Hold Desk
5a:保持面 5a: Keep Faces
6:蛇腹 6: Snake Belly
7:螺絲 7: Screws
10:磨削機構 10: Grinding mechanism
11:磨削輪 11: Grinding wheel
11a:下表面 11a: Lower surface
12:磨石 12: Grinding Stone
12a:磨削面 12a: Grinding surface
13:安裝座 13: Mounting seat
13a:裝設面 13a: Installation surface
14:主軸 14: Spindle
15:支撐機構 15: Supporting mechanism
150:外殼 150: Shell
151:供給路 151: Supply Road
152:空氣噴出口 152: Air outlet
153:間隙 153: Gap
16、22:馬達 16, 22: Motor
17:支持器 17: Supporter
18:磨削水供給源 18: Grinding water supply source
19:空氣供給源 19: Air supply source
20:磨削進給機構 20: Grinding feed mechanism
21:滾珠螺桿 21: Ball screw
23:導軌 23: Rails
24:升降板 24: Lifting plate
30:磨削水供給機構 30: Grinding water supply mechanism
31:貫通路 31: Through passage
32、32A:磨削水噴嘴 32, 32A: grinding water nozzle
33:筒體 33: Cylinder
33a、38:自由端部 33a, 38: Free end
33b:內壁 33b: inner wall
34、34A:放水部 34, 34A: Water discharge department
34a、39:倒角部 34a, 39: chamfered part
35:誘導部 35: Induction Department
350:連通路 350: Connecting Road
351:誘導路 351: Induction Road
352:分歧部 352: Division of Divergence
36:凸緣部 36: Flange
37:螺絲貫通孔 37: Screw through hole
A:箭頭 A: Arrow
B:中心線 B: Centerline
GW:磨削水 GW: grinding water
L:磨石的高度 L: the height of the grindstone
P1:磨石的旋轉軌跡的半周區域 P1: The half-circle area of the rotation track of the grindstone
P2:剩餘的磨石的半周區域 P2: The semicircular area of the remaining grindstone
T1:凸部的厚度 T1: Thickness of the convex part
T2:凹部的厚度 T2: Thickness of the recess
W:晶圓 W: Wafer
Wa:正面 Wa: front
Wb:背面 Wb: Back
Wc:凸部 Wc: convex part
Wd:凹部 Wd: Recess
Wo:晶圓的旋轉中心 Wo: The rotation center of the wafer
X、Y、Z:方向 X, Y, Z: direction
圖1是顯示磨削裝置之構成的立體圖。 FIG. 1 is a perspective view showing the structure of a grinding apparatus.
圖2是顯示磨削機構及磨削水供給機構之構成的截面圖。 2 is a cross-sectional view showing the configuration of a grinding mechanism and a grinding water supply mechanism.
圖3是顯示磨削機構及磨削水供給機構之主要部位放大截面圖。 Fig. 3 is an enlarged cross-sectional view showing the main parts of the grinding mechanism and the grinding water supply mechanism.
圖4之(a)是從上方觀看磨削水噴嘴的平面圖。(b)是從下方觀看磨削水噴嘴的仰視圖。 Fig. 4(a) is a plan view of the grinding water nozzle viewed from above. (b) is a bottom view of the grinding water nozzle viewed from below.
圖5是顯示藉由磨削輪磨削晶圓之狀態的截面圖。 FIG. 5 is a cross-sectional view showing a state in which a wafer is ground by a grinding wheel.
圖6是顯示藉由磨削輪磨削晶圓之狀態的立體圖。 FIG. 6 is a perspective view showing a state in which a wafer is ground by a grinding wheel.
圖7是說明一邊對晶圓及磨石供給磨削水,一邊磨削晶圓之狀態的平面圖。 7 is a plan view illustrating a state in which the wafer is ground while supplying grinding water to the wafer and the grindstone.
圖8之(a)是顯示磨削水噴嘴的變形例的截面圖。(b)是從上方觀看磨削水噴嘴的變形例的平面圖。(c)是從下方觀看磨削水噴嘴的變形例的仰視圖。 FIG. 8( a ) is a cross-sectional view showing a modification of the grinding water nozzle. (b) is a plan view of a modification of the grinding water nozzle viewed from above. (c) is a bottom view of a modification of the grinding water nozzle viewed from below.
用以實施發明之形態 Form for carrying out the invention
圖1所示的磨削裝置1具有在Y軸方向上延伸的裝置基座2、及豎立設置在裝置基座2的Y軸方向後部側的支柱3。在裝置基座2的上表面2a具備有保持台5,該保持台5具有保持晶圓之保持面5a。保持台5是連接到吸引源。在保持台5的周圍,是被可在Y軸方向上移動的移動基台4所罩蓋。在保持台5的下方配設有被蛇腹6所覆蓋之圖未示的移動機構,且成為藉由移動機構而讓保持台5與移動基台4一起在Y軸方向上移動之構成。
The grinding apparatus 1 shown in FIG. 1 has an
在支柱3的前方具備有磨削機構10、磨削進給機構20及磨削水供給機構30,該磨削機構10可旋轉地裝設有磨削輪11且將已保持於該保持台5晶圓的外周部留下而磨削中央部,其中該磨削輪是直徑比晶圓的直徑更小且環狀地配置有磨石12,該磨削進給機構20是將磨削機構10朝相對於保持台5接近及遠離的方向(Z軸方向)磨削進給,該磨削水供給機構30是對磨石12及晶圓供給磨削水。
A grinding
磨削進給機構20具備有在Z軸方向上延伸的滾珠螺桿21、連接於滾珠螺桿21的一端之馬達22、與滾珠螺桿21平行地延伸的一對導軌23、及其中一面固定於磨削機構10的升降板24。於一對導軌23上可供升降板24的另一面滑動接觸,並且形成於升降板24的內部的螺帽中螺合有滾珠螺桿21。藉由以馬達22使滾珠螺桿21旋動,可以使磨削機構10與升降板24一起在Z軸方向上移動。
The grinding
磨削機構10具備有將磨削晶圓的磨石12環狀地固接而成的磨削輪11、具有裝設磨削輪11之裝設面13a的安裝座13、使安裝座13的中心與軸心一致來連結一端的主軸14、可旋轉地支撐主軸14的支撐機構15、及使該主軸14旋轉之圖2所示的馬達16。在本實施形態所示的磨石12雖是以磨輪片(segment)磨石所構成,但並不限定於此構成。安裝座13的裝設面13a是成為平行於與鉛直方向正交之水平方向的平坦面。
The grinding
支撐機構15具備有可旋轉地圍繞主軸14之外殼150。外殼150是藉由固定在升降板24上的支持器17
而被保持。如圖2所示,在外殼150的內部具備有連接到空氣供給源19的空氣供給路151、及將高壓空氣噴出到外殼150與主軸14之間的間隙153的空氣噴出口152。容置在外殼150內部的主軸14是藉由從空氣噴出口152噴出到間隙153的高壓空氣而以非接觸的狀態可旋轉地被支撐。
The
磨削水供給機構30具備有貫通路31及磨削水噴嘴32,該貫通路31是貫通於主軸14及連結於主軸14的安裝座13,該磨削水噴嘴32是配設在安裝座13的裝設面13a側的中心並連通於貫通路31來放出磨削水。在貫通路31的上端連接有磨削水供給源18。
The grinding
磨削水噴嘴32是如圖3所示,具備有從形成於主軸14及安裝座13內的中心的貫通路31垂下的筒體33、形成於於筒體33的自由端部33a的放水部34、及配設於貫通路31與放水部34之間,並將於貫通路31流下之磨削水誘導成順沿於筒體33的內壁33b而流動的誘導部35。
As shown in FIG. 3 , the grinding
在筒體33的上端部配設有凸緣部36。於凸緣部36上,是如圖4(a)所示,在圓周方向上以等間隔的方式隔開而形成有複數個(在圖示之例子中為4個)螺絲貫通孔37。在圖3所示之安裝座13的裝設面13a中也是將螺絲7所螺合之母螺絲對應於螺絲貫通孔37的位置而形成。當將磨削水噴嘴32安裝到安裝座13時,可以藉由將螺絲7從下方插入到凸緣部36的螺絲貫通孔37來使其螺合於母螺絲,以將磨削水噴嘴32固定至安裝座13的裝設面13a。
A
誘導部35具備有連通於貫通路31之連通路
350、及藉由設置於筒體33的內部之分歧部352而被分歧之誘導路351。誘導路351是設置在筒體33的內壁33b的附近的位置之空洞。在本實施形態中,如圖4(b)所示,是將複數個(在圖示之例子中為3個)誘導路351在圓周方向上以等間隔的方式隔開而形成。在如此所構成的誘導部35中,在磨削時當磨削水從連通路350流入誘導路351時,會因為伴隨於由主軸14的旋轉所形成的離心力而使磨削水往徑方向外側流動,所以可以將磨削水誘導成順沿於內壁33b而流下。誘導路351的數量並非特別限定於本實施形態中所示的構成。
The
圖3所示的放水部34為以逐漸擴展(傘狀)的方式擴大而成的構成,並具備有推拔狀的倒角部34a。在放水部34中,由於是以由磨削輪11的旋轉所形成的離心力及磨削水的自重,以將藉由誘導部35而順沿於內壁33b流下來的磨削水進一步順沿於倒角部34a而流出去,因此可以使磨削水以逐漸擴展(傘狀)的方式放出。藉此,可以朝向環狀地配置的磨石12的全周的前端部分均勻地供給磨削水。亦即,不僅對磨石12與晶圓的接觸部分,連對磨石12與晶圓並未接觸之細微的間隙也可以充分地供給磨削水。
The
在此,圖2所示之磨削水噴嘴32的下端(筒體33的自由端部33a),宜配置在比磨削輪11的下表面11a更下方側。由於配置在比磨削輪11的下表面11a更上方時,會無法將磨削水效率良好地供給到磨石12的前端部分,因
此磨削水噴嘴32的下端宜藉由配置在比磨削輪11的下表面11a更下方側,以將放水部34定位在接近於成為加工對象的晶圓的位置。
Here, the lower end (
接著,使用磨削裝置1來說明下述的磨削例:將圖2所示的晶圓W的中央部分磨削來形成凹部Wd並留下外周部,而在外周部形成環狀凸部Wc。晶圓W是使形成有元件之面成為正面Wa,並在正面Wa貼附例如保護膠帶。另一方面,與正面Wa相反側的背面Wb是被磨石12所磨削的被磨削面。
Next, an example of grinding will be described using the grinding apparatus 1 in which the central portion of the wafer W shown in FIG. 2 is ground to form the concave portion Wd, the outer peripheral portion is left, and the annular convex portion Wc is formed on the outer peripheral portion. . In the wafer W, the surface on which the element is formed is the front surface Wa, and a protective tape, for example, is attached to the front surface Wa. On the other hand, the back surface Wb on the opposite side to the front surface Wa is a to-be-ground surface ground by the
在此,於本實施形態中所示之使用於磨削的磨石12的高度L,必須比形成在晶圓W的外周部分的凸部Wc的厚度T1(磨削前的晶圓W的厚度)更大。凸部Wc的厚度T1為例如750μm的情況下,為了將凹部Wd的厚度T2薄化到例如100μm,必須使達最大磨耗時的磨石12的高度L大於650μm。又,較理想的是將磨削水噴嘴32的下端配置在比達最大磨耗時的磨石12的磨削面12a更高的位置。
Here, the height L of the
如圖5所示,將晶圓W的正面Wa側載置於保持台5的保持面5a上而使背面Wb側露出。接着,在藉由圖未示的吸引源的吸引力將晶圓W吸引保持在保持面5a上後,即可使保持台5移動到磨削機構10的下側。之後,藉由圖1所示的磨削進給機構20,使磨削機構10朝接近於保持台5的方向下降。再者,保持台5的保持面5a雖然是形成為從其中央直到外周緣為已傾斜的傾斜面,但實際上是無
法以肉眼辨識之程度細微的傾斜面。
As shown in FIG. 5 , the front surface Wa side of the wafer W is placed on the holding
接著,如圖6所示,使保持台5例如朝箭頭A方向旋轉,並且磨削機構10一邊藉由旋轉主軸14使磨削輪11例如朝箭頭A的方向旋轉,一邊使磨石12的磨削面12a接觸於晶圓W的背面Wb來進行磨削。
Next, as shown in FIG. 6 , the holding table 5 is rotated, for example, in the direction of arrow A, and the grinding
磨削裝置10是如圖7所示,使磨石12旋轉成經常通過晶圓W的旋轉中心Wo。具體而言,是使成為磨石12的旋轉軌跡的半周區域P1(以中心線B為軸的左側部分)經常接觸於晶圓W的旋轉中心Wo,並僅對晶圓W的中央部分進行磨削來形成凹部Wd,並且在晶圓W的外周部形成環狀的凸部Wc。此時,剩餘的磨石12的半周區域P2(以中心線B為軸的右側部分)並未接觸於晶圖W,而是在凹部Wd與磨石12之間出現細微的間隙。
As shown in FIG. 7 , the grinding
在晶圓W的磨削中,經常從放水部34將磨削水GW供給到旋轉的磨石12的內側。具體而言,是從圖3所示之磨削水供給源18使規定的流量的磨削水GW流入貫通路31。於貫通路31流下來的磨削水GW,是通過誘導部35而伴隨於藉由主軸14的旋轉所形成的離心力來順沿於筒體33的內壁33b流下去,此外,從內壁33b順沿於倒角部34a流出去,並從放水部34以傘狀形式放出。
During the grinding of the wafer W, the grinding water GW is always supplied from the
如圖7所示,從放水部34以傘狀形式放出的的磨削水GW是朝向磨石12的全周以放射狀的形式流出去。因此,變成易於從上述之半周區域P2中的磨石12與凹部Wd之間的細微的間隙將磨削水GW排出到磨石12的外
側。蓄積於在磨石12的內側所形成的凹部Wd的磨削水GW中,包含有晶圓W的磨削屑或脫落磨粒,且將磨削屑或脫落磨粒與磨削水GW一起排出至磨石12的外側。
As shown in FIG. 7 , the grinding water GW discharged from the
如以上所述,本發明之磨削裝置1具備對磨石12及晶圓W供給磨削水GW之磨削水供給機構30,磨削水供給機構30具備貫通於主軸14與連結於主軸14之安裝座13的貫通路31、及配設於安裝座13的裝設面13a側的中心且連通於貫通路31來放出磨削水GW的磨削水噴嘴32,該磨削水噴嘴32具備從安裝座13垂下的筒體33、形成於筒體33的自由端部33a的放水部34、及配設於貫通路31與放水部34之間並將於貫通路31流下之磨削水GW誘導成順沿於筒體33的內壁33b而流動的誘導部35,放水部34具備有使磨削水GW以逐漸擴展的方式放出的倒角部34a,所以可以朝向環狀地配置的磨石12全周的前端部分均勻地供給磨削水GW,且變得易於將磨削水GW從晶圓W的被磨削面(凹部Wd)與磨石12之間的細微的間隙排出到磨石12的外側。因為可將磨削屑或脫落磨粒與磨削水GW一起排出到磨石12的外側,所以可以從晶圓W的被磨削面有效地除去磨削屑或脫落磨粒而防止對晶圓W的被磨削面造成損傷之情形。又,根據本發明,因為將磨削水GW充分地供給到環狀地配置的磨石12的全周的前端部分,所以可以提高磨石12的冷卻效果並且減少磨石12的消耗量。
As described above, the grinding apparatus 1 of the present invention includes the grinding
圖8所示之磨削水噴嘴32A是上述磨削水噴嘴32的變形例。磨削水噴嘴32A是如圖8(a)所示,並具備
有筒體33、形成於筒體33的自由端部38的放水部34A、及配設於圖未示的貫通路與放水部34A之間,且將於貫通路31流下之磨削水誘導成順沿於筒體33的內壁33b而流動的誘導部35。在磨削水噴嘴32A的上端部配設有凸緣部36,如圖8(b)所示,在凸緣部36的圓周方向上以等間隔的方式隔開而形成有複數個(在圖示之例子中為4個)螺絲貫通孔37。筒體33的內壁33b,到圖8(c)所示的自由端部38為止是直線狀地形成,且在其最下部分形成有倒角部39。即使在如此所構成的磨削水噴嘴32A中,仍然可以藉由主軸14的旋轉所形成的離心力及磨削水GW的自重,使磨削水GW於筒體33的內壁33b及倒角部39順沿而流下,並從放水部34A將磨削水GW以傘狀的形式放出。
The grinding
10‧‧‧磨削機構 10‧‧‧Grinding mechanism
11‧‧‧磨削輪 11‧‧‧grinding wheel
11a‧‧‧下表面 11a‧‧‧Lower surface
12‧‧‧磨石 12‧‧‧Wheelstone
12a‧‧‧磨削面 12a‧‧‧Grinding surface
13‧‧‧安裝座 13‧‧‧Mount
13a‧‧‧裝設面 13a‧‧‧Installation surface
14‧‧‧主軸 14‧‧‧Spindle
15‧‧‧支撐機構 15‧‧‧Supporting mechanism
150‧‧‧外殼 150‧‧‧Case
151‧‧‧供給路 151‧‧‧Supply Road
152‧‧‧空氣噴出口 152‧‧‧Air outlet
153‧‧‧間隙 153‧‧‧clearance
16‧‧‧馬達 16‧‧‧Motor
18‧‧‧磨削水供給源 18‧‧‧Supply source of grinding water
19‧‧‧空氣供給源 19‧‧‧Air supply source
30‧‧‧磨削水供給機構 30‧‧‧Grinding water supply mechanism
31‧‧‧貫通路 31‧‧‧Through Road
32‧‧‧磨削水噴嘴 32‧‧‧Grinding water nozzle
33‧‧‧筒體 33‧‧‧Cylinder
33a‧‧‧自由端部 33a‧‧‧Free end
33b‧‧‧內壁 33b‧‧‧Inner Wall
34‧‧‧放水部 34‧‧‧Water discharge department
35‧‧‧誘導部 35‧‧‧Induction Department
36‧‧‧凸緣部 36‧‧‧Flange
GW‧‧‧磨削水 GW‧‧‧grinding water
L‧‧‧磨石的高度 L‧‧‧The height of the grindstone
T1‧‧‧凸部的厚度 T1‧‧‧Thickness of convex part
T2‧‧‧凹部的厚度 T2‧‧‧Thickness of recess
W‧‧‧晶圓 W‧‧‧Wafer
Wa‧‧‧正面 Wa‧‧‧Front
Wb‧‧‧背面 Wb‧‧‧Back
Wc‧‧‧凸部 Wc‧‧‧Protrusion
Wd‧‧‧凹部 Wd‧‧‧Recess
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JP2017131102A JP7067878B2 (en) | 2017-07-04 | 2017-07-04 | Grinding device |
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CN111408990B (en) * | 2020-03-27 | 2021-08-24 | 深圳市赛平精密技术有限公司 | Full-automatic edge scraping machine |
EP4144480B1 (en) * | 2021-09-01 | 2024-01-31 | Siltronic AG | Method of grinding semiconductor wafers |
CN116512118B (en) * | 2023-07-04 | 2023-09-15 | 云科智能制造(沈阳)有限公司 | Main shaft power control device for grinding of gantry machining center |
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CN109202690A (en) | 2019-01-15 |
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TW201907468A (en) | 2019-02-16 |
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