TWI751839B - Merge and split sar analog-digital converter - Google Patents
Merge and split sar analog-digital converter Download PDFInfo
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本發明是關於一種逐漸逼近類比數位轉換器,特別是關於一種拆分合併式逐漸逼近類比數位轉換器。The present invention relates to a progressive approximation analog-to-digital converter, in particular to a split-merge type progressive approximation analog-to-digital converter.
逐漸逼近類比數位轉換器(Successive-approximation register ADC)為一種將連續之類比訊號轉換為數位訊號之裝置,其原理是將輸入訊號取樣至兩組電容陣列中,並在各個週期中對兩組電容陣列之電位進行比較及電容陣列之電荷的重新分布,使得兩組電容列在每一個週期的電位比較能夠符合二進制搜尋法,而各週期的比較結果即為轉換而得之數位訊號的各個位元。Successive-approximation register ADC (Successive-approximation register ADC) is a device that converts continuous analog signals into digital signals. The potential of the array is compared and the charge of the capacitor array is redistributed, so that the potential comparison of the two groups of capacitor arrays in each cycle can conform to the binary search method, and the comparison result of each cycle is the converted digital signal. .
請參閱中華民國專利公告I644520號專利,為本案發明人之已核准專利,其為一種拆分合併式逐漸逼近類比數位轉換器,藉由三級切換開關使電容陣列可選擇性地耦接至該參考電壓、該接地端或該半參考電壓,讓最小容量之電容也能進行一個週期的電位比較,使得原本電容陣列設計為N位元的逐漸逼近類比數位轉換器能夠成為N+1位元的逐漸逼近類比數位轉換器,而大幅地減少所需之電容容量,並降低了逐漸逼近類比數位轉換器的整體面積及功率消耗。Please refer to Patent Publication No. I644520 of the Republic of China, which is the approved patent of the inventor of the present application, which is a split-merge-type progressive approximation-analog digital converter. A three-stage switch enables a capacitor array to be selectively coupled to the analog digital converter. The reference voltage, the ground terminal or the half reference voltage allows the capacitor with the smallest capacity to perform a period of potential comparison, so that the original capacitor array designed as an N-bit gradually approximating analog digital converter can become an N+1-bit digital converter. The progressive approximation of the analog-to-digital converter greatly reduces the required capacitance and reduces the overall area and power consumption of the progressive approximation of the analog-to-digital converter.
本發明的主要目的在於藉由三級切換開關讓電容陣列可連接至一調整電壓,除了使拆分合併式逐漸逼近類比數位轉換器能夠具有N+1位元外,還能再進一步地降低所需之電容容量,而減少整體之佈局面積及電容陣列切換時的損耗。The main purpose of the present invention is to allow the capacitor array to be connected to a regulated voltage by means of a three-stage switch, in addition to enabling the split-merge progressive approximation analog digital converter to have N+1 bits, it can further reduce the required The required capacitance capacity is reduced, and the overall layout area and the loss when switching the capacitor array are reduced.
本發明之一種拆分合併式逐漸逼近類比數位轉換器包含一拆分合併式電容陣列、複數個三級切換開關、一比較器及一SAR邏輯電路,該拆分合併式電容陣列具有複數個之正端電容及複數個負端電容,各該正端電容之一第一端電性連接至一正端電位線,各該負端電容之一第一端電性連接至一負端電位線,各該三級切換開關電性連接各該正端電容之一第二端及各該負端電容之一第二端,各該三級切換開關選擇性地將各該正端電容之該第二端耦接至該負端電容之該第二端、或讓各該正端電容之該第二端耦接至一參考電壓、一接地端或一調整電壓、或讓各該負端電容之該第二端耦接至該參考電壓、該接地端或該調整電壓,其中該調整電壓之電位為該參考電壓之電位的3/2、3/4或3/8倍,該比較器電性連接該正端電位線及該負端電位線,且該比較器輸出一比較訊號,該SAR邏輯電路接收該比較訊號,且該SAR邏輯電路根據該比較訊號控制該些三級切換開關。A split and merged gradual approximation analog digital converter of the present invention includes a split and merged capacitor array, a plurality of three-level switches, a comparator and a SAR logic circuit, and the split and merged capacitor array has a plurality of A positive terminal capacitor and a plurality of negative terminal capacitors, a first terminal of each positive terminal capacitor is electrically connected to a positive terminal potential line, and a first terminal of each negative terminal capacitor is electrically connected to a negative terminal potential line, Each of the three-stage switching switches is electrically connected to a second terminal of each of the positive terminal capacitors and a second terminal of each of the negative terminal capacitors, and each of the three-stage switching switches selectively switches the second terminal of each of the positive terminal capacitors. The terminal is coupled to the second terminal of the negative terminal capacitor, or the second terminal of each positive terminal capacitor is coupled to a reference voltage, a ground terminal or an adjustment voltage, or the negative terminal capacitor is connected to the The second terminal is coupled to the reference voltage, the ground terminal or the adjustment voltage, wherein the potential of the adjustment voltage is 3/2, 3/4 or 3/8 times the potential of the reference voltage, and the comparator is electrically connected The positive-end potential line and the negative-end potential line, and the comparator outputs a comparison signal, the SAR logic circuit receives the comparison signal, and the SAR logic circuit controls the three-stage switching switches according to the comparison signal.
本發明藉由各該三級切換開關選擇性地將各該正端電容之該第二端耦接至各該負端電容之該第二端、或讓各該正端電容之該第二端耦接至該參考電壓、該接地端或該調整電壓、或讓各該負端電容之該第二端耦接至該參考電壓、該接地端或該調整電壓,且該調整電壓之電位為該參考電壓之電位的3/2、3/4或3/8倍,使得本發明之該拆分合併式電容陣列所使用的電容容量可以減少,而大幅地降低該拆分合併式逐漸逼近類比數位轉換器的佈局面積。The present invention selectively couples the second terminal of each positive terminal capacitor to the second terminal of each negative terminal capacitor, or allows the second terminal of each positive terminal capacitor to be selectively coupled by each of the three-stage switching switches be coupled to the reference voltage, the ground terminal or the adjustment voltage, or the second terminal of each negative terminal capacitor is coupled to the reference voltage, the ground terminal or the adjustment voltage, and the potential of the adjustment voltage is the The potential of the reference voltage is 3/2, 3/4 or 3/8 times, so that the capacitance used by the split-combined capacitor array of the present invention can be reduced, and the split-combined type is gradually approaching analog digital. The layout area of the converter.
請參閱第1圖,其為本發明之一實施例,一種拆分合併式逐漸逼近類比數位轉換器100的方塊圖,該拆分合併式逐漸逼近類比數位轉換器100具有一拆分合併式電容陣列110、複數個三級切換開關120、一比較器130及一SAR邏輯電路140、一正端取樣開關150及一負端取樣開關160。該拆分合併式電容陣列110具有複數個之正端電容111及複數個負端電容112,各該正端電容111之一端電性連接至一正端電位線PL,各該正端電容111之另一端電性連接至各該三級切換開關120,各該負端電容112之一端電性連接至一負端電位線NL,各該負端電容112之另一端電性連接至各該三級切換開關120。各該三級切換開關120選擇性地將各該正端電容111之另一端耦接至該負端電容112之另一端、或讓各該正端電容111之另一端耦接至一參考電壓V
r、一接地端或一調整電壓V
g、或讓各該負端電容112之另一端耦接至該參考電壓V
r、該接地端或該調整電壓V
g,在本實施例中,該調整電壓V
g之電位為該參考電壓V
r之電位的3/2、3/4或3/8倍。
Please refer to FIG. 1, which is an embodiment of the present invention, a block diagram of a split-merge progressive approximation-to-analog
該比較器130電性連接該正端電位線PL及該負端電位線NL,該比較器130用以比較該正端電位線PL及該負端電位線NL的電位大小並輸出一比較訊號S
c至該SAR邏輯電路140,該SAR邏輯電路140根據該比較訊號S
c輸出複數個控制訊號S
p,S
n,S
ms控制該些三級切換開關120,且該SAR邏輯電路140輸出一數位輸出訊號D
out。
The
該正端取樣開關150電性連接一正端電壓輸入端T
p及該正端電位線PL,於取樣階段時,該正端取樣開關150導通,一正端電壓V
inp經由該正端電壓輸入端T
p及該正端取樣開關150傳送至該正端電位線PL並對該些正端電容111進行充電而累積電荷。該負端取樣開關160電性連接一負端電壓輸入端T
n及該負端電位線NL,於取樣階段時,該負端取樣開關160導通,一負端電壓V
inn經由該負端電壓輸入端T
n及該負端取樣開關160傳送至該負端電位線NL並對該些負端電容112進行充電而累積電荷,其中該正端電壓V
inp減去該負端電V
inn等於取樣電壓。
The positive
請參閱第2圖,其為本實施例之該拆分合併式逐漸逼近類比數位轉換器100的電路圖,其中,該些正端電容111包含3個第一正端電容113及3個第二正端電容114,該些負端電容112包含3個第一負端電容115及3個第二負端電容116,該三級切換開關120具有3個第一三級切換開關121及3個第二三級切換開關122,各該第一三級切換開關121具有一第一合併開關121a、一第一正端切換開關121b及一第一負端切換開關121c,各該第二三級切換開關122具有一第二合併開關122a、一第二正端切換開關122b及一第二負端切換開關122c。在本實施例中,是以4+1位元之該拆分合併式逐漸逼近類比數位轉換器100為例以方便說明,但在其他實施例中,該拆分合併式逐漸逼近類比數位轉換器100能夠具有更多之正端電容、負端電容及三級切換開關而讓該拆分合併式逐漸逼近類比數位轉換器100具有更高之位元數。Please refer to FIG. 2 , which is a circuit diagram of the split-merge progressive approximation analog-to-
請再參閱第2圖,各該第一及第二正端電容113、114之一第一端113a、114a電性連接至該正端電位線PL,各該第一及第二正端電容113、114之一第二端113b、114b則分別電性連接至各該第一三級切換開關121之該第一正端切換開關121b及各該第二三級切換開關122之該第二正端切換開關122b。各該第一及第二負端電容115、116之一第一端115a、116a電性連接至該負端電位線NL,各該第一及第二負端電容115、116之一第二端115b、116b則分別電性連接至各該第一三級切換開關121之該第一負端切換開關121c及各該第二三級切換開關122之該第二負端切換開關122c。各該第一合併開關121a之兩端分別電性連接各該第一正端切換開關121b及各該第一負端切換開關121c,各該第二合併開關122a之兩端分別電性連接各該第二正端切換開關122b及各該第二負端切換開關122c。Please refer to FIG. 2 again, one of the
在該些第一三級切換開關121中,左側之該第一三級切換開關121之該第一正端切換開關121b可將左側之該第一正端電容113之該第二端113b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/2,因此圖式標示為3/2V
r)或該第一合併開關121a,左側之該第一三級切換開關121之該第一負端切換開關121c可將左側之該第一負端電容115之該第二端115b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/2,因此圖式標示為3/2V
r)或該第一合併開關121a。中間之該第一三級切換開關121之該第一正端切換開關121b可將中間之該第一正端電容113之該第二端113b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/4,因此圖式標示為3/4V
r)或該第一合併開關121a,中間之該第一三級切換開關121之該第一負端切換開關121c可將中間之該第一負端電容115之該第二端115b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/4,因此圖式標示為3/4V
r)或該第一合併開關121a。右側之該第一三級切換開關121之該第一正端切換開關121b可將右側之該第一正端電容113之該第二端113b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/8,因此圖式標示為3/8V
r)或該第一合併開關121a,右側之該第一三級切換開關121之該第一負端切換開關121c可將右側之該第一負端電容115之該第二端115b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/8,因此圖式標示為3/8V
r)或該第一合併開關121a。
Among the first three-
在該些第二三級切換開關122中,左側之該第二三級切換開關122之該第二正端切換開關122b可將左側之該第二正端電容114之該第二端114b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/2,因此圖式標示為3/2V
r)或該第二合併開關122a,左側之該第二三級切換開關122之該第二負端切換開關122c可將左側之該第二負端電容116之該第二端116b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/2,因此圖式標示為3/2V
r)或該第二合併開關122a。中間之該第二三級切換開關122之該第二正端切換開關122b可將中間之該第二正端電容114之該第二端114b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/4,因此圖式標示為3/4V
r)或該第二合併開關121a,中間之該第二三級切換開關122之該第二負端切換開關1221c可將中間之該第二負端電容116之該第二端116b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/4,因此圖式標示為3/4V
r)或該第二合併開關122a。右側之該第二三級切換開關122之該第二正端切換開關122b可將右側之該第二正端電容114之該第二端114b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/8,因此圖式標示為3/8V
r)或該第二合併開關122a,右側之該第二三級切換開關122之該第二負端切換開關122c可將右側之該第二負端電容116之該第二端116b切換連接至該接地端、該參考電壓V
r、該調整電壓(電位大小為該參考電壓V
r的3/8,因此圖式標示為3/8V
r)或該第二合併開關122a。
Among the second
該比較器130之一正極輸入端131及一負極輸入端132分別電性連接該正端電位線PL及該負端電位線NL,因此,當該正端電位線PL之電位較高時,該比較器130輸出之該比較訊號S
c為高電位,當該負端電位線NL之電位較高時,該比較器130輸出之該比較訊號S
c為低電位。該SAR邏輯電路140根據該比較訊號S
c輸出複數個拆分合併控制訊號S
ms1-6、複數個正端控制訊號S
p1-6及複數個負端控制訊號S
n1-6以分別控制各該第一合併開關121a、各該第二合併開關122a、各該第一正端切換開關121b、各該第二正端切換開關122b、各該第一負端切換開關121c及各該第二負端切換開關122c。當各該第一正端切換開關121b及對應之各該第一負端切換開關121c的切換使各該第一正端電容113之該第二端113b及各該第一負端電容115之該第二端115b耦接至各該第一合併開關121a時,各該第一合併開關121a導通,使得各該第一正端電容113及各該第一負端電容115耦接而合併。相同地,當各該第二正端切換開關122b及對應之各該第二負端切換開關122c的切換使各該第二正端電容114之該第二端114b及各該第二負端電容116之該第二端116b耦接至各該第二合併開關122a時,各該第二合併開關122a導通,使得各該第二正端電容114及各該第二負端電容116耦接而合併。
A
在本實施例4+1位元之該拆分合併式逐漸逼近類比數位轉換器100中,藉由控制該些三級切換開關120分別將該些第一正端電容113、該些第二正端電容114、該些第一負端電容115及該些第二負端電容116耦接至電位為該參考電壓V
r之3/2、3/4及3/8倍的該調整電壓,可讓該些電容使用容量為1C之電容,而降低電容陣列之佈局面積。就算將本案擴充至10位元的架構,電容陣列中之最大之電容容量也只需要48C,由於電容陣列的佈局面積占逐漸逼近類比數位轉換器的最大部分,因此,本實施例可大幅地降低該拆分合併式逐漸逼近類比數位轉換器100整體所需之佈局面積,其中,該單位電容值C為1 fF。
In the 4+1-bit split-and-merge gradual approximation analog-to-
請參閱第3至13圖,為本發明之該拆分合併式逐漸逼近類比數位轉換器100之該些三級切換開關120切換過程的電路作動圖,首先,請參閱第3圖,該正端取樣開關150及該負端取樣開關160閉合讓該正端電位線PL及該負端電位線NL分別接收該正端電壓V
inp及該負端電壓V
inn,該些第一正端電容113之該第二端及該些第二負端電容116之該第二端接收該參考電壓V
r,該第二正端電容114之該第二端及該第一負端電容115之該第二端則連接至接地端,使該些電容累積電荷。此時,該正端電位線PL之電位為該正端電壓V
inp,該負端電位線NL之電位為該負端電壓V
inn。
Please refer to FIGS. 3 to 13, which are circuit diagrams of the switching process of the three-
請參閱第4圖,該正端取樣開關150及該負端取樣開關160斷開,該比較器130對該正端電位線PL及該負端電位線NL之電位進行第1位元的比對,若該正端電位線PL之電位大於該負端電位線NL之電位則輸出1,反之則輸出0。接著,請參閱第5圖,當該正端電位線PL之電位大於該負端電位線NL之電位時,將各該第一正端電容113及各該第一負端電容115切換至相互耦接,該些第二正端電容114及該些第二負端電容116則分別維持著耦接該接地端及該參考電壓V
r。此時該些電容的電荷重新分佈,根據電荷守恆定律,該正端電位線PL之電位改變為V
inp-1/4V
r,該負端電位線NL之電位改變為V
inn+1/4V
r,因此,該比較器130於第2位元的比對可判斷V
inp-V
inn>1/2V
r或V
inp-V
inn<1/2V
r,而符合二分搜尋法。相對地,請參閱第6圖,若第1位元的比對中,該正端電位線PL之電位小於該負端電位線NL之電位時,將該些第二正端電容114及該第二負端電容116切換至相互耦接,該些第一正端電容113及該些第一負端電容115之則分別維持著耦接該參考電壓V
r及該接地端。此時該些電容的電荷重新分佈,根據電荷守恆定律,該正端電位線PL之電位改變為V
inp+1/4V
r,該負端電位線NL之電位改變為V
inn-1/4V
r,因此,該比較器130於第2位元的比對可判斷V
inp-V
inn>-1/2V
r或V
inp-V
inn<-1/2V
r,而符合二分搜尋法。
Please refer to FIG. 4 , the positive-
請參閱第7圖,當第1位元比對為1且第2位元比對結果V
inp-V
inn>1/2V
r亦為1時,將左側之該第一正端電容113切換至耦接該接地端,並將左側之該第一負端電容115切換至耦接該調整電壓3/2V
r,其餘之該第一正端電容113、該第二正端電容114、該第一負端電容115及該第二負端電容116則維持不切換。此時該些電容的電荷重新分佈,根據電荷守恆定律,該正端電位線PL之電位改變為V
inp-3/8V
r,該負端電位線NL之電位改變為V
inn+3/8V
r,因此,該比較器130於第3位元的比對可判斷V
inp-V
inn>3/4V
r或V
inp-V
inn<3/4V
r,而可確實地符合二分搜尋法。相對地,請參閱第8圖,當第1位元比對為1且第2位元比對結果V
inp-V
inn<1/2V
ref而為0時,將左側之該第二正端電容114切換至耦接該調整電壓3/2V
r,並將左側之該第二負端電容116切換至耦接該接地端,其餘之該第一正端電容113、該第二正端電容114、該第一負端電容115及該第二負端電容116則維持不切換。此時該些電容的電荷重新分佈,根據電荷守恆定律,該正端電位線PL之電位改變為V
inp-1/8V
r,該負端電位線NL之電位改變為V
inn+1/8V
r,因此,該比較器130於第3位元的比對可判斷V
inp-V
inn>1/4V
r或V
inp-V
inn<1/4V
r,而符合二分搜尋法。
Referring to FIG. 7, when the first bit comparison is 1 and the second bit comparison result V inp -V inn > 1/2V r is also 1, the first positive
請參閱第9圖,當第1位元比對為1、第2位元比對為1且第3位元比對結果V
inp-V
inn>3/4V
r而為1時,將中間之該第一正端電容113切換至耦接該接地端,並將中間之該第一負端電容115切換至耦接該調整電壓3/4V
r,其餘之該第一正端電容113、該第二正端電容114、該第一負端電容115及該第二負端電容116則維持不切換。此時該些電容的電荷重新分佈,根據電荷守恆定律,該正端電位線PL之電位改變為V
inp-7/16V
r,該負端電位線NL之電位改變為V
inn+7/16V
r,因此,該比較器130於第4位元的比對可判斷V
inp-V
inn>7/8V
r或V
inp-V
inn<7/8V
r,而可確實地符合二分搜尋法。相對地,請參閱第10圖,當第1位元比對為1、第2位元比對為1且第3位元比對結果為V
inp-V
inn<3/4V
r時,將中間之該第二正端電容114切換至耦接該調整電壓3/4V
r,並將中間之該第二負端電容116切換至耦接該接地端,其餘之該第一正端電容113、該第二正端電容114、該第一負端電容115及該第二負端電容116則維持不切換,此時該些電容的電荷重新分佈,根據電荷守恆定律,該正端電位線PL之電位改變為V
inp-5/16V
r,該負端電位線NL之電位改變為V
inn+5/16V
r,因此,該比較器130於第4位元的比對可判斷V
inp-V
inn>5/8V
r或V
inp-V
inn<5/8V
r,而符合二分搜尋法。
Please refer to Figure 9, when the 1st bit alignment is 1, the 2nd bit alignment is 1, and the 3rd bit alignment result V inp -V inn >3/4V r is 1, the middle The first
請參閱第11圖,當1位元比對為1、第2位元比對為1、第3位元比對為1且第4位元比對結果為V
inp-V
inn>7/8V
r時,將右側之該第一正端電容113切換至耦接該接地端,並將右側之該第一負端電容115切換至耦接該調整電壓3/8V
r,其餘之該第一正端電容113、該第二正端電容114、該第一負端電容115及該第二負端電容116則維持不切換,此時該些電容的電荷重新分佈,根據電荷守恆定律,該正端電位線PL之電位改變為V
inp-15/32V
r,該負端電位線NL之電位改變為V
inn+15/32V
r,因此,該比較器130於第5位元的比對可判斷V
inp-V
inn>15/16V
r或V
inp-V
inn<15/16V
r,而可確實地符合二分搜尋法。
Please refer to Figure 11, when the 1-bit alignment is 1, the 2-bit alignment is 1, the 3-bit alignment is 1, and the 4-bit alignment result is V inp -V inn >7/8V r , the first positive
請參閱第12圖,當1位元比對為1、第2位元比對為1、第3位元比對為0且第4位元比對結果為V
inp-V
inn>5/8V
r時,將右側之該第一正端電容113切換至耦接該接地端,並將右側之該第一負端電容115切換至耦接該調整電壓3/8V
r,可讓該正端電位線PL之電位改變為V
inp-11/32V
r,該負端電位線NL之電位改變為V
inn+11/32V
r,因此,該比較器130於第5位元的比對可判斷V
inp-V
inn>11/16V
r或V
inp-V
inn<11/16V
r,而可確實地符合二分搜尋法。
Please refer to Figure 12, when the 1-bit alignment is 1, the 2-bit alignment is 1, the 3-bit alignment is 0, and the 4-bit alignment result is V inp -V inn >5/8V r , the first positive
請參閱第13圖,當1位元比對為1、第2位元比對為0、第3位元比對為1且第4位元比對結果為V
inp-V
inn>3/8V
r時,將右側之該第一正端電容113切換至耦接該接地端,並將右側之該第一負端電容115切換至耦接該調整電壓3/8V
r,可讓該正端電位線PL之電位改變為V
inp-7/32V
r,該負端電位線NL之電位改變為V
inn+7/32V
r,因此,該比較器130於第5位元的比對可判斷V
inp-V
inn>7/16V
r或V
inp-V
inn<7/16V
r,而可確實地符合二分搜尋法。
Please refer to Figure 13, when the 1-bit alignment is 1, the 2-bit alignment is 0, the 3-bit alignment is 1, and the 4-bit alignment result is V inp -V inn > 3/8V r , the first positive
本發明藉由各該三級切換開關120選擇性地將各該正端電容111之耦接至各該負端電容112、或讓各該正端電容111之該第二端耦接至該參考電壓V
r、該接地端或該調整電壓V
g、或讓各該負端電容112之該第二端耦接至該參考電壓V
r、該接地端或該調整電壓V
g,且該調整電壓V
g之電位為該參考電壓V
r之電位的3/2、3/4或3/8倍,使得本發明之該拆分合併式電容陣列110所使用的電容容量可以減少,而大幅地降低該拆分合併式逐漸逼近類比數位轉換器100的佈局面積。
The present invention selectively couples the positive
本發明之保護範圍當視後附之申請專利範圍所界定者為準,任何熟知此項技藝者,在不脫離本發明之精神和範圍內所作之任何變化與修改,均屬於本發明之保護範圍。The protection scope of the present invention shall be determined by the scope of the appended patent application. Any changes and modifications made by anyone who is familiar with the art without departing from the spirit and scope of the present invention shall fall within the protection scope of the present invention. .
100:拆分合併式逐漸逼近類比數位轉換器
110:拆分合併式電容陣列
111:正端電容
112:負端電容
113:第一正端電容
113a:第一端
113b:第二端
114:第二正端電容
114a:第一端
114b:第二端
115:第一負端電容
115a:第一端
115b:第二端
116:第二負端電容
116a:第一端
116b:第二端
120:三級切換開關
121:第一三級切換開關
121a:第一合併開關
121b:第一正端切換開關
121c:第一負端切換開關
122:第二三級切換開關
122a:第二合併開關
122b:第二正端切換開關
122c:第二負端切換開關
130:比較器
131:正極輸入端
132:負極輸入端
140:SAR邏輯電路
150:正端取樣開關
160:負端取樣開關
PL:正端電位線
NL:負端電位線
V
r:參考電壓
S
vc:比較訊號
V
g:調整電壓
S
p:正端控制訊號
S
n:負端控制訊號
T
p:正端電壓輸入端
T
n:負端電壓輸入端
S
ms:拆分合併控制訊號
V
inp:正端電壓
V
inn:負端電壓
D
out:數位輸出訊號
100: split and merged gradual approximation analog digital converter 110: split and merged capacitor array 111: positive terminal capacitor 112: negative terminal capacitor 113: first positive
第1圖:依據本發明之一實施例,一種拆分合併式逐漸逼近類比數位轉換器的方塊圖。 第2圖:依據本發明之一實施例,該拆分合併式逐漸逼近類比數位轉換器的電路圖。 第3-13圖:依據本發明之一實施例,該拆分合併式逐漸逼近類比數位轉換器之三級切換開關切換過程的電路作動圖。 FIG. 1 is a block diagram of a split-merge progressive approximation analog-to-digital converter according to an embodiment of the present invention. Fig. 2: According to an embodiment of the present invention, a circuit diagram of the split-merge-type progressive approximation analog-to-digital converter. Fig. 3-13: According to an embodiment of the present invention, the circuit diagram of the switching process of the three-level switch of the split-merge-type gradual approximation analog-to-digital converter.
100:拆分合併式逐漸逼近類比數位轉換器 100: Split Merge Gradual Approximation Analog-to-Digital Converter
110:拆分合併式電容陣列 110: Split and merged capacitor array
111:正端電容 111: Positive terminal capacitance
112:負端電容 112: Negative terminal capacitance
120:三級切換開關 120: Three-stage toggle switch
130:比較器 130: Comparator
140:SAR邏輯電路 140: SAR logic circuit
150:正端取樣開關 150: Positive sampling switch
160:負端取樣電路 160: Negative end sampling circuit
Vr:參考電壓 V r : reference voltage
Vg:調整電壓 V g : Adjustment voltage
PL:正端電位線 PL: positive terminal potential line
NL:負端電位線 NL: Negative terminal potential line
Tp:正端電壓輸入端 T p : Positive terminal voltage input terminal
Tn:富端電壓輸入端 T n : rich terminal voltage input terminal
Sp:正端控制訊號 S p: a positive terminal of the control signal
Sn:富端控制訊號 S n : Rich end control signal
Sc:比較訊號 S c : Comparison signal
Sms:拆分合併式控制訊號 S ms : Split and merge control signal
Vinp:正端電壓 V inp : Positive terminal voltage
Vinn:負端電壓 V inn : negative terminal voltage
Dout:數位輸出訊號 D out : digital output signal
Claims (9)
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CN105071811A (en) * | 2015-07-27 | 2015-11-18 | 电子科技大学 | Bit circulation method used for improving successive approximation analog to digital converter DNL/INL |
TWI644520B (en) * | 2017-07-25 | 2018-12-11 | 國立中山大學 | Merge and split sar analog-digital converter with tri-level switch |
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CN105071811A (en) * | 2015-07-27 | 2015-11-18 | 电子科技大学 | Bit circulation method used for improving successive approximation analog to digital converter DNL/INL |
TWI644520B (en) * | 2017-07-25 | 2018-12-11 | 國立中山大學 | Merge and split sar analog-digital converter with tri-level switch |
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