TWI746806B - Medium hole contact medium, gas processing device and manufacturing method of medium hole contact medium - Google Patents

Medium hole contact medium, gas processing device and manufacturing method of medium hole contact medium Download PDF

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TWI746806B
TWI746806B TW107106134A TW107106134A TWI746806B TW I746806 B TWI746806 B TW I746806B TW 107106134 A TW107106134 A TW 107106134A TW 107106134 A TW107106134 A TW 107106134A TW I746806 B TWI746806 B TW I746806B
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film
gas
medium
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TW201842967A (en
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松本貴紀
中山鶴雄
原洋平
雨宮
秋田吾
山內悠輔
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日商Nbc紗網技術股份有限公司
國立研究開發法人物質 材料研究機構
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J23/00Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
    • B01J23/38Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals
    • B01J23/40Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals of the platinum group metals
    • B01J23/42Platinum
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D53/00Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
    • B01D53/34Chemical or biological purification of waste gases
    • B01D53/74General processes for purification of waste gases; Apparatus or devices specially adapted therefor
    • B01D53/86Catalytic processes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J23/00Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
    • B01J23/38Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals
    • B01J23/40Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals of the platinum group metals
    • B01J23/44Palladium
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J23/00Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
    • B01J23/38Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of noble metals
    • B01J23/48Silver or gold
    • B01J23/52Gold
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J23/00Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
    • B01J23/70Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of the iron group metals or copper
    • B01J23/89Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of the iron group metals or copper combined with noble metals
    • B01J23/8906Iron and noble metals
    • B01J35/23
    • B01J35/30
    • B01J35/393
    • B01J35/635
    • B01J35/647
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma

Abstract

本發明之課題在於提供可更為長期地維持活性之觸媒體。 The subject of the present invention is to provide a touch media that can maintain activity for a longer period of time.

解決手段為中孔洞觸媒體,具備:具有複數中孔洞之支撐體,被擔持於支撐體的中孔洞內的至少包含貴金屬、其氧化物、及貴金屬與過渡金屬之合金之中的一種之氧化觸媒粒子;於支撐體,一中孔洞至少與一其他中孔洞連通。 The solution is a mesoporous contact medium, which has: a support body with a plurality of mesopores, and oxidation of at least one of the noble metal, its oxide, and an alloy of noble metal and transition metal is supported in the middle hole of the support body Catalyst particles; in the support, a middle hole is connected to at least one other middle hole.

Description

中孔洞觸媒體、氣體處理裝置及中孔洞觸媒體之製造方法 Medium hole contact medium, gas processing device and manufacturing method of medium hole contact medium

本發明係關於可以分解例如氣體中的乙烯等有機成分或一氧化碳、氨等之觸媒體。 The present invention relates to a catalyst capable of decomposing organic components such as ethylene, carbon monoxide, ammonia, and the like in gas.

汽車或工廠等的內燃機所產生的排放氣體含有微量的一氧化碳等有害成分,所以使用除去手段將其除去之後才排放到大氣中。此外,在密閉的保管庫等會產生微量的惡臭物質,有發生氨臭的場合,被施以種種的除去手段。 Exhaust gas produced by internal combustion engines in automobiles or factories contains small amounts of harmful components such as carbon monoxide, so it is removed by means of removal before being discharged into the atmosphere. In addition, a small amount of malodorous substances are generated in a closed storage, etc., and when ammonia odor occurs, various removal methods are applied.

此外,由植物放出多種多樣的微量有機氣體,但是保管中的農作物會放出具有熟成作用的乙烯氣體,進行自身的熟成係屬已知。因此,使溫度、濕度保持一定同時減低此乙烯氣體濃度,對於長期間保持鮮度是有效的。 In addition, plants emit a variety of trace organic gases, but crops in storage emit ethylene gas that has a maturation effect, and the maturation system is known. Therefore, keeping the temperature and humidity constant while reducing the ethylene gas concentration is effective for maintaining freshness over a long period of time.

作為除去氣體中所含成分的方法,廣泛使用活性碳等往吸附劑之吸附、根據電漿產生裝置之自由基、或是根據臭氧等活性種之分解除去方法等。然而根據吸附劑之吸附處理在吸附劑的吸附量有其上限,必須定期交換吸附劑。使用電漿等活性種的處理方法必須要一定大小的 產生裝置,此外其運轉需要電力並不是可以簡便利用的方法,進而於農作物的保管,因為有脫色等外觀上改變的疑慮所以無法使用。 As a method of removing the components contained in the gas, adsorption of activated carbon and the like to an adsorbent, free radicals based on plasma generators, or decomposition and removal methods based on active species such as ozone, etc. are widely used. However, according to the adsorption treatment of the adsorbent, the adsorption capacity of the adsorbent has its upper limit, and the adsorbent must be exchanged regularly. The treatment method using active species such as plasma must be of a certain size In addition, the generating device requires electricity for its operation, which is not a method that can be easily utilized. Furthermore, it cannot be used because of concerns about changes in appearance such as discoloration for the storage of crops.

此外,除了如前述的電漿法那樣以物理產生的活性種進行氧化分解的方法以外,也廣泛使用觸媒來氧化分解氣體中所含有的成分之方法。作為氧化觸媒體,為了增廣接觸面積,而使用在無機粒子之擔體擔持活性物質(觸媒粒子)的構造體(專利文獻1),以使活性物質多孔質化之膜處理揮發性有機化合物之方法已被揭示(專利文獻4)。此外,具有汽缸狀的中孔洞之無機中孔洞擔體之細孔內使擔持觸媒粒子之觸媒體也被開發出來,與在無機粒子的外表面擔持觸媒粒子之觸媒體或使活性物質多孔質化的膜相比,得到非常寬廣的比表面積而活性很高的觸媒體(專利文獻2、3)。 In addition to the method of oxidizing and decomposing the components contained in the gas by oxidation and decomposition using a catalyst such as the aforementioned plasma method, a method of oxidizing and decomposing components contained in the gas is also widely used. As an oxidizing catalyst, in order to increase the contact area, a structure in which an active material (catalyst particle) is supported on a support of inorganic particles is used (Patent Document 1) to make the active material porous to the membrane to treat volatile organic compounds. The method of the compound has been disclosed (Patent Document 4). In addition, a catalyst that supports catalyst particles in the pores of an inorganic mesoporous support with cylinder-shaped mesopores has also been developed, and a catalyst that supports catalyst particles on the outer surface of inorganic particles may be activated. Compared with a porous membrane, a contact medium with a very wide specific surface area and high activity is obtained (Patent Documents 2 and 3).

[先前技術文獻] [Prior Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2003-080077號公報 [Patent Document 1] JP 2003-080077 A

[專利文獻2]日本特開2004-283770號公報 [Patent Document 2] JP 2004-283770 A

[專利文獻3]日本特開2007-326094號公報 [Patent Document 3] JP 2007-326094 A

[專利文獻4]日本特開2006-326530號公報 [Patent Document 4] JP 2006-326530 A

然而,前述汽缸狀中孔洞擔體擔持氧化觸媒粒子之觸媒體,存在隨著使用而觸媒活性降低的問題點。其原因還不清楚,但可能原因有藉由在細孔中大氣中的水分或氧化反應所產生的水分吸附,阻礙觸媒粒子與被處理氣體之接觸而使成為處理對象的成分之分解反應不能進行,或者細孔被吸附水所密封,妨礙被處理氣體往細孔內流通等原因。 However, the aforementioned cylinder-shaped hollow support body supports the catalyst of the oxidation catalyst particles, and there is a problem that the catalyst activity decreases with use. The reason is not clear, but the possible reason is that the moisture in the air in the pores or the moisture generated by the oxidation reaction prevents the contact between the catalyst particles and the gas to be treated, and the decomposition reaction of the components to be treated cannot be prevented. Or the pores are sealed by adsorbed water, hindering the flow of the gas to be processed into the pores, etc.

本發明之目的在於提供可更為長期地維持活性之觸媒體以及使用彼之氣體處理裝置。 The purpose of the present invention is to provide a contact medium that can maintain its activity for a longer period of time and a gas processing device using it.

本發明之要旨如下。 The gist of the present invention is as follows.

[1]一種中孔洞觸媒體,具備:具有複數中孔洞之支撐體,被擔持於前述支撐體的中孔洞內的至少包含貴金屬、其氧化物、及前述貴金屬與過渡金屬之合金之中的一種之氧化觸媒粒子;於前述支撐體,一中孔洞至少與一其他中孔洞連通。 [1] A mesoporous contact medium, comprising: a support body having a plurality of mesopores, and at least a noble metal, an oxide thereof, and an alloy of the noble metal and the transition metal supported in the mesopores of the support A kind of oxidation catalyst particles; in the aforementioned support, a middle hole is connected to at least one other middle hole.

[2]一種中孔洞觸媒體,藉由形成包含:烷氧基矽烷或金屬烷氧化物(alkoxide)之加水分解物,及乾燥及燒成(firing)聚氧乙烯烷基醚、與聚環氧烷三嵌段共聚物(polyalkylene oxide tri-block copolymer)或陽離子界面活性劑之溶液所得的具有中孔洞之支撐體,以及使與對應於貴金屬、其氧化物、及前述貴金屬與過渡金屬之合金之至 少一種的化合物之溶液或者膠體溶液接觸,進行燒成及/或還原處理而於前述支撐體之中孔洞內形成含前述貴金屬、其氧化物、及前述貴金屬與過渡金屬之合金之至少一種的氧化觸媒粒子而得。 [2] A mesoporous contact medium by forming a hydrolyzable product containing alkoxysilane or alkoxide, and drying and firing polyoxyethylene alkyl ether, and polyepoxy A mesoporous support obtained from a polyalkylene oxide tri-block copolymer or a solution of a cationic surfactant, and an alloy corresponding to the noble metal, its oxide, and the aforementioned noble metal and transition metal to The solution or colloidal solution of at least one compound is contacted and fired and/or reduced to form an oxidation containing at least one of the noble metal, its oxide, and the alloy of the noble metal and the transition metal in the pores of the support. It is derived from catalyst particles.

[3]如[1]或[2]記載之中孔洞觸媒體,前述支撐體係由金屬氧化物或SiO2形成。 [3] As described in [1] or [2], the above-mentioned supporting system is formed of metal oxide or SiO 2 in the hole contact medium.

[4]如[3]記載之中孔洞觸媒體,前述金屬氧化物係由TiO2、Fe2O3、ZrO2、及CeO2構成的群所選擇之1種或2種以上之化合物。 [4] As described in [3], in the hole contact medium, the aforementioned metal oxide is a compound of one or more selected from the group consisting of TiO 2 , Fe 2 O 3 , ZrO 2 , and CeO 2.

[5]如[1]至[4]之任一之中孔洞觸媒體,前述貴金屬為金、鉑及鈀構成的群所選擇之1種或2種以上。 [5] As in any of [1] to [4], the aforementioned noble metal is one or more selected from the group consisting of gold, platinum and palladium.

[6]如[1]至[5]之任一記載之中孔洞觸媒體,前述支撐體為粉體。 [6] As in any one of [1] to [5], the hole touches the medium, and the aforementioned support is powder.

[7]如[1]至[6]之任一記載之中孔洞觸媒體,前述中孔洞以BET法測定之平均孔徑為2nm以上10nm以下。 [7] As in the pore contact medium in any one of [1] to [6], the average pore diameter of the aforementioned mesopores measured by the BET method is 2 nm or more and 10 nm or less.

[8]如[1]至[7]之任一記載之中孔洞觸媒體,前述氧化觸媒粒子之平均粒徑為1nm以上10nm以下。 [8] As described in any one of [1] to [7], in the porous catalyst medium, the average particle diameter of the oxidation catalyst particles is 1 nm or more and 10 nm or less.

[9]如[1]至[8]之任一記載之中孔洞觸媒體,前述氧化觸媒粒子之擔持量為對含該氧化觸媒粒子之支撐體為0.1~30質量百分比。 [9] As in any of the descriptions in [1] to [8], in the porous contact medium, the supporting amount of the aforementioned oxidation catalyst particles is 0.1-30% by mass to the support containing the oxidation catalyst particles.

[10]如[1]至[8]之任一記載之中孔洞觸媒體,前述中孔洞觸媒體為氣體之氧化反應用觸媒。 [10] As described in any one of [1] to [8], the above-mentioned mesoporous contact medium is a catalyst for gas oxidation reaction.

[11]一種氣體處理裝置,其特徵為:至少具備第1電極、第2電極、被配置於前述第1電極與前述第2電極之間 的介電質;具備:藉由對前述第1電極與前述第2電極之間施加電壓使產生放電而產生電漿之電漿產生部、被形成於藉由前述電漿產生部產生的前述電漿存在的區域之被處理氣體流通之流道、以及被配置於前述流道之[1]至[10]之任一記載之中孔洞觸媒體。 [11] A gas processing device characterized by: at least a first electrode, a second electrode, and is arranged between the first electrode and the second electrode The dielectric substance; comprising: a plasma generating portion that generates plasma by applying a voltage between the first electrode and the second electrode to generate a discharge, and is formed on the electricity generated by the plasma generating portion The flow channel through which the processed gas flows in the area where the slurry exists, and the hole contacting the medium arranged in any of the aforementioned flow channels [1] to [10].

[12]一種中孔洞觸媒體之製造方法,含有形成包含:烷氧基矽烷或金屬烷氧化物(alkoxide)之加水分解物,及乾燥及燒成(firing)聚氧乙烯烷基醚、與聚環氧烷三嵌段共聚物(polyalkylene oxide tri-block copolymer)或陽離子界面活性劑之溶液所得的具有中孔洞之支撐體,以及使與對應於貴金屬、其氧化物、及前述貴金屬與過渡金屬之合金之至少一種的化合物之溶液或者膠體溶液接觸,進行燒成及/或還原處理而於前述支撐體之中孔洞內形成含前述貴金屬、其氧化物、及前述貴金屬與過渡金屬之合金之至少一種的氧化觸媒粒子。 [12] A method for manufacturing a mesoporous contact medium, including forming a hydrolyzable product containing alkoxysilane or alkoxide, drying and firing polyoxyethylene alkyl ether, and polyoxyethylene alkyl ether. Polyalkylene oxide tri-block copolymer (polyalkylene oxide tri-block copolymer) or cationic surfactant solution obtained with mesoporous support, and corresponding to the noble metal, its oxide, and the aforementioned noble metal and transition metal Contact with a solution or colloidal solution of at least one compound of the alloy, and perform sintering and/or reduction treatment to form at least one of the noble metal, its oxide, and the alloy of the noble metal and the transition metal in the hole in the support的oxidation catalyst particles.

根據本發明,可以提供可更為長期地維持活性之觸媒體以及使用彼之氣體處理裝置。 According to the present invention, it is possible to provide a contact medium that can maintain its activity for a longer period of time and a gas processing device using it.

11:施加電極 11: Apply electrode

12:接地電極 12: Ground electrode

12a:接地線 12a: Ground wire

13:介電質 13: Dielectric

14:電源 14: power supply

100:觸媒體膜 100: Touch media film

200:氣體處理裝置 200: Gas treatment device

300:氣體處理裝置 300: Gas treatment device

400:氣體處理裝置 400: Gas treatment device

圖1係模式顯示第1實施型態之氣體處理裝置200的剖 面之一部分之圖。 Fig. 1 schematically shows a cross-section of the gas processing device 200 of the first embodiment A picture of a part of the surface.

圖2係模式顯示第2實施型態之氣體處理裝置300的剖面之一部分之圖。 FIG. 2 is a diagram schematically showing a part of the cross-section of the gas processing device 300 of the second embodiment.

圖3係模式顯示第3實施型態之氣體處理裝置400的剖面之一部分之圖。 FIG. 3 is a diagram schematically showing a part of the cross-section of the gas processing device 400 of the third embodiment.

圖4係模式顯示第4實施型態之氣體處理裝置500的剖面之一部分之圖。 FIG. 4 is a diagram schematically showing a part of a cross-section of a gas processing device 500 of the fourth embodiment.

圖5係可以理解實施例1之觸媒體具有連通構造之3次元斷層掃描影像。 Fig. 5 is a 3-dimensional tomographic image in which it can be understood that the touch media of Example 1 has a connected structure.

圖6係可以理解實施例1之觸媒體具有連通構造之3次元斷層掃描影像。 Fig. 6 is a 3-dimensional tomographic image in which it can be understood that the touch media of Example 1 has a connected structure.

圖7係可以理解實施例1之觸媒體具有連通構造之3次元斷層掃描影像。 Fig. 7 is a 3-dimensional tomographic image in which it can be understood that the touch media of Example 1 has a connected structure.

以下,詳述本發明之實施型態。 Hereinafter, the implementation mode of the present invention will be described in detail.

本實施型態之中孔洞觸媒體(以下亦簡稱為觸媒體),是具有通氣性的構件,包含於支撐體的表面開口而具有可通氣體之複數中孔洞孔徑的細孔(中孔洞)之多孔質的支撐體,以及被擔持於該支撐體的中孔洞內的包含貴金屬、貴金屬氧化物及貴金屬與過渡金屬之合金之中的至少一種之氧化觸媒粒子(以下亦稱為氧化觸媒粒子)。於本實施型態之觸媒體,支撐體包含之一中孔洞至少與一其他中孔洞連通。 In this embodiment, the pore touch medium (hereinafter also referred to as the touch medium) is an air-permeable member, which is included in the surface of the support body and has a plurality of pores (middle pores) with gas-permeable apertures. A porous support, and an oxidation catalyst particle containing at least one of a noble metal, a noble metal oxide, and an alloy of noble metal and transition metal supported in the mesopores of the support (hereinafter also referred to as an oxidation catalyst particle). In the touch medium of this embodiment, the supporting body includes a middle hole that is connected to at least one other middle hole.

本實施型態之觸媒體,可以把有機氣體等成為處理對象的成分以氧化反應分解處理為二氧化鈦或水等,排出至大氣中。於本實施型態之觸媒體可以處理的氣體沒有特別限定,可以舉出香菸副流煙中的一氧化碳、或農產品或花卉等植物所散發的化合物、汽車內裝材、住宅之建材/內裝材、家電的筐體/構件等素材所揮發的物質、由塗料、接著劑、洗淨劑等有機溶劑所揮發的物質等。具體而言,可以例示甲烷、乙烷、丙烷、丁烷、乙烯、丙烯、異丙烯、苯、二甲苯、甲苯、乙苯、苯乙烯、α-菌綠烯、β-菌綠烯等碳化氫類、甲醇、乙醇、1-丙醇、1-丁醇、1-戊醇、1-己醇、1-庚醇、1-辛醇、反-2-己烯醇、順-2-己烯醇、反-3-己烯醇、順-3-己烯醇、芳樟醇(linalool)、苯甲醇等醇類、甲醛、乙醛、丙醛、丁醛、戊醛、壬醛、苯甲醛、己醛、反-2-己烯醛、順-2-己烯醛、反-2-辛烯醛、反-2-壬烯醛、順-2-壬烯醛、反,順-2,6-壬二烯醛、反,順-2,4-癸二烯醛等醛類、丙酮、甲乙酮、二乙酮、甲異丁酮、環己酮、苯乙酮等酮類、甲酸甲酯、乙酸乙酯、乙酸丙酯、乙酸異丙酯、乙酸辛酯、乙酸己酯、乙酸芐酯、丁酸甲酯、丁酸乙酯、丁酸丙酯、水楊酸甲酯、己酸乙酯、戊酸丙酯、乙基-2-甲基丙酯、丁酸乙酯、2-甲基丁酸甲酯、2-甲基丁酸乙酯、3-甲基丁酸乙酯、3-羥基丁酸甲酯、己酸甲酯、己酸乙酯、己酸己酯、3-羥基己酸甲酯、己酸辛酯、辛酸乙酯、3-羥基辛酸甲酯、烟酸乙酯、γ-己內酯、γ-辛內酯、δ-辛內酯、γ-癸內酯、δ-癸內 酯、γ-十二內酯、δ-十二內酯等酯類、甲酸、乙酸、丙酸、丁酸、戊酸、己酸、庚酸、辛酸、2-甲基丙酸、2-甲基丁酸等羧酸類、反-橙花叔醇(nerolidol)、順-橙花叔醇、菌綠烯醇(farnesol)等萜烯類或丁香油酚、香草醛(vanillin)等酚類、氨或三甲基胺、三乙基胺等胺類、甲硫醇、乙硫醇、丙硫醇等硫醇類、甲硫醚、二甲基硫、二甲基亞碸等硫磺有機化合物等。 The touch media of this embodiment can decompose organic gas and other components to be processed into titanium dioxide or water by oxidation reaction, and then discharge them into the atmosphere. The gas that can be processed by the touch media of this embodiment is not particularly limited. Examples include carbon monoxide in the sidestream smoke of cigarettes, or compounds emitted by plants such as agricultural products or flowers, interior materials for automobiles, and building materials/interior materials for houses. , Substances volatilized from materials such as housings/components of home appliances, substances volatilized from organic solvents such as paints, adhesives, detergents, etc. Specifically, examples of hydrocarbons such as methane, ethane, propane, butane, ethylene, propylene, isopropylene, benzene, xylene, toluene, ethylbenzene, styrene, α-bacterene, β-bacterene, etc. Class, methanol, ethanol, 1-propanol, 1-butanol, 1-pentanol, 1-hexanol, 1-heptanol, 1-octanol, trans-2-hexenol, cis-2-hexene Alcohol, trans-3-hexenol, cis-3-hexenol, linalool, benzyl alcohol and other alcohols, formaldehyde, acetaldehyde, propionaldehyde, butyraldehyde, valeraldehyde, nonanal, benzaldehyde , Hexanal, trans-2-hexenal, cis-2-hexenal, trans-2-octenal, trans-2-nonenal, cis-2-nonenal, trans, cis-2, Aldehydes such as 6-nonadienal, trans, cis-2,4-decadienal, acetone, methyl ethyl ketone, diethyl ketone, methyl isobutyl ketone, cyclohexanone, acetophenone and other ketones, methyl formate , Ethyl acetate, propyl acetate, isopropyl acetate, octyl acetate, hexyl acetate, benzyl acetate, methyl butyrate, ethyl butyrate, propyl butyrate, methyl salicylate, ethyl caproate Ester, propyl valerate, ethyl-2-methyl propyl, ethyl butyrate, methyl 2-methyl butyrate, ethyl 2-methyl butyrate, ethyl 3-methyl butyrate, 3 -Methyl hydroxybutyrate, methyl caproate, ethyl caproate, hexyl caproate, methyl 3-hydroxyhexanoate, octyl caproate, ethyl caprylate, methyl 3-hydroxyoctanoate, ethyl nicotinate, γ-caprolactone, γ-caprolactone, δ-caprolactone, γ-decanolide, δ-decanolide Esters, γ-laurolactone, δ-laurolactone and other esters, formic acid, acetic acid, propionic acid, butyric acid, valeric acid, caproic acid, heptanoic acid, caprylic acid, 2-methylpropionic acid, 2-methyl Butyric acid and other carboxylic acids, trans-nerolidol, cis-nerolidol, farnesol and other terpenes, or eugenol, vanillin and other phenols, ammonia Or amines such as trimethylamine and triethylamine, mercaptans such as methyl mercaptan, ethyl mercaptan, and propyl mercaptan, sulfur organic compounds such as methyl sulfide, dimethyl sulfide, dimethyl sulfide, etc.

其中,於乙烯或一氧化碳等的分解,使用本實施型態之觸媒體時觸媒活性更長時間地被維持著,所以較佳。此外,以乙烯為分解對象時藉由SiO2形成支撐體,氧化觸媒粒子以包含鉑、鉑氧化物、鉑與過渡金屬之合金、鈀鈀氧化物及鈀與過渡金屬之合金構成的群所選擇之1種或2種以上為較佳,含有鉑、鉑氧化物及鉑與過渡金屬之合金構成的群所選擇之1種或2種以上進而又更佳,含有鉑氧化物進而又更佳。以一氧化碳為分解對象時藉由金屬氧化物形成支撐體,氧化觸媒粒子含有金及/或金與過渡金屬之合金為更佳。 Among them, in the decomposition of ethylene, carbon monoxide, etc., the catalyst activity is maintained for a longer period of time when the catalyst of this embodiment is used, so it is preferable. In addition, when ethylene is the decomposition target, SiO 2 is used to form a support, and the oxidation catalyst particles are composed of a group consisting of platinum, platinum oxide, platinum and transition metal alloy, palladium palladium oxide, and palladium and transition metal alloy. It is preferable to select one or two or more, and one or two or more selected from the group consisting of platinum, platinum oxide, and an alloy of platinum and transition metals are more preferable, and platinum oxide is more preferable . When carbon monoxide is used as a decomposition target, a metal oxide is used to form a support, and it is more preferable that the oxidation catalyst particles contain gold and/or an alloy of gold and transition metals.

於本說明書,中孔洞係指以BET法求得的直徑為2nm以上50nm以下的細孔,指觸媒體的表面之開口部與其他的開口部連通之細孔。中孔洞的形狀或其開口部的位置關係等沒有特別限定。 In this specification, mesopores refer to pores with a diameter of 2 nm or more and 50 nm or less obtained by the BET method, and refer to pores where the opening on the surface of the touch medium communicates with other openings. The shape of the middle hole or the positional relationship of the openings thereof are not particularly limited.

於本實施型態之觸媒體,一個中孔洞在支撐體內部分歧而與其他的中孔洞連通著(以下,亦稱為連通構造)。又,支撐體是否具有連通構造可以藉由3次元透過 型電子顯微鏡(TEM)來確認。 In the touch medium of this embodiment, one middle hole is branched inside the support body and communicates with the other middle holes (hereinafter, also referred to as a connected structure). Also, whether the support has a connected structure can be penetrated by 3 dimensions Type electron microscope (TEM) to confirm.

本實施型態之觸媒體,可以是粉體、粒子體、膜狀等各種各樣的型態。其中,以膜狀,特別是具有膜厚1000nm以下的膜狀型態進而變得更不容易產生觸媒效率的下降所以較佳。此外,是粉體的話,能夠以種種形狀型態使用所以較佳。粉體的場合,其大小沒有特別限定,可由熟悉該項技藝者適當地設定。 The touch media of this embodiment can be in various forms such as powder, particle, and film. Among them, a film shape, particularly a film shape having a film thickness of 1000 nm or less, is less likely to cause a decrease in the catalyst efficiency, so it is preferable. In addition, if it is a powder, it can be used in various shapes and forms, so it is preferred. In the case of powder, the size is not particularly limited, and can be appropriately set by those skilled in the art.

藉由把被處理氣體暴露於本實施型態之觸媒體,被處理氣體往處媒體內部擴散,與細孔內的氧化觸媒粒子接觸,有機氣體等成為處理對象的成分被氧化分解。 By exposing the gas to be processed to the contact medium of this embodiment, the gas to be processed diffuses into the medium and comes into contact with the oxidation catalyst particles in the pores, and the organic gas and other components to be processed are oxidized and decomposed.

從前的粉末狀之中孔洞觸媒體,中孔洞不具有連通構造,具有1個中孔洞之支撐體的上面開口部與下面開口部直線狀地連通之氣缸構造等。在此場合,於中孔洞即使只存在有1處因為吸附水等導致有閉塞部,此中孔洞之通氣性就喪失,特別是在粉體會有在中孔洞內部直到氣流為止的距離相對變長的部位,於此部位,會成為粉體內部吸附的水分變得難以發生脫離的狀態。因此,推測在從前的中孔洞觸媒體,容易發生吸附水導致中孔洞的閉塞,使得觸媒活性降低。 The former powdered medium-hole contact media, the medium-hole does not have a connecting structure, and a cylinder structure in which the upper opening of the support body with one middle hole communicates with the lower opening linearly. In this case, even if there is only one occluded part in the middle hole due to adsorption of water, the air permeability of the middle hole is lost, especially in the case of powder, the distance from the inside of the middle hole to the air flow is relatively long The part, in this part, will be in a state where it is difficult for the moisture adsorbed inside the powder to escape. Therefore, it is inferred that in the former mesoporous contact media, the occlusion of the mesopores due to adsorption of water is likely to occur, which reduces the catalyst activity.

另一方面,連通構造於支撐體內部中孔洞相互連接著所以在支撐體內部即使水分附著也不容易損及通氣性,不容易妨礙支撐體中孔洞內擔持的氧化觸媒粒子與被處理氣體之接觸。結果,不管是粉體、顆粒狀、膜狀等觸媒體的形狀,都可以使觸媒活性維持更長期。 On the other hand, the communication structure is connected with the holes in the support body, so even if moisture adheres inside the support body, it is not easy to damage the air permeability, and it is not easy to hinder the oxidation catalyst particles and the gas to be processed in the holes in the support body. Of contact. As a result, regardless of the shape of the catalyst medium such as powder, granule, film, etc., the catalyst activity can be maintained for a longer period of time.

又,於本實施型態之觸媒體,只要具有連通構造可以達成本發明的目的,於中孔洞的一部分含有與其他中孔洞不連通者亦可。 In addition, in the touch medium of this embodiment, as long as it has a connecting structure, the purpose of the invention can be achieved, and a part of the middle hole may contain a part that is not connected to other middle holes.

於本實施型態之觸媒體,中孔洞之直徑只要滿足前述定義即可,沒有特別限定,但根據BET法之平均直徑為2nm以上10nm以下,被擔持的氧化觸媒粒子的粒徑也成為該範圍內,可得更高活性的觸媒體所以較佳。 In the catalyst of this embodiment, the diameter of the mesoporous hole is not particularly limited as long as it satisfies the aforementioned definition. However, the average diameter according to the BET method is 2 nm or more and 10 nm or less, and the particle diameter of the supported oxidation catalyst particles is also Within this range, a contact medium with higher activity can be obtained, so it is preferable.

又,相關於本實施型態之支撐體具有的細孔的直徑是使用根據日本工業標準JIS-Z-8831使用根據BET法之自動比表面積/細孔分布測定裝置所算出之值。 In addition, the diameter of the pores of the support body related to this embodiment is a value calculated using an automatic specific surface area/pore distribution measuring device according to the BET method in accordance with the Japanese Industrial Standard JIS-Z-8831.

氧化觸媒粒子,只要是包含具有促進氧化反應的觸媒機能之貴金屬、貴金屬氧化物及貴金屬與過渡金屬之合金之中至少任1種之粒子即可,沒有特別限定。 The oxidation catalyst particles are not particularly limited as long as they contain at least one of a precious metal, a precious metal oxide, and an alloy of a precious metal and a transition metal, which has a catalytic function that promotes the oxidation reaction.

於本說明書,貴金屬係指金、銀及白金族之釕、銠、鈀、鋨、銥及鉑。貴金屬氧化物為前述貴金屬之氧化物及其水和物,具體而言可以舉出Au2O3、Ag2O、AgO、Ag2O.Ag2O3、RuO2、RuO4、Rh2O3、PdO、OsO2、OsO4、IrO2、Ir2O3.nH2O、PtO2、PtO2.H2O、鉑黑等。 In this specification, precious metals refer to ruthenium, rhodium, palladium, osmium, iridium and platinum of the gold, silver and platinum groups. Noble metal oxides are the aforementioned noble metal oxides and their hydrates, specifically Au 2 O 3 , Ag 2 O, AgO, Ag 2 O. Ag 2 O 3 , RuO 2 , RuO 4 , Rh 2 O 3 , PdO, OsO 2 , OsO 4 , IrO 2 , Ir 2 O 3 . nH 2 O, PtO 2 , PtO 2 . H 2 O, platinum black, etc.

合金之過渡金屬只要是可以與貴金屬形成合金即可,沒有特別限定,可以舉出Sc、Ti、V、Cr、Mn、Fe、Co、Ni、Cu、Zn、Y、Zr、Nb、Mo、Tc、Ru、Rh、Pd、Ag、Cd、W等。 The transition metal of the alloy is not particularly limited as long as it can form an alloy with the noble metal. Examples include Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Y, Zr, Nb, Mo, Tc , Ru, Rh, Pd, Ag, Cd, W, etc.

較佳為以包含氧化觸媒能力更高之金、鉑、鈀、這些的氧化物、及金、鉑及鈀之至少任1與過渡金屬之合金構 成的群所選擇之1種或2種以上的方式構成氧化觸媒粒子為佳。在此場合,作為適宜的氧化觸媒粒子之構成成分,可以舉出由Au、Pt、Pd、PdO、Au2O3、PtO2、PtO2.H2O、及鉑黑構成的群所選擇之1種或2種以上所構成的粒子。 Preferably, one or two or more selected from the group consisting of gold, platinum, palladium, oxides of these, and alloys of at least any one of gold, platinum, and palladium, and transition metals with higher oxidation catalyst ability The way to form oxidation catalyst particles is better. In this case, suitable components of the oxidation catalyst particles include Au, Pt, Pd, PdO, Au 2 O 3 , PtO 2 , and PtO 2 . A particle composed of one or more selected from the group consisting of H 2 O and platinum black.

氧化觸媒粒子的平均粒徑為10nm以下(更佳為1nm以上10nm以下,進而又更佳為1nm以上未滿10nm,進而又再更佳者為1nm以上6nm以下)的話,氧化觸媒粒子的比表面積增大而觸媒活性飛躍地提升始被處理氣體中的處理對象的成分之分解效率進而提高所以較佳。 If the average particle size of the oxidation catalyst particles is 10nm or less (more preferably 1nm or more and 10nm or less, still more preferably 1nm or more and less than 10nm, and still more preferably 1nm or more and 6nm or less), the oxidation catalyst particles It is preferable that the specific surface area increases and the catalyst activity greatly increases the decomposition efficiency of the components of the treatment target in the gas to be treated, and therefore it is better.

又,氧化觸媒粒子的平均粒徑以透過型電子顯微鏡(TEM)的影像照片算出粒子尺寸,可以得到其平均值。 In addition, the average particle size of the oxidation catalyst particles is calculated from the image photograph of a transmission electron microscope (TEM), and the average value can be obtained.

氧化觸媒粒子對於包含該氧化觸媒粒子之支撐體,以擔持0.1~30質量百分比(質量%)為佳,0.5~20質量%為更佳,0.5~10質量%進而又更佳。擔持比30質量%更多的話,氧化觸媒粒子彼此變得容易凝集,與在範圍內的場合相比觸媒活性會減少。未滿0.1質量%的話,與範圍內的場合相比,無法得到充分的觸媒活性所以不佳。 The oxidation catalyst particles preferably support 0.1-30 mass% (mass %) of the support containing the oxidation catalyst particles, 0.5-20 mass% is more preferable, and 0.5-10 mass% is even more preferable. If the support is more than 30% by mass, the oxidation catalyst particles will easily agglomerate with each other, and the catalyst activity will be reduced compared to when it is within the range. If it is less than 0.1% by mass, the catalyst activity cannot be sufficiently obtained compared with the case within the range, so it is not preferable.

又,於本實施型態之觸媒體,除了氧化觸媒粒子以外,亦可包含助觸媒粒子或各種金屬元素等,沒有特別限定。具體而言,亦可為混合存在著助觸媒粒子與氧化觸媒粒子者,或者是使各種金屬元素與氧化觸媒粒子複合化之複合粒子所構成的複合觸媒。氧化觸媒粒子單獨存在的場合或者是在氧化觸媒粒子混合助觸媒的場合,只要氧化觸媒粒子在前述的大小範圍內即可。此外,複合了其 他金屬元素的複合粒子的場合,只要複合粒子的大小在前述大小範圍內即可。於助觸媒或複合觸媒使用的觸媒粒子以外之金屬粒子(奈米粒子)可以舉出卑金屬及這些的氧化物等。這些貴金屬及其氧化物、卑金屬及其氧化物之粒子亦可混合2種以上,使擔持於支撐體細孔內表面。 In addition, in addition to the oxidation catalyst particles, the catalyst in this embodiment may also include auxiliary catalyst particles, various metal elements, and the like, and it is not particularly limited. Specifically, it may be a mixture of co-catalyst particles and oxidation catalyst particles, or a composite catalyst composed of composite particles composed of various metal elements and oxidation catalyst particles. When the oxidation catalyst particles exist alone or when the oxidation catalyst particles are mixed with a co-catalyst, the oxidation catalyst particles may be within the aforementioned size range. In addition, compounded its In the case of composite particles of other metal elements, as long as the size of the composite particles is within the aforementioned size range. Metal particles (nanoparticles) other than the catalyst particles used in the co-catalyst or composite catalyst include base metals and oxides of these. The particles of these noble metals and their oxides, base metals and their oxides can also be mixed with two or more types so as to be supported on the inner surface of the pores of the support.

相關於本實施型態之具有中孔洞的支撐體,考慮到包含使用成為鑄模的化合物形成中孔洞,加熱除去該化合物的步驟而製造的場合的話,則以在加熱溫度以上也不產生劣化的材料材料來構成為佳。 Regarding the support body with mesopores in this embodiment, considering that it includes the steps of forming mesopores using a compound that becomes a mold, and heating to remove the compound, it should be made of a material that does not degrade above the heating temperature. The material is better.

相關於本實施型態的支撐體,可以由金屬氧化物形成。由金屬氧化物構成的支撐體,作用於觸媒粒子,可以提高觸媒體的觸媒活性。 The support body related to this embodiment can be formed of a metal oxide. The support composed of metal oxide acts on the catalyst particles to increase the catalyst activity of the catalyst.

金屬氧化物,為金屬的氧化物,所謂金屬,係指屬於週期表之1族(H除外)、2~12族、13族(B除外)、14族(C及Si除外)、15族(N、P及As除外)、及16族(O、S、Se、及Te除外)之元素,以及鑭系元素(lanthanoid)及錒系元素(actinoid)。金屬氧化物,例如可以舉出γ-Al2O3、α-Al2O3、θ-Al2O3、η-Al2O3、非晶質Al2O3、TiO2、ZrO2、SnO2、MgO、ZnO2、Bi2O3、In2O3、MnO2、Mn2O3、Nb2O5、FeO、Fe2O3、Fe3O4、Sb2O3、CuO、Cu2O、NiO、Ni3O4、Ni2O3、CoO、Co3O4、Co2O3、WO3、CeO2、Pr6O11、Y2O3、In2O3、PbO、ThO2等金屬氧化物。此外,金屬氧化物例如亦可為Al2O3-TiO2、Al2O3-ZrO2、Al2O3-CaO、Al2O3-CeO2、Al2O3-Fe2O3、TiO2-CeO2、TiO2- ZrO2、TiO2-WO3、ZrO2-WO3、SnO2-WO3、CeO2-ZrO2、Al2O3-TiO2-ZrO2、鈰/鋯/鉍複合氧化物等之包含2種以上的金屬之複合氧化物。又,鈰/鋯/鉍複合氧化物係以一般式Ce1-X-YZrXBiYO2-δ表示的固溶體,X、Y、δ之值分別在0.1≦X≦0.3、0.1≦Y≦0.3、0.05≦δ≦0.15之範圍。 Metal oxides are oxides of metals. The so-called metals refer to groups 1 (except for H), 2 to 12, 13 (except for B), 14 (except for C and Si), and 15 of the periodic table. N, P, and As are excluded), and 16 (except O, S, Se, and Te) elements, as well as lanthanoid and actinoid elements. Metal oxides, for example, γ-Al 2 O 3 , α-Al 2 O 3 , θ-Al 2 O 3 , η-Al 2 O 3 , amorphous Al 2 O 3 , TiO 2 , ZrO 2 , SnO 2 , MgO, ZnO 2 , Bi 2 O 3 , In 2 O 3 , MnO 2 , Mn 2 O 3 , Nb 2 O 5 , FeO, Fe 2 O 3 , Fe 3 O 4 , Sb 2 O 3 , CuO, Cu 2 O, NiO, Ni 3 O 4 , Ni 2 O 3 , CoO, Co 3 O 4 , Co 2 O 3 , WO 3 , CeO 2 , Pr 6 O 11 , Y 2 O 3 , In 2 O 3 , PbO , ThO 2 and other metal oxides. In addition, the metal oxide may also be, for example, Al 2 O 3 -TiO 2 , Al 2 O 3 -ZrO 2 , Al 2 O 3 -CaO, Al 2 O 3 -CeO 2 , Al 2 O 3 -Fe 2 O 3 , TiO 2 -CeO 2 , TiO2- ZrO 2 , TiO 2 -WO 3 , ZrO 2 -WO 3 , SnO 2 -WO 3 , CeO 2 -ZrO 2 , Al 2 O 3 -TiO 2 -ZrO 2 , cerium/zirconium/ A composite oxide containing two or more metals such as bismuth composite oxide. In addition, the cerium/zirconium/bismuth composite oxide is a solid solution represented by the general formula Ce 1-XY Zr X Bi Y O 2-δ , and the values of X, Y, and δ are 0.1≦X≦0.3, 0.1≦Y, respectively The range of ≦0.3, 0.05≦δ≦0.15.

此外,支撐體以SiO2形成亦可。 In addition, the support may be formed of SiO 2.

這些支撐體的材質因應於處理對象氣體等的種類或適用觸媒體的機器或者各環境條件而選擇即可。SiO2、TiO2、Fe2O3、ZrO2、CeO2可以更堅固地擔持觸媒粒子,同時於使用基材的場合可以與該基材更強度地接著所以更佳。 The material of these supports may be selected in accordance with the type of processing target gas, etc., equipment to which the touch media is applied, or various environmental conditions. SiO 2 , TiO 2 , Fe 2 O 3 , ZrO 2 , and CeO 2 can support the catalyst particles more firmly, and at the same time, it can be more strongly bonded to the substrate when the substrate is used, so it is better.

如前所述,本實施型態之觸媒體具有的支撐體的形狀沒有特別限定,例如可以是粉體、顆粒狀、膜狀等。另一方面,支撐體的形狀以膜狀為較佳。 As described above, the shape of the support body of the touch medium of this embodiment is not particularly limited, and may be, for example, powder, granular, film, or the like. On the other hand, the shape of the support is preferably a film shape.

支撐體為膜狀的場合,氧化觸媒粒子所存在的中孔洞與被處理氣體的氣流為止之距離,與粉體壯等其他形狀的觸媒體相比是比較短的。因此,膜狀的觸媒體的中孔洞內有氣體中的水分吸附的場合,會往被處理氣體氣流發生濃度梯度,往氣流進行吸附水的再擴散,結果使吸附水抑制在一定量。藉此,支撐體具有膜狀形狀時,會成為中孔洞的閉塞更不容易發生的構造。 When the support is in the form of a film, the distance between the middle hole where the oxidation catalyst particles exist and the gas flow to be processed is relatively short compared with other shapes such as powdered catalysts. Therefore, when moisture in the gas is adsorbed in the mesopores of the film-like contact medium, a concentration gradient will occur in the gas flow to be processed, and the adsorbed water will be re-diffused into the gas flow. As a result, the adsorbed water will be suppressed to a certain amount. Thereby, when the support body has a film-like shape, it becomes a structure in which the occlusion of the mesopore is less likely to occur.

又,於本說明書,所謂膜狀形狀,是指隔開空間,或覆蓋物體之至少一部分之層那樣的形狀。 In addition, in this specification, the "film-like shape" refers to a shape such as a layer that partitions a space or covers at least a part of an object.

本實施型態之觸媒體,例如可以是使在基材 上形成為膜狀。此時,基材是否具有通氣性並沒有特別限定。在沒有通氣性的基材上配置本實施型態的觸媒體的場合,於觸媒體表面藉由模壓加工等形成凹凸亦可。觸媒體的表面被形成凹凸的話,與流通的氣體之接觸面積增加,可以更為促進被處理氣體之氧化反應。 The touch media of this embodiment, for example, can be made on the substrate The top is formed into a film shape. At this time, whether or not the substrate has air permeability is not particularly limited. When the contact medium of this embodiment is arranged on a non-air-permeable base material, the surface of the contact medium may be embossed or the like to form irregularities. If the surface of the contact medium is formed with unevenness, the contact area with the gas flowing is increased, and the oxidation reaction of the gas to be processed can be further promoted.

本實施型態之觸媒體於其表面被形成為膜狀的基材是過濾器狀或網目狀等可通氣的基材的話,亦可於本實施型態之觸媒體的厚度方向使被處理氣體流通。此外,基材具有板材等形狀的場合,亦可於基材的兩面形成本實施型態之觸媒體,使用哪一種型態可以因應於組入本實施型態之觸媒體的裝置之設計等來決定。 If the substrate of the contact medium of this embodiment is formed into a film shape on its surface is a filter-like or mesh-like substrate that is permeable, the gas to be processed can also be used in the thickness direction of the contact medium of this embodiment Circulation. In addition, when the substrate has a shape such as a plate, the touch media of this embodiment can also be formed on both sides of the substrate. Which type to use may depend on the design of the device incorporating the touch media of this embodiment, etc. Decide.

本實施型態之觸媒體具有膜狀形狀的場合,其膜厚最好是50nm以上1000nm以下。未滿50nm的話,觸媒的絕對量減少,所以與在範圍內的場合相比,分解被處理氣體中的有機氣體變難。比1000nm還大的話,吸附在存在於離開被處理氣體的位置之中孔洞的水分變得難以再放出,吸附於細孔內的水分量增加,阻礙氧化觸媒粒子的作用。與在範圍內的場合相比,該觸媒體之觸媒效率降低。 When the touch medium of this embodiment has a film-like shape, the film thickness is preferably 50 nm or more and 1000 nm or less. If it is less than 50 nm, the absolute amount of the catalyst decreases, so it is more difficult to decompose the organic gas in the gas to be processed than when it is within the range. If it is larger than 1000 nm, the moisture adsorbed in the pores in the position away from the gas to be processed becomes difficult to release again, and the amount of moisture adsorbed in the pores increases, hindering the action of the oxidation catalyst particles. Compared with the occasions within the range, the catalyst efficiency of the catalyst medium is reduced.

又,本實施型態之觸媒體具有膜狀形狀時之膜厚可以藉由TEM觀察膜的剖面,測量剖面影像的尺寸而測定出。 In addition, the film thickness when the touch medium of this embodiment has a film-like shape can be measured by observing the cross-section of the film by TEM and measuring the size of the cross-sectional image.

本實施型態之觸媒體可以被形成在基材上。在基材上使本實施型態之觸媒體形成為膜狀的場合,可以更容易使觸媒體之膜厚變薄所以較佳。基材,如前所述, 亦可為板狀等沒有通氣性的構造,亦可為具有通氣性的構造。作為具有通氣性的構造,例如可以舉出藉由衝壓加工形成多數貫通孔的薄片狀者、纖維狀、布狀、網目狀而由紡織物、網物、不織布等所構成的纖維構造體(過濾器狀)。其他還可以適當利用配合於使用目的之種種形狀及尺寸等。 The touch media of this embodiment can be formed on a substrate. When the touch medium of this embodiment is formed into a film on the base material, it is easier to make the film thickness of the touch medium thinner. The substrate, as mentioned before, It may be a structure without air permeability such as a plate shape, or a structure having air permeability. As a structure having air permeability, for example, a sheet-like, fiber-like, cloth-like, mesh-like fibrous structure (filtered fabric, mesh, non-woven fabric, etc.) in which many through holes are formed by press processing Vessel-like). Other shapes and sizes suitable for the purpose of use can also be appropriately used.

在被形成膜狀觸媒體的基材,膜狀地形成支撐體時會有進行加熱的場合,以使用具有耐得住該加熱溫度的耐熱性的材料為佳。具體而言,以使用金屬材料、陶瓷、玻璃、碳纖維、碳化矽纖維或耐熱性有機高分子材料等為佳,進而以金屬、金屬氧化物、玻璃為更佳。 When the substrate on which the film-like contact medium is formed is heated when the support is formed into a film, it is preferable to use a material having heat resistance that can withstand the heating temperature. Specifically, it is preferable to use metal materials, ceramics, glass, carbon fibers, silicon carbide fibers, or heat-resistant organic polymer materials, and more preferably metals, metal oxides, and glass.

作為用於基材的金屬材料,可以使用鎢、鉬、鉭、鈮、TZM(Titanium Zirconium Molybdenum)、W-Re(Tungsten-rhenium)等高融點金屬,或銀、釕等貴金屬及這些的合金或者氧化物、鈦、鎳、鋯、鉻、鉻鎳鐵合金(Inconel)、赫史特合金(hastelloy,耐酸耐熱鎳基超合金)等特殊金屬、鋁、銅、不銹鋼、鋅、鎂、鐵等泛用金屬即包含這些泛用金屬的合金或這些泛用金屬的氧化物。此外,亦可藉由各種鍍層及真空蒸鍍,或CVD法、濺鍍法等,把被形成前述金屬、合金或氧化物的覆膜之構件作為金屬材料使用。 As the metal material used for the substrate, high melting point metals such as tungsten, molybdenum, tantalum, niobium, TZM (Titanium Zirconium Molybdenum), W-Re (Tungsten-rhenium), or precious metals such as silver and ruthenium, and alloys of these can be used Or special metals such as oxide, titanium, nickel, zirconium, chromium, Inconel, Hastelloy (acid-resistant and heat-resistant nickel-based super alloy), aluminum, copper, stainless steel, zinc, magnesium, iron, etc. The metal used is an alloy containing these general-purpose metals or oxides of these general-purpose metals. In addition, it is also possible to use various plating and vacuum vapor deposition, or CVD method, sputtering method, etc., to form the member on which the aforementioned metal, alloy, or oxide film is formed, as a metal material.

又,於前述之金屬表面及其合金表面,通常被形成自然氧化薄膜,由矽烷化合物形成支撐體的場合,利用此自然氧化薄膜可以堅固地固定基材與支撐體。在此 場合,藉由通常習知的方法除去附著於氧化薄膜表面的油分或髒汙,可以安定且堅固地固定所以較佳。此外,亦可替代利用自然氧化膜,而在金屬表面或合金表面藉由習知的方法化學地形成氧化薄膜,或藉由陽極氧化等電化學之習知方法形成氧化薄膜。 In addition, a natural oxide film is usually formed on the aforementioned metal surface and its alloy surface, and when the support is formed of a silane compound, the natural oxide film can be used to firmly fix the substrate and the support. here In this case, it is preferable to remove oil or dirt adhering to the surface of the oxide film by a conventional method, so that it can be fixed stably and firmly. In addition, instead of using a natural oxide film, an oxide film can be chemically formed on a metal surface or an alloy surface by a conventional method, or an oxide film can be formed by an electrochemical conventional method such as anodization.

進而,作為用於基材的陶瓷,可以舉出土器、陶器、石器、瓷器等陶瓷器、玻璃、水泥、石膏、琺瑯及精密陶瓷等陶瓷。構成的陶瓷的組成,可以舉出元素系、氧化物系、氫氧化物系、碳化物系、碳酸鹽系、氮化物系、鹵化物系、及磷酸鹽系等,此外亦可為這些的複合物。 Furthermore, ceramics used for the base material include ceramics such as earthenware, pottery, stoneware, and porcelain, and ceramics such as glass, cement, plaster, enamel, and fine ceramics. The composition of the constituted ceramics can include element series, oxide series, hydroxide series, carbide series, carbonate series, nitride series, halide series, and phosphate series. In addition, it can also be a composite of these Things.

此外,作為用於基材的陶瓷,進而可以舉出鈦酸鋇、鈦鋯酸鉛、鐵酸鹽、氧化鋁、矽酸鎂石(forsterite)、氧化鋯、鋯石(zircon)、莫來石(mullite)、滑石(steatite)、菫青石(cordierite)、氮化鋁、氮化矽、碳化矽、新碳材、新玻璃等,或是高強度陶瓷、機能性陶瓷、超導陶瓷、非線性光學陶瓷、抗菌性陶瓷、生物分解陶瓷、及生醫陶瓷等陶瓷。 In addition, as ceramics used for the substrate, there can be mentioned barium titanate, lead zirconate titanate, ferrite, alumina, forsterite, zirconia, zircon, and mullite. (mullite), steatite, cordierite, aluminum nitride, silicon nitride, silicon carbide, new carbon material, new glass, etc., or high-strength ceramics, functional ceramics, superconducting ceramics, nonlinear Ceramics such as optical ceramics, antibacterial ceramics, biodegradable ceramics, and biomedical ceramics.

此外,用於基材的玻璃,可以舉出蘇打石灰玻璃、鹼性玻璃、水晶玻璃、石英玻璃、硫屬玻璃(chalcogenide glass)、鈾玻璃(uranium glass)、水玻璃、偏光玻璃、強化玻璃、層合玻璃(laminated glass)、耐熱玻璃、硼矽酸玻璃、防彈玻璃、玻璃纖維、向色玻璃(dichroic glass)、金石(茶金石、砂金石、紫金石)、玻璃 陶瓷、低融點玻璃、金屬玻璃、及藍寶石玻璃(Saphiret)等玻璃。 In addition, the glass used for the substrate includes soda lime glass, alkali glass, crystal glass, quartz glass, chalcogenide glass, uranium glass, water glass, polarized glass, tempered glass, Laminated glass (laminated glass), heat-resistant glass, borosilicate glass, bulletproof glass, glass fiber, dichroic glass (dichroic glass), gold stone (tea lapis, aventurine, amethyst), glass Ceramics, low melting point glass, metallic glass, and sapphire glass (Saphiret) and other glass.

此外,基材除此之外,也可以使用普通卜特蘭水泥(Portland cement)、快乾卜特蘭水泥、超快乾卜特蘭水泥、中庸熱卜特蘭水泥、低熱卜特蘭水泥、耐硫酸鹽卜特蘭水泥、及在卜特蘭水泥添加了高爐灰渣、飛灰、矽酸質混合材之混合水泥也就是高爐水泥、矽酸水泥、及飛灰水泥等水泥。 In addition, in addition to the base material, ordinary Portland cement, quick-drying Portland cement, ultra-fast-drying Portland cement, moderate thermal Portland cement, low-heat Portland cement, Sulfate-resistant Portland cement, and Portland cement mixed with blast furnace ash, fly ash, and silicic acid-based admixtures are cements such as blast furnace cement, portland cement, and fly ash cement.

此外,於基材除此之外可以使用二氧化鈦、氧化鋯、氧化鋁、氧化鈰(Ceria)、沸石、磷灰石、二氧化矽、活性碳、矽藻土等。進而於基材,也可以使用鉻、錳、鐵、鈷、鎳、銅、錫等之金屬氧化物。 In addition, titanium dioxide, zirconia, alumina, cerium oxide (Ceria), zeolite, apatite, silica, activated carbon, diatomaceous earth, etc. can be used in addition to the base material. Furthermore, as the base material, metal oxides such as chromium, manganese, iron, cobalt, nickel, copper, and tin can also be used.

進而,基材也可以使用聚醯亞胺、聚醚醚酮、聚苯硫醚、聚芳醯胺、聚苯幷噻唑(benzothiazole)、聚苯並噁唑、聚苯咪唑、聚喹啉(quinoline)、聚喹喔啉(quinoxaline)、氟樹脂等,或苯酚樹脂或環氧樹脂等熱硬化性樹脂等熟悉該項技藝者所公知之耐熱性有機高分子材料。 Furthermore, polyimide, polyetheretherketone, polyphenylene sulfide, polyaramide, benzothiazole, polybenzoxazole, polybenzimidazole, polyquinoline (quinoline ), quinoxaline (quinoxaline), fluororesin, etc., or thermosetting resin such as phenol resin or epoxy resin, etc. heat-resistant organic polymer materials known to those skilled in the art.

接著,說明得到本實施型態的觸媒體之方法之一例。 Next, an example of a method of obtaining the touch media of this embodiment will be described.

本實施型態之觸媒體,例如可以藉由形成包含:烷氧基矽烷或金屬烷氧化物(alkoxide)之加水分解物,及乾燥及燒成(firing)含有界面活性劑之溶液所得的具有中孔洞之支撐體,以及使與對應於貴金屬、其氧化物、及貴金屬與 過渡金屬之合金之至少一種的化合物之溶液或者該貴金屬化合物之膠體溶液接觸,進行燒成及/或還原處理而於支撐體之中孔洞內形成含貴金屬、其氧化物、及貴金屬與過渡金屬之合金之至少一種的氧化觸媒粒子而得。 The contact medium of this embodiment can be obtained by forming a hydrolyzable product containing alkoxysilane or alkoxide, and drying and firing a solution containing a surfactant. The support body of the hole, and make and correspond to the noble metal, its oxide, and noble metal and The solution of at least one compound of the transition metal alloy or the colloidal solution of the noble metal compound is contacted, and the sintering and/or reduction treatment is performed to form a noble metal, its oxide, and a noble metal and a transition metal in the pores in the support. It is obtained by oxidizing catalyst particles of at least one kind of alloy.

於該方法,首先形成支撐體。 In this method, the support is first formed.

具有中孔洞的支撐體,例如,可形成使作為中孔洞的鑄模發揮作用的物質含有於內部的支撐體之前驅體,其後分解除去作為鑄模發揮作用的物質形成中孔洞而得到。 The support having mesopores, for example, can be obtained by forming a support precursor in which a substance that functions as a mold for the mesopore is contained in the inside, and then decomposing and removing the substance that functions as a mold to form a mesopore.

說明該方法之一例。首先,調製包含成為鑄模之界面活性劑與烷氧基矽烷或者金屬烷氧化物(alkoxide)之加水分解物的溶液(以下稱為前驅體溶液)。具體而言,例如,對溶解界面活性劑的溶液加入烷氧基矽烷或金屬烷氧化物(alkoxide),進行pH調整使烷氧基矽烷或金屬烷氧化物加水分解。藉此產生具有矽烷醇基或者金屬氫氧化物之加水分解物。界面活性劑在溶液中形成微胞(micelles)而成為中孔洞之鑄模。藉著加熱此前驅體溶液使溶媒揮散,同時使矽烷醇基或金屬氫氧化物縮合硬化,形成支撐體之前驅體。其後,進而藉著在300℃以上的高溫下燒成(firing),藉由前驅體中的鑄模之界面活性劑分解揮發而除去,得到具有中孔洞的支撐體。 An example of this method is described. First, a solution (hereinafter referred to as a precursor solution) containing a water-decomposed product of a surfactant used as a mold and an alkoxide or metal alkoxide (alkoxide) is prepared. Specifically, for example, an alkoxide or alkoxide is added to a solution in which a surfactant is dissolved, and the pH is adjusted to hydrolyze the alkoxide or alkoxide. Thereby, a hydrolyzable product having a silanol group or a metal hydroxide is produced. Surfactants form micelles in the solution and become mesoporous molds. By heating the precursor solution to volatilize the solvent, the silanol group or the metal hydroxide is condensed and hardened at the same time to form the support precursor. Thereafter, by firing at a high temperature of 300° C. or higher, the surfactant of the mold in the precursor is decomposed and volatilized to be removed, and a support with mesopores is obtained.

又,膜狀的支撐體,例如可以把前驅體溶液塗布於基材後加熱使溶媒揮散,進行縮合硬化等而得。此外,將前驅體溶液以噴霧乾燥器等形成粒子狀,其後進行溶媒揮散、縮合硬化的話,可得粉體之支撐體。此外,粉體之支 撐體亦可在前述步驟得到固體之支撐體後粉碎而得。 In addition, the film-like support can be obtained, for example, by applying a precursor solution to the base material and heating to volatilize the solvent to perform condensation hardening or the like. In addition, if the precursor solution is formed into particles with a spray dryer or the like, and then the solvent is volatilized and condensation hardened, a powder support can be obtained. In addition, the support of powder The support body can also be obtained by crushing after obtaining a solid support body in the foregoing steps.

前驅體溶液,例如可以包含(1)烷氧基矽烷或金屬烷氧化物(alkoxide)之加水分解物、(2)溶媒(溶劑)、(3)界面活性劑之3種成分而構成。針對烷氧基矽烷或金屬烷氧化物(alkoxide)在溶液中進行加水分解處理,得到加水分解物的場合,水是必要的,所以溶媒以水,或水與乙醇或甲醇等醇類之混合溶媒為較佳。此外,亦可使烷氧基矽烷或金屬烷氧化物(alkoxide)之加水分解處理之用的觸媒進而包含於溶液中,作為該觸媒以使用硝酸、鹽酸等酸為較佳。 The precursor solution may include, for example, (1) hydrolyzed product of alkoxysilane or metal alkoxide, (2) solvent (solvent), and (3) surfactant. For alkoxysilanes or metal alkoxides (alkoxides) in the solution to undergo hydrolysis treatment to obtain hydrolysis products, water is necessary, so the solvent is water, or a mixed solvent of water and alcohols such as ethanol or methanol. For better. In addition, a catalyst used for the hydrolysis treatment of alkoxysilanes or metal alkoxides (alkoxide) may be further included in the solution, and it is preferable to use acids such as nitric acid and hydrochloric acid as the catalyst.

界面活性劑或烷氧基矽烷或金屬烷氧化物(alkoxide)之比例沒有特別限定,可適宜設定,不特別限定。藉著改變界面活性劑/烷氧基矽烷或金屬烷氧化物(alkoxide)之莫耳比,可以控制所得到的支撐體之細孔體機率、多孔度。 The ratio of the surfactant, alkoxysilane, or metal alkoxide (alkoxide) is not particularly limited, and can be set appropriately, and is not particularly limited. By changing the molar ratio of surfactant/alkoxysilane or alkoxide, the probability and porosity of the obtained support can be controlled.

又,形成膜狀支撐體的場合,特別以在往基材塗布之前在前驅體溶液中部產生沉澱物,由具有更為均勻的膜厚之膜形成的觀點來看是較佳的,藉著使用pH為酸性的醇可以避免前驅體的沉澱。作為其他方法,可以僅調節水與烷氧基矽烷或金屬烷氧化物(alkoxide)之莫耳比或者與pH調整一起調整莫耳比,或者添加醇,或進行莫耳比調整與添加醇雙方來避免沉澱。 In addition, when forming a film-like support, it is particularly preferable to form a film with a more uniform film thickness by generating precipitates in the middle of the precursor solution before coating the substrate. Alcohols with acidic pH can avoid precipitation of precursors. As other methods, you can adjust only the molar ratio of water and alkoxysilane or metal alkoxide, or adjust the molar ratio together with pH adjustment, or add alcohol, or perform both molar ratio adjustment and alcohol addition. Avoid precipitation.

作為界面活性劑例如可以使用非離子性界面活性劑或陽離子界面活性劑。 As the surfactant, for example, a nonionic surfactant or a cationic surfactant can be used.

非離子性界面活性劑例如可以使用多價醇脂肪酸酯、 聚氧化烯(polyoxyalkylene)脂肪酸酯、聚氧乙烯烷基醚,聚氧乙烯烷基苯基醚或聚環氧烷嵌段共聚物等。 Nonionic surfactants, for example, polyvalent alcohol fatty acid esters, Polyoxyalkylene (polyoxyalkylene) fatty acid ester, polyoxyethylene alkyl ether, polyoxyethylene alkyl phenyl ether or polyalkylene oxide block copolymer, etc.

其中,作為非離子性界面活性劑,使用聚氧乙烯醚或聚環氧烷嵌段共聚物的話,可得到更不容易發生觸媒活性降低的觸媒,所以較佳。此外,由相同的理由,使用陽離子界面活性劑亦佳。 Among them, when polyoxyethylene ether or polyalkylene oxide block copolymer is used as the nonionic surfactant, a catalyst that is less likely to decrease in catalyst activity can be obtained, so it is preferred. In addition, for the same reason, it is also better to use a cationic surfactant.

作為聚氧乙烯烷基醚,具體可以使用C12H25(OCH2CH2)nOH(n為2~100)、C16H33(OCH2CH2)nOH(n為2~100)、C18H37(OCH2CH2)nOH(n為2~100)等,亦可單獨使用亦可為混合物。也可以使用Brij(登錄商標)56、Brij76、Brij78等市售的聚氧乙烯醚。 As the polyoxyethylene alkyl ether, C 12 H 25 (OCH 2 CH 2 ) n OH (n is 2 to 100), C 16 H 33 (OCH 2 CH 2 ) n OH (n is 2 to 100) can be used specifically , C 18 H 37 (OCH 2 CH 2 ) n OH (n is 2~100), etc., can also be used alone or as a mixture. Commercially available polyoxyethylene ethers such as Brij (registered trademark) 56, Brij76, and Brij78 can also be used.

作為聚環氧烷嵌段共聚物,可以舉出氧化乙烯與氧化丙烯之聚環氧烷三嵌段共聚物等,更具體地說,可以例示Pluronic(登錄商標)L121、P123等Pluronic系界面活性劑。 Examples of polyalkylene oxide block copolymers include polyalkylene oxide triblock copolymers of ethylene oxide and propylene oxide. More specifically, Pluronic (registered trademark) L121, P123 and other Pluronic interfacial actives can be exemplified. Agent.

作為陽離子界面活性劑,可以例示雙十八烷基二甲基氯化銨、羥基氯苯胺、氯化十六烷吡啶、十六烷基三甲基溴化銨、雙十烷基二甲基氯化銨、地喹氯銨(dequalinium chloride)等。 Examples of cationic surfactants include dioctadecyldimethylammonium chloride, hydroxychloroaniline, cetylpyridinium chloride, cetyltrimethylammonium bromide, and didecyldimethylammonium chloride. Ammonium chloride, dequalinium chloride, etc.

界面活性劑的分子鏈長會影響中孔洞直徑,只要因應於目的之中孔洞的孔徑而選擇界面活性劑即可。此外,把1,3,5-三甲基苯、1,3,5-三乙基苯、1,3,5-三異丙基苯、n-庚烷等疏水性化合物添加於前驅體溶液亦可,該疏水性化合物增大前驅體溶液中的微胞(micelles)徑,所以使用於中孔洞孔徑的調整。 The molecular chain length of the surfactant will affect the diameter of the mesopores. As long as the surfactant is selected according to the pore diameter of the target. In addition, hydrophobic compounds such as 1,3,5-trimethylbenzene, 1,3,5-triethylbenzene, 1,3,5-triisopropylbenzene, n-heptane, etc. are added to the precursor solution Alternatively, the hydrophobic compound increases the diameter of micelles in the precursor solution, so it is used to adjust the pore diameter of the mesopores.

烷氧基矽烷例如可以舉出四甲氧基矽烷、四乙氧基矽烷、四丙氧基矽烷、四丁氧基矽烷、甲基三甲氧基矽烷、甲基三乙氧基矽烷、n-丙基三甲氧基矽烷、n-丙基三乙氧基矽烷、己基三甲氧基矽烷、己基三乙氧基矽烷、辛基三乙氧基矽烷、癸基三甲氧基矽烷等。 Examples of alkoxysilanes include tetramethoxysilane, tetraethoxysilane, tetrapropoxysilane, tetrabutoxysilane, methyltrimethoxysilane, methyltriethoxysilane, n-propane Trimethoxysilane, n-propyltriethoxysilane, hexyltrimethoxysilane, hexyltriethoxysilane, octyltriethoxysilane, decyltrimethoxysilane, etc.

金屬烷氧化物(alkoxide)例如可以舉出四丙氧基鋁、四丙氧基錫、四丙氧基鈦、四丙氧基鋯等。 Metal alkoxides (alkoxides) include, for example, aluminum tetrapropoxide, tin tetrapropoxide, titanium tetrapropoxide, zirconium tetrapropoxide, and the like.

如前所述,在基材上形成膜狀的支撐體的場合,於基材上塗布前驅體溶液形成膜狀的支撐體。於基材塗布前驅體溶液的方法,只要是可以把前驅體溶液均勻地薄薄塗布的方法即可,可以使用旋轉塗布法或把基材浸漬於前驅體溶液後吹飛不要的溶液之浸漬吹噴(dip & blow)法等,只要配合於塗布的基材的形狀等而選擇即可。 As described above, when a film-like support is formed on a substrate, a precursor solution is applied to the substrate to form a film-like support. The method of coating the precursor solution on the substrate is sufficient as long as it is a method that can uniformly apply the precursor solution thinly. Spin coating method or immersion blowing of the substrate after immersing the substrate in the precursor solution and blowing off the unnecessary solution may be used. The dip & blow method or the like may be selected in accordance with the shape of the substrate to be coated and the like.

此外,形成前驅體後除去鑄模分子時之加熱條件也沒有特別限定,例如在300~600℃加熱前驅體即可。 In addition, the heating conditions for removing the mold molecules after forming the precursor are also not particularly limited. For example, the precursor may be heated at 300 to 600°C.

其次,於支撐體的中孔洞使擔持氧化觸媒粒子,得到本實施型態之觸媒體。首先,使接觸於對應於被含有在支撐體與被擔持的氧化觸媒粒子之貴金屬、其氧化物或者貴金屬與過渡金屬的合金之至少一種的化合物的溶液或者膠體溶液(以下,亦將此簡稱為貴金屬化合物溶液),於支撐體的中孔洞導入貴金屬化合物溶液。貴金屬與過渡金屬的合金被包含在氧化觸媒粒子的場合,只要把溶解了對應於貴金屬的化合物以外,進而溶解了過渡金屬的鹽之溶液作為貴金屬化合物溶液使用即可。其後,藉由 進行燒成(firing)及/或還原處理,於中孔洞內形成氧化觸媒粒子,可以得到本實施型態之觸媒體。 Secondly, the oxidized catalyst particles are supported in the holes in the support body to obtain the catalyst medium of this embodiment. First, contact with a solution or colloidal solution of a compound corresponding to at least one of the noble metal, its oxide, or the alloy of noble metal and transition metal contained in the support and the supported oxidation catalyst particles (hereinafter, also this (Referred to as precious metal compound solution for short), the precious metal compound solution is introduced into the hole in the support. When an alloy of a noble metal and a transition metal is contained in the oxidation catalyst particles, it is only necessary to use a solution in which a compound corresponding to the noble metal is dissolved, and a salt of the transition metal is dissolved as a noble metal compound solution. Afterwards, by Carrying out firing and/or reduction treatments to form oxidation catalyst particles in the mesopores to obtain the contact medium of this embodiment.

具體而言,例如可以把支撐體浸漬於貴金屬化合物溶液後,進行燒成及/或還原處理。 Specifically, for example, the support may be immersed in a precious metal compound solution, and then sintered and/or reduced.

更具體地說,把貴金屬化合物溶液加熱至20~90℃,較佳為至50~70℃,攪拌同時使用鹼溶液調整至pH3~10,較佳為至pH5~8。接著,把支撐體浸漬於貴金屬化合物溶液,接著,進行減壓脫氣處理使貴金屬化合物溶液浸透於細孔。其後藉著在200~600℃進行加熱燒成,可以得到在細孔內包含貴金屬等之氧化觸媒粒子。 More specifically, the precious metal compound solution is heated to 20 to 90°C, preferably to 50 to 70°C, and adjusted to pH 3 to 10, preferably to pH 5 to 8, with an alkali solution while stirring. Next, the support is immersed in the noble metal compound solution, and then a reduced-pressure degassing treatment is performed to impregnate the noble metal compound solution into the pores. Thereafter, by heating and firing at 200 to 600°C, oxidation catalyst particles containing precious metals and the like in the pores can be obtained.

此外,如前所述把貴金屬化合物溶液浸透至細孔後,實施進行200~600℃之燒成處理與暴露於100~300℃之氫氣流的處理之氫氣還原法、或浸漬於硼氫化鈉溶液之液相還原法等公知的還原操作,亦可於細孔內形成氧化觸媒粒子。又,隨著使含有於貴金屬化合物溶液之化合物種類的不同,亦可不實施前述公知的還原操作而僅藉著200~600℃之加熱燒成處理,於細孔內得到氧化觸媒粒子。此外,包含於貴金屬化合物溶液的化合物的還原只有一部分,在中孔洞內之氧化觸媒粒子為貴金屬單體與貴金屬氧化物共存亦可。 In addition, after impregnating the noble metal compound solution into the pores as described above, the hydrogen reduction method of sintering at 200 to 600°C and exposure to hydrogen flow at 100 to 300°C, or immersion in sodium borohydride solution Known reduction operations such as the liquid phase reduction method can also form oxidation catalyst particles in the pores. In addition, depending on the type of compound contained in the noble metal compound solution, it is possible to obtain oxidation catalyst particles in the pores only by heating and sintering at 200 to 600° C. without performing the aforementioned known reduction operation. In addition, the reduction of the compound contained in the noble metal compound solution is only part, and the oxidation catalyst particles in the mesopores may be noble metal monomers and noble metal oxides coexisting.

對應於構成氧化觸媒粒子的貴金屬、其氧化物、或貴金屬與過渡金屬的合金,作為包含貴金屬元素的化合物,例如金化合物可舉出HAuCl4.4H2O、NH4AuCl4、KAuCl4.nH2O、KAu(CN)4、Na2AuCl4、KAuBr4.2H2O、 NaAuBr4等,鉑化合物可舉出氯化鉑酸、二亞硝基二氨鉑、二氯四氨合鉑等,鈀化合物可以舉出二亞硝基二氨鈀、氯化鈀酸氨等。 Corresponding to the noble metal, its oxide, or the alloy of noble metal and transition metal constituting the oxidation catalyst particles, as a compound containing noble metal elements, for example, a gold compound may be HAuCl 4 . 4H 2 O, NH 4 AuCl 4 , KAuCl 4 . nH 2 O, KAu(CN) 4 , Na 2 AuCl 4 , KAuBr 4 . 2H 2 O, NaAuBr 4, etc., platinum compounds include chloroplatinic acid, dinitrosodiamine platinum, dichlorotetraammine platinum, etc., and palladium compounds include dinitrosodiamine palladium and palladium chloride Acid ammonia and so on.

貴金屬化合物溶液之貴金屬化合物的濃度沒有特別限定,但調製為1×10-2~1×10-5mol/L之溶液,產生的氧化觸媒粒子不容易凝集所以較佳。 The concentration of the noble metal compound in the noble metal compound solution is not particularly limited, but it is better to prepare a solution of 1×10 -2 to 1×10 -5 mol/L because the generated oxidation catalyst particles are not easy to agglomerate.

作為貴金屬化合物溶液所含的過渡金屬之鹽,只要是可溶解於溶液,與對應於前述貴金屬或貴金屬氧化物之金屬化合物共存也不會產生沉澱的化合物即可,沒有特別限定,可以例示使用的過渡金屬之氯化物、溴化物等鹵化鹽、硝酸鹽、碳酸鹽、重碳酸鹽、羧酸鹽等。過渡金屬鹽的濃度沒有特別限定,但調製為1×10-2~1×10-5mol/L之溶液,產生的氧化觸媒粒子不容易凝集所以較佳。 The transition metal salt contained in the noble metal compound solution is not particularly limited as long as it is a compound that is soluble in the solution and does not cause precipitation when it coexists with the metal compound corresponding to the noble metal or noble metal oxide. It is not particularly limited and can be used as examples. Halides, nitrates, carbonates, bicarbonates, carboxylates, etc. of transition metals such as chlorides and bromides. The concentration of the transition metal salt is not particularly limited, but it is preferably prepared as a solution of 1×10 -2 to 1×10 -5 mol/L, since the generated oxidation catalyst particles are not easy to agglomerate.

以上,本實施型態之觸媒體,藉由具備在具有通氣性,具有連通構造的支撐體之中孔洞擔持著包含貴金屬、貴金屬氧化物及貴金屬與過渡金屬的合金之中的一種以上之氧化觸媒粒子之構成,與從前技術相比較可以使活性更長期地維持著。 As mentioned above, the touch medium of this embodiment is provided with holes in the support having air permeability and connected structure to support the oxidation of one or more of precious metals, precious metal oxides, and alloys of precious metals and transition metals. Compared with the previous technology, the composition of the catalyst particles can maintain the activity for a longer period of time.

此外,本實施型態之觸媒體在比室溫(23.4℃)更低的溫度下也可以分解除去乙烯等。進而,隨著觸媒體的大小而有所差異,但即使0.5ppm程度的濃度也可以分解除去。 In addition, the contact medium of this embodiment can also decompose and remove ethylene and the like at a temperature lower than room temperature (23.4°C). Furthermore, it varies with the size of the contact medium, but it can be decomposed and removed even at a concentration of about 0.5 ppm.

本實施型態之中孔洞觸媒體,可以用於構成可以除去有機氣體成分等的構件或裝置。 The hole contact medium in this embodiment can be used to construct a member or device that can remove organic gas components and the like.

作為該構件或裝置,可以舉出空氣清淨機、空調、冰 箱等的過濾器類,或倉庫或展示櫃內設置的空氣淨化濾清器、青果或花卉類之包裝構件、或者內燃機等之排放氣體淨化裝置或燃料電池之水蒸氣改質器等。進而,針對青果或花卉類,於使堪用於生食、食品加工、或者觀賞等各種用途的狀態更能夠持續而使用之物品(鮮度保持劑),亦可具備本實施型態之中孔洞觸媒體。 Examples of such components or devices include air purifiers, air conditioners, ice Filters such as boxes, or air purification filters, packaging components such as green fruits or flowers installed in warehouses or display cabinets, or exhaust gas purification devices such as internal combustion engines, or water vapor reformers for fuel cells, etc. Furthermore, for green fruits or flowers, articles that can be used for various purposes such as raw food, food processing, or viewing (freshness preserving agent) can also be provided with the hole contact medium in this embodiment. .

其次,說明應用本實施型態的觸媒體之氣體處理裝置。又,於以下,作為本實施型態之觸媒體之一例,舉例說明使用膜狀的觸媒體(觸媒體膜)的場合。 Next, the gas processing device using the touch medium of this embodiment will be explained. In addition, in the following, as an example of the touch medium of this embodiment, a case where a film-like touch medium (touch medium film) is used is exemplified.

圖1係模式顯示第1實施型態之氣體處理裝置200的剖面之一部分之圖。本實施型態之氣體處理裝置200,是把成為對氣體處理裝置200往箭頭A方向供給的被處理氣體中的處理對象之成分,藉由在氣體處理裝置200產生的電漿與觸媒體膜100的機能,予以氧化而進行分解之裝置。 FIG. 1 is a diagram schematically showing a part of a cross-section of a gas processing device 200 of the first embodiment. The gas processing device 200 of this embodiment uses the components to be processed in the gas to be processed that is supplied to the gas processing device 200 in the direction of arrow A. The plasma and the contact medium film 100 generated in the gas processing device 200 The function of oxidizing and decomposing device.

氣體處理裝置200,具有具備施加電極11與接地電極12與介電質13之電漿產生部,於施加電極11,被連接著電源部之(高壓)電源14。接地電極12與施加電極11,相互對向配置,在接地電極12與施加電極11之間配置著介電質13。介電質13,僅密接於接地電極12,與施加電極11隔離。於氣體處理裝置200,這些施加電極11與接地電極12與介電質13,是供產生電漿之構件/裝置(電漿產生部),藉由電源14對施加電極11與接地電極12之間施加電壓,藉由施加電極11與接地電極12與介電質13,在施加電極11與介電質13之間形成放電所導致的低溫電漿反應層 (電漿存在的區域)。又,施加電極11與接地電極12之某一方為第1電極,另一方為第2電極。此外,於其他實施型態,即使施加電極11與接地電極12分別有複數組合的場合,也是某一方的種類的複數電極分別為第1電極,另一方種類的複數電極分別為第2電極。此外,介電質13,僅設於接地電極12與觸媒體膜100之間但不限於此,例如除了接地電極12與觸媒體膜100之間以外,設於施加電極11與觸媒體膜100之間亦可。 The gas processing device 200 has a plasma generating unit including an application electrode 11, a ground electrode 12, and a dielectric substance 13. The application electrode 11 is connected to a (high-voltage) power source 14 of the power supply unit. The ground electrode 12 and the application electrode 11 are arranged to face each other, and a dielectric 13 is arranged between the ground electrode 12 and the application electrode 11. The dielectric 13 is only in close contact with the ground electrode 12 and is isolated from the application electrode 11. In the gas processing device 200, the application electrode 11, the ground electrode 12 and the dielectric substance 13 are components/devices (plasma generation part) for generating plasma. The power supply 14 is used to connect the application electrode 11 and the ground electrode 12 Applying a voltage, by applying the electrode 11, the ground electrode 12 and the dielectric 13, a low-temperature plasma reaction layer caused by the discharge is formed between the applying electrode 11 and the dielectric 13 (Area where plasma exists). In addition, one of the application electrode 11 and the ground electrode 12 is the first electrode, and the other is the second electrode. In addition, in other embodiments, even when the application electrode 11 and the ground electrode 12 are respectively combined in plural, the plural electrodes of one type are the first electrodes, and the plural electrodes of the other type are the second electrodes. In addition, the dielectric 13 is only provided between the ground electrode 12 and the touch media film 100 but is not limited to this. For example, in addition to the ground electrode 12 and the touch media film 100, it is provided between the application electrode 11 and the touch media film 100. Between time is also possible.

施加電極11是藉由電源14施加電壓的電極。接地電極12,藉由接地線12a接地。接著,施加電極11、接地電極12及介電質13,是具有被處理氣體可以通過之通氣性的構造。具體而言,作為施加電極11與接地電極12與介電質13的構造,可以舉出格子狀或簾狀、根據衝壓加工等之多孔狀或延展網目狀、蜂巢(honeycomb)狀的構造(以下簡稱蜂巢),亦可組合2種以上的這些構造。針對施加電極11、接地電極12亦可為針狀的構造。此外,施加電極11與接地電極12與介電質13,於前述之形狀/構造之中,亦可為相同的形狀/構造。在圖1,施加電極11如網目那樣存在著多數小的開口,接地電極12與介電質13如沖壓導致的多孔狀那樣存在著少數而較大的開口。 The application electrode 11 is an electrode to which a voltage is applied by the power supply 14. The ground electrode 12 is grounded by a ground wire 12a. Next, the application electrode 11, the ground electrode 12, and the dielectric substance 13 have a structure in which the gas to be processed can pass through. Specifically, as the structure of the application electrode 11, the ground electrode 12, and the dielectric 13, a grid-like or curtain-like structure, a porous or expanded mesh-like structure, or a honeycomb-like structure (hereinafter It is abbreviated as honeycomb), and two or more of these structures can be combined. The application electrode 11 and the ground electrode 12 may have a needle-shaped structure. In addition, the application electrode 11, the ground electrode 12, and the dielectric 13 may have the same shape/structure among the aforementioned shapes/structures. In FIG. 1, the application electrode 11 has many small openings like a mesh, and the ground electrode 12 and the dielectric 13 have a few large openings like a porous shape caused by punching.

由箭頭A方向往電漿產生部供給的被處理氣體,透過被形成於施加電極11的開口,到達被形成於施加電極11與介電質13之間的低溫電漿反應層。到達低溫電漿反應層的被處理氣體,直接排出至電漿產生部的外部,或 者透過被形成於介電質13的開口與被形成於接地電極12的開口,排出至電漿產生部的外部。總之,於電漿產生部,被形成藉由被形成於施加電極11與接地電極12與介電質13的開口,以及被形成於施加電極11與介電質13之間的低溫電漿反應層構成的流道。 The gas to be processed supplied from the direction of arrow A to the plasma generating part passes through the opening formed in the application electrode 11 to reach the low-temperature plasma reaction layer formed between the application electrode 11 and the dielectric 13. The gas to be processed that reaches the low-temperature plasma reaction layer is directly discharged to the outside of the plasma generation part, or It passes through the opening formed in the dielectric 13 and the opening formed in the ground electrode 12 and is discharged to the outside of the plasma generating part. In short, the plasma generating part is formed by openings formed in the application electrode 11 and the ground electrode 12 and the dielectric 13 and a low-temperature plasma reaction layer formed between the application electrode 11 and the dielectric 13 Composition of the runner.

被形成於電漿產生部的流道之中,在低溫電漿反應層(施加電極11與介電質13之間),被配置著與觸媒體13與施加電極11密接的觸媒體膜100。因此,流過流道而到達低溫電漿反應層的被處理氣體,可以透過中孔洞通過觸媒體膜100。亦即,被處理氣體中的成為處理對象的成分,藉由電漿作用的觸媒體膜100的機能而被氧化分解。 In the flow channel formed in the plasma generating part, in the low-temperature plasma reaction layer (between the application electrode 11 and the dielectric 13 ), a contact medium film 100 in close contact with the contact medium 13 and the application electrode 11 is arranged. Therefore, the gas to be processed flowing through the flow channel and reaching the low-temperature plasma reaction layer can pass through the contact medium film 100 through the middle hole. That is, the components to be processed in the gas to be processed are oxidized and decomposed by the function of the contact medium film 100 by the action of plasma.

用於氣體處理裝置200的施加電極11及接地電極12,可以使用作為電極發揮機能的材料。作為施加電極11,接地電極12的材料,例如可以使用Cu、Ag、Au、Ni、Cr、Fe、Al、Ti、W、Ta、Mo、Co等金屬或其合金。 The application electrode 11 and the ground electrode 12 used in the gas processing device 200 can use materials that function as electrodes. As the material of the application electrode 11 and the ground electrode 12, for example, metals such as Cu, Ag, Au, Ni, Cr, Fe, Al, Ti, W, Ta, Mo, Co, or alloys thereof can be used.

介電質13只要具有絕緣體的性質即可。作為介電質13的材料,例如可以舉出ZrO2、γ-Al2O3、α-Al2O3、θ-Al2O3、η-Al2O3、非晶質Al2O3、氮化鋁、莫來石(mullite)、滑石、矽酸鎂石(forsterite)、菫青石(cordierite)、鈦酸鎂、鈦酸鋇、SiC、Si3N4、Si-SiC、雲母、玻璃等無機材料,或聚醯亞胺、液晶高分子、PTFE(polytetrafluoro ethylene)、 ETFE(ethylenetetrafluoroethylene)、PVF(polyvinylfluoride)、PVDF(polyvinylidene difluoride)、聚醚醯亞胺、聚醯胺醯亞胺等高分子材料。考慮到耐電漿性、耐熱性的話,以無機材料較佳。 The dielectric 13 only needs to have the properties of an insulator. Examples of the material of the dielectric substance 13 include ZrO 2 , γ-Al 2 O 3 , α-Al 2 O 3 , θ-Al 2 O 3 , η-Al 2 O 3 , and amorphous Al 2 O 3 , Aluminum nitride, mullite, talc, forsterite, cordierite, magnesium titanate, barium titanate, SiC, Si 3 N 4 , Si-SiC, mica, glass And other inorganic materials, or polyimide, liquid crystal polymer, PTFE (polytetrafluoroethylene), ETFE (ethylenetetrafluoroethylene), PVF (polyvinylfluoride), PVDF (polyvinylidene difluoride), polyether imide, poly imide, etc. Molecular materials. In consideration of plasma resistance and heat resistance, inorganic materials are preferred.

又,如前所述觸媒體膜100也具備作為介電質的機能的場合(例如,觸媒體的一部分為絕緣體的場合),也可以把觸媒體膜100作為介電質利用,所以不具備介電質13亦可。此外,於本實施型態之氣體處理裝置200,流通於流道的被處理氣體之量或流速等使用條件沒有特別限定。例如,把送風機連接至氣體處理裝置200,使特定量之被處理氣體以特定的流速送至流道亦可,把氣體處理裝置200放置於被處理氣體中,僅自然地使被處理氣體流入流道亦可。 In addition, when the contact medium film 100 also has a function as a dielectric as described above (for example, when a part of the contact medium is an insulator), the contact medium film 100 can also be used as a dielectric, so it does not have a dielectric. Electricity quality 13 is also possible. In addition, in the gas processing device 200 of this embodiment, the usage conditions such as the amount or flow rate of the gas to be processed flowing through the flow channel are not particularly limited. For example, a blower is connected to the gas processing device 200 so that a specific amount of the gas to be processed can be sent to the flow channel at a specific flow rate. The gas processing device 200 can be placed in the gas to be processed and only the gas to be processed can flow into the flow naturally. The way is also possible.

電源14為可以施加高電壓的電源。作為電源14,可以使用交流高電壓、脈衝高電壓等高電壓電源、對DC偏壓疊加交流或脈衝之電源等。作為交流高電壓之例,可以舉出正弦波交流、矩形波交流、三角波交流、鋸波交流等。藉由此電源14,以在施加電極11與接電電極12與介電質13所形成的放電空間產生電漿的方式,對施加電極11與接地電極12之間施加特定的電壓即可。根據電源14之施加電壓,會隨著被處理氣體所含有的成為處理對象的成分的濃度等而變動,通常可以為1~20kV,較佳為2~10kV。又,作為供產生電漿之用藉由從電源14供給的電力所產生的放電的種類,只要是可以產生電漿即可,沒有特 別限定,例如可以是無聲放電或沿面放電或電暈放電或脈衝放電等。此外,組合2種類以上產生這些放電而產生電漿亦可。 The power source 14 is a power source that can apply a high voltage. As the power source 14, a high-voltage power source such as an alternating high voltage, a pulsed high voltage, a power source in which an alternating current or a pulse is superimposed on a DC bias, and the like can be used. As an example of AC high voltage, sine wave AC, rectangular wave AC, triangle wave AC, saw wave AC, etc. can be cited. With this power supply 14, a specific voltage can be applied between the application electrode 11 and the ground electrode 12 in such a manner that plasma is generated in the discharge space formed by the application electrode 11, the connection electrode 12 and the dielectric 13. Depending on the applied voltage of the power supply 14, it will vary with the concentration of the component to be processed in the gas to be processed, etc., and it can usually be 1-20 kV, preferably 2-10 kV. In addition, as the type of discharge generated by the power supplied from the power supply 14 for generating plasma, there is no special feature as long as it can generate plasma. It is not limited, and it may be, for example, silent discharge, creeping discharge, corona discharge, or pulse discharge. In addition, two or more types of these discharges may be combined to generate plasma.

此外,電源14的輸出頻率以高頻為佳,具體而言可以為0.5kHz以上。進而0.5kHz以上30kHz以下為佳,更佳為1kHz以上20kHz以下亦可。頻率比0.5kHz更小的話,會有中間產物或臭氧產生量增加的情形,比30kHz更大的話,作為處理對象之任一成分之根據氧化的分解會被抑制。 In addition, the output frequency of the power supply 14 is preferably a high frequency, and specifically may be 0.5 kHz or more. Furthermore, it is preferably 0.5 kHz or more and 30 kHz or less, and more preferably 1 kHz or more and 20 kHz or less. If the frequency is lower than 0.5kHz, the amount of intermediate products or ozone generation may increase. If the frequency is greater than 30kHz, the decomposition of any component of the treatment object due to oxidation will be suppressed.

又,在本實施型態,使介電質13密接於接地電極12而構成,但是不限於此。只要可以產生電漿即可,介電質13至少與施加電極11與接地電極12之某一個密接著即可。此外,採用分別使介電質13與施加電極11與接地電極12密接配置,於該2個介電質13之間具備觸媒體膜100的構成亦可。進而,使觸媒體膜100形成於前述基材上的場合,可以把介電質13作為基材利用。 In addition, in this embodiment, the dielectric 13 is formed in close contact with the ground electrode 12, but it is not limited to this. As long as plasma can be generated, the dielectric 13 is in close contact with at least one of the application electrode 11 and the ground electrode 12. In addition, a configuration in which the dielectric substance 13 and the application electrode 11 and the ground electrode 12 are arranged in close contact with each other, and the contact medium film 100 is provided between the two dielectric substances 13 may be adopted. Furthermore, when the touch media film 100 is formed on the aforementioned substrate, the dielectric 13 can be used as the substrate.

其次,說明第2實施型態的氣體處理裝置300。於本實施型態,針對與第1實施型態說明的構件具有相同機能的構件,使用同一符號而省略詳細的說明。以下,主要說明與第1實施型態不同之處。 Next, the gas processing device 300 of the second embodiment will be described. In this embodiment, for members having the same functions as those described in the first embodiment, the same symbols are used, and detailed descriptions are omitted. In the following, the differences from the first embodiment are mainly explained.

圖2係模式顯示第2實施型態之氣體處理裝置300的剖面之一部分之圖。本實施型態之氣體處理裝置300,藉由無聲放電產生電漿。本實施型態之氣體處理裝置300,是在施加電極11與接地電極12之間,被配置對向 的2個介電質13的層積構造,分別的介電質13,密接於施加電極11與接地電極12。 FIG. 2 is a diagram schematically showing a part of the cross-section of the gas processing device 300 of the second embodiment. The gas processing device 300 of this embodiment generates plasma by silent discharge. The gas processing device 300 of this embodiment is disposed between the application electrode 11 and the ground electrode 12 to face each other In the laminated structure of the two dielectrics 13, the respective dielectrics 13 are in close contact with the application electrode 11 and the ground electrode 12.

氣體處理裝置300,藉由使用高電壓電源14對施加電極11與接地電極12之間施加電壓,於2個介電質13之間形成根據放電產生的低溫電漿反應層。又,在圖2,係對施加電極11與接地電極12雙方分別使介電質13密接而層積,但介電質13緊密接於其中之一亦可。 The gas processing device 300 uses a high-voltage power supply 14 to apply a voltage between the application electrode 11 and the ground electrode 12 to form a low-temperature plasma reaction layer generated by electric discharge between the two dielectric substances 13. In addition, in FIG. 2, the dielectric substance 13 is laminated in close contact with both the application electrode 11 and the ground electrode 12, but the dielectric substance 13 may be in close contact with one of them.

於本實施型態之氣體處理裝置300,施加電極11,接地電極12及介電質13,是被處理氣體不可以通過之不具通氣性的構造。因此,由圖2的箭頭a方向對電漿產生部供給的被處理氣體,通過被形成於2個介電質13之間的低溫電漿反應層,排出至電漿產生部的外部(箭頭b方向)。總之,於電漿產生部,被形成藉由被形成於2個介電質13之間的低溫電漿反應層(電漿存在的區域)構成的流道。於被形成於低溫電漿反應層的流道,密接於不同的介電質13的對向的2個觸媒體膜100隔著特定的間隔被配置著。因此,流過低溫電漿反應層的被處理氣體,可以透過中孔洞通過觸媒體膜100。亦即,被處理氣體中的成為處理對象的成分,與第一實施型態同樣,藉由電漿作用的觸媒體膜100的機能而被氧化分解。又,觸媒體膜100,可密接於介電質13,亦可不密接。隨著處理的被處理氣體的量而不同,在流道之壓力損失變高的場合,觸媒體膜100以不密接於介電質13為佳。又,本實施型態亦可把觸媒體膜100作為介電質13來利用,此外,亦可把介電質13作為被 形成觸媒體膜100的基材來利用。 In the gas processing device 300 of this embodiment, the application electrode 11, the ground electrode 12, and the dielectric 13 have a non-permeable structure through which the processed gas cannot pass. Therefore, the gas to be processed supplied to the plasma generating part in the direction of arrow a in FIG. 2 passes through the low-temperature plasma reaction layer formed between the two dielectric substances 13 and is discharged to the outside of the plasma generating part (arrow b direction). In short, in the plasma generating part, a flow channel formed by a low-temperature plasma reaction layer (a region where plasma exists) formed between two dielectric substances 13 is formed. In the flow channel formed in the low-temperature plasma reaction layer, two opposing contact media 100 in close contact with different dielectrics 13 are arranged at a specific interval. Therefore, the gas to be processed flowing through the low-temperature plasma reaction layer can pass through the contact medium film 100 through the middle hole. That is, the components to be processed in the gas to be processed are oxidized and decomposed by the function of the contact medium film 100 by the action of the plasma similarly to the first embodiment. In addition, the contact medium film 100 may be in close contact with the dielectric 13 or not. Depending on the amount of the processed gas to be processed, when the pressure loss of the flow channel becomes high, it is preferable that the contact medium film 100 is not in close contact with the dielectric 13. In addition, in this embodiment, the touch media film 100 can also be used as the dielectric 13, and the dielectric 13 can also be used as the blanket. The base material of the touch media film 100 is formed and used.

氣體處理裝置300,藉著採多層構造,變得容易確保流道。因此,容易增加處理的氣體量,可以效率佳地分解大量的成為處理對象之成分。氣體處理裝置300,因應於處理對象的成分的量,或流速等使用條件,以可效率佳地氧化分解該成分的方式設置。觸媒體膜100可以為單層亦可分為複數層,可以任意設定。 The gas processing device 300 adopts a multilayer structure, making it easy to secure a flow path. Therefore, it is easy to increase the amount of gas to be processed, and it is possible to efficiently decompose a large amount of components to be processed. The gas processing device 300 is installed in such a way that the components can be oxidized and decomposed efficiently in accordance with usage conditions such as the amount of the component to be processed or the flow rate. The touch media film 100 can be a single layer or can be divided into multiple layers, and can be set arbitrarily.

其次,說明第3實施型態的氣體處理裝置400。於本實施型態,針對與第1實施型態說明的構件具有相同機能的構件,使用同一符號而省略詳細的說明。以下,主要說明與第1實施型態不同之處。 Next, the gas processing device 400 of the third embodiment will be described. In this embodiment, for members having the same functions as those described in the first embodiment, the same symbols are used, and detailed descriptions are omitted. Hereinafter, the difference from the first embodiment will be mainly explained.

圖3係模式顯示第3實施型態之氣體處理裝置400的剖面之一部分之圖。於本實施型態之氣體處理裝置400,設有對向的2個接地電極12、被配置於2個接地電極12之間的2個介電質13、被配置於2個介電質13之間的施加電極11。接地電極12與介電質13,相互密接,介電質13與施加電極11,隔著特定間隔配置。氣體處理裝置400,藉由使用高電壓電源14對施加電極11與接地電極12之間施加電壓,可以在2個介電質13與施加電極11之間產生電漿,可形成挾著施加電極11的2個電漿反應層。 FIG. 3 is a diagram schematically showing a part of the cross-section of the gas processing device 400 of the third embodiment. In the gas processing device 400 of this embodiment, there are two ground electrodes 12 opposed to each other, two dielectric substances 13 arranged between the two ground electrodes 12, and two dielectric substances 13 arranged between them. Between the application electrode 11. The ground electrode 12 and the dielectric substance 13 are in close contact with each other, and the dielectric substance 13 and the application electrode 11 are arranged at a predetermined interval. The gas processing device 400 uses a high-voltage power supply 14 to apply a voltage between the application electrode 11 and the ground electrode 12, so that plasma can be generated between the two dielectric substances 13 and the application electrode 11, and the application electrode 11 can be formed. The 2 plasma reaction layers.

於本實施型態之氣體處理裝置400,接地電極12及介電質13,是被處理氣體不能通過之不具通氣性的構造。另一方面,施加電極11,具有複數開口,為被處理氣體可通過之具有通氣性的構造。因此,由圖2的箭頭a方 向對電漿產生部供給的被處理氣體,通過被形成於施加電極11的開口往2個電漿反應層移動,同時通過低溫電漿反應層,被排出至電漿產生部的外部。總之,於電漿產生部,被形成藉由被形成於施加電極11的開口,及2個電漿反應層構成的流道。 In the gas processing device 400 of this embodiment, the ground electrode 12 and the dielectric 13 have a non-permeable structure through which the processed gas cannot pass. On the other hand, the application electrode 11 has a plurality of openings and has a gas-permeable structure through which the gas to be processed can pass. Therefore, by the arrow a in Figure 2 The gas to be processed supplied to the plasma generation part moves to the two plasma reaction layers through the openings formed in the application electrode 11, and at the same time passes through the low-temperature plasma reaction layer, and is discharged to the outside of the plasma generation part. In short, in the plasma generating part, a flow channel formed by the opening formed in the application electrode 11 and two plasma reaction layers is formed.

被形成於電漿產生部的流道之中,在2個低溫電漿反應層(2個介電質13與施加電極11之間),分別被配置著與施加電極11密接的觸媒體膜100。因此,流過流道的被處理氣體,可以透過中孔洞通過觸媒體膜100。亦即,被處理器體中的成為處理對象的成分,藉由電漿作用的觸媒體膜100的機能而被氧化分解。 In the flow channel formed in the plasma generating part, two low-temperature plasma reaction layers (between the two dielectric substances 13 and the application electrode 11) are respectively arranged with a contact medium film 100 in close contact with the application electrode 11 . Therefore, the gas to be processed flowing through the flow channel can pass through the contact medium film 100 through the middle hole. That is, the components to be processed in the processed body are oxidized and decomposed by the function of the contact media film 100 by the action of plasma.

氣體處理裝置400,與第2實施型態之氣體處理裝置300同樣,藉著採多層構造,變得容易確保流道。因此,容易增加處理的氣體量,可以效率佳地分解大量的成為處理對象之成分。氣體處理裝置400,因應於處理對象的成分的量,或流速等使用條件,以可效率佳地氧化分解該成分的方式設置。觸媒體膜100可以為單層亦可分為複數層,可以任意設定。 The gas processing device 400, like the gas processing device 300 of the second embodiment, has a multi-layer structure, which makes it easy to secure a flow path. Therefore, it is easy to increase the amount of gas to be processed, and it is possible to efficiently decompose a large amount of components to be processed. The gas processing device 400 is installed in such a way that the components can be oxidized and decomposed efficiently in accordance with usage conditions such as the amount of the component to be processed or the flow rate. The touch media film 100 can be a single layer or can be divided into multiple layers, and can be set arbitrarily.

其次,說明第4實施型態的氣體處理裝置500。於本實施型態,針對與第1實施型態說明的構件具有相同機能的構件,使用同一符號而省略詳細的說明。以下,主要說明與第1實施型態不同之處。 Next, the gas processing device 500 of the fourth embodiment will be described. In this embodiment, for members having the same functions as those described in the first embodiment, the same symbols are used, and detailed descriptions are omitted. In the following, the differences from the first embodiment are mainly explained.

圖4係模式顯示第4實施型態之氣體處理裝置500的剖面之一部分之圖。本實施型態之氣體處理裝置 500,藉由無聲放電產生電漿,分解處理對象之成分。在本實施型態之氣體處理裝置500,筒形的施加電極11與觸媒體膜100與介電質13,是以圓柱狀的接地電極12為中心軸,年輪狀地往徑向外側層積而構成的圓筒狀的構造。 FIG. 4 is a diagram schematically showing a part of a cross-section of a gas processing device 500 of the fourth embodiment. Gas processing device of this embodiment 500. The plasma is generated by silent discharge to decompose the components of the processing object. In the gas processing device 500 of this embodiment, the cylindrical applying electrode 11, the contact medium film 100, and the dielectric 13 are stacked radially outward in the shape of an annual ring with the cylindrical ground electrode 12 as the central axis And constitute a cylindrical structure.

於氣體處理裝置500,介電質13設有2個。一方之介電質13,被配置於接地電極12的徑向外側,同時密接於接地電極12。另一方之介電質13,被配置於施加電極11的徑向內側,同時密接於施加電極11。氣體處理裝置500,可以藉由使用高電壓電源14對施加電極11與接地電極12之間施加電壓,於2個介電質13之間形成根據放電產生的低溫電漿反應層。又,在圖4,係分別對施加電極11與接地電極12使介電質13分別密接而層積,但介電質13緊密接於其中之一亦可。 In the gas processing device 500, two dielectric substances 13 are provided. The dielectric 13 on one side is arranged on the radially outer side of the ground electrode 12 and is in close contact with the ground electrode 12 at the same time. The other dielectric substance 13 is arranged on the radially inner side of the applying electrode 11 and is in close contact with the applying electrode 11 at the same time. The gas processing device 500 can apply a voltage between the application electrode 11 and the ground electrode 12 by using the high-voltage power supply 14 to form a low-temperature plasma reaction layer generated by discharge between the two dielectric substances 13. In addition, in FIG. 4, the application electrode 11 and the ground electrode 12 are respectively laminated with the dielectric substance 13 in close contact with each other, but the dielectric substance 13 may be in close contact with one of them.

於本實施型態之氣體處理裝置500,施加電極11,接地電極12及介電質13,是被處理氣體不可以通過之不具通氣性的構造。因此,由圓形的兩端面之一方(圖3之箭頭a方向)對電漿產生部供給的被處理氣體,通過被形成於2個介電質13之間的低溫電漿反應層,由另一方端面側排出(圖3之箭頭b方向)。總之,於電漿產生部,被形成藉由被形成於2個介電質13之間的低溫電漿反應層構成的流道。於被形成於低溫電漿反應層的流道,被配置著與2個介電質13隔離的觸媒體膜100。因此,流過低溫電漿反應層的被處理氣體,可以透過中孔洞通過觸媒體膜100。亦即,被處理氣體中的成為處理對象的成分,與第1~第3 實施型態同樣,藉由電漿作用的觸媒體膜100的機能而被氧化分解。又,於圖4,在觸媒體膜100與2個介電質13之間被形成空間。此外,觸媒體膜100,可密接於一方之介電質13,亦可不密接。 In the gas processing device 500 of this embodiment, the application electrode 11, the ground electrode 12, and the dielectric 13 have an impermeable structure through which the processed gas cannot pass. Therefore, the gas to be processed supplied to the plasma generating part from one of the circular end faces (in the direction of arrow a in FIG. 3) passes through the low-temperature plasma reaction layer formed between the two dielectric substances 13, and Discharge from one end surface side (in the direction of arrow b in Figure 3). In short, in the plasma generating part, a flow channel formed by a low-temperature plasma reaction layer formed between two dielectric substances 13 is formed. In the flow channel formed in the low-temperature plasma reaction layer, a contact medium film 100 separated from the two dielectric substances 13 is arranged. Therefore, the gas to be processed flowing through the low-temperature plasma reaction layer can pass through the contact medium film 100 through the middle hole. That is, the components of the gas to be processed are the same as the first to third In the same implementation mode, the function of the contact medium film 100 acted by plasma is oxidized and decomposed. In addition, in FIG. 4, a space is formed between the touch media film 100 and the two dielectric substances 13. In addition, the touch media film 100 may be in close contact with the dielectric 13 on one side, or may not be in close contact.

如本實施型態之氣體處理裝置500,藉著採年輪狀的多層構造亦可,藉著採多層構造,變得容易確保流道。因此,容易增加處理的氣體量,可以效率佳地分解大量的成為處理對象之成分。氣體處理裝置500,因應於處理對象的成分的量,或流速等使用條件,以可效率佳地氧化分解處理對象氣體的方式,把觸媒體膜100的筒形年輪狀的枚數任意設定為複數枚或者一枚。 As in the gas processing device 500 of this embodiment, it is also possible to adopt a multi-layer structure in the shape of tree rings. By adopting a multi-layer structure, it is easy to secure a flow path. Therefore, it is easy to increase the amount of gas to be processed, and it is possible to efficiently decompose a large amount of components to be processed. The gas processing device 500 arbitrarily sets the number of cylindrical growth rings of the contact medium film 100 in a manner that can efficiently oxidize and decompose the processing target gas in accordance with the use conditions such as the amount of the components to be processed or the flow rate. Multiple or one.

在此,於第1~第4實施型態之氣體處理裝置,處理包含於被處理氣體的成分的場合,藉由電源14,在對施加電極11施加電壓的狀態,把包含成分的被處理氣體供給至流道。藉此,流過流道到達中孔洞的被處理氣體中的成分,藉由觸媒體膜100不被加溫而在常溫被氧化分解。進而,被處理氣體中的成分,也藉由電漿而被氧化分解。此外,僅藉著觸媒體膜100的話,會有由於與成分的接觸而使觸媒體膜100表面(金觸媒粒子)毒化,使觸媒失去活性,產生甲醛等反應中間體的情形,但藉由併用電漿使觸媒體膜100的表面被清潔而使觸媒活性保持更長期間。此外,反應中間體的產量幾乎為零,進而可以長期間維持著有害成分根據氧化而分解。 Here, when the gas processing apparatuses of the first to fourth embodiments process the components contained in the gas Supply to the runner. Thereby, the components in the gas to be processed flowing through the flow channel to the middle hole are oxidized and decomposed at room temperature by the contact medium film 100 not being heated. Furthermore, the components in the gas to be processed are also oxidized and decomposed by the plasma. In addition, if only the catalyst film 100 is used, the surface of the catalyst film 100 (gold catalyst particles) may be poisoned due to contact with the components, and the catalyst may be inactivated, resulting in reaction intermediates such as formaldehyde. The combined use of plasma cleans the surface of the catalyst film 100 and maintains the catalyst activity for a longer period of time. In addition, the yield of reaction intermediates is almost zero, and the decomposition of harmful components due to oxidation can be maintained for a long period of time.

此外,在第1實施型態之氣體處理裝置200, 說明了把施加電極11配置於氣體流動方向之上游側,但不限於此,使氣體由接地電極12側流通亦可。 In addition, in the gas processing device 200 of the first embodiment, It is described that the applying electrode 11 is arranged on the upstream side of the gas flow direction, but it is not limited to this, and the gas may be circulated from the ground electrode 12 side.

以上說明之第1~第4實施型態之氣體處理裝置,藉由觸媒體膜100與電漿之組合,可以抑制反應中間體的產生,同時在分解處理的過程即使觸媒體膜100(金觸媒粒子)被毒化,也藉由電漿清潔觸媒體膜100,所以可以進而長期間維持觸媒體膜100的觸媒活性。亦即,根據第1~第4實施形態之氣體處理裝置,可以實現可更為長期間地氧化而分解掉成為對象的化合物之氣體處理裝置。 In the gas processing apparatuses of the first to fourth embodiments described above, the combination of the contact medium film 100 and the plasma can suppress the generation of reaction intermediates. At the same time, even the contact medium film 100 (gold touch The catalyst particles) are poisoned and the catalyst film 100 is also cleaned by the plasma, so the catalyst activity of the catalyst film 100 can be maintained for a long period of time. That is, according to the gas treatment devices of the first to fourth embodiments, it is possible to realize a gas treatment device that can oxidize and decompose the target compound for a longer period of time.

[實施例] [Example]

其次,舉出實施例,更具體地說明本發明。但,本發明並不僅以這些實施例為限定。 Next, examples are given to explain the present invention more specifically. However, the present invention is not limited only to these examples.

[實施例1] [Example 1]

於燒杯加入四乙氧基矽烷(TEOS)5.2g,進而加入6.0g的乙醇。在此,進而加入0.01M鹽酸2.7g,在室溫攪拌20分鐘(A液)。於其他燒杯加入非離子系界面活性劑(Pluronic P123)1.38g及乙醇2.62g,在室溫攪拌30分鐘(B液)。對A液加入B液,在室溫條件下混合後,進而攪拌3小時,調製了中孔洞二氧化矽之前驅體溶液。餾去前驅體溶液之溶媒,把產生的固形物乾燥後粉碎得到粉體狀之支撐體。 In the beaker, 5.2 g of tetraethoxysilane (TEOS) was added, and 6.0 g of ethanol was further added. Here, 2.7 g of 0.01 M hydrochloric acid was further added, and stirred at room temperature for 20 minutes (A liquid). In another beaker, 1.38 g of a nonionic surfactant (Pluronic P123) and 2.62 g of ethanol were added, and the mixture was stirred at room temperature for 30 minutes (liquid B). The solution A was added to solution B, mixed at room temperature, and then stirred for 3 hours to prepare a mesoporous silica precursor solution. The solvent of the precursor solution is distilled off, and the resulting solid is dried and then pulverized to obtain a powder-like support.

對包含二硝基二氨鉑硝酸的溶液投入前述粉體狀支撐 體,進行攪拌。由溶液濾掉粉體在300℃乾燥3小時後,在氫氣10%、氮氣90%的還原處理氣體中250℃下燒成1小時,得到Pt/得到Pt/中孔洞二氧化矽粉體。對於中孔洞二氧化矽膜之Pt擔持量為1重量百分比(wt%)。 Put the aforementioned powder support into the solution containing dinitrodiammine platinum nitric acid Body, stir. After filtering the powder from the solution and drying it at 300°C for 3 hours, it is fired in a reduction gas of 10% hydrogen and 90% nitrogen at 250°C for 1 hour to obtain Pt/Pt/Mesoporous silica powder. For the mesoporous silica film, the Pt supporting capacity is 1 weight percent (wt%).

針對Pt/中孔洞二氧化矽粉體實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為377m2/g、0.52cm3/g、7.0nm。以TEM觀察Pt粒子尺寸為3.2nm。 According to the BET method for Pt/medium-porous silica powder, the specific surface area, pore volume, and pore diameter of the mesoporous silica film are 377 m 2 / g, 0.52 cm 3 / g, and 7.0 nm, respectively. The size of the Pt particles observed by TEM was 3.2 nm.

此外,藉由從觸媒體之各個角度之電子顯微鏡影像在構成為立體影像之3次元斷層攝影術(tomography),確認了Pt/中孔洞二氧化矽粉體之連通構造的存在。再構成之立體影像的一部分顯示於圖5、圖6及圖7(傾斜角度60~-50°,以1°之步幅攝影)。各照片之氧化觸媒粒子(明亮白色點)及中孔洞(氧化觸媒粒子的周圍的暗部)的位置及形狀不同,中孔洞不是汽缸形狀,確認了觸媒體之中孔洞在觸媒體內部具有複數之中孔洞連接的連通構造。 In addition, the three-dimensional tomography (tomography) using electron microscope images from various angles of the touch media to form a three-dimensional image confirmed the existence of the Pt/Mesoporous silica powder interconnection structure. Part of the reconstructed 3D image is shown in Figure 5, Figure 6 and Figure 7 (tilt angle 60~-50°, shooting in 1° steps). The positions and shapes of the oxidation catalyst particles (bright white dots) and the middle holes (the dark parts around the oxidation catalyst particles) are different in each photo. The middle holes are not in the shape of a cylinder. It is confirmed that the holes in the catalyst have a plurality of holes inside the catalyst. Connected structure with holes in the middle.

又,其他實施例之觸媒體,也以與實施例1同樣的方法製造,而且以下所示的試驗例同樣可以確認觸媒活性被維持著更長,所以可以理解與實施例1同樣具有連通構造。 In addition, the contact media of other examples were also manufactured by the same method as Example 1, and the test examples shown below also confirmed that the catalyst activity was maintained longer, so it can be understood that it has the same connection structure as Example 1. .

[實施例2] [Example 2]

替換二硝基二氨鉑硝酸而使用氯化鈀以外,以與實施 例1同樣的方法得到Pd/中孔洞二氧化矽粉體。以TEM觀察Pd粒子尺寸為3.0nm。 Instead of dinitrodiammine platinum nitric acid and use palladium chloride other than Pd/Mesoporous silica powder was obtained in the same way as in Example 1. The Pd particle size was 3.0nm observed by TEM.

[實施例3] [Example 3]

除了進而於包含二硝基二氨鉑硝酸的溶液溶解氯化鐵(III)使用以外,以與實施例1同樣的方法得到鉑鐵合金/中孔洞二氧化矽粉體之觸媒體。以TEM觀察Pt/Fe合金之粒子尺寸為3.6nm。 Except for dissolving iron (III) chloride in a solution containing dinitrodiammine platinum nitric acid, the same method as in Example 1 was used to obtain a platinum iron alloy/mesoporous silica powder contact medium. The particle size of the Pt/Fe alloy observed by TEM was 3.6nm.

[實施例4] [Example 4]

於燒杯加入四乙氧基矽烷(TEOS)5.2g,進而加入6.0g的乙醇。在此,進而加入0.01M鹽酸2.7g,在室溫攪拌20分鐘(A液)。於其他燒杯加入非離子系界面活性劑(Pluronic(登錄商標,以下相同)P123)1.38g及乙醇2.62g,在室溫攪拌30分鐘(B液)。此後,對A液加入B液,在室溫條件下混合,進而攪拌3小時,得到中孔洞二氧化矽之前驅體溶液。於中孔洞二氧化矽前驅體溶液浸漬陶瓷蜂巢(岩谷產業社製造),減壓15分鐘。此後,拉起陶瓷蜂巢以空氣噴槍除去多餘的溶液後,以1℃/分鐘的速度升溫,在450℃燒成4小時,得到把中孔洞二氧化矽膜固定化之陶瓷蜂巢。 In the beaker, 5.2 g of tetraethoxysilane (TEOS) was added, and 6.0 g of ethanol was further added. Here, 2.7 g of 0.01 M hydrochloric acid was further added, and stirred at room temperature for 20 minutes (A liquid). In another beaker, 1.38 g of a nonionic surfactant (Pluronic (registered trademark, the same hereinafter) P123) and 2.62 g of ethanol were added, and the mixture was stirred at room temperature for 30 minutes (liquid B). After that, add solution B to solution A, mix at room temperature, and stir for 3 hours to obtain a precursor solution of mesoporous silica. The ceramic honeycomb (manufactured by Iwatani Sangyo Co., Ltd.) was immersed in the mesoporous silica precursor solution, and the pressure was reduced for 15 minutes. After that, the ceramic honeycomb was pulled up to remove the excess solution with an air spray gun, then the temperature was raised at a rate of 1°C/min, and then fired at 450°C for 4 hours to obtain a ceramic honeycomb with the middle-hole silicon dioxide film immobilized.

此後,對把中孔洞二氧化矽膜固定化之陶瓷蜂巢浸漬於含有二硝基二氨鉑硝酸的溶液,以空氣噴槍除去多餘的溶液。在300℃乾燥3小時後,在氫氣10%、氮氣90%的還 原處理氣體中250℃下燒成1小時,得到Pt/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜(包含粒子(實施例1的場合為Pt粒子),以下相同)之Pt擔持量為1重量百分比(wt%)。 After that, the ceramic honeycomb with the mesoporous silica film immobilized was immersed in a solution containing dinitrodiammine platinum nitric acid, and the excess solution was removed with an air spray gun. After drying at 300°C for 3 hours, the Firing in the original treatment gas at 250°C for 1 hour to obtain Pt/medium-porous silica film/honeycomb. For the mesoporous silica film (including particles (Pt particles in the case of Example 1, the same below)), the Pt supporting amount is 1 weight percent (wt%).

針對Pt/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為377m2/g、0.52cm3/g、7.0nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pt粒子尺寸為3.2nm。 According to the measurement of Pt/medium-porous silica film/honeycomb, the specific surface area, pore volume, and pore diameter of the mesoporous silica film are 377 m 2 / g, 0.52 cm 3 / g, and 7.0 nm, respectively. In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the size of the Pt particles observed by TEM was 3.2 nm.

[實施例5] [Example 5]

對B液進而加入均三甲苯1.3g以外,以與實施例4同樣的方法得到Pt/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之Pt擔持量為1重量百分比(wt%)。 To the liquid B, except for adding 1.3 g of mesitylene, the same method as in Example 4 was carried out to obtain Pt/middle-porous silica film/honeycomb. For the mesoporous silica film, the Pt supporting capacity is 1 weight percent (wt%).

針對Pt/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為401m2/g、0.64cm3/g、20nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pt粒子尺寸為12nm。 According to the measurement of Pt/medium-porous silica film/honeycomb, the specific surface area, pore volume, and pore diameter of the mesoporous silica film are 401 m 2 /g, 0.64 cm 3 /g, and 20 nm, respectively. In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the size of the Pt particles observed by TEM was 12 nm.

[實施例6] [Example 6]

於燒杯加入四乙氧基矽烷(TEOS)10.4g,進而加入12.0g的乙醇。在此,進而加入0.01M鹽酸4.5g,在室溫攪拌20分鐘(A液)。於其他燒杯加入非離子系界面活性劑 (Brij(登錄商標)56)2.9g及乙醇8.0g,在室溫攪拌30分鐘(B液)。此後,對A液加入B液,在室溫條件下混合,進而攪拌3小時,得到中孔洞二氧化矽之前驅體溶液。於中孔洞二氧化矽前驅體溶液浸漬陶瓷蜂巢(岩谷產業社製造),減壓15分鐘。拉起陶瓷蜂巢以空氣噴槍除去多餘的溶液後,以1℃/分鐘的速度升溫,在450℃燒成4小時,得到把中孔洞二氧化矽膜固定化之陶瓷蜂巢。 In a beaker, 10.4 g of tetraethoxysilane (TEOS) was added, and 12.0 g of ethanol was further added. Here, 4.5 g of 0.01M hydrochloric acid was further added, and stirred at room temperature for 20 minutes (A liquid). Add non-ionic surfactants to other beakers (Brij (registered trademark) 56) 2.9 g and 8.0 g of ethanol were stirred at room temperature for 30 minutes (liquid B). After that, add solution B to solution A, mix at room temperature, and stir for 3 hours to obtain a precursor solution of mesoporous silica. The ceramic honeycomb (manufactured by Iwatani Sangyo Co., Ltd.) was immersed in the mesoporous silica precursor solution, and the pressure was reduced for 15 minutes. After pulling up the ceramic honeycomb and removing the excess solution with an air spray gun, it is heated at a rate of 1°C/min, and fired at 450°C for 4 hours to obtain a ceramic honeycomb with the middle-hole silicon dioxide film immobilized.

此後,對把中孔洞二氧化矽膜固定化之陶瓷蜂巢浸漬於含有二硝基二氨鉑硝酸溶液的溶液,以空氣噴槍除去多餘的溶液。在300℃乾燥3小時後,在氫氣10%、氮氣90%的還原處理氣體中250℃下燒成1小時,得到Pt/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之Pt擔持量為1重量百分比(wt%)。 After that, the ceramic honeycomb with the mesoporous silica film immobilized was immersed in a solution containing dinitrodiammine platinum nitric acid solution, and the excess solution was removed with an air spray gun. After drying at 300°C for 3 hours, it was fired in a reducing gas of 10% hydrogen and 90% nitrogen at 250°C for 1 hour to obtain Pt/medium-porous silica film/honeycomb. For the mesoporous silica film, the Pt supporting capacity is 1 weight percent (wt%).

針對Pt/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為380m2/g、0.38cm3/g、4.5nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pt粒子尺寸為3.2nm。 According to the measurement of Pt/medium-porous silica film/honeycomb, the specific surface area, pore volume, and pore diameter of the mesoporous silica film are 380 m 2 / g, 0.38 cm 3 / g, and 4.5 nm, respectively. In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the size of the Pt particles observed by TEM was 3.2 nm.

[實施例7] [Example 7]

對B液進而加入均三甲苯1.3g以外,以與實施例6同樣的方法得到Pt/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之Pt擔持量為1重量百分比(wt%)。 To the liquid B, except for adding 1.3 g of mesitylene, the same method as in Example 6 was carried out to obtain Pt/mesoporous silica film/honeycomb. For the mesoporous silica film, the Pt supporting capacity is 1 weight percent (wt%).

針對Pt/中孔洞二氧化矽膜/蜂巢實施根據BET法之測 定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為365m2/g、0.44cm3/g、12nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pt粒子尺寸為3.2nm。 According to the BET method for Pt/medium-porous silica film/honeycomb, the specific surface area, pore volume, and pore diameter of the mesoporous silica film are 365m 2 /g, 0.44cm 3 /g, and 12nm, respectively. In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the size of the Pt particles observed by TEM was 3.2 nm.

[實施例8] [Example 8]

於燒杯加入四乙氧基矽烷(TEOS)6.2g,進而加入4.8g的乙醇。在此,進而加入0.01M鹽酸2.2g,在室溫攪拌20分鐘(A液)。於其他燒杯加入陽離子系界面活性劑(溴化十六烷基三甲銨、CTAB)1.53g及0.01M鹽酸2.2g,在室溫攪拌30分鐘(B液)。此後,對A液加入B液,在室溫條件下混合,進而攪拌3小時,得到中孔洞二氧化矽之前驅體溶液。於中孔洞二氧化矽前驅體溶液浸漬陶瓷蜂巢(岩谷產業社製造),減壓15分鐘。此後,拉起陶瓷蜂巢以空氣噴槍除去多餘的溶液後,以1℃/分鐘的速度升溫,在450℃燒成4小時,得到把中孔洞二氧化矽膜固定化之陶瓷蜂巢。 In a beaker, 6.2 g of tetraethoxysilane (TEOS) was added, and then 4.8 g of ethanol was added. Here, 2.2 g of 0.01 M hydrochloric acid was further added, and the mixture was stirred at room temperature for 20 minutes (liquid A). In another beaker, 1.53 g of a cationic surfactant (cetyltrimethylammonium bromide, CTAB) and 2.2 g of 0.01M hydrochloric acid were added, and the mixture was stirred at room temperature for 30 minutes (liquid B). After that, add solution B to solution A, mix at room temperature, and stir for 3 hours to obtain a precursor solution of mesoporous silica. The ceramic honeycomb (manufactured by Iwatani Sangyo Co., Ltd.) was immersed in the mesoporous silica precursor solution, and the pressure was reduced for 15 minutes. After that, the ceramic honeycomb was pulled up to remove the excess solution with an air spray gun, then the temperature was raised at a rate of 1°C/min, and then fired at 450°C for 4 hours to obtain a ceramic honeycomb with the middle-hole silicon dioxide film immobilized.

此後,對把中孔洞二氧化矽膜固定化之陶瓷蜂巢浸漬於含有二硝基二氨鉑硝酸的溶液,以空氣噴槍除去多餘的溶液。在300℃乾燥3小時後,在氫氣10%、氮氣90%的還原處理氣體中250℃下燒成1小時,得到Pt/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之Pt擔持量為1重量百分比(wt%)。 After that, the ceramic honeycomb with the mesoporous silica film immobilized was immersed in a solution containing dinitrodiammine platinum nitric acid, and the excess solution was removed with an air spray gun. After drying at 300°C for 3 hours, it was fired in a reducing gas of 10% hydrogen and 90% nitrogen at 250°C for 1 hour to obtain Pt/medium-porous silica film/honeycomb. For the mesoporous silica film, the Pt supporting capacity is 1 weight percent (wt%).

針對Pt/中孔洞二氧化矽膜/蜂巢實施根據BET法之測 定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為341m2/g、0.50cm3/g、2.43nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pt粒子尺寸為2.0nm。 For Pt / pores in the silicon dioxide film / honeycomb embodiment according to the BET method, the pores in the silicon dioxide film surface area, pore volume, pore diameter, respectively 341m 2 /g,0.50cm 3 /g,2.43nm. In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the Pt particle size was 2.0 nm as observed by TEM.

[實施例9] [Example 9]

替換二硝基二氨鉑硝酸而使用氯化鈀以外,以與實施例4同樣的方法得到Pd/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之Pt擔持量為1重量百分比(wt%)。 Except for using palladium chloride instead of dinitrodiammine platinum nitric acid, a Pd/medium-porous silica film/honeycomb was obtained in the same manner as in Example 4. For the mesoporous silica film, the Pt supporting capacity is 1 weight percent (wt%).

針對Pd/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為377m2/g、0.52cm3/g、7nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pd粒子尺寸為3.0nm。 For Pd / pores in the silicon dioxide film / honeycomb embodiment according to the BET method, the pores in the silicon dioxide film surface area, pore volume, pore diameter, respectively 377m 2 /g,0.52cm 3 / g, 7nm . In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the Pd particle size was 3.0 nm as observed by TEM.

[實施例10] [Example 10]

替換二硝基二氨鉑硝酸而使用氯化鈀以外,以與實施例6同樣的方法得到Pd/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之Pt擔持量為1重量百分比(wt%)。 Except for using palladium chloride instead of dinitrodiammine platinum nitric acid, a Pd/medium-porous silica film/honeycomb was obtained in the same manner as in Example 6. For the mesoporous silica film, the Pt supporting capacity is 1 weight percent (wt%).

針對Pd/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為380m2/g、0.38cm3/g、4.5nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pd粒子尺寸為3.0nm。 According to the measurement of Pd/medium-porous silica film/honeycomb, the specific surface area, pore volume, and pore diameter of the mesoporous silica film are 380 m 2 / g, 0.38 cm 3 / g, and 4.5 nm, respectively. In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the Pd particle size was 3.0 nm as observed by TEM.

[實施例11] [Example 11]

替換二硝基二氨鉑硝酸而使用氯化鈀以外,以與實施例8同樣的方法得到Pd/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之Pt擔持量為1wt%。 Except for using palladium chloride instead of dinitrodiammine platinum nitric acid, a Pd/medium-porous silica film/honeycomb was obtained in the same manner as in Example 8. For the mesoporous silica film, the Pt supporting amount is 1wt%.

針對Pd/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為341m2/g、0.5cm3/g、2.43nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察Pd粒子尺寸為2.0nm。 For Pd / pores in the silicon dioxide film / honeycomb embodiment according to the BET method, the pores in the silicon dioxide film surface area, pore volume, pore diameter, respectively 341m 2 /g,0.5cm 3 /g,2.43nm. In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the Pd particle size was 2.0 nm as observed by TEM.

[實施例12] [Example 12]

除了不進行在氫氣10%、氮氣90%的還原處理氣體中之燒成處理以外,以與實施例4同樣的方法得到鉑氧化物/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之鉑氧化物的擔持量為1wt%。 Except for not performing the firing treatment in a reduction treatment gas of 10% hydrogen and 90% nitrogen, a platinum oxide/mesoporous silica film/honeycomb was obtained in the same manner as in Example 4. The supporting amount of platinum oxide for the mesoporous silica film is 1wt%.

針對鉑氧化物/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為377m2/g、0.52cm3/g、7nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察鉑氧化物之粒子尺寸為3.2nm。 For a platinum oxide / silicon dioxide film in the hole / honeycomb embodiment according to the BET method, the specific surface area of pores in the silicon dioxide film, pore volume, pore diameter, respectively 377m 2 /g,0.52cm 3 / g, 7nm . In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the particle size of platinum oxide observed by TEM was 3.2 nm.

[實施例13] [Example 13]

除了替換二硝基二氨鉑硝酸而使用氯化鈀,不進行在 氫氣10%、氮氣90%的還原處理氣體中之燒成處理以外,以與實施例4同樣的方法得到鈀氧化物/中孔洞二氧化矽膜/蜂巢。對於中孔洞二氧化矽膜之鈀氧化物的擔持量為1wt%。 Except for the replacement of dinitrodiamine platinum nitric acid and the use of palladium chloride, it is not carried out in the Except for the sintering treatment in a reduction treatment gas of 10% hydrogen and 90% nitrogen, the same method as in Example 4 was used to obtain a palladium oxide/mesoporous silica film/honeycomb. The supporting amount of palladium oxide for the mesoporous silica film is 1wt%.

針對鈀氧化物/中孔洞二氧化矽膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為377m2/g、0.52cm3/g、7nm。此外,中孔洞二氧化矽膜之膜厚為500nm。此外,以TEM觀察鈀氧化物之粒子尺寸為3.0nm。 For palladium oxide / silicon dioxide film in the hole / honeycomb embodiment according to the BET method, the specific surface area of pores in the silicon dioxide film, pore volume, pore diameter, respectively 377m 2 /g,0.52cm 3 / g, 7nm . In addition, the thickness of the mesoporous silicon dioxide film is 500 nm. In addition, the particle size of the palladium oxide observed by TEM was 3.0 nm.

[比較例1] [Comparative Example 1]

對汽缸狀具有奈米細孔構造的中孔洞二氧化矽(ALDRICH、MCM-41)10g,混合Pt的裝入量相當於1wt%的二硝基二氨鉑硝酸溶液,藉由加熱蒸發乾燥固化。進而把得到的固形成分施以12小時減壓乾燥。其後,把得到的固形成分在氫氣10%、氮氣90%的還原處理氣體中250℃下燒成1小時調製出Pt/中孔洞二氧化矽觸媒粒子。此後,使用結合劑成形,製作了使Pt/中孔洞二氧化矽觸媒粒子成為顆粒狀者。 For cylinder-shaped mesoporous silica (ALDRICH, MCM-41) with a nano-pore structure, 10g is mixed with a dinitrodiammine platinum nitric acid solution with a loading amount of Pt equivalent to 1wt%, and it is heated and evaporated to dry and solidify . Furthermore, the obtained solid content was dried under reduced pressure for 12 hours. After that, the obtained solid content was fired in a reduction treatment gas of 10% hydrogen and 90% nitrogen at 250°C for 1 hour to prepare Pt/medium-porous silica catalyst particles. After that, a binder was used for molding, and the Pt/medium-porous silica catalyst particles were made into granules.

實施BET測定時,中孔洞二氧化矽之比表面積、細孔容積、細孔徑分別為760m2/g、0.84cm3/g、3.7nm。此外,以TEM觀察Pt粒子尺寸為3.1nm。 When the BET measurement was performed, the specific surface area, pore volume, and pore diameter of mesoporous silica were 760 m 2 / g, 0.84 cm 3 / g, and 3.7 nm, respectively. In addition, the size of the Pt particles observed by TEM was 3.1 nm.

[比較例2] [Comparative Example 2]

除了替換中孔洞二氧化矽(ALDRICH、MCM-41)使用具有汽缸狀奈米細孔構造的中孔洞二氧化矽(ALDRICH、SBA-15)以外,以與比較例1同樣的方法得到使Pt/中孔洞二氧化矽觸媒粒子成形為顆粒狀者。 Except for replacing the middle-hole silica (ALDRICH, MCM-41) with a cylinder-shaped nano-pore structure (ALDRICH, SBA-15), the same method as that of Comparative Example 1 was used to obtain Pt/ Silica catalyst particles with mesoporous holes are shaped into granules.

實施BET測定時,中孔洞二氧化矽之比表面積、細孔容積、細孔徑分別為635m2/g、1.07cm3/g、6.3nm7nm。此外,以TEM觀察Pt粒子尺寸為6.0nm。 When the BET measurement was performed, the specific surface area, pore volume, and pore diameter of the mesoporous silica were 635 m 2 / g, 1.07 cm 3 / g, and 6.3 nm 7 nm, respectively. In addition, the Pt particle size was 6.0 nm as observed by TEM.

[比較例3] [Comparative Example 3]

替換二硝基二氨鉑硝酸而使用氯化鈀以外,以與比較例1同樣的方法得到使Pd/中孔洞二氧化矽觸媒粒子成形為顆粒狀者。此外,以TEM觀察Pd粒子尺寸為3.0nm。 Except for using palladium chloride instead of dinitrodiammine platinum nitric acid, the same method as in Comparative Example 1 was used to obtain a pelletized Pd/medium-porous silica catalyst particles. In addition, the Pd particle size was 3.0 nm as observed by TEM.

[比較例4] [Comparative Example 4]

替換二硝基二氨鉑硝酸而使用氯化鈀以外,以與比較例例2同樣的方法得到使Pd/中孔洞二氧化矽觸媒粒子成形為顆粒狀者。此外,以TEM觀察Pd粒子尺寸為6.0nm。 Except for the use of palladium chloride instead of dinitrodiammine platinum nitric acid, the same method as in Comparative Example 2 was used to obtain a pelletized Pd/mesoporous silica catalyst particles. In addition, the particle size of Pd observed by TEM was 6.0 nm.

[比較例5] [Comparative Example 5]

把異丙醇鈦(以下稱為「TTIP」)與作為分散媒之異丙醇(以下稱為「IPA」)、作為觸媒之鹽酸混合,其後加入特定量的水,在約4℃進行1小時的加水分解。出發溶液的組成比(莫耳比)為TTIP/IPA/水/鹽酸=1/140/4/0.4。加水分解後藉著在室溫放置10小時,調製出二氧化鈦膠體凝膠。 其後,於二氧化鈦膠體凝膠浸漬陶瓷蜂巢(岩谷產業社製造),減壓15分鐘。此後,拉起陶瓷蜂巢以空氣噴槍除去多餘的溶液後,以1℃/分鐘的速度升溫,在450℃燒成4小時,得到把二氧化鈦膜固定化之陶瓷蜂巢。 Mix titanium isopropoxide (hereinafter referred to as "TTIP") with isopropanol (hereinafter referred to as "IPA") as a dispersion medium, and hydrochloric acid as a catalyst, and then add a specific amount of water at about 4°C 1 hour of hydrolysis. The composition ratio (molar ratio) of the starting solution is TTIP/IPA/water/hydrochloric acid=1/140/4/0.4. After hydrolysis, the titanium dioxide colloidal gel was prepared by leaving it at room temperature for 10 hours. Thereafter, a ceramic honeycomb (manufactured by Iwatani Sangyo Co., Ltd.) was immersed in the titanium dioxide colloidal gel, and the pressure was reduced for 15 minutes. After that, the ceramic honeycomb was pulled up with an air spray gun to remove the excess solution, then the temperature was raised at a rate of 1°C/min, and then fired at 450°C for 4 hours to obtain a ceramic honeycomb with the titanium dioxide film immobilized.

此後,對把二氧化鈦膜固定化之陶瓷蜂巢浸漬於含有二硝基二氨鉑硝酸溶液的溶液,以空氣噴槍除去多餘的溶液後,在氫氣10%、氮氣90%的還原處理氣體中進行250℃之1小時的燒成得到Pt/二氧化鈦膜/蜂巢。對於二氧化鈦膜之Pt擔持量為1wt%。 After that, the ceramic honeycomb with the titanium dioxide film immobilized was immersed in a solution containing dinitrodiammine platinum nitric acid solution, and the excess solution was removed with an air spray gun, and then subjected to a reduction treatment gas of 10% hydrogen and 90% nitrogen at 250°C After firing for 1 hour, Pt/titanium dioxide film/honeycomb is obtained. For the titanium dioxide film, the supporting amount of Pt is 1wt%.

針對Pt/二氧化鈦膜/蜂巢實施根據BET法之測定,中孔洞二氧化矽膜之比表面積、細孔容積、細孔徑分別為100m2/g、0.10cm3/g、5.0nm。此外,中孔洞二氧化矽膜之膜厚為1000nm。此外,以TEM觀察Pt粒子尺寸為3.0nm。 For Pt/titanium dioxide film/honeycomb, the specific surface area, pore volume, and pore diameter of the mesoporous silica film are 100m 2 / g, 0.10 cm 3 / g, and 5.0 nm, respectively. In addition, the thickness of the mesoporous silicon dioxide film is 1000 nm. In addition, the Pt particle size was 3.0 nm as observed by TEM.

[實施例14] [Example 14]

對0.2g之界面活性劑(Pluronic P123)加入乙醇3.55mL,攪拌20分鐘以上使溶解而得到A液。對鹽酸0.63mL加入異丙醇鈦(TTIP)1.05g,攪拌5分鐘得到B液。 To 0.2 g of the surfactant (Pluronic P123), 3.55 mL of ethanol was added, and the mixture was stirred for more than 20 minutes to dissolve to obtain a liquid A. 1.05 g of titanium isopropoxide (TTIP) was added to 0.63 mL of hydrochloric acid, and stirred for 5 minutes to obtain liquid B.

將A液加入B液,進而攪拌15小時,得到中孔洞氧化鈦之前驅體溶液。 Add liquid A to liquid B, and then stir for 15 hours to obtain a precursor solution of mesoporous titanium oxide.

由前驅體溶液餾去溶媒,把產生的固形物以電爐在450℃燒成4小時後粉碎得到粉體狀之支撐體。 The solvent is distilled off from the precursor solution, and the resulting solid is fired in an electric furnace at 450°C for 4 hours and then pulverized to obtain a powder support.

於燒杯加入特定濃度的氯化金酸水溶液,水浴加溫至70℃。將0.1M氫氧化鈉水溶液緩慢加入,調節至pH為7。 將氯化金酸水溶液冷卻至常溫,加入前述粉體支撐體加溫至70℃,到達70℃之後攪拌1小時。由溶液濾出粉體,以純水洗淨5次。以電爐在300℃燒成2小時,得到擔持Au的中孔洞氧化鈦粉體。 Add a specific concentration of gold chloride aqueous solution to the beaker, and heat the water bath to 70°C. A 0.1M aqueous sodium hydroxide solution was slowly added to adjust the pH to 7. The gold chloride aqueous solution was cooled to normal temperature, the aforementioned powder support was added and heated to 70°C, and after reaching 70°C, it was stirred for 1 hour. Filter out the powder from the solution and wash it with pure water 5 times. It was fired in an electric furnace at 300°C for 2 hours to obtain a mesoporous titanium oxide powder supporting Au.

擔持Au的中孔洞氧化鈦粉體之Au擔持量以原子吸光光譜測定,對中孔洞氧化鈦粉體之Au擔持量為20質量%。針對擔持Au的中孔洞氧化鈦粉體實施根據BET法之測定,中孔洞氧化鈦粉體之比表面積、細孔容積、細孔徑分別為118m2/g、0.54g/cm3、9.23nm。此外,以TEM觀察Au粒徑為2.4nm。 The Au supporting amount of the mesoporous titanium oxide powder supporting Au was measured by atomic absorption spectroscopy, and the Au supporting amount of the mesoporous titanium oxide powder was 20% by mass. The Au-supporting mesoporous titanium oxide powder was measured according to the BET method. The specific surface area, pore volume, and pore diameter of the mesoporous titanium oxide powder were 118 m 2 / g, 0.54 g/ cm 3, and 9.23 nm, respectively. In addition, the Au particle size was 2.4 nm as observed by TEM.

[實施例15] [Example 15]

除了對16.7g之2.5%三異丙氧鐵(III)/異丙醇溶液,加入醋酸0.286mL及純水0.1mL,攪拌10分鐘作為B液以外,以與實施例14同樣的方法得到擔持Au的氧化鐵粉體。擔持Au的氧化鐵粉體之Au擔持量以原子吸光光譜測定,對中孔洞氧化鐵粉體之Au擔持量為20質量%。中孔洞氧化鐵分體之比表面積、細孔容積、細孔徑分別為351m2/g、0.48g/cm3、6.20nm。此外,以TEM觀察Au粒徑為3.3nm。 Except that to 16.7 g of 2.5% triisopropoxy iron (III)/isopropanol solution, 0.286 mL of acetic acid and 0.1 mL of pure water were added, and stirred for 10 minutes as the B solution, and the support was obtained in the same manner as in Example 14. Iron oxide powder of Au. The Au supporting amount of the iron oxide powder supporting Au was measured by atomic absorption spectroscopy, and the Au supporting amount of the middle-hole iron oxide powder was 20% by mass. The specific surface area, pore volume, and pore diameter of the mesoporous iron oxide component are 351 m 2 / g, 0.48 g/ cm 3, and 6.20 nm, respectively. In addition, the Au particle diameter observed by TEM was 3.3 nm.

[實施例16] [Example 16]

除了進而於氯化金酸水溶液溶解氯化鐵(III)而使用以外,以與實施例14同樣的方法得到金鐵合金/中孔洞氧化鈦粉體之觸媒體。以TEM觀察Au/Fe合金之粒子尺寸為 3.8nm。 Except for further dissolving iron (III) chloride in the gold chloride aqueous solution and using it, the same method as in Example 14 was used to obtain a gold-iron alloy/mesoporous titanium oxide powder activator. The particle size of Au/Fe alloy observed by TEM is 3.8nm.

[實施例17] [Example 17] (固定化擔持Au之中孔洞氧化鈦膜之Ti板) (Immobilized Ti plate supporting titanium oxide film with holes in Au)

對0.2g之界面活性劑(Pluronic P123)加入乙醇3.55mL,攪拌20分鐘以上使溶解而得到A液。對鹽酸0.63mL加入異丙醇鈦(TTIP)1.05g,攪拌5分鐘得到B液。 To 0.2 g of the surfactant (Pluronic P123), 3.55 mL of ethanol was added, and the mixture was stirred for more than 20 minutes to dissolve to obtain a liquid A. 1.05 g of titanium isopropoxide (TTIP) was added to 0.63 mL of hydrochloric acid, and stirred for 5 minutes to obtain liquid B.

將A液加入B液,進而攪拌15小時,得到中孔洞氧化鈦之前驅體溶液。其後,使用中孔洞氧化鈦之前驅體溶液,於鈦(以下亦標示為Ti)板上使用旋轉塗布機以轉速3000rpm成膜。將成膜之Ti板放入培養皿,在-20℃,20%RH環境下(冷凍庫)靜置2小時。由冷凍庫取出,回到常溫後打開培養皿蓋,取出Ti板。以電爐在450℃燒成4小時,得到固定化中孔洞氧化鈦膜(膜支撐體)之Ti板。又,於燒成步驟使升溫及降溫速度為每分鐘1℃。 Add liquid A to liquid B, and then stir for 15 hours to obtain a precursor solution of mesoporous titanium oxide. After that, using the mesoporous titanium oxide precursor solution, a spin coater was used to form a film on a titanium (also referred to as Ti hereinafter) plate at a rotation speed of 3000 rpm. Put the film-forming Ti plate into a petri dish, and let it stand for 2 hours at -20°C and 20%RH (freezer). Take it out from the freezer, open the petri dish cover after returning to room temperature, and take out the Ti plate. It was fired in an electric furnace at 450°C for 4 hours to obtain a Ti plate with an immobilized middle-hole titanium oxide film (membrane support). In the firing step, the rate of temperature increase and temperature decrease was 1°C per minute.

於燒杯加入特定濃度的氯化金酸水溶液,水浴加溫至70℃。將0.1M氫氧化鈉水溶液緩慢加入,調節至pH為7。把氯化金酸水溶液冷卻至常溫,浸漬把中孔洞氧化鈦膜固定化之Ti板,減壓脫氣約15分鐘。再度以水浴加溫至70℃,到達70℃後攪拌1小時。取出固定化中孔洞氧化鈦膜之Ti板,以純水洗淨5次,以抹布除去多餘的水分。以電爐在300℃燒成2小時,得到固定化擔持Au之中孔洞氧化鈦膜之Ti板。 Add a specific concentration of gold chloride aqueous solution to the beaker, and heat the water bath to 70°C. A 0.1M aqueous sodium hydroxide solution was slowly added to adjust the pH to 7. Cool the gold chloride aqueous solution to room temperature, immerse the Ti plate with the mesoporous titanium oxide film immobilized, and degas under reduced pressure for about 15 minutes. It was heated to 70°C with a water bath again, and stirred for 1 hour after reaching 70°C. Take out the Ti plate with the fixed hole titanium oxide film, wash it with pure water 5 times, and remove the excess water with a rag. It was fired in an electric furnace at 300°C for 2 hours to obtain an immobilized Ti plate supporting a titanium oxide film with holes in Au.

以TEM觀察擔持Au之中孔洞氧化鈦膜的剖面,膜厚為 100nm。此外,以原子吸光光譜測定Au擔持量,對中孔洞氧化鈦膜之Au擔持量為20質量%。將固定化擔持Au的中孔洞氧化鈦膜之Ti板實施根據BET法之測定時,中孔洞氧化鈦膜之比表面積、細孔容積、細孔徑分別為118m2/g、0.54g/cm3、9.23nm。此外,以TEM觀察Au粒徑為2.4nm。 The cross-section of the titanium oxide film supporting the holes in Au was observed by TEM, and the film thickness was 100 nm. In addition, the Au supporting amount was measured by atomic absorption spectroscopy, and the Au supporting amount to the mesoporous titanium oxide film was 20% by mass. When the Ti oxide film of the pores in the plate-immobilized Au bearing unit according to an embodiment of the BET method, the specific surface area of pores in the titanium oxide film, pore volume, pore diameter, respectively 118m 2 /g,0.54g/cm 3 , 9.23nm. In addition, the Au particle size was 2.4 nm as observed by TEM.

[實施例18] [Example 18] (固定化擔持Au之中孔洞氧化鈦膜之Ti板) (Immobilized Ti plate supporting titanium oxide film with holes in Au)

除了使燒成溫度為300℃把中孔洞氧化鈦膜固定化於Ti板以外,以與實施例17同樣的方法得到固定化擔持Au之中孔洞氧化鈦膜之Ti板。 Except that the sintering temperature was set to 300° C. to fix the middle hole titanium oxide film on the Ti plate, the same method as in Example 17 was used to obtain a Ti plate supporting the hole titanium oxide film in Au.

此外,以TEM觀察擔持Au之中孔洞氧化鈦膜的剖面,膜厚為100nm。此外,以原子吸光光譜測定時,對中孔洞氧化鈦膜之Au擔持量為30質量%。將固定化擔持Au的中孔洞氧化鈦膜之Ti板實施根據BET法之測定時,中孔洞氧化鈦膜之比表面積、細孔容積、細孔徑分別為206m2/g、0.34g/cm3、3.71nm。此外,以TEM觀察Au粒徑為2.4nm。 In addition, the cross-section of the titanium oxide film supporting the holes in Au was observed by TEM, and the film thickness was 100 nm. In addition, when measured by atomic absorption spectroscopy, the amount of Au supporting the mesoporous titanium oxide film was 30% by mass. The specific surface area, pore volume, and pore diameter of the mesoporous titanium oxide film are 206m 2 / g and 0.34g/cm 3 when the Ti plate of the mesoporous titanium oxide film that is immobilized and supports Au is measured according to the BET method. , 3.71nm. In addition, the Au particle size was 2.4 nm as observed by TEM.

[實施例19] [Example 19] (固定化擔持Au之中孔洞氧化鋯膜之Ti板) (Immobilized Ti plate supporting zirconia film with holes in Au)

對0.2g之界面活性劑(Pluronic P123)加入乙醇1mL,攪拌20分鐘得到A液。對0.58g之四丙氧基鋯(IV)(Zr(OPr)4)加入醋酸0.286mL及純水0.1mL,攪拌10分鐘得到B液。 Add 1 mL of ethanol to 0.2 g of surfactant (Pluronic P123), and stir for 20 minutes to obtain liquid A. To 0.58 g of tetrapropoxyzirconium (IV) (Zr(OPr) 4 ), 0.286 mL of acetic acid and 0.1 mL of pure water were added, and the mixture was stirred for 10 minutes to obtain liquid B.

對B液加入A液後,加入鹽酸0.093mL,攪拌1小時得 到中孔洞氧化鋯之前驅體溶液。 After adding solution A to solution B, add 0.093mL of hydrochloric acid and stir for 1 hour to get To the precursor solution of medium-porous zirconia oxide.

其後,使用中孔洞氧化鋯之前驅體溶液,於Ti板上使用旋轉塗布機以轉速3000rpm成膜。將成膜之Ti板放入培養皿,在-20℃,20%RH環境下(冷凍庫)靜置2小時。由冷凍庫取出,回到常溫後打開培養皿蓋,取出Ti板。以電爐在450℃燒成4小時,得到固定化中孔洞氧化鋯膜(膜支撐體)之Ti板。又,於燒成步驟使升溫及降溫速度為每分鐘1℃。 After that, using a precursor solution of mesoporous zirconia, a spin coater was used to form a film on the Ti plate at a rotation speed of 3000 rpm. Put the film-forming Ti plate into a petri dish, and let it stand for 2 hours under -20℃, 20%RH environment (freezer). Take it out from the freezer, open the petri dish cover after returning to room temperature, and take out the Ti plate. It was fired in an electric furnace at 450°C for 4 hours to obtain a Ti plate with an immobilized mesoporous zirconia film (membrane support). In the firing step, the rate of temperature increase and temperature decrease was 1°C per minute.

於燒杯加入特定濃度的氯化金酸水溶液,水浴加溫至70℃。將0.1M氫氧化鈉水溶液緩慢加入,調節至pH為7。把氯化金酸水溶液冷卻至常溫,浸漬把中孔洞氧化鋯膜固定化之Ti板,減壓脫氣約15分鐘。再度以水浴加溫至70℃,到達70℃後攪拌1小時。取出固定化中孔洞氧化鋯膜之Ti板,以純水洗淨5次,以抹布除去多餘的水分。以電爐在300℃燒成2小時,得到固定化擔持Au之中孔洞氧化鋯膜之Ti板。 Add a specific concentration of gold chloride aqueous solution to the beaker, and heat the water bath to 70°C. A 0.1M aqueous sodium hydroxide solution was slowly added to adjust the pH to 7. Cool the gold chloride aqueous solution to room temperature, immerse the Ti plate with the mesoporous zirconia film immobilized, and degas under reduced pressure for about 15 minutes. It was heated to 70°C with a water bath again, and stirred for 1 hour after reaching 70°C. Take out the Ti plate with the immobilized zirconia film in the hole, wash it with pure water 5 times, and remove the excess water with a rag. It was fired in an electric furnace at 300°C for 2 hours to obtain an immobilized Ti plate supporting the porous zirconia film in Au.

以TEM觀察擔持Au之中孔洞氧化鋯膜的剖面,膜厚為150nm。此外,以原子吸光光譜測定時,對中孔洞氧化鋯膜之Au擔持量為10.6質量%。將固定化擔持Au的中孔洞氧化鋯膜之Ti板實施根據BET法之測定時,中孔洞氧化鋯膜之比表面積、細孔容積、細孔徑分別為85.2m2/g、0.29g/cm3、6.18nm。此外,以TEM觀察Au粒徑為2.5nm。 The cross-section of the zirconia film supporting the holes in Au was observed by TEM, and the film thickness was 150 nm. In addition, when measured by atomic absorption spectroscopy, the amount of Au supporting the mesoporous zirconia film was 10.6% by mass. When the plate holes Ti film of a zirconium oxide-immobilized Au bearing unit according to an embodiment of the BET method, the specific surface area of pores in the zirconium oxide film, pore volume, pore diameter, respectively 85.2m 2 /g,0.29g/cm 3. 6.18nm. In addition, the Au particle size was 2.5 nm as observed by TEM.

[實施例20] [Example 20] (固定化擔持Au之中孔洞氧化鋯膜之Ti板) (Immobilized Ti plate supporting zirconia film with holes in Au)

除了使燒成溫度為300℃把中孔洞氧化鋯膜固定化於Ti板以外,以與實施例19同樣的方法得到固定化擔持Au之中孔洞氧化鋯膜之Ti板。 Except that the sintering temperature was set to 300° C. and the mesoporous zirconia film was immobilized on the Ti plate, the same method as in Example 19 was used to obtain a Ti plate that immobilized the Au mesoporous zirconia film.

以TEM觀察擔持Au之中孔洞氧化鋯膜的剖面,膜厚為150nm。此外,以原子吸光光譜測定時,對中孔洞氧化鋯膜之Au擔持量為18.2質量%。將固定化擔持Au的中孔洞氧化鋯膜之Ti板實施根據BET法之測定時,中孔洞氧化鋯膜之比表面積、細孔容積、細孔徑分別為94.3m2/g、0.42g/cm3、4.19nm。此外,以TEM觀察Au粒徑為2.5nm。 The cross-section of the zirconia film supporting the holes in Au was observed by TEM, and the film thickness was 150 nm. In addition, when measured by atomic absorption spectroscopy, the amount of Au supporting the mesoporous zirconia film was 18.2% by mass. The specific surface area, pore volume, and pore diameter of the mesoporous zirconia film on a Ti plate with an immobilized Au-supporting mesoporous zirconia film were measured according to the BET method, respectively 94.3m 2 / g and 0.42g/cm 3. 4.19nm. In addition, the Au particle size was 2.5 nm as observed by TEM.

[比較例6] [Comparative Example 6]

除了不使用界面活性劑(Pluronic P123)而製作前驅體溶液以外,以與實施例17同樣的方法得到固定化擔持Au的氧化鈦膜之Ti板。 Except that the surfactant solution was not used (Pluronic P123) and the precursor solution was prepared, the same method as in Example 17 was used to obtain a Ti plate immobilized with a titanium oxide film supporting Au.

以TEM觀察擔持Au之氧化鈦膜的剖面,膜厚為100nm。此外,以原子吸光光譜測定時,對氧化鈦膜之Au擔持量為6.6質量%。固定化擔持Au之氧化鈦膜的Ti板實施根據BET法之測定時,氧化鈦膜之比表面積為10m2/g,確認了此氧化鈦膜不具有中孔洞構造。此外,以TEM觀察Au粒徑為5nm。 The cross-section of the titanium oxide film supporting Au was observed by TEM, and the film thickness was 100 nm. In addition, when measured by atomic absorption spectroscopy, the amount of Au supported on the titanium oxide film was 6.6% by mass. When the Ti plate on which the titanium oxide film supporting Au was immobilized was measured according to the BET method, the specific surface area of the titanium oxide film was 10 m 2 /g, which confirmed that the titanium oxide film did not have a mesoporous structure. In addition, the Au particle size was 5 nm as observed by TEM.

[比較例7] [Comparative Example 7]

除了不使用界面活性劑(Pluronic P123)而製作前驅體 溶液以外,以與實施例19同樣的方法得到固定化擔持Au的氧化鋯膜之Ti板。 In addition to making precursors without using surfactants (Pluronic P123) Except for the solution, the same method as in Example 19 was used to obtain a Ti plate on which a zirconia film supporting Au was immobilized.

以TEM觀察擔持Au之氧化鋯膜的剖面,膜厚為150nm。此外,以原子吸光光譜測定時,對氧化鋯膜之Au擔持量為5質量%。固定化擔持Au之氧化鋯膜的Ti板實施根據BET法之測定時,氧化鈦膜之比表面積為7.9m2/g,確認了此氧化鈦膜不具有中孔洞構造。此外,以TEM觀察Au粒徑為5nm。 The cross-section of the zirconia film supporting Au was observed by TEM, and the film thickness was 150 nm. In addition, when measured by atomic absorption spectroscopy, the amount of Au supported on the zirconia film was 5 mass%. The specific surface area of the titanium oxide film was 7.9 m 2 /g when the Ti plate on which the Au-supporting zirconia film was immobilized was measured by the BET method, which confirmed that the titanium oxide film did not have a mesoporous structure. In addition, the Au particle size was 5 nm as observed by TEM.

[比較例8] [Comparative Example 8]

將Au(I)(TPP)Cl錯合物470mg加入乙醇20mL攪拌30分鐘。將硼氫化鈉35.9mg溶於乙醇7.5mL,將此一口氣全加入上述液體,攪拌3小時。對此加入己烷500mL,靜置24小時。進而過濾,以己烷洗淨乾燥數次,得到以三苯基膦保護之金。把以三苯基膦保護之金溶於24mL二氯甲烷,添加中孔洞二氧化矽(SBA-15)1g攪拌2小時。攪拌後再經過濾後,藉著在200℃燒成而得到擔持Au之中孔洞二氧化矽。使得到的擔持Au之中孔洞二氧化矽懸浮於水,於Ti板上使用旋轉塗布機以轉速3000rpm成膜,使其乾燥,而得到固定化擔持Au之中孔洞二氧化矽的Ti板。 470 mg of Au(I)(TPP)Cl complex was added to 20 mL of ethanol and stirred for 30 minutes. Dissolve 35.9 mg of sodium borohydride in 7.5 mL of ethanol, add this to the above liquid all at once, and stir for 3 hours. To this, 500 mL of hexane was added and left to stand for 24 hours. It is further filtered, washed with hexane and dried several times to obtain gold protected with triphenylphosphine. The gold protected with triphenylphosphine was dissolved in 24 mL of dichloromethane, and 1 g of medium-hole silica (SBA-15) was added and stirred for 2 hours. After stirring, it is filtered and then fired at 200°C to obtain silica with holes in Au. The obtained silicon dioxide supporting the holes in the Au is suspended in water, and a spin coater is used to form a film on the Ti plate at a rotation speed of 3000 rpm, and the film is dried to obtain an immobilized Ti plate supporting the silicon dioxide in the holes of the Au .

以TEM觀察擔持Au之中孔洞二氧化矽的剖面,膜厚為100nm。此外,以原子吸光光譜測定時,對中孔洞二氧化矽之Au擔持量為1質量%。針對擔持Au之中孔洞二氧化矽實施根據BET法之測定,比表面積、細孔容積、細孔徑分 別為871m2/g、1.13cm3/g、7.5nm。此外,以TEM觀察Au粒徑為0.8nm。 The cross-section of the silicon dioxide supporting the holes in Au was observed by TEM, and the film thickness was 100 nm. In addition, when measured by atomic absorption spectroscopy, the Au supporting amount for the middle hole silica is 1% by mass. According to the measurement of the pore silicon dioxide in Au supporting the BET method, the specific surface area, pore volume, and pore diameter are 871 m 2 / g, 1.13 cm 3 / g, and 7.5 nm, respectively. In addition, the Au particle diameter observed by TEM was 0.8 nm.

[乙烯分解試驗] [Ethylene Decomposition Test]

使用實施例1~13及比較例1~5之觸媒體進行了乙烯之分解反應。混合包含濃度10ppm乙烯的空氣與室內空氣調製反應氣體,分別之氣體流量以熱質量流量控制器來控制。反應氣體的分析使用了裝填長光徑(20m)的氣體胞之紅外分光光度計(FTIR-6000、日本分光股份公司製造)。反應條件為乙烯濃度0.5ppm、氧濃度20%、氣體流量1L/min、反應溫度5℃、相對濕度90%。 Using the contact media of Examples 1 to 13 and Comparative Examples 1 to 5, the decomposition reaction of ethylene was carried out. The reaction gas is prepared by mixing air containing 10 ppm ethylene with indoor air, and the respective gas flow rates are controlled by a thermal mass flow controller. The reaction gas was analyzed using an infrared spectrophotometer (FTIR-6000, manufactured by JASCO Corporation) filled with gas cells with a long optical path (20 m). The reaction conditions were ethylene concentration of 0.5 ppm, oxygen concentration of 20%, gas flow rate of 1 L/min, reaction temperature of 5°C, and relative humidity of 90%.

乙烯的除去率,由以下之式求出。 The removal rate of ethylene is calculated by the following equation.

乙烯除去率(%)={(初期乙烯濃度-反應後乙烯濃度)/初期乙烯濃度}×100 Ethylene removal rate (%)={(initial ethylene concentration-ethylene concentration after reaction)/initial ethylene concentration}×100

所得到的結果顯示於表1。 The results obtained are shown in Table 1.

Figure 107106134-A0305-02-0054-1
Figure 107106134-A0305-02-0054-1

如由以上結果所可以理解的,比較例1與2之乙烯的1日後之除去氯為8.4%,7日後降低至4.7%及3.0%。此外,比較例3至5,1日後起除去率為零。對此,實施例1至13之乙烯除去率在1日後與7日後確認都沒有極端降低的情形。 As can be understood from the above results, the chlorine removal of ethylene in Comparative Examples 1 and 2 after 1 day was 8.4%, and it decreased to 4.7% and 3.0% after 7 days. In addition, in Comparative Examples 3 to 5, the removal rate was zero after one day. In this regard, it was confirmed that the ethylene removal rates of Examples 1 to 13 did not extremely decrease after 1 day and 7 days later.

由以上所述,顯示了實施例在比一般考慮的室溫還低5℃的溫度下,可以分解除去0.5ppm程度之低濃度的乙烯等碳化氫,此外其分解活性的降低不容易發生,可以跨長期間使用。 From the above, it is shown that the example can decompose and remove hydrocarbons such as ethylene at a low concentration of about 0.5 ppm at a temperature 5°C lower than the generally considered room temperature. In addition, the degradation of its decomposition activity is not easy to occur, and it can be Used across a long period of time.

(使用低溫電漿反應器(氣體處理裝置)之一氧 化碳除去試驗(試驗例1~14)) (Using one of the low-temperature plasma reactor (gas processing device) oxygen Carbon removal test (test examples 1-14))

作為氣體處理裝置,準備圖2所示之第2實施型態的氣體處理裝置300。觸媒體100分別使用了在實施例17~20與比較例6~8得到的Ti板。施加電極11及設置電極12使用銅帶。介電質13使用了α-氧化鋁。 As the gas processing device, a gas processing device 300 of the second embodiment shown in FIG. 2 is prepared. The touch medium 100 used the Ti plates obtained in Examples 17 to 20 and Comparative Examples 6 to 8, respectively. Copper tape is used for the application electrode 11 and the installation electrode 12. The dielectric 13 used α-alumina.

於電漿的產生,使用電將產生用電源將施加電極11與接地電極12連接於電漿產生用電源,藉著施加電壓產生電漿。施加電壓為8kVp-p,放電輸出為0.1W。 For the generation of plasma, a power source for generating electricity is used to connect the application electrode 11 and the ground electrode 12 to the power source for generating plasma, and the plasma is generated by applying a voltage. The applied voltage is 8kVp-p, and the discharge output is 0.1W.

使用一氧化碳(CO),評估使用實施例及比較例之Ti板之氣體處理裝置300的氧化反應。具體而言,混合一氧化碳(濃度1,000ppm)與空氣調製被處理氣體,以質量流量控制器控制流量同時把被處理氣體供給至流道(2個介電質13之間)。 Using carbon monoxide (CO), the oxidation reaction of the gas treatment device 300 using the Ti plate of the embodiment and the comparative example was evaluated. Specifically, carbon monoxide (concentration 1,000 ppm) and air are mixed to modulate the gas to be processed, and the flow rate is controlled by a mass flow controller, while the gas to be processed is supplied to the flow channel (between the two dielectric substances 13).

根據氣體處理裝置300之處理前的被處理氣體與處理後的被處理氣體的分析使用了裝填長光徑(2.5m)的氣體胞之紅外分光光度計(FTIR-6000、日本分光股份公司製造)。反應條件為一氧化碳濃度1,000ppm、氧濃度20%、相對濕度50%、氣體流量0.1L/min、觸媒尺寸25cm2、反應溫度為室溫。 According to the analysis of the gas to be processed before and after the processing of the gas processing device 300, an infrared spectrophotometer (FTIR-6000, manufactured by JASCO Corporation) filled with a gas cell with a long optical path (2.5m) is used. . The reaction conditions were 1,000 ppm carbon monoxide, 20% oxygen concentration, 50% relative humidity, gas flow rate 0.1 L/min, catalyst size 25 cm 2 , and reaction temperature at room temperature.

變更使用的觸媒體同時針對有無產生電漿也予以改變同時進行了試驗例1~14。 The contact media used was changed, and the presence or absence of plasma was also changed. Test examples 1 to 14 were also performed.

使用前述之紅外分光光度計,測定供給至氣體處理裝置300之前的被處理氣體中的CO濃度(以下亦稱為「初期CO濃度」)與以氣體處理裝置300處理之後的被處理氣體中 的CO濃度(以下亦稱為「反應後CO濃度」),使用以下之式算出CO除去率。又,把被處理氣體以氣體處理裝置300處理的時間,顯示於後述之表3及表4。 Using the aforementioned infrared spectrophotometer, measure the CO concentration in the gas to be processed before being supplied to the gas processing device 300 (hereinafter also referred to as the "initial CO concentration") and in the gas to be processed after being processed by the gas processing device 300 The CO concentration (hereinafter also referred to as the "post-reaction CO concentration") is used to calculate the CO removal rate using the following formula. In addition, the time for processing the gas to be processed by the gas processing device 300 is shown in Table 3 and Table 4 described later.

CO除去率(%)={(初期CO濃度-反應後CO濃度)/初期CO濃度}×100 CO removal rate (%)={(initial CO concentration-post-reaction CO concentration)/initial CO concentration}×100

(試驗例1) (Test Example 1)

使用實施例17所得到的Ti板,不使產生電漿而實施了CO除去試驗。 Using the Ti plate obtained in Example 17, a CO removal test was carried out without generating plasma.

(試驗例2) (Test Example 2)

除了使用實施例18所得到的Ti板以外,以與試驗例1同樣的方法實施了CO除去試驗。 Except that the Ti plate obtained in Example 18 was used, a CO removal test was carried out in the same manner as in Test Example 1.

(試驗例3) (Test Example 3)

除了使用實施例19所得到的Ti板以外,以與試驗例1同樣的方法實施了CO除去試驗。 Except that the Ti plate obtained in Example 19 was used, a CO removal test was carried out in the same manner as in Test Example 1.

(試驗例4) (Test Example 4)

除了使用實施例20所得到的Ti板以外,以與試驗例1同樣的方法實施了CO除去試驗。 Except that the Ti plate obtained in Example 20 was used, a CO removal test was carried out in the same manner as in Test Example 1.

(試驗例5) (Test Example 5)

除了使用比較例6所得到的Ti板以外,以與試驗例1同 樣的方法實施了CO除去試驗。 Except that the Ti plate obtained in Comparative Example 6 is used, it is the same as Test Example 1 The same method implemented CO removal test.

(試驗例6) (Test Example 6)

除了使用比較例7所得到的Ti板以外,以與試驗例1同樣的方法實施了CO除去試驗。 Except that the Ti plate obtained in Comparative Example 7 was used, a CO removal test was carried out in the same manner as in Test Example 1.

(試驗例7) (Test Example 7)

除了使用比較例8所得到的Ti板以外,以與試驗例1同樣的方法實施了CO除去試驗。 Except for using the Ti plate obtained in Comparative Example 8, a CO removal test was carried out in the same manner as in Test Example 1.

(試驗例8) (Test Example 8)

使用實施例17所得到的Ti板,使產生放電電力0.1W的電漿實施了CO除去試驗。 Using the Ti plate obtained in Example 17, a plasma generating discharge power of 0.1 W was subjected to a CO removal test.

(試驗例9) (Test Example 9)

除了使用實施例18所得到的Ti板以外,以與試驗例8同樣的方法實施了CO除去試驗。 Except for using the Ti plate obtained in Example 18, a CO removal test was carried out in the same manner as in Test Example 8.

(試驗例10) (Test Example 10)

除了使用實施例19所得到的Ti板以外,以與試驗例8同樣的方法實施了CO除去試驗。 Except for using the Ti plate obtained in Example 19, a CO removal test was carried out in the same manner as in Test Example 8.

(試驗例11) (Test Example 11)

除了使用實施例20所得到的Ti板以外,以與試驗例8 同樣的方法實施了CO除去試驗。 In addition to using the Ti plate obtained in Example 20, it was compared with Test Example 8. The CO removal test was carried out in the same way.

(試驗例12) (Test Example 12)

除了使用比較例6所得到的Ti板以外,以與試驗例8同樣的方法實施了CO除去試驗。 Except for using the Ti plate obtained in Comparative Example 6, a CO removal test was carried out in the same manner as in Test Example 8.

(試驗例13) (Test Example 13)

除了使用比較例7所得到的Ti板以外,以與試驗例8同樣的方法實施了CO除去試驗。 Except that the Ti plate obtained in Comparative Example 7 was used, a CO removal test was carried out in the same manner as in Test Example 8.

(試驗例14) (Test Example 14)

除了使用比較例8所得到的Ti板以外,以與試驗例8同樣的方法實施了CO除去試驗。 Except for using the Ti plate obtained in Comparative Example 8, a CO removal test was performed in the same manner as in Test Example 8.

試驗例1~14之CO除去率顯示於表2。 The CO removal rates of Test Examples 1-14 are shown in Table 2.

Figure 107106134-A0305-02-0059-2
Figure 107106134-A0305-02-0059-2

[一氧化碳除去試驗(試驗例15~17)] [Carbon Monoxide Removal Test (Test Examples 15-17)]

使用實施例14(試驗例15)、實施例15(試驗例16)、實施例16(試驗例17)之粉體之觸媒體,進行試驗例15~17之一氧化碳的分解反應。 Using the powder contact media of Example 14 (Test Example 15), Example 15 (Test Example 16), and Example 16 (Test Example 17), the decomposition reaction of carbon monoxide in Test Examples 15-17 was performed.

混合一氧化碳與空氣調製一氧化碳濃度1,000ppm之試驗氣體,以質量流量控制器控制流量同時供給至觸媒體。處理前的被處理氣體與處理1小時之後的被處理氣體之分析使用了裝填長光徑(2.5m)的氣體胞之紅外分光光度計(FTIR-6000、日本分光股份公司製造)。反應條件為一氧化碳濃度1,000ppm、氧濃度20%、相對濕度60%、氣體流量1.0L/min、反應溫度為室溫。 A test gas with a carbon monoxide concentration of 1,000 ppm is prepared by mixing carbon monoxide and air, and the mass flow controller is used to control the flow rate and supply to the contact medium at the same time. An infrared spectrophotometer (FTIR-6000, manufactured by JASCO Corporation) was used for the analysis of the gas to be processed before the treatment and the gas to be processed 1 hour after the treatment. The reaction conditions were 1,000 ppm carbon monoxide, 20% oxygen, 60% relative humidity, gas flow rate 1.0 L/min, and reaction temperature at room temperature.

使用以下之式算出CO除去率,結果記載於表3。 The CO removal rate was calculated using the following formula, and the results are shown in Table 3.

CO除去率(%)={(初期CO濃度-反應後CO濃度)/初期CO濃度}×100 CO removal rate (%)={(initial CO concentration-post-reaction CO concentration)/initial CO concentration}×100

Figure 107106134-A0305-02-0060-3
Figure 107106134-A0305-02-0060-3

[使用低溫電漿反應器(氣體處理裝置)之氨除去試驗(試驗例18,19)] [Ammonia removal test using a low-temperature plasma reactor (gas treatment device) (Experimental Examples 18, 19)]

使用了與使用低溫電漿反應器(氣體處理裝置)之一氧化碳除去試驗(試驗例1~14)相同的氣體處理裝置。此外,觸媒體100分別使用了在實施例19與比較例8得到的Ti板。 The same gas treatment device as the carbon oxide removal test (Experiment Examples 1 to 14) using a low-temperature plasma reactor (gas treatment device) was used. In addition, the touch medium 100 used the Ti plates obtained in Example 19 and Comparative Example 8, respectively.

除了混合含氨10,000ppm的氮氣與室內空氣調製反應氣體而使用以外,與使用低溫電漿反應器(氣體處理裝置)之一氧化碳除去試驗(試驗例1~14)同樣地進行。反應氣體的分析使用了裝填長光徑(2.5m)的氣體胞之紅外分光光度計(FTIR-6000、日本分光股份公司製造)。反應條件為氨濃度5ppm、氧濃度20%、相對濕度50%、氣體流量0.1L/min、觸媒尺寸25cm3、反應溫度為室溫。 Except for mixing nitrogen containing 10,000 ppm of ammonia and indoor air to prepare a reaction gas and using it, it was performed in the same manner as the carbon monoxide removal test (Test Examples 1 to 14) using a low-temperature plasma reactor (gas processing device). The reaction gas was analyzed using an infrared spectrophotometer (FTIR-6000, manufactured by JASCO Corporation) filled with gas cells with a long optical path (2.5 m). The reaction conditions are: ammonia concentration 5ppm, oxygen concentration 20%, relative humidity 50%, gas flow rate 0.1L/min, catalyst size 25cm 3 , reaction temperature is room temperature.

使用以下之式算出氨除去率,結果記載於表4。 The ammonia removal rate was calculated using the following formula, and the results are shown in Table 4.

氨除去率(%)={(初期氨濃度-反應後氨濃度)/初期氨濃度}×100 Ammonia removal rate (%)={(initial ammonia concentration-post-reaction ammonia concentration)/initial ammonia concentration}×100

(試驗例18) (Test Example 18)

使用實施例19所得到的Ti板,使產生放電電力0.1W的電漿實施了氨除去試驗。 Using the Ti plate obtained in Example 19, a plasma generating discharge power of 0.1 W was subjected to an ammonia removal test.

(試驗例19) (Test Example 19)

除了使用比較例8所得到的Ti板以外,以與試驗例18同樣的方法實施了氨除去試驗。 Except for using the Ti plate obtained in Comparative Example 8, an ammonia removal test was carried out in the same manner as in Test Example 18.

Figure 107106134-A0305-02-0061-4
Figure 107106134-A0305-02-0061-4

[使用低溫電漿反應器(氣體處理裝置)之三甲胺除去試驗(試驗例20、21)] [Trimethylamine removal test using low-temperature plasma reactor (gas treatment device) (Experiment 20, 21)]

使用了與使用低溫電漿反應器(氣體處理裝置)之一氧化碳除去試驗(試驗例1~14)相同的氣體處理裝置。此外,觸媒體100分別使用了在實施例19與比較例8得到的Ti板。 The same gas treatment device as the carbon oxide removal test (Experiment Examples 1 to 14) using a low-temperature plasma reactor (gas treatment device) was used. In addition, the touch medium 100 used the Ti plates obtained in Example 19 and Comparative Example 8, respectively.

除了於反應氣體混合含三甲胺10,000ppm的氮氣與室內空氣調製反應氣體而使用以外,與使用低溫電漿反應器(氣體處理裝置)之一氧化碳除去試驗(試驗例1~14)同樣地進行。反應氣體的分析使用了裝填長光徑(2.5m)的氣體胞 之紅外分光光度計(FTIR-6000、日本分光股份公司製造)。反應條件為三甲胺濃度10ppm、氧濃度20%、相對濕度50%、氣體流量0.1L/min、觸媒尺寸25cm3、反應溫度為室溫。 Except that the reaction gas was mixed with nitrogen containing trimethylamine 10,000 ppm and room air to prepare the reaction gas and used, it was carried out in the same manner as the carbon monoxide removal test (Experimental Examples 1 to 14) using a low-temperature plasma reactor (gas processing device). The reaction gas was analyzed using an infrared spectrophotometer (FTIR-6000, manufactured by JASCO Corporation) filled with gas cells with a long optical path (2.5 m). The reaction conditions are: trimethylamine concentration of 10 ppm, oxygen concentration of 20%, relative humidity of 50%, gas flow rate of 0.1 L/min, catalyst size of 25 cm 3 , and reaction temperature of room temperature.

使用以下之式算出三甲胺除去率,結果記載於表5。 The trimethylamine removal rate was calculated using the following formula, and the results are shown in Table 5.

三甲胺除去率(%)={(初期三甲胺濃度-反應後三甲胺濃度)/初期三甲胺濃度}×100 Trimethylamine removal rate (%)={(initial trimethylamine concentration-trimethylamine concentration after reaction)/initial trimethylamine concentration}×100

(試驗例20) (Test Example 20)

使用實施例19所得到的Ti板,使產生放電電力0.1W的電漿實施了三甲胺除去試驗。 Using the Ti plate obtained in Example 19, a plasma generating discharge power of 0.1 W was subjected to a trimethylamine removal test.

(試驗例21) (Test Example 21)

除了使用比較例8所得到的Ti板以外,以與試驗例20同樣的方法實施了三甲胺除去試驗。 Except for using the Ti plate obtained in Comparative Example 8, a trimethylamine removal test was performed in the same manner as in Test Example 20.

Figure 107106134-A0305-02-0062-6
Figure 107106134-A0305-02-0062-6

如表2所示,試驗例1~4之CO除去率為92%以上。此外,如表3所示試驗例15~17之CO除去率也為92%以上。另一方面,試驗例5~7之CO除去率為4%以下。由這些結果,確認了使用實施例14~20之氣體處理裝 置300,與使用比較例6~8之氣體處理裝置300相比具有優異的觸媒活性。 As shown in Table 2, the CO removal rate of Test Examples 1 to 4 is above 92%. In addition, as shown in Table 3, the CO removal rate of Test Examples 15 to 17 was also 92% or more. On the other hand, the CO removal rate of Test Examples 5 to 7 was 4% or less. From these results, it was confirmed that the gas treatment devices of Examples 14 to 20 were used The setting 300 has superior catalytic activity compared with the gas treatment device 300 of Comparative Examples 6-8.

如表2所示,試驗例8~11之1小時後的CO除去率為92%以上,24小時後的CO除去率為90.1%以上。另一方面,試驗例12~14之1小時後的CO除去率為4%以下,24小時後的CO除去率亦為0%。由這些結果,可以理解到使用實施例17~20之氣體處理裝置300,與使用比較例6~8之氣體處理裝置300相比具有優異的觸媒活性,可以持續其觸媒活性。 As shown in Table 2, the CO removal rate after 1 hour in Test Examples 8 to 11 was 92% or more, and the CO removal rate after 24 hours was 90.1% or more. On the other hand, in Test Examples 12-14, the CO removal rate after 1 hour was 4% or less, and the CO removal rate after 24 hours was also 0%. From these results, it can be understood that the gas treatment device 300 used in Examples 17 to 20 has superior catalytic activity compared to the gas treatment device 300 used in Comparative Examples 6 to 8, and the catalyst activity can be sustained.

如表4所示,試驗例18之1小時後的氨除去率為91.2%,24小時後的氨除去率為90.8%。另一方面,試驗例19之1小時後的氨率為1.8%以下,24小時後的氨除去率為1.7%。由這些結果,可以理解到使用實施例19之氣體處理裝置300,與使用比較例8之氣體處理裝置300相比具有優異的觸媒活性,可以持續其觸媒活性。 As shown in Table 4, the ammonia removal rate of Test Example 18 after 1 hour was 91.2%, and the ammonia removal rate after 24 hours was 90.8%. On the other hand, in Test Example 19, the ammonia rate after 1 hour was 1.8% or less, and the ammonia removal rate after 24 hours was 1.7%. From these results, it can be understood that the use of the gas processing device 300 of Example 19 has superior catalyst activity compared to the use of the gas processing device 300 of Comparative Example 8, and the catalyst activity can be maintained.

如表5所示,試驗例20之1小時後的三甲胺除去率為94.2%,24小時後的三甲胺除去率為93.8%。另一方面,試驗例21之1小時後的三甲胺除去率為2.2%,24小時後的三甲胺除去率亦為2.2%。由這些結果,可以理解到使用實施例19之氣體處理裝置300,與使用比較例8之氣體處理裝置300相比具有優異的觸媒活性,可以持續其觸媒活性。 As shown in Table 5, the removal rate of trimethylamine after 1 hour in Test Example 20 was 94.2%, and the removal rate of trimethylamine after 24 hours was 93.8%. On the other hand, in Test Example 21, the removal rate of trimethylamine after 1 hour was 2.2%, and the removal rate of trimethylamine after 24 hours was also 2.2%. From these results, it can be understood that the use of the gas processing device 300 of Example 19 has superior catalyst activity compared to the use of the gas processing device 300 of Comparative Example 8, and the catalyst activity can be maintained.

由以上結果,顯示了本發明的有效性。 From the above results, the effectiveness of the present invention is shown.

Claims (11)

一種中孔洞觸媒體,其特徵為具備:具有複數中孔洞之支撐體,及被擔持於前述支撐體的中孔洞內的至少包含貴金屬、貴金屬的氧化物、及貴金屬與過渡金屬之合金之中的一種之氧化觸媒粒子;於前述支撐體,一中孔洞至少與一其他中孔洞連通;前述氧化觸媒粒子之平均粒徑為1nm以上10nm以下。 A mesoporous contact medium, which is characterized by having: a support body with a plurality of mesopores, and at least a noble metal, an oxide of noble metal, and an alloy of noble metal and transition metal supported in the mesopore of the aforementioned support One of the oxidation catalyst particles; in the aforementioned support, one middle hole is connected to at least one other middle hole; the average particle size of the aforementioned oxidation catalyst particles is 1 nm or more and 10 nm or less. 一種中孔洞觸媒體,其特徵為藉由使具有中孔洞之支撐體,與對應於貴金屬、貴金屬的氧化物、及貴金屬與過渡金屬之合金之至少一種的化合物之溶液或者膠體溶液接觸,進行燒成及/或還原處理而於前述支撐體之中孔洞內形成含貴金屬、貴金屬的氧化物、及貴金屬與過渡金屬之合金之至少一種的平均粒徑為1nm以上10nm以下的氧化觸媒粒子而得;前述具有中孔洞之支撐體,係乾燥及燒成(firing)前驅體溶液而得,該前驅體溶液含有:烷氧基矽烷或金屬烷氧化物(alkoxide)之加水分解物,以及聚氧乙烯烷基醚、聚環氧烷三嵌段共聚物(polyalkylene oxide tri-block copolymer)或者陽離子界面活性劑。 A mesoporous contact medium, which is characterized by contacting a support with mesopores with a solution or colloidal solution of at least one compound corresponding to noble metals, noble metal oxides, and alloys of noble metals and transition metals to perform burning Formation and/or reduction treatment to form oxidation catalyst particles containing at least one of precious metals, precious metal oxides, and alloys of precious metals and transition metals in the pores of the aforementioned support, and having an average particle diameter of 1 nm or more and 10 nm or less ; The aforementioned support with mesopores is obtained by drying and firing a precursor solution, the precursor solution containing: alkoxysilane or metal alkoxide (alkoxide) hydrolyzed product, and polyoxyethylene Alkyl ether, polyalkylene oxide tri-block copolymer or cationic surfactant. 如申請專利範圍第1或2項之中孔洞觸媒體,其中 前述支撐體係由金屬氧化物或SiO2形成。 For example, the hole contact media in item 1 or 2 of the scope of patent application, wherein the aforementioned support system is formed of metal oxide or SiO 2 . 如申請專利範圍第3項之中孔洞觸媒體,其中前述金屬氧化物係由TiO2、Fe2O3、ZrO2、及CeO2構成的群所選擇之1種或2種以上之化合物。 For example, the hole contact medium in item 3 of the scope of patent application, wherein the aforementioned metal oxide is one or more compounds selected from the group consisting of TiO 2 , Fe 2 O 3 , ZrO 2 , and CeO 2. 如申請專利範圍第1或2項之中孔洞觸媒體,其中前述貴金屬為金、鉑及鈀構成的群所選擇之1種或2種以上。 For example, the porous touch media in item 1 or 2 of the scope of patent application, wherein the aforementioned noble metal is one or more selected from the group consisting of gold, platinum and palladium. 如申請專利範圍第1或2項之中孔洞觸媒體,其中前述支撐體為粉體。 For example, the hole contact media in item 1 or 2 of the scope of patent application, wherein the aforementioned support is powder. 如申請專利範圍第1或2項之中孔洞觸媒體,其中前述中孔洞以BET法測定之平均孔徑為2nm以上10nm以下。 For example, the pore touch media in item 1 or 2 of the scope of patent application, wherein the average pore diameter of the aforementioned mesopores measured by the BET method is 2nm or more and 10nm or less. 如申請專利範圍第1或2項之中孔洞觸媒體,其中前述氧化觸媒粒子之擔持量為對含該氧化觸媒粒子之支撐體為0.1~30質量百分比。 For example, the porous contact media in item 1 or 2 of the scope of patent application, wherein the supporting amount of the aforementioned oxidation catalyst particles is 0.1-30 mass percent to the support containing the oxidation catalyst particles. 如申請專利範圍第1或2項之中孔洞觸媒體,其中前述中孔洞觸媒體為氣體之氧化反應用觸媒。 For example, the hole contact medium in item 1 or 2 of the scope of patent application, wherein the aforementioned medium hole contact medium is a catalyst for the oxidation reaction of gas. 一種氣體處理裝置,其特徵為:至少具備第1電極、第2電極、被配置於前述第1電極與前述第2電極之間的介電質;具備:藉由對前述第1電極與前述第2電極之間施加電壓使產生放電而產生電漿之電漿產生部、被形成於藉由前述電漿產生部產生的前述電漿存在的區域之被處理氣體流通之流道、以及被配置於前述流道之申請專利範圍第1至9項之任一項所記載之中孔洞觸媒體。 A gas processing device is characterized by: at least a first electrode, a second electrode, and a dielectric material arranged between the first electrode and the second electrode; The plasma generating part that generates plasma by applying a voltage between the electrodes to generate a discharge, a flow channel through which the gas to be processed flows formed in the region where the plasma generated by the plasma generating part exists, and is arranged in The hole in any one of items 1 to 9 of the aforementioned flow channel’s patent application scope touches the medium. 一種中孔洞觸媒體之製造方法,其特徵為使具有中孔洞之支撐體,與對應於貴金屬、貴金屬的氧化物、及貴金屬與過渡金屬之合金之至少一種的化合物之溶液或者膠體溶液接觸,進行燒成及/或還原處理而於前述支撐體之中孔洞內形成含貴金屬、貴金屬的氧化物、及貴金屬與過渡金屬之合金之至少一種的平均粒徑為1nm以上10nm以下的氧化觸媒粒子;前述具有中孔洞之支撐體,係乾燥及燒成(firing)前驅體溶液而得,該前驅體溶液含有:烷氧基矽烷或金屬烷氧化物(alkoxide)之加水分解物,以及聚氧乙烯烷基醚、聚環氧烷三嵌段共聚物(polyalkylene oxide tri-block copolymer)或者陽離子界面活性劑。 A method for manufacturing a mesoporous contact medium, which is characterized in that a support body with mesopores is brought into contact with a solution or colloidal solution of at least one compound corresponding to noble metals, noble metal oxides, and alloys of noble metals and transition metals. Sintering and/or reduction treatment to form oxidation catalyst particles containing at least one of noble metals, noble metal oxides, and alloys of noble metals and transition metals in the pores of the aforementioned support, with an average particle size of 1 nm to 10 nm; The aforementioned support with mesopores is obtained by drying and firing a precursor solution, which contains the hydrolyzed product of alkoxysilane or metal alkoxide, and polyoxyethylene Base ether, polyalkylene oxide tri-block copolymer or cationic surfactant.
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