TWI737571B - Method of manufacturing high specific volume positive and negative electrode films for capacitors - Google Patents
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本發明係有關於一種電容器之高比容正負極薄膜製造方法,尤其是指一種利用負極薄膜與正極薄膜具有高比容值,使得由負極薄膜與正極薄膜所製作出之電容器,在其整體使用過程中能具有極佳的使用便利性,而在其整體施行使用上更增實用功效特性者。The present invention relates to a method for manufacturing a high-capacity positive and negative film for a capacitor, in particular to a method that uses the negative film and the positive film to have a high specific capacitance value, so that the capacitor made from the negative film and the positive film is used in its entirety. The process can have excellent convenience in use, and it has more practical functional characteristics in its overall implementation and use.
按,於各式積體電路上常能見到電容器[capacitor]之設置,該類電容器係將電能儲存在電場中的被動電子元件,電容器常用在電子電路中,阻隔直流電,讓交流電可以流過電容器;在類比濾波電路中,電容器可以使電源供應的輸出變平滑;在PC電路中電容器和電感器可以調諧無線電到特定的頻率;在輸電系統中可以穩定電壓及功率的流動。Press, capacitor [capacitor] can often be seen on various integrated circuits. This type of capacitor is a passive electronic component that stores electrical energy in an electric field. Capacitors are commonly used in electronic circuits to block direct current and allow alternating current to flow through the capacitor. ; In the analog filter circuit, the capacitor can smooth the output of the power supply; in the PC circuit, the capacitor and inductor can tune the radio to a specific frequency; in the power transmission system, the flow of voltage and power can be stabilized.
其中,就一般常見之電容的導電端腳而言,其主要係於電容底端連接設置有兩導電端腳,且將兩該導電端腳向外直接進行壓扁折彎,以方便後續作業流程使用;然而,上述電容之導電端腳雖可達到在電路上與其他電子元件連接導通之預期功效,但也在其實際施行操作使用上發現,該類導電端腳皆僅係為一般金屬材質製作,造成該類導電端腳之比容值偏低,導致其在使用過程中不具便利性,致令其在整體結構設計上仍存在有改進之空間。Among them, as far as the conductive terminal pins of a common capacitor are concerned, it is mainly connected with two conductive terminal pins at the bottom of the capacitor, and the two conductive terminal pins are directly flattened and bent outwards to facilitate the subsequent operation process Use; However, although the conductive terminals of the above-mentioned capacitors can achieve the expected effect of connecting with other electronic components on the circuit, it is also found in the actual operation and use that this type of conductive terminals are only made of general metal materials , Resulting in the low specific capacitance value of this type of conductive terminal foot, resulting in its inconvenience in the use process, so that there is still room for improvement in the overall structure design.
緣是,發明人有鑑於此,秉持多年該相關行業之豐富設計開發及實際製作經驗,針對現有之缺失予以研究改良,提供一種電容器之高比容正負極薄膜製造方法,以期達到更佳實用價值性之目的者。The reason is that, in view of this, the inventor upholds many years of rich experience in design, development and actual production in the related industry, researches and improves the existing shortcomings, and provides a method for manufacturing capacitors with high specific capacitance positive and negative films in order to achieve better practical value. The purpose of sex.
本發明之主要目的在於提供一種電容器之高比容正負極薄膜製造方法,其主要係利用負極薄膜與正極薄膜具有高比容值,使得由負極薄膜與正極薄膜所製作出之電容器,在其整體使用過程中能具有極佳的使用便利性,而在其整體施行使用上更增實用功效特性者。The main purpose of the present invention is to provide a method for manufacturing a high-capacity positive and negative film for capacitors, which mainly utilizes the high specific capacitance of the negative film and the positive It can have excellent convenience during use, and it has more practical function characteristics in its overall implementation and use.
本發明電容器之高比容正負極薄膜製造方法之主要目的與功效,係由以下具體技術手段所達成:The main purpose and effect of the manufacturing method of the high-capacity positive and negative film of the capacitor of the present invention are achieved by the following specific technical means:
其主要係包括有下列步驟:The main system includes the following steps:
A.製作負極薄膜:對負極鋁箔在真空室內施以濺鍍沉積,並控制功率密度與溫度,使其在負極鋁箔表面形成第一層為鈦[Ti]之負極金屬層,該負極金屬層厚度為10nm~100nm,並繼續以鈦[Ti]與氮[N]作化合沉積,同時控制各種製造參數,使鈦[Ti]與氮[N]於該負極金屬層表面形成負極晶柱狀結構沉積,控制該負極晶柱狀結構為Ti xN y,其x y,且x>y時,x-y至多等於15%y; A. Making the negative electrode film: Sputtering the negative electrode aluminum foil in a vacuum chamber, and controlling the power density and temperature, so that the first layer of titanium [Ti] is formed on the surface of the negative electrode aluminum foil. The thickness of the negative electrode metal layer 10nm~100nm, and continue to use titanium [Ti] and nitrogen [N] for compound deposition, while controlling various manufacturing parameters, so that titanium [Ti] and nitrogen [N] form a negative electrode crystal columnar structure deposition on the surface of the negative electrode metal layer , The columnar structure of the negative electrode crystal is controlled to be Ti x N y , and its x y, and x>y, xy is at most 15% y;
B.製作正極薄膜:對正極鋁箔在真空室內施以濺鍍沉積,並控制功率密度與溫度,使其在正極鋁箔表面形成第一層為鈦[Ti]之正極金屬層,該正極金屬層厚度為10nm~1000nm,並繼續以鈦[Ti]、氧[O]與氮[N]作化合沉積,同時控制各種製造參數,使鈦[Ti]、氧[O]與氮[N]於該正極金屬層表面形成正極晶柱狀結構沉積,控制該正極晶柱狀結構為Ti xO 2-yN y,其x 1、0 y 0.3; B. Making the positive electrode film: Sputtering and depositing the positive electrode aluminum foil in a vacuum chamber, and controlling the power density and temperature, so that the first layer of the positive electrode metal layer of titanium [Ti] is formed on the surface of the positive electrode aluminum foil, the thickness of the positive electrode metal layer 10nm~1000nm, and continue to use titanium [Ti], oxygen [O] and nitrogen [N] for compound deposition, while controlling various manufacturing parameters to make titanium [Ti], oxygen [O] and nitrogen [N] on the positive electrode The positive electrode crystal columnar structure is deposited on the surface of the metal layer, and the positive electrode crystal columnar structure is controlled to be Ti x O 2-y N y , whose x 1, 0 y 0.3;
C.製作電容器:再將該負極薄膜與該正極薄膜用於電容器之製作,使得該負極薄膜與該正極薄膜成為該電容器的正、負極使用。C. Making a capacitor: Use the negative electrode film and the positive electrode film to make a capacitor, so that the negative electrode film and the positive electrode film become the positive and negative electrodes of the capacitor.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於A步驟中係以磁控濺鍍、多弧磁控混搭式設備任一種對高純度、高潔淨之負極鋁箔在真空室內施以濺鍍沉積。A preferred embodiment of the method for manufacturing the high-capacity positive and negative film of the capacitor of the present invention, wherein in step A, any one of magnetron sputtering or multi-arc magnetron hybrid equipment is used to apply high-purity, high-cleanliness to the negative aluminum foil. Sputter deposition is applied in the vacuum chamber.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於A步驟中該負極金屬層厚度為30nm~50nm。In a preferred embodiment of the method for manufacturing a high-capacity positive and negative electrode film for a capacitor of the present invention, in step A, the thickness of the negative electrode metal layer is 30 nm-50 nm.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於A步驟中該負極晶柱狀結構為Ti xN y,x:y=1。 In a preferred embodiment of the method for manufacturing a high-capacity positive and negative electrode film for a capacitor of the present invention, in step A, the negative electrode crystal columnar structure is Ti x N y , x:y=1.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於B步驟中係以磁控濺鍍、多弧磁控混搭式設備任一種對高純度、高潔淨之正極鋁箔在真空室內施以濺鍍沉積。A preferred embodiment of the method for manufacturing the high-capacity positive and negative electrode film of the capacitor of the present invention, wherein in step B, any one of magnetron sputtering or multi-arc magnetron hybrid equipment is used to apply high-purity, high-cleanliness to the positive aluminum foil. Sputter deposition is applied in the vacuum chamber.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於B步驟中該正極金屬層厚度規格為依電壓要求每伏特1.4nm厚度的乘積製造。In a preferred embodiment of the method for manufacturing a high-capacity positive and negative electrode film for a capacitor of the present invention, the thickness specification of the positive electrode metal layer in step B is the product of the thickness of 1.4 nm per volt according to the voltage requirement.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於B步驟中完成濺鍍沉積後,取出至高溫高真空退火爐施予退火,其真空度至少為10 -3Mpa,最高溫度為550℃,退火時間至少8小時,自然降溫至室溫後取出。 A preferred embodiment of the method for manufacturing a high-capacity positive and negative electrode film for a capacitor of the present invention, wherein after the sputtering deposition is completed in step B, it is taken out to a high-temperature and high-vacuum annealing furnace for annealing, and the vacuum degree is at least 10 -3 Mpa , The highest temperature is 550℃, the annealing time is at least 8 hours, and the temperature is naturally cooled to room temperature before taking it out.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於B步驟中完成濺鍍沉積後,取出至高溫高真空退火爐施予退火,其真空度至少為10 -3Mpa,最高溫度為550℃,退火時間至少8小時,自然降溫至100℃以下後取出。 A preferred embodiment of the method for manufacturing a high-capacity positive and negative electrode film for a capacitor of the present invention, wherein after the sputtering deposition is completed in step B, it is taken out to a high-temperature and high-vacuum annealing furnace for annealing, and the vacuum degree is at least 10 -3 Mpa , The highest temperature is 550℃, the annealing time is at least 8 hours, and the temperature is naturally cooled to below 100℃ and then taken out.
本發明電容器之高比容正負極薄膜製造方法的較佳實施例,其中,於B步驟中該正極薄膜為連續帶狀式製造,依所需要尺寸作裁切,並施予再化成與電化學修復。A preferred embodiment of the method for manufacturing a high-capacity positive and negative electrode film for a capacitor of the present invention, wherein in step B, the positive electrode film is manufactured in a continuous strip form, cut according to the required size, and subjected to re-formation and electrochemical repair.
為令本發明所運用之技術內容、發明目的及其達成之功效有更完整且清楚的揭露,茲於下詳細說明之,並請一併參閱所揭之圖式及圖號:In order to make the technical content, the purpose of the invention and the effects achieved by the present invention more complete and clear, the following detailed descriptions are given, and please refer to the disclosed drawings and figure numbers together:
首先,請參閱第一圖本發明之製作流程示意圖所示,本發明主要係包括有下列步驟:First of all, please refer to the first figure shown in the schematic diagram of the production process of the present invention. The present invention mainly includes the following steps:
A.製作負極薄膜(1):請再一併參閱第二圖本發明之負極薄膜成形動作示意圖所示,運用磁控濺鍍或多弧磁控混搭式設備對高純度、高潔淨之負極鋁箔(11)在真空室內施以濺鍍沉積,並控制功率密度與溫度,使其在負極鋁箔(11)表面形成第一層為鈦[Ti]之負極金屬層(12),該負極金屬層(12)厚度為10nm~100nm,最佳厚度為30nm~50nm,並繼續以鈦[Ti]與氮[N]作化合沉積,同時控制各種製造參數,使鈦[Ti]與氮[N]於該負極金屬層(12)表面形成負極晶柱狀結構(13)沉積,控制該負極晶柱狀結構(13)為Ti xN y,其x y,且x>y時,x-y至多等於15%y,即x大於y至多為x=1.15y,最佳為x:y=1。 A. Making the negative electrode film (1): Please refer to the second figure as shown in the schematic diagram of the negative electrode film forming operation of the present invention. Use magnetron sputtering or multi-arc magnetron hybrid equipment to apply high purity and high cleanness to the negative electrode aluminum foil. (11) Apply sputtering deposition in the vacuum chamber, and control the power density and temperature, so that the first layer of titanium [Ti] is formed on the surface of the anode aluminum foil (11), the anode metal layer (12), the anode metal layer ( 12) The thickness is 10nm~100nm, the best thickness is 30nm~50nm, and continue to use titanium [Ti] and nitrogen [N] as compound deposition, while controlling various manufacturing parameters, make titanium [Ti] and nitrogen [N] in the The anode crystal columnar structure (13) is deposited on the surface of the anode metal layer (12), and the anode crystal columnar structure (13) is controlled to be Ti x N y , whose x y, and x>y, xy is at most equal to 15% y, that is, x is greater than y at most x=1.15y, and the best is x:y=1.
B.製作正極薄膜(2):請再一併參閱第三圖本發明之正極薄膜成形動作示意圖所示,運用磁控濺鍍或多弧磁控混搭式設備對高純度、高潔淨之正極鋁箔(21)在真空室內施以濺鍍沉積,並控制功率密度與溫度,使其在正極鋁箔(21)表面形成第一層為鈦[Ti]之正極金屬層(22),該正極金屬層(22)厚度為10nm~1000nm,最佳厚度規格為依電壓要求每伏特1.4nm厚度的乘積製造,如100V為140nm厚度、200V則為280nm厚度,並繼續以鈦[Ti]、氧[O]與氮[N]作化合沉積,同時控制各種製造參數,使鈦[Ti]、氧[O]與氮[N]於該正極金屬層(22)表面形成正極晶柱狀結構(23)沉積,控制該正極晶柱狀結構(23)為Ti xO 2-yN y,其x 1、0 y 0.3,完成濺鍍沉積後,取出至高溫高真空退火爐施予退火,其真空度至少為10 -3Mpa,最高溫度為550℃,退火時間至少8小時,自然降溫至室溫或100℃以下後取出,該正極薄膜(2)可為連續帶狀式製造,依所需要尺寸作裁切,並施予再化成與電化學修復。 B. Making the positive electrode film (2): Please refer to the third figure together as shown in the schematic diagram of the positive electrode film forming operation of the present invention, using magnetron sputtering or multi-arc magnetron hybrid equipment to apply high purity and high clean anode aluminum foil (21) Apply sputtering deposition in a vacuum chamber, and control the power density and temperature, so that the first layer of titanium [Ti] is formed on the surface of the anode aluminum foil (21). The anode metal layer ( 22) The thickness is 10nm~1000nm, and the best thickness specification is the product of 1.4nm thickness per volt required by the voltage. For example, 100V is 140nm thickness, 200V is 280nm thickness, and continue to use titanium [Ti], oxygen [O] and Nitrogen [N] is used for compound deposition, and various manufacturing parameters are controlled at the same time, so that titanium [Ti], oxygen [O] and nitrogen [N] are deposited on the surface of the cathode metal layer (22) to form a cathode crystal columnar structure (23), and control The anode crystal columnar structure (23) is Ti x O 2-y N y , its x 1, 0 y 0.3. After the sputtering deposition is completed, take it out to the high temperature and high vacuum annealing furnace for annealing, the vacuum degree is at least 10 -3 Mpa, the maximum temperature is 550℃, the annealing time is at least 8 hours, and the temperature is naturally cooled to room temperature or below 100℃ After being taken out, the positive electrode film (2) can be manufactured in a continuous strip form, cut according to the required size, and subjected to re-formation and electrochemical repair.
C.製作電容器:再將該負極薄膜(1)與該正極薄膜(2)用於電容器之製作,使得該負極薄膜(1)與該正極薄膜(2)成為該電容器的正、負極使用。C. Making a capacitor: Then the negative film (1) and the positive film (2) are used to make a capacitor, so that the negative film (1) and the positive film (2) become the positive and negative electrodes of the capacitor.
如此一來,使得由該負極薄膜(1)與該正極薄膜(2)所製作出之該電容器,即可利用該負極薄膜(1)與該正極薄膜(2)皆具有高比容值,而可具有極佳的使用便利性。In this way, the capacitor made from the negative electrode film (1) and the positive electrode film (2) can be used to have high specific capacitance values for both the negative electrode film (1) and the positive electrode film (2), and Can have excellent ease of use.
藉由以上所述,本發明之使用實施說明可知,本發明與現有技術手段相較之下,本發明主要係利用負極薄膜與正極薄膜具有高比容值,使得由負極薄膜與正極薄膜所製作出之電容器,在其整體使用過程中能具有極佳的使用便利性,而在其整體施行使用上更增實用功效特性者。Based on the above, the description of the application of the present invention shows that, compared with the prior art, the present invention mainly utilizes the high specific capacitance value of the negative electrode film and the positive electrode film, so that the negative electrode film and the positive electrode film are made of The capacitor out of it can have excellent convenience in its overall use, and it can be more practical and functional in its overall implementation.
然而前述之實施例或圖式並非限定本發明之產品結構或使用方式,任何所屬技術領域中具有通常知識者之適當變化或修飾,皆應視為不脫離本發明之專利範疇。However, the foregoing embodiments or drawings do not limit the product structure or usage mode of the present invention, and any appropriate changes or modifications by persons with ordinary knowledge in the relevant technical field should be regarded as not departing from the patent scope of the present invention.
綜上所述,本發明實施例確能達到所預期之使用功效,又其所揭露之具體構造,不僅未曾見諸於同類產品中,亦未曾公開於申請前,誠已完全符合專利法之規定與要求,爰依法提出發明專利之申請,懇請惠予審查,並賜准專利,則實感德便。In summary, the embodiments of the present invention can indeed achieve the expected use effect, and the specific structure disclosed by it has not been seen in similar products, nor has it been disclosed before the application, since it has fully complied with the provisions of the patent law. In accordance with the requirements, Yan filed an application for a patent for invention in accordance with the law, and asked for favors for examination and granted a patent.
1:負極薄膜1: Anode film
11:負極鋁箔11: Negative aluminum foil
12:負極金屬層12: Anode metal layer
13:負極晶柱狀結構13: Negative crystal columnar structure
2:正極薄膜2: Cathode film
21:正極鋁箔21: positive aluminum foil
22:正極金屬層22: positive metal layer
23:正極晶柱狀結構23: Anode crystal columnar structure
第一圖:本發明之製作流程示意圖Figure 1: Schematic diagram of the production process of the present invention
第二圖:本發明之負極薄膜成形動作示意圖Figure 2: Schematic diagram of the forming action of the negative electrode film of the present invention
第三圖:本發明之正極薄膜成形動作示意圖Figure 3: Schematic diagram of the forming action of the positive electrode film of the present invention
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