TWI732548B - Package structure - Google Patents

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TWI732548B
TWI732548B TW109115776A TW109115776A TWI732548B TW I732548 B TWI732548 B TW I732548B TW 109115776 A TW109115776 A TW 109115776A TW 109115776 A TW109115776 A TW 109115776A TW I732548 B TWI732548 B TW I732548B
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circuit board
printed circuit
package
solder balls
chip
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TW109115776A
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TW202143399A (en
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林敏龍
廖鄭雄
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宇瞻科技股份有限公司
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Abstract

A package structure is provided. The package structure includes a ball grid array (BGA) package, a printed circuit board (PCB), and an epoxy layer between the BGA package and the PCB. The PCB has at least an injection hole penetrating the PCB. Hence, an epoxy underfill can be injected into the space between the central region of the BGA package and the PCB through the injection hole and fill therein.

Description

封裝結構Package structure

本發明涉及一種封裝結構,特別是環氧樹脂層位於一種封裝結構之晶片和印刷電路板的空間內。The invention relates to a packaging structure, in particular an epoxy resin layer is located in the space between a chip of the packaging structure and a printed circuit board.

由於半導體晶片封裝的密度逐漸增加的趨勢,已發展出細間距球柵陣列(FBGA)封裝,以允許減少半導體封裝輪廓並提供增加的封裝密度。一般而言,FBGA封裝包含具有導線架的半導體晶粒,且導線架安裝於印刷電路板(PCB)之頂面。半導體晶粒具有複數個接合墊來電性連接導線架。此外,接合引線係用來連接在半導體晶粒上之該些接合墊以及導線架上的導電墊。導電元件,例如銲球,其係接合至PCB上的導電線路。半導體晶粒、導線架和接合引線係以一封裝膠體進行封裝。Due to the trend toward increasing density of semiconductor chip packaging, fine pitch ball grid array (FBGA) packages have been developed to allow reduction of semiconductor package outlines and provide increased packaging density. Generally speaking, the FBGA package includes a semiconductor die with a lead frame, and the lead frame is mounted on the top surface of a printed circuit board (PCB). The semiconductor die has a plurality of bonding pads to electrically connect the lead frame. In addition, bonding wires are used to connect the bonding pads on the semiconductor die and the conductive pads on the lead frame. Conductive elements, such as solder balls, are connected to conductive lines on the PCB. The semiconductor die, lead frame and bonding wire are packaged with a packaging compound.

PCB製造商係使用焊球陣列封裝 (Ball Grid Array,BGA)和其他高密度陣列封裝來減少特定產品所需要的電路板空間。為了減少電路板空間,PCB製造商已使用更小節距的銲球間距,亦即銲球行與銲球列之間的間距。為了使用這些更小的間距,PCB製造商更需要使用昂貴的技術來製造PCB。PCB manufacturers use Ball Grid Array (BGA) and other high-density array packages to reduce the board space required for specific products. In order to reduce the space on the circuit board, PCB manufacturers have used a smaller pitch of the solder ball pitch, that is, the pitch between the solder ball row and the solder ball column. In order to use these smaller pitches, PCB manufacturers need to use expensive technology to manufacture PCBs.

而當PCB製造商已使用更小間距的銲球間距時,所產生的高熱必須移除。目前業界常見散熱方式是透過金屬散熱器、熱管散熱器、風扇、石墨稀貼片、金屬片和導熱墊等方式將熱導出到外部金屬和導熱介質、或是讓空氣對流方式散熱。然而,這些散熱方式的散熱效果仍然不佳。When PCB manufacturers have used smaller pitches between solder balls, the high heat generated must be removed. At present, the common heat dissipation method in the industry is to conduct heat to external metal and heat conduction media through metal radiators, heat pipe radiators, fans, graphene patches, metal sheets, and thermal pads, or let air convection heat dissipation. However, the heat dissipation effect of these heat dissipation methods is still poor.

本發明之主要目的係在提供一種封裝結構,能在位於BGA背面之PCB上新增一個或數個以上的注射孔,讓自動點膠機注射頭可以由注射孔將環氧樹脂注入到靠近BGA中心與PCB之間的空間內,並進而向外擴散後,讓環氧樹脂更容易將BGA和PCB之間的空間填滿。The main purpose of the present invention is to provide a package structure that can add one or more injection holes on the PCB on the back of the BGA, so that the injection head of the automatic dispenser can inject epoxy resin from the injection hole to the vicinity of the BGA. In the space between the center and the PCB, and then spread out, it is easier for the epoxy resin to fill the space between the BGA and the PCB.

另外,在PCB打件時,若有PCB正反兩面都要接上BGA,則可設計讓兩個BGA錯位放置,並在PCB上預留所需的注射孔,以利環氧樹脂膠的填充。此方式可便利加工作業,也可讓位於正反面的BGA因工作所產生的熱能可以彼此隔絕,不會互相影響。In addition, when the PCB is printed, if the front and back sides of the PCB must be connected to the BGA, the two BGAs can be designed to be placed in a staggered position, and the required injection holes are reserved on the PCB to facilitate the filling of the epoxy resin. . This method can facilitate the processing operation, and also allows the heat generated by the work on the front and back of the BGA to be isolated from each other without affecting each other.

鑑於上述,提供一種封裝結構,其包括第一封裝模組、印刷電路板和第一隔熱層。該第一封裝模組包括第一晶片以及位於該第一晶片之下的複數個第一導電銲球。該印刷電路板包括位於該印刷電路板的第一面上之複數個第一接腳,用以分別電性連接該些第一導電銲球。該第一隔熱層係填滿於該第一晶片和該印刷電路板之間的空間內,其中該第一隔熱層係包含一環氧樹脂。In view of the above, a packaging structure is provided, which includes a first packaging module, a printed circuit board, and a first heat insulation layer. The first package module includes a first chip and a plurality of first conductive solder balls under the first chip. The printed circuit board includes a plurality of first pins on the first surface of the printed circuit board for electrically connecting the first conductive solder balls respectively. The first heat insulation layer is filled in the space between the first chip and the printed circuit board, wherein the first heat insulation layer includes an epoxy resin.

依據一實施例,其中該第一封裝模組可為球柵陣列封裝 (Ball-grid arrays; BGA)。According to an embodiment, the first package module may be a ball grid array package (Ball-grid arrays; BGA).

依據另一實施例,該印刷電路板更包含至少一第一注射孔,其中該至少一第一注射孔係貫穿該印刷電路板,且該至少一第一注射孔通往部分的相鄰之該些第一導電銲球之間。According to another embodiment, the printed circuit board further includes at least one first injection hole, wherein the at least one first injection hole penetrates the printed circuit board, and the at least one first injection hole leads to a portion of the adjacent one Between these first conductive solder balls.

依據又一實施例,其中每一該些第一導電銲球的間隔寬度為固定。According to another embodiment, the interval width of each of the first conductive solder balls is fixed.

依據另一實施例,更包括第二封裝模組以及第二隔熱層。該第二封裝模組包括第二晶片以及位於該第二晶片之下的複數個第二導電銲球。而且,該印刷電路板還包括位於該印刷電路板的第二面上之複數個第二接腳,用以分別電性連接該些第二導電銲球。該第二隔熱層係填滿於該第二晶片和該印刷電路板之間的空間,其中該第二隔熱層係包含該環氧樹脂。According to another embodiment, it further includes a second packaging module and a second heat insulation layer. The second package module includes a second chip and a plurality of second conductive solder balls under the second chip. Moreover, the printed circuit board further includes a plurality of second pins on the second surface of the printed circuit board for electrically connecting the second conductive solder balls respectively. The second heat insulation layer fills the space between the second chip and the printed circuit board, wherein the second heat insulation layer contains the epoxy resin.

依據另一實施例,其中該第二封裝模組可為球柵陣列封裝。According to another embodiment, the second package module may be a ball grid array package.

依據又一實施例,其中該印刷電路板更包括至少一第二注射孔,其中該至少一第二注射孔係貫穿該印刷電路板,且該至少一第二注射孔通往部分的相鄰之該些第二導電銲球之間According to another embodiment, the printed circuit board further includes at least one second injection hole, wherein the at least one second injection hole penetrates the printed circuit board, and the at least one second injection hole leads to a portion of the adjacent Between the second conductive solder balls

依據另一實施例,其中每一該些第二導電銲球的間隔寬度為固定。According to another embodiment, the interval width of each of the second conductive solder balls is fixed.

配合所附之圖式詳細說明本發明之實施例,該些圖式均為簡化之示意圖,僅以示意之結構或方法來說明本發明有關之元件與組合關係。因此,圖中所顯示之元件並非以實際實施之數量、形狀、尺寸做等比例繪製,某些尺寸比例與其他相關尺寸比例或以誇張或是簡化處理,以提供更清楚的描述。實際實施之數量、形狀或尺寸比例可以為選擇性之設計與配置,詳細之元件佈局可能更為複雜。The embodiments of the present invention are described in detail with the accompanying drawings. The drawings are simplified schematic diagrams, and only schematic structures or methods are used to illustrate the related elements and combinations of the present invention. Therefore, the elements shown in the figure are not drawn in proportion to the actual number, shape, and size of the actual implementation. Some size proportions and other related size proportions are exaggerated or simplified to provide a clearer description. The actual number, shape, or size ratio of the actual implementation can be optional design and configuration, and the detailed component layout may be more complicated.

圖2所繪為依據本發明一實施例之一種封裝結構之操作架構示意圖。在第2圖中,封裝結構100包括第一封裝模組120a、印刷電路板110和第一環氧樹脂層130a。該第一封裝模組120a包括第一晶片122a以及位於該第一晶片122a之下的複數個第一導電銲球124a。該印刷電路板110包括位於該印刷電路板的第一面110a上之複數個第一接腳112a和貫穿該印刷電路板110的至少一第一注射孔124a。該些第一接腳112a用以分別電性連接該些第一導電銲球124a,該至少一第一注射孔114a通往部分的相鄰之該些第一導電銲球124a之間。該第一環氧樹脂層130a,位於該第一晶片120a和該印刷電路板110之間以及部分之該至少一第一注射孔114a之內。該第一環氧樹脂層130a係使用第一注射器150a經由該至少一第一注射孔114a,將做為底部填充膠用之環氧樹脂注入到該第一晶片120a和該印刷電路板110之間的縫隙中,將縫隙填滿。FIG. 2 is a schematic diagram of the operation structure of a package structure according to an embodiment of the present invention. In Figure 2, the packaging structure 100 includes a first packaging module 120a, a printed circuit board 110, and a first epoxy resin layer 130a. The first package module 120a includes a first chip 122a and a plurality of first conductive solder balls 124a under the first chip 122a. The printed circuit board 110 includes a plurality of first pins 112 a on the first surface 110 a of the printed circuit board and at least one first injection hole 124 a penetrating the printed circuit board 110. The first pins 112a are used to electrically connect the first conductive solder balls 124a, and the at least one first injection hole 114a leads to a portion of the adjacent first conductive solder balls 124a. The first epoxy resin layer 130a is located between the first chip 120a and the printed circuit board 110 and part of the at least one first injection hole 114a. The first epoxy resin layer 130a uses a first syringe 150a to inject epoxy resin used as an underfill between the first chip 120a and the printed circuit board 110 through the at least one first injection hole 114a Fill the gap in the gap.

圖2所繪為依據本發明另一實施例之一種封裝結構之操作架構示意圖。在第2圖中,除了如圖1所示的封裝結構100的元件之外,封裝結構200還包括第二封裝模組120b,其包括第二晶片122b以及位於該第二晶片122b之下的複數個第二導電銲球124b。而且,該印刷電路板110還包括位於該印刷電路板110的第二面110b上之複數個第二接腳112b和貫穿該印刷電路板110的至少一第二注射孔114b。該些第二接腳112b用以分別電性連接該些第二導電銲球124b,該至少一第二注射孔114b通往部分的相鄰之該些第二導電銲球124b之間。該第二環氧樹脂層130b,位於該第二晶片122b和該印刷電路板110之間以及該至少一第二注射孔114b之內。該第二環氧樹脂層130b係使用第二注射器150b經由該至少一第二注射孔114b,將做為底部填充膠用之環氧樹脂注入到該第二晶片120b和該印刷電路板110之間的縫隙中,將縫隙填滿。FIG. 2 is a schematic diagram of the operation architecture of a package structure according to another embodiment of the present invention. In Figure 2, in addition to the components of the package structure 100 shown in FIG. 1, the package structure 200 also includes a second package module 120b, which includes a second chip 122b and a plurality of components located under the second chip 122b. A second conductive solder ball 124b. Moreover, the printed circuit board 110 further includes a plurality of second pins 112b on the second surface 110b of the printed circuit board 110 and at least one second injection hole 114b penetrating the printed circuit board 110. The second pins 112b are used for electrically connecting the second conductive solder balls 124b, and the at least one second injection hole 114b leads to a portion of the adjacent second conductive solder balls 124b. The second epoxy resin layer 130b is located between the second chip 122b and the printed circuit board 110 and within the at least one second injection hole 114b. The second epoxy resin layer 130b uses a second syringe 150b to inject the epoxy resin used as an underfill between the second chip 120b and the printed circuit board 110 through the at least one second injection hole 114b Fill the gap in the gap.

其中,該第一封裝模組120a及該第二封裝模組120b例如可為球柵陣列封裝 (Ball-grid arrays; BGA),如細間距球柵陣列(FBGA)封裝、超細間距球柵陣列(VFBGA)封裝、微球柵陣列(μBGA)封裝或窗口球柵陣列(WBGA)封裝,但不限於此。Wherein, the first package module 120a and the second package module 120b can be, for example, a ball grid array package (Ball-grid arrays; BGA), such as a fine pitch ball grid array (FBGA) package, an ultra-fine pitch ball grid array (VFBGA) package, micro ball grid array (μBGA) package, or window ball grid array (WBGA) package, but not limited to this.

綜合上述所言,本發明利用底部填充膠用之環氧樹脂的特性,在位於BGA背面之PCB上新增一個或數個以上的注射孔,讓自動點膠機注射頭可以由注射孔將環氧樹脂注入到靠近BGA中心與PCB之間的空間內,並進而向外擴散後,讓環氧樹脂更容易將BGA和PCB之間的空間填滿。如此,可改善環氧樹脂之一般常見填充不完全的問題。Based on the above, the present invention uses the characteristics of epoxy resin used for underfill to add one or more injection holes on the PCB on the back of the BGA, so that the injection head of the automatic dispenser can be ringed by the injection hole. Oxygen resin is injected into the space between the center of the BGA and the PCB, and then diffuses outward, making it easier for the epoxy resin to fill the space between the BGA and the PCB. In this way, the common incomplete filling problem of epoxy resin can be improved.

另外,在PCB打件時,若有PCB正反兩面都要接上BGA,則可設計讓兩個BGA錯位放置,並在PCB上預留所需的注射孔,以利環氧樹脂膠的填充。此方式可便利加工作業,也可讓位於正反面的BGA因工作所產生的熱能可以彼此隔絕,不會互相影響。In addition, when the PCB is printed, if the front and back sides of the PCB must be connected to the BGA, the two BGAs can be designed to be placed in a staggered position, and the required injection holes are reserved on the PCB to facilitate the filling of the epoxy resin. . This method can facilitate the processing operation, and also allows the heat generated by the work on the front and back of the BGA to be isolated from each other without affecting each other.

因此,透過上述環氧樹脂的注射填充方式,可阻隔BGA中晶片所產生熱能傳導至並累積在PCB上。因此,可以控制熱能傳導的方向,將熱能用最短的路徑傳導到外部與外界空氣接觸,以避免大量熱能累積在封裝結構中。如下圖4所述,以NP Nano Module 進行相關實驗。Therefore, through the above-mentioned epoxy resin injection filling method, the heat generated by the chip in the BGA can be prevented from being transferred to and accumulated on the PCB. Therefore, the direction of thermal energy conduction can be controlled, and the thermal energy can be conducted to the outside in the shortest path to contact with the outside air, so as to prevent a large amount of thermal energy from accumulating in the package structure. As shown in Figure 4 below, perform related experiments with the NP Nano Module.

接下來,以NP奈米模組(NP Nano Module)進行相關的溫度測試實驗。在此模組中,PCB上有PCIe的插槽,具有SATA介面的μSSD插在PCIe的插槽之中。而測試用的Iometer為一種測量單個系統和群集系統(cluster system)之子系統I/O數據的一套軟體。Next, perform related temperature test experiments with NP Nano Module. In this module, there is a PCIe slot on the PCB, and a μSSD with a SATA interface is inserted in the PCIe slot. The Iometer for testing is a set of software that measures I/O data of a single system and a cluster system's subsystems.

表1:無散熱片設置的NP奈米模組之溫度測試數據。 無散熱片 PCIe uSSD 常溫上昇至30℃ 59℃ 53℃ 30℃靜置15分 56℃ 49℃ 30℃下跑Iometer 15分 86℃ 68℃ 30℃上昇至70℃ 92℃ 83℃ 70℃靜置15分 118℃ 103℃ 70℃下跑Iometer 15分 126℃ 108℃ Table 1: Temperature test data of NP nano modules without heat sink. No heat sink PCIe uSSD Room temperature rises to 30℃ 59°C 53°C Let stand for 15 minutes at 30℃ 56°C 49°C Run Iometer at 30°C for 15 points 86°C 68°C 30°C to 70°C 92°C 83°C Let stand at 70℃ for 15 minutes 118°C 103°C Run Iometer at 70°C for 15 points 126°C 108°C

表2:無散熱片設置但有灌入環氧樹脂的NP奈米模組之溫度測試數據,所使用的環氧樹脂為市面上可購得之環氧樹脂。 灌膠(無散熱片) PCIe uSSD 常溫上昇至30℃ 42℃ 43℃ 30℃靜置15分 40℃ 41℃ 30℃下跑Iometer 15分 57℃ 57℃ 30℃上昇至70℃ 82℃ 82℃ 70℃靜置15分 86℃ 86℃ 70℃下跑Iometer 15分 94℃ 96℃ Table 2: Temperature test data of NP nano modules without heat sink but with epoxy resin. The epoxy resin used is commercially available epoxy resin. Glue (without heat sink) PCIe uSSD Room temperature rises to 30℃ 42°C 43°C Let stand for 15 minutes at 30℃ 40℃ 41℃ Run Iometer at 30°C for 15 points 57°C 57°C 30°C to 70°C 82°C 82°C Let stand at 70℃ for 15 minutes 86°C 86°C Run Iometer at 70°C for 15 points 94°C 96°C

表3:設置不鏽鋼散熱片的NP奈米模組之溫度測試數據。 散熱片(不鏽鋼) PCIe uSSD 常溫上昇至30℃ 50℃ 49℃ 30℃靜置15分 48℃ 48℃ 30℃下跑Iometer 15分 75℃ 76℃ 30℃上昇至70℃ 90℃ 89℃ 70℃靜置15分 104℃ 106℃ 70℃下跑Iometer 15分 105℃ 106℃ Table 3: Temperature test data of NP nano module with stainless steel heat sink. Heat sink (stainless steel) PCIe uSSD Room temperature rises to 30℃ 50℃ 49°C Let stand for 15 minutes at 30℃ 48℃ 48℃ Run Iometer at 30°C for 15 points 75°C 76°C 30°C to 70°C 90°C 89°C Let stand at 70℃ for 15 minutes 104°C 106°C Run Iometer at 70°C for 15 points 105°C 106°C

表4:設置鋁散熱片的NP奈米模組之溫度測試數據。 散熱片(鋁) PCIe uSSD 常溫上昇至30℃ 46℃ 45℃ 30℃靜置15分 45℃ 44℃ 30℃下跑Iomter 15分 68℃ 67℃ 30℃上昇至70℃ 86℃ 86℃ 70℃靜置15分 85℃ 84℃ 70℃下跑Ioemter 15分 94℃ 94℃ Table 4: Temperature test data of NP nano module with aluminum heat sink. Heat sink (aluminum) PCIe uSSD Room temperature rises to 30℃ 46°C 45°C Let stand for 15 minutes at 30℃ 45°C 44°C Run Iomter at 30°C for 15 minutes 68°C 67°C 30°C to 70°C 86°C 86°C Let stand at 70℃ for 15 minutes 85°C 84°C Run Ioemter at 70°C for 15 minutes 94°C 94°C

比較表2-4,可知在環境溫度30℃下,只使用環氧樹脂灌膠的模組,不論是否有跑Iometer程式,其散熱表現比使用不銹鋼散熱片的模組要佳,但比使用鋁散熱片的模組稍差一些。但是當環境溫度上升至70℃下,只使用環氧樹脂灌膠的模組,不論是否有跑Iometer程式,其散熱表現則與使用鋁散熱片的模組旗鼓相當。這結果顯示,使用環氧樹脂灌膠可以有效地達到散熱的功效。Comparing Table 2-4, it can be seen that at an ambient temperature of 30°C, modules that only use epoxy resin encapsulation, regardless of whether they run the Iometer program, have better heat dissipation performance than modules that use stainless steel heat sinks, but are better than aluminum modules. The heat sink module is slightly worse. However, when the ambient temperature rises to 70°C, modules that only use epoxy resin encapsulation, regardless of whether they run the Iometer program, have a heat dissipation performance comparable to that of modules that use aluminum heat sinks. This result shows that the use of epoxy resin potting can effectively achieve the effect of heat dissipation.

100、200:封裝結構 110:印刷電路板 110a:第一面 110b:第二面 112a:第一接腳 112b:第二接腳 114a:第一注射孔 114b:第二注射孔 120a:第一封裝模組 120b:第二封裝模組 122a:第一晶片 122b:第二晶片 124a:第一導電銲球 124b:第二導電銲球 130a:第一環氧樹脂層 130b:第二環氧樹脂層 150a:第一注射器 150b:第二注射器 100, 200: Package structure 110: printed circuit board 110a: First side 110b: Second side 112a: first pin 112b: second pin 114a: The first injection hole 114b: second injection hole 120a: The first package module 120b: second package module 122a: first chip 122b: second chip 124a: The first conductive solder ball 124b: second conductive solder ball 130a: The first epoxy layer 130b: The second epoxy layer 150a: first syringe 150b: second syringe

為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附附圖之說明如下: 圖1所繪為依據本發明一實施例之一種封裝結構之操作架構示意圖。 圖2所繪為依據本發明另一實施例之一種封裝結構之操作架構示意圖。 In order to make the above and other objectives, features, advantages and embodiments of the present invention more comprehensible, the description of the attached drawings is as follows: FIG. 1 is a schematic diagram of the operation architecture of a package structure according to an embodiment of the present invention. FIG. 2 is a schematic diagram of the operation architecture of a package structure according to another embodiment of the present invention.

100、200:封裝結構 100, 200: Package structure

110:印刷電路板 110: printed circuit board

110a:第一面 110a: First side

112a:第一接腳 112a: first pin

114a:第一注射孔 114a: The first injection hole

120a:第一封裝模組 120a: The first package module

122a:第一晶片 122a: first chip

124a:第一導電銲球 124a: The first conductive solder ball

130a:第一環氧樹脂層 130a: The first epoxy layer

150a:第一注射器 150a: first syringe

Claims (7)

一種封裝結構,其包括:一第一封裝模組,包括:一第一晶片;以及複數個第一導電銲球,位於該第一晶片之下;一印刷電路板,該印刷電路板包括:複數個第一接腳,位於該印刷電路板的第一面上,該些第一接腳分別電性連接每一該些第一導電銲球;以及至少一第一注射孔,係貫穿該印刷電路板且該至少一第一注射孔通往部分的相鄰之該些第一導電銲球之間;以及一第一隔熱層,係填滿於該第一晶片和該印刷電路板之間的空間內,其中該第一隔熱層係包含一環氧樹脂。 A packaging structure, comprising: a first packaging module, including: a first chip; and a plurality of first conductive solder balls located under the first chip; a printed circuit board, the printed circuit board including: A first pin located on the first surface of the printed circuit board, the first pins are respectively electrically connected to each of the first conductive solder balls; and at least one first injection hole penetrates the printed circuit Board and the at least one first injection hole leading to a portion between the adjacent first conductive solder balls; and a first heat insulation layer filled in between the first chip and the printed circuit board In the space, the first heat insulation layer contains an epoxy resin. 根據請求項1所述之封裝結構,其中該第一封裝模組包含一球柵陣列封裝。 The package structure according to claim 1, wherein the first package module includes a ball grid array package. 根據請求項1所述之封裝結構,其中每一該些第一導電銲球的間隔寬度為固定。 The package structure according to claim 1, wherein the interval width of each of the first conductive solder balls is fixed. 根據請求項1所述之封裝結構,更包括:一第二封裝模組,包括:一第二晶片;以及複數個第二導電銲球,位於該第二晶片之下;該印刷電路板更包括: 複數個第二接腳,位於該印刷電路板的第二面上,該些第二接腳分別電性連接每一該些第二導電銲球;以及一第二隔熱層,係填滿於該第二晶片和該印刷電路板之間的空間,其中該第二隔熱層係包含該環氧樹脂。 The package structure according to claim 1, further comprising: a second package module, including: a second chip; and a plurality of second conductive solder balls located under the second chip; the printed circuit board further includes : A plurality of second pins are located on the second surface of the printed circuit board, and the second pins are respectively electrically connected to each of the second conductive solder balls; and a second heat insulation layer is filled in In the space between the second chip and the printed circuit board, the second heat insulation layer contains the epoxy resin. 根據請求項4所述之封裝結構,其中該第二封裝模組包含一球柵陣列封裝。 The package structure according to claim 4, wherein the second package module includes a ball grid array package. 根據請求項4所述之封裝結構,其中該印刷電路板更包括至少一第二注射孔,其中該至少一第二注射孔係貫穿該印刷電路板,且該至少一第二注射孔通往部分的相鄰之該些第二導電銲球之間。 The packaging structure according to claim 4, wherein the printed circuit board further includes at least one second injection hole, wherein the at least one second injection hole penetrates the printed circuit board, and the at least one second injection hole leads to a part Between the adjacent second conductive solder balls. 根據請求項4所述之封裝結構,其中每一該些第二導電銲球的間隔寬度為固定。 The package structure according to claim 4, wherein the interval width of each of the second conductive solder balls is fixed.
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