TWI727588B - Photomask table and photoetching system - Google Patents
Photomask table and photoetching system Download PDFInfo
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- TWI727588B TWI727588B TW108148723A TW108148723A TWI727588B TW I727588 B TWI727588 B TW I727588B TW 108148723 A TW108148723 A TW 108148723A TW 108148723 A TW108148723 A TW 108148723A TW I727588 B TWI727588 B TW I727588B
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70758—Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting substrates others than wafers, e.g. chips
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- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
本發明屬於光刻技術領域,揭露一種光罩台及光刻系統,其中光罩台包含:支撐底座;承版台,滑動連接在支撐底座的上端面上;兩組Y向運動機構,設置在支撐底座上,且兩組Y向運動機構分別設置在承版台沿X方向的兩側;X向運動機構,設置在Y向運動機構上且與承版台連接,Y向運動機構帶動X向運動機構沿Y方向運動,Y方向與X方向垂直。光刻系統包含上述光罩台。本發明揭露的光罩台及光刻系統,能夠減小光罩台及光刻系統的體積,降低光罩台及光刻系統的成本。 The present invention belongs to the technical field of lithography and discloses a photomask table and a photoetching system. The photomask table includes: a support base; a plate bearing table, which is slidably connected to the upper end surface of the support base; and two sets of Y-direction motion mechanisms are arranged on On the supporting base, two groups of Y-direction movement mechanisms are respectively arranged on both sides of the plate bearing table in the X direction; the X-direction movement mechanism is arranged on the Y-direction movement mechanism and connected with the plate plate, and the Y-direction movement mechanism drives the X direction The movement mechanism moves along the Y direction, which is perpendicular to the X direction. The lithography system includes the above-mentioned mask stage. The photomask stage and the photoetching system disclosed in the present invention can reduce the volume of the photomask stage and the photoetching system, and reduce the cost of the photomask stage and the photoetching system.
Description
本發明關於光刻技術領域,例如關於一種光罩台機構及光刻系統。 The present invention relates to the field of lithography technology, for example, to a reticle stage mechanism and a lithography system.
光刻系統主要用於積體電路IC或其他微型器件的製造,藉由光刻設備,能夠把具有不同光罩圖案的多層光罩在精確對準下依次成像在塗覆有光刻膠的矽片或基板上,如半導體晶片或LCD板等。光刻系統通常分為步進光刻系統及步進掃描光刻系統,其中,步進掃描光刻系統藉由投影光場的掃描移動成像,在光罩圖像成像過程中,光罩與晶片同時相對於投影系統及投影光束移動。因此,對於步進掃描光刻系統,需要相應的裝置作為光罩版及矽片的載體,藉由裝載有光罩版及矽片的載體之間相對的精確運動來滿足光刻的需要,其中,用於承載光罩版的載體為承版台,用於承載矽片/基板的載體稱為承片台,承版台及承片台分為位於光刻系統的光罩台分系統及工作台分系統中,為各自分系統的核心模組。 The photolithography system is mainly used for the manufacture of integrated circuit ICs or other micro devices. With photolithography equipment, multilayer photomasks with different photomask patterns can be sequentially imaged on silicon coated with photoresist under precise alignment. Chips or substrates, such as semiconductor wafers or LCD panels, etc. The lithography system is usually divided into a step lithography system and a step and scan lithography system. Among them, the step and scan lithography system uses the scanning movement of the projection light field to image. In the process of imaging the reticle image, the reticle and the wafer At the same time, it moves relative to the projection system and the projection beam. Therefore, for a step-and-scan lithography system, a corresponding device is required as the carrier of the mask plate and the silicon wafer, and the needs of lithography can be met by the relative precise movement between the carrier loaded with the mask plate and the silicon wafer. , The carrier used to carry the mask plate is the plate table, and the carrier used to carry the silicon wafer/substrate is called the plate table. The plate table and the plate table are divided into the mask table sub-system and work in the lithography system In each sub-system, it is the core module of each sub-system.
由於光刻系統運行過程中,承版台要進行掃描方向的大行程運動及各向的微調運動,以滿足承版台的高速高精度運動要求,因此,相關技術中的光罩台系統通常採用粗一精動疊層的驅動結構。圖1為相關
技術提供的光罩台系統的結構示意圖,如圖1所示,相關技術提供的光罩台系統由粗動台150及疊加在上面的精動台140組成。其中,粗動台150採用左直線電機130及右直線電機120及導軌160組成高速大行程的雙邊驅動系統;精動台140則由X方向音圈電機170及Y方向音圈電機180驅動,對光罩台進行即時高精度的微調,滿足運動精度的要求。
During the operation of the lithography system, the plate table has to perform large-stroke movement in the scanning direction and fine-tuned movement in all directions to meet the high-speed and high-precision movement requirements of the plate table. Therefore, the photomask table system in the related technology usually adopts The driving structure of the coarse-fine motion stack. Figure 1 is related
The schematic diagram of the structure of the reticle stage system provided by the technology, as shown in FIG. 1, the reticle stage system provided by the related technology is composed of a
相關技術提供的光罩台系統,由於微動態及微動驅動裝置均設置在粗動台上,且由粗動驅動裝置驅動,一方面增加粗動台的尺寸,從而造成光罩台整體結構尺寸的增大,不利於光罩台系統的小型化設置,另一方面增加粗動驅動裝置的驅動負擔,造成成本的增加及運動精度的降低。 In the photomask table system provided by the related art, since the micro-motion and micro-motion driving devices are both arranged on the coarse motion table and driven by the coarse motion driving device, on the one hand, the size of the coarse motion table is increased, resulting in the overall structural size of the mask table. The enlargement is not conducive to the miniaturization of the mask stage system. On the other hand, it increases the driving burden of the coarse-motion driving device, resulting in an increase in cost and a decrease in motion accuracy.
本發明提供一種光罩台,減小光罩台的尺寸,降低光罩台的運行成本。 The invention provides a photomask table, which reduces the size of the photomask table and reduces the operating cost of the photomask table.
本發明提供一種光刻系統,減小光刻系統的體積,降低光刻成本。 The invention provides a photoetching system, which reduces the volume of the photoetching system and reduces the photoetching cost.
本發明採用下述技術手段: The present invention adopts the following technical means:
一種光罩台,包含: A photomask table, including:
支撐底座; Support base
承版台,滑動連接在前述支撐底座的上端面上; The plate bearing table is slidably connected to the upper end surface of the aforementioned supporting base;
兩組Y向運動機構,設置在前述支撐底座上,且兩組前述Y向運動機構分別設置在前述承版台沿X方向的兩側; Two groups of Y-direction movement mechanisms are arranged on the aforementioned support base, and the two groups of aforementioned Y-direction movement mechanisms are respectively arranged on both sides of the aforementioned plate-bearing platform along the X direction;
X向運動機構,設置在前述Y向運動機構上且與前述承版台連接,前述Y向運動機構帶動前述X向運動機構沿Y方向運動,前述Y方向與前述X方向垂直。 The X-direction movement mechanism is arranged on the aforementioned Y-direction movement mechanism and connected with the aforementioned plate table. The aforementioned Y-direction movement mechanism drives the aforementioned X-direction movement mechanism to move in the Y direction, and the aforementioned Y direction is perpendicular to the aforementioned X direction.
選擇性地,前述支撐底座具有第一安裝面及第二安裝面,前述第一安裝面及前述第二安裝面均與X方向及Y方向形成的平面平行,前述第一安裝面高於前述第二安裝面,且前述承版台設置在前述第一安裝面上,前述Y向運動機構設置在前述第二安裝面上。 Optionally, the support base has a first mounting surface and a second mounting surface, the first mounting surface and the second mounting surface are both parallel to the plane formed by the X direction and the Y direction, and the first mounting surface is higher than the first mounting surface. There are two mounting surfaces, and the plate bearing table is arranged on the first mounting surface, and the Y-direction movement mechanism is arranged on the second mounting surface.
選擇性地,前述X向運動機構及前述Y向運動機構藉由轉動調節組件連接。 Optionally, the aforementioned X-direction movement mechanism and the aforementioned Y-direction movement mechanism are connected by a rotating adjustment assembly.
選擇性地,前述轉動調節組件包含轉換軸承,前述X向運動機構及前述Y向運動機構中的一個與前述轉換軸承的內圈連接,另一個與前述轉換軸承的外圈連接,前述轉換軸承的軸線分別與前述X方向及前述Y方向垂直。 Optionally, the aforementioned rotation adjustment assembly includes a conversion bearing, one of the aforementioned X-direction movement mechanism and the aforementioned Y-direction movement mechanism is connected to the inner ring of the aforementioned conversion bearing, and the other is connected to the outer ring of the aforementioned conversion bearing. The axis is perpendicular to the aforementioned X direction and the aforementioned Y direction, respectively.
選擇性地,前述Y向運動機構包含: Optionally, the aforementioned Y-direction movement mechanism includes:
直線電機,前述直線電機的Y向定子部連接在前述支撐底座的側面且沿前述Y方向設置,前述直線電機的Y向動子部與前述X向運動機構連接。 In the linear motor, the Y-direction stator portion of the linear motor is connected to the side surface of the support base and arranged along the Y direction, and the Y-direction mover portion of the linear motor is connected to the X-direction motion mechanism.
選擇性地,前述Y向運動機構進一步包含: Optionally, the aforementioned Y-direction movement mechanism further includes:
Y向導軌,沿前述Y方向設置在前述第二安裝面上; The Y-direction guide rail is arranged on the aforementioned second mounting surface along the aforementioned Y-direction;
Y向滑塊,與前述Y向導軌滑動連接,前述Y向滑塊與前述Y向動子部連接。 The Y-direction slider is slidably connected to the Y-direction guide rail, and the Y-direction slider is connected to the Y-direction mover part.
選擇性地,前述Y向運動機構進一步包含: Optionally, the aforementioned Y-direction movement mechanism further includes:
第一連接板,其下端面與前述Y向滑塊連接,其上端面與前述X向運動機構連接。 The lower end surface of the first connecting plate is connected with the aforementioned Y-direction slider, and its upper end surface is connected with the aforementioned X-direction movement mechanism.
選擇性地,前述Y向運動機構進一步包含: Optionally, the aforementioned Y-direction movement mechanism further includes:
Y向位移檢測裝置,用於檢測前述Y向運動機構沿前述Y方向運動的位移;及/或 Y-direction displacement detection device for detecting the displacement of the aforementioned Y-direction movement mechanism along the aforementioned Y-direction; and/or
Y向限位裝置,設置在前述第二安裝面上,用於限定前述Y向運動機構的極限位移。 The Y-direction limiting device is arranged on the aforementioned second mounting surface and is used to limit the limit displacement of the aforementioned Y-direction motion mechanism.
選擇性地,前述Y向位移檢測裝置包含第一光柵尺組件,前述第一光柵尺組件包含: Optionally, the Y-direction displacement detection device includes a first grating ruler assembly, and the first grating ruler assembly includes:
第一標尺光柵,沿前述Y方向設置在前述第二安裝面上; The first scale grating is arranged on the aforementioned second mounting surface along the aforementioned Y direction;
第一光柵讀數頭,正對前述第一標尺光柵設置且與前述Y向動子部連接; The first grating reading head is arranged facing the aforementioned first scale grating and connected with the aforementioned Y-direction mover part;
前述Y向限位裝置包含光限位組件及/或限位緩衝組件,前述限位緩衝組件包含設置在前述Y向運動機構兩個極限位置處的液壓緩衝器,前述光限位組件包含: The aforementioned Y-direction limiting device includes an optical limiting component and/or a limiting buffer component, the aforementioned limiting buffer component includes a hydraulic buffer set at two extreme positions of the aforementioned Y-direction motion mechanism, and the aforementioned optical limiting component includes:
兩個第一光感測器,沿前述Y方向間隔設置,前述第一光感測器包含沿前述X方向相對設置的發射部及接收部; Two first light sensors are arranged at intervals along the aforementioned Y direction, and the aforementioned first light sensors include a transmitting part and a receiving part arranged oppositely along the aforementioned X direction;
光遮擋板,與前述Y向動子部連接,前述光遮擋板能夠伸入前述發射部及前述接收部之間以阻擋光線在前述發射部及前述接收部之間的傳 遞。 The light-shielding baffle is connected to the Y-direction mover part, and the light-shielding baffle can extend between the emitting part and the receiving part to block the transmission of light between the emitting part and the receiving part. Pass.
選擇性地,前述X向運動機構包含: Optionally, the aforementioned X-direction motion mechanism includes:
音圈電機,前述音圈電機的X向定子部與前述Y向運動機構連接,前述音圈電機的X向動子部與前述承版台連接。 In the voice coil motor, the X-direction stator portion of the voice coil motor is connected to the Y-direction movement mechanism, and the X-direction mover portion of the voice coil motor is connected to the plate platform.
選擇性地,前述X向運動機構包含: Optionally, the aforementioned X-direction motion mechanism includes:
X向位移檢測裝置,用於檢測前述X向運動機構沿前述X方向運動的位移;及/或 An X-direction displacement detection device for detecting the displacement of the aforementioned X-direction movement mechanism along the aforementioned X-direction; and/or
X向限位裝置,用於限定前述X向運動機構的極限位移。 The X-direction limiting device is used to limit the limit displacement of the aforementioned X-direction motion mechanism.
選擇性地,前述X向運動機構進一步包含: Optionally, the aforementioned X-direction movement mechanism further includes:
第二連接板,分別與前述Y向運動機構及前述X向定子部連接; The second connecting plate is respectively connected with the aforementioned Y-direction movement mechanism and the aforementioned X-direction stator part;
滑移板,與前述第二連接板滑動連接,且能相對前述第二連接板沿前述X方向滑動,前述滑移板分別與前述動子部及前述承版台連接。 The sliding plate is slidably connected to the second connecting plate and can slide in the X direction relative to the second connecting plate. The sliding plate is respectively connected to the mover part and the plate platform.
選擇性地,前述X向運動機構進一步包含: Optionally, the aforementioned X-direction movement mechanism further includes:
X導向組件,沿前述X方向設置在前述第二連接板與前述滑移板之間。 The X guide assembly is arranged between the second connecting plate and the sliding plate along the X direction.
選擇性地,前述X導向組件包含: Optionally, the aforementioned X-guide component includes:
至少一對平行設置的交叉滾子導軌,一對前述交叉滾子導軌中的一個與前述第二連接板連接,另一個與前述滑移板連接。 At least a pair of cross roller guide rails are arranged in parallel, one of the pair of cross roller guide rails is connected to the second connecting plate, and the other is connected to the sliding plate.
選擇性地,前述光罩台進一步包含: Optionally, the aforementioned mask stage further includes:
轉接件,前述X向運動機構藉由前述轉接件與前述承版台連接,前述轉接件在前述Y方向的剛度低於前述轉接件在前述X方向及Rz方向的剛度。 For the adapter, the X-direction movement mechanism is connected to the plate platform through the adapter, and the stiffness of the adapter in the Y direction is lower than the stiffness of the adapter in the X and Rz directions.
選擇性地,前述承版台的上端面開設有吸附真空腔,前述承版台的內部開設有第一吸附氣道,前述第一吸附氣道分別與前述吸附真空腔及抽真空裝置連接。 Optionally, an adsorption vacuum chamber is opened on the upper end surface of the plate table, a first adsorption air channel is opened inside the plate table, and the first adsorption air channel is respectively connected to the adsorption vacuum chamber and the vacuum device.
選擇性地,前述承版台下端面開設有氣浮孔,前述承版台的內部開設有充氣通道,前述充氣通道分別與前述氣浮孔及充氣裝置連通。 Optionally, the lower end surface of the plate bearing table is provided with air flotation holes, and the inside of the plate plate table is provided with an air-filling channel, and the air-filling channels are respectively connected with the air flotation hole and the air filling device.
選擇性地,前述承版台下端面開設有預載真空腔,前述承版台內部開設有第二吸附通道,前述第二吸附通道分別前述預載真空腔及前述抽真空裝置連通。 Optionally, a preload vacuum chamber is opened on the lower end of the plate table, a second suction channel is opened inside the plate table, and the second suction channel is respectively connected with the preload vacuum chamber and the vacuum device.
選擇性地,前述承版台的下端面設置有氣浮墊,前述氣浮墊內開設有氣道,前述氣浮墊的下端面開設有與前述氣道連通的出氣孔,前述氣浮墊與抽真空裝置連通。 Optionally, the lower end surface of the plate table is provided with an air floating cushion, the air floating cushion is provided with an air passage, and the lower end surface of the air floating cushion is provided with an air outlet communicating with the air passage. The device is connected.
選擇性地,前述承版台與前述支撐底座之間設置有磁預載組件,前述磁預載組件包含電磁鐵及金屬件,前述承版台及前述支撐底座中的一個設置有前述電磁鐵,另一個設置有前述金屬件,且前述電磁鐵與前述金屬件正對設置。 Optionally, a magnetic preload assembly is provided between the plate table and the support base, the magnetic preload assembly includes an electromagnet and a metal piece, and one of the plate table and the support base is provided with the electromagnet, The other is provided with the aforementioned metal piece, and the aforementioned electromagnet and the aforementioned metal piece are arranged directly opposite.
一種光刻系統,包含如上所述的光罩台。 A photolithography system includes the photomask stage as described above.
本發明提供的光罩台,藉由使Y向運動機構及X向運動機構均設置在承版台沿X方向的兩側,且X運動機構與Y向運動機構連接,使Y向運動機構直接藉由X向運動機構與承版台連接,避免額外設置粗動台及微動台實現Y向運動機構、X向運動機構與承版台之間的連接,簡化光罩台的結構複雜性,降低光罩台的成本,且由於Y向運動機構 僅需帶動X向運動機構及承版台運動,降低Y向運動機構的負載,提高Y向運動的精度;同時,由於X向運動機構及Y向運動機構設置在承版台的同一側,提高光罩台的結構緊湊性,降低光罩台的整體尺寸,有利於光罩台的小型化設計。 The photomask table provided by the present invention has the Y-direction movement mechanism and the X-direction movement mechanism arranged on both sides of the plate-bearing table along the X direction, and the X movement mechanism is connected with the Y-direction movement mechanism, so that the Y-direction movement mechanism is directly The X-direction motion mechanism is connected to the plate table, avoiding additional coarse motion tables and micro-movement tables to realize the connection between the Y-direction motion mechanism, X-direction motion mechanism and the plate table, simplifying the structural complexity of the mask table and reducing The cost of the mask stage, and due to the Y-direction movement mechanism It only needs to drive the X-direction movement mechanism and the plate to move, reduce the load of the Y-direction movement mechanism, and improve the accuracy of the Y-direction movement; at the same time, because the X-direction movement mechanism and the Y-direction movement mechanism are arranged on the same side of the plate, it improves The compact structure of the reticle stage reduces the overall size of the reticle stage, which is conducive to the miniaturization of the reticle stage.
本發明提供的光刻系統,由於採用上述的光罩台,減小光刻系統的體積,降低光刻系統的成本,增加光刻系統的運動速度及精度。 The lithography system provided by the present invention, due to the use of the above-mentioned mask stage, reduces the volume of the lithography system, reduces the cost of the lithography system, and increases the movement speed and accuracy of the lithography system.
1:支撐底座 1: Support base
2:Y向運動機構 2: Y-direction movement mechanism
3:X向運動機構 3: X-direction movement mechanism
4:承版台 4: plate platform
5:轉接板 5: Adapter board
6:轉換軸承 6: Conversion bearing
11:安裝通孔 11: Mounting through holes
12:安裝凸部 12: Install the convex part
121:第一安裝面 121: The first mounting surface
13:第二安裝面 13: The second mounting surface
14:第三安裝面 14: Third mounting surface
15:金屬件 15: metal parts
120:右直線電機 120: Right linear motor
130:左直線電機 130: Left linear motor
140:精動台 140: Fine Motion Table
150:粗動台 150: coarse motion table
160:導軌 160: Rail
170:X方向音圈電機 170: X direction voice coil motor
180:Y方向音圈電機 180: Y direction voice coil motor
21:直線電機 21: Linear motor
211:Y向定子部 211: Y-direction stator part
212:Y向動子部 212: Y-direction mover part
22:Y向導向組件 22: Y guide component
221:Y向導軌 221: Y-direction rail
222:Y向滑塊 222: Y-direction slider
23:第一連接板 23: The first connection board
24:固定件 24: fixed parts
25:第一光柵尺組件 25: The first grating ruler assembly
251:第一標尺光柵 251: The first ruler raster
252:第一光柵讀數頭 252: The first grating reading head
26:光限位組件 26: Optical limit component
261:第一光感測器 261: The first light sensor
262:光遮擋板 262: light shading baffle
27:液壓緩衝器 27: Hydraulic buffer
28:零位光感測器 28: Zero position light sensor
31:音圈電機 31: Voice coil motor
311:X向動子部 311: X-direction mover part
312:X向定子部 312: X-direction stator part
32:X導向組件 32: X guide assembly
321:交叉滾子導軌 321: Cross Roller Guide
33:第二連接板 33: The second connecting plate
34:滑移板 34: Sliding board
35:第二光柵讀數頭 35: The second grating reading head
36:第二光感測器 36: second light sensor
37:限位柱 37: limit column
38:防撞結構 38: Anti-collision structure
39:第一安裝板 39: The first mounting plate
310:第二安裝板 310: second mounting plate
41:承載凸台 41: Bearing boss
411:吸附真空腔 411: Adsorption vacuum chamber
42:氣浮凸台 42: Air floating boss
421:氣浮孔 421: Floating Hole
43:預載凸台 43: Preload boss
431:預載真空腔 431: preload vacuum chamber
44:氣路轉接塊 44: Gas circuit adapter block
441:氣道接頭 441: Airway connector
45:氣浮墊 45: Air Floatation Cushion
451:出氣孔 451: Vent Hole
46:電磁鐵 46: Electromagnet
47:透光通孔 47: light through hole
51:本體部 51: body part
52:加強板 52: Reinforcement board
53:加強部 53: Strengthening Department
【圖1】為相關技術提供的光罩台系統的結構示意圖。 [Figure 1] Schematic diagram of the structure of the mask stage system provided by the related technology.
【圖2】為本發明實施例一提供的光罩台的結構示意圖。 [Fig. 2] is a schematic diagram of the structure of the mask stage provided by the first embodiment of the present invention.
【圖3】為本發明實施例一提供的支撐底座及Y向運動機構的結構示意圖。 [Figure 3] is a schematic diagram of the structure of the support base and the Y-direction movement mechanism provided by the first embodiment of the present invention.
【圖4】為圖3中I處的局部放大圖。 [Fig. 4] is a partial enlarged view of I in Fig. 3.
【圖5】為本發明實施例一提供的X向運動機構的結構示意圖。 [Fig. 5] is a schematic diagram of the structure of the X-direction movement mechanism provided by the first embodiment of the present invention.
【圖6】為本發明實施例一提供的光罩台Rz向調節的原理圖。 [Figure 6] is a schematic diagram of the Rz-direction adjustment of the mask stage provided by the first embodiment of the present invention.
【圖7】為本發明實施例一提供的轉接板的結構示意圖。 [Fig. 7] is a schematic diagram of the structure of the adapter board provided in the first embodiment of the present invention.
【圖8】為本發明實施例一提供的承版台的正面結構示意圖。 [Fig. 8] is a schematic diagram of the front structure of the plate bearing table provided in the first embodiment of the present invention.
【圖9】為本發明實施例一提供的承版台的反面結構示意圖。 [Figure 9] is a schematic diagram of the reverse structure of the plate bearing table provided in the first embodiment of the present invention.
【圖10】為本發明實施例二提供的承版台與支撐底座的結構示意圖。 [Figure 10] is a schematic diagram of the structure of the plate bearing table and the supporting base provided in the second embodiment of the present invention.
【圖11】為本發明實施例二提供的承版台的反面結構示意圖。 [Fig. 11] is a schematic diagram of the reverse structure of the plate bearing table provided in the second embodiment of the present invention.
下面結合圖式及實施例對本發明作進一步的詳細說明。可以理解的是,此處所描述的具體實施例僅用於解釋本發明,而非對本發明的限定。另外進一步需要說明的是,為了便於描述,圖式中僅示出與本發明相關的部分而非全部結構。 The present invention will be further described in detail below in conjunction with the drawings and embodiments. It can be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be further noted that, for ease of description, only a part of the structure related to the present invention but not all of the structure is shown in the drawings.
在本發明的描述中,除非另有明確的規定及限定,術語「相連」、「連接」、「固定」應做廣義理解,例如,可以是固定連接,亦可以是可拆卸連接,或成一體;可以是機械連接,亦可以是電連接;可以是直接相連,亦可以藉由中間媒介間接相連,可以是兩個元件內部的連通或兩個元件的相互作用關係。對於所屬領域具有通常知識者而言,可以具體情況理解上述術語在本發明中的具體含義。 In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be interpreted broadly. For example, they may be fixedly connected, detachably connected, or integrated. ; It can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be a connection between two components or an interaction relationship between two components. For those with ordinary knowledge in the field, the specific meaning of the above terms in the present invention can be understood in specific situations.
在本發明中,除非另有明確的規定及限定,第一特徵在第二特徵之「上」或之「下」可以包含第一及第二特徵直接接觸,亦可以包含第一及第二特徵不是直接接觸而是藉由它們之間的另外的特徵接觸。而且,第一特徵在第二特徵「之上」、「上方」及「上面」包含第一特徵在第二特徵正上方及斜上方,或僅表示第一特徵水平高度高於第二特徵。第一特徵在第二特徵「之下」、「下方」及「下面」包含第一特徵在第二特徵正下方及斜下方,或僅表示第一特徵水平高度小於第二特徵。 In the present invention, unless expressly stipulated and limited otherwise, the "up" or "below" of the first feature on the second feature may include direct contact between the first and second features, or may include the first and second features Not in direct contact but in contact with other characteristics between them. Moreover, "above", "above" and "above" the second feature of the first feature include the first feature being directly above and obliquely above the second feature, or it only means that the level of the first feature is higher than the second feature. The first feature "below", "below" and "below" the second feature includes the first feature directly below and obliquely below the second feature, or it only means that the level of the first feature is smaller than the second feature.
在本實施例的描述中,術語「上」、「下」、「右」等方位或位置關係為基於圖式所示的方位或位置關係,僅是為了便於描述及簡化操 作,而不是指示或暗示所指的裝置或元件必須具有特定的方位、以特定的方位構造及操作,因此不能理解為對本發明的限制。此外,術語「第一」、「第二」僅用於在描述上加以區分,並沒有特殊的含義。 In the description of this embodiment, the terms "up", "down", "right" and other orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, and are only for ease of description and simplified operation. It does not indicate or imply that the pointed device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention. In addition, the terms "first" and "second" are only used to distinguish them in description and have no special meaning.
實施例一 Example one
圖2為本發明實施例提供的光罩台的結構示意圖,如圖2所示,本實施例提供一種光罩台,用於光刻系統中承載光罩版,並帶動光罩版實現大行程掃描運動及精細微調運動相結合的高速高精度運動,滿足積體電路IC或微型器件的光刻需求。 FIG. 2 is a schematic diagram of the structure of a mask stage provided by an embodiment of the present invention. As shown in FIG. 2, this embodiment provides a mask stage for carrying a mask plate in a lithography system and driving the mask plate to achieve a large stroke The high-speed and high-precision movement combined with scanning movement and fine-tuning movement meets the lithography needs of integrated circuit ICs or micro devices.
本實施例提供的光罩台包含支撐底座1、承版台4、X向運動機構3及Y向運動機構2。其中,支撐底座1用於支撐及固定整個光罩台上的結構,並提供物鏡安裝及通光用介面;承版台4設置在支撐底座1的頂面,用於承載光罩版,實現光罩版在光罩台上的交接以及帶動光罩版運動;X向運動機構3與承版台4連接,並帶動承版台4沿X方向運動;Y向運動機構2設置在支撐底座1上,且與X向運動機構3連接,並帶動X向運動機構3沿Y方向運動,從而實現承版台4沿Y方向的運動。
The photomask table provided in this embodiment includes a supporting
上述X方向及Y方向為圖1所示方向,需要說明的是,在一般情況下,在光刻系統中,光罩台通常帶動光罩版實現水平方向的運動及調節,即X方向及Y方向形成的面為水平面。但在某些特殊應用中,光罩台亦可以帶動光罩版實現在相對水平面傾斜的平面上的運動及調節,即此時,X方向及Y方向形成的平面可以為相對水平面傾斜的平面。在本實施例中,以X方向及Y方向形成的平面為水平面進行示例。 The above-mentioned X direction and Y direction are the directions shown in Figure 1. It should be noted that, in general, in a lithography system, the mask stage usually drives the mask plate to move and adjust in the horizontal direction, that is, the X direction and Y direction. The surface formed by the direction is a horizontal plane. However, in some special applications, the mask stage can also drive the mask plate to move and adjust on a plane inclined relative to the horizontal plane, that is, at this time, the plane formed by the X direction and the Y direction can be a plane inclined relative to the horizontal plane. In this embodiment, the plane formed by the X direction and the Y direction is taken as a horizontal plane for example.
在本實施例中,光罩版在Y方向進行大行程掃描運動,在
X方向能夠藉由X向運動機構3進行微調。
In this embodiment, the mask plate performs a large-stroke scanning movement in the Y direction.
The X-direction can be fine-tuned by the
在本實施例中,Y向運動機構2及X向運動機構3均設置在承版台4沿X方向的兩側,且X向運動機構3與Y向運動機構2連接。該種設置方式,Y向運動機構2直接藉由X向運動機構3與承版台4連接,避免額外設置粗動台及微動台實現Y向運動機構2、X向運動機構3與承版台4之間的連接,降低光罩台的結構複雜性,降低光罩台的成本,且由於Y向運動機構2僅需帶動X向運動機構3及承版台4運動,降低Y向運動機構2的負載,提高Y向運動的精度;同時,由於X向運動機構3及Y向運動機構2設置在承版台4的同一側,提高光罩台的結構緊湊性,降低光罩台的整體尺寸,有利於光罩台的小型化設計。
In this embodiment, the Y-
圖3是本發明實施例一提供的支撐底座及Y向運動機構的結構示意圖,如圖3所示,支撐底座1為光罩台的整體安裝底座,以及為對外安裝提供結構支撐。在本實施例中,支撐底座1基本為矩形結構,其沿Y方向的長度尺寸根據光罩台沿Y方向運動的掃描行程而確定,其沿X方向的寬度尺寸根據光罩版的尺寸以及Y向運動機構2的尺寸而確定。支撐底座1的中心開設有用於放置物鏡及為物鏡提供光路的安裝通孔11。
Fig. 3 is a schematic structural diagram of a support base and a Y-direction movement mechanism provided by the first embodiment of the present invention. As shown in Fig. 3, the
支撐底座1具有第一安裝面121及第二安裝面13,且第一安裝面121及第二安裝面13均與X方向及Y方向形成的平面平行。第一安裝面121高於第二安裝面13,且第二安裝面13位於支撐底座1的中部位置,第二安裝面13位於支撐底座1沿X方向的兩側。
The supporting
承版台4安裝在第一安裝面121上,Y向運動機構2設置在第二安裝面13上,且X向運動機構3設置在Y向運動機構2上且位於
第一安裝面121上方。藉由在支撐底座1上表面設置第一安裝面121,且在第一安裝面121的兩側設置第二安裝面13,使第一安裝面121用於安裝承版台4,第二安裝面13用於安裝Y向運動機構2,能夠在保證支撐底座1強度的同時,實現Y向運動機構2及承版台4的分層安裝,降低光罩台整體厚度尺寸。
The plate bearing table 4 is installed on the first mounting
在本實施例中,由於安裝通孔11貫穿支撐底座1的上下表面,因此,支撐底座1上表面具有兩個平行設置的安裝凸部12,兩個安裝凸部12分別設置在安裝通孔11的兩側,安裝凸部12的上端面形成第一安裝面121。由於第一安裝面121由兩個安裝凸部12的上端面形成,能夠減小第一安裝面121的面積,提高第一安裝面121的平面度,降低第一安裝面121的加工成本。在其他實施例中,可以使支撐底座1整體呈中間高、兩側低的「凸」型結構,第一安裝面121即為「凸」型結構的上端面,安裝通孔11貫穿「凸」型結構的上端面。本實施例中,第一安裝面121的形成,只要方便支撐底座1及第一安裝面121的加工成型即可。
In this embodiment, since the installation through
在本實施例中,Y向運動機構2沿支撐底座1的X方向設置有兩個,且兩個Y向運動機構2分別設置在對應的第二安裝面13上,每個Y向運動機構2均能帶動與之連接的承版台4沿Y方向運動。當兩個Y向運動機構2同步運動時,承版台4整體沿Y方向運動,實現光罩版在Y方向的掃描運動或微調運動。當兩個Y向運動機構2運動不同步時,由於兩個Y向運動機構2分別連接承版台4的兩側,使承版台4兩側出現Y向運動位移差,即導致承版台4產生繞Z方向的轉動運動。在本實施例中,Z方向為垂直於X方向及Y方向所在平面的方向。
In this embodiment, two Y-
藉由在承版台4的兩側均設置Y向運動機構2,能夠藉由兩個Y向運動機構2的不同步運動實現承版台4繞Z方向的轉動運動,從而實現沿Rz方向的微調,進一步提高光罩台的運動及調節精度,提高光刻品質;且由於不再需要設置Rz向的調節機構,能夠簡化光罩台的整體結構設置,縮小光罩台的整體尺寸,降低光罩台的設計成本,有利於實現光罩台的小型化設計;同時,兩個Y向運動機構2的同步運動,能夠使承版台4兩側受力均衡,提高承版台4的運動平穩性,保證承版台4的運動精度。
By setting the Y-
在其他實施例中,進一步可以僅在承版台4的一側設置一個Y向運動機構2,承版台4的另一側藉由採用Y向的導向組件與承版台4滑動連接,亦可以實現承版台4沿Y方向的運動。此時,可以藉由設置額外的Rz調節機構實現繞Z軸的轉動,亦可以藉由在承版台4兩側設置兩個X向運動機構3,使X向運動機構3分別連接的承版台4相對的兩角附近,亦可以實現Rz方向的微調。
In other embodiments, it is further possible to provide a Y-
圖4為圖3中I處的局部放大圖,如圖4所示,在本實施例中,Y向運動機構2包含直線電機21。直線電機21的Y向定子部211沿Y方向設置,直線電機21的Y向動子部212與Y向定子部211配合,並能相對Y向定子部211沿Y方向運動。藉由設置直線電機21,能夠實現直線運動的直接傳動,結構簡單,反應迅速,運動精度高,有利於提高承版台4沿Y向運動的速度及精度。在本實施例中,直線電機21可選為U型槽式直線電機21,結構簡單,設置方便。直線電機21的類型進一步可以為管式或平板式等結構。
FIG. 4 is a partial enlarged view of I in FIG. 3. As shown in FIG. 4, in this embodiment, the Y-
在本實施例中,支撐底座1位於X方向的兩側壁分別形成有第三安裝面14,直線電機21的Y向定子部211可選連接在第三安裝面14上,有利於節省Y向運動機構2在第二安裝面13上需要的佈置空間,減小光罩台沿高度方向的尺寸,提高光罩台整體結構緊湊性,進一步縮小光罩台需要的尺寸。在其他實施例中,直線電機21亦可以連接在第二安裝面13上。
In this embodiment, the two side walls of the
為提供Y向運動機構2的運動精度,選擇性地,Y向運動機構2包含Y嚮導向組件22,對Y向運動機構2的運動進行導向。Y嚮導向組件22包含Y向導軌221及Y向滑塊222,Y向導軌221沿Y方向設置在第二安裝面13上,Y向滑塊222與Y向導軌221配合並與Y向動子部212連接。
In order to provide the movement accuracy of the Y-
在本實施例中,Y向導軌221為凸式滑軌結構,其與支撐底座1可拆卸連接,有利於Y向導軌221的安裝、設置及更換。在其他實施例中,Y向導軌221可以為開設在第二安裝面13上的槽式結構,Y向滑塊222滑動連接在槽結構內並能沿槽結構的槽壁滑動。
In this embodiment, the Y-
在一些實施例中,Y向運動機構2進一步包含第一連接板23,第一連接板23設置在Y向滑塊222的上方且與Y向滑塊222的上端面連接。且第一連接板23分別與X向運動機構3及Y向動子部212連接。藉由第一連接板23,能夠實現直線電機21帶動Y向滑塊222沿Y向導軌221運動,並同步帶動X向運動機構3運動,提高結構的緊湊性。且由於Y向滑塊222不直接連接X向運動機構3及Y向動子部212,使Y向滑塊222可以採用通用性設計,簡化Y向滑塊222的設計及加工成本,
方便Y向滑塊222的維修及更換。在其他實施例中,亦可以藉由Y向滑塊222的結構設計,使Y向滑塊222直接與X向運動機構3及/或Y向動子部212連接。
In some embodiments, the Y-
在本實施例中,選擇性地,Y向滑塊222沿Y向導軌221長度方向設置兩個,且兩個Y向滑塊222的上端面均與第一連接板23連接,有利於提高Y向運動的平穩性以及與X向運動機構3的連接穩定性。
In this embodiment, optionally, two Y-
在本實施例中,Y向定子部211的上端面與第一連接板23之間藉由固定件24連接,有利於各部件之間的安裝及更換。
In this embodiment, the upper end surface of the Y-
選擇性地,Y向運動機構2進一步包含Y向位移檢測裝置,用於檢測Y向運動機構2沿Y方向的運動位移。在本實施例中,Y向位移檢測裝置可選採用第一光柵尺組件25,第一光柵尺組件25包含第一標尺光柵251及第一光柵讀數頭252,第一標尺光柵251沿Y方向設置在第二安裝面13上,第一光柵讀數頭252與Y向動子部212連接且正對第一標尺光柵251設置。在本實施例中,第一標尺光柵251設置在Y向導軌221遠離承版台4的一側,第一光柵讀數頭252設置在固定件24上。藉由採用光柵尺進行Y向位移的檢測,檢測行程大,檢測精度高、響應快,能夠提高Y向運動機構2的調節精度及調節速度。在其他實施例中,進一步可以採用測距感測器、位移感測器等進行Y向位移的測量。
Optionally, the Y-
選擇性地,Y向運動機構2進一步包含Y向限位裝置,用於限定Y向運動機構2沿Y方向兩側運動的極限位置,防止Y向運動機構2超出運動範圍而造成與其他結構的干涉或碰撞,提高Y向運動機構2
的運行可靠性及安全性。
Optionally, the Y-
在本實施例中,Y向限位裝置包含光限位組件26,光限位組件26包含光遮擋板262及兩個第一光感測器261。兩個第一光感測器261沿Y方向間隔設置,第一光感測器261包含沿X方向相對設置的發射部及接收部。光遮擋板262連接在第一連接板23上,且當Y向運動機構2分別運行到與兩個第一光感測器261對應的極限位置時,光遮擋板262位於對應的第一光感測器261的接收部及發射部之間,對發射部與接收部之間的光線進行遮擋。
In this embodiment, the Y-direction limiting device includes a light limiting
當發射部與接收部之間不存在遮擋時,接收部能夠接收發射部發出的光訊號並輸出對應的電平訊息。當發射部與接收部之間存在遮擋時,接收部不能接收或僅能接收部分發射部發出的光訊號,並輸送與未遮擋時不同的電平訊號。從而可以藉由光感測器輸出的電平訊號判斷是否存在光遮擋板262,當存在光遮擋板262時,即Y向運動機構2運行到對應的極限位置處。
When there is no obstruction between the transmitting part and the receiving part, the receiving part can receive the optical signal from the transmitting part and output the corresponding level information. When there is a shield between the transmitter and the receiver, the receiver cannot receive or can only receive the light signal from a part of the transmitter, and transmits a signal of a different level than when it is not shielded. Therefore, it can be judged whether there is a
在本實施例中,可選第一光感測器261為遮斷型光電斷續器,其發射部及接收部一體設置在殼體的兩側,且形成有U型槽,當光遮擋板262伸入U型槽中時,即可實現對光電斷續器光線的遮擋。在其他實施例中,第一光感測器261進一步可以為遮斷型光電開光等。
In this embodiment, the optional first
在本實施例中,可選第一連接板23沿Y方向的兩側均設置有一個光遮擋板262,每個光遮擋板262與對應側的第一光感測器261配合實現極限位置的檢測,使兩個第一光感測器261分別設置在Y向導軌221的兩端即可,光遮擋板262及第一光感測器261的設置位置更為直觀
方便。在其他實施中,亦可以僅設置一個光遮擋板262,此時,兩個第一光感測器261的位置根據Y向運動的兩個極限位置及光遮擋板262在第一連接板23上的位置進行確定。
In this embodiment, the optional first connecting
在本實施例中,其中一個第一光感測器261在遠離另一個第一光感測器261的一側進一步設置有零位光感測器28,用於確定Y向運動機構2的初始位置以及對Y向運動機構2進行復位,提高Y向運動機構2的運動精度。
In this embodiment, one of the
藉由設置第一光感測器261檢測Y向運動機構2的運動極限位置,響應速度快,精度高,提高Y向運動機構2的運動回饋速度,更有利於Y向運動機構2的調控速度及調控精度的提高。在其他實施例中,Y向限位組件進一步可以是接觸式開關,如微動開關等。
By setting the
在一些實施例中,Y向限位裝置進一步包含限位緩衝組件,限位緩衝組件包含設置在Y向導軌221兩端的液壓緩衝器27。當Y向運動機構2運動到兩個極限位置時,第一連接板23的對應側與對應的液壓緩衝器27接觸。液壓緩衝器27的設置能夠進一步對Y向運動機構2中運動部分的極限位置進行限位,並能夠起到對運動部分的運動起到緩衝作用,防止運動部分在運動過程中與其他結構發生硬性碰撞等,對Y向運動機構2起到保護作用,提高Y向運動機構2的結構可靠性及安全性。
In some embodiments, the Y-direction limiting device further includes a limiting buffer component, and the limiting buffer component includes
圖5是本發明實施例一提供的X向運動機構的結構示意圖,如圖5所示,X向運動機構3設置在Y向運動機構2上,用於實現承版台4在X方向運動的微調。X向運動機構3包含音圈電機31,音圈電機31的X向定子部312與Y向運動機構2的第一連接板23連接,音圈
電機31的X向動子部311與承版台4連接。藉由設置音圈電機31作為X向運動機構3的驅動單元,能夠減小X向運動機構3的體積,提高X向運動精度的調節精度。
Fig. 5 is a schematic structural diagram of the X-direction movement mechanism provided by the first embodiment of the present invention. As shown in Fig. 5, the
為方便音圈電機31與Y向運動機構2及承版台4之間的連接,選擇性地,X向運動機構3進一步包含第二連接板33及滑移板34。第二連接板33的下表面與第一連接板23連接,且第二連接板33遠離承版台4的一側藉由第一安裝板39與X向定子部312連接。滑移板34設置在第二連接板33的上方且藉由第二安裝板310與X向動子部311連接,滑移板34能夠在Y向動子部212的帶動下相對第二連接板33沿X方向滑動,同時,滑移板34與承版台4連接,以使滑移板34的X向運動帶動承版台4沿X方向運動。
In order to facilitate the connection between the
為提高滑移板34沿X方向運動的可靠性及精度,選擇性地,滑移板34及第二連接板33之間設置有X導向組件32。在本實施例中,X導向組件32包含兩對交叉滾子導軌321,兩對交叉滾子導軌321平行設置在滑移板34沿Y方向的兩側。在一些實施例中,每對交叉滾子導軌321中的一個與第二連接板33連接,另一個與滑移板34連接,以提高X導向組件32的導向穩定性及準確性。在其他一個實施例中,亦可以僅在滑移板34的中部設置一對交叉滾子導軌321,或可以僅設置一條交叉滾子導軌321等。在其他另一實施例中,進一步可以採用X向直線導軌與X向滑塊的配合來實現滑移板34與第二連接板33之間的滑動導向等。
In order to improve the reliability and accuracy of the sliding
在本實施例中,選擇性地,X向運動機構3進一步包含X向位移檢測裝置。在本實施例中,X向位移檢測裝置包含第二光柵尺組
件,第二光柵尺組件的第二標尺光柵沿X方向設置在第二連接板33上,第二光柵尺組件的第二光柵讀數頭35與滑移板34連接且正對第二標尺光柵設置。在其他實施例中,X向位移檢測裝置進一步可以為距離感測器等用於測距的感測器。
In this embodiment, optionally, the
在本實施例中,X向運動機構3進一步包含X向限位裝置,用於限定X向運動機構3的極限位移。在本實施例中,X限位裝置包含第二光感測器36,第二光感測器36與滑移板34連接,第二連接板33朝向滑移板34的一面開設有容置槽,容置槽的中部設置有光遮擋件,第二光感測器36包含相對設置的發射部及接收部,發射部及接收部伸入容置槽中,且當X向運動機構3處於初始狀態時,光遮擋件位於發射部及接收部之間,當X向運動機構3處於X向運動的兩個極限位置時,光遮擋件恰好不遮擋發射部及接受部之間的光線,從而可以藉由第二光感測器36的輸出訊號判斷X向運動機構3是否運行到極限位置。其中,第二光感測器36可以為光電斷續器、光電開光等。在其他實施例中,X向限位裝置進一步可以為接觸式開關等能夠用於限位並進行訊息輸出的結構。
In this embodiment, the
在本實施例中,X限位裝置進一步包含用於實現機械限位的限位柱37及限位槽,滑移板34及第二連接板33之間中的一個設置有限位柱37,另一個對應開設有限位槽,限位柱37伸入限位槽中,藉由限位柱37在限位槽內的可移動距離限制X向運動機構3的行程。在其他實施例中,X限位裝置進一步可以藉由其他的結構實現X向運動機構3在X方向上兩個極限位置的機械限位。
In this embodiment, the X limit device further includes a
在本實施例中,X向運動機構3進一步包含設置在滑移板
34朝向承版台4一側的防撞結構38,當滑移板34沿朝向承版台4的方向運動至極限位置時,防撞結構38與承版台4接觸,防止X向運動機構3進一步運動,且避免滑移板34等結構與承版台4發生剛性碰撞造成承版台4或滑移板34等結構損壞,提高X向運動機構3的運動可靠性及安全性。
In this embodiment, the
在本實施例中,承版台4沿X方向的兩側均設置有X向運動機構3,以提高承版台4沿X向運動的可靠性及平穩性。為降低光罩台的成本,在本實施例中,選擇性地,其中一個X向運動機構3可以取消音圈電機31及X向位移檢測裝置的設置,其他結構保持相同。
In this embodiment, both sides of the plate bearing table 4 along the X direction are provided with
圖6是本發明實施例一提供的光罩台Rz向調節的原理圖,其中,圖6中(a)為光罩台僅進行X方向及/或Y方向調節時的結構示意圖,圖6中(b)為光罩台進行Rz方向調節時的結構示意圖。如圖6所示,在本實施例中,由於X向運動機構3連接在Y向運動機構2上,且兩個Y向運動機構2的非同步運動會導致分別設置在兩個Y向運動機構2上的X向運動機構3的位置發生錯位,使兩個X向運動機構3的連線相對X方向傾斜。為實現X向運動機構3與Y向運動機構2的解耦,X向運動機構3與Y向運動機構2之間設置有轉動調節組件,使X向運動機構3藉由轉動調節組件與Y向運動機構2可轉動連接。從而,當採用兩個Y向運動機構2對承版台4進行Rz向調節α度之後,X向運動機構3相對Y向運動機構2發生偏轉,使兩個X向運動機構3之間的連接與X方向傾斜成α角,使X向運動機構3與承版台4之間的連接關係保持不變,X向運動機構3依然沿垂直於承版台4一邊的方向作用於承版台4,
保證X向運動機構3的調節精度。
6 is a schematic diagram of the Rz-direction adjustment of the reticle stage provided in the first embodiment of the present invention, in which (a) in FIG. 6 is a schematic diagram of the structure when the reticle stage is only adjusted in the X direction and/or the Y direction, in FIG. 6 (b) is a schematic diagram of the structure when the mask stage is adjusted in the Rz direction. As shown in Fig. 6, in this embodiment, the
在本實施例中,轉動調節組件為轉換軸承6。在一些實施例中,第一連接板23上開設有軸承安裝孔,軸承安裝孔的孔徑與轉換軸承6的外圈外徑相匹配,使轉換軸承6的外圈與第一連接板23固定連接,轉換軸承6的內圈與第二連接板33連接,從而藉由轉換軸承6內圈與外圈之間的相對轉動實現X向運動機構3相對Y向運動機構2的轉動。
In this embodiment, the rotation adjustment assembly is a
在其他實施例中,第一連接板23及第二連接板33亦可以採用固定連接,即X向運動機構3與Y向運動機構2之間不發生相對轉動。此時,可藉由使X向運動機構3與承版台4採用萬向球鉸或關節軸承與承版台4鉸接連接,實現X向運動機構3的作用力垂直施加在承版台4上。
In other embodiments, the first connecting
在本實施例中,X向運動機構3藉由轉接板5連接。由於兩個X向運動機構3中的一個可以省去音圈電機31等設置,因此,兩個X向運動機構3的上端面不在同一平面上,為解決兩個X向運動機構3在Z向等高的問題,轉接板5可選為簧片結構,且簧片結構在Ry方向的剛度較低,在X方向及Rz向的剛度較高,從而使簧片結構能夠在繞Y方向發生一定彎折變形,而在X方向及Rz方向保持與X向運動機構3的連接關係不變。
In this embodiment, the
圖7是本發明實施例一提供的轉接板的結構示意圖,如圖7所示,轉接件可以採用圖7中(a)、(b)或(c)中任一種結構。在圖7(a)中,簧片結構包含板狀的本體部51及沿本體部51的X方向間隔設
置的多個加強部53,加強部53的厚度大於本體部51的厚度,從而使X方向及Rz方向的剛度增加,Ry方向的剛度減小。在圖7(b)中,簧片結構沿X方向的長度大於其沿Y方向的長度,且其X方向的兩端的厚度大於中間部分的厚度,以減小Ry向的剛度。在圖7(c)中,簧片結構的本體部51為薄片狀結構,厚度約為1mm,可選採用304不銹鋼鈑金件,且簧片結構沿X方向的兩側邊上連接有加強板52,增強X方向及Y方向的強度。本實施例僅提供轉接板5的示例性結構,轉接板5進一步可以為其他具有Ry向剛度較小,X方向及Rz方向剛度較大的結構。
Fig. 7 is a schematic diagram of the structure of the adapter plate provided in the first embodiment of the present invention. As shown in Fig. 7, the adapter can adopt any of the structures shown in Fig. 7 (a), (b) or (c). In Figure 7 (a), the reed structure includes a plate-shaped
圖8是本發明實施例一提供的承版台的正面結構示意圖,圖9是本發明實施例一提供的承版台的反面結構示意圖。如圖8及9所示,在本實施例中,承版台4的中部開設有供物鏡光路藉由的透光通孔47,承版台4的上端面設置有用於承載光罩版的承載凸台41,且承版台4及承載凸台41為一體式結構。在本實施例中,透光通孔47為矩形孔,透光通孔47沿Y方向設置的兩側邊上分別設置有兩個承載凸台41,以提高對光罩版的承載穩定性。在其他實施例中,承載凸台41的位置設置及個數設置可以根據需求自行設置。
FIG. 8 is a schematic diagram of the front structure of the plate plate provided in the first embodiment of the present invention, and FIG. 9 is a schematic diagram of the back structure of the plate plate provided in the first embodiment of the present invention. As shown in Figures 8 and 9, in this embodiment, the middle of the plate table 4 is provided with a light-transmitting through
選擇性地,在本實施例中,承版台4整體為氣足結構,承載凸台41上端面上開設有吸附真空腔411,承版台4內部開設有第一吸附氣道,各個承載凸台41上的吸附真空腔411均與第一吸附氣道連通,且第一吸附氣道連通有抽真空裝置。當光罩版放置在承版台4上並搭載在承載凸台41上時,藉由抽真空裝置,光罩版及承載凸台41之間的空氣藉由吸附真空腔411內及第一吸附氣道排空,從而實現承載凸台41及承版台4
之間的緊密吸合,實現光罩版在承版台4上的固定。
Optionally, in this embodiment, the
在本實施例中,承版台4的下端面上開設有氣浮孔421,承版台4內部進一步開設有充氣通道,充氣通道與氣浮孔421連通,且充氣通道與設置在承版台4外部的充氣裝置連通。當充氣裝置藉由充氣通道向承版台4內部充氣時,氣流藉由氣浮孔421向承版台4與支撐底座1之間排出,使承版台4與支撐底座1之間形成一層氣模,承版台4能夠在氣模的作用下浮在支撐底座1至上,減小承版台4與支撐底座1之間的接觸摩擦力作用,從而能夠提高X向運動機構3及Y向運動機構2的負載,提高承版台4的運動速度及運動精度。
In this embodiment, the lower end surface of the plate bearing table 4 is provided with an
在本實施例中,承版台4至少在其底面的每個頂角附近設置有一個氣浮孔421。選擇性地,位於同一側邊處的氣浮孔421相對該側邊的中垂線對稱,實現氣浮作用下對承版台4的穩定支撐。在其他實施例中,承版台4底面的每一邊上進一步可以開設有三個或多個氣浮孔421。
In this embodiment, the
在本實施例中,承版台4的下端面設置有氣浮凸台42,氣浮凸台42的表面凸出承版台4的下表面,所有的氣浮凸台42的端面位於同一平面上,氣浮孔421開設在氣浮凸台42上。以減小承版台4與支撐底座1的加工難度,提高氣浮凸台42端面平整度,同時,減小氣浮所需氣體流量。
In this embodiment, the lower end surface of the
選擇性地,在本實施例中,承版台4的底面進一步凸設有預載凸台43,預載凸台43的端面與氣浮凸台42的端面平行。預載凸台43上開設有預載真空腔431,承版台4內部設置有第二吸附氣道,第二吸附氣道分別連通預載真空腔431及設置在承版台4外部的抽真空裝置。藉
由抽真空裝置,能夠使支撐底座1及預載凸台43之間的氣體藉由預載真空腔431及第二吸附氣道排空,實現預載凸台43與支撐底座1之間的氣吸附,從而實現支撐底座1與承版台4之間的穩定連接,避免承版台4在光罩版上版及下版過程中的產生移動,保證光罩版順利交接。
Optionally, in this embodiment, the bottom surface of the
在本實施例中,每個氣浮凸台42的兩側均設置有一個預載凸台43,有利於實現對承版台4與支撐底座1接觸面之間氣體的有效排空。在其他實施例中,氣浮凸台42的位置及個數可根據實際需求進行設置。
In this embodiment, a preloading
在本實施例中,承版台4的一側進一步設置有氣路轉接塊44,氣路轉接塊44上對應第一吸附氣道、第二充氣氣道及充氣氣道分別設置有氣道接頭441,用於實現承版台4內部第一吸附氣道、第二充氣氣道及充氣氣道與抽真空裝置或充氣裝置之間的連接。
In this embodiment, a gas
需要說明的是,在氣足內開設吸附氣道或真空氣道均為本領域的常規技術手段,本實施例不再進行贅述。 It should be noted that opening an adsorption air channel or vacuum air channel in the air foot is a conventional technical means in the art, and will not be repeated in this embodiment.
本實施例進一步提供一種光刻系統,包含上述的光罩台。 This embodiment further provides a lithography system, including the above-mentioned mask stage.
實施例二 Example two
本實施例提供一種光罩台,包含支撐底座1、X向運動機構3、Y向運動機構2與承版台4等。與實施例一提供的光罩台相比,本實施例提供的光罩台的支撐底座1、X向運動機構3及Y向運動機構2等設置均與實施例一種光罩台中的設置相同,不同之處在於在本實施例提供的光罩台的承版台4與實施例一種的承版台4結構不同。
This embodiment provides a photomask table, which includes a supporting
圖10為本發明實施例提供的承版台與支撐底座的結構示意
圖,圖11為本發明實施例提供的承版台的反面結構示意圖,如圖10及圖11所示,不同於實施例一,本實施例提供的承版台4為非氣足式結構。承版台4的底部設置有氣浮墊45,氣浮墊45與承版台4分體設置,且藉由粘接或熱壓等方式連接。氣浮墊45的端面開設有出氣孔451,氣浮墊45內部設置有與出氣孔451連通的氣道,氣道進一步連通外部的充氣裝置。藉由設置與承版台4連接的氣浮墊45,可以避免在承版台4內部開設用於氣浮孔421出氣的充氣通道,簡化承版台4的加工,且能夠適用通用的商用氣浮墊45,減小成本。在本實施例中,氣浮墊45至少設置在承版台4底部的四角附近,且位於同一側邊的兩個氣浮墊45相對該側邊的中垂線對稱設置。
Figure 10 is a schematic diagram of the structure of the plate bearing table and the supporting base provided by an embodiment of the present invention
Fig. 11 is a schematic diagram of the reverse structure of the plate bearing table provided by an embodiment of the present invention. As shown in Figs. 10 and 11, unlike the first embodiment, the plate bearing table 4 provided in this embodiment has a non-air-footed structure. An
在部分實施例中,承版台4及支撐底座1之間進一步設置有磁預載組件,磁預載組件包含電磁鐵46及金屬件15。在本實施例中,電磁鐵46設置在承版台4底面,金屬件15對應電磁鐵46的位置設置在支撐底座1上。向電磁鐵46通電,藉由電磁鐵46對金屬件15的磁吸作用,實現承版台4與支撐底座1之間的連接。且由於金屬件15設置在支撐底座1上,可以藉由設置長條狀金屬件15,且使金屬件15沿Y方向設置,亦能夠進一步使金屬件15的端面同時作為預載面及氣浮導向面。在其他實施中,亦可以是金屬件15設置在承版台4底部,電磁鐵46設置在支撐底座1上。
In some embodiments, a magnetic preload component is further provided between the plate bearing table 4 and the
在本實施例中,每個氣浮墊45的兩側均設置有一個電磁鐵46,以實現承版台4及支撐底座1之間的穩定連接,保證光罩版上版及下版的穩定性。
In this embodiment, an
本實施例提供的光罩台的其他結構可參考實施例一進行設置,本實施例不再進行贅述。 Other structures of the mask stage provided in this embodiment can be configured with reference to the first embodiment, which will not be described in detail in this embodiment.
本實施例進一步提供一種光刻系統,包含上述的光罩台。 This embodiment further provides a lithography system, including the above-mentioned mask stage.
1:支撐底座 1: Support base
2:Y向運動機構 2: Y-direction movement mechanism
3:X向運動機構 3: X-direction movement mechanism
4:承版台 4: plate platform
5:轉接板 5: Adapter board
13:第二安裝面 13: The second mounting surface
14:第三安裝面 14: Third mounting surface
121:第一安裝面 121: The first mounting surface
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