TWI726075B - Composition, method for manufacturing composition, cured film, color filter, light-shielding film, solid-state imaging element, and image display device - Google Patents

Composition, method for manufacturing composition, cured film, color filter, light-shielding film, solid-state imaging element, and image display device Download PDF

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TWI726075B
TWI726075B TW106109671A TW106109671A TWI726075B TW I726075 B TWI726075 B TW I726075B TW 106109671 A TW106109671 A TW 106109671A TW 106109671 A TW106109671 A TW 106109671A TW I726075 B TWI726075 B TW I726075B
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久保田誠
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日商富士軟片股份有限公司
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Abstract

本發明提供一種能夠製作具有優異之遮光性、優異之解像性及優異之電極的防腐性之硬化膜之組成物,以及提供一種組成物的製造方法、硬化膜、濾色器、遮光膜、固態攝影元件及圖像顯示裝置。組成物含有包含規定的原子之含金屬氮化物的粒子,該含金屬氮化物的粒子含有在3~11族的過渡金屬中除鈦之過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物。The present invention provides a composition capable of producing a cured film with excellent light-shielding, excellent resolution, and excellent electrode corrosion resistance, and a method for manufacturing the composition, a cured film, a color filter, a light-shielding film, Solid-state imaging device and image display device. The composition contains metal-containing nitride particles containing predetermined atoms, and the metal-nitride-containing particles contain transition metals that remove titanium among transition metals of groups 3 to 11 and have electronegativity of 1.22 to 2.36.化物。

Description

組成物、組成物的製造方法、硬化膜、濾色器、遮光膜、固態攝影元件及圖像顯示裝置Composition, method for manufacturing composition, cured film, color filter, light-shielding film, solid-state imaging element, and image display device

本發明係一種組成物、組成物的製造方法、硬化膜、濾色器、遮光膜、固態攝影元件及圖像顯示裝置。The present invention is a composition, a method for manufacturing the composition, a cured film, a color filter, a light shielding film, a solid-state imaging element, and an image display device.

一直以來,作為黑色粉末,周知有含有氮化鈦之組成物。含有氮化鈦之組成物用於各種用途,例如,用於製作設置於液晶顯示裝置及固態攝像裝置等之遮光膜。 具體而言,用於液晶顯示裝置之濾色器中,為了遮蔽著色像素之間的光並提高對比度等,具備被稱作黑矩陣之遮光膜。 並且,固態攝影元件中,亦為了防止產生噪聲、提高畫質等而設置有遮光膜。目前,在移動電話及PDA(Personal Digital Assistant(個人數字助理))等電子設備的便攜終端搭載有小型且薄型的攝像模組。該種攝像模組通常具備CCD(Charge Coupled Device(電荷耦合元件))圖像感測器及CMOS(Complementary Metal-Oxide Semiconductor(互補型金屬氧化膜半導體))圖像感測器等固態攝影元件及用於在固態攝影元件上形成被攝體像之透鏡。Conventionally, as a black powder, a composition containing titanium nitride has been known. The composition containing titanium nitride is used for various purposes, for example, for the production of light-shielding films installed in liquid crystal display devices and solid-state imaging devices. Specifically, a color filter used in a liquid crystal display device is provided with a light-shielding film called a black matrix in order to shield light between colored pixels and improve contrast. In addition, the solid-state imaging element is also provided with a light-shielding film in order to prevent the generation of noise, improve image quality, and the like. Currently, portable terminals of electronic devices such as mobile phones and PDAs (Personal Digital Assistants) are equipped with small and thin camera modules. This type of camera module usually has a CCD (Charge Coupled Device) image sensor and a CMOS (Complementary Metal-Oxide Semiconductor (Complementary Metal-Oxide Semiconductor)) image sensor and other solid-state image sensors. A lens used to form a subject image on a solid-state imaging device.

而且,近年來,著眼於特定波長的光的透射率,研究代替氮化鈦使用特定波長的光的透射率更低(遮光性較高)之金屬氮氧化物之黑色粉末。例如,專利文獻1中,公開有“一種藍色遮蔽黑色粉末,其為包含釩或鈮的一種或兩種的氮氧化物之黑色粉末,其特徵為,氧含量16wt%以下及氮含量10wt%以上,粉末濃度50ppm的分散液透過光譜中,450nm的透射率X為10.0%以下。”。 [先前技術文獻] [專利文獻]Moreover, in recent years, focusing on the transmittance of light of a specific wavelength, research has been conducted to replace titanium nitride with black powders of metal oxynitride with lower transmittance (higher light-shielding properties) of light of a specific wavelength. For example, Patent Document 1 discloses "a blue shielding black powder, which is a black powder containing one or two nitrogen oxides of vanadium or niobium, and is characterized by an oxygen content of 16wt% or less and a nitrogen content of 10wt% Above, in the transmission spectrum of the dispersion liquid with a powder concentration of 50 ppm, the transmittance X at 450 nm is 10.0% or less.". [Prior Technical Document] [Patent Document]

[專利文獻1]:日本特開2012-96945號公報[Patent Document 1]: JP 2012-96945 A

專利文獻1中記載的藍色遮蔽黑色粉末作為具有較高遮光性之黑色顏料,具有優異之性質。但是,依本發明人等的研究,發現將含有如上述的黑色顏料之組成物用於在形成有電極圖案之基板上形成加工成圖案狀之硬化膜時,在解像性的提高及電極圖案的劣化(腐蝕)抑制方面,還有可進一步改善之餘地。另外,解像性表示,相對於所希望的微細圖案,所獲得之圖案形狀更接近所希望的形狀,具體而言,所獲得之圖案形狀不比所希望的形狀粗或細。The blue-shielding black powder described in Patent Document 1 has excellent properties as a black pigment with high light-shielding properties. However, according to research conducted by the inventors, it has been found that when a composition containing the black pigment as described above is used to form a cured film processed into a pattern on a substrate on which an electrode pattern is formed, the resolution is improved and the electrode pattern is improved. There is room for further improvement in terms of degradation (corrosion) suppression. In addition, the resolution means that the obtained pattern shape is closer to the desired shape than the desired fine pattern. Specifically, the obtained pattern shape is not thicker or thinner than the desired shape.

本發明的課題在於提供一種能夠製作具有優異之遮光性、優異之解像性及優異之電極的防腐性之硬化膜之組成物。並且,本發明的課題還在於提供一種組成物的製造方法、硬化膜、濾色器、遮光膜、固態攝影元件及圖像顯示裝置。The subject of the present invention is to provide a composition capable of producing a cured film having excellent light-shielding properties, excellent resolution, and excellent electrode corrosion resistance. In addition, the subject of the present invention is to provide a method of manufacturing a composition, a cured film, a color filter, a light-shielding film, a solid-state imaging element, and an image display device.

本發明人等為了解決上述課題而進行了深入研究,其結果,發現一種含有包含規定的原子之含金屬氮化物的粒子之組成物,含金屬氮化物的粒子含有在3~11族的過渡金屬中除鈦以外的過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物之組成物能夠解決上述課題,並完成了本發明。 亦即,發現藉由以下結構能夠解決上述課題。The inventors of the present invention conducted intensive studies in order to solve the above-mentioned problems. As a result, they found a composition containing metal nitride-containing particles containing predetermined atoms. The metal-nitride-containing particles contain transition metals in groups 3-11. The composition of the nitride of a transition metal other than titanium and a transition metal with an electronegativity of 1.22 to 2.36 can solve the above-mentioned problems, and the present invention has been completed. That is, it was found that the above-mentioned problem can be solved by the following structure.

[1]一種組成物,其含有包含原子A之含金屬氮化物的粒子,其中,含金屬氮化物的粒子含有在3~11族的過渡金屬中除鈦以外的過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物,原子A係與構成過渡金屬的氮化物之過渡金屬不同之元素,係選自由硼、鋁、矽、錳、鐵、鎳及銀所組成的群組中的至少1種,含金屬氮化物的粒子中的原子A的含量為0.00005~10質量%。 [2]如[1]所述之組成物,其中,含金屬氮化物的粒子的導電率為100×104 ~600×104 S/m。 [3]如[1]或[2]所述之組成物,其中,含金屬氮化物的粒子的平均一次粒徑為10~50nm。 [4]如[1]至[3]中任一項所述之組成物,其還含有黏結樹脂。 [5]如[4]所述之組成物,其中,黏結樹脂相對於與含金屬氮化物的粒子的質量比為0.3以下。 [6]如[1]至[5]中任一項所述之組成物,過渡金屬係選自由V、Cr、Y、Zr、Nb、Hf、Ta、W及Re所組成的群組中的至少1種。 [7]如[1]至[6]中任一項所述之組成物,過渡金屬係選自由V及Nb所組成的群組中的至少1種。 [8]如[1]至[7]中任一項所述之組成物,其還含有聚合性化合物。 [9]如[1]至[8]中任一項所述之組成物,其還含有聚合起始劑。 [10]如[1]至[9]中任一項所述之組成物,其還含有溶劑,固體成分為10~40質量%。 [11]如[10]所述之組成物,其中,溶劑含有水,水的含量相對於組成物的總質量,為0.1~1質量%。 [12]如[1]至[11]中任一項所述之組成物,其中,含金屬氮化物的粒子的含量相對於組成物的總固體成分,為20~70質量%。 [13]如[1]至[12]中任一項所述之組成物,其還含有分散劑,分散劑含有選自由聚丙烯酸甲酯、聚甲基丙烯酸甲酯及環狀或鏈狀的聚酯所組成的群組中的至少1種結構。 [14]如[13]所述之組成物,其中,分散劑相對於含金屬氮化物的粒子之質量比為0.05~0.30。 [15]如[1]至[14]中任一項所述之組成物,其中,含金屬氮化物的粒子係被含有氫氧化鋁之無機化合物包覆之含金屬氮化物的粒子。 [16]一種組成物的製造方法,其為製造[1]至[15]中任一項所述之組成物的製造方法,其含有藉由熱電漿法獲得含金屬氮化物的粒子之製程。 [17]一種硬化膜,其使用[1]至[15]中任一項所述之組成物來獲得。 [18]一種濾色器,其含有[17]所述之硬化膜。 [19]一種遮光膜,其含有[17]所述之硬化膜。 [20]一種固態攝影元件,其含有[17]所述之硬化膜。 [21]一種圖像顯示裝置,其含有[17]所述之硬化膜。 [發明效果][1] A composition containing metal nitride particles containing atom A, wherein the metal nitride particles contain transition metals other than titanium among transition metals of groups 3 to 11 and have an electronegativity of 1.22 ~2.36 transition metal nitride, atom A is an element different from the transition metal constituting the transition metal nitride, at least selected from the group consisting of boron, aluminum, silicon, manganese, iron, nickel and silver In one type, the content of atom A in the metal nitride-containing particles is 0.00005 to 10% by mass. [2] The composition according to [1], wherein the electrical conductivity of the metal nitride-containing particles is 100×10 4 to 600×10 4 S/m. [3] The composition according to [1] or [2], wherein the metal nitride-containing particles have an average primary particle size of 10 to 50 nm. [4] The composition according to any one of [1] to [3], which further contains a binding resin. [5] The composition according to [4], wherein the mass ratio of the binder resin to the metal nitride-containing particles is 0.3 or less. [6] The composition according to any one of [1] to [5], the transition metal is selected from the group consisting of V, Cr, Y, Zr, Nb, Hf, Ta, W and Re At least one. [7] The composition according to any one of [1] to [6], wherein the transition metal is at least one selected from the group consisting of V and Nb. [8] The composition according to any one of [1] to [7], which further contains a polymerizable compound. [9] The composition according to any one of [1] to [8], which further contains a polymerization initiator. [10] The composition according to any one of [1] to [9], which further contains a solvent and has a solid content of 10 to 40% by mass. [11] The composition according to [10], wherein the solvent contains water, and the water content is 0.1 to 1% by mass relative to the total mass of the composition. [12] The composition according to any one of [1] to [11], wherein the content of the metal nitride-containing particles is 20 to 70% by mass relative to the total solid content of the composition. [13] The composition according to any one of [1] to [12], which further contains a dispersant, and the dispersant contains polymethyl acrylate, polymethyl methacrylate, and cyclic or chain At least one structure in the group consisting of polyester. [14] The composition according to [13], wherein the mass ratio of the dispersant to the metal nitride-containing particles is 0.05 to 0.30. [15] The composition according to any one of [1] to [14], wherein the metal nitride-containing particles are metal nitride-containing particles coated with an inorganic compound containing aluminum hydroxide. [16] A method for producing a composition, which is a method for producing the composition described in any one of [1] to [15], which includes a process for obtaining metal nitride-containing particles by a thermoplasma method. [17] A cured film obtained using the composition described in any one of [1] to [15]. [18] A color filter containing the cured film described in [17]. [19] A light-shielding film containing the cured film described in [17]. [20] A solid-state imaging element containing the cured film described in [17]. [21] An image display device containing the cured film described in [17]. [Effects of the invention]

依本發明,能夠提供一種能夠製作具有優異之遮光性、優異之解像性及優異之電極的防腐性之硬化膜之(以下,還稱作“具有本發明的效果”。)組成物。並且,依本發明,能夠提供一種組成物的製造方法、硬化膜、濾色器、遮光膜、固態攝影元件及圖像顯示裝置。According to the present invention, it is possible to provide a composition capable of producing a cured film having excellent light-shielding properties, excellent resolution, and excellent electrode corrosion resistance (hereinafter, also referred to as "the effect of the present invention") composition. Furthermore, according to the present invention, it is possible to provide a method for manufacturing a composition, a cured film, a color filter, a light shielding film, a solid-state imaging device, and an image display device.

以下,對組成物,按構成組成物之每個成分進行詳細說明。 本說明書中,使用“~”表示之數值範圍表示含有記載於“~”的前後之數值作為下限值及上限值之範圍。 並且,本說明書中的基團(原子團)的表述中,未記載取代及未取代之表述係與不含有取代基者一同還包含含有取代基者。例如,“烷基”不僅包含不含有取代基之烷基(未取代烷基),還包含含有取代基之烷基(取代烷基)。 並且,本說明書中,“活性光線”或“放射線” 例如表示水銀燈的明線光譜及準分子雷射為代表之遠紫外線、極紫外線(EUV:Extreme ultraviolet lithography光)、X射線以及電子束等。並且,本說明書中,“光” 表示活性光線或放射線。關於本說明書中的“曝光”,除非另有指明,則不僅限於基於水銀燈的明線光譜、準分子雷射為代表之遠紫外線、X射線以及EUV光等之曝光,基於電子束及離子束等粒子束之描繪亦包含在曝光中。 並且,本說明書中,“(甲基)丙烯酸酯”表示丙烯酸酯及甲基丙烯酸酯。並且,本說明書中,“(甲基)丙烯酸”表示丙烯酸及甲基丙烯酸。並且,本說明書中,“(甲基)丙烯醯基”表示丙烯醯基及甲基丙烯醯基。並且,本說明書中,“(甲基)丙烯醯胺”表示丙烯醯胺及甲基丙烯醯胺。並且,本說明書中,“單體”與“單體(monomer)”的含義相同。單體與寡聚物及聚合物有所區別,指重量平均分子量為2,000以下的化合物。本說明書中,聚合性化合物係指含有聚合性基團之化合物,可以係單體,亦可以係聚合物。聚合性基團係指參與聚合反應之基團。 [組成物] 上述組成物係含有包含原子A之含金屬氮化物的粒子之組成物,其中,含金屬氮化物的粒子含有在3~11族的過渡金屬中除鈦以外的過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物,原子A係與上述過渡金屬不同之元素,係選自由硼、鋁、矽、錳、鐵、鎳及銀所組成的群組中的至少1種,含金屬氮化物的粒子中的原子A的含量為0.00005~10質量%。對於上述組成物具有本發明的效果之理由,雖尚不明確,但本發明人等推斷如下。另外,並非依據以下推斷限定上述組成物發揮本發明的效果之機制。Hereinafter, the composition will be described in detail for each component constituting the composition. In this specification, the numerical range indicated by "~" means the range containing the numerical value described before and after "~" as the lower limit and the upper limit. In addition, in the expression of a group (atomic group) in this specification, expressions that do not describe substitution and unsubstituted include those that do not contain substituents, and include those that contain substituents. For example, "alkyl" includes not only alkyl groups without substituents (unsubstituted alkyl groups), but also alkyl groups with substituents (substituted alkyl groups). In addition, in this specification, "active light" or "radiation" means extreme ultraviolet, extreme ultraviolet (EUV: Extreme ultraviolet lithography), X-rays, electron beams, etc. represented by the bright-ray spectrum of mercury lamps and excimer lasers, for example. In addition, in this specification, "light" means active light or radiation. Regarding the "exposure" in this manual, unless otherwise specified, it is not limited to exposure based on the bright line spectrum of mercury lamps, extreme ultraviolet light represented by excimer lasers, X-rays and EUV light, and based on electron beams and ion beams, etc. The description of the particle beam is also included in the exposure. In addition, in this specification, "(meth)acrylate" means acrylate and methacrylate. In addition, in this specification, "(meth)acrylic acid" means acrylic acid and methacrylic acid. In addition, in this specification, "(meth)acryloyl group" means an acryloyl group and a methacryloyl group. In addition, in this specification, "(meth)acrylamide" means acrylamide and methacrylamide. In addition, in this specification, "monomer" and "monomer" have the same meaning. Monomers are distinguished from oligomers and polymers and refer to compounds with a weight average molecular weight of 2,000 or less. In this specification, a polymerizable compound refers to a compound containing a polymerizable group, and may be a monomer or a polymer. The polymerizable group refers to a group that participates in a polymerization reaction. [Composition] The above-mentioned composition is a composition containing particles of metal nitride containing atom A, wherein the particles containing metal nitride contain transition metals other than titanium among the transition metals of groups 3 to 11 and are electronegative. Nitrides of transition metals with properties ranging from 1.22 to 2.36, atom A is an element different from the above transition metals, at least one selected from the group consisting of boron, aluminum, silicon, manganese, iron, nickel and silver, The content of atom A in the metal nitride-containing particles is 0.00005 to 10% by mass. Although the reason why the above-mentioned composition has the effect of the present invention is not clear, the present inventors inferred as follows. In addition, the mechanism by which the above-mentioned composition exerts the effect of the present invention is not limited based on the following estimation.

上述組成物含有在3~11族的過渡金屬中除鈦以外的過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物。 上述氮化物的價帶由氮2p軌道構成,故與氧化物相比,價帶更靠負側。並且,如上述,上述氮化物包含具有規定的電負性之過渡金屬,故上述價帶與導帶之間的帶隙變得更小。其結果,推斷上述過渡金屬的氮化物係吸收更寬的波長區域的光(遮光性變高)者。另外,本說明書中的電負性表示基於鮑林(Pauling)的定義之電負性。 並且,上述組成物含有原子A。不僅遮光性較高,還能夠控制用於圖案形成之波長(例如,i射線:365nm)中的光的透射性。具體而言,能夠使圖案形成所必需之光透射。亦即,上述組成物具有優異之解像性。而且,上述組成物將原子A的含量設定為規定的範圍,故具有優異之電極的防腐性。The above composition contains nitrides of transition metals other than titanium among transition metals of groups 3 to 11 and whose electronegativity is 1.22 to 2.36. The valence band of the above-mentioned nitrides is composed of nitrogen 2p orbitals, so the valence band is closer to the negative side than oxides. In addition, as described above, the nitride contains a transition metal having a predetermined electronegativity, so the band gap between the valence band and the conduction band becomes smaller. As a result, it is inferred that the nitride system of the transition metal absorbs light in a wider wavelength region (the light-shielding property becomes higher). In addition, the electronegativity in this specification means the electronegativity based on Pauling's definition. In addition, the aforementioned composition contains atom A. Not only the light shielding property is high, but also the transmittance of light in the wavelength used for pattern formation (for example, i-ray: 365nm) can be controlled. Specifically, it is possible to transmit light necessary for pattern formation. That is, the above composition has excellent resolution. In addition, the above composition has the content of atom A in a predetermined range, and therefore has excellent corrosion resistance of the electrode.

〔含金屬氮化物的粒子〕 上述含金屬氮化物的粒子係含有原子A之含金屬氮化物的粒子。作為上述含金屬氮化物的粒子含有原子A之態樣,並無特別限制,可以以離子、金屬化合物(亦含有絡合物)、金屬間化合物、合金、氧化物、複合氧化物、氮化物、氮氧化物、硫化物及硫氧化物等任一形態包含。並且,含金屬氮化物的粒子中包含之原子A可作為晶格間位置的雜質而存在,亦可在晶界以非晶質狀態作為雜質而存在。[Metal Nitride-Containing Particles] The above-mentioned metal nitride-containing particles are metal nitride-containing particles containing atom A. The aspect in which the metal nitride-containing particles contain atom A is not particularly limited, and may be ions, metal compounds (including complexes), intermetallic compounds, alloys, oxides, composite oxides, nitrides, Any form such as nitrogen oxide, sulfide, and sulfur oxide is included. In addition, the atom A contained in the metal nitride-containing particle may exist as an impurity in the inter-lattice position, or may exist as an impurity in an amorphous state at the grain boundary.

<原子A> 原子A包含在含金屬氮化物的粒子中。原子A係與下述過渡金屬不同之元素,係選自由硼、鋁、矽、錳、鐵、鎳及銀所組成的群組中的至少1種。其中,從組成物具有更優異之本發明的效果之角度考慮,選自由鋁、矽、鐵、鎳及銀所組成的群組中的至少1種為較佳,選自由鐵、矽及鎳所組成的群組中的至少1種為更佳。原子A可單獨使用1種,亦可倂用2種以上。<Atom A> The atom A is contained in the metal nitride-containing particles. The atom A is an element different from the following transition metals, and is at least one selected from the group consisting of boron, aluminum, silicon, manganese, iron, nickel, and silver. Among them, from the viewpoint that the composition has more excellent effects of the present invention, at least one selected from the group consisting of aluminum, silicon, iron, nickel and silver is preferably selected from the group consisting of iron, silicon and nickel. It is more preferable that at least one of the groups is formed. Atom A may be used singly, or two or more of them may be used.

含金屬氮化物的粒子中的原子A的含量為0.00005~10質量%。若原子A的含量小於下限值,則可藉由上述組成物獲得之硬化膜的解像性較差。若原子A的含量超過上限值,則可藉由上述組成物獲得之硬化膜的遮光性及電極的防腐性較差。其中,從可藉由上述組成物獲得之硬化膜具有更優異之電極的防腐性的角度考慮,原子A的含量為0.00005質量%以上且小於1%為較佳,0.00005質量%以上且小於0.1%為更佳。 並且,若為0.00005質量%以上且小於10質量%,則可藉由上述組成物獲得之硬化膜具有更優異之遮光性。 其中,含金屬氮化物的粒子中的原子A的含量藉由ICP(Inductively Coupled Plasma:高頻電感耦合電漿)發光分光分析法進行測定。The content of atom A in the metal nitride-containing particles is 0.00005 to 10% by mass. If the content of atom A is less than the lower limit, the resolution of the cured film that can be obtained from the above composition is poor. If the content of atom A exceeds the upper limit, the light-shielding property of the cured film obtainable from the above composition and the corrosion resistance of the electrode are inferior. Among them, from the viewpoint that the cured film obtained from the above composition has more excellent corrosion resistance of the electrode, the content of atom A is preferably 0.00005 mass% or more and less than 1%, and 0.00005 mass% or more and less than 0.1% For better. In addition, if it is 0.00005% by mass or more and less than 10% by mass, the cured film obtained from the above composition has more excellent light-shielding properties. Among them, the content of atom A in the metal nitride-containing particles is measured by ICP (Inductively Coupled Plasma) emission spectrometry.

<過渡金屬的氮化物> 上述含金屬氮化物的粒子含有在3~11族的過渡金屬中除鈦以外的過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物。作為上述過渡金屬(括號內為電負性),可舉出3族的過渡元素的Sc(1.36)、Dy(1.22)、Ho(1.23)、Er(1.24)、Tm(1.25)、Lu(1.27)、Th(1.3)、Pa(1.5)、U(1.38)、Np(1.36)、Pu(1.28)、Am(1.3)、Cm(1.3)、Bk(1.3)、Cf(1.3)、Es(1.3)、Fm(1.3)、Md(1.3)、No(1.3)、Lr(1.3);4族的Zr(1.33)、Hf(1.3);5族的V(1.63)、Nb(1.6)、Ta(1.5);6族的Cr(1.66)、Mo(2.16)、W(2.36);7族的Mn(1.55)、Tc(1.9)、Re(1.9);8族的Fe(1.83)、Ru(2.2)、Os(2.2);9族的Co(1.88)、Rh(2.28)、Ir(2.2);10族的Ni(1.91)、Pd(2.2)、Pt(2.28);11族的Cu(1.9)、Ag(1.93)。其中,從組成物具有更優異之本發明的效果之角度考慮,Sc、V、Cr、Mn、Fe、Co、Ni、Cu、Y、Zr、Nb、Mo、Tc、Ru、Rh、Pd、Ag、Hf、Ta、W、Re、Os、Ir或Pt為較佳,Sc、V、Cr、Co、Cu、Y、Zr、Mo、Tc、Ru、Rh、Pd、Hf、Ta、W、Re、Os、Ir或Pt為更佳,V、Cr、Y、Zr、Nb、Hf、Ta、W或Re為進一步較佳,V、Cr、Y、Nb、Ta、W或Re尤為佳,V或Nb尤其更佳,Nb為最佳。<Nitrides of transition metals> The above-mentioned metal-containing nitride particles contain transition metals other than titanium among the transition metals of groups 3 to 11 and have an electronegativity of transition metal nitrides of 1.22 to 2.36. Examples of the transition metals (electronegativity in parentheses) include Sc (1.36), Dy (1.22), Ho (1.23), Er (1.24), Tm (1.25), Lu (1.27) of transition elements of group 3 ), Th(1.3), Pa(1.5), U(1.38), Np(1.36), Pu(1.28), Am(1.3), Cm(1.3), Bk(1.3), Cf(1.3), Es(1.3 ), Fm(1.3), Md(1.3), No(1.3), Lr(1.3); Zr(1.33), Hf(1.3) of group 4; V(1.63), Nb(1.6), Ta( 1.5); Group 6 Cr (1.66), Mo (2.16), W (2.36); Group 7 Mn (1.55), Tc (1.9), Re (1.9); Group 8 Fe (1.83), Ru (2.2 ), Os (2.2); Group 9 Co (1.88), Rh (2.28), Ir (2.2); Group 10 Ni (1.91), Pd (2.2), Pt (2.28); Group 11 Cu (1.9) , Ag (1.93). Among them, from the viewpoint of the composition having more excellent effects of the present invention, Sc, V, Cr, Mn, Fe, Co, Ni, Cu, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag , Hf, Ta, W, Re, Os, Ir or Pt are preferred, Sc, V, Cr, Co, Cu, Y, Zr, Mo, Tc, Ru, Rh, Pd, Hf, Ta, W, Re, Os, Ir or Pt is more preferred, V, Cr, Y, Zr, Nb, Hf, Ta, W or Re is further preferred, V, Cr, Y, Nb, Ta, W or Re is particularly preferred, V or Nb Particularly better, Nb is the best.

含金屬氮化物的粒子中的“構成過渡金屬的氮化物之過渡金屬”的含量相對於含金屬氮化物的粒子的總質量,10~85質量%為較佳,15~75質量%為更佳,20~70質量%為進一步較佳。含金屬氮化物的粒子中的“構成過渡金屬的氮化物之過渡金屬”的含量能夠藉由ICP(Inductively Coupled Plasma)發光分光分析法進行分析。 含金屬氮化物的粒子中的氮原子(N原子)的含量相對於含金屬氮化物的粒子的總質量,3~60質量%為較佳,5~50質量%為更佳,10~40質量%為進一步較佳。氮原子的含量能夠藉由惰性氣體熔融熱導法進行分析。 含金屬氮化物的粒子作為主成分含有金屬氮化物,可藉由粒子表面的氧化等,含有一部分氧原子。粒子表面的氧化例如在合成金屬氮化物時混入氧的情況或粒徑較小之情況下,變得更顯著。 含金屬氮化物的粒子中的氧原子的含量相對於含金屬氮化物的粒子的總質量,1~40質量%為較佳,1~35質量%為更佳,5~30質量%為進一步較佳。氧原子的含量能夠藉由惰性氣體熔融紅外線吸收法進行分析。The content of the "transition metal constituting the nitride of the transition metal" in the metal nitride-containing particles is preferably 10 to 85% by mass, and more preferably 15 to 75% by mass relative to the total mass of the metal nitride-containing particles , 20 to 70% by mass is more preferable. The content of the "transition metal constituting the nitride of the transition metal" in the metal nitride-containing particles can be analyzed by ICP (Inductively Coupled Plasma) emission spectrometry. The content of nitrogen atoms (N atoms) in the metal nitride-containing particles relative to the total mass of the metal nitride-containing particles is preferably 3-60% by mass, more preferably 5-50% by mass, and 10-40% by mass % Is more preferable. The content of nitrogen atoms can be analyzed by the inert gas fusion thermal conductivity method. The metal nitride-containing particle contains a metal nitride as a main component, and may contain a part of oxygen atoms due to oxidation of the particle surface or the like. The oxidation of the particle surface becomes more pronounced when, for example, oxygen is mixed in during the synthesis of metal nitride or when the particle size is small. The content of oxygen atoms in the metal nitride-containing particles relative to the total mass of the metal nitride-containing particles is preferably 1-40% by mass, more preferably 1-35% by mass, and more preferably 5-30% by mass. good. The content of oxygen atoms can be analyzed by inert gas fusion infrared absorption method.

從經時穩定性及遮光性的觀點考慮,含金屬氮化物的粒子的比表面積為5m2 /g以上100m2 /g以下為較佳,10m2 /g以上60m2 /g以下為更佳。比表面積能夠藉由BET(Brunauer、Emmett、Teller)法求出。From the viewpoint of stability over time and light-shielding properties, the specific surface area of the metal nitride-containing particles is preferably 5 m 2 /g or more and 100 m 2 /g or less, and more preferably 10 m 2 /g or more and 60 m 2 /g or less. The specific surface area can be obtained by the BET (Brunauer, Emmett, Teller) method.

含金屬氮化物的粒子可以係包含含金屬氮化物的粒子與金屬微粒之複合微粒。 複合微粒係指,含金屬氮化物的粒子與金屬微粒進行複合化或處於高度分散之狀態之粒子。其中,“進行複合化”表示,粒子由金屬氮化物與金屬的兩個成分構成,“高度分散之狀態”表示,含金屬氮化物的粒子與金屬粒子分別個別地存在,且少量成分的粒子未凝聚而均勻、相同地分散。 作為金屬微粒,並無特別限制,例如可舉出選自銅、金、鉑、鈀、錫、鈷、銠、銥、釕、鋨、鉬、鎢、鈮、鉭、鈣、鉍、銻及鉛、以及該些的合金之至少一種。其中,選自銅、金、鉑、鈀、錫、鈷、銠及銥、以及該些的合金之至少1種為較佳,選自銅、金、鉑及錫、以及該些的合金之至少1種為更佳。 作為含金屬氮化物的粒子中的金屬微粒的含量,相對於含金屬氮化物的粒子的總質量,5~50質量%為較佳,10~30質量%為更佳。The metal nitride-containing particles may be composite particles including metal nitride-containing particles and metal fine particles. Composite particles refer to particles in which metal nitride-containing particles and metal particles are compounded or in a highly dispersed state. Among them, "combined" means that the particles are composed of two components of metal nitride and metal, and "highly dispersed state" means that the particles containing metal nitride and the metal particles exist separately, and the particles with a small amount of components are not Aggregate and disperse uniformly and uniformly. The metal particles are not particularly limited, and examples include those selected from copper, gold, platinum, palladium, tin, cobalt, rhodium, iridium, ruthenium, osmium, molybdenum, tungsten, niobium, tantalum, calcium, bismuth, antimony, and lead , And at least one of these alloys. Among them, at least one selected from copper, gold, platinum, palladium, tin, cobalt, rhodium and iridium, and these alloys is preferred, and at least one selected from copper, gold, platinum and tin, and these alloys One is better. The content of the metal fine particles in the metal nitride-containing particles is preferably 5 to 50% by mass, and more preferably 10 to 30% by mass relative to the total mass of the metal nitride-containing particles.

<含金屬氮化物的粒子的製造方法> 製造含金屬氮化物的粒子時,通常利用氣相反應法,具體而言,可舉出電爐法及熱電漿法等。該些製法中,從雜質的混入較少之角度、粒徑易一致之角度及生產率較高之角度等理由考慮,熱電漿法為較佳。 作為基於熱電漿法之含金屬氮化物的粒子的具體的製造方法,例如,可舉出利用金屬微粒製造装置者。金屬微粒製造装置例如由產生熱電漿之電漿炬、向電漿炬內供給金屬原料粉末之材料供給装置、含有冷卻功能之腔室、對所生成之金屬微粒進行分級之旋風分離器、及回收金屬微粒之回收部構成。 另外,本說明書中,金屬微粒表示含有金屬元素之一次粒徑為20nm~40μm的粒子。<Method for producing metal nitride-containing particles> When producing metal nitride-containing particles, a gas phase reaction method is generally used. Specifically, an electric furnace method, a thermoplasma method, and the like are mentioned. Among these production methods, the thermoplasmic method is preferable from the viewpoint of less mixing of impurities, the viewpoint of easy uniformity of particle size, and the viewpoint of higher productivity. As a specific manufacturing method of metal nitride-containing particles by the thermoplasma method, for example, a manufacturing device using metal fine particles can be cited. The metal particle manufacturing device includes, for example, a plasma torch that generates thermoplasma, a material supply device that supplies metal raw material powder into the plasma torch, a chamber with a cooling function, a cyclone separator that classifies the generated metal particles, and recovery The structure of the recycling part of metal particles. In addition, in this specification, the metal fine particles refer to particles with a primary particle diameter of 20 nm to 40 μm containing a metal element.

作為利用金屬微粒製造装置之含金屬氮化物的粒子的製造方法,並無特別限定,能夠利用公知的方法。其中,從下述的規定的平均一次粒徑的含金屬氮化物的粒子的產率提高之角度考慮,利用金屬微粒製造装置製造含金屬氮化物的粒子之方法含有以下所示之製程為較佳。 製程A:向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程。 製程B:向電漿炬內的熱電漿火焰供給含有過渡金屬之金屬原料粉末,使上述金屬原料粉末蒸發來獲得氣相的原料金屬之製程。 製程C:冷卻上述氣相的原料金屬來獲得含有過渡金屬之金屬微粒之製程。 製程D:向電漿炬內供給含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程。 製程E:向電漿炬內的熱電漿火焰供給含有過渡金屬之金屬微粒,使上述金屬微粒蒸發來獲得氣相的原料金屬之製程。 製程F:冷卻上述氣相的原料金屬來獲得含金屬氮化物的粒子之製程。 並且,含金屬氮化物的粒子的製造方法可在上述的製程C和/或製程F之後依據需要含有下述的製程G。 製程G:對所獲得之粒子進行分級之製程。 而且,亦可在製程A之前、製程A與製程B之間、製程C與製程D之間或製程D與E之間含有以下的製程A2。 製程A2:向含有過渡金屬之金屬原料粉末混合原子A之製程。 而且,亦可在上述製程A2之前含有以下的製程A3-1~A3-3。 製程A3-1:向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程 製程A3-2:向電漿炬內的熱電漿火焰供給含有原子A之原料粉末,使上述原料粉末蒸發來獲得氣相的原子A之製程 製程A3-3:冷卻上述氣相的原子A來獲得被微粒化之原子A之製程 另外,亦可在製程A3-3之後還含有製程G。 另外,本說明書中,被微粒化之原子A表示含有原子A之一次粒徑為20nm~40μm的粒子。The method for producing metal nitride-containing particles using the metal fine particle production device is not particularly limited, and a known method can be used. Among them, from the viewpoint of improving the yield of metal nitride-containing particles with the following prescribed average primary particle diameters, it is preferable that the method for producing metal nitride-containing particles using a metal fine particle manufacturing device includes the following process . Process A: A process in which inert gas without nitrogen is supplied as a plasma gas into the plasma torch to generate a thermal plasma flame. Process B: A process of supplying the metal raw material powder containing transition metal to the thermoplasma flame in the plasma torch, and evaporating the metal raw material powder to obtain the raw material metal in the gas phase. Process C: A process of cooling the raw material metal in the gas phase to obtain metal particles containing transition metals. Process D: A process in which inert gas containing nitrogen is supplied as a plasma gas into the plasma torch to generate a thermoplasma flame. Process E: A process in which metal particles containing transition metals are supplied to the thermoplasma flame in the plasma torch, and the metal particles are evaporated to obtain the raw material metal in the gas phase. Process F: A process of cooling the raw material metal in the gas phase to obtain metal nitride-containing particles. In addition, the method for manufacturing the metal nitride-containing particles may include the following process G after the aforementioned process C and/or process F as needed. Process G: The process of classifying the obtained particles. Moreover, the following process A2 may be included before process A, between process A and process B, between process C and process D, or between process D and E. Process A2: A process of mixing atoms A into metal raw material powders containing transition metals. Furthermore, the following processes A3-1 to A3-3 may be included before the above process A2. Process A3-1: The process of supplying inert gas without nitrogen as the plasma gas to generate the thermoplasma flame. Process A3-2: Supplying the raw material powder containing atom A to the thermoplasma flame in the plasma torch. The process of vaporizing the above-mentioned raw material powder to obtain atom A in the gas phase. Process A3-3: The process of cooling the atom A in the gas phase to obtain atom A that is atomized. In addition, process G can also be included after process A3-3 . In addition, in this specification, atom A to be atomized means a particle containing atom A with a primary particle diameter of 20 nm to 40 μm.

而且,上述含金屬氮化物的粒子的製造方法在製程F之後(含有製程G時,在製程F之後的製程G之後)還含有下述的製程H為較佳。 製程H:將在製程F(或製程G)中獲得之含金屬氮化物的粒子暴露於水蒸氣及氮氣的混合氛圍來進行氮化處理之製程。 另外,依據需要,上述含金屬氮化物的粒子的製造方法亦可在製程H之後還含有製程G。以下,對各製程的較佳態様進行詳細說明。In addition, the method for manufacturing the metal nitride-containing particles described above preferably includes the following process H after the process F (when the process G is included, after the process G after the process F). Process H: A process in which the metal nitride-containing particles obtained in process F (or process G) are exposed to a mixed atmosphere of water vapor and nitrogen for nitriding treatment. In addition, the manufacturing method of the above-mentioned metal nitride-containing particles may also include a process G after the process H, if necessary. Hereinafter, the preferred state of each manufacturing process will be described in detail.

・製程A 製程A係向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程。作為熱電漿火焰的產生方法,並無特別限定,可舉出直流電弧放電法、多相電弧放電法、高頻電漿法及混合電漿法等,來自電極的雜質的混入較少之高頻電漿法為較佳。 作為基於高頻電漿法之熱電漿火焰的產生方法,並無特別限制,例如,可舉出向含有高頻振蕩用線圈與石英管之電漿炬內供給電漿氣體,對上述高頻振蕩用線圈施加高頻電流,藉此獲得熱電漿火焰之方法。 作為製程A中的上述電漿氣體,可利用不含有氮氣之惰性氣體。作為不含有氮氣之惰性氣體,可舉出氬氣及氫氣等。不含有氮氣之惰性氣體可單獨使用1種,亦可倂用2種以上。・Process A Process A is a process in which an inert gas containing no nitrogen is supplied as a plasma gas into the plasma torch to generate a thermal plasma flame. The method of generating thermoplasma flame is not particularly limited. Examples include direct current arc discharge method, multiphase arc discharge method, high frequency plasma method, and hybrid plasma method. The plasma method is preferred. The method of generating a thermoplasma flame based on the high-frequency plasma method is not particularly limited. For example, a plasma torch containing a coil for high-frequency oscillation and a quartz tube can be supplied with plasma gas to react to the above-mentioned high-frequency oscillation. A method of using a coil to apply a high-frequency current to obtain a thermoplasma flame. As the above-mentioned plasma gas in process A, an inert gas that does not contain nitrogen can be used. Examples of the inert gas that does not contain nitrogen include argon, hydrogen, and the like. The inert gas that does not contain nitrogen can be used singly, or two or more of them can be used.

・製程A2 製程A2係向含有過渡金屬之金屬原料粉末混合原子A之製程。作為原料金屬粉末及原子A的混合方法,並無特別限制,能夠利用公知的方法。例如,向電漿炬內供給金屬原料粉末之上述材料供給装置可含有混合及分散功能。具體而言,能夠利用國際公開第2010/147098號公報的段落0047~0058中記載之材料供給装置,該內容引入本說明書中。另外,作為含金屬氮化物的粒子的製造方法,亦可在製程A2之前還含有以下的製程A3-1~A3-3。・Process A2 Process A2 is a process in which atom A is mixed with metal raw material powders containing transition metals. The mixing method of the raw metal powder and atom A is not particularly limited, and a known method can be used. For example, the aforementioned material supply device for supplying metal raw material powder into the plasma torch may include mixing and dispersing functions. Specifically, the material supply device described in paragraphs 0047 to 0058 of International Publication No. 2010/147098 can be used, and this content is incorporated into this specification. In addition, as a method of manufacturing metal nitride-containing particles, the following processes A3-1 to A3-3 may be included before process A2.

・製程B 製程B係向電漿炬內的熱電漿火焰供給含有過渡金屬之金屬原料粉末,使上述金屬原料粉末蒸發來獲得氣相的原料金屬之製程。作為向電漿炬內的熱電漿火焰供給金屬原料粉末之方法,並無特別限制,從所獲得之氣相的原料金屬成為更均勻之狀態之角度考慮,利用載體氣體噴霧為較佳。另外,作為載體氣體,利用不含有氮氣之惰性氣體為較佳。不含有氮氣之惰性氣體的態様如上述。 另外,製造含金屬氮化物的粒子之方法含有上述製程A2時,在將金屬原料粉末供給至電漿炬內之間,金屬原料粉末維持均勻的分散狀態為較佳。・Process B Process B is a process of supplying the metal raw material powder containing transition metal to the thermoplasma flame in the plasma torch, and evaporating the above metal raw material powder to obtain the raw material metal in the gas phase. The method of supplying the metal raw material powder to the thermoplasma flame in the plasma torch is not particularly limited. From the viewpoint that the obtained gas phase raw material metal becomes a more uniform state, it is preferable to spray with a carrier gas. In addition, as the carrier gas, an inert gas that does not contain nitrogen is preferably used. The state of the inert gas that does not contain nitrogen is as described above. In addition, when the method for producing metal nitride-containing particles includes the above-mentioned process A2, it is preferable that the metal raw material powder maintains a uniform dispersion state between the supply of the metal raw material powder into the plasma torch.

・製程C 製程C係冷卻氣相的原料金屬來獲得含有過渡金屬之金屬微粒之製程。作為冷卻方法,並無特別限制,利用含有冷卻功能之腔室為較佳。將在上述製程B中獲得之氣相的原料金屬導入含有上述冷卻功能之腔室,在腔室內快速冷卻,藉此能夠生成下述的所希望的粒徑的金屬微粒。所生成之金屬微粒例如藉由上述回收部回收。作為腔室內的氛圍,不含有氮氣之惰性氣體為較佳。不含有氮氣之惰性氣體的態様如上述。 另外,藉由經過上述製程A~C,可獲得含有過渡金屬之金屬微粒。含有過渡金屬之金屬微粒易在製程E中蒸發。並且,金屬原料粉末含有雜質時,亦能夠藉由經過上述製程A~C來去除上述雜質。・Process C Process C is a process of cooling the raw metal in the gas phase to obtain metal particles containing transition metals. The cooling method is not particularly limited, and it is preferable to use a chamber containing a cooling function. The raw material metal in the gas phase obtained in the above process B is introduced into a chamber containing the above cooling function, and rapidly cooled in the chamber, whereby the following metal fine particles of the desired particle size can be produced. The produced metal particles are recovered by the above-mentioned recovery unit, for example. As the atmosphere in the chamber, an inert gas that does not contain nitrogen is preferable. The state of the inert gas that does not contain nitrogen is as described above. In addition, by going through the above-mentioned processes A to C, metal particles containing transition metals can be obtained. Metal particles containing transition metals are easy to evaporate in process E. In addition, when the metal raw material powder contains impurities, the impurities can also be removed by going through the above-mentioned processes A to C.

・製程D 製程D係向電漿炬內供給含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程。作為含有氮之惰性氣體,可舉出氮氣及含有惰性氣體之氮氣。作為惰性氣體,可舉出氬氣及氫氣等。作為含有惰性氣體之氮氣,並無特別限制,氮氣的含量通常為10~90莫耳%左右,30~60莫耳%程度為較佳。其他態様與製程A相同。・Process D Process D is a process in which an inert gas containing nitrogen is supplied as a plasma gas into the plasma torch to generate a thermal plasma flame. Examples of the inert gas containing nitrogen include nitrogen and nitrogen containing inert gas. As the inert gas, argon gas, hydrogen gas, and the like can be cited. The nitrogen containing inert gas is not particularly limited, and the content of nitrogen is usually about 10 to 90 mol%, preferably about 30 to 60 mol%. Other aspects are the same as process A.

・製程E 製程E係向電漿炬內的熱電漿火焰供給含有過渡金屬之金屬微粒,使上述金屬微粒蒸發來獲得氣相的原料金屬之製程。作為向電漿炬內的熱電漿火焰供給金屬微粒之方法,如上述,作為載體氣體,含有氮之惰性氣體為較佳。含有氮之惰性氣體的態様如上述。 製程E中,向熱電漿火焰供給藉由製程A~製程C成為金屬微粒之原料金屬,故易獲得氣相的原料金屬,並且,氣相的原料金屬的狀態亦變得更均勻。・Process E Process E is a process in which metal particles containing transition metals are supplied to the thermal plasma flame in the plasma torch, and the metal particles are evaporated to obtain the raw material metal in the gas phase. As a method of supplying metal particles to the thermoplasma flame in the plasma torch, as described above, as the carrier gas, an inert gas containing nitrogen is preferred. The state of the inert gas containing nitrogen is as described above. In the process E, the raw material metal that becomes the metal particles through the process A to the process C is supplied to the thermoplasma flame, so the gas phase raw material metal is easily obtained, and the state of the gas phase raw material metal becomes more uniform.

・製程F 製程F係冷卻氣相的原料金屬來獲得含有過渡金屬的氮化物之含金屬氮化物的粒子之製程。冷卻方法的較佳態樣如上述,但作為腔室內的氛圍,含有氮氣之惰性氣體為較佳。含有氮氣之惰性氣體的較佳態樣如上述。・Process F Process F is a process of cooling the raw material metal in the gas phase to obtain metal nitride-containing particles containing transition metal nitrides. The preferred aspect of the cooling method is as described above, but as the atmosphere in the chamber, an inert gas containing nitrogen is preferred. Preferred aspects of the inert gas containing nitrogen are as described above.

・製程G 製程G係對所獲得之金屬微粒和/或含金屬氮化物的粒子進行分級之製程。作為分級方法,並無特別限制,例如,能夠利用旋風分離器。旋風分離器具有圓錐上的容器,具有在容器內產生迴旋流,利用離心力對粒子進行分級之功能。另外,分級在惰性氣體的氛圍下進行為較佳。惰性氣體的態樣如上述。・Process G Process G is a process of classifying the obtained metal particles and/or metal nitride-containing particles. The classification method is not particularly limited. For example, a cyclone separator can be used. The cyclone separator has a container on a cone, which has the function of generating a swirling flow in the container and using centrifugal force to classify particles. In addition, classification is preferably performed in an atmosphere of inert gas. The state of the inert gas is as described above.

・製程H 製程H係將含金屬氮化物的粒子暴露於水蒸氣及氮氣的混合氛圍來進行氮化處理之製程。藉由經過該製程,能夠使含金屬氮化物的粒子中的金屬氮化物的含量更多。對於將含金屬氮化物的粒子暴露於水蒸氣及氮氣的混合氛圍之方法,並無特別限制,例如,可舉出將含金屬氮化物的粒子導入於充滿混合有水蒸氣及氮氣之氣體之恆溫槽中,靜置或攪拌規定時間之方法,從含金屬氮化物的粒子的表面及晶界更穩定化之角度考慮,靜置為更佳。 另外,作為水蒸氣及氮氣的混合比例,若在大氣中,則相對濕度成為25~95%之條件為較佳。並且,靜置或攪拌之時間為0.5~72小時為較佳,此時的溫度為10~40℃為較佳。・Process H Process H is a process in which metal nitride-containing particles are exposed to a mixed atmosphere of water vapor and nitrogen for nitriding treatment. Through the process, the content of metal nitride in the metal nitride-containing particles can be increased. The method of exposing the metal nitride-containing particles to the mixed atmosphere of water vapor and nitrogen is not particularly limited. For example, it can be mentioned that the metal nitride-containing particles are introduced into a constant temperature filled with a gas mixed with water vapor and nitrogen. The method of standing or stirring for a predetermined time in the tank is more preferable from the viewpoint of stabilizing the surface and grain boundaries of the metal nitride-containing particles. In addition, as the mixing ratio of water vapor and nitrogen, if it is in the air, the relative humidity is preferably 25 to 95%. In addition, the time for standing or stirring is preferably 0.5 to 72 hours, and the temperature at this time is preferably 10 to 40°C.

・製程A3-1~A3-3 製程A3-1~A3-3係向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程(A3-1)、向電漿炬內的熱電漿火焰供給含有原子A之原料粉末並使上述原料粉末蒸發來獲得氣相的原子A之製程(A3-2)、及冷卻上述氣相的原子A來獲得包含原子A之微粒之製程(A3-3)。各個製程中的態様如在上述製程A、製程B(代替含有過渡金屬之金屬原料粉末,使用含有原子A之原料粉末)、及製程C(代替含有過渡金屬之金屬微粒,獲得被微粒化之原子A。)中已說明的內容。 另外,藉由經過上述製程,原子A被微粒化,於製程E中原子A變得易於蒸發。並且,藉由經過上述製程,能夠去除含有原子A之原料粉末所含有之雜質(原子A以外的金屬成分等)。・Processes A3-1~A3-3 Processes A3-1~A3-3 are the processes (A3-1) in which inert gas without nitrogen is supplied into the plasma torch as the plasma gas to generate the thermoplasma flame (A3-1). The thermoplasma flame in the torch supplies the raw material powder containing atom A and evaporates the raw material powder to obtain the atom A in the gas phase (A3-2), and cools the atom A in the gas phase to obtain the fine particles containing atom A Manufacturing process (A3-3). The state of each process is as in the above process A, process B (instead of the metal raw material powder containing transition metal, use the raw material powder containing atom A), and process C (instead of the metal particles containing transition metal to obtain atomized atoms A.) The content has been explained in. In addition, by going through the above process, the atom A is atomized, and the atom A becomes easy to evaporate in the process E. In addition, by going through the above process, impurities (metal components other than atom A, etc.) contained in the raw material powder containing atom A can be removed.

(含有原子A之含金屬氮化物的粒子的製造方法的較佳態樣) 作為含有上述原子A之含金屬氮化物的粒子的製造方法的較佳態樣,可舉出從上至下依次具有以下製程之含有原子A之含金屬氮化物的粒子的製造方法。 ・製程A:向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程。 ・製程B:向電漿炬內的熱電漿火焰供給含有過渡金屬之金屬原料粉末,使上述原料金屬粉末蒸發來獲得氣相的原料金屬之製程。 ・製程C:冷卻上述氣相的原料金屬來獲得含有過渡金屬之金屬微粒之製程。 ・製程G:對所獲得之粒子進行分級之製程。 ・製程A3-1:向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程 ・製程A3-2:向電漿炬內的熱電漿火焰供給含有原子A之原料粉末,使上述原料粉末蒸發來獲得氣相的原子A之製程 ・製程A3-3:冷卻上述氣相的原子A來獲得被微粒化之原子A之製程 ・製程G:對所獲得之粒子進行分級之製程。 ・製程A2:向含有過渡金屬之金屬原料粉末(此時,為金屬微粒)混合原子A(此時,為被微粒化之原子A)之製程。 ・製程D:向電漿炬內供給含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程。 ・製程E:向電漿炬內的熱電漿火焰供給含有過渡金屬之金屬微粒,使上述金屬微粒蒸發來獲得氣相的原料金屬之製程。 ・製程F:冷卻上述氣相的原料金屬來獲得含金屬氮化物的粒子之製程。 ・製程G:對所獲得之粒子進行分級之製程。 ・製程H:將在製程G中獲得之含金屬氮化物的粒子暴露於水蒸氣及氮氣的混合氛圍來進行氮化處理之製程。 另外,上述一系列製程中,可替換製程A~C及製程A3-1~A3-3的順序。亦即,可在製程A3-1~A3-3之後實施製程A~C。(Preferred aspect of the method for producing metal nitride-containing particles containing atom A) As a preferable aspect of the method for producing metal nitride-containing particles containing atom A, there may be mentioned from top to bottom The following process is a method of manufacturing metal nitride-containing particles containing atom A.・Process A: A process in which inert gas without nitrogen is supplied as a plasma gas into the plasma torch to generate a thermal plasma flame.・Process B: The process of supplying the metal raw material powder containing transition metal to the thermoplasma flame in the plasma torch, and evaporating the above raw metal powder to obtain the raw material metal in the gas phase.・Process C: The process of cooling the above-mentioned raw material metal in the gas phase to obtain metal particles containing transition metals.・Process G: The process of classifying the obtained particles.・Process A3-1: Inert gas without nitrogen is supplied to the plasma torch as a plasma gas to generate a thermoplasma flame. ・Process A3-2: Supply raw material containing atom A to the thermoplasma flame in the plasma torch Powder, the process of evaporating the above-mentioned raw material powder to obtain atom A in the gas phase. Process A3-3: The process of cooling the atom A in the gas phase to obtain atom A that is atomized. Process G: The obtained particles are classified The manufacturing process.・Process A2: A process of mixing atom A (at this time, atom A to be atomized) into metal raw material powder containing transition metal (in this case, metal particles).・Process D: A process in which inert gas containing nitrogen is supplied as a plasma gas into the plasma torch to generate a thermoplasma flame.・Process E: A process in which metal particles containing transition metals are supplied to the thermoplasma flame in the plasma torch, and the metal particles are evaporated to obtain the raw material metal in the gas phase.・Process F: The process of cooling the above-mentioned raw material metal in the gas phase to obtain metal nitride-containing particles.・Process G: The process of classifying the obtained particles.・Process H: A process in which the metal nitride-containing particles obtained in Process G are exposed to a mixed atmosphere of water vapor and nitrogen for nitriding treatment. In addition, in the above series of processes, the order of process A to C and process A3-1 to A3-3 can be replaced. That is, the processes A to C may be implemented after the processes A3-1 to A3-3.

依上述含有原子A之含金屬氮化物的粒子的製造方法的較佳態樣,能夠去除金屬原料粉末及原料粒子所含有之雜質,且能夠製造具有所希望的平均一次粒徑之含金屬氮化物的粒子。 可去除雜質之機制雖尚不明確,但本發明人等推斷如下。亦即,推斷為過渡金屬和/或原子A藉由電漿處理被離子化,上述離子被冷卻時,過渡金屬、原子A及雜質反映各自的熔點而被微粒化。此時,熔點較低之原子的粒子化較快,熔點較高之原子的粒子化較慢。故,如上述,推斷經過一次電漿處理之微粒(製程B及C、以及製程A3-2及A3-3)為易於成為單一成分(單結晶)者。若對藉由上述來獲得之單一成分的粒子進行分級,則能夠藉由過渡金屬的粒子和/或原子A的粒子與雜質的粒子的密度及/粒徑的不同來去除雜質的粒子。另外,上述分級例如能夠利用旋風分離器等並適當設定分級條件來進行。According to the preferred aspect of the method for producing metal-containing nitride particles containing atom A, the metal raw material powder and the impurities contained in the raw material particles can be removed, and the metal-containing nitride having the desired average primary particle size can be produced particle of. Although the mechanism by which impurities can be removed is not clear, the inventors of the present invention concluded as follows. That is, it is inferred that the transition metal and/or atom A are ionized by plasma treatment, and when the ions are cooled, the transition metal, atom A, and impurities are micronized by reflecting their respective melting points. At this time, the atomization of the atom with the lower melting point is faster, and the atomization of the atom with the higher melting point is slower. Therefore, as mentioned above, it is inferred that the particles (processes B and C, and processes A3-2 and A3-3) that have undergone a plasma treatment are likely to become a single component (single crystal). If the single-component particles obtained as described above are classified, the particles of the impurities can be removed by the difference in the density and/or particle size of the particles of the transition metal and/or the particles of the atom A and the particles of the impurities. In addition, the above-mentioned classification can be performed, for example, by using a cyclone or the like, and appropriately setting classification conditions.

(原料金屬粉末及原料粉末的純化) 作為能夠在上述製程B中使用之含有過渡金屬之金屬原料粉末(以下,簡單稱作“金屬原料粉末”。)及含有原子A之原料粉末(以下,簡單稱作“原料粉末”。),並無特別限制,高純度者為較佳。金屬原料粉末中的過渡金屬的含量並無特別限定,99.99%以上為較佳,99.999%以上為更佳。並且,原料粉末中的原子A的含量亦相同。(Purification of raw metal powder and raw material powder) As a transition metal-containing metal raw material powder (hereinafter, simply referred to as "metal raw material powder") that can be used in the above process B, and a raw material powder containing atom A (hereinafter, simply It is called "raw material powder".) There is no particular limitation, but high purity is preferred. The content of the transition metal in the metal raw material powder is not particularly limited, but 99.99% or more is preferable, and 99.999% or more is more preferable. In addition, the content of atom A in the raw material powder is also the same.

上述金屬原料粉末和/或原料粉末有時作為雜質含有所希望的過渡金屬和/或原子A以外的原子。作為金屬原料粉末中含有之雜質,可舉出硼、鋁、矽、錳、鐵、鎳及銀等。並且,作為原料粉末中含有之雜質,可舉出金屬元素等。The metal raw material powder and/or raw material powder may contain the desired transition metal and/or atoms other than atom A as impurities. Examples of impurities contained in the metal raw material powder include boron, aluminum, silicon, manganese, iron, nickel, and silver. In addition, as the impurities contained in the raw material powder, metal elements and the like can be mentioned.

上述組成物中,藉由將含金屬氮化物的粒子中的原子A的含量設為0.00005~10質量%,發揮本發明的效果。故,若金屬原料粉末和/或原料粉末中包含預想外的上述雜質,則很難將原子A的含量控制在規定的範圍,故變得不易獲得本發明的效果。故,上述含金屬氮化物的粒子的製造方法可在製程B之前(含有製程A2時,為製程A2之前)還含有以下的製程A0。 製程A0:從金屬原料粉末和/或原料粉末去除雜質之製程。In the above composition, the effect of the present invention is exhibited by setting the content of atom A in the metal nitride-containing particles to 0.00005 to 10% by mass. Therefore, if the metal raw material powder and/or raw material powder contains the above-mentioned unexpected impurities, it is difficult to control the content of atom A within a predetermined range, and it becomes difficult to obtain the effects of the present invention. Therefore, the method for manufacturing the metal nitride-containing particles may include the following process A0 before the process B (when the process A2 is included, it is before the process A2). Process A0: A process for removing impurities from metal raw material powder and/or raw material powder.

・製程A0 製程A0中,作為從原料金屬粉末和/或原料粉末去除雜質之方法(分離純化方法),並無特別限定,例如,對於鈮,可利用日本特開2012-211048號公報的段落0013~0030中記載之方法,對於其他原料金屬粉末和/或原料粉末,亦能夠利用依據該內容之方法。・Process A0 In process A0, the method of removing impurities from raw metal powder and/or raw material powder (separation and purification method) is not particularly limited. For example, for niobium, paragraph 0013 of JP 2012-211048 A can be used The method described in ~0030 can also be used for other raw metal powders and/or raw material powders according to the method.

(含金屬氮化物的粒子的包覆) 上述含金屬氮化物的粒子可以係被無機化合物包覆之含金屬氮化物的粒子。亦即,可以係具有含金屬氮化物的粒子及包覆含金屬氮化物的粒子之利用無機化合物形成之包覆層之包覆含金屬氮化物的粒子。含有被無機化合物包覆之含金屬氮化物的粒子之上述組成物具有更優異之分散穩定性。 作為無機化合物,並無特別限定,可舉出SiO2 、ZrO2 、TiO2 、GeO2 、Al2 O3 、Y2 O3 、及P2 O5 等氧化物、氫氧化鋁、以及氫氧化鋯等氫氧化物。其中,從易形成更薄的覆膜且易形成包覆率更高之覆膜之角度考慮,氫氧化鋁為較佳。 並且,意圖控制含金屬氮化物的粒子的折射率時,作為低折射率覆膜,氧化矽為較佳,作為高折射率覆膜,氫氧化鋯為較佳。 對於藉由無機化合物包覆含金屬氮化物的粒子之方法,並無特別限制,含金屬氮化物的粒子的製造方法含有下述無機化合物包覆製程為較佳。(Coating of metal nitride-containing particles) The above-mentioned metal nitride-containing particles may be metal nitride-containing particles coated with an inorganic compound. That is, it may be a metal nitride-coated particle having a metal nitride-containing particle and a coating layer formed of an inorganic compound coating the metal-nitride-containing particle. The above composition containing metal nitride-containing particles coated with an inorganic compound has more excellent dispersion stability. The inorganic compound is not particularly limited, and includes oxides such as SiO 2 , ZrO 2 , TiO 2 , GeO 2 , Al 2 O 3 , Y 2 O 3 , and P 2 O 5 , aluminum hydroxide, and hydroxide Hydroxides such as zirconium. Among them, aluminum hydroxide is preferred from the viewpoint of easy formation of a thinner coating film and easy formation of a coating film with a higher coverage rate. In addition, when it is intended to control the refractive index of the metal nitride-containing particles, silicon oxide is preferred as the low refractive index coating, and zirconium hydroxide is preferred as the high refractive index coating. The method for coating metal nitride-containing particles with an inorganic compound is not particularly limited, and it is preferable that the method for producing metal nitride-containing particles includes the following inorganic compound coating process.

・無機化合物包覆製程 無機化合物包覆製程係藉由氧化物和/或氫氧化物包覆上述含金屬氮化物的粒子之製程。作為包覆方法,並無特別限制,例如,可舉出以下的濕式塗佈法等。・Inorganic compound coating process The inorganic compound coating process is a process in which the above-mentioned metal nitride-containing particles are coated with oxides and/or hydroxides. The coating method is not particularly limited. For example, the following wet coating method and the like can be mentioned.

作為第1濕式塗佈法,首先,混合上述含金屬氮化物的粒子與水來製作漿料。接著,使上述漿料與含有選自由Si、Zr、Ti、Ge、Al、Y及P所組成的群組中的至少1種之水溶性化合物(例如,矽酸鈉)反應,藉由傾析法和/或離子交換樹脂等去除多於的鹼離子之後,使漿料乾燥來獲得被氧化物包覆之含金屬氮化物的粒子。As the first wet coating method, first, the above-mentioned metal nitride-containing particles and water are mixed to prepare a slurry. Next, the above slurry is reacted with a water-soluble compound (for example, sodium silicate) containing at least one selected from the group consisting of Si, Zr, Ti, Ge, Al, Y, and P, by decantation After removing excess alkali ions by method and/or ion exchange resin, the slurry is dried to obtain oxide-coated metal nitride-containing particles.

作為第2濕式塗佈法,首先,混合上述含金屬氮化物的粒子與醇等有機溶劑來製作漿料。接著,在上述漿料中生成含有選自由Si、Zr、Ti、Ge、Al、Y及P所組成的群組中的至少1種之醇鹽等有機金屬化合物,以高溫燒成上述漿料。若以高溫燒成上述漿料,則進行溶膠凝膠反應,可獲得被氧化物包覆之含金屬氮化物的粒子。As a second wet coating method, first, the above-mentioned metal nitride-containing particles and an organic solvent such as alcohol are mixed to prepare a slurry. Next, an organometallic compound such as alkoxide containing at least one selected from the group consisting of Si, Zr, Ti, Ge, Al, Y, and P is generated in the slurry, and the slurry is fired at a high temperature. If the above-mentioned slurry is fired at a high temperature, a sol-gel reaction proceeds, and metal nitride-containing particles coated with an oxide can be obtained.

作為第3濕式塗佈法,在含金屬氮化物的粒子的存在下,利用尿素與氯化鋁,形成含有離子液體之漿料。從該漿料取出含金屬氮化物的粒子並使其乾燥,之後,燒成上述含金屬氮化物的粒子,藉此可獲得被含有氫氧化鋁之氫氧化物包覆之含金屬氮化物的粒子。As a third wet coating method, in the presence of metal nitride-containing particles, urea and aluminum chloride are used to form a slurry containing an ionic liquid. The metal nitride-containing particles are taken out from the slurry and dried. After that, the above-mentioned metal-nitride-containing particles are fired to obtain metal-nitride-containing particles coated with a hydroxide containing aluminum hydroxide. .

<含金屬氮化物的粒子的物性> (導電率) 上述含金屬氮化物的粒子的導電率並無特別限制,100×104 ~600×104 S/m為較佳,165×104 ~340×104 S/m為更佳,165×104 S/m~220×104 S/m為進一步較佳,170~190×104 S/m尤為佳。若含金屬氮化物的粒子的導電率的下限值為165×104 S/m以上,上限值為340×104 S/m以下,則藉由含有含金屬氮化物的粒子之後組成物獲得之硬化膜具有更優異之遮光性,且具有優異之電極的防腐性。 另外,本說明書中,導電率表示利用Mitsubishi Chemical Analytech CO., LTD.製造的粉體電阻測定系統MCP-PD51,藉由下述方法測定之導電率。 首先,將規定量的含金屬氮化物的粒子放入上述測定装置的測定容器之後,開始加壓,將壓力變更為0kN、1kN、5kN、10kN、20kN來測定粒子的體積電阻率(ρ)。從該測定結果求出體積電阻率不受壓力影響之條件下的飽和體積電阻率,利用所獲得之飽和體積電阻率,依據σ=1/ρ的關係式計算導電率(σ)。另外,上述試驗在室溫環境下進行。<Physical properties of metal nitride-containing particles> (Conductivity) The electrical conductivity of the metal nitride-containing particles is not particularly limited. 100×10 4 to 600×10 4 S/m is preferable, and 165×10 4 to 340×10 4 S/m is more preferable, 165×10 4 S/m to 220×10 4 S/m is still more preferable, and 170 to 190×10 4 S/m is particularly preferable. If the lower limit value of the conductivity of the metal nitride-containing particles is 165×10 4 S/m or more, and the upper limit value is 340×10 4 S/m or less, the composition will be obtained by containing the metal nitride-containing particles The obtained cured film has more excellent light-shielding properties, and has excellent electrode corrosion resistance. In addition, in this specification, the electrical conductivity means the electrical conductivity measured by the following method using the powder resistance measurement system MCP-PD51 manufactured by Mitsubishi Chemical Analytech CO., LTD. First, a predetermined amount of metal nitride-containing particles is put into the measurement container of the above-mentioned measuring device, and then pressurization is started, and the pressure is changed to 0 kN, 1 kN, 5 kN, 10 kN, and 20 kN to measure the volume resistivity (ρ) of the particles. From the measurement result, the saturated volume resistivity under the condition that the volume resistivity is not affected by pressure is obtained, and the conductivity (σ) is calculated according to the relationship of σ=1/ρ using the obtained saturated volume resistivity. In addition, the above-mentioned test was carried out at room temperature.

(平均一次粒徑) 上述含金屬氮化物的粒子的平均一次粒徑並無特別限制,10~50nm為較佳,10~30nm為更佳,10~27nm為進一步較佳。若平均一次粒徑為27nm以下,則含有含金屬氮化物的粒子之組成物中,含金屬氮化物的粒子變得不易沉澱,其結果,組成物具有更優異之經時穩定性。 另外,本說明書中,平均一次粒徑表示一次粒子的平均粒徑,平均一次粒徑表示藉由下述方法測定之平均一次粒徑。 試料:藉由下述實施例中記載的方法製備分散液(含金屬氮化物的粒子25質量%、分散劑7.5質量%、PGMEA;丙二醇單甲醚乙酸酯溶劑67.5質量%),藉由PGMEA將所獲得之分散液稀釋100倍之後,滴加在碳箔上並使其乾燥者。 另外,作為分散劑,使用使金屬氮化物含有例子以藉由下述方法獲得之圖像中能夠識別含金屬氮化物的粒子的一次粒子之程度分散之分散劑。作為上述分散劑的具體例,可舉出實施例中記載之分散劑。另外,一次粒子係指無凝聚之獨立粒子。 利用透射型電子顯微鏡(TEM:Transmission Electron Microscope),以倍率2万倍觀察上述試料來獲得圖像。所獲得之圖像的含金屬氮化物的粒子中,選擇一次粒子,藉由圖像處理計算上述一次粒子的面積。接著,計算將所獲得之面積換算成圓時的直徑。對4視場量、總計400個含金屬氮化物的粒子的一次粒子進行該操作,對所評價之圓換算的直徑進行算術平均來作為含金屬氮化物的粒子的平均一次粒徑。(Average Primary Particle Size) The average primary particle size of the metal nitride-containing particles is not particularly limited, and is preferably 10 to 50 nm, more preferably 10 to 30 nm, and even more preferably 10 to 27 nm. If the average primary particle size is 27 nm or less, in a composition containing metal nitride-containing particles, the metal nitride-containing particles become less likely to precipitate, and as a result, the composition has more excellent stability over time. In addition, in this specification, the average primary particle diameter means the average particle diameter of primary particles, and the average primary particle diameter means the average primary particle diameter measured by the following method. Sample: A dispersion liquid (25% by mass of metal nitride-containing particles, 7.5% by mass of dispersant, PGMEA; 67.5% by mass of propylene glycol monomethyl ether acetate solvent) was prepared by the method described in the following examples. After the obtained dispersion is diluted 100 times, it is dropped on the carbon foil and dried. In addition, as the dispersing agent, a dispersing agent that disperses the metal nitride containing example to the extent that the primary particles of the metal nitride-containing particles can be recognized in the image obtained by the following method is used. As a specific example of the above-mentioned dispersing agent, the dispersing agents described in the examples can be given. In addition, the primary particle refers to an independent particle without agglomeration. Using a transmission electron microscope (TEM: Transmission Electron Microscope), the sample was observed at a magnification of 20,000 times to obtain an image. Among the metal nitride-containing particles in the obtained image, a primary particle is selected, and the area of the above-mentioned primary particle is calculated by image processing. Next, calculate the diameter when the obtained area is converted into a circle. This operation was performed on the primary particles of a total of 400 metal nitride-containing particles with 4 fields of view, and the diameter converted into a circle to be evaluated was arithmetic averaged as the average primary particle size of the metal nitride-containing particles.

〔溶劑〕 上述組成物含有溶劑為較佳。作為溶劑,可舉出水及有機溶劑。其中,上述組成物含有有機溶劑為較佳。[Solvent] The above composition preferably contains a solvent. Examples of the solvent include water and organic solvents. Among them, it is preferable that the above-mentioned composition contains an organic solvent.

<有機溶劑> 作為有機溶劑,並無特別限制,例如,可舉出丙酮、甲乙酮、環己烷、二氯乙烷、四氫呋喃、甲苯、乙二醇單甲醚、乙二醇單乙醚、乙二醇二甲醚、丙二醇單甲醚、丙二醇單乙醚、乙醯丙酮、環己酮、環戊酮、二丙酮醇、乙二醇單甲醚乙酸酯、乙二醇乙醚乙酸酯、乙二醇單異丙醚、乙二醇單丁醚乙酸酯、3-甲氧基丙醇、甲氧基乙氧基乙醇、二乙二醇單甲醚、二乙二醇單乙醚、二乙二醇二甲醚、二乙二醇二乙基醚、丙二醇單甲醚乙酸酯、丙二醇單乙醚乙酸酯、3-甲氧基乙酸丙酯、N,N-二甲基甲醯胺、二甲基亞碸、γ-丁內酯、乙酸乙酯、乙酸丁酯、乳酸甲酯及乳酸乙酯等。<Organic solvent> The organic solvent is not particularly limited. Examples include acetone, methyl ethyl ketone, cyclohexane, dichloroethane, tetrahydrofuran, toluene, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, and ethylene diethyl ketone. Alcohol dimethyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether, acetone, cyclohexanone, cyclopentanone, diacetone alcohol, ethylene glycol monomethyl ether acetate, ethylene glycol ethyl ether acetate, ethylene two Alcohol monoisopropyl ether, ethylene glycol monobutyl ether acetate, 3-methoxypropanol, methoxyethoxyethanol, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene two Alcohol dimethyl ether, diethylene glycol diethyl ether, propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, 3-methoxypropyl acetate, N,N-dimethylformamide, two Methyl sulfenite, γ-butyrolactone, ethyl acetate, butyl acetate, methyl lactate and ethyl lactate, etc.

上述組成物可含有1種有機溶劑,亦可含有2種以上的有機溶劑,從在調液上述組成物時能夠抑制含金屬氮化物的粒子的粒徑變動之角度考慮,含有2種以上的有機溶劑為較佳。 含有2種以上的有機溶劑時,由選自由上述的3-乙氧基丙酸甲酯、3-乙氧基丙酸乙酯、乙基溶纖劑乙酸酯、乳酸乙酯、二甘醇二甲醚、乙酸丁酯、3-甲氧基丙酸甲酯、2-庚酮、環己酮、環戊酮、乙基卡必醇乙酸酯、丁基卡必醇乙酸酯、丙二醇單甲醚、及丙二醇單甲醚乙酸酯所組成的群組中的2種以上構成為較佳。The above composition may contain one organic solvent or two or more organic solvents. From the viewpoint of suppressing the variation in the particle size of the metal nitride-containing particles when the composition is adjusted, it contains two or more organic solvents. Solvents are preferred. When two or more organic solvents are contained, it is selected from the above-mentioned methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, ethyl cellosolve acetate, ethyl lactate, diethylene glycol Dimethyl ether, butyl acetate, methyl 3-methoxypropionate, 2-heptanone, cyclohexanone, cyclopentanone, ethyl carbitol acetate, butyl carbitol acetate, propylene glycol Two or more types in the group consisting of monomethyl ether and propylene glycol monomethyl ether acetate are preferable.

上述組成物含有有機溶劑時,作為有機溶劑的含量,相對於組成物的總質量,10~90質量%為較佳,60~90質量%為更佳。含有2種以上的有機溶劑時,其總計量成為上述範圍為較佳。When the above composition contains an organic solvent, the content of the organic solvent is preferably 10 to 90% by mass, and more preferably 60 to 90% by mass relative to the total mass of the composition. When two or more kinds of organic solvents are contained, the total amount thereof is preferably in the above-mentioned range.

<水> 上述組成物可含有水。水可以係有意添加者,亦可以係藉由添加上述組成物中包含之各成分而在組成物中不可避免地含有者。 水的含量相對於組成物的總質量,0.01質量以上為較佳,0.05質量%以上為更佳,0.1質量%以上為進一步較佳,1質量%以下為較佳,0.8質量%以下為更佳,0.7質量%以下為進一步較佳。若水的含量在上述範圍內,製作硬化膜時抑制產生針孔,而且硬化膜的耐濕性得到提高。並且,若水的含量在上述範圍內,則組成物中含有之顆粒易變得更少。<Water> The above composition may contain water. Water may be intentionally added, or may be inevitably contained in the composition by adding each component contained in the above-mentioned composition. The content of water relative to the total mass of the composition is preferably 0.01% by mass or more, more preferably 0.05% by mass or more, more preferably 0.1% by mass or more, more preferably 1% by mass or less, and more preferably 0.8% by mass or less , 0.7% by mass or less is more preferable. When the water content is within the above range, the occurrence of pinholes when the cured film is produced is suppressed, and the moisture resistance of the cured film is improved. In addition, if the water content is within the above range, the particles contained in the composition tend to become fewer.

上述組成物還含有溶劑時,組成物的固體成分為10~40質量%為較佳。若組成物的固體成分為上限值以下,則組成物中含有之顆粒數易變得更少。並且,若組成物的固體成分為下限值以上,則組成物具有更優異之塗佈性。 並且,含金屬氮化物的粒子的含量相對於組成物的總固體成分,為20~70質量%為較佳。若含金屬氮化物的粒子的含量為下限值以上,則組成物具有更優異之經時穩定性。並且,若含金屬氮化物的粒子的含量為上限值以下,則組成物中含有之顆粒數易變得更少,且可獲得能夠製作具有更優異之解像性之硬化膜之組成物。When the composition further contains a solvent, the solid content of the composition is preferably 10 to 40% by mass. If the solid content of the composition is equal to or less than the upper limit, the number of particles contained in the composition tends to decrease. In addition, if the solid content of the composition is equal to or greater than the lower limit, the composition has more excellent coatability. In addition, the content of the metal nitride-containing particles is preferably 20 to 70% by mass relative to the total solid content of the composition. If the content of the metal nitride-containing particles is more than the lower limit, the composition has more excellent stability over time. In addition, if the content of the metal nitride-containing particles is less than the upper limit, the number of particles contained in the composition is likely to be reduced, and a composition capable of producing a cured film with more excellent resolution can be obtained.

〔分散劑〕 上述組成物含有分散劑為較佳。分散劑有助於提高上述上述含金屬氮化物的粒子等黑色顏料的分散性。本說明書中,分散劑為與後述黏結樹脂不同之成分。 作為分散劑,例如,可適當選擇公知的顔料分散劑來使用。其中,高分子化合物為較佳。 作為分散劑,可舉出高分子分散劑〔例如,聚醯胺胺及其鹽、聚羧酸及其鹽、高分子量不飽和酸酯、改性聚胺基甲酸酯、改性聚酯、改性聚(甲基)丙烯酸酯、(甲基)丙烯酸共聚物、萘磺酸福馬林縮合物〕、聚氧乙烯烷基磷酸酯、聚氧乙烯烷基胺及顔料衍生物等。 高分子化合物可依其結構,進一步分類為直鏈狀高分子、末端改質型高分子、接枝型高分子及嵌段型高分子。[Dispersant] The above composition preferably contains a dispersant. The dispersant contributes to improving the dispersibility of black pigments such as the aforementioned metal nitride-containing particles. In this specification, the dispersant is a different component from the binder resin described later. As the dispersant, for example, a known pigment dispersant can be appropriately selected and used. Among them, polymer compounds are preferred. As the dispersant, a polymer dispersant [for example, polyamide amine and its salt, polycarboxylic acid and its salt, high molecular weight unsaturated acid ester, modified polyurethane, modified polyester, Modified poly(meth)acrylate, (meth)acrylic acid copolymer, formalin naphthalenesulfonate condensate], polyoxyethylene alkyl phosphate, polyoxyethylene alkyl amine and pigment derivatives, etc. Polymer compounds can be further classified into linear polymers, end-modified polymers, grafted polymers, and block polymers according to their structures.

<高分子化合物> 高分子化合物吸附於作為含金屬氮化物的粒子的較佳態樣之黑色顏料及依據需要倂用之顏料等(以下,還簡單稱作“黑色顏料等”。)被分散體的表面,發揮防止被分散體的再凝聚之作用。故,含有針對顏料表面的固定部位之末端改質型高分子、接枝型高分子、嵌段型高分子為較佳。 另一方面,藉由對含金屬氮化物的粒子的表面進行改質,還能夠促進高分子化合物對含金屬氮化物的粒子的吸附性。<Polymer compound> The polymer compound is adsorbed on black pigments, which are a preferred form of metal nitride-containing particles, and pigments that are used as needed (hereinafter, also simply referred to as "black pigments, etc.") to be dispersed The surface of the dispersion prevents the re-agglomeration of the dispersed body. Therefore, terminal-modified polymers, graft-type polymers, and block-type polymers containing fixed sites on the surface of the pigment are preferred. On the other hand, by modifying the surface of the metal nitride-containing particles, it is also possible to promote the adsorbability of the polymer compound to the metal nitride-containing particles.

高分子化合物含有包含接枝鏈之結構單元為較佳。另外,本說明書中,“結構單元”的含義與“重複單元”相同。 含有該種含有接枝鏈之結構單元之高分子化合物藉由接枝鏈具有與溶劑的親和性,故係黑色顏料等著色顏料的分散性及經時之後的分散穩定性(經時穩定性)優異者。並且,藉由存在接枝鏈,含有包含接枝鏈之結構單元之高分子化合物與聚合性化合物或其他能夠倂用之樹脂等具有親和性。其結果,在鹼顯影中不易生成殘渣。 若接枝鏈變長,則立體排斥效果提高而黑色顔料等的分散性得到提高。另一方面,若接枝鏈過長,則向黑色顏料等著色顏料的吸附力下降,黑色顔料等的分散性處於下降的趨勢。故,接枝鏈為氫原子以外的原子數為40~10000者為較佳,氫原子以外的原子數為50~2000者為更佳,氫原子以外的原子數為60~500者為進一步較佳。 其中,接枝鏈表示共聚物的主鏈的根部(從主鏈支化之基團中與主鏈鍵結之原子)至從主鏈支化之基團的末端。The polymer compound preferably contains a structural unit including a graft chain. In addition, in this specification, "structural unit" has the same meaning as "repeating unit". The polymer compound containing the structural unit containing the graft chain has affinity with the solvent through the graft chain, so it is the dispersibility of black pigments and other colored pigments and the dispersion stability after time (stability with time) Outstanding person. In addition, the presence of the graft chain allows the polymer compound containing the structural unit including the graft chain to have affinity with the polymerizable compound or other usable resins. As a result, residues are less likely to be generated during alkali development. If the graft chain becomes longer, the steric repulsion effect is improved and the dispersibility of black pigments and the like is improved. On the other hand, if the graft chain is too long, the adsorption power to color pigments such as black pigments will decrease, and the dispersibility of black pigments and the like will tend to decrease. Therefore, the graft chain is preferably 40 to 10,000 atoms other than hydrogen atoms, more preferably 50 to 2000 atoms other than hydrogen atoms, and more preferably 60 to 500 atoms other than hydrogen atoms. good. Wherein, the graft chain means the root of the main chain of the copolymer (atoms bonded to the main chain from the group branched from the main chain) to the end of the group branched from the main chain.

接枝鏈含有聚合物結構為較佳,作為該種聚合物結構,例如可舉出聚(甲基)丙烯酸酯結構(例如,聚(甲基)丙烯酸結構)、聚酯結構、聚胺基甲酸酯結構、聚脲結構、聚醯胺結構及聚醚結構等。 為了提高接枝鏈與溶劑的相互作用性,並藉此提高黑色顏料等的分散性,接枝鏈係含有選自由聚酯結構、聚醚結構及聚(甲基)丙烯酸酯結構所組成的群組中的至少1種之接枝鏈為較佳,含有聚酯結構或聚醚結構的至少任一個之接枝鏈為更佳。The graft chain preferably contains a polymer structure. Examples of the polymer structure include poly(meth)acrylate structure (for example, poly(meth)acrylic acid structure), polyester structure, and polyurethane structure. Acid ester structure, polyurea structure, polyamide structure and polyether structure, etc. In order to improve the interaction between the graft chain and the solvent, and thereby improve the dispersibility of black pigments, etc., the graft chain contains a group selected from the group consisting of a polyester structure, a polyether structure, and a poly(meth)acrylate structure. A graft chain of at least one species in the group is preferable, and a graft chain containing at least either a polyester structure or a polyether structure is more preferable.

作為含有該種接枝鏈之巨單體,並無特別限定,能夠適當使用含有反應性雙鍵性基之巨單體。The macromonomer containing this kind of graft chain is not particularly limited, and a macromonomer containing a reactive double bond group can be suitably used.

與高分子化合物所含有之含有接枝鏈之結構單元對應,作為適合用於合成高分子化合物之市售的巨單體,可使用AA-6(商品名、TOAGOSEI CO., LTD.)、AA-10(商品名、TOAGOSEI CO., LTD.製造)、AB-6(商品名、TOAGOSEI CO., LTD.製造)、AS-6(商品名、TOAGOSEI CO., LTD.製造)、AN-6(商品名、TOAGOSEI CO., LTD.製造)、AW-6(商品名、TOAGOSEI CO., LTD.製造)、AA-714(商品名、TOAGOSEI CO., LTD.製造)、AY-707(商品名、TOAGOSEI CO., LTD.製造)、AY-714(商品名、TOAGOSEI CO., LTD.製造)、AK-5(商品名、TOAGOSEI CO., LTD.製造)、AK-30(商品名、TOAGOSEI CO., LTD.製造)、AK-32(商品名、TOAGOSEI CO., LTD.製造)、Blemmer PP-100(商品名、NOF CORPORATION.製造)、Blemmer PP-500(商品名、NOF CORPORATION.製造)、Blemmer PP-800(商品名、NOF CORPORATION.製造)、Blemmer PP-1000(商品名、NOF CORPORATION.製造)、Blemmer 55-PET-800(商品名、NOF CORPORATION.製造)、Blemmer PME-4000(商品名、NOF CORPORATION.製造)、Blemmer PSE-400(商品名、NOF CORPORATION.製造)、Blemmer PSE-1300(商品名、NOF CORPORATION.製造)、Blemmer 43PAPE-600B(商品名、NOF CORPORATION.製造)等。其中,使用AA-6(商品名、TOAGOSEI CO., LTD.製造)、AA-10(商品名、TOAGOSEI CO., LTD.製造)、AB-6(商品名、TOAGOSEI CO., LTD.製造)、AS-6(商品名、TOAGOSEI CO., LTD.製造)、AN-6(商品名、TOAGOSEI CO., LTD.製造)及Blemmer PME-4000(商品名、NOF CORPORATION.製造)等為較佳。Corresponding to the structural unit containing the graft chain contained in the polymer compound, as a commercially available macromonomer suitable for synthesizing polymer compounds, AA-6 (trade name, TOAGOSEI CO., LTD.), AA can be used -10 (trade name, manufactured by TOAGOSEI CO., LTD.), AB-6 (trade name, manufactured by TOAGOSEI CO., LTD.), AS-6 (trade name, manufactured by TOAGOSEI CO., LTD.), AN-6 (Trade name, manufactured by TOAGOSEI CO., LTD.), AW-6 (trade name, manufactured by TOAGOSEI CO., LTD.), AA-714 (trade name, manufactured by TOAGOSEI CO., LTD.), AY-707 (product Name, manufactured by TOAGOSEI CO., LTD.), AY-714 (trade name, manufactured by TOAGOSEI CO., LTD.), AK-5 (trade name, manufactured by TOAGOSEI CO., LTD.), AK-30 (trade name, TOAGOSEI CO., LTD.), AK-32 (trade name, TOAGOSEI CO., LTD.), Blemmer PP-100 (trade name, manufactured by NOF CORPORATION.), Blemmer PP-500 (trade name, NOF CORPORATION. Manufacturing), Blemmer PP-800 (trade name, manufactured by NOF CORPORATION.), Blemmer PP-1000 (trade name, manufactured by NOF CORPORATION.), Blemmer 55-PET-800 (trade name, manufactured by NOF CORPORATION.), Blemmer PME- 4000 (trade name, manufactured by NOF CORPORATION.), Blemmer PSE-400 (trade name, manufactured by NOF CORPORATION.), Blemmer PSE-1300 (trade name, manufactured by NOF CORPORATION.), Blemmer 43PAPE-600B (trade name, NOF CORPORATION. Manufacturing) and so on. Among them, AA-6 (trade name, manufactured by TOAGOSEI CO., LTD.), AA-10 (trade name, manufactured by TOAGOSEI CO., LTD.), AB-6 (trade name, manufactured by TOAGOSEI CO., LTD.) are used , AS-6 (trade name, manufactured by TOAGOSEI CO., LTD.), AN-6 (trade name, manufactured by TOAGOSEI CO., LTD.), Blemmer PME-4000 (trade name, manufactured by NOF CORPORATION.), etc. are preferred .

上述分散劑含有選自由聚丙烯酸甲酯、聚甲基丙烯酸甲酯及環狀或鏈狀的聚酯所組成的群組中的至少1種結構為較佳。上述分散劑含有選自由聚丙烯酸甲酯、聚甲基丙烯酸甲酯及鏈狀的聚酯所組成的群組中的至少1種結構為更佳。上述分散劑含有選自由聚丙烯酸甲酯、聚甲基丙烯酸甲酯、聚己內酯及聚戊內酯所組成的群組中的至少1種結構為進一步較佳。分散劑可以係在1個分散劑中單獨含有上述結構者,亦可以係在1個分散劑中含有複數個該些結構者。 其中,聚己內酯結構係指作為重複單元含有對ε-己內酯進行開環之結構者。聚戊內酯結構係指作為重複單元含有對δ-戊內酯進行開環之結構者。 作為含有聚己內酯結構之分散劑的具體例,可舉出下述式(1)及下述式(2)中的j及k為5者。並且,作為含有聚戊內酯結構之分散劑的具體例,可舉出下述式(1)及下述式(2)中的j及k為4者。 作為含有聚丙烯酸甲酯結構之分散劑的具體例,可舉出下述式(4)中的X5 為氫原子,且R4 為甲基者。並且,作為含有聚甲基丙烯酸甲酯結構之分散劑的具體例,可舉出下述式(4)中的X5 為甲基,且R4 為甲基者。The dispersant preferably contains at least one structure selected from the group consisting of polymethyl acrylate, polymethyl methacrylate, and cyclic or chain polyesters. It is more preferable that the dispersant contains at least one structure selected from the group consisting of polymethyl acrylate, polymethyl methacrylate, and chain polyester. It is more preferable that the dispersant contains at least one structure selected from the group consisting of polymethyl acrylate, polymethyl methacrylate, polycaprolactone, and polyvalerolactone. The dispersant may contain the above-mentioned structure in one dispersant alone, or may contain a plurality of these structures in one dispersant. Among them, the polycaprolactone structure refers to a structure containing a ring-opening structure of ε-caprolactone as a repeating unit. The polyvalerolactone structure refers to a structure containing a ring-opening structure for δ-valerolactone as a repeating unit. As a specific example of the dispersing agent containing a polycaprolactone structure, j and k in the following formula (1) and following formula (2) are mentioned. In addition, as a specific example of the dispersant containing a polyvalerolactone structure, those in which j and k are 4 in the following formula (1) and the following formula (2) can be given. As a specific example of the dispersant containing a polymethyl acrylate structure, in the following formula (4), X 5 is a hydrogen atom, and R 4 is a methyl group. In addition, as a specific example of the dispersant containing a polymethyl methacrylate structure, X 5 in the following formula (4) is a methyl group and R 4 is a methyl group.

(含有接枝鏈之結構單元) 高分子化合物作為含有接枝鏈之結構單元,含有以下述式(1)~式(4)的任一個表示之結構單元為較佳,含有以下述式(1A)、下述式(2A)、下述式(3A)、下述式(3B)及下述(4)的任一個表示之結構單元為更佳。(Structural unit containing graft chain) As the structural unit containing the graft chain, the polymer compound preferably contains a structural unit represented by any one of the following formulas (1) to (4), and contains the following formula (1A) ), the structural unit represented by any one of the following formula (2A), the following formula (3A), the following formula (3B), and the following (4) is more preferred.

[化學式1]

Figure 02_image001
[Chemical formula 1]
Figure 02_image001

式(1)~式(4)中,W1 、W2 、W3 及W4 分別獨立地表示氧原子或NH。W1 、W2 、W3 及W4 為氧原子為較佳。 式(1)~式(4)中,X1 、X2 、X3 、X4 及X5 分別獨立地表示氫原子或1價的有機基團。作為X1 、X2 、X3 、X4 及X5 ,從合成方面的限制的觀點考慮,分別獨立地為氫原子或碳原子數(碳素原子數)1~12的烷基為較佳,分別獨立地為氫原子或甲基為更佳,甲基為進一步較佳。In formulas (1) to (4), W 1 , W 2 , W 3 and W 4 each independently represent an oxygen atom or NH. Preferably, W 1 , W 2 , W 3 and W 4 are oxygen atoms. In formulas (1) to (4), X 1 , X 2 , X 3 , X 4 and X 5 each independently represent a hydrogen atom or a monovalent organic group. As X 1 , X 2 , X 3 , X 4 and X 5 , from the viewpoint of restriction on synthesis, each independently a hydrogen atom or an alkyl group having 1 to 12 carbon atoms (number of carbon atoms) is preferred , Each independently being a hydrogen atom or a methyl group is more preferred, and a methyl group is even more preferred.

式(1)~式(4)中,Y1 、Y2 、Y3 及Y4 分別獨立地表示2價的連結基,連結基的結構方面並無特別的限制。作為以Y1 、Y2 、Y3 及Y4 表示之2價的連結基,具體而言,可舉出下述(Y-1)~(Y-21)的連結基等為例。下述所示之結構中,A、B分別表示鍵結部位。下述中示出之結構中,從合成的簡便性考慮,(Y-2)或(Y-13)為更佳。In formulas (1) to (4), Y 1 , Y 2 , Y 3 and Y 4 each independently represent a divalent linking group, and there is no particular restriction on the structure of the linking group. As the bivalent linking group represented by Y 1 , Y 2 , Y 3, and Y 4 , specifically, the following linking groups (Y-1) to (Y-21), etc., can be given as examples. In the structure shown below, A and B respectively represent bonding sites. Among the structures shown below, (Y-2) or (Y-13) is more preferable from the viewpoint of ease of synthesis.

[化學式2]

Figure 02_image003
[Chemical formula 2]
Figure 02_image003

式(1)~式(4)中,Z1 、Z2 、Z3 及Z4 分別獨立地表示1價的有機基團。有機基團的結構並無特別限定,具體而言,可舉出烷基、羥基、烷氧基、芳氧基、雜芳氧基、烷硫醚基、芳硫醚基、雜芳硫醚基及胺基等。該些中,作為以Z1 、Z2 、Z3 及Z4 表示之有機基團,尤其從分散性提高的觀點考慮,具有立體排斥效果者為較佳,分別獨立地為碳原子數5至24的烷基或烷氧基為較佳,其中,分別獨立地為碳原子數5至24的分支烷基、碳原子數5至24的環狀烷基或碳原子數5至24的烷氧基尤為佳。另外,烷氧基中包含之烷基可以係直鏈狀、支鏈狀及環狀的任一個。In formulas (1) to (4), Z 1 , Z 2 , Z 3 and Z 4 each independently represent a monovalent organic group. The structure of the organic group is not particularly limited. Specifically, it includes an alkyl group, a hydroxyl group, an alkoxy group, an aryloxy group, a heteroaryloxy group, an alkyl sulfide group, an arylene sulfide group, and a heteroarylene sulfide group. And amine groups and so on. Among these, as the organic groups represented by Z 1 , Z 2 , Z 3 and Z 4 , especially from the viewpoint of improving dispersibility, those having a steric repulsive effect are preferred, and each independently has a carbon number of 5 to The alkyl group or alkoxy group of 24 is preferred, wherein each independently is a branched alkyl group having 5 to 24 carbon atoms, a cyclic alkyl group having 5 to 24 carbon atoms, or an alkoxy group having 5 to 24 carbon atoms. Kie is better. In addition, the alkyl group contained in the alkoxy group may be any of linear, branched, and cyclic.

式(1)~式(4)中,n、m、p及q分別獨立地為1至500的整數。 並且,式(1)及式(2)中,j及k分別獨立地表示2~8的整數。從組成物的分散穩定性及顯影性的觀點考慮,式(1)及式(2)中的j及k為4~6的整數為較佳,5最為佳。In formula (1) to formula (4), n, m, p, and q are each independently an integer of 1 to 500. In addition, in Formula (1) and Formula (2), j and k each independently represent an integer of 2-8. From the viewpoint of the dispersion stability and developability of the composition, it is preferable that j and k in the formulas (1) and (2) are integers of 4 to 6, and 5 is the most preferable.

式(3)中,R3 表示分支或者直鏈的伸烷基,碳原子數1~10的伸烷基為較佳,碳原子數2或3的伸烷基為更佳。p為2~500時,存在複數個之R3 可相互相同亦可互不相同。 式(4)中,R4 表示氫原子或1價的有機基團,作為該1價的有機基團,結構上並無特別限定。作為R4 ,可較佳地舉出氫原子、烷基、芳基及雜芳基,氫原子或烷基為更佳。R4 為烷基時,作為烷基,碳原子數1~20的直鏈狀烷基、碳原子數3~20的分支狀烷基或碳原子數5~20的環狀烷基為較佳,碳原子數1~20的直鏈狀烷基為更佳,碳原子數1~6的直鏈狀烷基為進一步較佳。式(4)中,q為2~500時,接枝共聚物中存在複數個之X5 及R4 可相互相同亦可互不相同。In the formula (3), R 3 represents a branched or straight chain alkylene group, and an alkylene group having 1 to 10 carbon atoms is preferred, and an alkylene group having 2 or 3 carbon atoms is more preferred. When p is 2 to 500, the presence of a plurality of R 3 may be the same or different from each other. In formula (4), R 4 represents a hydrogen atom or a monovalent organic group, and the monovalent organic group is not particularly limited in structure. As R 4 , preferably, a hydrogen atom, an alkyl group, an aryl group, and a heteroaryl group are mentioned, and a hydrogen atom or an alkyl group is more preferable. When R 4 is an alkyl group, the alkyl group is preferably a linear alkyl group having 1 to 20 carbon atoms, a branched alkyl group having 3 to 20 carbon atoms, or a cyclic alkyl group having 5 to 20 carbon atoms. A linear alkyl group having 1 to 20 carbon atoms is more preferable, and a linear alkyl group having 1 to 6 carbon atoms is more preferable. In the formula (4), when q is 2 to 500, multiple X 5 and R 4 in the graft copolymer may be the same or different from each other.

並且,高分子化合物可含有2種以上的不同結構且含有接枝鏈之結構單元。亦即,高分子化合物的分子中可以包含結構互不相同之以式(1)~式(4)表示之結構單元,並且,式(1)~式(4)中,n、m、p及q分別表示2以上的整數時,式(1)及式(2)中,可在側鏈中包含j及k互不相同之結構,式(3)及式(4)中,分子內存在複數個之R3 、R4 及X5 可相互相同亦可互不相同。In addition, the polymer compound may contain two or more different structures and a structural unit of a graft chain. That is, the molecules of the polymer compound may contain structural units represented by formulas (1) to (4) that are different in structure, and in formulas (1) to (4), n, m, p, and When q represents an integer of 2 or more, in formulas (1) and (2), structures with j and k different from each other can be included in the side chain. In formulas (3) and (4), there are plural numbers in the molecule R 3 , R 4 and X 5 may be the same or different from each other.

作為以式(1)表示之結構單元,從組成物的經時穩定性及顯影性的觀點考慮,以下述式(1A)表示之結構單元為更佳。 並且,作為以式(2)表示之結構單元,從組成物的經時穩定性及顯影性的觀點考慮,以下述式(2A)表示之結構單元為更佳。As the structural unit represented by the formula (1), a structural unit represented by the following formula (1A) is more preferable from the viewpoint of the stability and developability of the composition over time. In addition, as the structural unit represented by the formula (2), a structural unit represented by the following formula (2A) is more preferable from the viewpoint of the stability and developability of the composition over time.

[化學式3]

Figure 02_image005
[Chemical formula 3]
Figure 02_image005

式(1A)中,X1 、Y1 、Z1 及n的含義與式(1)中的X1 、Y1 、Z1 及n相同,較佳範圍亦相同。式(2A)中,X2 、Y2 、Z2 及m的含義與式(2)中的X2 、Y2 、Z2 及m相同,較佳範圍亦相同。In the formula (1A), X 1, X Y 1, Z 1 and n are as defined in the formula (1) is 1, Y 1, Z 1 and n, respectively, preferred ranges are also the same. In formula (2A), X 2, Y 2, Z 2 and m are as defined for the formula X (2) is 2, Y 2, Z 2 and the same as m, the preferred range is also the same.

並且,作為以式(3)表示之結構單元,從組成物的經時穩定性及顯影性的觀點考慮,以下述式(3A)或式(3B)表示之結構單元為更佳。In addition, as the structural unit represented by the formula (3), a structural unit represented by the following formula (3A) or formula (3B) is more preferable from the viewpoint of the stability and developability of the composition over time.

[化學式4]

Figure 02_image007
[Chemical formula 4]
Figure 02_image007

式(3A)或(3B)中,X3 、Y3 、Z3 及p的含義與式(3)中的X3 、Y3 、Z3 及p相同,較佳範圍亦相同。Formula (3A) or (3B) in, 3, Y 3, Z 3 and same p X 3, Y 3, Z 3 and p are defined for the formula X (3) is, preferred ranges are also the same.

高分子化合物作為含有接枝鏈之結構單元,含有以式(1A)表示之結構單元為更佳。As the structural unit containing the graft chain, the polymer compound preferably contains the structural unit represented by formula (1A).

高分子化合物中,含有接枝鏈之結構單元(例如,以上述式(1)~式(4)表示之結構單元)以質量換算,相對於高分子化合物的總質量,以2~90%的範圍包含為較佳,以5~30%的範圍包含為更佳。若在該範圍內包含含有接枝鏈之結構單元,則黑色顏料的分散性較高,形成硬化膜時的顯影性良好。In the polymer compound, the structural unit containing the graft chain (for example, the structural unit represented by the above formula (1) to formula (4)) is calculated by mass, and relative to the total mass of the polymer compound, 2 to 90% It is preferable to include in the range, and it is more preferable to include in the range of 5 to 30%. If the structural unit containing the graft chain is included in this range, the dispersibility of the black pigment will be high, and the developability at the time of forming a cured film will be good.

(疏水性結構單元) 並且,高分子化合物包含與含有接枝鏈之結構單元不同(亦即,並不相當於含有接枝鏈之結構單元)之疏水性結構單元為較佳。其中,本發明中,疏水性結構單元係不含有酸基(例如,羧酸基、磺酸基、磷酸基、酚性羥基等)之結構單元。(Hydrophobic Structural Unit) In addition, the polymer compound preferably contains a hydrophobic structural unit that is different from the structural unit containing the graft chain (that is, it does not correspond to the structural unit containing the graft chain). Among them, in the present invention, the hydrophobic structural unit system does not contain a structural unit of an acid group (for example, a carboxylic acid group, a sulfonic acid group, a phosphoric acid group, a phenolic hydroxyl group, etc.).

疏水性結構單元係源自(對應)ClogP值為1.2以上的化合物(單體)之結構單元為較佳,係源自ClogP值為1.2~8的化合物之結構單元為更佳。藉此,能夠更可靠地顯現本發明的效果。The hydrophobic structural unit is preferably derived from (corresponding to) a structural unit derived from a compound (monomer) having a ClogP value of 1.2 or more, and more preferably a structural unit derived from a compound having a ClogP value of 1.2-8. Thereby, the effect of the present invention can be more reliably expressed.

ClogP值係藉由能夠從Daylight Chemical Information System, Inc,獲得之程序“CLOGP”計算之值。該程序提供藉由Hansch, Leo的fragmentapproach(參閱下述文獻)計算出之“計算logP”的值。Fragmentapproach依據化合物的化學結構,將化學結構分割為部分結構(片段),總計分配於該片段之logP貢獻量,藉此推算化合物的logP值。其詳細內容記載於以下文獻中。本發明中,使用藉由程序CLOGP v4.82計算出之ClogP值。 A. J. Leo, Comprehensive Medicinal Chemistry, Vol.4, C. Hansch, P. G. Sammnens,J. B. Taylor and C. A. Ramsden, Eds., p.295, Pergamon Press, 1990 C. Hansch & A. J. Leo. SUbstituent Constants For Correlation Analysis in Chemistry and Biology. John Wiley & Sons. A.J. Leo. Calculating logPoct from structure. Chem. Rev., 93, 1281-1306, 1993.The ClogP value is a value calculated by the program "CLOGP" available from Daylight Chemical Information System, Inc. This program provides the value of "calculated logP" calculated by Hansch, Leo's fragment approach (refer to the following documents). Fragmentapproach divides the chemical structure into partial structures (fragments) according to the chemical structure of the compound, and totals the logP contribution allocated to the fragment, thereby inferring the logP value of the compound. The details are described in the following documents. In the present invention, the ClogP value calculated by the program CLOGP v4.82 is used. AJ Leo, Comprehensive Medicinal Chemistry, Vol. 4, C. Hansch, PG Sammnens, JB Taylor and CA Ramsden, Eds., p. 295, Pergamon Press, 1990 C. Hansch & AJ Leo. SUbstituent Constants For Correlation Analysis in Chemistry and Biology. John Wiley & Sons. AJ Leo. Calculating logPoct from structure. Chem. Rev., 93, 1281-1306, 1993.

logP表示分配係數P(Partition Coefficient)的常用對數,係以定量的數值表示某一有機化合物在油(通常為1-辛醇)與水的2相系的平衡中如何分配之物性值,由以下式表示。 logP=log(Coil/Cwater) 式中,Coil表示油相中的化合物的莫耳濃度,Cwater表示水相中的化合物的莫耳濃度。 若logP的值夾著0而正向(plus)增大,則表示油溶性增加,若絕對值負向(minus)增大,則表示水溶性增加,與有機化合物的水溶性有負相關,作為估計有機化合物的親疏水性之參數而廣泛利用。logP represents the common logarithm of the partition coefficient P (Partition Coefficient), which is a quantitative value that represents the physical property value of how a certain organic compound is distributed in the two-phase equilibrium of oil (usually 1-octanol) and water, as follows式 expression. logP=log(Coil/Cwater) In the formula, Coil represents the molar concentration of the compound in the oil phase, and Cwater represents the molar concentration of the compound in the water phase. If the value of logP sandwiches 0 and increases in the positive direction (plus), it means that the oil solubility increases. If the absolute value (minus) increases in the negative direction, it means that the water solubility increases, which is negatively correlated with the water solubility of organic compounds. It is widely used to estimate the hydrophilic and hydrophobic parameters of organic compounds.

高分子化合物作為疏水性結構單元,含有選自源自以下述通式(i)~(iii)表示之單體的結構單元之1種以上的結構單元為較佳。As the hydrophobic structural unit, the polymer compound preferably contains one or more structural units selected from structural units derived from monomers represented by the following general formulas (i) to (iii).

[化學式5]

Figure 02_image009
[Chemical formula 5]
Figure 02_image009

上述式(i)~(iii)中,R1 、R2 及R3 分別獨立地表示氫原子、鹵原子(例如,氟原子、氯原子、溴原子等)或碳原子數為1~6的烷基(例如,甲基、乙基、丙基等)。 R1 、R2 及R3 係氫原子或碳原子數為1~3的烷基為較佳,氫原子或甲基為更佳。R2 及R3 係氫原子尤為佳。 X表示氧原子(-O-)或亞胺基(-NH-),氧原子為較佳。In the above formulas (i) to (iii), R 1 , R 2 and R 3 each independently represent a hydrogen atom, a halogen atom (for example, a fluorine atom, a chlorine atom, a bromine atom, etc.) or a carbon atom of 1 to 6 Alkyl (for example, methyl, ethyl, propyl, etc.). R 1 , R 2 and R 3 are preferably a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and more preferably a hydrogen atom or a methyl group. R 2 and R 3 are particularly preferably hydrogen atoms. X represents an oxygen atom (-O-) or an imino group (-NH-), and an oxygen atom is preferred.

L係單鍵或2價的連結基。作為2價的連結基,可舉出2價的脂肪族基(例如,伸烷基、取代伸烷基、伸烯基、取代伸烯基、伸炔基、取代伸炔基)、2價的芳香族基(例如,伸芳基、取代伸芳基)、2價的雜環基、氧原子(-O-)、硫原子(-S-)、亞胺基(-NH-)、取代亞胺基(-NR31 -,其中,R31 為脂肪族基、芳香族基或雜環基)、羰基(-CO-)及該些的組合等。L is a single bond or a divalent linking group. Examples of the divalent linking group include divalent aliphatic groups (for example, alkylene, substituted alkylene, alkenylene, substituted alkenylene, alkynylene, and substituted alkynylene), divalent Aromatic groups (for example, aryl group, substituted aryl group), divalent heterocyclic group, oxygen atom (-O-), sulfur atom (-S-), imino group (-NH-), substituted arylene group An amino group (-NR 31 -, where R 31 is an aliphatic group, an aromatic group, or a heterocyclic group), a carbonyl group (-CO-), a combination of these, and the like.

2價的脂肪族基可具有環狀結構或分支結構。脂肪族基的碳原子數為1~20為較佳,1~15為更佳,1~10為進一步較佳。脂肪族基可以係不飽和脂肪族基,亦可以係飽和脂肪族基,但飽和脂肪族基為較佳。並且,脂肪族基可具有取代基。取代基的例子可舉出鹵原子、芳香族基及雜環基等。The divalent aliphatic group may have a cyclic structure or a branched structure. The number of carbon atoms of the aliphatic group is preferably 1-20, more preferably 1-15, and still more preferably 1-10. The aliphatic group may be an unsaturated aliphatic group or a saturated aliphatic group, but a saturated aliphatic group is preferred. In addition, the aliphatic group may have a substituent. Examples of the substituent include halogen atoms, aromatic groups, and heterocyclic groups.

2價的芳香族基的碳原子數為6~20為較佳,6~15為更佳,6~10為進一步較佳。並且,芳香族基可具有取代基。取代基的例子可舉出鹵原子、脂肪族基、芳香族基及雜環基等。The number of carbon atoms of the divalent aromatic group is preferably 6-20, more preferably 6-15, and still more preferably 6-10. In addition, the aromatic group may have a substituent. Examples of the substituent include halogen atoms, aliphatic groups, aromatic groups, and heterocyclic groups.

2價的雜環基作為雜環含有5員環或6員環為較佳。雜環上可縮合有其他雜環、脂肪族環或芳香族環。並且,雜環基可具有取代基。作為取代基的例子,可舉出鹵原子、羥基、氧代基(=O)、硫代基(=S)、亞胺基(=NH)、取代亞胺基(=N-R32 ,其中,R32 為脂肪族基、芳香族基或雜環基)、脂肪族基、芳香族基或雜環基。The divalent heterocyclic group preferably contains a 5-membered ring or a 6-membered ring as a heterocyclic ring. The heterocyclic ring may be condensed with other heterocyclic rings, aliphatic rings or aromatic rings. In addition, the heterocyclic group may have a substituent. Examples of substituents include halogen atoms, hydroxyl groups, oxo groups (=O), thio groups (=S), imino groups (=NH), and substituted imino groups (=NR 32 , where R 32 is an aliphatic group, an aromatic group or a heterocyclic group), an aliphatic group, an aromatic group or a heterocyclic group.

L係單鍵、伸烷基或含有氧化烯結構之2價的連結基為較佳。氧化烯結構係氧乙烯結構或氧丙烯結構為更佳。並且,L可含有重複包含2個以上的氧化烯結構之聚氧化烯結構。作為聚氧化烯結構,聚氧乙烯結構或聚氧丙烯結構為較佳。聚氧乙烯結構以-(OCH2 CH2 )n-表示,n為2以上的整數為較佳,2~10的整數為更佳。L-based single bonds, alkylene groups, or divalent linking groups containing an oxyalkylene structure are preferred. The alkylene oxide structure is more preferably an oxyethylene structure or an oxypropylene structure. In addition, L may contain a polyoxyalkylene structure including two or more alkylene oxide structures repeatedly. As the polyoxyalkylene structure, a polyoxyethylene structure or a polyoxypropylene structure is preferable. The polyoxyethylene structure is represented by -(OCH 2 CH 2 )n-, and n is preferably an integer of 2 or more, and more preferably an integer of 2-10.

作為Z,可舉出脂肪族基(例如,烷基、取代烷基、不飽和烷基及取代不飽和烷基)、芳香族基(例如,芳基、取代芳基、伸芳基、取代伸芳基)、雜環基或該些的組合。該些基團中可包含氧原子(-O-)、硫原子(-S-)、亞胺基(-NH-)、取代亞胺基(-NR31 -、其中,R31 為脂肪族基、芳香族基或雜環基)、羰基(-CO-)。Examples of Z include aliphatic groups (for example, alkyl groups, substituted alkyl groups, unsaturated alkyl groups, and substituted unsaturated alkyl groups), aromatic groups (for example, aryl groups, substituted aryl groups, arylene groups, and substituted alkyl groups). Aryl), heterocyclic group or a combination of these. These groups may contain oxygen atoms (-O-), sulfur atoms (-S-), imino groups (-NH-), substituted imino groups (-NR 31 -, wherein R 31 is an aliphatic group , Aromatic group or heterocyclic group), carbonyl group (-CO-).

脂肪族基可具有環狀結構或分支結構。脂肪族基的碳原子數為1~20為較佳,1~15為更佳,1~10為進一步較佳。脂肪族基中還包含環集合烴基、交聯環式烴基,作為環集合烴基的例子,包含雙環己基、全氫萘基、聯苯基、4-環己基苯基等。作為交聯環式烴環,例如,可舉出:蒎烷(pinane)、莰烷(bornane)、降蒎烷(norpinane)、降莰烷(norbornane)、雙環辛烷環(雙環[2.2.2]辛烷環、雙環[3.2.1]辛烷環等)等2環式烴環;高佈雷烷(homobledane)、金剛烷、三環[5.2.1.02,6]癸烷、三環[4.3.1.12,5]十一烷環等3環式烴環;四環[4.4.0.12,5.17,10]十二烷、全氫-1,4-亞甲基-5,8-亞甲基萘環等4環式烴環等。並且,交聯環式烴環中還包含稠環式烴環,例如,全氫萘(十氫萘)、全氫蒽、全氫菲、全氫苊、全氫芴、全氫茚、全氫葩環等縮合有複數個5~8員環烷烴環之稠環。 與不飽和脂肪族基相比,脂肪族基係飽和脂肪族基為較佳。並且,脂肪族基可具有取代基。取代基的例子可舉出鹵原子、芳香族基及雜環基。其中,脂肪族基作為取代基不具有酸基。The aliphatic group may have a cyclic structure or a branched structure. The number of carbon atoms of the aliphatic group is preferably 1-20, more preferably 1-15, and still more preferably 1-10. The aliphatic group also includes a ring assembly hydrocarbyl group and a cross-linked cyclic hydrocarbyl group, and examples of the ring assembly hydrocarbyl group include bicyclohexyl, perhydronaphthyl, biphenyl, 4-cyclohexylphenyl, and the like. As the crosslinked cyclic hydrocarbon ring, for example, pinane, bornane, norpinane, norbornane, bicyclooctane ring (bicyclo[2.2.2 ]Octane ring, bicyclic [3.2.1] octane ring, etc.) and other 2-cyclic hydrocarbon rings; homobredane, adamantane, tricyclic [5.2.1.02,6] decane, tricyclic [4.3. 1.12,5] Undecane ring and other 3-cyclic hydrocarbon ring; tetracyclic [4.4.0.12,5.17,10] dodecane, perhydro-1,4-methylene-5,8-methylene naphthalene ring Etc. 4-cyclic hydrocarbon ring and so on. In addition, the cross-linked cyclic hydrocarbon ring also includes a fused-ring hydrocarbon ring, such as perhydronaphthalene (decahydronaphthalene), perhydroanthracene, perhydrophenanthrene, perhydroacenaphthene, perhydrofluorene, perhydroindene, perhydronaphthalene The condensed ring is a condensed ring of 5-8 member cycloalkane rings. Compared with unsaturated aliphatic groups, aliphatic groups are preferably saturated aliphatic groups. In addition, the aliphatic group may have a substituent. Examples of the substituent include a halogen atom, an aromatic group, and a heterocyclic group. Among them, the aliphatic group does not have an acid group as a substituent.

芳香族基的碳原子數為6~20為較佳,6~15為更佳,6~10為進一步較佳。並且,芳香族基可具有取代基。取代基的例子可舉出鹵原子、脂肪族基、芳香族基及雜環基。其中,芳香族基作為取代基不具有酸基。The number of carbon atoms of the aromatic group is preferably 6-20, more preferably 6-15, and still more preferably 6-10. In addition, the aromatic group may have a substituent. Examples of the substituent include halogen atoms, aliphatic groups, aromatic groups, and heterocyclic groups. Among them, the aromatic group does not have an acid group as a substituent.

雜環基作為雜環含有5員環或6員環為較佳。雜環上可縮合有其他雜環、脂肪族環或芳香族環。並且,雜環基可具有取代基。作為取代基的例子,可舉出鹵原子、羥基、氧代基(=O)、硫代基(=S)、亞胺基(=NH)、取代亞胺基(=N-R32 ,其中,R32 為脂肪族基、芳香族基或雜環基)、脂肪族基、芳香族基及雜環基。其中,雜環基作為取代基不具有酸基。The heterocyclic group preferably contains a 5-membered ring or a 6-membered ring as a heterocyclic ring. The heterocyclic ring may be condensed with other heterocyclic rings, aliphatic rings or aromatic rings. In addition, the heterocyclic group may have a substituent. Examples of substituents include halogen atoms, hydroxyl groups, oxo groups (=O), thio groups (=S), imino groups (=NH), and substituted imino groups (=NR 32 , where R 32 is an aliphatic group, an aromatic group or a heterocyclic group), an aliphatic group, an aromatic group and a heterocyclic group. Among them, the heterocyclic group does not have an acid group as a substituent.

上述式(iii)中,R4 、R5 及R6 分別獨立地表示氫原子、鹵原子(例如,氟原子、氯原子、溴原子等)、碳原子數為1~6的烷基(例如,甲基、乙基、丙基等)、Z或L-Z。其中,L及Z的含義與上述中的L及Z相同。作為R4 、R5 及R6 ,氫原子或碳原子數為1~3的烷基為較佳,氫原子為更佳。In the above formula (iii), R 4 , R 5 and R 6 each independently represent a hydrogen atom, a halogen atom (for example, a fluorine atom, a chlorine atom, a bromine atom, etc.), an alkyl group having 1 to 6 carbon atoms (for example , Methyl, ethyl, propyl, etc.), Z or LZ. However, the meanings of L and Z are the same as those of L and Z in the above. As R 4 , R 5 and R 6 , a hydrogen atom or an alkyl group having 1 to 3 carbon atoms is preferred, and a hydrogen atom is more preferred.

作為以上述通式(i)表示之單體,R1 、R2 及R3 為氫原子或甲基、L為單鍵或伸烷基或者包含氧化烯結構之2價的連結基、X為氧原子或亞胺基、Z為脂肪族基、雜環基或芳香族基之化合物為較佳。 並且,作為以上述通式(ii)表示之單體,R1 為氫原子或甲基、L為伸烷基、Z為脂肪族基、雜環基或芳香族基之化合物為較佳。並且,作為以上述通式(iii)表示之單體,R4 、R5 及R6 為氫原子或甲基、Z為脂肪族基、雜環基或芳香族基之化合物為較佳。As a monomer represented by the above general formula (i), R 1 , R 2 and R 3 are hydrogen atoms or methyl groups, L is a single bond or an alkylene group or a divalent linking group containing an oxyalkylene structure, and X is A compound in which an oxygen atom or an imino group, and Z is an aliphatic group, a heterocyclic group, or an aromatic group is preferable. In addition, as the monomer represented by the above general formula (ii), a compound in which R 1 is a hydrogen atom or a methyl group, L is an alkylene group, and Z is an aliphatic group, a heterocyclic group, or an aromatic group is preferable. In addition, as the monomer represented by the above general formula (iii), compounds in which R 4 , R 5 and R 6 are hydrogen atoms or methyl groups, and Z is an aliphatic group, heterocyclic group or aromatic group are preferred.

作為以式(i)~(iii)表示之代表性化合物的例子,可舉出選自丙烯酸酯類、甲基丙烯酸酯類及苯乙烯類等之自由基聚合性化合物。 另外,作為以式(i)~(iii)表示之代表性化合物的例子,能夠參閱日本特開2013-249417號公報的段落0089~0093中記載之化合物,該些內容引入本說明書中。Examples of representative compounds represented by formulas (i) to (iii) include radically polymerizable compounds selected from acrylic esters, methacrylic esters, styrenes, and the like. In addition, as examples of representative compounds represented by formulas (i) to (iii), reference can be made to the compounds described in paragraphs 0089 to 0093 of JP 2013-249417 A, and these contents are incorporated in this specification.

高分子化合物中,疏水性結構單元以質量換算,相對於高分子化合物的總質量,以10~90%的範圍包含為較佳,以20~80%的範圍包含為更佳。含量在上述範圍中可實現充分的圖案形成。In the polymer compound, the hydrophobic structural unit is calculated in terms of mass, and it is preferably contained in the range of 10 to 90%, and more preferably contained in the range of 20 to 80% relative to the total mass of the polymer compound. The content in the above range can achieve sufficient pattern formation.

(可與黑色顏料等形成相互作用之官能基) 高分子化合物能夠導入可與黑色顏料等著色顏料形成相互作用之官能基。其中,高分子化合物還包含含有可與黑色顏料等著色顏料形成相互作用之官能基之結構單元為較佳。 作為可與該黑色顏料等著色顏料形成相互作用之官能基,例如,可舉出酸基、鹼性基、配位性基及具有反應性之官能基等。 高分子化合物具有酸基、鹼性基、配位性基或具有反應性之官能基時,分別含有具有酸基之結構單元、具有鹼性基之結構單元、具有配位性基之結構單元或包含具有反應性之結構單元為較佳。 尤其,高分子化合物進一步含有羧酸基等鹼可溶性基作為酸基,藉此能夠對高分子化合物賦予用於基於鹼顯影之圖案形成的顯影性。 亦即,藉由向高分子化合物導入鹼可溶性基,上述組成物中,作為有助於黑色顏料等著色顏料的分散之分散劑的高分子化合物含有鹼可溶性。含有該種高分子化合物之組成物成為曝光部的遮光性優異者,且未曝光部的鹼顯影性得到提高。 並且,藉由高分子化合物包含含有酸基之結構單元,高分子化合物變得易與溶劑整合且塗佈性亦提高之趨勢。 推測這是因為,含有酸基之結構單元中的酸基易與黑色顏料等著色顏料相互作用,高分子化合物使黑色顏料等著色顏料穩定地分散,並且使黑色顏料等著色顏料分散之高分子化合物的黏度變低,高分子化合物本身亦容易穩定地分散。(Functional groups that can interact with black pigments, etc.) The polymer compound can introduce functional groups that can interact with colored pigments such as black pigments. Among them, the polymer compound preferably further includes a structural unit containing a functional group that can interact with color pigments such as black pigments. Examples of functional groups that can interact with color pigments such as black pigments include acid groups, basic groups, coordinating groups, and reactive functional groups. When a polymer compound has an acid group, a basic group, a coordination group or a reactive functional group, it contains a structural unit with an acid group, a structural unit with a basic group, a structural unit with a coordination group, or It is preferable to include reactive structural units. In particular, the polymer compound further contains an alkali-soluble group such as a carboxylic acid group as an acid group, whereby the polymer compound can be provided with developability for pattern formation by alkali development. That is, by introducing an alkali-soluble group into the polymer compound, the polymer compound that serves as a dispersant that contributes to the dispersion of color pigments such as black pigments in the above-mentioned composition contains alkali-solubility. A composition containing this type of polymer compound has an excellent light-shielding property of the exposed portion, and the alkali developability of the unexposed portion is improved. In addition, since the polymer compound contains a structural unit containing an acid group, the polymer compound becomes easy to integrate with the solvent and the coating properties are also improved. It is presumed that this is because the acid group in the structural unit containing the acid group easily interacts with color pigments such as black pigments, and the polymer compound makes the color pigments such as black pigments stably disperse and disperses the color pigments such as black pigments. The viscosity becomes lower, and the polymer compound itself is easily dispersed stably.

其中,含有作為酸基的鹼可溶性基之結構單元可以係與上述的含有接枝鏈之結構單元相同的結構單元,亦可以係不同的結構單元,但含有作為酸基的鹼可溶性基之結構單元係與上述的疏水性結構單元不同的結構單元(亦即,並不相當於上述的疏水性結構單元)。Among them, the structural unit containing an alkali-soluble group as an acid group may be the same structural unit as the above-mentioned graft chain-containing structural unit, or a different structural unit, but a structural unit containing an alkali-soluble group as an acid group It is a structural unit different from the above-mentioned hydrophobic structural unit (that is, it does not correspond to the above-mentioned hydrophobic structural unit).

作為可與黑色顏料等著色顏料形成相互作用之官能基亦即酸基,例如有羧酸基、磺酸基、磷酸基或酚性羥基等,羧酸基、磺酸基及磷酸基中的至少1種為較佳,針對黑色顏料等著色顏料的吸附力良好且著色顏料的分散性較高之角度考慮,羧酸基為更佳。 亦即,高分子化合物還包含含有羧酸基、磺酸基及磷酸基中的至少1種之結構單元為較佳。As a functional group that can interact with color pigments such as black pigments, that is, acid groups, for example, there are carboxylic acid groups, sulfonic acid groups, phosphoric acid groups, or phenolic hydroxyl groups. At least one of carboxylic acid groups, sulfonic acid groups, and phosphoric acid groups One type is preferable, and the carboxylic acid group is more preferable from the viewpoint of good adsorption power of color pigments such as black pigments and higher dispersibility of the color pigments. That is, the polymer compound preferably further includes a structural unit containing at least one of a carboxylic acid group, a sulfonic acid group, and a phosphoric acid group.

高分子化合物可具有1種或2種以上的含有酸基之結構單元。 高分子化合物可含有包含酸基之結構單元,亦可不含有,但含有時,含有酸基之結構單元的含量以質量換算,相對於高分子化合物的總質量,5~80%為較佳,從抑制基於鹼顯影之圖像強度的損傷之觀點考慮,10~60%為更佳。The polymer compound may have one type or two or more types of structural units containing acid groups. The polymer compound may or may not contain structural units containing acid groups, but when it contains, the content of structural units containing acid groups is calculated by mass. Relative to the total mass of the polymer compound, 5 to 80% is preferred. From the viewpoint of suppressing damage to the image strength based on alkali development, 10 to 60% is more preferable.

作為可與黑色顏料等著色顏料形成相互作用之官能基亦即鹼性基,例如有第1級胺基、第2級胺基、第3級胺基、含有N原子之雜環及醯胺基等,從針對黑色顏料等著色顏料的吸附力良好且著色顏料的分散性較高之角度考慮,第3級胺基為較佳。高分子化合物能夠含有1種或2種以上的該些鹼性基。 高分子化合物可含有包含鹼性基之結構單元,亦可不含有,但含有時,含有鹼性基之結構單元的含量以質量換算,相對於高分子化合物的總質量,0.01%以上且50%以下為較佳,從抑制阻礙顯影性之觀點考慮,0.01%以上且30%以下為更佳。Functional groups that can interact with color pigments such as black pigments, that is, basic groups, include, for example, first-level amino groups, second-level amino groups, third-level amino groups, heterocycles containing N atoms, and amide groups. For example, from the viewpoint of good adsorption force for color pigments such as black pigments and high dispersibility of the color pigments, a tertiary amino group is preferred. The polymer compound can contain one kind or two or more kinds of these basic groups. The polymer compound may or may not contain a structural unit containing a basic group, but when it contains, the content of the structural unit containing a basic group is calculated by mass, relative to the total mass of the polymer compound, 0.01% or more and 50% or less Preferably, it is more preferably 0.01% or more and 30% or less from the viewpoint of suppressing the hindrance of developability.

作為可與黑色顏料等著色顏料形成相互作用之官能基亦即配位性基及具有反應性之官能基,例如可舉出乙醯乙醯氧基、三烷氧基甲矽烷基、異氰酸酯基、酸酐及醯氯等。從針對黑色顏料等著色顏料吸附力良好且著色顏料的分散性較高之角度考慮,乙醯乙醯氧基為較佳。高分子化合物可具有1種或2種以上的該些基團。 高分子化合物可包含含有配位性基之結構單元或含有具有反應性之官能基之結構單元,亦可不含有,但含有時,該些結構單元的含量以質量換算,相對於高分子化合物的總質量,10%以上且80%以下為較佳,從抑制阻礙顯影性之觀點考慮,20%以上且60%以下為更佳。As the functional group that can interact with color pigments such as black pigments, that is, coordination groups and reactive functional groups, for example, acetylacetoxy, trialkoxysilyl, isocyanate, Acid anhydride and chlorinated acid etc. From the viewpoints of good adsorption force for color pigments such as black pigments and high dispersibility of the color pigments, the acetylacetoxy group is preferred. The polymer compound may have one kind or two or more kinds of these groups. The polymer compound may contain a structural unit containing a coordination group or a structural unit containing a reactive functional group, or not, but when it contains, the content of these structural units is calculated by mass, relative to the total polymer compound The quality is preferably 10% or more and 80% or less, and from the viewpoint of inhibiting the developmental property from being inhibited, 20% or more and 60% or less is more preferable.

上述高分子化合物除了接枝鏈以外還含有可與黑色顏料等著色顏料形成相互作用之官能基時,含有上述的各種可與黑色顏料等著色顏料形成相互作用之官能基即可,並不特別限定該些官能基如何被導入,但高分子化合物含有選自源自以下述通式(iv)~(vi)表示之單體的結構單元之1種以上的結構單元為較佳。When the above-mentioned polymer compound contains a functional group capable of interacting with black pigments and other coloring pigments in addition to the graft chain, it is sufficient to contain the above-mentioned various functional groups capable of interacting with coloring pigments such as black pigments, and it is not particularly limited. How these functional groups are introduced, it is preferable that the polymer compound contains one or more structural units selected from structural units derived from monomers represented by the following general formulas (iv) to (vi).

[化學式6]

Figure 02_image011
[Chemical formula 6]
Figure 02_image011

通式(iv)~通式(vi)中,R11 、R12 及R13 分別獨立地表示氫原子、鹵原子(例如,氟原子、氯原子、溴原子等)或碳原子數為1~6的烷基(例如,甲基、乙基、丙基等)。 通式(iv)~通式(vi)中,R11 、R12 及R13 分別獨立地為氫原子或碳原子數為1~3的烷基為較佳,分別獨立地為氫原子或甲基為更佳。通式(iv)中,R12 及R13 分別為氫原子尤為佳。In general formula (iv) to general formula (vi), R 11 , R 12 and R 13 each independently represent a hydrogen atom, a halogen atom (for example, a fluorine atom, a chlorine atom, a bromine atom, etc.), or the number of carbon atoms is 1 to 6 alkyl groups (for example, methyl, ethyl, propyl, etc.). In general formula (iv) to general formula (vi), R 11 , R 12 and R 13 are each independently a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and each independently is a hydrogen atom or methyl group. The base is better. In the general formula (iv), it is particularly preferable that R 12 and R 13 are each a hydrogen atom.

通式(iv)中的X1 表示氧原子(-O-)或亞胺基(-NH-),氧原子為較佳。 並且,通式(v)中的Y表示次甲基或氮原子。 X 1 in the general formula (iv) represents an oxygen atom (-O-) or an imino group (-NH-), and an oxygen atom is preferred. In addition, Y in the general formula (v) represents a methine group or a nitrogen atom.

並且,通式(iv)~通式(v)中的L1 表示單鍵或2價的連結基。作為2價的連結基的例子,可舉出2價的脂肪族基(例如,伸烷基、取代伸烷基、伸烯基、取代伸烯基、伸炔基及取代伸炔基)、2價的芳香族基(例如,伸芳基及取代伸芳基)、2價的雜環基、氧原子(-O-)、硫原子(-S-)、亞胺基(-NH-)、取代亞胺鍵(-NR31 ’-,其中,R31 ’為脂肪族基、芳香族基或雜環基)、羰鍵(-CO-)及該些的組合等。 In addition, L 1 in general formula (iv) to general formula (v) represents a single bond or a divalent linking group. Examples of divalent linking groups include divalent aliphatic groups (for example, alkylene, substituted alkylene, alkenylene, substituted alkenylene, alkynylene, and substituted alkynylene), 2 Valence aromatic groups (for example, aryl and substituted aryl groups), divalent heterocyclic groups, oxygen atoms (-O-), sulfur atoms (-S-), imino groups (-NH-), substituted imine bond (-NR 31 '-, wherein, R 31' is an aliphatic group, an aromatic group or a heterocyclic group), a carbonyl bond (-CO-), and the like, and combinations of the these.

2價的脂肪族基可具有環狀結構或分支結構。脂肪族基的碳原子數為1~20為較佳,1~15為更佳,1~10為進一步較佳。與不飽和脂肪族基相比,脂肪族基為飽和脂肪族基為較佳。並且,脂肪族基可具有取代基。作為取代基的例子,可舉出鹵原子、羥基、芳香族基及雜環基。The divalent aliphatic group may have a cyclic structure or a branched structure. The number of carbon atoms of the aliphatic group is preferably 1-20, more preferably 1-15, and still more preferably 1-10. Compared with an unsaturated aliphatic group, the aliphatic group is preferably a saturated aliphatic group. In addition, the aliphatic group may have a substituent. Examples of the substituent include a halogen atom, a hydroxyl group, an aromatic group, and a heterocyclic group.

2價的芳香族基的碳原子數為6~20為較佳,6~15為更佳,6~10為進一步較佳。並且,芳香族基可具有取代基。取代基的例子可舉出鹵原子、羥基、脂肪族基、芳香族基及雜環基。The number of carbon atoms of the divalent aromatic group is preferably 6-20, more preferably 6-15, and still more preferably 6-10. In addition, the aromatic group may have a substituent. Examples of the substituent include a halogen atom, a hydroxyl group, an aliphatic group, an aromatic group, and a heterocyclic group.

2價的雜環基作為雜環含有5員環或6員環為較佳。雜環中可縮合有其他雜環、脂肪族環或芳香族環中的1個以上。並且,雜環基可具有取代基。作為取代基的例子,可舉出鹵原子、羥基、氧代基(=O)、硫代基(=S)、亞胺基(=NH)、取代亞胺基(=N-R32 ,其中,R32 為脂肪族基、芳香族基或雜環基)、脂肪族基、芳香族基及雜環基。The divalent heterocyclic group preferably contains a 5-membered ring or a 6-membered ring as a heterocyclic ring. One or more of other heterocyclic rings, aliphatic rings, or aromatic rings may be condensed in the heterocyclic ring. In addition, the heterocyclic group may have a substituent. Examples of substituents include halogen atoms, hydroxyl groups, oxo groups (=O), thio groups (=S), imino groups (=NH), and substituted imino groups (=NR 32 , where R 32 is an aliphatic group, an aromatic group or a heterocyclic group), an aliphatic group, an aromatic group and a heterocyclic group.

L1 係單鍵、伸烷基或包含氧化烯結構之2價的連結基為較佳。氧化烯結構係氧乙烯結構或氧丙烯結構為更佳。並且,L1 可包含重複包含2個以上的氧化烯結構之聚氧化烯結構。作為聚氧化烯結構,聚氧乙烯結構或聚氧丙烯結構為較佳。聚氧乙烯結構以-(OCH2 CH2 )n-表示,n為2以上的整數為較佳,2~10的整數為更佳。L 1 is preferably a single bond, an alkylene group, or a divalent linking group containing an oxyalkylene structure. The alkylene oxide structure is more preferably an oxyethylene structure or an oxypropylene structure. In addition, L 1 may include a polyoxyalkylene structure repeatedly including two or more alkylene oxide structures. As the polyoxyalkylene structure, a polyoxyethylene structure or a polyoxypropylene structure is preferable. The polyoxyethylene structure is represented by -(OCH 2 CH 2 )n-, and n is preferably an integer of 2 or more, and more preferably an integer of 2-10.

通式(iv)~通式(vi)中,Z1 表示接枝鏈以外可與黑色顏料等著色顏料形成相互作用之官能基,羧酸基及第三級胺基為較佳,羧酸基為更佳。In general formula (iv) to general formula (vi), Z 1 represents a functional group other than the graft chain that can interact with color pigments such as black pigments. Carboxylic acid groups and tertiary amino groups are preferred. Carboxylic acid groups For better.

通式(vi)中,R14 、R15 及R16 分別獨立地表示氫原子、鹵原子(例如,氟、氯、溴等)、碳原子數為1~6的烷基(例如,甲基、乙基及丙基等)、-Z1 或L1 -Z1 。其中,L1 及Z1 的含義與上述中的L1 及Z1 相同,較佳例亦相同。作為R14 、R15 及R16 ,分別獨立地為氫原子、或碳原子數為1~3的烷基為較佳,氫原子為更佳。In the general formula (vi), R 14 , R 15 and R 16 each independently represent a hydrogen atom, a halogen atom (for example, fluorine, chlorine, bromine, etc.), an alkyl group having 1 to 6 carbon atoms (for example, methyl , ethyl and propyl, etc.), - Z 1 or L 1 -Z 1. Wherein, L 1 and Z 1 meaning the same as the above L 1 and Z 1, preferred embodiments are also the same. As R 14 , R 15 and R 16 , each independently a hydrogen atom or an alkyl group having 1 to 3 carbon atoms is preferred, and a hydrogen atom is more preferred.

作為以通式(iv)表示之單體,R11 、R12 及R13 分別獨立地為氫原子或甲基、L1 為伸烷基或含有氧化烯結構之2價的連結基、X1 為氧原子或亞胺基、Z1 為羧酸基之化合物為較佳。 並且,作為以通式(v)表示之單體,R11 為氫原子或甲基、L1 為伸烷基、Z1 為羧酸基、Y為次甲基之化合物為較佳。 而且,作為以通式(vi)表示之單體,R14 、R15 及R16 分別獨立地為氫原子或甲基、L1 為單鍵或伸烷基、Z1 為羧酸基之化合物為較佳。As a monomer represented by the general formula (iv), R 11 , R 12 and R 13 are each independently a hydrogen atom or a methyl group, L 1 is an alkylene group or a divalent linking group containing an oxyalkylene structure, X 1 A compound in which it is an oxygen atom or an imino group, and Z 1 is a carboxylic acid group is preferred. In addition, as the monomer represented by the general formula (v), a compound in which R 11 is a hydrogen atom or a methyl group, L 1 is an alkylene group, Z 1 is a carboxylic acid group, and Y is a methine group is preferable. Furthermore, as a monomer represented by the general formula (vi), R 14 , R 15 and R 16 are each independently a hydrogen atom or a methyl group, L 1 is a single bond or an alkylene group, and Z 1 is a carboxylic acid group. For better.

以下,示出以通式(iv)~通式(vi)表示之單體(化合物)的代表例。 作為單體的例子,可舉出甲基丙烯酸、巴豆酸、異巴豆酸、分子內含有加成聚合性雙鍵及羥基之化合物(例如,甲基丙烯酸2-羥乙基)與琥珀酸酐的反應物、分子內含有加成聚合性雙鍵及羥基之化合物與鄰苯二甲酸酐的反應物、分子內含有加成聚合性雙鍵及羥基之化合物與四羥基鄰苯二甲酸酐的反應物、分子內含有加成聚合性雙鍵及羥基之化合物與偏苯三酸酐的反應物、分子內含有加成聚合性雙鍵及羥基之化合物與均苯四甲酸酐的反應物、丙烯酸、丙烯酸二聚物、丙烯酸寡聚物、馬來酸、伊康酸、反丁烯二酸、4-乙烯基安息香酸、乙烯基苯酚及4-羥基苯甲基丙烯醯等。Hereinafter, representative examples of monomers (compounds) represented by general formula (iv) to general formula (vi) are shown. Examples of monomers include the reaction of methacrylic acid, crotonic acid, isocrotonic acid, compounds containing addition polymerizable double bonds and hydroxyl groups in the molecule (for example, 2-hydroxyethyl methacrylate) and succinic anhydride The reaction product of a compound containing an addition polymerizable double bond and a hydroxyl group in the molecule and phthalic anhydride, a reaction product of a compound containing an addition polymerizable double bond and a hydroxyl group in the molecule and tetrahydroxyphthalic anhydride, A reaction product of a compound containing an addition polymerizable double bond and a hydroxyl group and trimellitic anhydride, a reaction product of a compound containing an addition polymerizable double bond and a hydroxyl group and a pyromellitic anhydride in the molecule, acrylic acid, acrylic acid dimer, acrylic acid Oligomers, maleic acid, itaconic acid, fumaric acid, 4-vinyl benzoic acid, vinyl phenol and 4-hydroxybenzyl acrylate, etc.

從與黑色顏料等著色顏料的相互作用、經時穩定性及向顯影液的浸透性的觀點考慮,含有可與黑色顏料等著色顏料形成相互作用之官能基之結構單元的含量,相對於高分子化合物的總質量,0.05質量%~90質量%為較佳,1.0質量%~80質量%為更佳,10質量%~70質量%為進一步較佳。From the viewpoints of interaction with black pigments and other colored pigments, stability over time, and permeability to developing solutions, the content of structural units containing functional groups that can interact with colored pigments such as black pigments is relative to that of macromolecules. The total mass of the compound is preferably 0.05% by mass to 90% by mass, more preferably 1.0% by mass to 80% by mass, and more preferably 10% by mass to 70% by mass.

(其他結構單元) 而且,為了提高圖像強度等各種性能,高分子化合物可在無損本發明的效果之前提下,進一步含有與含有接枝鏈之結構單元、疏水性結構單元及含有可與黑色顏料等著色顏料形成相互作用之官能基之結構單元不同之、含有各種功能之其他結構單元(例如,具有與用於分散物之分散介質具有親和性之官能基等之結構單元)。 作為該種其他結構單元,例如可舉出源自選自丙烯腈類及甲基丙烯腈類等之自由基聚合性化合物的結構單元。 高分子化合物能夠使用1種或者2種以上的該些其他結構單元,其含量以質量換算,相對於高分子化合物的總質量,0%以上且80%以下為較佳,10%以上且60%以下尤為佳。含量在上述範圍內可維持充分的圖案形成性。(Other structural units) Moreover, in order to improve various properties such as image intensity, the polymer compound can further contain a structural unit containing a graft chain, a hydrophobic structural unit, and a structural unit that can be combined with black without compromising the effect of the present invention. Colored pigments such as pigments have different structural units that form functional groups that interact with each other, and other structural units that contain various functions (for example, structural units that have functional groups that have affinity with the dispersion medium used for the dispersion). Examples of such other structural units include structural units derived from radically polymerizable compounds selected from acrylonitriles and methacrylonitriles. The polymer compound can use one or more of these other structural units, and the content is calculated by mass. Relative to the total mass of the polymer compound, 0% or more and 80% or less is preferred, 10% or more and 60% The following is particularly good. The content can maintain sufficient pattern formability within the above-mentioned range.

(高分子化合物的物性) 高分子化合物的酸值為0mgKOH/g以上且160mgKOH/g以下的範圍為較佳,10mgKOH/g以上且140mgKOH/g以下的範圍為更佳,20mgKOH/g以上且120mgKOH/g以下的範圍為進一步較佳。 若高分子化合物的酸值為160mgKOH/g以下,則更有效地抑制形成硬化膜時的顯影中的圖案剝離。並且,若高分子化合物的酸值為10mgKOH/g以上,則鹼顯影性更加良好。並且,若高分子化合物的酸值為20mgKOH/g以上,則能夠更加抑制黑色顏料等著色顏料的沉澱,能夠使粗大粒子數更少,能夠更加提高組成物的經時穩定性。(Physical properties of the polymer compound) The acid value of the polymer compound is preferably in the range of 0 mgKOH/g or more and 160 mgKOH/g or less, more preferably in the range of 10 mgKOH/g or more and 140 mgKOH/g or less, 20 mgKOH/g or more and 120 mgKOH The range of /g or less is more preferable. If the acid value of the polymer compound is 160 mgKOH/g or less, it is more effective to suppress pattern peeling during development when the cured film is formed. In addition, when the acid value of the polymer compound is 10 mgKOH/g or more, the alkali developability is more favorable. In addition, if the acid value of the polymer compound is 20 mgKOH/g or more, the precipitation of color pigments such as black pigments can be more suppressed, the number of coarse particles can be reduced, and the stability of the composition over time can be further improved.

高分子化合物的酸值例如能夠由高分子化合物中的酸基的平均含量計算。並且,能夠藉由改變含有高分子化合物的構成成分亦即酸基之結構單元的含量來獲得具有所希望的酸值之樹脂。The acid value of the polymer compound can be calculated from the average content of acid groups in the polymer compound, for example. In addition, it is possible to obtain a resin having a desired acid value by changing the content of the structural unit of the acid group, which is the constituent component of the polymer compound.

形成硬化膜時,從顯影時的圖案剝離的抑制和顯影性的觀點考慮,高分子化合物的重量平均分子量作為基於GPC(Gel Permeation Chromatography:凝膠滲透層析法)法之聚苯乙烯換算值,4,000以上且300,000以下為較佳,5,000以上且200,000以下為更佳,6,000以上且100,000以下進一步較佳,10,000以上且50,000以下尤為佳。 GPC法基於如下方法,亦即,利用HLC-8020GPC(TOSOH CORPORATION製造),作為管柱使用TSKgel SuperHZM-H、TSKgel SuperHZ4000、TSKgel SuperHZ2000(TOSOH CORPORATION製造、4.6mmID×15cm),作為溶離液使用THF(四氫呋喃)。When the cured film is formed, the weight average molecular weight of the polymer compound is taken as a polystyrene conversion value based on the GPC (Gel Permeation Chromatography) method from the viewpoint of suppression of pattern peeling during development and developability. 4,000 or more and 300,000 or less are preferably, more preferably 5,000 or more and 200,000 or less, more preferably 6,000 or more and 100,000 or less, and particularly preferably 10,000 or more and 50,000 or less. The GPC method is based on the following method: HLC-8020GPC (manufactured by TOSOH CORPORATION), TSKgel SuperHZM-H, TSKgel SuperHZ4000, TSKgel SuperHZ2000 (manufactured by TOSOH CORPORATION, 4.6mmID×15cm) as the column, and THF ( Tetrahydrofuran).

高分子化合物能夠依公知的方法合成,作為合成高分子化合物時使用之溶劑,例如可舉出二氯乙烷、環己酮、甲乙酮、丙酮、甲醇、乙醇、丙醇、丁醇、乙二醇單甲醚、乙二醇單乙醚、2-甲氧基乙基乙酸酯、1-甲氧基-2-丙醇、1-甲氧基-2-乙酸丙酯、N,N-二甲基甲醯胺、N,N-二甲基乙醯胺、二甲基亞碸、甲苯、乙酸乙酯、乳酸甲酯及乳酸乙酯等。該些溶劑可單獨使用亦可混合2種以上來使用。The polymer compound can be synthesized according to a known method. As a solvent used in the synthesis of polymer compound, for example, dichloroethane, cyclohexanone, methyl ethyl ketone, acetone, methanol, ethanol, propanol, butanol, ethylene glycol Monomethyl ether, ethylene glycol monoethyl ether, 2-methoxyethyl acetate, 1-methoxy-2-propanol, 1-methoxy-2-propyl acetate, N,N-dimethyl Methyl methamide, N,N-dimethyl acetamide, dimethyl sulfide, toluene, ethyl acetate, methyl lactate, ethyl lactate, etc. These solvents may be used alone or in mixture of two or more kinds.

作為高分子化合物的具體例,可舉出Kusumoto Chemicals, Ltd.製造“DA-7301”、BYK Chemie公司製造“Disperbyk-101(聚醯胺胺磷酸鹽)、107(羧酸酯)、110(含有酸基之共聚物)、111(磷酸系分散劑)、130(聚醯胺)、161、162、163、164、165、166、170、190(高分子共聚物)”、“BYK-P104、P105(高分子量不飽和聚羧酸)”、EFKA公司製造“EFKA4047、4050~4010~4165(聚胺基甲酸酯系)、EFKA4330~4340(嵌段共聚物)、4400~4402(改性聚丙烯酸酯)、5010(聚醯胺酯)、5765(高分子量聚羧酸鹽)、6220(脂肪酸聚酯)、6745(酞菁衍生物)、6750(偶氮顏料衍生物)”、Ajinomoto Fine-Techno Co., Inc.製造“AJISPER PB821、PB822、PB880、PB881”、KYOEISHA CHEMICAL Co., LTD.製造“FLOREN TG-710(胺基甲酸酯低聚物)”、“Polyflow No.50E、No.300(丙烯酸系共聚物)”、Kusumoto Chemicals, Ltd.製造“DISPARLON KS-860、873SN、874、#2150(脂肪族多元羧酸)、#7004(聚醚酯)、DA-703-50、DA-705、DA-725”、Kao Corporation製造“DEMOL RN、N(萘磺酸福馬林縮聚物)、MS、C、SN-B(芳香族磺酸福馬林縮聚物)”、“HOMOGENOL L-18(高分子聚羧酸)”、“EMULGEN 920、930、935、985(聚氧乙烯壬基苯基醚)”、“ACETAMIN 86(硬脂胺醋酸鹽)”、The Lubrinzol corporation製造“SOLSPERSE 5000(酞菁衍生物)、22000(偶氮顏料衍生物)、13240(聚酯胺)、3000、12000、17000、20000、27000(在末端部含有功能部之高分子)、24000、28000、32000、38500(接枝共聚物)”、Nikkol Chemicals CO., LTD.製造“Nikkor T106(聚氧乙烯山梨醇單油酸酯)、MYS-IEX(聚氧乙烯單硬脂酸酯)”、Kawaken Fine Chemicals CO., LTD.製造HINOAKUTO T-8000E等、Shin-Etsu Chemical Co., Ltd.製造聚有機基團矽氧烷聚合物KP341、Yusho Co Ltd製造“W001:陽離子系界面活性劑”、聚氧乙烯月桂基醚、聚氧乙烯硬脂醚、聚氧乙烯油基醚、聚氧乙烯辛基苯基醚、聚氧乙烯壬基苯基醚、聚乙二醇二月桂酸酯、聚乙二醇二硬脂酸酯、脫水山梨醇脂肪酸酯等非離子系界面活性劑、“W004、W005、W017”等陰離子系界面活性劑、MORISHITA & CO., LTD.製造“EFKA-46、EFKA-47、EFKA-47EA、EFKA聚合物100、EFKA聚合物400、EFKA聚合物401、EFKA聚合物450”、SAN NOPCO LIMITED製造“Disperse Aid 6、Disperse Aid 8、Disperse Aid 15、Disperse Aid 9100”等高分子分散劑、ADEKA CORPORATION製造“Adeka Pluronic L31、F38、L42、L44、L61、L64、F68、L72、P95、F77、P84、F87、P94、L101、P103、F108、L121、P-123”及Sanyo Chemical Industries, Ltd.製造“Ionet(商品名)S-20”等。並且,還能夠使用Acrylic base FFS-6752、Acrylic base FFS-187、Akurikyua-RD-F8及Cyclomer P。 並且,作為兩性樹脂的市售品,例如可舉出BYK Additives&Instruments製造的DISPERBYK-130、DISPERBYK-140、DISPERBYK-142、DISPERBYK-145、DISPERBYK-180、DISPERBYK-187、DISPERBYK-191、DISPERBYK-2001、DISPERBYK-2010、DISPERBYK-2012、DISPERBYK-2025、BYK-9076、Ajinomoto Fine-Techno Co.,Inc.製造的AJISPER PB821、AJISPER PB822及AJISPER PB881等。 該些高分子化合物可單獨使用,亦可組合2種以上來使用。Specific examples of polymer compounds include "DA-7301" manufactured by Kusumoto Chemicals, Ltd., "Disperbyk-101 (polyamide amine phosphate) manufactured by BYK Chemie, 107 (carboxylate), 110 (containing Acid-based copolymer), 111 (phosphate-based dispersant), 130 (polyamide), 161, 162, 163, 164, 165, 166, 170, 190 (polymer copolymer)", "BYK-P104, P105 (high molecular weight unsaturated polycarboxylic acid)", EFKA 4047, 4050-4010-4165 (polyurethane series), EFKA 4330-4340 (block copolymer), 4400-4402 (modified poly Acrylate), 5010 (polyamide ester), 5765 (high molecular weight polycarboxylate), 6220 (fatty acid polyester), 6745 (phthalocyanine derivative), 6750 (azo pigment derivative)", Ajinomoto Fine- "AJISPER PB821, PB822, PB880, PB881" manufactured by Techno Co., Inc., "FLOREN TG-710 (urethane oligomer)" manufactured by KYOEISHA CHEMICAL Co., LTD., "Polyflow No.50E, No .300 (acrylic copolymer)", manufactured by Kusumoto Chemicals, Ltd. "DISPARLON KS-860, 873SN, 874, #2150 (aliphatic polycarboxylic acid), #7004 (polyether ester), DA-703-50, DA-705, DA-725", Kao Corporation "DEMOL RN, N (formalin naphthalenesulfonate condensation polymer), MS, C, SN-B (aromatic sulfonate formalin condensation polymer)", "HOMOGENOL L- 18 (polymer polycarboxylic acid)", "EMULGEN 920, 930, 935, 985 (polyoxyethylene nonyl phenyl ether)", "ACETAMIN 86 (stearyl amine acetate)", "SOLSPERSE 5000 manufactured by The Lubrinzol corporation" (Phthalocyanine derivatives), 22000 (Azo pigment derivatives), 13240 (polyester amine), 3000, 12000, 17000, 20000, 27000 (polymers with functional parts at the end), 24000, 28000, 32000, 38500 (graft copolymer)", "Nikkor T106 (polyoxyethylene sorbitol monooleate), MYS-IEX (polyoxyethylene monostearate)" manufactured by Nikkol Chemicals CO., LTD., Kawaken Fine Ch Emicals CO., LTD. manufactures HINOAKUTO T-8000E, etc., Shin-Etsu Chemical Co., Ltd. manufactures polyorganosiloxane polymer KP341, Yusho Co Ltd manufactures "W001: cationic surfactant", polyoxygen Ethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene oleyl ether, polyoxyethylene octyl phenyl ether, polyoxyethylene nonyl phenyl ether, polyethylene glycol dilaurate, polyethylene glycol Nonionic surfactants such as distearate and sorbitan fatty acid esters, anionic surfactants such as "W004, W005, and W017", "EFKA-46, EFKA-47" manufactured by MORISHITA & CO., LTD. , EFKA-47EA, EFKA polymer 100, EFKA polymer 400, EFKA polymer 401, EFKA polymer 450", "Disperse Aid 6, Disperse Aid 8, Disperse Aid 15, Disperse Aid 9100" and other polymers manufactured by SAN NOPCO LIMITED Dispersant, "Adeka Pluronic L31, F38, L42, L44, L61, L64, F68, L72, P95, F77, P84, F87, P94, L101, P103, F108, L121, P-123" manufactured by ADEKA CORPORATION and Sanyo Chemical "Ionet (trade name) S-20" manufactured by Industries, Ltd., etc. In addition, Acrylic base FFS-6752, Acrylic base FFS-187, Akurikyua-RD-F8, and Cyclomer P can also be used. In addition, as commercial products of amphoteric resins, for example, DISPERBYK-130, DISPERBYK-140, DISPERBYK-142, DISPERBYK-145, DISPERBYK-180, DISPERBYK-187, DISPERBYK-191, DISPERBYK-2001, manufactured by BYK Additives & Instruments DISPERBYK-2010, DISPERBYK-2012, DISPERBYK-2025, BYK-9076, AJISPER PB821, AJISPER PB822 and AJISPER PB881 manufactured by Ajinomoto Fine-Techno Co., Inc. etc. These polymer compounds may be used alone or in combination of two or more kinds.

另外,作為高分子化合物的具體例,能夠參閱日本特開2013-249417號公報的段落0127~0129中記載之高分子化合物,該些內容引入本說明書中。In addition, as a specific example of the polymer compound, the polymer compound described in paragraphs 0127 to 0129 of JP 2013-249417 A can be referred to, and these contents are incorporated in this specification.

並且,作為分散劑,除了上述的高分子化合物以外,還能夠使用日本特開2010-106268號公報的段落0037~0115(對應之US2011/0124824的段落0075~0133欄)的接枝共聚物,該些內容能夠援用並引入本說明書中。 並且,上述以外,還能夠使用日本特開2011-153283號公報的段落0028~0084(對應之US2011/0279759的段落0075~0133欄)的含有包含酸性基經由連結基鍵結而成之側鏈結構之構成成分之高分子化合物,該些內容能夠援用並引入本說明書中。In addition, as the dispersant, in addition to the above-mentioned polymer compounds, the graft copolymers of paragraphs 0037 to 0115 (corresponding to paragraphs 0075 to 0133 of US2011/0124824) of JP 2010-106268 A can also be used. These contents can be cited and introduced into this manual. In addition to the above, paragraphs 0028 to 084 of JP 2011-153283 (corresponding to paragraphs 0075 to 0133 of US2011/0279759) containing side chain structures containing acidic groups bonded via linking groups can also be used. The content of the polymer compound of the constituent components can be cited and incorporated into this specification.

組成物含有分散劑時,分散劑的含量相對於組成物的總固體成分,0.1~50質量%為較佳,0.5~30質量%為更佳。 分散劑可單獨使用1種,亦可倂用2種以上。倂用2種以上時,總計量成為上述範圍為較佳。When the composition contains a dispersant, the content of the dispersant relative to the total solid content of the composition is preferably 0.1-50% by mass, more preferably 0.5-30% by mass. One type of dispersant may be used alone, or two or more types may be used. When two or more types are used, it is preferable that the total amount falls within the above-mentioned range.

上述組成物中,上述分散劑相對於上述含金屬氮化物的粒子之質量比(亦即,(組成物中的分散劑的含量)/(組成物中的含金屬氮化物的粒子的含量),以下還稱作“D/P”。)為0.05~0.30為較佳,0.10~0.30為更佳,0.12~0.30為進一步較佳。若上述D/P為0.30以下,則藉由上述組成物形成之硬化膜具有更優異之解像性。若上述D/P為0.05以上,則上述組成物具有更優異之經時穩定性。In the composition, the mass ratio of the dispersant to the metal nitride-containing particles (that is, (the content of the dispersant in the composition)/(the content of the metal nitride-containing particles in the composition), Hereinafter, it is also referred to as "D/P".) It is preferably 0.05 to 0.30, more preferably 0.10 to 0.30, and even more preferably 0.12 to 0.30. If the above-mentioned D/P is 0.30 or less, the cured film formed of the above-mentioned composition has more excellent resolution. If the above D/P is 0.05 or more, the above composition has more excellent stability over time.

上述組成物中,上述分散劑相對於上述原子A之質量比(亦即,(組成物中的分散劑的含量)/(組成物中的Fe原子的含量))的下限值為0.8以上為較佳,1.0以上為更佳,1.5以上為進一步較佳。上限值為270以下為較佳,150以下為更佳,50以下為進一步較佳。 藉由分散劑相對於原子A之質量比在上述範圍內,上述組成物具有更優異之本發明的效果。尤其,藉由上述質量比在1.5~50的範圍內,上述組成物具有進一步優異之本發明的效果。其理由雖不明確,但認為組成物中的原子A與分散劑相互作用,藉此對圖案形成性(硬化性及解像性)帶來影響。In the above composition, the lower limit of the mass ratio of the dispersant relative to the atom A (that is, (the content of the dispersant in the composition)/(the content of Fe atoms in the composition)) is 0.8 or more Preferably, 1.0 or more is more preferable, and 1.5 or more is even more preferable. The upper limit is preferably 270 or less, more preferably 150 or less, and even more preferably 50 or less. Since the mass ratio of the dispersant to the atom A is within the above range, the above composition has a more excellent effect of the present invention. In particular, since the above-mentioned mass ratio is in the range of 1.5-50, the above-mentioned composition has a further excellent effect of the present invention. Although the reason is not clear, it is thought that the atom A in the composition interacts with the dispersant, thereby affecting the patterning properties (curability and resolution).

上述組成物中,下述聚合性化合物相對於上述原子A之質量比(亦即,(組成物中的聚合性化合物的含量)/(組成物中的原子A的含量))的下限值為0.7以上為較佳,0.85以上為更佳,1.0以上為進一步較佳。上限值為50以下為較佳,11以下為更佳,7.0以下為進一步較佳。 藉由聚合性化合物相對於原子A之質量比在上述範圍內,組成物具有更優異之本發明的效果。藉由上述含有比例在1.0~7.0的範圍內,組成物具有更優異之本發明的效果。其理由雖不明確,但認為組成物中的原子A與聚合性化合物相互作用,藉此對圖案形成性(硬化性及解像性)帶來影響。In the above-mentioned composition, the lower limit of the mass ratio of the following polymerizable compound to the above-mentioned atom A (that is, (the content of the polymerizable compound in the composition)/(the content of the atom A in the composition)) is 0.7 or more is preferable, 0.85 or more is more preferable, and 1.0 or more is still more preferable. The upper limit is preferably 50 or less, more preferably 11 or less, and even more preferably 7.0 or less. When the mass ratio of the polymerizable compound to the atom A is within the above range, the composition has a more excellent effect of the present invention. When the above-mentioned content ratio is in the range of 1.0 to 7.0, the composition has more excellent effects of the present invention. Although the reason is not clear, it is thought that the atom A in the composition interacts with the polymerizable compound and thereby affects the patterning properties (curability and resolution).

〔黏結樹脂〕 上述組成物含有黏結樹脂為較佳。 作為黏結樹脂,使用線狀有機聚合物為較佳。作為該種線狀有機聚合物,能夠任意地使用公知者。為了實現水顯影或弱鹼性水顯影,選擇對水或弱鹼性水為可溶性或膨潤性之線狀有機聚合物為更佳。其中,作為黏結樹脂,鹼可溶性樹脂(含有促進鹼可溶性之基團之樹脂)尤為佳。 作為黏結樹脂,能夠從線狀有機聚合物且分子(較佳地為以(甲基)丙烯酸系共聚物或苯乙烯系共聚物為主鏈之分子)中含有至少1個促進鹼可溶性之基團之鹼可溶性樹脂中適當選擇。從耐熱性的觀點考慮,聚羥基苯乙烯系樹脂、聚矽氧烷系樹脂、(甲基)丙烯酸樹脂、(甲基)丙烯醯胺系樹脂、(甲基)丙烯酸/(甲基)丙烯醯胺共聚物樹脂、環氧系樹脂及聚醯亞胺系樹脂為較佳,從顯影性控制的觀點考慮,(甲基)丙烯酸樹脂、(甲基)丙烯醯胺系樹脂、(甲基)丙烯酸/(甲基)丙烯醯胺共聚物樹脂及聚醯亞胺系樹脂為更佳。 作為促進鹼可溶性之基團(以下,還稱作酸基),例如,可舉出羧基、磷酸基、磺酸基及酚性羥基等。其中,可溶於有機溶劑且能夠藉由弱鹼性水溶液顯影者為較佳,作為更佳者,可舉出含有源自(甲基)丙烯酸的結構單元之鹼可溶性樹脂。該些酸基可以係僅為1種,亦可以係2種以上。[Binder Resin] The above composition preferably contains a binder resin. As the binder resin, it is preferable to use a linear organic polymer. As such linear organic polymers, known ones can be used arbitrarily. In order to realize water development or weak alkaline water development, it is better to select linear organic polymers that are soluble or swellable to water or weak alkaline water. Among them, as the binder resin, alkali-soluble resins (resins containing groups that promote alkali solubility) are particularly preferred. As a binding resin, it can contain at least one group that promotes alkali solubility from a linear organic polymer and a molecule (preferably a molecule with a (meth)acrylic copolymer or a styrene copolymer as the main chain) The alkali-soluble resin is appropriately selected. From the viewpoint of heat resistance, polyhydroxystyrene resins, polysiloxane resins, (meth)acrylic resins, (meth)acrylamide resins, (meth)acrylic acid/(meth)acrylic acid resins Amine copolymer resins, epoxy resins, and polyimide resins are preferred. From the viewpoint of developability control, (meth)acrylic resin, (meth)acrylamide resin, (meth)acrylic acid /(Meth)acrylamide copolymer resin and polyimide resin are more preferable. Examples of groups that promote alkali solubility (hereinafter, also referred to as acid groups) include carboxyl groups, phosphoric acid groups, sulfonic acid groups, and phenolic hydroxyl groups. Among them, those that are soluble in organic solvents and can be developed by weakly alkaline aqueous solutions are preferred, and more preferred include alkali-soluble resins containing structural units derived from (meth)acrylic acid. There may be only one type of these acid groups, or two or more types.

作為黏結樹脂,例如可舉出在側鏈含有羧酸基之自由基聚合物。作為在側鏈含有羧酸基之自由基聚合物,例如,可舉出日本特開昭59-44615號、日本特公昭54-34327號、日本特公昭58-12577號、日本特公昭54-25957號、日本特開昭54-92723號、日本特開昭59-53836號及日本特開昭59-71048號中記載者。作為在側鏈含有羧酸基之自由基聚合物,可舉出對含有羧酸基之單體單獨或使其共聚之樹脂、含有酸酐之單體單獨或使其共聚來獲得之酸酐單元進行水解、半酯化或半醯胺化之樹脂及藉由不飽和單羧酸及酸酐對環氧樹脂進行改性之環氧丙烯酸酯等。 作為含有羧酸基之單體,可舉出丙烯酸、甲基丙烯酸、衣康酸、巴豆酸、馬來酸、富马酸及4-羧基苯乙烯等。並且,亦可舉出在側鏈含有羧酸基之酸性纖維素衍生物為例。 作為含有酸酐之單體,可舉出馬來酸酐等。此外,對含有羥基之聚合物加成環狀酸酐者等較有用。 並且,含有酸基之縮醛改性聚乙烯醇類黏結樹脂記載於歐洲專利第993966號、歐洲專利第1204000號及日本特開2001-318463號等各公報中。含有酸基之縮醛改性聚乙烯醇類黏結樹脂的膜強度及顯影性的平衡優異,為較佳。 而且,作為水溶性線狀有機聚合物,聚乙烯吡咯烷酮或聚環氧乙烷等較有用。並且,為了提高硬化皮膜的強度,醇溶性尼龍及2,2-雙-(4-羥苯基)-丙烷與環氧氯丙烷的反應物亦即聚醚等亦有用。 並且,國際公開第2008/123097號中記載之聚醯亞胺樹脂亦有用。As the binder resin, for example, a radical polymer containing a carboxylic acid group in the side chain can be cited. As a radical polymer containing a carboxylic acid group in the side chain, for example, Japanese Patent Publication No. 59-44615, Japanese Patent Publication No. 54-34327, Japanese Patent Publication No. 58-12577, Japanese Patent Publication No. 54-25957 No., Japanese Patent Application Publication No. 54-92723, Japanese Patent Application Publication No. 59-53836, and Japanese Patent Application Publication No. 59-71048. As a radical polymer containing a carboxylic acid group in the side chain, there can be mentioned the acid anhydride unit obtained by hydrolyzing the monomer containing the carboxylic acid group alone or by copolymerizing it, and the monomer containing acid anhydride alone or by copolymerizing it. , Semi-esterified or semi-aminated resin and epoxy acrylate modified by unsaturated monocarboxylic acid and acid anhydride. Examples of monomers containing carboxylic acid groups include acrylic acid, methacrylic acid, itaconic acid, crotonic acid, maleic acid, fumaric acid, 4-carboxystyrene, and the like. In addition, an acidic cellulose derivative containing a carboxylic acid group in the side chain can also be cited as an example. Examples of monomers containing acid anhydride include maleic anhydride. In addition, it is more useful to add cyclic anhydrides to polymers containing hydroxyl groups. In addition, acetal-modified polyvinyl alcohol-based binder resins containing acid groups are described in European Patent No. 993966, European Patent No. 1204000, and Japanese Patent Laid-Open No. 2001-318463. The acid group-containing acetal-modified polyvinyl alcohol-based adhesive resin has an excellent balance of film strength and developability, which is preferable. Furthermore, as a water-soluble linear organic polymer, polyvinylpyrrolidone or polyethylene oxide is useful. In addition, in order to increase the strength of the cured film, polyethers, which are alcohol-soluble nylon and 2,2-bis-(4-hydroxyphenyl)-propane and epichlorohydrin, which are the reactants, are also useful. In addition, the polyimide resin described in International Publication No. 2008/123097 is also useful.

尤其,該些中,〔苄基(甲基)丙烯酸酯/(甲基)丙烯酸/依據需要為其他加成聚合性乙烯單體〕共聚物及〔(甲基)丙烯酸烯丙酯/(甲基)丙烯酸/依據需要為其他加成聚合性乙烯單體〕共聚物的膜強度、靈敏度及顯影性的平衡優異,為較佳。 作為市售品,例如,可舉出Acrylic base FF-187、FF-426(FUJIKURA KASEI CO., LTD.製造)、Akurikyua-RD-F8(NIPPON SHOKUBAI CO., LTD.)及DAICEL-ALLNEX LTD.製造Cyclomer P(ACA)230AA等。In particular, among these, [benzyl (meth)acrylate/(meth)acrylic acid/other addition polymerizable vinyl monomers as necessary] copolymer and [(meth)allyl acrylate/(meth) ) Acrylic acid/other addition polymerizable vinyl monomers as required] The copolymer has excellent film strength, sensitivity, and developability in balance, which is preferred. As commercially available products, for example, Acrylic base FF-187, FF-426 (manufactured by FUJIKURA KASEI CO., LTD.), Akurikiyua-RD-F8 (NIPPON SHOKUBAI CO., LTD.), and DAICEL-ALLNEX LTD. Manufacturing Cyclomer P (ACA) 230AA, etc.

黏結樹脂的製造中,例如,能夠適用基於公知的自由基聚合法之方法。本領域技術人員能夠輕鬆設定藉由自由基聚合法製造鹼可溶性樹脂時的溫度、壓力、自由基起始劑的種類及其量以及溶劑的種類等聚合條件。In the production of the binder resin, for example, a method based on a known radical polymerization method can be applied. Those skilled in the art can easily set polymerization conditions such as the temperature, pressure, the type and amount of the radical initiator, and the type of solvent when the alkali-soluble resin is produced by the radical polymerization method.

並且,作為黏結樹脂,使用包含含有接枝鏈之結構單元及含有酸基(鹼可溶性基)之結構單元之聚合物亦較佳。 含有接枝鏈之結構單元的定義與上述之分散劑所含有之含有接枝鏈之結構單元相同,並且較佳範圍亦相同。 作為酸基,例如有羧酸基、磺酸基、磷酸基或酚性羥基等,羧酸基、磺酸基及磷酸基中的至少1種為較佳,羧酸基為更佳。Moreover, as the binder resin, it is also preferable to use a polymer containing a structural unit containing a graft chain and a structural unit containing an acid group (alkali-soluble group). The definition of the structural unit containing the graft chain is the same as the structural unit containing the graft chain contained in the above-mentioned dispersant, and the preferred range is also the same. The acid group includes, for example, a carboxylic acid group, a sulfonic acid group, a phosphoric acid group, or a phenolic hydroxyl group. At least one of a carboxylic acid group, a sulfonic acid group, and a phosphoric acid group is preferable, and a carboxylic acid group is more preferable.

<含有酸基之結構單元> 作為含有酸基之結構單元,含有選自源自以下述通式(vii)~通式(ix)表示之單量體之結構單元之1種以上結構單元為較佳。<Structural unit containing an acid group> As a structural unit containing an acid group, one or more structural units selected from the structural units derived from the monomers represented by the following general formula (vii) to general formula (ix) are more good.

[化學式7]

Figure 02_image013
[Chemical formula 7]
Figure 02_image013

通式(vii)~通式(ix)中,R21 、R22 及R23 分別獨立地表示氫原子、鹵原子(例如,氟原子、氯原子、溴原子等)或碳原子數為1~6的烷基(例如,甲基、乙基、丙基等)。 通式(vii)~通式(ix)中、R21 、R22 及R23 分別獨立地為氫原子或碳原子數為1~3的烷基,分別獨立地為氫原子或甲基為更佳。通式(vii)中,R21 及R23 分別為氫原子尤為佳。In general formula (vii) to general formula (ix), R 21 , R 22 and R 23 each independently represent a hydrogen atom, a halogen atom (for example, a fluorine atom, a chlorine atom, a bromine atom, etc.), or the number of carbon atoms is 1 to 6 alkyl groups (for example, methyl, ethyl, propyl, etc.). In general formula (vii) to general formula (ix), R 21 , R 22 and R 23 are each independently a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and each independently is a hydrogen atom or a methyl group. good. In the general formula (vii), it is particularly preferable that R 21 and R 23 are each a hydrogen atom.

通式(vii)中的X2 表示氧原子(-O-)或亞胺基(-NH-),氧原子為較佳。 並且,通式(viii)中的Y表示次甲基或氮原子。 X 2 in the general formula (vii) represents an oxygen atom (-O-) or an imino group (-NH-), and an oxygen atom is preferred. In addition, Y in the general formula (viii) represents a methine group or a nitrogen atom.

並且,通式(vii)~通式(ix)中的L2 表示單鍵或2價的連結基。作為2價的連結基的例子,可舉出2價的脂肪族基(例如,伸烷基、取代伸烷基、伸烯基、取代伸烯基、伸炔基及取代伸炔基)、2價的芳香族基(例如,伸芳基及取代伸芳基)、2價的雜環基、氧原子(-O-)、硫原子(-S-)、亞胺基(-NH-)、取代亞胺鍵(-NR41 ’-,其中,R41 ’ 為脂肪族基、芳香族基或雜環基)、羰鍵(-CO-)及該些的組合等。 In addition, L 2 in general formula (vii) to general formula (ix) represents a single bond or a divalent linking group. Examples of divalent linking groups include divalent aliphatic groups (for example, alkylene, substituted alkylene, alkenylene, substituted alkenylene, alkynylene, and substituted alkynylene), 2 Valence aromatic groups (for example, aryl and substituted aryl groups), divalent heterocyclic groups, oxygen atoms (-O-), sulfur atoms (-S-), imino groups (-NH-), substituted imine bond (-NR 41 '-, wherein, R 41' is an aliphatic group, an aromatic group or a heterocyclic group), a carbonyl bond (-CO-), and the plurality of combinations.

2價的脂肪族基可具有環狀結構或分支結構。脂肪族基的碳原子數為1~20為較佳,1~15為更佳,1~10為進一步較佳。關於脂肪族基,與不飽和脂肪族基相比,飽和脂肪族基為更佳。並且,脂肪族基可具有取代基。作為取代基的例子,可舉出鹵原子、羥基、芳香族基及雜環基。The divalent aliphatic group may have a cyclic structure or a branched structure. The number of carbon atoms of the aliphatic group is preferably 1-20, more preferably 1-15, and still more preferably 1-10. Regarding the aliphatic group, the saturated aliphatic group is more preferable than the unsaturated aliphatic group. In addition, the aliphatic group may have a substituent. Examples of the substituent include a halogen atom, a hydroxyl group, an aromatic group, and a heterocyclic group.

2價的芳香族基的碳原子數為6~20為較佳,6~15為進一步較佳,6~10為最佳。並且,芳香族基可具有取代基。取代基的例子可舉出鹵原子、羥基、脂肪族基、芳香族基及雜環基。The number of carbon atoms of the divalent aromatic group is preferably 6-20, more preferably 6-15, and most preferably 6-10. In addition, the aromatic group may have a substituent. Examples of the substituent include a halogen atom, a hydroxyl group, an aliphatic group, an aromatic group, and a heterocyclic group.

2價的雜環基作為雜環具有5員環或6員環為較佳。雜環上可縮合有其他雜環、脂肪族環或芳香族環中的1個以上。並且,雜環基可具有取代基。作為取代基的例子,可舉出鹵原子、羥基、氧代基(=O)、硫代基(=S)、亞胺基(=NH)、取代亞胺基(=N-R42 ,其中,R42 為脂肪族基、芳香族基或雜環基)、脂肪族基、芳香族基及雜環基。The divalent heterocyclic group preferably has a 5-membered ring or a 6-membered ring as the heterocyclic ring. One or more of other heterocyclic rings, aliphatic rings, or aromatic rings may be condensed on the heterocyclic ring. In addition, the heterocyclic group may have a substituent. Examples of substituents include halogen atoms, hydroxyl groups, oxo groups (=O), thio groups (=S), imino groups (=NH), and substituted imino groups (=NR 42 , where R 42 is an aliphatic group, an aromatic group or a heterocyclic group), an aliphatic group, an aromatic group and a heterocyclic group.

L2 係單鍵、伸烷基或含有氧化烯結構之2價的連結基為較佳。氧化烯結構係氧乙烯結構或氧丙烯結構為更佳。並且,L2 可含有重複包含2個以上的氧化烯結構之聚氧化烯結構。作為聚氧化烯結構,聚氧乙烯結構或聚氧丙烯結構為較佳。聚氧乙烯結構以-(OCH2 CH2 )n-表示,n為2以上的整數為較佳,2~10的整數為更佳。L 2 is preferably a single bond, an alkylene group or a divalent linking group containing an oxyalkylene structure. The alkylene oxide structure is more preferably an oxyethylene structure or an oxypropylene structure. In addition, L 2 may contain a polyoxyalkylene structure repeatedly including two or more alkylene oxide structures. As the polyoxyalkylene structure, a polyoxyethylene structure or a polyoxypropylene structure is preferable. The polyoxyethylene structure is represented by -(OCH 2 CH 2 )n-, and n is preferably an integer of 2 or more, and more preferably an integer of 2-10.

通式(vii)~通式(ix)中,Z2 為酸基,羧酸基為較佳。In general formula (vii) to general formula (ix), Z 2 is an acid group, and a carboxylic acid group is preferred.

通式(ix)中,R24 、R25 及R26 分別獨立地表示氫原子、鹵原子(例如,氟、氯、溴等)、碳原子數為1~6的烷基(例如,甲基、乙基、丙基等)、-Z2 或L2 -Z2 。其中,L2 及Z2 的含義與上述中的L2 及Z2 相同,較佳例子亦相同。作為R24 、R25 及R26 ,分別獨立地為氫原子或碳原子數為1~3的烷基為較佳,氫原子為更佳。In the general formula (ix), R 24 , R 25 and R 26 each independently represent a hydrogen atom, a halogen atom (for example, fluorine, chlorine, bromine, etc.), an alkyl group having 1 to 6 carbon atoms (for example, methyl , ethyl, propyl, etc.), - Z 2 or L 2 -Z 2. Wherein, L 2, and the meaning is the same as Z 2 in the above-described L 2 and Z 2, preferred examples are also the same. As R 24 , R 25 and R 26 , each independently a hydrogen atom or an alkyl group having 1 to 3 carbon atoms is preferred, and a hydrogen atom is more preferred.

作為以通式(vii)表示之單量體,R21 、R22 及R23 分別獨立地為氫原子或甲基、L2 為伸烷基或含有氧化烯結構之2價的連結基、X2 為氧原子或亞胺基、Z2 為羧酸基之化合物為較佳。 並且,作為以通式(vii)表示之單量體,R21 為氫原子或甲基、L2 為伸烷基、Z2 為羧酸基、Y為次甲基之化合物為較佳。 而且,作為以通式(ix)表示之單量體,R24 、R25 及R26 分別獨立地為氫原子或甲基、Z2 為羧酸基之化合物為較佳。As a monomer represented by the general formula (vii), R 21 , R 22 and R 23 are each independently a hydrogen atom or a methyl group, L 2 is an alkylene group or a divalent linking group containing an oxyalkylene structure, and X A compound in which 2 is an oxygen atom or an imino group, and Z 2 is a carboxylic acid group is preferred. In addition, as a monomer represented by the general formula (vii), a compound in which R 21 is a hydrogen atom or a methyl group, L 2 is an alkylene group, Z 2 is a carboxylic acid group, and Y is a methine group is preferable. Furthermore, as a monomer represented by the general formula (ix), compounds in which R 24 , R 25 and R 26 are each independently a hydrogen atom or a methyl group, and Z 2 is a carboxylic acid group are preferred.

上述黏結樹脂能夠藉由與上述的包含含有接枝鏈之結構單元之分散劑相同之方法合成,並且,其較佳酸值、重量平均分子量亦相同。The above-mentioned binding resin can be synthesized by the same method as the above-mentioned dispersant containing a structural unit containing a graft chain, and its preferred acid value and weight average molecular weight are also the same.

上述黏結樹脂可具有1種或2種以上含有酸基之結構單元。 含有酸基之結構單元的含量以質量換算計,相對於上述黏結樹脂的總質量,5~95%為較佳,從抑制基於鹼顯影之圖像強度的損傷之觀點考慮,10~90%為更佳。The above-mentioned binder resin may have one or more structural units containing acid groups. The content of the acid group-containing structural unit is calculated by mass conversion, and is preferably 5-95% relative to the total mass of the above-mentioned binder resin. From the viewpoint of suppressing damage to the image strength due to alkali development, 10-95% is Better.

上述組成物中的黏結樹脂的含量相對於組成物的總固體成分,0.1~30質量%為較佳,0.3~25質量%為更佳。 黏結樹脂可單獨使用1種,亦可倂用2種以上。倂用2種以上時,總計量成為上述範圍為較佳。The content of the binder resin in the composition is preferably 0.1 to 30% by mass, and more preferably 0.3 to 25% by mass relative to the total solid content of the composition. One type of bonding resin can be used alone, or two or more types can be used. When two or more types are used, it is preferable that the total amount falls within the above-mentioned range.

黏結樹脂相對於含金屬氮化物的粒子之質量比(亦即,(組成物中的黏結樹脂的含量)/(組成物中的金屬氧化物含有粒子的含量))為0.3以下為較佳,0.25以下為更佳,0.20以下為進一步較佳。另外,對於下限值,並無特別限制,通常為0.01以上,0.02以上為較佳,0.07以上為更佳。 若上限值為0.25以下,則組成物具有更優異之經時穩定性,若為0.014以上,則使用組成物來獲得之硬化膜具有更優異之解像性。The mass ratio of the binding resin to the metal nitride-containing particles (ie, (the content of the binding resin in the composition)/(the content of the metal oxide-containing particles in the composition)) is preferably 0.3 or less, 0.25 The following is more preferable, and 0.20 or less is even more preferable. In addition, the lower limit is not particularly limited, but it is usually 0.01 or more, preferably 0.02 or more, and more preferably 0.07 or more. If the upper limit value is 0.25 or less, the composition has more excellent stability over time, and if it is 0.014 or more, the cured film obtained by using the composition has more excellent resolution.

〔聚合性化合物〕 上述組成物含有聚合性化合物為較佳。 聚合性化合物係包含1個以上的含有烯屬不飽和鍵之基團之化合物為較佳,含有2個以上之化合物為更佳,含有3個以上為進一步較佳,含有5個以上尤為佳。上限例如為15個以下。作為含有烯屬不飽和鍵之基團,例如,可舉出乙烯基、(甲基)烯丙基及(甲基)丙烯醯基等。[Polymerizable compound] The above composition preferably contains a polymerizable compound. The polymerizable compound is preferably a compound containing one or more ethylenically unsaturated bond-containing groups, more preferably two or more compounds, more preferably three or more, and more preferably five or more groups. The upper limit is, for example, 15 or less. Examples of the group containing an ethylenically unsaturated bond include a vinyl group, a (meth)allyl group, and a (meth)acryloyl group.

聚合性化合物例如可以係單體、預聚物及低聚物及該些的混合物以及該些的多聚體等化學形態的任一個。單體為較佳。 聚合性化合物的分子量為100~3000為較佳,250~1500為更佳。 聚合性化合物係3~15官能的(甲基)丙烯酸酯化合物為較佳,3~6官能的(甲基)丙烯酸酯化合物為更佳。 作為單體、預聚物的例子,可舉出不飽和羧酸(例如,丙烯酸、甲基丙烯酸、衣康酸、巴豆酸、異巴豆酸、馬來酸等)和其酯類、醯胺類、以及該些的多聚體,不飽和羧酸與脂肪族多元醇化合物的酯、及不飽和羧酸與脂肪族多元胺化合物的醯胺類、以及該些的多聚體為較佳。並且,亦可適當地使用含有羥基、胺基、巰基等親核性取代基之不飽和羧酸酯或者醯胺類與單官能或多官能異氰酸酯類或者環氧類的加成反應物及上述不飽和羧酸酯或者醯胺類與單官能或多官能的羧酸的脫水縮合反應物等。並且,含有異氰酸酯基、環氧基等親電子性取代基之不飽和羧酸酯或者醯胺類與單官能或多官能的醇類、胺類、硫醇類的反應物、含有鹵素基或甲苯磺醯基等分離性取代基之不飽和羧酸酯或者醯胺類與單官能或多官能的醇類、胺類、硫醇類的反應物亦較佳。並且,還可代替上述不飽和羧酸,使用不飽和膦酸、苯乙烯等苯乙烯衍生物及被取代為乙烯基醚、烯丙基醚等之化合物組。 作為該些的具體化合物,本發明中亦能夠適當使用日本特開2009-288705號公報的段落0095~0108中記載之化合物。The polymerizable compound may be any of chemical forms such as monomers, prepolymers, oligomers, mixtures of these, and polymers of these, for example. Monomers are preferred. The molecular weight of the polymerizable compound is preferably 100 to 3000, more preferably 250 to 1500. The polymerizable compound is preferably a 3 to 15 functional (meth)acrylate compound, and a 3 to 6 functional (meth)acrylate compound is more preferable. Examples of monomers and prepolymers include unsaturated carboxylic acids (for example, acrylic acid, methacrylic acid, itaconic acid, crotonic acid, isocrotonic acid, maleic acid, etc.) and their esters and amides. And these polymers, esters of unsaturated carboxylic acids and aliphatic polyol compounds, amides of unsaturated carboxylic acids and aliphatic polyamine compounds, and these polymers are preferred. In addition, addition reactants of unsaturated carboxylic acid esters containing nucleophilic substituents such as hydroxyl groups, amine groups, and mercapto groups, or addition reactants of amides and monofunctional or polyfunctional isocyanates or epoxy groups and the above-mentioned non- Dehydration condensation reaction product of saturated carboxylic acid ester or amides and monofunctional or polyfunctional carboxylic acid, etc. In addition, reaction products of unsaturated carboxylic acid esters or amides containing electrophilic substituents such as isocyanate groups and epoxy groups with monofunctional or polyfunctional alcohols, amines, and mercaptans, halogen groups or toluene Unsaturated carboxylic acid esters with discrete substituents such as sulfonyl groups or reactants of amides and monofunctional or polyfunctional alcohols, amines, and thiols are also preferred. In addition, in place of the above-mentioned unsaturated carboxylic acids, styrene derivatives such as unsaturated phosphonic acid and styrene, and compound groups substituted with vinyl ethers, allyl ethers, and the like can also be used. As these specific compounds, the compounds described in paragraphs 0095 to 0108 of JP 2009-288705 A can also be suitably used in the present invention.

聚合性化合物係含有1個以上的包含烯屬不飽和鍵之基團、且常壓下具有100℃以上的沸點之化合物亦較佳。例如,能夠參閱日本特開2013-29760號公報的段落0227、日本特開2008-292970號公報的段落0254~0257中記載之化合物,該內容引入本申請說明書中。It is also preferable that the polymerizable compound contains one or more groups containing an ethylenically unsaturated bond and has a boiling point of 100°C or higher under normal pressure. For example, the compounds described in paragraph 0227 of JP 2013-29760 A and paragraphs 0254 to 0257 of JP 2008-292970 A can be referred to, and this content is incorporated in the specification of this application.

聚合性化合物還能夠使用雙季戊四醇三丙烯酸酯(作為市售品,KAYARAD D-330;Nippon Kayaku CO., LTD.製造)、雙季戊四醇四丙烯酸酯(作為市售品,KAYARAD D-320;Nippon Kayaku CO., LTD.製造)、雙季戊四醇五(甲基)丙烯酸酯(作為市售品,KAYARAD D-310;Nippon Kayaku CO., LTD.製造)、雙季戊四醇六(甲基)丙烯酸酯(作為市售品,KAYARAD DPHA;Nippon Kayaku CO., LTD.製造、A-DPH-12E;Shin-Nakamura Chemical CO., LTD製造)及該些(甲基)丙烯醯基經由乙二醇殘基、丙二醇殘基之結構(例如,由Sartomer company Inc.市售之SR454、SR499)為較佳。還能夠使用該些的低聚物類型。並且,還能夠使用NK酯A-TMMT(季戊四醇四丙烯酸酯、Shin-Nakamura Chemical CO., LTD製造)及KAYARAD RP-1040(Nippon Kayaku CO., LTD.製造)等。 以下示出較佳聚合性化合物的態様。As the polymerizable compound, dipentaerythritol triacrylate (as a commercial product, KAYARAD D-330; manufactured by Nippon Kayaku CO., LTD.), dipentaerythritol tetraacrylate (as a commercial product, KAYARAD D-320; Nippon Kayaku CO., LTD.), dipentaerythritol penta(meth)acrylate (as a commercial product, KAYARAD D-310; manufactured by Nippon Kayaku CO., LTD.), dipentaerythritol hexa(meth)acrylate (as a commercial product) For sale, KAYARAD DPHA; manufactured by Nippon Kayaku CO., LTD., A-DPH-12E; manufactured by Shin-Nakamura Chemical CO., LTD), and these (meth)acrylic groups are through ethylene glycol residues and propylene glycol residues. The base structure (for example, SR454 and SR499 commercially available from Sartomer company Inc.) is preferred. These oligomer types can also be used. In addition, NK ester A-TMMT (pentaerythritol tetraacrylate, manufactured by Shin-Nakamura Chemical CO., LTD), KAYARAD RP-1040 (manufactured by Nippon Kayaku CO., LTD.), etc. can also be used. The state of the preferable polymerizable compound is shown below.

聚合性化合物可具有羧酸基、磺酸基及磷酸基等酸基。作為含有酸基之聚合性化合物,脂肪族聚羥基化合物與不飽和羧酸的酯為較佳,使非芳香族羧酸酐與脂肪族聚羥基化合物的未反應的羥基進行反應來使其具有酸基之聚合性化合物為更佳,該酯中,脂肪族聚羥基化合物為季戊四醇和/或雙季戊四醇者為進一步較佳。作為市售品,例如,可舉出TOAGOSEI CO., LTD.製造的ARONIX TO-2349、M-305、M-510及M-520等。The polymerizable compound may have acid groups such as a carboxylic acid group, a sulfonic acid group, and a phosphoric acid group. As the polymerizable compound containing an acid group, an ester of an aliphatic polyhydroxy compound and an unsaturated carboxylic acid is preferred. The non-aromatic carboxylic acid anhydride is reacted with the unreacted hydroxyl group of the aliphatic polyhydroxy compound to give it an acid group. The polymerizable compound is more preferable, and among the esters, the aliphatic polyhydroxy compound is pentaerythritol and/or dipentaerythritol is more preferable. Examples of commercially available products include ARONIX TO-2349, M-305, M-510, and M-520 manufactured by TOAGOSEI CO., LTD.

作為含有酸基之聚合性化合物的較佳酸值,為0.1~40mgKOH/g,5~30mgKOH/g為更佳。若聚合性化合物的酸值為0.1mgKOH/g以上,則顯影溶解特性良好,若為40mgKOH/g以下,則在製造和操作上有利。而且,光聚合性能良好且硬化性優異。The preferable acid value of the polymerizable compound containing an acid group is 0.1-40 mgKOH/g, more preferably 5-30 mgKOH/g. If the acid value of the polymerizable compound is 0.1 mgKOH/g or more, the development dissolution characteristic is good, and if it is 40 mgKOH/g or less, it is advantageous in terms of production and handling. Moreover, the photopolymerization performance is good and the curability is excellent.

關於聚合性化合物,含有己內酯結構之化合物亦為較佳態様。 作為含有己內酯結構之化合物,只要在分子內含有己內酯結構,則並無特別限定,例如,可舉出藉由使三羥甲基乙烷、二三羥甲基乙烷、三羥甲基丙烷、二三羥甲基丙烷、季戊四醇、雙季戊四醇、三季戊四醇、甘油、雙甘油、三羥甲基三聚氰胺等多元醇與(甲基)丙烯酸及ε-己內酯進行酯化來獲得之、ε-己內酯改性多官能(甲基)丙烯酸酯。其中,具有以下述通式(Z-1)表示之己內酯結構之化合物為較佳。Regarding the polymerizable compound, a compound containing a caprolactone structure is also preferred. The compound containing a caprolactone structure is not particularly limited as long as it contains a caprolactone structure in the molecule. For example, it can be exemplified by using trimethylolethane, ditrimethylolethane, and trimethylolethane. Methylpropane, ditrimethylolpropane, pentaerythritol, dipentaerythritol, tripentaerythritol, glycerin, diglycerol, trimethylol melamine and other polyols are obtained by esterification with (meth)acrylic acid and ε-caprolactone , Ε-caprolactone modified multifunctional (meth)acrylate. Among them, compounds having a caprolactone structure represented by the following general formula (Z-1) are preferred.

[化學式8]

Figure 02_image015
[Chemical formula 8]
Figure 02_image015

通式(Z-1)中,6個R全部為以下述通式(Z-2)表示之基團,或6個R中的1~5個為以下述通式(Z-2)表示之基團,剩餘為以下述通式(Z-3)表示之基團。In the general formula (Z-1), all 6 Rs are groups represented by the following general formula (Z-2), or 1 to 5 of the 6 Rs are represented by the following general formula (Z-2) The remaining groups are groups represented by the following general formula (Z-3).

[化學式9]

Figure 02_image017
[Chemical formula 9]
Figure 02_image017

通式(Z-2)中,R1 表示氫原子或甲基,m表示1或2的數,“*”表示係鍵結鍵。In the general formula (Z-2), R 1 represents a hydrogen atom or a methyl group, m represents the number of 1 or 2, and "*" represents a bonding bond.

[化學式10]

Figure 02_image019
[Chemical formula 10]
Figure 02_image019

通式(Z-3)中,R1 表示氫原子或甲基,“*”表示係鍵結鍵。In the general formula (Z-3), R 1 represents a hydrogen atom or a methyl group, and "*" represents a bonding bond.

含有己內酯結構之聚合性化合物例如由Nippon Kayaku CO., LTD.作為KAYARAD DPCA系列而市售,DPCA-20(上述式(Z-1)~(Z-3)中,m=1,以式(Z-2)表示之基團的數=2,R1 全部為氫原子之化合物)、DPCA-30(同式,m=1,以式(Z-2)表示之基團的數=3,R1 全部為氫原子之化合物)、DPCA-60(同式,m=1,以式(Z-2)表示之基團的數=6,R1 全部為氫原子之化合物)、DPCA-120(同式中,m=2,以式(Z-2)表示之基團的數=6,R1 全部為氫原子之化合物)等。Polymeric compounds containing a caprolactone structure, for example, are commercially available as KAYARAD DPCA series by Nippon Kayaku CO., LTD., DPCA-20 (in the above formulas (Z-1) to (Z-3), m=1, with the number of groups represented by the formula (Z-2) = 2, R 1 all hydrogen atoms is), the number of groups represented by the DPCA-30 (the same formula, m = 1, the formula (Z-2) = 3. Compounds where all R 1 are hydrogen atoms), DPCA-60 (same formula, m=1, the number of groups represented by formula (Z-2) = 6, compounds where all R 1 is hydrogen atoms), DPCA -120 (in the same formula, m=2, the number of groups represented by formula (Z-2)=6, and R 1 is a compound with all hydrogen atoms) etc.

聚合性化合物還能夠使用以下述通式(Z-4)或(Z-5)表示之化合物。The polymerizable compound can also be a compound represented by the following general formula (Z-4) or (Z-5).

[化學式11]

Figure 02_image021
[Chemical formula 11]
Figure 02_image021

通式(Z-4)及(Z-5)中,E分別獨立地表示-((CH2y CH2 O)-、或-((CH2y CH(CH3 )O)-,y分別獨立地表示0~10的整數,X分別獨立地表示(甲基)丙烯醯基、氫原子或羧酸基。 通式(Z-4)中,(甲基)丙烯醯基的總計為3個或4個,m分別獨立地表示0~10的整數,各m的總計為0~40的整數。 通式(Z-5)中,(甲基)丙烯醯基的總計為5個或6個,n分別獨立地表示0~10的整數,各n的總計為0~60的整數。In general formulas (Z-4) and (Z-5), E independently represents -((CH 2 ) y CH 2 O)-, or -((CH 2 ) y CH(CH 3 )O)-, y each independently represents an integer of 0-10, and X each independently represents a (meth)acryloyl group, a hydrogen atom, or a carboxylic acid group. In the general formula (Z-4), the total of (meth)acrylic groups is 3 or 4, m each independently represents an integer of 0-10, and the total of each m is an integer of 0-40. In general formula (Z-5), the total of (meth)acrylic groups is 5 or 6, n each independently represents an integer of 0-10, and the total of each n is an integer of 0-60.

通式(Z-4)中,m為0~6的整數為較佳,0~4的整數為更佳。 並且,各m的總計為2~40的整數為較佳,2~16的整數為更佳,4~8的整數為進一步較佳。 通式(Z-5)中,n為0~6的整數為較佳,0~4的整數為更佳。 並且,各n的總計為3~60的整數為較佳,3~24的整數為更佳,6~12的整數為進一步較佳。 並且,通式(Z-4)或通式(Z-5)中的-((CH2y CH2 O)-或-((CH2y CH(CH3 )O)-為氧原子側的末端與X鍵結之形態為較佳。In the general formula (Z-4), m is preferably an integer of 0-6, and more preferably an integer of 0-4. In addition, it is preferable that the total of each m is an integer of 2 to 40, an integer of 2 to 16 is more preferable, and an integer of 4 to 8 is more preferable. In general formula (Z-5), n is preferably an integer of 0-6, and more preferably an integer of 0-4. Furthermore, it is preferable that the total of each n is an integer of 3-60, the integer of 3-24 is more preferable, and the integer of 6-12 is more preferable. In addition, -((CH 2 ) y CH 2 O)- or -((CH 2 ) y CH(CH 3 )O)- in general formula (Z-4) or general formula (Z-5) is an oxygen atom The form in which the end of the side is bonded to X is preferred.

以通式(Z-4)或通式(Z-5)表示之化合物可單獨使用1種,亦可倂用2種以上。尤其,通式(Z-5)中的6個X全部為丙烯醯基之形態、通式(Z-5)中的6個X全部為丙烯醯基之化合物與6個X中的至少1個為氫原子之化合物的混合物之態様為較佳。藉由設為該種結構,能夠更加提高顯影性。The compound represented by the general formula (Z-4) or the general formula (Z-5) may be used singly, or two or more of them may be used. In particular, all the six Xs in the general formula (Z-5) are in the form of acryloyl groups, the compound in which all the six Xs in the general formula (Z-5) are acryloyl groups, and at least one of the six Xs The state of a mixture of compounds that are hydrogen atoms is preferred. With this structure, the developability can be further improved.

並且,作為以通式(Z-4)或通式(Z-5)表示之化合物在聚合性化合物中的總含量,20質量%以上為較佳,50質量%以上為更佳。In addition, as the total content of the compound represented by the general formula (Z-4) or the general formula (Z-5) in the polymerizable compound, 20% by mass or more is preferable, and 50% by mass or more is more preferable.

以通式(Z-4)或通式(Z-5)表示之化合物能夠藉由作為以往公知的製程之以下製程合成:藉由開環加成反應,使環氧乙烷或環氧丙烷與季戊四醇或雙季戊四醇鍵結開環骨架之製程;及例如使(甲基)丙烯醯氯與開環骨架的末端羥基反應來導入(甲基)丙烯醯基之製程。各製程係廣為人知之製程,本領域技術人員能夠輕鬆合成以通式(Z-4)或(Z-5)表示之化合物。The compound represented by general formula (Z-4) or general formula (Z-5) can be synthesized by the following process, which is a conventionally known process: by ring-opening addition reaction, ethylene oxide or propylene oxide is combined with A process in which pentaerythritol or dipentaerythritol is bonded to a ring-opening skeleton; and for example, a process in which (meth)acrylic acid chloride is reacted with the terminal hydroxyl group of the ring-opening skeleton to introduce a (meth)acrylic acid group. Each process is a well-known process, and those skilled in the art can easily synthesize the compound represented by the general formula (Z-4) or (Z-5).

以通式(Z-4)或通式(Z-5)表示之化合物中,季戊四醇衍生物和/或雙季戊四醇衍生物為更佳。 具體而言,可舉出以下述式(a)~(f)表示之化合物(以下,還稱作“例示化合物(a)~(f)”。),其中,例示化合物(a)、(b)、(e)、(f)為較佳。Among the compounds represented by general formula (Z-4) or general formula (Z-5), pentaerythritol derivatives and/or dipentaerythritol derivatives are more preferred. Specifically, compounds represented by the following formulas (a) to (f) (hereinafter, also referred to as "exemplary compounds (a) to (f)") can be given, and among them, the exemplified compounds (a) and (b) ), (e), (f) are better.

[化學式12]

Figure 02_image023
[Chemical formula 12]
Figure 02_image023

[化學式13]

Figure 02_image025
[Chemical formula 13]
Figure 02_image025

作為以通式(Z-4)、(Z-5)表示之聚合性化合物的市售品,例如可舉出Sartomer company Inc.製造的含有4個氧化乙烯鏈之4官能丙烯酸酯亦即SR-494、Nippon Kayaku CO., LTD.製造的含有6個亞戊基氧(pentyleneoxy)鏈之6官能丙烯酸酯亦即DPCA-60、含有3個異丁烯氧鏈之3官能丙烯酸酯亦即TPA-330等。As commercially available products of polymerizable compounds represented by the general formulas (Z-4) and (Z-5), for example, SR-, a 4-functional acrylate containing 4 ethylene oxide chains manufactured by Sartomer Company Inc. can be mentioned. 494. The 6-functional acrylate containing 6 pentyleneoxy chains, namely DPCA-60, manufactured by Nippon Kayaku CO., LTD., and the trifunctional acrylate containing 3 isobutyleneoxy chains, namely TPA-330, etc. .

作為聚合性化合物,日本特公昭48-41708號公報、日本特開昭51-37193號公報、日本特公平2-32293號公報、日本特公平2-16765號公報中記載之胺基甲酸酯丙烯酸酯類;日本特公昭58-49860號公報、日本特公昭56-17654號公報、日本特公昭62-39417號公報及日本特公昭62-39418號公報中記載之含有環氧乙烷系骨架之胺基甲酸酯化合物類亦較佳。並且,還能夠藉由使用日本特開昭63-277653號公報、日本特開昭63-260909號公報及日本特開平1-105238號公報中記載之、在分子內含有胺基結構和/或硫醚結構之加成聚合性化合物類,獲得感光速度非常優異之組成物。 作為市售品,可舉出胺基甲酸酯低聚物UAS-10、UAB-140(Sanyo Kokusaku Pulp CO., LTD.製造)、UA-7200(Shin-Nakamura Chemical CO., LTD製造)、DPHA-40H(Nippon Kayaku CO., LTD.製造)、UA-306H、UA-306T、UA-306I、AH-600、T-600及AI-600(KYOEISHA CHEMICAL CO., LTD製造)等。As a polymerizable compound, urethane acrylics described in Japanese Patent Publication No. 48-41708, Japanese Patent Application Publication No. 51-37193, Japanese Patent Publication No. 2-32293, and Japanese Patent Publication No. 2-16765 Esters; amines containing ethylene oxide-based skeletons described in Japanese Patent Publication No. 58-49860, Japanese Patent Publication No. 56-17654, Japanese Patent Publication No. 62-39417, and Japanese Patent Publication No. 62-39418 Carbamate compounds are also preferred. In addition, it is also possible to use JP-A 63-277653, JP-A 63-260909, and JP-A 1-105238, which contain an amine structure and/or sulfur in the molecule. Addition polymerizable compounds with ether structure to obtain a composition with very excellent photosensitive speed. Commercial products include urethane oligomer UAS-10, UAB-140 (manufactured by Sanyo Kokusaku Pulp CO., LTD.), UA-7200 (manufactured by Shin-Nakamura Chemical CO., LTD), DPHA-40H (manufactured by Nippon Kayaku CO., LTD.), UA-306H, UA-306T, UA-306I, AH-600, T-600 and AI-600 (manufactured by KYOEISHA CHEMICAL CO., LTD), etc.

並且,聚合性化合物的SP(Solubility Parameter:溶解度參數)值為9.50以上為較佳,10.40以上為更佳,10.60以上為進一步較佳。 另外,本說明書中,關於SP值,除非另有指明,則藉由Hoy法求出(H.L. Hoy Journal of Painting,1970,Vol. 42,76-118)。並且,對於SP值,省略單位而示出,但其單位為cal1/2 cm-3/2In addition, the SP (Solubility Parameter) value of the polymerizable compound is preferably 9.50 or more, more preferably 10.40 or more, and still more preferably 10.60 or more. In addition, in this specification, the SP value is calculated by the Hoy method (HL Hoy Journal of Painting, 1970, Vol. 42, 76-118) unless otherwise specified. In addition, the SP value is shown without the unit, but the unit is cal 1/2 cm -3/2 .

並且,從改善顯影殘渣的觀點考慮,組成物包含含有卡多骨架之聚合性化合物亦較佳。 作為含有卡多骨架之聚合性化合物,具有9,9-二芳基芴骨架之聚合性化合物為較佳,以下述式(Q3)表示之化合物為更佳。In addition, from the viewpoint of improving the development residue, it is also preferable that the composition contains a polymerizable compound containing a cardo skeleton. As the polymerizable compound containing a cardo skeleton, a polymerizable compound having a 9,9-diarylfluorene skeleton is preferable, and a compound represented by the following formula (Q3) is more preferable.

通式(Q3) [化學式14]

Figure 02_image027
General formula (Q3) [Chemical formula 14]
Figure 02_image027

上述通式(Q3)中,Ar11 ~Ar14 分別獨立地表示含有以虛線包圍之苯環之芳基。X1 ~X4 分別獨立地表示含有聚合性基團之取代基,上述取代基中的碳原子可被雜原子取代。a及b分別獨立地表示1~5的整數,c及d分別獨立地表示0~4的整數。R1 ~R4 分別獨立地表示取代基,e、f、g及h分別獨立地表示0以上的整數,e、f、g及h的上限值分別為從Ar11 ~Ar14 能夠具有之取代基的數減去a、b、c或d之值。其中,Ar11 ~Ar14 分別獨立地為作為稠環之一而含有以虛線包圍之苯環之多環芳香族烴基時,X1 ~X4 及R1 ~R4 可分別獨立地取代為以虛線包圍之苯環,亦可取代為以虛線包圍之苯環以外的環。In the above general formula (Q3), Ar 11 to Ar 14 each independently represent an aryl group containing a benzene ring surrounded by a dotted line. X 1 to X 4 each independently represent a substituent containing a polymerizable group, and the carbon atom in the substituent may be substituted with a hetero atom. a and b each independently represent an integer of 1 to 5, and c and d each independently represent an integer of 0 to 4. R 1 to R 4 each independently represent a substituent, e, f, g, and h each independently represent an integer greater than or equal to 0, and the upper limits of e, f, g, and h are each that can be possessed from Ar 11 to Ar 14 The number of substituents minus the value of a, b, c, or d. Wherein, when Ar 11 to Ar 14 are each independently a polycyclic aromatic hydrocarbon group containing a benzene ring surrounded by a dotted line as one of the condensed rings, X 1 to X 4 and R 1 to R 4 may each independently be substituted with The benzene ring enclosed by the dotted line may be substituted with a ring other than the benzene ring enclosed by the dotted line.

上述通式(Q3)中,Ar11 ~Ar14 所表示之含有以虛線包圍之苯環之芳基為碳原子數6~14的芳基為較佳,碳原子數6~10的芳基(例如,苯基、萘基)為更佳,苯基(限於以虛線包圍之苯環)為進一步較佳。In the above general formula (Q3), the aryl group represented by Ar 11 to Ar 14 containing a benzene ring surrounded by a dotted line is preferably an aryl group having 6 to 14 carbon atoms, and an aryl group having 6 to 10 carbon atoms ( For example, phenyl and naphthyl) are more preferable, and phenyl (limited to the benzene ring surrounded by a dotted line) is still more preferable.

上述通式(Q3)中,X1 ~X4 分別獨立地表示含有聚合性基團之取代基,上述取代基中的碳原子可被雜原子取代。作為X1 ~X4 所表示之含有聚合性基團之取代基,並無特別限制,但含有聚合性基團之脂肪族基為較佳。 作為具有X1 ~X4 所表示之聚合性基團之脂肪族基,並無特別限制,但聚合性基團以外的碳原子數為1~12的伸烷基為較佳,碳原子數2~10的伸烷基為更佳,碳原子數2~5的伸烷基為進一步較佳。 並且,含有X1 ~X4 所表示之聚合性基團之脂肪族基中,上述脂肪族基被雜原子取代時,被-NR-(R為取代基)、氧原子、硫原子取代為較佳,上述脂肪族基中不相鄰之-CH2 -被氧原子或硫原子取代為更佳,上述脂肪族基中不相鄰之-CH2 -被氧原子取代為進一步較佳。含有X1 ~X4 所表示之聚合性基團之脂肪族基的1~2處被雜原子取代為較佳,被雜原子取代1處為更佳,與Ar11 ~Ar14 所表示之含有以虛線包圍之苯環之芳基相鄰之1處被雜原子取代為進一步較佳。 作為含有X1 ~X4 所表示之聚合性基團之脂肪族基中含有之聚合性基團,能夠進行自由基聚合或陽離子聚合之聚合性基團(以下,還分別稱作自由基聚合性基團及陽離子聚合性基團)為較佳。 作為自由基聚合性基團,能夠使用通常周知之自由基聚合性基團,作為較佳者,能夠舉出含有能夠進行自由基聚合之烯屬不飽和鍵之聚合性基團,具體而言,可舉出乙烯基、(甲基)丙烯醯氧基等。其中,(甲基)丙烯醯氧基為較佳,丙烯醯氧基為更佳。 作為陽離子聚合性基團,能夠使用通常周知之陽離子聚合性基團,具體而言,可舉出脂環式醚基、環狀縮醛基、環狀內酯基、環狀硫醚基、螺環原酸酯基、乙烯氧基等。其中,脂環式醚基、乙烯氧基為較佳,環氧基、氧雜環丁基、乙烯氧基尤為佳。 Ar1 ~Ar4 所含有之取代基所含有之上述聚合性基團為自由基聚合性基團為較佳。 Ar1 ~Ar4 中的2個以上包含含有聚合性基團之取代基,Ar1 ~Ar4 中的2~4個包含含有聚合性基團之取代基為較佳,Ar1 ~Ar4 中的2或3個包含含有聚合性基團之取代基為更佳,Ar1 ~Ar4 中的2個包含含有聚合性基團之取代基為進一步較佳。 Ar11 ~Ar14 分別獨立地為作為稠環之一含有以虛線包圍之苯環之多環芳香族烴基時,X1 ~X4 可分別獨立地取代為以虛線包圍之苯環,亦可取代為以虛線包圍之苯環以外的環。In the above general formula (Q3), X 1 to X 4 each independently represent a substituent containing a polymerizable group, and the carbon atom in the substituent may be substituted with a hetero atom. The polymerizable group-containing substituent represented by X 1 to X 4 is not particularly limited, but an aliphatic group containing a polymerizable group is preferred. The aliphatic group having a polymerizable group represented by X 1 to X 4 is not particularly limited, but an alkylene group having 1 to 12 carbon atoms other than the polymerizable group is preferred, and the number of carbon atoms is 2 The alkylene group of -10 is more preferable, and the alkylene group of 2 to 5 carbon atoms is more preferable. In addition, in the aliphatic group containing the polymerizable group represented by X 1 to X 4 , when the aliphatic group is substituted with a hetero atom, it is replaced by -NR- (R is a substituent), an oxygen atom, and a sulfur atom. Jia, the aliphatic group of non-adjacent -CH 2 - is substituted with an oxygen atom or a sulfur atom is more preferably the aliphatic group of non-adjacent -CH 2 - is substituted with an oxygen atom is further preferred. The aliphatic group containing the polymerizable group represented by X 1 to X 4 is preferably substituted by a heteroatom at 1 to 2 places, and it is more preferably substituted by a heteroatom at 1 place, and contains the same as Ar 11 ~Ar 14 It is more preferable that one adjacent aryl group of the benzene ring surrounded by a dotted line is substituted with a heteroatom. As the polymerizable group contained in the aliphatic group containing the polymerizable group represented by X 1 to X 4 , a polymerizable group capable of undergoing radical polymerization or cationic polymerization (hereinafter, also referred to as radical polymerizable group, respectively) Group and cationically polymerizable group) are preferred. As the radical polymerizable group, a generally known radical polymerizable group can be used. Preferably, a polymerizable group containing an ethylenically unsaturated bond capable of radical polymerization can be used. Specifically, Examples include vinyl groups, (meth)acryloxy groups, and the like. Among them, (meth)acryloxy is preferred, and acryloxy is more preferred. As the cationically polymerizable group, generally known cationically polymerizable groups can be used. Specifically, alicyclic ether groups, cyclic acetal groups, cyclic lactone groups, cyclic thioether groups, and spiro Cycloorthoester group, vinyloxy group, etc. Among them, alicyclic ether groups and vinyloxy groups are preferred, and epoxy groups, oxetanyl groups, and vinyloxy groups are particularly preferred. The above-mentioned polymerizable groups contained in the substituents contained in Ar 1 to Ar 4 are preferably radical polymerizable groups. Ar 1 ~ Ar 4 comprising two or more of the substituents containing the polymerizable group, Ar 1 ~ Ar 4 is 2 to 4 comprising a substituent of the polymerizable group is preferred, Ar 1 ~ Ar 4 in It is more preferable that two or three of the substituents contain a polymerizable group, and it is more preferable that two of Ar 1 to Ar 4 contain a polymerizable group-containing substituent. When Ar 11 to Ar 14 are each independently a polycyclic aromatic hydrocarbon group containing a benzene ring surrounded by a dotted line as one of the condensed rings, X 1 to X 4 may each independently be substituted with a benzene ring surrounded by a dotted line, or may be substituted It is a ring other than the benzene ring surrounded by a dotted line.

上述通式(Q3)中,a及b分別獨立地表示1~5的整數,1或2為較佳,a及b均為1為更佳。 上述通式(Q3)中,c及d分別獨立地表示0~5的整數,0或1為較佳,c及d均為0為更佳。In the above general formula (Q3), a and b each independently represent an integer of 1 to 5, preferably 1 or 2, and more preferably both a and b are 1. In the above general formula (Q3), c and d each independently represent an integer of 0 to 5, preferably 0 or 1, and more preferably both c and d are 0.

上述通式(Q3)中,R1 ~R4 分別獨立地表示取代基。作為R1 ~R4 所表示之取代基,並無特別限制,例如,可舉出鹵原子、鹵化烷基、烷基、烯基、醯基、羥基、羥基烷基、烷氧基、芳基、雜芳基、脂環基等。R1 ~R4 所表示之取代基為烷基、烷氧基或芳基為較佳,碳原子數1~5的烷基、碳原子數1~5的烷氧基或苯基為更佳,甲基、甲氧基或苯基為進一步較佳。 上述通式(Q3)中,Ar11 ~Ar14 分別獨立地為作為稠環之一含有以虛線包圍之苯環之多環芳香族烴基時,R1 ~R4 可分別獨立地取代為以虛線包圍之苯環,亦可取代為以虛線包圍之苯環以外的環。In the above general formula (Q3), R 1 to R 4 each independently represent a substituent. The substituents represented by R 1 to R 4 are not particularly limited. Examples include halogen atoms, halogenated alkyl groups, alkyl groups, alkenyl groups, hydroxy groups, hydroxyalkyl groups, alkoxy groups, and aryl groups. , Heteroaryl, alicyclic, etc. The substituent represented by R 1 to R 4 is preferably an alkyl group, an alkoxy group or an aryl group, and more preferably an alkyl group having 1 to 5 carbon atoms, an alkoxy group or a phenyl group having 1 to 5 carbon atoms , Methyl, methoxy or phenyl is further preferred. In the above general formula (Q3), when Ar 11 to Ar 14 are each independently a polycyclic aromatic hydrocarbon group containing a benzene ring surrounded by a dotted line as one of the condensed rings, R 1 to R 4 may each independently be substituted with a dotted line The surrounding benzene ring may be substituted with a ring other than the benzene ring surrounded by a dotted line.

上述通式(Q3)中,e、f、g及h分別獨立地表示0以上的整數,e、f、g及h的上限值分別為從Ar11 ~Ar14 能夠具有之取代基的數減去a、b、c或d之值。 e、f、g及h分別獨立地0~8為較佳,0~2為更佳,0為進一步較佳。 Ar11 ~Ar14 分別獨立地為作為稠環之一含有以虛線包圍之苯環之多環芳香族烴基時,e、f、g及h為0或1為較佳,0為更佳。In the above general formula (Q3), e, f, g, and h each independently represent an integer of 0 or more, and the upper limit of e, f, g, and h is the number of substituents that can have from Ar 11 to Ar 14 respectively Subtract the value of a, b, c, or d. e, f, g, and h each independently are preferably 0-8, more preferably 0-2, and even more preferably 0. When Ar 11 to Ar 14 are each independently a polycyclic aromatic hydrocarbon group containing a benzene ring surrounded by a dotted line as one of the condensed rings, it is preferable that e, f, g, and h are 0 or 1, and 0 is more preferable.

作為以上述式(Q3)表示之化合物,例如,可舉出9,9‘-二[4-(2-丙烯醯氧基乙氧基)苯基]芴等。作為含有9,9-二芳基芴骨架之聚合性化合物,還能夠較佳地使用日本特開2010-254732號公報記載之化合物類。Examples of the compound represented by the above formula (Q3) include 9,9'-bis[4-(2-propenyloxyethoxy)phenyl]fluorene and the like. As the polymerizable compound containing a 9,9-diarylfluorene skeleton, the compounds described in JP 2010-254732 A can also be preferably used.

作為該種含有卡多骨架之聚合性化合物,並無限定,例如,可舉出Oncoat EX系列(NAGASE & CO., LTD製造)及Ogsol (Osaka Gas Chemicals Co., Ltd.製造)等。The polymerizable compound containing the cardo skeleton is not limited, and examples thereof include Oncoat EX series (manufactured by NAGASE & CO., LTD) and Ogsol (manufactured by Osaka Gas Chemicals Co., Ltd.).

組成物含有聚合性化合物時,聚合性化合物的含量相對於組成物的總固體成分,0.1~40質量%為較佳。下限例如為0.5質量%以上為更佳,1質量%以上為進一步較佳。上限例如為30質量%以下為更佳,20質量%以下為進一步較佳。 聚合性化合物可以係單獨1種,亦可倂用2種以上。倂用2種以上時,總計量成為上述範圍為較佳。When the composition contains a polymerizable compound, the content of the polymerizable compound is preferably 0.1 to 40% by mass relative to the total solid content of the composition. The lower limit is preferably 0.5% by mass or more, and more preferably 1% by mass or more. For example, the upper limit is more preferably 30% by mass or less, and more preferably 20% by mass or less. The polymerizable compound may be one type alone, or two or more types may be used. When two or more types are used, it is preferable that the total amount falls within the above-mentioned range.

〔聚合起始劑〕 上述組成物含有聚合起始劑為較佳。 作為聚合起始劑,並無特別限制,能夠從公知的聚合起始劑中適當選擇,例如,具有感光性者(所謂的光聚合起始劑)為較佳。 上述組成物除了含金屬氮化物的粒子以外,還含有光聚合起始劑及上述聚合性化合物時,藉由活性光線或放射線的照射而硬化,故有時被稱作“感光性組成物”。 作為光聚合起始劑,只要具有引發聚合性化合物的聚合之能力,則並無特別限制,能夠從公知的光聚合起始劑中適當選擇。例如,對從紫外線區域至可見光線具有感光性者為較佳。並且,聚合起始劑可以係與被光激發之光敏劑產生某些作用,並生成活性自由基之活性劑,亦可以係依據聚合性化合物的種類而引發陽離子聚合之起始劑。 並且,光聚合起始劑含有至少1種於約300nm~800nm(330nm~500nm為更佳。)的範圍內具有至少約50莫耳吸光系數之化合物為較佳。[Polymerization initiator] The above composition preferably contains a polymerization initiator. The polymerization initiator is not particularly limited, and can be appropriately selected from known polymerization initiators. For example, those having photosensitivity (so-called photopolymerization initiators) are preferred. When the above composition contains a photopolymerization initiator and the above polymerizable compound in addition to the metal nitride-containing particles, it is cured by irradiation with active light rays or radiation, so it is sometimes referred to as a "photosensitive composition." The photopolymerization initiator is not particularly limited as long as it has the ability to initiate polymerization of the polymerizable compound, and it can be appropriately selected from known photopolymerization initiators. For example, it is preferable to have photosensitivity from ultraviolet region to visible light. In addition, the polymerization initiator can be an active agent that has some effect with the photosensitizer excited by light and generates active free radicals, or it can be an initiator that initiates cationic polymerization according to the type of polymerizable compound. In addition, the photopolymerization initiator preferably contains at least one compound having an absorption coefficient of at least about 50 mol in the range of about 300 nm to 800 nm (more preferably, 330 nm to 500 nm).

作為光聚合起始劑,例如,可舉出鹵化烴衍生物(例如,含有三嗪骨架者、含有噁二唑骨架者等)、醯基氧化膦等醯基膦化合物、六芳基雙咪唑、肟衍生物等肟化合物、有機過氧化物、硫代化合物、酮化合物、芳香族鎓鹽、酮肟醚、胺基苯乙酮化合物、羥基苯乙酮等。 作為上述含有三嗪骨架之鹵代烴化合物,例如,可舉出若林等著、Bull.Chem.Soc.Japan,42、2924(1969)記載之化合物、英國專利1388492號說明書記載之化合物、日本特開昭53-133428號公報記載之化合物、德國專利3337024號說明書記載之化合物、基於F.C.Schaefer等之J.Org.Chem.;29、1527(1964)記載之化合物、日本特開昭62-58241號公報記載之化合物、日本特開平5-281728號公報記載之化合物、日本特開平5-34920號公報記載之化合物、美國專利第4212976號說明書中記載之化合物等。As the photopolymerization initiator, for example, halogenated hydrocarbon derivatives (for example, those containing triazine skeletons, those containing oxadiazole skeletons, etc.), phosphine compounds such as phosphine oxides, hexaarylbisimidazole, Oxime compounds such as oxime derivatives, organic peroxides, thio compounds, ketone compounds, aromatic onium salts, ketoxime ethers, aminoacetophenone compounds, hydroxyacetophenone, etc. Examples of halogenated hydrocarbon compounds containing triazine skeletons include compounds described in Wakabayashi et al., Bull. Chem. Soc. Japan, 42, 2924 (1969), compounds described in the specification of British Patent No. 1388492, and Japanese patents The compound described in Japanese Patent Publication No. 53-133428, the compound described in German Patent No. 3337024, the compound described in J. Org. Chem. based on FC Schaefer et al.; 29, 1527 (1964), and Japanese Patent Application Publication No. 62-58241 The compound described in the publication, the compound described in JP 5-281728, the compound described in JP 5-34920, the compound described in the specification of U.S. Patent No. 4212976, and the like.

並且,從曝光靈敏度的觀點考慮,選自由三鹵甲基三嗪化合物、苄基二甲基縮酮化合物、α-羥基酮化合物、α-胺基酮化合物、醯基膦化合物、氧化膦化合物、茂金屬化合物、肟化合物、三芳基咪唑二聚體、鎓類化合物、苯并噻唑化合物、二苯甲酮化合物、苯乙酮化合物及其衍生物、環戊二烯-苯-鐵絡合物及其鹽、鹵代甲基噁二唑化合物以及3-芳基取代香豆素化合物所組成的群組中的化合物為較佳。Also, from the viewpoint of exposure sensitivity, it is selected from trihalomethyl triazine compounds, benzyl dimethyl ketal compounds, α-hydroxy ketone compounds, α-amino ketone compounds, phosphine compounds, phosphine oxide compounds, Metallocene compounds, oxime compounds, triarylimidazole dimers, onium compounds, benzothiazole compounds, benzophenone compounds, acetophenone compounds and their derivatives, cyclopentadiene-benzene-iron complexes and Compounds in the group consisting of salts, halogenated methyl oxadiazole compounds and 3-aryl substituted coumarin compounds are preferred.

三鹵甲基三嗪化合物、α-胺基酮化合物、醯基膦化合物、氧化膦化合物、肟化合物、三芳基咪唑二聚體、鎓類化合物、二苯甲酮化合物或苯乙酮化合物為進一步較佳,選自由三鹵甲基三嗪化合物、α-胺基酮化合物、肟化合物、三芳基咪唑二聚體及二苯甲酮化合物所組成的群組中的至少1種化合物尤為佳。Trihalomethyl triazine compound, α-amino ketone compound, phosphine compound, phosphine oxide compound, oxime compound, triaryl imidazole dimer, onium compound, benzophenone compound or acetophenone compound are further Preferably, at least one compound selected from the group consisting of trihalomethyl triazine compound, α-amino ketone compound, oxime compound, triaryl imidazole dimer, and benzophenone compound is particularly preferred.

尤其,使用上述組成物製作遮光膜時,需要以銳利的形狀形成微細的圖案,故與硬化性一同在未曝光部無殘渣地進行顯影較為重要。從該種觀點考慮,使用肟化合物作為光聚合起始劑尤為佳。尤其,形成微細的圖案時,硬化用曝光中利用步進曝光,但該曝光機有時會被鹵素損傷,還需要將光聚合起始劑的添加量抑制得較低。故,若考慮該些方面,則形成微細圖案時,作為光聚合起始劑,使用肟化合物尤為佳。 作為光聚合起始劑的具體例,例如,能夠參閱日本特開2013-29760號公報的段落0265~0268,該內容引入本申請說明書中。In particular, when producing a light-shielding film using the above-mentioned composition, it is necessary to form a fine pattern in a sharp shape. Therefore, together with the curability, it is important to develop the unexposed area without residue. From this viewpoint, it is particularly preferable to use an oxime compound as a photopolymerization initiator. In particular, when forming a fine pattern, step exposure is used in exposure for curing, but this exposure machine may be damaged by halogen, and it is also necessary to suppress the addition amount of the photopolymerization initiator to a low level. Therefore, considering these aspects, when forming a fine pattern, it is particularly preferable to use an oxime compound as a photopolymerization initiator. As a specific example of the photopolymerization initiator, for example, paragraphs 0265 to 0268 of JP 2013-29760 A can be referred to, and this content is incorporated into the specification of this application.

作為光聚合起始劑,亦可適當地使用羥基苯乙酮化合物、胺基苯乙酮化合物及醯基膦化合物。更具體而言,例如,還能夠使用日本特開平10-291969號公報中記載之胺基苯乙酮系起始劑及日本專利第4225898號公報中記載之醯基膦系起始劑。 作為羥基苯乙酮系起始劑,能夠使用IRGACURE-184、DAROCUR-1173、IRGACURE-500、IRGACURE-2959、IRGACURE-127(商品名:均為BASF公司製造)。 作為胺基苯乙酮系起始劑,能夠使用作為市售品之IRGACURE-907、IRGACURE-369或IRGACURE-379EG(商品名:均為BASF公司製造)。胺基苯乙酮系起始劑還能夠使用吸收波長與365nm或405nm等長波光源匹配之日本特開2009-191179號公報中記載之化合物。 作為醯基膦系起始劑,能夠使用作為市售品之IRGACURE-819或DAROCUR-TPO(商品名:均為BASF公司製造)。As a photopolymerization initiator, a hydroxyacetophenone compound, an aminoacetophenone compound, and an phosphine compound can also be used suitably. More specifically, for example, the aminoacetophenone-based initiator described in Japanese Patent Laid-Open No. 10-291969 and the phosphine-based initiator described in Japanese Patent No. 4225898 can also be used. As the hydroxyacetophenone-based initiator, IRGACURE-184, DAROCUR-1173, IRGACURE-500, IRGACURE-2959, and IRGACURE-127 (brand names: all manufactured by BASF) can be used. As the aminoacetophenone-based initiator, commercially available IRGACURE-907, IRGACURE-369, or IRGACURE-379EG (brand name: all manufactured by BASF Corporation) can be used. As the aminoacetophenone-based initiator, the compound described in Japanese Patent Application Laid-Open No. 2009-191179 whose absorption wavelength is matched to a long-wave light source such as 365 nm or 405 nm can also be used. As the phosphine-based initiator, commercially available IRGACURE-819 or DAROCUR-TPO (brand name: both manufactured by BASF Corporation) can be used.

(肟化合物) 作為光聚合起始劑,可更佳地舉出肟化合物(肟系起始劑)。尤其,肟化合物為高靈敏度且聚合效率較高,能夠與色材濃度無關地進行硬化,易將色材的濃度設計為較高,故較佳。 作為肟化合物的具體例,可使用日本特開2001-233842號公報記載之化合物、日本特開2000-80068號公報記載之化合物或日本特開2006-342166號公報記載之化合物。 在本發明中作為能夠較佳地使用之肟化合物,例如,可舉出3-苯甲醯氧基亞胺基丁烷-2-酮、3-乙醯氧基亞胺基丁烷-2-酮、3-丙醯氧基亞胺基丁烷-2-酮、2-乙醯氧基亞胺基戊烷-3-酮、2-乙醯氧基亞胺基-1-苯基丙烷-1-酮、2-苯甲醯氧基亞胺基-1-苯基丙烷-1-酮、3-(4-甲苯磺醯氧基)亞胺基丁烷-2-酮及2-乙氧基羰氧基亞胺基-1-苯基丙烷-1-酮等。 並且,還可舉出J.C.S.Perkin II(1979年)pp.1653-1660)、J.C.S.Perkin II(1979年)pp.156-162、Journal of Photopolymer Science and Technology(1995年)pp.202-232、日本特開2000-66385號公報記載之化合物、日本特開2000-80068號公報、特表2004-534797號公報及日本特開2006-342166號公報的各公報中記載之化合物等。 市售品中,亦可較佳地使用IRGACURE-OXE01(BASF公司製造)、IRGACURE-OXE02(BASF公司製造)、IRGACURE-OXE03(BASF公司製造)或IRGACURE-OXE04(BASF公司製造)。並且,還能夠使用TR-PBG-304(常州強力電子新材料有限公司製造)、Adeka Arkls NCI-831及Adeka Arkls NCI-930(ADEKA CORPORATION製造)或N-1919(含咔唑·肟酯骨架光起始劑(ADEKA CORPORATION製造)。(Oxime compound) As the photopolymerization initiator, an oxime compound (oxime-based initiator) can be more preferably used. In particular, the oxime compound has high sensitivity and high polymerization efficiency, can be cured regardless of the color material concentration, and the color material concentration can be easily designed to be high, which is preferable. As specific examples of the oxime compound, the compound described in JP 2001-233842 A, the compound described in JP 2000-80068 A, or the compound described in JP 2006-342166 A can be used. As the oxime compound that can be preferably used in the present invention, for example, 3-benzyloxyiminobutan-2-one, 3-acetoxyiminobutane-2- Ketone, 3-propionyloxyiminobutan-2-one, 2-acetoxyiminopentane-3-one, 2-acetoxyimino-1-phenylpropane- 1-ketone, 2-benzyloxyimino-1-phenylpropan-1-one, 3-(4-toluenesulfonyloxy)iminobutan-2-one and 2-ethoxy Carbonyloxyimino-1-phenylpropan-1-one and the like. In addition, JCSPerkin II (1979) pp.1653-1660), JCSPerkin II (1979) pp.156-162, Journal of Photopolymer Science and Technology (1995) pp.202-232, Japan Compounds described in JP 2000-66385, JP 2000-80068, JP 2004-534797, and JP 2006-342166, compounds, etc. Among the commercially available products, IRGACURE-OXE01 (manufactured by BASF Corporation), IRGACURE-OXE02 (manufactured by BASF Corporation), IRGACURE-OXE03 (manufactured by BASF Corporation), or IRGACURE-OXE04 (manufactured by BASF Corporation) can also be preferably used. In addition, TR-PBG-304 (manufactured by Changzhou Qiangli Electronic New Materials Co., Ltd.), Adeka Arkls NCI-831 and Adeka Arkls NCI-930 (manufactured by ADEKA CORPORATION) or N-1919 (containing carbazole·oxime ester skeleton light Starter (manufactured by ADEKA CORPORATION).

並且,作為上述記載以外的肟化合物,可使用:在咔唑N位連結有肟之日本特表2009-519904號公報中記載之化合物;在二苯基酮部位導入有雜取代基之美國專利第7626957號公報中記載之化合物;在色素部位導入有硝基之日本特開2010-15025號公報及美國專利公開2009-292039號公報中記載之化合物;國際公開專利2009-131189號公報中記載之酮肟化合物;在同一分子內含有三嗪骨架與肟骨架之美國專利7556910號公報中記載之化合物;在405nm具有極大吸收且對g射線光源具有良好的靈敏度之日本特開2009-221114號公報中記載之化合物;等。 例如可較佳地參閱日本特開2013-29760號公報的段落0274~0275,該內容引入本申請說明書中。 具體而言,作為肟化合物,以下述式(OX-1)表示之化合物為較佳。另外,肟的N-O鍵可以係(E)體的肟化合物,亦可以係(Z)體的肟化合物,還可以係(E)體與(Z)體的混合物。In addition, as oxime compounds other than those described above, there can be used: the compound described in Japanese Patent Application Publication No. 2009-519904 in which an oxime is linked to the N-position of a carbazole; and the US Patent No. The compound described in No. 7626957; the compound described in JP 2010-15025 and U.S. Patent Publication No. 2009-292039 in which a nitro group is introduced into the pigment site; the ketone described in International Publication No. 2009-131189 An oxime compound; a compound described in US Patent No. 7556910 containing a triazine skeleton and an oxime skeleton in the same molecule; described in Japanese Patent Application Laid-Open No. 2009-221114, which has great absorption at 405 nm and good sensitivity to g-ray light sources The compound; etc. For example, it is better to refer to paragraphs 0274 to 0275 of JP 2013-29760 A, which content is incorporated into the specification of this application. Specifically, as the oxime compound, a compound represented by the following formula (OX-1) is preferred. In addition, the N-O bond of the oxime may be an oxime compound of the (E) body, or an oxime compound of the (Z) body, or a mixture of the (E) body and the (Z) body.

[化學式15]

Figure 02_image029
[Chemical formula 15]
Figure 02_image029

通式(OX-1)中,R及B分別獨立地表示一價的取代基,A表示二價的有機基團,Ar表示芳基。 作為通式(OX-1)中以R表示之一價的取代基,一價的非金屬原子團為較佳。 作為一價的非金屬原子團,可舉出烷基、芳基、醯基、烷氧羰基、芳氧羰基、雜環基、烷基硫代羰基及芳基硫代羰基等。並且,該些基團可具有1個以上的取代基。並且,前述取代基可進一步被其他取代基取代。 作為取代基,可舉出鹵原子、芳氧基、烷氧羰基或芳氧羰基、醯氧基、醯基、烷基及芳基等。 作為通式(OX-1)中以B表示之一價的取代基,芳基、雜環基、芳基羰基或雜環羰基為較佳。該些基團可具有1個以上的取代基。作為取代基,可例示前述取代基。 作為通式(OX-1)中以A表示之二價的有機基團,碳原子數1~12的伸烷基、伸環烷基或伸炔基為較佳。該些基團可具有1個以上的取代基。作為取代基,可例示前述取代基。In the general formula (OX-1), R and B each independently represent a monovalent substituent, A represents a divalent organic group, and Ar represents an aryl group. As the monovalent substituent represented by R in the general formula (OX-1), a monovalent non-metal atomic group is preferred. Examples of the monovalent non-metal atomic group include an alkyl group, an aryl group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a heterocyclic group, an alkylthiocarbonyl group, an arylthiocarbonyl group, and the like. In addition, these groups may have one or more substituents. In addition, the aforementioned substituents may be further substituted with other substituents. Examples of the substituent include a halogen atom, an aryloxy group, an alkoxycarbonyl group or an aryloxycarbonyl group, an acyloxy group, an acyl group, an alkyl group, and an aryl group. As the monovalent substituent represented by B in the general formula (OX-1), an aryl group, a heterocyclic group, an arylcarbonyl group or a heterocyclic carbonyl group is preferred. These groups may have one or more substituents. As the substituent, the aforementioned substituents can be exemplified. As the divalent organic group represented by A in the general formula (OX-1), an alkylene group, cycloalkylene group or alkynylene group having 1 to 12 carbon atoms is preferred. These groups may have one or more substituents. As the substituent, the aforementioned substituents can be exemplified.

作為光聚合起始劑,還能夠使用含有氟原子之肟化合物。作為含有氟原子之肟化合物的具體例,可舉出:日本特開2010-262028號公報中記載之化合物;日本特表2014-500852號公報中記載之化合物24、36~40;日本特開2013-164471號公報中記載之化合物(C-3);等。該內容引入本說明書中。As the photopolymerization initiator, an oxime compound containing a fluorine atom can also be used. Specific examples of oxime compounds containing fluorine atoms include: the compounds described in JP 2010-262028 A; the compounds 24, 36-40 described in JP 2014-500852 A; JP 2013 -Compound (C-3) described in Bulletin No. 164471; etc. This content is incorporated into this manual.

作為光聚合起始劑,還能夠使用以下述通式(1)~(4)表示之化合物。As the photopolymerization initiator, compounds represented by the following general formulas (1) to (4) can also be used.

[化學式16]

Figure 02_image031
[Chemical formula 16]
Figure 02_image031

[化學式17]

Figure 02_image033
[Chemical formula 17]
Figure 02_image033

式(1)中,R1 及R2 分別獨立地表示碳原子數1~20的烷基、碳原子數4~20的脂環式烴基、碳原子數6~30的芳基或碳原子數7~30的芳烷基,R1 及R2 為苯基時,苯基彼此可鍵結而形成茀基,R3 及R4 分別獨立地表示氫原子、碳原子數1~20的烷基、碳原子數6~30的芳基、碳原子數7~30的芳烷基或碳原子數4~20的雜環基,X表示直接鍵結或羰基。In formula (1), R 1 and R 2 each independently represent an alkyl group having 1 to 20 carbon atoms, an alicyclic hydrocarbon group having 4 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms, or the number of carbon atoms 7-30 aralkyl group, when R 1 and R 2 are phenyl groups, the phenyl groups may be bonded to each other to form a stilbene group, and R 3 and R 4 each independently represent a hydrogen atom and an alkyl group having 1 to 20 carbon atoms , An aryl group having 6 to 30 carbon atoms, an aralkyl group having 7 to 30 carbon atoms, or a heterocyclic group having 4 to 20 carbon atoms, and X represents a direct bond or a carbonyl group.

式(2)中,R1 、R2 、R3 及R4 的含義與式(1)中的R1 、R2 、R3 及R4 相同,R5 表示-R6 、-OR6 、-SR6 、-COR6 、-CONR6 R6 、-NR6 COR6 、-OCOR6 、-COOR6 、-SCOR6 、-OCSR6 、-COSR6 、-CSOR6 、-CN、鹵原子或羥基,R6 表示碳原子數1~20的烷基、碳原子數6~30的芳基、碳原子數7~30的芳烷基或碳原子數4~20的雜環基,X表示直接鍵結或羰基,a表示0~4的整數。 (2), R 1, R 2, 1 , R 2, R 3 and the same formula the meanings of R 4 in the formula R (1) in R 3 and R 4, R 5 represents -R 6, -OR 6, -SR 6 , -COR 6 , -CONR 6 R 6 , -NR 6 COR 6 , -OCOR 6 , -COOR 6 , -SCOR 6 , -OCSR 6 , -COSR 6 , -CSOR 6 , -CN, halogen atom or Hydroxyl group, R 6 represents an alkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms, an aralkyl group having 7 to 30 carbon atoms or a heterocyclic group having 4 to 20 carbon atoms, and X represents direct A bond or a carbonyl group, a represents an integer of 0-4.

式(3)中,R1 表示碳原子數1~20的烷基、碳原子數4~20的脂環式烴基、碳原子數6~30的芳基或碳原子數7~30的芳烷基,R3 及R4 分別獨立地表示氫原子、碳原子數1~20的烷基、碳原子數6~30的芳基、碳原子數7~30的芳烷基或碳原子數4~20的雜環基,X表示直接鍵結或羰基。In formula (3), R 1 represents an alkyl group having 1 to 20 carbon atoms, an alicyclic hydrocarbon group having 4 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms, or an aralkyl group having 7 to 30 carbon atoms Group, R 3 and R 4 each independently represent a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an aryl group having 6 to 30 carbon atoms, an aralkyl group having 7 to 30 carbon atoms, or an aralkyl group having 4 to 30 carbon atoms. The heterocyclic group of 20, X represents a direct bond or a carbonyl group.

式(4)中,R1 、R3 及R4 的含義與式(3)中的R1 、R3 及R4 相同,R5 表示-R6 、-OR6 、-SR6 、-COR6 、-CONR6 R6 、-NR6 COR6 、-OCOR6 、-COOR6 、-SCOR6 、-OCSR6 、-COSR6 、-CSOR6 、-CN、鹵原子或羥基,R6 表示碳原子數1~20的烷基、碳原子數6~30的芳基、碳原子數7~30的芳烷基或碳原子數4~20的雜環基,X表示直接鍵結或羰基,a表示0~4的整數。Formula (4), R 1, R 3 and R 4 defined for the formula (3) in R 1, the same as R 3 and R 4, R 5 represents -R 6, -OR 6, -SR 6 , -COR 6 , -CONR 6 R 6 , -NR 6 COR 6 , -OCOR 6 , -COOR 6 , -SCOR 6 , -OCSR 6 , -COSR 6 , -CSOR 6 , -CN, halogen atom or hydroxyl, R 6 represents carbon An alkyl group having 1 to 20 atoms, an aryl group having 6 to 30 carbon atoms, an aralkyl group having 7 to 30 carbon atoms, or a heterocyclic group having 4 to 20 carbon atoms, X represents a direct bond or a carbonyl group, a Represents an integer of 0-4.

上述式(1)及式(2)中,R1 及R2 分別獨立地為甲基、乙基、正丙基、異丙基、環己基或苯基為較佳。R3 為甲基、乙基、苯基、甲苯基或二甲苯基為較佳。R4 為碳原子數1~6的烷基或苯基為較佳。R5 為甲基、乙基、苯基、甲苯基或萘基為較佳。X為直接鍵結為較佳。 並且,上述式(3)及(4)中,R1 分別獨立地為甲基、乙基、正丙基、異丙基、環己基或苯基為較佳。R3 為甲基、乙基、苯基、甲苯基或二甲苯基為較佳。R4 為碳原子數1~6的烷基或苯基為較佳。R5 為甲基、乙基、苯基、甲苯基或萘基為較佳。X為直接鍵結為較佳。 作為以式(1)及式(2)表示之化合物的具體例,例如,可舉出日本特開2014-137466號公報的段落號0076~0079中記載之化合物。該內容引入本說明書中。In the above formula (1) and formula (2), it is preferred that R 1 and R 2 are independently methyl, ethyl, n-propyl, isopropyl, cyclohexyl or phenyl. R 3 is preferably methyl, ethyl, phenyl, tolyl or xylyl. Preferably, R 4 is an alkyl group having 1 to 6 carbon atoms or a phenyl group. R 5 is preferably methyl, ethyl, phenyl, tolyl or naphthyl. X is preferably a direct bond. In addition, in the above formulas (3) and (4), R 1 is preferably each independently a methyl group, an ethyl group, an n-propyl group, an isopropyl group, a cyclohexyl group, or a phenyl group. R 3 is preferably methyl, ethyl, phenyl, tolyl or xylyl. Preferably, R 4 is an alkyl group having 1 to 6 carbon atoms or a phenyl group. R 5 is preferably methyl, ethyl, phenyl, tolyl or naphthyl. X is preferably a direct bond. As specific examples of the compounds represented by formula (1) and formula (2), for example, the compounds described in paragraphs 0076 to 0079 of JP 2014-137466 A can be cited. This content is incorporated into this manual.

以下示出可在上述組成物中較佳地使用之肟化合物的具體例。Specific examples of oxime compounds that can be preferably used in the above composition are shown below.

[化學式18]

Figure 02_image035
[Chemical formula 18]
Figure 02_image035

肟化合物係在350nm~500nm的波長區域具有極大吸收波長者為較佳,在360nm~480nm的波長區域具有極大吸收波長者為更佳,365nm及405nm的吸光度較高者為進一步較佳。 肟化合物中,關於365nm或405nm中的莫耳吸光系數,從靈敏度的觀點考慮,1,000~300,000為較佳,2,000~300,000為更佳,5,000~200,000為進一步較佳。 化合物的莫耳吸光系數能夠利用公知的方法,例如,藉由紫外可見分光光度計(Varian公司製造Cary-5 spctrophotometer),利用乙酸乙酯溶劑,以0.01g/L的濃度進行測定為較佳。 光聚合起始劑可依據需要組合2種以上來使用。The oxime compound preferably has a maximum absorption wavelength in the wavelength region of 350 nm to 500 nm, more preferably has a maximum absorption wavelength in the wavelength region of 360 nm to 480 nm, and further preferably has a higher absorbance at 365 nm and 405 nm. Among the oxime compounds, from the viewpoint of sensitivity, the molar absorption coefficient at 365 nm or 405 nm is preferably 1,000 to 300,000, more preferably 2,000 to 300,000, and more preferably 5,000 to 200,000. The molar absorptivity of the compound can be measured by a known method, for example, by an ultraviolet-visible spectrophotometer (Cary-5 spctrophotometer manufactured by Varian), using an ethyl acetate solvent, preferably at a concentration of 0.01 g/L. The photopolymerization initiator can be used in combination of two or more types as required.

上述組成物含有聚合起始劑時,聚合起始劑的含量相對於組成物中的總固體成分,0.1~30質量%為較佳,1~25質量%為更佳,1~10質量%為進一步較佳。上述組成物可僅包含1種聚合起始劑,亦可含有2種以上。包含2種以上時,其總計量成為上述範圍為較佳。When the above composition contains a polymerization initiator, the content of the polymerization initiator relative to the total solid content in the composition is preferably 0.1-30% by mass, more preferably 1-25% by mass, and 1-10% by mass Further better. The said composition may contain only 1 type of polymerization initiator, and may contain 2 or more types. When two or more types are contained, the total amount thereof is preferably within the above-mentioned range.

〔其他任意成分〕 上述組成物可還含有以下的任意成分。[Other optional components] The above-mentioned composition may further contain the following optional components.

<界面活性劑> 關於上述組成物,從更加提高塗佈性之觀點考慮,可含有各種界面活性劑。作為界面活性劑,能夠使用氟系界面活性劑、非離子系界面活性劑、陽離子系界面活性劑、陰離子系界面活性劑及矽酮系界面活性劑等各種界面活性劑。<Surfactant> The above-mentioned composition may contain various surfactants from the viewpoint of further improving coatability. As the surfactant, various surfactants such as fluorine surfactants, nonionic surfactants, cationic surfactants, anionic surfactants, and silicone surfactants can be used.

藉由使上述組成物中含有氟系界面活性劑,製備成塗佈液時的液體特性(尤其,流動性)更加提高,能夠更加改善塗佈厚度的均勻性和省液性。亦即,利用適用含有氟系界面活性劑之組成物之塗佈液來形成膜時,被塗佈面與塗佈液之間的界面張力下降,向被塗佈面的潤濕性得到改善,向被塗佈面的塗佈性得到提高。故,能夠更佳地形成厚度不均較小之均勻厚度的膜。By including a fluorine-based surfactant in the above composition, the liquid characteristics (especially fluidity) when preparing the coating liquid are further improved, and the uniformity of the coating thickness and the liquid-saving property can be further improved. That is, when a film is formed using a coating liquid applied with a composition containing a fluorine-based surfactant, the interfacial tension between the coated surface and the coating liquid decreases, and the wettability to the coated surface is improved. The coatability to the coated surface is improved. Therefore, it is possible to better form a uniform thickness film with less uneven thickness.

氟系界面活性劑中的氟含有率為3~40質量%為較佳,5~30質量%為更佳,7~25質量%為進一步較佳。氟含有率在該範圍內之氟系界面活性劑在塗佈膜的厚度的均勻性和省液性方面有效,組成物中的溶解性亦良好。The fluorine content in the fluorine-based surfactant is preferably from 3 to 40% by mass, more preferably from 5 to 30% by mass, and even more preferably from 7 to 25% by mass. A fluorine-based surfactant having a fluorine content within this range is effective in terms of uniformity of the thickness of the coating film and liquid-saving properties, and the solubility in the composition is also good.

作為氟系界面活性劑,例如,可舉出Megafac F171、Megafac F172、Megafac F173、Megafac F176、Megafac F177、Megafac F141、Megafac F142、Megafac F143、Megafac F144、Megafac R30、Megafac F437、Megafac F475、Megafac F479、Megafac F482、Megafac F554、Megafac F780、RS-72-K(以上,DIC CORPORATION製造)、Fluorado FC430、Fluorado FC431、Fluorado FC171(以上,3M Japan Limited製造)、Surflon S-382、Surflon SC-101、Surflon SC-103、Surflon SC-104、Surflon SC-105、Surflon SC-1068、Surflon SC-381、Surflon SC-383、Surflon S-393、Surflon KH-40(以上,ASAHI GLASS CO., LTD.製造)、PF636、PF656、PF6320、PF6520、PF7002(OMNOVA SOLUTIONS INC.製造)等。氟系界面活性劑還能夠使用日本特開2015-117327號公報的段落0015~0158中記載之化合物。作為氟系界面活性劑,還能夠使用嵌段聚合物,作為具體例,例如,可舉出日本特開2011-89090號公報中記載之化合物。 氟系界面活性劑還能夠較佳地使用如下含氟高分子化合物,其含有源自含有氟原子之(甲基)丙烯酸酯化合物之重複單元及源自含有2個以上(5個以上為較佳)伸烷氧基(乙烯氧基、丙烯氧基為較佳)之(甲基)丙烯酸酯化合物之重複單元,下述化合物亦作為可在本發明中使用之氟系界面活性劑來例示。Examples of fluorine-based surfactants include Megafac F171, Megafac F172, Megafac F173, Megafac F176, Megafac F177, Megafac F141, Megafac F142, Megafac F143, Megafac F144, Megafac R30, Megafac F437, Megafac F475, , Megafac F482, Megafac F554, Megafac F780, RS-72-K (above, manufactured by DIC CORPORATION), Fluorado FC430, Fluorado FC431, Fluorado FC171 (above, manufactured by 3M Japan Limited), Surflon S-382, Surflon SC-101, Surflon SC-103, Surflon SC-104, Surflon SC-105, Surflon SC-1068, Surflon SC-381, Surflon SC-383, Surflon S-393, Surflon KH-40 (above, manufactured by ASAHI GLASS CO., LTD. ), PF636, PF656, PF6320, PF6520, PF7002 (manufactured by OMNOVA SOLUTIONS INC.), etc. As the fluorine-based surfactant, the compounds described in paragraphs 0015 to 0158 of JP 2015-117327 A can also be used. As the fluorine-based surfactant, a block polymer can also be used. As a specific example, for example, a compound described in JP 2011-89090 A can be cited. Fluorine-based surfactants can also preferably use the following fluorine-containing polymer compounds, which contain repeating units derived from (meth)acrylate compounds containing fluorine atoms and two or more (5 or more are preferred) ) Repeating units of (meth)acrylate compounds of alkoxyl groups (ethyleneoxy and propyleneoxy are preferred), and the following compounds are also exemplified as fluorine-based surfactants that can be used in the present invention.

[化學式19]

Figure 02_image037
[Chemical formula 19]
Figure 02_image037

上述化合物的重量平均分子量為3,000~50,000為較佳,例如為14,000。 並且,還能夠將在側鏈含有烯屬不飽和基之含氟聚合物用作氟系界面活性劑。作為具體例,可舉出日本特開2010-164965號公報0050~0090段落及0289~0295段落中記載之化合物,例如DIC CORPORATION製造的Megafac RS-101、RS-102、RS-718K、RS-72-K等。The weight average molecular weight of the above compound is preferably 3,000 to 50,000, for example, 14,000. In addition, a fluorine-containing polymer containing an ethylenically unsaturated group in the side chain can also be used as a fluorine-based surfactant. Specific examples include the compounds described in paragraphs 0050 to 0090 and paragraphs 0289 to 0295 of JP 2010-164965 A, such as Megafac RS-101, RS-102, RS-718K, RS-72 manufactured by DIC CORPORATION -K etc.

作為非離子系界面活性劑,具體而言,可舉出甘油、三羥甲基丙烷、三羥甲基乙烷以及該些的乙氧基化物及丙氧基化物(例如,甘油丙氧基化物、甘油乙氧基化物等)、聚氧乙烯月桂基醚、聚氧乙烯硬脂醚、聚氧乙烯油基醚、聚氧乙烯辛基苯基醚、聚氧乙烯壬基苯基醚、聚乙二醇二月桂酸酯、聚乙二醇二硬脂酸酯、脫水山梨醇脂肪酸酯(BASF公司製造的Pluronic L10、L31、L61、L62、10R5、17R2、25R2、TETRONIC 304、701、704、901、904、150R1)、SOLSPERSE 20000(The Lubrizol corporatin製造)等。並且,還能夠使用Wako Pure Chemical Industries, Ltd.製造的NCW-101、NCW-1001、NCW-1002。Specific examples of nonionic surfactants include glycerin, trimethylolpropane, trimethylolethane, and ethoxylates and propoxylates of these (for example, glycerol propoxylate). , Glycerol ethoxylates, etc.), polyoxyethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene oleyl ether, polyoxyethylene octyl phenyl ether, polyoxyethylene nonyl phenyl ether, polyethylene Glycol dilaurate, polyethylene glycol distearate, sorbitan fatty acid ester (Pluronic L10, L31, L61, L62, 10R5, 17R2, 25R2, TETRONIC 304, 701, 704, manufactured by BASF 901, 904, 150R1), SOLSPERSE 20000 (manufactured by The Lubrizol corporatin), etc. In addition, NCW-101, NCW-1001, NCW-1002 manufactured by Wako Pure Chemical Industries, Ltd. can also be used.

作為陽離子系界面活性劑,具體而言,可舉出酞菁衍生物(商品名:EFKA-745、MORISHITA & CO., LTD.製造)、有機矽氧烷聚合物KP341(Shin-Etsu Chemical Co., Ltd.製造)、(甲基)丙烯酸系(共)聚合物Polyflow No.75、No.90、No.95(KYOEISHA CHEMICAL CO., LTD製造)、W001(Yusho Co Ltd製造)等。Specific examples of the cationic surfactant include phthalocyanine derivatives (trade name: EFKA-745, manufactured by MORISHITA & CO., LTD.) and organosiloxane polymer KP341 (Shin-Etsu Chemical Co. , Ltd.), (meth)acrylic (co)polymer Polyflow No.75, No.90, No.95 (manufactured by KYOEISHA CHEMICAL CO., LTD), W001 (manufactured by Yusho Co Ltd), etc.

作為陰離子系界面活性劑,具體而言,可舉出W004、W005、W017(Yusho Co Ltd製造)、Sandetto BL(Sanyo Chemical Industries, Ltd.製造)等。Specific examples of the anionic surfactant include W004, W005, W017 (manufactured by Yusho Co Ltd), Sandetto BL (manufactured by Sanyo Chemical Industries, Ltd.), and the like.

作為矽酮系界面活性劑,例如,可舉出Toray Silicone DC3PA、Toray Silicone SH7PA、Toray Silicone DC11PA、Toray Silicone SH21PA、Toray Silicone SH28PA、Toray Silicone SH29PA、Toray Silicone SH30PA、Toray Silicone SH8400(以上,Dow Corning Toray CO., LTD.製造)、TSF-4440、TSF-4300、TSF-4445、TSF-4460、TSF-4452(以上,Momentive Performance Materials Inc.製造)、KP341、KF6001、KF6002(以上,Shin-Etsu Chemical Co., Ltd.製造)、BYK307、BYK323、BYK330(以上,BYK Additives & Instruments製造)等。Examples of silicone-based surfactants include Toray Silicone DC3PA, Toray Silicone SH7PA, Toray Silicone DC11PA, Toray Silicone SH21PA, Toray Silicone SH28PA, Toray Silicone SH29PA, Toray Silicone SH30PA, Toray Silicone SH8400 (above, Dow Corning Toray CO., LTD.), TSF-4440, TSF-4300, TSF-4445, TSF-4460, TSF-4452 (above, manufactured by Momentive Performance Materials Inc.), KP341, KF6001, KF6002 (above, Shin-Etsu Chemical Co., Ltd.), BYK307, BYK323, BYK330 (above, manufactured by BYK Additives & Instruments), etc.

界面活性劑可僅使用1種,亦可組合2種以上。界面活性劑的含量相對於本發明的組成物的總固體成分,0.001~2.0質量%為較佳,0.005~1.0質量%為更佳。Surfactant may use only 1 type, and may combine 2 or more types. The content of the surfactant relative to the total solid content of the composition of the present invention is preferably 0.001 to 2.0% by mass, more preferably 0.005 to 1.0% by mass.

<著色劑> 上述組成物可含有含金屬氮化物的粒子以外的著色劑(以下,還簡單稱作“著色劑”。)。 著色劑例如為了調整組成物的色度而使用,能夠在OD(Optical Density)值不下降之範圍內,將含金屬氮化物的粒子的一部分替換為著色劑。作為該種著色劑,可舉出顔料(黑色有機顏料及彩色有機顏料以及無機顏料)及染料等。<Coloring agent> The above-mentioned composition may contain a coloring agent other than the metal nitride-containing particles (hereinafter, also simply referred to as "coloring agent"). The colorant is used, for example, to adjust the chromaticity of the composition, and it is possible to replace part of the metal nitride-containing particles with the colorant within a range where the OD (Optical Density) value does not decrease. Examples of such coloring agents include pigments (black organic pigments, colored organic pigments, and inorganic pigments), dyes, and the like.

(顏料) 作為顔料,並無特別限制,能夠使用公知的顏料。作為彩色有機顏料,例如可舉出:染料索引(C.I.)顏料黃1,2,3,4,5,6,10,11,12,13,14,15,16,17,18,20,24,31,32,34,35,35:1,36,36:1,37,37:1,40,42,43,53,55,60,61,62,63,65,73,74,77,81,83,86,93,94,95,97,98,100,101,104,106,108,109,110,113,114,115,116,117,118,119,120,123,125,126,127,128,129,137,138,139,147,148,150,151,152,153,154,155,156,161,162,164,166,167,168,169,170,171,172,173,174,175,176,177,179,180,181,182,185,187,188,193,194,199,213,214等; C.I.顏料橙 2,5,13,16,17:1,31,34,36,38,43,46,48,49,51,52,55,59,60,61,62,64,71,73等; C.I.顏料紅 1,2,3,4,5,6,7,9,10,14,17,22,23,31,38,41,48:1,48:2,48:3,48:4,49,49:1,49:2,52:1,52:2,53:1,57:1,60:1,63:1,66,67,81:1,81:2,81:3,83,88,90,105,112,119,122,123,144,146,149,150,155,166,168,169,170,171,172,175,176,177,178,179,184,185,187,188,190,200,202,206,207,208,209,210,216,220,224,226,242,246,254,255,264,270,272,279等; C.I.顏料綠 7,10,36,37,58,59等; C.I.顏料紫 1,19,23,27,32,37,42等; C.I.顏料藍 1,2,15,15:1,15:2,15:3,15:4,15:6,16,22,60,64,66,79,80等。(Pigment) There is no restriction|limiting in particular as a pigment, A well-known pigment can be used. Examples of color organic pigments include: Dye Index (CI) Pigment Yellow 1, 2, 3, 4, 5, 6, 10, 11, 12, 13, 14, 15, 16, 17, 18, 20, 24 , 31, 32, 34, 35, 35: 1, 36, 36: 1, 37, 37: 1, 40, 42, 43, 53, 55, 60, 61, 62, 63, 65, 73, 74, 77 , 81, 83, 86, 93, 94, 95, 97, 98, 100, 101, 104, 106, 108, 109, 110, 113, 114, 115, 116, 117, 118, 119, 120, 123, 125 , 126,127,128,129,137,138,139,147,148,150,151,152,153,154,155,156,161,162,164,166,167,168,169,170,171 , 172,173,174,175,176,177,179,180,181,182,185,187,188,193,194,199,213,214 etc.; CI Pigment Orange 2,5,13,16,17 : 1, 31, 34, 36, 38, 43, 46, 48, 49, 51, 52, 55, 59, 60, 61, 62, 64, 71, 73 etc.; CI Pigment Red 1, 2, 3, 4 ,5,6,7,9,10,14,17,22,23,31,38,41,48:1,48:2,48:3,48:4,49,49:1,49:2 , 52:1, 52:2, 53:1, 57:1, 60:1, 63:1, 66, 67, 81:1, 81:2, 81:3, 83, 88, 90, 105, 112 , 119, 122, 123, 144, 146, 149, 150, 155, 166, 168, 169, 170, 171, 172, 175, 176, 177, 178, 179, 184, 185, 187, 188, 190, 200 , 202,206,207,208,209,210,216,220,224,226,242,246,254,255,264,270,272,279 etc.; CI Pigment Green 7,10,36,37,58 ,59 etc.; CI Pigment Violet 1,19,23,27,32,37,42 etc.; CI Pigment Blue 1,2,15,15:1,15:2,15:3,15:4,15:6 , 16, 22, 60, 64, 66, 79, 80 etc.

並且,作為綠色顔料,還能夠使用分子中的鹵原子數為平均10~14個、溴原子為平均8~12個、氯原子為平均2~5個之鹵化鋅酞菁顔料。作為具體例,可舉出國際公開第2015/118720號中記載之化合物。 該些有機顔料可單獨或者為了提高顏色純度而組合複數種來使用。In addition, as a green pigment, it is also possible to use a halogenated zinc phthalocyanine pigment having an average of 10 to 14 halogen atoms, an average of 8 to 12 bromine atoms, and an average of 2 to 5 chlorine atoms in the molecule. As a specific example, the compound described in International Publication No. 2015/118720 can be mentioned. These organic pigments can be used alone or in combination of plural kinds in order to improve color purity.

黑色顔料能夠使用各種公知的黑色顔料。例如,可舉出碳黑和/或以下示出之含黑色金屬有機顏料。作為含黑色金屬有機顏料,可舉出包含選自含有Co、Cr、Cu、Mn,Ru、Fe、Ni、Sn、Ti及Ag所組成的群組中的1種或2種以上的金屬元素之金屬氧化物。該些能夠僅使用1種,並且,還能夠作為2種以上的混合物來使用。並且,可藉由對黑色顔料進一步組合其他色調的無機顔料,製備成具有所希望的遮光性。作為可組合來使用之具體的無機顔料的例子,例如,可舉出鋅白、鉛白、鋅鋇白、氧化鈦、氧化鉻、氧化鐵、沉降性硫酸鋇及重晶石粉、鉛紅、氧化鐵紅、鉻黃、鋅黃(鋅黃1種、鋅黃2種)、群青藍、普魯士藍(亞鐵氰化鐵鉀)鋯石灰色、鐠黃、鉻鈦黃、鉻綠、孔雀、維多利亞綠、鐵藍(與普魯士藍無關)、釩鋯藍、鉻錫紅、錳紅、橙紅等。尤其,為了顯現紫外至紅外的較廣的波長域中的遮光性,不僅能夠單獨使用該些黑色顔料或其他色調,亦可混合複數種顔料來使用。As the black pigment, various well-known black pigments can be used. For example, carbon black and/or black metal-containing organic pigments shown below can be cited. Examples of black metal-containing organic pigments include those containing one or more metal elements selected from the group consisting of Co, Cr, Cu, Mn, Ru, Fe, Ni, Sn, Ti, and Ag. Metal oxide. These can be used only 1 type, and can also be used as a mixture of 2 or more types. In addition, it can be prepared to have desired light-shielding properties by further combining inorganic pigments of other colors with black pigments. Examples of specific inorganic pigments that can be used in combination include zinc white, lead white, lithopone, titanium oxide, chromium oxide, iron oxide, precipitating barium sulfate and barite powder, lead red, oxide Iron red, chrome yellow, zinc yellow (1 zinc yellow, 2 zinc yellow), ultramarine blue, Prussian blue (potassium ferrocyanide) zircon gray, yellow yellow, chrome titanium yellow, chrome green, peacock, Victoria Green, iron blue (not related to Prussian blue), vanadium zirconium blue, chrome tin red, manganese red, orange red, etc. In particular, in order to express light-shielding properties in a wide wavelength range from ultraviolet to infrared, not only these black pigments or other colors can be used alone, but also plural kinds of pigments can be mixed and used.

黑色顔料的平均一次粒徑為5nm以上為較佳,10nm以上為更佳。從相同的觀點考慮,作為上限,10μm以下為較佳,1μm以下為更佳,100nm以下為進一步較佳。黑色顏料的平均一次粒徑表示藉由與含金屬氮化物的粒子的平均一次粒徑相同的方法測定之平均一次粒徑。The average primary particle size of the black pigment is preferably 5 nm or more, and more preferably 10 nm or more. From the same viewpoint, as the upper limit, 10 μm or less is preferable, 1 μm or less is more preferable, and 100 nm or less is more preferable. The average primary particle size of the black pigment means the average primary particle size measured by the same method as the average primary particle size of the metal nitride-containing particles.

(染料) 作為染料,例如可使用日本特開昭64-90403號公報、日本特開昭64-91102號公報、日本特開平1-94301號公報、日本特開平6-11614號公報、日本特登2592207號、美國專利4808501號說明書、美國專利5667920號說明書、美國專利505950號說明書、日本特開平5-333207號公報、日本特開平6-35183號公報、日本特開平6-51115號公報及日本特開平6-194828號公報等中公開之色素。若作為化學結構予以區分,則能夠使用吡唑偶氮化合物、吡咯亞甲基化合物、苯胺偶氮化合物、三苯甲烷化合物、蒽醌化合物、亞苄基化合物、氧雜菁(oxonol)化合物、吡唑並三唑偶氮化合物、吡啶酮偶氮化合物、花青化合物、啡噻嗪化合物及吡咯並吡唑甲亞胺化合物等。並且,作為染料,可使用色素多聚體。作為色素多聚體,可舉出日本特開2011-213925號公報及日本特開2013-041097號公報中記載之化合物。(Dyes) As dyes, for example, Japanese Patent Application Publication No. 64-90403, Japanese Patent Application Publication No. 64-91102, Japanese Patent Application Publication No. 1-94301, Japanese Patent Application Publication No. 6-11614, Japanese Patent Publication No. 2592207, U.S. Patent No. 4808501, U.S. Patent No. 5,669,920, U.S. Patent No. 505,950, Japanese Patent Application Publication No. 5-333207, Japanese Patent Application Publication No. 6-35183, Japanese Patent Application Publication No. 6-51115, and Japanese Patent The pigment disclosed in Kaihei 6-194828 Bulletin. If distinguished as a chemical structure, pyrazole azo compounds, pyrrole methylene compounds, aniline azo compounds, triphenylmethane compounds, anthraquinone compounds, benzylidene compounds, oxonol compounds, pyrazole compounds can be used Azolotriazole azo compounds, pyridone azo compounds, cyanine compounds, phenothiazine compounds, pyrrolopyrazole azomethine compounds, etc. In addition, as the dye, a dye multimer can be used. Examples of the dye multimer include compounds described in Japanese Patent Application Publication No. 2011-213925 and Japanese Patent Application Publication No. 2013-041097.

上述組成物可除了著色劑以外,還依據需要包含體質顏料。作為該種體質顏料,例如能夠舉出硫酸鋇、碳酸鋇、碳酸鈣、二氧化矽、鹼性碳酸鎂、矾土白、光澤白、鈦白及水滑石等。該些體質顏料能夠單獨使用或混合2種以上來使用。體質顏料的使用量相對於著色劑100質量份,通常為0~100質量份,5~50質量份為較佳,10~40質量份為更佳。著色劑及體質顏料能夠藉由聚合物對其表面進行改質來使用。The above-mentioned composition may contain extender pigments as needed in addition to the colorant. Examples of such extender pigments include barium sulfate, barium carbonate, calcium carbonate, silica, basic magnesium carbonate, alumina white, gloss white, titanium white, hydrotalcite, and the like. These extender pigments can be used alone or in mixture of two or more kinds. The use amount of the extender pigment is usually 0-100 parts by mass relative to 100 parts by mass of the colorant, preferably 5-50 parts by mass, and more preferably 10-40 parts by mass. Colorants and extender pigments can be used by modifying their surfaces with polymers.

著色劑可單獨使用1種,亦可倂用2種以上。作為著色劑,可含有紅色、藍色、黃色、綠色及紫色等著色有機顔料。倂用遮光性顔料(具體而言,含金屬氮化物的粒子)與著色有機顔料時,相對於遮光性顔料,使用1~40質量%的著色有機顔料為較佳。從調整色調之觀點考慮,倂用紅色顔料與遮光性顔料為較佳,雖並無特別限定,但作為紅色顔料,顏料紅254為較佳。並且,從提高遮光性之觀點考慮,倂用黄色顔料與遮光性顔料為較佳,雖然並無特別限定,但作為黄色顔料,顏料黃150為較佳。The coloring agent may be used singly, or two or more kinds may be used. As a coloring agent, coloring organic pigments, such as red, blue, yellow, green, and purple, can be contained. When using light-shielding pigments (specifically, metal nitride-containing particles) and coloring organic pigments, it is preferable to use 1-40% by mass of the coloring organic pigments relative to the light-shielding pigments. From the viewpoint of adjusting the color tone, a red pigment and a light-shielding pigment are preferable. Although not particularly limited, as the red pigment, Pigment Red 254 is preferable. In addition, from the viewpoint of improving light-shielding properties, yellow pigments and light-shielding pigments are preferred. Although not particularly limited, as the yellow pigment, Pigment Yellow 150 is preferred.

上述組成物含有著色劑時,著色劑的含量相對於組成物的總固體成分,20~80質量%為較佳,30~70質量%為更佳,35~60質量%為進一步較佳。When the composition contains a coloring agent, the content of the coloring agent relative to the total solid content of the composition is preferably 20 to 80% by mass, more preferably 30 to 70% by mass, and more preferably 35 to 60% by mass.

<顔料衍生物> 上述組成物能夠含有顔料衍生物。作為顔料衍生物,例如,可舉出含有藉由酸性基、鹼性基或鄰苯二甲酸亞胺甲基取代有機顏料的一部分之結構之化合物。 作為用於構成顔料衍生物之有機顔料,可舉出二氧代吡咯并吡咯系顔料、偶氮系顔料、酞菁系顔料、蒽醌系顔料、喹吖啶酮系顔料、二噁嗪系顔料、紫環酮系顔料、苝系顔料、硫靛系顔料、異吲哚啉系顔料、異吲哚啉酮系顔料、喹酞酮系顔料、士林系顔料及金屬絡合物系顔料等。 並且,作為顔料衍生物所含有之酸性基,磺酸基、羧酸基及其四級銨鹽基為較佳,羧酸基及磺酸基為進一步較佳,磺酸基尤為佳。作為顔料衍生物所含有之鹼性基,胺基為較佳,三級胺基為更佳。 作為顔料衍生物的具體例,例如,可舉出下述化合物。並且,可參閱日本特開2011-252065號公報的段落0162~0183的記載,該內容引入本說明書中。<Pigment Derivatives> The above-mentioned composition can contain a pigment derivative. As the pigment derivative, for example, a compound having a structure in which a part of an organic pigment is substituted by an acidic group, a basic group, or a phthalic iminomethyl group. Examples of organic pigments used to form pigment derivatives include dioxopyrrolopyrrole-based pigments, azo-based pigments, phthalocyanine-based pigments, anthraquinone-based pigments, quinacridone-based pigments, and dioxazine-based pigments. , Perylene pigments, perylene pigments, thioindigo pigments, isoindoline pigments, isoindolinone pigments, quinophthalone pigments, Shilin pigments, metal complex pigments, etc. In addition, as the acidic group contained in the pigment derivative, a sulfonic acid group, a carboxylic acid group, and a quaternary ammonium salt group thereof are preferable, the carboxylic acid group and the sulfonic acid group are more preferable, and the sulfonic acid group is particularly preferable. As the basic group contained in the pigment derivative, an amine group is preferred, and a tertiary amine group is more preferred. As a specific example of a pigment derivative, the following compounds can be mentioned, for example. In addition, the description of paragraphs 0162 to 0183 of JP 2011-252065 A can be referred to, and this content is incorporated into this specification.

[化學式20]

Figure 02_image039
[Chemical formula 20]
Figure 02_image039

上述組成物含有顔料衍生物時,顔料衍生物的含量相對於著色劑的總質量,1~30質量%為較佳,3~20質量%為進一步較佳。上述組成物可僅包含1種顔料衍生物,亦可含有2種以上。含有2種以上時,其總計量成為上述範圍為較佳。When the above composition contains a pigment derivative, the content of the pigment derivative relative to the total mass of the colorant is preferably 1-30% by mass, and more preferably 3-20% by mass. The above-mentioned composition may contain only one type of pigment derivative, or may contain two or more types. When two or more types are contained, the total amount thereof is preferably in the above-mentioned range.

<矽烷偶聯劑> 矽烷偶聯劑係指在分子中含有水解性基團及其以外的官能基之化合物。另外,烷氧基等水解性基團與矽原子鍵結。 水解性基團係指,與矽原子直接鍵結,並且可藉由水解反應和/或縮合反應生成矽氧烷鍵之取代基。作為水解性基團,例如,可舉出鹵原子、烷氧基、醯氧基及烯氧基。水解性基團含有碳原子時,其碳原子數為6以下為較佳,4以下為更佳。碳原子數4以下的烷氧基或碳原子數4以下的烯氧基尤為佳。 並且,在基板上形成硬化膜時,為了提高基板與硬化膜之間的黏附性,矽烷偶聯劑不包含氟原子及矽原子(其中,水解性基團所鍵結之矽原子除外)為較佳,不包含氟原子、矽原子(其中,水解性基團所鍵結之矽原子除外)、被矽原子取代之伸烷基、碳原子數8以上的直鏈烷基及碳原子數3以上的支鏈烷基為較佳。<Silane coupling agent> Silane coupling agent refers to a compound containing a hydrolyzable group and other functional groups in the molecule. In addition, a hydrolyzable group such as an alkoxy group is bonded to a silicon atom. The hydrolyzable group refers to a substituent that is directly bonded to a silicon atom and can generate a siloxane bond through a hydrolysis reaction and/or condensation reaction. Examples of the hydrolyzable group include a halogen atom, an alkoxy group, an alkoxy group, and an alkenoxy group. When the hydrolyzable group contains carbon atoms, the number of carbon atoms is preferably 6 or less, and more preferably 4 or less. An alkoxy group having 4 or less carbon atoms or an alkenyloxy group having 4 or less carbon atoms is particularly preferred. In addition, when the cured film is formed on the substrate, in order to improve the adhesion between the substrate and the cured film, the silane coupling agent does not contain fluorine atoms and silicon atoms (except for the silicon atoms bonded by hydrolyzable groups). Preferably, it does not contain fluorine atoms, silicon atoms (excluding silicon atoms bonded by hydrolyzable groups), alkylene groups substituted by silicon atoms, straight-chain alkyl groups with 8 or more carbon atoms, and 3 or more carbon atoms The branched alkyl group is preferred.

矽烷偶聯劑含有以以下的式(Z)表示之基團為較佳。*表示鍵結位置。 式(Z)*-Si-(RZ13 式(Z)中,RZ1 表示水解性基團,其定義如上述。The silane coupling agent preferably contains a group represented by the following formula (Z). * Indicates the position of the bond. Formula (Z)*-Si-(R Z1 ) 3 In formula (Z), R Z1 represents a hydrolyzable group, and its definition is as described above.

矽烷偶聯劑含有選自由(甲基)丙烯醯氧基、環氧基及氧雜環丁基所組成的群組中的1種以上的硬化性官能基為較佳。硬化性官能基可直接與矽原子鍵結,亦可經由連結基與矽原子鍵結。 另外,作為上述矽烷偶聯劑中包含之硬化性官能基的較佳態樣,還可舉出自由基聚合性基團。The silane coupling agent preferably contains one or more curable functional groups selected from the group consisting of (meth)acryloxy groups, epoxy groups, and oxetanyl groups. The hardenable functional group can be directly bonded to the silicon atom, or can be bonded to the silicon atom via a linking group. Moreover, as a preferable aspect of the curable functional group contained in the said silane coupling agent, a radical polymerizable group can also be mentioned.

矽烷偶聯劑的分子量並無特別限制,從操作性觀點考慮,100~1000的情況較多,270以上為較佳,270~1000為更佳。The molecular weight of the silane coupling agent is not particularly limited. From the viewpoint of operability, it is often 100 to 1,000, preferably 270 or more, and more preferably 270 to 1,000.

作為矽烷偶聯劑的較佳態樣之一,可舉出以式(W)表示之矽烷偶聯劑X。 式(W) RZ2 -Lz-Si-(RZ13 Rz1 表示水解性基團,定義如上述。 Rz2 表示硬化性官能基,定義如上述,較佳範圍亦如上述。 Lz表示單鍵或2價的連結基。Lz表示2價的連結基時,作為2價的連結基,可舉出鹵原子可取代之伸烷基、鹵原子可取代之伸芳基、-NR12 -、-CONR12 -、-CO-、-CO2 -、SO2 NR12 -、-O-、-S-、-SO2 -或該些的組合。其中,選自由碳原子數2~10的鹵原子可取代之伸烷基及碳原子數6~12的鹵原子可取代之伸芳基所組成的群組中的至少1種、或包含該些基團與選自由-NR12 -、-CONR12 -、-CO-、-CO2 -、SO2 NR12 -、-O-、-S-及SO2 -所組成的群組中的至少1種基團的組合之基團為較佳,包含碳原子數2~10的鹵原子可取代之伸烷基、-CO2 -、-O-、-CO-、-CONR12 -或該些基團的組合之基團為更佳。其中,上述R12 表示氫原子或甲基。As one of the preferred aspects of the silane coupling agent, a silane coupling agent X represented by the formula (W) can be cited. Formula (W) R Z2 -Lz-Si-(R Z1 ) 3 R z1 represents a hydrolyzable group, and is defined as described above. R z2 represents a curable functional group, which is defined as described above, and the preferred range is also the same as described above. Lz represents a single bond or a divalent linking group. When Lz represents a divalent linking group, examples of the divalent linking group include an alkylene group substituted with a halogen atom, an aryl group substituted with a halogen atom, -NR 12 -, -CONR 12 -, -CO- , -CO 2 -, SO 2 NR 12 -, -O-, -S-, -SO 2 -or a combination of these. Among them, at least one selected from the group consisting of an alkylene group substituted with a halogen atom having 2 to 10 carbon atoms and an arylene group substituted with a halogen atom having 6 to 12 carbon atoms, or includes these Group and at least 1 selected from the group consisting of -NR 12 -, -CONR 12 -, -CO-, -CO 2 -, SO 2 NR 12 -, -O-, -S- and SO 2- Combinations of these groups are preferred, including alkylene groups that can be substituted with a halogen atom having 2 to 10 carbon atoms, -CO 2 -, -O- , -CO-, -CONR 12 -or these groups The combination of groups is more preferable. Here, the above-mentioned R 12 represents a hydrogen atom or a methyl group.

作為矽烷偶聯劑X,可舉出N-β-胺乙基-γ-胺丙基-甲基二甲氧基矽烷(Shin-Etsu Chemical Co., Ltd.製商品名 KBM-602)、N-β-胺乙基-γ-胺丙基-三甲氧基矽烷(Shin-Etsu Chemical Co., Ltd.製商品名 KBM-603)、N-β-胺乙基-γ-胺丙基-三乙氧基矽烷(Shin-Etsu Chemical Co., Ltd.製造商品名 KBE-602)、γ-胺丙基-三甲氧基矽烷(Shin-Etsu Chemical Co., Ltd.製造商品名 KBM-903)、γ-胺丙基-三乙氧基矽烷(Shin-Etsu Chemical Co., Ltd.製造商品名 KBE-903)、3-甲基丙烯醯氧基丙基三甲氧基矽烷(Shin-Etsu Chemical Co., Ltd.製造商品名 KBM-503)及環氧丙氧基辛基三甲氧基矽烷(Shin-Etsu Chemical Co., Ltd.製造商品名 KBM-4803)等。Examples of the silane coupling agent X include N-β-aminoethyl-γ-aminopropyl-methyldimethoxysilane (trade name KBM-602 manufactured by Shin-Etsu Chemical Co., Ltd.), N -β-aminoethyl-γ-aminopropyl-trimethoxysilane (trade name KBM-603 manufactured by Shin-Etsu Chemical Co., Ltd.), N-β-aminoethyl-γ-aminopropyl-tri Ethoxysilane (trade name KBE-602 manufactured by Shin-Etsu Chemical Co., Ltd.), γ-aminopropyl-trimethoxysilane (trade name KBM-903 manufactured by Shin-Etsu Chemical Co., Ltd.), γ-aminopropyl-triethoxysilane (trade name KBE-903 manufactured by Shin-Etsu Chemical Co., Ltd.), 3-methacryloxypropyl trimethoxysilane (Shin-Etsu Chemical Co., Ltd.) , Ltd. manufactures trade name KBM-503) and glycidoxy octyl trimethoxysilane (Shin-Etsu Chemical Co., Ltd. manufactures trade name KBM-4803) and so on.

作為矽烷偶聯劑的其他較佳態樣,可舉出在分子內至少具有矽原子、氮原子、硬化性官能基,且含有與矽原子鍵結之水解性基團之矽烷偶聯劑Y。 該矽烷偶聯劑Y在分子內具有至少1個矽原子即可,矽原子能夠與以下的原子、取代基鍵結。該些可以係相同的原子、取代基,亦可不同。可鍵結之原子、取代基可舉出氫原子、鹵原子、羥基、碳原子數1至20的烷基、烯基、炔基、芳基、可用烷基和/或芳基取代之胺基、甲矽烷基、碳原子數1至20的烷氧基、芳氧基等。該些取代基可進一步被甲矽烷基、烯基、炔基、芳基、烷氧基、芳氧基、硫代烷氧基、可用烷基和/或芳基取代之胺基、鹵原子、磺醯胺基、烷氧基羰基、醯胺基、尿素基、銨基、烷基銨基、羧酸基或其鹽、磺基或其鹽等。 另外,矽原子上鍵結有至少1個水解性基團。水解性基團的定義如上述。 矽烷偶聯劑Y中可包含以式(Z)表示之基團。As another preferred aspect of the silane coupling agent, a silane coupling agent Y having at least a silicon atom, a nitrogen atom, and a hardenable functional group in the molecule and containing a hydrolyzable group bonded to the silicon atom can be mentioned. The silane coupling agent Y only needs to have at least one silicon atom in the molecule, and the silicon atom can bond with the following atoms and substituents. These may be the same atom, substituent or different. Examples of bondable atoms and substituents include hydrogen atoms, halogen atoms, hydroxyl groups, alkyl groups having 1 to 20 carbon atoms, alkenyl groups, alkynyl groups, aryl groups, and amine groups that can be substituted with alkyl and/or aryl groups. , Silyl group, alkoxy group having 1 to 20 carbon atoms, aryloxy group, etc. These substituents may be further substituted by silyl, alkenyl, alkynyl, aryl, alkoxy, aryloxy, thioalkoxy, amine groups that can be substituted with alkyl and/or aryl groups, halogen atoms, Sulfonamide group, alkoxycarbonyl group, amide group, urea group, ammonium group, alkylammonium group, carboxylic acid group or its salt, sulfo group or its salt, etc. In addition, at least one hydrolyzable group is bonded to the silicon atom. The definition of the hydrolyzable group is as described above. The silane coupling agent Y may contain a group represented by formula (Z).

矽烷偶聯劑Y在分子內具有至少1個以上的氮原子,氮原子以2級胺基或者3級胺基的形態存在為較佳,亦即,氮原子作為取代基含有至少1個有機基團為較佳。另外,作為胺基的結構,可以以含氮雜環的部分結構的形態存在於分子內,亦可作為苯胺等取代胺基存在。 其中,作為有機基團,可舉出烷基、烯基、炔基、芳基或該些的組合。該些可進一步具有取代基,作為可導入之取代基,可舉出甲矽烷基、烯基、炔基、芳基、烷氧基、芳氧基、硫代烷氧基、胺基、鹵原子、磺醯胺基、烷氧基羰基、羰基氧基、醯胺基、尿素基、伸烷氧基銨基、烷基銨基、羧酸基或其鹽、磺基等。 並且,氮原子經由任意的有機連結基與硬化性官能基鍵結為較佳。作為較佳之有機連結基,可舉出可導入到上述氮原子及與其鍵結之有機基團之取代基。Silane coupling agent Y has at least one nitrogen atom in the molecule. The nitrogen atom is preferably in the form of a secondary or tertiary amino group, that is, the nitrogen atom contains at least one organic group as a substituent. Group is better. In addition, the structure of the amino group may exist in the molecule in the form of a partial structure of a nitrogen-containing heterocyclic ring, or may exist as a substituted amino group such as aniline. Among them, examples of the organic group include an alkyl group, an alkenyl group, an alkynyl group, an aryl group, or a combination of these. These may further have substituents. Examples of the substituents that can be introduced include silyl groups, alkenyl groups, alkynyl groups, aryl groups, alkoxy groups, aryloxy groups, thioalkoxy groups, amino groups, and halogen atoms. , Sulfonamide group, alkoxycarbonyl group, carbonyloxy group, amide group, urea group, alkoxy ammonium group, alkyl ammonium group, carboxylic acid group or its salt, sulfo group, etc. In addition, the nitrogen atom is preferably bonded to the curable functional group via any organic linking group. As a preferable organic linking group, the substituent which can be introduced into the above-mentioned nitrogen atom and the organic group bonded to it can be mentioned.

矽烷偶聯劑Y中包含之硬化性官能基的定義如上述,較佳範圍亦如上述。 矽烷偶聯劑Y中,在一分子中可以具有至少1個以上的硬化性官能基,但亦可取含有2個以上的硬化性官能基之態樣,從靈敏度、穩定性的觀點考慮,含有2~20個硬化性官能基為較佳,含有4~15個為更佳,在分子內含有6~10個硬化性官能基為進一步較佳。The definition of the curable functional group contained in the silane coupling agent Y is as described above, and the preferred range is also the same as described above. Silane coupling agent Y may have at least one hardenable functional group in one molecule, but it may also contain two or more hardenable functional groups. From the viewpoint of sensitivity and stability, 2 It is preferable to have -20 hardenable functional groups, more preferably 4 to 15 hardenable functional groups are contained, and it is still more preferable to have 6-10 hardenable functional groups in the molecule.

矽烷偶聯劑X及矽烷偶聯劑Y的分子量並無特別限制,可舉出上述範圍(270以上為較佳)。The molecular weights of the silane coupling agent X and the silane coupling agent Y are not particularly limited, and can be in the above-mentioned range (270 or more is preferable).

上述組成物中的矽烷偶聯劑的含量相對於組成物中的總固體成分,0.1~10質量%為較佳,0.5~8質量%為更佳,1.0~6質量%為進一步較佳。The content of the silane coupling agent in the composition is preferably 0.1 to 10% by mass, more preferably 0.5 to 8% by mass, and still more preferably 1.0 to 6% by mass relative to the total solid content in the composition.

上述組成物可單獨包含1種矽烷偶聯劑,亦可包含2種以上。組成物含有2種以上的矽烷偶聯劑時,其總計在上述範圍內即可。The above composition may contain one type of silane coupling agent alone, or two or more types. When the composition contains two or more types of silane coupling agents, the total of them should be within the above-mentioned range.

<紫外線吸收劑> 上述組成物可含有紫外線吸收劑。藉此,能夠將硬化膜的圖案形狀設為更優異(精細)者。 作為紫外線吸收劑,能夠使用水楊酸鹽系、二苯甲酮系、苯并三唑系、取代丙烯腈系及三嗪系紫外線吸收劑。作為該些的具體例,能夠使用日本特開2012-068418號公報的段落0137~0142(對應之US2012/0068292的段落0251~0254)的化合物,能夠援用該些內容並引入本說明書中。 此外,二乙基胺基-苯基磺醯基系紫外線吸收劑(DAITO CHEMICAL CO., LTD.製造、商品名:UV-503)等亦可較佳地使用。 作為紫外線吸收劑,可舉出日本特開2012-32556號公報的段落0134~0148中例示之化合物。 紫外線吸收劑的含量相對於組成物的總固體成分,0.001~15質量%為較佳,0.01~10質量%為更佳,0.1~5質量%為進一步較佳。<Ultraviolet absorber> The above-mentioned composition may contain an ultraviolet absorber. Thereby, the pattern shape of the cured film can be made more excellent (fine). As the ultraviolet absorber, salicylate-based, benzophenone-based, benzotriazole-based, substituted acrylonitrile-based, and triazine-based ultraviolet absorbers can be used. As these specific examples, the compounds of paragraphs 0137 to 0142 (corresponding to paragraphs 0251 to 0254 of US2012/0068292) of JP 2012-068418 A can be used, and these contents can be incorporated into this specification. In addition, diethylamino-phenylsulfonyl-based ultraviolet absorbers (manufactured by DAITO CHEMICAL CO., LTD., trade name: UV-503) and the like can also be preferably used. Examples of the ultraviolet absorber include the compounds exemplified in paragraphs 0134 to 0148 of JP 2012-32556 A. The content of the ultraviolet absorber is preferably 0.001 to 15% by mass relative to the total solid content of the composition, more preferably 0.01 to 10% by mass, and still more preferably 0.1 to 5% by mass.

<聚合抑制劑> 上述組成物可含有聚合抑制劑。作為聚合抑制劑,可舉出對苯二酚、對甲氧基苯酚、二-第三丁基-對甲酚、鄰苯三酚 、第三丁基鄰苯二酚、對苯醌、4,4’-硫代雙(3-甲基-6-第三丁基苯酚)、2,2’-亞甲基雙(4-甲基-6-第三丁基苯酚)、N-亞硝基苯基羥基胺亞鈰鹽等。 聚合抑制劑的含量相對於組成物的總固體成分,0.01~5質量%為較佳。上述組成物可僅包含1種聚合抑制劑,亦可包含2種以上。含有2種以上時,其總計量成為上述範圍為較佳。 並且,可依據需要,為了防止氧引起之聚合阻礙,添加山嵛酸和/或山嵛酸醯胺等高級脂肪酸衍生物等,在塗佈之後的乾燥過程中使其局部存在於塗佈膜的表面。高級脂肪酸衍生物的含量相對於組成物的總固體成分,0.5~10質量%為較佳。<Polymerization inhibitor> The above-mentioned composition may contain a polymerization inhibitor. Examples of polymerization inhibitors include hydroquinone, p-methoxyphenol, di-tertiary butyl-p-cresol, pyrogallol, tertiary butylcatechol, p-benzoquinone, 4, 4'-thiobis(3-methyl-6-tertiary butylphenol), 2,2'-methylene bis(4-methyl-6-tertiary butylphenol), N-nitroso Phenylhydroxylamine cerium salt and the like. The content of the polymerization inhibitor is preferably 0.01 to 5% by mass relative to the total solid content of the composition. The said composition may contain only 1 type of polymerization inhibitor, and may contain 2 or more types. When two or more types are contained, the total amount thereof is preferably in the above-mentioned range. In addition, if necessary, in order to prevent polymerization inhibition caused by oxygen, higher fatty acid derivatives such as behenic acid and/or behenic acid amide can be added to make it locally present in the coating film during the drying process after coating. surface. The content of the higher fatty acid derivative is preferably 0.5 to 10% by mass relative to the total solid content of the composition.

除了上述成分以外,上述組成物中亦可進一步添加以下成分。例如,可舉出敏化劑、共敏化劑、交聯劑、硬化促進劑、填料、熱硬化促進劑、增塑劑、稀釋劑及感脂化劑等,而且,還可依據需要添加對基板表面的黏附促進劑及其他助劑類(例如,導電性粒子、填充劑、消泡劑、阻燃劑、流平劑、剝離促進劑、抗氧化劑、香料、界面張力調整劑及鏈轉移劑等)等公知的添加劑。 該些成分例如能夠參閱日本特開2012-003225號公報的段落號0183~0228(對應之美國專利申請公開第2013/0034812號說明書的<0237>~<0309>)、日本特開2008-250074號公報的段落號0101~0102、段落號0103~0104、段落號0107~0109及日本特開2013-195480號公報的段落號0159~0184等的記載,該些內容引入本申請說明書中。In addition to the above-mentioned components, the following components may be further added to the above-mentioned composition. For example, sensitizers, co-sensitizers, crosslinking agents, hardening accelerators, fillers, thermal hardening accelerators, plasticizers, diluents, and fat-sensitizing agents, etc. can be mentioned. Moreover, it can be added as needed. Adhesion promoters and other auxiliary agents on the substrate surface (for example, conductive particles, fillers, defoamers, flame retardants, leveling agents, peeling promoters, antioxidants, fragrances, interfacial tension regulators, and chain transfer agents Etc.) and other well-known additives. For these components, refer to paragraphs 0183 to 0228 of Japanese Patent Application Publication No. 2012-003225 (corresponding to <0237> to <0309> of the specification of US Patent Application Publication No. 2013/0034812) and Japanese Patent Application Publication No. 2008-250074 The descriptions of paragraph numbers 0101 to 0102, paragraph numbers 0103 to 0104, paragraph numbers 0107 to 0109, and paragraph numbers 0159 to 0184 of JP 2013-195480 A are incorporated into the specification of this application.

〔組成物的製造方法〕 上述組成物的製造方法含有以下的混合及分散製程。並且,含有靜置製程和/或過濾製程為更佳。以下,對各製程,對較佳態樣進行詳細說明。[Method for manufacturing composition] The method for manufacturing the above composition includes the following mixing and dispersion processes. In addition, it is more preferable to include a standing process and/or a filtration process. Hereinafter, the preferred aspects of each manufacturing process will be described in detail.

<混合及分散製程> 混合及分散製程係藉由公知的混合方法(例如,攪拌機、均質器、高壓乳化装置、濕式粉碎機及濕式分散機)混合上述成分來獲得組成物之製程。 混合及分散製程中,可集中配合構成組成物之各成分,亦可在將各成分溶解或分散於有機溶劑之後依次配合。並且,配合時的投入順序及作業條件並不特別受限。並且,混合及分散製程可含有製作分散液之製程。<Mixing and Dispersion Process> The mixing and dispersion process is a process in which the above-mentioned components are mixed by a known mixing method (for example, agitator, homogenizer, high-pressure emulsification device, wet grinder, and wet disperser) to obtain a composition. In the mixing and dispersing process, the components of the composition can be mixed together, or they can be mixed in sequence after dissolving or dispersing the components in an organic solvent. In addition, the order of input and working conditions at the time of cooperation are not particularly limited. In addition, the mixing and dispersion process may include a process for preparing a dispersion.

(製作分散液之製程) 製作分散液之製程係混合含金屬氮化物的粒子、分散劑與溶劑,藉由上述方法使含金屬氮化物的粒子分散來製作分散液之製程。能夠向所製作之分散液混合其餘的成分來製造組成物。 製作上述分散液之製程中,作為用於顔料的分散之機械力,可舉出壓縮、壓榨、衝擊、裁斷或氣蝕等。作為該些工藝的具體例,可舉出珠磨、砂磨、輥磨、高速葉輪、混砂、噴射流混合、高壓濕式微粒化及超聲波分散等。並且,能夠適當使用“分散技術大全、株式會社資訊機構發行、2005年7月15日”及“以懸浮液(suspension)(固/液分散系統)為中心之分散技術與工業應用的實際綜合資料集、經營開發中心r出版部發行、1978年10月10日”中記載之製程及分散機。 並且,在製作上述分散液之製程中,可進行基於鹽磨製程之顔料的微細化處理。用於鹽磨製程之原材料、設備及處理條件等例如能夠使用日本特開2015-194521號及日本特開2012-046629號中記載者。 並且,上述組成物的製造方法含有藉由熱電漿法獲得上述含金屬氮化物的粒子之製程為較佳。獲得含金屬氮化物的粒子之製程在混合上述各成分之前實施。基於熱電漿法之含金屬氮化物的粒子的具體的製造製程的態樣如上述。(Process for making dispersion) The process for making dispersion is a process of mixing metal nitride-containing particles, dispersant and solvent, and dispersing the metal nitride-containing particles by the above-mentioned method to make a dispersion. The remaining components can be mixed with the prepared dispersion to produce a composition. In the process of preparing the above dispersion, as the mechanical force used for the dispersion of the pigment, compression, squeezing, impact, cutting, or cavitation can be mentioned. Specific examples of these processes include bead milling, sand milling, roll milling, high-speed impeller, sand mixing, jet mixing, high-pressure wet micronization, and ultrasonic dispersion. In addition, it is possible to appropriately use the "Dispersion Technology Encyclopedia, issued by the Information Agency Co., Ltd., July 15, 2005" and "suspension (solid/liquid dispersion system)-centered dispersion technology and actual comprehensive data on industrial applications. The production process and dispersing machine recorded in the publishing department of the Collection and Management Development Center r, October 10, 1978. In addition, in the process of preparing the above-mentioned dispersion liquid, the miniaturization treatment of the pigment based on the salt milling process can be performed. The raw materials, equipment, and processing conditions used in the salt milling process can be those described in Japanese Patent Application Publication No. 2015-194521 and Japanese Patent Application Publication No. 2012-046629, for example. In addition, it is preferable that the manufacturing method of the above-mentioned composition includes a process of obtaining the above-mentioned metal nitride-containing particles by a thermoplasma method. The process of obtaining metal nitride-containing particles is carried out before mixing the above-mentioned components. The specific manufacturing process of the metal nitride-containing particles based on the thermoplasma method is as described above.

<靜置製程> 上述含金屬氮化物的粒子在供給至混合及分散製程、或製作分散液之製程之前,經過以下的靜置製程為較佳。 靜置製程係將藉由熱電漿法獲得之含金屬氮化物的粒子在其製造之後並不暴露於大氣,而是在氧濃度得到控制之密封容器內,靜置規定時間(12~72小時為較佳,12~48小時為更佳,12~24小時為進一步較佳)之製程。此時,密封容器內的水分的含量得到控制為更佳。<Standing Process> The above-mentioned metal nitride-containing particles are preferably subjected to the following standing process before being supplied to the mixing and dispersion process or the process of preparing a dispersion. The static process is to make the metal nitride-containing particles obtained by the thermoplasma method not be exposed to the atmosphere after its manufacture, but placed in a sealed container with controlled oxygen concentration for a predetermined time (12 to 72 hours is Preferably, 12 to 48 hours is more preferable, and 12 to 24 hours is further preferable). At this time, it is better to control the moisture content in the sealed container.

此時,密封容器內的氧(O2 )濃度及水分的含量分別為100ppm以下為較佳,10ppm以下為更佳,1ppm以下為進一步較佳。 密封容器內的氧(O2 )濃度及水分的含量能夠藉由調整供給至密封容器內之惰性氣體中的氧濃度及水分量來進行調整。作為惰性氣體,使用氮氣及氬氣為較佳,其中,使用氮氣為更佳。 若經過上述靜置製程,則含金屬氮化物的粒子的表面及晶界變得穩定。藉此,能夠抑制使用組成物來獲得之硬化膜的針孔的產生。 另外,上述靜置製程能夠被在含金屬氮化物的粒子的製造方法中說明之製程H替代,從組成物具有更優異之本發明的效果之角度考慮,藉由製程H代替為較佳。At this time, the oxygen (O 2 ) concentration and the moisture content in the sealed container are preferably 100 ppm or less, more preferably 10 ppm or less, and even more preferably 1 ppm or less. The oxygen (O 2 ) concentration and moisture content in the sealed container can be adjusted by adjusting the oxygen concentration and moisture content in the inert gas supplied into the sealed container. As the inert gas, nitrogen and argon are preferable, and among them, nitrogen is more preferable. After the above-mentioned standing process, the surface and grain boundary of the metal nitride-containing particles become stable. Thereby, it is possible to suppress the occurrence of pinholes in the cured film obtained by using the composition. In addition, the above-mentioned standing process can be replaced by the process H described in the method for producing metal nitride-containing particles. From the viewpoint of the composition having a more excellent effect of the present invention, it is better to replace it by the process H.

<過濾製程> 過濾製程係藉由過濾器對藉由上述混合及分散製程製造之組成物進行過濾之製程。過濾製程中,能夠從組成物去除異物和/或減少缺陷。 作為過濾器,只要係一直以來用於過濾用途等者,則能夠不特別受限地使用。例如,可舉出基於PTFE (polytetrafluoroethylene:聚四氟乙烯)等氟樹脂、尼龍等聚醯胺系樹脂、聚乙烯、聚丙烯(PP)等聚烯烴樹脂(含有高密度、超高分子量)等之過濾器。該些原材料中,聚丙烯(含有高密度聚丙烯)、尼龍為較佳。 過濾器的孔徑為0.1~7.0μm程度為較適宜,0.2~2.5μm程度為較佳,0.2~1.5μm程度為更佳,0.3~0.7μm為進一步較佳。藉由設為該範圍,能夠抑制顔料的過濾堵塞,並且能夠可靠地去除顔料中包含之雜質或凝聚物等微細的異物。 使用過濾器時,可組合不同過濾器。此時,藉由第1過濾器的過濾可僅進行1次,亦可進行2次以上。組合不同過濾器來進行2次以上的過濾時,第2次之後的孔徑與第1次過濾的孔徑相比,相同或更大為較佳。並且,亦可組合在上述範圍內不同之孔徑的第1過濾器。此處的孔徑能夠參閱過濾器製造商的公稱值。作為市售的過濾器,例如,能夠從由NIHON PALL LTD.、Toyo Roshi Kaisha, Ltd.、Nihon Entegris K.K.(原Mykrolis Corpration)或KITZ MICROFILTER CORPORATION等提供之各種過濾器中選擇。 第2過濾器能夠使用由與上述第1過濾器相同的材料等形成者。第2過濾器的孔徑為0.2~10.0μm程度為較適宜,0.2~7.0μm程度為較佳,0.3~6.0μm程度為進一步較佳。<Filtration process> The filtration process is a process in which the composition manufactured by the above mixing and dispersion process is filtered through a filter. During the filtration process, foreign matter can be removed from the composition and/or defects can be reduced. As the filter, as long as it has been used for filtering purposes, etc., it can be used without particular limitation. For example, fluororesins such as PTFE (polytetrafluoroethylene: polytetrafluoroethylene), polyamide resins such as nylon, polyolefin resins (including high density and ultra-high molecular weight) such as polyethylene and polypropylene (PP), etc. can be mentioned. filter. Among these raw materials, polypropylene (containing high-density polypropylene) and nylon are preferred. The pore size of the filter is preferably about 0.1 to 7.0 μm, preferably about 0.2 to 2.5 μm, more preferably about 0.2 to 1.5 μm, and even more preferably 0.3 to 0.7 μm. By setting it as this range, the filter clogging of the pigment can be suppressed, and fine foreign substances such as impurities and aggregates contained in the pigment can be reliably removed. When using filters, different filters can be combined. At this time, the filtration by the first filter may be performed only once, or may be performed two or more times. When combining different filters to perform filtration more than two times, it is preferable that the pore size after the second filtration is the same or larger than the pore size of the first filtration. In addition, it is also possible to combine first filters with different pore diameters within the above-mentioned range. The pore size here can refer to the nominal value of the filter manufacturer. As a commercially available filter, for example, it can be selected from various filters provided by NIHON PALL LTD., Toyo Roshi Kaisha, Ltd., Nihon Entegris K.K. (formerly Mykrolis Corpration), KITZ MICROFILTER CORPORATION, and the like. The second filter can be formed of the same material as the above-mentioned first filter. The pore size of the second filter is preferably about 0.2 to 10.0 μm, preferably about 0.2 to 7.0 μm, and more preferably about 0.3 to 6.0 μm.

[硬化膜(遮光膜)] 上述硬化膜使用上述組成物來獲得。上述硬化膜中包含含金屬氮化物的粒子。上述硬化膜適宜用作遮光膜,具體而言,適宜用於圖像感測器的受光部周邊部分的遮光。 以下,作為一例,對硬化膜用作圖像感測器的受光部周邊部分的遮光膜之情況進行說明。 上述遮光膜係使用上述組成物(尤其,上述感光性組成物)來形成者。使用上述組成物來獲得之遮光膜的解像性及電極的防腐性優異。[Cured film (light-shielding film)] The cured film is obtained using the composition described above. The cured film contains metal nitride-containing particles. The above-mentioned cured film is suitable as a light-shielding film, and specifically, it is suitable for light-shielding the peripheral part of the light-receiving part of an image sensor. Hereinafter, as an example, a case where the cured film is used as a light-shielding film in the peripheral portion of the light-receiving portion of an image sensor will be described. The said light-shielding film is formed using the said composition (especially, the said photosensitive composition). The light-shielding film obtained by using the above composition is excellent in resolution and corrosion resistance of the electrode.

作為遮光膜的膜厚,並無特別限定,從遮光膜具有更優異之本發明的效果之角度考慮,以乾燥後的膜厚計,0.2μm以上且50μm以下為較佳,0.3μm以上且10μm以下為更佳,0.3μm以上且5μm以下為進一步較佳。上述組成物的每單位體積的光學濃度較高(遮光性較高),故與以往使用黑色顏料之組成物相比,還能夠更加減小膜厚。 作為遮光膜的尺寸(設置於感測器受光部周邊之遮光膜的一邊的長度),從遮光膜具有更優異之本發明的效果之角度考慮,0.001mm以上且10mm以下為較佳,0.05mm以上且7mm以下為更佳,0.1mm以上且3.5mm以下為進一步較佳。上述組成物的每單位體積的光學濃度較高,故減少塗佈量等,有利於微細加工,且解像性及電極的防腐性優異,故能夠在上述範圍內尤其較佳地使用。The film thickness of the light-shielding film is not particularly limited. From the viewpoint that the light-shielding film has more excellent effects of the present invention, in terms of the film thickness after drying, 0.2 μm or more and 50 μm or less is preferred, 0.3 μm or more and 10 μm The following are more preferable, and 0.3 μm or more and 5 μm or less are more preferable. The above-mentioned composition has a high optical density per unit volume (high light-shielding property), and therefore, it is possible to further reduce the film thickness compared to a composition using a black pigment in the past. As for the size of the light-shielding film (the length of one side of the light-shielding film provided on the periphery of the light-receiving part of the sensor), from the viewpoint that the light-shielding film has more excellent effects of the present invention, 0.001mm or more and 10mm or less is preferable, 0.05mm The above and 7 mm or less are more preferable, and the 0.1 mm or more and 3.5 mm or less are more preferable. The above-mentioned composition has a high optical density per unit volume, so it is advantageous for microfabrication by reducing the coating amount, etc., and is excellent in resolution and electrode corrosion resistance, so it can be used particularly preferably within the above-mentioned range.

〔硬化膜的製造方法〕 接著,對上述硬化膜(遮光膜)的製造方法,將含有黑矩陣之濾色器的製造方法為例進行說明。 含有上述黑矩陣之濾色器在基板上含有使用上述組成物來獲得之硬化膜(黑矩陣)。 以下,對含有上述黑矩陣之濾色器的製造方法,按每個製程進行詳細說明。[Method of Manufacturing Cured Film] Next, the method of manufacturing the above-mentioned cured film (light-shielding film) will be described as an example of a method of manufacturing a black matrix-containing color filter. The color filter containing the above-mentioned black matrix contains a cured film (black matrix) obtained by using the above-mentioned composition on a substrate. Hereinafter, the manufacturing method of the color filter containing the above-mentioned black matrix will be described in detail for each process.

含有上述黑矩陣之濾色器的製造方法含有以下的組成物層形成製程、曝光製程及顯影製程。 組成物層形成製程:在基板上塗佈上述組成物來形成組成物層(塗佈膜)之製程。 曝光製程:經由光罩(以下,還簡單稱作“遮罩”。)對上述組成物層進行曝光之製程。 顯影製程:對曝光之後的組成物層進行顯影來形成圖案狀的硬化膜(遮光膜)之製程。The manufacturing method of the color filter containing the above-mentioned black matrix includes the following composition layer forming process, exposure process, and development process. Composition layer formation process: a process of coating the above composition on a substrate to form a composition layer (coating film). Exposure process: The process of exposing the above-mentioned composition layer through a photomask (hereinafter, also simply referred to as "mask".). Development process: the process of developing the exposed composition layer to form a patterned hardened film (light-shielding film).

具體而言,直接或經由其他層,將上述組成物塗佈於基板上來形成組成物層(組成物層形成製程),經由規定的遮罩圖案進行曝光,僅使被光照射之塗佈膜部分硬化(曝光製程),藉由用顯影液進行顯影(顯影製程),藉此能夠製造本發明的濾色器。 以下,對含有上述黑矩陣之濾色器的製造方法中的各製程進行說明。Specifically, directly or through other layers, the above-mentioned composition is coated on the substrate to form a composition layer (composition layer formation process), and exposure is performed through a predetermined mask pattern, so that only the part of the coating film irradiated by light is exposed Hardening (exposure process), and developing with a developer (development process), whereby the color filter of the present invention can be manufactured. Hereinafter, each process in the manufacturing method of the color filter containing the above-mentioned black matrix will be described.

<組成物層形成製程> 組成物層形成製程係在基板上塗佈上述組成物來形成組成物層(塗佈膜)之製程。 作為基板,例如,用於液晶顯示裝置等之無鹼玻璃、鈉玻璃、Pyrex(註冊商標)玻璃、石英玻璃及對該些附著透明導電膜者、用於固態攝影元件等之光電轉換元件基板(例如,矽酮基板等)、CCD(Charge Coupled Device(電荷耦合元件))基板、以及CMOS(Complementary Metal-Oxide Semiconductor(互補型金屬氧化膜半導體))基板等。 並且,為了改善與上部層的黏附、防止物質的擴散或者基板表面的平坦化,可在該些基板上,依據需要設置底塗層。<Composition layer formation process> The composition layer formation process is a process of applying the above-mentioned composition on a substrate to form a composition layer (coating film). As the substrate, for example, alkali-free glass, soda glass, Pyrex (registered trademark) glass, quartz glass used for liquid crystal display devices, and photoelectric conversion element substrates used for solid-state imaging devices, etc. ( For example, silicone substrates, etc.), CCD (Charge Coupled Device) substrates, and CMOS (Complementary Metal-Oxide Semiconductor (Complementary Metal-Oxide Semiconductor)) substrates. In addition, in order to improve adhesion to the upper layer, prevent diffusion of substances, or flatten the surface of the substrate, a primer layer can be provided on these substrates as needed.

作為向基板上塗佈上述組成物之塗佈方法,能夠適用狹縫塗佈法、噴墨法、旋塗法、流延塗佈法、輥塗法及網版印刷法等各種塗佈方法。As a coating method for coating the above-mentioned composition on a substrate, various coating methods such as a slit coating method, an inkjet method, a spin coating method, a cast coating method, a roll coating method, and a screen printing method can be applied.

製造固態攝影元件用的含有黑矩陣之濾色器時,作為組成物的塗佈膜厚,從解像性的觀點考慮,0.35μm以上且1.5μm以下為較佳,0.40μm以上且1.0μm以下為更佳。When manufacturing a black matrix-containing color filter for solid-state imaging devices, the coating film thickness of the composition is preferably 0.35 μm or more and 1.5 μm or less from the viewpoint of resolution, and 0.40 μm or more and 1.0 μm or less For better.

塗佈於基板上之組成物通常在70℃以上且110℃以下且2分鐘以上且4分鐘以下的程度的條件下進行乾燥。藉此,能夠形成組成物層。The composition coated on the substrate is usually dried under conditions of about 70°C or higher and 110°C or lower and 2 minutes or longer and 4 minutes or shorter. Thereby, a composition layer can be formed.

<曝光製程> 曝光製程係經由遮罩對在組成物層形成製程中形成之組成物層(塗佈膜)進行曝光,僅使被光照射之塗佈膜部分硬化之製程。 曝光藉由活性光線或放射線的照射來進行為較佳,尤其,可較佳地使用g射線、h射線及i射線等紫外線,高壓水銀燈為更佳。照射強度為5~1500mJ/cm2 為較佳,10~1000mJ/cm2 為更佳。並且,從提高解像性的觀點考慮,固態攝影元件用的遮光膜形成中,基於i射線步進機之曝光為較佳。<Exposure process> The exposure process is a process in which the composition layer (coating film) formed in the composition layer formation process is exposed through a mask, and only the part of the coating film irradiated by light is hardened. The exposure is preferably carried out by irradiation of active light or radiation. In particular, ultraviolet rays such as g-rays, h-rays, and i-rays can be preferably used, and a high-pressure mercury lamp is more preferred. The irradiation intensity is preferably 5 to 1500 mJ/cm 2 and more preferably 10 to 1000 mJ/cm 2 . In addition, from the viewpoint of improving the resolution, in the formation of the light-shielding film for solid-state imaging devices, exposure by an i-ray stepper is preferable.

<顯影製程> 接著曝光製程進行鹼顯影處理(顯影製程),使曝光製程中的光未照射部分溶出於鹼水溶液。藉此,僅殘留已光硬化之部分(被光照射之塗佈膜部分)。 作為顯影液,製作固態攝影元件用的含有黑矩陣之遮光性濾色器時,不會對基底的電路等帶來損傷之有機鹼顯影液為較佳。作為顯影溫度,通常為20~30℃,顯影時間為20~90秒。<Development process> After the exposure process, an alkali development process (development process) is performed, so that the light unirradiated part in the exposure process is dissolved in the alkali aqueous solution. Thereby, only the light-hardened part (the part of the coating film irradiated by light) remains. As the developer, an organic alkali developer that does not cause damage to the circuit of the substrate and the like when producing a black matrix-containing light-shielding color filter for a solid-state imaging element is preferable. The development temperature is usually 20 to 30°C, and the development time is 20 to 90 seconds.

作為鹼性水溶液,例如,可舉出無機系顯影液及有機系顯影液。作為無機系顯影液,可舉出將氫氧化鈉、氫氧化鉀、碳酸鈉、碳酸氫鈉、矽酸鈉或偏矽酸鈉,溶解成濃度為0.001~10質量%,較佳地為0.01~1質量%之鹼性水溶液。作為有機系顯影液,可舉出將氨水、乙胺、二乙胺、二甲基乙醇胺、四甲基氫氧化銨、四乙基氫氧化銨、膽鹼、吡咯、哌啶或1,8-二氮雜雙環-[5.4.0]-7-十一碳烯等有機鹼性化合物,溶解成濃度為0.001~10質量%,較佳地為0.01~1質量%之鹼性水溶液。鹼性水溶液中,例如還能夠添加適量的甲醇及乙醇等水溶性有機溶劑和/或界面活性劑等。另外,使用包含該種鹼性水溶液之顯影液時,通常在顯影後以純水清洗(沖洗)為較佳。As an alkaline aqueous solution, an inorganic type developer and an organic type developer are mentioned, for example. As an inorganic developer, sodium hydroxide, potassium hydroxide, sodium carbonate, sodium bicarbonate, sodium silicate, or sodium metasilicate, dissolved in a concentration of 0.001-10% by mass, preferably 0.01- 1% by mass alkaline aqueous solution. Examples of organic developers include ammonia, ethylamine, diethylamine, dimethylethanolamine, tetramethylammonium hydroxide, tetraethylammonium hydroxide, choline, pyrrole, piperidine, or 1,8- An organic basic compound such as diazabicyclo-[5.4.0]-7-undecene is dissolved into an alkaline aqueous solution with a concentration of 0.001-10% by mass, preferably 0.01-1% by mass. In the alkaline aqueous solution, for example, an appropriate amount of water-soluble organic solvents such as methanol and ethanol and/or surfactants can be added. In addition, when a developer containing such an alkaline aqueous solution is used, it is generally preferable to wash (rinse) with pure water after development.

作為顯影方法,例如能夠利用旋覆浸沒顯影方法及噴淋顯影方法等。As the development method, for example, a spin-on immersion development method, a shower development method, and the like can be used.

另外,含有上述硬化膜(黑矩陣)之濾色器的製造方法可在上述顯影製程之後含有藉由加熱和/或曝光對硬化膜進行硬化之硬化製程。In addition, the manufacturing method of the color filter containing the cured film (black matrix) may include a curing process of curing the cured film by heating and/or exposure after the development process.

含有上述硬化膜(黑矩陣)之濾色器的解像性及電極的防腐性優異。 藉此,含有上述硬化膜(黑矩陣)之濾色器適於CCD圖像感測器和/或CMOS圖像感測器等固態攝影元件。尤其適於超過100万像素之高解像性的CCD圖像感測器和/或CMOS圖像感測器等。亦即,含有上述硬化膜之濾色器適於固態攝影元件。並且,濾色器可含有如下結構,亦即,在藉由隔壁例如分割成格子狀之空間,埋入有形成各顏色像素之硬化膜。 上述硬化膜(黑矩陣)例如配置於構成CCD圖像感測器和/或CMOS圖像感測器等之各像素的受光部與用於聚光的微透鏡之間。The color filter containing the above-mentioned cured film (black matrix) has excellent resolution and electrode corrosion resistance. Thereby, the color filter containing the above-mentioned cured film (black matrix) is suitable for solid-state imaging devices such as CCD image sensors and/or CMOS image sensors. Especially suitable for high resolution CCD image sensor and/or CMOS image sensor with over 1 million pixels. That is, the color filter containing the above-mentioned cured film is suitable for solid-state imaging devices. In addition, the color filter may include a structure in which, for example, a space divided into a grid shape by a partition wall is embedded with a cured film forming pixels of each color. The above-mentioned cured film (black matrix) is arranged, for example, between the light-receiving portion of each pixel constituting the CCD image sensor and/or the CMOS image sensor and the microlens for condensing light.

[固態攝影元件] 上述固態攝影元件含有上述硬化膜(黑矩陣)。上述固態攝影元件具有含有黑矩陣而且依據需要而含有包含其他顏色(3色或者4色)的像素之圖案狀皮膜之濾色器為較佳。 上述固態攝影元件只要含有上述黑矩陣且作為固態攝影元件發揮作用,則並無特別限制,例如,可舉出在基板上含有包含構成固態攝影元件(CCD圖像感測器及CMOS圖像感測器等)的受光區之複數個光電二極體及多晶矽等之受光元件,在基板的受光元件形成面的相反側的面含有上述黑矩陣之固態攝影元件。 並且,濾色器亦可具有如下結構,亦即,在藉由隔壁例如分割成格子狀之空間,埋入有形成各顏色像素之硬化膜。此時的隔壁相對於各顏色像素為低折射率為較佳。作為含有該種結構之攝像元件的例子,可舉出日本特開2012-227478號公報及特開2014-179577號公報中記載的固態攝影元件。[Solid-state imaging element] The solid-state imaging element includes the cured film (black matrix). The solid-state imaging device described above preferably has a color filter including a black matrix and a patterned film including pixels of other colors (three colors or four colors) as necessary. The solid-state imaging device described above is not particularly limited as long as it contains the black matrix and functions as a solid-state imaging device. For example, it can be mentioned that the solid-state imaging device (CCD image sensor and CMOS image sensor) is included on the substrate. A plurality of photodiodes, polysilicon and other light-receiving elements in the light-receiving area of the light-receiving area of the substrate include the above-mentioned black matrix solid-state imaging element on the surface opposite to the light-receiving element forming surface of the substrate. In addition, the color filter may have a structure in which a cured film forming pixels of each color is buried in a space divided into a grid shape by a partition wall, for example. In this case, it is preferable that the partition wall has a low refractive index with respect to each color pixel. As an example of an imaging element including such a structure, solid-state imaging elements described in Japanese Patent Application Publication No. 2012-227478 and Japanese Patent Application Publication No. 2014-179577 can be cited.

[圖像顯示裝置] 上述硬化膜適於液晶顯示裝置及有機電致發光顯示裝置等圖像顯示裝置。[Image Display Device] The cured film described above is suitable for image display devices such as liquid crystal display devices and organic electroluminescence display devices.

對於圖像顯示裝置的定義及各圖像顯示裝置的詳細內容,例如記載於“電子顯示裝置(佐佐木 昭夫著、Kogyo Chosakai Publishing CO., LTD. 1990年發行)”、“顯示裝置(伊吹 順章著、產業圖書(株)平成元年發行)”等中。並且,對於液晶顯示裝置,例如記載於“第二代液晶顯示器技術(內田 龍男編輯、Kogyo Chosakai Publishing CO., LTD. 1994年發行)”。上述硬化膜例如適於上述“第二代液晶顯示器技術”中記載之方式的液晶顯示裝置。The definition of image display devices and the details of each image display device are described in, for example, "Electronic Display Devices (by Akio Sasaki, published by Kogyo Chosakai Publishing CO., LTD. 1990)" and "Display Devices (Junaki Ibuki) "Industrial Books (published in the first year of Heisei)" etc. In addition, the liquid crystal display device is described in, for example, "Second Generation Liquid Crystal Display Technology (edited by Tatsuo Uchida, published by Kogyo Chosakai Publishing CO., LTD. in 1994)". The above-mentioned cured film is suitable for, for example, a liquid crystal display device of the method described in the above-mentioned "Second Generation Liquid Crystal Display Technology".

作為含有上述硬化膜之液晶顯示裝置的一態様,例如,至少1個係在光透射性的一對基板之間至少含有濾色器、液晶層及液晶驅動機構(含有單純矩陣驅動方式及有源矩陣驅動方式)之液晶顯示裝置。上述液晶顯示裝置含有複數個像素組,構成該像素組之各像素含有相互藉由上述硬化膜(黑矩陣)分離之濾色器。As one aspect of the liquid crystal display device containing the above-mentioned cured film, for example, at least one of a pair of light-transmissive substrates contains at least a color filter, a liquid crystal layer, and a liquid crystal drive mechanism (including a simple matrix drive method and active Matrix drive mode) liquid crystal display device. The liquid crystal display device includes a plurality of pixel groups, and each pixel constituting the pixel group includes color filters separated from each other by the cured film (black matrix).

並且,作為上述液晶顯示裝置的其他態様,至少1個係在光透射性的一對基板之間至少含有濾色器、液晶層及液晶驅動機構,液晶驅動機構含有有源元件(例如,TFT(Thin Film Transistor(薄膜晶體管))),且各有源元件之間包含含有上述硬化膜(黑矩陣)之濾色器。In addition, as another aspect of the above-mentioned liquid crystal display device, at least one system includes at least a color filter, a liquid crystal layer, and a liquid crystal drive mechanism between a pair of light-transmitting substrates, and the liquid crystal drive mechanism includes an active element (for example, TFT ( Thin Film Transistor (thin film transistor)), and each active element contains a color filter containing the above-mentioned cured film (black matrix).

含有上述硬化膜之濾色器適於彩色TFT(Thin Film Transistor(薄膜晶體管))方式的液晶顯示裝置。對於彩色TFT方式的液晶顯示裝置,例如記載於“彩色TFT液晶顯示器(KYORITSU SHUPPAN CO., LTD.1996年發行)”。而且,上述濾色器還適於:IPS(In Plane Switching(平面轉換))等橫向電場驅動方式;MVA(Multi-domain Vertical Alignment(多域垂直對準))等像素分割方式;等視角被擴大之液晶顯示裝置、STN(Super-Twist Nematic(超扭曲向列))、TN(Twisted Nematic(扭曲向列))、VA(Vertical Alignment(豎向定線))、OCS(on-chip spacer(片上間隔))、FFS(fringe field switching(邊緣場開關))及R-OCB(Reflective Optically Compensated Bend(反射式光學補償彎管))等。The color filter containing the above-mentioned cured film is suitable for a color TFT (Thin Film Transistor) type liquid crystal display device. The color TFT type liquid crystal display device is described in, for example, "Color TFT Liquid Crystal Display (KYORITSU SHUPPAN CO., LTD. issued in 1996)." Moreover, the above-mentioned color filter is also suitable for: IPS (In Plane Switching) and other horizontal electric field driving methods; MVA (Multi-domain Vertical Alignment) and other pixel division methods; and the viewing angle is enlarged Liquid crystal display device, STN (Super-Twist Nematic), TN (Twisted Nematic), VA (Vertical Alignment), OCS (on-chip spacer) Interval), FFS (fringe field switching) and R-OCB (Reflective Optically Compensated Bend) etc.

上述濾色器適於明亮且高精細的COA(Color-filter On Array(濾色器陣列))方式的液晶顯示裝置。關於COA方式的液晶顯示裝置,對於濾色器之要求特性,除了通常的要求特性以外,有時還要求對於層間絶縁膜之要求特性,亦即,低介電常數及剝離液耐性。含有上述濾色器之COA方式的液晶顯示裝置具有更優異之解像性,或具有更優異之耐久性。另外,為了滿足低介電常數的要求特性,可在濾色器層上進一步含有樹脂覆膜。The above-mentioned color filter is suitable for a bright and high-definition COA (Color-filter "On" Array (color filter array)) liquid crystal display device. Regarding the liquid crystal display device of the COA method, in addition to the usual required characteristics of the color filter, the required characteristics of the interlayer insulation film, that is, low dielectric constant and peeling liquid resistance, are sometimes required. The COA type liquid crystal display device containing the above-mentioned color filter has more excellent resolution, or has more excellent durability. In addition, in order to meet the required characteristics of low dielectric constant, a resin coating film may be further included on the color filter layer.

對於該些圖像顯示方式,例如記載於“EL、PDP、LCD顯示器-技術與市場的最新動向-(TORAY Research Center,Inc.調查研究部門2001年發行)”的43頁等。另外,上述中,EL表示Electroluminescence(電致發光)的省略,PDP表示Plasma Display Panel的省略,LCD表示liquid crystal display(液晶顯示器)的省略。These image display methods are described, for example, on page 43 of "EL, PDP, LCD Display-Latest Trends in Technology and Market-(issued by TORAY Research Center, Inc. in 2001)". In addition, in the above, EL represents the abbreviation of Electroluminescence, PDP represents the abbreviation of Plasma Display Panel, and LCD represents the abbreviation of liquid crystal display (liquid crystal display).

上述液晶顯示裝置除了上述濾色器以外,亦可由電極基板、偏光膜、相位差膜、背光、間隔物及視角保護膜等各種構件構成。上述濾色器能夠適用於由該些公知構件構成之液晶顯示裝置。對於該些構件,例如記載於“’94液晶顯示器周邊材料・化學製品市場(島 健太郎CMC-Group. 1994年發行)”、“2003液晶関連市場的現狀與未來展望(下卷)(表良吉Fuji Chimera Research Institute, Inc.、2003年發行)”。 關於背光,記載於SID meeting Digest 1380(2005)(A.Konno et.al)和月刊顯示器2005年12月號的18~24頁(島 康裕)、月刊顯示器2005年12月號的25~30頁(八木隆明)等。The above-mentioned liquid crystal display device may be constituted by various members such as an electrode substrate, a polarizing film, a retardation film, a backlight, a spacer, and a viewing angle protective film in addition to the above-mentioned color filter. The above-mentioned color filter can be applied to a liquid crystal display device composed of these known members. These components are described in, for example, "'94 Liquid Crystal Display Peripheral Materials and Chemicals Market (Shima Kentaro CMC-Group. Issued in 1994)" and "2003 Liquid Crystal Related Market Status and Future Prospects (Volume 2)" (Table Ryoshi Fuji) Chimera Research Institute, Inc., issued in 2003)”. The backlight is described in SID meeting Digest 1380 (2005) (A.Konno et.al), pages 18-24 of the December 2005 issue of the monthly display (Yoshihiro Shima), and pages 25-30 of the December 2005 issue of the monthly display (Yagi Takaaki) and so on.

並且,上述硬化膜適於個人計算機、平板電腦、移動電話、智能手機及數位相機等便攜式設備;多功能打印機及掃描儀等OA(Office Automation(辦公室自動化))設備;監視攝影機、條碼讀取器及自動存提款機(ATM:automated teller machine)、高速相機及使用人臉圖像認證之本人認證等產業用設備;車載用相機設備;內窺鏡、膠囊內窺鏡及導管等醫療用相機設備;生物體感測器、生物感測器(Biosensor)、軍事偵查用相機、立體地圖用相機、氣象及海洋觀測相機、陸地資源偵查相機、以及宇宙的天文及深空目標用勘探相機等航天設備等中使用之光學濾波器及模組的遮光構件及遮光層,進一步適於防反射構件以及防反射層。In addition, the above-mentioned cured film is suitable for portable devices such as personal computers, tablet computers, mobile phones, smartphones, and digital cameras; OA (Office Automation) devices such as multifunction printers and scanners; surveillance cameras, barcode readers And automatic teller machine (ATM: automated teller machine), high-speed camera, and personal authentication using facial image authentication, and other industrial equipment; automotive camera equipment; medical cameras such as endoscopes, capsule endoscopes, and catheters Equipment; biological sensors, biological sensors (Biosensor), military reconnaissance cameras, stereo map cameras, meteorological and ocean observation cameras, terrestrial resources reconnaissance cameras, and exploration cameras for astronomical and deep space targets in the universe. The light-shielding members and light-shielding layers of optical filters and modules used in equipment, etc. are further suitable for anti-reflection members and anti-reflection layers.

上述硬化膜還能夠使用於微型LED(Light Emitting Diode)及微型OLED(Organic Light Emitting Diode)等用途。上述硬化膜除了微型LED及微型OLED中使用之光學濾波器及光學薄膜以外,還適於賦予遮光功能或防反射功能之構件。 作為微型LED及微型OLED的例子,可舉出日本特表2015-500562號及日本特表2014-533890中記載者。The above-mentioned cured film can also be used for applications such as micro LED (Light   Emitting   Diode) and micro OLED (Organic   Light   Emitting   Diode). In addition to optical filters and optical films used in micro-LEDs and micro-OLEDs, the above-mentioned cured film is also suitable for members that provide light-shielding function or anti-reflection function. Examples of micro LEDs and micro OLEDs include those described in Japanese Special Form No. 2015-500562 and Japanese Special Form 2014-533890.

上述硬化膜適合作為量子點顯示器中使用之光學濾波器及光學薄膜。並且,適合作為賦予遮光功能及防反射功能之構件。 作為量子點顯示器的例子,可舉出美國專利申請公開第2013/0335677號、美國專利申請公開第2014/0036536號、美國專利申請公開第2014/0036203號及美國專利申請公開第2014/0035960號中記載者。 [實施例]The above-mentioned cured film is suitable as an optical filter and an optical film used in a quantum dot display. In addition, it is suitable as a member that provides a light-shielding function and an anti-reflection function. As examples of quantum dot displays, U.S. Patent Application Publication No. 2013/0335677, U.S. Patent Application Publication No. 2014/0036536, U.S. Patent Application Publication No. 2014/0036203, and U.S. Patent Application Publication No. 2014/0035960 Recorder. [Example]

以下,依據實施例,對上述組成物等進行更詳細說明。關於以下的實施例所示之材料、使用量、比例、處理內容、處理步驟等,只要不脫離本發明的宗旨,則能夠適當變更。藉此,本發明的範圍並不應藉由以下示出之實施例限定性地解釋。Hereinafter, the above-mentioned composition and the like will be described in more detail based on examples. The materials, usage amounts, ratios, processing contents, processing procedures, etc. shown in the following examples can be appropriately changed as long as they do not deviate from the spirit of the present invention. Therefore, the scope of the present invention should not be limitedly interpreted by the embodiments shown below.

[含金屬氮化物的粒子P-1的製作] 藉由以下的方法製作了含金屬氮化物的粒子P-1。 首先,準備作為過渡金屬含有鈮之Mituwa Chemistry.製造的鈮(粉末)<100-325mesh>作為原料(以下,還稱作“金屬原料粉末”。)。接著,藉由ICP發光分光分析法分析了該金屬原料粉末中包含之雜質的含量。另外,ICP發光分光分析法中,利用了Seiko Instruments Inc.製造的ICP發光分光分析装置“SPS3000”(商品名)。[Production of metal nitride-containing particle P-1] The metal nitride-containing particle P-1 was produced by the following method. First, prepare niobium (powder) <100-325 mesh> manufactured by Mituwa Chemistry. which contains niobium as a transition metal as a raw material (hereinafter, also referred to as "metal raw material powder"). Next, the content of impurities contained in the metal raw material powder was analyzed by ICP emission spectrometry. In addition, in the ICP emission spectroscopic analysis method, an ICP emission spectroscopic analysis device "SPS3000" (trade name) manufactured by Seiko Instruments Inc. was used.

接著,將上述金屬原料粉末在Ar氣中進行電漿處理(處理條件基於下述的電漿處理(1))來進行了金屬微粒化。測定了所獲得之金屬微粒的平均一次粒徑,其結果,為80nm。另外,平均一次粒徑藉由以下方法求出。 試料:藉由與後述之[含金屬氮化物的粒子分散液的製備]相同的方法製備分散液(金屬微粒25質量%、下述分散劑A7.5質量%、PGMEA;丙二醇單甲醚乙酸酯溶劑67.5質量%),藉由PGMEA將所獲得之分散液稀釋100倍之後,滴加在碳箔上並使其乾燥者。 利用透射型電子顯微鏡(TEM:Transmission Electron Microscope),以倍率2万倍觀察上述試料來獲得了圖像。藉由圖像處理計算出了所獲得之圖像中的金屬微粒的面積。接著,計算出將所獲得之面積換算為圓時的直徑。對4視場量、總計400個(在各視場確認到約3000個金屬微粒)金屬微粒進行該操作,對所評價之圓換算的直徑進行算術平均來作為金屬微粒的平均一次粒徑。Next, the above-mentioned metal raw material powder was subjected to plasma treatment in Ar gas (treatment conditions were based on the following plasma treatment (1)) to perform metal microparticulation. The average primary particle size of the obtained metal fine particles was measured. As a result, it was 80 nm. In addition, the average primary particle size is calculated by the following method. Sample: The dispersion was prepared by the same method as [Preparation of metal nitride-containing particle dispersion] described later (metal fine particles 25% by mass, the following dispersant A7.5% by mass, PGMEA; propylene glycol monomethyl ether acetic acid Ester solvent 67.5% by mass), after diluting the obtained dispersion 100 times with PGMEA, dropping it on the carbon foil and drying it. An image was obtained by observing the sample with a transmission electron microscope (TEM: Transmission Electron Microscope) at a magnification of 20,000 times. The area of the metal particles in the obtained image is calculated by image processing. Next, calculate the diameter when converting the obtained area into a circle. This operation was performed for a total of 400 metal particles (approximately 3,000 metal particles were confirmed in each field of view) with 4 fields of view, and the circle-evaluated diameter converted to arithmetic average was used as the average primary particle size of the metal particles.

並且,藉由上述方法測定了金屬微粒中包含之雜質,其結果,未檢測出雜質。另外,藉由上述方法未檢測出雜質表示雜質的含量相對於金屬微粒的總質量小於20ppm。In addition, the impurities contained in the metal fine particles were measured by the above-mentioned method, and as a result, no impurities were detected. In addition, no impurities detected by the above method means that the content of impurities is less than 20 ppm relative to the total mass of the metal fine particles.

<電漿處理(1)> 藉由以下方法進行了電漿處理(1)。亦即,將依據國際公開第2010/147098號小冊子的圖1中記載的黑色複合微粒製造装置之装置用作金屬微粒製造装置,依據以下條件進行了電漿處理(1)。 ・對高頻振蕩用線圈施加之高頻電壓:頻率、約4MHz、電壓、約80kVA・電漿氣體:氬氣(供給量 100L/min) ・載體氣體:氬氣(供給量 10L/min) ・腔室內氛圍:氬氣(供給量 1000L/min、腔室內流速 5m/sec) ・旋風分離器內氛圍:氬氣、內壓:50kPa ・從腔室向旋風分離器供給材料的速度:10m/s(平均值)<Plasma treatment (1)> Plasma treatment (1) was performed by the following method. That is, an apparatus based on the black composite particle manufacturing apparatus described in Fig. 1 of International Publication No. 2010/147098 pamphlet was used as a metal particle manufacturing apparatus, and plasma treatment was performed under the following conditions (1).・High-frequency voltage applied to the high-frequency oscillation coil: frequency, about 4MHz, voltage, about 80kVA ・Plasma gas: argon (supply amount 100L/min) ・Carrier gas: argon (supply amount 10L/min) ・Chamber atmosphere: argon gas (supply rate 1000L/min, chamber flow rate 5m/sec) · Cyclone atmosphere: argon gas, internal pressure: 50kPa · Material supply speed from the chamber to the cyclone separator: 10m/s (average value)

接著,作為含有原子A之原料粉末,準備Fe粉JFE STEEL CORPORATION製造的JIP 270M,依據上述電漿處理(1)的條件進行電漿處理來使原子A微粒化。此時,藉由與上述相同的方法測定了所獲得之微粒中包含之雜質,其結果,未檢測出雜質。Next, as a raw material powder containing atom A, Fe powder was prepared JIP "270M manufactured by JFE STEEL CORPORATION, and plasma treatment was performed according to the conditions of the above-mentioned plasma treatment (1) to atomize atom A. At this time, the impurities contained in the obtained microparticles were measured by the same method as described above, and as a result, no impurities were detected.

接著,混合藉由上述來獲得之金屬微粒及已微粒化之原子A,從而獲得了原料金屬粉末。對於該原料金屬粉末,藉由在氮氣中進行電漿處理(處理條件依據下述的電漿處理(2))來獲得了含金屬氮化物的粒子。Next, the metal fine particles obtained as described above and the atomized atom A are mixed to obtain raw metal powder. The raw metal powder was subjected to plasma treatment in nitrogen (treatment conditions were based on the plasma treatment (2) described below) to obtain metal nitride-containing particles.

<電漿處理(2)> 藉由以下方法進行了電漿處理(2)。另外,所使用之装置與電漿處理(1)相同。 ・對高頻振蕩用線圈施加之高頻電壓:頻率、約4MHz、電壓、約80kVA・電漿氣體:氬氣及氮氣(供給量 分別為50L/min) ・載體氣體:氮氣(供給量 10L/min) ・腔室內氛圍:氮氣(供給量 1000L/min、腔室內流速 5m/sec) ・旋風分離器內氛圍:氮氣、內壓 50kPa ・從腔室向旋風分離器供給材料的速度:10m/s(平均值)<Plasma treatment (2)> Plasma treatment (2) was performed by the following method. In addition, the equipment used is the same as the plasma treatment (1).・High-frequency voltage applied to the high-frequency oscillation coil: frequency, about 4MHz, voltage, about 80kVA ・Plasma gas: argon and nitrogen (supply volume of 50L/min) ・Carrier gas: nitrogen (supply volume 10L/ min) ・The atmosphere in the chamber: Nitrogen (supply amount 1000L/min, the flow rate in the chamber is 5m/sec) ・The atmosphere in the cyclone: nitrogen, internal pressure 50kPa ・The speed of feeding material from the chamber to the cyclone: 10m/s (average value)

利用Ar氣,將結束電漿處理(2)之後的含金屬氮化物的粒子,藉由NIHON SHINTECH CO., LTD.製造的分流型濕度供給裝置SRH,在若在大氣中則成為相對濕度95%之條件下導入20℃的氮氣,並靜置24小時。之後,利用Hosokawa Micron Group製造的TTSP分離器,以產率成為10%之條件,對所獲得之含金屬氮化物的粒子進行分級,從而獲得了含金屬氮化物的粒子P-1的粉末。另外,向分離器供給了氮氣。Using Ar gas, the metal nitride-containing particles after the plasma treatment (2) are completed, and the shunt type humidity supply device SRH manufactured by NIHON SHINTECH CO., LTD. becomes 95% relative humidity in the atmosphere. Introduce nitrogen at 20°C under the conditions, and let it stand for 24 hours. After that, a TTSP separator manufactured by Hosokawa Micron Group was used to classify the obtained metal nitride-containing particles under the condition that the yield was 10%, thereby obtaining metal nitride-containing particles P-1 powder. In addition, nitrogen gas was supplied to the separator.

測定了含金屬氮化物的粒子P-1的平均一次粒徑,其結果,為12nm。並且,測定了含金屬氮化物的粒子P-1的導電率,其結果,為180×104 S/m。 另外,平均一次粒徑係藉由上述方法測定之平均一次粒徑。 另外,上述導電率係藉由下述方法測定之導電率。 導電率的測定利用Mitsubishi Chemical Analytech CO., LTD.製造的粉體電阻測定系統MCP-PD51,藉由下述方法測定。 首先,將1g含金屬氮化物的粒子裝入上述測定装置的φ20mm的測定容器之後,開始加壓,將壓力變更為0kN、1kN、5kN、10kN、20kN來測定了粒子的體積電阻率(ρ)。從其測定結果求出體積電阻率不受壓力影響之條件下的飽和體積電阻率,利用所獲得之飽和體積電阻率,藉由σ=1/ρ的關係式計算出了導電率(σ)。另外,上述試驗在室溫環境下進行。The average primary particle diameter of the metal nitride-containing particle P-1 was measured, and as a result, it was 12 nm. In addition, the electrical conductivity of the metal nitride-containing particle P-1 was measured. As a result, it was 180×10 4 S/m. In addition, the average primary particle size is the average primary particle size measured by the above-mentioned method. In addition, the above-mentioned electrical conductivity is the electrical conductivity measured by the following method. The electrical conductivity was measured by the following method using the powder resistance measurement system MCP-PD51 manufactured by Mitsubishi Chemical Analytech CO., LTD. First, 1g of metal nitride-containing particles was put into the measuring container of φ20mm of the above measuring device, then pressurization was started, and the pressure was changed to 0kN, 1kN, 5kN, 10kN, 20kN to measure the volume resistivity (ρ) of the particles . The saturated volume resistivity under the condition that the volume resistivity is not affected by pressure is obtained from the measurement results, and the conductivity (σ) is calculated by the relational expression of σ=1/ρ using the obtained saturated volume resistivity. In addition, the above-mentioned test was carried out at room temperature.

[含金屬氮化物的粒子P-2~P-7、P-C1及P-C5的製作] 將原子A的含量設為如表1中記載,除此以外,藉由與含金屬氮化物的粒子P-1相同的方法製作了含金屬氮化物的粒子P-2~P-7、P-C1及P-C5。 另外,上述含金屬氮化物的粒子的製作中的金屬微粒的平均一次粒徑、含金屬氮化物的粒子的平均一次粒徑及導電率綜合示於表1。[Production of metal nitride-containing particles P-2 to P-7, P-C1, and P-C5] The content of atom A was set as shown in Table 1. In addition, by combining with metal nitride-containing particles The particles P-2 to P-7, P-C1, and P-C5 containing metal nitrides were produced in the same manner as the particle P-1. In addition, the average primary particle size of the metal fine particles, the average primary particle size and the electrical conductivity of the metal nitride-containing particles in the production of the metal nitride-containing particles are shown in Table 1 in a comprehensive manner.

[含金屬氮化物的粒子P-C2的製作] 未向過渡金屬原料添加原子A,除此以外,藉由與含金屬氮化物的粒子P-1相同的方法製作了含金屬氮化物的粒子P-C2。 另外,上述含金屬氮化物的粒子的製作中的金屬微粒的平均一次粒徑、含金屬氮化物的粒子的平均一次粒徑及導電率綜合示於表1。[Preparation of metal nitride-containing particle P-C2] Except that atom A was not added to the transition metal raw material, the metal nitride-containing particle P was produced by the same method as the metal nitride-containing particle P-1 -C2. In addition, the average primary particle size of the metal fine particles, the average primary particle size and the electrical conductivity of the metal nitride-containing particles in the production of the metal nitride-containing particles are shown in Table 1 in a comprehensive manner.

[含金屬氮化物的粒子P-8~P-15的製作] 使用表1所示之過渡金屬原料,將原子A的含量設為如表1中記載,除此以外,藉由與含金屬氮化物的粒子P-1相同的方法製作了含金屬氮化物的粒子P-8~P-15。 另外,上述含金屬氮化物的粒子的製作中的金屬微粒的平均一次粒徑、含金屬氮化物的粒子的平均一次粒徑及導電率綜合示於表1。[Production of metal nitride-containing particles P-8 to P-15] The transition metal raw materials shown in Table 1 were used, and the content of atom A was set as described in Table 1. In addition, by combining with metal nitrogen The metal nitride-containing particles P-8 to P-15 were produced in the same manner as the particles P-1 of the compound. In addition, the average primary particle size of the metal fine particles, the average primary particle size and the electrical conductivity of the metal nitride-containing particles in the production of the metal nitride-containing particles are shown in Table 1 in a comprehensive manner.

[含金屬氮化物的粒子P-C3及P-C4的製作] 代替過渡金屬原料使用表1所示之各原料,未添加原子A,除此以外,藉由與含金屬氮化物的粒子P-1相同的方法製作了含金屬氮化物的粒子P-C3及P-C4。 另外,上述含金屬氮化物的粒子的製作中的金屬微粒的平均一次粒徑、含金屬氮化物的粒子的平均一次粒徑及導電率綜合示於表1。[Preparation of metal nitride-containing particles P-C3 and P-C4] Instead of transition metal raw materials, the raw materials shown in Table 1 were used, and atom A was not added. In addition, by combining with metal nitride-containing particles P- 1 The metal nitride-containing particles P-C3 and P-C4 were produced in the same way. In addition, the average primary particle size of the metal fine particles, the average primary particle size and the electrical conductivity of the metal nitride-containing particles in the production of the metal nitride-containing particles are shown in Table 1 in a comprehensive manner.

表1中的過渡金屬原料等及原子A的原料中的各略號如下。The symbols of the transition metal raw materials and the raw materials of atom A in Table 1 are as follows.

・Nb粉:Mituwa Chemistry.製造的鈮(粉末)<100-325mesh> ・V粉:TAIYO KOKO Co., LTD.製造的金屬釩粉末VHO ・Zr粉:Wako Pure Chemical Industries, Ltd.製造的鋯粉末 ・鉭Nodular:Global Advanced Metal製造的鉭Nodular ・Hf粉:Furuuchi Chemical Corporation製造的鉿粉末 ・Y粉:NIPPON YTTRIUM CO., LTD.製造的釔粉末 ・Cr粉:Copyright Kosei Pharmaceutical CO., LTD.製造的脫氣電解金屬鉻粉 ・Re粉:Rhenium Alloys, Inc.製造的錸粉末 ・W粉:Eurotungsten製造的鎢粉末AW3110 ・Al粉:METAL POWDER CO., LTD.製造的鋁粉末No.22000 ・Si粉:Furuuchi Chemical Corporation製造的矽粉末 ・Fe粉:Fe粉JFE STEEL CORPORATION製造的JIP 270M ・Ni粉:Ni粉 Toho Titanium Corporation製造的300奈米品 ・Ag粉:Ag粉Mitsui Mining & Smelting Co., Ltd.製造的SPQ03R・Nb powder: Niobium (powder) manufactured by Mituwa Chemistry. <100-325mesh> ・V powder: Metal vanadium powder VHO manufactured by TAIYO KOKO Co., LTD. ・Zr powder: Zirconium powder manufactured by Wako Pure Chemical Industries, Ltd.・Tantalum Nodular: Tantalum Nodular manufactured by Global Advanced Metal ・Hf powder: Hafnium powder manufactured by Furuchi Chemical Corporation ・Y powder: Yttrium powder manufactured by NIPPON YTTRIUM CO., LTD. ・Cr powder: manufactured by Copyright Kosei Pharmaceutical CO., LTD. Degassed electrolytic metal chromium powder ・Re powder: Rhenium powder manufactured by Rhenium Alloys, Inc. ・W powder: Tungsten powder AW3110 manufactured by Eurotungsten ・Al powder: Aluminum powder No.22000 ・Si manufactured by METAL POWDER CO., LTD. Powder: Silicon powder manufactured by Furuuchi Chemical Corporation ・Fe powder: Fe powder JIP 270M manufactured by JFE STEEL CORPORATION ・Ni powder: Ni powder 300nm product manufactured by Toho Titanium Corporation ・Ag powder: Ag powder Mitsui Mining & Smelting Co., SPQ03R manufactured by Ltd.

另外,以下的表1中的“ppm”表示質量ppm。 並且,表中,“未檢測出”表示藉由上述測定方法測定之結果,未檢測出雜質,具體而言,表示小於20質量ppm。並且,“未添加”表示為添加原子A,“未測定”表示由於未添加上述原子A,因而未進行測定。藉此,“未測定”表示實際上小於20質量ppm(計算上為小於5質量ppm)。In addition, "ppm" in Table 1 below means ppm by mass. In addition, in the table, "not detected" means that no impurities are detected as a result of the measurement by the above-mentioned measuring method, and specifically means that it is less than 20 mass ppm. In addition, "not added" means that the atom A is added, and "not measured" means that the above-mentioned atom A is not added, and therefore the measurement is not performed. By this, "not measured" means that it is actually less than 20 mass ppm (calculated as less than 5 mass ppm).

[表1]

Figure 106109671-A0304-0001
[Table 1]
Figure 106109671-A0304-0001

<分散劑> 作為分散劑,使用了以下結構的分散劑A~C。分散劑A及C中,各結構單元中記載的數值表示相對於所有結構單元之各結構單元的質量%。分散劑B中,各結構單元中記載的文字表示相對於所有結構單元之各結構單元的mol%。<Dispersant> As dispersants, dispersants A to C of the following structures were used. In dispersant A and C, the numerical value described in each structural unit represents the mass% of each structural unit with respect to all structural units. In dispersant B, the characters described in each structural unit indicate the mol% of each structural unit with respect to all structural units.

・分散劑A [化學式21]

Figure 02_image041
・Dispersant A [Chemical formula 21]
Figure 02_image041

・分散劑B [化學式22]

Figure 02_image043
・Dispersant B [Chemical formula 22]
Figure 02_image043

・分散劑C [化學式23]

Figure 02_image045
・Dispersant C [Chemical formula 23]
Figure 02_image045

<黏結樹脂> 作為黏結樹脂,使用了以下樹脂A及樹脂B。以下,分別示出樹脂A及樹脂B的結構。樹脂A及樹脂B中,各結構單元中記載的數字表示相對於所有結構單元之各結構單元的mol%。<Binder Resin> As the binder resin, the following resin A and resin B were used. Hereinafter, the structures of resin A and resin B are shown respectively. In resin A and resin B, the number described in each structural unit represents the mol% of each structural unit with respect to all structural units.

・樹脂A:Akurikyua RD-F8(商品名、NIPPON SHOKUBAI CO., LTD.製造) [化學式24]

Figure 02_image047
・Resin A: Akurikiyua RD-F8 (trade name, manufactured by NIPPON SHOKUBAI CO., LTD.) [Chemical formula 24]
Figure 02_image047

・樹脂B [化學式25]

Figure 02_image049
・Resin B [Chemical formula 25]
Figure 02_image049

上述樹脂B的式中,各略號表示以下內容。 BzMA:甲基丙烯酸芐酯 MMA:甲基丙烯酸甲酯 HEMA:甲基丙烯酸-2-羥基乙酯In the formula of the resin B, each abbreviation indicates the following. BzMA: Benzyl methacrylate MMA: Methyl methacrylate HEMA: 2-hydroxyethyl methacrylate

<聚合性化合物> ・聚合性化合物M1:二季戊四醇六丙烯酸酯(Nippon Kayaku CO., LTD.製造、商品名“KAYARAD”、參閱下述式) [化學式26]

Figure 02_image051
<Polymerizable compound> ・Polymerizable compound M1: Dipentaerythritol hexaacrylate (manufactured by Nippon Kayaku CO., LTD., trade name "KAYARAD", see the following formula) [Chemical formula 26]
Figure 02_image051

・聚合性化合物M2:PET-30(季戊四醇三丙烯酸酯、Nippon Kayaku CO., LTD.製造)・Polymerizable compound M2: PET-30 (pentaerythritol triacrylate, manufactured by Nippon Kayaku CO., LTD.)

<聚合起始劑> ・OXE-02:Irgacure OXE02(商品名、BASF Japan Ltd製造)<Polymerization initiator> ・OXE-02: Irgacure OXE02 (trade name, manufactured by BASF Japan Ltd)

<聚合抑制劑> ・PMF:對甲氧基苯酚<Polymerization inhibitor> ・PMF: p-methoxyphenol

<界面活性劑> ・F-556:Megafac F-556(DIC CORPORATION製造)<Surface active agent> ・F-556: Megafac F-556 (manufactured by DIC CORPORATION)

<有機溶劑> ・PGMEA:丙二醇單甲醚乙酸酯 ・CPN:環戊酮 ・乙酸Bu:乙酸丁酯<Organic solvent> ・PGMEA: Propylene glycol monomethyl ether acetate ・CPN: Cyclopentanone ・Bu acetate: butyl acetate

[含金屬氮化物的粒子分散液的製備] 首先,藉由攪拌機(IKA Works GmbH & CO. KG製造EUROSTAR),將含金屬氮化物的粒子、分散劑及有機溶劑混合15分鐘來獲得了上述成分的混合液。接著,對所獲得之混合液,使用SHINMARU ENTERPRISES CORPORATION製造的NPM-Pilot,在下述條件下進行分散處理來獲得了含金屬氮化物的粒子分散液。另外,以分散劑相對於含金屬氮化物的粒子之質量比(D/P)成為表3的實施例及比較例所示之值之方式進行了添加。[Preparation of metal nitride-containing particle dispersion] First, with a blender (EUROSTAR manufactured by IKA Works GmbH & CO. KG), the metal nitride-containing particles, dispersant, and organic solvent were mixed for 15 minutes to obtain the above components的mixture. Next, using NPM-Pilot manufactured by SHINMARU ENTERPRISES CORPORATION, the obtained mixed liquid was subjected to dispersion treatment under the following conditions to obtain a metal nitride-containing particle dispersion liquid. In addition, it was added so that the mass ratio (D/P) of the dispersant to the metal nitride-containing particles became the values shown in the Examples and Comparative Examples in Table 3.

<分散條件> ・微珠徑:φ0.05mm、(NIKKATO CORPORATION製造氧化鋯珠、YTZ) ・微珠填充率:65體積% ・研磨圓周速度:10m/sec ・分離器圓周速度:13m/s ・進行分散處理之混合液量:15kg ・循環流量(泵供給量):90kg/hour ・處理液溫度:19~21℃ ・冷卻水:水 ・處理時間:22小時左右<Dispersion conditions> ・Bead diameter: φ0.05mm, (Zirconium oxide beads, YTZ manufactured by NIKKATO CORPORATION) ・Bead filling rate: 65% by volume ・Grinding peripheral speed: 10m/sec ・Separator peripheral speed: 13m/s ・Mixed liquid volume for dispersion treatment: 15kg ・Circulation flow rate (pump supply volume): 90kg/hour ・Processing liquid temperature: 19~21℃ ・Cooling water: water ・Treatment time: about 22 hours

[組成物的製備] 接著,混合並攪拌上述含金屬氮化物的粒子分散液、黏結樹脂、聚合性化合物、聚合起始劑、聚合抑制劑及界面活性劑,獲得了下述表2及3所示之實施例及比較例的各組成物。另外,表2中的各成分的含量均為質量%。[Preparation of composition] Next, the above-mentioned metal nitride-containing particle dispersion, binder resin, polymerizable compound, polymerization initiator, polymerization inhibitor, and surfactant were mixed and stirred to obtain the following Tables 2 and 3 The compositions of the examples and comparative examples are shown. In addition, the content of each component in Table 2 is mass %.

[表2][Table 2]

<組成物中的水分量的測定> 關於實施例及比較例的各組成物的水分量,藉由以Karl Fischer 方法作為測定原理之MKV-710(商品名、KYOTO ELECTRONICS INDUSTRY CO., LTD.製造)進行了測定。將結果示於表3。<Measurement of the moisture content in the composition> The moisture content of each composition in the examples and comparative examples was measured by MKV-710 (trade name, manufactured by KYOTO ELECTRONICS INDUSTRY CO., LTD.) based on the Karl Fischer method. ) Was measured. The results are shown in Table 3.

[評價試驗] 對實施例及比較例的各組成物進行了以下的各評價試驗。將結果綜合示於表3。[Evaluation Test] The following evaluation tests were performed on each composition of the Examples and Comparative Examples. The results are summarized in Table 3.

〔OD值〕 在厚度0.7mm、10cm方形的玻璃板(EagleXG,Corning Incorporated製造)上,使用各組成物,藉由旋轉塗佈形成了塗膜。此時,依據各組成物的固體成分濃度,以膜厚成為1.5μm之方式調整了轉速。將所形成之塗膜,在加熱板上藉由100℃、2分鐘的熱處理使其乾燥,從而獲得了硬化膜。對含有所獲得之硬化膜之基板,藉由分光光度計U-4100(Hitachi High-Technologies Corporation.製造)測定了OD值。OD值越大,硬化膜越具有優異之遮光性。另外,藉由以下基準進行了評價。實際使用中,“C”以上為較佳。 A:OD值超過4 B:OD值超過3且為4以下 C:OD值超過2且為3以下 D:OD值為2以下[OD value] On a square glass plate (EagleXG, manufactured by Corning Incorporated) with a thickness of 0.7 mm and 10 cm, each composition was used to form a coating film by spin coating. At this time, in accordance with the solid content concentration of each composition, the rotation speed was adjusted so that the film thickness became 1.5 μm. The formed coating film was dried by a heat treatment at 100°C for 2 minutes on a hot plate to obtain a cured film. For the substrate containing the obtained cured film, the OD value was measured with a spectrophotometer U-4100 (manufactured by Hitachi High-Technologies Corporation). The greater the OD value, the more excellent the light-shielding property of the cured film is. In addition, evaluation was performed based on the following criteria. In actual use, "C" or higher is preferred. A: OD value exceeds 4 B: OD value exceeds 3 and is 4 or less C: OD value exceeds 2 and is 3 or less D: OD value is 2 or less

〔經時穩定性〕 向φ50mm且容量100mL的容器,添加100mL的含金屬氮化物的粒子分散液,在室溫下靜置9分鐘。靜置之後,抽取上清液1cm量的含金屬氮化物的粒子分散液,藉由蒸乾測定了其固體成分濃度。藉由下述式計算出靜置前後的含金屬氮化物的粒子分散液的固體成分的變化率,並且藉由下述基準評價了其值。實際使用中,“C”以上為較佳。 (式)固體成分變化率=(初始固體成分濃度)-(上清液1cm量的固體成分濃度) A:固體成分變化率小於3% B:固體成分變化率為3%以上且小於7% C:固體成分變化率為7%以上且小於12% D:固體成分變化率為12%以上[Stability with time] To a container having a diameter of 50 mm and a capacity of 100 mL, 100 mL of the metal nitride-containing particle dispersion was added, and the mixture was allowed to stand at room temperature for 9 minutes. After standing still, 1 cm of the supernatant liquid was extracted from the metal nitride-containing particle dispersion liquid, and the solid content concentration was measured by evaporation to dryness. The rate of change in the solid content of the metal nitride-containing particle dispersion before and after the standing was calculated by the following formula, and the value was evaluated by the following criteria. In actual use, "C" or higher is preferred. (Formula) Solid content change rate = (initial solid content concentration)-(solid content concentration of 1 cm of supernatant) A: The solid content change rate is less than 3% B: The solid content change rate is 3% or more and less than 7% C : The rate of change of solid content is 7% or more and less than 12% D: The rate of change of solid content is 12% or more

〔顆粒數〕 製備藉由PGMEA將上述組成物稀釋成500倍之試料溶液,藉由流式粒子圖像分析裝置(商品名“FPIA”、Malvern Instruments Ltd製造),測定了該試料溶液10ml中包含之10μm以上尺寸的含金屬氮化物的粒子的數量。藉由以下基準進行了評價。實際使用中,“C”以上為較佳。 A:顆粒數為3個以下 B:顆粒數為4~10個 C:顆粒數為11~20個 D:顆粒數為21個以上[Number of particles] A sample solution was prepared by diluting the above composition 500 times by PGMEA, and measured by a flow-type particle image analyzer (trade name "FPIA", manufactured by Malvern Instruments Ltd), and the sample solution contained in 10 ml The number of metal nitride-containing particles with a size of 10μm or more. The evaluation was performed based on the following criteria. In actual use, "C" or higher is preferred. A: The number of particles is 3 or less B: The number of particles is 4-10 C: The number of particles is 11-20 D: The number of particles is 21 or more

〔解像性〕 在8英寸的矽基板上塗佈上述組成物來製作了塗膜。塗膜的製作利用Tokyo Electron Limited製造的Coater Developer ACT8進行,依據各組成物的固體成分濃度,以膜厚成為1.5μm之方式調整了轉速。對所獲得之塗膜,作為預烘處理,利用加熱板進行100℃、2分鐘的熱處理。對上述預烘後的附帶塗膜的基板,利用i射線步進機(Canon Inc.製造FPA3000i5+),通過形成有10μm寬度的島狀圖案之光罩,對上述塗膜進行了曝光(負)。對曝光後的塗膜,利用Tokyo Electron Limited製造的Coater Developer ACT8,作為顯影液使用CD-2060(FUJIFILM Electronic Materials CO., LTD.製造),進行30秒鐘的旋覆浸沒顯影,顯影之後藉由純水進行了沖洗處理。對顯影後的塗膜進行後烘(溫度:220℃、時間:10分鐘)。藉由測長SEM(Scanning Electron Microscope)測定了後烘後的塗膜的圖案形狀。具體而言,測定島狀的寬度,並藉由以下基準進行了評價。實際使用中,“C”以上為較佳。 A:島狀的寬度為9.5μm~10.5μm B:島狀的寬度為8μm以上且小於9.5μm、或超過10.5μm且為12μm以下 C:島狀的寬度為小於8μm或超過12μm D:圖案剝落或因顯影不足而未形成島狀。[Resolution] The above composition was applied on an 8-inch silicon substrate to produce a coating film. The coating film was produced using Coater Developer ACT8 manufactured by Tokyo Electron Limited, and the rotation speed was adjusted so that the film thickness became 1.5 μm in accordance with the solid content concentration of each composition. The obtained coating film was subjected to a heat treatment at 100°C for 2 minutes on a hot plate as a pre-baking treatment. The pre-baked substrate with a coating film was exposed (negatively) by using an i-ray stepper (FPA3000i5+ manufactured by Canon Inc.) through a mask formed with an island pattern with a width of 10 μm. For the exposed coating film, use Coater Developer ACT8 manufactured by Tokyo Electron Limited and CD-2060 (manufactured by FUJIFILM Electronic Materials CO., LTD.) as a developer. Perform spin immersion development for 30 seconds. The pure water was rinsed. Post-baking the developed coating film (temperature: 220°C, time: 10 minutes). The pattern shape of the post-baked coating film was measured by SEM (Scanning Electron Microscope). Specifically, the width of the island shape was measured and evaluated based on the following criteria. In actual use, "C" or higher is preferred. A: The width of the island shape is 9.5 μm to 10.5 μm B: The width of the island shape is 8 μm or more and less than 9.5 μm, or more than 10.5 μm and 12 μm or less C: The width of the island shape is less than 8 μm or more than 12 μm D: Pattern peeling Or the islands are not formed due to insufficient development.

〔電極的防腐性〕 使用組成物,在圖像感測裝置基板上藉由旋轉塗佈形成了塗佈膜。將塗佈膜,在加熱板上以100℃、2min的條件進行了預烘處理。對預烘處理後的基板,利用i射線曝光装置(FPA3000i5+、Canon Inc.製造),在基板上的受光部外周部分形成切割線及包覆電極部以外之遮光層。而且,利用加熱板進行了220℃、5min的加熱處理(後烘製程)。遮光膜形成處理之後,將基板在130℃、相對濕度90%的條件下暴露7天之後,藉由接合線形成了配線。藉由Canon Machinery Inc.製造的接合線檢査装置評價了斷線的產生。所評價之晶片為50個,每一晶片的配線數為40。評價藉由以下的基準進行。實際使用中,“C”以上為較佳。 A:斷線為1個以下 B:斷線為2個以上且小於5個 C:斷線為5個以上且小於10個 D:斷線為10個以上[Corrosion resistance of electrode] Using the composition, a coating film was formed on the substrate of the image sensor device by spin coating. The coated film was pre-baked on a hot plate at 100°C for 2 minutes. For the pre-baked substrate, an i-ray exposure device (FPA3000i5+, manufactured by Canon Inc.) was used to form a cutting line and a light shielding layer other than the coated electrode on the outer periphery of the light-receiving part on the substrate. Moreover, the heating plate was used for heating treatment (post-baking process) at 220°C for 5 minutes. After the light-shielding film formation process, the substrate was exposed to conditions of 130° C. and a relative humidity of 90% for 7 days, and then wiring was formed by bonding wires. The occurrence of wire breakage was evaluated by a bonding wire inspection device manufactured by Canon Machinery Inc. The number of chips evaluated was 50, and the number of wires per chip was 40. The evaluation was performed based on the following criteria. In actual use, "C" or higher is preferred. A: The number of broken wires is less than 1 B: The number of broken wires is more than 2 and less than 5 C: The broken wires are more than 5 and less than 10 D: The broken wires are more than 10

[表3]

Figure 106109671-A0304-0003
[table 3]
Figure 106109671-A0304-0003

從表3所示之結果可知,使用含金屬氮化物的粒子含有在3~11族的過渡金屬中除鈦以外的過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物之實施例1~32的組成物來製作之硬化膜(遮光膜)具有優異之遮光性、優異之解像性及優異之電極的防腐性。另一方面,使用比較例1~5的組成物來製作之硬化膜(遮光膜)未獲得所希望的效果。 並且,使用過渡金屬分別係鈮、釩、鉭、釔、鉻、錸或鎢之實施例3、8、10、12、13、14及15的組成物來製作之硬化膜(遮光膜)具有比使用過渡金屬係鋯或鉿之實施例9或11的組成物來製作之硬化膜(遮光膜)更優異之OD值(遮光性)。其中,使用過渡金屬分別係鈮或釩之實施例3或8的組成物來製作之硬化膜(遮光膜)具有進一步優異之OD值。 並且,固體成分為10~40質量%之實施例21的組成物與固體成分超過40質量%的實施例22的組成物相比,顆粒數更少。 並且,水的含量為0.1~1質量%之實施例23的組成物與超過1質量%的實施例24的組成物相比,顆粒數更少。 並且,含金屬氮化物的粒子的含量相對於組成物的總固體成分為20~70質量%之實施例2的組成物與小於20質量%之實施例29的組成物相比,具有更優異之經時穩定性。並且,上述實施例2的組成物與超過70質量%之實施例28的組成物相比,顆粒數更少,並且,所獲得之硬化膜(遮光膜)具有更優異之解像性。 並且,分散劑相對於含金屬氮化物的粒子之質量比為0.05~0.30之實施例2的組成物與上述質量比小於0.05之實施例32的組成物相比,具有更優異之經時穩定性。並且,使用實施例2的組成物來製作之硬化膜(遮光膜)與使用實施例18的組成物來製作之硬化膜(遮光膜)相比,具有更優異之解像性。From the results shown in Table 3, it can be seen that the particles containing metal nitrides contain transition metals other than titanium among the transition metals of groups 3 to 11 and have an electronegativity of 1.22 to 2.36 in Example 1 The cured film (light-shielding film) made from the composition of ~32 has excellent light-shielding properties, excellent resolution, and excellent electrode corrosion resistance. On the other hand, the cured film (light-shielding film) produced using the compositions of Comparative Examples 1 to 5 did not achieve the desired effect. In addition, the cured film (light-shielding film) produced by using the composition of Examples 3, 8, 10, 12, 13, 14 and 15 of the transition metal-based niobium, vanadium, tantalum, yttrium, chromium, rhenium or tungsten, respectively The cured film (light-shielding film) produced using the composition of Example 9 or 11 of transition metal-based zirconium or hafnium has a more excellent OD value (light-shielding property). Among them, the cured film (light-shielding film) produced using the composition of Examples 3 or 8 in which the transition metal is niobium or vanadium, respectively, has a further excellent OD value. In addition, the composition of Example 21 having a solid content of 10 to 40% by mass has a smaller number of particles than the composition of Example 22 having a solid content of more than 40% by mass. In addition, the composition of Example 23 having a water content of 0.1 to 1% by mass has a smaller number of particles than the composition of Example 24 having a water content of more than 1% by mass. In addition, the composition of Example 2 in which the content of metal nitride-containing particles is 20 to 70% by mass relative to the total solid content of the composition is more excellent than the composition of Example 29, which is less than 20% by mass. Stability over time. In addition, the composition of Example 2 described above has fewer particles than the composition of Example 28 that exceeds 70% by mass, and the cured film (light-shielding film) obtained has more excellent resolution. In addition, the composition of Example 2 in which the mass ratio of the dispersant to the metal nitride-containing particles is 0.05 to 0.30 has better stability over time than the composition of Example 32 in which the mass ratio is less than 0.05. . In addition, the cured film (light-shielding film) produced using the composition of Example 2 has better resolution than the cured film (light-shielding film) produced using the composition of Example 18.

[含金屬氮化物的粒子P-1(A)的製作及評價] 藉由以下方法製作了含金屬氮化物的粒子P-1(A),該含金屬氮化物的粒子P-1(A)為對藉由上述方法製作而成之含金屬氮化物的粒子P-1的表面包覆氫氧化鋁而成者。 首先,將含金屬氮化物的粒子P-1稱重100g,並添加到750mL的純水中,使其良好地分散來獲得了漿料。接著,向將作為氧化鋁的濃度10質量%的氯化鋁水溶液220g及尿素160g溶解於500mL水之溶液,添加上述漿料並均勻混合來獲得了混合物。以90℃將該混合物加熱8小時,並冷卻至室溫。過濾冷卻後的混合物,之後進行水洗,在110℃下乾燥24小時之後,進一步以600℃燒成5小時,從而獲得了含金屬氮化物的粒子P-1的表面被氫氧化鋁包覆之含金屬氮化物的粒子P-1(A)。上述含金屬氮化物的粒子P-1(A)的平均一次粒徑為13nm,導電率為100S/m。 接著,使用含金屬氮化物的粒子P-1(A),藉由與上述實施例1相同的方法,製作了分散液及組成物,對OD值、解像性、電極的腐食性、經時穩定性及顆粒進行了評價,其結果,為與使用含金屬氮化物的粒子P-1之實施例1相同的結果。[Preparation and evaluation of metal nitride-containing particle P-1 (A)] The metal nitride-containing particle P-1 (A) was prepared by the following method, and the metal nitride-containing particle P-1 (A) It is obtained by coating the surface of the metal nitride-containing particle P-1 produced by the above method with aluminum hydroxide. First, 100 g of metal nitride-containing particles P-1 was weighed, and added to 750 mL of pure water, and dispersed well to obtain a slurry. Next, to a solution prepared by dissolving 220 g of an aluminum chloride aqueous solution with a concentration of 10% by mass of aluminum oxide and 160 g of urea in 500 mL of water, the slurry was added and uniformly mixed to obtain a mixture. The mixture was heated at 90°C for 8 hours and cooled to room temperature. The cooled mixture was filtered, washed with water, dried at 110°C for 24 hours, and then fired at 600°C for 5 hours to obtain a metal nitride-containing particle P-1 whose surface was coated with aluminum hydroxide. Metal nitride particles P-1 (A). The average primary particle diameter of the metal nitride-containing particle P-1 (A) was 13 nm, and the electrical conductivity was 100 S/m. Next, using the metal nitride-containing particles P-1 (A), the dispersion and composition were prepared by the same method as in Example 1 above, and the OD value, resolution, corrosion resistance of the electrode, and time-dependent The stability and particles were evaluated. As a result, the results were the same as those of Example 1 using metal nitride-containing particles P-1.

[含金屬氮化物的粒子P-2(A)~P-15(A)的製作及評價] 藉由與上述含金屬氮化物的粒子P-1(A)相同的方法,使用含金屬氮化物的粒子P-2~P-15,製作了含金屬氮化物的粒子P-2(A)~P-15(A)。將各個平均一次粒徑及導電率示於表4。 接著,使用含金屬氮化物的粒子P-2(A)~P-15(A),藉由與上述實施例2~32相同的方法,製作分散液及組成物,對OD值、解像性、電極的腐食性、經時穩定性及顆粒進行了評價,其結果,分別為與使用含金屬氮化物的粒子P-2~P-15之實施例2~32結果相同。[Preparation and evaluation of metal nitride-containing particles P-2(A) to P-15(A)] By the same method as the above-mentioned metal nitride-containing particle P-1(A), metal-containing nitride was used Particles P-2 to P-15 of, and metal nitride-containing particles P-2(A) to P-15(A) were produced. Table 4 shows each average primary particle size and conductivity. Next, using metal nitride-containing particles P-2 (A) to P-15 (A), the dispersion and composition were prepared by the same method as in Examples 2 to 32 above, and the OD value and resolution The corrosion resistance, stability over time, and particles of the electrode were evaluated. The results were the same as the results of Examples 2 to 32 using metal nitride-containing particles P-2 to P-15, respectively.

[表4]

Figure 106109671-A0304-0004
[Table 4]
Figure 106109671-A0304-0004

實施例1中,將聚合起始劑從OXE-02替代為Irgacure OXE03(商品名、BASF公司製造),除此以外,藉由相同的方法進行了評價,其結果,得知可獲得與實施例1相同的結果。而且,與實施例1相比,相對於曝光量之鲁棒較廣,即使在減少曝光量時,亦能夠維持解像性。In Example 1, the polymerization initiator was replaced with Irgacure OXE03 (trade name, manufactured by BASF Corporation) from OXE-02. Except for this, the same method was used for evaluation. As a result, it was found that 1 The same result. Moreover, compared with Example 1, the robustness with respect to the exposure amount is wider, and the resolution can be maintained even when the exposure amount is reduced.

實施例1中,將聚合起始劑從OXE-02替代為Adeka Arkls NCI-831(ADEKA CORPORATION製造),除此以外,藉由相同的方法進行了評價,其結果,得知可獲得與實施例1相同的結果。而且,與實施例1相比,相對於曝光量之鲁棒較廣,即使在減少曝光量時,亦能夠維持了解像性。In Example 1, the polymerization initiator was replaced from OXE-02 to Adeka Arkls NCI-831 (manufactured by ADEKA CORPORATION). Except for this, the evaluation was carried out by the same method. As a result, it was found that the same as in the examples can be obtained. 1 The same result. Moreover, compared with Example 1, the robustness with respect to the exposure amount is wider, and the visibility can be maintained even when the exposure amount is reduced.

實施例1中,將聚合性化合物從聚合性化合物M1替代為聚合性化合物M2,除此以外,藉由相同的方法進行了評價,其結果得知可獲得與實施例1相同的結果。In Example 1, the polymerizable compound was replaced from the polymerizable compound M1 to the polymerizable compound M2, and the evaluation was performed by the same method except for this. As a result, it was found that the same results as in Example 1 were obtained.

實施例1中,將聚合性化合物從聚合性化合物M1,在不改變相對於所有各組成物之聚合性化合物的含量之前提下,替代為聚合性化合物M1及M2的混合物(質量比1:1),除此以外,藉由相同的方法進行了評價,其結果,得知可獲得與實施例1相同的結果。In Example 1, the polymerizable compound was changed from the polymerizable compound M1 to a mixture of polymerizable compounds M1 and M2 (mass ratio 1:1 without changing the content of the polymerizable compound relative to all the components). Except for this, the evaluation was carried out by the same method, and as a result, it was found that the same result as in Example 1 was obtained.

實施例1中,代替溶劑CPN使用了PGMEA,除此以外,藉由相同的方法進行了評價,其結果,得知可獲得與實施例1相同的結果。In Example 1, PGMEA was used instead of the solvent CPN, and the evaluation was carried out by the same method except for this. As a result, it was found that the same results as in Example 1 were obtained.

實施例1中,代替溶劑CPN及乙酸Bu使用了PGMEA,除此以外,藉由相同的方法進行了評價,其結果,得知可獲得與實施例1相同的結果。In Example 1, PGMEA was used instead of the solvent CPN and Bu acetic acid, and the evaluation was performed by the same method. As a result, it was found that the same results as in Example 1 were obtained.

實施例1中,未使用界面活性劑F-556,除此以外,藉由相同的方法進行了評價。評價結果,得知可獲得與實施例1相同的結果。In Example 1, the surfactant F-556 was not used, and the evaluation was performed by the same method except that. As a result of the evaluation, it was found that the same results as in Example 1 were obtained.

實施例1中,未使用聚合抑制劑PMF,除此以外,藉由相同的方法進行了評價。評價結果,得知可獲得與實施例1相同的結果。In Example 1, the polymerization inhibitor PMF was not used, and the evaluation was performed by the same method except that. As a result of the evaluation, it was found that the same results as in Example 1 were obtained.

<碳黑分散物(CB分散液)的製備> 上述顏料分散物的製備中,代替含金屬氮化物的粒子,使用了碳黑(商品名“Color Black S170”、Degussa-Hüls AG製造、平均一次粒徑17nm、BET比表面積200m2 /g、藉由氣黑方式製造之碳黑),除此以外,藉由與上述相同的方法製作分散物來獲得了碳黑分散物。<Preparation of Carbon Black Dispersion (CB Dispersion)> In the preparation of the above-mentioned pigment dispersion, instead of metal nitride-containing particles, carbon black (trade name "Color Black S170", manufactured by Degussa-Hüls AG, average one time) was used. A particle size of 17 nm, a BET specific surface area of 200 m 2 /g, and carbon black produced by a gas black method), except that the dispersion was prepared by the same method as above to obtain a carbon black dispersion.

實施例1的組成物的製備中,代替以在組成物中含有21質量%的含金屬氮化物的粒子P-1之方式添加之含金屬氮化物的粒子分散液,使用了含有含金屬氮化物的粒子P-1之含金屬氮化物的粒子分散液與上述CB分散液的混合物[組成物中的含金屬氮化物的粒子P-1:組成物的碳黑=5:2(質量比)。組成物中的含金屬氮化物的粒子P-1與碳黑的總計含量為21質量%。],除此以外,藉由相同的方法製作組成物,並用其進行了評價。評價結果,成為與實施例1相同的OD值,得知可獲得與實施例1相同的遮光性。In the preparation of the composition of Example 1, instead of the metal nitride-containing particle dispersion added to contain 21% by mass of the metal nitride-containing particles P-1 in the composition, a metal-containing nitride-containing particle dispersion was used. A mixture of the metal nitride-containing particle dispersion liquid of the particles P-1 and the above-mentioned CB dispersion liquid [metal nitride-containing particle P-1 in the composition: carbon black of the composition=5:2 (mass ratio). The total content of the metal nitride-containing particles P-1 and carbon black in the composition was 21% by mass. ], other than that, the composition was produced by the same method and evaluated. As a result of the evaluation, the OD value was the same as that of Example 1, and it was found that the same light shielding property as that of Example 1 was obtained.

<彩色顏料分散物(PY分散液)的製備> 上述含金屬氮化物的粒子分散液的製備中,代替含金屬氮化物的粒子,使用了顏料黃150(Hangzhou Star-up Pigment Co., Ltd.製、商品名6150顏料黄5GN),除此以外,藉由相同的方法獲得了彩色顏料分散物(PY分散液)。<Preparation of color pigment dispersion (PY dispersion)> In the preparation of the metal nitride-containing particle dispersion, instead of metal nitride-containing particles, Pigment Yellow 150 (Hangzhou Star-up Pigment Co., Ltd. Product, trade name 6150 Pigment Yellow 5GN), except for this, a color pigment dispersion (PY dispersion) was obtained by the same method.

實施例1的組成物的製備中,代替以組成物中含有21質量%的含金屬氮化物的粒子P-1之方式添加之含金屬氮化物的粒子分散液,使用了含有含金屬氮化物的粒子P-1之顏料分散液與上述PY分散液的混合物[組成物中的含金屬氮化物的粒子P-1:組成物中的顏料黃150=6:1(質量比)。組成物中的含金屬氮化物的粒子P-1與顏料黃150的總計含量為21質量%。],除此以外,藉由相同的方法製備組成物,並用該組成物進行了評價。評價結果,成為與實施例1相同的OD值,得知可獲得與實施例1相同的遮光性,可獲得黑色更濃之膜。In the preparation of the composition of Example 1, instead of the metal nitride-containing particle dispersion added so that the composition contained 21% by mass of the metal nitride-containing particles P-1, a metal-containing nitride-containing particle dispersion was used A mixture of the pigment dispersion of the particle P-1 and the above-mentioned PY dispersion [the metal nitride-containing particle P-1 in the composition: the pigment yellow in the composition 150=6:1 (mass ratio). The total content of the metal nitride-containing particles P-1 and Pigment Yellow 150 in the composition was 21% by mass. ], except for this, the composition was prepared by the same method, and the composition was evaluated. As a result of the evaluation, the OD value was the same as that of Example 1, and it was found that the same light shielding property as that of Example 1 was obtained, and a darker black film was obtained.

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Claims (22)

一種組成物,其含有包含原子A之含金屬氮化物的粒子,前述含金屬氮化物的粒子含有在3~11族的過渡金屬中除鈦以外的過渡金屬且電負性為1.22~2.36之過渡金屬的氮化物,前述原子A係與構成前述過渡金屬的氮化物之過渡金屬不同之元素,且係選自由硼、鋁、矽、錳、鐵、鎳及銀所組成的群組中的至少1種,前述含金屬氮化物的粒子中的前述原子A的含量為0.00005~10質量%。 A composition containing a metal nitride-containing particle containing atom A. The aforementioned metal-nitride-containing particle contains a transition metal other than titanium among the transition metals of groups 3 to 11 and has an electronegativity of 1.22 to 2.36. Nitride of the metal, the atom A is an element different from the transition metal constituting the nitride of the transition metal, and is at least 1 selected from the group consisting of boron, aluminum, silicon, manganese, iron, nickel, and silver The content of the atom A in the metal nitride-containing particle is 0.00005 to 10% by mass. 如申請專利範圍第1項所述之組成物,其中前述含金屬氮化物的粒子的導電率為100×104~600×104S/m。 The composition described in item 1 of the scope of patent application, wherein the conductivity of the aforementioned metal nitride-containing particles is 100×10 4 to 600×10 4 S/m. 如申請專利範圍第1項或第2項所述之組成物,其中前述含金屬氮化物的粒子的平均一次粒徑為10~50nm。 The composition described in item 1 or item 2 of the scope of patent application, wherein the average primary particle size of the aforementioned metal nitride-containing particles is 10-50nm. 如申請專利範圍第1項或第2項所述之組成物,其還含有黏結樹脂。 Such as the composition described in item 1 or item 2 of the scope of patent application, it also contains a binding resin. 如申請專利範圍第4項所述之組成物,其中前述黏結樹脂相對於前述含金屬氮化物的粒子的質量比為0.3以下。 The composition according to item 4 of the scope of patent application, wherein the mass ratio of the aforementioned binder resin to the aforementioned metal nitride-containing particles is 0.3 or less. 如申請專利範圍第1項或第2項所述之組成物,其中前述過渡金屬係選自由V、Cr、Y、Zr、Nb、Hf、Ta、W及Re所組成的群組中的至少1種。 The composition described in item 1 or item 2 of the scope of patent application, wherein the aforementioned transition metal is at least 1 selected from the group consisting of V, Cr, Y, Zr, Nb, Hf, Ta, W, and Re Kind. 如申請專利範圍第1項或第2項所述之組成物,其中前述過渡金屬係選自由V及Nb所組成的群組中的至少1種。 The composition described in item 1 or item 2 of the scope of patent application, wherein the aforementioned transition metal is at least one selected from the group consisting of V and Nb. 如申請專利範圍第1項或第2項所述之組成物,其還含有聚合性化合物。 The composition described in item 1 or item 2 of the scope of the patent application further contains a polymerizable compound. 如申請專利範圍第1項或第2項所述之組成物,其還含有聚合起始劑。 The composition described in item 1 or item 2 of the scope of the patent application further contains a polymerization initiator. 如申請專利範圍第1項或第2項所述之組成物,其還含有溶劑,且固體成分為10~40質量%。 The composition described in item 1 or item 2 of the scope of the patent application further contains a solvent and has a solid content of 10-40% by mass. 如申請專利範圍第10項所述之組成物,其中前述溶劑含有水,前述水的含量相對於前述組成物的總質量為0.1~1質量%。 The composition described in item 10 of the scope of patent application, wherein the solvent contains water, and the content of the water is 0.1 to 1% by mass relative to the total mass of the composition. 如申請專利範圍第1項或第2項所述之組成物,其中前述含金屬氮化物的粒子的含量相對於前述組成物的總固體成分為20~70質量%。 The composition described in item 1 or item 2 of the scope of patent application, wherein the content of the metal nitride-containing particles is 20 to 70% by mass relative to the total solid content of the composition. 如申請專利範圍第1項或第2項所述之組成物,其還含有分散劑,前述分散劑含有選自由聚丙烯酸甲酯、聚甲基丙烯酸甲酯及環狀或鏈狀的聚酯所組成的群組中的至少1種結構。 The composition described in item 1 or item 2 of the scope of the patent application further contains a dispersant, and the aforementioned dispersant contains polymethyl acrylate, polymethyl methacrylate, and cyclic or chain polyesters. At least one structure in the group. 如申請專利範圍第13項所述之組成物,其中前述分散劑相對於前述含金屬氮化物的粒子之質量比為0.05~0.30。 The composition described in item 13 of the scope of patent application, wherein the mass ratio of the dispersant to the metal nitride-containing particles is 0.05 to 0.30. 如申請專利範圍第1項或第2項所述之組成物,其中前述含金屬氮化物的粒子係被含有氫氧化鋁之無機化合物包覆之含金屬氮化物的粒子。 The composition according to item 1 or item 2 of the scope of patent application, wherein the aforementioned metal nitride-containing particles are metal nitride-containing particles coated with an inorganic compound containing aluminum hydroxide. 如申請專利範圍第1項或第2項所述之組成物,其中前述含金屬氮化物的粒子中的前述原子A的含量為0.005~10質量%。 The composition described in item 1 or item 2 of the scope of the patent application, wherein the content of the atom A in the metal nitride-containing particles is 0.005-10% by mass. 一種組成物的製造方法,其為製造申請專利範圍第1項至第16項中任一項所述之組成物的製造方法, 其含有藉由熱電漿法獲得前述含金屬氮化物的粒子之製程,前述藉由熱電漿法獲得前述含金屬氮化物的粒子之製程依次含有下述製程A、製程B、製程C、製程A3-1、製程A3-2、製程A3-3、製程A2、製程D、製程E及製程F,其中,下述一系列製程中,可替換前述製程A~C及前述製程A3-1~A3-3的順序,製程A:向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程;製程B:向前述電漿炬內的前述熱電漿火焰供給含有前述過渡金屬之金屬原料粉末,使前述原料金屬粉末蒸發來獲得氣相的原料金屬之製程;製程C:冷卻前述氣相的原料金屬來獲得含有前述過渡金屬之金屬微粒之製程;製程A3-1:向電漿炬內供給不含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程;製程A3-2:向前述電漿炬內的前述熱電漿火焰供給含有前述原子A之原料粉末,使前述原料粉末蒸發來獲得氣相的原子A之製程;製程A3-3:冷卻前述氣相的原子A來獲得被微粒化之原子A之製程;製程A2:向前述金屬微粒混合前述被微粒化之原子A之製程;製程D:向電漿炬內供給含有氮氣之惰性氣體作為電漿氣體來產生熱電漿火焰之製程;製程E:向前述電漿炬內的前述熱電漿火焰供給前述製程A2.中得到的前述金屬微粒,使前述金屬微粒蒸發來獲得氣相的原料金屬之製程; 製程F:冷卻前述氣相的原料金屬來獲得前述含金屬氮化物的粒子之製程。 A method for manufacturing a composition, which is a method for manufacturing the composition described in any one of items 1 to 16 in the scope of the patent application, It includes a process for obtaining the aforementioned metal nitride-containing particles by the thermoplasma method, and the aforementioned process for obtaining the aforementioned metal nitride-containing particles by the thermoplasma method sequentially includes the following process A, process B, process C, and process A3- 1. Process A3-2, Process A3-3, Process A2, Process D, Process E, and Process F. Among the following series of processes, the aforementioned processes A~C and the aforementioned processes A3-1~A3-3 can be replaced The sequence of process A: the process of supplying the plasma torch with an inert gas that does not contain nitrogen as the plasma gas to generate a thermoplasma flame; Process B: the process of supplying the thermal plasma flame in the plasma torch with the transition metal Metal raw material powder, the process of evaporating the raw material metal powder to obtain the raw material metal in the gas phase; Process C: The process of cooling the raw material metal in the gas phase to obtain metal particles containing the transition metal; Process A3-1: To plasma A process in which inert gas without nitrogen is supplied as a plasma gas in the torch to generate a thermoplasma flame; Process A3-2: the raw material powder containing the atom A is supplied to the thermoplasma flame in the plasma torch to make the raw material powder The process of evaporation to obtain the atom A in the gas phase; Process A3-3: The process of cooling the atom A in the gas phase to obtain the atom A that is atomized; Process A2: The atom A that is atomized is mixed with the metal particles Process; Process D: Supply an inert gas containing nitrogen as a plasma gas to the plasma torch to generate a thermoplasma flame; Process E: Supply the thermoplasma flame in the plasma torch with the result obtained in Process A2. The aforementioned metal particles, the process of evaporating the aforementioned metal particles to obtain the raw material metal in the gas phase; Process F: A process of cooling the raw material metal in the gas phase to obtain the metal nitride-containing particles. 一種硬化膜,其使用申請專利範圍第1項至第16項中任一項所述之組成物來獲得。 A cured film obtained by using the composition described in any one of items 1 to 16 in the scope of the patent application. 一種濾色器,其含有申請專利範圍第18項所述之硬化膜。 A color filter containing the cured film described in item 18 of the scope of patent application. 一種遮光膜,其含有申請專利範圍第18項所述之硬化膜。 A light-shielding film containing the cured film described in item 18 of the scope of patent application. 一種固態攝影元件,其含有申請專利範圍第18項所述之硬化膜。 A solid-state imaging element containing the cured film described in item 18 of the scope of patent application. 一種圖像顯示裝置,其含有申請專利範圍第18項所述之硬化膜。 An image display device containing the cured film described in item 18 of the scope of patent application.
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