TWI725265B - 研磨裝置、及按壓研磨具之按壓墊 - Google Patents
研磨裝置、及按壓研磨具之按壓墊 Download PDFInfo
- Publication number
- TWI725265B TWI725265B TW106143719A TW106143719A TWI725265B TW I725265 B TWI725265 B TW I725265B TW 106143719 A TW106143719 A TW 106143719A TW 106143719 A TW106143719 A TW 106143719A TW I725265 B TWI725265 B TW I725265B
- Authority
- TW
- Taiwan
- Prior art keywords
- pressing
- polishing
- elastic member
- wafer
- substrate
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 311
- 238000003825 pressing Methods 0.000 title claims abstract description 250
- 239000000758 substrate Substances 0.000 claims abstract description 65
- 230000002093 peripheral effect Effects 0.000 claims abstract description 50
- 239000004575 stone Substances 0.000 claims description 4
- 235000012431 wafers Nutrition 0.000 description 207
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 125
- 229910052710 silicon Inorganic materials 0.000 description 125
- 239000010703 silicon Substances 0.000 description 125
- 230000007246 mechanism Effects 0.000 description 47
- 238000010586 diagram Methods 0.000 description 24
- 229910052581 Si3N4 Inorganic materials 0.000 description 17
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 17
- 238000002474 experimental method Methods 0.000 description 8
- 230000000712 assembly Effects 0.000 description 7
- 238000000429 assembly Methods 0.000 description 7
- 238000005192 partition Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000011084 recovery Methods 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 5
- 238000007517 polishing process Methods 0.000 description 5
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 229920001971 elastomer Polymers 0.000 description 3
- 238000004064 recycling Methods 0.000 description 3
- 230000003252 repetitive effect Effects 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229920006311 Urethane elastomer Polymers 0.000 description 2
- 239000006061 abrasive grain Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- 238000009423 ventilation Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
- B24B21/04—Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces
- B24B21/06—Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces involving members with limited contact area pressing the belt against the work, e.g. shoes sweeping across the whole area to be ground
- B24B21/08—Pressure shoes; Pressure members, e.g. backing belts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/065—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016243295 | 2016-12-15 | ||
JP2016-243295 | 2016-12-15 | ||
JP2017-210426 | 2017-10-31 | ||
JP2017210426A JP6974117B2 (ja) | 2016-12-15 | 2017-10-31 | 研磨装置、および研磨具を押圧する押圧パッド |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201829122A TW201829122A (zh) | 2018-08-16 |
TWI725265B true TWI725265B (zh) | 2021-04-21 |
Family
ID=62634225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106143719A TWI725265B (zh) | 2016-12-15 | 2017-12-13 | 研磨裝置、及按壓研磨具之按壓墊 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6974117B2 (ja) |
KR (1) | KR102243698B1 (ja) |
TW (1) | TWI725265B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7355670B2 (ja) * | 2020-02-05 | 2023-10-03 | 株式会社荏原製作所 | 研磨ヘッドおよび研磨装置 |
CN111993205A (zh) * | 2020-08-31 | 2020-11-27 | 孔彦 | 汽车碳纤维零件加工带有边缘毛刺处理的修整装置 |
JP2023130650A (ja) * | 2022-03-08 | 2023-09-21 | 株式会社荏原製作所 | 基板研磨方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6558239B2 (en) * | 2001-01-09 | 2003-05-06 | Ebara Corporation | Polishing apparatus |
US20030139049A1 (en) * | 2001-11-26 | 2003-07-24 | Kenro Nakamura | Method for manufacturing semiconductor device and polishing apparatus |
JP2008042220A (ja) * | 2007-09-25 | 2008-02-21 | Ebara Corp | 基板処理方法及び装置 |
JP2009018363A (ja) * | 2007-07-11 | 2009-01-29 | Ebara Corp | 研磨装置 |
JP5254575B2 (ja) * | 2007-07-11 | 2013-08-07 | 株式会社東芝 | 研磨装置および研磨方法 |
US8517804B2 (en) * | 2007-10-16 | 2013-08-27 | Nagel Maschinen- Und Werkzeugfabrik Gmbh | Pressing device for cutting means and apparatus and method for finishing circumferential surfaces on cylindrical parts of a workpiece |
TWI523092B (zh) * | 2011-03-25 | 2016-02-21 | 荏原製作所股份有限公司 | 研磨裝置及研磨方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5254575Y2 (ja) | 1973-05-30 | 1977-12-10 | ||
US7744445B2 (en) * | 2004-10-15 | 2010-06-29 | Kabushiki Kaisha Toshiba | Polishing apparatus and polishing method |
WO2006112532A1 (en) * | 2005-04-19 | 2006-10-26 | Ebara Corporation | Substrate processing apparatus |
JP2009119537A (ja) * | 2007-11-12 | 2009-06-04 | Toshiba Corp | 基板処理方法及び基板処理装置 |
JP5663295B2 (ja) * | 2010-01-15 | 2015-02-04 | 株式会社荏原製作所 | 研磨装置、研磨方法、研磨具を押圧する押圧部材 |
-
2017
- 2017-10-31 JP JP2017210426A patent/JP6974117B2/ja active Active
- 2017-12-12 KR KR1020170170150A patent/KR102243698B1/ko active IP Right Grant
- 2017-12-13 TW TW106143719A patent/TWI725265B/zh active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6558239B2 (en) * | 2001-01-09 | 2003-05-06 | Ebara Corporation | Polishing apparatus |
US20030139049A1 (en) * | 2001-11-26 | 2003-07-24 | Kenro Nakamura | Method for manufacturing semiconductor device and polishing apparatus |
JP2009018363A (ja) * | 2007-07-11 | 2009-01-29 | Ebara Corp | 研磨装置 |
JP5254575B2 (ja) * | 2007-07-11 | 2013-08-07 | 株式会社東芝 | 研磨装置および研磨方法 |
JP2008042220A (ja) * | 2007-09-25 | 2008-02-21 | Ebara Corp | 基板処理方法及び装置 |
US8517804B2 (en) * | 2007-10-16 | 2013-08-27 | Nagel Maschinen- Und Werkzeugfabrik Gmbh | Pressing device for cutting means and apparatus and method for finishing circumferential surfaces on cylindrical parts of a workpiece |
TWI523092B (zh) * | 2011-03-25 | 2016-02-21 | 荏原製作所股份有限公司 | 研磨裝置及研磨方法 |
Also Published As
Publication number | Publication date |
---|---|
TW201829122A (zh) | 2018-08-16 |
KR20180069713A (ko) | 2018-06-25 |
KR102243698B1 (ko) | 2021-04-23 |
JP2018094715A (ja) | 2018-06-21 |
JP6974117B2 (ja) | 2021-12-01 |
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