TWI721070B - Dry film and printed wiring board - Google Patents

Dry film and printed wiring board Download PDF

Info

Publication number
TWI721070B
TWI721070B TW105141431A TW105141431A TWI721070B TW I721070 B TWI721070 B TW I721070B TW 105141431 A TW105141431 A TW 105141431A TW 105141431 A TW105141431 A TW 105141431A TW I721070 B TWI721070 B TW I721070B
Authority
TW
Taiwan
Prior art keywords
resin
resin layer
film
aforementioned
dry film
Prior art date
Application number
TW105141431A
Other languages
Chinese (zh)
Other versions
TW201801584A (en
Inventor
遠藤新
播磨英司
中条貴幸
興津諭
青山良朋
Original Assignee
日商太陽油墨製造股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商太陽油墨製造股份有限公司 filed Critical 日商太陽油墨製造股份有限公司
Publication of TW201801584A publication Critical patent/TW201801584A/en
Application granted granted Critical
Publication of TWI721070B publication Critical patent/TWI721070B/en

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/38Layered products comprising a layer of synthetic resin comprising epoxy resins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • B32B27/20Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K9/00Use of pretreated ingredients
    • C08K9/04Ingredients treated with organic substances
    • C08K9/06Ingredients treated with organic substances with silicon-containing compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/281Applying non-metallic protective coatings by means of a preformed insulating foil
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/005Additives being defined by their particle size in general

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Medicinal Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Polymers & Plastics (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Laminated Bodies (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Materials For Photolithography (AREA)
  • Coating Of Shaped Articles Made Of Macromolecular Substances (AREA)

Abstract

本發明係提供具有埋入性及平坦性優異之樹脂層的乾薄膜、及具備將該乾薄膜硬化所得之硬化物的印刷配線板。一種乾薄膜,其係具有薄膜及含有形成於該薄膜上之環氧樹脂之樹脂層的乾薄膜,前述樹脂層之熔融黏度在100℃下為60~5500dPa.s,前述樹脂層之儲存彈性模數在100℃下為80~5500Pa,前述樹脂層為至少含有液狀環氧樹脂作為前述環氧樹脂,前述液狀環氧樹脂之含量為在前述環氧樹脂全質量中,未達60質量%。 The present invention provides a dry film having a resin layer with excellent embedding properties and flatness, and a printed wiring board provided with a cured product obtained by curing the dry film. A dry film, which is a dry film having a film and a resin layer containing an epoxy resin formed on the film, the melt viscosity of the aforementioned resin layer is 60~5500dPa at 100°C. s, the storage elastic modulus of the aforementioned resin layer is 80~5500Pa at 100°C, the aforementioned resin layer contains at least liquid epoxy resin as the aforementioned epoxy resin, and the content of the aforementioned liquid epoxy resin is in the aforementioned epoxy resin In the total mass, less than 60% by mass.

Description

乾薄膜及印刷配線板 Dry film and printed wiring board

本發明係有關乾薄膜及印刷配線板,更詳細而言係有關具有埋入性及平坦性優異之樹脂層的乾薄膜、具備將該乾薄膜硬化所得之硬化物的印刷配線板。 The present invention relates to a dry film and a printed wiring board, and more specifically relates to a dry film having a resin layer with excellent embedding properties and flatness, and a printed wiring board provided with a cured product obtained by curing the dry film.

以往,被設置於電子機器等所使用之印刷配線板之阻焊劑或層間絕緣層等之保護膜或絕緣層之形成手段之一為利用乾薄膜(例如專利文獻1~3)。乾薄膜具有將具有所期望特性之硬化性樹脂組成物塗佈於載體薄膜上後,經過乾燥步驟所得的樹脂層,一般而言,為了保護與載體薄膜相反側之面用的保護薄膜,在進一步被層合的狀態下,流通於市場。將乾薄膜之樹脂層層合於具有電路圖型之基材後,藉由施予圖型化或硬化處理,可於印刷配線板上形成如述之保護膜或絕緣層。 In the past, one of the methods for forming protective films or insulating layers such as solder resists or interlayer insulating layers used on printed wiring boards used in electronic devices has been the use of dry films (for example, Patent Documents 1 to 3). The dry film has a resin layer obtained by coating a curable resin composition with desired characteristics on a carrier film and then undergoing a drying step. Generally speaking, a protective film used to protect the side opposite to the carrier film is further In the state of being laminated, circulate in the market. After the resin layer of the dry film is laminated on the substrate with the circuit pattern, patterning or hardening treatment is applied to form the protective film or insulating layer as described above on the printed wiring board.

〔先前技術文獻〕 [Prior technical literature] 〔專利文獻〕 〔Patent Literature〕

專利文獻1:日本特開平7-15119號公報(專利申請 範圍) Patent Document 1: Japanese Patent Application Publication No. 7-15119 (Patent Application range)

專利文獻2:日本特開2002-162736號公報(專利申請範圍) Patent Document 2: Japanese Patent Laid-Open No. 2002-162736 (Scope of Patent Application)

專利文獻3:日本特開2003-131366號公報(專利申請範圍) Patent Document 3: Japanese Patent Application Publication No. 2003-131366 (Scope of Patent Application)

發明之概要 Summary of the invention

將乾薄膜之樹脂層層合於基材時,對於基材上之電路圖型之凹凸,樹脂層無法被充分地埋入,在樹脂層與基材之間有產生氣泡的情形,因這種氣泡有損及樹脂層與基材之密著性的情形。 When laminating the resin layer of the dry film on the substrate, the resin layer cannot be fully buried in the unevenness of the circuit pattern on the substrate, and air bubbles may be generated between the resin layer and the substrate. It may impair the adhesion between the resin layer and the substrate.

又,為了使層合後之乾薄膜之樹脂層之外側表面平坦時,而進行真空層合或壓製,但是因基材上之電路圖型之凹凸被轉印製外側表面,故平坦性不足。 In order to flatten the outer surface of the resin layer of the laminated dry film, vacuum lamination or pressing is performed. However, since the unevenness of the circuit pattern on the substrate is transferred to the outer surface, the flatness is insufficient.

特別是近年電子機器之輕薄短小化的潮流,而印刷配線板也薄型化,而要求相較於乾薄膜之樹脂層,更進一步變薄。藉此,即使進行真空層合或壓製,也不易得到對基材之樹脂層之埋入性或樹脂層之外側表面之平坦性。 Especially in recent years, the trend of lighter, thinner, shorter and smaller electronic devices, and the thinning of printed wiring boards, is required to be thinner than the resin layer of dry film. Thereby, even if vacuum lamination or pressing is performed, it is difficult to obtain the embedding property of the resin layer of the base material or the flatness of the outer surface of the resin layer.

因此,本發明之目的係提供具有埋入性及平坦性優異之樹脂層的乾薄膜、及、具備將該乾薄膜硬化所得之硬化物的印刷配線板。 Therefore, the object of the present invention is to provide a dry film having a resin layer with excellent embedding properties and flatness, and a printed wiring board provided with a cured product obtained by curing the dry film.

本發明人等有鑑於上述的情形,精心檢討結果,發現藉由使用具有下述樹脂層的乾薄膜,而可解決前述課題,遂完成本發明,其中前述樹脂層為在100℃下熔融黏度為60~5500dPa.s,在100℃下儲存彈性模數為10~5500Pa,相對於環氧樹脂全量,以未達60質量%含有液狀環氧樹脂的樹脂層。 In view of the above situation, the inventors of the present invention carefully reviewed the results and found that the foregoing problems can be solved by using a dry film with the following resin layer, and completed the present invention, wherein the resin layer has a melt viscosity at 100°C. 60~5500dPa. s, the storage elastic modulus at 100°C is 10 to 5500 Pa, and the resin layer containing liquid epoxy resin is less than 60% by mass relative to the total amount of epoxy resin.

亦即,本發明之乾薄膜,其係具有薄膜及含有形成於該薄膜上之環氧樹脂之樹脂層的乾薄膜,前述樹脂層之熔融黏度在100℃下為60~5500dPa.s,前述樹脂層之儲存彈性模數在100℃下為80~5500Pa,前述樹脂層為至少含有液狀環氧樹脂作為前述環氧樹脂, 前述液狀環氧樹脂之含量為在前述環氧樹脂全質量中,未達60質量%。 That is, the dry film of the present invention is a dry film having a film and a resin layer containing an epoxy resin formed on the film, and the melt viscosity of the resin layer is 60~5500dPa at 100°C. s, the storage elastic modulus of the aforementioned resin layer is 80-5500 Pa at 100°C, and the aforementioned resin layer contains at least liquid epoxy resin as the aforementioned epoxy resin, The content of the liquid epoxy resin is less than 60% by mass in the total mass of the epoxy resin.

本發明之乾薄膜,其中前述樹脂層中之殘留溶劑量為1.0~7.0質量%為佳。 In the dry film of the present invention, the amount of residual solvent in the aforementioned resin layer is preferably 1.0 to 7.0% by mass.

本發明之乾薄膜,其中前述樹脂層中,含有選自由N,N-二甲基甲醯胺、甲苯、環己酮、碳數為8以上之芳香族烴及甲基乙基酮所成群之至少2種的有機溶劑為佳。 The dry film of the present invention, wherein the aforementioned resin layer contains a group selected from the group consisting of N,N-dimethylformamide, toluene, cyclohexanone, aromatic hydrocarbons with 8 or more carbon atoms, and methyl ethyl ketone At least two kinds of organic solvents are preferred.

本發明之乾薄膜,其中前述樹脂層進一步含有選自由雙酚A型環氧樹脂、萘型環氧樹脂及苯酚酚醛清漆型環氧樹脂所成群之至少1種的半固形環氧樹脂,作為前述環氧樹脂為佳。 The dry film of the present invention, wherein the resin layer further contains at least one semi-solid epoxy resin selected from the group consisting of bisphenol A epoxy resin, naphthalene epoxy resin, and phenol novolac epoxy resin, as The aforementioned epoxy resin is preferred.

本發明之乾薄膜,其中前述樹脂層含有填料,前述填料之平均粒徑為0.1~10μm為佳。 In the dry film of the present invention, the resin layer contains a filler, and the average particle size of the filler is preferably 0.1-10 μm.

本發明之乾薄膜,其中前述樹脂層含有填料,前述填料之調配量係樹脂層全量(樹脂層含有溶劑的情形係排除溶劑之全量)之40~80質量%為佳。 In the dry film of the present invention, the resin layer contains a filler, and the blending amount of the filler is preferably 40-80% by mass of the total amount of the resin layer (when the resin layer contains a solvent, the total amount of the solvent is excluded).

本發明之乾薄膜,其中前述樹脂層含有填料,前述填料為以具有環氧基之矽烷偶合劑、具有胺基之矽烷偶合劑、具有巰基之矽烷偶合劑、具有異氰酸酯基之矽烷偶合劑、具有乙烯基之矽烷偶合劑、具有苯乙烯基之矽烷偶合劑、具有甲基丙烯醯基之矽烷偶合劑及具有丙烯醯基之矽烷偶合劑之至少任1種進行表面處理為佳。 In the dry film of the present invention, the resin layer contains a filler, and the filler is a silane coupling agent with epoxy groups, a silane coupling agent with amine groups, a silane coupling agent with mercapto groups, a silane coupling agent with isocyanate groups, and It is preferable that at least any one of vinyl silane coupling agent, styrene group-containing silane coupling agent, methacryl group-containing silane coupling agent, and acryl group-containing silane coupling agent be subjected to surface treatment.

本發明之硬化物,其特徵係前述乾薄膜之樹脂層硬化所得者。 The cured product of the present invention is characterized by curing the resin layer of the aforementioned dry film.

本發明之印刷配線板,其特徵係具備如前述硬化物者。 The printed wiring board of the present invention is characterized by having a cured product as described above.

依據本發明時,可提供具有埋入性及平坦性優異之樹脂層的乾薄膜、及具備將該乾薄膜硬化所得之硬化物的印刷配線板。 According to the present invention, a dry film having a resin layer with excellent embedding properties and flatness, and a printed wiring board having a cured product obtained by curing the dry film can be provided.

11‧‧‧二層構造之乾薄膜 11‧‧‧Two-layer dry film

12‧‧‧樹脂層 12‧‧‧Resin layer

13‧‧‧薄膜 13‧‧‧Film

21‧‧‧三層構造之乾薄膜 21‧‧‧Three-layer dry film

22‧‧‧樹脂層 22‧‧‧Resin layer

23‧‧‧第一薄膜 23‧‧‧First film

24‧‧‧第二薄膜 24‧‧‧Second film

30a‧‧‧液狀判定用試驗管 30a‧‧‧Test tube for liquid state determination

30b‧‧‧溫度測量用試驗管 30b‧‧‧Test tube for temperature measurement

31‧‧‧標線(A線) 31‧‧‧Marking line (A line)

32‧‧‧標線(B線) 32‧‧‧Marking line (B line)

33a、33b‧‧‧橡膠栓 33a, 33b‧‧‧Rubber plug

34‧‧‧溫度計 34‧‧‧Thermometer

[圖1]示意表示本發明之層合構造物之一實施態樣的 概略剖面圖。 [Figure 1] Schematic representation of one embodiment of the laminated structure of the present invention Schematic section view.

[圖2]示意表示本發明之層合構造物之其他之實施態樣的概略剖面圖。 [Fig. 2] A schematic cross-sectional view schematically showing another embodiment of the laminated structure of the present invention.

[圖3]表示環氧樹脂之液狀判定用之2支試驗管的概略側面圖。 [Fig. 3] A schematic side view showing two test tubes for judging the liquid state of epoxy resin.

<乾薄膜> <Dry Film>

本發明之乾薄膜,其係具有薄膜及含有形成於該薄膜上之樹脂層的乾薄膜,前述樹脂層之熔融黏度在100℃下為60~5500dPa.s,前述樹脂層之儲存彈性模數在100℃下為80~5500Pa,前述樹脂層為至少含有液狀環氧樹脂作為前述環氧樹脂,前述液狀環氧樹脂之含量為在前述環氧樹脂全質量中,未達60質量%為特徵。詳細的機構雖不明,但是藉由將樹脂層之熔融黏度及儲存彈性模數之兩方調整為上述範圍,且樹脂層所含有之液狀環氧樹脂相對於環氧樹脂全量的比例設為未達60質量%,明顯改善埋入性與平坦性。 The dry film of the present invention is a dry film having a film and a resin layer formed on the film, and the melt viscosity of the resin layer is 60~5500dPa at 100°C. s, the storage elastic modulus of the aforementioned resin layer is 80~5500Pa at 100°C, the aforementioned resin layer contains at least liquid epoxy resin as the aforementioned epoxy resin, and the content of the aforementioned liquid epoxy resin is in the aforementioned epoxy resin Among the total mass, it is characterized by less than 60 mass%. The detailed mechanism is unknown, but by adjusting both the melt viscosity of the resin layer and the storage elastic modulus to the above ranges, and the ratio of the liquid epoxy resin contained in the resin layer to the total amount of epoxy resin is set to not Up to 60% by mass, significantly improving embedding and flatness.

又,依據本發明之乾薄膜時,可形成表面為平坦的硬化膜,故其上形成抗電鍍劑(Plating resist)的情形,可抑制抗電鍍劑之線的缺落或顯影不良。亦即,依據本發明之乾薄膜時,可得到抗電鍍劑之形成性優異的硬化物。藉此,也可在樹脂層上形成高精細的導電電路。 In addition, according to the dry film of the present invention, a cured film with a flat surface can be formed. Therefore, when a plating resist is formed on the dry film, it is possible to suppress the lack of line of the plating resist or poor development. That is, according to the dry film of the present invention, a cured product with excellent plating resistance can be obtained. Thereby, a high-definition conductive circuit can also be formed on the resin layer.

相對於此,乾薄膜之樹脂層之熔融黏度在100℃下未達60dPa.s未達或樹脂層之儲存彈性模數在100℃下未達80Pa時,乾薄膜之層合時,變得容易捲入氣泡,難以得到埋入性。另外,樹脂層之熔融黏度在100℃下超過5500dPa.s或樹脂層之儲存彈性模數在100℃下超過5500Pa時,難以得到樹脂層之外側表面的平坦性。樹脂層之熔融黏度在100℃下為400~3000dPa.s較佳,樹脂層之儲存彈性模數在100℃下為100~3500Pa較佳。又,液狀環氧樹脂之含量相對於環氧樹脂全量,成為60質量%以上的情形,也難以得到乾薄膜之埋入性與樹脂層之外側表面的平坦性。 In contrast, the melt viscosity of the resin layer of the dry film does not reach 60dPa at 100°C. If s is not reached or the storage elastic modulus of the resin layer is less than 80 Pa at 100°C, air bubbles will be easily involved in the lamination of dry films, making it difficult to obtain embedding properties. In addition, the melt viscosity of the resin layer exceeds 5500dPa at 100°C. When s or the storage elastic modulus of the resin layer exceeds 5500 Pa at 100°C, it is difficult to obtain the flatness of the outer surface of the resin layer. The melt viscosity of the resin layer is 400~3000dPa at 100℃. s is better, and the storage elastic modulus of the resin layer is preferably 100~3500 Pa at 100°C. In addition, when the content of the liquid epoxy resin is 60% by mass or more relative to the total amount of the epoxy resin, it is difficult to obtain the embedding property of the dry film and the flatness of the outer surface of the resin layer.

前述樹脂層之熔融黏度在100℃下為3000dPa.s以下,前述樹脂層之儲存彈性模數在100℃下為3000Pa以下時,平坦性及抗電鍍劑之形成性優異,故較佳。 The melt viscosity of the aforementioned resin layer is 3000dPa at 100°C. s or less, when the storage elastic modulus of the aforementioned resin layer is 3000 Pa or less at 100°C, the flatness and the formability of the plating resist are excellent, which is preferable.

前述樹脂層之熔融黏度在100℃下為100dPa.s以上,前述樹脂層之儲存彈性模數在100℃下為100Pa以上時,層合時不易捲入氣泡,埋入性更優異,故較佳。 The melt viscosity of the aforementioned resin layer is 100dPa at 100°C. s or more, when the storage elastic modulus of the aforementioned resin layer is 100 Pa or more at 100°C, air bubbles are less likely to be involved during lamination, and the embedding property is more excellent, so it is preferable.

前述樹脂層之熔融黏度在100℃下為500~3000dPa.s,前述樹脂層之儲存彈性模數在100℃下為500~3000Pa更佳。 The melt viscosity of the aforementioned resin layer is 500~3000dPa at 100℃. s. It is better that the storage elastic modulus of the aforementioned resin layer is 500~3000Pa at 100°C.

樹脂層之熔融黏度及儲存彈性模數之調整方法無特別限定,如後述,藉由選擇填料之調配量、粒徑、 種類等,可容易調整。又,也可藉由熱硬化性成分或硬化劑來調整。 The method of adjusting the melt viscosity and storage elastic modulus of the resin layer is not particularly limited. As described later, by selecting the blending amount, particle size, and The type, etc., can be easily adjusted. Moreover, it can also be adjusted by thermosetting components or hardeners.

圖1表示本發明之乾薄膜之一實施形態的概略剖面圖。樹脂層12為形成於薄膜13上之二層構造的乾薄膜11。又,如圖2所示,第一薄膜23之上形成樹脂層22,為了保護樹脂層22之表面,也可為進一步層合了第二薄膜24之三層構造的乾薄膜21。必要時,在薄膜與樹脂層之間也可設置其他的樹脂層。 Fig. 1 shows a schematic cross-sectional view of an embodiment of the dry film of the present invention. The resin layer 12 is a two-layer dry film 11 formed on the film 13. Furthermore, as shown in FIG. 2, a resin layer 22 is formed on the first film 23. In order to protect the surface of the resin layer 22, it may be a dry film 21 with a three-layer structure further laminated with a second film 24. If necessary, another resin layer may be provided between the film and the resin layer.

[樹脂層] [Resin layer]

本發明之乾薄膜之樹脂層,一般被稱為B階段狀態的狀態,由硬化性樹脂組成物所得者。具體而言,乾薄膜之樹脂層係將硬化性樹脂組成物塗佈於薄膜後,經過乾燥步驟而得。前述硬化性樹脂組成物在滿足上述熔融黏度、儲存彈性模數及液狀環氧樹脂之調配量時,其他的成分之種類或調配量無特別限定。樹脂層之膜厚無特別限定,例如,乾燥後之膜厚為1~200μm即可,但是樹脂層之膜厚越薄,越顯著地得到本發明效果。具體而言,樹脂層之膜厚較佳為30μm以下,更佳為20μm以下,又更佳為15μm以下,變得越容易發揮本發明效果,故較佳。 The resin layer of the dry film of the present invention is generally called a B-stage state, and is obtained from a curable resin composition. Specifically, the resin layer of the dry film is obtained by coating the curable resin composition on the film and then going through a drying step. When the aforementioned curable resin composition satisfies the aforementioned melt viscosity, storage modulus of elasticity, and the blending amount of the liquid epoxy resin, the types or blending amounts of other components are not particularly limited. The film thickness of the resin layer is not particularly limited. For example, the film thickness after drying may be 1 to 200 μm. However, the thinner the film thickness of the resin layer, the more remarkable the effect of the present invention can be obtained. Specifically, the film thickness of the resin layer is preferably 30 μm or less, more preferably 20 μm or less, and still more preferably 15 μm or less, since it becomes easier to exhibit the effects of the present invention, which is preferable.

前述樹脂層含有環氧樹脂。環氧樹脂係具有環氧基之樹脂,可使用以往習知者。可列舉分子中具有2個環氧基之2官能性環氧樹脂、分子中具有多數個環氧基之多官能環氧樹脂等。又,也可為經氫化的環氧樹脂。前 述樹脂層係前述在前述環氧樹脂全質量中,未達60質量%之含量含有液狀環氧樹脂,作為前述環氧樹脂。前述樹脂層係含有固形環氧樹脂及半固形環氧樹脂之至少任一者,作為液狀環氧樹脂以外的環氧樹脂。本說明書中,固形環氧樹脂係指40℃下,固體狀的環氧樹脂,半固形環氧樹脂係指20℃下為固體狀,40℃下為液狀的環氧樹脂,液狀環氧樹脂係指20℃下為液狀環氧樹脂。 The aforementioned resin layer contains epoxy resin. The epoxy resin is a resin having an epoxy group, and conventionally known ones can be used. Examples include bifunctional epoxy resins having two epoxy groups in the molecule, multifunctional epoxy resins having many epoxy groups in the molecule, and the like. Moreover, it may be a hydrogenated epoxy resin. before The resin layer contains a liquid epoxy resin in a content of less than 60% by mass in the total mass of the epoxy resin as the epoxy resin. The aforementioned resin layer contains at least one of a solid epoxy resin and a semi-solid epoxy resin as an epoxy resin other than the liquid epoxy resin. In this manual, solid epoxy resin means solid epoxy resin at 40°C, semi-solid epoxy resin means solid epoxy resin at 20°C and liquid epoxy resin at 40°C, liquid epoxy Resin refers to a liquid epoxy resin at 20°C.

液狀之判定係依據危險物之試驗及性狀的省令(平成元年自治省令第1號)之第2「液狀之確認方法」來進行。 The determination of the liquid state is based on the second "method of confirming liquid state" of the provincial ordinance on the test and properties of dangerous substances (the first year of the Heisei Provincial Autonomous Province Order No. 1).

(1)裝置 (1) Device 恆溫水槽: Constant temperature water tank:

使用具備有攪拌機、加熱器、溫度計、自動溫度調節器(可以±0.1℃控制溫度者)者,且深度150mm以上者。 Use those with a mixer, heater, thermometer, and automatic temperature regulator (the temperature can be controlled by ±0.1°C), and the depth is 150mm or more.

又,後述實施例使用之環氧樹脂之判定時,均使用yamato科學公司製之低溫恆溫水槽(型式BU300)與投入式恆溫裝置Thermomate(型式BF500)之組合,將自來水約22公升置入低溫恆溫水槽(型式BU300)中,開啟組裝於此之Thermomate(型式BF500)的電源,設定為設定溫度(20℃或40℃),將水溫以Thermomate(型式BF500)微調整為設定溫度±0.1℃,但是只要是可同樣調整的裝置時,皆可使用。 In addition, in the determination of the epoxy resin used in the following examples, a combination of a low-temperature constant-temperature water tank (model BU300) manufactured by Yamato Science Co., Ltd. and an input constant-temperature device Thermomate (model BF500) was used, and approximately 22 liters of tap water was placed in a low-temperature constant-temperature water tank. In the water tank (type BU300), turn on the power of the Thermomate (type BF500) assembled here, set it to the set temperature (20°C or 40°C), and fine-tune the water temperature with the Thermomate (type BF500) to the set temperature ±0.1°C, But as long as it is a device that can be adjusted in the same way, it can be used.

試驗管: Test tube:

試驗管係如圖3所示,內徑30mm、高度120mm之平底圓筒型透明玻璃製者,使用由管底起55mm及85mm之高度處,各自製作標線31、32,橡膠栓33a密閉試驗管口之液狀判定用試驗管30a及相同尺寸同樣製作標線,以中央開啟挿入.支撐溫度計用之孔的橡膠栓33b密閉試驗管口,在橡膠栓33b插入溫度計34之溫度測量用試驗管30b。以下,由管底起55mm之高度的標線稱為「A線」,由管底起85mm之高度的標線稱為「B線」。 The test tube is shown in Figure 3. The flat-bottomed cylindrical transparent glass with an inner diameter of 30mm and a height of 120mm is made of transparent glass. The marks 31 and 32 are made at the height of 55mm and 85mm from the bottom of the tube, respectively, and the rubber plug 33a is sealed test. The test tube 30a for judging the liquid state of the nozzle and the same size is also marked with the same size, and inserted with the center opening. The rubber plug 33b supporting the hole for the thermometer seals the test nozzle, and the test tube 30b for temperature measurement of the thermometer 34 is inserted into the rubber plug 33b. Hereinafter, the marking line with a height of 55mm from the bottom of the tube is called "A line", and the marking line with a height of 85mm from the tube bottom is called "B line".

溫度計34使用JIS B7410(1982)「石油類試驗用玻璃製溫度計」所規定之凝固點測量用者(SOP-58刻度範圍20~50℃),但是只要在0~50℃之溫度範圍可測量者即可。 The thermometer 34 uses the freezing point measurement specified by JIS B7410 (1982) "Glass Thermometer for Petroleum Tests" (SOP-58 scale range 20~50℃), but as long as it can be measured in the temperature range of 0~50℃ can.

(2)試驗之實施順序 (2) The order of implementation of the test

將在溫度20±5℃之大氣壓下放置24小時以上的試料分別置入於圖3(a)所示之液狀判定用試驗管30a與圖3(b)所示之溫度測量用試驗管30b至A線為止。使2支試驗管30a、30b在低溫恆溫水槽中,直立使B線成為水面下靜置。使溫度計之下端比A線低30mm。 Place the sample that has been left for more than 24 hours under the atmospheric pressure at a temperature of 20±5°C into the test tube 30a for liquid state determination shown in Fig. 3(a) and the test tube 30b for temperature measurement shown in Fig. 3(b). Until the A line. The two test tubes 30a and 30b were placed in a low-temperature constant-temperature water tank, and the line B was allowed to stand still under the water surface. Make the lower end of the thermometer 30mm lower than the A line.

試料溫度到達設定溫度±0.1℃後,該狀態保持10分鐘。10分鐘後,低溫恆溫水槽中取出液狀判定用試驗管30a,隨即於水平的試驗台上水平放置,以碼錶測量試驗管內之液面前端由A線移動至B線的時間,並記錄。試 料在設定溫度中,測量之時聞為90秒以內者判定為液狀,超過90秒者判定為固體狀。 After the sample temperature reaches the set temperature ±0.1°C, keep this state for 10 minutes. After 10 minutes, take out the test tube 30a for judging the liquid state from the low temperature and constant temperature water tank, and then place it horizontally on a horizontal test bench. Use a stopwatch to measure the time for the tip of the liquid in the test tube to move from line A to line B, and record it . test When the material is at the set temperature, the one that is within 90 seconds of the measurement is judged to be liquid, and the one that exceeds 90 seconds is judged to be solid.

固形環氧樹脂可列舉DIC公司製HP-4700(萘型環氧樹脂)、DIC公司製EXA4700(4官能萘型環氧樹脂)、日本化藥公司製NC-7000(含有萘骨架之多官能固形環氧樹脂)等之萘型環氧樹脂;日本化藥公司製EPPN-502H(三苯酚(trisphenol)環氧樹脂)等之酚類與具有酚性羥基之芳香族醛之縮合物的環氧化物(三苯酚型環氧樹脂);DIC公司製EPICLON HP-7200H(含有二環戊二烯骨架之多官能固形環氧樹脂)等之二環戊二烯芳烷基型環氧樹脂;日本化藥公司製NC-3000H(含有聯苯骨架之多官能固形環氧樹脂)等之聯苯基芳烷基型環氧樹脂;日本化藥公司製NC-3000L等之聯苯基/苯酚酚醛清漆型環氧樹脂;DIC公司製EPICLON N660、EPICLON N690、日本化藥公司製EOCN-104S等之酚醛清漆型環氧樹脂;三菱化學公司製YX-4000等之聯苯基型環氧樹脂;新日鐵住金化學公司製TX0712等之含有磷環氧樹脂;日產化學工業公司製TEPIC等之參(2,3-環氧基丙基)三聚異氰酸酯等。 Examples of solid epoxy resins include HP-4700 (naphthalene type epoxy resin) manufactured by DIC, EXA4700 (4-functional naphthalene epoxy resin) manufactured by DIC, and NC-7000 (multifunctional solid containing naphthalene skeleton) manufactured by Nippon Kayaku Co., Ltd. Epoxy resins such as naphthalene type epoxy resins; EPPN-502H (trisphenol epoxy resin) manufactured by Nippon Kayaku Co., Ltd. Epoxides of condensation products of phenols and aromatic aldehydes with phenolic hydroxyl groups (Triphenol type epoxy resin); Dicyclopentadiene aralkyl type epoxy resin such as EPICLON HP-7200H (multifunctional solid epoxy resin containing dicyclopentadiene skeleton) manufactured by DIC; Nippon Kayaku Biphenyl aralkyl type epoxy resin such as NC-3000H (multifunctional solid epoxy resin containing biphenyl skeleton) manufactured by the company; Biphenyl/phenol novolac type ring such as NC-3000L manufactured by Nippon Kayaku Co., Ltd. Oxygen resin; Novolac type epoxy resin such as EPICLON N660, EPICLON N690 manufactured by DIC, EOCN-104S manufactured by Nippon Kayaku Co.; Biphenyl type epoxy resin such as YX-4000 manufactured by Mitsubishi Chemical Corporation; Nippon Steel & Sumikin Phosphorus-containing epoxy resins such as TX0712 manufactured by Chemical Corporation; Ginseng (2,3-epoxypropyl) cyanuric acid esters such as TEPIC manufactured by Nissan Chemical Industry Co., Ltd.

半固形環氧樹脂可列舉DIC公司製EPICLON860、EPICLON900-IM、EPICLONEXA-4816、EPICLON EXA-4822、旭ciba公司製araldite AER280、東都化成公司製EPOTOHTO YD-134、三菱化學公司製jER834、jER872、住友化學工業公司製ELA-134等之雙 酚A型環氧樹脂;DIC公司製EPICLON HP-4032等之萘型環氧樹脂;DIC公司製EPICLON N-740等之苯酚酚醛清漆型環氧樹脂等。 Examples of semi-solid epoxy resins include EPICLON860, EPICLON900-IM, EPICLONEXA-4816, EPICLON EXA-4822 manufactured by DIC, araldite AER280 manufactured by Asahi Ciba, EPOTOHTO YD-134 manufactured by Toto Kasei Co., Ltd., jER834, jER872 manufactured by Mitsubishi Chemical Corporation, and Sumitomo ELA-134, etc. made by Chemical Industry Corporation Phenolic A type epoxy resin; Naphthalene type epoxy resin such as EPICLON HP-4032 manufactured by DIC Company; Phenolic novolak type epoxy resin such as EPICLON N-740 manufactured by DIC Company.

半固形狀環氧樹脂含有選自由雙酚A型環氧樹脂、萘型環氧樹脂及苯酚酚醛清漆型環氧樹脂所成群之至少1種為佳。藉由含有彼等之半固形狀環氧樹脂,因此硬化物之玻璃轉移溫度(Tg)高,CTE降低,龜裂耐性優異。 The semi-solid epoxy resin preferably contains at least one selected from the group consisting of bisphenol A epoxy resin, naphthalene epoxy resin, and phenol novolac epoxy resin. By containing these semi-solid epoxy resins, the glass transition temperature (Tg) of the hardened product is high, the CTE is reduced, and the crack resistance is excellent.

液狀環氧樹脂可列舉雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、苯酚酚醛清漆型環氧樹脂、tert-丁基-兒茶酚型環氧樹脂、環氧丙基胺型環氧樹脂、胺基酚型環氧樹脂、脂環式環氧樹脂等。 Liquid epoxy resins include bisphenol A epoxy resins, bisphenol F epoxy resins, bisphenol AF epoxy resins, phenol novolac epoxy resins, and tert-butyl-catechol epoxy resins. Resin, epoxy propyl amine type epoxy resin, amino phenol type epoxy resin, alicyclic epoxy resin, etc.

環氧樹脂可組合2種以上使用。環氧樹脂之調配量係以排除溶劑後之乾薄膜之樹脂層全量基準,較佳為5~50質量%,更佳為5~40質量%,又更佳為5~35質量%。又,液狀環氧樹脂之含量係環氧樹脂全質量中,較佳為5~45質量%,更佳為5~40質量%,特佳為5~30質量%。 Two or more types of epoxy resins can be used in combination. The blending amount of the epoxy resin is based on the total amount of the resin layer of the dry film after excluding the solvent, and is preferably 5-50% by mass, more preferably 5-40% by mass, and still more preferably 5-35% by mass. In addition, the content of the liquid epoxy resin is preferably 5 to 45% by mass, more preferably 5 to 40% by mass, and particularly preferably 5 to 30% by mass in the entire mass of the epoxy resin.

前述樹脂層係含有填料為佳。因含有填料,藉由配合位於絕緣層周圍之銅等之導體層與熱強度,可提高乾薄膜之熱特性。填料可使用以往習知之無機填料及有機填料,無限定為特定者,以抑制塗膜之硬化收縮,有助於提高密著性、硬度等之特性的無機填料為佳。無機填料可列舉例如硫酸鋇、鈦酸鋇、鈦酸鋯酸鋇、鈦酸鍶、鈦酸鈣、鋯酸鈣、鈦酸鎂、鈦酸鉍、鈦酸鋇釹、鈦酸鋇錫、鈦 酸鉛、無定形二氧化矽、結晶性二氧化矽、熔融二氧化矽、球狀二氧化矽等之二氧化矽、滑石、黏土、二氧化矽(Neuburger Kieselerde)粒子、水鋁石(Boehmite)、碳酸鎂、碳酸鈣、氧化鈦、氧化鋁、氫氧化鋁、氮化矽、氮化鋁等之體質顏料或、銅、錫、鋅、鎳、銀、鈀、鋁、鐵、鈷、金、鉑等之金屬粉體。 The aforementioned resin layer system preferably contains a filler. Because it contains fillers, the thermal properties of the dry film can be improved by matching the copper conductor layer and the thermal strength around the insulating layer. As the filler, conventionally known inorganic fillers and organic fillers can be used, and they are not limited to specific ones. It is preferable to suppress the curing shrinkage of the coating film and to help improve the adhesion, hardness and other characteristics of the inorganic filler. Inorganic fillers include, for example, barium sulfate, barium titanate, barium zirconate titanate, strontium titanate, calcium titanate, calcium zirconate, magnesium titanate, bismuth titanate, barium neodymium titanate, barium tin titanate, titanium Lead acid, amorphous silica, crystalline silica, fused silica, spherical silica, etc., silica, talc, clay, silica (Neuburger Kieselerde) particles, diaspore (Boehmite) , Magnesium carbonate, calcium carbonate, titanium oxide, aluminum oxide, aluminum hydroxide, silicon nitride, aluminum nitride and other extender pigments or, copper, tin, zinc, nickel, silver, palladium, aluminum, iron, cobalt, gold, Metal powder such as platinum.

上述填料之中,使用鈦酸鋇、鈦酸鋯酸鋇、鈦酸鍶、鈦酸鈣、鋯酸鈣、鈦酸鎂、鈦酸鉍、鈦酸鋇釹、鈦酸鋇錫、鈦酸鉛、氧化鈦時,可提高介電率,提高電路之隱蔽性,故較佳。 Among the above fillers, barium titanate, barium titanate zirconate, strontium titanate, calcium titanate, calcium zirconate, magnesium titanate, bismuth titanate, barium neodymium titanate, barium tin titanate, lead titanate, In the case of titanium oxide, it can increase the dielectric rate and improve the concealment of the circuit, so it is preferred.

無機填料較佳為球狀粒子。填料之平均粒徑,較佳為0.1~10μm。又,本案說明書中,填料之平均粒徑不僅是一次粒子之粒徑,也包含二次粒子(凝聚物)之粒徑的平均粒徑。平均粒徑可藉由雷射繞射式粒徑分布測量裝置求得。藉由雷射繞射法之測量裝置,可列舉日機裝公司製Nanotrac wave等。 The inorganic filler is preferably spherical particles. The average particle size of the filler is preferably 0.1-10 μm. In addition, in the specification of this case, the average particle size of the filler is not only the particle size of the primary particles, but also the average particle size of the particle size of the secondary particles (aggregates). The average particle size can be obtained by a laser diffraction particle size distribution measuring device. The measurement device by the laser diffraction method includes the Nanotrac wave manufactured by Nikkiso Co., Ltd. and the like.

前述無機填料係經表面處理為佳。表面處理較佳為利用偶合劑之表面處理。偶合劑可使用矽烷偶合劑、鈦偶合劑、鋯偶合劑、鋁偶合劑等。其中,較佳為矽烷偶合劑。 The aforementioned inorganic fillers are preferably surface-treated. The surface treatment is preferably a surface treatment using a coupling agent. As the coupling agent, silane coupling agent, titanium coupling agent, zirconium coupling agent, aluminum coupling agent, etc. can be used. Among them, a silane coupling agent is preferred.

矽烷偶合劑可使用具有作為有機基之環氧基的矽烷偶合劑、具有胺基之矽烷偶合劑、具有巰基之矽烷偶合劑、具有異氰酸酯基之矽烷偶合劑、具有乙烯基之矽烷偶合劑、具有苯乙烯基之矽烷偶合劑、具有甲基丙烯醯 基之矽烷偶合劑、具有丙烯醯基之矽烷偶合劑等。特別是與底層電路之密著性優異,較佳為具有環氧基之矽烷偶合劑、具有胺基之矽烷偶合劑。 As the silane coupling agent, a silane coupling agent with an epoxy group as an organic group, a silane coupling agent with an amine group, a silane coupling agent with a mercapto group, a silane coupling agent with an isocyanate group, a silane coupling agent with a vinyl group, Styrene-based silane coupling agent, with methacrylic acid Base silane coupling agent, acryl-based silane coupling agent, etc. In particular, the adhesion to the underlying circuit is excellent, and a silane coupling agent having an epoxy group and a silane coupling agent having an amine group are preferred.

又,無機填料可經氧化鋁處理等之未導入有機基之表面處理。 In addition, the inorganic filler can be subjected to surface treatment such as alumina treatment without introducing organic groups.

進行了表面處理的無機填料可以經表面處理的狀態,調配於乾薄膜的樹脂層即可,調製硬化性樹脂組成物時,分別調配表面未處理之無機填料與表面處理劑,在組成物中,無機填料可經表面處理,但是調製硬化性樹脂組成物時,調配預先進行表面處理的無機填料為佳。藉由調配預先進行表面處理的無機填料,可更提高樹脂層之硬化後之平坦性及抗電鍍劑之形成性,又,加濕後之介電正切優異。預先進行表面處理的情形,調配將無機填料預備分散於溶劑的預備分散液為佳,將表面處理後之無機填料預備分散於溶劑,將該預備分散液調配於組成物中,或將表面未處理之無機填料預備分散於溶劑時,充分表面處理後,將該預備分散液調配於組成物中更佳。 The surface-treated inorganic filler can be surface-treated and blended in the resin layer of the dry film. When preparing the curable resin composition, the surface-untreated inorganic filler and the surface treatment agent are separately blended. In the composition, The inorganic filler may be surface-treated, but when preparing a curable resin composition, it is better to prepare an inorganic filler that has been surface-treated in advance. By mixing the inorganic filler that has been surface-treated in advance, the flatness of the resin layer after curing and the formation of the plating resist can be improved, and the dielectric tangent after humidification is excellent. In the case of surface treatment in advance, it is better to prepare a preliminary dispersion liquid in which the inorganic filler is pre-dispersed in a solvent. The inorganic filler after the surface treatment is pre-dispersed in the solvent, and the preliminary dispersion liquid is prepared in the composition, or the surface is untreated When the inorganic filler is pre-dispersed in a solvent, it is better to mix the pre-dispersed liquid into the composition after sufficient surface treatment.

在此,調配預先以具有乙烯基之矽烷偶合劑進行表面處理的二氧化矽時,加濕後的介電正切優異。又,調配預先以具有乙烯基之矽烷偶合劑進行表面處理的氧化鋁時,散熱性優異。 Here, when silicon dioxide surface-treated with a silane coupling agent having a vinyl group is prepared, the dielectric tangent after humidification is excellent. In addition, when alumina surface-treated with a vinyl-containing silane coupling agent is prepared in advance, heat dissipation is excellent.

填料之調配量係以除去溶劑後之乾薄膜之樹脂層全量基準,較佳為25~85質量%,更佳為40~85質量%。填料之調配量為25~85質量%的情形,埋入性優異。 25質量%以上時,可降低線膨脹係數,散熱特性優異。 The blending amount of the filler is based on the total amount of the resin layer of the dry film after removing the solvent, preferably 25 to 85% by mass, more preferably 40 to 85% by mass. When the blending amount of the filler is 25 to 85% by mass, the embedding property is excellent. At 25% by mass or more, the coefficient of linear expansion can be reduced and the heat dissipation characteristics are excellent.

又,填料組合2種以上使用時,平坦性及抗電鍍劑之形成性優異,故較佳。在此,填料為含有平均一次粒徑為100nm以下之奈米填料的情形,可提高填料之填充效率。藉此,可降低加濕後之介電正切,可降低線膨脹係數,可提高回焊後之冷熱循環時的龜裂耐性。 In addition, when two or more types of fillers are used in combination, the flatness and the formability of the plating resist are excellent, which is preferable. Here, when the filler contains nanofillers with an average primary particle diameter of 100 nm or less, the filling efficiency of the filler can be improved. In this way, the dielectric tangent after humidification can be reduced, the coefficient of linear expansion can be reduced, and the crack resistance during the thermal cycle after reflow can be improved.

前述樹脂層中之殘留溶劑量,較佳為1.0~7.0質量%,更佳為3.0~5.0質量%,又更佳為3.5~4.5質量%。殘留溶劑為7.0質量%以下時,可抑制熱硬化時之突沸,表面之平坦性良好。又,可抑制熔融黏度過度降低,樹脂產生流動的情形,平坦性良好。殘留溶劑為1.0質量%以上時,層合時之流動性良好,平坦性及埋入性良好。又,殘留溶劑為3.0~5.0質量%時,乾薄膜之操作性及塗膜特性優異。 The amount of residual solvent in the aforementioned resin layer is preferably 1.0 to 7.0% by mass, more preferably 3.0 to 5.0% by mass, and still more preferably 3.5 to 4.5% by mass. When the residual solvent is 7.0% by mass or less, sudden boiling during thermal hardening can be suppressed, and the surface flatness is good. In addition, it is possible to prevent the melt viscosity from being excessively lowered and the resin to flow, and the flatness is good. When the residual solvent is 1.0% by mass or more, the fluidity during lamination is good, and the flatness and embedding properties are good. In addition, when the residual solvent is 3.0 to 5.0% by mass, the handleability of the dry film and the coating film characteristics are excellent.

前述樹脂層中,含有選自由N,N-二甲基甲醯胺、甲苯、環己酮、碳數為8以上之芳香族烴及甲基乙基酮所成群之至少2種的有機溶劑為佳。樹脂層之形成使用含有這種有機溶劑的樹脂組成物時,變得容易得到乾燥餘裕。亦即,可延長乾燥時間,提高乾燥時間之自由度。 The aforementioned resin layer contains at least two organic solvents selected from the group consisting of N,N-dimethylformamide, toluene, cyclohexanone, aromatic hydrocarbons with 8 or more carbon atoms, and methyl ethyl ketone Better. When a resin composition containing such an organic solvent is used for the formation of the resin layer, it becomes easy to obtain a drying margin. That is, the drying time can be extended, and the degree of freedom of the drying time can be increased.

前述硬化性樹脂組成物係含有液狀環氧樹脂等之環氧樹脂的熱硬化性樹脂組成物,具體例可列舉光硬化性熱硬化性樹脂組成物、熱硬化性樹脂組成物、含有光聚合起始劑之光硬化性熱硬化性樹脂組成物、含有光鹼發生劑之光硬化性熱硬化性樹脂組成物、含有光酸產生劑之 光硬化性熱硬化性樹脂組成物、負型光硬化性熱硬化性樹脂組成物及正型感光性熱硬化性樹脂組成物、鹼顯影型光硬化性熱硬化性樹脂組成物、溶劑顯影型光硬化性熱硬化性樹脂組成物、膨潤剝離型熱硬化性樹脂組成物、溶解剝離型熱硬化性樹脂組成物,但是不限定於此等者。又,液狀環氧樹脂等之環氧樹脂,可列舉前述樹脂層所含有之環氧樹脂所例示者。 The aforementioned curable resin composition is a thermosetting resin composition containing epoxy resin such as liquid epoxy resin. Specific examples include photocuring thermosetting resin composition, thermosetting resin composition, and photopolymerization. The light-curing thermosetting resin composition of the initiator, the light-curing thermosetting resin composition containing the photoalkali generator, the one containing the photoacid generator Photocurable thermosetting resin composition, negative type photocuring thermosetting resin composition, positive type photosensitive thermosetting resin composition, alkali development type photocuring thermosetting resin composition, solvent development type light The curable thermosetting resin composition, the swelling peeling type thermosetting resin composition, and the dissolving peeling type thermosetting resin composition, but are not limited to these. Moreover, epoxy resins, such as a liquid epoxy resin, are exemplified by the epoxy resin contained in the aforementioned resin layer.

(光硬化性熱硬化性樹脂組成物) (Photocurable thermosetting resin composition)

光硬化性熱硬化性樹脂組成物之一例,針對除環氧樹脂外,包含含羧基樹脂及光聚合起始劑的樹脂組成物,如下述說明。 As an example of the photocurable thermosetting resin composition, the resin composition containing a carboxyl group-containing resin and a photopolymerization initiator in addition to an epoxy resin is described below.

含羧基樹脂係因含有羧基,而可為鹼顯影性。又,從光硬化性或耐顯影性之觀點,除羧基外,分子內具有乙烯性不飽和鍵為佳,也可僅使用不具有乙烯性不飽和鍵之含羧基樹脂。含羧基樹脂為不具有乙烯性不飽和鍵的情形時,為了將組成物設為光硬化性時,必須併用分子中具有1個以上之乙烯性不飽和鍵的化合物(感光性單體)。乙烯性不飽和鍵較佳為來自丙烯酸或甲基丙烯酸或彼等之衍生物者。含羧基樹脂之中,具有共聚合結構之含羧基樹脂、具有胺基甲酸酯結構之含羧基樹脂、以環氧樹脂作為起始原料之含羧基樹脂、以苯酚化合物作為起始原料之含羧基樹脂為佳。含羧基樹脂之具體例,可列舉以下所列舉之化合物(可為寡聚物或聚合物之任一)。 Since the carboxyl group-containing resin contains a carboxyl group, it can be alkali-developable. In addition, from the viewpoint of photocurability or development resistance, it is preferable to have ethylenically unsaturated bonds in the molecule in addition to the carboxyl group, and it is also possible to use only carboxyl group-containing resins that do not have ethylenically unsaturated bonds. When the carboxyl group-containing resin does not have an ethylenically unsaturated bond, in order to make the composition photocurable, a compound (photosensitive monomer) having one or more ethylenically unsaturated bonds in the molecule must be used in combination. The ethylenically unsaturated bond is preferably derived from acrylic acid or methacrylic acid or their derivatives. Among the carboxyl-containing resins, carboxyl-containing resins with copolymerized structure, carboxyl-containing resins with urethane structure, carboxyl-containing resins with epoxy resin as starting material, carboxyl-containing resins with phenol compound as starting material Resin is better. Specific examples of the carboxyl group-containing resin include the following compounds (which may be either oligomer or polymer).

(1)使如後述之2官能或2官能以上之多官能環氧樹脂與(甲基)丙烯酸反應,使苯二甲酸酐、四氫苯二甲酸酐、六氫苯二甲酸酐等之二元酸(DIBASIC ACID)酐加成於存在於側鏈之羥基的含羧基感光性樹脂。在此,2官能或2官能以上之多官能環氧樹脂較佳為固形。 (1) Reacting a bifunctional or bifunctional or more polyfunctional epoxy resin as described later with (meth)acrylic acid to make a binary system such as phthalic anhydride, tetrahydrophthalic anhydride, and hexahydrophthalic anhydride The acid (DIBASIC ACID) anhydride is added to the carboxyl group-containing photosensitive resin that exists in the hydroxyl group of the side chain. Here, the bifunctional or bifunctional or more polyfunctional epoxy resin is preferably in a solid form.

(2)使如後述之2官能環氧樹脂之羥基再以表氯醇進行環氧化之多官能環氧樹脂與(甲基)丙烯酸反應,所產生之羥基上加成有二元酸酐的含羧基感光性樹脂。在此,2官能環氧樹脂較佳為固形。 (2) The hydroxyl group of the bifunctional epoxy resin described below is then epoxidized with epichlorohydrin and the multifunctional epoxy resin is reacted with (meth)acrylic acid, and the resulting hydroxyl group is added with a carboxyl group containing dibasic acid anhydride Photosensitive resin. Here, the bifunctional epoxy resin is preferably in a solid form.

(3)使1分子中具有2個以上之環氧基的環氧化合物,與1分子中具有至少1個醇性羥基與1個酚性羥基的化合物及(甲基)丙烯酸等之含有不飽和基之單羧酸反應,對於所得之反應生成物之醇性羥基,與馬來酸酐(maleic anhydride)、四氫苯二甲酸酐、偏苯三甲酸酐、均苯四甲酸酐、己二酸等之多元酸酐反應,得到含羧基感光性樹脂。 (3) Unsaturation of epoxy compounds having two or more epoxy groups in one molecule, compounds having at least one alcoholic hydroxyl group and one phenolic hydroxyl group in one molecule, and (meth)acrylic acid, etc. For the reaction of the alcoholic hydroxyl group of the resulting reaction product with maleic anhydride, tetrahydrophthalic anhydride, trimellitic anhydride, pyromellitic anhydride, adipic acid, etc. The polybasic acid anhydride reacts to obtain a carboxyl group-containing photosensitive resin.

(4)使雙酚A、雙酚F、雙酚S、酚醛清漆型酚樹脂、聚-p-羥基苯乙烯、萘酚與醛類之縮合物、二羥基萘與醛類之縮合物等之1分子中具有2個以上之酚性羥基的化合物與環氧乙烷、環氧丙烷等之環氧化物反應所得之反應生成物,與(甲基)丙烯酸等之含有不飽和基之單羧酸反應所得之反應生成物與多元酸酐反應所得之含羧基感光性樹脂。 (4) Make bisphenol A, bisphenol F, bisphenol S, novolac type phenol resin, poly-p-hydroxystyrene, condensate of naphthol and aldehyde, condensate of dihydroxy naphthalene and aldehyde, etc. A reaction product obtained by reacting a compound having two or more phenolic hydroxyl groups in a molecule with an epoxide such as ethylene oxide and propylene oxide, and an unsaturated group-containing monocarboxylic acid such as (meth)acrylic acid A carboxyl group-containing photosensitive resin obtained by reacting the reaction product obtained by the reaction with a polybasic acid anhydride.

(5)使1分子中具有2個以上之酚性羥基的化合物與碳酸乙烯酯、碳酸丙烯酯等之環狀碳酸酯化合物反應所得之反應生成物,與含有不飽和基之單羧酸反應所得之反應生成物,與多元酸酐反應所得之含有羧基感光性樹脂。 (5) The reaction product obtained by reacting a compound having two or more phenolic hydroxyl groups in a molecule with a cyclic carbonate compound such as ethylene carbonate and propylene carbonate, and the reaction product obtained by reacting a monocarboxylic acid containing an unsaturated group The reaction product is a carboxyl group-containing photosensitive resin obtained by reacting with polybasic acid anhydride.

(6)脂肪族二異氰酸酯、分枝脂肪族二異氰酸酯、脂環式二異氰酸酯、芳香族二異氰酸酯等之二異氰酸酯化合物與、聚碳酸酯系多元醇、聚醚系多元醇、聚酯系多元醇、聚烯烴系多元醇、丙烯酸系多元醇、雙酚A系環氧烷(alkylene oxide)加成物二醇、具有酚性羥基及醇性羥基之化合物等之二醇化合物之藉由加成聚合反應(polyaddition reaction)之胺基甲酸酯樹脂之末端,使與酸酐反應所成之末端含羧基之胺基甲酸酯樹脂。 (6) Diisocyanate compounds such as aliphatic diisocyanates, branched aliphatic diisocyanates, alicyclic diisocyanates, and aromatic diisocyanates, and polycarbonate polyols, polyether polyols, and polyester polyols , Polyolefin-based polyols, acrylic polyols, bisphenol A-based alkylene oxide adducts, diols, compounds with phenolic hydroxyl groups and alcoholic hydroxyl groups, etc. by addition polymerization The end of the urethane resin of the polyaddition reaction is reacted with an acid anhydride to form a carboxyl-containing urethane resin at the end.

(7)二異氰酸酯與二羥甲基丙酸、二羥甲基丁酸等之含羧基二醇化合物與二醇化合物之藉由加成聚合反應之含羧基之胺基甲酸酯樹脂之合成中,添加羥基烷基(甲基)丙烯酸酯等之分子中具有1個羥基與1個以上之(甲基)丙烯醯基的化合物,進行末端(甲基)丙烯酸化之含羧基之胺基甲酸酯樹脂。 (7) In the synthesis of carboxyl-containing urethane resins by addition polymerization of carboxyl-containing diol compounds such as diisocyanate, dimethylolpropionic acid, dimethylolbutyric acid, and diol compounds , Add hydroxyalkyl (meth)acrylate and other compounds having one hydroxyl group and one or more (meth)acrylic acid groups in the molecule, and carry out terminal (meth)acrylation of carboxyl-containing amino formic acid Ester resin.

(8)二異氰酸酯與含羧基之二醇化合物與二醇化合物之藉由加成聚合反應之含羧基之胺基甲酸酯樹脂之合成中,添加異佛爾酮二異氰酸酯與季戊四醇三丙烯酸酯之等莫耳反應物等,分子中具有1個異氰酸酯基與1個以上之(甲基)丙烯醯基的化合物,進行末端(甲基)丙 烯酸化之含羧基之胺基甲酸酯樹脂。 (8) In the synthesis of diisocyanate and carboxyl-containing diol compound and diol compound by addition polymerization of carboxyl-containing urethane resin, one of isophorone diisocyanate and pentaerythritol triacrylate is added Mole reactants, etc., a compound having one isocyanate group and one or more (meth)acrylic groups in the molecule, and the terminal (meth)acrylic acid Acrylated carboxyl-containing urethane resin.

(9)(甲基)丙烯酸等之不飽和羧酸與苯乙烯、α-甲基苯乙烯、低級烷基(甲基)丙烯酸酯、二異丁烯等之含有不飽和基化合物之藉由共聚合所得之含羧基感光性樹脂。 (9) Copolymerization of unsaturated carboxylic acids such as (meth)acrylic acid and unsaturated group-containing compounds such as styrene, α-methylstyrene, lower alkyl (meth)acrylate, diisobutylene, etc. The carboxyl-containing photosensitive resin.

(10)對於使多官能氧雜環丁烷樹脂與己二酸、苯二甲酸、六氫苯二甲酸等之二羧酸反應所產生之一級羥基上加成有二元酸酐之含羧基聚酯樹脂,再加成有環氧丙基(甲基)丙烯酸酯、α-甲基環氧丙基(甲基)丙烯酸酯等之1分子中具有1個環氧基與1個以上之(甲基)丙烯醯基之化合物所成之含羧基感光性樹脂。 (10) For polyfunctional oxetane resin and dicarboxylic acid such as adipic acid, phthalic acid, hexahydrophthalic acid, etc., the carboxyl group-containing polyester with dibasic acid anhydride added to the primary hydroxyl group Resins, with glycidyl (meth)acrylate, α-methylglycidyl (meth)acrylate, etc., which have one epoxy group and more than one (methyl) per molecule ) A carboxyl group-containing photosensitive resin formed from an acrylic compound.

(11)對於上述(1)~(10)之任一之含羧基樹脂加成有1分子中具有環狀醚基與(甲基)丙烯醯基之化合物之含羧基感光性樹脂。 (11) A carboxyl group-containing photosensitive resin containing a compound having a cyclic ether group and a (meth)acryloyl group in one molecule is added to the carboxyl group-containing resin of any one of (1) to (10) above.

又,在此(甲基)丙烯酸酯係指丙烯酸酯、甲基丙烯酸酯及彼等之混合物總稱的用語,對於以下其他的類似的敘述也同樣。 In addition, (meth)acrylate here refers to a general term of acrylate, methacrylate, and their mixture, and the same applies to other similar descriptions below.

含羧基樹脂之酸價,較佳為40~150mgKOH/g。藉由使含羧基樹脂之酸價設為40mgKOH/g以上,鹼顯影變得良好。又,藉由將酸價設為150mgKOH/g以下,可使正常之阻劑圖型之描繪變得容易。更佳為50~130mgKOH/g。 The acid value of the carboxyl group-containing resin is preferably 40 to 150 mgKOH/g. By setting the acid value of the carboxyl group-containing resin to 40 mgKOH/g or more, alkali development becomes good. In addition, by setting the acid value to 150 mgKOH/g or less, it is easy to draw a normal resist pattern. More preferably, it is 50~130mgKOH/g.

含羧基樹脂之調配量係以除去溶劑後之乾薄膜之樹脂層全量基準,較佳為20~60質量%。藉由設為20 質量%以上,可提高塗膜強度。又,藉由設為60質量%以下,黏性適當,提高加工性。更佳為20~50質量%。 The compounding amount of the carboxyl-containing resin is based on the total amount of the resin layer of the dry film after removing the solvent, and is preferably 20-60% by mass. By setting it to 20 Above mass%, the strength of the coating film can be improved. In addition, by setting it to 60% by mass or less, the viscosity is appropriate and the workability is improved. More preferably, it is 20-50% by mass.

光聚合起始劑可使用習知者,其中較佳為具有肟酯基之肟酯系光聚合起始劑、α-胺基苯乙酮系光聚合起始劑、醯基氧化磷系光聚合起始劑、二茂鈦系光聚合起始劑。光聚合起始劑可單獨使用1種或併用2種以上使用。 As the photopolymerization initiator, known ones can be used, and among them, an oxime ester-based photopolymerization initiator having an oxime ester group, an α-aminoacetophenone-based photopolymerization initiator, and an oxyphosphorus-based photopolymerization initiator are preferred. Initiator, titanocene-based photopolymerization initiator. A photopolymerization initiator can be used individually by 1 type or in combination of 2 or more types.

光聚合起始劑之調配量,例如相對於含羧基樹脂100質量份,為0.1~30質量份。 The compounding amount of the photopolymerization initiator is, for example, 0.1 to 30 parts by mass relative to 100 parts by mass of the carboxyl group-containing resin.

使用肟酯系光聚合起始劑時之調配量係相對於含羧基樹脂100質量份,較佳為0.01~5質量份。藉由設為0.01質量份以上,在銅上之光硬化性更確實,提高耐藥品性等之塗膜特性。又,藉由設為5質量份以下,在塗膜表面之光吸收被抑制,也有提高深部之硬化性的傾向。相對於含羧基樹脂100質量份,更佳為0.5~3質量份。 The compounding amount when using the oxime ester-based photopolymerization initiator is preferably 0.01 to 5 parts by mass relative to 100 parts by mass of the carboxyl group-containing resin. By setting it to 0.01 parts by mass or more, the photocuring property on copper is more reliable, and the coating film properties such as chemical resistance are improved. In addition, by setting it as 5 parts by mass or less, light absorption on the surface of the coating film is suppressed, and there is also a tendency to improve the curability of the deep part. It is more preferably 0.5 to 3 parts by mass relative to 100 parts by mass of the carboxyl group-containing resin.

使用α-胺基苯乙酮系光聚合起始劑或醯基氧化磷系光聚合起始劑時之各自之調配量係相對於含羧基樹脂100質量份,較佳為0.01~15質量份。藉由設為0.01質量份以上,在銅上之光硬化性更確實,提高耐藥品性等之塗膜特性。又,藉由設為15質量份以下,可得到充分之釋氣(Outgas)之低減效果,進一步在硬化被膜表面之光吸收被抑制,也提高深部之硬化性的傾向。相對於含羧基樹脂100質量份,更佳為0.5~10質量份。 When an α-aminoacetophenone-based photopolymerization initiator or an acetoxyphosphorus-based photopolymerization initiator is used, the respective compounding amount is based on 100 parts by mass of the carboxyl group-containing resin, preferably 0.01-15 parts by mass. By setting it to 0.01 parts by mass or more, the photocuring property on copper is more reliable, and the coating film properties such as chemical resistance are improved. In addition, by setting it to 15 parts by mass or less, sufficient outgas reduction effect can be obtained, and light absorption on the surface of the cured film is further suppressed, and the tendency of deep curability is also improved. It is more preferably 0.5 to 10 parts by mass relative to 100 parts by mass of the carboxyl group-containing resin.

與上述光聚合起始劑併用,也可使用光開始助劑或增感劑。光開始助劑或增感劑,可列舉苯偶因化合物、苯乙酮化合物、蒽醌化合物、噻噸酮化合物、縮醛化合物、二苯甲酮化合物、三級胺化合物、及呫噸酮化合物等。此等之化合物也有可作為光聚合起始劑使用的情形,但是與光聚合起始劑併用使用為佳。又,光開始助劑或增感劑可單獨使用1種或併用2種以上。 In combination with the above-mentioned photopolymerization initiator, a photoinitiator or sensitizer can also be used. Light initiation aids or sensitizers, including benzidine compounds, acetophenone compounds, anthraquinone compounds, thioxanthone compounds, acetal compounds, benzophenone compounds, tertiary amine compounds, and xanthone compounds Wait. These compounds can also be used as photopolymerization initiators, but they are preferably used in combination with photopolymerization initiators. In addition, a photo-initiating aid or a sensitizer may be used alone or in combination of two or more kinds.

光硬化性熱硬化性樹脂組成物,為了提高耐熱性、絕緣信賴性等特性之目的,也可含有環氧樹脂以外之熱硬化性成分。這種熱硬化性成分,可使用異氰酸酯化合物、嵌段異氰酸酯化合物、胺基樹脂、馬來醯亞胺化合物、苯並噁嗪(benzoxazine)樹脂、碳二亞胺(CARBODIIMIDE)樹脂、環碳酸酯化合物、多官能氧雜環丁烷化合物、環硫化物樹脂等之習知慣用的熱硬化性樹脂。 The photocurable thermosetting resin composition may contain thermosetting components other than epoxy resin for the purpose of improving the characteristics of heat resistance and insulation reliability. For this thermosetting component, isocyanate compounds, blocked isocyanate compounds, amino resins, maleimide compounds, benzoxazine resins, CARBODIIMIDE resins, cyclic carbonate compounds can be used , Polyfunctional oxetane compounds, episulfide resins and other conventionally used thermosetting resins.

熱硬化性成分之調配量係相對於含羧基樹脂100質量份,較佳為10~100質量份。 The blending amount of the thermosetting component is preferably 10-100 parts by mass relative to 100 parts by mass of the carboxyl group-containing resin.

光硬化性熱硬化性樹脂組成物係相對於熱硬化觸媒為佳。這種熱硬化觸媒,可列舉例如咪唑、2-甲基咪唑、2-乙基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、4-苯基咪唑、1-氰基乙基-2-苯基咪唑、1-(2-氰基乙基)-2-乙基-4-甲基咪唑等之咪唑衍生物;雙氰胺、苄基二甲基胺、4-(二甲基胺基)-N,N-二甲基苄基胺、4-甲氧基-N,N-二甲基苄基胺、4-甲基-N,N-二甲基苄基胺等之胺化 合物、己二酸二聯胺、癸二酸二聯胺等之肼化合物;三苯基膦等之磷化合物等。又,可使用胍胺、乙醯基胍胺、苯胍胺、三聚氰胺、2,4-二胺基-6-甲基丙烯醯氧基乙基-S-三嗪、2-乙烯基-2,4-二胺基-S-三嗪、2-乙烯基-4,6-二胺基-S-三嗪.異三聚氰酸加成物、2,4-二胺基-6-甲基丙烯醯氧基乙基-S-三嗪.異三聚氰酸加成物等之S-三嗪衍生物,較佳為將此等也可作為密著性賦予劑機能之化合物與熱硬化觸媒併用。 The photocurable thermosetting resin composition system is better than the thermosetting catalyst. Such thermosetting catalysts include, for example, imidazole, 2-methylimidazole, 2-ethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 4-phenylimidazole, 1-cyanide Dicyandiamide, benzyldimethylamine, 1-(2-cyanoethyl)-2-ethyl-4-methylimidazole and other imidazole derivatives; dicyandiamide, benzyldimethylamine, 4- (Dimethylamino)-N,N-dimethylbenzylamine, 4-methoxy-N,N-dimethylbenzylamine, 4-methyl-N,N-dimethylbenzyl Amination of amines, etc. Hydrazine compounds such as dihydrazine adipic acid and sebacic acid diamine; phosphorus compounds such as triphenylphosphine, etc. In addition, guanamine, acetoguanamine, benzoguanamine, melamine, 2,4-diamino-6-methacryloxyethyl-S-triazine, 2-vinyl-2, 4-Diamino-S-triazine, 2-vinyl-4,6-diamino-S-triazine. Isocyanuric acid adduct, 2,4-diamino-6-methacryloyloxyethyl-S-triazine. S-triazine derivatives such as isocyanuric acid adducts are preferably used in combination with a thermosetting catalyst as a compound that also functions as an adhesion imparting agent.

熱硬化觸媒之調配量係相對於環氧樹脂100質量份,較佳為0.1~20質量份,更佳為0.5~15.0質量份。 The blending amount of the thermosetting catalyst is based on 100 parts by mass of the epoxy resin, preferably 0.1-20 parts by mass, more preferably 0.5-15.0 parts by mass.

光硬化性熱硬化性樹脂組成物中,除上述含羧基樹脂、光聚合起始劑、及環氧樹脂外,也可含有感光性單體。感光性單體係分子中具有1個以上之乙烯性不飽和鍵的化合物。感光性單體係藉由活性能量線照射幫助含羧基樹脂之光硬化者。 In addition to the aforementioned carboxyl group-containing resin, photopolymerization initiator, and epoxy resin, the photocurable thermosetting resin composition may also contain a photosensitive monomer. A compound having at least one ethylenic unsaturated bond in the photosensitive single-system molecule. The photosensitive single system is irradiated with active energy rays to help the light hardening of the carboxyl-containing resin.

可作為感光性單體使用的化合物,可列舉例如慣用習知之聚酯(甲基)丙烯酸酯、聚醚(甲基)丙烯酸酯、胺基甲酸酯(甲基)丙烯酸酯、碳酸酯(甲基)丙烯酸酯、環氧基(甲基)丙烯酸酯等。具體而言,2-羥基乙基丙烯酸酯、2-羥基丙基丙烯酸酯等之羥基烷基丙烯酸酯類;乙二醇、甲氧基四乙二醇、聚乙二醇、丙二醇等之乙二醇之二丙烯酸酯類;N,N-二甲基丙烯醯胺、N-羥甲基丙烯醯胺、N,N-二甲基胺基丙基丙烯醯胺等之丙烯醯胺 類;N,N-二甲基胺基乙基丙烯酸酯、N,N-二甲基胺基丙基丙烯酸酯等之胺基烷基丙烯酸酯類;己二醇、三羥甲基丙烷、季戊四醇、二季戊四醇、參-羥基乙基三聚異氰酸酯等之多元醇或此等之環氧乙烷加成物、環氧丙烷加成物、或ε-己內酯加成物等之多元丙烯酸酯類;苯氧基丙烯酸酯、雙酚A二丙烯酸酯、及此等之酚類之環氧乙烷加成物或環氧丙烷加成物等之多元丙烯酸酯類;丙三醇二環氧丙醚、丙三醇三環氧丙醚、三羥甲基丙烷三環氧丙醚、三環氧丙基三聚異氰酸酯等之環氧丙醚之多元丙烯酸酯類;不限於前述,可由聚醚多元醇、聚碳酸酯二醇、羥基末端聚丁二烯、聚酯多元醇等之多元醇直接丙烯酸酯化、或經由二異氰酸酯,進行胺基甲酸酯丙烯酸酯化之丙烯酸酯類及三聚氰胺丙烯酸酯、及與前述丙烯酸酯對應之各甲基丙烯酸酯類之任一至少1種適宜選擇使用。 Compounds that can be used as photosensitive monomers include, for example, conventionally known polyester (meth)acrylates, polyether (meth)acrylates, urethane (meth)acrylates, and carbonate (meth)acrylates. Base) acrylate, epoxy (meth)acrylate, etc. Specifically, hydroxyalkyl acrylates such as 2-hydroxyethyl acrylate and 2-hydroxypropyl acrylate; ethylene glycol, methoxytetraethylene glycol, polyethylene glycol, propylene glycol, etc. Alcohol diacrylates; acrylamides such as N,N-dimethyl acrylamide, N-methylol acrylamide, N,N-dimethylaminopropyl acrylamide, etc. Class; N,N-dimethylaminoethyl acrylate, N,N-dimethylaminopropyl acrylate and other amino alkyl acrylates; hexanediol, trimethylolpropane, pentaerythritol , Dipentaerythritol, ginseng-hydroxyethyl trimeric isocyanate and other polyols or these ethylene oxide adducts, propylene oxide adducts, or ε-caprolactone adducts and other polyacrylates ; Phenoxy acrylate, bisphenol A diacrylate, and polyacrylates such as ethylene oxide adducts or propylene oxide adducts of these phenols; glycerol diglycidyl ether , Glycerol triglycidyl ether, trimethylolpropane triglycidyl ether, triglycidyl triglycidyl isocyanate, etc. Polyacrylates of glycidyl ether; not limited to the foregoing, it can be polyether polyol , Polycarbonate diol, hydroxyl-terminated polybutadiene, polyester polyol and other polyols are directly acrylated, or urethane acrylated acrylates and melamine acrylates through diisocyanate, And any one of at least one of each methacrylate corresponding to the aforementioned acrylate is appropriately selected and used.

使甲酚酚醛清漆型環氧樹脂等之多官能環氧樹脂與丙烯酸反應之環氧基丙烯酸酯樹脂或、再將該環氧基丙烯酸酯樹脂之羥基與季戊四醇三丙烯酸酯等之羥基丙烯酸酯與異佛爾酮二異氰酸酯等之二異氰酸酯之半胺基甲酸酯化合物反應之環氧基胺基甲酸酯丙烯酸酯化合物等,也可作為感光性單體使用。這種環氧基丙烯酸酯系樹脂不會使指觸乾燥性降低,可提高光硬化性。 An epoxy acrylate resin that reacts a multifunctional epoxy resin such as a cresol novolak type epoxy resin with acrylic acid or an epoxy acrylate resin such as the hydroxyl group of the epoxy acrylate resin and a hydroxy acrylate such as pentaerythritol triacrylate and the like The epoxy urethane acrylate compound, etc., which react with the half urethane compound of the diisocyanate such as isophorone diisocyanate, can also be used as a photosensitive monomer. This epoxy acrylate-based resin does not reduce the dryness to the touch, and can improve the photocurability.

作為感光性單體使用之分子中具有乙烯性不飽和鍵之化合物之調配量,相對於含羧基樹脂100質量份,較佳為5~100質量份,更佳為5~70質量份之比例。 藉由將具有乙烯性不飽和鍵之化合物之調配量設為5質量份以上,可提高光硬化性熱硬化性樹脂組成物之光硬化性。又,藉由將調配量設為100質量份以下,可提高塗膜硬度。 The compounding amount of the compound having an ethylenically unsaturated bond in the molecule used as the photosensitive monomer is preferably 5-100 parts by mass, and more preferably 5-70 parts by mass relative to 100 parts by mass of the carboxyl group-containing resin. By setting the compounding amount of the compound having an ethylenically unsaturated bond to 5 parts by mass or more, the photocurability of the photocurable thermosetting resin composition can be improved. In addition, by setting the blending amount to 100 parts by mass or less, the hardness of the coating film can be increased.

光硬化性熱硬化性樹脂組成物除上述成分以外,也可含有填料為佳,也可含有著色劑、彈性體、熱可塑性樹脂等之其他的成分。以下說明此等成分。 In addition to the above-mentioned components, the photocurable thermosetting resin composition may preferably contain fillers, and may also contain other components such as colorants, elastomers, and thermoplastic resins. These ingredients are explained below.

光硬化性熱硬化性樹脂組成物中,為了提高所得之硬化物之物理強度等,必要時可調配填料。填料無特別限定,可列舉例如前述樹脂層所含有之填料所例示者。填料可單獨使用1種或作為2種以上之混合物使用。 In the photocurable thermosetting resin composition, fillers may be blended as necessary in order to improve the physical strength of the cured product obtained. The filler is not particularly limited, and examples thereof include those exemplified for the filler contained in the aforementioned resin layer. The filler can be used singly or as a mixture of two or more.

填料之添加量係相對於含羧基樹脂100質量份,較佳為500質量份以下,更佳為0.1~400質量份,特佳為0.1~300質量份。填料之添加量為500質量份以下的情形,光硬化性熱硬化性樹脂組成物之黏度不會變得過高,印刷性佳,硬化物不易變脆。 The addition amount of the filler is based on 100 parts by mass of the carboxyl group-containing resin, preferably 500 parts by mass or less, more preferably 0.1 to 400 parts by mass, and particularly preferably 0.1 to 300 parts by mass. When the amount of filler added is 500 parts by mass or less, the viscosity of the photocurable thermosetting resin composition will not become too high, the printability will be good, and the cured product will not easily become brittle.

光硬化性熱硬化性樹脂組成物中,可含有著色劑。著色劑可使用紅、藍、綠、黃、黑、白等之習知的著色劑,可為顏料、染料、色素之任一。但是從對環境負擔降低及對人體之影響的觀點,含有鹵素為佳。 The photocurable thermosetting resin composition may contain a coloring agent. As the coloring agent, conventional coloring agents such as red, blue, green, yellow, black, and white can be used, and can be any of pigments, dyes, and pigments. However, from the viewpoint of reducing the burden on the environment and affecting the human body, it is preferable to contain halogen.

著色劑之添加量無特別限制,相對於含羧基樹脂100質量份,較佳為10質量份以下,特佳為0.1~7質量份之比例即可。 The addition amount of the coloring agent is not particularly limited, and it is preferably 10 parts by mass or less, particularly preferably 0.1-7 parts by mass relative to 100 parts by mass of the carboxyl group-containing resin.

又,光硬化性熱硬化性樹脂組成物中,為了 對所得之硬化物之柔軟性之賦予,硬化物之脆度之改善等為目的,可調配彈性體。彈性體可列舉例如聚酯系彈性體、聚胺基甲酸脂系彈性體、聚酯胺基甲酸酯系彈性體、聚醯胺系彈性體、聚酯醯胺系彈性體、丙烯酸系彈性體、烯烴系彈性體等。又,將具有各種骨架之環氧樹脂之一部分或全部之環氧基以兩末端羧酸改性型丁二烯-丙烯腈橡膠改性的樹脂等也可使用。此外,含有環氧基聚丁二烯系彈性體、含有丙烯酸聚丁二烯系彈性體、含有羥基之聚丁二烯系彈性體、含有羥基之異戊二烯系彈性體等也可使用。彈性體可單獨使用1種或作為2種類以上之混合物使用。 In addition, in the photocurable thermosetting resin composition, in order to For the purpose of imparting flexibility to the obtained hardened product and improving the brittleness of the hardened product, an elastomer can be formulated. Elastomers include, for example, polyester elastomers, polyurethane elastomers, polyester urethane elastomers, polyamide elastomers, polyester amide elastomers, and acrylic elastomers. , Olefin-based elastomers, etc. In addition, resins in which part or all of epoxy groups of epoxy resins having various skeletons are modified with carboxylic acid-modified butadiene-acrylonitrile rubber at both ends can also be used. In addition, epoxy-containing polybutadiene-based elastomers, acrylic-containing polybutadiene-based elastomers, hydroxyl-containing polybutadiene-based elastomers, hydroxyl-containing isoprene-based elastomers, and the like can also be used. Elastomers can be used singly or as a mixture of two or more types.

彈性體之添加量係相對於含羧基樹脂100質量份,較佳為50質量份以下,更佳為1~30質量份,特佳為5~30質量份。彈性體之添加量為50質量份以下的情形,光硬化性熱硬化性樹脂組成物之鹼顯影性為良好,可顯影之可使時間不易變短。 The addition amount of the elastomer is relative to 100 parts by mass of the carboxyl group-containing resin, preferably 50 parts by mass or less, more preferably 1-30 parts by mass, and particularly preferably 5-30 parts by mass. When the addition amount of the elastomer is 50 parts by mass or less, the alkali developability of the photocurable thermosetting resin composition is good, and it can be developed so that the time is not easily shortened.

又,光硬化性熱硬化性樹脂組成物中,必要時可調配嵌段共聚物、密著促進劑、抗氧化劑、紫外線吸收劑等之成分。此等可使用在電子材料之領域中之習知物。又,可調配如微粉二氧化矽、水滑石、有機膨潤土、微晶高嶺石等之習知慣用之增黏劑、聚矽氧系、氟系、高分子系等之消泡劑、平坦劑、咪唑系、噻唑系、三唑系等之矽烷偶合劑、防銹劑、螢光增白劑等之習知慣用之添加劑類之至少任一種。 In addition, in the photocurable thermosetting resin composition, components such as block copolymers, adhesion promoters, antioxidants, and ultraviolet absorbers may be blended as necessary. These conventional objects can be used in the field of electronic materials. In addition, it can be formulated with conventionally used tackifiers such as micropowder silica, hydrotalcite, organic bentonite, microcrystalline kaolinite, defoaming agents, leveling agents, etc. of polysiloxane, fluorine, and polymer systems, etc. At least one of the conventionally used additives such as imidazole series, thiazole series, triazole series, etc., silane coupling agents, rust inhibitors, fluorescent whitening agents, etc.

可使用之有機溶劑無特別限制,可列舉例如酮類、芳香族烴類、乙二醇醚類、乙二醇醚乙酸酯類、酯類、醇類、脂肪族烴、石油系溶劑等。更具體而言,可列舉甲基乙基酮、環己酮、甲基丁基酮、甲基異丁基酮、甲基乙基酮等之酮類;甲苯、二甲苯、四甲基苯等之芳香族烴類;溶纖素、甲基溶纖素、丁基溶纖素、卡必醇、甲基卡必醇、丁基卡必醇、乙二醇單甲醚、乙二醇單乙醚、乙二醇單丁醚、丙二醇單甲醚、二丙二醇單甲醚、二丙二醇二乙醚、三乙二醇單乙醚等之乙二醇醚類;乙酸乙酯、乙酸丁酯、乙酸異丁酯、乙二醇單乙醚乙酸酯、二丙二醇甲醚乙酸酯、丙二醇甲醚乙酸酯、丙二醇乙醚乙酸酯、丙二醇丁醚乙酸酯等之酯類;乙醇、丙醇、2-甲氧基丙醇、n-丁醇、異丁醇、異戊醇、乙二醇、丙二醇等之醇類;辛烷、癸烷等之脂肪族烴;石油醚、石油腦、氫化石油腦、溶劑石油腦等之石油系溶劑等外,尚有N,N-二甲基甲醯胺(DMF)、四氯乙烯、松節油(turpentine)等。又,可使用丸善石油化學公司製Swasol 1000、Swasol 1500、標準石油大阪販售所公司製SOLVESSO 100、SOLVESSO 150、三共化學公司製solvent#100、solvent#150、Shell Chemicals Japan公司製shellsol A100、shellsolA150、出光興產公司製Ipsol100號、Ipsol150號等之有機溶劑。這種有機溶劑可單獨使用1種或作為2種類以上之混合物使用。 The organic solvent that can be used is not particularly limited, and examples thereof include ketones, aromatic hydrocarbons, glycol ethers, glycol ether acetates, esters, alcohols, aliphatic hydrocarbons, and petroleum-based solvents. More specifically, ketones such as methyl ethyl ketone, cyclohexanone, methyl butyl ketone, methyl isobutyl ketone, methyl ethyl ketone, etc.; toluene, xylene, tetramethyl benzene, etc. Of aromatic hydrocarbons; cellosolve, methyl cellosolve, butyl cellosolve, carbitol, methyl carbitol, butyl carbitol, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethyl Glycol ethers such as glycol monobutyl ether, propylene glycol monomethyl ether, dipropylene glycol monomethyl ether, dipropylene glycol diethyl ether, triethylene glycol monoethyl ether, etc.; ethyl acetate, butyl acetate, isobutyl acetate, ethyl acetate Glycol monoethyl ether acetate, dipropylene glycol methyl ether acetate, propylene glycol methyl ether acetate, propylene glycol ethyl ether acetate, propylene glycol butyl ether acetate and other esters; ethanol, propanol, 2-methoxy Alcohols such as propanol, n-butanol, isobutanol, isoamyl alcohol, ethylene glycol, and propylene glycol; aliphatic hydrocarbons such as octane and decane; petroleum ether, naphtha, hydrogenated naphtha, solvent naphtha In addition to other petroleum-based solvents, there are N,N-dimethylformamide (DMF), tetrachloroethylene, turpentine, etc. In addition, Swasol 1000 and Swasol 1500 manufactured by Maruzen Petrochemical Company, SOLVESSO 100 and SOLVESSO 150 manufactured by Standard Petroleum Osaka Sales Office, solvent#100, solvent#150 manufactured by Sankyo Chemical Co., Ltd., shellsol A100, shellsolA150 manufactured by Shell Chemicals Japan Co., Ltd. can be used. , Idemitsu Kosan Co.'s Ipsol No. 100, Ipsol No. 150 and other organic solvents. This organic solvent can be used singly or as a mixture of two or more types.

使用具有由光硬化性熱硬化性樹脂組成物所 成之樹脂層之乾薄膜的印刷配線板之製造方法,使用以往習知方法即可。例如,如圖2所示在第一薄膜與第二薄膜之間挾有樹脂層之乾薄膜的情形,可以如下述的方法製造印刷配線板。由乾薄膜剝離第二薄膜,使樹脂層露出,在形成有電路圖型的基板上,使用真空層合機等,層合乾薄膜的樹脂層,對樹脂層進行圖型曝光。第一薄膜可在層合後曝光前或曝光後之任一,剝離即可。然後,藉由進行鹼顯影,在基板上形成經圖型化之樹脂層,藉由光照射及熱使經圖型化之樹脂層硬化,藉由形成硬化被膜,可製造印刷配線板。 The use of light-curable thermosetting resin composition The manufacturing method of the printed wiring board of the dry film of the resin layer can be made by a conventionally known method. For example, in the case of a dry film in which a resin layer is interposed between the first film and the second film as shown in FIG. 2, a printed wiring board can be manufactured as follows. The second film is peeled from the dry film to expose the resin layer. On the substrate on which the circuit pattern is formed, the resin layer of the dry film is laminated using a vacuum laminator or the like, and the resin layer is pattern-exposed. The first film can be peeled off either before or after exposure after lamination. Then, by performing alkali development, a patterned resin layer is formed on the substrate, and the patterned resin layer is cured by light irradiation and heat, and by forming a cured film, a printed wiring board can be manufactured.

(熱硬化性樹脂組成物) (Thermosetting resin composition)

作為熱硬化性樹脂組成物之一例,針對不含光硬化性成分,含有環氧樹脂之樹脂組成物,進行下述說明。 As an example of a thermosetting resin composition, a resin composition containing no photocurable component and containing an epoxy resin will be described below.

熱硬化性樹脂組成物中調配填料為佳,可提高所得之硬化物之物理強度等。填料無特別限制,可列舉例如前述樹脂層所含有之填料所例示者。填料可單獨使用1種或作為2種類以上之混合物使用。 It is better to mix fillers in the thermosetting resin composition, which can improve the physical strength of the cured product obtained. The filler is not particularly limited, and examples thereof include those exemplified for the filler contained in the aforementioned resin layer. The filler can be used singly or as a mixture of two or more types.

可使用的有機溶劑無特別限制,可列舉例如前述光硬化性熱硬化性樹脂組成物所例示之有機溶劑。有機溶劑可單獨使用1種或作為2種類以上之混合物使用。 The organic solvent that can be used is not particularly limited, and examples thereof include the organic solvents exemplified in the aforementioned photocurable thermosetting resin composition. The organic solvent can be used singly or as a mixture of two or more types.

熱硬化性樹脂組成物可含有硬化劑。硬化劑可列舉酚樹脂、聚羧酸及其酸酐、氰酸酯樹脂、活性酯樹脂、馬來醯亞胺化合物、脂環式烯烴聚合物等。硬化劑可 單獨使用1種或組合2種以上使用。在此,藉由至少使用氰酸酯樹脂或活性酯樹脂,可降低加濕後之介電正切。又,藉由至少使用氰酸酯樹脂或馬來醯亞胺化合物,可提高回焊後之冷熱循環時的龜裂耐性。 The thermosetting resin composition may contain a curing agent. Examples of hardeners include phenol resins, polycarboxylic acids and their anhydrides, cyanate ester resins, active ester resins, maleimide compounds, and alicyclic olefin polymers. Hardener can One type is used alone or two or more types are used in combination. Here, by using at least a cyanate ester resin or an active ester resin, the dielectric tangent after humidification can be reduced. In addition, by using at least a cyanate ester resin or a maleimide compound, the crack resistance during the cooling and heating cycle after reflow can be improved.

樹脂層為由熱硬化性樹脂組成物所成的情形,以高溫硬化時,容易產生氣泡,但是依據本發明之乾薄膜時,即使為含有酚樹脂、活性酯樹脂、氰酸酯樹脂等需要高溫硬化之硬化劑的情形,硬化後也不易產生氣泡。又,硬化劑較佳為具有、聯苯骨架及萘酚骨架之至少任一結構。 When the resin layer is made of a thermosetting resin composition, it is easy to generate bubbles when cured at a high temperature. However, the dry film according to the present invention requires high temperature even if it contains phenol resin, active ester resin, cyanate ester resin, etc. In the case of hardening agent, it is not easy to produce bubbles after hardening. In addition, the curing agent preferably has at least any structure of a biphenyl skeleton and a naphthol skeleton.

作為前述酚樹脂,可將苯酚酚醛清漆樹脂、烷基苯酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、二環戊二烯型酚樹脂、Xylok型酚樹脂、萜烯改性酚樹脂、甲酚/萘酚樹脂、聚乙烯基酚類、苯酚/萘酚樹脂、含有α-萘酚骨架酚樹脂、含有三嗪骨架甲酚酚醛清漆樹脂、聯苯基芳烷基型酚樹脂、Zilog型苯酚酚醛清漆樹脂等之以往習知者,以1種單獨使用或組合2種以上使用。 As the aforementioned phenol resin, phenol novolak resin, alkylphenol novolak resin, bisphenol A novolak resin, dicyclopentadiene type phenol resin, Xylok type phenol resin, terpene-modified phenol resin, cresol/ Naphthol resin, polyvinyl phenols, phenol/naphthol resin, phenol resin containing α-naphthol skeleton, cresol novolak resin containing triazine skeleton, biphenyl aralkyl phenol resin, Zilog phenol novolak Conventionally known resins such as resins are used singly or in combination of two or more.

前述酚樹脂之中,以羥基當量為130g/eq.以上者為佳,更佳為150g/eq.以上者。羥基當量為130g/eq.以上之酚樹脂,可列舉例如二環戊二烯骨架苯酚酚醛清漆樹脂(GDP系列、群榮化學公司製)、Zilog型苯酚酚醛清漆樹脂(MEH-7800、明和化成公司製)、聯苯基芳烷基型酚醛清漆樹脂(MEH-7851、明和化成公司製)、萘酚芳烷基型硬化劑(SN系列、新日鐵住金公司製)、含有三嗪骨架甲酚酚醛清漆樹脂(LA-3018-50P、DIC公司製) 等。 Among the aforementioned phenol resins, those having a hydroxyl equivalent of 130 g/eq. or more are preferable, and those having a hydroxyl equivalent of 150 g/eq. or more are more preferable. Phenolic resins having a hydroxyl equivalent of 130g/eq. or more include, for example, dicyclopentadiene skeleton phenol novolac resin (GDP series, manufactured by Kunei Chemical Co., Ltd.), Zilog type phenol novolac resin (MEH-7800, Meiwa Chemical Co., Ltd.) Made), biphenyl aralkyl type novolac resin (MEH-7851, made by Meiwa Chemical Co., Ltd.), naphthol aralkyl type hardener (SN series, made by Nippon Steel & Sumikin Co., Ltd.), cresol containing triazine skeleton Novolac resin (LA-3018-50P, manufactured by DIC) Wait.

前述氰酸酯樹脂係一分子中具有2個以上之氰酸酯基(-OCN)的化合物。氰酸酯樹脂可使用以往習知者。氰酸酯樹脂可列舉例如苯酚酚醛清漆型氰酸酯樹脂、烷基苯酚酚醛清漆型氰酸酯樹脂、二環戊二烯型氰酸酯樹脂、雙酚A型氰酸酯樹脂、雙酚F型氰酸酯樹脂、雙酚S型氰酸酯樹脂。又,也可為一部分經三嗪化的預聚物。 The aforementioned cyanate ester resin is a compound having two or more cyanate ester groups (-OCN) in one molecule. As the cyanate ester resin, conventionally known ones can be used. Examples of cyanate ester resins include phenol novolac type cyanate ester resins, alkylphenol novolac type cyanate ester resins, dicyclopentadiene type cyanate ester resins, bisphenol A type cyanate ester resins, and bisphenol F. Type cyanate ester resin, bisphenol S type cyanate ester resin. In addition, it may be a prepolymer partially triazineized.

前述活性酯樹脂係一分子中具有2個以上之活性酯基的樹脂。活性酯樹脂一般可藉由羧氧化合物與羥基化合物之縮合反應而得。其中,作為羥基化合物使用苯酚化合物或萘酚化合物所得之活性酯化合物為佳。苯酚化合物或萘酚化合物,可列舉氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、苯酚、o-甲酚、m-甲酚、p-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三醇、二環戊二烯二酚、苯酚酚醛清漆等。又,活性酯樹脂可為萘二醇烷基/苯甲酸型。 The aforementioned active ester resin is a resin having two or more active ester groups in one molecule. The active ester resin can generally be obtained by the condensation reaction of a carboxyl compound and a hydroxyl compound. Among them, an active ester compound obtained by using a phenol compound or a naphthol compound as the hydroxyl compound is preferred. Phenol compounds or naphthol compounds, including hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, methylated bisphenol F, methylated bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2 ,6-Dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucinol, benzenetriol, dicyclopentadienediol, phenol novolac, etc. In addition, the active ester resin may be a naphthalene glycol alkyl/benzoic acid type.

前述馬來醯亞胺化合物係具有馬來醯亞胺骨架之化合物,可使用以往習知者。馬來醯亞胺化合物較佳為具有2以上之馬來醯亞胺骨架者,更佳為N,N’-1,3-伸苯基二馬來醯亞胺、N,N’-1,4-伸苯基二馬來醯亞胺、N,N’-4,4-二苯基甲烷雙馬來醯亞胺、1,2-雙(馬來醯亞 胺)乙烷、1,6-雙馬來醯亞胺己烷、1,6-雙馬來醯亞胺-(2,2,4-三甲基)己烷、2,2’-雙-[4-(4-馬來醯亞胺苯氧基)苯基]丙烷、3,3’-二甲基-5,5’-二乙基-4,4’-二苯基甲烷雙馬來醯亞胺、4-甲基-1,3-伸苯基雙馬來醯亞胺、雙(3-乙基-5-甲基-4-馬來醯亞胺苯基)甲烷、雙酚A二苯基醚雙馬來醯亞胺、聚苯基甲烷馬來醯亞胺、及此等之寡聚物及具有馬來醯亞胺骨架之二胺縮合物中之至少任一種。 The aforementioned maleimine compound is a compound having a maleimine skeleton, and conventionally known compounds can be used. The maleimide compound is preferably one having a maleimine skeleton of 2 or more, more preferably N,N'-1,3-phenylene dimaleimide, N,N'-1, 4-phenylene dimaleimide, N,N'-4,4-diphenylmethane bismaleimide, 1,2-bis(maleimide) Amine) ethane, 1,6-bismaleimide hexane, 1,6-bismaleimide-(2,2,4-trimethyl)hexane, 2,2'-bis- [4-(4-Maleiminophenoxy)phenyl]propane, 3,3'-dimethyl-5,5'-diethyl-4,4'-diphenylmethane bismaleic Amide, 4-methyl-1,3-phenylene bismaleimide, bis(3-ethyl-5-methyl-4-maleimide phenyl)methane, bisphenol A Diphenyl ether bismaleimide, polyphenylmethane maleimide, and at least any one of these oligomers and diamine condensates having a maleimine skeleton.

前述寡聚物係藉由使上述馬來醯亞胺化合物中之單體的馬來醯亞胺化合物縮合而得的寡聚物。馬來醯亞胺化合物可單獨使用1種或組合2種以上使用。 The aforementioned oligomer is an oligomer obtained by condensing a maleimine compound which is a monomer in the above-mentioned maleimine compound. The maleimide compound can be used individually by 1 type or in combination of 2 or more types.

前述硬化劑係以熱硬化性成分之環氧基等可熱硬化反應的官能基與該官能基反應之硬化劑中之官能基之比率成為硬化劑之官能基/可熱硬化反應的官能基(當量比)=0.2~2的比例調配為佳。藉由將硬化劑之官能基/可熱硬化反應的官能基(當量比)設為上述範圍內,可防止除膠渣(desmear)步驟中之薄膜表面之粗化。更佳為硬化劑之官能基/可熱硬化反應之官能基(當量比)=0.2~1.5,又更佳為硬化劑之官能基/可熱硬化反應之官能基(當量比)=0.3~1.0。 The aforementioned curing agent is the functional group of the curing agent/the functional group capable of heat curing reaction based on the ratio of the functional group that can be heat-cured, such as epoxy group of the thermosetting component, and the functional group in the curing agent that reacts with the functional group ( Equivalent ratio)=0.2~2 is better. By setting the functional group of the hardening agent/the functional group capable of thermal curing reaction (equivalent ratio) within the above range, it is possible to prevent the roughening of the film surface in the desmear step. More preferably, the functional group of the hardener/the functional group capable of thermal hardening reaction (equivalent ratio)=0.2~1.5, and more preferably the functional group of the hardener/the functional group capable of thermal hardening reaction (the equivalent ratio)=0.3~1.0 .

酚樹脂、氰酸酯樹脂、活性酯樹脂、馬來醯亞胺化合物之官能基當量(g/eq.)為200以上時,可使翹曲變小。 When the functional group equivalent (g/eq.) of the phenol resin, cyanate ester resin, active ester resin, and maleimide compound is 200 or more, the warpage can be reduced.

熱硬化性樹脂組成物為了提高所得之硬化被膜之機械強度,可進一步含有熱可塑性樹脂。熱可塑性樹 脂可溶於溶劑者為佳。可溶於溶劑的情形,可提高乾薄膜之柔軟性,抑制龜裂之發生或落粉。熱可塑性樹脂可列舉熱可塑性聚羥基聚醚樹脂或、環氧氯丙烷與各種2官能苯酚化合物之縮合物的苯氧基樹脂或將存在於其骨架之羥基醚部之羥基使用各種酸酐或酸氯化物進行酯化的苯氧基樹脂、聚乙烯醇縮乙醛樹脂、聚醯胺樹脂、聚醯胺醯亞胺樹脂、嵌段共聚物等。熱可塑性樹脂可單獨使用1種或組合2種以上使用。 In order to increase the mechanical strength of the cured film obtained, the thermosetting resin composition may further contain a thermoplastic resin. Thermoplastic Tree The fat is soluble in solvents. When it is soluble in solvents, it can improve the softness of the dry film and inhibit the occurrence of cracks or powder falling. Thermoplastic resins include thermoplastic polyhydroxypolyether resins or phenoxy resins that are condensates of epichlorohydrin and various bifunctional phenol compounds, or use various acid anhydrides or acid chlorides for the hydroxyl groups present in the hydroxy ether portion of the skeleton. Phenoxy resins, polyvinyl acetal resins, polyamide resins, polyimide imine resins, block copolymers, etc. in which the product is esterified. Thermoplastic resin can be used individually by 1 type or in combination of 2 or more types.

熱可塑性樹脂之調配量係以除去溶劑後之樹脂層全量基準,為0.5~20質量%,較佳為0.5~10質量%之比例。熱可塑性樹脂之調配量成為上述範圍外時,變得難以得到均勻的粗化面狀態。 The blending amount of the thermoplastic resin is based on the total amount of the resin layer after the solvent is removed, and is 0.5-20% by mass, preferably 0.5-10% by mass. When the blending amount of the thermoplastic resin is outside the above range, it becomes difficult to obtain a uniform roughened surface state.

此外,熱硬化性樹脂組成物,必要時可含有橡膠狀粒子。這種橡膠狀粒子可列舉聚丁二烯橡膠、聚異丙烯橡膠、胺基甲酸酯改性聚丁二烯橡膠、環氧基改性聚丁二烯橡膠、丙烯腈改性聚丁二烯橡膠、羧基改性聚丁二烯橡膠、以羧基或羥基改性的丙烯腈丁二烯橡膠及彼等之交聯橡膠粒子、殼核型橡膠粒子等,可單獨使用1種或組合2種以上使用。 In addition, the thermosetting resin composition may contain rubber-like particles as necessary. Such rubbery particles can include polybutadiene rubber, polyisopropylene rubber, urethane modified polybutadiene rubber, epoxy modified polybutadiene rubber, and acrylonitrile modified polybutadiene. Rubber, carboxyl modified polybutadiene rubber, carboxyl or hydroxyl modified acrylonitrile butadiene rubber and their cross-linked rubber particles, shell-core rubber particles, etc., can be used alone or in combination of two or more use.

此等之橡膠狀粒子矽為了提高所得之硬化被膜之柔軟性,或提高龜裂耐性,或可藉由氧化劑進行表面粗化處理,提高與銅箔等之密著強度而被添加。 These rubbery particles of silicon can be added in order to improve the flexibility of the cured film obtained, or to improve the crack resistance, or to roughen the surface with an oxidizing agent to improve the adhesion strength with copper foil.

橡膠狀粒子之平均粒徑,較佳為0.005~1μm之範圍,更佳為0.2~1μm之範圍。本發明中之橡膠狀粒子 之平均粒徑,可藉由雷射繞射式粒徑分布測量裝置而求得。例如藉由超音波等將橡膠狀粒子均勻分散於適當的有機溶劑中,使用日機裝公司製Nanotrac wave,以質量基準製作橡膠狀粒子之粒度分布,可將其中值粒徑(median diameter)作為平均粒徑進行測量。 The average particle diameter of the rubber-like particles is preferably in the range of 0.005 to 1 μm, more preferably in the range of 0.2 to 1 μm. Rubber-like particles in the present invention The average particle size can be obtained by a laser diffraction particle size distribution measuring device. For example, the rubber-like particles are uniformly dispersed in a suitable organic solvent by ultrasonic waves, and the Nanotrac wave manufactured by Nikkiso Co., Ltd. is used to produce the particle size distribution of the rubber-like particles on a mass basis. The median diameter can be used as The average particle size is measured.

橡膠狀粒子之調配量係以除去溶劑後之樹脂層全量基準,較佳為0.5~10質量%,更佳為1~5質量%。0.5質量%以上的情形,可得到龜裂耐性。可提高與導體圖型等之密著強度。10質量%以下的情形,熱膨脹係數(CTE)降低,玻璃轉移溫度(Tg)上昇,提高硬化特性。 The compounding amount of the rubber-like particles is based on the total amount of the resin layer after the solvent is removed, and is preferably 0.5-10% by mass, more preferably 1-5% by mass. In the case of 0.5% by mass or more, crack resistance can be obtained. It can improve the adhesion strength with conductor pattern etc. In the case of 10% by mass or less, the coefficient of thermal expansion (CTE) decreases, the glass transition temperature (Tg) increases, and the hardening characteristics are improved.

本發明之乾薄膜之樹脂層可含有硬化促進劑。硬化促進劑係促進熱硬化反應者,為了進一步提高密著性、耐藥品性、耐熱性等之特性而使用。這種硬化促進劑之具體例,可列舉咪唑及其衍生物;乙醯基胍胺、苯胍胺等之胍胺類;二胺基二苯基甲烷、m-苯二胺、m-二甲苯二胺、二胺基二苯基碸、雙氰胺、脲、脲衍生物、三聚氰胺、多元醯肼等之聚胺類;此等之有機酸鹽及/或環氧加成物;三氟化硼之胺錯合物;乙基二胺基-S-三嗪、2,4-二胺基-S-三嗪、2,4-二胺基-6-二甲苯基-S-三嗪等之三嗪衍生物類;三甲基胺、三乙醇胺、N,N-二甲基辛基胺、N-苄基二甲基胺、吡啶、N-甲基嗎啉、六(N-甲基)三聚氰胺、2,4,6-參(二甲基胺基酚)、四甲基胍、m-胺基酚等之胺類;聚乙烯基酚、聚乙烯基酚溴化物、苯酚酚醛清 漆、烷基苯酚酚醛清漆等之多酚類;三丁基膦、三苯基膦、參-2-氰基乙基膦等之有機膦類;三-n-丁基(2,5-二羥基苯基)鏻溴化物、十六烷基三丁基鏻氯化物等之鏻鹽類;苄基三甲基銨氯化物、苯基三丁基銨氯化物等之四級銨鹽類;前述多元酸酐;二苯基錪四氟硼酸鹽、三苯基鋶六氟銻酸鹽、2,4,6-三苯基噻喃鎓(Thiopyrylium)六氟磷酸酯等之光陽離子聚合觸媒;苯乙烯-馬來酸酐樹脂;苯基異氰酸酯與二甲基胺之等莫耳反應物或甲伸苯基二異氰酸酯、異佛爾酮二異氰酸酯等之有機聚異氰酸酯與二甲基胺之等莫耳反應物、金屬觸媒等之以往習知之硬化促進劑。硬化促進劑之中,可得到BHAST耐性的點,較佳為鏻鹽類。 The resin layer of the dry film of the present invention may contain a hardening accelerator. The hardening accelerator is one that promotes the thermal hardening reaction and is used to further improve the characteristics of adhesion, chemical resistance, and heat resistance. Specific examples of such hardening accelerators include imidazole and its derivatives; guanamines such as acetoguanamine and benzoguanamine; diaminodiphenylmethane, m-phenylenediamine, and m-xylene Polyamines such as diamine, diaminodiphenyl sulfide, dicyandiamide, urea, urea derivatives, melamine, polyhydrazine, etc.; these organic acid salts and/or epoxy adducts; trifluoride Amine complexes of boron; ethyldiamino-S-triazine, 2,4-diamino-S-triazine, 2,4-diamino-6-xylyl-S-triazine, etc. Triazine derivatives; trimethylamine, triethanolamine, N,N-dimethyloctylamine, N-benzyldimethylamine, pyridine, N-methylmorpholine, hexa(N-methyl) ) Melamine, 2,4,6-ginseng (dimethylaminophenol), tetramethylguanidine, m-aminophenol and other amines; polyvinylphenol, polyvinylphenol bromide, phenol novolac Polyphenols such as paint, alkylphenol novolac; organic phosphines such as tributylphosphine, triphenylphosphine, ginseng-2-cyanoethylphosphine; tri-n-butyl(2,5-di Phosphonium salts such as hydroxyphenyl)phosphonium bromide and cetyltributylphosphonium chloride; quaternary ammonium salts such as benzyltrimethylammonium chloride and phenyltributylammonium chloride; the aforementioned Polybasic acid anhydride; photocationic polymerization catalysts such as diphenyliodonium tetrafluoroborate, triphenylsulfonium hexafluoroantimonate, 2,4,6-triphenylthiopyrylium (Thiopyrylium) hexafluorophosphate, etc.; benzene Ethylene-maleic anhydride resin; molar reaction of phenyl isocyanate and dimethylamine or organic polyisocyanate of phenyl tolylene diisocyanate, isophorone diisocyanate and dimethylamine Hardening accelerators known in the past as materials, metal catalysts, etc. Among the hardening accelerators, the point at which BHAST resistance can be obtained, and phosphonium salts are preferred.

硬化促進劑可1種單獨使用或混合2種以上使用。硬化促進劑之使用不是必須,但是特別是欲促進硬化的情形時,相對於熱硬化性成分100質量份,較佳為可在0.01~5質量份之範圍使用。金屬觸媒的情形,相對於熱硬化性成分100質量份,以金屬換算較佳為10~550ppm,更佳為25~200ppm。 A hardening accelerator can be used individually by 1 type or in mixture of 2 or more types. The use of a hardening accelerator is not essential, but particularly when it is desired to accelerate hardening, it is preferably used in the range of 0.01 to 5 parts by mass relative to 100 parts by mass of the thermosetting component. In the case of a metal catalyst, it is preferably 10 to 550 ppm in terms of metal, and more preferably 25 to 200 ppm based on 100 parts by mass of the thermosetting component.

熱硬化性樹脂組成物,必要時可使用酞菁.藍、酞菁.綠、碘.綠、雙偶氮黃、結晶紫、氧化鈦、碳黑、萘黑等之以往習知之著色劑、石綿(asbestos)、Orben、膨潤土(Bentonite)、微粉二氧化矽等之以往習知之增黏劑、聚矽氧系、氟系、高分子系等之消泡劑及/或平坦劑、噻唑系、三唑系、矽烷偶合劑等之密著性賦予 劑、難燃劑、鈦酸酯系、鋁系之以往習知之添加劑類。 Thermosetting resin composition, phthalocyanine can be used if necessary. Blue, phthalocyanine. Green, iodine. Green, bis-azo yellow, crystal violet, titanium oxide, carbon black, naphthalene black and other known coloring agents, asbestos, Orben, Bentonite, micronized silica and other conventionally known tackifiers , Polysiloxane, fluorine, polymer, etc. defoaming agent and/or leveling agent, thiazole, triazole, silane coupling agent, etc. Conventional additives such as additives, flame retardants, titanate series, and aluminum series.

使用具有由熱硬化性樹脂組成物所成之樹脂層之乾薄膜的印刷配線板之製造方法,使用以往習知方法即可。例如,如圖2所示在第一薄膜與第二薄膜之間挾有樹脂層之乾薄膜的情形,可以如下述的方法製造印刷配線板。由乾薄膜剝離第二薄膜,加熱層合於形成有電路圖型的電路基板後,使熱硬化。熱硬化可在烤箱中使硬化或以熱板壓製使硬化。將形成有電路之基材與本發明之乾薄膜進行層合或熱板壓製時,可同時層合銅箔或形成電路的基材。形成有電路圖型之基板上之特定位置所對應的位置上,以雷射照射或鑽孔機形成圖型或導通孔(via hole),藉由使電路配線露出,可製造印刷配線板。此時,圖型或導通孔內之電路配線上,存在無法完全除去而殘留的成分(殘渣)的情形時,進行去膠渣處理。第一薄膜係在層合後,熱硬化後,在雷射加工後或去膠渣處理後,剝離即可。 The method of manufacturing a printed wiring board using a dry film having a resin layer made of a thermosetting resin composition may use a conventionally known method. For example, in the case of a dry film in which a resin layer is interposed between the first film and the second film as shown in FIG. 2, a printed wiring board can be manufactured as follows. The second film is peeled off from the dry film, and laminated on the circuit board on which the circuit pattern is formed by heating, and then thermally cured. Thermal hardening can be hardened in an oven or hardened by pressing with a hot plate. When laminating the circuit-formed substrate and the dry film of the present invention or hot plate pressing, the copper foil or the circuit-forming substrate can be laminated at the same time. At the position corresponding to the specific position on the substrate with the circuit pattern formed, a pattern or via hole is formed by laser irradiation or a drilling machine, and a printed wiring board can be manufactured by exposing the circuit wiring. At this time, if there are components (residues) that cannot be completely removed on the circuit wiring in the via hole, the desmear treatment is performed. The first film can be peeled off after being laminated, thermally hardened, and after laser processing or slag removal.

(含有光鹼發生劑之光硬化性熱硬化性樹脂組成物) (Photocurable thermosetting resin composition containing photoalkali generator)

針對作為含有光鹼發生劑之光硬化性熱硬化性樹脂組成物(以下也稱為含有光鹼發生劑之組成物)之一例,除了環氧樹脂外,也包含鹼顯影性樹脂、光鹼發生劑的組成物,如下述說明。 Regarding an example of a photocurable thermosetting resin composition containing a photobase generator (hereinafter also referred to as a composition containing a photobase generator), in addition to epoxy resins, it also includes alkali developable resins and photobase generators. The composition of the agent is as follows.

鹼顯影性樹脂係含有酚性羥基、巰基及羧基之中1種以上的官能基,可以鹼溶液顯影的樹脂,較佳為 具有2個以上之酚性羥基的化合物、含羧基樹脂、具有酚性羥基及羧基之化合物、具有2個以上之巰基的化合物。 Alkali developable resin contains at least one functional group among phenolic hydroxyl group, mercapto group and carboxyl group, and can be developed by alkaline solution, preferably A compound having two or more phenolic hydroxyl groups, a carboxyl group-containing resin, a compound having a phenolic hydroxyl group and a carboxyl group, and a compound having two or more mercapto groups.

含羧基樹脂可使用習知含有羧基的樹脂。因羧基之存在,可使樹脂組成物形成鹼顯影性。又,除羧基外,也可使用分子內具有乙烯性不飽和鍵的化合物,但是本發明中,含羧基樹脂僅使用不具有乙烯性不飽和鍵之含羧基樹脂為佳。 As the carboxyl group-containing resin, conventional resins containing carboxyl group can be used. Due to the presence of carboxyl groups, the resin composition can be made alkali developable. In addition to the carboxyl group, a compound having an ethylenically unsaturated bond in the molecule can also be used. However, in the present invention, it is preferable to use only a carboxyl group-containing resin that does not have an ethylenically unsaturated bond in the carboxyl group-containing resin.

本發明可使用之含羧基樹脂之具體例,除前述光硬化性熱硬化性樹脂組成物中所含之含羧基樹脂所列舉之(1)~(11)外,可列舉如以下所列舉的化合物(可為寡聚物及聚合物之任一)。 Specific examples of the carboxyl group-containing resin that can be used in the present invention include the compounds listed below in addition to the carboxyl group-containing resins contained in the photocurable thermosetting resin composition (1) to (11) (It can be either oligomer or polymer).

(12)藉由脂肪族二異氰酸酯、分枝脂肪族二異氰酸酯、脂環式二異氰酸酯、芳香族二異氰酸酯等之二異氰酸酯與、二羥甲基丙酸、二羥甲基丁酸等之含羧基之二醇化合物及聚碳酸酯系多元醇、聚醚系多元醇、聚酯系多元醇、聚烯烴系多元醇、丙烯酸系多元醇、雙酚A系環氧烷加成物二醇、具有酚性羥基及醇性羥基之化合物等之二醇化合物之聚加成反應而得之含羧基之胺基甲酸酯樹脂。 (12) Diisocyanates such as aliphatic diisocyanates, branched aliphatic diisocyanates, alicyclic diisocyanates, aromatic diisocyanates, etc. and carboxyl-containing groups such as dimethylol propionic acid and dimethylol butyric acid Diol compounds and polycarbonate polyols, polyether polyols, polyester polyols, polyolefin polyols, acrylic polyols, bisphenol A-based alkylene oxide adduct diols, phenols Carboxyl group-containing urethane resin obtained by polyaddition reaction of diol compounds such as hydroxy and alcoholic hydroxy compounds.

(13)藉由二異氰酸酯與雙酚A型環氧樹脂、氫化雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙二甲苯酚型環氧樹脂、聯苯二酚型環氧樹脂等之2官能環氧樹脂之(甲基)丙烯酸酯或其部分酸酐改性物、含羧基之二醇化合物及二醇化合物之聚加成反應 而得之含羧基之胺基甲酸酯樹脂。 (13) Diisocyanate and bisphenol A type epoxy resin, hydrogenated bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisxylenol type epoxy resin, The polyaddition reaction of (meth)acrylates of bifunctional epoxy resins, such as bifunctional epoxy resins, or partial acid anhydride modified products, carboxyl-containing diol compounds and diol compounds The resulting urethane resin containing carboxyl groups.

(14)上述(12)或(13)之樹脂之合成中,添加羥基烷基(甲基)丙烯酸酯等之分子中具有1個羥基與1個以上之(甲基)丙烯醯基之化合物,進行末端(甲基)丙烯酸化而成之含羧基之胺基甲酸酯樹脂。 (14) In the synthesis of the resin of (12) or (13) above, a compound having one hydroxyl group and one or more (meth)acryloyl groups in the molecule such as hydroxyalkyl (meth)acrylate is added, Carboxyl-containing urethane resin formed by terminal (meth)acrylation.

(15)上述(12)或(13)之樹脂之合成中,添加異佛爾酮二異氰酸酯與季戊四醇三丙烯酸酯之等莫耳反應物等,分子中具有1個異氰酸酯基與1個以上之(甲基)丙烯醯基的化合物,進行末端(甲基)丙烯酸化而成之含羧基之胺基甲酸酯樹脂。 (15) In the synthesis of the resin of (12) or (13) above, a molar reactant such as isophorone diisocyanate and pentaerythritol triacrylate is added, and the molecule has one isocyanate group and one or more ( A meth)acrylic compound is a carboxyl-containing urethane resin formed by terminal (meth)acrylation.

(16)使如前述之多官能環氧樹脂與飽和單羧酸反應,存在於側鏈之羥基上加成有苯二甲酸酐、四氫苯二甲酸酐、六氫苯二甲酸酐等之二元酸酐的含羧基樹脂。在此,多官能環氧樹脂係固形為佳。 (16) Make the aforementioned multifunctional epoxy resin react with saturated monocarboxylic acid, and add phthalic anhydride, tetrahydrophthalic anhydride, hexahydrophthalic anhydride, etc. to the hydroxyl group present in the side chain A carboxyl group-containing resin of anhydride. Here, the solid form of the multifunctional epoxy resin is preferable.

(17)使如後述之多官能氧雜環丁烷樹脂與二羧酸反應,所產生之一級羥基上,加成有二元酸酐之含羧基之聚酯樹脂。 (17) The polyfunctional oxetane resin described later is reacted with a dicarboxylic acid to produce a carboxyl group-containing polyester resin with a dibasic acid anhydride added to the primary hydroxyl group.

(18)使1分子中具有複數之酚性羥基之化合物與環氧乙烷、環氧丙烷等之環氧烷(alkylene oxide)反應所得之反應生成物,與多元酸酐反應所得之含羧基樹脂。 (18) A carboxyl group-containing resin obtained by reacting a compound having a plurality of phenolic hydroxyl groups in one molecule with an alkylene oxide such as ethylene oxide and propylene oxide, and a polybasic acid anhydride.

(19)使1分子中具有複數之酚性羥基之化合物與環氧乙烷、環氧丙烷等之環氧烷反應所得之反應生成物,與飽和單羧酸反應所得之反應生成物,再與多元酸 酐反應所得之含羧基樹脂。 (19) The reaction product obtained by reacting a compound having plural phenolic hydroxyl groups in one molecule with alkylene oxide such as ethylene oxide and propylene oxide, and the reaction product obtained by reacting with saturated monocarboxylic acid, and then with Polyacid Carboxyl group-containing resin obtained by anhydride reaction.

(20)使1分子中具有複數之酚性羥基之化合物與碳酸乙烯酯、碳酸丙烯酯等之環狀碳酸酯化合物反應所得之反應生成物,與飽和單羧酸反應所得之反應生成物,再與多元酸酐反應所得之含羧基樹脂。 (20) The reaction product obtained by reacting a compound having plural phenolic hydroxyl groups in one molecule with a cyclic carbonate compound such as ethylene carbonate and propylene carbonate, and the reaction product obtained by reacting with saturated monocarboxylic acid, and then Carboxyl group-containing resin obtained by reacting with polybasic acid anhydride.

(21)使1分子中具有複數之酚性羥基之化合物與碳酸乙烯酯、碳酸丙烯酯等之環狀碳酸酯化合物反應所得之反應生成物,再與多元酸酐反應所得之含羧基樹脂。 (21) A carboxyl group-containing resin obtained by reacting a compound having plural phenolic hydroxyl groups in one molecule with a cyclic carbonate compound such as ethylene carbonate and propylene carbonate, and then reacting with a polybasic acid anhydride.

(22)使1分子中具有複數之環氧基的環氧化合物與p-羥基苯乙醇等之1分子中具有至少1個醇性羥基與1個酚性羥基的化合物與飽和單羧酸反應所得之反應生成物之醇性羥基,與馬來酸酐、四氫苯二甲酸酐、偏苯三甲酸酐、均苯四甲酸酐、己二酸等之多元酸酐反應所得之含羧基樹脂。 (22) An epoxy compound having plural epoxy groups in one molecule and a compound having at least one alcoholic hydroxyl group and one phenolic hydroxyl group in one molecule such as p-hydroxyphenethyl alcohol are reacted with saturated monocarboxylic acid The alcoholic hydroxyl group of the reaction product is a carboxyl-containing resin obtained by reacting with maleic anhydride, tetrahydrophthalic anhydride, trimellitic anhydride, pyromellitic anhydride, adipic acid and other polybasic acid anhydrides.

(23)使1分子中具有複數之環氧基的環氧化合物與p-羥基苯乙醇等之1分子中具有至少1個醇性羥基與1個酚性羥基的化合物反應所得之反應生成物之醇性羥基,與馬來酸酐、四氫苯二甲酸酐、偏苯三甲酸酐、均苯四甲酸酐、己二酸等之多元酸酐反應所得之含羧基樹脂。 (23) One of the reaction products obtained by reacting an epoxy compound having plural epoxy groups in one molecule with a compound having at least one alcoholic hydroxyl group and one phenolic hydroxyl group in one molecule such as p-hydroxyphenethyl alcohol Alcoholic hydroxyl group is a carboxyl-containing resin obtained by reacting with maleic anhydride, tetrahydrophthalic anhydride, trimellitic anhydride, pyromellitic anhydride, adipic acid and other polybasic acid anhydrides.

(24)對於上述(12)~(23)之任一樹脂,進一步加成環氧丙基(甲基)丙烯酸酯、α-甲基環氧丙基(甲基)丙烯酸酯等之分子中具有1個環氧基與1個以上 之(甲基)丙烯醯基的化合物所成的含羧基樹脂。 (24) For any of the resins (12) to (23) above, further addition of glycidyl (meth)acrylate, α-methylglycidyl (meth)acrylate, etc., has 1 epoxy group and more than 1 The (meth)acrylic acid compound is a carboxyl-containing resin.

如上述之鹼顯影性樹脂係在主鏈.聚合物之側鏈具有多數羧基或羥基等,故可藉由鹼水溶液顯影。 The alkali-developable resin mentioned above is in the main chain. The side chain of the polymer has many carboxyl groups or hydroxyl groups, etc., so it can be developed by an aqueous alkali solution.

又,上述鹼顯影性樹脂之羥基當量或羧基當量,較佳為80~900g/eq.,又更佳為100~700g/eq.。羥基當量或羧基當量為900g/eq.以下的情形,可得到圖型層之密著性,鹼顯影變得容易。又,羥基當量或羧基當量為80g/eq.以上的情形時,藉由顯影液之光照射部之溶解被抑制,線不會過度變瘦,正常之阻劑圖型之描繪變得容易,故較佳。又,羧基當量或酚基當量較大的情形,即使鹼顯影性樹脂之含量較少的情形,也可顯影,故較佳。 In addition, the hydroxyl equivalent or carboxyl equivalent of the alkali developable resin is preferably 80 to 900 g/eq., and more preferably 100 to 700 g/eq. When the hydroxyl equivalent or carboxyl equivalent is 900 g/eq. or less, the adhesion of the pattern layer can be obtained, and alkali development becomes easy. In addition, when the hydroxyl equivalent or carboxyl equivalent is 80 g/eq. or more, the dissolution of the light-irradiated part by the developer is suppressed, the line does not become excessively thin, and the normal resist pattern drawing becomes easy, so Better. In addition, when the carboxyl group equivalent or the phenol group equivalent is large, even if the content of the alkali developable resin is small, the image can be developed, which is preferable.

鹼顯影性樹脂之酸價,較佳為40~150mgKOH/g。鹼顯影性樹脂之酸價藉由設為40mgKOH/g以上,鹼顯影變得良好。又,藉由將酸價設為150mgKOH/g以下,正常之阻劑圖型可容易描繪。更佳為50~130mgKOH/g。 The acid value of the alkali developable resin is preferably 40 to 150 mgKOH/g. By setting the acid value of the alkali-developable resin to 40 mgKOH/g or more, alkali development becomes good. In addition, by setting the acid value to 150 mgKOH/g or less, a normal resist pattern can be easily drawn. More preferably, it is 50~130mgKOH/g.

鹼顯影性樹脂之調配量係以除去溶劑之乾薄膜之樹脂層全量基準,較佳為20~60質量%。藉由設為20質量%以上,可提高塗膜強度。又,藉由設為60質量%以下,成為適當的黏性,提高塗佈性。更佳為30~50質量%。 The blending amount of the alkali-developable resin is based on the total amount of the resin layer of the dry film from which the solvent has been removed, and is preferably 20-60% by mass. By setting it as 20% by mass or more, the strength of the coating film can be improved. In addition, by setting it to 60% by mass or less, the viscosity becomes appropriate and the coatability is improved. More preferably, it is 30-50% by mass.

光鹼發生劑係藉由紫外線或可見光等之光照射,分子結構產生變化,或因分子開裂,生成可作為上述熱反應性化合物之加成反應之觸媒功能之1種以上之鹼性 物質的化合物。鹼性物質可列舉例如二級胺、三級胺。 The photobase generator is irradiated with light such as ultraviolet light or visible light, and the molecular structure changes, or the molecule cracks, to produce more than one kind of alkali that can act as a catalyst for the addition reaction of the above-mentioned thermally reactive compound. The compound of the substance. Examples of basic substances include secondary amines and tertiary amines.

光鹼發生劑可列舉例如α-胺基苯乙酮化合物、肟酯化合物或具有醯基羥亞胺基,N-甲醯基化芳香族胺基、N-醯化芳香族胺基、硝基苄基胺基甲酸酯基、烷氧基苄基胺基甲酸酯基等之取代基的化合物等。 The photobase generator includes, for example, α-aminoacetophenone compounds, oxime ester compounds, or hydroxylimino groups having acyl groups, N-formylated aromatic amine groups, N-acylated aromatic amine groups, and nitro groups. Compounds with substituents such as benzyl carbamate groups and alkoxy benzyl carbamate groups.

前述光鹼發生劑可單獨使用1種或組合2種以上使用。含有光鹼發生劑之組成物中之光鹼發生劑的調配量,相對於熱反應性化合物100質量份,較佳為1~50質量份,又更佳為1~40質量份。1質量份以上的情形,顯影變得容易,故較佳。 The aforementioned photobase generators can be used singly or in combination of two or more kinds. The compounding amount of the photobase generator in the composition containing the photobase generator is preferably 1-50 parts by mass, and more preferably 1-40 parts by mass relative to 100 parts by mass of the thermally reactive compound. If it is 1 part by mass or more, development becomes easy, so it is preferable.

含有光鹼發生劑之組成物中,調配填料為佳,可提高所得之硬化物之物理強度等。填料無特別限制,可列舉例如前述樹脂層所含有之填料所例示者。填料可單獨使用1種或作為2種以上之混合物使用。 In the composition containing the photobase generator, it is better to mix fillers, which can improve the physical strength of the resulting hardened product. The filler is not particularly limited, and examples thereof include those exemplified for the filler contained in the aforementioned resin layer. The filler can be used singly or as a mixture of two or more.

可使用的有機溶劑,無特別限制,可列舉例如前述光硬化性熱硬化性樹脂組成物所例示之有機溶劑。有機溶劑可單獨使用1種或作為2種以上之混合物使用。 The organic solvent that can be used is not particularly limited, and examples thereof include organic solvents exemplified for the aforementioned photocurable thermosetting resin composition. The organic solvent can be used singly or as a mixture of two or more.

含有光鹼發生劑之組成物中,必要時可調配巰基化合物、密著促進劑、抗氧化劑、紫外線吸收劑等之成分。此等可使用在電子材料領域之習知物。 In the composition containing the photobase generator, components such as sulfhydryl compounds, adhesion promoters, antioxidants, ultraviolet absorbers, etc. can be adjusted when necessary. These can be used conventionally in the field of electronic materials.

又,上述含有光鹼發生劑之組成物中,可調配微粉二氧化矽、水滑石、有機膨潤土、微晶高嶺石等之習知慣用之增黏劑、聚矽氧系、氟系、高分子系等之消泡劑及/或平坦劑、矽烷偶合劑、防銹劑等之習知慣用的添加劑類。 In addition, in the above-mentioned composition containing photoalkali generators, conventionally used tackifiers such as micropowdered silica, hydrotalcite, organic bentonite, microcrystalline kaolinite, silicone, fluorine, and polymer can be blended. It is the conventionally used additives such as defoamer and/or leveling agent, silane coupling agent, rust inhibitor, etc.

使用具有由含有光鹼發生劑之組成物所成之樹脂層之乾薄膜的印刷配線板之製造方法,使用以往習知方法即可。例如,如圖2所示在第一薄膜與第二薄膜之間挾有樹脂層之乾薄膜的情形,可以如下述的方法製造印刷配線板。由乾薄膜剝離第二薄膜,使樹脂層露出,在形成有電路圖型的基板上,使用真空層合機等,層合乾薄膜。然後,以負型之圖型狀之光照射,使含有光鹼發生劑之樹脂組成物所含有之光鹼發生劑進行活性化,使光照射部硬化,藉由鹼顯影除去未照射部,可形成負型之圖型層。第一薄膜可在層合後或曝光後之任一,剝離即可。又,在光照射後且顯影前,將樹脂層加熱為佳。藉此,使樹脂層充分地硬化,進一步可得到硬化特性優異之圖型層。另外,光照射後且顯影前之加熱係未照射部未熱硬化的溫度為佳。又,顯影後,進行熱硬化(後硬化:post curing)為佳。顯影後,也可藉由進行紫外線照射,使光照射時未活性化而殘留之光鹼發生劑活性化後,進行熱硬化(後硬化)。 The method of manufacturing a printed wiring board having a dry film of a resin layer formed of a composition containing a photobase generator may be a conventionally known method. For example, in the case of a dry film in which a resin layer is interposed between the first film and the second film as shown in FIG. 2, a printed wiring board can be manufactured as follows. The second film is peeled from the dry film to expose the resin layer, and the dry film is laminated on the substrate on which the circuit pattern is formed, using a vacuum laminator or the like. Then, it is irradiated with light in a negative pattern to activate the photobase generator contained in the resin composition containing the photobase generator to harden the light-irradiated part, and remove the unirradiated part by alkali development. Form a negative pattern layer. The first film can be peeled off either after laminating or after exposure. Furthermore, it is preferable to heat the resin layer after light irradiation and before development. Thereby, the resin layer is fully cured, and a patterned layer with excellent curing characteristics can be obtained. In addition, the temperature at which the non-irradiated part is not thermally cured after the light irradiation and before the image development is preferable. Furthermore, it is preferable to perform thermal curing (post curing) after development. After the image development, by irradiating with ultraviolet rays, the photobase generator that is not activated during the light irradiation and the remaining photobase generator may be activated, and then thermal curing (post-curing) may be performed.

(正型感光性熱硬化性樹脂組成物) (Positive photosensitive thermosetting resin composition)

針對正型感光性熱硬化性樹脂組成物之一例為除了環氧樹脂外,含有藉由光照射產生羧基之化合物的樹脂組成物,如下述說明。 An example of a positive photosensitive thermosetting resin composition is a resin composition containing a compound that generates a carboxyl group by light irradiation in addition to an epoxy resin, as described below.

藉由光照射產生羧基之化合物之中,使用萘醌二疊氮化合物為佳。萘醌二疊氮化合物,以往被用於藉 由與羧基或酚性羥基形成錯合物,抑制羧基等之鹼可溶性,藉由其後之光照射,錯合物產生解離,使展現鹼可溶性之體系。此時,膜中殘存萘醌二疊氮化合物時,因光照射,錯合物產生解離而有展現可溶性的疑慮,故在半導體領域等,殘存之萘醌二疊氮化合物,最終以高溫飛散被除去。但是在印刷配線板領域,無法施加這種高溫,從安定性的觀點,無法作為永久塗膜使用,故萘醌二疊氮化合物,實際上未被使用。本發明中,藉由光照射產生羧基之化合物使用萘醌二疊氮化合物的情形時,殘存於未曝光部之萘醌二疊氮化合物,在熱硬化反應時,被併入於交聯結構中而安定化,故不會產生如以往除去的問題,可提高膜強韌性,亦即,耐彎曲性或電特性。特別是藉由作為以光照射產生羧基之化合物之萘醌二疊氮化合物與聚醯胺醯亞胺樹脂與熱硬化成分併用,可良好確保顯影性或解析性,有效地提高彎曲性者,故較佳。 Among the compounds that generate a carboxyl group by light irradiation, a naphthoquinonediazide compound is preferably used. Naphthoquinone diazide compounds, used in the past to borrow By forming a complex with a carboxyl group or a phenolic hydroxyl group, the alkali solubility of the carboxyl group is inhibited, and by subsequent light irradiation, the complex is dissociated, and the system exhibits alkali solubility. At this time, when the naphthoquinone diazide compound remains in the film, the complex compound is dissociated due to light irradiation, and there is a concern that it will exhibit solubility. Therefore, in the semiconductor field, the remaining naphthoquinone diazide compound is finally scattered at high temperature. Remove. However, in the field of printed wiring boards, such high temperatures cannot be applied, and from the standpoint of stability, it cannot be used as a permanent coating film. Therefore, naphthoquinonediazide compounds are not actually used. In the present invention, when a naphthoquinone diazide compound is used as a compound that generates a carboxyl group by light irradiation, the naphthoquinone diazide compound remaining in the unexposed part is incorporated into the cross-linked structure during the thermosetting reaction In addition, it is stabilized, so it does not cause the problems that have been removed as in the past, and the film strength and toughness, that is, the bending resistance or electrical properties can be improved. In particular, the use of a naphthoquinonediazide compound, which is a compound that generates a carboxyl group by light irradiation, together with a polyamide imide resin and a thermosetting component can ensure good developability or resolution, and effectively improve flexibility, so Better.

萘醌二疊氮化合物,具體而言,可使用例如參(4-羥基苯基)-1-乙基-4-異丙基苯之萘醌二疊氮加成物(例如,三寶化學研究所公司製之TS533,TS567,TS583,TS593)或四羥基二苯甲酮之萘醌二疊氮加成物(例如,三寶化學研究所公司製之BS550,BS570,BS599)等。 The naphthoquinone diazide compound, specifically, the naphthoquinone diazide adduct of (4-hydroxyphenyl)-1-ethyl-4-isopropylbenzene (for example, Sambo Chemical Research Institute TS533, TS567, TS583, TS593 manufactured by the company) or naphthoquinone diazide adduct of tetrahydroxybenzophenone (for example, BS550, BS570, BS599 manufactured by Sanbao Chemical Research Institute) and the like.

正型感光性熱硬化性樹脂組成物中,調配填料為佳,可提高所得之硬化物之物理強度等。填料無特別限限制,可列舉例如前述樹脂層所含有填料所例示者。填 料可單獨使用1種或作為2種以上之混合物使用。 In the positive photosensitive thermosetting resin composition, it is better to mix fillers, which can improve the physical strength of the cured product obtained. The filler is not particularly limited, and examples thereof include those exemplified for the filler contained in the aforementioned resin layer. fill The materials can be used alone or as a mixture of two or more.

正型感光性熱硬化性樹脂組成物所含有鹼顯影性樹脂之具體例,可列舉前述光硬化性熱硬化性樹脂組成物所例示之含羧基樹脂、及前述含有光鹼發生劑之組成物所例示的鹼顯影性樹脂等。 Specific examples of the alkali developable resin contained in the positive photosensitive thermosetting resin composition include the carboxyl group-containing resin exemplified in the aforementioned photocurable thermosetting resin composition and the aforementioned composition containing the photobase generator. Illustrative alkali developable resin and the like.

正型感光性熱硬化性樹脂組成物中,為了提高耐熱性、絕緣信賴性等之特性之目的,也可含有環氧樹脂以外之熱硬化性成分。熱硬化性成分可使用異氰酸酯化合物、嵌段異氰酸酯化合物、胺基樹脂、馬來醯亞胺化合物、苯並噁嗪樹脂、碳二亞胺樹脂、環碳酸酯化合物、多官能氧雜環丁烷化合物、環硫化物樹脂等之習知慣用的熱硬化性樹脂。 The positive photosensitive thermosetting resin composition may contain thermosetting components other than epoxy resin for the purpose of improving characteristics such as heat resistance and insulation reliability. Thermosetting components can use isocyanate compounds, blocked isocyanate compounds, amino resins, maleimide compounds, benzoxazine resins, carbodiimide resins, cyclic carbonate compounds, and polyfunctional oxetane compounds. , Episulfide resin and other conventionally used thermosetting resins.

可使用之有機溶劑無特別限限制,可列舉例如前述光硬化性熱硬化性樹脂組成物所例示之有機溶劑。有機溶劑可使用單獨1種或作為2種以上之混合物使用。 The organic solvent that can be used is not particularly limited, and examples thereof include the organic solvents exemplified in the aforementioned photocurable thermosetting resin composition. The organic solvent can be used singly or as a mixture of two or more.

正型感光性熱硬化性樹脂組成物含有填料為佳。填料無特別限限制,可列舉例如前述樹脂層所含有填料所例示者。填料可使用單獨1種或作為2種以上之混合物使用。 The positive photosensitive thermosetting resin composition preferably contains a filler. The filler is not particularly limited, and examples thereof include those exemplified for the filler contained in the aforementioned resin layer. The filler can be used alone or as a mixture of two or more types.

正型感光性熱硬化性樹脂組成物,除上述成分以外,也可含有嵌段共聚物、著色劑、彈性體、熱可塑性樹脂等之其他的成分。又,正型感光性熱硬化性樹脂組成物中,必要時可調配密著促進劑、抗氧化劑、紫外線吸收劑等之成分。此等可使用在電子材料領域中之習知物。 又,也可調配如微粉二氧化矽、水滑石、有機膨潤土、微晶高嶺石等之習知慣用之增黏劑、聚矽氧系、氟系、高分子系等之消泡劑及平坦劑之至少任一種、咪唑系、噻唑系、三唑系等之矽烷偶合劑、防銹劑、螢光增白劑等之習知慣用之添加劑類之至少任一種。 In addition to the above-mentioned components, the positive photosensitive thermosetting resin composition may also contain other components such as block copolymers, colorants, elastomers, and thermoplastic resins. In addition, in the positive photosensitive thermosetting resin composition, components such as adhesion promoters, antioxidants, and ultraviolet absorbers may be blended as necessary. These can be used conventionally in the field of electronic materials. In addition, it can also be formulated with conventionally used tackifiers such as micronized silica, hydrotalcite, organic bentonite, and microcrystalline kaolin, as well as defoamers and flattening agents such as silicone, fluorine, and polymer. At least any one of the conventionally used additives such as imidazole-based, thiazole-based, triazole-based silane coupling agents, rust inhibitors, fluorescent whitening agents, etc.

使用具有由正型感光性熱硬化性樹脂組成物所成之樹脂層之乾薄膜的印刷配線板之製造方法,使用以往習知方法即可。例如,如圖2所示在第一薄膜與第二薄膜之間挾有樹脂層之乾薄膜的情形,可以如下述的方法製造印刷配線板。由乾薄膜剝離第二薄膜,使樹脂層露出,在形成有電路圖型的基板上,使用真空層合機等,層合乾薄膜。然後,以正型之圖型狀之光照射樹脂層,將樹脂層進行鹼顯影,藉由除去光照射部,可形成正型之圖型層。第一薄膜可在層合後或曝光後之任一,剝離即可。又,顯影後,樹脂層進行熱硬化(後硬化),藉由使未照射部硬化,可製造印刷配線板。正型感光性熱硬化性樹脂組成物係藉由光照射產生之酸,而變化成對於鹼顯影液為可溶的組成,故可藉由鹼顯影形成正型圖型。 The method of manufacturing a printed wiring board using a dry film having a resin layer made of a positive photosensitive thermosetting resin composition can use a conventionally known method. For example, in the case of a dry film in which a resin layer is interposed between the first film and the second film as shown in FIG. 2, a printed wiring board can be manufactured as follows. The second film is peeled from the dry film to expose the resin layer, and the dry film is laminated on the substrate on which the circuit pattern is formed, using a vacuum laminator or the like. Then, the resin layer is irradiated with positive patterned light, the resin layer is subjected to alkali development, and the light irradiated portion is removed to form a positive patterned layer. The first film can be peeled off either after laminating or after exposure. In addition, after development, the resin layer is thermally cured (post-curing), and by curing the unirradiated portion, a printed wiring board can be manufactured. The positive-type photosensitive thermosetting resin composition is changed into a composition soluble in an alkali developer by an acid generated by light irradiation, so that a positive-type pattern can be formed by alkali development.

[薄膜] [film]

層合在載體薄膜與保護薄膜之間所挾之具有樹脂層之乾薄膜時,大部分的情形,將保護薄膜剝離,與保護薄膜接觸之側之樹脂層面與基材接觸予以層合。但是也有將載體薄膜剝離,與載體薄膜接觸之側之樹脂層面與基材接觸 予以層合的情形。本發明係藉由載體薄膜及保護薄膜,如圖2所示,樹脂層被挾於第一薄膜與第二薄膜之間為佳。又,層合於基材時,與基材接觸之樹脂層面(亦即層合面)接觸之側之薄膜為第二薄膜,與第二薄膜之前述樹脂層接觸之面為算術平均表面粗糙度Ra為0.1~1.2μm為佳,更佳為0.3~1.2μm,又更佳為0.4~1.2μm。又,算術平均表面粗糙度Ra係指依據JIS B0601所測量之值。第二薄膜可為載體薄膜與保護薄膜之任一。較佳為第一薄膜為載體薄膜,第二薄膜為保護薄膜。 When laminating a dry film with a resin layer sandwiched between a carrier film and a protective film, in most cases, the protective film is peeled off, and the resin layer on the side contacting the protective film is laminated with the base material. However, the carrier film is also peeled off, and the resin layer on the side in contact with the carrier film is in contact with the substrate. To be laminated. The present invention uses a carrier film and a protective film. As shown in FIG. 2, the resin layer is preferably sandwiched between the first film and the second film. In addition, when laminating on a substrate, the film on the side in contact with the resin layer (ie, the laminated surface) of the substrate is the second film, and the surface in contact with the aforementioned resin layer of the second film is the arithmetic average surface roughness Ra is preferably 0.1 to 1.2 μm, more preferably 0.3 to 1.2 μm, and still more preferably 0.4 to 1.2 μm. In addition, the arithmetic mean surface roughness Ra refers to the value measured in accordance with JIS B0601. The second film can be any of a carrier film and a protective film. Preferably, the first film is a carrier film, and the second film is a protective film.

載體薄膜係指具有支撐乾薄膜之樹脂層之功能者,形成該樹脂層時,塗佈有硬化性樹脂組成物之薄膜。載體薄膜可使用例如聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯等之聚酯薄膜、聚醯亞胺薄膜、聚醯胺醯亞胺薄膜、聚乙烯薄膜、聚四氟乙烯薄膜、聚丙烯薄膜、聚苯乙烯薄膜等之熱可塑性樹脂所成的薄膜及經表面處理的紙等。此等之中,從耐熱性、機械強度、操作性等的觀點,較佳為使用聚酯薄膜。載體薄膜之厚度,無特別限限制,大概在10~150μm之範圍內,配合用途適宜選擇。設置載體薄膜之樹脂層之面,也可施予脫模處理。又,設置載體薄膜之樹脂層之面,可濺鍍或形成極薄銅箔。 The carrier film refers to a film that has the function of supporting the resin layer of the dry film, and when the resin layer is formed, a film coated with a curable resin composition. The carrier film can use, for example, polyester film such as polyethylene terephthalate or polyethylene naphthalate, polyimide film, polyimide film, polyethylene film, and polytetrafluoroethylene film. , Polypropylene film, polystyrene film and other thermoplastic resin films and surface-treated paper, etc. Among these, from the viewpoints of heat resistance, mechanical strength, handleability, etc., a polyester film is preferably used. The thickness of the carrier film is not particularly limited, and it is probably in the range of 10~150μm, which is appropriately selected according to the application. The surface where the resin layer is provided with the carrier film can also be subjected to mold release treatment. In addition, the surface where the resin layer of the carrier film is provided can be sputtered or formed into an ultra-thin copper foil.

保護薄膜係指為了防止在乾薄膜之樹脂層之表面附著塵埃等,同時提高操作性,被設置於樹脂層之載體薄膜相反面。保護薄膜可使用例如前述載體薄膜所例示之由熱可塑性樹脂所成之薄膜、及經表面處理的紙等,此 等之中,較佳為聚酯薄膜及聚乙烯薄膜、聚丙烯薄膜。保護薄膜之厚度無特別限限制,大概在10~150μm之範圍內,配合用途適宜選擇。設置保護薄膜之樹脂層之面,也可施予脫模處理。 The protective film is to prevent dust and the like from adhering to the surface of the resin layer of the dry film, and to improve the workability, is set on the opposite side of the carrier film of the resin layer. As the protective film, for example, a film made of a thermoplastic resin as exemplified in the aforementioned carrier film, a surface-treated paper, etc. can be used. Among the others, a polyester film, a polyethylene film, and a polypropylene film are preferred. The thickness of the protective film is not particularly limited, it is probably in the range of 10~150μm, which is suitable for the application. The surface of the resin layer where the protective film is provided can also be demoulded.

具有如上述之算術平均表面粗糙度Ra之第二薄膜使用熱可塑性樹脂薄膜的情形,在使薄膜成膜時之樹脂中添加填料,或將薄膜表面進行噴砂(blasting)處理,或藉由發紋處理(Hairline Finish)、霧面塗佈(matte coating)或化學蝕刻等,可使表面形成特定之形態,可得到具有上述算術平均表面粗糙度Ra的熱可塑性樹脂薄膜。例如,樹脂中添加填料的情形,藉由調整填料之粒徑或添加量,可控制算術平均表面粗糙度Ra。又,進行噴砂處理的情形時,藉由調整噴砂材或噴砂壓等之處理條件,可控制算術平均表面粗糙度Ra。具有這種表面粗糙度之熱可塑性樹脂薄膜也可使用市售品,可列舉例如東麗公司製lumirror X42、lumirror X43、lumirror X44、unitika公司製EMBLETPTH-12、EMBLETPTH-25、EMBLETPTHA-25、EMBLETPTH-38、王子F-Tex公司製alphanMA-411、MA-420、E-201F及ER-440等。 When a thermoplastic resin film is used for the second film with the arithmetic average surface roughness Ra as described above, filler is added to the resin when the film is formed, or the surface of the film is blasted, or by hairline Treatment (Hairline Finish), matte coating (matte coating) or chemical etching, etc. can make the surface form a specific shape, and a thermoplastic resin film with the above-mentioned arithmetic average surface roughness Ra can be obtained. For example, when a filler is added to the resin, the arithmetic average surface roughness Ra can be controlled by adjusting the particle size or the amount of the filler. In addition, in the case of sandblasting, the arithmetic average surface roughness Ra can be controlled by adjusting the processing conditions such as sandblasting material or sandblasting pressure. Commercially available products can also be used for thermoplastic resin films having such surface roughness. For example, lumirror X42, lumirror X43, lumirror X44 made by Toray, EMBLETPTH-12 made by Unitika, EMBLETPTH-25, EMBLETPTHA-25, EMBLETPTH can be mentioned. -38. AlphanMA-411, MA-420, E-201F and ER-440 manufactured by Oji F-Tex.

第一薄膜係與前述樹脂層接觸之面之算術平均表面粗糙度Ra為0.1μm以下為佳。0.1μm以下的情形,硬化後之樹脂層之表面平坦性變得良好,光澤度也變得良好。又,第一薄膜與第二薄膜之算術平均表面粗糙度Ra有差異時,以目視(光澤之有無)可容易辨識哪個薄 膜,可防止作業上之疏失。 The arithmetic mean surface roughness Ra of the surface of the first film in contact with the aforementioned resin layer is preferably 0.1 μm or less. In the case of less than 0.1 μm, the surface flatness of the cured resin layer becomes good, and the gloss becomes good. In addition, when the arithmetic average surface roughness Ra of the first film and the second film are different, it is easy to recognize which is thinner by visual inspection (presence of gloss) Membrane can prevent negligence in operation.

又,因第二薄膜變得容易剝離,故第一薄膜之厚度A大於第二薄膜之厚度B為佳。更佳為厚度A與厚度B之差(A-B)為1μm以上。又,第一薄膜與第二薄膜之厚度有差時,以觸感或目視容易辨識哪個薄膜,可防止作業上之疏失。 In addition, since the second film becomes easy to peel off, the thickness A of the first film is preferably greater than the thickness B of the second film. More preferably, the difference (A-B) between thickness A and thickness B is 1 μm or more. In addition, when there is a difference in thickness between the first film and the second film, it is easy to identify which film is touched or visually, which can prevent errors in operation.

第一薄膜之厚度較佳為10~100μm,但是更佳為15μm以上。10μm以上的情形,將乾薄膜層合於基材後,不剝離第一薄膜而施予熱處理,第一薄膜也不易產生熱收縮,可防止因熱收縮造成厚度不均勻,或因熱收縮,沿著第一薄膜所產生之條紋,而樹脂層產生流動,樹脂層也產生紋路之品質劣化。 The thickness of the first film is preferably 10-100 μm, but more preferably 15 μm or more. In the case of 10μm or more, after the dry film is laminated on the substrate, the first film is heat-treated without peeling off the first film. The first film is not easy to undergo thermal shrinkage, which can prevent uneven thickness due to thermal shrinkage, or thermal shrinkage. With the streaks produced by the first film, the resin layer produces flow, and the resin layer also produces grain quality deterioration.

本發明之乾薄膜之樹脂層為由感光性樹脂組成物所成的情形時,為了可使第一乾薄膜未剝離而曝光,第一薄膜使用如上述熱可塑性樹脂之光透過性之材料為佳。此時,第一薄膜之厚度較佳為45μm以下。45μm以下的情形,底切(under cut)可降低。更佳為40μm以下。 When the resin layer of the dry film of the present invention is made of a photosensitive resin composition, in order to expose the first dry film without peeling off, it is preferable to use a light-transmitting material such as the above-mentioned thermoplastic resin for the first film . At this time, the thickness of the first film is preferably 45 μm or less. Under 45μm, the undercut can be reduced. More preferably, it is 40 μm or less.

本發明之乾薄膜可適合用於形成印刷配線板之永久保護膜,也可適合用於形成阻焊劑層、層間絕緣層、可撓性的印刷配線板之覆蓋膜(cover lay)。又,本發明之乾薄膜係埋入性優異,故可適用於如氣泡影響大之封裝基板之具備微細電路的印刷配線板,特別是可適用於具備L/S=10/10μm以下之微細電路的印刷配線板。此外, 作為乾薄膜之層合方法採用容易產生氣泡之真空層合的情形,也可適合使用本發明之乾薄膜。又,本發明之乾薄膜之樹脂層之硬化物係抗電鍍劑之形成性優異,故用於形成層間絕緣層為佳。使用本發明之乾薄膜,也可藉由貼合配線,形成配線板。又,也可作為半導體晶片用之封裝樹脂使用。也可用於形成無核心(coreless)基板之最外層或層間絕緣層。 The dry film of the present invention can be suitably used to form a permanent protective film for a printed wiring board, and can also be suitably used to form a solder resist layer, an interlayer insulating layer, and a cover lay of a flexible printed wiring board. In addition, the dry film of the present invention is excellent in embedding properties, so it can be applied to printed wiring boards with fine circuits such as packaging substrates that have a large influence of bubbles, and especially suitable for fine circuits with L/S=10/10μm or less Printed wiring board. In addition, The dry film of the present invention can also be suitably used in the case of vacuum lamination which is easy to generate bubbles as the lamination method of the dry film. In addition, the cured product of the resin layer of the dry film of the present invention is excellent in the formability of a plating resist, so it is preferably used to form an interlayer insulating layer. Using the dry film of the present invention, a wiring board can also be formed by bonding wiring. In addition, it can also be used as an encapsulating resin for semiconductor wafers. It can also be used to form the outermost layer or interlayer insulating layer of a coreless substrate.

實施例 Example

以下,舉本發明之實施例、比較例及試驗例,具體說明本發明,但是本發明不限定於下述實施例者。又,以下中,「份」及「%」在特別聲明時,全部為質量基準。 Hereinafter, examples, comparative examples, and test examples of the present invention will be given to specifically explain the present invention, but the present invention is not limited to the following examples. In addition, in the following, "parts" and "%" are all quality standards when specifically stated.

[經表面處理之無機填料之調製] [Preparation of surface-treated inorganic fillers] (經表面處理之二氧化矽A~D之調製及經表面處理之氧化鋁A、B之調製) (The preparation of surface-treated silica A~D and the preparation of surface-treated alumina A and B)

在燒瓶中,添加各自之無機填料100g、醇水溶液2000g(水:醇=1:9重量比),室溫下,以旋轉數300rpm攪拌30分鐘左右,形成漿料狀。其次,相對於無機填料之重量,各自之矽烷偶合劑準備1wt%,避免液滴飛散,以10分鐘徐徐滴下至漿料中,以10分鐘、300rpm攪拌漿料。然後,使用圓形定性濾紙取出經表面處理之填料。接著,將進行表面處理之無機填料擴散於淺盤 (tray)中,在110℃下乾燥60分鐘,得到經矽烷偶合劑進行表面處理的無機填料。關於使用的無機填料及矽烷偶合劑記載於下述表1之注釋中。 In the flask, 100 g of each inorganic filler and 2000 g of alcohol aqueous solution (water:alcohol=1:9 weight ratio) are added, and the mixture is stirred at a rotation speed of 300 rpm for about 30 minutes at room temperature to form a slurry. Secondly, relative to the weight of the inorganic filler, the respective silane coupling agent is prepared at 1 wt% to prevent droplets from flying off, drip slowly into the slurry for 10 minutes, and stir the slurry for 10 minutes at 300 rpm. Then, use round qualitative filter paper to take out the surface-treated filler. Next, diffuse the surface-treated inorganic filler on the shallow pan (tray), dried at 110°C for 60 minutes to obtain an inorganic filler surface-treated with a silane coupling agent. The inorganic filler and silane coupling agent used are described in the notes to Table 1 below.

(實施例1~34及比較例1~12) (Examples 1 to 34 and Comparative Examples 1 to 12) <乾薄膜之製作> <Production of dry film>

以下述表1、3、5、7、9、11、13及15所記載之實施例、比較例所示之處方調配各成分,進行輥磨機分散,調製黏度0.5~20dPa.s(旋轉黏度計5rpm、25℃)的硬化性樹脂組成物。其次,使用塗佈棒,塗佈於載體薄膜(lumirrorS10、厚度38μm、無表面處理、Ra=0.03μm、東麗公司製)上,使乾薄膜之膜厚在乾燥後成為15μm。其次,使用熱風循環式乾燥爐在85℃乾燥5~15分鐘,使用殘留溶劑量成為3.5~4.5%,在載體薄膜上形成硬化性樹脂層。其次,將保護薄膜(MA-411、厚度15μm、Ra=0.45μm、王子f-tex公司製)於乾燥塗膜面上,以設定溫度70℃進行輥層合,得到3層構造之乾薄膜。 In the following Tables 1, 3, 5, 7, 9, 11, 13 and 15 described in the Examples and Comparative Examples, the ingredients were mixed and dispersed by a roller mill to adjust the viscosity to 0.5-20dPa. s (rotary viscometer 5rpm, 25°C) curable resin composition. Next, using a coating bar, apply to a carrier film (lumirror S10, thickness 38 μm, no surface treatment, Ra=0.03 μm, manufactured by Toray Corporation) so that the film thickness of the dry film becomes 15 μm after drying. Next, use a hot air circulation type drying oven to dry at 85°C for 5 to 15 minutes, and the residual solvent amount used will be 3.5 to 4.5% to form a curable resin layer on the carrier film. Next, a protective film (MA-411, thickness 15 μm, Ra=0.45 μm, manufactured by Oji f-tex Co., Ltd.) was applied to the dry coating film surface, and roll-laminated at a set temperature of 70° C. to obtain a dry film with a three-layer structure.

<樹脂層之儲存彈性模數G’及熔融黏度> <Storage elastic modulus G'and melt viscosity of resin layer>

關於上述製作之各乾薄膜,將保護薄膜剝離後,以1腔式公司真空層合機MVLP-500(名機公司製),重疊2片乾薄膜之樹脂層,進行熱壓接,使樹脂層之厚度成為350μm。此時,為了避免對薄膜加熱,在溫度40℃、壓力0.5MPa下,進行1分鐘層合,重疊薄膜。其次,以黏度. 黏彈性測量裝置RheoStress RS-6000(HAAKE公司製)將載體薄膜剝離後,測量各自之樹脂層之溫度一黏彈性。測量條件係以昇溫模式5℃/min、振動模式(oscillation mode)應變量8%、頻率1Hz、測量感測器Φ20mm之平行板、感測器間之間隙(gap)300μm下進行。對於間隙,藉由使樹脂層增厚,在加熱時,也可間隙間確保充分的樹脂厚度。由以如前述的方法進行測量之溫度-儲存彈性模數G’、黏度η之曲線,將100℃下之儲存彈性模數及熔融黏度作為「樹脂層之儲存彈性模數G’」、「樹脂層之熔融黏度」。測量結果係如表中所示。 Regarding each dry film produced above, after peeling off the protective film, use a 1-cavity company vacuum laminator MVLP-500 (manufactured by Meiji Co., Ltd.) to superimpose two resin layers of the dry film and perform thermocompression bonding to make the resin layer The thickness becomes 350μm. At this time, in order to avoid heating the film, lamination was performed for 1 minute at a temperature of 40°C and a pressure of 0.5 MPa to overlap the film. Secondly, in terms of viscosity. The viscoelasticity measuring device RheoStress RS-6000 (manufactured by HAAKE) peeled off the carrier film, and then measured the temperature-viscoelasticity of the respective resin layer. The measurement conditions were performed in a heating mode of 5°C/min, an oscillation mode (oscillation mode) strain of 8%, a frequency of 1 Hz, a parallel plate of measuring sensor Φ20mm, and a gap between sensors of 300 μm. Regarding the gap, by increasing the thickness of the resin layer, a sufficient resin thickness can also be ensured between the gaps during heating. From the temperature-storage elastic modulus G'and viscosity η measured by the aforementioned method, the storage elastic modulus and melt viscosity at 100°C are taken as the "storage elastic modulus G'of the resin layer" and "resin Melt viscosity of the layer". The measurement results are shown in the table.

<埋入性(氣泡之發生FLS(細線寬/間距))> <Embedding (FLS (thin line width/spacing))>

在形成銅厚10μm、L(線(line):配線寬)/S(間距(space):間隔寬)=5/5μm、長寬比2.0之櫛齒狀圖型之微細電路的兩面印刷配線基板,進行前處理:以merk公司製CZ-8101處理,進行0.5μm相當之蝕刻處理。其次,將以述製作之厚度15μm的乾薄膜,使用分批式真空加壓層合機MVLP-500(名機公司製),層合於形成有L/S之基板上。層合條件係以5kgf/cm2、100℃、1分鐘、1Torr之條件下進行加熱層合,其次,在熱板壓製步驟,以10kgf/cm2、100℃、1分鐘之條件使平坦。層合後,空氣進入線寬/間距之界面部分,在100處剝離載體薄膜後,確認是否產生氣泡(空隙)。以此方法評價者,作為「層合後」。其次,以使樹脂層硬化的狀態同樣評價 有無氣泡之發生者,作為「硬化後」。硬化條件詳細如次項所示。評價基準如下述。 A double-sided printed circuit board with a copper thickness of 10μm, L (line: wiring width)/S (space (space): interval width) = 5/5μm, and an aspect ratio of 2.0 with a comb-tooth pattern fine circuit , Carry out pretreatment: Treat with CZ-8101 made by Merk Company, and carry out 0.5μm equivalent etching treatment. Next, the dry film with a thickness of 15 μm produced as described above was laminated on the substrate on which the L/S was formed using a batch-type vacuum pressure laminator MVLP-500 (manufactured by Meiji Co., Ltd.). The lamination conditions are heating lamination under the conditions of 5kgf/cm 2 , 100°C, 1 minute, and 1 Torr, and secondly, in the hot plate pressing step, flattening under the conditions of 10kgf/cm 2 , 100°C, and 1 minute. After lamination, air enters the line width/spacing interface. After peeling off the carrier film at 100 points, check whether bubbles (voids) are generated. Those evaluated in this way are regarded as "after lamination". Next, the presence or absence of bubbles was evaluated in the same way as the state in which the resin layer was cured, and it was referred to as "after curing". The hardening conditions are detailed as shown in the next item. The evaluation criteria are as follows.

○:未確認有空隙。 ○: No gaps are confirmed.

△:1~5處之空隙被確認。 △: 1~5 gaps are confirmed.

×:黏度及彈性率高,無法埋入於具有細線之基板。 ×: The viscosity and elastic modulus are high and cannot be embedded in a substrate with fine lines.

<硬化後之基板之平坦性> <The flatness of the hardened substrate>

關於以前述<埋入性(氣泡之發生FLS)>所記載的方法,層合於形成有微細電路之基板上之各自之乾薄膜的樹脂層,其中硬化系統為熱硬化性者係將載體薄膜剝離後,使用熱風循環式乾燥爐,在180℃下使熱硬化30分鐘後,在200℃下使熱硬化60分鐘,使樹脂層完全硬化。 Regarding the resin layer of each dry film laminated on the substrate on which the micro-circuit is formed by the method described in the above-mentioned <embedding (bubble generation FLS)>, and the curing system is thermosetting, the carrier film After peeling, using a hot-air circulation type drying oven, thermal curing was performed at 180°C for 30 minutes, and then thermal curing was performed at 200°C for 60 minutes to completely cure the resin layer.

另外,硬化系統為光.熱硬化性者係自載體薄膜上,使細線部分上完全被曝光,以曝光量300mJ/cm2(i線、牛尾投影曝光機)使光硬化後,將載體薄膜剝離。其次,以1wt%之碳酸鈉水溶液、0.2MPa之壓力、液溫30℃下進行顯影60秒鐘。其次,使用高壓水銀燈照射裝置進行1000mJ/cm2曝光。然後,以熱風循環式乾燥爐在180℃下使熱硬化60分鐘,使樹脂層完全硬化。 In addition, the hardening system is light. The thermosetting type is from the carrier film, so that the thin line part is completely exposed, and the light is cured with an exposure amount of 300mJ/cm 2 (i-line, oxtail projection exposure machine), and then the carrier film is peeled off. Next, develop with a 1 wt% sodium carbonate aqueous solution, a pressure of 0.2 MPa, and a liquid temperature of 30°C for 60 seconds. Next, a high-pressure mercury lamp irradiation device was used to perform 1000 mJ/cm 2 exposure. Then, heat curing was performed at 180°C for 60 minutes in a hot air circulation type drying furnace to completely cure the resin layer.

對於以各自之硬化方法使完全硬化的基板,相對於細線為垂直方向之硬化膜之表面凹凸,以接觸型表面粗糙度計測裝置(SE-300、小坂研究所公司製)在長度20mm之寬,測量硬化膜上之凹凸。評價基準如下述。 For the substrates that are completely cured by the respective curing methods, the surface irregularities of the cured film in the direction perpendicular to the thin line are measured with a contact-type surface roughness measuring device (SE-300, manufactured by Kosaka Laboratory Co., Ltd.) in a width of 20 mm in length, Measure the unevenness on the hardened film. The evaluation criteria are as follows.

◎:微細電路上,凹凸未達最大公差0.3μm。未看見 微細電路之銅燒焦。 ◎: On the fine circuit, the unevenness does not reach the maximum tolerance of 0.3μm. Not seen The copper of the fine circuit is burnt.

○:微細電路上,凹凸未達最大公差0.3μm。 ○: On the fine circuit, the unevenness does not reach the maximum tolerance of 0.3μm.

△:微細電路上,凹凸最大為公差0.3μm以上未達1.0μm。 △: On the fine circuit, the maximum unevenness is a tolerance of 0.3μm or more and less than 1.0μm.

×:微細電路上,凹凸最大為公差1.0μm以上。 ×: On the fine circuit, the maximum unevenness is 1.0 μm or more tolerance.

××:微細電路上,凹凸最大為公差5.0μm以上。電路之凹凸明顯。 ××: On fine circuits, the maximum unevenness is 5.0 μm or more tolerance. The unevenness of the circuit is obvious.

<與底部電路之密著性> <Adhesion to the bottom circuit>

在電解銅箔GTS-MP-18μm(古河Circuit Foil公司製)之光澤面,以Merk公司製CZ-8101處理,進行0.5μm相當之蝕刻處理。 The glossy surface of the electrolytic copper foil GTS-MP-18μm (manufactured by Furukawa Circuit Foil) was treated with CZ-8101 manufactured by Merk, and an etching treatment equivalent to 0.5μm was performed.

然後,對於處理面側,將各自之乾薄膜以<埋入性(氣泡之發生FLS)>所記載的方法進行層合,其次,以<硬化後之基板之平坦性>的方法使樹脂層完全硬化。然後,在樹脂層側使用2液型接著劑araldite,貼合於1.6mmtFR-4之蝕刻板,使接著層在室溫下硬化,得到CZ處理銅箔-樹脂層-FR4材之3層構造。對於所得之基板,依據JIS-C-6481之貼銅層合版試驗方法、剝離強度之測量方法(試驗片寬10mm、90°方向、速度50mm/min)測量各自之樹脂層與CZ處理面之接著力。判定基準係如下述。 Then, for the treatment surface side, the respective dry films are laminated by the method described in <embedding (bubble generation FLS)>, and secondly, the resin layer is completed by the method of <flatness of the substrate after curing> hardening. Then, a 2-component adhesive araldite was used on the resin layer side and attached to a 1.6mmtFR-4 etching board, and the adhesive layer was cured at room temperature to obtain a three-layer structure of CZ-treated copper foil-resin layer-FR4 material. For the obtained substrate, measure the relationship between the resin layer and the CZ treatment surface according to the JIS-C-6481 copper-laminated laminate test method and the peel strength measurement method (test piece width 10mm, 90° direction, speed 50mm/min) Follow force. The criterion system is as follows.

◎:接著力為5.0N/cm以上。 ⊚: The adhesive force is 5.0 N/cm or more.

○:接著力為3.0N/cm以上未達5.0N/cm。 ○: The adhesive force is 3.0 N/cm or more and less than 5.0 N/cm.

×:黏度或彈性率高,無法製作評價樣品。 ×: The viscosity or modulus of elasticity is high, and an evaluation sample cannot be produced.

<抗電鍍劑之形成性> <Formation of anti-plating agent>

對於以<硬化後之基板之平坦性>所記載的方法製作的硬化基板,進一步於其表面形成抗電鍍劑,進行評價。 For the hardened substrate produced by the method described in <The flatness of the substrate after hardening>, a plating resist was further formed on the surface and evaluated.

具體而言,對於製作之硬化基板,藉由過錳酸除膠渣處理(atotech公司製、垂直除膠渣(desmear)用Securiganth MV系列),以60℃膨潤5分鐘、以過錳酸在80℃下、處理20分鐘、50℃下、還原處理5分鐘,將基板表面進行粗化處理。其次,使用無電鍍銅處理(上村工業公司製、鹼離子型Pd),在基板表面形成0.3μm之厚度之銅晶種層(copper seed layer)。然後,將銅晶種層表面進行鹼脫脂後,將抗電鍍劑fortech RY-3625(日立化成工業公司製、SAP用抗電鍍劑、厚度25μm)使用輥層合機,在110℃、0.4MPa之壓力條件下,貼合於基板表面。其次,以EXP-2960(orc製作所公司製、平行光曝光機)使用玻璃乾板負型遮罩(negative mask)L/S圖型(20mm×20mm之區域之範圍內,形成有L/S=10/10μm之圖型的負型遮罩),並以曝光量100mJ/cm2,在基板表面形成負型圖型。其次,使用1wt%之碳酸鈉水溶液,在30℃下顯影30秒鐘,在基板表面形成L/S圖型。對於所得之基板,使用SEM觀察。在20mm×20mm之範圍內,隨意地萃取100處,評價抗電鍍劑之形成性(確認線缺漏的狀態或因凹陷,產生顯影不良處之狀態之有無)。判定基 準如下述。 Specifically, the produced hardened substrate is treated with permanganic acid desmear (manufactured by atotech, Securiganth MV series for vertical desmear), swelled at 60°C for 5 minutes, and permanganic acid is used at 80°C for 5 minutes. The surface of the substrate was subjected to a roughening treatment at 20 minutes of treatment at 50°C, and reduction treatment at 50°C for 5 minutes. Next, an electroless copper plating process (manufactured by Uemura Industry Co., Ltd., alkali ion type Pd) was used to form a copper seed layer with a thickness of 0.3 μm on the surface of the substrate. Then, after alkali degreasing the surface of the copper seed layer, apply the anti-plating agent fortech RY-3625 (manufactured by Hitachi Chemical Co., Ltd., anti-plating agent for SAP, thickness 25μm) using a roll laminator at 110°C, 0.4MPa Under pressure conditions, it is attached to the surface of the substrate. Next, use the EXP-2960 (Orc Manufacturing Co., Ltd., parallel light exposure machine) to use a glass dry plate negative mask (negative mask) L/S pattern (20mm×20mm area, L/S=10 /10μm pattern negative mask), and with an exposure amount of 100mJ/cm 2 , a negative pattern is formed on the surface of the substrate. Secondly, a 1wt% sodium carbonate aqueous solution was used to develop at 30°C for 30 seconds to form an L/S pattern on the surface of the substrate. The obtained substrate was observed by SEM. Randomly extract 100 places within the range of 20mm×20mm to evaluate the formation of the anti-plating agent (check whether the line is missing or the state of poor development due to dents). The judgment criteria are as follows.

○:形成性良好。 ○: The formability is good.

△:L/S之形成不良(線缺漏、顯影不良)發現1處以上未達10處。 △: Poor L/S formation (line missing, poor development) was found to be more than one and less than ten.

×:L/S之形成不良(線缺漏、顯影不良)發現10處以上。 ×: L/S formation failures (line missing, poor development) were found in 10 or more places.

××:底層不平坦,故未形成如設計值之圖型。 ××: The bottom layer is not flat, so there is no pattern like the design value.

<加濕後之介電正切> <Dielectric tangent after humidification>

將以<乾薄膜之製作>所記載的方法製作之樹脂層之厚度15μm的乾薄膜在電解銅箔GTS-MP-18μm(古河Circuit Foil公司製)之光澤面上,使用<埋入性(氣泡之發生FLS)>所記載的方法進行層合,其次,以<硬化後之基板之平坦性>的方法使樹脂層完全硬化。然後,由銅箔上,將硬化物剝離,得到厚度15μm之硬化物。 A dry film with a thickness of 15μm in the resin layer produced by the method described in <Production of dry film> is used on the glossy surface of the electrolytic copper foil GTS-MP-18μm (manufactured by Furukawa Circuit Foil Co., Ltd.) with <embedding (bubble) The occurrence of FLS) is laminated by the method described in, and secondly, the resin layer is completely cured by the method of <flatness of the substrate after curing>. Then, the cured product was peeled off from the copper foil to obtain a cured product with a thickness of 15 μm.

對於所得之硬化物,在設定為溫度85℃、濕度85%RH之高溫高濕槽中保管100小時,取出後10分鐘以內,使用SPDR介電體共振器與網路分析儀(均為agilent公司製),測量23℃下之5.1GHz之加濕時之介電正切。判定基準係如下述。 The cured product obtained is stored in a high temperature and high humidity tank set at a temperature of 85°C and a humidity of 85%RH for 100 hours. Within 10 minutes after taking it out, use an SPDR dielectric resonator and a network analyzer (both from agilent) Manufacture), measure the dielectric tangent of 5.1GHz humidification at 23℃. The criterion system is as follows.

◎◎:5GHz之介電正切未達0.005。 ◎◎: The dielectric tangent of 5GHz is less than 0.005.

◎:5GHz之介電正切為0.005以上、未達0.01。 ◎: The dielectric tangent of 5GHz is 0.005 or more and less than 0.01.

○:5GHz之介電正切為0.01以上、未達0.015。 ○: The dielectric tangent at 5 GHz is 0.01 or more and less than 0.015.

△:5GHZ之介電正切為0.015以上、未達0.02。 △: The dielectric tangent of 5GHZ is more than 0.015 and less than 0.02.

×:5GHz之介電正切為0.02以上。 ×: The dielectric tangent at 5 GHz is 0.02 or more.

<散熱特性> <Heat dissipation characteristics>

將與<加濕後之介電正切>同樣方法所得之15μm的硬化物,依據JIS-R1611所記載的方法,測量硬化物之熱導率(Thermal Conductivity)。判定基準係如下述。 The 15μm hardened product obtained by the same method as the <dielectric tangent after humidification> was measured according to the method described in JIS-R1611 to measure the thermal conductivity of the hardened product (Thermal Conductivity). The criterion system is as follows.

◎:熱導率為1W/m.K以上。 ◎: The thermal conductivity is 1W/m. Above K.

○:熱導率為0.3W/m.K以上、未達1W/m.K。 ○: The thermal conductivity is 0.3W/m. Above K, less than 1W/m. K.

△:熱導率為未達0.3W/m.K。 △: The thermal conductivity is less than 0.3W/m. K.

×:黏度或彈性率高,無法製作評價樣品。 ×: The viscosity or modulus of elasticity is high, and an evaluation sample cannot be produced.

<熱膨脹係數> <Coefficient of Thermal Expansion>

將與<加濕後之介電正切>同樣方法所得之15μm之硬化物由銅箔上剝離後,將樣品切成測量尺寸(3mm×10mm之大小),供Seiko Instruments公司製TMA6100。TMA測量係在試驗荷重5g下,將樣品以10℃/分鐘之昇溫速度下,自室溫昇溫,連續測量2次。作為第2次之Tg以下之區域中之熱膨脹係數(CTE(α1))來評價。判定基準係如下述。 After peeling the cured product of 15 μm from the copper foil by the same method as the "dielectric tangent after humidification", the sample was cut into a measurement size (3mm×10mm size) and supplied to TMA6100 manufactured by Seiko Instruments. The TMA measurement system is to measure the temperature of the sample from room temperature at a heating rate of 10°C/min under a test load of 5g, and two consecutive measurements. It is evaluated as the second thermal expansion coefficient (CTE(α1)) in the region below Tg. The criterion system is as follows.

◎◎:玻璃轉移溫度以下之CTE為未達10ppm。 ◎◎: The CTE below the glass transition temperature is less than 10 ppm.

◎:玻璃轉移溫度以下之CTE為10ppm以上、未達17ppm。 ◎: The CTE below the glass transition temperature is 10 ppm or more and less than 17 ppm.

○:玻璃轉移溫度以下之CTE為17ppm以上、未達30ppm。 ○: The CTE below the glass transition temperature is 17 ppm or more and less than 30 ppm.

△:玻璃轉移溫度以下之CTE為30ppm以上。 △: The CTE below the glass transition temperature is 30 ppm or more.

×:黏度或彈性率高,無法製作評價樣品。 ×: The viscosity or modulus of elasticity is high, and an evaluation sample cannot be produced.

<基板翹曲> <Substrate warpage>

在厚度200μm、尺寸100×100mm之貼銅層合板(MCL-E-770G、日立化成社、銅厚18μm、前處理:施予CZ-8101相當1μm之蝕刻處理)上以<乾薄膜之製作>所記載的方法製作之樹脂厚度15μm的乾薄膜,使用真空層合機層合於基板之單面,接著,將載體薄膜剝離後,使用熱風循環式乾燥爐使樹脂層完全硬化。對於所得之基板使用游標尺(Vernier Caliper)測量基板4角之翹曲量,依據以下判定基準進行評價。 On a copper-laminated laminate (MCL-E-770G, Hitachi Chemical Co., Ltd., copper thickness 18μm, pre-treatment: CZ-8101 equivalent to 1μm etching treatment) with a thickness of 200μm and a size of 100×100mm, use <Production of dry film> A dry film with a resin thickness of 15 μm produced by the described method is laminated on one side of the substrate using a vacuum laminator, and then the carrier film is peeled off, and then the resin layer is completely cured using a hot air circulation drying oven. For the obtained substrate, the amount of warpage at the 4 corners of the substrate was measured using a Vernier Caliper, and the evaluation was performed based on the following criteria.

◎:翹曲之最大值未達3mm。 ◎: The maximum warpage is less than 3mm.

○:翹曲之最大值為3mm以上未達15mm。 ○: The maximum warpage is 3mm or more and less than 15mm.

△:翹曲之最大值為15mm以上。 △: The maximum value of warpage is 15 mm or more.

×:黏度或彈性率高,無法製作評價樣品。 ×: The viscosity or modulus of elasticity is high, and an evaluation sample cannot be produced.

<回焊+TCT(Thermal Cycling Test)> <Reflow+TCT (Thermal Cycling Test)>

將各實施例及比較例之乾薄膜厚度(樹脂厚15μm)使用分批式真空加壓層合機MVLP-500(名機公司製),以5kgf/cm2、80℃、1分鐘、1Torr之條件下層合於貼銅層合板之銅上。然後,將載體薄膜剝離,以熱風循環式乾燥爐加熱,使樹脂層在180℃下硬化30分鐘。然後,使用CO2雷射加工機(日立viamechanics公司製)形成頂徑 65μm、底徑50μm之導孔(via)。 The dry film thickness (resin thickness of 15μm) of each example and comparative example was used in a batch-type vacuum pressure laminator MVLP-500 (manufactured by Meiji Corporation) at a rate of 5kgf/cm 2 , 80°C, 1 minute, 1 Torr Under the conditions, it is laminated on the copper of the copper-clad laminate. Then, the carrier film was peeled off and heated in a hot-air circulation type drying oven to harden the resin layer at 180°C for 30 minutes. Then, a CO 2 laser processing machine (manufactured by Hitachi Viamechanics) was used to form vias with a top diameter of 65 μm and a bottom diameter of 50 μm.

硬化系為光.熱硬化性者係以<硬化後之基板之平坦性>所記載的方法,使用Φ65μm之負型圖型,進行曝光及顯影,接著進行紫外線照射及本硬化,形成導孔。 The hardening system is light. For the thermosetting type, use the method described in <The flatness of the substrate after curing>, using a 65μm negative pattern, exposure and development, followed by ultraviolet radiation and this curing to form via holes.

其次,對於所得之導孔圖型,依市售之濕式過錳酸除膠渣(ATOTECH公司製)、無電鍍銅(THRU-CUP PEA、上村工業公司製)、電鍍銅處理之順序進行處理,在樹脂層上供與銅厚度25μm、以填充導孔部分施予鍍銅處理。其次,以熱風循環式乾燥爐在200℃下進行熱硬化60分鐘,得到施予完全硬化之鍍銅處理的試驗基板。將所得之試驗用基板以無鉛裝配之條件(波峰溫度270℃、10秒鐘)施加回焊處理3循環熱衝撃後,在-65℃下30分鐘、150℃下30分鐘作為1循環,施予冷熱循環處理。經過2000及3000循環後,為了以光學顯微鏡觀察導孔底或壁面的狀態,而以精密切斷機裁斷,研磨導孔中心部分,觀察剖面狀態。評價基準係依據下述評價。觀察導孔數為100孔。 Secondly, the obtained via pattern is processed in the order of commercially available wet permanganic acid desmear (manufactured by ATOTECH), electroless copper (THRU-CUP PEA, manufactured by Uemura Industrial Co.), and copper electroplating. , Provide copper with a thickness of 25μm on the resin layer, and apply copper plating to fill the via hole. Next, heat curing was carried out at 200° C. for 60 minutes in a hot-air circulation type drying furnace to obtain a test substrate subjected to a fully cured copper plating treatment. The obtained test substrate was subjected to 3 cycles of heat shock under lead-free assembly conditions (peak temperature of 270°C, 10 seconds), and then subjected to 1 cycle at -65°C for 30 minutes and 150°C for 30 minutes. Heat and cold cycle processing. After 2000 and 3000 cycles, in order to observe the state of the bottom or wall surface of the guide hole with an optical microscope, it was cut with a precision cutter, and the center part of the guide hole was polished to observe the cross-sectional state. The evaluation criteria are based on the following evaluations. The number of observation guide holes is 100 holes.

◎:3000循環終了後,未發生龜裂。 ◎: After 3000 cycles, no cracks occurred.

○:2000循環終了後,未發生龜裂。3000循環時發生1~5處之龜裂。 ○: No cracks occurred after the end of the 2000 cycle. 1 to 5 cracks occurred at 3000 cycles.

△:2000循環終了後,發生1~5處之龜裂。 △: After the end of the 2000 cycle, 1 to 5 cracks occurred.

×:熔融黏度、儲存彈性模數超過最佳範圍,故無法製作試驗片。 ×: The melt viscosity and storage elastic modulus exceed the optimum range, so the test piece cannot be produced.

<比介電率> <Specific Dielectric Rate>

在電解銅箔GTS-MP-18μm(古河Circuit Foil公司製)之光澤面,以<埋入性(氣泡之發生FLS)>所記載的方法層合<乾薄膜之製作>所記載方法製作之樹脂層之厚度15μm的乾薄膜,其次,以<硬化後之基板之平坦性>的方法使樹脂層完全硬化。然後,自銅箔上剝離硬化物,得到厚度15μm的硬化物。 On the glossy surface of electrolytic copper foil GTS-MP-18μm (manufactured by Furukawa Circuit Foil Co., Ltd.), laminate the resin produced by the method described in <embedding property (foam generation FLS)> with the method described in <dry film production> A dry film with a layer thickness of 15μm, and secondly, the resin layer is completely cured by the method of <Finishing the substrate after curing>. Then, the cured product was peeled from the copper foil to obtain a cured product having a thickness of 15 μm.

對於所得之硬化物,使用SPDR介電體共振器與網路分析儀(均為agilent公司製),測量23℃下之1GHz之比介電率。判定基準係如下述。 For the obtained cured product, SPDR dielectric resonator and network analyzer (both manufactured by Gilent) were used to measure the specific dielectric rate of 1 GHz at 23°C. The criterion system is as follows.

◎:在1GHz下之比介電率為10.0以上。 ⊚: The specific permittivity at 1 GHz is 10.0 or more.

○:在1GHz下之比介電率為5.0以上未達10.0。 ○: The specific permittivity at 1 GHz is 5.0 or more and less than 10.0.

<電路隱蔽性> <Circuit concealment>

以前述<埋入性(氣泡之發生FLS)>及<硬化後之基板之平坦性>所記載方法,在微細電路基板上形成硬化膜後,將載體薄膜剝離得到印刷配線板。 After forming a cured film on a fine circuit board by the methods described in the above-mentioned <embedding (bubble generation FLS)> and <flatness of the substrate after curing>, the carrier film is peeled off to obtain a printed wiring board.

對於所得之評價基板,以目視確認自硬化膜上之銅電路之變色,對於電路之隱蔽性進行評價。判定基準如下述。 For the obtained evaluation substrate, the discoloration of the copper circuit from the cured film was visually confirmed, and the concealment of the circuit was evaluated. The judgment criteria are as follows.

◎:未確認變色。 ◎: No discoloration was confirmed.

×:確認變色。 ×: Discoloration is confirmed.

Figure 105141431-A0202-12-0057-1
Figure 105141431-A0202-12-0057-1

*1:DIC公司製HP-820、烷基苯酚型液狀環氧樹脂、環氧當量:225g/eq *1: HP-820 manufactured by DIC, alkylphenol type liquid epoxy resin, epoxy equivalent: 225g/eq

*2:日本化藥公司製NC-3000L、聯苯基芳烷基型固 形環氧樹脂、環氧當量:275g/eq *2: NC-3000L, biphenyl aralkyl type solid Shape epoxy resin, epoxy equivalent: 275g/eq

*3:大阪氣體化學公司製CG-500、茀系固形環氧樹脂、環氧當量:311g/eq *3: CG-500 manufactured by Osaka Gas Chemical Co., Ltd., a solid epoxy resin, epoxy equivalent: 311g/eq

*4:日產化學公司製TGIC、三環氧丙基異三聚氰酸酯(isocyanurate)(固形環氧樹脂)、環氧當量:99g/eq *4: TGIC manufactured by Nissan Chemical Co., triglycidyl isocyanurate (solid epoxy resin), epoxy equivalent: 99g/eq

*5:三菱化學公司製1003、Bis-A型固形環氧樹脂、環氧當量:720g/eq *5: Mitsubishi Chemical Corporation 1003, Bis-A type solid epoxy resin, epoxy equivalent: 720g/eq

*6:DIC公司製TD-2131、苯酚酚醛清漆樹脂、羥基當量:104g/eq *6: TD-2131 manufactured by DIC, phenol novolac resin, hydroxyl equivalent: 104g/eq

*7:明和化成公司製MEH-7851-4H、聯苯基芳烷基型酚樹脂、羥基當量:240g/eq *7: MEH-7851-4H, biphenyl aralkyl type phenol resin manufactured by Meiwa Chemical Co., Ltd., hydroxyl equivalent: 240g/eq

*8:DIC公司製LA-3018、含有ATN之苯酚酚醛清漆樹脂、羥基當量:151g/eq *8: LA-3018 made by DIC, phenol novolac resin containing ATN, hydroxyl equivalent: 151g/eq

*9:丸善化學公司製MARUKA LYNCUR M、聚乙烯基苯酚、羥基當量120g/eq *9: MARUKA LYNCUR M manufactured by Maruzen Chemical Co., polyvinylphenol, hydroxyl equivalent 120g/eq

*10:Lonza Japan公司製PT-30、酚醛清漆型氰酸酯酯樹脂、氰酸酯當量:124g/eq *10: PT-30 manufactured by Lonza Japan, novolac type cyanate ester resin, cyanate equivalent: 124g/eq

*11:Lonza Japan公司製BA-3000、Bis-A型氰酸酯樹脂、氰酸酯當量:284g/eq *11: BA-3000, Bis-A type cyanate ester resin manufactured by Lonza Japan, cyanate equivalent: 284g/eq

*12:大和化成工業公司製BMI-1100、N,N’-二苯基甲烷雙馬來醯亞胺、馬來醯亞胺當量:179g/eq *12: BMI-1100, N,N'-diphenylmethane bismaleimide, maleimine equivalent manufactured by Daiwa Chemical Industry Co., Ltd.: 179g/eq

*13:日本化藥社公司製MIR-3000、含有聯苯骨架雙馬來醯亞胺、馬來醯亞胺當量:275g/eq *13: MIR-3000 manufactured by Nippon Kayakusha Co., Ltd., containing biphenyl skeleton bismaleimide, maleimide equivalent: 275g/eq

*14:AIR WATER公司製PC-1100-02、多官能型活性酯樹脂、活性酯當量:154g/eq *14: PC-1100-02 manufactured by AIR WATER, multifunctional active ester resin, active ester equivalent: 154g/eq

*15:DIC公司製EXB9416、萘酚末端、含有二環戊二烯骨架之活性酯樹脂、活性酯當量:220g/eq *15: EXB9416 manufactured by DIC, naphthol end, active ester resin containing dicyclopentadiene skeleton, active ester equivalent: 220g/eq

*16:日本乳化劑公司製RMA-11902、以酚樹脂作為起始原料之具有丙烯醯基之感光性含羧基樹脂(固體成分:65%) *16: RMA-11902 made by Nippon Emulsifier Co., a photosensitive carboxyl group-containing resin with an acrylic group using phenol resin as a starting material (solid content: 65%)

*17:新中村化學工業公司製A-DCP、二環戊二烯骨架丙烯酸單體 *17: A-DCP, dicyclopentadiene skeleton acrylic monomer manufactured by Shinnakamura Chemical Industry Co., Ltd.

*18:東亞合成公司製HPS-500、D50=0.5μm之球狀二氧化矽 *18: HPS-500 manufactured by Toagosei Co., Ltd., spherical silica with D50=0.5μm

*19:東亞合成公司製HPS-1000、D50=1.0μm之球狀二氧化矽 *19: HPS-1000 manufactured by Toagosei Co., Ltd., spherical silica with D50=1.0μm

*20:上述調製之經表面處理的二氧化矽A(admatechs公司製奈米二氧化矽(平均一次粒徑(D50)=50nm)之1wt%之胺基矽烷處理品) *20: The above-prepared surface-treated silica A (Nanosilica manufactured by Admatechs (Average primary particle size (D50)=50nm) 1wt% aminosilane-treated product)

*21:電化學工業公司製FB-5SDX、D50=4.9μm之球狀二氧化矽 *21: FB-5SDX, D50=4.9μm spherical silicon dioxide manufactured by Electrochemical Industry Co., Ltd.

*22:上述調製之經表面處理的二氧化矽B(HPS-500/KBE-1003、HPS-500之1wt%乙烯基矽烷處理品) *22: Surface-treated silicon dioxide B prepared above (HPS-500/KBE-1003, HPS-500 1wt% vinyl silane treated product)

*23:上述調製之經表面處理的二氧化矽C(HPS-500/KBE-9103、HPS-500之1wt%胺基矽烷處理品) *23: Surface-treated silicon dioxide C prepared above (HPS-500/KBE-9103, HPS-500 1wt% aminosilane treated product)

*24:上述調製之經表面處理的二氧化矽D(HPS-1000/KBE-1003、HPS-1000之1wt%乙烯基矽烷處理品) *24: The surface-treated silicon dioxide D prepared above (HPS-1000/KBE-1003, HPS-1000 1wt% vinyl silane treated product)

*25:上述調製之經表面處理的二氧化矽E(FB-5SDX/KBE-9103、FB-5SDX之1wt%胺基矽烷處理品) *25: The surface-treated silicon dioxide E prepared above (FB-5SDX/KBE-9103, FB-5SDX 1wt% aminosilane treated product)

*26:電化學工業公司製ASFP-20、D50=0.3μm之球狀氧化鋁 *26: ASFP-20 made by Electrochemical Industry Corporation, D50=0.3μm spherical alumina

*27:電化學工業公司製DAM-03、D50=3.7μm之球狀氧化鋁 *27: DAM-03, D50=3.7μm spherical alumina manufactured by Electrochemical Industry Corporation

*28:上述調製之經表面處理的氧化鋁A(ASFP-20/KBE-1003、ASFP-20之1wt%乙烯基矽烷處理品) *28: The surface-treated alumina A prepared above (ASFP-20/KBE-1003, ASFP-20 1wt% vinyl silane treated product)

*29:上述調製之經表面處理的氧化鋁B(DAM-03/KBE-1003、DAM-03之1wt%乙烯基矽烷處理品) *29: The surface-treated alumina B prepared above (DAM-03/KBE-1003, DAM-03 1wt% vinyl silane treated product)

*30:龍森公司製FUSELEX WX、D50=1.5μm之不定形二氧化矽 *30: FUSELEX WX made by Ronson, D50=1.5μm amorphous silica

*31:信越化學公司製KBE-1003、乙烯基三乙氧基矽烷 *31: KBE-1003, vinyl triethoxysilane manufactured by Shin-Etsu Chemical Co., Ltd.

*32:信越化學公司製KBE-402、3-環氧丙氧基丙基甲基二乙氧基矽烷 *32: KBE-402, 3-glycidoxypropylmethyldiethoxysilane manufactured by Shin-Etsu Chemical Co., Ltd.

*33:信越化學公司製KBE-9103、3-三乙氧基甲矽烷基-N-(1,3-二甲基-亞丁基)丙基胺 *33: KBE-9103, 3-triethoxysilyl-N-(1,3-dimethyl-butylene) propylamine manufactured by Shin-Etsu Chemical Co., Ltd.

*34:BASF Japan公司製IRGACURE369、α-胺基烷基苯酮(phenone)系光聚合起始劑 *34: IRGACURE369 made by BASF Japan, α-aminoalkyl phenone (phenone)-based photopolymerization initiator

*35:鈷乙醯基丙酮1wt%、DMF溶液 *35: Cobalt acetone 1wt%, DMF solution

*36:四國化成公司製2E4MZ-AP、咪唑 *36: 2E4MZ-AP, imidazole manufactured by Shikoku Chemical Co., Ltd.

*37:三菱化學公司製YL7600、含有低介電骨架之苯氧基樹脂 *37: YL7600 made by Mitsubishi Chemical Corporation, phenoxy resin containing low dielectric skeleton

*38:環己酮 *38: Cyclohexanone

*39:DMF(N,N-二甲基甲醯胺) *39: DMF (N,N-dimethylformamide)

*40:出光興產公司製Ipsol 100、芳香族系高沸點溶劑 *40: Ipsol 100 manufactured by Idemitsu Kosan Co., Ltd., aromatic high boiling point solvent

Figure 105141431-A0202-12-0061-2
Figure 105141431-A0202-12-0061-2

Figure 105141431-A0202-12-0062-3
Figure 105141431-A0202-12-0062-3

Figure 105141431-A0202-12-0063-4
Figure 105141431-A0202-12-0063-4

Figure 105141431-A0202-12-0064-5
Figure 105141431-A0202-12-0064-5

Figure 105141431-A0202-12-0065-6
Figure 105141431-A0202-12-0065-6

Figure 105141431-A0202-12-0066-7
Figure 105141431-A0202-12-0066-7

Figure 105141431-A0202-12-0067-8
Figure 105141431-A0202-12-0067-8

Figure 105141431-A0202-12-0068-9
Figure 105141431-A0202-12-0068-9

*42:DIC公司製EPICLON 860、雙酚A型半固形環氧樹脂、環氧當量:245g/eq *42: EPICLON 860 manufactured by DIC, bisphenol A type semi-solid epoxy resin, epoxy equivalent: 245g/eq

*43:DIC公司製HP-4032、萘型半固形環氧樹脂、環氧當量:150g/eq *43: HP-4032 manufactured by DIC, naphthalene type semi-solid epoxy resin, epoxy equivalent: 150g/eq

*44:DIC公司製N-740、苯酚酚醛清漆型半固形環氧樹脂、環氧當量:180g/eq *44: N-740 manufactured by DIC, phenol novolac type semi-solid epoxy resin, epoxy equivalent: 180g/eq

Figure 105141431-A0202-12-0069-10
Figure 105141431-A0202-12-0069-10

Figure 105141431-A0202-12-0070-11
Figure 105141431-A0202-12-0070-11

*45:堺化學工業製BT-03B D50=0.3μm *45: BT-03B D50=0.3μm manufactured by Sakai Chemical Industry

*46:石原產業製TIPAQUE CR-97 D50=0.25μm *46: TIPAQUE CR-97 D50=0.25μm manufactured by Ishihara Sangyo

*47:堺化學工業製CZ-03 D50=0.3μm *47: CZ-03 D50=0.3μm manufactured by Sakai Chemical Industry

Figure 105141431-A0202-12-0071-12
Figure 105141431-A0202-12-0071-12

Figure 105141431-A0202-12-0072-13
Figure 105141431-A0202-12-0072-13

Figure 105141431-A0202-12-0073-14
Figure 105141431-A0202-12-0073-14

*48:無法層合 *48: Cannot be laminated

Figure 105141431-A0202-12-0074-15
Figure 105141431-A0202-12-0074-15

Figure 105141431-A0202-12-0075-16
Figure 105141431-A0202-12-0075-16

由上表所示之結果可知實施例1~34之乾薄膜的情形,樹脂層之埋入性及平坦性優異。此外,樹脂層之熔融黏度未滿足在100℃下為60~5500dPa.s或樹脂層之儲存彈性模數未滿足在100℃下為80~5500Pa之比較例1~11的乾薄膜及樹脂層中之液狀環氧樹脂之含量為60質量%以上之比較例12的乾薄膜,埋入性及平坦性差。 From the results shown in the above table, it can be seen that the dry films of Examples 1 to 34 have excellent embedding properties and flatness of the resin layer. In addition, the melt viscosity of the resin layer does not meet the requirements of 60~5500dPa at 100℃. s or the storage elastic modulus of the resin layer does not satisfy the dry film of Comparative Examples 1 to 11 at 100°C of 80 to 5500 Pa, and Comparative Example 12 where the content of the liquid epoxy resin in the resin layer is 60% by mass or more Dry film, poor embedding and flatness.

Claims (9)

一種乾薄膜,其係具有薄膜及含有形成於該薄膜上之環氧樹脂之樹脂層的乾薄膜,前述樹脂層之熔融黏度在100℃下為60~5500dPa.s,前述樹脂層之儲存彈性模數在100℃下為80~5500Pa,前述樹脂層為至少含有液狀環氧樹脂作為前述環氧樹脂,前述液狀環氧樹脂之含量為在前述環氧樹脂全質量中,未達60質量%,其係用於在將前述樹脂層硬化所得的硬化膜上形成抗電鍍劑(Plating resist)的用途。 A dry film, which is a dry film having a film and a resin layer containing an epoxy resin formed on the film, the melt viscosity of the aforementioned resin layer is 60~5500dPa at 100°C. s, the storage elastic modulus of the aforementioned resin layer is 80~5500Pa at 100°C, the aforementioned resin layer contains at least liquid epoxy resin as the aforementioned epoxy resin, and the content of the aforementioned liquid epoxy resin is in the aforementioned epoxy resin The total mass is less than 60% by mass, and it is used for the purpose of forming a plating resist on the cured film obtained by curing the aforementioned resin layer. 如申請專利範圍第1項之乾薄膜,其中前述樹脂層中之殘留溶劑量為1.0~7.0質量%。 For example, the dry film of item 1 in the scope of patent application, wherein the amount of residual solvent in the aforementioned resin layer is 1.0~7.0% by mass. 如申請專利範圍第1項之乾薄膜,其中前述樹脂層中,含有選自由N,N-二甲基甲醯胺、甲苯、環己酮、碳數為8以上之芳香族烴及甲基乙基酮所成群之至少2種的有機溶劑。 For example, the dry film of the first item of the scope of patent application, wherein the aforementioned resin layer contains selected from the group consisting of N,N-dimethylformamide, toluene, cyclohexanone, aromatic hydrocarbons with a carbon number of 8 or more, and methyl ethyl At least 2 kinds of organic solvents from the group of base ketones. 如申請專利範圍第1項之乾薄膜,其中前述樹脂層進一步含有選自由雙酚A型環氧樹脂、萘型環氧樹脂及苯酚酚醛清漆型環氧樹脂所成群之至少1種的半固形環氧樹脂,作為前述環氧樹脂。 For example, the dry film of item 1 in the scope of patent application, wherein the aforementioned resin layer further contains at least one semi-solid selected from the group consisting of bisphenol A epoxy resin, naphthalene epoxy resin and phenol novolac epoxy resin. Epoxy resin is the aforementioned epoxy resin. 如申請專利範圍第1項之乾薄膜,其中前述樹脂層含有填料, 前述填料之平均粒徑為0.1~10μm。 For example, the dry film of item 1 in the scope of patent application, in which the aforementioned resin layer contains fillers, The average particle size of the aforementioned filler is 0.1~10μm. 如申請專利範圍第1項之乾薄膜,其中前述樹脂層含有填料,前述填料之調配量係樹脂層全量(樹脂層含有溶劑的情形係排除溶劑之全量)之40~80質量%。 For example, the dry film of the first item in the scope of patent application, wherein the resin layer contains a filler, and the blending amount of the filler is 40 to 80% by mass of the total amount of the resin layer (when the resin layer contains a solvent, the total amount of the solvent is excluded). 如申請專利範圍第1項之乾薄膜,其中前述樹脂層含有填料,前述填料為以具有環氧基之矽烷偶合劑、具有胺基之矽烷偶合劑、具有巰基之矽烷偶合劑、具有異氰酸酯基之矽烷偶合劑、具有乙烯基之矽烷偶合劑、具有苯乙烯基之矽烷偶合劑、具有甲基丙烯醯基之矽烷偶合劑及具有丙烯醯基之矽烷偶合劑之至少任1種進行表面處理。 For example, the dry film of the first item in the scope of patent application, wherein the resin layer contains a filler, and the filler is a silane coupling agent with an epoxy group, a silane coupling agent with an amine group, a silane coupling agent with a mercapto group, and an isocyanate group At least one of a silane coupling agent, a silane coupling agent with a vinyl group, a silane coupling agent with a styrene group, a silane coupling agent with a methacryl group and a silane coupling agent with an acryl group is subjected to surface treatment. 一種硬化物,其係使如申請專利範圍第1~7項中任一項之乾薄膜之樹脂層硬化所得者。 A hardened product obtained by hardening the resin layer of a dry film as in any one of items 1 to 7 in the scope of the patent application. 一種印刷配線板,其係具備如申請專利範圍第8項之硬化物者。 A printed wiring board, which is provided with a cured product as in item 8 of the scope of the patent application.
TW105141431A 2016-01-13 2016-12-14 Dry film and printed wiring board TWI721070B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016004825 2016-01-13
JP2016-004825 2016-01-13

Publications (2)

Publication Number Publication Date
TW201801584A TW201801584A (en) 2018-01-01
TWI721070B true TWI721070B (en) 2021-03-11

Family

ID=59311203

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105141431A TWI721070B (en) 2016-01-13 2016-12-14 Dry film and printed wiring board

Country Status (5)

Country Link
JP (1) JP6937701B2 (en)
KR (1) KR102641274B1 (en)
CN (1) CN108476589B (en)
TW (1) TWI721070B (en)
WO (1) WO2017122460A1 (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016208667A1 (en) * 2015-06-25 2016-12-29 日本化薬株式会社 Epoxy resin composition and cured product thereof
JP7102093B2 (en) * 2016-09-28 2022-07-19 味の素株式会社 Resin composition, resin sheet, circuit board and semiconductor chip package
WO2018123695A1 (en) * 2016-12-28 2018-07-05 太陽インキ製造株式会社 Curable composition, base resin, curing agent, dry film, cured product, and printed wiring board
JP6888870B2 (en) * 2017-08-30 2021-06-16 京セラ株式会社 Resin composition for encapsulating semiconductors and semiconductor devices
US11008420B2 (en) 2018-01-09 2021-05-18 Mitsubishi Gas Chemical Company, Inc. Resin composition, prepreg, metal foil-clad laminate, resin composite sheet, and printed wiring board
US20210061986A1 (en) * 2018-03-16 2021-03-04 Hitachi Chemical Company, Ltd. Epoxy resin composition and electronic component device
JP6650076B1 (en) * 2018-03-30 2020-02-19 太陽インキ製造株式会社 Alkali-developing photosensitive resin composition, dry film, cured product, and printed wiring board
WO2020040092A1 (en) * 2018-08-20 2020-02-27 Jsr株式会社 Method for forming pattern, and radiation-sensitive composition
EP3901699A4 (en) * 2018-12-19 2022-09-21 Taiyo Ink Mfg. Co., Ltd. Curable resin composition, dry film, cured article, and electronic component
CN111378252A (en) * 2018-12-29 2020-07-07 太阳油墨(苏州)有限公司 Resin filler
JP7221064B2 (en) * 2019-01-30 2023-02-13 太陽インキ製造株式会社 Dry films, cured products and electronic components
JP2020145270A (en) * 2019-03-05 2020-09-10 住友ベークライト株式会社 Electronic device
JP7316071B2 (en) * 2019-03-18 2023-07-27 太陽ホールディングス株式会社 Curable resin compositions, dry films, cured products and electronic components
JP7251323B2 (en) * 2019-05-31 2023-04-04 株式会社レゾナック Photosensitive resin composition, photosensitive resin film, multilayer printed wiring board, semiconductor package, and method for producing multilayer printed wiring board
KR102465161B1 (en) * 2019-11-06 2022-11-09 주식회사 아모그린텍 Heat radiation sheet, method for manufacturing thereof, and electronic device comprising the same
JP2021097131A (en) * 2019-12-17 2021-06-24 イビデン株式会社 Dry film resist and manufacturing method of printed wiring board
JP7070604B2 (en) * 2020-04-30 2022-05-18 味の素株式会社 Resin composition, resin sheet, circuit board and semiconductor chip package
CN117500663A (en) * 2021-03-25 2024-02-02 太阳控股株式会社 Laminated structure, cured product of resin layer in the laminated structure, electronic component, and method for forming cured product
CN115145112A (en) * 2021-03-30 2022-10-04 太阳油墨(苏州)有限公司 Photocurable/thermosetting resin composition, dry film, cured product, and electronic component
JP7545447B2 (en) 2021-09-24 2024-09-04 株式会社タムラ製作所 Photosensitive resin composition, photocured product of photosensitive resin composition, and printed wiring board coated with photosensitive resin composition
WO2023145974A1 (en) * 2022-01-31 2023-08-03 太陽ホールディングス株式会社 Film laminate, cured product, and printed wiring board comprising said cured product
WO2023238732A1 (en) * 2022-06-06 2023-12-14 太陽ホールディングス株式会社 Layered structure, cured product of resin layer in said layered structure, and electronic component having said cured product
TWI823569B (en) 2022-09-16 2023-11-21 長春人造樹脂廠股份有限公司 Resin film
WO2024204709A1 (en) * 2023-03-31 2024-10-03 太陽ホールディングス株式会社 Laminated structure, cured product, insulating layer comprising cured product, and electronic component

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011068711A (en) * 2009-09-24 2011-04-07 Ube Industries Ltd Method for producing conjugated diene polymer
JP2013053212A (en) * 2011-09-02 2013-03-21 Ube Industries Ltd Rubber composition
TW201522591A (en) * 2013-11-28 2015-06-16 Nitto Denko Corp Sealing thermosetting-resin sheet and hollow-package manufacturing method
TW201542672A (en) * 2014-03-20 2015-11-16 Hitachi Chemical Co Ltd Resin composition, resin sheet, hardened resin sheet, laminated resin sheet, hardened laminated resin sheet and production method thereof, semiconductor device and LED device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0715119A (en) 1993-06-23 1995-01-17 Toagosei Co Ltd Dry film type solder resist
JP2002162736A (en) 2000-11-22 2002-06-07 Kanegafuchi Chem Ind Co Ltd Photosensitive dry film
JP2003131366A (en) 2001-10-30 2003-05-09 Kansai Paint Co Ltd Positive active energy ray-sensitive dry film
JP2005264109A (en) * 2004-03-22 2005-09-29 Hitachi Chem Co Ltd Film-shaped adhesive and manufacturing method of semiconductor device using the same
CN101583647A (en) * 2007-01-15 2009-11-18 太阳油墨制造株式会社 Thermosetting resin composition
JP2009227992A (en) * 2008-02-29 2009-10-08 Sekisui Chem Co Ltd Film and printed circuit board
JP5150381B2 (en) * 2008-06-20 2013-02-20 太陽ホールディングス株式会社 Thermosetting resin composition
JP2015056480A (en) * 2013-09-11 2015-03-23 デクセリアルズ株式会社 Underfill material, and method for manufacturing semiconductor device using the same
JP6484061B2 (en) * 2014-02-26 2019-03-13 日東電工株式会社 Manufacturing method of electronic component package
JP2015216317A (en) * 2014-05-13 2015-12-03 日東電工株式会社 Method for manufacturing semiconductor device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011068711A (en) * 2009-09-24 2011-04-07 Ube Industries Ltd Method for producing conjugated diene polymer
JP2013053212A (en) * 2011-09-02 2013-03-21 Ube Industries Ltd Rubber composition
TW201522591A (en) * 2013-11-28 2015-06-16 Nitto Denko Corp Sealing thermosetting-resin sheet and hollow-package manufacturing method
TW201542672A (en) * 2014-03-20 2015-11-16 Hitachi Chemical Co Ltd Resin composition, resin sheet, hardened resin sheet, laminated resin sheet, hardened laminated resin sheet and production method thereof, semiconductor device and LED device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
J *

Also Published As

Publication number Publication date
KR102641274B1 (en) 2024-02-29
CN108476589A (en) 2018-08-31
CN108476589B (en) 2021-10-26
WO2017122460A1 (en) 2017-07-20
TW201801584A (en) 2018-01-01
JP6937701B2 (en) 2021-09-22
KR20180103101A (en) 2018-09-18
JPWO2017122460A1 (en) 2018-11-01

Similar Documents

Publication Publication Date Title
TWI721070B (en) Dry film and printed wiring board
TWI745366B (en) Curable resin composition, dry film, cured product, and printed wiring board
JPH01141904A (en) Photosensitive thermosetting resin composition and formation of solder resist pattern
JP2013522659A (en) Photosensitive resin composition excellent in heat resistance and mechanical properties and protective film for printed circuit board
JP6939784B2 (en) Resin composition, resin sheet, multilayer printed wiring board and semiconductor device
JP2016086000A (en) Dry film and printed wiring board
TW201839040A (en) Dry film, cured product, printed wiring board, and method for manufacturing cured product
EP3979002A1 (en) Photosensitive resin composition, photosensitive resin film, multilayer printed wiring board, semiconductor package, and method for producing multilayer printed wiring board
JP2019178307A (en) Curable resin composition, dry film, cured product and electronic component
KR102543357B1 (en) Laminated film
CN113614131A (en) Photosensitive resin composition, photosensitive resin film, printed wiring board, semiconductor package, and method for producing printed wiring board
US20230047699A1 (en) Photosensitive resin composition, photosensitive resin film, multilayered printed wiring board, semiconductor package, and method for producing multilayered printed wiring board
US20230303750A1 (en) Photosensitive resin composition, photosensitive resin film, multilayered printed wiring board, semiconductor package, and method for producing multilayered printed wiring board
JP2005037755A (en) Photosensitive resin composition, photosensitive film using same, and its manufacturing method
JP7542305B2 (en) Manufacturing method of the cured product
TWI697404B (en) Laminated film
JP7032977B2 (en) Curable resin compositions, dry films, cured products, and electronic components
JP2017179184A (en) Curable resin composition, dry film and cured product thereof
JP2021044387A (en) Laminated cured product, curable resin composition, dry film, and manufacturing method of laminated cured product
TWI846816B (en) Curable resin composition, cured product, acid-modified maleimide resin and curing agent
JP7388374B2 (en) Photosensitive resin composition
JP2005068308A (en) Photoselective thermosetting resin composition sheet
JP2019178306A (en) Curable resin composition, dry film, cured product and electronic component
JP2019125629A (en) Method for manufacturing printed wiring board
WO2023153103A1 (en) Photosensitive resin composition, photosensitive element, printed wiring board, and method for manufacturing printed wiring board