TWI712177B - 微機械壓力感測器 - Google Patents

微機械壓力感測器 Download PDF

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TWI712177B
TWI712177B TW106100832A TW106100832A TWI712177B TW I712177 B TWI712177 B TW I712177B TW 106100832 A TW106100832 A TW 106100832A TW 106100832 A TW106100832 A TW 106100832A TW I712177 B TWI712177 B TW I712177B
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substrate
evaluation circuit
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pressure sensor
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佛羅里安 葛拉邁爾
艾卡特 雪爾克斯
提摩 林德曼
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德商羅伯特博斯奇股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00261Processes for packaging MEMS devices
    • B81C1/00309Processes for packaging MEMS devices suitable for fluid transfer from the MEMS out of the package or vice versa, e.g. transfer of liquid, gas, sound
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00261Processes for packaging MEMS devices
    • B81C1/00269Bonding of solid lids or wafers to the substrate
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00261Processes for packaging MEMS devices
    • B81C1/00333Aspects relating to packaging of MEMS devices, not covered by groups B81C1/00269 - B81C1/00325
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/0032Packages or encapsulation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/0032Packages or encapsulation
    • B81B7/0061Packages or encapsulation suitable for fluid transfer from the MEMS out of the package or vice versa, e.g. transfer of liquid, gas, sound
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00222Integrating an electronic processing unit with a micromechanical structure
    • B81C1/0023Packaging together an electronic processing unit die and a micromechanical structure die
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/14Housings
    • G01L19/141Monolithic housings, e.g. molded or one-piece housings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L7/00Measuring the steady or quasi-steady pressure of a fluid or a fluent solid material by mechanical or fluid pressure-sensitive elements
    • G01L7/02Measuring the steady or quasi-steady pressure of a fluid or a fluent solid material by mechanical or fluid pressure-sensitive elements in the form of elastically-deformable gauges
    • G01L7/08Measuring the steady or quasi-steady pressure of a fluid or a fluent solid material by mechanical or fluid pressure-sensitive elements in the form of elastically-deformable gauges of the flexible-diaphragm type
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00Specific applications of microelectromechanical systems
    • B81B2201/02Sensors
    • B81B2201/0264Pressure sensors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2207/00Microstructural systems or auxiliary parts thereof
    • B81B2207/01Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS
    • B81B2207/012Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS the micromechanical device and the control or processing electronics being separate parts in the same package
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2203/00Forming microstructural systems
    • B81C2203/01Packaging MEMS
    • B81C2203/0136Growing or depositing of a covering layer
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2203/00Forming microstructural systems
    • B81C2203/01Packaging MEMS
    • B81C2203/0154Moulding a cap over the MEMS device
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2203/00Forming microstructural systems
    • B81C2203/07Integrating an electronic processing unit with a micromechanical structure
    • B81C2203/0785Transfer and j oin technology, i.e. forming the electronic processing unit and the micromechanical structure on separate substrates and joining the substrates
    • B81C2203/0792Forming interconnections between the electronic processing unit and the micromechanical structure

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Fluid Pressure (AREA)
  • Pressure Sensors (AREA)

Abstract

一種用於製造一壓力感測器的方法,其包括以下步驟:提供具有一凹入的一基板;將一微機械感測器元件附接至該基板而於該凹入中;將一評估電路附接到該基板而於該凹入旁邊;將該評估電路電性連接到該感測器元件;藉由一封裝模具來覆蓋該凹入附近的基板,使得該凹入被封閉;將該評估電路封裝在該基板和該封裝模具之間;以及移除該封裝模具。

Description

微機械壓力感測器
本發明關於一種微機械壓力感測器。特別是,本發明關於以半導體元件來製造該壓力感測器。
壓力感測器包括微機械感測器元件和評估電路,其係被配置在一個共同的外殼中。該外殼係保護個別構件免於受到環境影響,如灰塵、振動、和熱,並因此,例如該壓力感測器可以使用在馬達載具上。該微機械感測器元件包括膜,該膜因為大氣壓力造成的變形或變彎係被轉換成感測器信號,其隨後係進一步藉由評估電路加以處理。已知有多個技術可用於將該感測器元件和該評估電路容納於一外殼中。
在第一變化例中,以鑄造方式製造外殼部件而具有一凹入,並且該感測器元件和評估電路係隨後附接至該外殼部件。元件與元件之間的電性接點接著仍需要進行鈍化,這可能是複雜的和高成本的。
在第二變化例中,該評估電路和可選用的其他被動元件被配置在一基板上,並藉由模製進行囊封。在一第二放置過程中附接有該微機械感測器元件的一凹入係在鑄造期間同一時間被製造出。但是,電性接點 然後必須再次鈍化,並因此,該處理製程包括兩個循序的放置動作。另一方面,這裡有利的是,除了微機械感測器,所有的構件係被裝入在封裝(potting)化合物中,並因此可以輕易避免受到環境之影響。封裝化合物可以比後續所施加的鈍化材料(例如,矽酮凝膠)提供更好的保護。
在第三變化例中,在該壓力感測器以封裝化合物進行封裝之前,該感測器元件係與該評估電路一起放置在該基板上,並且進行接觸。為此目的,通常必須在一封裝模具和一基板之間插入一膜,以確保相關於該封裝化合物的密封性。結果是,一個放置過程是足夠的,且即使在感測器的完成狀態,該感測器元件仍然允許外部存取。在此方面的不利因素在於,該封裝模具必須與感測器元件的膜分開地密封。在此過程中,該膜可能很輕易受到損壞,或是不能保證相關於該封裝化合物的密封性。過度流動的封裝化合物(模具)可以弄髒各個構件,例如壓力感測器,並且特別是壓力感測器的膜(模具溢出)。如果該膜與封裝化合物進行接觸時,該感測器信號可能造成假的結果。
因此,本發明的目標是詳述一改良的技術,用於提供一種克服上述缺點中的至少一者之壓力感測器。本發明係藉由獨立請求項的主題來實現此目標。
一種用於製造壓力感測器的方法,其係包括以下步驟:提供具有一凹入的一基板;將一微機械感測器元件附接至該基板而於該凹入中;將一評估電路附接到該基板而於該凹入旁邊;將該評估電路電性連接 到該感測器元件;藉由封裝模具來覆蓋該凹入附近的基板,使得該凹入被封閉;將該評估電路封裝在該基板和該封裝模具之間;以及移除該封裝模具。
該方法可使得藉由僅需一個放置過程來製造該壓力感測器,其中該感測器元件與該評估電路兩者係被連接到該基板。在封裝該評估電路的期間,該感測器元件所在的凹入係藉由該封裝模具進行密封。因此,可以有效地防止封裝化合物的進入。封裝模具和基板之間如此會有一密封表面,並且因此,不需要相關於該感測器元件來製造密封,特別是該感測器元件的膜。因此,可以避免該感測器及其膜之污染或過載。
一種用於製造上述壓力感測器的封裝模具係進行配置,用以緊密地適配到該凹入附近的基板以及使該評估電路附近和上方空出預定區域。該區域接著可以用該封裝化合物進行填充,用以填充該基板上的評估電路。同一時間,可以藉由該封裝模具而有效地防止封裝化合物滲入該感測器元件所在的凹入中。
特別是藉由上述方法、並例如使用類似上述的封裝模具、而可以製造的一種壓力感測器包括:具有一凹入的一基板;一微機械感測器元件,其係附接至該基板而於該凹入中;一評估電路,其係附接至該基板而於該凹入旁邊;該評估電路的一電性連結,其係連接至該感測器元件;以及一封裝化合物,其係覆蓋該評估電路但不覆蓋該感測器元件。
該感測器元件可以藉由封裝化合物而輕易地受到保護,並且因此,該感測器元件可特別適用於汽車領域的應用。例如,該感測器元件可用於馬達載具上,例如,與內燃發動機的排氣管中結合。
100:步驟
105:基板
110:凹入
115:感測器元件
120:評估電路
125:膜
130:接合線
200:步驟
205:封裝模具
210:區域
300:步驟
305:封裝化合物
400:步驟
405:壓力感測器
本發明現在將參照隨附圖式進行詳細描述,其中:圖1至圖4係例示在製造壓力感測器期間的方法步驟。
圖1係顯示一種用於製造壓力感測器之方法的第一步驟100。該基板105包括一凹入110,其也可以被稱為一腔體。該基板105通常包括一半導體材料,例如矽。在該基板105的上表面上,一微機械感測器元件115係被附接到該凹入110,且一評估電路120係附接至該凹入110旁。該微機械感測器元件115包括一微機械結構(MEMS:微機電系統),其包括一膜125,其係相對於感測器元件115的其餘部分以可移動的方式進行安裝。該評估電路120通常是一半導體電路,其一般係設計作為一個特定應用積體電路(ASIC)。該感測器元件115和該評估電路120通常是以黏著劑接合技術而緊固於該膜125。
在該感測器元件115和該評估電路120之間的電性連結係藉由接合線130,其較佳係分別引導至在基板105的表面內或基板105的表面上的導電性結構。此操作也稱為接點連接、接合或電性連接。用於該壓力感測器的接點連接之外部端子並未在圖1中例示。
在步驟200中,該基板105、該感測器元件115和該評估電路120係藉由封裝模具205來進行覆蓋。該評估電路120附近和其上方的區域210係藉由封裝模具205而被空出。然而,該封裝模具205係儘可能在該 基板105和該區域的外部之間提供緊密性。此外,該封裝模具205以此方式形成的,即其係緊密地適配至該凹入110附近的基板105。在該基板105和該封裝模具205之間的密封表面可具有一預定的最小寬度,其係包圍該凹入110。並沒有設想到在該封裝模具205和該基板105之間提供一膜或其他的暫時性或永久性密封件。反倒是說,,封裝模具205直接適配到在基板105的上述地點處是較佳的。
在第三步驟300中,該封裝模具205和該基板105之間的區域210係藉由封裝化合物305進行填充。用於導引封裝化合物305之對應通道可以形成於封裝模具205中。在溫度升高以及可選用地壓力升高的情況下,該封裝化合物305通常係可流動的,用以填充該區域210。該封裝化合物305通常係沿著基板105的表面在水平方向上進行流動,但由於該封裝模具205與該基板105形成一個不可通過的屏障,所以該封裝化合物305無法滲入該凹入110的區域。
圖4係顯示第四步驟400,其中,在封裝化合物305的冷卻、交聯、或定型之後,該封裝模具205係在區域210中再次被移除。結果是,一壓力感測器405係被製造出,該壓力感測器405的評估電路120係藉由該封裝化合物305進行覆蓋,並因此被鈍化,而其微機械感測器元件115繼續允許自由存取。該壓力感測器405可以特別用於確定壓力,或是氣體與氣體之間的壓力差,例如用於馬達載具上。
100‧‧‧步驟
105‧‧‧基板
110‧‧‧凹入
115‧‧‧感測器元件
120‧‧‧評估電路
125‧‧‧膜
130‧‧‧接合線

Claims (1)

  1. 一種用於製造一壓力感測器(405)的方法,其中該方法包括以下步驟:提供(100)具有一凹入(110)的一基板(105);將一微機械感測器元件(115)附接(100)至該基板(105)而於該凹入(110)中;將一評估電路(120)附接(100)到基板(105)而於該凹入(110)旁邊;將該評估電路(120)電性連接(100)到該微機械感測器元件(115);藉由一封裝模具(205)來覆蓋(200)在該凹入(110)附近的基板(105),使得該凹入(110)被封閉;將該評估電路(120)封裝(300)在該基板(105)和該封裝模具(205)之間;以及移除(400)該封裝模具(205)。
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JPH10104101A (ja) * 1996-10-02 1998-04-24 Mitsubishi Electric Corp 半導体圧力センサ
JP2001326238A (ja) * 2000-05-17 2001-11-22 Toshiba Corp 半導体装置、半導体装置の製造方法、樹脂封止金型及び半導体製造システム
DE102008021091A1 (de) * 2008-04-28 2009-10-29 Epcos Ag Drucksensor
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CN1752721A (zh) * 2004-09-24 2006-03-29 株式会社电装 热动式流量传感器及其制造方法
US20080310663A1 (en) * 2007-06-14 2008-12-18 Yamaha Corporation Microphone package adapted to semiconductor device and manufacturing method therefor
TW201401386A (zh) * 2012-06-21 2014-01-01 Gld Technology Co Ltd 半導體之封裝方法

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