TWI700579B - Storage device testing system and storage device testing method - Google Patents

Abstract

A storage device testing system and a storage device testing method are provided. The storage device testing system includes: an electronic device including a processor and an internal storage device coupled to the processor; and an external storage device coupled to the processor of the electronic device. The processor receives a test script and executes the test script to perform a test operation to the internal storage device. The processor transmits a test log corresponding to the test operation to the external storage device.

Description

Storage device testing system and storage device testing method

The present disclosure relates to a storage device testing system and a storage device testing method, and more particularly to a storage device testing system and a storage device testing method for automatically testing storage devices.

Existing mobile phone testing systems usually connect test equipment to the mobile phone for testing, which causes inconvenience in testing. When the memory of the mobile phone is damaged or the mobile phone system crashes during the test, it may cause the loss of important test information. Therefore, how to test the internal storage device of the mobile phone and maintain complete test information when an error occurs is a goal that those skilled in the art should strive for.

The present disclosure provides a storage device testing system and a storage device testing method, which can automatically test the internal storage device of a mobile phone and retain complete test information when errors occur.

The present disclosure proposes a storage device testing system including: an electronic device including a processor and an internal storage device coupled to the processor; and an external storage device, which is coupled to the processor of the electronic device. The processor receives the test script and executes the test script to perform a test operation on the internal storage device. The processor transmits the test log file corresponding to the test operation to the external storage device.

The present disclosure provides a storage device testing method, which is suitable for electronic devices and external storage devices. The electronic device includes a processor and an internal storage device coupled to the processor. The external storage device is coupled to the processor of the electronic device. The storage device testing method includes: receiving a test script by a processor and executing the test script to perform a test operation on the internal storage device; and transmitting a test log file corresponding to the test operation to the external storage device by the processor.

Based on the above, the storage device testing system and storage device testing method of the present disclosure can test the internal storage device of the electronic device by executing the test script through the processor of the electronic device, and transmit the test log file to the external storage device.

In order to make the above-mentioned features and advantages of the present disclosure more obvious and understandable, the following specific embodiments are described in detail in conjunction with the accompanying drawings.

FIG. 1 is a block diagram of a storage device testing system according to an embodiment of the disclosure.

Please refer to FIG. 1, a storage device testing system 100 of an embodiment of the present disclosure includes an electronic device 110 and an external storage device 120. The electronic device 110 includes a processor 111 and an internal storage device 112 coupled to the processor 111. The external storage device 120 is coupled to the processor 111 of the electronic device 110. The electronic device 110 is, for example, a smart phone, a tablet computer, a smart watch, or similar devices. The electronic device 110 can execute an Android platform, an iOS platform, or other types of system platforms. The processor 111 is, for example, a central processing unit (Central Processing Unit, CPU), a microprocessor control unit (MCU) or other similar components. The internal storage device 112 is, for example, a NAND flash or other similar components. The external storage device 120 is, for example, a Secure Digital card (SD card) or other similar components.

In an embodiment, the processor 111 may receive a test script and execute the test script to perform a test operation on the internal storage device 112. The processor 111 can also transmit the test log file corresponding to the test operation to the external storage device 120 in real time to prevent the internal storage device 112 from being damaged or the electronic device 110 from losing important test information when the electronic device 110 crashes.

FIG. 2 is a flowchart of a storage device testing method according to an embodiment of the disclosure.

Although it is disclosed in this embodiment that steps S201 to S208 of FIG. 2 are executed in sequence, the disclosure is not limited to this. In another embodiment, step S201 to step S208 can be executed in any sequence, and a single step can be executed one to multiple times or not.

1 and 2, in step S201, an application package installation test is performed. In one embodiment, the application package is, for example, an Android Application Package (APK). Specifically, the internal storage device 112 can receive multiple application packages. The processor 111 executes the test script to perform multiple installation and uninstallation operations on the application package and determines whether each installation and uninstallation operation is successful. The sizes of multiple application packages can be different to test whether the internal storage device 112 generates a firmware bug when installing and uninstalling application packages of different sizes. In another embodiment, the size of multiple application packages may also be the same. After the application package is installed each time, the processor 111 may search for the existence of the application package application file in the system. If the application package application file is found, a search success message will be generated, otherwise, a search success message will be generated. The above-mentioned test information can be used as a test log file and sent to the external storage device 120 in real time.

In step S202, a read and write test is performed. Specifically, the processor 111 executes the test script to perform multiple sequential and random reads and writes on the internal storage device 112 and determines whether the internal storage device 112 generates an error. The read-write test menu can include block size (e.g., 1KB to 512MB), sequential buffer size (e.g., 1KB to 21768KB), random buffer size (e.g., 1KB to 4KB), write data type (e.g., 10101010, 01010101, etc.), test cycle, cycle mode and time mode, etc., to provide testers to choose and match, and increase the complexity of the test. In this way, it can be tested whether the internal storage device 112 generates a firmware error in different read and write modes.

In step S203, a read and write performance test is performed. Specifically, the processor 111 can execute a test script to perform multiple sequential and random reads and writes on the internal storage device 112, determine the read and write performance of each sequential and random read and write, and determine the number of sequential and random reads and writes. The write performance is less than the threshold value, and the read and write performance is transmitted to the external storage device 120 after each sequential and random read and write. For example, the processor 111 can test the sequential read and write performance, random read and write performance, and insert/update/delete performance of the database management system (for example, SQLite) of the internal storage device 112 through a benchmark test application.

In step S204, a video burn-in test is performed. Specifically, the processor 111 executes the test script to execute the video (for example, video player video, network video, game video, etc.) but does not transmit the video data of the video to the display of the electronic device 110 (not shown in the figure) ), and determine whether the electronic device 110 has an abnormal state (for example, the system platform generates a fixed screen, crashes, etc.). It is worth noting that when the processor 111 executes the automated video burn-in test script, the test item is first opened and information such as the playback time is recorded, and the test information is periodically written to the external storage device 120.

In step S205, a standby wake-up test is performed. Specifically, the processor 111 executes the test script to perform multiple sleep and wake-up operations, and determines whether the internal storage device 112 generates an error. In this way, it can be tested whether the internal storage device 112 generates a firmware error (for example, a state that cannot be awakened after sleep) during repeated sleep and wake-up operations.

In step S206, a restart test is performed. Specifically, the processor 111 executes the test script to perform multiple soft boot operations, and determines whether the electronic device 110 has an abnormal state. In this way, it can be tested whether the internal storage device 112 causes the system platform to crash or the card display logo (logo) occurs during the soft boot test.

In step S207, a reading pressure test is performed. Specifically, the processor 111 executes the test script to perform multiple reading operations, and determines whether the electronic device 110 has an abnormal state. In this way, it can be tested whether the internal storage device 112 causes the platform to crash or read data errors when reading a large amount of data.

In step S208, a power-down test is performed. Specifically, the processor 111 executes the test script to perform multiple reading operations and performs a soft boot operation during the reading operation, and determines whether the data corresponding to the reading operation is correct and complete after the soft boot operation.

Through the above tests, it can be ensured that the software and firmware errors will not recur and that the product meets the quality requirements to build the confidence of the development team and customers. In addition, the above-mentioned tests can also achieve the effect of speeding up debugging and saving a lot of labor costs, and can identify potential product problems and performance problems. Due to the consistency and repeatability of the above-mentioned automated tests, the test results and test content are guaranteed. Testers can arbitrarily combine and adjust test conditions to increase test pressure, test complexity or extend test time, so as to improve the performance, quality and stability of system platform compatibility testing, and reduce the chance of product repair.

In summary, the storage device testing system and storage device testing method of the present disclosure can test the internal storage device of the electronic device by executing the test script through the processor of the electronic device, and transmit the test log file to the external storage device. In this way, you can avoid losing important test information when the test generates an error.

Although this disclosure has been disclosed in the above embodiments, it is not intended to limit the disclosure. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of this disclosure. Therefore, The scope of protection of this disclosure shall be subject to those defined by the attached patent scope.

100: Storage device test system

110: electronic device

111: processor

112: Internal storage device

120: External storage device

S201~S208: Steps of storage device test method

FIG. 1 is a block diagram of a storage device testing system according to an embodiment of the disclosure. FIG. 2 is a flowchart of a storage device testing method according to an embodiment of the disclosure.

100: Storage device test system

110: electronic device

111: processor

112: Internal storage device

120: External storage device

Claims (16)

A storage device testing system includes: an electronic device including a processor and an internal storage device coupled to the processor; and an external storage device coupled to the processor of the electronic device, wherein the processor Receive a test script and execute the test script to perform a test operation on the internal storage device, the processor transmits a test log file corresponding to the test operation to the external storage device, wherein the processor executes the test script to The internal storage device performs multiple sequential and random reads and writes and judges the read and write performance of each sequential and random read and write, determines how many times the read and write performance of the sequential and random read and writes is less than the threshold, and After the sequential and random read and write, the read and write performance is transmitted to the external storage device. For example, the storage device testing system described in the first item of the scope of patent application, wherein the internal storage device receives a plurality of application program packages, and the processor executes the test script to perform multiple installation and uninstallation operations on the application program packages and Determine whether each installation and uninstallation operation is successful, in which the size of the application packages is different. For example, in the storage device test system described in claim 1, wherein the processor executes the test script to perform multiple sequential and random reads and writes on the internal storage device and determine whether the internal storage device generates an error. The storage device test system described in the first item of the scope of patent application, wherein the processor executes the test script to execute a video but does not transmit a video data of the video to a display, and determines whether the electronic device generates an abnormality status. For example, in the storage device test system described in claim 1, wherein the processor executes the test script to perform multiple sleep and wake-up operations, and determines whether the internal storage device generates an error. For the storage device test system described in item 1 of the scope of patent application, the processor executes the test script to perform multiple soft boot operations and determines whether the electronic device has an abnormal state. For the storage device test system described in item 1 of the scope of patent application, the processor executes the test script to perform multiple reading operations and determines whether the electronic device has an abnormal state. For the storage device test system described in claim 1, wherein the processor executes the test script to perform multiple read operations and performs a soft boot operation during the read operations, and performs a soft boot operation during the soft boot operation Then judge whether the data corresponding to the reading operation is correct. A storage device testing method is suitable for an electronic device and an external storage device. The electronic device includes a processor and an internal storage device coupled to the processor. The external storage device is coupled to the processing of the electronic device The storage device testing method includes: receiving a test script by the processor and executing the test script to perform a test operation on the internal storage device; and The processor sends a test log file corresponding to the test operation to the external storage device, wherein the processor executes the test script to perform multiple sequential and random reads and writes on the internal storage device and determine the sequential order each time A read and write performance of random read and write, determine how many times the read and write performance of the sequential and random read and write is less than the threshold value, and send the read and write performance to the external storage after each sequential and random read and write Device. For example, in the storage device testing method described in claim 9, wherein the internal storage device receives a plurality of application program packages, the processor executes the test script to perform multiple installation and uninstallation operations on the application program packages and Determine whether each installation and uninstallation operation is successful, in which the size of the application packages is different. For example, in the storage device testing method described in item 9 of the scope of patent application, the processor executes the test script to perform multiple sequential and random reads and writes on the internal storage device and determine whether the internal storage device generates an error. For the storage device testing method described in claim 9, wherein the processor executes the test script to execute a video but does not transmit a video data of the video to a display, and determines whether the electronic device generates an abnormality status. For example, in the storage device testing method described in claim 9, the processor executes the test script to perform multiple sleep and wake-up operations, and determines whether the internal storage device generates an error. According to the storage device testing method described in item 9 of the scope of patent application, the processor executes the test script to perform multiple soft boot operations and determines whether the electronic device has an abnormal state. According to the storage device test method described in item 9 of the scope of patent application, the processor executes the test script to perform multiple reading operations and determines whether the electronic device has an abnormal state. The storage device testing method described in item 9 of the scope of patent application, wherein the processor executes the test script to perform multiple read operations and performs a soft boot operation during the read operations, and performs a soft boot operation during the soft boot operation Then judge whether the data corresponding to the reading operation is correct.

Images