CN111698362A - Storage device test system and storage device test method - Google Patents
Storage device test system and storage device test method Download PDFInfo
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- CN111698362A CN111698362A CN201910378754.3A CN201910378754A CN111698362A CN 111698362 A CN111698362 A CN 111698362A CN 201910378754 A CN201910378754 A CN 201910378754A CN 111698362 A CN111698362 A CN 111698362A
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- 238000012360 testing method Methods 0.000 title claims abstract description 151
- 238000010998 test method Methods 0.000 title description 2
- 230000002159 abnormal effect Effects 0.000 claims description 9
- 238000009434 installation Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 4
- 230000007958 sleep Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 238000012217 deletion Methods 0.000 description 1
- 230000037430 deletion Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006266 hibernation Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 238000011056 performance test Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
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Abstract
The present disclosure provides a storage device testing system and a storage device testing method. The storage device test system includes: an electronic device comprising a processor and an internal storage device coupled to the processor; and an external storage device coupled to a processor of the electronic device. The processor receives the test script and executes the test script to perform a test operation on the internal memory device. The processor transmits a test record file corresponding to the test operation to the external storage device.
Description
Technical Field
The present disclosure relates to a storage device testing system and a storage device testing method, and more particularly, to a storage device testing system and a storage device testing method for automatically testing a storage device.
Background
Existing handset test systems typically attach test equipment to the handset for testing, which causes inconvenience in testing. When the memory of the mobile phone is damaged or the system of the mobile phone is halted in the test process, the loss of important test information may be caused. It is therefore an aim of the skilled person how to test the internal memory device of the mobile phone and to keep the complete test information when an error occurs.
Disclosure of Invention
The present disclosure provides a storage device testing system and a storage device testing method, which perform an automated test on an internal storage device of a mobile phone and maintain complete test information when an error occurs.
The present disclosure provides a storage device test system including: an electronic device comprising a processor and an internal storage device coupled to the processor; and an external storage device coupled to a processor of the electronic device. The processor receives the test script and executes the test script to perform a test operation on the internal memory device. The processor transmits a test record file corresponding to the test operation to the external storage device.
The present disclosure provides a storage device testing method, which is suitable for an electronic device and an external storage device. The electronic device includes a processor and an internal storage device coupled to the processor. The external storage device is coupled to a processor of the electronic device. The storage device testing method comprises the following steps: receiving, by a processor, a test script and executing the test script to perform a test operation on an internal storage device; and transmitting the test record file corresponding to the test operation to an external storage device through the processor.
Based on the above, the storage device testing system and the storage device testing method of the present disclosure can test the internal storage device of the electronic device by executing the test script by the processor of the electronic device, and transmit the test record file to the external storage device.
In order to make the aforementioned and other features and advantages of the disclosure more comprehensible, embodiments accompanied with figures are described in detail below.
Drawings
FIG. 1 is a block diagram of a storage device testing system according to an embodiment of the present disclosure.
FIG. 2 is a flow chart of a method for testing a memory device according to an embodiment of the present disclosure.
[ notation ] to show
100: storage device test system
110: electronic device
111: processor with a memory having a plurality of memory cells
112: internal storage device
120: external storage device
S201 to S208: steps of storage device testing method
Detailed Description
FIG. 1 is a block diagram of a storage device testing system according to an embodiment of the present disclosure.
Referring to fig. 1, a storage device testing system 100 according to an embodiment of the disclosure includes an electronic device 110 and an external storage device 120. The electronic device 110 includes a processor 111 and an internal storage device 112 coupled to the processor 111. The external storage device 120 is coupled to the processor 111 of the electronic device 110. The electronic device 110 is, for example, a smart phone, a tablet computer, a smart watch, or the like. The electronic device 110 may execute an android (android) platform, an iOS platform, or other kinds of system platforms. The processor 111 is, for example, a Central Processing Unit (CPU), a Microprocessor Control Unit (MCU) or the like. The internal storage device 112 is, for example, a NAND flash memory (NAND flash) or other similar device. The external storage device 120 is, for example, a secure digital card (SD card) or the like.
In an embodiment, the processor 111 may receive a test script and execute the test script to perform a test operation on the internal storage device 112. The processor 111 may also instantly transmit a test log file corresponding to the test operation to the external storage device 120 to prevent important test information from being lost when the internal storage device 112 is damaged or the electronic device 110 crashes.
FIG. 2 is a flow chart of a method for testing a memory device according to an embodiment of the present disclosure.
Although it is disclosed in the present embodiment that the steps S201 to S208 of fig. 2 are sequentially performed, the present disclosure is not limited thereto. In another embodiment, steps S201 to S208 may be performed in any order and a single step may be performed one to multiple times or not.
Referring to fig. 1 and 2, in step S201, an application suite installation test is performed. In one embodiment, the Application Package is, for example, an Android Application Package (APK). Specifically, the internal storage 112 may receive a plurality of application suites. The processor 111 executes the test script to perform a plurality of installation and uninstallation operations on the application suite and determines whether each installation and uninstallation operation is successful. The multiple application suites may be sized differently to test whether the internal storage device 112 generates a firmware bug when the different sized application suites are installed and uninstalled. In another embodiment, the size of the plurality of application suites may also be the same. After each installation of the suite of applications, the processor 111 may search the system for the existence of suite of applications files. If the application files of the application program suite are searched, searching success information is generated, otherwise, searching failure information is generated. The test information can be used as a test record file and transmitted to the external storage device 120 instantly.
In step S202, a read/write test is performed. Specifically, the processor 111 executes the test script to perform multiple sequential and random reads and writes to the internal storage device 112 and determine whether the internal storage device 112 generates an error. The read/write test menu may include a block size (e.g., 1KB to 512MB), a sequential buffer size (e.g., 1KB to 21768KB), a random buffer size (e.g., 1KB to 4KB), a write data type (e.g., 10101010, 01010101, etc.), a test cycle, a cycle mode, a time mode, etc. to provide the tester with a choice and increase the test complexity. In this way, it is possible to test whether the internal memory device 112 generates firmware errors in different read/write modes.
In step S203, a read/write performance test is performed. Specifically, the processor 111 may execute the test script to perform multiple sequential and random reads and writes on the internal storage device 112, determine the read/write performance of each sequential and random read and write, determine that the read/write performance of the next sequential and random read and write is less than the threshold, and transmit the read/write performance to the external storage device 120 after each sequential and random read and write. For example, the processor 111 may test the sequential read/write performance, the random read/write performance, and the insertion/update/deletion performance of the database management system (e.g., SQLite) of the internal storage device 112 through a benchmark (benchmark) test application.
In step S204, a video burn-in test is performed. Specifically, the processor 111 executes the test script to execute the video (e.g., video player movie, network movie, game movie, etc.) without transmitting the video data of the video to a display (not shown in the figure) of the electronic device 110, and determines whether the electronic device 110 generates an abnormal state (e.g., a system platform generates a screen-fixing phenomenon, a crash phenomenon, etc.). It should be noted that when the processor 111 executes the automated video aging test script, the test items are first opened and the playing time and other information are recorded, and the test information is periodically written into the external storage device 120.
In step S205, a standby wake-up test is performed. Specifically, the processor 111 executes the test script to perform a plurality of sleep and wake-up operations and determines whether the internal storage device 112 generates an error. In this way, it is possible to test whether the internal storage device 112 generates a firmware error (e.g., a state that cannot be woken up after hibernation) when the sleep and wake-up operations are repeatedly tested.
In step S206, a reboot test is performed. Specifically, the processor 111 executes the test script to perform a plurality of soft-boot operations and determines whether the electronic device 110 generates an abnormal state. In this way, it is possible to test whether the internal storage device 112 causes a system platform crash or a card display identifier (logo) state during the soft-boot test.
In step S207, a reading pressure test is performed. Specifically, the processor 111 executes the test script to perform a plurality of reading operations and determines whether the electronic device 110 generates an abnormal state. Therefore, it is possible to test whether the internal memory device 112 is halted during mass data reading or the data reading is incorrect.
In step S208, a power down test is performed. Specifically, the processor 111 executes the test script to perform a plurality of reading operations and perform a soft-boot operation during the reading operation, and determines whether data corresponding to the reading operation is correct and complete after the soft-boot operation.
Through the test, the software and firmware errors can be prevented from repeatedly occurring, and the product can meet the quality requirement so as to establish the confidence of a development team and a client. In addition, the test can also achieve the effect of accelerating debugging, save a large amount of labor cost and find out the potential problem and the efficiency problem of the product. Because the automatic test has consistency and repeatability, the test result and the test content are guaranteed. The tester can arbitrarily combine and adjust the test conditions to increase the test pressure, the test complexity or prolong the test time, so as to improve the efficiency, the quality and the stability of the compatibility test of the system platform and reduce the repair probability of the product.
In summary, the storage device testing system and the storage device testing method of the present disclosure can test the internal storage device of the electronic device by executing the test script through the processor of the electronic device, and transmit the test record file to the external storage device. Therefore, important test information can be prevented from being lost when a test generates errors.
Although the present disclosure has been described with reference to exemplary embodiments, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the disclosure, and therefore, the scope of the disclosure should be determined by that of the appended claims.
Claims (18)
1. A storage device testing system, comprising:
an electronic device comprising a processor and an internal storage device coupled to the processor; and
an external storage device coupled to the processor of the electronic device, wherein,
the processor receives a test script and executes the test script to perform a test operation on the internal storage device,
and the processor transmits a test record file corresponding to the test operation to the external storage device.
2. The storage device testing system of claim 1, wherein the internal storage device receives a plurality of application suites, the processor executing the test script to perform a plurality of install and uninstall operations on the plurality of application suites and to determine whether each of the install and uninstall operations was successful, wherein the plurality of application suites are of different sizes.
3. The storage device test system of claim 1, wherein the processor executes the test script to perform a plurality of sequential and random reads and writes to the internal storage device and to determine whether the internal storage device generates an error.
4. The storage device testing system of claim 1, wherein the processor executes the test script to perform a plurality of sequential and random reads and writes to the internal storage device and determine a read and write performance for each of the sequential and random reads and writes, determine that the read and write performance for a second number of the sequential and random reads and writes is less than a threshold, and transmit the read and write performance to the external storage device after each of the sequential and random reads and writes.
5. The storage device testing system of claim 1, wherein the processor executes the test script to execute a video without transferring video data of the video to a display and determines whether the electronic device generates an abnormal state.
6. The storage device test system of claim 1, wherein the processor executes the test script to perform a plurality of sleep and wake operations and determines whether the internal storage device generates an error.
7. The storage device testing system of claim 1, wherein the processor executes the test script to perform a plurality of soft-on operations and determines whether the electronic device generates an abnormal state.
8. The storage device testing system of claim 1, wherein the processor executes the test script to perform a plurality of read operations and determines whether the electronic device generates an abnormal state.
9. The storage device testing system of claim 1, wherein the processor executes the test script to perform a plurality of read operations and to perform a soft-boot operation during the plurality of read operations, and to determine whether data corresponding to the plurality of read operations is correct after the soft-boot operation.
10. A storage device testing method for an electronic device and an external storage device, wherein the electronic device includes a processor and an internal storage device coupled to the processor, and the external storage device is coupled to the processor of the electronic device, the storage device testing method comprising:
receiving, by the processor, a test script and executing the test script to perform a test operation on the internal storage device; and
and transmitting a test record file corresponding to the test operation to the external storage device through the processor.
11. The storage device testing method of claim 10, wherein the internal storage device receives a plurality of application suites, the processor executes the test script to perform a plurality of installation and uninstallation operations on the plurality of application suites and to determine whether each of the installation and uninstallation operations is successful, wherein the plurality of application suites are different in size.
12. The storage device testing method of claim 10, wherein the processor executes the test script to perform a plurality of sequential and random reads and writes to the internal storage device and to determine whether the internal storage device generates an error.
13. The method for testing a storage device of claim 10, wherein the processor executes the test script to perform a plurality of sequential and random reads and writes to the internal storage device and determine a read and write performance for each of the sequential and random reads and writes, determine that the read and write performance for the second sequential and random reads and writes is less than a threshold, and transmit the read and write performance to the external storage device after each of the sequential and random reads and writes.
14. The storage device testing method of claim 10, wherein the processor executes the test script to execute a video without transferring video data of the video to a display and determines whether the electronic device generates an abnormal state.
15. The storage device testing method of claim 10, wherein the processor executes the test script to perform a plurality of sleep and wake operations and determines whether the internal storage device generates an error.
16. The storage device testing method of claim 10, wherein the processor executes the test script to perform a plurality of soft-on operations and determines whether the electronic device generates an abnormal state.
17. The storage device testing method of claim 10, wherein the processor executes the test script to perform a plurality of read operations and determines whether the electronic device generates an abnormal state.
18. The storage device testing method of claim 10, wherein the processor executes the test script to perform a plurality of read operations and a soft-boot operation during the plurality of read operations, and determines whether data corresponding to the plurality of read operations is correct after the soft-boot operation.
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| Application Number | Priority Date | Filing Date | Title |
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| TW108108761A TWI700579B (en) | 2019-03-15 | 2019-03-15 | Storage device testing system and storage device testing method |
| TW108108761 | 2019-03-15 |
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| CN104301481A (en) * | 2014-09-24 | 2015-01-21 | 福建联迪商用设备有限公司 | Method and system for generating mobile phone compatibility testing results |
| CN105718332A (en) * | 2013-05-23 | 2016-06-29 | 青岛海信移动通信技术股份有限公司 | Intelligent terminal and data backup method thereof |
| CN106155824A (en) * | 2016-06-27 | 2016-11-23 | 贵州万臻时代通讯技术有限公司 | A kind of mobile phone hardware accelerated ageing test method and system |
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| US8291387B2 (en) * | 2005-11-22 | 2012-10-16 | International Business Machines Corporation | Method and system for testing a software application interfacing with multiple external software applications in a simulated test environment |
| TWI476587B (en) * | 2011-12-01 | 2015-03-11 | Mstar Semiconductor Inc | Testing method and testing apparatus for testing function of electronic apparatus |
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2019
- 2019-03-15 TW TW108108761A patent/TWI700579B/en active
- 2019-05-08 CN CN201910378754.3A patent/CN111698362A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103294573A (en) * | 2013-05-23 | 2013-09-11 | 青岛海信移动通信技术股份有限公司 | Intelligent terminal and data backup method thereof |
| CN105718332A (en) * | 2013-05-23 | 2016-06-29 | 青岛海信移动通信技术股份有限公司 | Intelligent terminal and data backup method thereof |
| CN104301481A (en) * | 2014-09-24 | 2015-01-21 | 福建联迪商用设备有限公司 | Method and system for generating mobile phone compatibility testing results |
| CN106155824A (en) * | 2016-06-27 | 2016-11-23 | 贵州万臻时代通讯技术有限公司 | A kind of mobile phone hardware accelerated ageing test method and system |
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| TW202036290A (en) | 2020-10-01 |
| TWI700579B (en) | 2020-08-01 |
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