TW201933091A - A system and a method for testing a data storage device - Google Patents

Abstract

A system for testing a data storage device includes the data storage device, an electronic device and a computer. The electronic device includes a host device coupled to the data storage device and communicating with the data storage device via an interface logic. The computer is coupled to the electronic device and configured to issues a plurality of commands to test the data storage device in a test procedure. When the electronic device has been successfully started up, the computer issues a first command to the electronic device, to trigger the electronic device to enter a hibernate mode. After waiting for a first predetermined period of time, the computer issues a second command to the electronic device, so as to wake up the electronic device.

Description

Test system and test method for data storage device

The invention relates to a test method for various data storage devices, which can quickly and effectively verify the data storage devices.

With the rapid development of data storage device technology in recent years, many data storage devices, such as SD / MMC, CF, MS, and XD-compliant memory cards, solid-state hard drives, and embedded multimedia memory cards (embedded Multi Media Card (abbreviated as eMMC) and Universal Flash Storage (Universal Flash Storage (abbreviated as UFS)) have been widely used in many applications. Since the data storage device can be widely used on various host devices, how to quickly and effectively verify the stability of the data storage device and the compatibility on various platforms is an important issue for data storage device manufacturers. .

In order to ensure the verification performance of the data storage device, the present invention proposes a new test method that can quickly and effectively verify the operation stability of the data storage device applied to various different host devices, and the compatibility of the data storage device with various platforms. .

The invention discloses a test system for a data storage device, which includes a data storage device, an electronic device, and a computer device. Electronic device contains A host device is coupled to the data storage device and communicates with the data storage device by using an interface logic. The computer device is coupled to the electronic device, and is used for sending a plurality of instructions to test the data storage device in a test procedure. After the electronic device is successfully started, the computer device sends a first command to the electronic device to drive the electronic device into a sleep state, and after waiting for a first predetermined time, the computer device sends a second command to the electronic device To wake up the electronic device.

The invention discloses a test method for a data storage device for testing a data storage device, wherein the data storage device is coupled to an electronic device, the electronic device is coupled to a computer device, and the computer device sends a plurality of instructions for testing in a test procedure. Data storage device and testing method of data storage device include: after the electronic device is successfully started, the computer device sends a first instruction to the electronic device to drive the electronic device into a sleep state; and waiting for a first predetermined time Then, the computer device sends a second instruction to the electronic device to wake the electronic device.

100, 210‧‧‧ data storage device

110‧‧‧Memory Controller

112‧‧‧Microprocessor

112M‧‧‧Read Only Memory

112C‧‧‧Code

114‧‧‧Control logic

116‧‧‧Buffer memory

118‧‧‧ Interface Logic

120‧‧‧Memory device

130‧‧‧Host device

132‧‧‧ Encoder

134‧‧‧ decoder

200‧‧‧test system

220‧‧‧Computer device

230‧‧‧electronic device

FIG. 1 is a schematic diagram illustrating a memory device according to an embodiment of the present invention.

FIG. 2 is a schematic diagram showing a test system of a data storage device according to an embodiment of the present invention.

FIG. 3A and FIG. 3B are flowcharts showing a test method of the data storage device according to the first embodiment of the present invention.

4A and 4B are flowcharts showing a test method of a data storage device according to a second embodiment of the present invention.

In order to make the objects, features, and advantages of the present invention more comprehensible, specific embodiments of the present invention are specifically listed below, and described in detail with the accompanying drawings. The purpose is to explain the spirit of the present invention and not to limit the protection scope of the present invention. It should be understood that the following embodiments can be implemented by software, hardware, firmware, or any combination thereof.

FIG. 1 is a schematic diagram showing a data storage device 100 according to an embodiment of the present invention. The data storage device 100 includes a memory device 120, for example, a flash memory module and a memory controller 110. The memory controller 110 is used to access the memory device 120. According to an embodiment of the present invention, the memory controller 110 includes a microprocessor 112, a read only memory (ROM) 112M, a control logic 114, a buffer memory 116, and an interface logic 118. The read-only memory 112M is used to store a code 112C, and the microprocessor 112 is used to execute the code 112C to control access to the memory device 120 (Aecess). The control logic 114 includes an encoder 132 and a decoder 134, where the encoder 132 is used to encode data written in the memory device 120 to generate a corresponding check code (or error correction code (Error Correction Code (ECC), and the decoder 134 is used to decode data read from the memory device 120.

Under typical conditions, the memory device 120 includes a plurality of flash memory chips, and each flash memory chip includes a plurality of blocks, and the controller (for example, executes a program through the microprocessor 112) The memory controller 110 of the code 112C) erases data from the memory device 120 in blocks. In addition, a block can record a specific number of data pages (Page), which The operation of writing data to the memory device 120 by the controller (for example, the memory controller 110 that executes the code 112C through the microprocessor 112) is to write data in units of data pages.

In practice, the memory controller 110 that executes the code 112C through the microprocessor 112 can use its internal components to perform many control operations, such as: using the control logic 114 to control the access operation of the memory device 120 (especially Is to access at least one block or at least one data page), use buffer memory 116 to perform required buffer processing, and use interface logic 118 to communicate with a host device 130. The buffer memory 116 is implemented by a random access memory (Random Access Memory, RAM). For example, the buffer memory 116 may be a static random access memory (Static RAM, SRAM), but the present invention is not limited thereto.

In one embodiment, the data storage device 100 may be a portable memory device (for example, a memory card that complies with SD / MMC, CF, MS, XD standards), and the host device 130 is a device that can be connected to the data storage device. Electronic devices, such as mobile phones, laptops, desktops, etc. In another embodiment, the data storage device 100 may be a solid state drive or an embedded device that conforms to Universal Flash Storage (UFS) or Embedded Multi Media Card (EMMC) specifications. The storage device is disposed in an electronic device, for example, a mobile phone, a notebook computer, or a desktop computer. In this case, the host device 130 may be a processor of the electronic device.

The host device 130 may issue a command, such as a read command or a write command, to the data storage device 100 to access the data stored in the memory device 120. Data, or further control and manage the data storage device 100.

FIG. 2 is a schematic diagram showing a test system of a data storage device according to an embodiment of the present invention. The test system 200 of the data storage device may include a computer device 220, an electronic device 230, and a data storage device 210. The computer device 220 is coupled to the electronic device 230 and is used to send a plurality of instructions to test the operation stability of the data storage device 210 in a test procedure. The electronic device 230 may be a mobile phone, a notebook computer, a desktop computer, etc. In this embodiment, the data storage device 210 may be an embedded storage device that conforms to the universal flash memory storage (UFS) or embedded multimedia memory card (EMMC) specifications, and is disposed in the electronic device 230.

For example, when the data storage device 210 is an embedded storage device that complies with the universal flash memory storage (UFS) specification, the host device (not shown in FIG. 2) and the data storage device 210 provided in the electronic device 230 can be accessed through The interface logic conforming to the UFS specification is interconnected, and communicates with the data storage device 210 through the interface logic. As another example, when the data storage device 210 is an embedded storage device complying with the Embedded Multimedia Memory Card (EMMC) specification, the host device and the data storage device 210 provided in the electronic device 230 may be connected to each other through an interface logic that complies with the EMMC specification. And communicate with the data storage device 210 through this interface logic.

FIG. 3A and FIG. 3B are flowcharts showing a test method of the data storage device according to the first embodiment of the present invention. First, the computer device 220 may first confirm that the electronic device 230 has been successfully activated (step S302). According to an embodiment of the present invention, a tester can activate the electronic device 230 by pressing a power button of the electronic device 230. According to another embodiment of the present invention, the computer device 220 may send a power-on command or a power-on command to the electronic device 230 for The electronic device 230 is forcibly started or restarted.

In the embodiment of the present invention, the computer device 220 may send one or more Confirm instructions to the electronic device 230, and determine whether the electronic device 230 has been successfully started according to a message returned by the electronic device 230. For example, when the bit value of the message carried by the electronic device 230 is set to “1”, it means that the electronic device 230 has been successfully activated. When the bit value carried in the message returned by the electronic device 230 is set to '0', it means that the electronic device 230 has not been successfully started, or the startup has failed.

According to an embodiment of the present invention, when the electronic device 230 is successfully started for the first time, it may be regarded as the first time that the electronic device is successfully started in the test program. The computer device 220 may determine whether the electronic device 230 has passed the first-stage startup test or analyze the root cause of the startup failure according to the manner and result of the electronic device 230 being activated for the first time. For example, if the computer device 220 is forced to start the electronic device 230 by issuing a boot command, and the electronic device 230 is not successfully started, it may be the signal transmission layer (physical layer) inside the electronic device 230 or the data storage device 210 ) Or the physical signal of the transmission protocol layer is unstable, which results in that the startup-related command signal is not correctly transmitted.

After confirming that the electronic device 230 has been successfully started, the computer device 220 may send a sleep command (first command) to the electronic device 230 to drive the electronic device 230 into a sleep state (step S304). When the electronic device 230 successfully receives the sleep instruction from the computer device 220, it can return an acknowledgement signal (ACK), and the computer device 220 can determine whether the electronic device 230 enters the sleep state according to whether the electronic device 230 receives the confirmation signal.

After the electronic device 230 enters the sleep state, the electronic device 230 The screen is turned off and operates in a low power consumption manner. The data storage device 210 does not perform read and write operations in the sleep state.

Then, the computer device 220 waits for a predetermined time DEVICE_SUSPEND_TIME (the first predetermined time), and then sends a wake-up command (second command) to the electronic device to wake the electronic device (step S306).

The computer device 220 may send a Confirm signal to the electronic device 230 to confirm whether the electronic device is successfully woken up (step S308).

According to an embodiment of the present invention, the computer device 220 can test whether the communication of the electronic device 230 is normal when the electronic device 230 operates in the sleep mode through steps S304 to S308. If the electronic device 230 cannot be woken up in the sleep state, the computer device 220 determines that the data storage device 210 cannot pass the second-stage wake-up test (step S310). Thereby, the computer device 220 can further analyze the root cause of the test failure. For example, when the signal quality of the electronic device 230 or the data storage device 210 is unstable or the signal quality is not good, the electronic device 230 may not be able to be woken up in the hibernation state.

If the electronic device 230 is successfully woken up in the hibernation state in response to the wake-up command, the computer device 220 may further issue a fetch command (third command) to the electronic device 230 to request the electronic device 230 or the corresponding host device self-data The storage device 210 reads an operation log file and returns the operation log file to the computer device 220 (step S312).

The kernel log file is a core log file maintained by the electronic device 230 and is used to record all events that occur during the operation of the electronic device 230. The computer device 220 may analyze the contents of the operation log file by executing some corresponding programs to determine the root cause of the failure of the previous test. For example, The computer device 220 can find out whether there is a test failure due to the abnormality of the data storage device 210 by searching keywords recorded in the operation log file.

For example, the keyword “_ufs_do_card_reset” may indicate that a data storage device 210 (eg, a UFS device) has been set incorrectly and the electronic device 230 system performs a reset on the data storage device 210. The keyword "hibern8 enter failed" may indicate that an error occurred when the data storage device 210 entered the hibernation state. The keyword "hibern8 exit failed" may indicate that an error occurred when the data storage device 210 left the hibernation state. The keyword "ufshcd_abort" may indicate that the data storage device 210 was interrupted, usually accompanied by a hibernation entry / exit error. The keyword “query_flag_retry” may indicate that an error occurred when the data storage device 210 transmitted a parameter message.

Then, the computer device 220 may issue a restart instruction (fourth instruction) to the electronic device 230 to restart the electronic device 230 (step S314).

When the electronic device 230 successfully receives the restart instruction from the computer device 220, it may return an acknowledgment signal (ACK) to inform the computer device 220 that the electronic device 230 has performed the restart. The computer device 220 can determine whether the restart instruction can be successfully transmitted according to whether the confirmation signal is received (step S316). For example, the computer device 220 may set another predetermined time DEVICE_REBOOTING_TIME (second predetermined time). If no confirmation signal is received from the electronic device 230 within the predetermined time DEVICE_REBOOTING_TIME, it is determined that the restart command cannot succeed within the predetermined time DEVICE_REBOOTING_TIME The data is transmitted, and the data storage device 210 cannot pass the third-stage restart test (step S318).

If the computer device 220 is at a predetermined time After receiving the confirmation signal from the electronic device 230 within DEVICE_REBOOTING_TIME, it is determined that the restart command can be successfully transmitted. Next, the computer device 220 further determines whether the number of times the electronic device 230 performs a restart in the test program is greater than a predetermined value (step S320). According to an embodiment of the present invention, the computer device 220 may continuously calculate the number of times the electronic device 230 performs a restart in the test program. Whenever the electronic device 230 informs the computer device 220 that a restart has been performed by sending back an acknowledgement signal (ACK), the computer device 220 may increase the number of restarts by one. When the number of restarts performed by the electronic device 230 in the test program is greater than a predetermined value TOTAL_DEVICE_REBOOT_LOOP, which indicates that the number of restarts performed by the electronic device 230 has exceeded the threshold set by the test system, the computer device 220 may determine the data storage device 210 The overall test has been passed (step S322).

On the other hand, if the number of restarts of the electronic device 230 in the test program is not greater than the predetermined value TOTAL_DEVICE_REBOOT_LOOP, which means that the number of restarts of the electronic device 230 has not exceeded the threshold set by the test system, the test program may return to step S302. It is confirmed again by the computer device 220 whether the electronic device 230 has been successfully restarted.

According to an embodiment of the present invention, different tests are arranged at different time points in the test program (for example, the startup test in the first stage, the wake-up test in the second stage, and the restart test in the third stage, etc.). With the above arrangement, when any operation error occurs in the electronic device 230 or the data storage device 210, the computer device 220 can use the steps interrupted by the test program, the execution history of the test program, and the information transmitted between the computer device 220 and the electronic device 230. Communicate messages, etc. to quickly determine the type of error. For example, as described above, the computer device 220 may be According to the manner and result of the electronic device 230 being activated for the first time, determine whether the electronic device 230 has passed the first-stage startup test or analyze the root cause of the startup failure.

For another example, the computer device 220 may also determine whether an error occurs when the data storage device 210 enters / leaves the hibernation state based on whether the electronic device 230 can be successfully woken up from the hibernation state.

For another example, the computer device 220 may determine whether a low-speed to high-speed switching error occurs in the data storage device 210 according to whether the electronic device 230 can successfully receive a restart instruction and / or whether it can be successfully restarted ( Because during the restart, the data transfer rate of the interface logic between the host device and the data storage device 210 is set to a low-speed gear, and after the host device successfully sends a command such as LinkStartUP or LineReset to restart, the interface logic data The transmission rate is set to high-speed gear), Device power mode Sync error, etc.

In addition, since the operation log file records all events that occurred during the operation of the electronic device 230, the computer device 220 retrieves the operation log file after the electronic device 230 is successfully turned on, and analyzes the content recorded in the operation log file. You can also determine the root cause of previous test failures, if any.

4A and 4B are flowcharts showing a test method of a data storage device according to a second embodiment of the present invention. First, the computer device 220 may first confirm whether the electronic device 230 has been successfully activated. According to an embodiment of the present invention, a tester can activate the electronic device 230 by pressing a power button of the electronic device 230. According to another embodiment of the present invention, the computer device 220 may send a boot command or a reboot command to the electronic device 230 to force the boot. Activate or restart the electronic device 230.

According to an embodiment of the present invention, the computer device 220 may set a waiting time WAIT_DEVICE_CHECKING_TIME (the third predetermined time), and after waiting for the predetermined time WAIT_DEVICE_CHECKING_TIME to elapse, issue a Confirm instruction (the fifth instruction) to the electronic device 230 ( Step S402), to further confirm whether the electronic device 230 has been successfully started (Step S404).

According to an embodiment of the present invention, the computer device 220 may send one or more confirmation instructions to the electronic device 230, and determine whether the electronic device 230 has been successfully started according to a message returned by the electronic device 230. For example, when the bit value of the message carried by the electronic device 230 is set to “1”, it means that the electronic device 230 has been successfully activated. When the bit value carried in the message returned by the electronic device 230 is set to '0', it means that the electronic device 230 has not been successfully started or failed to start.

In addition, according to an embodiment of the present invention, the computer device 220 may accumulate a confirmation count value n after each confirmation instruction is issued. If the computer device 220 is not successfully started, the computer device 220 further determines whether the confirmation count value n exceeds the confirmation threshold value CHECKING_COUNT (step S406). If the confirmation count value has not exceeded the confirmation threshold CHECKING_COUNT, the test program returns to step S402 to perform confirmation again. If the confirmation count value has exceeded the confirmation threshold value CHECKING_COUNT, it means that the number of confirmations has exceeded the confirmation threshold value set by the test system, it is determined that the test has failed (step S408).

According to an embodiment of the present invention, the computer device 220 can determine whether the current test failure is caused by the steps of the test program interruption, the execution history of the test program, and the communication message transmitted between the computer device 220 and the electronic device 230. The test failed due to the electronic device 230 failing the first-stage power-on test. In addition, according to an embodiment of the present invention, the computer device 220 may also analyze the root cause of the startup failure according to the manner and result of the electronic device 230 being activated. For example, if the computer device 220 is forced to start the electronic device 230 by issuing a boot command, and the electronic device 230 is not successfully started, it may be the signal transmission layer (physical layer) inside the electronic device 230 or the data storage device 210 ) Or the physical signal of the transmission protocol layer is unstable, which results in that the startup-related command signal is not correctly transmitted.

On the other hand, after confirming that the electronic device 230 has been successfully started, the computer device 220 may issue a sleep command (first command) to the electronic device 230 to drive the electronic device 230 into a sleep state (step S410). When the electronic device 230 successfully receives the sleep instruction from the computer device 220, it can return an acknowledgement signal (ACK), and the computer device 220 can determine whether the electronic device 230 enters the sleep state according to whether the electronic device 230 receives the confirmation signal.

After the electronic device 230 enters the sleep state, the screen of the electronic device 230 is turned off and operates in a low power consumption manner. The data storage device 210 does not perform read and write operations in the sleep state.

Then, the computer device 220 waits for a predetermined time DEVICE_SUSPEND_TIME (the first predetermined time), and then sends a wake-up command (second command) to the electronic device to wake the electronic device (step S412).

The computer device 220 may send a Confirm signal to the electronic device 230 to confirm whether the electronic device is successfully woken up (step S414).

According to an embodiment of the present invention, the computer device 220 can test the communication between the electronic device 230 and the electronic device 230 in the sleep mode through steps S410 to S414. Is it normal? If the electronic device 230 cannot be woken up in the sleep state, the computer device 220 determines that the data storage device 210 has failed the test (step S408).

It is worth noting that the computer device 220 can determine whether the test failure at this stage belongs to the electronic device 230 by the steps of the test program interruption, the execution history of the test program, and the communication messages transmitted between the computer device 220 and the electronic device 230. The test failed due to failing the second stage wake-up test. In addition, the computer device 220 can further analyze the root cause of the test failure. For example, when the signal quality of the electronic device 230 or the data storage device 210 is unstable or the signal quality is not good, the electronic device 230 may not be able to be woken up in the hibernation state.

If the electronic device 230 is successfully woken up in the hibernation state in response to the wake-up command, the computer device 220 may further issue a fetch command (third command) to the electronic device 230 to request the electronic device 230 or the corresponding host device self-data The storage device 210 reads an operation log file and returns the operation log file to the computer device 220 (step S416).

The kernel log file is a core log file maintained by the electronic device 230 and is used to record all events that occur during the operation of the electronic device 230. The computer device 220 may analyze the contents of the operation log file by executing some corresponding programs to determine the root cause of the failure of the previous test. For example, the computer device 220 may search for keywords recorded in the operation log file to find out whether there is a test failure due to the abnormality of the data storage device 210.

For example, the keyword “_ufs_do_card_reset” may indicate that a data storage device 210 (eg, a UFS device) has been set incorrectly and the electronic device 230 system performs a reset on the data storage device 210. Keywords "hibern8 enter failed" may indicate that an error occurred when the data storage device 210 entered the hibernation state. The keyword "hibern8 exit failed" may indicate that an error occurred when the data storage device 210 left the hibernation state. The keyword "ufshcd_abort" may indicate that the data storage device 210 was interrupted, usually accompanied by a hibernation entry / exit error. The keyword “query_flag_retry” may indicate that an error occurred when the data storage device 210 transmitted a parameter message.

Then, the computer device 220 may issue a restart instruction (fourth instruction) to the electronic device 230 to restart the electronic device 230 (step S418).

When the electronic device 230 successfully receives the restart instruction from the computer device 220, it may return an acknowledgment signal (ACK) to inform the computer device 220 that the electronic device 230 has performed the restart. The computer device 220 can determine whether the restart instruction can be successfully transmitted according to whether the confirmation signal is received (step S420). For example, the computer device 220 may set another predetermined time DEVICE_REBOOTING_TIME (second predetermined time). If no confirmation signal is received from the electronic device 230 within the predetermined time DEVICE_REBOOTING_TIME, it is determined that the restart command cannot succeed within the predetermined time DEVICE_REBOOTING_TIME If the ground is transmitted, the computer device 220 determines that the data storage device 210 has failed the test (step S408). As described above, the computer device 220 can determine whether the test failure at this stage belongs to the data storage device 210 through the steps of the test program interruption, the execution history of the test program, and the communication messages transmitted between the computer device 220 and the electronic device 230. Passed the third stage restart test.

If the computer device 220 receives a confirmation letter from the electronic device 230 within a predetermined time DEVICE_REBOOTING_TIME Number, it is determined that the restart command can be successfully transmitted. Next, the computer device 220 further determines whether the number of times the electronic device 230 performs a restart in the test program is greater than a predetermined value (step S422). According to an embodiment of the present invention, the computer device 220 may continuously calculate the number of times the electronic device 230 performs a restart in the test program. Whenever the electronic device 230 informs the computer device 220 that a restart has been performed by sending back an acknowledgement signal (ACK), the computer device 220 may increase the number of restarts by one. When the number of restarts performed by the electronic device 230 in the test program is greater than a predetermined value TOTAL_DEVICE_REBOOT_LOOP, which indicates that the number of restarts performed by the electronic device 230 has exceeded the threshold set by the test system, the computer device 220 may determine the data storage device 210 The overall test has been passed (step S424).

On the other hand, if the number of restarts of the electronic device 230 in the test program is not greater than the predetermined value TOTAL_DEVICE_REBOOT_LOOP, which means that the number of restarts of the electronic device 230 has not exceeded the threshold set by the test system, the test program may return to step S402. It is confirmed again by the computer device 220 whether the electronic device 230 has been successfully restarted.

As described above, according to an embodiment of the present invention, different tests are arranged at different time points in the test program (for example, the first-stage startup test, the second-stage wake-up test, and the third-stage restart test). Wait). With the above arrangement, when any operation error occurs in the electronic device 230 or the data storage device 210, the computer device 220 can use the steps interrupted by the test program, the execution history of the test program, and the transmission between the computer device 220 and the electronic device 230 Communicate messages, etc. to quickly determine the type of error. For example, as described above, the computer device 220 may determine the electronic device according to the manner and result of the first activation of the electronic device 230. Whether the setting 230 passes the first-stage startup test or analyzes the root cause of the startup failure.

For another example, the computer device 220 may also determine whether an error occurs when the data storage device 210 enters / leaves the hibernation state based on whether the electronic device 230 can be successfully woken up from the hibernation state.

For another example, the computer device 220 may determine whether a low-speed to high-speed switching error occurs in the data storage device 210 according to whether the electronic device 230 can successfully receive a restart instruction and / or whether it can be successfully restarted ( Because during the restart, the data transfer rate of the interface logic between the host device and the data storage device 210 is set to a low-speed gear, and after the host device successfully sends a command such as LinkStartUP or LineReset to restart, the interface logic data The transmission rate is set to high-speed gear), Device power mode Sync error, DMR Reset timing error, etc.

In addition, since the operation log file records all events that occurred during the operation of the electronic device 230, the computer device 220 retrieves the operation log file after the electronic device 230 is successfully turned on, and analyzes the content recorded in the operation log file. You can also determine the root cause of previous test failures, if any.

Generally speaking, during the electronic device verification phase, the stability of each component configured in the overall system is verified through a rebooting test, for example, to confirm that the data storage device can be stable after power-off / power-on Ground to reconnect to the host device and complete normal boot. However, in the conventional technology, since the verification of the electronic device is performed through an application program (APK) built into the electronic device, it cannot be retained when the electronic device cannot be started smoothly. Any error message leads to the need to spend a lot of time waiting for the error to reappear, indirectly extending the debugging time, and increasing the difficulty of identifying the problem point.

In order to solve the above problems, the present invention proposes a novel test system and test method, which can quickly and effectively verify the operation stability of the data storage device applied to various electronic devices, and the compatibility of the data storage device with various system platforms It can effectively shorten the startup test time, solve the problem that the traditional startup test time is too long, and can improve the error detection rate. In the test procedure, different tests are arranged at different time points (for example, the first-stage startup test, the second-stage wake-up test, and the third-stage restart test, etc.). When the electronic device 230 or data is stored, When any operation error of the device 210 occurs, the computer device 220 can quickly determine the type of the error by using the steps of the test program interruption, the test program execution history, and the communication messages transmitted between the computer device 220 and the electronic device 230 to assist in research and development. Personnel can quickly check to clarify the root cause of the error and propose improvement measures. In addition, the test method proposed by the present invention can be automatically controlled by a computer device throughout the process, and can perform tests on multiple electronic devices at the same time. Compared with the conventional technology, the test efficiency can be greatly improved, and the problems of the conventional technology are solved. In addition, the test method proposed in the present invention can stop the test when a test failure is detected, and keep a record of the execution of the test program, and then use a computer device to analyze each log file to effectively improve the error detection rate.

The use of ordinal numbers such as "first" and "second" in the scope of the patent application does not imply any priority, order of priority, order between elements, or the order of steps performed by the method. It is only used as an identifier to distinguish different elements with the same name (with different ordinal numbers).

Although the present invention has been disclosed as above with preferred embodiments, it is not It is used to limit the present invention. Anyone familiar with the art can make some modifications and retouching without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be defined by the scope of the attached patent application as follows: quasi.

Claims (10)

A test system for a data storage device for testing a data storage device includes: a data storage device; an electronic device including a host device, the host device is coupled to the data storage device, and uses an interface logic and the data Communication with a storage device; and a computer device coupled to the electronic device for issuing a plurality of instructions to test the data storage device in a test procedure; wherein after the electronic device is successfully activated, the computer device issues a first An instruction is given to the electronic device to drive the electronic device into a sleep state, and after waiting for a first predetermined time, the computer device sends a second instruction to the electronic device to wake up the electronic device. The test system according to item 1 of the scope of patent application, wherein after the electronic device is awakened in response to the second instruction, the computer device further issues a third instruction to the electronic device to request the host device to retrieve the data from the host device. The storage device reads an operation log file and returns the operation log file to the computer device. The test system according to item 1 of the scope of patent application, wherein after the electronic device is awakened in response to the second instruction, the computer device further issues a fourth instruction to the electronic device to drive the electronic device to restart. The test system according to item 3 of the scope of patent application, wherein the computer device calculates a number of times the electronic device is restarted in the test procedure. The test system according to item 4 of the scope of patent application, wherein when the number of times the electronic device is restarted in the test procedure is greater than a predetermined value, the The computer device determines that the data storage device passes the test. A test method for a data storage device for testing a data storage device, wherein the data storage device is coupled to an electronic device, the electronic device is coupled to a computer device, and the computer device sends a plurality of instructions for testing in a test procedure In the data storage device, the testing method includes: after the electronic device is successfully started, the computer device sends a first instruction to the electronic device to drive the electronic device into a sleep state; and waiting for a first After the predetermined time, the computer device sends a second instruction to the electronic device to wake up the electronic device. The test method described in item 6 of the patent application scope further includes: after the electronic device is awakened in response to the second instruction, the computer device sends a third instruction to the electronic device to request the electronic device to The data storage device reads an operation log file and returns the operation log file to the computer device. The test method described in item 6 of the scope of patent application, further includes: after the electronic device is awakened in response to the second instruction, the computer device sends a fourth instruction to the electronic device to drive the electronic device to restart Power on. The test method described in item 6 of the patent application scope further includes: calculating a number of times that the electronic device is restarted in the test procedure. According to the test method described in item 9 of the scope of patent application, the method further includes: when the number of times the electronic device is restarted in the test procedure is greater than a predetermined value, judging that the data storage device passes the test.