TWI683403B - Method of producing power module substrate with heat sink - Google Patents

Method of producing power module substrate with heat sink Download PDF

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TWI683403B
TWI683403B TW105106329A TW105106329A TWI683403B TW I683403 B TWI683403 B TW I683403B TW 105106329 A TW105106329 A TW 105106329A TW 105106329 A TW105106329 A TW 105106329A TW I683403 B TWI683403 B TW I683403B
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heat sink
atomic
less
aluminum material
metal layer
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TW201644017A (en
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岩崎航
駒崎雅人
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日商三菱綜合材料股份有限公司
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Abstract

A method of producing a power module substrate with a heat sink includes performing solid-phase diffusion bonding a metal layer and a heat sink. Any one of an aluminum material composing a bonding surface of the metal layer and an aluminum material composing a bonding surface of the heat sink is a high purity aluminum material containing high purity aluminum. The other thereof is a low purity aluminum material containing low purity aluminum. The difference between the concentration of elements other than Al in the high purity aluminum material and in the low purity aluminum material is 1 atom% or more.

Description

附有散熱片之電源模組用基板的製造方法 Method for manufacturing substrate for power module with heat sink

本發明係關於附有散熱片之電源模組用基板的製造方法,其係具備有絕緣層、形成於此絕緣層之其中一面的電路層、形成於前述絕緣層之另一面的金屬層、以及被配置於此金屬層之與前述絕緣層相反側之面的散熱片。 The present invention relates to a method for manufacturing a substrate for a power module with a heat sink, which includes an insulating layer, a circuit layer formed on one side of the insulating layer, a metal layer formed on the other side of the insulating layer, and A heat sink arranged on the surface of the metal layer opposite to the insulating layer.

本申請案係根據2015年3月30日在日本申請之日本特願2015-069860號而主張優先權,並將其內容援用於此。 This application claims priority based on Japanese Patent Application No. 2015-069860 filed in Japan on March 30, 2015, and the contents are used here.

一般而言,為了控制風力發電、電動汽車、油電混合車等所使用的大電力控制用之功率半導體元件係發熱量為多。因此,作為搭載如此之功率半導體元件的基板,以往廣泛使用有例如電源模組用基板,該電源模組用基板係具備有由AlN(氮化鋁)、Al2O3(氧化鋁)等所構成的陶瓷基板、形成於此陶瓷基板之其中一面的電路層、以及形成陶瓷基板之另一面的金屬層。 In general, the amount of heat generated by power semiconductor elements for controlling large power used in wind power generation, electric vehicles, hybrid vehicles, etc. is large. Therefore, the power semiconductor element is mounted so the substrate, for example, widely used conventional power module substrate, the power module substrate provided with a line of AlN (aluminum nitride), Al 2 O 3 (alumina), etc. The formed ceramic substrate, the circuit layer formed on one side of the ceramic substrate, and the metal layer formed on the other side of the ceramic substrate.

又,提供為了有效率地擴散由所搭載之半導體元件等所產生的熱,而將散熱片接合於金屬層側的附有散熱片之電源模組用基板。 In addition, a heat-dissipating fin-attached substrate for a power module in which a heat sink is bonded to a metal layer side to efficiently diffuse heat generated by mounted semiconductor elements and the like is provided.

例如,於專利文獻1中係揭示有一種附有散熱片之電源模組用基板,其係電源模組用基板之電路層及金屬層由鋁或鋁合金所構成,且散熱片由鋁或鋁合金所構成,將金屬層與散熱片藉由焊接或者硬焊接合作接合。 For example, Patent Document 1 discloses a power module substrate with a heat sink. The circuit layer and the metal layer of the power module substrate are made of aluminum or aluminum alloy, and the heat sink is made of aluminum or aluminum. It is composed of alloy, and the metal layer and the heat sink are joined together by welding or brazing.

又,於專利文獻2中係揭示有一種附有散熱片之電源模組用基板,其係於陶瓷基板之其中一面及另一面形成由鋁所構成的電路層及金屬層,於金屬層與散熱片之間配置銅板,金屬層與銅板、銅板與散熱片係分別焊接。 In addition, Patent Document 2 discloses a substrate for a power module with a heat sink. The circuit layer and the metal layer made of aluminum are formed on one side and the other side of the ceramic substrate. A copper plate is arranged between the sheets, and the metal layer and the copper plate, and the copper plate and the heat sink are welded separately.

再者,於專利文獻3中係揭示有於電源模組用基板之電路層及金屬層由鋁或鋁合金所構成,且散熱片由鋁或鋁合金所構成的附有散熱片之電源模組用基板中,於金屬層與散熱片之間介在由銅或銅合金所構成的接合材,將金屬層與接合材及接合材與散熱片分別進行固相擴散接合而成者。 Furthermore, Patent Document 3 discloses that the circuit layer and the metal layer of the substrate for the power module are composed of aluminum or aluminum alloy, and the heat sink is composed of aluminum or aluminum alloy. In the substrate, a bonding material made of copper or a copper alloy is interposed between the metal layer and the heat sink, and the metal layer and the joint material and the joint material and the heat sink are separately solid-phase diffusion bonded.

〔先前技術文獻〕 [Previous Technical Literature] 〔專利文獻〕 [Patent Literature]

〔專利文獻1〕日本特開2008-016813號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2008-016813

〔專利文獻2〕日本特開2007-250638號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2007-250638

〔專利文獻3〕日本特開2014-060215號公報 [Patent Document 3] Japanese Unexamined Patent Publication No. 2014-060215

另外,最近功率半導體元件等之高輸出化發展,成為對搭載其之附有散熱片之電源模組用基板負荷嚴峻的熱循環,而比以往更加要求有對於熱循環之接合可靠性優異的附有散熱片之電源模組用基板。 In addition, the recent development of high output of power semiconductor devices and the like has become a severe thermal cycle on the substrate of the power module with its heat sink attached, and it is more important than ever to have an excellent bonding reliability for thermal cycles. Substrate for power module with heat sink.

在此,於專利文獻1所記載的附有散熱片之電源模組用基板中,在將金屬層與散熱片進行焊接的情況,存在有於熱循環負荷時,在焊錫處產生龜裂而接合率降低的問題。 Here, in the substrate for a power module with a heat sink described in Patent Document 1, when a metal layer and a heat sink are soldered, there may be cracks at the solder joints when the heat cycle load occurs and the joints The problem of reduced rates.

又,在將金屬層與散熱片進行硬焊接合的情況,恐有於熱循環負荷時,在陶瓷基板產生破裂之虞。 In addition, when the metal layer and the heat sink are brazed, there is a possibility that the ceramic substrate may crack due to thermal cycling load.

再者,於內部形成有冷卻介質之流路等之複雜的構造之散熱片中,有時係藉由固相線溫度較低的鋁鑄物合金所製造,但於如此之散熱片中,使用硬焊材料進行接合一事係為困難。 Furthermore, in a heat sink with a complicated structure in which a cooling medium flow path is formed, it is sometimes made of an aluminum casting alloy with a low solidus temperature, but in such a heat sink, it is used It is difficult to join brazing materials.

又,於專利文獻2所記載的附有散熱片之電源模組用基板中,由於是金屬層與銅板、銅板與散熱片分別進行焊接,因此仍舊存在有於熱循環負荷時,在焊錫處產生龜裂而接合率降低的問題。 In addition, in the substrate for a power module with a heat sink described in Patent Document 2, since the metal layer and the copper plate, and the copper plate and the heat sink are soldered separately, they still occur at the place of the solder during the heat cycle load The problem of cracking and lowering the bonding rate.

再者,於專利文獻3所示之附有散熱片之電源模組用基板中,於金屬層與散熱片之間介在由銅或銅合金所構成的接合材,將金屬層與接合材及接合材與散熱片 分別進行固相擴散接合,而於金屬層與散熱片之接合界面形成金屬間化合物。此金屬間化合物係由於硬且脆,因此恐有於熱循環負荷時發生龜裂等之虞。 Furthermore, in the substrate for a power module with a heat sink shown in Patent Document 3, a bonding material composed of copper or a copper alloy is interposed between the metal layer and the heat sink, and the metal layer is bonded to the bonding material and Material and heat sink Solid phase diffusion bonding is performed separately, and an intermetallic compound is formed at the bonding interface between the metal layer and the heat sink. Since this intermetallic compound is hard and brittle, there is a possibility that cracks or the like may occur when the heat cycle is loaded.

本發明係鑑於前述之情事而完成者,其目的在於提供一種可製造附有散熱片之電源模組用基板的附有散熱片之電源模組用基板的製造方法,該附有散熱片之電源模組用基板係即使在負荷熱循環的情況亦可對在接合界面產生龜裂等一事作抑制。 The present invention has been completed in view of the foregoing circumstances, and its object is to provide a method for manufacturing a substrate for a power module with a heat sink that can manufacture a substrate for a power module with a heat sink, the power supply with a heat sink The module substrate system can suppress the occurrence of cracks at the bonding interface even under load thermal cycling.

為了解決如此之課題而達成前述目的,本發明之一樣態之附有散熱片之電源模組用基板的製造方法係具備有絕緣層、形成於此絕緣層之其中一面的電路層、形成於前述絕緣層之另一面的金屬層、以及被配置於此金屬層之與前述絕緣層相反側之面的散熱片之附有散熱片之電源模組用基板的製造方法,其特徵為,前述金屬層中與前述散熱片之接合面、及前述散熱片中與前述金屬層之接合面係以鋁或鋁合金所成之鋁材料所構成,構成前述金屬層之接合面的鋁材料及構成前述散熱片之接合面的鋁材料中的任一方為鋁之純度高的高純度鋁材料,另一方為鋁之純度低的低純度鋁材料,將前述高純度鋁材料與前述低純度鋁材料之Al以外的含有元素之濃度差設為1原子%以上,將前述金屬層與前述散熱片進行固相擴散接合。 In order to solve such a problem and achieve the aforementioned object, the manufacturing method of a substrate for a power module with a heat sink in the same form of the present invention is provided with an insulating layer, a circuit layer formed on one side of the insulating layer, formed on the aforementioned The manufacturing method of the metal layer on the other surface of the insulating layer and the heat sink-attached power module substrate provided on the surface of the metal layer opposite to the insulating layer is characterized in that the metal layer The bonding surface with the heat sink and the bonding surface with the metal layer of the heat sink are made of aluminum material made of aluminum or aluminum alloy, the aluminum material constituting the bonding surface of the metal layer and the heat sink One of the aluminum materials on the joining surface is a high-purity aluminum material with high purity aluminum, and the other is a low-purity aluminum material with low purity aluminum. The high-purity aluminum material and the low-purity aluminum material other than Al The concentration difference of the element is set to 1 atomic% or more, and the metal layer and the heat sink are subjected to solid phase diffusion bonding.

於此構成之附有散熱片電源模組用基板的製 造方法中,前述金屬層中與前述散熱片之接合面、及前述散熱片中與前述金屬層之接合面係以鋁或鋁合金所成之鋁材料所構成,將此等金屬層與散熱片進行固相擴散接合。通常,在使鋁材料彼此進行固相擴散的情況,由於鋁之自我擴散速度緩慢,因此為了得到強固的固相擴散接合係需要較長的時間,而在工業上無法實現。 Manufacturing of a substrate for a power module with a heat sink constituted here In the manufacturing method, the bonding surface of the metal layer with the heat sink and the bonding surface of the heat sink with the metal layer are made of aluminum material made of aluminum or aluminum alloy, and the metal layer and the heat sink Perform solid phase diffusion bonding. Generally, when aluminum materials are solid-phase diffused with each other, since the self-diffusion rate of aluminum is slow, it takes a long time to obtain a strong solid-phase diffusion bonding system, which is not industrially feasible.

在此,於本發明中,由於構成前述金屬層之接合面的鋁材料及構成前述散熱片之接合面的鋁材料中的任一方為鋁之純度高的高純度鋁材料,另一方為鋁之純度低的低純度鋁材料,將前述高純度鋁材料與前述低純度鋁材料之Al以外的含有元素之濃度差設為1原子%以上,因此藉由Al以外之含有元素從前述低純度鋁材料側朝前述高純度鋁材料側擴散,而促進鋁之自我擴散,成為能夠以較短時間將金屬層與散熱片確實地進行固相擴散接合。 Here, in the present invention, either one of the aluminum material constituting the bonding surface of the metal layer and the aluminum material constituting the bonding surface of the heat sink is a high-purity aluminum material with high purity of aluminum, and the other is aluminum The low-purity aluminum material with low purity has a difference in concentration of elements other than Al between the high-purity aluminum material and the low-purity aluminum material to 1 atomic% or more. The side diffuses toward the high-purity aluminum material side, and promotes the self-diffusion of aluminum, so that it is possible to reliably perform solid-phase diffusion bonding of the metal layer and the heat sink in a short time.

並且,由於如此般散熱片與金屬層被固相擴散接合,因此即使在負荷熱循環的情況,也無在接合界面處產生龜裂等的疑慮,而可得到對於熱循環之接合可靠性優異的附有散熱片之電源模組用基板。 In addition, since the heat sink and the metal layer are diffusion-bonded in a solid phase in this way, even in the case of a load thermal cycle, there is no doubt that a crack or the like is generated at the bonding interface, and excellent bonding reliability for thermal cycle can be obtained A substrate for power modules with heat sinks.

於本發明之一樣態之附有散熱片之電源模組用基板的製造方法中,較佳為前述高純度鋁材料與前述低純度鋁材料係含有由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素作為Al以外之含有元素,且前述高純度鋁材料中之前述Al以外的含有元素之合計量與前述低純度鋁材料中之前述Al以外的含有元素 之合計量的差為1原子%以上。 In the manufacturing method of a substrate for a power module with a heat sink in the same state of the present invention, it is preferable that the high-purity aluminum material and the low-purity aluminum material contain Si, Cu, Mn, Fe, Mg, Zn , Ti and Cr selected one or two or more elements as elements other than Al, and the total amount of elements other than Al in the high-purity aluminum material and the elements other than Al in the low-purity aluminum material Contains elements The total difference is at least 1 atom%.

於此情況中,Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr之元素係由於促進鋁之自我擴散的作用效果優異,因此成為能夠將均以鋁材料所構成的金屬層與散熱片以短時間確實地進行固相擴散接合。 In this case, the elements of Si, Cu, Mn, Fe, Mg, Zn, Ti, and Cr are excellent in the effect of promoting the self-diffusion of aluminum, so it becomes possible to combine the metal layer and the heat sink composed of aluminum materials. Solid phase diffusion bonding is performed reliably in a short time.

又,於本發明之一樣態之附有散熱片之電源模組用基板的製造方法中,較佳為前述低純度鋁材料係合計含有1原子%以上之由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素,並且Si之含量為15原子%以下、Cu之含量為10原子%以下、Mn之含量為2原子%以下、Fe之含量為1原子%以下、Mg之含量為5原子%以下、Zn之含量為10原子%以下、Ti之含量為1原子%以下及Cr之含量為1原子%以下。 In addition, in the manufacturing method of a substrate for a power module with a heat sink in the same state of the present invention, it is preferable that the total amount of the low-purity aluminum material contains 1 atomic% or more of Si, Cu, Mn, Fe, and Mg , Zn, Ti and Cr selected one or more elements, and the content of Si is 15 atomic% or less, the content of Cu is 10 atomic% or less, the content of Mn is 2 atomic% or less, the content of Fe is 1 atomic% or less, Mg content is 5 atomic% or less, Zn content is 10 atomic% or less, Ti content is 1 atomic% or less, and Cr content is 1 atomic% or less.

於此情況中,由於純度低之低純度鋁材料係合計含有1原子%以上之由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素,因此藉由使此等元素朝高純度鋁材料側擴散,而促進鋁之自我擴散,成為能夠以較短時間將金屬層與散熱片確實地進行固相擴散接合。 In this case, since the low-purity aluminum material with a low purity contains 1 atomic% or more in total, one or more elements selected from Si, Cu, Mn, Fe, Mg, Zn, Ti, and Cr, so By diffusing these elements toward the side of the high-purity aluminum material to promote the self-diffusion of aluminum, it becomes possible to reliably perform solid-phase diffusion bonding of the metal layer and the heat sink in a short time.

另一方面,由於被限制成:Si之含量為15原子%以下、Cu之含量為10原子%以下、Mn之含量為2原子%以下、Fe之含量為1原子%以下、Mg之含量為5原子%以下、Zn之含量為10原子%以下、Ti之含量為1原子%以下及Cr之含量為1原子%以下,因此藉由此等之元素可 抑制接合界面硬達必要程度以上,而可確實地製造對於散熱片之接合可靠性優異的附有散熱片之電源模組用基板。 On the other hand, it is limited to: the content of Si is 15 atomic% or less, the content of Cu is 10 atomic% or less, the content of Mn is 2 atomic% or less, the content of Fe is 1 atomic% or less, and the content of Mg is 5 At% or less, Zn content is 10% or less, Ti content is 1% or less, and Cr content is 1% or less, so these elements can be It is possible to reliably manufacture a substrate for a power module with a heat sink with excellent bonding reliability to a heat sink by suppressing the bonding interface to be harder than necessary.

進而,於本發明之一樣態之附有散熱片之電源模組用基板的製造方法中,較佳係作為下述構成:藉由將前述屬層與前述散熱片進行層合,以於層合方向負荷0.3MPa以上、3.0MPa以下之荷重的狀態,並在低純度鋁材料之固相線溫度(K)的90%以上、未達低純度鋁材料之固相線溫度的保持溫度下保持1小時以上,而將前述金屬層與前述散熱片進行固相擴散接合。 Furthermore, in the manufacturing method of a substrate for a power module with a heat sink in the same form of the present invention, it is preferable to have the following structure: by laminating the above-mentioned generic layer and the above-mentioned heat sink to facilitate lamination The direction load is 0.3MPa or more and 3.0MPa or less, and it is maintained at a holding temperature of 90% or more of the solidus temperature (K) of the low-purity aluminum material and the solidus temperature of the low-purity aluminum material. For more than hours, the metal layer and the heat sink are subjected to solid phase diffusion bonding.

於此情況中,由於是採用以於層合方向負荷0.3MPa以上、3.0MPa以下之荷重的狀態,並在低純度鋁材料之固相線溫度(K)的90%以上、未達低純度鋁材料之固相線溫度的保持溫度下保持1小時以上之固相擴散接合條件,因此可促進鋁之擴散移動,而可將前述金屬層與前述散熱片確實地接合。 In this case, it is in a state where the load in the lamination direction is 0.3 MPa or more and 3.0 MPa or less, and the low-purity aluminum is not more than 90% of the solidus temperature (K) of the low-purity aluminum material. The solid-phase diffusion bonding conditions of the material are maintained at the solidus temperature for more than 1 hour. Therefore, the diffusion movement of aluminum can be promoted, and the metal layer and the heat sink can be reliably bonded.

依據本發明,成為可提供一種可製造附有散熱片之電源模組用基板的附有散熱片之電源模組用基板的製造方法,該附有散熱片之電源模組用基板係即使在負荷熱循環的情況亦可對在接合界面產生龜裂等一事作抑制。 According to the present invention, it is possible to provide a method for manufacturing a substrate for a power module with a heat sink that can manufacture a substrate for a power module with a heat sink, the substrate for a power module with a heat sink is even under load The thermal cycle can also suppress the occurrence of cracks at the joint interface.

1、101、201‧‧‧電源模組 1, 101, 201 ‧‧‧ power module

10、110、210‧‧‧電源模組用基板 10, 110, 210‧‧‧ substrate for power module

11‧‧‧陶瓷基板 11‧‧‧Ceramic substrate

12、112、212‧‧‧電路層 12, 112, 212‧‧‧ circuit layer

13、113、213‧‧‧金屬層 13, 113, 213‧‧‧ metal layer

30、130、230‧‧‧附有散熱片之電源模組用基板 30, 130, 230 ‧‧‧ substrate for power module with heat sink

31、131、231‧‧‧散熱片 31, 131, 231‧‧‧ heat sink

〔第1圖〕係本發明之實施形態之附有散熱片之電源模組用基板及電源模組的概略說明圖。 [Figure 1] This is a schematic explanatory diagram of a heat sink-attached power module substrate and power module according to an embodiment of the present invention.

〔第2圖〕係顯示附有散熱片之電源模組用基板的金屬層與散熱片之接合界面的觀察結果及分析結果的圖。 [Figure 2] This is a diagram showing the observation results and analysis results of the bonding interface between the metal layer of the power module substrate with heat sink and the heat sink.

〔第3圖〕係顯示本發明之實施形態之附有散熱片之電源模組用基板及電源模組的製造方法的流程圖。 [Figure 3] is a flowchart showing a method for manufacturing a power module substrate with a heat sink and a power module according to an embodiment of the present invention.

〔第4圖〕係顯示本發明之實施形態之附有散熱片之電源模組用基板的製造方法的說明圖。 [FIG. 4] It is explanatory drawing which shows the manufacturing method of the board|substrate for power supply modules with a heat sink which concerns on embodiment of this invention.

〔第5圖〕係本發明之另一實施形態之附有散熱片之電源模組用基板及電源模組的概略說明圖。 [FIG. 5] This is a schematic explanatory diagram of a heat sink-attached power module substrate and power module according to another embodiment of the present invention.

〔第6圖〕係本發明之另一實施形態之附有散熱片之電源模組用基板及電源模組的概略說明圖。 [Figure 6] This is a schematic explanatory diagram of a power-supply module substrate with a heat sink and a power module according to another embodiment of the present invention.

以下,針對本發明之實施形態,參照所附圖示進行說明。 Hereinafter, embodiments of the present invention will be described with reference to the attached drawings.

第1圖係顯示本發明之一實施形態之附有散熱片之電源模組用基板30及電源模組1。 FIG. 1 shows a heat sink-attached power module substrate 30 and a power module 1 according to an embodiment of the present invention.

此電源模組1係具備有附有散熱片之電源模組用基板30、以及經由焊錫層2被接合於此附有散熱片之電源模組用基板30的其中一面(於第1圖中為上面)的半導體元件3。 This power module 1 is provided with a substrate 30 for a power module with a heat sink, and one side of the substrate 30 for a power module with a heat sink attached via the solder layer 2 (in FIG. 1 is The above) of the semiconductor element 3.

在此,焊錫層2係為例如Sn-Ag系、Sn-In系、或者Sn-Ag-Cu系之焊錫材料。 Here, the solder layer 2 system is, for example, a Sn-Ag system, Sn-In system, or Sn-Ag-Cu system solder material.

又,本實施形態之附有散熱片之電源模組用基板30係具備有電源模組用基板10、以及被接合於電源模組用基板10的散熱片31。 In addition, the heat sink-attached power module substrate 30 of the present embodiment includes the power module substrate 10 and the heat sink 31 bonded to the power module substrate 10.

電源模組用基板10係具備有陶瓷基板11、被配設於此陶瓷基板11之其中一面(於第1圖中為上面)的電路層12、以及被配設於陶瓷基板11之另一面(於第1圖中為下面)的金屬層13。 The power supply module substrate 10 includes a ceramic substrate 11, a circuit layer 12 disposed on one side (upper surface in FIG. 1) of the ceramic substrate 11, and the other surface disposed on the ceramic substrate 11 ( In the first figure, the metal layer 13 below).

陶瓷基板11係防止電路層12與金屬層13之間的電連接者,於本實施形態中係以絕緣性高的AlN(氮化鋁)所構成。在此,陶瓷基板11之厚度係設定在0.2mm以上、1.5mm以下之範圍內,於本實施形態中係設定為0.635mm。 The ceramic substrate 11 prevents the electrical connection between the circuit layer 12 and the metal layer 13, and in this embodiment is composed of AlN (aluminum nitride) with high insulation. Here, the thickness of the ceramic substrate 11 is set within a range of 0.2 mm or more and 1.5 mm or less, and in the present embodiment, it is set to 0.635 mm.

電路層12係如第4圖所示般,藉由於陶瓷基板11之其中一面接合由鋁或鋁合金所構成的鋁板22所形成。於本實施形態中,作為構成電路層12之鋁板22係使用純度99mass%以上的2N鋁之壓延板。於此電路層12係形成有電路圖型,其中一面(於第1圖中為上面)係為搭載半導體元件3的搭載面。在此,電路層12(鋁板22)之厚度係設定在0.1mm以上、1.0mm以下之範圍內,於本實施形態中係設定為0.6mm。 The circuit layer 12 is formed by joining an aluminum plate 22 made of aluminum or aluminum alloy to one side of the ceramic substrate 11 as shown in FIG. 4. In this embodiment, as the aluminum plate 22 constituting the circuit layer 12, a rolled plate of 2N aluminum having a purity of 99 mass% or more is used. A circuit pattern is formed on the circuit layer 12, and one surface (the upper surface in the first drawing) is a mounting surface on which the semiconductor element 3 is mounted. Here, the thickness of the circuit layer 12 (aluminum plate 22) is set within a range of 0.1 mm or more and 1.0 mm or less, and in this embodiment, it is set to 0.6 mm.

金屬層13係如第4圖所示般,藉由於陶瓷基板11之另一面接合由鋁或鋁合金所構成的鋁板23所形成。於本實施形態中,作為構成金屬層13之鋁板23係使用純度99.99mass%以上的4N鋁之壓延板。在此,金屬層 13(鋁板23)之厚度係設定在0.1mm以上、6.0mm以下之範圍內,於本實施形態中係設定為2.0mm。 As shown in FIG. 4, the metal layer 13 is formed by bonding an aluminum plate 23 made of aluminum or aluminum alloy to the other surface of the ceramic substrate 11. In this embodiment, as the aluminum plate 23 constituting the metal layer 13, a rolled plate of 4N aluminum having a purity of 99.99 mass% or more is used. Here, the metal layer The thickness of 13 (aluminum plate 23) is set within a range of 0.1 mm or more and 6.0 mm or less, and in the present embodiment, it is set to 2.0 mm.

散熱片31係用以將電源模組用基板10側之熱進行擴散者,於本實施形態中係如第1圖所示般,設置有供冷卻介質流通的流路32。 The heat sink 31 is used for diffusing the heat of the power module substrate 10 side, and in this embodiment, as shown in FIG. 1, a flow path 32 is provided for the cooling medium to circulate.

此散熱片31係以使構成金屬層13之鋁(於本實施形態中係純度99.99mass%以上之4N鋁)與構成散熱片31之鋁合金之Al以外的含有元素之濃度差成為1原子%以上般的材料所構成。 The heat sink 31 is such that the concentration difference of the elements other than Al constituting the aluminum layer of the metal layer 13 (in this embodiment, 4N aluminum with a purity of 99.99 mass% or more) and the aluminum alloy constituting the heat sink 31 becomes 1 atomic% Made of the above materials.

更佳係由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素作為Al以外之含有元素。 More preferably, one or more elements selected from Si, Cu, Mn, Fe, Mg, Zn, Ti, and Cr are included as elements other than Al.

再更佳係合計含有1原子%以上之由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素作為Al以外之含有元素,並且Si之含量為15原子%以下、Cu之含量為10原子%以下、Mn之含量為2原子%以下、Fe之含量為1原子%以下、Mg之含量為5原子%以下、Zn之含量為10原子%以下、Ti之含量為1原子%以下及Cr之含量為1原子%以下。 Even more preferably, it contains 1 atomic% or more of one or more elements selected from Si, Cu, Mn, Fe, Mg, Zn, Ti, and Cr as elements other than Al, and the content of Si is 15 atomic% or less, Cu content 10 atomic% or less, Mn content 2 atomic% or less, Fe content 1 atomic% or less, Mg content 5 atomic% or less, Zn content 10 atomic% or less, The content of Ti is 1 atomic% or less and the content of Cr is 1 atomic% or less.

於本實施形態中,散熱片31係以依JIS H 2118:2006所規定的壓鑄用鋁合金之ADC12所構成。另外,此ADC12係包含Cu為1.5mass%以上、3.5mass%以下、Si為9.6mass%以上、12.0mass%以下之範圍的鋁合金。 In the present embodiment, the heat sink 31 is composed of the ADC12 of the aluminum alloy for die casting specified in JIS H 2118:2006. In addition, the ADC12 series includes aluminum alloys in which Cu is 1.5 mass% or more and 3.5 mass% or less, and Si is 9.6 mass% or more and 12.0 mass% or less.

並且,於本實施形態之附有散熱片之電源模組用基板30中,金屬層13與散熱片31係藉由固相擴散 接合所接合。亦即,於本實施形態中,由於金屬層13係以純度99.99mass%以上之4N鋁所構成,並且散熱片31係以壓鑄用鋁合金之ADC12所構成,因此在此等金屬層13與散熱片31,鋁的純度不同,金屬層13係以高純度鋁材料所構成,散熱片31係以低純度鋁材料所構成。 Furthermore, in the substrate 30 for a power module with a heat sink of this embodiment, the metal layer 13 and the heat sink 31 are diffused by solid phase Joined. That is, in this embodiment, since the metal layer 13 is composed of 4N aluminum with a purity of 99.99 mass% or more, and the heat sink 31 is composed of the ADC 12 of aluminum alloy for die casting, the metal layer 13 and the heat dissipation The sheet 31 has different purity of aluminum. The metal layer 13 is made of high-purity aluminum material, and the heat sink 31 is made of low-purity aluminum material.

在此,將對於金屬層13與散熱片31之接合界面使用日本電子股份有限公司製JXA-8530F,並以SEM、EPMA所得之映像的觀察結果顯示於第2圖(a)~(c)。由第2圖(a)~(c)可確認於散熱片31中所包含之添加元素(Cu,Si)擴散至金屬層13側。另外,從接合界面往金屬層13側之擴散深度係Cu為10μm以上、Si為45μm以上。另外,Cu為25μm以上、Si為45μm以上亦可。 Here, JXA-8530F manufactured by JEOL Ltd. is used for the bonding interface between the metal layer 13 and the heat sink 31, and the observation results of the images obtained by SEM and EPMA are shown in FIGS. 2(a) to (c). It can be confirmed from FIGS. 2(a) to (c) that the added elements (Cu, Si) included in the heat sink 31 diffuse to the metal layer 13 side. In addition, the diffusion depth from the junction interface to the metal layer 13 side is 10 μm or more for Cu and 45 μm or more for Si. In addition, Cu may be 25 μm or more, and Si may be 45 μm or more.

接著,針對上述之本實施形態之附有散熱片之電源模組用基板30的製造方法,參照第3圖及第4圖進行說明。 Next, the method of manufacturing the heat sink-attached power module substrate 30 of the present embodiment described above will be described with reference to FIGS. 3 and 4.

(鋁板接合步驟S01) (Aluminum plate joining step S01)

首先,如第4圖所示般,將成為電路層12之鋁板22及成為金屬層13之鋁板23與陶瓷基板11進行接合。於本實施形態中,將由2N鋁之壓延板所構成的鋁板22及由4N鋁之壓延板所構成的鋁板23與由AlN所構成的陶瓷基板11分別藉由Al-Si系硬焊材料24進行接合。 First, as shown in FIG. 4, the aluminum plate 22 serving as the circuit layer 12 and the aluminum plate 23 serving as the metal layer 13 are bonded to the ceramic substrate 11. In this embodiment, the aluminum plate 22 made of a 2N aluminum rolled plate, the aluminum plate 23 made of a 4N aluminum rolled plate, and the ceramic substrate 11 made of AlN are each made of an Al-Si brazing material 24 Join.

於此鋁板接合步驟S01中,首先,於陶瓷基 板11之其中一面與另一面,分別經由Al-Si系硬焊材料24來層合鋁板22、鋁板23(鋁板層合步驟S11)。 In this aluminum plate bonding step S01, first, on the ceramic base One side and the other side of the plate 11 are respectively laminated with an aluminum plate 22 and an aluminum plate 23 via an Al-Si brazing material 24 (aluminum plate lamination step S11).

接著,藉由以對層合後的陶瓷基板11、鋁板22、鋁板23於層合方向負荷0.1MPa以上、3.5MPa以下之荷重的狀態,裝入真空或者氬環境之加熱爐內,在600℃以上、650℃以下保持0.5小時以上、3小時以下,而於陶瓷基板11與鋁板22、鋁板23之間形成熔融金屬區域(加熱步驟S12)。 Next, by loading the laminated ceramic substrate 11, the aluminum plate 22, and the aluminum plate 23 in the lamination direction with a load of 0.1 MPa or more and 3.5 MPa or less, it is placed in a heating furnace in a vacuum or argon environment at 600°C. Above and below 650°C for 0.5 hours or more and 3 hours or less, a molten metal region is formed between the ceramic substrate 11 and the aluminum plate 22 and the aluminum plate 23 (heating step S12).

其後,藉由進行冷卻而使熔融金屬區域凝固(凝固步驟S13)。以如此方式,將鋁板22與陶瓷基板11與鋁板23進行接合,而形成電路層12及金屬層13。藉此,製造本實施形態之電源模組用基板10。 Thereafter, the molten metal region is solidified by cooling (solidification step S13). In this way, the aluminum plate 22 and the ceramic substrate 11 and the aluminum plate 23 are joined to form the circuit layer 12 and the metal layer 13. With this, the power module substrate 10 of this embodiment is manufactured.

(散熱片接合步驟S02) (Sink bonding step S02)

接著,於電源模組用基板10之金屬層13的另一面(與陶瓷基板11之接合面相反側的面)接合散熱片31。 Next, the heat sink 31 is bonded to the other surface of the metal layer 13 of the power module substrate 10 (the surface opposite to the bonding surface of the ceramic substrate 11 ).

於此散熱片接合步驟S02中,首先,如第4圖所示般,於電源模組用基板10的另一面側層合散熱片31(散熱片層合步驟S21)。 In this heat sink bonding step S02, first, as shown in FIG. 4, the heat sink 31 is laminated on the other surface side of the power module substrate 10 (heat sink lamination step S21).

以對此電源模組用基板10與散熱片31之層合體於層合方向負荷0.3MPa以上、3.0MPa以下之荷重的狀態,裝入真空加熱爐之中。 In this state, the laminate of the power module substrate 10 and the heat sink 31 is loaded into the vacuum heating furnace in a state where the load in the lamination direction is 0.3 MPa or more and 3.0 MPa or less.

接著,在低純度鋁材料之固相線溫度(K)的90%以上、未達低純度鋁材料之固相線溫度的溫度下保持1小時 以上來進行固相擴散接合(固相擴散接合步驟S22)。另外,低純度鋁材料之固相線溫度(K)的90%係指以絕對溫度表示低純度鋁之固相線溫度時的90%之溫度。於本實施形態中,ADC12為低純度鋁材料,其固相線溫度為788K(515℃)。因而,加熱溫度係為固相線溫度的90%,亦即709.2K(436.2℃)以上、未達固相線溫度,亦即未達788K(515℃)。 Next, the temperature is kept at 90% or more of the solidus temperature (K) of the low-purity aluminum material and at a temperature that does not reach the solidus temperature of the low-purity aluminum material for 1 hour. The solid phase diffusion bonding is performed as described above (solid phase diffusion bonding step S22). In addition, 90% of the solidus temperature (K) of the low-purity aluminum material refers to the temperature of 90% when the solidus temperature of the low-purity aluminum is expressed in absolute temperature. In this embodiment, ADC12 is a low-purity aluminum material, and its solidus temperature is 788K (515°C). Therefore, the heating temperature is 90% of the solidus temperature, that is, more than 709.2K (436.2°C), and the solidus temperature is not reached, that is, less than 788K (515°C).

於本實施形態中,金屬層13與散熱片31之接合面係在預先去除該面之損傷成為平滑之後,進行固相擴散接合。另外,於此時之金屬層13及散熱片31之各自的接合面之表面粗度被設定在以算術平均粗度Ra(JIS B 0601(1994))計為0.5μm以下之範圍內。 In the present embodiment, the bonding surface of the metal layer 13 and the fins 31 is solid-phase diffusion bonding after the damage of the surface is removed in advance to become smooth. In addition, the surface roughness of the joint surface of the metal layer 13 and the heat sink 31 at this time is set to a range of 0.5 μm or less in terms of arithmetic average roughness Ra (JIS B 0601 (1994)).

以如此方式,製造本實施形態之附有散熱片之電源模組用基板30。 In this way, the heat sink-attached power module substrate 30 of this embodiment is manufactured.

(半導體元件接合步驟S03) (Semiconductor element bonding step S03)

接著,於電源模組用基板10之電路層12的其中一面藉由焊接而接合半導體元件3。 Next, the semiconductor element 3 is bonded to one side of the circuit layer 12 of the power module substrate 10 by soldering.

藉由以上步驟,而製造出第1圖所示之電源模組1。 Through the above steps, the power module 1 shown in FIG. 1 is manufactured.

依據如以上般之構成的本實施形態之附有散熱片之電源模組用基板30的製造方法,由於構成金屬層13之鋁材料為純度99.99mass%以上之4N鋁,構成散熱片31之鋁材料為ADC12(Cu:1.5mass%以上、3.5mass%以下、Si:9.6mass%以上、12.0mass%以下)所構成,因 此於固相擴散接合時,散熱片31之Cu及Si會朝金屬層13側擴散,而促進鋁之自我擴散。藉此,成為能夠以較短時間將金屬層與散熱片確實地進行固相擴散接合。 According to the manufacturing method of the substrate 30 for a power module with a heat sink of the present embodiment configured as above, since the aluminum material constituting the metal layer 13 is 4N aluminum having a purity of 99.99 mass% or more, the aluminum constituting the heat sink 31 The material is composed of ADC12 (Cu: 1.5mass% or more, 3.5mass% or less, Si: 9.6mass% or more, 12.0mass% or less), because During solid phase diffusion bonding, Cu and Si of the heat sink 31 diffuse toward the metal layer 13 to promote the self-diffusion of aluminum. This makes it possible to reliably perform solid-phase diffusion bonding of the metal layer and the heat sink in a short time.

接著,於本實施形態中,由於均以鋁材料所構成的金屬層13與散熱片31被固相擴散接合,因此如第2圖所示般,於散熱片31與金屬層13之接合界面並未形成異相。 Next, in this embodiment, since the metal layer 13 and the heat sink 31 both made of aluminum are solid-phase diffusion bonded, as shown in FIG. 2, at the junction interface of the heat sink 31 and the metal layer 13 No out of phase.

因而,即使在負荷熱循環的情況,亦無在接合界面處產生龜裂的疑慮,而可製造對於熱循環之接合可靠性優異的附有散熱片之電源模組用基板30。 Therefore, even in the case of a thermal cycle under load, there is no possibility of cracks at the bonding interface, and the substrate 30 for a power module with a heat sink with excellent bonding reliability for thermal cycles can be manufactured.

又,於本實施形態中,構成散熱片31之鋁材料為ADC12(Cu:1.5mass%以上、3.5mass%以下、Si:9.6mass%以上、12.0mass%以下)所構成,此等Cu及Si係促進鋁之自我擴散的作用效果優異,因此,成為可將均以鋁材料所構成的金屬層13與散熱片31以短時間確實地進行固相擴散接合。 Moreover, in this embodiment, the aluminum material constituting the heat sink 31 is composed of ADC12 (Cu: 1.5 mass% or more, 3.5 mass% or less, Si: 9.6 mass% or more, 12.0 mass% or less), such Cu and Si Since the effect of promoting the self-diffusion of aluminum is excellent, it becomes possible to reliably perform solid-phase diffusion bonding of the metal layer 13 and the heat sink 31 each composed of an aluminum material in a short time.

進而,由於在構成散熱片31之鋁材料中,Si之含量為12.0mass%以下(11.6原子%以下(換算值))、Cu之含量為3.5mass%以下(1.5原子%以下(換算值)),因此藉由此等之元素而可抑制接合界面硬達必要程度以上,可確實地製造對於熱循環之接合可靠性優異的附有散熱片之電源模組用基板。 Furthermore, in the aluminum material constituting the heat sink 31, the Si content is 12.0 mass% or less (11.6 atomic% or less (converted value)), and the Cu content is 3.5 mass% or less (1.5 atomic% or less (converted value)) Therefore, by these elements, it is possible to suppress the bonding interface to be harder than necessary, and it is possible to reliably manufacture a substrate for a power module with a heat sink, which is excellent in bonding reliability for thermal cycles.

又,由於是藉由將金屬層13與散熱片31進行層合,以於層合方向負荷0.3MPa以上、3.0MPa以下之 荷重的狀態,並在低純度鋁材料之固相線溫度(K)的90%以上、未達低純度鋁材料之固相線溫度的保持溫度下保持1小時以上,將金屬層13與散熱片31進行固相擴散接合,因此可促進鋁之擴散移動,而可將金屬層13與散熱片31確實地接合。 Furthermore, since the metal layer 13 and the heat sink 31 are laminated, the load in the lamination direction is 0.3 MPa or more and 3.0 MPa or less Loaded state, and maintained at a temperature above 90% of the solidus temperature (K) of the low-purity aluminum material and less than the holding temperature of the solidus temperature of the low-purity aluminum material for more than 1 hour, and the metal layer 13 and the heat sink 31 performs solid-phase diffusion bonding, so that the diffusion movement of aluminum can be promoted, and the metal layer 13 and the heat sink 31 can be reliably bonded.

於荷重為0.3MPa以上的情況,接合初期之接觸面積被充分確保,而可將金屬層13與散熱片31作良好地接合。又,於荷重為3.0MPa以下的情況,可抑制於金屬層13或散熱片31產生變形一事。 When the load is 0.3 MPa or more, the contact area at the initial stage of bonding is sufficiently ensured, and the metal layer 13 and the heat sink 31 can be bonded well. In addition, when the load is 3.0 MPa or less, deformation of the metal layer 13 or the heat sink 31 can be suppressed.

於保持溫度為低純度鋁材料之固相線溫度(K)的90%以上的情況,可確保充分的擴散速度,而可將金屬層13與散熱片31作良好地接合。於保持溫度為未達低純度鋁材料之固相線溫度的情況,由於無液相發生,且,可抑制於金屬層13或散熱片31產生變形一事,因此可將金屬層13與散熱片31確實地進行固相擴散接合。 When the holding temperature is 90% or more of the solidus temperature (K) of the low-purity aluminum material, a sufficient diffusion rate can be ensured, and the metal layer 13 and the heat sink 31 can be well bonded. When the holding temperature is less than the solidus temperature of the low-purity aluminum material, since no liquid phase occurs and deformation of the metal layer 13 or the heat sink 31 can be suppressed, the metal layer 13 and the heat sink 31 can be suppressed Solid-phase diffusion bonding is surely performed.

於保持時間為1小時以上的情況,可充分進行固相擴散,而可將金屬層13與散熱片31良好地接合。 In the case where the holding time is 1 hour or more, the solid phase diffusion can be sufficiently performed, and the metal layer 13 and the heat sink 31 can be bonded well.

進而,於本實施形態中,由於將接合前之金屬層13及散熱片31之接合面的損傷去除,並且將其表面粗度設定在以算術平均粗度Ra(JIS B 0601(1994))計為0.5μm以下之範圍內,因此使金屬層13與散熱片31確實地接觸,而可促進鋁原子、及散熱片31之添加元素(Cu,Si)的擴散移動,而可將金屬層13與散熱片31確實地接合。 Furthermore, in this embodiment, the damage of the bonding surface of the metal layer 13 and the heat sink 31 before bonding is removed, and the surface roughness is set to an arithmetic average roughness Ra (JIS B 0601 (1994)) Is within the range of 0.5 μm or less, so that the metal layer 13 and the heat sink 31 are reliably in contact, and the diffusion movement of aluminum atoms and the added elements (Cu, Si) of the heat sink 31 can be promoted, and the metal layer 13 and The heat sink 31 is surely joined.

以上,雖針對本發明之實施形態進行說明,但本發明並不限定於此,在不脫離其發明之技術性思想的範圍內可適當變更。 Although the embodiment of the present invention has been described above, the present invention is not limited to this, and can be appropriately changed without departing from the technical idea of the invention.

例如,金屬層及散熱片之材質並受本實施形態所限定,只要構成金屬層之接合面的鋁材料及構成散熱片之接合面的鋁材料中的任一方為鋁之純度高的高純度鋁材料,另一方為鋁之純度低的低純度鋁材料,將高純度鋁材料與低純度鋁材料之Al以外的含有元素之濃度差設為1原子%以上即可。 For example, the material of the metal layer and the heat sink is not limited by this embodiment, as long as either one of the aluminum material constituting the bonding surface of the metal layer and the aluminum material constituting the bonding surface of the heat sink is high purity aluminum with high purity The other material is a low-purity aluminum material with low purity of aluminum, and the difference in concentration of elements other than Al between the high-purity aluminum material and the low-purity aluminum material may be 1 atomic% or more.

具體而言,於本實施形態中,雖將金屬層作為以純度99.99mass%之4N鋁所構成者進行說明,但並不限定於此,亦可為以其他之純鋁或鋁合金所構成者。例如,亦可使用A1050或A1085等之純度99mass%以上之2N鋁。於此情況中,由於金屬層之初期的雜質濃度為高,因此接合溫度中之晶粒成長被抑制,而可期待晶界擴散,因此,成為可促進來自散熱片側之含有元素的擴散移動。 Specifically, in the present embodiment, although the metal layer is described as composed of 4N aluminum with a purity of 99.99 mass%, it is not limited to this, and may be composed of other pure aluminum or aluminum alloys . For example, 2N aluminum with a purity of 99 mass% or higher such as A1050 or A1085 can also be used. In this case, since the initial impurity concentration of the metal layer is high, the growth of crystal grains at the bonding temperature is suppressed, and the diffusion of grain boundaries can be expected. Therefore, it becomes possible to promote the diffusion movement of the element contained from the heat sink side.

再者,於本實施形態中,雖將散熱片作為以ADC12所構成者進行說明,但並不限定於此,亦可為以其他之純鋁或A3003或A6063等之鋁合金所構成者。 In addition, in this embodiment, although the heat sink is described as being composed of ADC12, it is not limited to this, and may be composed of other pure aluminum or aluminum alloys such as A3003 or A6063.

又,亦可散熱片側為高純度鋁材料,金屬層側為低純度鋁材料所構成。 Alternatively, the heat sink side may be made of high-purity aluminum material, and the metal layer side may be made of low-purity aluminum material.

又,於本實施形態中,雖以金屬層全體為鋁或鋁合金所構成者進行說明,但並不限定於此,例如第5 圖所示般,只要金屬層中與散熱片之接合面為鋁或鋁合金所構成即可。於此第5圖所示之附有散熱片之電源模組用基板130及電源模組101中,金屬層113係為層合有銅層113A與鋁層113B的構造,將陶瓷基板11與銅層113A接合,並將鋁層113B與散熱片131固相擴散接合。另外,於第5圖中,電路層112亦為層合有銅層112A與鋁層112B的構造,於鋁層112B經由焊錫層2來接合半導體元件3。 In this embodiment, although the entire metal layer is made of aluminum or aluminum alloy, it is not limited to this. For example, the fifth As shown in the figure, as long as the bonding surface between the metal layer and the heat sink is made of aluminum or aluminum alloy. In the power module substrate 130 and power module 101 with a heat sink shown in FIG. 5, the metal layer 113 is a structure in which a copper layer 113A and an aluminum layer 113B are laminated, and the ceramic substrate 11 and copper The layer 113A is bonded, and the aluminum layer 113B and the heat sink 131 are solid-phase diffusion bonded. In addition, in FIG. 5, the circuit layer 112 also has a structure in which a copper layer 112A and an aluminum layer 112B are laminated, and the semiconductor element 3 is joined to the aluminum layer 112B via the solder layer 2.

相同地,於本實施形態中,雖以散熱片全體為鋁或鋁合金所構成者進行說明,但並不限定於此,例如第6圖所示般,只要散熱片中與金屬層之接合面為鋁或鋁合金所構成即可。於此第6圖所示之附有散熱片之電源模組用基板230及電源模組201中,散熱片231係為層合有由鋁或鋁合金所構成的鋁層231B與由銅或銅合金所構成的散熱片主體231A的構造,將金屬層213與鋁層231B(散熱片231)固相擴散接合。 Similarly, in this embodiment, although the whole heat sink is made of aluminum or aluminum alloy, it is not limited to this. For example, as shown in FIG. 6, as long as the bonding surface between the heat sink and the metal layer It may be composed of aluminum or aluminum alloy. In the substrate 230 for a power module with a heat sink and the power module 201 shown in FIG. 6 here, the heat sink 231 is composed of an aluminum layer 231B composed of aluminum or an aluminum alloy laminated with copper or copper The structure of the heat sink body 231A made of an alloy solid-phase diffusion-bonds the metal layer 213 and the aluminum layer 231B (heat sink 231).

又,於本實施形態中,雖將構成電路層之鋁板作為以純度為99mass%之2N鋁所構成者進行說明,但並不限定於此,亦可為由純度99.99mass%以上之純鋁、或其他之純鋁或鋁合金所構成者。 In this embodiment, although the aluminum plate constituting the circuit layer is described as 2N aluminum with a purity of 99 mass%, it is not limited to this, and may be pure aluminum with a purity of 99.99 mass% or more. Or other pure aluminum or aluminum alloy.

進而,於本發明中,電路層之構造並無限定,可適當進行設計變更。例如,可由銅或銅合金所構成,亦可如第5圖所示之附有散熱片電源模組用基板130及電源模組101般,電路層112為銅層112A與鋁層112B之層合構 造。 Furthermore, in the present invention, the structure of the circuit layer is not limited, and design changes can be made as appropriate. For example, it may be composed of copper or a copper alloy, or as shown in FIG. 5 with the substrate 130 for a power module with a heat sink and the power module 101, the circuit layer 112 is a laminate of a copper layer 112A and an aluminum layer 112B Construct Made.

進而,於本實施形態中,雖將成為電路層及金屬層之鋁板與陶瓷基板作為使用Al-Si系硬焊材料來接合者進行說明,但並不限定於此,亦可使用過渡液相接合法(Transient Liquid Phase Bonding)、鑄造法、金屬黏貼法等進行接合。 Furthermore, in the present embodiment, although the aluminum plate and the ceramic substrate that are the circuit layer and the metal layer are joined by using an Al-Si brazing material, it is not limited to this, and a transition liquid phase junction may also be used. Legal (Transient Liquid Phase Bonding), casting method, metal bonding method, etc. for bonding.

又,於本實施形態中,雖將絕緣層作為以由AlN構成的陶瓷基板所構成者進行說明,但並不限定於此,亦可使用Si3N4或Al2O3等之其他的陶瓷基板。 In this embodiment, although the insulating layer is described as a ceramic substrate made of AlN, it is not limited to this, and other ceramics such as Si 3 N 4 or Al 2 O 3 may be used. Substrate.

再者,絕緣層、電路層、金屬層、散熱片的厚度並受本實施形態所限定,亦可適當進行設計變更。 In addition, the thicknesses of the insulating layer, the circuit layer, the metal layer, and the heat sink are also limited by this embodiment, and design changes can be made as appropriate.

〔實施例〕 [Examples]

針對為了確認本發明之有效性而進行的確認實驗進行說明。 A confirmation experiment conducted to confirm the effectiveness of the present invention will be described.

按照第3圖之流程圖記載的順序,來製作本發明例及比較例之附有散熱片之電源模組用基板。 According to the procedure described in the flowchart of FIG. 3, the heat sink-attached power module substrates of the present invention and the comparative examples were produced.

另外,陶瓷基板係使用以AlN所構成,且40mm×40mm、厚度0.635mm者。 The ceramic substrate is made of AlN, and has a size of 40 mm×40 mm and a thickness of 0.635 mm.

電路層係藉由將純度99mass%以上之2N鋁之壓延板(37mm×37mm、厚度0.6mm)使用Al-7.5mass%Si硬焊材料來接合於陶瓷基板所形成。 The circuit layer is formed by bonding a 2N aluminum rolled plate (37 mm×37 mm, thickness 0.6 mm) with a purity of 99 mass% or more to a ceramic substrate using an Al-7.5 mass% Si brazing material.

金屬層係藉由將由表1所示之鋁材料所構成的壓延板(37mm×37mm、厚度0.6mm)使用Al-7.5mass%Si硬焊材 料來接合於陶瓷基板所形成。 The metal layer is made of Al-7.5mass%Si brazing material by using a rolled plate (37mm×37mm, thickness 0.6mm) composed of the aluminum materials shown in Table 1. It is expected to be formed by bonding to a ceramic substrate.

散熱片係使用以表2記載之材質所構成,且50mm×50mm、厚度5mm者。 The heat sink is made of the materials described in Table 2, and is 50mm×50mm and 5mm thick.

金屬層與散熱片之固相擴散接合係以表3所示之條件進行實施。 The solid phase diffusion bonding of the metal layer and the heat sink is carried out under the conditions shown in Table 3.

又,製作以下之附有散熱片之電源模組用基板作為以往例1至3。 Furthermore, the following heat sink-attached power module substrates were produced as Conventional Examples 1 to 3.

藉由將成為電路層之2N鋁之壓延板(37mm×37mm、厚度0.6mm)與以AlN所構成之陶瓷基板(40mm×40mm、厚度0.635mm)與成為金屬層之4N鋁之壓延板(37mm×37mm、厚度0.6mm),經由Al-7.5mass%Si硬焊材料進行層合,以於層合方向以5kgf/cm2加壓的狀態,裝入真空加熱爐內,以650℃進行加熱30分鐘而進行接合,製作出電源模組用基板。 By using a 2N aluminum rolled plate (37mm × 37mm, thickness 0.6mm) as a circuit layer and a ceramic substrate (40mm × 40mm, thickness 0.635mm) made of AlN and a 4N aluminum rolled plate (37mm) as a metal layer ×37mm, thickness 0.6mm), laminated via Al-7.5mass%Si brazing material, placed in a vacuum heating furnace with a pressure of 5kgf/cm 2 in the lamination direction, and heated at 650°C for 30 The bonding is performed in minutes to produce a substrate for a power module.

並且,於以往例1中,將電源模組用基板與施加Ni鍍敷後的散熱片(A6063之壓延板、50mm×50mm、厚度5mm),經由Sn-Ag-Cu焊錫進行接合。 In addition, in the conventional example 1, the substrate for the power module and the heat sink after the Ni plating (rolled plate of A6063, 50 mm×50 mm, thickness 5 mm) were joined via Sn-Ag-Cu solder.

於以往例2中,將電源模組用基板與散熱片(A6063之壓延板、50mm×50mm、厚度5mm),經由Al-10mass%Si硬焊材料進行接合。 In the conventional example 2, the substrate for the power module and the heat sink (the calendered plate of A6063, 50 mm×50 mm, thickness 5 mm) were joined via an Al-10mass%Si brazing material.

於以往例3中,將電源模組用基板與散熱片(A6063之壓延板、50mm×50mm、厚度5mm),經由Cu箔(厚度:200μm)進行固相擴散接合。 In the conventional example 3, the substrate for the power module and the heat sink (the calender plate of A6063, 50 mm×50 mm, thickness 5 mm) were solid-phase diffusion bonded via Cu foil (thickness: 200 μm).

(含有元素之擴散距離) (Diffusion distance with elements)

進行所得之本發明例的散熱片與金屬層之接合界面附近的剖面觀察,測定從低純度鋁材料側朝高純度鋁材料側之Al以外的含有元素之擴散距離。將評估結果顯示於表4。 A cross-sectional observation near the junction interface of the obtained heat sink and metal layer of the present invention example was carried out, and the diffusion distance of elements other than Al from the low-purity aluminum material side to the high-purity aluminum material side was measured. The evaluation results are shown in Table 4.

含有元素之擴散距離係從低純度鋁材料與高純度鋁材料之接合界面朝向高純度鋁材料側進行以EPMA(日本電子股份有限公司製JXA-8530F)所致之線分析,測定距離與含有元素濃度,將含有元素濃度成為低純度鋁材料中所包含之含有元素的濃度之一半的距離作為擴散距離。 The diffusion distance of the element is measured by the line analysis by EPMA (JXA-8530F manufactured by JEOL Ltd.) from the junction interface of the low-purity aluminum material and the high-purity aluminum material toward the side of the high-purity aluminum material. For the concentration, the distance at which the concentration of the element contained becomes half of the concentration of the element contained in the low-purity aluminum material is taken as the diffusion distance.

(熱循環試驗) (Thermal cycle test)

熱循環試驗係使用冷熱衝擊試驗機ESPEC公司製TSB-51,對於試驗片(附有散熱片之電源模組),以液相(FLUORINERT),實施4000次之在-40℃ 5分鐘與在150℃ 5分鐘之熱循環。 For the thermal cycle test, TSB-51 manufactured by ESPEC Co., Ltd. is used. For the test piece (power module with heat sink), the liquid phase (FLUORINERT) is performed 4000 times at -40°C for 5 minutes and at 150 ℃ 5 minutes thermal cycle.

接著,將熱循環試驗前後之接合率以下述方式進行評估。又,目視評估熱循環試驗後之陶瓷破裂之有無。將評估結果顯示於表4。 Next, the bonding rate before and after the thermal cycle test was evaluated in the following manner. Also, visually evaluate the presence or absence of ceramic cracking after the thermal cycle test. The evaluation results are shown in Table 4.

(接合率) (Joint rate)

金屬層與散熱片之接合率係使用超音波探傷裝置(Hitachi Power Solutions公司製FineSAT200),並使用以下式子來求出。在此,初期接合面積係設為接合前之應 接合的面積(37mm平方)。於將超音波探傷影像作二值化處理後的影像中,剝離係以接合部內之白色部表示,因此,將此白色部的面積設為剝離面積。 The bonding rate between the metal layer and the heat sink is determined using an ultrasonic flaw detection device (FineSAT200 manufactured by Hitachi Power Solutions) and using the following formula. Here, the initial bonding area is assumed to be before bonding The joined area (37mm square). In the image obtained by binarizing the ultrasonic flaw detection image, the peeling is represented by a white portion in the joint portion. Therefore, the area of the white portion is taken as the peeling area.

(接合率(%))={(初期接合面積)-(剝離面積)}/(初期接合面積)×100 (Bonding rate (%)) = {(initial bonding area)-(peeling area)}/(initial bonding area) × 100

Figure 105106329-A0202-12-0022-1
Figure 105106329-A0202-12-0022-1

Figure 105106329-A0202-12-0023-2
Figure 105106329-A0202-12-0023-2

Figure 105106329-A0202-12-0024-3
Figure 105106329-A0202-12-0024-3

Figure 105106329-A0202-12-0025-4
Figure 105106329-A0202-12-0025-4

於以往例1中,於熱循環試驗後接合率大幅降低。可推測此乃因熱循環而於焊錫層發生了龜裂之故。 In the conventional example 1, the bonding rate greatly decreased after the thermal cycle test. It is speculated that this is due to cracks in the solder layer due to thermal cycling.

於以往例2中,於熱循環試驗後接合率大幅降低,於陶瓷基板確認到破裂。 In the conventional example 2, the bonding rate was greatly reduced after the thermal cycle test, and cracking was confirmed on the ceramic substrate.

又,於將金屬層與散熱片以相同純度之鋁材料構成的比較例1-3中,在上述之固相擴散條件下無法將金屬層與散熱片進行接合。 In addition, in Comparative Example 1-3 in which the metal layer and the heat sink are composed of aluminum materials of the same purity, the metal layer and the heat sink cannot be joined under the above-described solid-phase diffusion conditions.

相對於此,於本發明例中,任一者於熱循環 後接合率皆無大幅上昇,且,亦無確認到陶瓷破裂,而接合可靠性優異。 In contrast, in the examples of the present invention, either There was no significant increase in the post-bonding rate, and no ceramic cracking was confirmed, and the bonding reliability was excellent.

由以上內容,可確認依據本發明,可製造即使在負荷熱循環的情況亦可對在接合界面產生龜裂等一事作抑制的附有散熱片之電源模組用基板。 From the above, it can be confirmed that according to the present invention, a substrate for a power module with a heat sink can be manufactured that suppresses the occurrence of cracks at the bonding interface even in the case of thermal cycling under load.

〔產業上之可利用性〕 [Industry availability]

依據本發明之附有散熱片之電源模組用基板的製造方法,成為能夠以較短時間將金屬層與散熱片確實地進行固相擴散接合。又,由於散熱片與金屬層被固相擴散接合,因此即使在負荷熱循環的情況,亦無在接合界面處產生龜裂等的疑慮,而可得到對於熱循環之接合可靠性優異的附有散熱片之電源模組用基板。 According to the manufacturing method of the substrate for a power module with a heat sink according to the present invention, it is possible to reliably perform solid-phase diffusion bonding of the metal layer and the heat sink in a short time. In addition, since the heat sink and the metal layer are solid-phase diffusion-bonded, even in the case of load thermal cycling, there is no doubt that a crack or the like will occur at the bonding interface, and it is possible to obtain an excellent bonding reliability for thermal cycling. Substrate for power module of heat sink.

10‧‧‧電源模組用基板 10‧‧‧ substrate for power module

11‧‧‧陶瓷基板 11‧‧‧Ceramic substrate

12‧‧‧電路層 12‧‧‧ circuit layer

13‧‧‧金屬層 13‧‧‧Metal layer

22‧‧‧鋁板 22‧‧‧Aluminum plate

23‧‧‧鋁板 23‧‧‧Aluminum plate

24‧‧‧Al-Si系硬焊材料 24‧‧‧Al-Si brazing material

30‧‧‧附有散熱片之電源模組用基板 30‧‧‧Substrate for power module with heat sink

31‧‧‧散熱片 31‧‧‧heat sink

Claims (5)

一種附有散熱片之電源模組用基板的製造方法,其係具備有絕緣層、形成於此絕緣層之其中一面的電路層、形成於前述絕緣層之另一面的金屬層、以及被配置於此金屬層之與前述絕緣層相反側之面的散熱片之附有散熱片之電源模組用基板的製造方法,前述金屬層中與前述散熱片之接合面、及前述散熱片中與前述金屬層之接合面係以鋁或鋁合金所成之鋁材料所構成,構成前述金屬層之接合面的鋁材料及構成前述散熱片之接合面的鋁材料中的任一方為鋁之純度高的高純度鋁材料,另一方為鋁之純度低的低純度鋁材料,將前述高純度鋁材料與前述低純度鋁材料之Al以外的含有元素之濃度差設為1原子%以上,將前述金屬層與前述散熱片進行固相擴散接合,Al以外之含有元素從前述低純度鋁材料側朝前述高純度鋁材料側擴散。 A method for manufacturing a substrate for a power module with a heat sink, which includes an insulating layer, a circuit layer formed on one side of the insulating layer, a metal layer formed on the other side of the insulating layer, and is disposed A method of manufacturing a substrate for a power module with a heat sink attached to a heat sink on a surface of the metal layer opposite to the insulating layer, a bonding surface of the metal layer with the heat sink, and a heat sink with the metal The bonding surface of the layer is composed of an aluminum material made of aluminum or aluminum alloy. Either of the aluminum material constituting the bonding surface of the metal layer and the aluminum material constituting the bonding surface of the heat sink is high in purity of aluminum A pure aluminum material, the other is a low-purity aluminum material with low purity of aluminum, the concentration difference between the high-purity aluminum material and the low-purity aluminum material other than Al is set to 1 atomic% or more, and the metal layer and The heat sink performs solid-phase diffusion bonding, and elements other than Al diffuse from the low-purity aluminum material side to the high-purity aluminum material side. 如請求項1之附有散熱片之電源模組用基板的製造方法,其中,前述高純度鋁材料與前述低純度鋁材料係含有由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素作為Al以外之含有元素,前述高純度鋁材料中之前述Al以外的含有元素之合計量與前述低純度鋁材料中之前述Al以外的含有元素之合計量的差為1原子%以上。 The method for manufacturing a substrate for a power module with a heat sink according to claim 1, wherein the high-purity aluminum material and the low-purity aluminum material contain Si, Cu, Mn, Fe, Mg, Zn, Ti, and Cr One or two or more elements selected from the above are included as elements other than Al, and the total amount of elements other than Al in the high-purity aluminum material and the total amount of elements other than Al in the low-purity aluminum material are The difference in amount is 1 atomic% or more. 如請求項1之附有散熱片之電源模組用基板的製造方法,其中,前述低純度鋁材料係合計含有1原子%以上之由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素,並且Si之含量為15原子%以下、Cu之含量為10原子%以下、Mn之含量為2原子%以下、Fe之含量為1原子%以下、Mg之含量為5原子%以下、Zn之含量為10原子%以下、Ti之含量為1原子%以下及Cr之含量為1原子%以下。 The method for manufacturing a substrate for a power supply module with a heat sink according to claim 1, wherein the low-purity aluminum material contains a total of 1 atomic% or more of Si, Cu, Mn, Fe, Mg, Zn, Ti, and Cr One or more elements selected from among, and the content of Si is 15 atomic% or less, the content of Cu is 10 atomic% or less, the content of Mn is 2 atomic% or less, the content of Fe is 1 atomic% or less, Mg The content is 5 atomic% or less, the Zn content is 10 atomic% or less, the Ti content is 1 atomic% or less, and the Cr content is 1 atomic% or less. 如請求項2之附有散熱片之電源模組用基板的製造方法,其中,前述低純度鋁材料係合計含有1原子%以上之由Si、Cu、Mn、Fe、Mg、Zn、Ti及Cr中選出的1種或2種以上之元素,並且Si之含量為15原子%以下、Cu之含量為10原子%以下、Mn之含量為2原子%以下、Fe之含量為1原子%以下、Mg之含量為5原子%以下、Zn之含量為10原子%以下、Ti之含量為1原子%以下及Cr之含量為1原子%以下。 The method for manufacturing a substrate for a power supply module with a heat sink according to claim 2, wherein the low-purity aluminum material contains a total of 1 atomic% or more of Si, Cu, Mn, Fe, Mg, Zn, Ti, and Cr One or more elements selected from among, and the content of Si is 15 atomic% or less, the content of Cu is 10 atomic% or less, the content of Mn is 2 atomic% or less, the content of Fe is 1 atomic% or less, Mg The content is 5 atomic% or less, the Zn content is 10 atomic% or less, the Ti content is 1 atomic% or less, and the Cr content is 1 atomic% or less. 如請求項1至4中任一項之附有散熱片之電源模組用基板的製造方法,其中,藉由將前述金屬層與前述散熱片進行層合,以於層合方向負荷0.3MPa以上、3.0MPa以下之荷重的狀態,並在前述低純度鋁材料之固相線溫度(K)的90%以上、未達前述低純度鋁材料之固相線溫度的保持溫度下保持1小時以上,而將前述金屬層與前述散熱片進行固相擴散接合。 The method for manufacturing a substrate for a power module with a heat sink according to any one of claims 1 to 4, wherein by laminating the metal layer and the heat sink, a load of 0.3 MPa or more is applied in the lamination direction , Under a load of 3.0 MPa or less, and maintained at a temperature above 90% of the solidus temperature (K) of the aforementioned low-purity aluminum material and at a holding temperature below the solidus temperature of the aforementioned low-purity aluminum material, for more than 1 hour, On the other hand, the metal layer and the heat sink are subjected to solid phase diffusion bonding.
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