TWI667287B - Curable composition, conductive material, and connection structure - Google Patents

Curable composition, conductive material, and connection structure Download PDF

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TWI667287B
TWI667287B TW104114806A TW104114806A TWI667287B TW I667287 B TWI667287 B TW I667287B TW 104114806 A TW104114806 A TW 104114806A TW 104114806 A TW104114806 A TW 104114806A TW I667287 B TWI667287 B TW I667287B
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curable composition
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TW201546176A (en
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石澤英亮
久保田敬士
保井秀文
新城隆
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日商積水化學工業股份有限公司
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    • CCHEMISTRY; METALLURGY
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    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
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    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
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    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • HELECTRICITY
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    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • H01B1/22Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations

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Abstract

本發明提供一種可提高連接對象構件之接著性的硬化性組合物。 The present invention provides a curable composition that can improve the adhesion of members to be connected.

本發明之硬化性組合物包含硬化性化合物、及熱硬化劑與光硬化起始劑內之至少一種,該硬化性化合物係藉由使用由下述式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與上述第1化合物進行反應而獲得。 The curable composition of the present invention contains a curable compound and at least one of a thermal curing agent and a light curing initiator. The curable compound is obtained by using a compound represented by the following formula (11) and a diol compound. The first compound obtained by the reaction is obtained by reacting a second compound having an isocyanate group and an unsaturated double bond with the first compound.

[化1]R1OOC-X-COOR2‧‧‧(11) [化 1] R1OOC-X-COOR2‧‧‧ (11)

上述式(11)中,X表示碳數2~10之伸烷基或伸苯基,R1及R2分別表示氫原子或碳數1~4之烷基。 In the formula (11), X represents an alkylene group or a phenylene group having 2 to 10 carbon atoms, and R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

Description

硬化性組合物、導電材料及連接構造體 Curable composition, conductive material, and connection structure

本發明係關於一種接著性優異之硬化性組合物。又,本發明係關於一種使用上述硬化性組合物之導電材料及連接構造體。 The present invention relates to a curable composition having excellent adhesion. The present invention also relates to a conductive material and a connection structure using the curable composition.

包含硬化性化合物之硬化性組合物被廣泛用於電氣、電子、建築及車輛等各種用途。 The curable composition containing the curable compound is widely used in various applications such as electric, electronic, construction, and vehicles.

作為上述硬化性組合物之一例,於下述專利文獻1中揭示有包含(A)特定之苯氧基樹脂、(B)無機填充劑、及(C)矽烷偶合劑之硬化性組合物。相對於該硬化性組合物全體,上述(C)矽烷偶合劑之含量為1質量%以上且10質量%以下。 As an example of the said curable composition, the following patent document 1 discloses the curable composition containing (A) specific phenoxy resin, (B) inorganic filler, and (C) a silane coupling agent. The content of the (C) silane coupling agent is 1% by mass or more and 10% by mass or less with respect to the entire curable composition.

存在於上述硬化性組合物中調配導電性粒子之情況。包含導電性粒子之硬化性組合物被稱為異向性導電材料。上述異向性導電材料係用以連接各種連接對象構件而獲得各種連接構造體。 The conductive particles may be blended in the curable composition. A curable composition containing conductive particles is called an anisotropic conductive material. The anisotropic conductive material is used to connect various connection target members to obtain various connection structures.

上述異向性導電材料係用於例如可撓性印刷基板與玻璃基板之連接(FOG(Film on Glass,玻璃鍍膜))、半導體晶片與可撓性印刷基板之連接(COF(Chip on Film,薄膜覆晶))、半導體晶片與玻璃基板之連接(COG(Chip on Glass,玻璃覆晶))、以及可撓性印刷基板與玻璃環氧基板之連接(FOB(Film on Board,板鍍膜))等。 The anisotropic conductive material is used, for example, for connection between flexible printed substrates and glass substrates (FOG (Film on Glass, glass coating)), connection between semiconductor wafers and flexible printed substrates (COF (Chip on Film, film) (Flip-Chip)), the connection between semiconductor wafers and glass substrates (COG (Chip on Glass, glass-on-Chip)), and the connection between flexible printed substrates and glass epoxy substrates (FOB (Film on Board, plate coating)), etc. .

又,近年來,搭載有觸控面板之電子機器之使用增加。例如於行動電話、智慧型手機、汽車導航系統及個人電腦等電子機器中使用觸控面板。觸控面板等存在使用聚對苯二甲酸乙二酯(PET)膜作為連 接對象構件之情況。具體而言,觸控面板存在於周圍形成有銀電極等之PET膜與可撓性印刷基板藉由硬化性組合物而接合之情況。近年來,使用PET膜之連接構造體之市場規模擴大。 In addition, in recent years, the use of electronic devices equipped with a touch panel has increased. For example, touch panels are used in electronic devices such as mobile phones, smart phones, car navigation systems, and personal computers. Touch panels and the like use polyethylene terephthalate (PET) films Connection to the target component. Specifically, the touch panel may be a case where a PET film having a silver electrode or the like formed therearound and a flexible printed circuit board are joined by a curable composition. In recent years, the market size of connection structures using PET films has expanded.

作為上述異向性導電材料之一例,於下述專利文獻2中揭示有包含藉由加熱產生游離自由基之硬化劑、分子量10000以上之含羥基之樹脂、磷酸酯、自由基聚合性物質、及導電性粒子之異向性導電材料(硬化性組合物)。作為上述含羥基之樹脂,具體而言,可列舉聚乙烯醇縮丁醛樹脂、聚乙烯醇縮甲醛、聚醯胺、聚酯、酚系樹脂、環氧樹脂及苯氧基樹脂等聚合物。 As an example of the above-mentioned anisotropic conductive material, Patent Document 2 below includes a hardener that generates free radicals upon heating, a hydroxyl-containing resin having a molecular weight of 10,000 or more, a phosphate ester, a radical polymerizable substance, and Anisotropic conductive material (curable composition) of conductive particles. Specific examples of the hydroxyl-containing resin include polymers such as polyvinyl butyral resin, polyvinyl formal, polyvinylamine, polyester, phenol resin, epoxy resin, and phenoxy resin.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2013-23503號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2013-23503

[專利文獻2]日本專利特開2005-314696號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2005-314696

如專利文獻1、2所記載之先前之硬化性組合物具有連接對象構件之接著性較低之問題。尤其,先前之硬化性組合物具有於接著PET膜時PET膜容易剝離之問題。 The conventional curable composition described in Patent Documents 1 and 2 has a problem that the adhesion of the connection target member is low. In particular, the conventional curable composition has a problem that the PET film is easily peeled when the PET film is adhered.

本發明之目的在於提供可提高連接對象構件之接著性之硬化性組合物、以及提供使用上述硬化性組合物之導電材料及連接構造體。 An object of the present invention is to provide a curable composition capable of improving the adhesion of a member to be connected, and to provide a conductive material and a connection structure using the curable composition.

又,本發明之限定目的在於提供可提高PET膜之接著性,且即便接著有PET膜,亦可抑制PET膜之剝離的硬化性組合物,以及提供使用上述硬化性組合物之導電材料及連接構造體。再者,本發明之硬化性組合物適宜用於PET膜之接著,但本發明之硬化性組合物之用途並不限定於PET膜之接著。 In addition, a limited object of the present invention is to provide a curable composition that can improve the adhesion of a PET film, and can suppress peeling of the PET film even if a PET film is adhered, and to provide a conductive material and a connection using the curable composition. Construct. In addition, the curable composition of the present invention is suitable for bonding PET films, but the use of the curable composition of the present invention is not limited to the bonding of PET films.

根據本發明之較廣之態樣,提供一種硬化性組合物,其包含硬化性化合物及熱硬化劑,該硬化性化合物係使用由下述式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,使具有異氰酸酯基及不飽和雙鍵之第2化合物與上述第1化合物進行反應而獲得。 According to a broad aspect of the present invention, there is provided a hardenable composition containing a hardenable compound and a heat hardener, and the hardenable compound is a reaction using a compound represented by the following formula (11) and a diol compound The obtained first compound is obtained by reacting a second compound having an isocyanate group and an unsaturated double bond with the first compound.

[化1]R1OOC-X-COOR2‧‧‧(11) [化 1] R1OOC-X-COOR2‧‧‧ (11)

上述式(11)中,X表示碳數2~10之伸烷基或伸苯基,R1及R2分別表示氫原子或碳數1~4之烷基。 In the formula (11), X represents an alkylene group or a phenylene group having 2 to 10 carbon atoms, and R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

於本發明之硬化性組合物之某特定態樣中,上述式(11)所表示之化合物係下述式(11A)所表示之化合物。 In a specific aspect of the curable composition of the present invention, the compound represented by the formula (11) is a compound represented by the following formula (11A).

上述式(11A)中,R1及R2分別表示氫原子或碳數1~4之烷基。 In the formula (11A), R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

於本發明之硬化性組合物之某特定態樣中,上述式(11)所表示之化合物為對苯二甲酸、對苯二甲酸烷基酯、間苯二甲酸、或間苯二甲酸烷基酯。 In a specific aspect of the curable composition of the present invention, the compound represented by the above formula (11) is terephthalic acid, an alkyl terephthalate, isophthalic acid, or an alkyl isophthalate ester.

於本發明之硬化性組合物之某特定態樣中,上述二醇化合物包含1,6-己二醇,於另一特定態樣中,上述二醇化合物包含雙酚A或雙酚F,於又一特定態樣中,上述二醇化合物包含1,6-己二醇及雙酚A或雙酚F。 In a specific aspect of the curable composition of the present invention, the diol compound includes 1,6-hexanediol. In another specific aspect, the diol compound includes bisphenol A or bisphenol F. In yet another specific aspect, the diol compound includes 1,6-hexanediol and bisphenol A or bisphenol F.

於本發明之硬化性組合物之某特定態樣中,上述第2化合物具有(甲基)丙烯醯基作為含有不飽和雙鍵之基,於另一特定態樣中,上述第2化合物為(甲基)丙烯醯氧基烷氧基異氰酸酯。 In a specific aspect of the curable composition of the present invention, the second compound has a (meth) acrylfluorenyl group as a group containing an unsaturated double bond, and in another specific aspect, the second compound is ( (Meth) acryloxyalkoxy isocyanate.

於本發明之硬化性組合物之某特定態樣中,上述硬化性化合物之重量平均分子量為8000以上且50000以下。 In a specific aspect of the curable composition of the present invention, the weight-average molecular weight of the curable compound is 8,000 or more and 50,000 or less.

上述硬化性組合物較佳為包含四級銨鹽化合物或具有羥基之(甲基)丙烯酸系化合物。上述硬化性組合物較佳為包含上述四級銨鹽化合物。上述硬化性組合物較佳為包含上述具有羥基之(甲基)丙烯酸系化合物。 The curable composition preferably contains a quaternary ammonium salt compound or a (meth) acrylic compound having a hydroxyl group. The curable composition preferably contains the quaternary ammonium salt compound. The curable composition preferably contains the (meth) acrylic compound having a hydroxyl group.

於本發明之硬化性組合物之某特定態樣中,上述熱硬化劑為熱自由基產生劑。 In a specific aspect of the curable composition of the present invention, the thermal curing agent is a thermal radical generator.

於本發明之硬化性組合物之某特定態樣中,於使上述硬化性組合物於140℃及10秒之條件下硬化時,所獲得之硬化物之斷裂伸長率為500%以上。 In a specific aspect of the curable composition of the present invention, when the curable composition is cured at 140 ° C. and 10 seconds, the cured product has an elongation at break of 500% or more.

本發明之硬化性組合物適宜用於聚對苯二甲酸乙二酯膜之接著,較佳為聚對苯二甲酸乙二酯膜接著用之硬化性組合物。本發明之硬化性組合物於觸控面板中適宜用於聚對苯二甲酸乙二酯膜之接著,較佳為觸控面板中之聚對苯二甲酸乙二酯膜接著用之硬化性組合物。 The curable composition of the present invention is preferably used for the adhesion of a polyethylene terephthalate film, and is preferably a curable composition for the subsequent application of a polyethylene terephthalate film. The hardenable composition of the present invention is suitable for the adhesion of a polyethylene terephthalate film in a touch panel, and is preferably a hardenable combination for the adhesion of a polyethylene terephthalate film in a touch panel. Thing.

根據本發明之較廣之態樣,提供一種包含下述式(1)所表示之硬化性化合物與熱硬化劑之硬化性組合物。 According to a broad aspect of the present invention, a curable composition comprising a curable compound represented by the following formula (1) and a thermosetting agent is provided.

上述式(1)中,R1、R2分別表示氫原子或甲基,R3及R4分別表示氫原子、甲基或苯基,X表示碳數2~10之伸烷基或聚醚基,Y表示碳數2~10之伸烷基或伸苯基,n1及n2分別表示1或2,m表示式(1)所表示之硬化性化合物之重量平均分子量成為8000以上且50000以下之整數。 In the above formula (1), R1 and R2 each represent a hydrogen atom or a methyl group, R3 and R4 each represent a hydrogen atom, a methyl group, or a phenyl group, X represents an alkylene or polyether group having 2 to 10 carbon atoms, and Y represents An alkylene group or a phenylene group having 2 to 10 carbon atoms, n1 and n2 represent 1 or 2, respectively, and m represents a weight-average molecular weight of the hardening compound represented by formula (1), which is an integer of 8,000 or more and 50,000 or less.

根據本發明之較廣態樣,提供一種包含上述硬化性組合物與導電性粒子之導電材料。 According to a wider aspect of the present invention, there is provided a conductive material including the above-mentioned curable composition and conductive particles.

於本發明之導電材料之某特定態樣中,上述硬化性化合物之含量為50重量%以上。 In a specific aspect of the conductive material of the present invention, the content of the hardening compound is 50% by weight or more.

於本發明之導電材料之某特定態樣中,上述導電性粒子於導電性之外表面具有焊料。 In a specific aspect of the conductive material of the present invention, the conductive particles have solder on a surface other than the conductive surface.

根據本發明之較廣之態樣,提供一種連接構造體,其具備第1連接對象構件、第2連接對象構件、及連接上述第1連接對象構件與上述第2連接對象構件之連接部,且上述連接部係藉由使上述硬化性組合物硬化而形成。 According to a broad aspect of the present invention, there is provided a connection structure including a first connection target member, a second connection target member, and a connection portion connecting the first connection target member and the second connection target member, and The connection portion is formed by curing the curable composition.

於本發明之連接構造體之某特定態樣中,上述第1連接對象構件於表面具有第1電極,上述第2連接對象構件於表面具有第2電極,上述第1電極與上述第2電極藉由進行接觸而電性連接。 In a specific aspect of the connection structure of the present invention, the first connection target member has a first electrode on a surface, the second connection target member has a second electrode on a surface, and the first electrode and the second electrode are borrowed. They are electrically connected by contact.

根據本發明之較廣之態樣,提供一種連接構造體,其具備:第1連接對象構件,其於表面具有第1電極;第2連接對象構件,其於表面具有第2電極;及連接部,其連接上述第1連接對象構件與上述第2連接對象構件;且上述連接部係藉由使上述導電材料硬化而形成,上述第1電極與上述第2電極係藉由上述導電性粒子而電性連接。 According to a broad aspect of the present invention, there is provided a connection structure including: a first connection target member having a first electrode on a surface; a second connection target member having a second electrode on a surface; and a connection portion Wherein the first connection target member and the second connection target member are connected; and the connection portion is formed by hardening the conductive material, and the first electrode and the second electrode are electrically charged by the conductive particles Sexual connection.

本發明之硬化性組合物包含硬化性化合物與熱硬化劑,上述硬化性化合物係藉由使用由式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應而獲得,因此可提高連接對象構件之接著性。 The hardenable composition of the present invention contains a hardenable compound and a thermal hardener. The hardenable compound is a first compound obtained by using a reaction of a compound represented by formula (11) and a diol compound, and has an isocyanate. The second compound having a base and an unsaturated double bond is obtained by reacting the first compound with the first compound. Therefore, the adhesion of the member to be connected can be improved.

本發明之硬化性組合物包含式(1)所表示之硬化性化合物與熱硬化劑,因此可提高連接對象構件之接著性。 Since the curable composition of this invention contains the curable compound represented by Formula (1) and a thermosetting agent, the adhesiveness of the connection target member can be improved.

1‧‧‧導電性粒子 1‧‧‧ conductive particles

2‧‧‧基材粒子 2‧‧‧ substrate particles

3‧‧‧導電層 3‧‧‧ conductive layer

3A‧‧‧第2導電層 3A‧‧‧Second conductive layer

3B‧‧‧焊料層 3B‧‧‧Solder Layer

3Ba‧‧‧熔融之焊料層部分 3Ba‧‧‧ Molten solder layer

11‧‧‧導電性粒子 11‧‧‧ conductive particles

12‧‧‧焊料層 12‧‧‧ solder layer

21‧‧‧導電性粒子 21‧‧‧ conductive particles

51‧‧‧連接構造體 51‧‧‧ connected structure

52‧‧‧第1連接對象構件 52‧‧‧The first connection target component

52a‧‧‧第1電極 52a‧‧‧First electrode

53‧‧‧第2連接對象構件 53‧‧‧The second connection target component

53a‧‧‧第2電極 53a‧‧‧Second electrode

54‧‧‧連接部 54‧‧‧Connection Department

61‧‧‧連接構造體 61‧‧‧ Connected Structure

62‧‧‧第1連接對象構件 62‧‧‧The first connection target component

62a‧‧‧第1電極 62a‧‧‧first electrode

63‧‧‧第2連接對象構件 63‧‧‧The second connection target component

63a‧‧‧第2電極 63a‧‧‧Second electrode

64‧‧‧連接部 64‧‧‧Connection Department

71‧‧‧連接構造體 71‧‧‧ connected structure

72‧‧‧第1連接對象構件 72‧‧‧The first connection target component

73‧‧‧第2連接對象構件 73‧‧‧The second connection target component

74‧‧‧連接部 74‧‧‧ Connection Department

圖1係模式性地表示使用包含本發明之第1實施形態之硬化性組 合物與導電性粒子之導電材料獲得之連接構造體之前視剖視圖。 FIG. 1 is a view schematically showing the use of a hardening group including the first embodiment of the present invention. A front cross-sectional view of a connection structure obtained from a conductive material of a polymer and conductive particles.

圖2係模式性地表示使用本發明之第2實施形態之硬化性組合物獲得之連接構造體之前視剖視圖。 FIG. 2 is a schematic front cross-sectional view of a connection structure obtained using a curable composition according to a second embodiment of the present invention.

圖3係模式性地表示使用本發明之第3實施形態之硬化性組合物獲得之連接構造體之前視剖視圖。 FIG. 3 is a schematic cross-sectional view showing a front structure of a connection structure obtained using a curable composition according to a third embodiment of the present invention.

圖4係將圖1所示之連接構造體中之導電性粒子與電極之連接部分放大而模式性地表示之前視剖視圖。 FIG. 4 is an enlarged cross-sectional view of a conductive particle and an electrode in the connection structure shown in FIG.

圖5係表示可用於本發明之第1實施形態中使用之導電材料之導電性粒子之一例之剖視圖。 5 is a cross-sectional view showing an example of conductive particles that can be used for a conductive material used in the first embodiment of the present invention.

圖6係表示導電性粒子之變化例之剖視圖。 FIG. 6 is a cross-sectional view showing a modified example of the conductive particles.

圖7係表示導電性粒子之另一變化例之剖視圖。 FIG. 7 is a cross-sectional view showing another modified example of the conductive particles.

以下,說明本發明之詳細情況。 The details of the present invention will be described below.

(硬化性組合物) (Sclerosing composition)

本發明之硬化性組合物較佳為包含如下硬化性化合物,該硬化性化合物係藉由使用由下述式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應而獲得。藉由用以獲得該硬化性化合物之反應,例如可獲得式(1)所表示之硬化性化合物等。為了使上述硬化性化合物硬化,本發明之硬化性組合物包含熱硬化劑。 The curable composition of the present invention preferably contains a curable compound which is a first compound obtained by using a reaction of a compound represented by the following formula (11) and a diol compound, and A second compound having an isocyanate group and an unsaturated double bond is obtained by reacting the first compound. By using a reaction for obtaining the curable compound, for example, a curable compound represented by the formula (1) can be obtained. In order to harden the said hardening compound, the hardening composition of this invention contains a thermosetting agent.

[化4]R1OOC-X-COOR2‧‧‧(11) [化 4] R1OOC-X-COOR2‧‧‧ (11)

上述式(11)中,X表示碳數2~10之伸烷基或伸苯基,R1及R2分別表示氫原子或碳數1~4之烷基。 In the formula (11), X represents an alkylene group or a phenylene group having 2 to 10 carbon atoms, and R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

又,本發明之硬化性組合物較佳為包含下述式(1)所表示之硬化 性化合物。式(1)所表示之硬化性化合物例如可藉由如下方法等而獲得:使用由式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應。為了使上述硬化性化合物硬化,本發明之硬化性組合物包含熱硬化劑。 Moreover, it is preferable that the curable composition of this invention contains the hardening represented by following formula (1) Sexual compounds. The hardening compound represented by the formula (1) can be obtained, for example, by a method such as using a first compound obtained by reacting a compound represented by the formula (11) with a diol compound, and having an isocyanate group and The second compound having a saturated double bond reacts with the first compound. In order to harden the said hardening compound, the hardening composition of this invention contains a thermosetting agent.

上述式(1)中,R1、R2分別表示氫原子或甲基,R3及R4分別表示氫原子、甲基或苯基,X表示碳數2~10之伸烷基或聚醚基,Y表示碳數2~10之伸烷基或伸苯基,n1及n2分別表示1或2,m表示式(1)所表示之硬化性化合物之重量平均分子量成為8000以上且50000以下之整數。 In the above formula (1), R1 and R2 each represent a hydrogen atom or a methyl group, R3 and R4 each represent a hydrogen atom, a methyl group, or a phenyl group, X represents an alkylene or polyether group having 2 to 10 carbon atoms, and Y represents An alkylene group or a phenylene group having 2 to 10 carbon atoms, n1 and n2 represent 1 or 2, respectively, and m represents a weight-average molecular weight of the hardening compound represented by formula (1), which is an integer of 8,000 or more and 50,000 or less.

本發明之硬化性組合物由於採用上述組成,故而可提高連接對象構件之接著性。可認為其原因在於,上述硬化性化合物含有具有適度柔軟性之骨架構造。 Since the curable composition of the present invention has the above-mentioned composition, the adhesion of the connection target member can be improved. The reason for this is considered to be that the curable compound contains a skeleton structure having moderate flexibility.

進而,本發明之硬化性組合物由於採用上述組成,故而尤其因上述硬化性化合物之構造而可提高聚對苯二甲酸乙二酯(PET)膜之接著性。可認為其原因在於,上述硬化性化合物不僅含有具有適度柔軟性之骨架構造,而且含有與PET類似之構造。 Furthermore, since the curable composition of the present invention has the above-mentioned composition, the adhesion of a polyethylene terephthalate (PET) film can be improved particularly by the structure of the curable compound. The reason is considered to be that the above-mentioned curable compound contains not only a skeleton structure having a moderate flexibility but also a structure similar to PET.

本發明之硬化性組合物尤其可大大獲得PET膜之接著性之提高效果,亦可獲得其他連接對象構件之接著性之提高效果。 In particular, the curable composition of the present invention can greatly improve the adhesiveness of a PET film, and can also improve the adhesiveness of other members to be connected.

又,於使用本發明之硬化性組合物將連接對象構件連接時,所獲得之連接構造體即便暴露於高溫下或高濕下,亦不易產生剝離。 Moreover, when the connection target member is connected using the curable composition of the present invention, the obtained connection structure does not easily peel off even when exposed to high temperature or high humidity.

上述硬化性組合物包含上述熱硬化劑。藉由加熱使上述硬化性 組合物硬化,藉此連接對象構件之接著性提高。上述硬化性組合物不含或包含上述光硬化起始劑。就於藉由光之照射而使硬化進行後,藉由加熱進行硬化,藉此抑制硬化性組合物之過度流動的觀點而言,上述硬化性組合物較佳為包含上述光硬化起始劑。另一方面,就增加加熱引起之硬化之比率而進一步提高連接對象構件之接著性之觀點而言,上述硬化性組合物亦可不含上述光硬化起始劑。若不使用上述光硬化起始劑,則為了使上述硬化性組合物硬化可不進行光之照射而僅進行加熱,因此連接構造體之製造效率提高。 The said curable composition contains the said thermosetting agent. Hardenability by heating The composition is hardened, thereby improving the adhesion of the connection target member. The said curable composition does not contain or contain the said photohardening initiator. It is preferable that the said hardening composition contains the said light hardening initiator from a viewpoint of hardening by hardening after hardening by irradiation of light, and hardening by hardening. On the other hand, from the viewpoint of increasing the ratio of hardening due to heating to further improve the adhesion of the connection target member, the hardenable composition may not contain the photohardening initiator. If the photo-curing initiator is not used, in order to harden the curable composition, only the heating may be performed without irradiation of light, so that the production efficiency of the connection structure is improved.

於使上述硬化性組合物於140℃及10秒之條件下硬化時,所獲得之硬化物之斷裂伸長率較佳為500%以上,更佳為700%以上。又,於使下述導電材料中所含之硬化性組合物於140℃及10秒之條件下硬化時,所獲得之硬化物之斷裂伸長率較佳為500%以上,更佳為700%以上。若上述斷裂伸長率為上述下限以上,則可進一步提高連接對象構件之接著性,尤其可進一步提高PET膜之接著性。再者,關於上述斷裂伸長率之測定時之導電材料中所含之硬化性組合物,可使用調配導電材料時所使用之硬化性組合物(除導電性粒子以外之各調配成分之混合物),亦可使用自導電材料去除導電性粒子之硬化性組合物。 When the above-mentioned curable composition is cured under the conditions of 140 ° C. and 10 seconds, the elongation at break of the obtained cured product is preferably 500% or more, more preferably 700% or more. In addition, when the curable composition contained in the following conductive material is cured at 140 ° C. and 10 seconds, the elongation at break of the obtained cured product is preferably 500% or more, and more preferably 700% or more. . When the elongation at break is greater than or equal to the above lower limit, the adhesion of members to be connected can be further improved, and in particular, the adhesion of the PET film can be further improved. In addition, regarding the curable composition contained in the conductive material at the time of measuring the elongation at break, the curable composition (a mixture of various formulation components other than the conductive particles) used when the conductive material is prepared, A curable composition that removes conductive particles from a conductive material may also be used.

上述斷裂伸長率係使用拉伸試驗機將上述硬化物於23℃及拉伸速度1mm/分鐘及夾頭間距離40mm之條件下拉伸時之斷裂時夾頭間距離之伸長率之值。 The elongation at break refers to the value of the elongation at the distance between the chucks when the hardened product is stretched under conditions of 23 ° C., a tensile speed of 1 mm / min, and a distance between the chucks using a tensile tester.

為了進一步提高接著性,本發明之硬化性組合物較佳為包含四級銨鹽化合物或具有羥基之(甲基)丙烯酸系化合物。於此情形時,為了有效地提高接著性,本發明之硬化性組合物亦可包含上述四級銨鹽化合物與上述具有羥基之(甲基)丙烯酸系化合物之兩者。為了進一步提高接著性,進而為了抑制高溫下之剝離,本發明之硬化性組合物較佳為包含上述四級銨鹽化合物。為了進一步提高接著性,本發明之硬 化性組合物較佳為包含上述具有羥基之(甲基)丙烯酸系化合物。 In order to further improve adhesion, the curable composition of the present invention preferably contains a quaternary ammonium salt compound or a (meth) acrylic compound having a hydroxyl group. In this case, in order to effectively improve adhesion, the curable composition of the present invention may include both the above-mentioned quaternary ammonium salt compound and the above-mentioned (meth) acrylic compound having a hydroxyl group. In order to further improve adhesion and to suppress peeling at high temperatures, the curable composition of the present invention preferably contains the above-mentioned quaternary ammonium salt compound. In order to further improve the adhesion, the present invention The chemical composition preferably contains the above-mentioned (meth) acrylic compound having a hydroxyl group.

以下,對可用於本發明之硬化性組合物之各成分之詳細情況進行說明。 Hereinafter, details of each component which can be used for the curable composition of this invention are demonstrated.

[硬化性化合物] [Sclerosing compound]

上述硬化性化合物係藉由使用由式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應而獲得。上述反應為脫水縮合反應或脫醇反應。上述式(11)所表示之化合物可僅使用一種,亦可併用兩種以上。上述二醇化合物可僅使用一種,亦可併用兩種以上。為了獲得上述硬化性化合物,上述第1化合物可僅使用一種,亦可併用兩種以上。為了獲得上述硬化性化合物,上述第2化合物可僅使用一種,亦可併用兩種以上。 The hardenable compound is obtained by using a first compound obtained by reacting a compound represented by formula (11) with a diol compound, and performing a second compound having an isocyanate group and an unsaturated double bond with the first compound. Obtained by reaction. The above reaction is a dehydration condensation reaction or a dealcoholization reaction. The compound represented by the formula (11) may be used alone or in combination of two or more. These diol compounds may be used alone or in combination of two or more. In order to obtain the curable compound, the first compound may be used alone, or two or more kinds may be used in combination. In order to obtain the curable compound, the second compound may be used alone or in combination of two or more.

上述硬化性化合物之重量平均分子量較佳為8000以上,更佳為10000以上,且較佳為50000以下,更佳為30000以下。若上述重量平均分子量為上述下限以上,則連接對象構件之接著性進一步提高。若上述重量平均分子量為上述上限以下,則硬化性化合物與其他成分之相溶性提高。 The weight-average molecular weight of the curable compound is preferably 8,000 or more, more preferably 10,000 or more, and more preferably 50,000 or less, and more preferably 30,000 or less. When the said weight average molecular weight is more than the said minimum, the adhesiveness of the connection target member will improve further. When the said weight average molecular weight is below the said upper limit, the compatibility of a hardenable compound and another component will improve.

上述重量平均分子量表示藉由凝膠滲透層析法(GPC)測定之聚苯乙烯換算時之重量平均分子量。上述重量平均分子量可藉由島津製作所公司製造之「Prominence GPC系統」,於溶劑THF(tetrahydrofuran,四氫呋喃)、流量1mL/min、檢測器:示差折射之條件下測定。 The said weight average molecular weight shows the weight average molecular weight at the time of polystyrene conversion measured by the gel permeation chromatography (GPC). The above-mentioned weight average molecular weight can be measured under conditions of a solvent THF (tetrahydrofuran, tetrahydrofuran), a flow rate of 1 mL / min, and a detector: differential refraction using a "Prominence GPC system" manufactured by Shimadzu Corporation.

上述式(11)中之R1及R2分別表示氫原子或碳數1~4之烷基。上述式(11)中之R1及R2分別可為氫原子,亦可為碳數1~4之烷基。 R1 and R2 in the formula (11) each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms. R1 and R2 in the formula (11) may each be a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述式(11)中之X較佳為伸苯基,上述式(11)所表示之化合物較佳為下述式(11A)所表示之化合物。就進一步提高連接 對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述硬化性組合物較佳為包含如下硬化性化合物,該硬化性化合物係藉由使用由下述式(11A)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應而獲得。 From the viewpoint of further improving the adhesiveness of the connection target member, especially the PET film, X in the formula (11) is preferably a phenyl group, and the compound represented by the formula (11) is preferably A compound represented by the following formula (11A). To further improve the connection From the standpoint of improving the adhesiveness of the target member, particularly the PET film, the curable composition preferably contains a curable compound represented by the following formula (11A) by using the curable compound. The first compound obtained by the reaction of the compound and the diol compound is obtained by reacting a second compound having an isocyanate group and an unsaturated double bond with the first compound.

上述式(11A)中,R1及R2分別表示氫原子或碳數1~4之烷基。 In the formula (11A), R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述式(11)所表示之化合物較佳為對苯二甲酸、對苯二甲酸烷基酯、間苯二甲酸、或間苯二甲酸烷基酯。即,上述式(11)所表示之化合物較佳為下述式(11AA)或下述式(11AB)所表示之化合物。 From the viewpoint of further improving the adhesion of members to be connected, especially the PET film, the compound represented by the formula (11) is preferably terephthalic acid, an alkyl terephthalate, and m-benzene. Dicarboxylic acid, or alkyl isophthalate. That is, the compound represented by the formula (11) is preferably a compound represented by the following formula (11AA) or the following formula (11AB).

上述式(11AA)中,R1及R2分別表示氫原子或碳數1~4之烷基。 In the formula (11AA), R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

上述式(11AB)中,R1及R2分別表示氫原子或碳數1~4之烷基。 In the formula (11AB), R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.

就獲得硬化性化合物時之反應性優異而言,於上述式(11)、(11A)、(11AA)及(11AB)中之R1及R2分別為碳數1~4之烷基之情形 時,烷基之碳數較佳為3以下,更佳為2以下(甲基或乙基),進而較佳為1(甲基)。 When the reactivity at the time of obtaining a hardening compound is excellent, when R1 and R2 in the said Formula (11), (11A), (11AA), and (11AB) are an alkyl group of 1-4 carbons, respectively In this case, the number of carbon atoms of the alkyl group is preferably 3 or less, more preferably 2 or less (methyl or ethyl), and even more preferably 1 (methyl).

作為用以獲得上述第1化合物之上述二醇化合物,可列舉1,4-丁二醇、1,5-戊二醇、1,6-己二醇、1,7-庚二醇及1,8-辛二醇等。 Examples of the diol compound used to obtain the first compound include 1,4-butanediol, 1,5-pentanediol, 1,6-hexanediol, 1,7-heptanediol, and 1, 8-octanediol and the like.

又,於本發明之硬化性組合物之某特定態樣中,上述硬化性組合物較佳為含有由下述式(11B)所表示之化合物與二醇化合物之反應所獲得之第3化合物。下述式(11B)所表示之化合物為二羧酸或二羧酸酯。上述反應為脫水縮合反應或脫醇反應。又,於本發明之硬化性組合物之某特定態樣中,上述硬化性組合物較佳為含有藉由使用由上述式(11A)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應而獲得的硬化性化合物;及藉由使用由下述式(11B)所表示之化合物與二醇化合物之反應所獲得之第3化合物,並使具有異氰酸酯基及不飽和雙鍵之第4化合物(與第2化合物為相同種類)與該第3化合物進行反應而獲得的硬化性化合物;或者含有藉由使用由上述式(11A)所表示之化合物、下述式(11B)所表示之化合物及二醇化合物之反應所獲得之第5化合物,並使具有異氰酸酯基及不飽和雙鍵之第6化合物(與第2化合物為相同種類)與該第5化合物進行反應而獲得的硬化性化合物。藉由使用該等兩種硬化性化合物,可有效地提高連接對象構件之接著性,尤其有效地提高PET膜之接著性。 In a specific aspect of the curable composition of the present invention, the curable composition preferably contains a third compound obtained by a reaction of a compound represented by the following formula (11B) and a diol compound. The compound represented by the following formula (11B) is a dicarboxylic acid or a dicarboxylic acid ester. The above reaction is a dehydration condensation reaction or a dealcoholization reaction. Moreover, in a specific aspect of the curable composition of the present invention, it is preferable that the curable composition contains a first compound obtained by using a reaction of a compound represented by the formula (11A) and a diol compound. Compounds, and a hardening compound obtained by reacting a second compound having an isocyanate group and an unsaturated double bond with the first compound; and using a compound represented by the following formula (11B) and a diol compound The third compound obtained by the reaction, and a hardening compound obtained by reacting a fourth compound (the same kind as the second compound) having an isocyanate group and an unsaturated double bond with the third compound; or containing a hardening compound A fifth compound obtained by reacting a compound represented by the above formula (11A), a compound represented by the following formula (11B), and a diol compound, and a sixth compound (with an isocyanate group and an unsaturated double bond) The second compound is the same kind) and is a curable compound obtained by reacting with the fifth compound. The use of these two hardening compounds can effectively improve the adhesion of members to be connected, especially the adhesion of PET films.

R1OOC-X-COOR2‧‧‧式(11B) R1OOC-X-COOR2‧‧‧type (11B)

上述式(11B)中,R1及R2分別表示氫原子或碳數1~4之烷基,X表示碳數2~10之伸烷基。 In the above formula (11B), R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, and X represents an alkylene group having 2 to 10 carbon atoms.

第1化合物1及第3化合物可分別合成而混合,亦可於反應時使第3化合物與上述式(11A)所表示之化合物一併進行反應。較佳為於反應時與上述式(11A)所表示之化合物一併進行反應。 The first compound 1 and the third compound may be separately synthesized and mixed, or the third compound may be reacted with the compound represented by the formula (11A) at the time of the reaction. It is preferable to perform the reaction together with the compound represented by the formula (11A) during the reaction.

關於上述式(11B)所表示之化合物,作為更佳之化合物係R1及R2表示氫原子或甲基、X表示碳數3~5之伸烷基之化合物,作為進而較佳之化合物係R1及R2表示甲基、X表示碳數4之伸烷基之化合物。 Regarding the compound represented by the above formula (11B), more preferable compounds are those in which R1 and R2 represent a hydrogen atom or a methyl group, and X represents an alkylene group having 3 to 5 carbon atoms, and further preferable compounds are represented by R1 and R2 Methyl and X represent a compound having an alkylene group having 4 carbon atoms.

就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,用以獲得上述第1化合物之上述二醇化合物較佳為下述式(12)所表示之化合物、具有(甲基)丙烯醯基之化合物、聚酯多元醇化合物或聚醚多元醇化合物,更佳為下述式(12)所表示之化合物或聚醚多元醇化合物。就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,用以獲得上述第1化合物之上述二醇化合物較佳為包含下述式(12)所表示之化合物。 From the viewpoint of further improving the adhesiveness of the connection target member, particularly the PET film, the diol compound used to obtain the first compound is preferably a compound represented by the following formula (12), The (meth) acrylfluorenyl compound, polyester polyol compound or polyether polyol compound is more preferably a compound represented by the following formula (12) or a polyether polyol compound. From the viewpoint of further improving the adhesiveness of the connection target member, particularly the PET film, the diol compound used to obtain the first compound preferably contains a compound represented by the following formula (12).

[化9]HO-R-OH‧‧‧(12) [化 9] HO-R-OH‧‧‧ (12)

上述式(12)中,R表示碳數2~10之伸烷基或聚醚基。上述式(12)中,R亦可表示碳數2~10之伸烷基。作為上述式(12)中之R,可列舉伸乙基、伸丙基、伸丁基、伸戊基、伸己基、伸庚基、伸辛基、伸壬基及伸癸基等。就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述式(12)中之R之碳數較佳為6。即,上述式(12)所表示之化合物較佳為下述式(12A)所表示之化合物。即,用以獲得上述第1化合物之上述二醇化合物及用以獲得上述第3化合物之上述二醇化合物尤佳為包含1,6-己二醇。 In the formula (12), R represents an alkylene group or a polyether group having 2 to 10 carbon atoms. In the formula (12), R may also represent an alkylene group having 2 to 10 carbon atoms. Examples of R in the formula (12) include ethylene, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, and decyl. From the viewpoint of further improving the adhesiveness of the connection target member, especially the PET film, the number of carbon atoms of R in the formula (12) is preferably 6. That is, the compound represented by the formula (12) is preferably a compound represented by the following formula (12A). That is, it is particularly preferable that the diol compound used to obtain the first compound and the diol compound used to obtain the third compound include 1,6-hexanediol.

就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述第2化合物較佳為具有(甲基)丙烯醯基作為含有不飽和雙鍵之基。 The second compound preferably has a (meth) acrylfluorenyl group as a group containing an unsaturated double bond from the viewpoint of further improving the adhesiveness of the connection target member, particularly the PET film.

作為用以獲得上述第1化合物之上述二醇化合物,亦可列舉雙酚A或雙酚F等。就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述二醇化合物較佳為包含雙酚A或雙酚F。就更進一步提高連接對象構件之接著性、尤其更進一步提高PET膜之接著性之觀點而言,上述二醇化合物較佳為包含1,6-己二醇及雙酚A或雙酚F。於該較佳形態中,可僅使用雙酚A,亦可僅使用雙酚F,還可併用雙酚A與雙酚F。 Examples of the diol compound used to obtain the first compound include bisphenol A and bisphenol F. The diol compound preferably contains bisphenol A or bisphenol F from the viewpoint of further improving the adhesiveness of the member to be connected, particularly the adhesiveness of the PET film. From the viewpoint of further improving the adhesiveness of the member to be connected, particularly the adhesiveness of the PET film, the diol compound preferably contains 1,6-hexanediol and bisphenol A or bisphenol F. In this preferred embodiment, only bisphenol A or bisphenol F may be used, and bisphenol A and bisphenol F may be used in combination.

作為上述二醇化合物,亦可列舉聚醚多元醇化合物等。作為聚醚多元醇,較佳為丙二醇或乙二醇等二官能伸烷基二醇。又,上述聚醚多元醇化合物之分子量較佳為500以上,更佳為600以上,且較佳為2000以下,更佳為1500以下。 Examples of the diol compound include polyether polyol compounds. The polyether polyol is preferably a difunctional alkylene glycol such as propylene glycol or ethylene glycol. The molecular weight of the polyether polyol compound is preferably 500 or more, more preferably 600 or more, and more preferably 2000 or less, and more preferably 1500 or less.

作為上述二醇化合物,亦可列舉聚酯多元醇化合物。聚酯多元醇化合物係藉由使羧酸與多元醇進行脫水縮合而獲得。作為羧酸,較佳為己二酸、苯二甲酸。作為多元醇,較佳為乙二醇、1,4-丁二醇、1,6-己二醇。又,聚酯多元醇化合物之分子量較佳為500以上,更佳為600以上,且較佳為2000以下,更佳為1500以下。 Examples of the diol compound include polyester polyol compounds. The polyester polyol compound is obtained by dehydrating and condensing a carboxylic acid and a polyol. The carboxylic acid is preferably adipic acid or phthalic acid. The polyhydric alcohol is preferably ethylene glycol, 1,4-butanediol, or 1,6-hexanediol. The molecular weight of the polyester polyol compound is preferably 500 or more, more preferably 600 or more, and more preferably 2000 or less, and even more preferably 1500 or less.

上述二醇化合物可分別與式(11A)所表示之化合物或上述式(11B)所表示之化合物進行反應,亦可進行混合而與式(11A)所表示之化合物或上述式(11B)所表示之化合物進行反應。 The diol compound may be reacted with the compound represented by formula (11A) or the compound represented by formula (11B), or may be mixed with the compound represented by formula (11A) or represented by formula (11B). The compounds are reacted.

於用以獲得上述第1化合物之上述二醇化合物100重量%中,上述式(12)所表示之化合物或1,6-己二醇之含量較佳為0重量%(未使用)以上,更佳為10重量%以上,進而較佳為20重量%以上,且較佳為100重量%(總量)以下,更佳為80重量%以下。於用以獲得上述第1化合物之上述二醇化合物100重量%中,雙酚A及雙酚F之含量較佳為0重量%(未使用)以上,更佳為20重量%以上,且較佳為100重量%(總量)以下,更佳為80重量%以下。 In 100% by weight of the diol compound used to obtain the first compound, the content of the compound represented by the formula (12) or 1,6-hexanediol is preferably 0% by weight (unused), more preferably It is preferably 10% by weight or more, more preferably 20% by weight or more, still more preferably 100% by weight (total amount) or less, and even more preferably 80% by weight or less. The content of bisphenol A and bisphenol F in 100% by weight of the above-mentioned diol compound used to obtain the first compound is preferably 0% by weight (unused), more preferably 20% by weight, and more preferably The content is 100% by weight or less, and more preferably 80% by weight or less.

作為上述第2化合物,只要具有異氰酸酯基及不飽和雙鍵,則無特別限定。作為上述第2化合物之具體例,可列舉(甲基)丙烯醯氧基烷氧基異氰酸酯、異氰酸1,1-(雙丙烯醯氧基甲基)乙酯、及甲基丙烯酸2-(2-異氰酸酯基乙氧基)乙酯等。 The second compound is not particularly limited as long as it has an isocyanate group and an unsaturated double bond. Specific examples of the second compound include (meth) acryloxyalkoxy isocyanate, 1,1- (bisacryloxymethyl) ethyl isocyanate, and 2- (methacrylic acid) 2-isocyanate ethoxy) ethyl ester and the like.

就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述第2化合物較佳為(甲基)丙烯醯氧基烷氧基異氰酸酯、甲基丙烯酸2-(2-異氰酸酯基乙氧基)乙酯,更佳為甲基丙烯酸2-(2-異氰酸酯基乙氧基)乙酯。 From the viewpoint of further improving the adhesiveness of the connection target member, and particularly the adhesiveness of the PET film, the second compound is preferably (meth) acryloxyalkoxy isocyanate, or methacrylic acid 2- (2 -Isocyanate ethoxy) ethyl ester, more preferably 2- (2-isocyanate ethoxy) ethyl methacrylate.

上述式(1)所表示之硬化性化合物例如可藉由使用由式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應之方法等而獲得。於此情形時,以獲得式(1)所表示之硬化性化合物之方式適當選擇式(11)所表示之化合物、二醇化合物及第2反應物等。上述式(1)所表示之硬化性化合物例如亦可藉由除使用由式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,使具有異氰酸酯基及不飽和雙鍵之第2化合物與該第1化合物進行反應之方法以外之方法而獲得。 The hardening compound represented by the formula (1) can be obtained by, for example, using a first compound obtained by reacting a compound represented by the formula (11) with a diol compound, It is obtained by a method of reacting the 2 compound with the first compound and the like. In this case, the compound represented by the formula (11), the diol compound, the second reactant, and the like are appropriately selected so as to obtain the curable compound represented by the formula (1). The hardening compound represented by the above formula (1) can be made into an isocyanate group and an unsaturated double bond by, for example, using a first compound obtained by reacting the compound represented by the formula (11) with a diol compound. It is obtained by a method other than a method of reacting the second compound with the first compound.

上述式(1)中之X較佳為伸烷基,亦較佳為聚醚基。上述式(1)所表示之硬化性化合物較佳為含有伸烷基作為上述式(1)中之X,亦較佳為含有聚醚基。 X in the formula (1) is preferably an alkylene group, and also preferably a polyether group. The curable compound represented by the formula (1) preferably contains an alkylene group as X in the formula (1), and also preferably contains a polyether group.

作為上述式(1)中之X之伸烷基,可列舉伸乙基、伸丙基、伸丁基、伸戊基、伸己基、伸庚基、伸辛基、伸壬基或伸癸基等。就提高柔軟性之觀點而言,較佳為伸己基。 Examples of the alkylene group of X in the above formula (1) include ethylene, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, or decyl Wait. From the viewpoint of improving flexibility, hexyl is preferred.

作為上述式(1)中之X之聚醚基,可列舉下述式(2)所表示之聚醚基。 Examples of the polyether group of X in the formula (1) include a polyether group represented by the following formula (2).

-(R3-O)q-‧‧‧(2) -(R3-O) q-‧‧‧ (2)

上述式(2)中,R3為碳數1~6之直鏈狀伸烷基,q表示式(1)所表 示之硬化性化合物之重量平均分子量成為8000以上且50000以下之整數。上述式(2)中之q之分子量較佳為650以上,更佳為1000以上,較佳為2000以下。就提高柔軟性之觀點而言,於上述式(2)中之R3為直鏈狀伸烷基之情形時,R3之碳數較佳為2以上,較佳為4以下。又,複數個-R3-0-基可相同,亦可不同。 In the above formula (2), R3 is a linear alkylene group having 1 to 6 carbon atoms, and q represents the formula (1) The weight average molecular weight of the curable compound shown is an integer of 8,000 or more and 50,000 or less. The molecular weight of q in the formula (2) is preferably 650 or more, more preferably 1,000 or more, and more preferably 2,000 or less. From the viewpoint of improving flexibility, when R3 in the formula (2) is a linear alkylene group, the carbon number of R3 is preferably 2 or more, and more preferably 4 or less. Moreover, a plurality of -R3-0- groups may be the same or different.

就使硬化物之玻璃轉移溫度更低、進而使低溫下之拉伸彈性模數充分低、且於低溫下更快速地硬化之觀點而言,上述式(1)所表示之硬化性化合物較佳為具有聚醚基作為上述式(1)中之X。連接構造體存在被暴露於低溫下之情況。藉由使低溫下之拉伸彈性模數變低,低溫下之硬化物之柔軟性變高,更不易產生低溫下之剝離。 The hardening compound represented by the above formula (1) is preferable from the viewpoints that the glass transition temperature of the hardened material is lowered, the tensile elastic modulus at low temperature is sufficiently low, and the hardening is performed more quickly at low temperature. It has a polyether group as X in said Formula (1). The connection structure may be exposed to a low temperature. By lowering the tensile modulus of elasticity at low temperature, the softness of the hardened material at low temperature becomes higher, and peeling at low temperature is less likely to occur.

於上述式(1)所表示之硬化性化合物100重量%中,上述聚醚基構造部分之比率(例如式(2)所表示之構造部分之比率)較佳為17重量%以上,且較佳為41重量%以下,更佳為23重量%以下。 In 100% by weight of the curable compound represented by the formula (1), the ratio of the polyether-based structural portion (for example, the ratio of the structural portion represented by the formula (2)) is preferably 17% by weight or more, and more preferably It is 41% by weight or less, and more preferably 23% by weight or less.

上述式(1)中之Y表示碳數2~10之伸烷基或伸苯基。複數個Y可相同,亦可不同。就提高耐酸性之觀點而言,上述式(1)所表示之硬化性化合物較佳為具有碳數2~10之伸烷基與苯基之兩者作為上述式(1)中之Y。就提高柔軟性之觀點而言,上述式(1)所表示之硬化性化合物較佳為具有伸丁基作為上述式(1)中之Y。於上述式(1)中之Y為伸苯基之情形時,作為Y,可列舉下述式(3A)或下述式(3B)所表示之基。上述式(1)所表示之硬化性化合物較佳為具有下述式(3A)所表示之基作為上述式(1)中之Y。 Y in the above formula (1) represents an alkylene group or a phenylene group having 2 to 10 carbon atoms. The plurality of Ys may be the same or different. From the viewpoint of improving acid resistance, the hardening compound represented by the formula (1) is preferably both an alkylene group having a carbon number of 2 to 10 and a phenyl group as Y in the formula (1). From the viewpoint of improving flexibility, the hardening compound represented by the formula (1) preferably has a butyl group as Y in the formula (1). When Y in the formula (1) is a phenyl group, examples of Y include a group represented by the following formula (3A) or the following formula (3B). The curable compound represented by the formula (1) preferably has a group represented by the following formula (3A) as Y in the formula (1).

[熱硬化劑] [Thermal hardener]

關於上述熱硬化劑,作為使上述硬化性化合物熱硬化之上述熱硬化劑,可列舉咪唑硬化劑、胺硬化劑、酚硬化劑、多硫醇硬化劑、酸酐、熱陽離子起始劑及熱自由基產生劑等。上述熱硬化劑可僅使用一種,亦可併用兩種以上。 Regarding the thermal hardener, examples of the thermal hardener that thermally hardens the hardening compound include an imidazole hardener, an amine hardener, a phenol hardener, a polythiol hardener, an acid anhydride, a thermal cation initiator, and a thermal free agent. Base generator and so on. These thermosetting agents may be used alone or in combination of two or more.

其中,由於可使硬化性組合物於低溫下更快速地硬化,故而較佳為咪唑硬化劑、多硫醇硬化劑或胺硬化劑。又,由於在將可藉由加熱而硬化之硬化性化合物與上述熱硬化劑混合時保存穩定性提高,故而較佳為潛伏性硬化劑。潛伏性硬化劑較佳為潛伏性咪唑硬化劑、潛伏性多硫醇硬化劑或潛伏性胺硬化劑。再者,上述熱硬化劑亦可經聚胺基甲酸酯樹脂或聚酯樹脂等高分子物質被覆。 Among them, an imidazole hardener, a polythiol hardener, or an amine hardener is preferable because the hardenable composition can be hardened more quickly at a low temperature. Moreover, since the storage stability improves when the hardening compound which can harden | cure by heating is mixed with the said thermosetting agent, it is preferable that it is a latent hardening agent. The latent curing agent is preferably a latent imidazole curing agent, a latent polythiol curing agent, or a latent amine curing agent. The thermosetting agent may be coated with a polymer material such as a polyurethane resin or a polyester resin.

就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述熱硬化劑較佳為熱自由基產生劑。藉由使用熱自由基產生劑,尤其有效地提高PET膜之接著性。 From the viewpoint of further improving the adhesiveness of the connection target member, particularly the PET film, the thermal curing agent is preferably a thermal radical generator. The use of thermal radical generators is particularly effective in improving the adhesion of PET films.

熱自由基產生劑之1分鐘半衰期分解溫度較佳為100℃以上,更佳為110℃以上,且較佳為150℃以下,更佳為130℃以下。若上述1分鐘半衰期溫度為上述下限以上,則組合物之儲存穩定性變得更良好。若上述1分鐘半衰期溫度為上述上限以下,則作為被接著體之PET膜於硬化時之溫度下更不易變形及劣化。 The 1-minute half-life decomposition temperature of the thermal radical generator is preferably 100 ° C or higher, more preferably 110 ° C or higher, and preferably 150 ° C or lower, and more preferably 130 ° C or lower. When the 1-minute half-life temperature is equal to or higher than the above-mentioned lower limit, the storage stability of the composition becomes better. If the 1-minute half-life temperature is equal to or lower than the above-mentioned upper limit, the PET film as an adherend is less likely to be deformed and deteriorated at the temperature when it is hardened.

作為上述咪唑硬化劑,並無特別限定,可列舉:2-甲基咪唑、2-乙基-4-甲基咪唑、1-氰基乙基-2-苯基咪唑、1-氰基乙基-2-苯基咪唑鎓偏苯三酸酯、2,4-二胺基-6-[2'-甲基咪唑基-(1')]-乙基-均三及2,4- 二胺基-6-[2'-甲基咪唑基-(1')]-乙基-均三異三聚氰酸加成物等。 The imidazole curing agent is not particularly limited, and examples thereof include 2-methylimidazole, 2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, and 1-cyanoethyl 2-phenylimidazolium trimellitate, 2,4-diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-mesanthine And 2,4-diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-mesanthine Isocyanuric acid adducts and the like.

作為上述多硫醇硬化劑,並無特別限定,可列舉三羥甲基丙烷三-3-巰基丙酸酯、季戊四醇四-3-巰基丙酸酯及二季戊四醇六-3-巰基丙酸酯等。 The polythiol hardener is not particularly limited, and examples thereof include trimethylolpropane tri-3-mercaptopropionate, pentaerythritol tetra-3-mercaptopropionate, and dipentaerythritol hexa-3-mercaptopropionate. .

作為上述胺硬化劑,並無特別限定,可列舉己二胺、辛二胺、癸二胺、3,9-雙(3-胺基丙基)-2,4,8,10-四螺[5.5]十一烷、雙(4-胺基環己基)甲烷、間苯二胺及二胺基二苯基碸等。 The amine hardener is not particularly limited, and examples thereof include hexamethylene diamine, octane diamine, secanediamine, 3,9-bis (3-aminopropyl) -2,4,8,10-tetraspiro [ 5.5] Undecane, bis (4-aminocyclohexyl) methane, m-phenylenediamine, and diaminodiphenylphosphonium.

作為上述熱陽離子硬化劑,可列舉錪系陽離子硬化劑、系陽離子硬化劑及鋶系陽離子硬化劑等。作為上述錪系陽離子硬化劑,可列舉雙(4-第三丁基苯基)錪六氟磷酸鹽等。作為上述系陽離子硬化劑,可列舉三甲基四氟硼酸鹽等。作為上述鋶系陽離子硬化劑,可列舉三對甲苯基鋶六氟磷酸鹽等。 Examples of the thermal cationic hardener include a fluorene-based cationic hardener, Based cationic hardeners and fluorene based cationic hardeners. Examples of the fluorene-based cationic hardener include bis (4-thirdbutylphenyl) fluorene hexafluorophosphate and the like. As above Cation hardener, trimethyl Tetrafluoroborate, etc. Examples of the fluorene-based cation hardener include tri-p-tolyl hexafluorophosphate and the like.

作為上述熱自由基產生劑,並無特別限定,可列舉偶氮化合物及有機過氧化物等。上述熱自由基產生劑可僅使用一種,亦可併用兩種以上。 The thermal radical generator is not particularly limited, and examples thereof include an azo compound and an organic peroxide. The thermal radical generator may be used alone or in combination of two or more.

作為上述偶氮化合物,可列舉2,2'-偶氮二異丁腈、1,1'-(環己烷-1-甲腈)、2,2'-偶氮雙(2-環丙基丙腈)、2,2'-偶氮雙(2,4-二甲基戊腈)、及2,2'-偶氮雙(2-甲基丙酸)二甲酯等。 Examples of the azo compound include 2,2'-azobisisobutyronitrile, 1,1 '-(cyclohexane-1-carbonitrile), and 2,2'-azobis (2-cyclopropyl) Propionitrile), 2,2'-azobis (2,4-dimethylvaleronitrile), and 2,2'-azobis (2-methylpropanoic acid) dimethyl.

作為上述有機過氧化物,可列舉氫過氧化物及二烷基過氧化物等。作為上述氫過氧化物,可列舉:氫過氧化二異丙基苯、氫過氧化1,1,3,3-四甲基丁基、氫過氧化異丙苯、氫過氧化第三己基及氫過氧化第三丁基等。作為上述二烷基過氧化物,可列舉:α,α'-雙(過氧化第三丁基-間異丙基)苯、過氧化二異丙苯基、2,5-二甲基-2,5-雙(過氧化第三丁基)己烷、過氧化第三丁基異丙苯基、過氧化二第三丁基及2,5-二甲基-2,5-雙(過氧化第三丁基)己炔-3等。 Examples of the organic peroxide include hydroperoxide and dialkyl peroxide. Examples of the hydroperoxide include dicumyl hydroperoxide, 1,1,3,3-tetramethylbutyl hydroperoxide, cumene hydroperoxide, third hexyl hydroperoxide, and Third butyl hydroperoxide and the like. Examples of the dialkyl peroxide include α, α'-bis (third butyl peroxide-m-isopropyl) benzene, dicumyl peroxide, and 2,5-dimethyl-2. , 5-bis (tertiary butyl peroxide) hexane, tertiary butyl cumene peroxide, tertiary butyl peroxide, and 2,5-dimethyl-2,5-bis (peroxide Third butyl) hexyne-3 and the like.

上述熱硬化劑之含量並無特別限定。相對於上述硬化性化合物 100重量份,上述熱硬化劑及上述熱自由基產生劑之各含量較佳為0.01重量份以上,更佳為1重量份以上,且較佳為200重量份以下,更佳為100重量份以下,進而較佳為75重量份以下。若上述熱硬化劑及上述熱自由基產生劑之各含量為上述下限以上,則易於使硬化性組合物充分硬化。若上述熱硬化劑及上述熱自由基產生劑之各含量為上述上限以下,則於硬化後不易殘留未參與到硬化之剩餘之熱硬化劑,且硬化物之耐熱性進一步提高。 The content of the thermosetting agent is not particularly limited. Relative to the above-mentioned hardening compounds 100 parts by weight, each content of the thermal curing agent and the thermal radical generator is preferably 0.01 parts by weight or more, more preferably 1 part by weight or more, and preferably 200 parts by weight or less, and more preferably 100 parts by weight or less. It is more preferably 75 parts by weight or less. When each content of the said thermosetting agent and the said thermal radical generator is more than the said minimum, it will be easy to fully harden a curable composition. If the respective contents of the thermal curing agent and the thermal radical generator are equal to or less than the upper limit described above, the remaining thermal curing agent that does not participate in curing is hardly left after curing, and the heat resistance of the cured product is further improved.

[光硬化起始劑] [Light hardening initiator]

作為上述光硬化起始劑,並無特別限定,可列舉:苯乙酮光硬化起始劑(苯乙酮光自由基產生劑)、二苯甲酮光硬化起始劑(二苯甲酮光自由基產生劑)、9-氧硫、縮酮光硬化起始劑(縮酮光自由基產生劑)、鹵代酮、醯基膦氧化物及醯基膦酸鹽等。上述光硬化起始劑可僅使用一種,亦可併用兩種以上。 The photo-curing initiator is not particularly limited, and examples thereof include acetophenone photo-curing initiator (acetophenone photo-radical generator) and benzophenone photo-curing initiator (benzophenone photo-curing agent). Free radical generator), 9-oxysulfur , Ketal photohardening initiator (ketal photoradical generator), haloketone, fluorenylphosphine oxide and fluorenylphosphonate. The light curing initiator may be used alone or in combination of two or more.

作為上述苯乙酮光硬化起始劑之具體例,可列舉:4-(2-羥基乙氧基)苯基(2-羥基-2-丙基)酮、2-羥基-2-甲基-1-苯基丙烷-1-酮、甲氧基苯乙酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮、及2-羥基-2-環己基苯乙酮等。作為上述縮酮光硬化起始劑之具體例,可列舉苯偶醯二甲基縮酮等。 Specific examples of the acetophenone photocuring initiator include 4- (2-hydroxyethoxy) phenyl (2-hydroxy-2-propyl) ketone and 2-hydroxy-2-methyl- 1-phenylpropane-1-one, methoxyacetophenone, 2,2-dimethoxy-1,2-diphenylethane-1-one, and 2-hydroxy-2-cyclohexylbenzene Acetone and so on. Specific examples of the ketal photocuring initiator include benzophenone dimethyl ketal and the like.

上述光硬化起始劑之含量並無特別限定。相對於上述硬化性化合物100重量份,上述光硬化起始劑之含量較佳為0.1重量份以上,更佳為0.2重量份以上,且較佳為2重量份以下,更佳為1重量份以下。若上述光硬化起始劑之含量為上述下限以上,則易於使硬化性組合物充分硬化。又,藉由對硬化性組合物照射光,進行B-階段(B-stage)化,可抑制硬化性組合物之流動。若上述光硬化起始劑之含量為上述上限以下,則於硬化後不易殘留未參與到硬化之剩餘之光硬化起始劑。 The content of the photocuring initiator is not particularly limited. The content of the photocuring initiator is preferably 0.1 parts by weight or more, more preferably 0.2 parts by weight or more, and more preferably 2 parts by weight or less, and more preferably 1 part by weight or less based on 100 parts by weight of the curable compound. . When the content of the photocuring initiator is at least the above lower limit, it is easy to sufficiently harden the curable composition. In addition, the hardening composition is irradiated with light to be B-staged, and the flow of the hardening composition can be suppressed. If the content of the photocuring initiator is below the above upper limit, it is difficult for the remaining photocuring initiator that does not participate in curing to remain after the curing.

[四級銨鹽化合物] [Quaternary ammonium salt compound]

藉由使用上述四級銨鹽化合物,連接對象構件之接著性進一步提高。又,藉由使用上述四級銨鹽化合物,即便被暴露於高溫下,亦更不易產生剝離。上述四級銨鹽化合物可僅使用一種,亦可併用兩種以上。 By using the above-mentioned quaternary ammonium salt compound, the adhesion of the connection target member is further improved. In addition, by using the above-mentioned quaternary ammonium salt compound, even if exposed to a high temperature, peeling is less likely to occur. These quaternary ammonium salt compounds may be used alone or in combination of two or more.

就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述四級銨鹽化合物較佳為具有碳數8~18之烷基。就進一步提高連接對象構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述四級銨鹽化合物較佳為下述式(31)所表示之化合物。 From the viewpoint of further improving the adhesiveness of the connection target member, especially the PET film, the above-mentioned quaternary ammonium salt compound is preferably an alkyl group having 8 to 18 carbon atoms. From the viewpoint of further improving the adhesiveness of the connection target member, particularly the PET film, the quaternary ammonium salt compound is preferably a compound represented by the following formula (31).

R1R2R3R4N+X-…式(31) R1R2R3R4N + X - ... of formula (31)

上述式(31)中,R1、R2及R3分別表示甲基或乙基,R4表示碳數8~18之烷基,X表示溴原子或氯原子。 In the formula (31), R1, R2, and R3 each represent a methyl group or an ethyl group, R4 represents an alkyl group having 8 to 18 carbon atoms, and X represents a bromine atom or a chlorine atom.

作為上述四級銨鹽化合物,例如可列舉:氯化正辛基三甲基、溴化正辛基三甲基、溴化壬基三甲基、溴化癸基三甲基、氯化十二烷基三甲基、溴化十二烷基三甲基、氯化十四烷基三甲基、氯化十六烷基三甲基、溴化十六烷基三甲基、溴化乙基十六烷基二甲基、溴化十七烷基三甲基、氯化十八烷基三甲基、及溴化十八烷基三甲基等。 Examples of the quaternary ammonium salt compound include n-octyltrimethyl chloride, n-octyltrimethyl bromide, nonyltrimethyl bromide, decyltrimethyl bromide, and dodecyl chloride. Alkyltrimethyl, dodecyltrimethyl bromide, tetradecyltrimethyl chloride, cetyltrimethyl chloride, cetyltrimethyl bromide, ethyl bromide Cetyl dimethyl, heptadecyl trimethyl bromide, octadecyl trimethyl chloride, and octadecyl trimethyl bromide.

相對於上述硬化性化合物及上述熱硬化劑之合計100重量份,上述四級銨鹽化合物與上述具有羥基之(甲基)丙烯酸系化合物之合計含量較佳為0.1重量份以上,更佳為3重量份以上,進而較佳為5重量份以上,且較佳為50重量份以下,更佳為40重量份以下,進而較佳為30重量份以下,可為8重量份以下,亦可為5重量份以下。若上述四級銨鹽化合物與上述具有羥基之(甲基)丙烯酸系化合物之合計含量為上述下限以上及上述上限以下,則接著對象構件之接著性進一步提高。 The total content of the quaternary ammonium salt compound and the (meth) acrylic compound having a hydroxyl group is preferably 0.1 part by weight or more, more preferably 3 with respect to 100 parts by weight of the total of the curable compound and the thermosetting agent. At least parts by weight, more preferably at least 5 parts by weight, and more preferably at most 50 parts by weight, more preferably at most 40 parts by weight, still more preferably at most 30 parts by weight, may be at most 8 parts by weight, and may also be at least 5 parts by weight. Part by weight or less. When the total content of the quaternary ammonium salt compound and the (meth) acrylic compound having a hydroxyl group is equal to or more than the lower limit and equal to or lower than the upper limit, the adhesion of the target member is further improved.

相對於上述硬化性化合物及上述熱硬化劑之合計100重量份,上 述四級銨鹽化合物之含量為0重量份(不含有)以上,較佳為0.1重量份以上,更佳為3重量份以上,且較佳為50重量份以下,更佳為8重量份以下,進而較佳為5重量份以下。若使用上述四級銨鹽化合物,且上述四級銨鹽化合物之含量為上述下限以上及上述上限以下,則接著對象構件之接著性進一步提高,進一步抑制高溫下之剝離。 Based on 100 parts by weight of the total of the curable compound and the thermosetting agent, The content of the quaternary ammonium salt compound is 0 parts by weight (not contained), preferably 0.1 parts by weight or more, more preferably 3 parts by weight or more, and preferably 50 parts by weight or less, and more preferably 8 parts by weight or less. It is more preferably 5 parts by weight or less. When the above-mentioned quaternary ammonium salt compound is used, and the content of the quaternary ammonium salt compound is equal to or higher than the lower limit and lower than the upper limit, the adhesion of the target member is further improved, and peeling at high temperatures is further suppressed.

[具有羥基之(甲基)丙烯酸系化合物] [(Meth) acrylic compound having a hydroxyl group]

藉由使用上述具有羥基之(甲基)丙烯酸系化合物,而連接對象構件之接著性進一步提高。上述具有羥基之(甲基)丙烯酸系化合物可僅使用一種,亦可併用兩種以上。 By using the (meth) acrylic compound which has the said hydroxyl group, the adhesiveness of a connection target member is further improved. The (meth) acrylic compound having a hydroxyl group may be used alone or in combination of two or more.

作為上述含有羥基之(甲基)丙烯酸系化合物,例如可列舉:羥基乙基甲基丙烯酸酯磷酸酯、(甲基)丙烯酸4-羥基丁酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸羥基丙酯、N-(2-羥基乙基)(甲基)丙烯醯胺、N-(羥基甲基)(甲基)丙烯醯胺、N-(4-羥基苯基)(甲基)丙烯醯胺或環氧(甲基)丙烯酸酯等。 Examples of the (meth) acrylic compound containing a hydroxyl group include hydroxyethyl methacrylate phosphate, 4-hydroxybutyl (meth) acrylate, 2-hydroxyethyl (meth) acrylate, ( Hydroxypropyl methacrylate, N- (2-hydroxyethyl) (meth) acrylamide, N- (hydroxymethyl) (meth) acrylamide, N- (4-hydroxyphenyl) ( Methacrylamide or epoxy (meth) acrylate.

使用上述硬化性化合物之硬化性組合物之黏度相對容易變高。就降低硬化性組合物之黏度之觀點而言,上述硬化性化合物較佳為包含環氧(甲基)丙烯酸酯。環氧(甲基)丙烯酸酯可僅使用一種,亦可併用兩種以上。 The viscosity of the curable composition using the curable compound is relatively high. From the viewpoint of reducing the viscosity of the curable composition, the curable compound preferably contains an epoxy (meth) acrylate. The epoxy (meth) acrylate may be used alone or in combination of two or more.

作為環氧(甲基)丙烯酸酯,具體而言,可列舉EBECRYL3701(DAICEL-ALLNEX公司製造)、EBECRYL3703(DAICEL-ALLNEX公司製造)或EBECRYL3708(DAICEL-ALLNEX公司製造)等。上述環氧丙烯酸酯亦可為於分子末端具有丙烯酸2-羥基乙酯加成於己內酯之構造、且具有雙酚A之二縮水甘油基開環之構造作為主骨架的環氧丙烯酸酯。 Specific examples of the epoxy (meth) acrylate include EBCRYL3701 (manufactured by DAICEL-ALLNEX), EBCRYL3703 (manufactured by DAICEL-ALLNEX), and EBCRYL3708 (manufactured by DAICEL-ALLNEX). The epoxy acrylate may be an epoxy acrylate having a structure in which a 2-hydroxyethyl acrylate is added to caprolactone at a molecular terminal and a diglycidyl ring opening structure of bisphenol A is used as a main skeleton.

就進一步提高接著對象構件之接著性之觀點而言,較佳為(甲基)丙烯酸4-羥基丁酯、EBECRYL3701(DAICEL-ALLNEX公司製造)或 EBECRYL3708(DAICEL-ALLNEX公司製造)。 From the viewpoint of further improving the adhesion of the target member, 4-hydroxybutyl (meth) acrylate, EBECRYL3701 (manufactured by DAICEL-ALLNEX Corporation), or EBECRYL3708 (manufactured by DAICEL-ALLNEX).

相對於上述硬化性化合物及上述熱硬化劑之合計100重量份,上述具有羥基之(甲基)丙烯酸系化合物之含量為0重量份(不含有)以上,較佳為0.1重量份以上,更佳為3重量份以上,進而較佳為5重量份以上,且較佳為50重量份以下,更佳為40重量份以下,進而較佳為30重量份以下。若使用上述具有羥基之(甲基)丙烯酸系化合物,且上述具有羥基之(甲基)丙烯酸系化合物之含量為上述下限以上及上述上限以下,則接著對象構件之接著性進一步提高。 The content of the (meth) acrylic compound having a hydroxyl group is 0 parts by weight (not contained) or more, more preferably 0.1 parts by weight or more, based on 100 parts by weight of the total of the curable compound and the thermosetting agent. It is 3 parts by weight or more, more preferably 5 parts by weight or more, and preferably 50 parts by weight or less, more preferably 40 parts by weight or less, and still more preferably 30 parts by weight or less. When the (meth) acrylic compound having a hydroxyl group is used, and the content of the (meth) acrylic compound having a hydroxyl group is equal to or greater than the lower limit and equal to or lower than the upper limit, the adhesion of the target member is further improved.

[其他成分] [Other ingredients]

於連接對象構件包含玻璃、PET(聚對苯二甲酸乙二酯)之情形時,就進一步提高玻璃、PET之接著性之觀點而言,上述硬化性化合物較佳為包含(甲基)丙烯酸系化合物。作為上述(甲基)丙烯酸系化合物,可列舉丙烯醯嗎啉、醯亞胺(甲基)丙烯酸酯、(甲基)丙烯酸胺基甲酸酯等磷酸酯型(甲基)丙烯酸酯等。上述(甲基)丙烯酸系化合物係上述硬化性化合物以外之化合物。上述(甲基)丙烯酸系化合物係具有(甲基)丙烯醯基之化合物。上述(甲基)丙烯酸系化合物可僅使用一種,亦可併用兩種以上。 When the member to be connected includes glass or PET (polyethylene terephthalate), from the viewpoint of further improving the adhesion between glass and PET, the hardening compound preferably contains (meth) acrylic Compound. Examples of the (meth) acrylic compound include phosphate (meth) acrylates such as acrylic morpholine, fluorimine (meth) acrylate, and (meth) acrylate urethane. The (meth) acrylic compound is a compound other than the curable compound. The (meth) acrylic compound is a compound having a (meth) acrylfluorenyl group. These (meth) acrylic compounds may be used alone or in combination of two or more.

上述硬化性組合物視需要亦可包含例如助焊劑、填料、增量劑、軟化劑、塑化劑、聚合觸媒、硬化觸媒、著色劑、抗氧化劑、熱穩定劑、光穩定劑、紫外線吸收劑、潤滑劑、抗靜電劑及阻燃劑等各種添加劑。 The hardenable composition may further include, for example, a flux, a filler, an extender, a softener, a plasticizer, a polymerization catalyst, a hardening catalyst, a colorant, an antioxidant, a heat stabilizer, a light stabilizer, and ultraviolet rays. Various additives such as absorbents, lubricants, antistatic agents and flame retardants.

上述硬化性組合物較佳為包含助焊劑。藉由使用助焊劑,去除電極表面之氧化膜,可提高電極間之導通可靠性。助焊劑之詳細情況記載於下述導電材料之欄中。 The curable composition preferably contains a flux. By using a flux, the oxide film on the electrode surface is removed, and the conduction reliability between the electrodes can be improved. Details of the flux are described in the column of the conductive material described below.

上述硬化性組合物較佳為包含填料。藉由使用填料,硬化物之熱線膨脹率降低。作為上述填料之具體例,可列舉二氧化矽、氮化 鋁、氧化鋁、玻璃、氮化硼、氮化矽、聚矽氧、碳、石墨、石墨烯及滑石等。填料可僅使用一種,亦可併用兩種以上。若使用導熱率較高之填料,則正式硬化時間縮短。 The curable composition preferably contains a filler. By using a filler, the thermal linear expansion rate of a hardened | cured material is reduced. Specific examples of the filler include silicon dioxide and nitride. Aluminum, aluminum oxide, glass, boron nitride, silicon nitride, polysiloxane, carbon, graphite, graphene, and talc. The filler may be used singly or in combination of two or more kinds. If a filler with higher thermal conductivity is used, the formal hardening time is shortened.

上述硬化性組合物亦可包含溶劑。藉由使用該溶劑,可易於調整硬化性組合物之黏度。作為上述溶劑,例如可列舉乙酸乙酯、甲基溶纖素、甲苯、丙酮、甲基乙基酮、環己烷、正己烷、四氫呋喃及二乙醚等。 The said curable composition may contain a solvent. By using this solvent, the viscosity of a curable composition can be adjusted easily. Examples of the solvent include ethyl acetate, methyl lysin, toluene, acetone, methyl ethyl ketone, cyclohexane, n-hexane, tetrahydrofuran, and diethyl ether.

(導電材料) (Conductive material)

本發明之導電材料包含上述硬化性組合物與導電性粒子。具體而言,本發明之導電材料包含藉由使上述第2化合物與上述第1化合物進行反應而獲得之上述硬化性化合物、上述熱硬化劑及導電性粒子。本說明書中,將包含導電性粒子之硬化性組合物稱為導電材料。藉由使用本發明之導電材料,可提高連接對象構件之接著性及電極間之導通可靠性。 The conductive material of the present invention includes the curable composition and conductive particles. Specifically, the conductive material of the present invention includes the curable compound, the thermosetting agent, and conductive particles obtained by reacting the second compound with the first compound. In this specification, a curable composition containing conductive particles is referred to as a conductive material. By using the conductive material of the present invention, it is possible to improve the adhesiveness of the connection target member and the reliability of conduction between the electrodes.

上述導電材料較佳為包含助焊劑。藉由使用助焊劑,可去除導電性粒子表面及電極表面之氧化膜,提高電極間之導通可靠性。 The conductive material preferably contains a flux. By using a flux, the oxide film on the surface of the conductive particles and the surface of the electrode can be removed, and the reliability of conduction between the electrodes can be improved.

就更有效率地將導電性粒子配置於電極上之觀點而言,導電材料之25℃下之黏度較佳為100Pa‧s以上,更佳為200Pa‧s以上,且較佳為800Pa‧s以下,更佳為600Pa‧s以下。 From the viewpoint of more efficiently disposing the conductive particles on the electrode, the viscosity at 25 ° C of the conductive material is preferably 100 Pa · s or more, more preferably 200 Pa · s or more, and preferably 800 Pa · s or less. , More preferably below 600Pa‧s.

上述黏度可以調配成分之種類及調配量容易地適當進行調整。又,藉由使用填料,可使黏度相對變高。 The viscosity can be easily and appropriately adjusted by the type and amount of the ingredients. In addition, by using a filler, the viscosity can be relatively increased.

上述黏度例如可使用E型黏度計TVE-22裝置(東機產業公司製造),於25℃及2.5rpm之條件下測定。 The above viscosity can be measured, for example, using an E-type viscometer TVE-22 device (manufactured by Toki Sangyo Co., Ltd.) at 25 ° C and 2.5 rpm.

上述導電材料較佳為異向性導電材料。上述導電材料可用作導電膏及導電膜等。於上述導電材料為導電膜之情形時,亦可於包含導電性粒子之導電膜積層不含導電性粒子之膜。就進一步提高連接對象 構件之接著性、尤其進一步提高PET膜之接著性之觀點而言,上述導電材料較佳為膏狀之導電膏。上述導電材料較佳為用於電極間之電性連接。上述導電材料較佳為電路連接材料。 The conductive material is preferably an anisotropic conductive material. The above conductive materials can be used as a conductive paste, a conductive film, and the like. When the above-mentioned conductive material is a conductive film, a film containing no conductive particles may be laminated on a conductive film containing conductive particles. To further improve the connection object From the viewpoint of further improving the adhesiveness of the members, especially the PET film, the conductive material is preferably a paste-like conductive paste. The conductive material is preferably used for electrical connection between electrodes. The conductive material is preferably a circuit connection material.

於上述導電材料100重量%中,藉由使上述第2化合物與上述第1化合物進行反應而獲得之上述硬化性化合物之含量較佳為50重量%以上,更佳為60重量%以上,進而較佳為75重量%以上,且較佳為100重量%以下,更佳為95重量%以下。若上述硬化性化合物之含量為上述下限以上,則連接對象構件之接著性進一步提高,尤其PET膜之接著性進一步提高。若上述硬化性化合物之含量為上述上限以下,則可使導電性粒子之含量相對變多,電極間之導通可靠性進一步提高。 The content of the curable compound obtained by reacting the second compound with the first compound in 100% by weight of the conductive material is preferably 50% by weight or more, more preferably 60% by weight or more, It is preferably 75% by weight or more, more preferably 100% by weight or less, and even more preferably 95% by weight or less. When the content of the curable compound is greater than or equal to the above lower limit, the adhesion of the connection target member is further improved, and in particular, the adhesion of the PET film is further improved. When the content of the curable compound is equal to or less than the above upper limit, the content of the conductive particles can be relatively increased, and the reliability of conduction between the electrodes can be further improved.

於上述導電材料100重量%中,上述導電性粒子之含量較佳為0.1重量%以上,更佳為1重量%以上,進一步較佳為2重量%以上,進而較佳為10重量%以上,進而更佳為20重量%以上,尤佳為25重量%以上,最佳為30重量%以上,且較佳為80重量%以下,更佳為60重量%以下,進而較佳為50重量%以下,尤佳為45重量%以下,最佳為35重量%以下。若上述導電性粒子之含量為上述下限以上及上述上限以下,則易於在電極間配置較多導電性粒子,導通可靠性進一步提高。又,硬化性化合物等之含量變得適度,因此電極間之導通可靠性進一步提高。 In 100% by weight of the conductive material, the content of the conductive particles is preferably 0.1% by weight or more, more preferably 1% by weight or more, still more preferably 2% by weight or more, still more preferably 10% by weight or more, It is more preferably 20% by weight or more, particularly preferably 25% by weight or more, most preferably 30% by weight or more, and preferably 80% by weight or less, more preferably 60% by weight or less, and even more preferably 50% by weight or less, It is particularly preferably 45% by weight or less, and most preferably 35% by weight or less. When the content of the conductive particles is equal to or more than the lower limit and equal to or less than the upper limit, it is easy to arrange a large number of conductive particles between the electrodes, and the conduction reliability is further improved. In addition, since the content of the hardenable compound and the like becomes moderate, the conduction reliability between the electrodes is further improved.

以下,對可用於本發明之導電材料之各成分之詳細情況進行說明。 Hereinafter, details of each component of the conductive material that can be used in the present invention will be described.

[導電性粒子] [Conductive particles]

作為上述導電性粒子,可列舉全體由具有導電性之材料形成之導電性粒子、以及具有基材粒子與配置於該基材粒子之表面上之導電層之導電性粒子。 Examples of the conductive particles include conductive particles formed of a conductive material as a whole, and conductive particles having a substrate particle and a conductive layer disposed on a surface of the substrate particle.

上述導電性粒子較佳為至少外表面為焊料之導電性粒子。導電 性部分之外表面較佳為焊料。於此情形時,藉由使導電材料硬化而形成之連接部與由該連接部連接之連接對象構件之接著性因焊料而進一步提高。 The conductive particles are preferably conductive particles having at least an outer surface of solder. Conductive The outer surface of the sexual portion is preferably solder. In this case, the adhesion between the connection portion formed by hardening the conductive material and the connection target member connected by the connection portion is further improved by solder.

作為上述至少外表面為焊料之導電性粒子,可使用焊料粒子、或具備基材粒子與配置於該基材粒子之表面上之焊料層之粒子等。其中,較佳為使用焊料粒子。藉由使用焊料粒子,可進一步提高高速傳送或金屬接合強度。又,於使用至少外表面為焊料之導電性粒子之情形時,亦可使焊料粒子聚集於第1電極與第2電極之電極間。至少外表面為焊料之導電性粒子亦可具有如下性質,即,於加熱時,存在於未形成電極之區域之導電性粒子集中於第1電極與第2電極之間。 As the conductive particles having at least an outer surface of the solder, solder particles, particles having a base material particle, and a solder layer disposed on the surface of the base material particle can be used. Among these, it is preferable to use solder particles. By using solder particles, high-speed transfer or metal bonding strength can be further improved. When using conductive particles whose solder is at least on the outer surface, the solder particles may be collected between the first electrode and the second electrode. The conductive particles whose solder is at least on the outer surface may have the property that, when heated, the conductive particles existing in the region where the electrode is not formed are concentrated between the first electrode and the second electrode.

圖5係表示可用於本發明之第1實施形態中使用之導電材料之導電性粒子之一例之剖視圖。 5 is a cross-sectional view showing an example of conductive particles that can be used for a conductive material used in the first embodiment of the present invention.

如圖5所示,上述導電性粒子較佳為作為焊料粒子之導電性粒子21。導電性粒子21僅由焊料形成。導電性粒子21於核心不具有基材粒子,並非核殼粒子。導電性粒子21之中心部分及外表面均由焊料形成。 As shown in FIG. 5, the conductive particles are preferably conductive particles 21 as solder particles. The conductive particles 21 are formed of only solder. The conductive particles 21 do not have substrate particles at the core, and are not core-shell particles. Both the central portion and the outer surface of the conductive particles 21 are formed of solder.

就更均勻地保持連接對象構件間之連接距離之觀點而言,亦可使用具備基材粒子及配置於該基材粒子表面上之焊料層之粒子。 From the viewpoint of more uniformly maintaining the connection distance between the members to be connected, particles having substrate particles and a solder layer disposed on the surface of the substrate particles may be used.

圖6所示之變化例中,導電性粒子1具備基材粒子2及配置於基材粒子2之表面上之導電層3。導電層3被覆基材粒子2之表面。導電性粒子1係基材粒子2之表面經導電層3被覆之被覆粒子。 In the modified example shown in FIG. 6, the conductive particles 1 include a substrate particle 2 and a conductive layer 3 disposed on the surface of the substrate particle 2. The conductive layer 3 covers the surface of the substrate particles 2. The conductive particles 1 are coated particles whose surfaces are covered with the conductive layer 3 on the surface of the substrate particles 2.

導電層3具有第2導電層3A及配置於第2導電層3A之表面上之焊料層3B(第1導電層)。導電性粒子1於基材粒子2與焊料層3B之間具備第2導電層3A。因此,導電性粒子1具備基材粒子2、配置於基材粒子2之表面上之第2導電層3A、及配置於第2導電層3A之表面上之焊料層3B。如此,導電層3可具有多層構造,亦可具有兩層以上之積層構 造。 The conductive layer 3 includes a second conductive layer 3A and a solder layer 3B (first conductive layer) disposed on the surface of the second conductive layer 3A. The conductive particles 1 include a second conductive layer 3A between the substrate particles 2 and the solder layer 3B. Therefore, the conductive particle 1 includes the substrate particles 2, the second conductive layer 3A disposed on the surface of the substrate particle 2, and the solder layer 3B disposed on the surface of the second conductive layer 3A. In this way, the conductive layer 3 may have a multi-layer structure or a multilayer structure of two or more layers. Made.

如上所述,導電性粒子1中之導電層3具有雙層構造。如圖7所示之另一變化例般,導電性粒子11亦可具有焊料層12作為單層之導電層。導電性粒子11具備基材粒子2、及配置於基材粒子2之表面上之焊料層12。亦可以接觸基材粒子2之方式於基材粒子2之表面上配置焊料層12。 As described above, the conductive layer 3 in the conductive particles 1 has a double-layered structure. As another modified example shown in FIG. 7, the conductive particles 11 may have a solder layer 12 as a single-layer conductive layer. The conductive particles 11 include substrate particles 2 and a solder layer 12 disposed on the surface of the substrate particles 2. The solder layer 12 may be arranged on the surface of the substrate particles 2 so as to contact the substrate particles 2.

就易於使導電材料之導熱率變得更低而言,導電性粒子1、11、21中,更佳為導電性粒子1、11。藉由使用具備基材粒子及配置於該基材粒子表面上之焊料層之導電性粒子,易於使導電材料之導熱率變得更低。就進一步提高連接可靠性及電極間之導通可靠性之觀點而言,較佳為導電性粒子21。 Among the conductive particles 1, 11, 21, the conductive particles 1 and 11 are more preferable because the thermal conductivity of the conductive material is easily lowered. By using the conductive particles provided with the substrate particles and the solder layer disposed on the surface of the substrate particles, it is easy to lower the thermal conductivity of the conductive material. From the viewpoint of further improving connection reliability and conduction reliability between electrodes, the conductive particles 21 are preferred.

作為上述基材粒子,可列舉樹脂粒子、除金屬粒子以外之無機粒子、有機無機混合粒子及金屬粒子等。就更有效率地將導電性粒子配置於電極上之觀點而言,上述基材粒子較佳為除金屬以外之基材粒子,較佳為樹脂粒子、除金屬粒子以外之無機粒子或有機無機混合粒子。上述基材粒子亦可為銅粒子。上述基材粒子較佳為並非金屬粒子。 Examples of the substrate particles include resin particles, inorganic particles other than metal particles, organic-inorganic mixed particles, and metal particles. From the viewpoint of efficiently disposing the conductive particles on the electrode, the substrate particles are preferably substrate particles other than metal, and are preferably resin particles, inorganic particles other than metal particles, or an organic-inorganic mixture. particle. The substrate particles may be copper particles. The substrate particles are preferably not metal particles.

上述基材粒子較佳為由樹脂形成之樹脂粒子。於使用導電性粒子將電極間連接時,藉由於將導電性粒子配置於電極間後進行壓接而使導電性粒子壓縮。若上述基材粒子為樹脂粒子,則於上述壓接時導電性粒子容易變形,導電性粒子與電極之接觸面積變大。因此,電極間之導通可靠性進一步提高。 The substrate particles are preferably resin particles made of a resin. When the electrodes are connected using conductive particles, the conductive particles are compressed by disposing the conductive particles between the electrodes and then crimping them. When the substrate particles are resin particles, the conductive particles are easily deformed during the compression bonding, and the contact area between the conductive particles and the electrode becomes large. Therefore, the conduction reliability between the electrodes is further improved.

作為用以形成上述樹脂粒子之樹脂,適宜使用各種有機物。作為用以形成上述樹脂粒子之樹脂,例如可列舉:聚乙烯、聚丙烯、聚苯乙烯、聚氯乙烯、聚偏二氯乙烯、聚異丁烯、聚丁二烯等聚烯烴樹脂;聚甲基丙烯酸甲酯、聚丙烯酸甲酯等丙烯酸系樹脂;聚對苯二甲 酸烷二酯、聚碳酸酯、聚醯胺、酚甲醛樹脂、三聚氰胺-甲醛樹脂、苯胍甲醛樹脂、脲甲醛樹脂、酚系樹脂、三聚氰胺樹脂、苯胍樹脂、脲樹脂、環氧樹脂、不飽和聚酯樹脂、飽和聚酯樹脂、聚對苯二甲酸乙二酯、聚碸、聚苯醚、聚縮醛、聚醯亞胺、聚醯胺醯亞胺、聚醚醚酮、聚醚碸、二乙烯基苯聚合物、以及二乙烯基苯系共聚物等。作為上述二乙烯基苯系共聚物等,可列舉二乙烯基苯-苯乙烯共聚物及二乙烯基苯-(甲基)丙烯酸酯共聚物等。由於可易於將上述樹脂粒子之硬度控制於適宜之範圍,故而用以形成上述樹脂粒子之樹脂較佳為使具有乙烯性不飽和基之聚合性單體之一種或兩種以上聚合而成之聚合物。 As the resin for forming the resin particles, various organic substances are suitably used. Examples of the resin for forming the resin particles include polyolefin resins such as polyethylene, polypropylene, polystyrene, polyvinyl chloride, polyvinylidene chloride, polyisobutylene, and polybutadiene; polymethacrylic acid Acrylic resins such as methyl ester and polymethyl acrylate; polyterephthalate Acid alkyl diesters, polycarbonates, polyamides, phenol formaldehyde resins, melamine-formaldehyde resins, benzoguanaldehyde formaldehyde resins, urea formaldehyde resins, phenol resins, melamine resins, benzoguanide resins, urea resins, epoxy resins, Saturated polyester resin, saturated polyester resin, polyethylene terephthalate, polyfluorene, polyphenylene ether, polyacetal, polyimide, polyimide, imine, polyetheretherketone, polyether , Divinylbenzene polymers, and divinylbenzene copolymers. Examples of the divinylbenzene-based copolymer and the like include a divinylbenzene-styrene copolymer and a divinylbenzene- (meth) acrylate copolymer. Since the hardness of the resin particles can be easily controlled to an appropriate range, the resin used to form the resin particles is preferably a polymer obtained by polymerizing one or two or more polymerizable monomers having an ethylenically unsaturated group. Thing.

於使具有乙烯性不飽和基之單體聚合而獲得上述樹脂粒子之情形時,作為該具有乙烯性不飽和基之單體,可列舉非交聯性之單體與交聯性之單體。 When the above-mentioned resin particles are obtained by polymerizing a monomer having an ethylenically unsaturated group, examples of the monomer having an ethylenically unsaturated group include a non-crosslinkable monomer and a crosslinkable monomer.

作為上述非交聯性之單體,例如可列舉:苯乙烯、α-甲基苯乙烯等苯乙烯系單體;(甲基)丙烯酸、順丁烯二酸、順丁烯二酸酐等含羧基之單體;(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸月桂酯、(甲基)丙烯酸鯨蠟酯、(甲基)丙烯酸硬脂酯、(甲基)丙烯酸環己酯、(甲基)丙烯酸異酯等(甲基)丙烯酸烷基酯類;(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸甘油酯、聚氧乙烯(甲基)丙烯酸酯、(甲基)丙烯酸縮水甘油酯等含氧原子之(甲基)丙烯酸酯類;(甲基)丙烯腈等含腈之單體;甲基乙烯醚、乙基乙烯醚、丙基乙烯醚等乙烯醚類;乙酸乙烯酯、丁酸乙烯酯、月桂酸乙烯酯、硬脂酸乙烯酯等酸乙烯酯類;乙烯、丙烯、異戊二烯、丁二烯等不飽和烴;(甲基)丙烯酸三氟甲酯、(甲基)丙烯酸五氟乙酯、氯乙烯、氟乙烯、氯苯乙烯等含鹵素之單體等。 Examples of the non-crosslinkable monomer include styrene-based monomers such as styrene and α-methylstyrene; carboxyl groups such as (meth) acrylic acid, maleic acid, and maleic anhydride Monomers; methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, (formyl) Base) lauryl acrylate, cetyl (meth) acrylate, stearyl (meth) acrylate, cyclohexyl (meth) acrylate, (meth) acrylic acid (Meth) acrylic acid alkyl esters; 2-hydroxyethyl (meth) acrylate, glyceryl (meth) acrylate, polyoxyethylene (meth) acrylate, glycidyl (meth) acrylate, etc. (Meth) acrylates containing oxygen atoms; nitrile-containing monomers such as (meth) acrylonitrile; vinyl ethers such as methyl vinyl ether, ethyl vinyl ether, and propyl vinyl ether; vinyl acetate, butyric acid Vinyl esters, vinyl laurate, vinyl stearate and other acid vinyl esters; unsaturated hydrocarbons such as ethylene, propylene, isoprene, butadiene; trifluoromethyl (meth) acrylate, (methyl) Halogen-containing monomers such as pentafluoroethyl acrylate, vinyl chloride, vinyl fluoride, and chlorostyrene.

作為上述交聯性之單體,例如可列舉:四羥甲基甲烷四(甲基)丙烯酸酯、四羥甲基甲烷三(甲基)丙烯酸酯、四羥甲基甲烷二(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、二季戊四醇五(甲基)丙烯酸酯、三(甲基)丙烯酸甘油酯、二(甲基)丙烯酸甘油酯、(聚)乙二醇二(甲基)丙烯酸酯、(聚)丙二醇二(甲基)丙烯酸酯、(聚)1,4-丁二醇二(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯等多官能(甲基)丙烯酸酯類;(異)氰尿酸三烯丙酯、偏苯三酸三烯丙酯、二乙烯基苯、鄰苯二甲酸二烯丙酯、二烯丙基丙烯醯胺、二烯丙醚、γ-(甲基)丙烯醯氧基丙基三甲氧基矽烷、三甲氧基矽烷基苯乙烯、乙烯基三甲氧基矽烷等含矽烷之單體等。 Examples of the crosslinkable monomer include tetramethylolmethane tetra (meth) acrylate, tetramethylolmethane tri (meth) acrylate, and tetramethylolmethane di (meth) acrylic acid. Ester, trimethylolpropane tri (meth) acrylate, dipentaerythritol hexa (meth) acrylate, dipentaerythritol penta (meth) acrylate, glyceryl tri (meth) acrylate, di (meth) acrylic acid Glyceride, (poly) ethylene glycol di (meth) acrylate, (poly) propylene glycol di (meth) acrylate, (poly) 1,4-butanediol di (meth) acrylate, 1,4 -Multifunctional (meth) acrylates such as butanediol di (meth) acrylate; (iso) triallyl cyanurate, triallyl trimellitate, divinylbenzene, phthalic acid Diallyl ester, diallyl allylamine, diallyl ether, γ- (meth) acryl methoxypropyltrimethoxysilane, trimethoxysilylstyrene, vinyltrimethoxysilane, etc. Silane-containing monomers, etc.

於上述基材粒子為除金屬以外之無機粒子或有機無機混合粒子之情形時,作為用以形成基材粒子之無機物,可列舉二氧化矽及碳黑等。上述無機物較佳為並非金屬。作為由上述二氧化矽形成之粒子,並無特別限定,例如可列舉於使具有2個以上水解性烷氧基矽烷基之矽化合物水解而形成交聯聚合物粒子後,藉由視需要進行煅燒而獲得之粒子。作為上述有機無機混合粒子,例如可列舉由交聯之烷氧基矽烷基聚合物與丙烯酸系樹脂形成之有機無機混合粒子等。 When the substrate particles are inorganic particles or organic-inorganic mixed particles other than metals, examples of the inorganic substance used to form the substrate particles include silicon dioxide and carbon black. The inorganic substance is preferably not a metal. The particles formed from the above-mentioned silicon dioxide are not particularly limited, and examples thereof include hydrolysis of a silicon compound having two or more hydrolyzable alkoxysilyl groups to form crosslinked polymer particles, and calcination if necessary. And obtained particles. Examples of the organic-inorganic mixed particles include organic-inorganic mixed particles formed of a crosslinked alkoxysilyl polymer and an acrylic resin.

於上述基材粒子為金屬粒子之情形時,作為用以形成該金屬粒子之金屬,可列舉銀、銅、鎳、矽、金及鈦等。於上述基材粒子為金屬粒子之情形時,該金屬粒子較佳為銅粒子。但是,上述基材粒子較佳為並非金屬粒子。 When the substrate particles are metal particles, examples of the metal used to form the metal particles include silver, copper, nickel, silicon, gold, and titanium. When the substrate particles are metal particles, the metal particles are preferably copper particles. However, it is preferred that the substrate particles are not metal particles.

上述基材粒子之熔點較佳為高於上述焊料層之熔點。上述基材粒子之熔點較佳為超過160℃,更佳為超過300℃,進而較佳為超過400℃,尤佳為超過450℃。再者,上述基材粒子之熔點亦可未達400℃。上述基材粒子之熔點亦可為160℃以下。上述基材粒子之軟化點較佳為260℃以上。上述基材粒子之軟化點亦可未達260℃。 The melting point of the substrate particles is preferably higher than the melting point of the solder layer. The melting point of the substrate particles is preferably more than 160 ° C, more preferably more than 300 ° C, even more preferably more than 400 ° C, and even more preferably more than 450 ° C. The melting point of the substrate particles may not reach 400 ° C. The melting point of the substrate particles may be 160 ° C or lower. The softening point of the substrate particles is preferably 260 ° C or higher. The softening point of the substrate particles may not reach 260 ° C.

上述導電性粒子亦可具有單層之焊料層。上述導電性粒子亦可具有複數層之導電層(焊料層,第2導電層)。即,上述導電性粒子中,亦可積層2層以上之導電層。視情形,焊料粒子亦可為由複數層形成之粒子。 The conductive particles may have a single-layer solder layer. The conductive particles may have a plurality of conductive layers (a solder layer and a second conductive layer). That is, two or more conductive layers may be laminated on the conductive particles. Optionally, the solder particles may be particles formed of a plurality of layers.

形成上述焊料層之焊料、及形成焊料粒子之焊料較佳為熔點為450℃以下之低熔點金屬。上述焊料層較佳為熔點為450℃以下之低熔點金屬層。上述低熔點金屬層係包含低熔點金屬之層。上述焊料粒子較佳為熔點為450℃以下之低熔點金屬粒子。上述低熔點金屬粒子係包含低熔點金屬之粒子。該低熔點金屬係表示熔點為450℃以下之金屬。低熔點金屬之熔點較佳為300℃以下,更佳為160℃以下。又,上述焊料層及上述焊料粒子較佳為包含錫。於上述焊料層中所含之金屬100重量%中及上述焊料粒子中所含之金屬100重量%中,錫之含量較佳為30重量%以上,更佳為40重量%以上,進而較佳為70重量%以上,尤佳為90重量%以上。若上述焊料層及上述焊料粒子中之錫之含量為上述下限以上,則導電性粒子與電極之連接可靠性進一步提高。 The solder forming the solder layer and the solder particles forming the solder are preferably low-melting metals having a melting point of 450 ° C or lower. The solder layer is preferably a low-melting metal layer having a melting point of 450 ° C or lower. The low melting point metal layer is a layer containing a low melting point metal. The solder particles are preferably low-melting metal particles having a melting point of 450 ° C or lower. The low-melting metal particles are particles containing a low-melting metal. The low melting point metal refers to a metal having a melting point of 450 ° C or lower. The melting point of the low melting point metal is preferably 300 ° C or lower, and more preferably 160 ° C or lower. The solder layer and the solder particles preferably contain tin. The content of tin in 100% by weight of the metal contained in the solder layer and 100% by weight of the metal contained in the solder particles is preferably 30% by weight or more, more preferably 40% by weight or more, and even more preferably 70% by weight or more, particularly preferably 90% by weight or more. When the content of tin in the solder layer and the solder particles is at least the above lower limit, the connection reliability between the conductive particles and the electrode is further improved.

再者,上述錫之含量可使用高頻電感耦合電漿發光分光分析裝置(堀場製作所公司製造之「ICP-AES」)、或螢光X射線分析裝置(島津製作所公司製造之「EDX-800HS」)等進行測定。 In addition, the above-mentioned tin content can be measured by a high-frequency inductively coupled plasma emission spectrophotometer ("ICP-AES" manufactured by HORIBA, Ltd.) or a fluorescent X-ray analyzer ("EDX-800HS" manufactured by Shimadzu Corporation). ) And so on.

藉由使用上述焊料粒子及於導電性表面具有焊料之導電性粒子,焊料熔融而與電極接合,焊料使電極間導通。例如,由於焊料與電極易於進行面接觸而非點接觸,故而連接電阻變低。又,藉由使用於導電性表面具有焊料之導電性粒子,焊料與電極之接合強度變高,結果,更不易產生焊料與電極之剝離,有效地提高導通可靠性及連接可靠性。 By using the above-mentioned solder particles and conductive particles having solder on a conductive surface, the solder melts and joins the electrodes, and the solder conducts electricity between the electrodes. For example, since the solder and the electrode are likely to make surface contact instead of point contact, the connection resistance becomes low. In addition, by using conductive particles having solder on a conductive surface, the bonding strength between the solder and the electrode becomes higher, and as a result, peeling of the solder and the electrode is less likely to occur, and the conduction reliability and connection reliability are effectively improved.

構成上述焊料層及上述焊料粒子之低熔點金屬並無特別限定。該低熔點金屬較佳為錫或含有錫之合金。該合金可列舉錫-銀合金、 錫-銅合金、錫-銀-銅合金、錫-鉍合金、錫-鋅合金、錫-銦合金等。其中,就對電極之潤濕性優異而言,上述低熔點金屬較佳為錫、錫-銀合金、錫-銀-銅合金、錫-鉍合金、錫-銦合金。更佳為錫-鉍合金、錫-銦合金。 The low-melting-point metal constituting the solder layer and the solder particles is not particularly limited. The low melting point metal is preferably tin or an alloy containing tin. Examples of the alloy include a tin-silver alloy, Tin-copper alloy, tin-silver-copper alloy, tin-bismuth alloy, tin-zinc alloy, tin-indium alloy, etc. Among them, in terms of excellent wettability to the electrode, the above-mentioned low melting point metal is preferably tin, tin-silver alloy, tin-silver-copper alloy, tin-bismuth alloy, and tin-indium alloy. More preferred are tin-bismuth alloys and tin-indium alloys.

構成上述焊料(焊料層及上述焊料粒子)之材料較佳為基於JIS Z3001:焊接用語,液相線為450℃以下之填補材料。作為上述焊料之組成,例如可列舉含有鋅、金、銀、鉛、銅、錫、鉍、銦等之金屬組成。其中,較佳為低熔點且無鉛之錫-銦系(117℃共晶)、或錫-鉍系(139℃共晶)。即,上述焊料較佳為不含鉛,較佳為含有錫及銦之焊料、或含有錫及鉍之焊料。 The material constituting the solder (the solder layer and the solder particles) is preferably a filler material based on JIS Z3001: soldering term and having a liquidus of 450 ° C. or lower. Examples of the composition of the solder include metal compositions containing zinc, gold, silver, lead, copper, tin, bismuth, and indium. Among them, a low melting point and lead-free tin-indium based (117 ° C eutectic) or tin-bismuth based (139 ° C eutectic) is preferred. That is, the solder is preferably lead-free, and is preferably a solder containing tin and indium, or a solder containing tin and bismuth.

為了進一步提高上述焊料與電極之接合強度,上述焊料層及上述焊料粒子可含有磷、碲,亦可含有鎳、銅、銻、鋁、鋅、鐵、金、鈦、鍺、鈷、鉍、錳、鉻、鉬、鈀等金屬。又,就進一步提高焊料與電極之接合強度之觀點而言,上述焊料層及上述焊料粒子較佳為含有鎳、銅、銻、鋁或鋅。就進一步提高焊料層或焊料粒子與電極之接合強度之觀點而言,用以提高接合強度之該等金屬之含量於焊料層100重量%中或焊料粒子100重量%中較佳為0.0001重量%以上,且較佳為1重量%以下。 In order to further improve the bonding strength between the solder and the electrode, the solder layer and the solder particles may contain phosphorus, tellurium, and nickel, copper, antimony, aluminum, zinc, iron, gold, titanium, germanium, cobalt, bismuth, and manganese. , Chromium, molybdenum, palladium and other metals. From the viewpoint of further improving the bonding strength between the solder and the electrode, the solder layer and the solder particles preferably contain nickel, copper, antimony, aluminum, or zinc. From the viewpoint of further improving the bonding strength between the solder layer or the solder particles and the electrode, the content of these metals for improving the bonding strength is preferably 0.0001% by weight or more in 100% by weight of the solder layer or 100% by weight of the solder particles. And is preferably 1% by weight or less.

上述第2導電層之熔點較佳為高於上述焊料層之熔點。上述第2導電層之熔點較佳為超過160℃,更佳為超過300℃,進而較佳為超過400℃,進而更佳為超過450℃,尤佳為超過500℃,最佳為超過600℃。上述焊料層由於熔點較低,故而於導電連接時熔融。上述第2導電層較佳為於導電連接時不熔融。上述導電性粒子較佳為使焊料熔融而使用,較佳為使上述焊料層熔融而使用,較佳為使上述焊料層熔融且不使上述第2導電層熔融而使用。藉由上述第2導電層之熔點高於上述焊料層之熔點,可於導電連接時不使上述第2導電層熔融而僅使上述焊 料層熔融。 The melting point of the second conductive layer is preferably higher than the melting point of the solder layer. The melting point of the second conductive layer is preferably more than 160 ° C, more preferably more than 300 ° C, still more preferably more than 400 ° C, still more preferably more than 450 ° C, even more preferably more than 500 ° C, and most preferably more than 600 ° C. . Since the solder layer has a relatively low melting point, it melts during conductive connection. The second conductive layer is preferably not melted during conductive connection. The conductive particles are preferably used by melting solder, preferably used by melting the solder layer, and preferably used by melting the solder layer without melting the second conductive layer. Since the melting point of the second conductive layer is higher than the melting point of the solder layer, it is possible to prevent the second conductive layer from being melted during the conductive connection, and only the soldering can be performed. The material layer is melted.

上述焊料層之熔點與上述第2導電層之熔點之差之絕對值超過0℃,較佳為5℃以上,更佳為10℃以上,進而較佳為30℃以上,尤佳為50℃以上,最佳為100℃以上。 The absolute value of the difference between the melting point of the solder layer and the melting point of the second conductive layer exceeds 0 ° C, preferably 5 ° C or more, more preferably 10 ° C or more, still more preferably 30 ° C or more, and even more preferably 50 ° C or more , Preferably 100 ° C or more.

上述第2導電層較佳為含有金屬。構成上述第2導電層之金屬並無特別限定。作為該金屬,例如可列舉金、銀、銅、鉑、鈀、鋅、鉛、鋁、鈷、銦、鎳、鉻、鈦、銻、鉍、鍺及鎘、及其等之合金等。又,作為上述金屬,亦可使用摻錫氧化銦(ITO)。上述金屬可僅使用一種,亦可併用兩種以上。 The second conductive layer preferably contains a metal. The metal constituting the second conductive layer is not particularly limited. Examples of the metal include gold, silver, copper, platinum, palladium, zinc, lead, aluminum, cobalt, indium, nickel, chromium, titanium, antimony, bismuth, germanium and cadmium, and alloys thereof. Also, as the metal, tin-doped indium oxide (ITO) may be used. These metals may be used alone or in combination of two or more.

上述第2導電層較佳為鎳層、鈀層、銅層或金層,更佳為鎳層或金層,進而較佳為銅層。導電性粒子較佳為具有鎳層、鈀層、銅層或金層,更佳為具有鎳層或金層,進而較佳為具有銅層。藉由將具有該等較佳之導電層之導電性粒子用於電極間之連接,電極間之連接電阻進一步變低。又,於該等較佳之導電層之表面,可更易於形成焊料層。 The second conductive layer is preferably a nickel layer, a palladium layer, a copper layer, or a gold layer, more preferably a nickel layer or a gold layer, and even more preferably a copper layer. The conductive particles preferably have a nickel layer, a palladium layer, a copper layer, or a gold layer, more preferably have a nickel layer or a gold layer, and even more preferably have a copper layer. By using conductive particles having these preferred conductive layers for connection between electrodes, the connection resistance between the electrodes is further reduced. In addition, a solder layer can be more easily formed on the surfaces of these preferred conductive layers.

上述導電性粒子之平均粒徑較佳為0.1μm以上,更佳為1μm以上,且較佳為100μm以下,更佳為80μm以下,進而較佳為50μm以下,尤佳為40μm以下。若導電性粒子之平均粒徑為上述下限以上及上述上限以下,則導電性粒子與電極之接觸面積充分變大,且於形成導電層時不易形成凝聚之導電性粒子。又,成為適於導電材料中之導電性粒子之大小,經由導電性粒子連接之電極間之間隔不會變得過大,且導電層不易自基材粒子之表面剝離。 The average particle diameter of the conductive particles is preferably 0.1 μm or more, more preferably 1 μm or more, and more preferably 100 μm or less, more preferably 80 μm or less, still more preferably 50 μm or less, and even more preferably 40 μm or less. When the average particle diameter of the conductive particles is greater than or equal to the above lower limit and less than or equal to the above upper limit, the contact area between the conductive particles and the electrode becomes sufficiently large, and it is not easy to form aggregated conductive particles when forming the conductive layer. In addition, the size is suitable for the conductive particles in the conductive material, the interval between the electrodes connected via the conductive particles does not become too large, and the conductive layer is not easily peeled from the surface of the substrate particles.

上述導電性粒子之粒徑表示數量平均粒徑。上述導電性粒子之平均粒徑係藉由利用電子顯微鏡或光學顯微鏡對任意50個導電性粒子進行觀察並算出平均值而求出。 The particle diameter of the conductive particles indicates a number average particle diameter. The average particle diameter of the conductive particles is obtained by observing arbitrary 50 conductive particles with an electron microscope or an optical microscope and calculating an average value.

上述焊料層之厚度較佳為0.005μm以上,更佳為0.01μm以上, 且較佳為10μm以下,更佳為1μm以下,進而較佳為0.3μm以下。若焊料層之厚度為上述下限以上及上述上限以下,則可獲得充分之導電性,且導電性粒子不會變得過硬,於電極間連接時導電性粒子充分地變形。又,上述焊料層之厚度越薄,越易於使導電材料之導熱率變低。就使導電材料之導熱率充分低之觀點而言,上述焊料層之厚度較佳為4μm以下,更佳為2μm以下。 The thickness of the solder layer is preferably 0.005 μm or more, and more preferably 0.01 μm or more. The thickness is preferably 10 μm or less, more preferably 1 μm or less, and even more preferably 0.3 μm or less. When the thickness of the solder layer is greater than or equal to the above lower limit and less than or equal to the above upper limit, sufficient conductivity can be obtained, and the conductive particles will not become too hard, and the conductive particles will be sufficiently deformed during the connection between the electrodes. The thinner the thickness of the solder layer, the easier it is to lower the thermal conductivity of the conductive material. From the viewpoint of sufficiently lowering the thermal conductivity of the conductive material, the thickness of the solder layer is preferably 4 μm or less, and more preferably 2 μm or less.

上述第2導電層之厚度較佳為0.005μm以上,更佳為0.01μm以上,且較佳為10μm以下,更佳為1μm以下,進而較佳為0.3μm以下。若上述第2導電層之厚度為上述下限以上及上述上限以下,則電極間之連接電阻進一步變低。又,上述第2導電層之厚度越薄,越易於使導電材料之導熱率變低。就使導電材料之導熱率充分低之觀點而言,上述第2導電層之厚度較佳為3μm以下,更佳為1μm以下。 The thickness of the second conductive layer is preferably 0.005 μm or more, more preferably 0.01 μm or more, and more preferably 10 μm or less, more preferably 1 μm or less, and further preferably 0.3 μm or less. When the thickness of the second conductive layer is equal to or greater than the lower limit and equal to or lower than the upper limit, the connection resistance between the electrodes is further reduced. The thinner the second conductive layer is, the easier it is to lower the thermal conductivity of the conductive material. From the viewpoint of sufficiently lowering the thermal conductivity of the conductive material, the thickness of the second conductive layer is preferably 3 μm or less, and more preferably 1 μm or less.

於上述導電性粒子僅具有焊料層作為導電層之情形時,上述焊料層之厚度較佳為10μm以下,更佳為5μm以下。於上述導電性粒子具有焊料層與不同於焊料層之其他導電層(第2導電層等)作為導電層之情形時,焊料層與不同於焊料層之其他之導電層之合計厚度較佳為10μm以下,更佳為5μm以下。 When the conductive particles have only a solder layer as a conductive layer, the thickness of the solder layer is preferably 10 μm or less, and more preferably 5 μm or less. When the above conductive particles have a solder layer and another conductive layer (second conductive layer, etc.) different from the solder layer as the conductive layer, the total thickness of the solder layer and the other conductive layer different from the solder layer is preferably 10 μm. Hereinafter, it is more preferably 5 μm or less.

[助焊劑] [Flux]

上述導電材料較佳為含有助焊劑。該助焊劑並無特別限定。作為上述助焊劑,可使用一般用於焊接等之助焊劑。上述助焊劑可僅使用一種,亦可併用兩種以上。 The conductive material preferably contains a flux. The flux is not particularly limited. As the flux, a flux generally used for soldering or the like can be used. These fluxes may be used alone or in combination of two or more.

作為上述助焊劑,例如可列舉氯化鋅、氯化鋅與無機鹵化物之混合物、氯化鋅與無機酸之混合物、熔融鹽、磷酸、磷酸之衍生物、有機鹵化物、肼、有機酸及松脂等。作為上述熔融鹽,可列舉氯化銨等。作為上述有機酸,可列舉乳酸、檸檬酸、硬脂酸、麩胺酸及戊二酸等。作為上述松脂,可列舉活化松脂及非活化松脂等。上述助焊劑 較佳為具有2個以上羧基之有機酸、松脂。上述助焊劑可為具有2個以上羧基之有機酸,亦可為松脂。藉由使用具有2個以上羧基之有機酸、松脂,電極間之導通可靠性進一步提高。 Examples of the flux include zinc chloride, a mixture of zinc chloride and an inorganic halide, a mixture of zinc chloride and an inorganic acid, a molten salt, phosphoric acid, a derivative of phosphoric acid, an organic halide, hydrazine, an organic acid, and Rosin, etc. Examples of the molten salt include ammonium chloride. Examples of the organic acid include lactic acid, citric acid, stearic acid, glutamic acid, and glutaric acid. Examples of the turpentine include activated turpentine and non-activated turpentine. The above flux Organic acids and turpentine having two or more carboxyl groups are preferred. The flux may be an organic acid having two or more carboxyl groups, or may be turpentine. By using an organic acid or rosin having two or more carboxyl groups, the reliability of conduction between electrodes is further improved.

上述松脂係以松香酸作為主成分之松香類。助焊劑較佳為松香類,更佳為松香酸。藉由使用該較佳之助焊劑,電極間之導通可靠性進一步提高。 The rosin is a rosin containing rosin acid as a main component. The flux is preferably rosin, and more preferably rosin acid. By using the better flux, the conduction reliability between the electrodes is further improved.

上述助焊劑之熔點較佳為50℃以上,更佳為70℃以上,進而較佳為80℃以上,且較佳為200℃以下,更佳為160℃以下,進一步較佳為150℃以下,進而較佳為140℃以下。若上述助焊劑之熔點為上述下限以上及上述上限以下,則更有效地發揮助焊劑效應,更有效率地將焊料粒子配置於電極上。上述助焊劑之熔點較佳為80℃以上且190℃以下。上述助焊劑之熔點尤佳為80℃以上且140℃以下。 The melting point of the above-mentioned flux is preferably 50 ° C or higher, more preferably 70 ° C or higher, further preferably 80 ° C or higher, and more preferably 200 ° C or lower, more preferably 160 ° C or lower, even more preferably 150 ° C or lower, The temperature is more preferably 140 ° C or lower. If the melting point of the flux is above the lower limit and below the upper limit, the flux effect is more effectively exerted, and the solder particles are more efficiently arranged on the electrode. The melting point of the flux is preferably 80 ° C or higher and 190 ° C or lower. The melting point of the above-mentioned flux is particularly preferably 80 ° C to 140 ° C.

作為熔點為80℃以上且190℃以下之上述助焊劑,可列舉丁二酸(熔點186℃)、戊二酸(熔點96℃)、己二酸(熔點152℃)、庚二酸(熔點104℃)、辛二酸(熔點142℃)等二羧酸、苯甲酸(熔點122℃)、蘋果酸(熔點130℃)等。 Examples of the above-mentioned flux having a melting point of 80 ° C to 190 ° C include succinic acid (melting point 186 ° C), glutaric acid (melting point 96 ° C), adipic acid (melting point 152 ° C), and pimelic acid (melting point 104). ℃), dicarboxylic acid such as suberic acid (melting point 142 ° C), benzoic acid (melting point 122 ° C), malic acid (melting point 130 ° C), and the like.

就將焊料更有效率地配置於電極上之觀點而言,上述助焊劑之熔點較佳為較上述焊料粒子中之焊料之熔點低,更佳為低5℃以上,進而較佳為低10℃以上。 From the viewpoint of more efficiently disposing the solder on the electrode, the melting point of the above-mentioned flux is preferably lower than the melting point of the solder in the above-mentioned solder particles, more preferably 5 ° C or higher, and further preferably 10 ° C or lower. the above.

就將焊料更有效率地配置於電極上之觀點而言,上述助焊劑之熔點較佳為較上述熱硬化劑之反應起始溫度低,更佳為低5℃以上,進而較佳為低10℃以上。 From the viewpoint of more efficiently disposing the solder on the electrode, the melting point of the above-mentioned flux is preferably lower than the reaction starting temperature of the above-mentioned thermosetting agent, more preferably 5 ° C or higher, and further preferably 10% lower. Above ℃.

上述助焊劑可分散於上述硬化性組合物或上述導電材料中,亦可附著於導電性粒子或焊料粒子之表面上。 The said flux may be disperse | distributed in the said hardenable composition or the said conductive material, and may adhere to the surface of electroconductive particle or solder particle.

上述導電材料100重量%中,上述助焊劑之含量為0重量%(未使用)以上,較佳為0.5重量%以上,且較佳為30重量%以下,更佳為25 重量%以下。上述導電材料亦可包含助焊劑。若助焊劑之含量為上述下限以上及上述上限以下,則更不易於焊料及電極之表面形成氧化膜,進而可更有效地去除形成於焊料及電極之表面之氧化膜。 In 100% by weight of the conductive material, the content of the flux is 0% by weight (unused), preferably 0.5% by weight or more, and preferably 30% by weight or less, more preferably 25% by weight. % By weight or less. The conductive material may also include a flux. If the content of the flux is above the above lower limit and below the above upper limit, it is more difficult to form an oxide film on the surface of the solder and the electrode, and the oxide film formed on the surface of the solder and the electrode can be more effectively removed.

(連接構造體) (Connection structure)

藉由使用上述硬化性組合物或上述導電材料將連接對象構件連接,可獲得連接構造體。 By connecting the connection target members using the curable composition or the conductive material, a connection structure can be obtained.

上述連接構造體具備第1連接對象構件、第2連接對象構件、及連接上述第1連接對象構件與上述第2連接對象構件之連接部。上述連接部係藉由使上述硬化性組合物硬化、或使上述導電材料硬化而形成。 The connection structure includes a first connection target member, a second connection target member, and a connection portion that connects the first connection target member and the second connection target member. The connection portion is formed by curing the curable composition or curing the conductive material.

圖1係模式性地表示使用包含本發明之第1實施形態之硬化性組合物及導電性粒子之導電材料獲得之連接構造體的前視剖視圖。 FIG. 1 is a front cross-sectional view schematically showing a connection structure obtained using a conductive material containing a curable composition according to a first embodiment of the present invention and a conductive particle.

圖1所示之連接構造體51具備第1連接對象構件52、第2連接對象構件53、及連接第1連接對象構件52與第2連接對象構件53之連接部54。連接部54為硬化物層,藉由使包含導電性粒子1之導電材料硬化而形成。除導電性粒子1以外,亦可使用導電性粒子11或導電性粒子21。又,亦可使用除導電性粒子1、11、21以外之導電性粒子。 The connection structure 51 shown in FIG. 1 includes a first connection target member 52, a second connection target member 53, and a connection portion 54 that connects the first connection target member 52 and the second connection target member 53. The connection portion 54 is a hardened material layer, and is formed by hardening a conductive material including the conductive particles 1. In addition to the conductive particles 1, the conductive particles 11 or the conductive particles 21 may be used. In addition, conductive particles other than the conductive particles 1, 11, and 21 may be used.

第1連接對象構件52於表面(上表面)具有複數個第1電極52a。第2連接對象構件53於表面(下表面)具有複數個第2電極53a。第1電極52a與第2電極53a藉由1個或複數個導電性粒子1而電性連接。因此,第1、第2連接對象構件52、53藉由導電性粒子1而電性連接。 The first connection target member 52 has a plurality of first electrodes 52a on a surface (upper surface). The second connection target member 53 has a plurality of second electrodes 53a on the surface (lower surface). The first electrode 52a and the second electrode 53a are electrically connected by one or a plurality of conductive particles 1. Therefore, the first and second connection target members 52 and 53 are electrically connected by the conductive particles 1.

圖4中,將圖1所示之連接構造體51中之導電性粒子1與第1、第2電極52a、53a之連接部分放大而以前視剖視圖表示。如圖4所示,連接構造體51中,於導電性粒子1中之焊料層3B熔融後,熔融之焊料層部分3Ba與第1、第2電極52a、53a充分進行接觸。即,藉由使用表面層為焊料層3B之導電性粒子1,與使用導電層之表面層為鎳、金或銅 等金屬之導電性粒子之情形相比,導電性粒子1與第1、第2電極52a、53a之接觸面積變大。因此,可提高連接構造體51之導通可靠性及連接可靠性。再者,於使用助焊劑之情形時,藉由加熱,一般而言助焊劑會逐漸失活。又,就進一步提高導通可靠性之觀點而言,較佳為使第2導電層3A與第1電極52a接觸,較佳為使第2導電層3A與第2電極53a接觸。 In FIG. 4, the connection portion between the conductive particles 1 and the first and second electrodes 52 a and 53 a in the connection structure 51 shown in FIG. 1 is enlarged and shown in a front cross-sectional view. As shown in FIG. 4, in the connection structure 51, after the solder layer 3B in the conductive particles 1 is melted, the molten solder layer portion 3Ba is brought into full contact with the first and second electrodes 52a and 53a. That is, by using the conductive particles 1 whose surface layer is the solder layer 3B and the surface layer using the conductive layer is nickel, gold, or copper The contact area between the conductive particles 1 and the first and second electrodes 52a and 53a is larger than that in the case of metal conductive particles. Therefore, the conduction reliability and connection reliability of the connection structure 51 can be improved. Furthermore, in the case of using a flux, generally, the flux is gradually deactivated by heating. From the viewpoint of further improving the conduction reliability, the second conductive layer 3A is preferably in contact with the first electrode 52a, and the second conductive layer 3A is preferably in contact with the second electrode 53a.

圖2係模式性地表示使用本發明之第2實施形態之硬化性組合物獲得之連接構造體之前視剖視圖。 FIG. 2 is a schematic front cross-sectional view of a connection structure obtained using a curable composition according to a second embodiment of the present invention.

圖2所示之連接構造體61具備第1連接對象構件62、第2連接對象構件63、及連接第1連接對象構件62與第2連接對象構件63之連接部64。連接部64為硬化物層,藉由使不含導電性粒子之硬化性組合物硬化而形成。 The connection structure 61 shown in FIG. 2 includes a first connection target member 62, a second connection target member 63, and a connection portion 64 that connects the first connection target member 62 and the second connection target member 63. The connection portion 64 is a cured material layer, and is formed by curing a curable composition containing no conductive particles.

第1連接對象構件62於表面(上表面)具有複數個第1電極62a。第2連接對象構件63於表面(下表面)具有複數個第2電極63a。第1電極62a與第2電極63a例如為凸塊電極。第1電極62a與第2電極63a係不經由導電性粒子而藉由相互接觸而電性連接。因此,第1、第2連接對象構件62、63電性連接。 The first connection target member 62 has a plurality of first electrodes 62a on a surface (upper surface). The second connection target member 63 has a plurality of second electrodes 63a on the surface (lower surface). The first electrode 62a and the second electrode 63a are, for example, bump electrodes. The first electrode 62a and the second electrode 63a are electrically connected by contacting each other without using conductive particles. Therefore, the first and second connection target members 62 and 63 are electrically connected.

圖3係模式性地表示使用本發明之第3實施形態之硬化性組合物獲得之連接構造體之前視剖視圖。 FIG. 3 is a schematic cross-sectional view showing a front structure of a connection structure obtained using a curable composition according to a third embodiment of the present invention.

圖3所示之連接構造體71具備第1連接對象構件72、第2連接對象構件73、及連接第1連接對象構件72與第2連接對象構件73之連接部74。連接部74為硬化物層,藉由使不含導電性粒子之硬化性組合物硬化而形成。連接構造體71中,電極未電性連接。上述硬化性組合物之用途並不限定於電極電性連接之用途。 The connection structure 71 shown in FIG. 3 includes a first connection target member 72, a second connection target member 73, and a connection portion 74 that connects the first connection target member 72 and the second connection target member 73. The connection portion 74 is a hardened material layer, and is formed by hardening a hardening composition containing no conductive particles. In the connection structure 71, the electrodes are not electrically connected. The use of the curable composition is not limited to the use for the electrical connection of electrodes.

上述連接構造體之製造方法並無特別限定。作為該連接構造體之製造方法之一例,可列舉如下方法等:於上述第1連接對象構件與 上述第2連接對象構件之間配置上述導電材料或上述硬化性組合物,獲得積層體後,對該積層體進行加熱及加壓。上述加壓之壓力為9.8×104~4.9×106Pa左右。上述加熱之溫度為120~220℃左右。 The manufacturing method of the said connection structure is not specifically limited. As an example of a method of manufacturing the connection structure, there may be mentioned a method in which the conductive material or the hardenable composition is arranged between the first connection target member and the second connection target member, and a laminated body is obtained. This laminated body is heated and pressurized. The aforementioned pressure is about 9.8 × 10 4 to 4.9 × 10 6 Pa. The heating temperature is about 120 to 220 ° C.

上述第1、第2連接對象構件並無特別限定。作為上述第1、第2連接對象構件,具體而言,可列舉:金屬構件、樹脂構件及膜構件等電子/電氣零件、電氣半導體晶片、電容器及二極體等電子/電氣零件、以及印刷基板、可撓性印刷基板、玻璃環氧基板、FFC(flexible flat cable,可撓性扁平電纜)及玻璃基板等電路基板等電子/電氣零件等。上述第1、第2連接對象構件較佳為電子/電氣零件。上述電子/電氣零件係構成電子/電氣機器之構件。上述連接構造體較佳為電子/電氣零件連接構造體。上述連接構造體較佳為電子/電氣機器。 The first and second connection target members are not particularly limited. Specific examples of the first and second connection target members include electronic / electrical components such as metal members, resin members, and film members, electronic / electrical components such as electrical semiconductor wafers, capacitors, and diodes, and printed boards. Electronic / electrical components such as flexible printed boards, glass epoxy substrates, circuit boards such as FFC (flexible flat cable) and glass substrates. The first and second connection target members are preferably electronic / electrical components. The above-mentioned electronic / electrical components are members constituting electronic / electrical equipment. The connection structure is preferably an electronic / electrical component connection structure. The connection structure is preferably an electronic / electrical device.

上述第1、第2連接對象構件較佳為觸控面板用連接對象構件。就藉由使用上述硬化性組合物及上述導電材料而較大地獲得接著性提高效果而言,上述第1、第2連接對象構件內之至少一者較佳為PET膜。 The first and second connection target members are preferably connection target members for a touch panel. It is preferable that at least one of the said 1st and 2nd connection object members is a PET film in order to obtain the improvement effect of adhesiveness largely by using the said curable composition and the said conductive material.

上述硬化性組合物及上述導電材料適宜用於PET膜、FFC(可撓性扁平電纜)之接著,且較佳為PET膜、FFC(可撓性扁平電纜)接著用之硬化性組合物。上述硬化性組合物及上述導電材料於觸控面板中適宜用於PET膜之接著,且較佳為觸控面板中之PET膜接著用之硬化性組合物。 The above-mentioned curable composition and the above-mentioned conductive material are suitably used for the adhesion of PET film and FFC (flexible flat cable), and are preferably those of PET film and FFC (flexible flat cable). The above-mentioned curable composition and the above-mentioned conductive material are suitable for the adhesion of a PET film in a touch panel, and are preferably a curable composition for the adhesion of a PET film in a touch panel.

又,上述硬化性組合物及上述導電材料不僅適宜用於PET膜之接著,而且亦適宜用於顯示器用樹脂膜與可撓性印刷基板之接著。 The curable composition and the conductive material are not only suitable for bonding a PET film, but also suitable for bonding a resin film for a display and a flexible printed circuit board.

又,上述硬化性組合物及上述導電材料不僅適宜用於FFC(可撓性扁平電纜)之接著,而且亦適宜用於剛性基板與FFC(可撓性扁平電纜)之接著。 In addition, the hardenable composition and the conductive material are not only suitable for bonding FFC (flexible flat cable), but also suitable for bonding rigid substrates and FFC (flexible flat cable).

作為設置於上述連接對象構件之電極,可列舉金電極、鎳電 極、錫電極、鋁電極、銅電極、銀電極、鉬電極及鎢電極等金屬電極。於上述連接對象構件為可撓性印刷基板之情形時,上述電極較佳為金電極、鎳電極、錫電極或銅電極。於上述連接對象構件為玻璃基板之情形時,上述電極較佳為鋁電極、銅電極、鉬電極或鎢電極。再者,於上述電極為鋁電極之情形時,可為僅由鋁形成之電極,亦可為於金屬氧化物層之表面積層有鋁層之電極。作為上述金屬氧化物層之材料,可列舉摻雜有三價金屬元素之氧化銦及摻雜有三價金屬元素之氧化鋅等。作為上述三價金屬元素,可列舉Sn、Al及Ga等。 Examples of the electrode provided on the connection target member include a gold electrode and a nickel electrode. Electrode, tin electrode, aluminum electrode, copper electrode, silver electrode, molybdenum electrode and tungsten electrode. When the connection target member is a flexible printed circuit board, the electrode is preferably a gold electrode, a nickel electrode, a tin electrode, or a copper electrode. When the connection target member is a glass substrate, the electrode is preferably an aluminum electrode, a copper electrode, a molybdenum electrode, or a tungsten electrode. When the above-mentioned electrode is an aluminum electrode, it may be an electrode formed of only aluminum or an electrode having an aluminum layer on the surface area of the metal oxide layer. Examples of the material of the metal oxide layer include indium oxide doped with a trivalent metal element and zinc oxide doped with a trivalent metal element. Examples of the trivalent metal element include Sn, Al, and Ga.

以下,列舉實施例及比較例具體地說明本發明。本發明並不僅限定於以下之實施例。 Hereinafter, the present invention will be specifically described with examples and comparative examples. The present invention is not limited to the following examples.

(第1試驗例) (First test example) (合成例1) (Synthesis example 1)

硬化性化合物(1)之合成:將二甲基間苯二甲酸40g、1,6-己二醇100g、及作為觸媒之氧化二丁基錫0.2g稱量置於三口燒瓶中,於真空條件下,一面藉由迪安-斯塔克分離器(Dean-Stark trap)進行脫水一面於120℃下反應4小時。其後,添加甲基丙烯酸2-異氰酸酯基乙酯9g、及二丁基月桂酸二丁基錫0.05g,於120℃下反應4小時,藉此獲得硬化性化合物。所獲得之硬化性化合物之重量平均分子量為15000。 Synthesis of hardenable compound (1): 40 g of dimethyl isophthalic acid, 100 g of 1,6-hexanediol, and 0.2 g of dibutyltin oxide as a catalyst were weighed and placed in a three-necked flask under vacuum The reaction was carried out at 120 ° C. for 4 hours while dehydrating by a Dean-Stark trap. Thereafter, 9 g of 2-isocyanate ethyl methacrylate and 0.05 g of dibutyltin dilaurate were added and reacted at 120 ° C. for 4 hours to obtain a curable compound. The weight-average molecular weight of the obtained curable compound was 15,000.

(合成例2) (Synthesis example 2)

硬化性化合物(2)之合成:將二甲基間苯二甲酸37g及二甲基對苯二甲酸3g、1,6-己二醇100g、以及作為觸媒之氧化二丁基錫0.2g稱量置於三口燒瓶中,於真空條件下,一面藉由迪安-斯塔克分離器進行脫水一面於120℃下反應4小時。其後,添加甲基丙烯酸2-異氰酸酯基乙酯9g、及二丁基月桂酸二丁基錫0.05g,於120℃下反應4小時,藉此獲得硬化性化合 物。所獲得之硬化性化合物之重量平均分子量為15000。 Synthesis of hardenable compound (2): Weigh 37 g of dimethyl isophthalic acid, 3 g of dimethyl terephthalic acid, 100 g of 1,6-hexanediol, and 0.2 g of dibutyltin oxide as a catalyst. In a three-necked flask, the reaction was performed at 120 ° C. for 4 hours while dehydrating through a Dean-Stark separator under vacuum. Thereafter, 9 g of 2-isocyanate ethyl methacrylate and 0.05 g of dibutyltin dibutyl laurate were added and reacted at 120 ° C. for 4 hours to obtain a hardenable compound. Thing. The weight-average molecular weight of the obtained curable compound was 15,000.

(合成例3) (Synthesis example 3)

硬化性化合物(3)之合成:將二甲基間苯二甲酸40g、1,6-己二醇20g、雙酚F 15g、及作為觸媒之氧化二丁基錫0.2g稱量置於三口燒瓶中,於真空條件下,一面藉由迪安-斯塔克分離器進行脫水一面於120℃下反應4小時。其後,添加甲基丙烯酸2-異氰酸酯基乙酯9g、及二丁基月桂酸二丁基錫0.05g,於120℃下反應4小時,藉此獲得硬化性化合物。所獲得之硬化性化合物之重量平均分子量為12000。 Synthesis of hardening compound (3): 40 g of dimethyl isophthalic acid, 20 g of 1,6-hexanediol, 15 g of bisphenol F, and 0.2 g of dibutyltin oxide as a catalyst were weighed and placed in a three-necked flask Under a vacuum condition, the reaction was performed at 120 ° C for 4 hours while dehydration was performed by a Dean-Stark separator. Thereafter, 9 g of 2-isocyanate ethyl methacrylate and 0.05 g of dibutyltin dilaurate were added and reacted at 120 ° C. for 4 hours to obtain a curable compound. The weight-average molecular weight of the obtained curable compound was 12,000.

(合成例4) (Synthesis example 4)

硬化性化合物(4)之合成:將二甲基間苯二甲酸15g、二甲基己二酸25g、1,6-己二醇20g、雙酚F 15g、及作為觸媒之氧化二丁基錫0.2g稱量置於三口燒瓶中,於真空條件下,一面藉由迪安-斯塔克分離器進行脫水一面於120℃下反應4小時。其後,添加甲基丙烯酸2-異氰酸酯基乙酯9g、及二丁基月桂酸二丁基錫0.05g,於120℃下反應4小時,藉此獲得硬化性化合物。所獲得之硬化性化合物之重量平均分子量為16000。 Synthesis of hardening compound (4): 15 g of dimethyl isophthalic acid, 25 g of dimethyl adipic acid, 20 g of 1,6-hexanediol, 15 g of bisphenol F, and dibutyltin oxide 0.2 as a catalyst g was weighed and placed in a three-necked flask, and reacted at 120 ° C. for 4 hours while dehydrating with a Dean-Stark separator under vacuum. Thereafter, 9 g of 2-isocyanate ethyl methacrylate and 0.05 g of dibutyltin dilaurate were added and reacted at 120 ° C. for 4 hours to obtain a curable compound. The weight-average molecular weight of the obtained curable compound was 16,000.

(合成例5) (Synthesis example 5)

硬化性化合物(5)之合成:將二甲基間苯二甲酸15g、二甲基己二酸25g、1,6-己二醇20g、分子量650之聚1,4-丁二醇15g、及作為觸媒之氧化二丁基錫0.2g稱量置於三口燒瓶中,於真空條件下,一面藉由迪安-斯塔克分離器進行脫水一面於120℃下反應4小時。其後,添加甲基丙烯酸2-異氰酸酯基乙酯9g、及二丁基月桂酸二丁基錫0.05g,於120℃下反應4小時,藉此獲得硬化性化合物。所獲得之硬化性化合物之重量平均分子量為20000。 Synthesis of hardening compound (5): 15 g of dimethyl isophthalic acid, 25 g of dimethyl adipate, 20 g of 1,6-hexanediol, 15 g of poly 1,4-butanediol having a molecular weight of 650, and As a catalyst, 0.2 g of dibutyltin oxide was weighed and placed in a three-necked flask, and reacted at 120 ° C. for 4 hours while dehydrating with a Dean-Stark separator under vacuum. Thereafter, 9 g of 2-isocyanate ethyl methacrylate and 0.05 g of dibutyltin dilaurate were added and reacted at 120 ° C. for 4 hours to obtain a curable compound. The weight-average molecular weight of the obtained curable compound was 20,000.

(實施例1) (Example 1) (1)導電膏之製備 (1) Preparation of conductive paste

調配合成例1中所獲得之硬化性化合物(1)90重量份、丙烯酸系化合物(1)(KOHJIN FILM & CHEMICALS公司製造之「ACMO」)10重量份、焊料粒子(三井金屬礦業公司製造之「DS-10」,SnBi共晶,熔點139℃,平均粒徑12μm)30重量份、熱硬化劑(日油公司製造「PEROCTA O」,1分鐘半衰期溫度124.3℃)0.2重量份、及矽烷偶合劑(信越化學工業公司製造,聚合物型多官能胺基矽烷偶合劑「X-12-972A」)0.2重量份,獲得異向性導電膏。 90 parts by weight of the hardening compound (1) obtained in Example 1 and 10 parts by weight of the acrylic compound (1) ("ACMO" manufactured by KOHJIN FILM & CHEMICALS) were blended, and solder particles ("Mitsubishi Metal Mining Corporation" " DS-10 ", SnBi eutectic, melting point 139 ° C, average particle size 12 μm) 30 parts by weight, thermosetting agent (" PEROCTA O "manufactured by Nippon Oil Corporation, 1 minute half-life temperature 124.3 ° C), and 0.2 parts by weight of silane coupling agent (Shin-Etsu Chemical Industry Co., Ltd., polymer-type polyfunctional amine-based silane coupling agent "X-12-972A") 0.2 parts by weight to obtain an anisotropic conductive paste.

(2)連接構造體(1)之製作 (2) Production of connection structure (1)

作為被接著體1,準備於基材PET膜上形成有40條L/S=200/200μm之鋁配線之電路基板。作為被接著體2,準備於基材聚醯亞胺膜上在L/S=200/200μm之Cu配線上以基底Ni藉由無電解鍍Au形成有40條配線之FPC(Flexible Print Circuit,可撓性印刷電路板)。 As the adherend 1, a circuit board having 40 aluminum wirings with L / S = 200/200 μm formed on a base PET film was prepared. As the adherend 2, a FPC (Flexible Print Circuit, FPC) with 40 wirings was prepared on a base polyimide film with Cu wiring of L / S = 200/200 μm and base Ni by electroless plating Au. Flexible printed circuit board).

於被接著體1上藉由空氣分配器(air dispenser)塗佈異向性導電膏3mg。將被接著體2設為重合寬度3mm,以被接著體1與被接著體2之電極圖案吻合之方式,介隔異向性導電膏將被接著體1與被接著體2重合。其後,於140℃下以壓力1MPa接合10秒,獲得連接構造體(1)。 3 mg of an anisotropic conductive paste was applied to the adherend 1 through an air dispenser. The adherend 2 was set to have an overlap width of 3 mm, and the anisotropic conductive paste was used to overlap the adherend 1 and the adherend 2 in such a manner that the electrode patterns of the adherend 1 and the adherend 2 coincide. Then, it joined at 140 degreeC for 10 second under the pressure of 1 MPa, and obtained the connection structure (1).

(實施例2) (Example 2)

將合成例1中所獲得之硬化性化合物(1)變更為合成例2中所獲得之硬化性化合物(2),除此以外,以與實施例1同樣之方式獲得異向性導電膏及連接構造體(1)。 An anisotropic conductive paste and a connection were obtained in the same manner as in Example 1 except that the curable compound (1) obtained in Synthesis Example 1 was changed to the curable compound (2) obtained in Synthesis Example 2. Construct (1).

(實施例3) (Example 3)

連接構造體(2)之製作:使用實施例1中所獲得之異向性導電膏,作為被接著體1,使用FFC(可撓性扁平電纜)、以L/S=200/200μm形成有40條配線之被接著 體,除此以外,以與連接構造體(1)同樣之方式獲得連接構造體(2)。 Production of connection structure (2): The anisotropic conductive paste obtained in Example 1 was used, and as the adherend 1, FFC (flexible flat cable) was used, and 40 was formed at L / S = 200/200 μm. Wiring Except for the body, the connection structure (2) was obtained in the same manner as the connection structure (1).

(實施例4~11) (Examples 4 to 11) (1)導電膏之製備 (1) Preparation of conductive paste

將調配成分之種類及調配量變更為如下述表1所示般,除此以外,以與實施例1同樣之方式獲得異向性導電膏。 An anisotropic conductive paste was obtained in the same manner as in Example 1 except that the types and blending amounts of the blending components were changed as shown in Table 1 below.

再者,(甲基)丙烯酸系化合物之詳細情況如下。 The details of the (meth) acrylic compound are as follows.

(甲基)丙烯酸系化合物(2):DAICEL-ALLNEX公司製造之「Ebecryl8413」,脂肪族丙烯酸胺基甲酸酯 (Meth) acrylic compound (2): "Ebecryl8413" manufactured by DAICEL-ALLNEX, aliphatic acrylic urethane

(甲基)丙烯酸系化合物(3):DAICEL-ALLNEX公司製造之「Ebecryl3708」,於分子末端具有丙烯酸2-羥基乙酯加成於己內酯之構造,且具有雙酚A之二縮水甘油基開環之構造作為主骨架的環氧丙烯酸酯 (Meth) acrylic compound (3): "Ebecryl 3708" manufactured by DAICEL-ALLNEX Corporation, which has a structure in which 2-hydroxyethyl acrylate is added to caprolactone at the molecular terminal, and has a diglycidyl group of bisphenol A Ring-opening structure epoxy acrylate as main skeleton

(甲基)丙烯酸系化合物(4):DAICEL-ALLNEX公司製造之「Ebecryl168」,羥基乙基甲基丙烯酸酯磷酸酯等磷酸酯型(甲基)丙烯酸酯 (Meth) acrylic compound (4): "Ebecryl168" manufactured by DAICEL-ALLNEX, phosphate ester (meth) acrylate such as hydroxyethyl methacrylate phosphate

(甲基)丙烯酸系化合物(5):東亞合成公司製造之「M-140」,醯亞胺(甲基)丙烯酸酯 (Meth) acrylic compound (5): "M-140" manufactured by Toya Synthesis Co., Ltd.

(2)連接構造體(3)之製作 (2) Production of connection structure (3)

使用所獲得之異向性導電膏,於140℃下以壓力1MPa接合5秒,除此以外,以與連接構造體(1)同樣之方式獲得連接構造體(3)。 A connection structure (3) was obtained in the same manner as the connection structure (1), except that the obtained anisotropic conductive paste was bonded at 140 ° C for 5 seconds under a pressure of 1 MPa.

(3)連接構造體(4)之製作 (3) Production of connection structure (4)

使用所獲得之異向性導電膏,於140℃下以壓力1MPa接合5秒,除此以外,以與連接構造體(2)同樣之方式獲得連接構造體(4)。 A connection structure (4) was obtained in the same manner as the connection structure (2), except that the obtained anisotropic conductive paste was bonded at a pressure of 1 MPa at 140 ° C for 5 seconds.

(比較例1) (Comparative example 1)

將硬化性化合物之種類變更為雙酚A型環氧化合物,除此以外,以與實施例1同樣之方式獲得異向性導電膏。使用所獲得之異向性導 電膏,以與實施例1同樣之方式獲得連接構造體(1),以與實施例3同樣之方式獲得連接構造體(2),以與實施例4~11同樣之方式獲得連接構造體(3)及連接構造體(4)。 An anisotropic conductive paste was obtained in the same manner as in Example 1 except that the type of the curable compound was changed to a bisphenol A type epoxy compound. Use the anisotropic guide obtained An electric paste was used to obtain a connection structure (1) in the same manner as in Example 1, a connection structure (2) was obtained in the same manner as in Example 3, and a connection structure was obtained in the same manner as in Examples 4 to 11 ( 3) and connection structure (4).

(評價) (Evaluation) (1)初期接著性 (1) Initial adhesion

使用所獲得之連接構造體,使用島津製作所公司製造之「Micro Autograph MST-I」進行剝離,藉此以拉伸速度50mm/分鐘於23℃環境下測定90°剝離強度C。根據下述基準判定初期接著性。 Using the obtained connection structure, peeling was performed using "Micro Autograph MST-I" manufactured by Shimadzu Corporation, and the 90 ° peel strength C was measured at 23 ° C at a tensile speed of 50 mm / minute. The initial adherence was determined based on the following criteria.

[初期接著性之判定基準] [Judgment Criteria for Initial Adhesion]

○○:90°剝離強度C為20N/cm以上 ○○: 90 ° peel strength C is 20N / cm or more

○:90°剝離強度C為15N/cm以上且未達20N/cm ○: 90 ° peel strength C is 15 N / cm or more and less than 20 N / cm

△:90°剝離強度C為10N/cm以上且未達15Ncm △: 90 ° peel strength C is 10N / cm or more and less than 15Ncm

×:90°剝離強度C未達10N/cm ×: 90 ° peel strength C is less than 10 N / cm

(2)高溫高濕下之接著性 (2) Adhesion under high temperature and humidity

將所獲得之連接構造體於85℃及濕度85%環境下靜置500小時。關於放置後之連接構造體,以與上述(1)接著性之評價同樣之方式測定90°剝離強度D。根據下述基準判定高溫高濕下之接著性。 The obtained connection structure was left to stand in an environment of 85 ° C. and 85% humidity for 500 hours. With respect to the connection structure after being left to stand, the 90 ° peel strength D was measured in the same manner as in the evaluation of the adhesiveness (1) above. Adhesion under high temperature and high humidity was determined according to the following criteria.

[高溫高濕下之接著性之判定基準] [Criterion for Adhesion under High Temperature and High Humidity]

○○:90°剝離強度C為20N/cm以上且剝離強度D/剝離強度C×100為80%以上 ○○: 90 ° peel strength C is 20 N / cm or more and peel strength D / peel strength C × 100 is 80% or more

○:90°剝離強度C為15N/cm以上且未達20N/cm,且剝離強度D/剝離強度C×100為80%以上 ○: 90 ° peel strength C is 15 N / cm or more and less than 20 N / cm, and peel strength D / peel strength C × 100 is 80% or more

△:90°剝離強度C為10N/cm以上且未達15Ncm,且剝離強度D/剝離強度C×100為80%以上 △: 90 ° peel strength C is 10 N / cm or more and less than 15 Ncm, and peel strength D / peel strength C × 100 is 80% or more

×:90°剝離強度C未達10N/cm ×: 90 ° peel strength C is less than 10 N / cm

(3)上下電極間之導通可靠性 (3) Reliability between the upper and lower electrodes

於所獲得之連接構造體(n=15個)中,藉由四端子法分別測定上下電極間之連接電阻。算出連接電阻之平均值。再者,根據電壓=電流×電阻之關係,可藉由測定流過固定電流時之電壓而求出連接電阻。根據下述基準判定導通可靠性。所求出之連接電阻設為重合有1對電極之連接部之電阻。 In the obtained connection structures (n = 15), the connection resistance between the upper and lower electrodes was measured by the four-terminal method, respectively. Calculate the average connection resistance. Furthermore, based on the relationship of voltage = current × resistance, the connection resistance can be obtained by measuring the voltage when a fixed current flows. The conduction reliability was determined based on the following criteria. The obtained connection resistance is a resistance of a connection portion in which a pair of electrodes are superposed.

[導通可靠性之判定基準] [Judgment Criteria for Continuity Reliability]

○○:連接電阻之平均值為50mΩ以下 ○○: The average value of the connection resistance is 50mΩ or less

○:連接電阻之平均值超過50mΩ且為75mΩ以下 ○: The average value of the connection resistance exceeds 50 mΩ and is 75 mΩ or less

△:連接電阻之平均值超過75mΩ且為100mΩ以下 △: The average value of the connection resistance exceeds 75 mΩ and is less than 100 mΩ

×:連接電阻之平均值超過100mΩ ×: The average value of the connection resistance exceeds 100 mΩ

(4)斷裂伸長率 (4) Elongation at break

於實施例及比較例之各導電膏之製備中,僅未調配導電性粒子,除此以外,以同樣之方式製備不含導電性粒子之硬化性組合物。使所獲得之硬化性組合物於140℃及10秒之條件下硬化,獲得硬化物。將所獲得之硬化物於23℃及拉伸速度1mm/分鐘、夾頭間距離40mm之條件下拉伸,測定斷裂伸長率。 In the preparation of each of the conductive pastes of the Examples and Comparative Examples, except that no conductive particles were prepared, a curable composition containing no conductive particles was prepared in the same manner. The obtained curable composition was cured at 140 ° C and 10 seconds to obtain a cured product. The obtained cured product was stretched under conditions of 23 ° C., a stretching speed of 1 mm / minute, and a distance between chucks of 40 mm, and the elongation at break was measured.

將組成及結果示於下述表1。 The composition and results are shown in Table 1 below.

(第2試驗例) (Second Test Example) (合成例6) (Synthesis example 6)

硬化性化合物(6)之合成:將二甲基間苯二甲酸64g、二甲基己二酸19g、1,6-己二醇38g、分子量650之聚1,4-丁二醇90g、及作為觸媒之四丁氧基鈦2g稱量置於三口燒瓶中,於真空條件下,一面藉由迪安-斯塔克分離器進行脫甲醇一面於120℃下反應4小時。其後,添加丙烯酸2-異氰酸酯基乙酯6g、及二丁基月桂酸二丁基錫0.6g,於120℃下反應4小時,藉此獲得硬化性化合物。所獲得之硬化性化合物之重量平均分子量為27000。 Synthesis of hardenable compound (6): 64 g of dimethyl isophthalic acid, 19 g of dimethyl adipate, 38 g of 1,6-hexanediol, 90 g of poly 1,4-butanediol having a molecular weight of 650, and As a catalyst, 2 g of titanium tetrabutoxide was weighed and placed in a three-necked flask. The reaction was performed at 120 ° C. for 4 hours while the methanol was removed by a Dean-Stark separator under vacuum. Then, 6 g of 2-isocyanate ethyl acrylate and 0.6 g of dibutyltin dibutyl laurate were added, and it reacted at 120 degreeC for 4 hours, and obtained the hardening compound. The weight-average molecular weight of the obtained curable compound was 27,000.

(合成例7) (Synthesis example 7)

硬化性化合物(7)之合成:將二甲基間苯二甲酸58g、二甲基己二酸17g、1,6-己二醇40g、分子量650之聚1,4-丁二醇94g、及作為觸媒之四丁氧基鈦2g稱量置於三口燒瓶中,於真空條件下,一面藉由迪安-斯塔克分離器進行脫甲醇一面於120℃下反應4小時。其後,添加丙烯酸2-異氰酸酯基乙酯23g、及二丁基月桂酸二丁基錫0.6g,於120℃下反應4小時,藉此獲得硬化性化合物。所獲得之硬化性化合物之重量平均分子量為8300。 Synthesis of hardening compound (7): 58 g of dimethyl isophthalic acid, 17 g of dimethyl adipate, 40 g of 1,6-hexanediol, 94 g of poly 1,4-butanediol having a molecular weight of 650, and As a catalyst, 2 g of titanium tetrabutoxide was weighed and placed in a three-necked flask. The reaction was performed at 120 ° C. for 4 hours while the methanol was removed by a Dean-Stark separator under vacuum. Thereafter, 23 g of 2-isocyanate ethyl acrylate and 0.6 g of dibutyltin dilaurate were added and reacted at 120 ° C. for 4 hours to obtain a hardenable compound. The weight-average molecular weight of the obtained curable compound was 8,300.

(實施例12) (Example 12)

於調配合成例6中所獲得之硬化性化合物(6)88.5重量份、丙烯酸4-羥基丁酯(東京化成工業公司製造)10重量份、及熱硬化劑(日油公司製造之「PEROCTA O」,1分鐘半衰期溫度124.3℃)1.5重量份後,利用行星式攪拌裝置進行混合及消泡,藉此獲得硬化性組合物。 88.5 parts by weight of the hardenable compound (6) obtained in Preparation Example 6, 10 parts by weight of 4-hydroxybutyl acrylate (manufactured by Tokyo Chemical Industry Co., Ltd.), and a thermosetting agent ("PEROCTA O" manufactured by Nippon Oil Corporation) (1 minute half-life temperature: 124.3 ° C) 1.5 parts by weight, and then mixed and defoamed with a planetary stirring device to obtain a hardenable composition.

(實施例13~35) (Examples 13 to 35)

將調配成分之種類及調配量變更為如下述表2、3所示般,除此以外,以與實施例1同樣之方式獲得硬化性組合物。 A curable composition was obtained in the same manner as in Example 1 except that the types and blending amounts of the blending components were changed to those shown in Tables 2 and 3 below.

(評價) (Evaluation) (1)接著性 (1) Adherence

接著試片係按以下順序製成。於SUS基板(2cm×7cm)上塗佈硬化性組合物,並於其上載置PET膜,自其上以平滑之板進行壓抵,使硬化性組合物成為固定厚度(80μm),獲得積層體。 The test pieces were then produced in the following order. A hardening composition was coated on a SUS substrate (2cm × 7cm), and a PET film was placed thereon, and a smooth plate was pressed thereon to make the hardening composition a fixed thickness (80 μm) to obtain a laminated body. .

關於所獲得之積層體,於在130℃下10秒、壓力1MPa之條件下進行熱硬化,獲得接著試片。 The obtained laminated body was heat-cured under conditions of 130 ° C. for 10 seconds and a pressure of 1 MPa to obtain a subsequent test piece.

使用所獲得之接著試片,藉由島津製作所公司製造之「Micro Autograph MST-I」進行剝離,藉此以拉伸速度300mm/分鐘於23℃或100℃之環境下測定180°剝離強度。根據下述基準判定初期接著性。 Using the obtained test piece, peeling was performed with "Micro Autograph MST-I" manufactured by Shimadzu Corporation, and a 180 ° peel strength was measured at an extension speed of 300 mm / min in an environment of 23 ° C or 100 ° C. The initial adherence was determined based on the following criteria.

[初期接著性之判定基準] [Judgment Criteria for Initial Adhesion]

○○○:180°剝離強度為1.5N/mm以上 ○○○: 180 ° peel strength is 1.5N / mm or more

○○:180°剝離強度為1.0/mm以上且未達1.5N/mm ○○: 180 ° peel strength is 1.0 / mm or more and less than 1.5N / mm

○:180°剝離強度為0.5N/mm以上且未達1.0N/mm ○: 180 ° peel strength is 0.5N / mm or more and less than 1.0N / mm

△:180°剝離強度為0.25N/mm以上且未達0.5N/mm △: 180 ° peel strength is 0.25N / mm or more and less than 0.5N / mm

×:180°剝離強度未達0.25N/mm ×: 180 ° peel strength is less than 0.25N / mm

(2)硬化性 (2) Hardenability

於硬化時間為10秒與30秒之兩種條件下製成試片,除此以外,與上述接著性之評價方法同樣地製成試片,測定180°剝離強度。依照下述式對硬化性進行評價。 A test piece was prepared under the two conditions of a hardening time of 10 seconds and 30 seconds, and a test piece was produced in the same manner as the above-mentioned evaluation method of adhesiveness, and the 180 ° peel strength was measured. The hardenability was evaluated according to the following formula.

硬化性(%)=(硬化時間10秒時之180°剝離強度)×100/硬化時間30秒時之180°剝離強度 Hardness (%) = (180 ° peel strength at 10 seconds of hardening time) × 100/180 ° peel strength at 30 seconds of hardening time

[硬化性之判定基準] [Critical criteria for hardenability]

○○:95%以上 ○○: 95% or more

○:90%以上且未達95% ○: 90% or more and less than 95%

△:85%以上且未達90% △: 85% or more and less than 90%

×:未達85% ×: Less than 85%

將組成及結果示於下述表2、3。 The composition and results are shown in Tables 2 and 3 below.

(第3試驗例) (Third Test Example)

(合成例8)不屬於式(1)所表示之硬化性化合物之硬化性化合物之合成 (Synthesis Example 8) Synthesis of hardenable compound which is not a hardenable compound represented by formula (1)

硬化性化合物(8)(直鏈狀聚酯化合物)之合成:將二甲基己二酸64.6g、二甲基間苯二甲酸24.0g、1,6-己二醇61.4、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯6.3g、及二丁基月桂酸二丁基錫0.6g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為8000。 Synthesis of hardenable compound (8) (straight-chain polyester compound): 64.6 g of dimethyl adipate, 24.0 g of dimethyl isophthalic acid, 61.4 hexanediol, and as a catalyst 0.05 g of titanium tetrabutoxide was weighed and placed in a three-necked flask, and the reaction was carried out at 140 ° C for 4 hours while removing methanol, followed by a reaction at 140 ° C for 12 hours under reduced pressure. Thereafter, 6.3 g of 2-isocyanate ethyl acrylate and 0.6 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound (straight-chain polyester compound). The weight-average molecular weight of the obtained curable compound was 8,000.

(合成例9) (Synthesis example 9)

硬化性化合物(9)(直鏈狀聚酯化合物)之合成:將二甲基己二酸56.7g、二甲基間苯二甲酸21.1g、1,6-己二醇51.2、分子量650之聚1,4-丁二醇(PTMG650)14.8g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面自系內去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯6.4g、及二丁基月桂酸二丁基錫0.6g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為8500。 Synthesis of hardening compound (9) (straight-chain polyester compound): 56.7 g of dimethyl adipate, 21.1 g of dimethyl isophthalic acid, 51.2 of 1,6-hexanediol, and a molecular weight of 650 14.8 g of 1,4-butanediol (PTMG650) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask. The methanol was removed from the system while reacting at 140 ° C for 4 hours. The reaction was carried out under reduced pressure at 140 ° C for 12 hours. Thereafter, 6.4 g of 2-isocyanate ethyl acrylate and 0.6 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound (straight-chain polyester compound). The weight-average molecular weight of the obtained curable compound was 8,500.

(合成例10) (Synthesis example 10)

硬化性化合物(10)(直鏈狀聚酯化合物)之合成:將二甲基間苯二甲酸56.1g、二甲基己二酸20.1g、1,6-己二醇50.6g、分子量1000之聚1,4-丁二醇(PTMG1000)22.5g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯6.4g、及二丁基月桂酸二丁基錫0.6g,於70℃下反 應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為12000。 Synthesis of hardenable compound (10) (straight-chain polyester compound): 56.1 g of dimethyl isophthalic acid, 20.1 g of dimethyl adipate, 50.6 g of 1,6-hexanediol, and a molecular weight of 1,000 22.5 g of poly 1,4-butanediol (PTMG1000) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask, and the reaction was carried out at 140 ° C for 4 hours while removing methanol, and then under reduced pressure. The reaction was carried out at 140 ° C for 12 hours. Thereafter, 6.4 g of 2-isocyanate ethyl acrylate and 0.6 g of dibutyltin dibutyl laurate were added, and the mixture was reacted at 70 ° C. It should take 4 hours to obtain a curable compound (straight-chain polyester compound). The weight-average molecular weight of the obtained curable compound was 12,000.

(合成例11) (Synthesis example 11)

硬化性化合物(11)(直鏈狀聚酯化合物)之合成:將二甲基間苯二甲酸47.0g、二甲基己二酸17.5g、1,6-己二醇42.4g、分子量2000之聚1,4-丁二醇(PTMG2000)37.8g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯5.3g、及二丁基月桂酸二丁基錫0.65g,於70℃下反應4小時,藉此獲得硬化性化合物)(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為18000。 Synthesis of hardening compound (11) (straight-chain polyester compound): 47.0 g of dimethyl isophthalic acid, 17.5 g of dimethyl adipate, 42.4 g of 1,6-hexanediol, and a molecular weight of 2000 37.8 g of poly 1,4-butanediol (PTMG2000) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask. The reaction was carried out at 140 ° C for 4 hours while removing methanol, and then under reduced pressure. The reaction was carried out at 140 ° C for 12 hours. Thereafter, 5.3 g of 2-isocyanate ethyl acrylate and 0.65 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound) (linear polyester compound). The weight-average molecular weight of the obtained curable compound was 18,000.

(合成例12) (Synthesis example 12)

硬化性化合物(12)(直鏈狀聚酯化合物)之合成:將二甲基間苯二甲酸41.8g、二甲基己二酸15.5g、1,6-己二醇37.7g、分子量3000之聚1,4-丁二醇(PTMG3000)50.3g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯4.7g、及二丁基月桂酸二丁基錫0.4g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為30000。 Synthesis of hardenable compound (12) (straight-chain polyester compound): 41.8 g of dimethyl isophthalic acid, 15.5 g of dimethyl adipate, 37.7 g of 1,6-hexanediol, and a molecular weight of 3000 50.3 g of poly 1,4-butanediol (PTMG3000) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask. The reaction was carried out at 140 ° C for 4 hours while removing methanol, and then under reduced pressure. The reaction was carried out at 140 ° C for 12 hours. Thereafter, 4.7 g of 2-isocyanate ethyl acrylate and 0.4 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound (straight-chain polyester compound). The weight-average molecular weight of the obtained curable compound was 30,000.

(合成例13) (Synthesis example 13)

硬化性化合物(13)(直鏈狀聚酯化合物)之合成:將二甲基間苯二甲酸56.1g、二甲基己二酸20.1g、1,6-己二醇50.6g、分子量1000之聚乙二醇(PEG1000)22.5g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰 酸酯基乙酯6.4g、及二丁基月桂酸二丁基錫0.6g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為12000。 Synthesis of hardening compound (13) (straight-chain polyester compound): 56.1 g of dimethyl isophthalic acid, 20.1 g of dimethyl adipate, 50.6 g of 1,6-hexanediol, and a molecular weight of 1,000 22.5 g of polyethylene glycol (PEG1000) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask. The reaction was carried out at 140 ° C for 4 hours while removing methanol, and then at 140 ° C under reduced pressure. The reaction was continued for 12 hours. Thereafter, acrylic acid 2-isocyanate was added 6.4 g of ester-based ethyl esters and 0.6 g of dibutyltin dilaurate were reacted at 70 ° C. for 4 hours to obtain a hardenable compound (straight-chain polyester compound). The weight-average molecular weight of the obtained curable compound was 12,000.

(合成例14) (Synthesis example 14)

硬化性化合物(14)(直鏈狀聚酯化合物)之合成:將二甲基間苯二甲酸51.9g、二甲基己二酸19.3g、1,6-己二醇47.8g、分子量2000之聚1,4-丁二醇(PTMG2000)25.0g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯5.9g、及二丁基月桂酸二丁基錫0.65g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為18000。 Synthesis of hardening compound (14) (straight-chain polyester compound): 51.9 g of dimethyl isophthalic acid, 19.3 g of dimethyl adipate, 47.8 g of 1,6-hexanediol, and a molecular weight of 2000 25.0 g of poly 1,4-butanediol (PTMG2000) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask, and the reaction was carried out at 140 ° C for 4 hours while removing methanol, and then under reduced pressure. The reaction was carried out at 140 ° C for 12 hours. Thereafter, 5.9 g of 2-isocyanate ethyl acrylate and 0.65 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound (straight-chain polyester compound). The weight-average molecular weight of the obtained curable compound was 18,000.

(合成例15) (Synthesis example 15)

硬化性化合物(15)(直鏈狀聚酯化合物)之合成:將二甲基間苯二甲酸38.0g、二甲基己二酸14.1g、1,6-己二醇32.5g、分子量2000之聚1,4-丁二醇(PTMG2000)61.1g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯4.3g、及二丁基月桂酸二丁基錫0.4g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為18000。 Synthesis of hardening compound (15) (straight-chain polyester compound): 38.0 g of dimethyl isophthalic acid, 14.1 g of dimethyl adipate, 32.5 g of 1,6-hexanediol, and a molecular weight of 2000 61.1 g of poly 1,4-butanediol (PTMG2000) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask, and the reaction was carried out at 140 ° C for 4 hours while removing methanol, and then under reduced pressure. The reaction was carried out at 140 ° C for 12 hours. Thereafter, 4.3 g of 2-isocyanate ethyl acrylate and 0.4 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound (linear polyester compound). The weight-average molecular weight of the obtained curable compound was 18,000.

(合成例16) (Synthesis example 16)

硬化性化合物(16)(直鏈狀聚酯化合物)之合成:將二甲基對苯二甲酸47.0g、二甲基己二酸17.5g、1,6-己二醇42.4g、分子量2000之聚1,4-丁二醇(PTMG2000)37.8g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃ 下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯5.3g、及二丁基月桂酸二丁基錫0.65g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為18000。 Synthesis of hardening compound (16) (straight-chain polyester compound): 47.0 g of dimethyl terephthalic acid, 17.5 g of dimethyl adipate, 42.4 g of 1,6-hexanediol, and a molecular weight of 2000 37.8 g of poly 1,4-butanediol (PTMG2000) and 0.05 g of titanium tetrabutoxide as a catalyst were weighed and placed in a three-necked flask, while removing methanol at 140 ° C After the reaction was carried out for 4 hours, the reaction was carried out under reduced pressure at 140 ° C for 12 hours. Thereafter, 5.3 g of 2-isocyanate ethyl acrylate and 0.65 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound (linear polyester compound). The weight-average molecular weight of the obtained curable compound was 18,000.

(合成例17) (Synthesis example 17)

硬化性化合物(17)(直鏈狀聚酯化合物)之合成:將二甲基己二酸63.4g、1,6-己二醇42.9g、分子量2000之聚1,4-丁二醇(PTMG2000)38.2g、及作為觸媒之四丁氧基鈦0.05g稱量置於三口燒瓶中,一面去除甲醇一面於140℃下反應4小時後,於減壓下於140℃下反應12小時。其後,添加丙烯酸2-異氰酸酯基乙酯5.4g、及二丁基月桂酸二丁基錫0.65g,於70℃下反應4小時,藉此獲得硬化性化合物(直鏈狀聚酯化合物)。所獲得之硬化性化合物之重量平均分子量為18000。 Synthesis of hardenable compound (17) (straight-chain polyester compound): 63.4 g of dimethyl adipate, 42.9 g of 1,6-hexanediol, and poly 1,4-butanediol (PTMG2000 with a molecular weight of 2000) 38.2 g, and 0.05 g of tetrabutoxytitanium as a catalyst were weighed and placed in a three-necked flask, and reacted at 140 ° C for 4 hours while removing methanol, and then reacted at 140 ° C for 12 hours under reduced pressure. Thereafter, 5.4 g of 2-isocyanate ethyl acrylate and 0.65 g of dibutyltin dilaurate were added and reacted at 70 ° C. for 4 hours to obtain a curable compound (linear polyester compound). The weight-average molecular weight of the obtained curable compound was 18,000.

(實施例36) (Example 36)

於調配合成例9中所獲得之硬化性化合物(9)98.5重量份與熱硬化劑(日油公司製造「PEROCTA O」,1分鐘半衰期溫度124.3℃)1.5重量份後,利用行星式攪拌裝置進行混合及消泡,藉此獲得硬化性組合物。 After mixing 98.5 parts by weight of the hardenable compound (9) obtained in Preparation Example 9 with 1.5 parts by weight of a thermal hardener ("PEROCTA O" manufactured by Nippon Oil Corporation, 1 minute half-life temperature 124.3 ° C), the mixture was carried out using a planetary stirring device By mixing and defoaming, a curable composition is obtained.

(實施例37~45) (Examples 37 to 45)

將調配成分之種類及調配量變更為如下述表4所示,除此以外,以與實施例1同樣之方式獲得硬化性組合物。 A curable composition was obtained in the same manner as in Example 1 except that the types and blending amounts of the blending components were changed as shown in Table 4 below.

(評價) (Evaluation) (1)玻璃轉移溫度(Tg) (1) Glass transition temperature (Tg)

使用0.5mm之間隔件及熱壓機製成厚度0.5mm之硬化物。關於所獲得之硬化物,藉由DMA(Dynamic Mechanical Analyzer,動態機械分析儀)(黏彈性測定裝置)於10℃/min之升溫條件下求出玻璃轉移溫 度。 A 0.5mm thickness hardened product was made using a 0.5mm spacer and a hot press. About the obtained hardened | cured material, the glass transition temperature was calculated | required by DMA (Dynamic Mechanical Analyzer) (viscoelasticity measuring device) under the temperature rising condition of 10 degree-C / min. degree.

(2)-30℃下之拉伸彈性模數 (2) Tensile elastic modulus at -30 ℃

使用0.5mm之間隔件及熱壓機,製成厚度0.5mm之硬化物。將上述硬化物切割為特定尺寸(5.0mm×50mm×0.5mmt)。於-30℃下,使用萬能材料試驗機(AND公司製造之「Tensilon」)求出拉伸彈性模數。 Using a 0.5mm spacer and a hot press, a hardened material with a thickness of 0.5mm is made. The hardened | cured material was cut | disconnected to specific size (5.0 mm * 50 mm * 0.5 mmt). The tensile elastic modulus was determined at -30 ° C using a universal material testing machine ("Tensilon" manufactured by AND Corporation).

(2)接著性 (2) Adherence

接著試片係按以下順序製成。於SUS(Steel Use Stainless,不鏽鋼)基板(2cm×7cm)上塗佈硬化性組合物,於其上載置PET膜,自其上以平滑之板進行壓抵,使硬化性組合物成為固定厚度(80μm),獲得積層體。 The test pieces were then produced in the following order. A hardening composition is coated on a SUS (Steel Use Stainless) substrate (2cm × 7cm), a PET film is placed thereon, and a smooth plate is pressed thereon to make the hardening composition a fixed thickness ( 80 μm) to obtain a laminate.

關於所獲得之積層體,於在130℃下10秒、壓力1MPa之條件下進行熱硬化,獲得接著試片。 The obtained laminated body was heat-cured under conditions of 130 ° C. for 10 seconds and a pressure of 1 MPa to obtain a subsequent test piece.

使用所獲得之接著試片,藉由島津製作所公司製造之「Micro Autograph MST-I」進行剝離,藉此以拉伸速度300mm/分鐘於23℃之環境下測定180°剝離強度。根據下述基準判定初期接著性。 Using the obtained test piece, peeling was performed with "Micro Autograph MST-I" manufactured by Shimadzu Corporation, and the 180 ° peel strength was measured at a tensile speed of 300 mm / minute under an environment of 23 ° C. The initial adherence was determined based on the following criteria.

[初期接著性之判定基準] [Judgment Criteria for Initial Adhesion]

○○○:180°剝離強度為1.5N/mm以上 ○○○: 180 ° peel strength is 1.5N / mm or more

○○:180°剝離強度為1.0/mm以上且未達1.5N/mm ○○: 180 ° peel strength is 1.0 / mm or more and less than 1.5N / mm

○:180°剝離強度為0.5N/mm以上且未達1.0N/mm ○: 180 ° peel strength is 0.5N / mm or more and less than 1.0N / mm

△:180°剝離強度為0.25N/mm以上且未達0.5N/mm △: 180 ° peel strength is 0.25N / mm or more and less than 0.5N / mm

×:180°剝離強度未達0.25N/mm ×: 180 ° peel strength is less than 0.25N / mm

(4)硬化性 (4) Hardenability

於硬化時間為10秒與30秒之兩種條件下製成試片,除此以外,與上述接著性之評價方法同樣地製成試片,測定180°剝離強度。按照下述式對硬化性進行評價。 A test piece was prepared under the two conditions of a hardening time of 10 seconds and 30 seconds, and a test piece was produced in the same manner as the above-mentioned evaluation method of adhesiveness, and the 180 ° peel strength was measured. The hardenability was evaluated according to the following formula.

硬化性(%)=(硬化時間10秒時之180°剝離強度)×100/硬化時間30秒時之180°剝離強度 Hardness (%) = (180 ° peel strength at 10 seconds of hardening time) × 100/180 ° peel strength at 30 seconds of hardening time

[硬化性之判定基準] [Critical criteria for hardenability]

○○:95%以上 ○○: 95% or more

○:90%以上且未達95% ○: 90% or more and less than 95%

△:85%以上且未達90% △: 85% or more and less than 90%

×:未達85% ×: Less than 85%

將組成及結果示於下述表4。 The composition and results are shown in Table 4 below.

Claims (22)

一種硬化性組合物,其包含:硬化性化合物,其係藉由使用由下述式(11)所表示之化合物與二醇化合物之反應所獲得之第1化合物,並使具有異氰酸酯基及不飽和雙鍵之第2化合物與上述第1化合物進行反應而獲得,及熱硬化劑,上述硬化性化合物之重量平均分子量為8000以上且50000以下,[化1]R1OOC-X-COOR2…(11)上述式(11)中,X表示碳數2~10之伸烷基或表示伸苯基,R1及R2分別表示氫原子或碳數1~4之烷基。A curable composition comprising a curable compound, which is a first compound obtained by using a reaction of a compound represented by the following formula (11) and a diol compound, and has an isocyanate group and an unsaturated group. The second compound having a double bond is obtained by reacting with the above-mentioned first compound, and a thermosetting agent. The weight-average molecular weight of the above-mentioned hardening compound is 8,000 or more and 50,000 or less. In the formula (11), X represents an alkylene group having 2 to 10 carbon atoms or represents a phenylene group, and R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms. 如請求項1之硬化性組合物,其中上述式(11)所表示之化合物係下述式(11A)所表示之化合物,上述式(11A)中,R1及R2分別表示氫原子或碳數1~4之烷基。The curable composition according to claim 1, wherein the compound represented by the above formula (11) is a compound represented by the following formula (11A), In the formula (11A), R1 and R2 each represent a hydrogen atom or an alkyl group having 1 to 4 carbon atoms. 如請求項1之硬化性組合物,其中上述式(11)所表示之化合物係對苯二甲酸、對苯二甲酸烷基酯、間苯二甲酸、或間苯二甲酸烷基酯。The curable composition according to claim 1, wherein the compound represented by the formula (11) is terephthalic acid, an alkyl terephthalate, isophthalic acid, or an alkyl isophthalate. 如請求項1至3中任一項之硬化性組合物,其中上述二醇化合物包含1,6-己二醇。The sclerosing composition according to any one of claims 1 to 3, wherein the diol compound comprises 1,6-hexanediol. 如請求項1至3中任一項之硬化性組合物,其中上述二醇化合物包含雙酚A或雙酚F。The curable composition according to any one of claims 1 to 3, wherein the diol compound contains bisphenol A or bisphenol F. 如請求項1至3中任一項之硬化性組合物,其中上述二醇化合物包含1,6-己二醇與雙酚A或雙酚F。The curable composition according to any one of claims 1 to 3, wherein the diol compound comprises 1,6-hexanediol and bisphenol A or bisphenol F. 如請求項1至3中任一項之硬化性組合物,其中上述第2化合物具有(甲基)丙烯醯基作為含有不飽和雙鍵之基。The curable composition according to any one of claims 1 to 3, wherein the second compound has a (meth) acrylfluorenyl group as a group containing an unsaturated double bond. 如請求項7之硬化性組合物,其中上述第2化合物係(甲基)丙烯醯氧基烷氧基異氰酸酯。The curable composition according to claim 7, wherein the second compound is a (meth) acryloxyalkoxy isocyanate. 如請求項1至3中任一項之硬化性組合物,其包含四級銨鹽化合物或具有羥基之(甲基)丙烯酸系化合物。The curable composition according to any one of claims 1 to 3, which comprises a quaternary ammonium salt compound or a (meth) acrylic compound having a hydroxyl group. 如請求項9之硬化性組合物,其包含上述四級銨鹽化合物。The curable composition according to claim 9, comprising the above-mentioned quaternary ammonium salt compound. 如請求項9之硬化性組合物,其包含上述具有羥基之(甲基)丙烯酸系化合物。The curable composition according to claim 9, comprising the above-mentioned (meth) acrylic compound having a hydroxyl group. 如請求項1至3中任一項之硬化性組合物,其中上述熱硬化劑為熱自由基產生劑。The curable composition according to any one of claims 1 to 3, wherein the thermal curing agent is a thermal radical generator. 如請求項1至3中任一項之硬化性組合物,其中於140℃及10秒之條件下進行硬化時,所獲得之硬化物之斷裂伸長率為500%以上。The hardenable composition according to any one of claims 1 to 3, wherein when the hardened composition is cured at 140 ° C and 10 seconds, the elongation at break of the hardened material obtained is 500% or more. 如請求項1至3中任一項之硬化性組合物,其為聚對苯二甲酸乙二酯膜接著用之硬化性組合物。The curable composition according to any one of claims 1 to 3, which is a curable composition for subsequent use of a polyethylene terephthalate film. 如請求項14之硬化性組合物,其為觸控面板中之聚對苯二甲酸乙二酯膜接著用之硬化性組合物。The curable composition as claimed in claim 14, which is a curable composition for subsequent use of a polyethylene terephthalate film in a touch panel. 一種硬化性組合物,其包含下述式(1)所表示之硬化性化合物、及熱硬化劑,上述式(1)中,R1、R2分別表示氫原子或甲基,R3及R4分別表示氫原子、甲基或苯基,X表示碳數2~10之伸烷基或表示聚醚基,Y表示碳數2~10之伸烷基或表示伸苯基,n1及n2分別表示1或2,m表示式(1)所表示之硬化性化合物之重量平均分子量成為8000以上且50000以下之整數。A curable composition comprising a curable compound represented by the following formula (1) and a thermosetting agent, In the above formula (1), R1 and R2 each represent a hydrogen atom or a methyl group, R3 and R4 each represent a hydrogen atom, a methyl group or a phenyl group, X is an alkylene group having 2 to 10 carbon atoms or a polyether group, and It represents an alkylene group having 2 to 10 carbon atoms or represents a phenylene group, n1 and n2 represent 1 or 2, respectively, and m represents a weight-average molecular weight of the hardenable compound represented by formula (1), which is an integer of 8,000 to 50,000. 一種導電材料,其包含如請求項1至15中任一項之硬化性組合物、及導電性粒子。A conductive material including the curable composition according to any one of claims 1 to 15 and conductive particles. 如請求項17之導電材料,其中上述硬化性組合物所含之上述硬化性化合物之含量為50重量%以上。The conductive material according to claim 17, wherein the content of the hardenable compound contained in the hardenable composition is 50% by weight or more. 如請求項17或18之導電材料,其中上述導電性粒子於外表面具有焊料。The conductive material according to claim 17 or 18, wherein the conductive particles have solder on an outer surface. 一種連接構造體,其包括:第1連接對象構件,第2連接對象構件,及連接部,其連接上述第1連接對象構件與上述第2連接對象構件,且上述連接部係藉由使如請求項1至15中任一項之硬化性組合物硬化而形成。A connection structure includes a first connection target member, a second connection target member, and a connection portion that connects the first connection target member and the second connection target member, and the connection portion is used by request The curable composition according to any one of items 1 to 15 is formed by curing. 如請求項20之連接構造體,其中上述第1連接對象構件於表面具有第1電極,上述第2連接對象構件於表面具有第2電極,上述第1電極與上述第2電極藉由進行接觸而電性連接。The connection structure of claim 20, wherein the first connection target member has a first electrode on the surface, the second connection target member has a second electrode on the surface, and the first electrode and the second electrode are brought into contact by Electrical connection. 一種連接構造體,其包括:第1連接對象構件,其於表面具有第1電極;第2連接對象構件,其於表面具有第2電極;及連接部,其連接上述第1連接對象構件與上述第2連接對象構件;且上述連接部係藉由使如請求項17至19中任一項之導電材料硬化而形成,上述第1電極與上述第2電極藉由上述導電性粒子而電性連接。A connection structure comprising: a first connection target member having a first electrode on a surface; a second connection target member having a second electrode on a surface; and a connection portion that connects the first connection target member to the above The second connection target member; and the connection portion is formed by hardening the conductive material according to any one of claims 17 to 19, and the first electrode and the second electrode are electrically connected by the conductive particles. .
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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04161447A (en) * 1990-10-26 1992-06-04 Dainippon Ink & Chem Inc Polyester resin composition, production thereof and coating using the same

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2454773C3 (en) * 1974-11-19 1980-07-31 Basf Ag, 6700 Ludwigshafen Production of accelerated thickening molding compounds based on unsaturated polyester resins
JP4289319B2 (en) 1997-03-31 2009-07-01 日立化成工業株式会社 Circuit connection material, circuit terminal connection structure and connection method
JP3342829B2 (en) * 1998-02-25 2002-11-11 和歌山県 Unsaturated polyester resin composition and molding method thereof
JP4174580B2 (en) * 2002-03-19 2008-11-05 和歌山県 Polyester macromonomer and method for producing the same
JP4760069B2 (en) * 2005-03-16 2011-08-31 日立化成工業株式会社 Adhesive composition, adhesive composition for circuit connection, circuit connection structure using the same, and semiconductor device
JP5297418B2 (en) * 2010-06-21 2013-09-25 デクセリアルズ株式会社 Anisotropic conductive material and method for manufacturing the same, and mounting body and method for manufacturing the same
JP5821355B2 (en) 2011-07-15 2015-11-24 住友ベークライト株式会社 Metal base circuit board, laminated board, inverter device and power semiconductor device
EP2770000B1 (en) * 2011-10-19 2016-05-18 DIC Corporation Active-energy-ray-curable resin composition, adhesive, and laminate film
US8802989B2 (en) * 2012-03-26 2014-08-12 Sekisui Chemical Co., Ltd. Conductive material and connection structure

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04161447A (en) * 1990-10-26 1992-06-04 Dainippon Ink & Chem Inc Polyester resin composition, production thereof and coating using the same

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JP6049879B2 (en) 2016-12-21
WO2015170682A1 (en) 2015-11-12

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