TWI663477B - Positive photosensitive resin composition - Google Patents

Positive photosensitive resin composition Download PDF

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TWI663477B
TWI663477B TW103136311A TW103136311A TWI663477B TW I663477 B TWI663477 B TW I663477B TW 103136311 A TW103136311 A TW 103136311A TW 103136311 A TW103136311 A TW 103136311A TW I663477 B TWI663477 B TW I663477B
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photosensitive resin
resin composition
positive
mass
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TW201523157A (en
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竹田佳代
服部隼人
畑中真
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日商日產化學工業股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/023Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • G03F7/0233Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133345Insulating layers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0048Photosensitive materials characterised by the solvents or agents facilitating spreading, e.g. tensio-active agents
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/0226Quinonediazides characterised by the non-macromolecular additives
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2002Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
    • G03F7/2012Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image using liquid photohardening compositions, e.g. for the production of reliefs such as flexographic plates or stamps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/124Insulating layers formed between TFT elements and OLED elements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Materials For Photolithography (AREA)
  • Liquid Crystal (AREA)
  • Compositions Of Macromolecular Compounds (AREA)

Abstract

本發明之課題在於提供非常高感度,高透明性,且在後烘烤時能在寬大烘烤溫度範圍內形成形狀變化小之硬化膜的正型感光性樹脂組成物。 An object of the present invention is to provide a positive-type photosensitive resin composition which has very high sensitivity, high transparency, and can form a cured film with a small shape change in a wide baking temperature range during post-baking.

其解決手段為一種正型感光性樹脂組成物,其係含有下述(A)成分、(B)成分、(C)成分、(D)成分、及(E)溶劑。 The solution is a positive-type photosensitive resin composition containing the following (A) component, (B) component, (C) component, (D) component, and (E) solvent.

(A)鹼可溶性丙烯酸系聚合物、(B)成分:1,2-醌二疊氮化合物、(C)成分:具有異三聚氰酸酯骨架與2個以上聚合性不飽和雙鍵之化合物、(D)成分:具有2個以上選自烷氧基甲基及羥基甲基之取代基的交聯性化合物、(E)溶劑。 (A) alkali-soluble acrylic polymer, (B) component: 1,2-quinonediazide compound, (C) component: compound having an isocyanurate skeleton and two or more polymerizable unsaturated double bonds (D) component: a crosslinkable compound having two or more substituents selected from alkoxymethyl and hydroxymethyl, and (E) a solvent.

Description

正型感光性樹脂組成物 Positive photosensitive resin composition

本發明係關於正型感光性樹脂組成物及由此所得之硬化膜。更詳細而言,本發明係關於在顯示器材料之用途上適宜之正型感光性樹脂組成物及其硬化膜、以及使用該硬化膜之各種材料。 The present invention relates to a positive photosensitive resin composition and a cured film obtained therefrom. More specifically, the present invention relates to a positive-type photosensitive resin composition and a cured film thereof suitable for use in a display material, and various materials using the cured film.

一般而言,在薄膜電晶體(TFT)型液晶顯示元件、有機EL(electroluminescent)元件等之顯示器元件中,設置有經圖型形成之電極保護膜、平坦化膜、絕緣膜等。作為形成此等膜之材料,在感光性樹脂組成物之中自以往即係廣泛使用具有取得必要圖型形狀所需之步驟數為少,並且具有充分平坦性之特徵之感光性樹脂組成物。 Generally, display elements such as a thin film transistor (TFT) liquid crystal display element and an organic EL (electroluminescent) element are provided with an electrode protection film, a planarization film, an insulating film, and the like formed in a pattern. As materials for forming such films, among the photosensitive resin compositions, photosensitive resin compositions having a small number of steps required to obtain a necessary pattern shape and having sufficient flatness have been widely used.

且,對於上述之膜除要求耐熱性、耐溶劑性、長時間燒成耐性、金屬濺鍍耐性等之製程耐性優異,與基底之密著性,具有在配合使用目的之各種製程條件下仍能形成圖型之寬大製程界限(process margin),並更加要求高感度且高透明性,以及顯像後之膜不均為少等之 諸特性。因此,從該所要求之特性之觀點,作為上述感光性樹脂組成物,過往至今廣泛使用包含萘醌二疊氮化合物之樹脂。 In addition, the above-mentioned films require excellent process resistance in addition to process resistance such as heat resistance, solvent resistance, long-term firing resistance, and metal sputtering resistance, and adhesion to the substrate, which can still be used under various process conditions for the purpose of use. Form a wide process margin of the pattern, and more demand for high sensitivity and transparency, and the non-uniform film after development Various characteristics. Therefore, from the viewpoint of the required characteristics, as the above-mentioned photosensitive resin composition, a resin containing a naphthoquinonediazide compound has been widely used in the past.

已提出藉由在此等材料中添加環氧交聯劑,又,藉由使丙烯酸系樹脂中含有羧基與環氧基,而使經形成之圖型進行熱交聯且硬化(專利文獻1及2)。但,使用此般樹脂時無法取得充分感度,而造成顯示器製造時之生產量降低。又由於後烘烤時之烘烤溫度而圖型形狀容易變化,而必需要有精密溫度控制。 It has been proposed that by adding an epoxy cross-linking agent to these materials, and by including a carboxyl group and an epoxy group in an acrylic resin, the formed pattern is thermally cross-linked and hardened (Patent Document 1 and 2). However, when such a resin is used, sufficient sensitivity cannot be obtained, which results in a reduction in the throughput during the manufacture of the display. In addition, due to the baking temperature during post-baking, the shape of the pattern is easy to change, and precise temperature control is necessary.

又,亦提出藉由在丙烯酸系樹脂中導入環氧基,且藉由組合使用至少具有1個乙烯性不飽和鍵且具有異三聚氰酸酯骨架之化合物,而使經形成之圖型熱交聯且硬化(專利文獻3)。但,該文獻3並未敘及藉由併用具有特定構造之交聯性化合物,而使圖型形狀之尺寸安定性與金屬濺鍍後之耐熱性提升。 In addition, it has also been proposed that an epoxy group be introduced into an acrylic resin, and a compound having at least one ethylenically unsaturated bond and having an isotricyanate skeleton be used in combination to heat the formed pattern. Crosslinked and hardened (Patent Document 3). However, the document 3 does not describe the improvement of the dimensional stability of the pattern shape and the heat resistance after metal sputtering by using a crosslinkable compound having a specific structure in combination.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2000-103937號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2000-103937

[專利文獻2]日本特開平4-352101號公報 [Patent Document 2] Japanese Unexamined Patent Publication No. 4-352101

[專利文獻3]日本特開2010-134422號公報 [Patent Document 3] Japanese Patent Laid-Open No. 2010-134422

本發明係有鑑於上述情事所完成者,在於提供一種正型感光性樹脂組成物,其係能在維持顯像時之密著性之狀態下以高感度形成圖型,且硬化膜在維持高段差平坦化性能之狀態下於後烘烤時之形狀變化為小,且能形成高金屬濺鍍耐性之硬化膜。 The present invention has been made in view of the above circumstances, and provides a positive-type photosensitive resin composition capable of forming a pattern with high sensitivity while maintaining adhesion during development, and maintaining a cured film at a high level. In the state of the step flattening performance, the shape change during post-baking is small, and a hardened film with high metal sputtering resistance can be formed.

本發明者係為了解決上述課題經過精心研究之結果,而完成本發明。即,本發明係關於下述者。 The present inventors have completed the present invention as a result of careful research in order to solve the above-mentioned problems. That is, this invention relates to the following.

1.一種正型感光性樹脂組成物,其係含有下述(A)成分、(B)成分、(C)成分、(D)成分、及(E)溶劑。 A positive-type photosensitive resin composition comprising the following components (A), (B), (C), (D), and (E) a solvent.

(A)鹼可溶性丙烯酸系聚合物、(B)成分:1,2-醌二疊氮化合物、(C)成分:具有異三聚氰酸酯骨架與2個以上聚合性不飽和雙鍵之化合物、(D)成分:具有2個以上選自烷氧基甲基及羥基甲基之取代基的交聯性化合物、(E)溶劑。 (A) alkali-soluble acrylic polymer, (B) component: 1,2-quinonediazide compound, (C) component: compound having an isocyanurate skeleton and two or more polymerizable unsaturated double bonds (D) component: a crosslinkable compound having two or more substituents selected from alkoxymethyl and hydroxymethyl, and (E) a solvent.

2.如上述1之正型感光性樹脂組成物,其中(A)成分係數平均分子量以聚苯乙烯換算為2,000至30,000之鹼可溶性丙烯酸系聚合物。 2. The positive-type photosensitive resin composition according to the above 1, wherein the (A) component coefficient is an alkali-soluble acrylic polymer having an average molecular weight of 2,000 to 30,000 in terms of polystyrene.

3.如上述1或2之正型感光性樹脂組成物,其中相 對於(A)成分之100質量份,(B)成分為5至100質量份。 3. The positive-type photosensitive resin composition according to 1 or 2 above, wherein the phase The component (B) is 5 to 100 parts by mass for 100 parts by mass of the (A) component.

4.如上述1至3中任一項之正型感光性樹脂組成物,其中相對於(A)成分100質量份,(C)成分為5至60質量份。 4. The positive-type photosensitive resin composition according to any one of the above 1 to 3, wherein the (C) component is 5 to 60 parts by mass with respect to 100 parts by mass of the component (A).

5.如上述1至3中任一項之正型感光性樹脂組成物,其中相對於(A)成分100質量份,(D)成分為5至50質量份。 5. The positive-type photosensitive resin composition according to any one of 1 to 3 above, wherein the (D) component is 5 to 50 parts by mass with respect to 100 parts by mass of the component (A).

6.如上述1至4中任一項之正型感光性樹脂組成物,其中在正型感光性樹脂組成物100質量份中,更含有作為(F)成分之界面活性劑0.01至1.0質量份。 6. The positive-type photosensitive resin composition according to any one of the above 1 to 4, wherein 100 parts by mass of the positive-type photosensitive resin composition further contains 0.01 to 1.0 part by mass of a surfactant as a component (F). .

7.如上述1至5中任一項之正型感光性樹脂組成物,其中在正型感光性樹脂組成物中,相對於(A)成分100質量份,更含有作為(G)成分之密著促進劑0.1至20質量份。 7. The positive-type photosensitive resin composition according to any one of the above 1 to 5, wherein the positive-type photosensitive resin composition further contains (G) as a component with respect to 100 parts by mass of the (A) component. The adhesion promoter is 0.1 to 20 parts by mass.

8.一種硬化膜,其係使用如上述1至7中任一項之正型感光性樹脂組成物而得者。 8. A cured film obtained by using the positive-type photosensitive resin composition according to any one of 1 to 7 above.

9.一種顯示元件,其係具有如上述8之硬化膜。 9. A display element having the cured film according to 8 above.

10.一種顯示器用陣列平坦化膜,其係由如上述8之硬化膜所構成。 10. An array flattening film for a display, comprising a cured film as described in 8 above.

11.一種層間絕緣膜,其係由如上述8之硬化膜所構成。 11. An interlayer insulating film comprising a hardened film as described in 8 above.

本發明之正型感光性樹脂組成物能在維持顯像時之密著性之狀態下以高感度形成圖型,在後烘烤時能在寬大烘烤溫度範圍內形成形狀之變化小,且金屬濺鍍耐性高之硬化膜。 The positive-type photosensitive resin composition of the present invention can form a pattern with a high sensitivity while maintaining the adhesion during development, and can form a small change in shape over a wide baking temperature range during post-baking, and Hardened film with high resistance to metal sputtering.

本發明之感光性樹脂組成物係含有下述(A)成分、(B)成分、(C)成分、(D)成分、及(E)溶劑之正型感光性樹脂組成物。 The photosensitive resin composition of the present invention is a positive-type photosensitive resin composition containing the following (A) component, (B) component, (C) component, (D) component, and (E) a solvent.

(A)鹼可溶性丙烯酸系聚合物、(B)成分:1,2-醌二疊氮化合物、(C)成分:具有異三聚氰酸酯骨架與2個以上聚合性不飽和雙鍵之化合物、(D)成分:具有2個以上選自烷氧基甲基及羥基甲基之取代基的交聯性化合物、(E)溶劑。 (A) alkali-soluble acrylic polymer, (B) component: 1,2-quinonediazide compound, (C) component: compound having an isocyanurate skeleton and two or more polymerizable unsaturated double bonds (D) component: a crosslinkable compound having two or more substituents selected from alkoxymethyl and hydroxymethyl, and (E) a solvent.

以下,說明各成分之詳細內容。 The details of each component are described below.

<(A)成分> <(A) component>

(A)成分為鹼可溶性丙烯酸系聚合物。 The component (A) is an alkali-soluble acrylic polymer.

本發明中,丙烯酸系聚合物係指:使用丙烯酸、甲基丙烯酸、丙烯酸酯、甲基丙烯酸酯、苯乙烯、馬來醯亞胺等之具有不飽和雙鍵之單體進行均聚合或共聚合而得之聚合物。 In the present invention, an acrylic polymer refers to homopolymerization or copolymerization using an unsaturated double bond monomer such as acrylic acid, methacrylic acid, acrylate, methacrylate, styrene, and maleimide. The resulting polymer.

(A)成分之鹼可溶性丙烯酸系聚合物只要係鹼可溶性丙烯酸系聚合物即可,構成丙烯酸系聚合物之高分子主鏈之骨架及側鏈之種類等則並無特別限定。 The alkali-soluble acrylic polymer of the component (A) may be an alkali-soluble acrylic polymer, and the type of the backbone and side chains of the polymer main chain constituting the acrylic polymer is not particularly limited.

然而,(A)成分之鹼可溶性丙烯酸系聚合物若為數平均分子量超出30,000之過大者時,對段差之平坦化性能降低,另一方面數平均分子量為未滿2,000之過小者時,則會在熱硬化時變得硬化不足而有溶劑耐性降低之情況。因此,數平均分子量係在2,000至30,000之範圍內者。 However, if the alkali-soluble acrylic polymer of the component (A) is an excessively large number average molecular weight of more than 30,000, the flattening performance with respect to the step difference is lowered. On the other hand, when the number-average molecular weight is less than 2,000, the average It may become insufficiently hardened during thermal curing and may reduce solvent resistance. Therefore, the number average molecular weight is in the range of 2,000 to 30,000.

如上述般,作為(A)成分之鹼可溶丙烯酸系聚合物之合成方法,較為簡便者為使具有羧基、酸酐基及酚性羥基之任意者之單體與馬來醯亞胺等之鹼可溶性單體進行共聚合之方法。 As described above, as a method for synthesizing the alkali-soluble acrylic polymer as the component (A), it is relatively simple to use a monomer having any of a carboxyl group, an acid anhydride group, and a phenolic hydroxyl group, and a base such as maleimide. Method for copolymerizing soluble monomers.

作為具有羧基之單體,可舉出例如,丙烯酸、甲基丙烯酸、巴豆酸、單-(2-(丙烯醯氧基)乙基)酞酸酯、單-(2-(甲基丙烯醯氧基)乙基)酞酸酯、N-(羧基苯基)馬來醯亞胺、N-(羧基苯基)甲基丙烯醯胺、N-(羧基苯基)丙烯醯胺等。 Examples of the monomer having a carboxyl group include acrylic acid, methacrylic acid, crotonic acid, mono- (2- (propenyloxy) ethyl) phthalate, and mono- (2- (methacrylic acid) Group) ethyl) phthalate, N- (carboxyphenyl) maleimide, N- (carboxyphenyl) methacrylamide, N- (carboxyphenyl) acrylamide, and the like.

作為具有酸酐基之單體,可舉出例如,無水馬來酸、無水伊康酸等。 Examples of the monomer having an acid anhydride group include anhydrous maleic acid and anhydrous itaconic acid.

作為具有酚性羥基之單體,可舉出例如,p-羥基苯乙烯、α-甲基-p-羥基苯乙烯、N-羥基苯基馬來醯亞胺、N-羥基苯基丙烯醯胺、N-羥基苯基甲基丙烯醯胺、4-羥基苯基甲基丙烯酸酯等。 Examples of the monomer having a phenolic hydroxyl group include p-hydroxystyrene, α-methyl-p-hydroxystyrene, N-hydroxyphenylmaleimide, and N-hydroxyphenylpropenylamine. , N-hydroxyphenylmethacrylamide, 4-hydroxyphenylmethacrylate, and the like.

又,本發明中,在取得鹼可溶性丙烯酸系聚合物時,亦可併用能與具有鹼可溶性基之單體進行共聚合之單體。 In the present invention, when obtaining an alkali-soluble acrylic polymer, a monomer that can be copolymerized with a monomer having an alkali-soluble group may be used in combination.

作為此種單體之具體例,可舉出如丙烯酸酯化合物、甲基丙烯酸酯化合物、N取代馬來醯亞胺化合物、丙烯醯胺化合物、丙烯腈、苯乙烯化合物及乙烯基化合物等。 Specific examples of such a monomer include an acrylate compound, a methacrylate compound, an N-substituted maleimide compound, an acrylamide compound, acrylonitrile, a styrene compound, and a vinyl compound.

以下,雖例舉上述單體之具體例,但並非係受此等所限定者。 Although specific examples of the above-mentioned monomers are exemplified below, they are not limited thereto.

作為前述丙烯酸酯化合物,可舉出例如,甲基丙烯酸酯、乙基丙烯酸酯、異丙基丙烯酸酯、苄基丙烯酸酯、萘基丙烯酸酯、蒽基丙烯酸酯、蒽基甲基丙烯酸酯、苯基丙烯酸酯、環氧丙基丙烯酸酯、苯氧基乙基丙烯酸酯、2,2,2-三氟乙基丙烯酸酯、tert-丁基丙烯酸酯、環己基丙烯酸酯、異莰基丙烯酸酯、2-甲氧基乙基丙烯酸酯、甲氧基三乙二醇丙烯酸酯、2-乙氧基乙基丙烯酸酯、2-胺基乙基丙烯酸酯、四氫糠基丙烯酸酯、3-甲氧基丁基丙烯酸酯、2-甲基-2-金剛烷基丙烯酸酯、2-丙基-2-金剛烷基丙烯酸酯、8-甲基-8-三環癸基丙烯酸酯、及、8-乙基-8-三環癸基丙烯酸酯、2-羥基乙基丙烯酸酯、2-羥基丙基丙烯酸酯、4-羥基丁基丙烯酸酯、2,3-二羥基丙基丙烯酸酯、二乙二醇單丙烯酸酯、己內酯2-(丙烯醯氧基)乙基酯、聚(乙二醇)乙基醚丙烯酸酯、5-丙烯醯氧基-6-羥基降莰烯-2-羧酸-6-內酯等。 Examples of the acrylate compound include methacrylate, ethacrylate, isopropyl acrylate, benzyl acrylate, naphthyl acrylate, anthryl acrylate, anthryl methacrylate, and benzene. Acrylate, epoxy acrylate, phenoxyethyl acrylate, 2,2,2-trifluoroethyl acrylate, tert-butyl acrylate, cyclohexyl acrylate, isofluorenyl acrylate, 2-methoxyethyl acrylate, methoxytriethylene glycol acrylate, 2-ethoxyethyl acrylate, 2-aminoethyl acrylate, tetrahydrofurfuryl acrylate, 3-methoxy Butyl acrylate, 2-methyl-2-adamantyl acrylate, 2-propyl-2-adamantyl acrylate, 8-methyl-8-tricyclodecyl acrylate, and 8- Ethyl-8-tricyclodecyl acrylate, 2-hydroxyethyl acrylate, 2-hydroxypropyl acrylate, 4-hydroxybutyl acrylate, 2,3-dihydroxypropyl acrylate, diethylene glycol Alcohol monoacrylate, caprolactone 2- (propenyloxy) ethyl ester, poly (ethylene glycol) ethyl ether acrylate, 5-propenyloxy-6-hydroxyl Ene-2-carboxylic-6-lactone and the like.

作為前述甲基丙烯酸酯化合物,可舉出例 如,甲基甲基丙烯酸酯、乙基甲基丙烯酸酯、異丙基甲基丙烯酸酯、苄基甲基丙烯酸酯、萘基甲基丙烯酸酯、蒽基甲基丙烯酸酯、蒽基甲基甲基丙烯酸酯、苯基甲基丙烯酸酯、環氧丙基甲基丙烯酸酯、苯氧基乙基甲基丙烯酸酯、2,2,2-三氟乙基甲基丙烯酸酯、tert-丁基甲基丙烯酸酯、環己基甲基丙烯酸酯、異莰基甲基丙烯酸酯、2-甲氧基乙基甲基丙烯酸酯、甲氧基三乙二醇甲基丙烯酸酯、2-乙氧基乙基甲基丙烯酸酯、2-胺基甲基甲基丙烯酸酯、四氫糠基甲基丙烯酸酯、3-甲氧基丁基甲基丙烯酸酯、2-甲基-2-金剛烷基甲基丙烯酸酯、γ-丁內酯甲基丙烯酸酯、2-丙基-2-金剛烷基甲基丙烯酸酯、8-甲基-8-三環癸基甲基丙烯酸酯、及、8-乙基-8-三環癸基甲基丙烯酸酯、2-羥基乙基甲基丙烯酸酯、2-羥基丙基甲基丙烯酸酯、4-羥基丁基甲基丙烯酸酯、2,3-二羥基丙基甲基丙烯酸酯、二乙二醇單甲基丙烯酸酯、己內酯2-(甲基丙烯醯氧基)乙基酯、聚(乙二醇)乙基醚甲基丙烯酸酯、5-甲基丙烯醯氧基-6-羥基降莰烯-2-羧酸-6-內酯等。 Examples of the methacrylate compound include For example, methyl methacrylate, ethyl methacrylate, isopropyl methacrylate, benzyl methacrylate, naphthyl methacrylate, anthryl methacrylate, anthryl methylformate Acrylate, phenylmethacrylate, epoxypropylmethacrylate, phenoxyethylmethacrylate, 2,2,2-trifluoroethylmethacrylate, tert-butylmethacrylate Ester, cyclohexyl methacrylate, isofluorenyl methacrylate, 2-methoxyethyl methacrylate, methoxytriethylene glycol methacrylate, 2-ethoxyethylmethyl Acrylate, 2-aminomethyl methacrylate, tetrahydrofurfuryl methacrylate, 3-methoxybutyl methacrylate, 2-methyl-2-adamantyl methacrylate, γ- Butyrolactone methacrylate, 2-propyl-2-adamantyl methacrylate, 8-methyl-8-tricyclodecyl methacrylate, and 8-ethyl-8-tricyclic Decyl methacrylate, 2-hydroxyethyl methacrylate, 2-hydroxypropyl methacrylate, 4-hydroxybutyl methacrylate, 2,3-dihydroxypropyl methyl Acrylate, diethylene glycol monomethacrylate, caprolactone 2- (methacryl) oxy) ethyl ester, poly (ethylene glycol) ethyl ether methacrylate, 5-methacryl Oxy-6-hydroxynorbornene-2-carboxylic acid-6-lactone and the like.

作為前述丙烯醯胺化合物,可舉出例如,N-甲基丙烯醯胺、N-甲基甲基丙烯醯胺、N,N-二甲基丙烯醯胺、N,N-二甲基甲基丙烯醯胺、N-甲氧基甲基丙烯醯胺、N-甲氧基甲基甲基丙烯醯胺、N-丁氧基甲基丙烯醯胺、N-丁氧基甲基甲基丙烯醯胺等。 Examples of the acrylamide compound include N-methacrylamide, N-methacrylamide, N, N-dimethylacrylamide, and N, N-dimethylmethyl Acrylamide, N-methoxymethacrylamide, N-methoxymethylmethacrylamine, N-butoxymethacrylamide, N-butoxymethylmethacrylamine Amine, etc.

作為前述乙烯基化合物,可舉出例如,甲基乙烯基醚、苄基乙烯基醚、環己基乙烯基醚、乙烯基萘、 乙烯基蒽、乙烯基咔唑、烯丙基環氧丙基醚、3-乙烯基-7-氧雜雙環[4.1.0]庚烷、1,2-環氧基-5-己烯及1,7-辛二烯單環氧化物等。 Examples of the vinyl compound include methyl vinyl ether, benzyl vinyl ether, cyclohexyl vinyl ether, vinylnaphthalene, Vinyl anthracene, vinyl carbazole, allyl glycidyl ether, 3-vinyl-7-oxabicyclo [4.1.0] heptane, 1,2-epoxy-5-hexene and 1 , 7-octadiene monoepoxide and so on.

作為前述苯乙烯化合物,可舉出例如,苯乙烯、α-甲基苯乙烯、氯苯乙烯、溴苯乙烯等。 Examples of the styrene compound include styrene, α-methylstyrene, chlorostyrene, and bromostyrene.

作為前述馬來醯亞胺化合物,可舉出例如,馬來醯亞胺、N-甲基馬來醯亞胺、N-苯基馬來醯亞胺、及N-環己基馬來醯亞胺等。 Examples of the maleimide compound include maleimide, N-methylmaleimide, N-phenylmaleimide, and N-cyclohexylmaleimide Wait.

尚且,本發明所使用之鹼可溶性丙烯酸系聚合物,從保存安定性之觀點,以不具有環氧基,或即使具有仍係以少量為佳。 Moreover, it is preferable that the alkali-soluble acrylic polymer used in the present invention does not have an epoxy group or has a small amount even if it has an epoxy group from the viewpoint of storage stability.

取得本發明所使用之鹼可溶性丙烯酸系聚合物之方法並無特別限定,例如可在共同存在有鹼可溶性單體、其以外之能共聚合之單體、以及根據需求之聚合起始劑等的溶劑中,藉由在50至110℃之溫度下進行聚合反應而得。此時,所使用之溶劑只要係能溶解構成鹼可溶性丙烯酸系聚合物之單體及具有特定官能基之丙烯酸系聚合物者,即無特別限定。作為具體例,可舉出如記載於後述(E)溶劑中之溶劑。 The method for obtaining the alkali-soluble acrylic polymer used in the present invention is not particularly limited. For example, an alkali-soluble monomer, a copolymerizable monomer other than the alkali-soluble monomer, and a polymerization initiator as required may be used. It is obtained by performing a polymerization reaction in a solvent at a temperature of 50 to 110 ° C. In this case, the solvent to be used is not particularly limited as long as it is capable of dissolving the monomer constituting the alkali-soluble acrylic polymer and the acrylic polymer having a specific functional group. Specific examples include solvents described in the (E) solvent described later.

藉此而得之鹼可溶性丙烯酸系聚合物係通常為溶解在溶劑中之溶液狀態。 The alkali-soluble acrylic polymer thus obtained is usually in a solution state dissolved in a solvent.

作為上述鹼可溶性單體或其以外之能共聚合之單體,係完全不使用具有環氧基之單體,或即使係使用具有環氧基之單體,其使用量係相對於聚合所使用之全單體100莫 耳,以預設成10莫耳以下為佳。 As the alkali-soluble monomer or other copolymerizable monomers, the monomer having an epoxy group is not used at all, or even if the monomer having an epoxy group is used, the amount used is based on the amount used for polymerization. 100% Mo For ears, it is better to preset it to 10 mol or less.

因此,本發明使用之鹼可溶性丙烯酸系聚合物係以完全不使用具有環氧基之單體而得者,或使用具有少量環氧基之單體(相對於聚合所使用之全單體100莫耳為10莫耳以下)而得者為佳。 Therefore, the alkali-soluble acrylic polymer used in the present invention is obtained by using no monomer having epoxy groups at all, or using a monomer having a small amount of epoxy groups (100 moles relative to all monomers used for polymerization). Ears are less than 10 moles).

又,將藉由上述施行而得之鹼可溶性丙烯酸系聚合物之溶液,在攪拌下投入於二乙基醚或水等使其再沉澱,過濾生成之沉澱物並洗淨後,在常壓或減壓下進行常溫或加熱乾燥,即可作成鹼可溶性丙烯酸系聚合物之粉體。藉由此般操作,可去除與鹼可溶性丙烯酸系聚合物共存之聚合起始劑或未反應單體,其結果係可取得已純化之鹼可溶性丙烯酸系聚合物之粉體。一次之操作並無法充分純化時,只需使取得之粉體再溶解於溶劑中,並重複上述操作即可。 In addition, the solution of the alkali-soluble acrylic polymer obtained by the above-mentioned implementation is put into diethyl ether or water under stirring to reprecipitate, and the resulting precipitate is filtered and washed, and then the mixture is washed at normal pressure or It can be made into powder of alkali-soluble acrylic polymer by drying at room temperature or heating under reduced pressure. With this operation, a polymerization initiator or an unreacted monomer coexisting with the alkali-soluble acrylic polymer can be removed. As a result, a powder of the purified alkali-soluble acrylic polymer can be obtained. When one operation does not fully purify, it is only necessary to re-dissolve the obtained powder in a solvent and repeat the above operation.

在本發明中,可直接使用上述鹼可溶性丙烯酸系聚合物之粉體,或亦可將其粉體再溶解於例如後述之(E)成分之溶劑中而作為溶液之狀態使用。 In the present invention, the powder of the alkali-soluble acrylic polymer may be used as it is, or the powder may be redissolved in a solvent such as the component (E) described later and used as a solution.

又,本發明中,(A)成分之丙烯酸系聚合物亦可為複數種之鹼可溶性丙烯酸系聚合物之混合物。 In the present invention, the acrylic polymer of the component (A) may be a mixture of a plurality of alkali-soluble acrylic polymers.

<(B)成分> <(B) component>

作為(B)成分之1,2-醌二疊氮化合物,可使用具有羥基或胺基之任意一者,或具有羥基及胺基兩者之化合物,且此等之羥基或胺基(在具有羥基與胺基兩者時,為 此等之合計量)之中,較佳係10至100莫耳%,特佳係20至95莫耳%被1,2-醌二疊氮磺酸所酯化,或醯胺化之化合物。 As the 1,2-quinonediazide compound of the component (B), a compound having any one of a hydroxyl group or an amine group, or a compound having both a hydroxyl group and an amine group, and these hydroxyl or amine groups (in For both hydroxyl and amine groups, it is Among these total amounts), preferably 10 to 100 mole%, and particularly preferably 20 to 95 mole% are esterified with 1,2-quinonediazidesulfonic acid, or amidolated compounds.

作為前述具有羥基之化合物,可舉出例如,酚、o-甲酚、m-甲酚、p-甲酚、氫醌、間苯二酚、兒茶酚、沒食子酸甲酯、沒食子酸乙酯、1,3,3-參(4-羥基苯基)丁烷、4,4-異亞丙基二酚、2,2-雙(4-羥基苯基)丙烷、1,1-雙(4-羥基苯基)環己烷、4,4’-二羥基苯基碸、4,4-六氟異亞丙基二酚、4,4’,4”-參羥基苯基乙烷、1,1,1-參羥基苯基乙烷、4,4’-[1-[4-[1-(4-羥基苯基)-1-甲基乙基]苯基]亞乙基]雙酚、2,4-二羥基二苯甲酮、2,3,4-三羥基二苯甲酮、2,2’,4,4’-四羥基二苯甲酮、2,3,4,4’-四羥基二苯甲酮、2,2’,3,4,4’-五羥基二苯甲酮、2,5-雙(2-羥基-5-甲基苄基)甲基等之酚化合物、乙醇、2-丙醇、4-丁醇、環己醇、乙二醇、丙二醇、二乙二醇、二丙二醇、2-甲氧基乙醇、2-丁氧基乙醇、2-甲氧基丙醇、2-丁氧基丙醇、乳酸乙酯、乳酸丁酯等之脂肪族醇類。 Examples of the compound having a hydroxyl group include phenol, o-cresol, m-cresol, p-cresol, hydroquinone, resorcinol, catechol, methyl gallate, and galactose. Ethyl acetate, 1,3,3-ginseng (4-hydroxyphenyl) butane, 4,4-isopropylidene diphenol, 2,2-bis (4-hydroxyphenyl) propane, 1,1 -Bis (4-hydroxyphenyl) cyclohexane, 4,4'-dihydroxyphenylphosphonium, 4,4-hexafluoroisopropylidene diphenol, 4,4 ', 4 "-p-hydroxyphenylethyl Alkane, 1,1,1-phenylhydroxyphenylethane, 4,4 '-[1- [4- [1- (4-hydroxyphenyl) -1-methylethyl] phenyl] ethylene ] Bisphenol, 2,4-dihydroxybenzophenone, 2,3,4-trihydroxybenzophenone, 2,2 ', 4,4'-tetrahydroxybenzophenone, 2,3,4 , 4'-tetrahydroxybenzophenone, 2,2 ', 3,4,4'-pentahydroxybenzophenone, 2,5-bis (2-hydroxy-5-methylbenzyl) methyl, etc. Phenol compounds, ethanol, 2-propanol, 4-butanol, cyclohexanol, ethylene glycol, propylene glycol, diethylene glycol, dipropylene glycol, 2-methoxyethanol, 2-butoxyethanol, 2- Aliphatic alcohols such as methoxypropanol, 2-butoxypropanol, ethyl lactate, and butyl lactate.

又,作為前述含有胺基之化合物,可舉出如苯胺、o-甲苯胺、m-甲苯胺、p-甲苯胺、4-胺基二苯基甲烷、4-胺基二苯基、o-伸苯基二胺、m-伸苯基二胺、p-伸苯基二胺、4,4’-二胺基苯基甲烷、4,4’-二胺基二苯基醚、等之苯胺類、胺基環己烷。 Examples of the amine group-containing compound include aniline, o-toluidine, m-toluidine, p-toluidine, 4-aminodiphenylmethane, 4-aminodiphenyl, and o- Phenylene diamine, m-phenylene diamine, p-phenylene diamine, 4,4'-diaminophenylmethane, 4,4'-diaminodiphenyl ether, etc. Class, amino cyclohexane.

並且,作為含有羥基與胺基兩者之化合物,可舉出例如,o-胺基酚、m-胺基酚、p-胺基酚、4-胺基間 苯二酚、2,3-二胺基酚、2,4-二胺基酚、4,4’-二胺基-4”-羥基三苯基甲烷、4-胺基-4’,4”-二羥基三苯基甲烷、雙(4-胺基-3-羧基-5-羥基苯基)醚、雙(4-胺基-3-羧基-5-羥基苯基)甲烷、2,2-雙(4-胺基-3-羧基-5-羥基苯基)丙烷、2,2-雙(4-胺基-3-羧基-5-羥基苯基)六氟丙烷等之胺基酚類、2-胺基乙醇、3-胺基丙醇、4-胺基環己醇等之烷醇胺類。 Examples of the compound containing both a hydroxyl group and an amino group include o-aminophenol, m-aminophenol, p-aminophenol, and 4-amino group. Resorcinol, 2,3-diaminophenol, 2,4-diaminophenol, 4,4'-diamino-4 "-hydroxytriphenylmethane, 4-amino-4 ', 4" -Dihydroxytriphenylmethane, bis (4-amino-3-carboxy-5-hydroxyphenyl) ether, bis (4-amino-3-carboxy-5-hydroxyphenyl) methane, 2,2- Aminophenols such as bis (4-amino-3-carboxy-5-hydroxyphenyl) propane, 2,2-bis (4-amino-3-carboxy-5-hydroxyphenyl) hexafluoropropane, Alkanolamines such as 2-aminoethanol, 3-aminopropanol, and 4-aminocyclohexanol.

此等1,2-醌二疊氮化合物係可單獨使用或將2種以上組合使用。 These 1,2-quinonediazide compounds can be used alone or in combination of two or more.

本發明之正型感光性樹脂組成物中之(B)成分之含量,在相對於(A)成分100質量份而言,以5至100質量份為佳,較佳為8至50質量份,更佳為10至40質量份。若未滿5質量份時,正型感光性樹脂組成物之曝光部與未曝光部對於顯像液之溶解速度差變小,而有難以由顯像進行圖型化之情況。又,在超過100質量份時,由於以短時間下之曝光無法充分分解1,2-醌二疊氮化合物,故有感度降低之情況,或(B)成分吸收到光而導致硬化膜之透明性降低之情況。 The content of the component (B) in the positive photosensitive resin composition of the present invention is preferably 5 to 100 parts by mass, and more preferably 8 to 50 parts by mass relative to 100 parts by mass of the (A) component. More preferably, it is 10 to 40 parts by mass. If the content is less than 5 parts by mass, the difference in the dissolution rate of the developing solution between the exposed portion and the unexposed portion of the positive-type photosensitive resin composition becomes small, and it may be difficult to perform patterning from development. In addition, when it exceeds 100 parts by mass, the 1,2-quinonediazide compound cannot be sufficiently decomposed by exposure in a short period of time, so sensitivity may be reduced, or (B) component may absorb light and cause transparency of the cured film. Sexual decline.

<(C)成分> <(C) component>

作為(C)成分之具有異三聚氰酸酯骨架與2個以上聚合性不飽和雙鍵之化合物,可舉出例如,三甲基烯丙基異三聚氰酸酯、參(2-丙烯醯氧基乙基)異三聚氰酸酯、參(2-甲基丙烯醯氧基乙基)異三聚氰酸酯等。 Examples of the compound having a component (C) having an isotricyanate skeleton and two or more polymerizable unsaturated double bonds include trimethylallyl isotricyanate, and ginseng (2-propylene Ethoxyethyl) isotricyanate, ginseng (2-methacryloxyethyl) isotricyanate, and the like.

此等化合物係可單獨使用或將2種以上組合使用。 These compounds can be used alone or in combination of two or more.

本發明之正型感光性樹脂組成物中(C)成分之含量,在相對於(A)成分100質量份而言,以5至60質量份為佳,較佳為10至50質量份。若未滿5質量份時,則有顯像時之密著性不足,或段差平坦化性變小之情況。又,超出60質量份時,則有感度降低,或顯像後產生殘渣之可能性。 The content of the component (C) in the positive-type photosensitive resin composition of the present invention is preferably 5 to 60 parts by mass, and more preferably 10 to 50 parts by mass, relative to 100 parts by mass of the component (A). If it is less than 5 parts by mass, the adhesion at the time of development may be insufficient, or the step flatness may become small. Moreover, when it exceeds 60 mass parts, sensitivity may fall or a residue may generate | occur | produce after development.

<(D)成分> <(D) component>

(D)成分之具有2個以上選自烷氧基甲基及羥基甲基之取代基的交聯性化合物係為暴露在熱硬化時之高溫下,則因脫水縮合反應而進行交聯反應者。作為此種化合物,可舉出例如,烷氧基甲基化乙炔脲、烷氧基甲基化苯胍胺、及烷氧基甲基化三聚氰胺等之化合物、及酚醛樹脂(phenoplast)系化合物。 (D) A crosslinkable compound having two or more substituents selected from the group consisting of alkoxymethyl and hydroxymethyl is a cross-linking reaction due to dehydration condensation reaction when exposed to high temperature during heat curing . Examples of such compounds include compounds such as alkoxymethylated acetylene urea, alkoxymethylated benzoguanamine, and alkoxymethylated melamine, and phenoplast-based compounds.

作為烷氧基甲基化乙炔脲之具體例,可舉出例如,1,3,4,6-肆(甲氧基甲基)乙炔脲、1,3,4,6-肆(丁氧基甲基)乙炔脲、1,3,4,6-肆(羥基甲基)乙炔脲、1,3-雙(羥基甲基)脲、1,1,3,3-肆(丁氧基甲基)脲、1,1,3,3-肆(甲氧基甲基)脲、1,3-雙(羥基甲基)-4,5-二羥基-2-咪唑啉酮、及1,3-雙(甲氧基甲基)-4,5-二甲氧基-2-咪唑啉酮等。作為市售品,可舉出如Mitsui Cytec(股)製乙炔脲化合物(商品名:Cymel(註冊商標) 1170、Powderlink(註冊商標)1174)等之化合物、甲基化脲樹脂(商品名:UFR(註冊商標)65)、丁基化脲樹脂(商品名:UFR(註冊商標)300、U-VAN10S60、U-VAN10R、U-VAN11HV)、大日本油墨化學工業(股)製脲/甲醛系樹脂(高縮合型、商品名:Beckamine(註冊商標)J-300S、同P-955、同N)等。 Specific examples of the alkoxymethylated acetylene urea include, for example, 1,3,4,6-methyl (methoxymethyl) acetylene urea, and 1,3,4,6-methyl (butoxy (Methyl) acetylene urea, 1,3,4,6- (Hydroxymethyl) acetylene urea, 1,3-bis (hydroxymethyl) urea, 1,1,3,3- (Butoxymethyl) ) Urea, 1,1,3,3-trimethyl (methoxymethyl) urea, 1,3-bis (hydroxymethyl) -4,5-dihydroxy-2-imidazolinone, and 1,3- Bis (methoxymethyl) -4,5-dimethoxy-2-imidazolinone and the like. Examples of commercially available products include acetylene urea compounds (trade name: Cymel (registered trademark)) made by Mitsui Cytec (stock). 1170, Powderlink (registered trademark) 1174), methylated urea resin (trade name: UFR (registered trademark) 65), butylated urea resin (trade name: UFR (registered trademark) 300, U-VAN10S60, U-VAN10R, U-VAN11HV), urea / formaldehyde resin (high condensation type, trade name: Beckamine (registered trademark) J-300S, same P-955, same N) made by Dainippon Ink Chemical Industry Co., Ltd.

作為烷氧基甲基化苯胍胺之具體例,可舉出如四甲氧基甲基苯胍胺等。作為市售品,可舉出如Mitsui Cytec(股)製(商品名:Cymel(註冊商標)1123)、(股)三和化學製(商品名:Nikalac(註冊商標)BX-4000、同BX-37、同BL-60、同BX-55H)等。 Specific examples of the alkoxymethylated benzoguanamine include tetramethoxymethylbenzoguanamine and the like. Examples of commercially available products include Mitsui Cytec (trade name) (trade name: Cymel (registered trademark) 1123), Sanyo Chemical Co., Ltd. (trade name: Nikalac (registered trademark)) BX-4000, and the same BX- 37. Same as BL-60, same as BX-55H).

作為烷氧基甲基化三聚氰胺之具體例,可舉出例如六甲氧基甲基三聚氰胺等。作為市售品,可舉出如Mitsui Cytec(股)製甲氧基甲基型三聚氰胺化合物(商品名:Cymel(註冊商標)300、同301、同303、同350)、丁氧基甲基型三聚氰胺化合物(商品名:Mycoat(註冊商標)506、同508)、三和化學製甲氧基甲基型三聚氰胺化合物(商品名:Nikalac(註冊商標)MW-30、同MW-22、同MW-11、同MW-100LM、同MS-001、同MX-002、同MX-730、同MX-750、同MX-035)、丁氧基甲基型三聚氰胺化合物(商品名:Nikalac(註冊商標)MX-45、同MX-410、同MX-302)等。 Specific examples of the alkoxymethylated melamine include hexamethoxymethylmelamine and the like. Examples of commercially available products include methoxymethyl type melamine compounds (trade names: Cymel (registered trademark) 300, same 301, same 303, and 350) made by Mitsui Cytec (stock), butoxymethyl type Melamine compounds (trade names: Mycoat (registered trademark) 506, same as 508), methoxymethyl melamine compounds (trade names: Nikalac (registered trademark) MW-30, same MW-22, same MW- 11. Same as MW-100LM, same as MS-001, same as MX-002, same as MX-730, same as MX-750, and same as MX-035), butoxymethyl melamine compound (trade name: Nikalac (registered trademark) MX-45, same as MX-410, same as MX-302) and so on.

又,作為(D)成分,亦可為使胺基之氫原子被羥甲基或烷氧基甲基所取代之三聚氰胺化合物、脲化合 物、乙炔脲化合物及苯胍胺化合物進行縮合而得之化合物。例如,可舉出從美國專利第6323310號中記載之三聚氰胺化合物及苯胍胺化合物所製造之高分子量之化合物。作為前述三聚氰胺化合物之市售品,可舉出如商品名:Cymel(註冊商標)303(Mitsui Cytec(股)製)等,作為前述苯胍胺化合物之市售品,可舉出如商品名:Cymel(註冊商標)1123(Mitsui Cytec(股)製)等。 The component (D) may be a melamine compound or a urea compound in which the hydrogen atom of the amine group is replaced by a methylol group or an alkoxymethyl group. A compound obtained by condensing a substance, an acetylene urea compound, and a benzoguanamine compound. For example, a high molecular weight compound produced from a melamine compound and a benzoguanamine compound described in US Patent No. 6323310 can be mentioned. Examples of commercially available products of the melamine compound include, for example, trade names: Cymel (registered trademark) 303 (Mitsui Cytec), and examples of commercially available products of the benzoguanamine compound include: Cymel (registered trademark) 1123 (made by Mitsui Cytec).

作為酚醛樹脂系化合物之具體例,可舉出例如,2,6-雙(羥基甲基)酚、2,6-雙(羥基甲基)甲酚、2,6-雙(羥基甲基)-4-甲氧基酚、3,3’,5,5’-肆(羥基甲基)聯苯基-4,4’-二醇、3,3’-亞甲基雙(2-羥基-5-甲基苯甲醇)、4,4’-(1-甲基亞乙基)雙[2-甲基-6-羥基甲基酚]、4,4’-亞甲基雙[2-甲基-6-羥基甲基酚]、4,4’-(1-甲基亞乙基)雙[2,6-雙(羥基甲基)酚]、4,4’-亞甲基雙[2,6-雙(羥基甲基)酚]、2,6-雙(甲氧基甲基)酚、2,6-雙(甲氧基甲基)甲酚、2,6-雙(甲氧基甲基)-4-甲氧基酚、3,3’,5,5’-肆(甲氧基甲基)聯苯基-4,4’-二醇、3,3’-亞甲基雙(2-甲氧基-5-甲基苯甲醇)、4,4’-(1-甲基亞乙基)雙[2-甲基-6-甲氧基甲基酚]、4,4’-亞甲基雙[2-甲基-6-甲氧基甲基酚]、4,4’-(1-甲基亞乙基)雙[2,6-雙(甲氧基甲基)酚]、4,4’-亞甲基雙[2,6-雙(甲氧基甲基)酚]等。亦能以市售品取得,作為其具體例,可舉出如26DMPC、46DMOC、DM-BIPC-F、DM-BIOC-F、TM-BIP-A、BISA-F、BI25X-DF、BI25X-TPA(以上,旭有機材工 業(股)製)等。 Specific examples of the phenol resin compound include, for example, 2,6-bis (hydroxymethyl) phenol, 2,6-bis (hydroxymethyl) cresol, and 2,6-bis (hydroxymethyl)- 4-methoxyphenol, 3,3 ', 5,5'-methyl (hydroxymethyl) biphenyl-4,4'-diol, 3,3'-methylenebis (2-hydroxy-5) -Methylbenzyl alcohol), 4,4 '-(1-methylethylene) bis [2-methyl-6-hydroxymethylphenol], 4,4'-methylenebis [2-methyl -6-hydroxymethylphenol], 4,4 '-(1-methylethylene) bis [2,6-bis (hydroxymethyl) phenol], 4,4'-methylenebis [2, 6-bis (hydroxymethyl) phenol], 2,6-bis (methoxymethyl) phenol, 2,6-bis (methoxymethyl) cresol, 2,6-bis (methoxymethyl) Phenyl) -4-methoxyphenol, 3,3 ', 5,5'-methyl (methoxymethyl) biphenyl-4,4'-diol, 3,3'-methylenebis ( 2-methoxy-5-methylbenzyl alcohol), 4,4 '-(1-methylethylene) bis [2-methyl-6-methoxymethylphenol], 4,4'- Methylenebis [2-methyl-6-methoxymethylphenol], 4,4 '-(1-methylethylene) bis [2,6-bis (methoxymethyl) phenol] , 4,4'-methylenebis [2,6-bis (methoxymethyl) phenol] and the like. It can also be obtained as a commercial product. As specific examples, 26DMPC, 46DMOC, DM-BIPC-F, DM-BIOC-F, TM-BIP-A, BISA-F, BI25X-DF, BI25X-TPA (Above, Asahi Organic Materials Industry (shares) system).

並且,作為(D)成分,亦可運用使用N-羥基甲基丙烯醯胺、N-甲氧基甲基甲基丙烯醯胺、N-乙氧基甲基丙烯醯胺、N-丁氧基甲基甲基丙烯醯胺等之被羥基甲基或烷氧基甲基所取代之丙烯醯胺化合物或甲基丙烯醯胺化合物所製造之聚合物。 In addition, as the component (D), N-hydroxymethacrylamide, N-methoxymethylmethacrylamide, N-ethoxymethacrylamide, and N-butoxy can also be used. A polymer made of acrylamide compound or methacrylamide compound substituted by hydroxymethyl or alkoxymethyl, such as methacrylamide.

作為此種聚合物,可舉出例如,聚(N-丁氧基甲基丙烯醯胺)、N-丁氧基甲基丙烯醯胺與苯乙烯之共聚物、N-羥基甲基甲基丙烯醯胺與甲基甲基丙烯酸酯之共聚物、N-乙氧基甲基甲基丙烯醯胺與苄基甲基丙烯酸酯之共聚物、及N-丁氧基甲基丙烯醯胺與苄基甲基丙烯酸酯與2-羥基丙基甲基丙烯酸酯之共聚物等。此般聚合物之重量平均分子量為1,000至50,000,較佳為1,500至20,000,更佳為2,000至10,000。 Examples of such a polymer include poly (N-butoxymethacrylamide), a copolymer of N-butoxymethacrylamide and styrene, and N-hydroxymethylmethacryl Copolymer of fluorene and methmethacrylate, copolymer of N-ethoxymethylmethacrylamide and benzyl methacrylate, and N-butoxymethacrylamide and benzyl Copolymers of methacrylate and 2-hydroxypropyl methacrylate, etc. The weight average molecular weight of such a polymer is 1,000 to 50,000, preferably 1,500 to 20,000, and more preferably 2,000 to 10,000.

此等交聯性化合物係可單獨使用將或2種以上組合使用。 These crosslinkable compounds can be used alone or in combination of two or more.

本發明之正型感光性樹脂組成物中之(D)成分之含量,在相對於(A)成分100質量份而言,較佳為5至50質量份,更佳為10至40質量份。若未滿5質量份時,則有金屬濺鍍後之耐熱性降低,或段差平坦化性降低之情況。又,若超出50質量份時,則有顯像時之密著性降低,或感度降低之可能性。 The content of the component (D) in the positive-type photosensitive resin composition of the present invention is preferably 5 to 50 parts by mass, more preferably 10 to 40 parts by mass, with respect to 100 parts by mass of the component (A). If it is less than 5 parts by mass, the heat resistance after metal sputtering may be reduced, or the leveling flatness may be reduced. Moreover, when it exceeds 50 mass parts, the adhesiveness at the time of image development may fall, or sensitivity may fall.

<(E)溶劑> <(E) Solvent>

本發明使用之(E)溶劑係溶解(A)成分、(B)成分、(C)成分及(D)成分,且溶解依據需要所添加之後述之(F)成分至(G)成分等者,若為具有此種溶解能之溶劑,則其種類及構造等並非係受到特別限定者。 The (E) solvent used in the present invention dissolves the (A) component, (B) component, (C) component, and (D) component, and dissolves the component (F) to (G) component mentioned later as needed as needed. If it is a solvent having such a dissolving energy, its type and structure are not particularly limited.

作為此種(E)溶劑,可舉出例如,乙二醇單甲基醚、乙二醇單乙基醚、甲基溶纖劑乙酸酯、乙基溶纖劑乙酸酯、二乙二醇單甲基醚、二乙二醇單乙基醚、丙二醇、丙二醇單甲基醚、丙二醇單甲基醚乙酸酯、丙二醇丙基醚乙酸酯、甲苯、茬、甲基乙基酮、環戊酮、環己酮、2-丁酮、3-甲基-2-戊酮、2-戊酮、2-庚酮、γ-丁內酯、2-羥基丙酸乙酯、2-羥基-2-甲基丙酸乙酯、乙氧基乙酸乙酯、羥基乙酸乙酯、2-羥基-3-甲基丁酸甲酯、3-甲氧基丙酸甲酯、3-甲氧基丙酸乙酯、3-乙氧基丙酸乙酯、3-乙氧基丙酸甲酯、丙酮酸甲酯、丙酮酸乙酯、乙酸乙酯、乙酸丁酯、乳酸乙酯、乳酸丁酯、N,N-二甲基甲醯胺、N,N-二甲基乙醯胺、及N-甲基吡咯啶酮等。 Examples of such (E) solvents include ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, methyl cellosolve acetate, ethyl cellosolve acetate, and diethylene glycol. Alcohol monomethyl ether, diethylene glycol monoethyl ether, propylene glycol, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, propylene glycol propyl ether acetate, toluene, stubble, methyl ethyl ketone, Cyclopentanone, cyclohexanone, 2-butanone, 3-methyl-2-pentanone, 2-pentanone, 2-heptanone, γ-butyrolactone, ethyl 2-hydroxypropionate, 2-hydroxy Ethyl-2-methylpropionate, ethyl ethoxyacetate, ethyl hydroxyacetate, methyl 2-hydroxy-3-methylbutyrate, methyl 3-methoxypropionate, 3-methoxy Ethyl propionate, ethyl 3-ethoxypropionate, methyl 3-ethoxypropionate, methyl pyruvate, ethyl pyruvate, ethyl acetate, butyl acetate, ethyl lactate, butyl lactate , N, N-dimethylformamide, N, N-dimethylacetamide, and N-methylpyrrolidone.

此等溶劑係可單獨使用一種或可將二種以上組合使用。 These solvents may be used singly or in combination of two or more kinds.

此等(E)溶劑之中,從塗膜性良好且安全性高之觀點,以丙二醇單甲基醚、丙二醇單甲基醚乙酸酯、2-庚酮、丙二醇丙基醚、丙二醇丙基醚乙酸酯、乳酸乙酯、乳酸丁酯等為佳。此等溶劑係一般使用作為光阻材料用之溶劑。 Among these (E) solvents, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, 2-heptanone, propylene glycol propyl ether, and propylene glycol propyl are, from the viewpoint of good coating properties and high safety. Ether acetate, ethyl lactate, butyl lactate and the like are preferred. These solvents are generally used as a photoresist material.

<(F)成分> <(F) component>

(F)成分為界面活性劑。在本發明之正型感光性樹脂組成物中,以提升其塗佈性為目的,在不損及本發明之效果範圍內,亦可更含有界面活性劑。 (F) The component is a surfactant. In the positive-type photosensitive resin composition of the present invention, a surfactant may be further contained within the scope of not impairing the effect of the present invention for the purpose of improving the coatability thereof.

作為(F)成分之界面活性劑,並無特別限制,可舉出例如,氟系界面活性劑、聚矽氧系界面活性劑、非離子系界面活性劑等。作為此種界面活性劑,可使用例如住友3M(股)製、DIC(股)製或AGC清美化學(股)製等之市售品。此等市售品由於可容易取得,故較為方便。作為其具體例,可舉出如PolyFox(註冊商標)PF-136A、151、156A、154N、159、636、6320、656、6520(Omnova公司製)、Megafac(註冊商標)R30、R08、R40、R41、R43、F251、F477、F552、F553、F554、F555、F556、F557、F558、F559、F560、F561、F562、F563、F565、F567、F570(DIC(股)製)、FC4430、FC4432(住友3M(股)製)、Asahiguard(註冊商標)AG710、Surflon(註冊商標)S-386、S-611、S-651、(AGC清美化學(股)製)、Ftergent(註冊商標)FTX-218、DFX-18、220P、251、212M、215M((股)Neos製)等之氟系界面活性劑、BYK-300、302、306、307、310、313、315、320、322、323、325、330、331、333、342、345、346、347、348、349、370、377、378、3455(BYK Japan(股)製)、SH3746、SH3749、SH3771、SH8400、SH8410、SH8700、SF8428 (東麗道康寧.聚矽氧(股)製)、KF-351、KF-352、KF-353、KF-354L、KF-355A、KF-615A、KF-945、KF-618、KF-6011、KF-6015(信越化學工業(股)製)等之聚矽氧系界面活性劑。 The surfactant of the component (F) is not particularly limited, and examples thereof include a fluorine-based surfactant, a polysiloxane-based surfactant, and a nonionic surfactant. As such a surfactant, commercially available products such as Sumitomo 3M Co., Ltd., DIC Co., Ltd., and AGC Kiyomi Chemical Co., Ltd. can be used. These commercially available products are convenient because they are easily available. Specific examples thereof include PolyFox (registered trademark) PF-136A, 151, 156A, 154N, 159, 636, 6320, 656, 6520 (manufactured by Omnova), Megafac (registered trademark) R30, R08, R40, R41, R43, F251, F477, F552, F553, F554, F555, F556, F557, F558, F559, F560, F561, F562, F563, F565, F567, F570 (DIC (share) system), FC4430, FC4432 (Sumitomo 3M (stock) system, Asahiguard (registered trademark) AG710, Surflon (registered trademark) S-386, S-611, S-651, (AGC Qingmei Chemical (stock) system), Ftergent (registered trademark) FTX-218, DFX-18, 220P, 251, 212M, 215M (made by Neos) and other fluorine-based surfactants, BYK-300, 302, 306, 307, 310, 313, 315, 320, 322, 323, 325, 330, 331, 333, 342, 345, 346, 347, 348, 349, 370, 377, 378, 3455 (by BYK Japan), SH3746, SH3749, SH3771, SH8400, SH8410, SH8700, SF8428 (Toray Dow Corning. Polysilicone Co., Ltd.), KF-351, KF-352, KF-353, KF-354L, KF-355A, KF-615A, KF-945, KF-618, KF-6011, KF-6015 (made by Shin-Etsu Chemical Industry Co., Ltd.) and other polysiloxane based surfactants.

(F)成分之界面活性劑係可單獨使用一種,或可使用二種以上之組合。 The (F) component surfactant may be used alone or in combination of two or more.

在使用界面活性劑時,其含量在正型感光性樹脂組成物100質量份中通常為0.01至1.0質量份,較佳為0.02至0.8質量份。即使將(F)成分之界面活性劑之使用量設成超出1.0質量份之量,上述塗佈性之改良效果變為遲緩,而變得不經濟。在0.01份以下時,則有不會展現塗佈性改善效果的情況。 When a surfactant is used, its content is usually 0.01 to 1.0 parts by mass, preferably 0.02 to 0.8 parts by mass, in 100 parts by mass of the positive-type photosensitive resin composition. Even if the usage-amount of the surfactant of (F) component exceeds 1.0 mass part, the improvement effect of the said coating property becomes slow, and it becomes uneconomical. When it is 0.01 part or less, there may be a case where the coating property improvement effect is not exhibited.

<(G)成分> <(G) component>

(G)成分為密著促進劑。本發明之正型感光性樹脂組成物以提升顯像後與基板之密著性為目的,亦可添加密著促進劑。作為此種密著促進劑之具體例,可舉出如三甲基氯矽烷、二甲基乙烯基氯矽烷、甲基二苯基氯矽烷、氯甲基二甲基氯矽烷等之氯矽烷類、三甲基甲氧基矽烷、二甲基二乙氧基矽烷、甲基二甲氧基矽烷、二甲基乙烯基乙氧基矽烷、二苯基二甲氧基矽烷、苯基三乙氧基矽烷、乙烯基三氯矽烷、γ-胺基丙基三乙氧基矽烷、γ-甲基丙烯醯氧基丙基三乙氧基矽烷、γ-甲基丙烯醯氧基丙基三甲氧基矽烷、γ-環氧丙氧基丙基三乙氧基矽烷、γ-(N-哌 啶基)丙基三乙氧基矽烷、3-脲基丙基三乙氧基矽烷、3-脲基丙基三甲氧基矽烷等之烷氧基矽烷類、六甲基二矽氮烷、N,N’-雙(三甲基矽基)脲、二甲基三甲基矽基胺、三甲基矽基咪唑等之矽氮烷類、苯並三唑、苯並咪唑、吲唑、咪唑、2-巰基苯並咪唑、2-巰基苯並噻唑、2-巰基苯並噁唑、脲唑、硫脲嘧啶、巰基咪唑、巰基嘧啶等之雜環狀化合物,或1,1-二甲基脲、1,3-二甲基脲等之脲、或硫脲化合物。 The (G) component is an adhesion promoter. The positive photosensitive resin composition of the present invention is for the purpose of improving the adhesion to the substrate after development, and an adhesion promoter may be added. Specific examples of such adhesion promoters include chlorosilanes such as trimethylchlorosilane, dimethylvinylchlorosilane, methyldiphenylchlorosilane, and chloromethyldimethylchlorosilane. , Trimethylmethoxysilane, dimethyldiethoxysilane, methyldimethoxysilane, dimethylvinylethoxysilane, diphenyldimethoxysilane, phenyltriethoxy Silane, vinyltrichlorosilane, γ-aminopropyltriethoxysilane, γ-methacryloxypropyltriethoxysilane, γ-methacryloxypropyltrimethoxysilane Silane, γ-glycidoxypropyltriethoxysilane, γ- (N-pipeline (Pyridyl) propyltriethoxysilane, 3-ureidopropyltriethoxysilane, alkoxysilanes such as 3-ureidopropyltrimethoxysilane, hexamethyldisilazane, N , N'-bis (trimethylsilyl) urea, dimethyltrimethylsilylamine, trimethylsilyl imidazole and other silazane, benzotriazole, benzimidazole, indazole, imidazole Heterocyclic compounds such as 2-mercaptobenzimidazole, 2-mercaptobenzothiazole, 2-mercaptobenzoxazole, ureaazole, thiouracil, mercaptoimidazole, mercaptopyrimidine, or 1,1-dimethyl Urea, urea, such as 1,3-dimethylurea, or thiourea compounds.

作為上述之密著促進劑,亦可使用例如信越化學工業(股)製、Momentive Performance Materials Worldwide Inc.製或東麗道康寧.聚矽氧(股)製等之市售品之化合物,且此等市售品係能容易取得。 As the adhesion promoter, for example, Shin-Etsu Chemical Industry Co., Ltd., Momentive Performance Materials Worldwide Inc., or Toray Dow Corning. Compounds of commercially available products such as polysiloxane, and these commercially available products can be easily obtained.

亦可將前述密著性促進劑之中1種或2種類以上予以組合使用作為(G)成分。 One or two or more of the adhesion promoters may be used in combination as the (G) component.

此等(G)成分之中,從取得良好密著性之觀點,以烷氧基矽烷類(即,矽烷耦合劑)為佳。 Among these (G) components, from the viewpoint of obtaining good adhesion, alkoxysilanes (that is, silane coupling agents) are preferred.

此等密著促進劑之添加量,在相對於(A)成分100質量份而言,通常為0.1至20質量份,較佳為0.5至10質量份。若使用20質量份以上時,則有感度降低之情況,又,未滿0.1質量份時則有無法取得密著促進劑之充足效果的情況。 The addition amount of these adhesion promoters is usually 0.1 to 20 parts by mass, and preferably 0.5 to 10 parts by mass, with respect to 100 parts by mass of the component (A). When 20 mass parts or more is used, sensitivity may fall, and when it is less than 0.1 mass part, sufficient effect of an adhesion promoter may not be acquired.

<其他添加劑> <Other additives>

更進一步,本發明之正型感光性樹脂組成物在不損及 本發明之效果範圍內,因應必要可含有流變調整劑、顏料、染料、保存安定劑、消泡劑、或多價酚、多價羧酸等之溶解促進劑等。 Furthermore, the positive photosensitive resin composition of the present invention does not damage Within the scope of the effect of the present invention, a rheology modifier, a pigment, a dye, a storage stabilizer, an antifoaming agent, or a dissolution accelerator such as a polyvalent phenol or a polyvalent carboxylic acid may be contained as necessary.

<正型感光性樹脂組成物> <Positive photosensitive resin composition>

本發明之正型感光性樹脂組成物係使(A)成分之鹼可溶性丙烯酸系聚合物、(B)成分之1,2-醌二疊氮化合物、(C)成分之具有異三聚氰酸酯骨架與2個以上聚合性不飽和雙鍵之化合物、(D)成分之具有2個以上選自烷氧基甲基及羥基甲基之取代基的交聯性化合物溶解於(E)溶劑而成者,且,個別依據所欲亦可更含有(F)成分之界面活性劑、(G)成分之密著促進劑、及其他添加劑中之一種以上之組成物。 The positive photosensitive resin composition of the present invention is an alkali-soluble acrylic polymer of the component (A), a 1,2-quinonediazide compound of the component (B), and isocyanuric acid having the component of (C) A compound having an ester skeleton and two or more polymerizable unsaturated double bonds, and a crosslinkable compound having two or more substituents selected from the group consisting of alkoxymethyl and hydroxymethyl in the component (D) are dissolved in the solvent (E), and In addition, one or more components of the surfactant (F), the adhesion promoter of the (G) component, and other additives may be further contained as required.

其中,本發明之正型感光性樹脂組成物之較佳例係如以下所示。 Among them, preferred examples of the positive-type photosensitive resin composition of the present invention are as follows.

[1]:基於(A)成分100質量份而含有5至100質量份之(B)成分、5至60質量份之(C)成分、5至50質量份之(D)成分,且此等成分係溶解於(E)溶劑中而成之正型感光性樹脂組成物。 [1]: 5 to 100 parts by mass of the (B) component, 5 to 60 parts by mass of the (C) component, 5 to 50 parts by mass of the (D) component based on 100 parts by mass of the (A) component, and these The component is a positive-type photosensitive resin composition obtained by dissolving in a (E) solvent.

[2]:上述[1]之組成物中,基於(A)成分100質量份,更含有0.01至1.0質量份(F)成分之正型感光性樹脂組成物。 [2]: In the composition of the above [1], based on 100 parts by mass of the component (A), the positive photosensitive resin composition further contains 0.01 to 1.0 part by mass of the component (F).

[3]:上述[1]或[2]之組成物中,基於(A)成分100質量份,更含有(F)成分0.1至20質量份之正型感光性 樹脂組成物。 [3]: In the composition of the above [1] or [2], based on 100 parts by mass of the (A) component, and further containing 0.1 to 20 parts by mass of the (F) component, a positive-type photosensitivity Resin composition.

本發明之正型感光性樹脂組成物中固形分之比例只要係各成分均勻地溶解於溶劑中,則並非係受到特別限定者,例如為1至80質量%,又例如5至60質量%,或10至50質量%。在此,固形分係指從正型感光性樹脂組成物之全部成分中去除(E)溶劑者。 The proportion of the solid content in the positive-type photosensitive resin composition of the present invention is not particularly limited as long as each component is uniformly dissolved in a solvent, for example, it is 1 to 80% by mass, for example, 5 to 60% by mass. Or 10 to 50% by mass. Here, the solid content refers to a case where the (E) solvent is removed from all the components of the positive photosensitive resin composition.

本發明之正型感光性樹脂組成物之調製方法並非係受到特別限定,作為其調製法,可舉出例如,使(A)成分(鹼可溶性丙烯酸系聚合物)溶解於(E)溶劑,對此溶液以規定比例混合(B)成分之1,2-醌二疊氮化合物、(C)成分之具有異三聚氰酸酯骨架與2個以上聚合性不飽和雙鍵之化合物、以及(D)成分之具有2個以上選自烷氧基甲基及羥基甲基之取代基的交聯性化合物,而作成均勻溶液之方法,或,在此調製法之適當段階中,因應必要更添加(F)成分(界面活性劑)、(G)成分(密著促進劑)及其他添加劑進行混合之方法。 The method for preparing the positive photosensitive resin composition of the present invention is not particularly limited, and examples of the method for preparing the positive photosensitive resin composition include dissolving the component (A) (alkali-soluble acrylic polymer) in the solvent (E), and In this solution, (B) the 1,2-quinonediazide compound of the component, the (C) component of the compound having an isotricyanate skeleton and two or more polymerizable unsaturated double bonds, and (D ) A method of preparing a homogeneous solution of a crosslinkable compound having two or more substituents selected from alkoxymethyl and hydroxymethyl, or, in an appropriate stage of the preparation method, add ( F) A method of mixing the component (surfactant), (G) component (adhesion promoter) and other additives.

在調製本發明之正型感光性樹脂組成物時,能直接使用(E)溶劑中藉由聚合反應而得之共聚物(鹼可溶性丙烯酸系聚合物)之溶液,於此情況,在與前述相同地對此(A)成分之溶液添加(B)成分、(C)成分、(D)成分等而作成均勻溶液時,以調整濃度調整為目的,亦可追加投入(E)溶劑。此時,在上述共聚物之形成過程中所使用之(E)溶劑,與調製正型感光性樹脂組成物時用以調整濃度所使用之(E)溶劑係可為相同,亦 可為相異。 When preparing the positive-type photosensitive resin composition of the present invention, a solution of a copolymer (alkali-soluble acrylic polymer) obtained by polymerization in a solvent (E) can be directly used. In this case, it is the same as above. When (B) component, (C) component, (D) component and the like are added to the solution of component (A) to make a homogeneous solution, for the purpose of adjusting the concentration, an (E) solvent may be additionally added. At this time, the (E) solvent used in the formation of the above-mentioned copolymer may be the same as the (E) solvent used to adjust the concentration when preparing the positive photosensitive resin composition. Can be different.

其後,經調製之正型感光性樹脂組成物之溶液係以使用孔徑為0.2μm程度之濾器進行過濾後使用為佳。 After that, the solution of the prepared positive-type photosensitive resin composition is preferably used after being filtered using a filter having a pore size of about 0.2 μm.

<塗膜及硬化膜> <Coated film and cured film>

本發明之正型感光性樹脂組成物係在半導體基板(例如,矽/二氧化矽被覆基板、氮化矽基板、由金屬例如鋁、鉬、鉻等所被覆之基板、玻璃基板、石英基板、ITO基板等)等之上,藉由旋轉塗佈、流延塗佈、輥塗佈、狹縫塗佈、狹縫塗佈後接續旋轉塗佈、噴墨塗佈等進行塗佈,其後藉由加熱板或烤箱等進行預備乾燥,即可形成塗膜。其後,藉由加熱處理此塗膜,而形成正型感光性樹脂膜。 The positive photosensitive resin composition of the present invention is a semiconductor substrate (for example, a silicon / silicon dioxide coated substrate, a silicon nitride substrate, a substrate covered with a metal such as aluminum, molybdenum, chromium, etc., a glass substrate, a quartz substrate, ITO substrate, etc.), coating is performed by spin coating, cast coating, roll coating, slit coating, slit coating followed by spin coating, inkjet coating, etc. The coating film can be formed by pre-drying with a hot plate or an oven. Thereafter, this coating film is heat-treated to form a positive-type photosensitive resin film.

作為此加熱處理之條件,例如係採用適宜選自溫度70℃至160℃、時間0.3至60分鐘之範圍之中的加熱溫度及加熱時間。加熱溫度及加熱時間較佳為80℃至140℃、0.5至10分鐘。 As conditions for this heat treatment, for example, a heating temperature and a heating time suitably selected from the range of a temperature of 70 ° C to 160 ° C and a time of 0.3 to 60 minutes are used. The heating temperature and heating time are preferably 80 ° C to 140 ° C and 0.5 to 10 minutes.

又,由正型感光性樹脂組成物所形成之正型感光性樹脂膜之膜厚係例如為0.1至30μm,又例如為0.2至10μm,再例如為0.3至8μm。 The film thickness of the positive-type photosensitive resin film formed from the positive-type photosensitive resin composition is, for example, 0.1 to 30 μm, for example, 0.2 to 10 μm, and further, for example, 0.3 to 8 μm.

於上述取得之塗膜上,裝上具有規定圖型之遮罩,照射紫外線等之光,並以鹼顯像液進行顯像,洗去曝光部後,取得端面清晰之起伏圖型。 On the obtained coating film, a mask having a predetermined pattern was mounted, and light such as ultraviolet rays was irradiated, and development was performed with an alkali developing solution. After the exposed portion was washed away, a undulating pattern with a clear end surface was obtained.

作為能使用之鹼性顯像液,可舉出例如,碳酸鈉、碳酸鉀、氫氧化鉀、氫氧化鈉等之鹼金屬氫氧化物之水溶液、氫氧化四甲基銨、氫氧化四乙基銨、膽鹼等之氫氧化第四級銨之水溶液、乙醇胺、丙基胺、乙二胺等之胺水溶液等之鹼性水溶液。並且,此等顯像液中亦可添加界面活性劑等。 Examples of the usable alkaline developing solution include aqueous solutions of alkali metal hydroxides such as sodium carbonate, potassium carbonate, potassium hydroxide, and sodium hydroxide, tetramethylammonium hydroxide, and tetraethyl hydroxide. Aqueous solutions of ammonium, choline and other quaternary ammonium hydroxides, alkaline aqueous solutions of amines such as ethanolamine, propylamine, and ethylenediamine. A surfactant or the like may be added to these developing solutions.

上述之中,作為光阻之顯像液,一般係使用氫氧化四乙基銨0.1至2.38質量%水溶液,本發明之感光性樹脂組成物中,使用此鹼性顯像液,仍不會引起膨潤等之問題而能良好地顯像。 Among the above, as a developing solution for photoresist, a tetraethylammonium hydroxide 0.1 to 2.38% by mass aqueous solution is generally used. In the photosensitive resin composition of the present invention, the use of this basic developing solution does not cause Problems such as swelling can cause good development.

又,作為顯像方法,可使用盛液法、浸漬法、搖動浸漬法等之任意者。此時之顯像時間係通常為15至180秒鐘。 As the developing method, any one of a liquid holding method, a dipping method, and a shaking dipping method can be used. The development time at this time is usually 15 to 180 seconds.

顯像後,對正型感光性樹脂膜施以例如20至120秒鐘以流水之洗淨,其後使用壓縮空氣或壓縮氮或藉由旋轉進行風乾,去除基板上之水分,而後取得經形成圖型之膜。 After the development, the positive-type photosensitive resin film is washed with flowing water for, for example, 20 to 120 seconds, and then air-dried using compressed air or compressed nitrogen or by rotation to remove moisture on the substrate, and then obtain the formed film. Graphic film.

其次,對該圖型形成膜,施以熱硬化用之後烘烤,具體而言,藉由使用加熱板、烤箱等進行加熱,即可取得耐熱性、透明性、平坦化性、低吸水性、耐藥品性等優異之具有良好起伏圖型之膜。 Next, the pattern-forming film is baked after being subjected to thermosetting. Specifically, by using a heating plate, an oven, or the like, heat resistance, transparency, flatness, low water absorption, Films with good undulations, such as excellent chemical resistance.

作為後烘烤,一般係使用選自溫度140℃至270℃範圍之中之加熱溫度,採用在加熱板上時係處理5至30分鐘,在烤箱中時係處理30至90分鐘的方法。 As the post-baking, a heating temperature selected from the range of 140 ° C. to 270 ° C. is generally used, and the method is performed for 5 to 30 minutes on a hot plate and for 30 to 90 minutes in an oven.

而後,藉由該後烘烤,即可取得目的之具有良好圖型形狀之硬化膜。 Then, by this post-baking, a desired hardened film having a good pattern shape can be obtained.

如以上所述,藉由本發明之正型感光性樹脂組成物,可形成高保存安定性、充足高感度且在顯像時未曝光部之膜減少為非常小,且具有微細圖型之塗膜。 As described above, with the positive photosensitive resin composition of the present invention, it is possible to form a coating film having a high storage stability, a sufficient high sensitivity, and an unexposed portion reduced during the development to a very small size, and a fine pattern. .

又,由此塗膜所得之硬化膜具有在金屬濺鍍後之耐熱性、耐溶劑性上優異,且高段差平坦化性之特徵。因此,液晶顯示器或有機EL顯示器中之各種膜,可適宜使用為例如層間絕緣膜、保護膜、絕緣膜等,亦可適宜使用在TFT型液晶元件之陣列平坦化膜等之用途上。 In addition, the cured film obtained from the coating film has the characteristics of being excellent in heat resistance and solvent resistance after metal sputtering, and having high leveling flatness. Therefore, various films in a liquid crystal display or an organic EL display can be suitably used, for example, as an interlayer insulating film, a protective film, an insulating film, and the like, and can also be suitably used for applications such as an array flattening film of a TFT type liquid crystal element.

[實施例] [Example]

以下,例舉實施例更詳細說明本發明,但本發明並非係受到此等實施例所限定者。 Hereinafter, the present invention will be described in more detail by way of examples, but the present invention is not limited by these examples.

[實施例中使用之省略記號] [Omitted Symbols Used in Examples]

以下之實施例中使用之省略記號之意義係如以下所示。 The meaning of the omitted symbols used in the following examples is as follows.

MAA:甲基丙烯酸 MAA: methacrylic acid

MMA:甲基甲基丙烯酸酯 MMA: methyl methacrylate

HEMA:2-羥基乙基甲基丙烯酸酯 HEMA: 2-hydroxyethyl methacrylate

CHMI:N-環己基馬來醯亞胺 CHMI: N-cyclohexylmaleimide

AIBN:偶氮二異丁腈 AIBN: Azobisisobutyronitrile

PGMEA:丙二醇單甲基醚乙酸酯 PGMEA: propylene glycol monomethyl ether acetate

QD:藉由α、α、α’-參(4-羥基苯基)-1-乙基-4-異丙基苯1mol與1,2-萘醌-2-二疊氮-5-磺醯氯1.5mol之縮合反應所合成之化合物 QD: by 1 mol of α, α, α'-shen (4-hydroxyphenyl) -1-ethyl-4-isopropylbenzene and 1,2-naphthoquinone-2-diazide-5-sulfofluorene Compounds synthesized by condensation reaction of 1.5 mol of chlorine

TAIC:參(2-丙烯醯氧基乙基)異三聚氰酸酯 TAIC: Ginseng (2-propenyloxyethyl) isocyanurate

HMM:六甲氧基甲基三聚氰胺 HMM: hexamethoxymethyl melamine

CEL-2021P:3,4-環氧基環己基甲基-3’,4’-環氧基環己烷羧酸酯 CEL-2021P: 3,4-epoxycyclohexylmethyl-3 ', 4'-epoxycyclohexanecarboxylate

DPHA:二季戊四醇五/六丙烯酸酯 DPHA: Dipentaerythritol penta / hexaacrylate

MPTS:γ-甲基丙烯醯氧基丙基三甲氧基矽烷 MPTS: γ-methacryloxypropyltrimethoxysilane

R30:大日本油墨化學工業(股)製Megafac R-30(商品名) R30: Megafac R-30 (trade name) manufactured by Dainippon Ink Chemical Industry Co., Ltd.

TMAH:氫氧化四甲基銨 TMAH: Tetramethylammonium hydroxide

[數平均分子量及重量平均分子量之測量] [Measurement of number average molecular weight and weight average molecular weight]

根據以下合成例而得之鹼可溶性丙烯酸系聚合物及特定交聯物之數平均分子量及重量平均分子量係使用日本分光(股)製GPC裝置(Shodex(註冊商標)管柱KF803L及KF804L),在析出溶劑之四氫呋喃以流量1ml/分在管柱中(管柱溫度40℃)流動使其溶離之條件下進行測量者。尚且,下述之數平均分子量(以下,稱為Mn)及重量平均分子量(以下,稱為Mw)係以聚苯乙烯之換算值表示。 The number-average molecular weight and weight-average molecular weight of the alkali-soluble acrylic polymer and the specific crosslinked product obtained according to the following synthesis examples were obtained using a GPC device (Shodex (registered trademark) column KF803L and KF804L) manufactured by JASCO Corporation. Tetrahydrofuran which precipitated the solvent was measured under the conditions that the flow rate was 1 ml / min in a column (column temperature 40 ° C) to dissolve it. The number average molecular weight (hereinafter, referred to as Mn) and weight average molecular weight (hereinafter, referred to as Mw) are expressed in terms of polystyrene conversion values.

<合成例1> <Synthesis example 1>

作為構成鹼可溶性丙烯酸系聚合物之單體成分,使用MAA 10.9g、CHMI 35.3g、HEMA 25.5g、MMA 28.3g,自由基聚合起始劑係使用AIBN 5g,並藉由使此等在溶劑PGMEA 150g中以溫度60℃至100℃進行聚合反應,而取得Mn 3,800、Mw 6,700之(A)成分(鹼可溶性丙烯酸系聚合物)之溶液(鹼可溶性丙烯酸系聚合物濃度:40.0質量%)。(P1) As monomer components constituting the alkali-soluble acrylic polymer, MAA 10.9 g, CHMI 35.3 g, HEMA 25.5 g, and MMA 28.3 g are used, and AIBN 5 g is used as a radical polymerization initiator, and these are made into a solvent PGMEA In 150 g, a polymerization reaction was performed at a temperature of 60 ° C. to 100 ° C. to obtain a solution of the (A) component (alkali-soluble acrylic polymer) of Mn 3,800 and Mw 6,700 (alkali-soluble acrylic polymer concentration: 40.0% by mass). (P1)

<實施例1至實施例2至實施例3及比較例1至比較例2至比較例3> <Example 1 to Example 2 to Example 3 and Comparative Example 1 to Comparative Example 2 to Comparative Example 3>

依據以下表1所示之組成,以規定比例對(A)成分之溶液混合(B)成分、(C)成分、及(D)成分、(E)溶劑、以及(F)成分及(G)成分,在室溫下攪拌3小時而作成均勻溶液,進而調製成實施例及各比較例之正型感光性樹脂組成物。 According to the composition shown in Table 1 below, (A) component solution (B) component, (C) component, and (D) component, (E) solvent, and (F) component and (G) The components were stirred at room temperature for 3 hours to prepare a homogeneous solution, and the positive photosensitive resin compositions of the examples and each comparative example were prepared.

對於取得之實施例1至實施例3以及比較例1至比較例3之各正型感光性樹脂組成物,分別測量個別塗膜之感度、顯像時之密著性、熱硬化時之圖型尺寸變化、硬化膜之段差平坦化性、金屬濺鍍後之耐熱性,並進行此等之評價。 For each of the positive photosensitive resin compositions obtained in Examples 1 to 3 and Comparative Examples 1 to 3, the sensitivity of individual coating films, adhesion during development, and pattern during thermal curing were measured separately. The dimensional change, leveling flatness of the cured film, and heat resistance after metal sputtering were evaluated.

[感度之評價] [Evaluation of sensitivity]

使用旋轉塗佈器將正型感光性樹脂組成物塗佈在矽晶圓上後,在加熱板上以溫度120℃進行120秒鐘預烘烤而形成膜厚4.0μm之塗膜。膜厚係使用FILMETRICS製F20進行測量。藉由佳能(股)製紫外線照射裝置PLA-600FA,對此塗膜照射一定時間在365nm處之光強度為5.5mW/cm2之紫外線。其後浸漬於0.4質量%之TMAH水溶液中90秒鐘進行顯像後,以超純水進行流水洗淨20秒鐘。將在曝光部中使溶解殘餘變無之最低曝光量(mJ/cm2)設為感度。 After the positive-type photosensitive resin composition was coated on a silicon wafer using a spin coater, pre-baking was performed on a hot plate at a temperature of 120 ° C. for 120 seconds to form a coating film having a thickness of 4.0 μm. The film thickness was measured using F20 manufactured by FILMETRICS. This coating film was irradiated with ultraviolet light having a light intensity of 5.5 mW / cm 2 at 365 nm for a certain period of time by a UV irradiation device PLA-600FA made by Canon. Thereafter, it was immersed in a 0.4% by mass TMAH aqueous solution for 90 seconds for development, and then washed with ultrapure water for 20 seconds. The minimum exposure amount (mJ / cm 2 ) that eliminates the dissolution residue in the exposure section is set as the sensitivity.

[密著性之評價] [Evaluation of adhesion]

使用旋轉塗佈器將正型感光性樹脂組成物塗佈於矽晶圓上後,在加熱板上以溫度120℃進行120秒鐘預烘烤而形成塗膜。經由遮罩,對此塗膜照射一定時間在365nm處之光強度為5.5mW/cm2之紫外線而製成10μm×10μm之圖型。其後藉由在0.4質量%之TMAH水溶液中浸漬90 秒鐘進行顯像後,以超純水進行流水洗淨90秒鐘。無膜剝離而圖型全部殘留時,判斷密著性為良好(○),膜有剝離且無圖型殘留時,則判斷為密著性不良(×)。 After the positive photosensitive resin composition was applied on a silicon wafer using a spin coater, pre-baking was performed on a hot plate at a temperature of 120 ° C for 120 seconds to form a coating film. Via a mask, this coating film was irradiated with ultraviolet light having a light intensity of 5.5 mW / cm 2 at 365 nm for a certain period of time to form a pattern of 10 μm × 10 μm. Thereafter, development was performed by immersing in a 0.4% by mass TMAH aqueous solution for 90 seconds, and then washing with ultrapure water was performed for 90 seconds. When there is no film peeling and all the patterns remain, the adhesion is judged to be good (○), and when the film is peeled and no patterns remain, the adhesion is judged to be poor (×).

[圖型尺寸變化之評價] [Evaluation of pattern size change]

使用Espec(股)製CLEAN OVEN PVHC-210,以230℃使密著性評價中製成之矽晶圓基板進行30分鐘後烘烤,而形成膜厚約4.0μm之硬化膜。藉由日立電界放出形掃描電子顯微鏡S-4100測量此製成之圖型之圖型尺寸。尺寸安定性係以維持在9.0μm<圖型尺寸<10.0μm為佳。 The silicon wafer substrate prepared in the adhesion evaluation was baked at 230 ° C for 30 minutes using CLEAN OVEN PVHC-210 manufactured by Espec Corporation to form a hardened film having a thickness of about 4.0 μm. The pattern size of the pattern produced was measured by a Hitachi Denkai S-shaped scanning electron microscope S-4100. The dimensional stability is preferably maintained at 9.0 μm <pattern size <10.0 μm.

[金屬濺鍍後耐熱性之評價] [Evaluation of heat resistance after metal sputtering]

使用旋轉塗佈器將正型感光性樹脂組成物塗佈在矽晶圓上後,在加熱板上以溫度120℃進行120秒鐘預烘烤而形成塗膜。 After the positive photosensitive resin composition was coated on a silicon wafer using a spin coater, pre-baking was performed on a hot plate at a temperature of 120 ° C for 120 seconds to form a coating film.

使用烤箱以溫度230℃後烘烤此塗膜60分鐘,而形成膜厚約4.0μm之硬化膜。於此硬化膜上使用往復式濺鍍裝置,以1000Å之膜厚濺鍍成膜Al-Nd金屬。並且,使用烤箱以230℃加熱此附Al-Nd之硬化膜30分鐘。此時,將金屬表面上未產生龜裂之情況判斷為金屬濺鍍後之耐熱性良好(○),將金屬表面上產生龜裂之情況判斷為金屬濺鍍後之耐熱性不良(×)。 An oven was used to bake the coating film at a temperature of 230 ° C. for 60 minutes to form a hardened film having a thickness of about 4.0 μm. An Al-Nd metal was sputtered with a thickness of 1000 Å using a reciprocating sputtering device on this hardened film. And, this hardened film with Al-Nd was heated at 230 ° C for 30 minutes using an oven. At this time, it was judged that the case where cracks did not occur on the metal surface was good in heat resistance after metal sputtering (镀), and the case where cracks occurred in metal surface was judged as poor heat resistance after metal sputtering (×).

[段差平坦化性之評價] [Evaluation of step flatness]

使用旋轉塗佈器將正型感光性樹脂組成物塗佈於附Cr段差基板(線寬50μm、高度0.5μm、線間距50μm)上後,在加熱板上以溫度120℃進行120秒鐘預烘烤而形成塗膜。在烤箱中以溫度230℃後烘烤此塗膜30分鐘而形成膜厚4.0μm之硬化膜。膜厚係使用ULVAC製觸針式表面形狀測量器Dektak150進行測量,測量段差基板線上之塗膜與線間距上之塗膜之膜厚差。使用平坦化率(DOP)=100×{1-(塗膜之膜厚差(μm))/(段差基板之高度(0.5μm)}之式求取平坦化率。 Using a spin coater, apply a positive photosensitive resin composition to a Cr-attached substrate (50 μm line width, 0.5 μm height, and 50 μm line spacing), and then pre-baked on a hot plate at 120 ° C. for 120 seconds. Bake to form a coating film. This coating film was baked in an oven at a temperature of 230 ° C. for 30 minutes to form a hardened film having a thickness of 4.0 μm. The film thickness is measured by using a stylus-type surface shape measuring device Dektak150 made by ULVAC. The film thickness difference between the coating film on the stepped substrate line and the coating film on the line pitch is measured. The flattening ratio (DOP) = 100 × {1- (film thickness difference (μm) of the coating film) / (height of the stepped substrate (0.5 μm)}) is used to obtain the flattening ratio.

[評價之結果] [Result of Evaluation]

將施行以上評價之結果展示於以下之表2。 The results of the above evaluations are shown in Table 2 below.

由表2所之結果可得知,實施例1至實施例3之正型感光性樹脂組成物皆為高感度,且顯像時之密著性 亦充足。並且圖型形成後之尺寸變化小,硬化膜在金屬濺鍍後之耐熱性高,段差平坦化性亦為良好。另一方面,比較例1至比較例2之圖型尺寸變化大,比較例2之段差平坦化性低,比較例3在金屬濺鍍後之耐熱性差,皆為無法滿足全部性質者。 As can be seen from the results shown in Table 2, the positive-type photosensitive resin compositions of Examples 1 to 3 are all highly sensitive and exhibit adhesiveness during development. Also sufficient. In addition, the dimensional change after pattern formation is small, the heat resistance of the cured film after metal sputtering is high, and the leveling flatness is also good. On the other hand, the pattern size of Comparative Example 1 to Comparative Example 2 changed greatly, the flatness of the step difference of Comparative Example 2 was low, and the heat resistance of Comparative Example 3 after metal sputtering was poor, all of which could not satisfy all the properties.

[產業上之可利用性] [Industrial availability]

本發明之正型感光性樹脂組成物係適宜作為形成薄膜電晶體(TFT)型液晶顯示元件、有機EL元件等之各種顯示器中之保護膜、平坦化膜、絕緣膜等之硬化膜用的材料,尤其亦係適宜作為形成TFT型液晶元件之層間絕緣膜、濾色器之保護膜、陣列平坦化膜、反射型顯示器之反射膜下側之凹凸膜、有機EL元件之絕緣膜等用之材料,並且亦適宜作為微透鏡材料等之各種電子材料。 The positive-type photosensitive resin composition of the present invention is suitable as a material for hardening films such as protective films, planarizing films, and insulating films in various displays such as thin-film transistor (TFT) liquid crystal display elements and organic EL elements. In particular, it is also suitable as a material for forming an interlayer insulating film of a TFT type liquid crystal element, a protective film for a color filter, an array flattening film, a concave-convex film under a reflective film of a reflective display, an insulating film of an organic EL element, and the like It is also suitable for various electronic materials such as micro lens materials.

Claims (11)

一種正型感光性樹脂組成物,其係含有下述(A)成分、(B)成分、(C)成分、(D)成分及(E)溶劑;(A)鹼可溶性丙烯酸系聚合物、(B)成分:醌二疊氮化合物、(C)成分:具有異三聚氰酸酯骨架與2個以上聚合性不飽和雙鍵之化合物、(D)成分:具有2個以上選自烷氧基甲基及羥基甲基之取代基的交聯性化合物、(E)溶劑。A positive-type photosensitive resin composition comprising the following components (A), (B), (C), (D), and (E) a solvent; (A) an alkali-soluble acrylic polymer, ( B) component: quinonediazide compound, (C) component: compound having an isocyanurate skeleton and two or more polymerizable unsaturated double bonds, (D) component: having two or more selected from alkoxy groups Crosslinkable compounds of methyl and hydroxymethyl substituents, (E) solvents. 如請求項1之正型感光性樹脂組成物,其中(A)成分係數平均分子量以聚苯乙烯換算為2,000至30,000之鹼可溶性丙烯酸系聚合物。The positive-type photosensitive resin composition according to claim 1, wherein the (A) component coefficient is an alkali-soluble acrylic polymer having an average molecular weight of 2,000 to 30,000 in terms of polystyrene. 如請求項1或請求項2之正型感光性樹脂組成物’其中相對於(A)成分100質量份,(B)成分為5至100質量份。For example, the positive photosensitive resin composition of claim 1 or claim 2 is 5 to 100 parts by mass with respect to 100 parts by mass of the component (A). 如請求項1或請求項2之正型感光性樹脂組成物,其中相對於(A)成分100質量份,(C)成分為5至60質量份。For example, the positive-type photosensitive resin composition of claim 1 or claim 2, wherein the component (C) is 5 to 60 parts by mass relative to 100 parts by mass of the component (A). 如請求項1或請求項2之正型感光性樹脂組成物,其中相對於(A)成分100質量份,(D)成分為5至50質量份。For example, the positive-type photosensitive resin composition of claim 1 or claim 2, wherein the component (D) is 5 to 50 parts by mass relative to 100 parts by mass of the component (A). 如請求項1或請求項2之正型感光性樹脂組成物,其中在正型感光性樹脂組成物100質量份中,更含有作為(F)成分之界面活性劑0.01至1.0質量份。For example, the positive photosensitive resin composition according to claim 1 or claim 2, wherein 100 parts by mass of the positive photosensitive resin composition further contains 0.01 to 1.0 part by mass of a surfactant as a component (F). 如請求項1或請求項2之正型感光性樹脂組成物,其中在正型感光性樹脂組成物中,相對於(A)成分100質量份,更含有作為(G)成分之密著促進劑0.1至20質量份。For example, the positive-type photosensitive resin composition of claim 1 or claim 2, wherein the positive-type photosensitive resin composition contains an adhesion promoter as a component (G) with respect to 100 parts by mass of the component (A). 0.1 to 20 parts by mass. 一種硬化膜,其係使用如請求項1至請求項7中任一項之正型感光性樹脂組成物而得。A cured film obtained by using the positive-type photosensitive resin composition according to any one of claim 1 to claim 7. 一種顯示元件,其係具有如請求項8之硬化膜。A display element having a cured film as claimed in claim 8. 一種顯示器用陣列平坦化膜,其係由如請求項8之硬化膜所構成。An array flattening film for a display is composed of a cured film as claimed in claim 8. 一種層間絕緣膜,其係由如請求項8之硬化膜所構成。An interlayer insulating film composed of a hardened film as claimed in claim 8.
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