TWI663220B - Method for manufacturing resin modified concrete - Google Patents

Method for manufacturing resin modified concrete Download PDF

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TWI663220B
TWI663220B TW104105770A TW104105770A TWI663220B TW I663220 B TWI663220 B TW I663220B TW 104105770 A TW104105770 A TW 104105770A TW 104105770 A TW104105770 A TW 104105770A TW I663220 B TWI663220 B TW I663220B
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resin
epoxy resin
filler
epoxy
present
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TW104105770A
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TW201544553A (en
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中西政隆
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日商日本化藥股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09CTREATMENT OF INORGANIC MATERIALS, OTHER THAN FIBROUS FILLERS, TO ENHANCE THEIR PIGMENTING OR FILLING PROPERTIES ; PREPARATION OF CARBON BLACK  ; PREPARATION OF INORGANIC MATERIALS WHICH ARE NO SINGLE CHEMICAL COMPOUNDS AND WHICH ARE MAINLY USED AS PIGMENTS OR FILLERS
    • C09C1/00Treatment of specific inorganic materials other than fibrous fillers; Preparation of carbon black
    • C09C1/28Compounds of silicon
    • C09C1/30Silicic acid
    • C09C1/3072Treatment with macro-molecular organic compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K9/00Use of pretreated ingredients
    • C08K9/08Ingredients agglomerated by treatment with a binding agent
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01PINDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
    • C01P2004/00Particle morphology
    • C01P2004/30Particle morphology extending in three dimensions
    • C01P2004/32Spheres

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Pigments, Carbon Blacks, Or Wood Stains (AREA)

Abstract

本發明之目的在於提供一種賦予環氧樹脂組成物之流動性,且耐封端(blocking)性優異之樹脂改質填料、使用其之環氧樹脂組成物、其硬化物。 An object of the present invention is to provide a resin-modified filler which imparts fluidity to an epoxy resin composition and is excellent in blocking resistance, an epoxy resin composition using the filler, and a cured product thereof.

本發明之樹脂改質填料,其含有無機填料(a)與一分子內具有平均2~10個環氧基之環氧樹脂(b),且(a)與(b)之重量比為(a):(b)=70:30~98:2,且長軸為5cm以下。 The modified resin filler of the present invention contains an inorganic filler (a) and an epoxy resin (b) having an average of 2 to 10 epoxy groups in one molecule, and the weight ratio of (a) to (b) is (a ): (B) = 70: 30 ~ 98: 2, and the long axis is 5 cm or less.

Description

樹脂改質填料之製造方法 Manufacturing method of resin modified filler

本發明係關於一種賦予環氧樹脂組成物流動性優異,又處理特性優異之樹脂改質填料、使用其之環氧樹脂組成物,及其硬化物。 The present invention relates to a resin-modified filler having excellent fluidity and excellent handling characteristics provided to an epoxy resin composition, an epoxy resin composition using the same, and a cured product thereof.

本發明係關於一種於要求高功能之電氣電子材料用途,尤其是作為半導體密封劑、薄膜基板材料較佳之樹脂改質填料、環氧樹脂組成物,及其硬化物。 The present invention relates to an application of electrical and electronic materials that require high functions, especially a resin modified filler, a epoxy resin composition, and a cured product thereof, which are preferred as semiconductor sealants, film substrate materials.

環氧樹脂組成物由於作業性及其硬化物之優異電氣特性、耐熱性、接著性、耐濕性(耐水性)等,而被廣泛用於電氣、電子零件、構造用材料、接著劑、塗料等領域。 Epoxy resin compositions are widely used in electrical and electronic parts, structural materials, adhesives, and coatings because of their excellent electrical properties, heat resistance, adhesion, and moisture resistance (water resistance). And other fields.

然而,近年於電氣、電子領域中,伴隨其發展,要求有以樹脂組成物之高純度化為代表、耐濕性、密接性、誘電特性、用以高填充填料(無機或有機填充劑)之低黏度化、用以縮短成型週期之反應性之提升等各特性之進一步提升。又,作為構造材料,於航空太空材料、休閒、運動器具用途等,要求有輕量且機械物性優異之材料。尤其是於半導體密封領域、基板(基板自身,或其周邊材料)中,隨著其半導體之變遷,薄層化、堆疊化、系統化、三維化變得複雜,其金屬線配線之窄間距化、細線化不斷發展,若無高流動性,則誘發金屬線偏移(wire sweep)。進而,對金屬線之連接部造成不良影響。 However, in recent years in the electrical and electronic fields, along with its development, it is required to be represented by the high purity of the resin composition, moisture resistance, adhesion, electrical properties, and high filling fillers (inorganic or organic fillers). Various properties such as lower viscosity and improved reactivity to shorten the molding cycle have been further improved. In addition, as a structural material, materials that are lightweight and excellent in mechanical properties are required for aerospace materials, leisure, and sports equipment applications. Especially in the field of semiconductor sealing and the substrate (the substrate itself or its surrounding materials), with the change of its semiconductor, thinning, stacking, systematization, and three-dimensionalization become complicated, and the narrow pitch of its metal wire wiring 3. Thinning continues to develop. Without high fluidity, wire sweep is induced. Further, it adversely affects the connection portion of the metal wire.

進而,倒裝晶片型之封裝中,由所謂廉價製造方法方面而言不使用底膠(under filling),一次性進行密封之MUF的方法備受關注。於本用途中,樹脂必須通過晶片與封裝基板之非常狹窄的間隙,填料之細微化變得重要,由於其細微化,而體系之黏度上升、成為空隙之原因。 Furthermore, in the flip-chip type package, a method of performing MUF sealing without using under filling in terms of a so-called inexpensive manufacturing method has attracted much attention. In this application, the resin must pass through a very narrow gap between the wafer and the package substrate, and the miniaturization of the filler becomes important. Due to the miniaturization, the viscosity of the system increases and becomes a cause of voids.

進而,使用於晶圓級封裝等再配線層之密封樹脂、或用於增層(build up layer)層之相關絕緣膜等中,由於層之厚度較薄,又線膨脹率降低,而必須填充細微填料。因此,於本用途中亦與上述相同,體系之低黏度成為必要(非專利文獻1)。 Furthermore, in sealing resins used in redistribution layers such as wafer-level packaging, or related insulating films used in build up layer layers, the thickness of the layers is thinner, and the linear expansion rate is reduced, so they must be filled. Fine filler. Therefore, also in this application, the same as the above, a low viscosity of the system becomes necessary (Non-Patent Document 1).

非專利文獻1:“2008年 STRJ報告 半導體藍圖(road map)專門委員會2008年度報告”,第8章,p1-17,[online],2009年3月,JEITA(公司)電子資訊技術產業協會半導體技術藍圖專門委員會,[2012年5月30日檢索],Internet<URL:http://strj-jeita.elisasp.net/strj/nenjihoukoku-2008.cfm> Non-Patent Document 1: "2008 Annual Report of the Special Committee on Semiconductor Road Map of the 2008 STRJ Report", Chapter 8, p1-17, [online], March 2009, JEITA (Company) Electronics and Information Technology Industry Association Semiconductors Technical Blueprint Special Committee, [Retrieved on May 30, 2012], Internet <URL: http: //strj-jeita.elisasp.net/strj/nenjihoukoku-2008.cfm>

作為一般環氧樹脂組成物之低黏度化之方法,可用所使用之樹脂的低分子量化,但若低分子量化,則軟化點下降,於室溫之形狀變得易具有流動性,故而難以於室溫操作,進而,作為組成物時產生黏膩性而產生難以儲藏或處理等之不適性。 As a method for reducing the viscosity of a general epoxy resin composition, the molecular weight of the resin used can be reduced. However, if the molecular weight is reduced, the softening point is reduced, and the shape at room temperature becomes easy to have fluidity. Operation at room temperature also causes stickiness when used as a composition, causing discomfort such as difficulty in storage and handling.

因此,對於該用途,研究結晶性之環氧樹脂的提供,但即使樹脂本身之處理特性良好但於熔融捏合後難以進行結晶化,有具有黏膩之情形。其即使於捏合時均勻,但由於在工業製造中捏合之隙縫(clearance)較大、難以均勻地捏合而於表面殘留樹脂塊,因此產生封端(blocking)促進等問題。 Therefore, for this application, the provision of a crystalline epoxy resin has been studied, but even if the resin itself has good processing characteristics, it is difficult to crystallize after melt-kneading, and it may be sticky. Although it is uniform at the time of kneading, since the clearance of kneading is large in industrial manufacturing, it is difficult to knead uniformly to leave a resin block on the surface, which causes problems such as blocking promotion.

有鑑於如此先前之問題點,本發明之課題在於提供一種賦予環氧樹脂組成物之流動性,耐封端性優異之樹脂改質填料、使用其之環氧樹脂組成物,其硬化物。 In view of such a previous problem, an object of the present invention is to provide a resin-modified filler that imparts fluidity to an epoxy resin composition and is excellent in end-capping resistance, an epoxy resin composition using the filler, and a cured product thereof.

本發明人等鑑於如上述之實際情況,潛心研究,結果完成本發明。 The present inventors have made intensive studies in view of the above-mentioned actual situation, and as a result, have completed the present invention.

即,本發明係關於下述〔1〕~〔4〕。 That is, the present invention relates to the following [1] to [4].

〔1〕一種樹脂改質填料,其含有無機填料(a),與於一分子內具有平均2~10個環氧基之環氧樹脂(b),且(a)與(b)之重量比為(a):(b)=70:30~98:2,且長軸為5cm以下。 [1] A resin modified filler containing an inorganic filler (a) and an epoxy resin (b) having an average of 2 to 10 epoxy groups in one molecule, and a weight ratio of (a) to (b) (A) :( b) = 70: 30 ~ 98: 2, and the long axis is 5 cm or less.

〔2〕如〔1〕之樹脂改質填料,其中,環氧樹脂(b)之軟化點為35~75℃。 [2] The resin-modified filler according to [1], wherein the softening point of the epoxy resin (b) is 35 to 75 ° C.

〔3〕一種環氧樹脂組成物,其含有〔1〕或〔2〕之樹脂改質填料、環氧樹脂用硬化劑及/或聚合觸媒。 [3] An epoxy resin composition containing the resin-modified filler of [1] or [2], a hardener for epoxy resin, and / or a polymerization catalyst.

〔4〕一種硬化物,其係將〔3〕之環氧樹脂組成物硬化而得。 [4] A cured product obtained by curing the epoxy resin composition of [3].

本發明之樹脂改質填料係賦予環氧樹脂組成物之流動性,且含有該填料之硬化性環氧樹脂組成物,對於以電氣電子零件用絕緣材料及積層板(印刷配線板、增層積板等)或CFRP為代表之各種複合材料、接著劑、塗料等有用。尤其是對於保護半導體元件之半導體密封材料極其有用。 The resin-modified filler of the present invention imparts fluidity to an epoxy resin composition, and the hardening epoxy resin composition containing the filler is suitable for insulating materials for electric and electronic parts and laminated boards (printed wiring boards, laminated layers). Boards, etc.) or CFRP is useful for a variety of composite materials, adhesives, coatings, etc. It is particularly useful for semiconductor sealing materials for protecting semiconductor elements.

圖1係本發明之塊狀之樹脂改質填料的放大照片。 FIG. 1 is an enlarged photograph of a block-shaped resin-modified filler of the present invention.

圖2係本發明之粉狀之樹脂改質填料的放大照片。 FIG. 2 is an enlarged photograph of the powdery resin-modified filler of the present invention.

圖3係環氧樹脂與無機填料之混合物的放大照片。 Figure 3 is an enlarged photograph of a mixture of an epoxy resin and an inorganic filler.

圖4係於實施例8所得之樹脂改質填料的放大照片(放大倍率200倍)。 FIG. 4 is an enlarged photograph (200x magnification) of the resin-modified filler obtained in Example 8. FIG.

圖5係於實施例8所得之樹脂改質填料的放大照片(放大倍率800倍)。 FIG. 5 is an enlarged photograph (800 times magnification) of the resin-modified filler obtained in Example 8. FIG.

圖6係於實施例8所得之樹脂改質填料的放大照片(放大倍率50000倍)。 FIG. 6 is an enlarged photograph (50,000 times magnification) of the resin-modified filler obtained in Example 8. FIG.

圖7係於實施例9所得之樹脂改質填料的放大照片(放大倍率200倍)。 FIG. 7 is an enlarged photograph (200 times magnification) of the resin-modified filler obtained in Example 9. FIG.

圖8係於實施例9所得之樹脂改質填料的放大照片(放大倍率800倍)。 FIG. 8 is an enlarged photograph (800 times magnification) of the resin-modified filler obtained in Example 9. FIG.

圖9係於實施例9所得之樹脂改質填料的放大照片(放大倍率50000倍)。 FIG. 9 is an enlarged photograph (50,000 magnifications) of the resin-modified filler obtained in Example 9. FIG.

本發明之樹脂改質填料,其含有無機填料(a),與於一分子內具有平均2~10個環氧基之環氧樹脂(b)。 The modified resin filler of the present invention contains an inorganic filler (a) and an epoxy resin (b) having an average of 2 to 10 epoxy groups in one molecule.

本發明中之無機填料(a)可舉出:矽凝膠(由結晶矽、熔融矽、奈米矽、溶膠-凝膠(sol-gel)之氧化矽聚合物等)、氧化鋁、鋯石、矽酸鈣、碳酸鈣、碳化矽、氮化矽、氮化硼、氧化鋯、鎂橄欖石、塊滑石、尖晶石、氧化鈦、滑石等之粉體或球型化該等之珠粒等,但並不限定於該等。該等可單獨使用,亦可使用2種以上。於本發明中尤其是較佳為矽凝膠或氧化鋁、氮化硼、氮化鋁等,特佳為矽凝膠、氧化鋁。 Examples of the inorganic filler (a) in the present invention include: silica gel (from crystalline silica, fused silica, nano-silica, sol-gel silica polymer, etc.), alumina, zircon , Calcium silicate, calcium carbonate, silicon carbide, silicon nitride, boron nitride, zirconia, forsterite, talc, spinel, titanium oxide, talc, etc. Etc., but not limited to them. These can be used alone or in combination of two or more. Particularly preferred in the present invention are silica gel or alumina, boron nitride, aluminum nitride, and the like, and particularly preferred are silica gel and alumina.

其之粒徑可舉出多種,但其平均粒徑較佳為0.1~100μm,更佳為0.1~60μm,特佳為0.1~30μm。平均粒徑之測定係可使用例如:雷射繞射、散射式粒度分布測定器(乾式)(SEISHIN ENTERPRISE CO.,LTD製:LMS-30)等來進行測定。 There are various types of particle diameters, but the average particle diameter is preferably 0.1 to 100 μm, more preferably 0.1 to 60 μm, and particularly preferably 0.1 to 30 μm. The measurement of the average particle diameter can be performed using, for example, laser diffraction, a scattering-type particle size distribution measuring device (dry type) (manufactured by SEISHIN ENTERPRISE CO., LTD: LMS-30), and the like.

再者,平均粒徑較佳為根據封裝來進行選擇。若為倒裝晶片型,則較佳為0.1~10μm,更佳為0.1~5μm。又,若為金屬線結合型,則較佳為1~ 30μm,特佳為1~25μm。 The average particle diameter is preferably selected based on the package. If it is a flip chip type, it is preferably 0.1 to 10 μm, and more preferably 0.1 to 5 μm. If it is a metal wire bonding type, it is preferably 1 to 30 μm, particularly preferably 1 to 25 μm.

作為本發明所使用之環氧樹脂(b)之具體例,可舉出:酚醛清漆型環氧樹脂、雙酚A型環氧樹脂、聯苯型環氧樹脂、三苯甲烷型環氧樹脂、苯酚芳烷基型環氧樹脂等。具體而言,可舉出:雙酚A、雙酚S、硫代聯苯酚、茀雙酚、萜二酚、4,4’-聯苯酚、2,2’-聯苯酚、3,3’,5,5’-四甲基-[1,1’-聯苯]-4,4’-二醇、對苯二酚、間苯二酚、萘二酚、三-(4-羥基苯基)甲烷、1,1,2,2-四(4-羥基苯基)乙烷、酚類(苯酚、烷基取代苯酚、萘酚、烷基取代萘酚、二羥基苯、二羥基萘等)與甲醛、乙醛、苯甲醛、對羥基苯甲醛、鄰羥基苯甲醛、對羥基苯乙酮、鄰羥基苯乙酮、二環戊二烯、糠醛、4,4'-雙(氯甲基)-1,1’-聯苯、4,4'-雙(甲氧基甲基)-1,1’-聯苯、1,4-雙(氯甲基)苯、1,4-雙(甲氧基甲基)苯等之聚縮合物及該等之改質物,由四溴雙酚A等鹵化雙酚類、醇類衍生之環氧丙基醚化物、脂環式環氧樹脂、環氧丙基胺系環氧樹脂、環氧丙基酯系環氧樹脂等矽倍半氧烷(silsesquioxane)系之環氧樹脂(鏈狀、環狀、梯狀,或於該等至少兩種以上之混合結構之矽氧烷構造中具有環氧丙基,及/或環氧環己烷結構之環氧樹脂)等環氧樹脂,但並不限定於該等。此處,其中較佳為聯苯型苯酚芳烷基型環氧樹脂、苯基型苯酚芳烷基型環氧樹脂、苯酚類與二環戊二烯之聚縮合物及該等之改質物、酚醛清漆型環氧樹脂。 Specific examples of the epoxy resin (b) used in the present invention include novolac epoxy resin, bisphenol A epoxy resin, biphenyl epoxy resin, triphenylmethane epoxy resin, Phenol aralkyl type epoxy resin and the like. Specific examples include: bisphenol A, bisphenol S, thiobiphenol, pyrene bisphenol, terpene diphenol, 4,4'-biphenol, 2,2'-biphenol, 3,3 ', 5,5'-tetramethyl- [1,1'-biphenyl] -4,4'-diol, hydroquinone, resorcinol, naphthalenediol, tris- (4-hydroxyphenyl) Methane, 1,1,2,2-tetrakis (4-hydroxyphenyl) ethane, phenols (phenol, alkyl-substituted phenol, naphthol, alkyl-substituted naphthol, dihydroxybenzene, dihydroxynaphthalene, etc.) and Formaldehyde, acetaldehyde, benzaldehyde, p-hydroxybenzaldehyde, o-hydroxybenzaldehyde, p-hydroxyacetophenone, o-hydroxyacetophenone, dicyclopentadiene, furfural, 4,4'-bis (chloromethyl)- 1,1'-biphenyl, 4,4'-bis (methoxymethyl) -1,1'-biphenyl, 1,4-bis (chloromethyl) benzene, 1,4-bis (methoxy) Polymethyl condensates such as benzene, etc. and their modifications, epoxypropyl etherates derived from halogenated bisphenols such as tetrabromobisphenol A, alcohols, alicyclic epoxy resins, and propylene oxide Silsesquioxane based epoxy resins (chain, cyclic, ladder, or a mixture of at least two or more of these) Structural silicon oxide An epoxy resin such as an epoxy group having an epoxy group structure and / or an epoxy cyclohexane structure in the alkane structure is not limited thereto. Here, among them, biphenyl-type phenol aralkyl-type epoxy resin, phenyl-type phenol aralkyl-type epoxy resin, polycondensates of phenols and dicyclopentadiene, and modifications thereof, Novolac epoxy resin.

然而,本發明中尤其是其樹脂之軟化點較佳為35~75℃,特佳為35~60℃。一般而言,環氧樹脂在軟化點低於30℃環境下使用時,於環氧樹脂中可一面抑制封端一面保持固體形狀。於環氧樹脂中,特佳為在軟 化點低於50℃溫度下使用,若於其通常超過75℃,則成為固體形狀,特地使用本方法之必要較小,而有不僅其效果小而且黏度變高之虞。又35~75℃之軟化點之化合物,有熔融黏度與耐熱性等硬化特性之平衡優異的傾向。 However, in the present invention, especially the softening point of the resin is preferably 35 to 75 ° C, and particularly preferably 35 to 60 ° C. Generally speaking, when the epoxy resin is used in an environment where the softening point is lower than 30 ° C, the epoxy resin can keep the solid shape while suppressing the end-capping. In epoxy resin, especially good in soft If it is used at a temperature lower than 50 ° C, it usually becomes a solid shape if it usually exceeds 75 ° C. It is necessary to use this method in a small way, but it may not only have a small effect but also a high viscosity. A compound having a softening point of 35 to 75 ° C tends to have an excellent balance of melt viscosity and heat resistance such as heat resistance.

又於150℃之較佳熔融黏度為0.2Pa.s以下。若熔融黏度較150℃高,則有於成形性產生問題之虞。由於黏度越低越有用,故於本發明中並無設定下限(以通常之黏度計測定亦為困難)。 The preferred melt viscosity at 150 ° C is 0.2Pa. s or less. If the melt viscosity is higher than 150 ° C, there may be a problem in the formability. Since the lower the viscosity, the more useful it is. In the present invention, no lower limit is set (it is also difficult to measure with a general viscosity meter).

再者,於本發明中所使用之環氧樹脂,於一分子內具有平均2~10個環氧基。若於一分子內所含之環氧基之數平均低於2,則對於耐熱性等硬化特性有不良影響,若於一分子內所含之環氧基之數平均超過10,則黏度變得非常高而於處理特性產生問題。 Moreover, the epoxy resin used in the present invention has an average of 2 to 10 epoxy groups in one molecule. If the number of epoxy groups contained in one molecule is less than 2 on average, it has an adverse effect on hardening properties such as heat resistance. If the number of epoxy groups contained in one molecule exceeds 10 on average, the viscosity becomes Very high and causes problems with processing characteristics.

又於本發明所使用之環氧樹脂之環氧當量較佳為150~750g/eq.,特佳為150~500g/eq.。藉由於本範圍內,而於組成物中有流動性、硬化性成為良好之傾向,又該硬化物中,有耐熱性、熱分解特性、吸水特性、機械強度優異之傾向,且可適當地使用於良好之半導體裝置之製造。 The epoxy equivalent of the epoxy resin used in the present invention is preferably 150 to 750 g / eq., And particularly preferably 150 to 500 g / eq. With this range, the composition tends to have good fluidity and hardenability, and the hardened material tends to be excellent in heat resistance, thermal decomposition characteristics, water absorption characteristics, and mechanical strength, and can be suitably used. In good semiconductor device manufacturing.

於本發明中無機填料(a)與環氧樹脂(b)之比率,以重量比(a):(b)=70:30~98:2,更佳為70:30~95:5。 In the present invention, the ratio of the inorganic filler (a) to the epoxy resin (b) is a weight ratio (a): (b) = 70: 30 to 98: 2, and more preferably 70:30 to 95: 5.

相較於(a):(b)=70:30之比率,若填料量之比例變少,則尤其是使用軟化點60℃以下之環氧樹脂時,於室溫操作中產生封端的可能性高,且處理變得非常困難。例如於使用軟化點50℃以下之環氧樹脂時,成為細小碎裂、粒狀,或片狀或小塊狀而有其困難。即,就流動性、處理等之特性面而言(a):(b)=70:30~98:2。 Compared with the ratio of (a) :( b) = 70: 30, if the ratio of the filler amount is reduced, especially when using an epoxy resin with a softening point of 60 ° C or less, the possibility of capping may occur during room temperature operation. High and handling becomes very difficult. For example, when an epoxy resin having a softening point of 50 ° C or lower is used, it becomes difficult to form a fine chipped, granular, or sheet or small block. That is, (a): (b) = 70: 30 to 98: 2 in terms of characteristics of fluidity and processing.

本發明之樹脂改質填料,進一步可含有偶合劑等添加劑。偶 合劑係為了使樹脂與填料變得緊密,較佳為於混合時添加。 The resin-modified filler of the present invention may further contain additives such as a coupling agent. I The mixture is preferably added during mixing to make the resin and the filler compact.

作為較佳之偶合劑可舉出:3-環氧丙氧基丙基三甲氧基矽烷、3-環氧丙氧基丙基甲基二甲氧基矽烷、3-環氧丙氧基丙基甲基二甲氧基矽烷、2-(3,4-環氧基環己基)乙基三甲氧基矽烷、N-(2-胺基乙基)3-胺基丙基甲基二甲氧基矽烷、N-(2-胺基乙基)3-胺基丙基甲基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、乙烯基三甲氧基矽烷、N-(2-(乙烯基苄基胺基)乙基)3-胺基丙基三甲氧基矽烷鹽酸鹽、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-氯丙基甲基二甲氧基矽烷、3-氯丙基三甲氧基矽烷等矽烷系偶合劑;異丙基(N-乙胺基乙胺基)鈦酸酯、異丙基三異硬酯酸鈦酸酯、二(焦磷酸二辛酯)乙氧酸酯鈦(titanium di(dioctyl pyrophosphate)oxyacetate)、四異丙基二(亞磷酸二辛酯)鈦酸酯(tetra-isopropyldi(dioctyl phosphite)titanate)、新烷氧基三(p-N(β-胺基乙基)胺基苯基)鈦酸酯等鈦系偶合劑;乙醯丙酮鋯、甲基丙烯酸鋯、丙酸鋯、新烷氧基鋯酸酯、新烷氧基三新癸醯基鋯酸酯(neoalkoxy tris neodecanoyl zirconate)、新烷氧基三(十二醯基)苯磺醯基鋯酸酯、新烷氧基三(乙二胺乙基)鋯酸酯、新烷氧基三(間胺基苯基)鋯酸酯、碳酸鋯銨、乙醯丙酮鋁、甲基丙烯酸鋁、丙酸鋁等鋯或鋁系偶合劑等。 Preferred coupling agents include 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldimethoxysilane, and 3-glycidoxypropylmethyl Dimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, N- (2-aminoethyl) 3-aminopropylmethyldimethoxysilane , N- (2-aminoethyl) 3-aminopropylmethyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-mercaptopropyltrimethoxysilane, vinyltrimethoxy Silane, N- (2- (vinylbenzylamino) ethyl) 3-aminopropyltrimethoxysilane hydrochloride, 3-methacryloxypropyltrimethoxysilane, 3- Silane-based coupling agents such as chloropropylmethyldimethoxysilane and 3-chloropropyltrimethoxysilane; isopropyl (N-ethylaminoethylamino) titanate, isopropyltriisostearate Acid titanate, titanium di (dioctyl pyrophosphate) oxyacetate, tetra-isopropyldi (dioctyl phosphite) ) titanate), neoalkoxytris (pN (β-aminoethyl) aminophenyl) titanate Mixture; zirconium acetoacetone, zirconium methacrylate, zirconium propionate, neoalkoxy zirconate, neoalkoxy tris neodecanoyl zirconate, neoalkoxy tris (ten Difluorenyl) benzenesulfonyl zirconate, neoalkoxytris (ethylenediamineethyl) zirconate, neoalkoxytris (m-aminophenyl) zirconate, ammonium zirconium carbonate, acetamidine Zirconium or aluminum-based coupling agents such as aluminum acetone, aluminum methacrylate, and aluminum propionate.

該等偶合劑可混合1種或2種以上使用。 These coupling agents may be used in combination of one kind or two or more kinds.

偶合劑於本發明之環氧樹脂組成物中通常為0.05~20重量份,較佳為視需要含有0.1~10重量份。 The coupling agent is usually 0.05 to 20 parts by weight in the epoxy resin composition of the present invention, preferably 0.1 to 10 parts by weight as needed.

作為本發明之樹脂改質填料之製造方法,並無特別指定,較佳為使用溶劑之方法。亦有利用熔融捏合之改質方法,但考量將環氧樹脂 均勻地塗布及/或浸漬於填料時,較佳為藉由溶劑充分地與填料結合。具體而言,混合溶劑、樹脂、填料,其後於減壓下將溶劑蒸餾去除,藉此獲得本發明之樹脂改質填料。此時,不論先將樹脂溶解於溶劑,其後放入填料混合,或者使填料分散於溶劑時投入樹脂混合皆可,同時投入亦可。再者,混合之溫度沒有特別規定,較佳為0℃~100℃,特佳為10℃~80℃。再者,使用加熱至均勻後冷卻的方法亦可。 The method for producing the resin-modified filler of the present invention is not particularly specified, and a method using a solvent is preferred. There are also modification methods using melt-kneading, but consider the epoxy resin When the filler is uniformly applied and / or impregnated, it is preferred that the filler is sufficiently bonded to the filler by a solvent. Specifically, a solvent, a resin, and a filler are mixed, and then the solvent is distilled off under reduced pressure, thereby obtaining a resin-modified filler of the present invention. In this case, it is not necessary to dissolve the resin in a solvent first, and then mix the filler, or to mix the resin when the filler is dispersed in the solvent, or it may be added at the same time. In addition, the mixing temperature is not particularly limited, but is preferably 0 ° C to 100 ° C, and particularly preferably 10 ° C to 80 ° C. It is also possible to use a method of heating to uniformity and then cooling.

溶劑的蒸餾去除係於減壓下進行。溶劑的蒸餾去除溫度通常為50~200℃,特佳為50~180℃。此時,殘留溶劑較佳為1%以下,若超過該者時,則有於成型時成為間隙、剝離之原因。 The solvent is removed by distillation under reduced pressure. The solvent removal temperature is usually 50 ~ 200 ° C, particularly preferably 50 ~ 180 ° C. At this time, the residual solvent is preferably 1% or less, and if it exceeds this, it may cause gaps and peeling during molding.

作為於本發明中可使用之溶劑,可舉出:以甲苯、二甲苯、石油腦為代表之芳香族烴類、甲基乙基酮、甲基異丁基酮、丙酮、環己酮、環戊酮等之酮類、乙酸乙酯、乙酸丁酯、乳酸乙酯、卡必醇醋酸酯(carbitol acetate)、丙二醇單甲醚醋酸酯、γ丁內酯等酯類、甲醇、乙醇、丙醇、丁醇等醇類、二甘醇二甲醚(diglyme)、三甘醇二甲醚、二烷、四氫呋喃等醚類等,尤其是就其樹脂的溶解性而言較佳為芳香族烴類、酮類、酯類,特佳為使用酮類、酯類。再者,亦可合併兩種類以上之溶劑,且亦可調整樹脂之溶解性、填料之分散性、蒸餾去除時之揮發性。例如可組合酮類與醇類來調整溶解性,以酮類與芳香族烴類來調整揮發性。 Examples of the solvent usable in the present invention include aromatic hydrocarbons typified by toluene, xylene, and petroleum naphtha, methyl ethyl ketone, methyl isobutyl ketone, acetone, cyclohexanone, and cyclo Ketones such as pentanone, ethyl acetate, butyl acetate, ethyl lactate, carbitol acetate, propylene glycol monomethyl ether acetate, gamma butyrolactone and other esters, methanol, ethanol, propanol , Alcohols such as butanol, diglyme, diglyme, In particular, ethers such as alkane and tetrahydrofuran are aromatic hydrocarbons, ketones, and esters, and particularly preferred are ketones and esters in terms of solubility of the resin. Furthermore, two or more types of solvents can be combined, and the solubility of the resin, the dispersibility of the filler, and the volatility during distillation can be adjusted. For example, the solubility can be adjusted by combining ketones and alcohols, and the volatility can be adjusted by ketones and aromatic hydrocarbons.

再者,於本發明中其沸點較佳為150℃以下者,特佳為130℃以下。若沸點過高,則容易殘留有殘留溶劑故而不佳。 Furthermore, in the present invention, the boiling point is preferably 150 ° C or lower, and particularly preferably 130 ° C or lower. If the boiling point is too high, residual solvents tend to remain, which is not preferable.

於本發明中其溶劑之蒸餾去除方法並無特別限定,但較佳為一面攪拌一面將溶劑蒸餾去除,具體而言,較佳為諾塔混合機(Nauta- Mixer)、混合乾燥機(ribocone)、錐形乾燥機、減壓下之行星式混合機、蒸發器、真空乾燥機(可於減壓條件下使用之切斷器(chopper))等構造,可於200torr以下之減壓環境下可攪拌者較佳。其中,為激烈碎裂之金屬製的粉碎機時,由於金屬汙染的可能性高,故而不佳。 The method for distilling and removing the solvent in the present invention is not particularly limited, but it is preferable to distill and remove the solvent while stirring, and specifically, a Nauta mixer (Nauta- Mixer), ribocone, cone dryer, planetary mixer under reduced pressure, evaporator, vacuum dryer (chopper that can be used under reduced pressure), etc. It can be stirred in a reduced pressure environment below 200torr. Among them, a crusher made of a metal that is severely cracked is not preferable because the possibility of metal contamination is high.

本發明中,100μm以上之磁化金屬異物較佳為每10g 1個以下,更佳為每30g 1個以下,特佳為每50g 1個以下。每100g混入1個以上磁化異物時,對於已完成之半導體裝置有產生致命的問題之虞。 In the present invention, the magnetized metal foreign matter of 100 μm or more is preferably 1 or less per 10 g, more preferably 1 or less per 30 g, and particularly preferably 1 or less per 50 g. When more than one magnetized foreign substance is mixed per 100 g, there is a possibility that a fatal problem may be caused to a completed semiconductor device.

如此所得之樹脂改質填料呈現粒狀、塊狀或粉狀,於20℃中即使1cm以上重疊一週以上也不會成為單一塊,表示為粒狀或塊狀(長軸:0.1mm~5cm),或粉狀(長軸:0.1μm~0.1mm)之形狀。再者,塊狀、粉狀係限於區分兩者之基準。此處中不會成為單一塊係表示即使有少許的結塊也是以人手之力可撥開之程度的結塊。一般之環氧樹脂重疊時通常漸漸生成結塊,往往成為單一且無法為以人手撥開之形狀。特佳之形狀者為即使於100℃保管1小時以上亦不會成為單一塊者。 The resin-modified filler obtained in this way is granular, lumpy, or powdery, and does not become a single lumpy at 20 ° C even if it is overlapped by more than 1cm for more than a week. It is expressed as lumpy or lumpy (long axis: 0.1mm ~ 5cm) , Or powdery (major axis: 0.1μm ~ 0.1mm) shape. Furthermore, the lump and powder are limited to the criterion for distinguishing the two. It does not mean a single piece here means that even a small amount of cake is a cake that can be removed by human hands. Generally, when the epoxy resin overlaps, it usually gradually forms agglomerates, and often becomes a single shape that cannot be pulled out by human hands. A particularly good shape is one that does not become a single piece even if stored at 100 ° C for more than one hour.

本發明之樹脂改質填料,例如:以將環氧樹脂浸漬於無機填料間彼此藉由環氧樹脂黏合而成之填料或無機填料的狀態存在。因此,對於如此之樹脂改質填料之粒徑長軸在5cm以下,較佳為0.1μm~1cm,更佳為0.3μm~5mm。此處,長軸係表示粒狀、塊狀或粉狀之粒子最長直徑的長部位之直徑,作為測定方法,可使用尺規進行測定,或透過具有欲測定之一定大小綱目之篩孔確認通過與否藉此來測定。又,亦可使用顯微鏡來測定長軸。再者,作為平均粒徑通常為5cm以下,較佳為0.1μm~1cm,更佳為0.3μm~5mm。測定方法相同。 The resin-modified filler of the present invention exists, for example, in a state in which an epoxy resin is impregnated between inorganic fillers and the epoxy resin is a filler or an inorganic filler. Therefore, the major axis of the particle diameter of such a resin-modified filler is 5 cm or less, preferably 0.1 μm to 1 cm, and more preferably 0.3 μm to 5 mm. Here, the long axis indicates the diameter of the long part of the longest diameter of the granular, lump, or powder particles. As a measuring method, a ruler can be used for measurement, or it can be confirmed through a sieve with a certain size of the mesh to be measured. Whether to use this to determine. The long axis can also be measured using a microscope. The average particle diameter is usually 5 cm or less, preferably 0.1 μm to 1 cm, and more preferably 0.3 μm to 5 mm. The measurement method is the same.

作為本發明之樹脂改質填料之形狀的例,相較於先前之環氧樹脂與無機填料混合物(以全體一體化而成之板狀型態:圖3)者,分別於圖1~圖2所示之形狀。 As an example of the shape of the resin-modified filler of the present invention, as compared with the previous mixture of epoxy resin and inorganic filler (a plate-like shape integrated as a whole: FIG. 3), it is shown in FIGS. 1 to 2 respectively. The shape shown.

以下,記載關於含本發明之樹脂改質填料之本發明的環氧樹脂組成物。 Hereinafter, the epoxy resin composition of this invention containing the resin modified filler of this invention is described.

於本發明之環氧樹脂組成物中,使用硬化劑及/或聚合觸媒作為必須成分。再者,亦可進一步考量使其含有其他環氧樹脂,此時,可使用之環氧樹脂並無特別限定,例如可使用上述之環氧樹脂。 In the epoxy resin composition of the present invention, a hardener and / or a polymerization catalyst are used as essential components. Furthermore, it may be further considered that it contains other epoxy resins. In this case, the epoxy resins that can be used are not particularly limited, and for example, the aforementioned epoxy resins can be used.

作為本發明之環氧樹脂組成物所含有之硬化劑的具體例,可舉出例如:酚樹脂、酚系化合物、胺系化合物、酸酐系化合物、醯胺系化合物、羧酸系化合物等。作為可使用之硬化劑之具體例,可舉出:酚樹脂、酚化合物;雙酚A、雙酚F、雙酚S、茀雙酚、萜二酚、4,4’-聯苯酚、2,2’-聯苯酚、3,3’,5,5’-四甲基-[1,1’-聯苯]-4,4’-二醇、對苯二酚、間苯二酚、萘二酚、三-(4-羥基苯基)甲烷、1,1,2,2-四(4-羥基苯基)乙烷、酚類(苯酚、烷基取代苯酚、萘酚、烷基取代萘酚、二羥基苯、二羥基萘等)與甲醛、乙醛、苯甲醛、對羥基苯甲醛、鄰羥基苯甲醛、對羥基苯乙酮、鄰羥基苯乙酮、二環戊二烯、糠醛、4,4'-雙(氯甲基)-1,1’-聯苯、4,4'-雙(甲氧基甲基)-1,1’-聯苯、1,4’-雙(氯甲基)苯、1,4’-雙(甲氧基甲基)苯等之聚縮合物及該等之改質物,四溴雙酚A等鹵化雙酚類、萜類與酚類之縮合物等多酚類,但不限定於該等。該等可單獨使用,亦可使用2種以上。 Specific examples of the curing agent contained in the epoxy resin composition of the present invention include, for example, phenol resins, phenol-based compounds, amine-based compounds, acid anhydride-based compounds, amidine-based compounds, and carboxylic acid-based compounds. Specific examples of usable hardeners include phenol resins and phenol compounds; bisphenol A, bisphenol F, bisphenol S, bisphenol, terpene diphenol, 4,4'-biphenol, 2, 2'-biphenol, 3,3 ', 5,5'-tetramethyl- [1,1'-biphenyl] -4,4'-diol, hydroquinone, resorcinol, naphthalenedi Phenol, tri- (4-hydroxyphenyl) methane, 1,1,2,2-tetra (4-hydroxyphenyl) ethane, phenols (phenol, alkyl-substituted phenol, naphthol, alkyl-substituted naphthol , Dihydroxybenzene, dihydroxynaphthalene, etc.) and formaldehyde, acetaldehyde, benzaldehyde, p-hydroxybenzaldehyde, o-hydroxybenzaldehyde, p-hydroxyacetophenone, o-hydroxyacetophenone, dicyclopentadiene, furfural, 4 , 4'-bis (chloromethyl) -1,1'-biphenyl, 4,4'-bis (methoxymethyl) -1,1'-biphenyl, 1,4'-bis (chloromethyl) Poly) condensates of benzene, 1,4'-bis (methoxymethyl) benzene and the like, and halogenated bisphenols such as tetrabromobisphenol A, condensation products of terpenes and phenols, etc. Polyphenols are not limited to these. These can be used alone or in combination of two or more.

作為較佳之酚樹脂,可舉出苯酚芳烷基樹脂(具有芳香族伸 烷基結構之樹脂),特佳為如下樹脂,其特徵在於:其係具有選自苯酚、萘酚、甲酚中之至少一種之結構,且成為其連接子(linker)之伸烷基部係選自苯結構、聯苯結構、萘結構中之至少一種(具體而言可舉出:賽洛克(Xylok)、萘酚賽洛克、苯酚伸苯酚醛清漆樹脂、甲酚-伸苯酚醛清漆樹脂、苯酚-萘酚醛清漆樹脂等)。 As a preferable phenol resin, a phenol aralkyl resin (having aromatic extension A resin having an alkyl structure) is particularly preferably a resin characterized in that it has a structure selected from at least one of phenol, naphthol, and cresol, and is selected as an alkylene moiety of its linker At least one of a self-benzene structure, a biphenyl structure, and a naphthalene structure (specifically, Xylok, naphthol, phenol, phenol novolac resin, cresol-phenol novolac resin, phenol -Naphthol novolac resin, etc.).

胺系化合物、醯胺系化合物;二胺基二苯甲烷、二伸乙基三胺、三伸乙基四胺、二胺基二苯碸、異佛爾酮二胺、二氰二胺、由次亞麻油酸之二聚物與乙二胺合成之聚醯胺樹脂等之含氮化合物。 Amine compounds, amine compounds; diaminodiphenylmethane, diethylene triamine, triethylene tetramine, diamino diphenyl hydrazone, isophorone diamine, dicyandiamine, from Nitrogen compounds such as the dimer of linolenic acid and polyamine resin synthesized by ethylenediamine.

酸酐系化合物、羧酸系化合物;鄰苯二甲酸酐、1,2,4-苯三甲酸酐、焦蜜石酸酐、順丁烯二酸酐、四氫鄰苯二甲酸酐、甲基四氫鄰苯二甲酸酐、甲基耐地酸酐(methyl nadic anhydride)、耐地酸酐、六氫鄰苯二甲酸酐、甲基六氫鄰苯二甲酸酐、丁烷四羧酸酐、雙環[2,2,1]庚烷-2,3-二羧酸酐、甲基雙環[2,2,1]庚烷-2,3-二羧酸酐、環己烷-1,3,4-三羧酸-3,4-酐等酸酐;藉由各種醇、甲醇改質聚矽烷與上述之酸酐加成反應而得之羧酸樹脂;其他;可舉出咪唑、三氟硼烷-胺錯合物、胍衍生物之化合物等,但不限定於該等。該等可單獨使用,亦可使用2種以上。於本發明中尤其就可靠性方面而言,較佳為使用酚樹脂。 Acid anhydride compounds, carboxylic acid compounds; phthalic anhydride, 1,2,4-phthalic anhydride, pyromite anhydride, maleic anhydride, tetrahydrophthalic anhydride, methyltetrahydrophthalic acid Dicarboxylic anhydride, methyl nadic anhydride, methyl nadic anhydride, hexahydrophthalic anhydride, methylhexahydrophthalic anhydride, butanetetracarboxylic anhydride, bicyclic [2,2,1 ] Heptane-2,3-dicarboxylic anhydride, methylbicyclo [2,2,1] heptane-2,3-dicarboxylic anhydride, cyclohexane-1,3,4-tricarboxylic acid-3,4 -Anhydrides such as anhydrides; carboxylic acid resins obtained by the addition reaction of various alcohols, methanol-modified polysilanes and the above anhydrides; others; examples include imidazole, trifluoroborane-amine complexes, and guanidine derivatives. Compounds and the like are not limited thereto. These can be used alone or in combination of two or more. In the present invention, particularly in terms of reliability, it is preferable to use a phenol resin.

本發明之環氧樹脂組成物中硬化劑之使用量,相對於全體環氧樹脂之環氧基1當量,較佳為0.7~1.2當量。於相對於環氧基1當量未達0.7當量時,或超過1.2當量時,均有硬化不完全而無法獲得良好硬化物性之虞。 The use amount of the hardener in the epoxy resin composition of the present invention is preferably 0.7 to 1.2 equivalents relative to 1 equivalent of the epoxy group of the entire epoxy resin. When the amount of epoxy equivalent is less than 0.7 equivalent, or when it exceeds 1.2 equivalent, there is a possibility that hardening is incomplete and good hardened physical properties cannot be obtained.

於本發明之環氧樹脂組成物中併用聚合觸媒作為硬化劑,或者於無使用硬化劑時使用亦可。作為可使用之聚合觸媒的具體例可舉出:2 -甲基咪唑、2-乙基咪唑、2-乙基-4-甲基咪唑等咪唑類,2-(二甲基胺基甲基)苯酚、1,8-二氮雜-雙環(5,4,0)十一烯-7等第3級胺類,三甲苯膦、三苯膦等膦類,四丁基銨鹽、三異丙基甲基銨鹽、三甲基癸基銨鹽、鯨蠟基三甲基銨鹽等四級銨鹽,三苯基苄基鏻鹽、三苯基乙基鏻鹽、四丁基鏻鹽等四級鏻鹽等(四級鹽之相對離子為鹵素、有機酸離子、氫氧化物離子等,並無特別指定,但較佳為有機酸離子、氫氧化物離子。)、辛酸亞錫等金屬化合物等。使用硬化促進劑時,相對於環氧樹脂100重量份,視需要使用0.01~5.0重量份。 In the epoxy resin composition of the present invention, a polymerization catalyst may be used as a curing agent, or it may be used when a curing agent is not used. Specific examples of usable polymerization catalysts include: 2 -Imidazoles such as methylimidazole, 2-ethylimidazole, 2-ethyl-4-methylimidazole, 2- (dimethylaminomethyl) phenol, 1,8-diaza-bicyclo (5, 4,0) tertiary amines such as undecene-7, phosphines such as trimethylphosphine, triphenylphosphine, tetrabutylammonium salt, triisopropylmethylammonium salt, trimethyldecylammonium salt, Quaternary ammonium salts such as cetyltrimethylammonium salts, quaternary phosphonium salts such as triphenylbenzylphosphonium salts, triphenylethylphosphonium salts, tetrabutylphosphonium salts, etc. (the relative ion of the quaternary salts is halogen , Organic acid ion, hydroxide ion, and the like are not particularly specified, but organic acid ion, hydroxide ion are preferred.), Metal compounds such as stannous octoate, and the like. When a hardening accelerator is used, 0.01 to 5.0 parts by weight is used as necessary with respect to 100 parts by weight of the epoxy resin.

於本發明中,特佳為三級胺、膦類、四級鏻鹽。 In the present invention, tertiary amines, phosphines and quaternary phosphonium salts are particularly preferred.

再者,使用三級胺類等之胺系化合物作為聚合觸媒時,於無硬化劑,或硬化劑量以較既定量少之量使其硬化亦可,藉由陰離子聚合而使其硬化亦可。 Furthermore, when using an amine compound such as a tertiary amine as a polymerization catalyst, it is also possible to harden it without a hardener or a hardening amount in an amount smaller than a predetermined amount, or to harden it by anionic polymerization. .

於環氧樹脂組成物中,除了於本發明之樹脂改質填料所使用之環氧樹脂外,亦可併用其他環氧樹脂。於併用時,於本發明之樹脂改質填料所使用之環氧樹脂佔全體環氧樹脂中之比例較佳為15重量%以上,特佳為20重量%以上。 In the epoxy resin composition, in addition to the epoxy resin used in the resin-modified filler of the present invention, other epoxy resins may be used in combination. When used in combination, the proportion of the epoxy resin used in the resin-modified filler of the present invention to the total epoxy resin is preferably 15% by weight or more, and particularly preferably 20% by weight or more.

作為其他之環氧樹脂的具體例,可舉出:酚醛清漆型環氧樹脂、雙酚A型環氧樹脂、聯苯型環氧樹脂、三苯甲烷型環氧樹脂、苯酚芳烷基型環氧樹脂等。具體而言,可舉出:雙酚A、雙酚S、硫代聯苯酚、茀雙酚、萜二酚、4,4’-聯苯酚、2,2’-聯苯酚、3,3’,5,5’-四甲基-[1,1’-聯苯]-4,4’-二醇、對苯二酚、間苯二酚、萘二酚、三-(4-羥基苯基)甲烷、1,1,2,2-四(4-羥基苯基)乙烷、酚類(苯酚、烷基取代苯酚、 萘酚、烷基取代萘酚、二羥基苯、二羥基萘等)與甲醛、乙醛、苯甲醛、對羥基苯甲醛、鄰羥基苯甲醛、對羥基苯乙酮、鄰羥基苯乙酮、二環戊二烯、糠醛、4,4'-雙(氯甲基)-1,1’-聯苯、4,4'-雙(甲氧基甲基)-1,1’-聯苯、1,4-雙(氯甲基)苯、1,4-雙(甲氧基甲基)苯等之聚縮合物及該等之改質物,由四溴雙酚A等鹵化雙酚類、醇類衍生之環氧丙基醚化物、脂環式環氧樹脂、環氧丙基胺系環氧樹脂、環氧丙基酯系環氧樹脂等矽倍半氧烷系之環氧樹脂(鏈狀、環狀、梯狀,或於該等至少兩種以上之混合結構之矽氧烷構造中具有環氧丙基,及/或環氧環己烷結構之環氧樹脂)等環氧樹脂,但並不限定於該等。 Specific examples of other epoxy resins include novolac epoxy resin, bisphenol A epoxy resin, biphenyl epoxy resin, triphenylmethane epoxy resin, and phenol aralkyl ring. Oxygen resin and so on. Specific examples include: bisphenol A, bisphenol S, thiobiphenol, pyrene bisphenol, terpene diphenol, 4,4'-biphenol, 2,2'-biphenol, 3,3 ', 5,5'-tetramethyl- [1,1'-biphenyl] -4,4'-diol, hydroquinone, resorcinol, naphthalenediol, tris- (4-hydroxyphenyl) Methane, 1,1,2,2-tetrakis (4-hydroxyphenyl) ethane, phenols (phenol, alkyl-substituted phenol, Naphthol, alkyl-substituted naphthol, dihydroxybenzene, dihydroxynaphthalene, etc.) and formaldehyde, acetaldehyde, benzaldehyde, p-hydroxybenzaldehyde, o-hydroxybenzaldehyde, p-hydroxyacetophenone, o-hydroxyacetophenone, two Cyclopentadiene, furfural, 4,4'-bis (chloromethyl) -1,1'-biphenyl, 4,4'-bis (methoxymethyl) -1,1'-biphenyl, 1 Polycondensates of 1,4-bis (chloromethyl) benzene, 1,4-bis (methoxymethyl) benzene, etc. and their modifications, halogenated bisphenols and alcohols such as tetrabromobisphenol A Derived silsesquioxane-based epoxy resins (chain-like, epoxy-based epoxy resins, epoxy-propylamine-based epoxy resins, epoxy-propyl ester-based epoxy resins, etc.) Epoxy resins such as cyclic, ladder-shaped, or epoxy resins with epoxy group structure in these siloxane structures with at least two or more mixed structures, but not Not limited to these.

本發明之環氧樹脂組成物亦可含有含磷化合物作為難燃性賦予成分。作為含磷化合物可為反應型者,亦可為添加型者。作為含磷化合物之具體例,可舉出:磷酸三甲酯、磷酸三乙酯、磷酸三甲酚酯、磷酸三(二甲苯)酯、磷酸甲酚二苯酯、2,6-二(二甲苯)磷酸甲酚酯、1,3-伸苯基雙(二(二甲苯)磷酸酯)、1,4-伸苯基雙(二(二甲苯)磷酸酯)、4,4’-聯苯(二(二甲苯)磷酸酯)等磷酸酯類;9,10-二氫-9-氮雜-10-磷雜菲-10-氧化物、10(2,5-二羥基苯基)-10H-9-氮雜-10-磷雜菲-10-氧化物等膦類;將環氧樹脂與上述膦類之活性氫進行反應而獲得之含磷環氧化物、紅磷等,較佳為磷酸酯類、膦類或含有磷環氧化合物,特佳為1,3-伸苯基雙(二(二甲苯)磷酸酯)、1,4-伸苯基雙(二(二甲苯)磷酸酯)、4,4’-聯苯(二(二甲苯)磷酸酯)或含有磷環氧化物。含磷化合物之含量較佳為含磷化合物/全體環氧樹脂=0.1~0.6(重量比)。於0.1以下係難燃性不充分,且於0.6以上係有對硬化物之吸濕性、介電特性有不良影響之虞。 The epoxy resin composition of the present invention may contain a phosphorus-containing compound as a flame retardancy-imparting component. The phosphorus-containing compound may be a reactive type or an additive type. Specific examples of the phosphorus-containing compound include trimethyl phosphate, triethyl phosphate, tricresol phosphate, tris (xylyl) phosphate, cresyl diphenyl phosphate, and 2,6-dimethyl (xylene). ) Cresol phosphate, 1,3-phenylene bis (xylene) phosphate), 1,4-phenylene bis (xylene) phosphate), 4,4'-biphenyl ( Bis (xylene) phosphate ester) and other phosphate esters; 9,10-dihydro-9-aza-10-phosphaphenanthrene-10-oxide, 10 (2,5-dihydroxyphenyl) -10H- Phosphines such as 9-aza-10-phosphaphenanthrene-10-oxide; phosphorus-containing epoxides, red phosphorus, etc. obtained by reacting epoxy resin with active hydrogen of the above-mentioned phosphines, preferably phosphate esters Type, phosphine type or phosphorus-containing epoxy compound, particularly preferred are 1,3-phenylene bis (dimethyl (xylene) phosphate), 1,4-phenylene bis (dimethyl (xylene) phosphate), 4,4'-biphenyl (di (xylene) phosphate) or contains a phosphorus epoxide. The content of the phosphorus-containing compound is preferably phosphorus-containing compound / total epoxy resin = 0.1 to 0.6 (weight ratio). Below 0.1, the flame retardancy is insufficient, and above 0.6, there is a possibility that the moisture absorption and dielectric properties of the cured product may be adversely affected.

進而,於本發明之環氧樹脂組成物,亦可視需要添加抗氧化劑。作為可使用之抗氧化劑,可舉出:酚系、硫系、磷系抗氧化劑。抗氧化劑可單獨或組合2種以上使用。抗氧化劑之使用量,相對於本發明之環氧樹脂組成物中之樹脂成分100重量份,通常為0.008~1重量份,較佳為0.01~0.5重量份。 Furthermore, if necessary, an antioxidant may be added to the epoxy resin composition of the present invention. Examples of usable antioxidants include phenol-based, sulfur-based, and phosphorus-based antioxidants. The antioxidant can be used alone or in combination of two or more. The usage-amount of an antioxidant is 0.008-1 weight part normally with respect to 100 weight part of resin components in the epoxy resin composition of this invention, Preferably it is 0.01-0.5 weight part.

作為抗氧化劑,可舉出例如:酚系抗氧化劑、硫系抗氧化劑、磷系抗氧化劑等。作為酚系抗氧化劑之具體例,例示有:2,6-二-三級丁基-對甲酚、丁基化羥基苯甲醚、2,6-二-三級丁基-對乙基苯酚、β-(3,5-二-三級丁基-4-羥基苯基)丙酸硬脂酯、3-(3,5-二-三級丁基-4-羥基苯基)丙酸異辛酯、2,4-雙-(正辛硫基)-6-(4-羥基-3,5-三級丁基苯胺基)-1,3,5-三、2,4-雙[(辛硫基)甲基]-鄰甲酚等一元酚類;2,2’-亞甲基雙(4-甲基-6-三級丁基苯酚)、2,2’-亞甲基雙(4-乙基-6-三級丁基苯酚)、4,4’-硫代雙(3-甲基-6-三級丁基苯酚)、4,4’-亞丁基雙(3-甲基-6-三級丁基苯酚)、三乙二醇-雙[3-(3-三級丁基-5-甲基-4-羥基苯基)丙酸酯]、1,6-己二醇-雙[3-(3,5-二-三級丁基-4-羥基苯基)丙酸酯]、N,N’-六亞甲基雙(3,5-二-三級丁基-4-羥基-苯丙醯)、2,2-硫基-二伸乙基雙[3-(3,5-二-三級丁基-4-羥基苯基)丙酸酯]、3,5-二-三級丁基-4-羥基苄基膦酸-二乙酯、3,9-雙[1,1-二甲基-2-{β-(3-三級丁基-4-羥基-5-甲基苯基)丙醯氧基}乙基]2,4,8,10-四氧雜螺[5,5]十一烷、雙(3,5-二-三級丁基-4-羥基苄基磺酸乙酯)鈣等雙酚類;1,1,3-三(2-甲基-4-羥基-5-三級丁基苯基)丁烷、1,3,5-三甲基-2,4,6-三(3,5-二-三級丁基-4-羥基苄基)苯、四-[亞甲基-3- (3’,5’-二-三級丁基-4’-羥基苯基)丙酸酯]甲烷、雙[3,3’-雙-(4’-羥基-3’-三級丁基苯基)丁酸]二醇酯、三-(3,5-二-三級丁基-4-羥基苄基)異三聚氰酸酯、1,3,5-三(3’,5’-二-三級丁基-4’-羥基苄基)-S-三-2,4,6-(1H,3H,5H)三酮、生育酚(tocopherol)等高分子型酚類。 Examples of the antioxidant include a phenol-based antioxidant, a sulfur-based antioxidant, and a phosphorus-based antioxidant. Specific examples of the phenol-based antioxidant include 2,6-di-tertiary-butyl-p-cresol, butylated hydroxyanisole, and 2,6-di-tertiary-butyl-p-ethylphenol Β- (3,5-di-tertiary-butyl-4-hydroxyphenyl) propanoic acid stearyl, 3- (3,5-di-tertiary-butyl-4-hydroxyphenyl) propionic acid Octyl ester, 2,4-bis- (n-octylthio) -6- (4-hydroxy-3,5-tert-butylaniline) -1,3,5-tri , 2,4-bis [(octylthio) methyl] -o-cresol and other monophenols; 2,2'-methylenebis (4-methyl-6-tert-butylphenol), 2, 2'-methylenebis (4-ethyl-6-tert-butylphenol), 4,4'-thiobis (3-methyl-6-tert-butylphenol), 4,4'- Butylene bis (3-methyl-6-tertiary butylphenol), triethylene glycol-bis [3- (3-tertiary butyl-5-methyl-4-hydroxyphenyl) propionate] , 1,6-hexanediol-bis [3- (3,5-di-tert-butyl-4-hydroxyphenyl) propionate], N, N'-hexamethylenebis (3,5 -Di-tertiary-butyl-4-hydroxy-phenylpropanthine), 2,2-thio-diphenylethylbis [3- (3,5-di-tertiary-butyl-4-hydroxyphenyl) Propionate], 3,5-di-tert-butyl-4-hydroxybenzylphosphonic acid-diethyl ester, 3,9-bis [1,1-dimethyl-2- {β- (3- Tertiary butyl-4-hydroxy-5-methylphenyl) propanyloxy} ethyl] 2,4,8,10-tetraoxaspiro [5,5] undecane, bis (3,5 -Bisphenols such as di-tertiary butyl-4-hydroxybenzylsulfonate) calcium; 1,1,3-tris (2-methyl-4-hydroxy-5-tertiary butylphenyl) Butane, 1,3,5-trimethyl-2,4,6-tris (3,5-di-tertiarybutyl-4-hydroxybenzyl) benzene, tetra- [methylene-3- ( 3 ', 5'-di-tertiary-butyl-4'-hydroxyphenyl) propionate] methane, bis [ 3,3'-bis- (4'-hydroxy-3'-tert-butylphenyl) butanoic acid] glycol ester, tri- (3,5-di-tert-butyl-4-hydroxybenzyl) Isocyanurate, 1,3,5-tris (3 ', 5'-di-tertiarybutyl-4'-hydroxybenzyl) -S-tri -2,4,6- (1H, 3H, 5H) triketone, tocopherol and other polymer phenols.

作為硫系抗氧化劑之具體例,例示有:3,3’-硫代二丙酸二月桂酯、3,3’-硫代二丙酸二肉豆蔻酯、3,3’-硫代二丙酸二硬脂酯等。 Specific examples of the sulfur-based antioxidant include: 3,3'-dithiothiopropionate dilauryl, 3,3'-thiodipropionate dimyristyl, and 3,3'-thiodipropionate Distearyl acid and the like.

作為磷系抗氧化劑之具體例,例示有:亞磷酸三苯酯、亞磷酸二苯基異癸酯、亞磷酸苯基二異癸酯、亞磷酸三(壬基苯基)酯、二異癸基新戊四醇亞磷酸酯、亞磷酸三(2,4-二-三級丁基苯基)酯、亞磷酸環新戊四烷雙(十八烷基)酯、亞磷酸環新戊四烷雙(2,4-二-三級丁基苯基)酯、亞磷酸環新戊四烷雙(2,4-二-三級丁基-4-甲基苯基)酯、氫亞磷酸雙[2-三級丁基-6-甲基-4-{2-(十八烷氧基羰基)乙基}苯基]酯等亞磷酸類;9,10-二氫-9-氧雜-10-磷雜菲-10-氧化物、10-(3,5-二-三級丁基-4-羥基苄基)-9,10-二氫-9-氧雜-10-磷雜菲-10-氧化物、10-癸氧基-9,10-二氫-9-氧雜-10-磷雜菲-10-氧化物等氧雜磷雜菲氧化物類等。 Specific examples of the phosphorus-based antioxidant include triphenyl phosphite, diphenyl isodecyl phosphite, phenyl diisodecyl phosphite, tri (nonylphenyl) phosphite, and diisodecyl N-Pentaerythritol Phosphite, Tris (2,4-di-tert-butylphenyl) Phosphite, Cycopeneopentane Di (octadecyl) Phosphite Alkyl bis (2,4-di-tertiary butylphenyl) ester, cyclonepentapentane bis (2,4-di-tertiary butyl-4-methylphenyl) ester, hydrogen phosphite Phosphites such as bis [2-tert-butyl-6-methyl-4- {2- (octadecyloxycarbonyl) ethyl} phenyl] ester; 9,10-dihydro-9-oxa -10-Phenanthrene-10-oxide, 10- (3,5-di-tert-butyl-4-hydroxybenzyl) -9,10-dihydro-9-oxa-10-phenanthroline Oxaphosphaphenanthrene oxides such as -10-oxide, 10-decyloxy-9, 10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide, etc.

該等之抗氧化劑可分別單獨使用,亦可組合2種以上併用。尤其是於本發明中較佳為磷系抗氧化劑。 These antioxidants can be used individually or in combination of 2 or more types. Particularly, a phosphorus-based antioxidant is preferred in the present invention.

進而,於本發明之環氧樹脂組成物,亦可視需要添加光穩定劑。 Furthermore, a light stabilizer may be added to the epoxy resin composition of the present invention as necessary.

作為光穩定劑較佳為受阻胺系之光穩定劑,尤其是HALS等。作為HALS並無特別限定,作為代表者,可舉出:二丁基胺、1,3,5-三、N,N’-雙 (2,2,6,6-四甲基-4-哌啶基-1,6-六亞甲基二胺與N-(2,2,6,6-四甲基-4-哌啶基)丁基胺之聚縮合物、琥珀酸二甲基-1-(2-羥基乙基)-4-羥基-2,2,6,6-四甲基哌啶聚縮合物、聚[{6-(1,1,3,3-四甲基丁基}胺基-1,3,5-三-2,4-二基}{(2,2,6,6-四甲基-4-哌啶基)亞胺基}六亞甲基{(2,2,6,6-四甲基-4-哌啶基)亞胺基}]、雙(1,2,2,6,6-五甲基-4-哌啶基)[[3,5-雙(1,1-二甲基乙基)-4-羥基苯基]甲基]丁基丙二酸、雙(2,2,6,6-四甲基-4-哌啶基)癸二酸酯、雙(1,2,2,6,6-五甲基-4-哌啶基)癸二酸酯、雙(1-辛氧基-2,2,6,6-四甲基-4-哌啶基)癸二酸酯、2-(3,5-二-三級丁基-4-羥基苄基)-2-正丁基丙二酸雙(1,2,2,6,6-五甲基-4-哌啶基)酯等。HALS可僅使用1種,亦可併用2種類以上。 As the light stabilizer, a hindered amine-based light stabilizer is preferred, especially HALS and the like. The HALS is not particularly limited, and examples thereof include dibutylamine, 1,3,5-tris , N, N'-bis (2,2,6,6-tetramethyl-4-piperidinyl-1,6-hexamethylenediamine and N- (2,2,6,6-tetramethyl Poly-4-piperidinyl) butylamine polycondensate, dimethyl-1- (2-hydroxyethyl) -4-hydroxy-2,2,6,6-tetramethylpiperidine polysuccinate Condensate, poly [{6- (1,1,3,3-tetramethylbutyl) amino-1,3,5-tri -2,4-diyl} {(2,2,6,6-tetramethyl-4-piperidinyl) imino} hexamethylene {(2,2,6,6-tetramethyl- 4-piperidinyl) imino}], bis (1,2,2,6,6-pentamethyl-4-piperidinyl) [[3,5-bis (1,1-dimethylethyl ) -4-hydroxyphenyl] methyl] butylmalonate, bis (2,2,6,6-tetramethyl-4-piperidinyl) sebacate, bis (1,2,2 , 6,6-pentamethyl-4-piperidinyl) sebacate, bis (1-octyloxy-2,2,6,6-tetramethyl-4-piperidinyl) sebacate , 2- (3,5-di-tertiarybutyl-4-hydroxybenzyl) -2-n-butylmalonate bis (1,2,2,6,6-pentamethyl-4-piperidine ) Esters and the like. HALS can be used alone or in combination of two or more.

進而,於本發明之環氧樹脂組成物,亦可視需要摻合黏合劑樹脂。作為黏合劑樹脂可舉出:丁醛系樹脂、縮醛系樹脂、丙烯酸系樹脂、環氧-尼龍系樹脂、NBR-酚系樹脂、環氧-NBR系樹脂、聚醯胺系樹脂、聚亞醯胺系樹脂、聚矽氧系樹脂等,但並不限定於該等。黏合劑樹脂之摻合量較佳為在不損及硬化物之難燃性、耐熱性之範圍,相對於樹脂成分100重量份視需要使用通常為0.05~50重量份,較佳為0.05~20重量份。 Further, an adhesive resin may be blended into the epoxy resin composition of the present invention as necessary. Examples of the binder resin include a butyral resin, an acetal resin, an acrylic resin, an epoxy-nylon resin, an NBR-phenol resin, an epoxy-NBR resin, a polyamide resin, and a polyurethane. Amidamine-based resin, silicone resin, and the like are not limited to these. The blending amount of the binder resin is preferably in a range that does not impair the flame retardancy and heat resistance of the hardened material. It is generally used in an amount of 0.05 to 50 parts by weight, preferably 0.05 to 20, based on 100 parts by weight of the resin component as needed. Parts by weight.

於本發明之環氧樹脂組成物,進而可添加矽烷偶合劑、硬脂酸、棕梠酸、硬脂酸鋅、硬脂酸鈣等之脫模劑、界面活性劑、染料、顏料、紫外線吸收劑等各種摻合劑、各種熱硬化性樹脂。 In the epoxy resin composition of the present invention, release agents such as silane coupling agents, stearic acid, palmitic acid, zinc stearate, calcium stearate, surfactants, dyes, pigments, and ultraviolet absorbers can be further added. Various admixtures and various thermosetting resins.

本發明之環氧樹脂組成物,藉由將各成分均勻地混合而獲得。本發明之環氧樹脂組成物以與先前習知之方法同樣地可容易地成為其硬化物。例如本發明之樹脂改質填料與硬化劑及所需之硬化促進劑、含磷 化合物、黏合劑樹脂、無機填充材料及摻合劑,視需要使用擠壓機、捏合機、輥等充分地混合至均勻而獲得環氧樹脂組成物,將其環氧樹脂組成物使用封裝、熔融後(液狀的情形時無熔融)鑄型或轉移成型機等進行成型,進而利用於80~200℃加熱2~10小時而可獲得本發明之硬化物。 The epoxy resin composition of the present invention is obtained by uniformly mixing the components. The epoxy resin composition of this invention can be easily made into a hardened | cured material similarly to the conventionally well-known method. For example, the resin modified filler and hardener of the present invention and the required hardening accelerator, containing phosphorus Compounds, adhesive resins, inorganic fillers, and admixtures can be thoroughly mixed with an extruder, kneader, roller, etc. as needed to obtain an epoxy resin composition. The epoxy resin composition is encapsulated and melted. (In the case of a liquid state, there is no melting) A mold, a transfer molding machine, or the like is used for molding, and further, the hardened product of the present invention can be obtained by heating at 80 to 200 ° C for 2 to 10 hours.

由本發明之環氧樹脂組成物硬化而成之硬化物可使用於各種用途。適當地作為半導體密封材料使用,可舉出例如接著劑、塗料、塗布劑、成形材料(包含片、薄膜、FRP等)、絕緣材料(包含印刷基板、電線被覆等)、密封劑之外、對於其他樹脂等之添加劑。作為接著劑,可舉出土木用、建築用、汽車用、一般事務用、醫療用接著劑、此外之電子材料用接著劑。該等之中作為電子材料用接著劑,可舉出增層基板等之多層基板之層間接著劑、黏晶劑、底膠等半導體用接著劑、BGA補強用底膠、異向性導電膜(ACF)、異向性導電性膏(ACP)等安裝用接著劑等。 The hardened | cured material hardened from the epoxy resin composition of this invention can be used for various uses. Suitable use as a semiconductor sealing material includes, for example, adhesives, coatings, coating agents, molding materials (including sheets, films, FRP, etc.), insulating materials (including printed circuit boards, wire coatings, etc.), other than sealants, and Additives for other resins. Examples of the adhesive include civil, construction, automotive, general office, medical adhesives, and other electronic material adhesives. Among these, as adhesives for electronic materials, indirect adhesives for multi-layer substrates such as build-up substrates, die attach agents, primers for semiconductors such as primers, primers for BGA reinforcement, and anisotropic conductive films ( ACF), anisotropic conductive paste (ACP), and other mounting adhesives.

作為密封劑,適當於電容器、電晶體、二極體、發光二極體、IC、LSI等用之封裝、浸漬、轉移成型密封、IC、LSI類之COB、COF、TAB等用等之封裝密封、倒裝晶片等用之底膠、QFP、BGA、CSP等之IC封裝類安裝時之密封(包含補強用底膠)。 As a sealant, it is suitable for packaging, dipping, transfer molding, sealing of capacitors, transistors, diodes, light-emitting diodes, ICs, LSIs, etc., ICs, LSIs such as COB, COF, TAB, etc Seals for mounting of IC packages such as flip chip, QFP, BGA, CSP, etc. (including primers for reinforcement).

實施例 Examples

接著,藉由實施例進一步更具體地說明本發明,以下份若無特別說明則為重量份。再者,本發明並不限定於該等。 Next, the present invention will be described more specifically by way of examples. The following parts are parts by weight unless otherwise specified. The present invention is not limited to these.

以下對於實施例所使用之各種分析方法進行記載。 Various analysis methods used in the examples are described below.

環氧當量:依據JIS K 7236(ISO 3001) Epoxy equivalent: according to JIS K 7236 (ISO 3001)

ICI熔融黏度:依據JIS K 7117-2(ISO 3219) ICI melt viscosity: according to JIS K 7117-2 (ISO 3219)

軟化點:依據JIS K 7234 Softening point: According to JIS K 7234

以下,藉由實施例、比較例具體地說明本發明。 Hereinafter, the present invention will be specifically described with reference to examples and comparative examples.

實施例1~7、比較例1~4 Examples 1 to 7, Comparative Examples 1 to 4

使用甲基乙基酮(MEK)作為溶劑,軟化點52℃之鄰甲酚酚醛型之環氧樹脂(EP1:日本化藥製EOCN-1020-52)、軟化點55℃之鄰甲酚酚醛型之環氧樹脂(EP2:日本化藥製EOCN-1020-55)、軟化點52℃之聯苯酚醛型環氧樹脂(EP3:日本化藥製NC-3000-L)、軟化點45℃之三苯基甲烷型環氧樹脂(EP4:將三苯基甲烷(本州化學工業製Tris P-M)進行環氧丙基醚化者)、軟化點40℃之雙酚茀氧化乙烯加成物之環氧化物(EP5:大阪瓦斯化學製)作為環氧樹脂,熔融矽氧(瀧森製MSR-2122)作為無機填料,以下述表1之組成進行以下之操作。 Using methyl ethyl ketone (MEK) as a solvent, an ortho-cresol novolac type epoxy resin with a softening point of 52 ° C (EP1: EOCN-1020-52 manufactured by Nippon Kayaku Co., Ltd.), and an o-cresol novolac type with a softening point of 55 ° C Epoxy resin (EP2: EOCN-1020-55, manufactured by Nippon Kayaku), biphenol aldehyde epoxy resin (EP3: NC-3000-L, manufactured by Nippon Kayaku), and softening point 45 ° C Phenylmethane type epoxy resin (EP4: triphenylmethane (Tris PM manufactured by Honshu Chemical Industry Co., Ltd.) is epoxypropyl etherified), epoxide of bisphenol-ethylene oxide adduct of softening point of 40 ° C (EP5: manufactured by Osaka Gas Chemical Co., Ltd.) As an epoxy resin, molten silica (MSR-2122 manufactured by Hori Mori) as an inorganic filler, the following operations were performed with the composition of Table 1 below.

於具備攪拌機、回流冷卻管、攪拌裝置之燒瓶,一面施加氮氣沖洗一面投入甲基乙基酮(MEK)作為溶劑、投入表1所記載之各種環氧樹脂、無機填料後,於25℃進行攪拌1小時。其後,以旋轉蒸發器蒸餾去除溶劑,最後於120℃20torr之減壓下蒸餾去除至溶劑全部散出。 In a flask equipped with a stirrer, a reflux cooling tube, and a stirring device, methyl ethyl ketone (MEK) was added as a solvent while various kinds of epoxy resins and inorganic fillers described in Table 1 were charged while flushing with nitrogen, and then stirred at 25 ° C. 1 hour. Thereafter, the solvent was distilled off on a rotary evaporator, and finally, the solvent was distilled off under a reduced pressure of 120 torr at 20 torr until the solvent was completely dispersed.

取出所獲得之樹脂改質填料,將試樣於鉑濺鍍後進行樹脂包埋,以CP3.5kV製作剖面試樣後,利用SEM(無蒸鍍低真空加速電壓10kV)觀察試樣,其結果任一者之粒度為5.0cm以下之粒徑,且確認樹脂與填料聚集之形狀。又,於25℃下1週進行結塊測試。結果表示於表1。 The obtained modified resin filler was taken out, and the sample was embedded with platinum after sputtering. After making a cross section sample at CP 3.5 kV, the sample was observed by SEM (non-evaporation low vacuum acceleration voltage 10 kV). The particle size of any of the particles was 5.0 cm or less, and the shape in which the resin and the filler were aggregated was confirmed. The agglomeration test was performed at 25 ° C for one week. The results are shown in Table 1.

如表1所記載,本發明之樹脂改質填料,於剛製造後及安定性測試後兩者中,維持粉狀或粒狀之形狀而結塊測試的結果亦良好。另一方面,比較例之環氧樹脂與無機填料之混合物,於剛製造後或安定性測試後產生結塊者,或者僅獲得成為板狀型態而處理性不良者。 As shown in Table 1, the resin-modified filler of the present invention maintained a powdery or granular shape and the results of the agglomeration test were good both immediately after manufacturing and after the stability test. On the other hand, the mixture of the epoxy resin and the inorganic filler of the comparative example had agglomerates immediately after manufacture or stability tests, or only those with a plate-like shape and poor handling properties were obtained.

實施例8、9 Examples 8, 9

使用丙酮與甲基異丁基酮(1:1)溶液作為溶劑,軟化點58℃之聯苯酚醛型環氧樹脂(EP6:日本化藥製NC-3000)作為環氧樹脂,球狀矽氧(Admatechs 1030 DMATECHS股份有限公司製平均粒徑0.3μm)作為無機填料,以溶液150、環氧樹脂10、球狀矽氧90之組成(實施例8),及溶液150、環氧樹脂20、球狀矽氧80之組成(實施例9)進行以下操作。 A solution of acetone and methyl isobutyl ketone (1: 1) as a solvent, a biphenol-formaldehyde epoxy resin (EP6: Nippon Kayaku NC-3000) with a softening point of 58 ° C as the epoxy resin, and spherical silica (Admatechs 1030 DMATECHS Co., Ltd. average particle diameter 0.3 μm) As the inorganic filler, it is composed of solution 150, epoxy resin 10, and spherical silica 90 (Example 8), and solution 150, epoxy resin 20, and balls The composition of the silicic acid 80 (Example 9) was performed as follows.

於具備攪拌機、回流冷卻管、攪拌裝置之燒瓶,投入各種上述之組成後,於25℃進行攪拌30分鐘。其後,以旋轉蒸發器蒸餾去除溶劑,最後於120℃ 20torr之減壓下蒸餾去除至溶劑全部散出。 A flask equipped with a stirrer, a reflux cooling tube, and a stirring device was charged with various components described above, and then stirred at 25 ° C for 30 minutes. Thereafter, the solvent was distilled off by a rotary evaporator, and finally, the solvent was distilled off under a reduced pressure of 120 to 20 torr until the solvent was completely dispersed.

取出所獲得之樹脂改質填料,將試樣於鉑濺鍍後進行樹脂包埋,以CP3.5kV製作剖面試樣後,利用SEM(無蒸鍍低真空加速電壓10kV)觀察試樣,其結果任一者之粒度為1mm以下之粒徑,且確認樹脂與填料聚集之形狀。由圖4~9可知樹脂與填料混合在一起,最表面以填料覆蓋的樣子。又,於25℃下1週進行結塊測試,未發現任何結塊(樹脂間彼此多數、相互交疊之狀態)。 The obtained modified resin filler was taken out, and the sample was embedded with platinum after sputtering. After making a cross section sample at CP 3.5 kV, the sample was observed by SEM (non-evaporation low vacuum acceleration voltage 10 kV). The particle size of any of the particles was 1 mm or less, and the shape in which the resin and the filler were aggregated was confirmed. It can be seen from Figs. 4 to 9 that the resin is mixed with the filler, and the outermost surface is covered with the filler. The agglomeration test was performed at 25 ° C for one week, and no agglomeration was found (a state in which the resins are in a large number and overlap each other).

本發明參照特定態樣詳細地進行說明,但該業者應知曉可在不脫離本發明之精神與範圍之情形下進行各種變更及修正。 The present invention is described in detail with reference to specific aspects, but those skilled in the art should know that various changes and modifications can be made without departing from the spirit and scope of the present invention.

再者,本申請案係基於2014年2月19日提出申請之日本專利申請案(日本 特願2014-029097),其整理藉由引用而援用。又,引用於此處之全部參照係作為整體併入本文。 Furthermore, this application is based on a Japanese patent application filed on February 19, 2014 (Japan (Japanese Patent Application No. 2014-029097), whose arrangement is incorporated by reference. In addition, all the references referred to herein are hereby incorporated as a whole.

[產業上之可利用性] [Industrial availability]

本發明之樹脂改質填料係賦予環氧樹脂組成物之流動性的填料,含有該填料之硬化性的環氧樹脂組成物係對於電氣電子零件用絕緣材料及積層板(印刷配線板、增層基板等)或CFRP為代表之各種複合材料、接著劑、塗料等有用。尤其是對於保護半導體元件之半導體密封材料極為有用。 The resin-modified filler of the present invention is a filler that imparts fluidity to an epoxy resin composition. The hardening epoxy resin composition containing the filler is suitable for insulating materials for electrical and electronic parts and laminated boards (printed wiring boards, buildups). Substrates, etc.) or CFRP is useful for a variety of composite materials, adhesives, coatings and the like. It is particularly useful for semiconductor sealing materials for protecting semiconductor elements.

Claims (5)

一種樹脂改質填料之製造方法,該樹脂改質填料含有無機填料(a)、與於一分子內具有平均2~10個環氧基之環氧樹脂(b),長軸為5cm以下,且將(a)與(b)之重量比設為(a):(b)=70:30~98:2,並於將(a)及(b)與溶劑共同捏合後,蒸餾去除溶劑。A method for manufacturing a resin-modified filler, the resin-modified filler contains an inorganic filler (a), and an epoxy resin (b) having an average of 2 to 10 epoxy groups in one molecule, and the long axis is 5 cm or less, and The weight ratio of (a) and (b) was set to (a) :( b) = 70: 30 ~ 98: 2, and after kneading (a) and (b) with the solvent, the solvent was distilled off. 如申請專利範圍第1項之樹脂改質填料之製造方法,其中,環氧樹脂(b)之軟化點為35~75℃。For example, the method for manufacturing a modified resin filler according to item 1 of the application, wherein the softening point of the epoxy resin (b) is 35 to 75 ° C. 如申請專利範圍第1或2項之樹脂改質填料之製造方法,其中,無機填料(a)之平均粒徑為0.1~5μm。For example, the method for manufacturing a resin-modified filler according to item 1 or 2 of the patent application range, wherein the average particle diameter of the inorganic filler (a) is 0.1 to 5 μm. 如申請專利範圍第1或2項之樹脂改質填料之製造方法,其中,上述溶劑為酮類。For example, the method for manufacturing a modified resin filler according to item 1 or 2 of the patent application range, wherein the solvent is a ketone. 如申請專利範圍第3項之樹脂改質填料之製造方法,其中,上述溶劑為酮類。For example, the method for manufacturing a modified resin filler according to item 3 of the patent application, wherein the solvent is a ketone.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09216939A (en) * 1996-02-09 1997-08-19 Shin Etsu Chem Co Ltd Epoxy resin composition and semiconductor device
TW200732413A (en) * 2006-02-28 2007-09-01 Dainippon Ink & Chemicals Epoxy resin composition, cured article, novel epoxy resin, novel phenol resin and semiconductor encapsulating material
TW200904901A (en) * 2007-05-16 2009-02-01 Dow Corning Toray Co Ltd Curable epoxy resin composition and cured body thereof
JP2009120815A (en) * 2007-09-14 2009-06-04 Nippon Kayaku Co Ltd Epoxy resin composition and semiconductor device
JP2013203928A (en) * 2012-03-29 2013-10-07 Sumitomo Bakelite Co Ltd Epoxy resin composition for sealing, electronic equipment and method for manufacturing electronic equipment

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3176502B2 (en) * 1993-07-30 2001-06-18 日東電工株式会社 Semiconductor device and epoxy resin composition for semiconductor encapsulation used therein
JP5134824B2 (en) * 2007-02-05 2013-01-30 日東電工株式会社 Resin molded product manufacturing method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09216939A (en) * 1996-02-09 1997-08-19 Shin Etsu Chem Co Ltd Epoxy resin composition and semiconductor device
TW200732413A (en) * 2006-02-28 2007-09-01 Dainippon Ink & Chemicals Epoxy resin composition, cured article, novel epoxy resin, novel phenol resin and semiconductor encapsulating material
TW200904901A (en) * 2007-05-16 2009-02-01 Dow Corning Toray Co Ltd Curable epoxy resin composition and cured body thereof
JP2009120815A (en) * 2007-09-14 2009-06-04 Nippon Kayaku Co Ltd Epoxy resin composition and semiconductor device
JP2013203928A (en) * 2012-03-29 2013-10-07 Sumitomo Bakelite Co Ltd Epoxy resin composition for sealing, electronic equipment and method for manufacturing electronic equipment

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