TWI659832B - Complex - Google Patents

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TWI659832B
TWI659832B TW104119468A TW104119468A TWI659832B TW I659832 B TWI659832 B TW I659832B TW 104119468 A TW104119468 A TW 104119468A TW 104119468 A TW104119468 A TW 104119468A TW I659832 B TWI659832 B TW I659832B
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Taiwan
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glass substrate
resin
resin layer
composite
layer
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TW104119468A
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Chinese (zh)
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TW201604005A (en
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角田純一
井手正迪
江畑研一
深澤寧司
小林大介
鈴木祐一
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日商Agc股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • B32B17/10005Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing
    • B32B17/10165Functional features of the laminated safety glass or glazing
    • B32B17/10366Reinforcements of the laminated safety glass or glazing against impact or intrusion
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • B32B17/10005Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing
    • B32B17/1055Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing characterized by the resin layer, i.e. interlayer
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/28Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
    • B32B27/281Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polyimides
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/28Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material
    • C03C17/32Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material with synthetic or natural resins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/54Yield strength; Tensile strength
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Laminated Bodies (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Photovoltaic Devices (AREA)
  • Surface Treatment Of Glass (AREA)

Abstract

本發明之目的在於提供一種於對表面存在微小裂縫之玻璃基板施加拉伸應力時不易產生破裂之複合體。本發明係關於一種複合體,其中樹脂層之樹脂深入至微小裂縫內部之至少一部分,且樹脂距離玻璃基板表面之深入深度df相對於上述微小裂縫之深度d的比、與上述樹脂層之斷裂伸長率TE(%)、及上述樹脂層之降伏應力σS(MPa)的乘積為400MPa‧%以上,並且上述樹脂層之拉伸彈性模數為1.0GPa以上。 An object of the present invention is to provide a composite body that is less prone to cracking when a tensile stress is applied to a glass substrate having a minute crack on the surface. The invention relates to a composite in which the resin of the resin layer penetrates into at least a part of the interior of the micro-cracks, and the ratio of the depth d f of the resin from the surface of the glass substrate to the depth d of the micro-cracks and the fracture of the resin layer The product of the elongation TE (%) and the undulating stress σ S (MPa) of the resin layer is 400 MPa ·% or more, and the tensile elastic modulus of the resin layer is 1.0 GPa or more.

Description

複合體 Complex

本發明係關於一種複合體,尤其是關於一種樹脂深入至玻璃基板表面之微小裂縫內部特定深度之複合體。 The present invention relates to a composite body, in particular to a composite body in which a resin penetrates to a specific depth inside a minute crack on the surface of a glass substrate.

作為圖像顯示面板、太陽電池、薄膜二次電池等電子裝置之基板,提出有具有玻璃片材及與玻璃片材結合之樹脂層之複合片材(例如參照專利文獻1)。於複合片材所含之玻璃片材以特定之曲率半徑彎曲變形而於玻璃片材之與樹脂層結合之主面產生拉伸應力的情形時,該拉伸應力因樹脂層之存在而得以減小。藉此可抑制玻璃片材之破損。 As a substrate of an electronic device such as an image display panel, a solar cell, and a thin film secondary battery, a composite sheet having a glass sheet and a resin layer bonded to the glass sheet has been proposed (for example, refer to Patent Document 1). When the glass sheet contained in the composite sheet is bent and deformed with a specific curvature radius, and the tensile stress is generated on the main surface of the glass sheet combined with the resin layer, the tensile stress is reduced due to the presence of the resin layer. small. This can suppress breakage of the glass sheet.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

專利文獻1:國際公開第2012/166343號 Patent Document 1: International Publication No. 2012/166343

另一方面,通常對玻璃基板實施洗淨處理、研磨處理、切斷處理等各種處理,此時於玻璃基板之表面形成微小裂縫。 On the other hand, various processes, such as a washing process, a grinding process, and a cutting process, are usually performed on a glass substrate, and a micro crack is formed in the surface of a glass substrate at this time.

本發明者等人參照專利文獻1之記載,於經過特定處理而在表面形成有微小裂縫之玻璃基板上形成樹脂層,評估該複合體之特性,結果發現,若對玻璃基板施加拉伸應力,則存在容易破裂之情況。 The present inventors, referring to the description in Patent Document 1, formed a resin layer on a glass substrate having minute cracks formed on the surface after a specific treatment, and evaluated the characteristics of the composite. As a result, they found that if a tensile stress is applied to the glass substrate, There are cases where it is easy to break.

本發明係鑒於上述實際情況,目的在於提供一種於對表面存在 微小裂縫之玻璃基板施加拉伸應力時不易產生破裂之複合體。 In view of the above-mentioned actual situation, the present invention aims to provide an A micro-cracked glass substrate is less likely to break when a tensile stress is applied.

本發明者等人為解決上述課題經過努力研究,結果完成本發明。 The present inventors have made intensive studies to solve the above-mentioned problems, and as a result, have completed the present invention.

即,本發明之第1形態係一種複合體,其係具備表面存在微小裂縫之玻璃基板、與配置於上述玻璃基板上之樹脂層者,且上述樹脂層之樹脂深入至上述微小裂縫內部之至少一部分,上述樹脂距離上述玻璃基板表面之深入深度df相對於上述微小裂縫之深度d的比(df/d)、與上述樹脂層之斷裂伸長率TE(%)、及上述樹脂層之降伏應力σS(MPa)的乘積(比(df/d)×斷裂伸長率TE×降伏應力σS)為400MPa‧%以上,並且上述樹脂層之拉伸彈性模數Eresin為1.0GPa以上。 That is, the first aspect of the present invention is a composite body comprising a glass substrate having microcracks on its surface, and a resin layer disposed on the glass substrate, and the resin of the resin layer penetrates into at least the inside of the microcracks. In part, the ratio of the depth d f of the resin from the surface of the glass substrate to the depth d of the minute cracks (d f / d), the elongation at break TE (%) with the resin layer, and the yield of the resin layer The product of the stress σ S (MPa) (ratio (d f / d) × elongation at break TE × falling stress σ S ) is 400 MPa ·% or more, and the tensile elastic modulus E resin of the resin layer is 1.0 GPa or more.

第1形態中,較佳為玻璃基板之平均厚度為10~200μm。 In the first aspect, the average thickness of the glass substrate is preferably 10 to 200 μm.

第1形態中,較佳為樹脂層之平均厚度為10~100μm。 In the first aspect, the average thickness of the resin layer is preferably 10 to 100 μm.

第1形態中,較佳為樹脂層包含聚醯亞胺。 In the first aspect, the resin layer preferably contains polyimide.

本發明之第2形態係一種電子裝置,其包含作為第1形態之複合體、與形成於上述複合體之玻璃基板上之元件。 A second aspect of the present invention is an electronic device including the composite as the first aspect, and an element formed on a glass substrate of the composite.

根據本發明,可提供一種於對表面存在微小裂縫之玻璃基板施加拉伸應力時不易產生破裂之複合體。 According to the present invention, it is possible to provide a composite body that is less prone to cracking when a tensile stress is applied to a glass substrate having minute cracks on its surface.

2‧‧‧複合體 2‧‧‧ complex

4‧‧‧玻璃基板 4‧‧‧ glass substrate

6‧‧‧樹脂層 6‧‧‧ resin layer

8‧‧‧微小裂縫 8‧‧‧ tiny crack

8a‧‧‧線狀之微小裂縫 8a‧‧‧ linear tiny crack

8b‧‧‧點狀之微小裂縫 8b‧‧‧point tiny cracks

10‧‧‧彎曲試驗裝置 10‧‧‧ Bending test device

14‧‧‧上側支持盤 14‧‧‧Upper support plate

14a‧‧‧上側支持盤之支持面 14a‧‧‧Support surface of upper support plate

16‧‧‧下側支持盤 16‧‧‧ underside support plate

16a‧‧‧下側支持盤之支持面 16a‧‧‧ Support surface of the lower support plate

17‧‧‧止動部 17‧‧‧ Stop

18‧‧‧試驗片材 18‧‧‧test sheet

70‧‧‧有機EL面板(OLED) 70‧‧‧Organic EL Panel (OLED)

71‧‧‧有機EL元件 71‧‧‧Organic EL element

72‧‧‧像素電極 72‧‧‧pixel electrode

74‧‧‧有機層 74‧‧‧ organic layer

76‧‧‧對向電極 76‧‧‧ counter electrode

78‧‧‧密封板 78‧‧‧sealing plate

80‧‧‧液晶面板 80‧‧‧LCD panel

82‧‧‧TFT基板 82‧‧‧TFT substrate

83‧‧‧TFT元件 83‧‧‧TFT element

84‧‧‧CF基板 84‧‧‧CF substrate

85‧‧‧彩色濾光片元件 85‧‧‧color filter element

86‧‧‧液晶層 86‧‧‧LCD layer

90‧‧‧太陽電池 90‧‧‧ solar battery

91‧‧‧太陽電池元件 91‧‧‧solar cell element

92‧‧‧透明電極 92‧‧‧ transparent electrode

94‧‧‧矽層 94‧‧‧ silicon layer

96‧‧‧反射電極 96‧‧‧Reflective electrode

98‧‧‧密封板 98‧‧‧sealing plate

100‧‧‧薄膜二次電池 100‧‧‧ thin film secondary battery

101‧‧‧薄膜二次電池元件 101‧‧‧ thin film secondary battery element

102‧‧‧透明電極 102‧‧‧Transparent electrode

104‧‧‧電解質層 104‧‧‧electrolyte layer

106‧‧‧集電層 106‧‧‧Current collector

108‧‧‧密封層 108‧‧‧Sealing layer

109‧‧‧密封板 109‧‧‧Sealing plate

110‧‧‧電子紙 110‧‧‧electronic paper

111‧‧‧電子紙元件 111‧‧‧Electronic paper components

112‧‧‧TFT層 112‧‧‧TFT layer

114‧‧‧包含電工學介質之層 114‧‧‧ Contains layers of electrical media

116‧‧‧透明電極 116‧‧‧Transparent electrode

118‧‧‧前面板 118‧‧‧Front panel

d‧‧‧微小裂縫之深度 d‧‧‧depth of tiny cracks

df‧‧‧樹脂距離玻璃基板表面之深入深度 d f ‧‧‧ depth of resin from glass substrate surface

D‧‧‧上側支持盤之支持面與下側支持盤之支持面之間之間隔 D‧‧‧ The distance between the support surface of the upper support plate and the support surface of the lower support plate

W‧‧‧微小裂縫之寬度 W‧‧‧Width of micro cracks

圖1係表示本發明之複合體之一實施形態的剖視圖。 FIG. 1 is a cross-sectional view showing one embodiment of the composite of the present invention.

圖2係具有微小裂縫之玻璃基板的俯視圖。 FIG. 2 is a plan view of a glass substrate having minute cracks.

圖3係表示本發明之一實施形態之有機EL面板之構造的剖視圖。 3 is a cross-sectional view showing a structure of an organic EL panel according to an embodiment of the present invention.

圖4係表示本發明之一實施形態之液晶面板之構造的剖視圖。 FIG. 4 is a cross-sectional view showing a structure of a liquid crystal panel according to an embodiment of the present invention.

圖5係表示本發明之一實施形態之太陽電池之構造的剖視圖。 Fig. 5 is a sectional view showing the structure of a solar cell according to an embodiment of the present invention.

圖6係表示本發明之一實施形態之薄膜二次電池之構造的剖視 圖。 Fig. 6 is a sectional view showing the structure of a thin film secondary battery according to an embodiment of the present invention; Illustration.

圖7係表示本發明之一實施形態之電子紙之構造的剖視圖。 Fig. 7 is a sectional view showing the structure of an electronic paper according to an embodiment of the present invention.

圖8係表示檢測本發明之一實施形態之玻璃基板及複合體之平均破壞強度的彎曲試驗裝置之概略圖。 FIG. 8 is a schematic diagram showing a bending test apparatus for detecting the average breaking strength of a glass substrate and a composite according to an embodiment of the present invention.

圖9(A)及圖9(B)係使螢光素吸附於具有微小裂縫之玻璃基板表面後破壞玻璃基板,對該破斷面利用光學顯微鏡進行觀察而得之圖(圖9(A))及利用螢光顯微鏡進行觀察而得的圖(圖9(B))。 FIG. 9 (A) and FIG. 9 (B) are diagrams obtained by causing fluorescein to adsorb on the surface of a glass substrate having micro-cracks and damaging the glass substrate, and observing the broken surface with an optical microscope (FIG. 9 (A) ) And a diagram obtained by observation with a fluorescence microscope (FIG. 9 (B)).

以下參照圖式說明用以實施本發明之形態。各圖式中,對相同或對應之構成標註相同或對應之符號而省略說明。再者,本發明中之圖為模式圖,各層之厚度之關係或位置關係等未必與實物一致。再者,於本說明書中,“重量%”與“質量%”含義相同。 Embodiments for implementing the present invention will be described below with reference to the drawings. In each drawing, the same or corresponding components are denoted by the same or corresponding symbols, and descriptions thereof are omitted. Moreover, the drawing in the present invention is a schematic drawing, and the thickness relationship or positional relationship of each layer may not be consistent with the real thing. In addition, in this specification, "weight%" and "mass%" have the same meaning.

作為本發明之複合體之特徵之一,可列舉:對樹脂層之特性(斷裂伸長率、降伏應力、拉伸彈性模數)加以控制,並且樹脂層中之樹脂深入至玻璃基板之微小裂縫內之特定深度。認為玻璃基板容易破裂之原因在於玻璃表面存在之微小裂縫,推測於對玻璃施加應力時,該微小裂縫大幅延伸而導致破裂。因此,如上所述藉由表現出特定特性之樹脂深入至微小裂縫內部而獲得所期望效果。 As one of the characteristics of the composite of the present invention, the characteristics of the resin layer (elongation at break, yield stress, tensile modulus of elasticity) are controlled, and the resin in the resin layer penetrates into the micro cracks of the glass substrate Specific depth. It is thought that the reason why the glass substrate is easily broken is the existence of minute cracks on the glass surface, and it is presumed that when the stress is applied to the glass, the minute cracks greatly extend and cause cracks. Therefore, as described above, a desired effect can be obtained by penetrating a resin exhibiting specific characteristics into the interior of a minute crack.

圖1係本發明之複合體之一例之模式剖視圖。 FIG. 1 is a schematic sectional view of an example of a composite body of the present invention.

複合體2具有玻璃基板4、與配置於玻璃基板4上之樹脂層6。於玻璃基板4之樹脂層6側之表面存在微小裂縫8,樹脂層6中之樹脂深入至微小裂縫8內部之至少一部分。 The composite 2 includes a glass substrate 4 and a resin layer 6 disposed on the glass substrate 4. There is a micro crack 8 on the surface of the glass substrate 4 on the resin layer 6 side, and the resin in the resin layer 6 penetrates to at least a part of the interior of the micro crack 8.

複合體2可為用作圖像顯示面板、太陽電池、薄膜二次電池等電子裝置之基板者,亦可為供形成各種元件者。複合體2可為捲取於捲芯上者,亦可為用於藉由捲對捲法進行之電子裝置之製造者。 The composite 2 may be used as a substrate for an electronic device such as an image display panel, a solar cell, or a thin film secondary battery, or may be used for forming various elements. The composite body 2 may be a roll wound on a roll core, or may be a manufacturer for an electronic device performed by a roll-to-roll method.

再者,圖1中,僅於玻璃基板4之單側具有樹脂層6,亦可於隔著 玻璃基板4之兩側分別具有樹脂層6。隔著玻璃基板4所配置之2個樹脂層6可具有相同厚度亦可具有不同厚度,可具有相同物性(拉伸彈性模數、熱膨脹係數等)亦可具有不同物性。 Moreover, in FIG. 1, the resin layer 6 is provided only on one side of the glass substrate 4, The glass substrate 4 has resin layers 6 on both sides. The two resin layers 6 disposed across the glass substrate 4 may have the same thickness or different thicknesses, may have the same physical properties (tensile elastic modulus, thermal expansion coefficient, etc.) or may have different physical properties.

首先,以下對構成複合體2之玻璃基板4及樹脂層6進行詳細說明。 First, the glass substrate 4 and the resin layer 6 constituting the composite 2 will be described in detail below.

<玻璃基板> <Glass substrate>

玻璃基板4之玻璃可為多種多樣,例如可列舉鈉鈣玻璃、無鹼玻璃等。 The glass of the glass substrate 4 can be various, and examples thereof include soda-lime glass and alkali-free glass.

玻璃基板4之平均厚度並無特別限制,較佳為200μm以下。若玻璃基板4之平均厚度為200μm以下,則可將玻璃基板4捲繞成螺旋狀而製成玻璃輥。 The average thickness of the glass substrate 4 is not particularly limited, but is preferably 200 μm or less. When the average thickness of the glass substrate 4 is 200 μm or less, the glass substrate 4 can be wound into a spiral shape to form a glass roll.

玻璃基板4之平均厚度較佳為150μm以下,更佳為100μm以下,進而較佳為50μm以下。又,玻璃基板4之平均厚度較佳為0.1μm以上,更佳為1μm以上,進而較佳為5μm以上,尤佳為10μm以上。 The average thickness of the glass substrate 4 is preferably 150 μm or less, more preferably 100 μm or less, and even more preferably 50 μm or less. The average thickness of the glass substrate 4 is preferably 0.1 μm or more, more preferably 1 μm or more, still more preferably 5 μm or more, and even more preferably 10 μm or more.

再者,上述平均厚度係測定任意10點以上之玻璃基板4之厚度,將該等作算術平均而得之值。 The above average thickness is a value obtained by measuring the thickness of the glass substrate 4 at an arbitrary 10 points or more, and averaging these values.

玻璃基板4之寬度方向上之厚度偏差較佳為5μm以下。所謂「厚度偏差」意指與平均厚度之偏差。若玻璃基板4之寬度方向上之厚度偏差為5μm以下,則複合體2於彎曲變形時等於玻璃基板4上產生之應力較均勻,可減小玻璃基板4之破損。再者,玻璃基板4之長度方向上之厚度偏差一般而言小於玻璃基板4之寬度方向上之厚度偏差。玻璃基板4之寬度方向上之厚度偏差更佳為3μm以下,進而較佳為1μm以下,尤佳為0.5μm以下。玻璃基板4之寬度方向上之厚度偏差係利用雷射位移計分別測定玻璃基板4之正反面之凹凸形狀而求出。 The thickness deviation in the width direction of the glass substrate 4 is preferably 5 μm or less. The "thickness deviation" means a deviation from the average thickness. If the thickness deviation in the width direction of the glass substrate 4 is 5 μm or less, the stress on the glass substrate 4 when the composite body 2 is deformed during bending is more uniform, and the damage of the glass substrate 4 can be reduced. Moreover, the thickness deviation in the length direction of the glass substrate 4 is generally smaller than the thickness deviation in the width direction of the glass substrate 4. The thickness deviation in the width direction of the glass substrate 4 is more preferably 3 μm or less, more preferably 1 μm or less, and even more preferably 0.5 μm or less. The thickness deviation in the width direction of the glass substrate 4 is obtained by measuring the uneven shape of the front and back surfaces of the glass substrate 4 with a laser displacement meter, respectively.

玻璃基板4可為帶狀,玻璃基板4之寬度可為100mm以上。於玻璃基板4之寬度為100mm以上之情形時,藉由捲對捲法進行之電子裝 置之製造步驟中,存在對複合體2施加之拉力於寬度方向上變得不均勻之情況,存在拉伸應力集中於玻璃基板4之一部分之情況。於上述情形時,本實施形態之效果(降低玻璃基板4之破損之效果)顯著顯現。 The glass substrate 4 may have a strip shape, and the width of the glass substrate 4 may be 100 mm or more. When the width of the glass substrate 4 is 100 mm or more, the electronic assembly by the roll-to-roll method In the manufacturing steps, the tensile force applied to the composite 2 may become uneven in the width direction, and the tensile stress may be concentrated on a part of the glass substrate 4. In the above case, the effect of this embodiment (the effect of reducing the breakage of the glass substrate 4) is remarkably exhibited.

玻璃基板4之製造方法可為浮式法、熔融法、再曳引法中之任意方法。於浮式法之情形時,使熔融玻璃於浴槽內之熔融錫上流動而成形為帶板狀,待所成形之玻璃緩慢冷卻後,將已冷卻之玻璃切斷成所需尺寸。於熔融法之情形時,使自槽狀構件溢出之熔融玻璃於槽狀構件之下端合流而成形為帶板狀,待所成形之玻璃緩慢冷卻後,將已冷卻之玻璃切斷成所需尺寸。於再曳引法之情形時,利用熱使玻璃基板軟化後拉伸成所需厚度,並使經拉伸之玻璃基板固化。 The method for manufacturing the glass substrate 4 may be any of a float method, a melting method, and a retraction method. In the case of the float method, the molten glass is flowed on the molten tin in the bath to be formed into a strip shape. After the formed glass is slowly cooled, the cooled glass is cut to a desired size. In the case of the melting method, the molten glass overflowing from the groove-shaped member is merged at the lower end of the groove-shaped member and formed into a strip shape. After the formed glass is slowly cooled, the cooled glass is cut to the required size . In the case of the retraction method, the glass substrate is softened by heat and stretched to a desired thickness, and the stretched glass substrate is cured.

於玻璃基板4之表面上存在微小裂縫8。微小裂縫8係於製造玻璃基板時之各種處理(洗淨處理、研磨處理、切斷處理等)時、或搬運玻璃基板等操作時產生。微小裂縫8之形狀並無特別限制,如具有微小裂縫之玻璃基板4之俯視圖即圖2所示,例如可列舉溝狀之凹部呈線狀延伸而成之形狀8a、或點狀之凹部形狀8b。 There are minute cracks 8 on the surface of the glass substrate 4. The micro-cracks 8 are generated during various processes (cleaning process, polishing process, cutting process, etc.) when manufacturing a glass substrate, or during operations such as transporting a glass substrate. The shape of the micro-cracks 8 is not particularly limited. For example, as shown in FIG. 2 in a plan view of the glass substrate 4 having micro-cracks, for example, a groove-shaped concave portion 8a or a dot-shaped concave portion 8b can be cited. .

所謂微小裂縫8,主要指微小尺寸等級以下之裂縫(損傷)。 The minute cracks 8 mainly refer to cracks (damages) below a minute size level.

微小裂縫8之深度d之大小並無特別限制,就可由電子顯微鏡等檢測出之範圍而言多為0.1μm以上,更多情況下為1.0μm以上。又,上限並無特別限制,多為30μm以下,更多情況下為15μm以下。 The depth d of the micro-cracks 8 is not particularly limited. The range detectable by an electron microscope or the like is usually 0.1 μm or more, and more preferably 1.0 μm or more. The upper limit is not particularly limited, but it is usually 30 μm or less, and in most cases, 15 μm or less.

微小裂縫8之寬度W之大小並無特別限制,就可由電子顯微鏡等檢測出之範圍而言多為1nm以上,更多情況下為10nm以上。又,上限並無特別限制,多為100μm以下,更多情況下為10μm以下。 The width W of the micro-cracks 8 is not particularly limited, and the range detectable by an electron microscope or the like is usually 1 nm or more, and in most cases, 10 nm or more. The upper limit is not particularly limited, but it is usually 100 μm or less, and more often 10 μm or less.

作為上述微小裂縫8之深度d及寬度W之測定方法,可列舉將複合體2切斷而對該切斷面利用電子顯微鏡進行觀察之方法。 Examples of the method for measuring the depth d and the width W of the micro-cracks 8 include a method of cutting the composite 2 and observing the cut surface with an electron microscope.

<樹脂層> <Resin layer>

樹脂層6係配置於上述玻璃基板4上之層,發揮針對玻璃基板4之易破裂性進行補強之補強層之作用。 The resin layer 6 is a layer disposed on the glass substrate 4, and functions as a reinforcing layer that reinforces the easily broken glass substrate 4.

樹脂層6與上述玻璃基板4之間滿足以下式(1)之關係。 The relationship between the resin layer 6 and the above-mentioned glass substrate 4 satisfies the following formula (1).

式(1):(比(df/d))×(樹脂層之斷裂伸長率TE)×(樹脂層之降伏應力σS)≧400MPa‧% Formula (1): (ratio (d f / d)) × (breaking elongation TE of the resin layer) × (falling stress σ S of the resin layer) ≧ 400MPa‧%

以下,首先對該式中之各項進行詳細說明。 Hereinafter, each item in the formula will be described in detail first.

如圖1所示,樹脂層6中之樹脂深入至(填充於)微小裂縫8內部之一部分區域。樹脂距離玻璃基板4表面之深入深度df(填充深度)相對於微小裂縫之深度d的比(df/d)之大小(微小裂縫之深度方向上之樹脂之嵌入比)只要滿足上述式(1)之關係則並無特別限制,就複合體更不易破裂之方面(以下亦簡稱為「本發明之效果更優異之方面」)而言,較佳為0.01以上,更佳為0.05以上,進而較佳為0.1以上。上限並無特別限制,由於深入深度df不會大於微小裂縫之深度d,故而為1以下。上述深入深度df表示以玻璃基板4表面為基準,深入至微小裂縫內部之樹脂之最深位置。 As shown in FIG. 1, the resin in the resin layer 6 penetrates (fills in) a part of the area inside the micro-crack 8. The magnitude of the ratio (d f / d) of the depth d f (filling depth) of the resin from the surface of the glass substrate 4 to the depth d of the micro-cracks (the embedding ratio of the resin in the depth direction of the micro-cracks) should satisfy the above formula ( The relationship of 1) is not particularly limited. As far as the composite body is less likely to break (hereinafter also referred to as "the aspect of the present invention having more excellent effects"), it is preferably 0.01 or more, and more preferably 0.05 or more. It is preferably 0.1 or more. The upper limit is not particularly limited, and since the depth d f is not larger than the depth d of the minute cracks, it is 1 or less. The above-mentioned depth of penetration d f represents the deepest position of the resin that penetrates into the interior of the micro-cracks based on the surface of the glass substrate 4.

上述比(df/d)為平均值,即,觀察10個以上之微小裂縫,測定各微小裂縫之深度d與深入深度df,計算各微小裂縫之比(df/d),並將所算出之各微小裂縫之比(df/d)進行算術平均而得之值。 The above ratio (d f / d) is an average value, that is, observing more than 10 micro cracks, measuring the depth d and the depth d f of each micro crack, calculating the ratio (d f / d) of each micro crack, and The calculated ratio (d f / d) of each minute crack is a value obtained by arithmetic average.

上述深度d及深入深度df係藉由實施複合體之破壞試驗後利用光學顯微鏡直接觀察破壞起點而獲得。又,根據破壞力學之基礎式(「陶瓷之破壞學」P68),由破壞應力、應力強度因數亦可求出理論值,可確認上述值之正確性。進而,關於深入深度df,預先使色素分散於待塗佈之樹脂中,藉此可利用螢光顯微鏡觀察破壞試驗後之破壞起點,測定其大小,並與深度d進行比較。此處,色素並無特別限定,較佳為螢光素或其衍生物。 The above-mentioned depth d and depth d f are obtained by directly observing the starting point of the damage with an optical microscope after performing the damage test of the composite. In addition, according to the basic formula of failure mechanics ("Ceramic Destruction" P68), theoretical values can also be obtained from the failure stress and stress intensity factor, and the correctness of the above values can be confirmed. Further, regarding the depth d f , the pigment is dispersed in the resin to be coated in advance, whereby the starting point of the failure after the failure test can be observed with a fluorescence microscope, and its size can be measured and compared with the depth d. Here, the pigment is not particularly limited, and fluorescein or a derivative thereof is preferred.

又,於色素之分散性較差之樹脂液之情形時,可使用黏度一致 之水溶性樹脂作為觀察用樹脂。藉由使實際用於形成樹脂層之樹脂層形成用組合物之黏度與包含上述觀察用樹脂及色素之評估用組合物之黏度一致,而使評估用組合物侵入至深度d之微小裂縫內部之程度與使用樹脂層形成用組合物之情形時為同等程度。此處,所謂水溶性樹脂係指聚乙烯醇(PVA)或羥基纖維素(HEC)等。又,關於深度d,亦可藉由使色素吸附於微小裂縫內表面,利用螢光顯微鏡觀察破壞試驗後之破壞起點而求出。 In the case of resin liquids with poor pigment dispersibility, uniform viscosity can be used. The water-soluble resin is used as a resin for observation. By making the viscosity of the resin layer-forming composition actually used to form the resin layer consistent with the viscosity of the evaluation composition containing the above-mentioned observation resin and pigment, the evaluation composition penetrates into the micro-cracks at the depth d. The degree is the same as when the composition for forming a resin layer is used. Here, the water-soluble resin refers to polyvinyl alcohol (PVA), hydroxycellulose (HEC), and the like. The depth d can also be obtained by adsorbing the pigment on the inner surface of the micro-crack and observing the starting point of the failure after the failure test with a fluorescent microscope.

再者,作為一例,圖9(A)及圖9(B)中揭示對使螢光素吸附於具有微小裂縫之玻璃基板表面而進行破壞試驗後之玻璃基板之破壞起點附近之破斷面利用光學顯微鏡及螢光顯微鏡進行觀察而得之照片。圖9(A)為光學顯微鏡下之觀察圖,圖9(B)為螢光顯微鏡下之觀察圖。圖中之箭頭意指玻璃基板之厚度方向。若比較兩者,則可於圖9(B)之一表面上(圖式中為玻璃基板之下側之表面)確認到源自吸附於微小裂縫內部之螢光素之螢光,由距離玻璃基板表面之該螢光區域之深度可算出上述深度d。又,如上所述,亦可使色素(例如螢光素)分散於待塗佈之樹脂中,與上述圖9(B)同樣地觀察破壞試驗後之玻璃基板之剖面,藉此觀察上述深入深度dfIn addition, as an example, FIG. 9 (A) and FIG. 9 (B) disclose the use of the fracture surface near the destruction starting point of the glass substrate after the destruction test is performed by adsorbing fluorescein to the surface of the glass substrate having microcracks. Photographs obtained by observation with an optical microscope and a fluorescent microscope. FIG. 9 (A) is an observation diagram under an optical microscope, and FIG. 9 (B) is an observation diagram under a fluorescent microscope. The arrows in the figure indicate the thickness direction of the glass substrate. If you compare the two, you can see on one of the surfaces in Figure 9 (B) (the surface on the lower side of the glass substrate in the figure) that the fluorescent light originated from the fluorescein adsorbed inside the micro-crack, from the distance glass The depth d of the fluorescent region on the substrate surface can be calculated. As described above, a pigment (for example, luciferin) may be dispersed in the resin to be coated, and the cross-section of the glass substrate after the breaking test may be observed in the same manner as in FIG. 9 (B) to observe the above-mentioned depth. d f .

樹脂層6之斷裂伸長率TE(%)之大小只要滿足上述式(1)之關係則並無特別限制,就本發明之效果更優異之方面而言,較佳為20%以上,更佳為40%以上。 The size of the elongation at break TE (%) of the resin layer 6 is not particularly limited as long as it satisfies the relationship of the above formula (1). In terms of the effect of the present invention, it is more preferably 20% or more, more preferably Over 40%.

斷裂伸長率TE(%)之測定方法係依據ASTM D882-12。 The method for measuring the elongation at break TE (%) is based on ASTM D882-12.

樹脂層6之降伏應力σS(MPa)之大小只要滿足上述式(1)之關係則並無特別限制,就本發明之效果更優異之方面而言,較佳為50MPa以上,更佳為100MPa以上。 The magnitude of the undulating stress σ S (MPa) of the resin layer 6 is not particularly limited as long as it satisfies the relationship of the above formula (1). In terms of the effect of the present invention, it is preferably 50 MPa or more, and more preferably 100 MPa. the above.

降伏應力σS之測定方法係依據JIS-C-2151:2006。 The method for measuring the yield stress σ S is based on JIS-C-2151: 2006.

上述式(1)意指上述比(df/d)、與樹脂層6之斷裂伸長率TE、及樹 脂層6之降伏應力σS的乘積為400MPa‧%(N/mm2‧%)以上。其中,就本發明之效果更優異之方面而言,上述式(1)之左邊((比(df/d))×(樹脂層之斷裂伸長率TE)×(樹脂層之降伏應力σS))較佳為450MPa‧%以上,更佳為500MPa‧%以上。上限並無特別限制,通常多為8000MPa‧%以下,更多情況下為2000MPa‧%以下。 The above formula (1) means that the product of the above ratio (d f / d), the elongation at break TE of the resin layer 6, and the undulating stress σ S of the resin layer 6 is 400 MPa‧% (N / mm 2 ‧%) or more . Among them, as far as the effect of the present invention is more excellent, the left side of the above formula (1) ((ratio (d f / d)) × (elongation at break of the resin layer TE) × (residual stress of the resin layer σ S )) Is preferably 450 MPa‧% or more, and more preferably 500 MPa‧% or more. The upper limit is not particularly limited, but it is usually below 8000 MPa‧%, and more often below 2,000 MPa‧%.

如上所述,玻璃基板4破裂之原因主要在於:應力集中於玻璃基板4表面所存在之微小裂縫8而導致玻璃基板4容易破裂。本發明者等人發現:藉由使可形成展現特定斷裂伸長率TE及降伏應力σS之樹脂層6之樹脂深入至微小裂縫8內部之特定深度,即,藉由滿足式(1)之關係,可抑制如圖1中之空心箭頭所示之朝向使微小裂縫8之破裂進一步延伸之方向上之應力。 As described above, the main reason for the cracking of the glass substrate 4 is that stress is concentrated on the small cracks 8 existing on the surface of the glass substrate 4 and the glass substrate 4 is easily broken. The present inventors have found that: by so formed may exhibit an elongation at break TE and specific yield stress σ S of the resin layer of the resin to small cracks deep 6 8 inside of a certain depth, i.e., by satisfying the relationship of formula (1) of It can suppress the stress in the direction indicated by the hollow arrow in FIG. 1 to further extend the rupture of the micro-crack 8.

更具體而言,如上所述,玻璃基板破裂之原因在於應力集中於微小裂縫,但於樹脂深入至(嵌入至)微小裂縫內之情形時,施加於微小裂縫之能量根據所深入之深度被分配至樹脂。此時,由樹脂所作之作功量係由以下之式(X)表示。 More specifically, as described above, the reason for the cracking of the glass substrate is that the stress is concentrated in the micro-cracks, but when the resin penetrates (embeds) into the micro-cracks, the energy applied to the micro-cracks is distributed according to the depth of penetration To resin. At this time, the amount of work done by the resin is expressed by the following formula (X).

式(X)中,W'表示由微小裂縫內所嵌入之樹脂所作之作功量,α表示於微小裂縫之深度方向上之樹脂之嵌入率,d表示微小裂縫之深度,σ表示樹脂之降伏應力,ε表示樹脂之斷裂伸長率。 In formula (X), W ′ represents the work done by the resin embedded in the micro-crack, α represents the embedding rate of the resin in the depth direction of the micro-crack, d represents the depth of the micro-crack, and σ represents the undulation Stress, ε represents the elongation at break of the resin.

上述變數中,d(微小裂縫之深度)相當於經過某步驟之玻璃之最低強度所對應之最深之微小裂縫,若為同一批次之玻璃基板則不存在較大變化,因此可視為大致常數。如此,作功量W'之大小取決於α、 σ及ε。本發明者等人發現,若該3個參數之乘積為特定值,則玻璃基板不易產生破裂。 In the above variables, d (the depth of the minute cracks) corresponds to the deepest minute cracks corresponding to the lowest strength of the glass after a certain step. If the glass substrates of the same batch have no large changes, they can be regarded as approximately constant. In this way, the amount of work W 'depends on α, σ and ε. The inventors have found that if the product of the three parameters is a specific value, the glass substrate is less likely to crack.

尤其樹脂層6之斷裂伸長率TE越大,則微小裂縫內部之樹脂直至斷裂為止之容許應力之範圍較廣。又,樹脂層6之降伏應力σS越大,則微小裂縫內部之樹脂直至降伏為止之容許應力之範圍較廣。 In particular, the larger the elongation at break TE of the resin layer 6, the wider the allowable stress range of the resin inside the micro-cracks until the fracture. In addition, the larger the undulation stress σ S of the resin layer 6 is, the wider the allowable stress range of the resin inside the micro-crack until the undulation is.

樹脂層6之拉伸彈性模數Eresin為1.0GPa以上,就本發明之效果更優異之方面而言,較佳為1.5GPa以上,更佳為2.0GPa以上。上限並無特別限制,通常多為15GPa以下,更多情況下為10GPa以下。 The tensile elastic modulus E resin of the resin layer 6 is 1.0 GPa or more. In terms of the effect of the present invention being more excellent, it is preferably 1.5 GPa or more, and more preferably 2.0 GPa or more. The upper limit is not particularly limited, but it is usually 15 GPa or less, and in most cases, 10 GPa or less.

拉伸彈性模數Eresin之測定方法係依據JIS-C-2151(2006年)。 The method for measuring the tensile elastic modulus E resin is based on JIS-C-2151 (2006).

樹脂層6之平均厚度並無特別限制,較佳為100μm以下。若樹脂層6之平均厚度為100μm以下,則可充分確保複合體2之可撓性。又,若樹脂層6之平均厚度為100μm以下,則可抑制因樹脂與玻璃之熱膨脹係數差所引起之翹曲。樹脂層6之平均厚度較佳為90μm以下,更佳為75μm以下。又,樹脂層6之平均厚度就本發明之效果更優異之方面而言,較佳為0.5μm以上,更佳為1μm以上,進而較佳為10μm以上。 The average thickness of the resin layer 6 is not particularly limited, but is preferably 100 μm or less. When the average thickness of the resin layer 6 is 100 μm or less, the flexibility of the composite 2 can be sufficiently ensured. In addition, if the average thickness of the resin layer 6 is 100 μm or less, warpage due to a difference in thermal expansion coefficient between the resin and glass can be suppressed. The average thickness of the resin layer 6 is preferably 90 μm or less, and more preferably 75 μm or less. The average thickness of the resin layer 6 is more preferably 0.5 μm or more, more preferably 1 μm or more, and still more preferably 10 μm or more, in terms of the effect of the present invention.

再者,上述平均厚度係測定任意10點以上之樹脂層6之厚度,並將該等進行算術平均而得之值。 The average thickness is a value obtained by measuring the thickness of the resin layer 6 at an arbitrary 10 points or more, and averaging these values.

樹脂層6例如可僅由樹脂形成。再者,樹脂層6只要由包含樹脂之材料形成即可,例如亦可由樹脂及填料形成。 The resin layer 6 may be formed only of a resin, for example. The resin layer 6 may be formed of a resin-containing material, and may be formed of, for example, a resin and a filler.

作為填料,可列舉纖維狀、或板狀、鱗片狀、粒狀、不定形狀、破碎品等非纖維狀之填充剖,具體而言,例如可列舉:玻璃纖維、PAN(Polyacrylonitrile,聚丙烯腈)系或瀝青系之碳纖維、不鏽鋼纖維、鋁纖維或黃銅纖維等金屬纖維、芳香族聚醯胺纖維等有機纖維、石膏纖維、陶瓷纖維、石棉纖維、氧化鋯纖維、氧化鋁纖維、二氧化矽纖維、氧化鈦纖維、碳化矽纖維、岩絨、鈦酸鉀晶鬚、鈦酸鋇 晶鬚、硼酸鋁晶鬚、氮化矽晶鬚、雲母、滑石、高嶺土、二氧化矽、碳酸鈣、玻璃珠、玻璃薄片、玻璃微球、黏土、二硫化鉬、矽灰石、氧化鈦、氧化鋅、聚磷酸鈣、金屬粉、金屬薄片、金屬帶、金屬氧化物、碳粉末、石墨、碳黑、鱗片狀碳、奈米碳管等。作為金屬粉、金屬薄片、金屬帶之金屬種之具體例,可例示:銀、鎳、銅、鋅、鋁、不鏽鋼、鐵、黃銅、鉻、錫等。玻璃纖維或碳纖維之種類只要為一般用於樹脂強化用者則並無特別限定,例如可自長纖維型或短纖維型之切股纖維、磨碎纖維等中加以選擇而使用。又,樹脂層6亦可由含浸有樹脂之織布、不織布等構成。 Examples of the filler include fibrous, or plate-like, scaly, granular, irregular, broken, and other non-fibrous filling profiles. Specific examples include glass fiber and PAN (Polyacrylonitrile, polyacrylonitrile). Carbon fibers such as carbon fibers, stainless steel fibers, aluminum fibers or brass fibers, organic fibers such as aromatic polyamide fibers, gypsum fibers, ceramic fibers, asbestos fibers, zirconia fibers, alumina fibers, and silicon dioxide Fiber, titanium oxide fiber, silicon carbide fiber, rock wool, potassium titanate whisker, barium titanate Whiskers, aluminum borate whiskers, silicon nitride whiskers, mica, talc, kaolin, silicon dioxide, calcium carbonate, glass beads, glass flakes, glass microspheres, clay, molybdenum disulfide, wollastonite, titanium oxide, Zinc oxide, calcium polyphosphate, metal powder, metal flake, metal strip, metal oxide, carbon powder, graphite, carbon black, scaly carbon, nano carbon tube, etc. Specific examples of the metal species of metal powder, metal foil, and metal strip include silver, nickel, copper, zinc, aluminum, stainless steel, iron, brass, chromium, and tin. The type of glass fiber or carbon fiber is not particularly limited as long as it is generally used for resin reinforcement. For example, it can be selected from long-fiber or short-fiber cut strand fibers, ground fibers, and the like. The resin layer 6 may be made of a woven fabric, a non-woven fabric, or the like impregnated with a resin.

樹脂層6之樹脂可為多種多樣,例如可為熱塑性樹脂、熱硬化性樹脂之任意者。 The resin of the resin layer 6 can be various, for example, any of a thermoplastic resin and a thermosetting resin can be used.

作為熱硬化性樹脂,例如可使用聚醯亞胺(PI)、環氧樹脂(EP)等。作為熱塑性樹脂,例如可使用聚醯胺(PA)、聚醯胺醯亞胺(PAI)、聚醚醚酮(PEEK)、聚苯并咪唑(PBI)、液晶聚合物(LCP)、聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯(PEN)、聚醚碸(PES)、環狀聚烯烴(COP)、聚碳酸酯(PC)、聚氯乙烯(PVC)、聚乙烯(PE)、聚丙烯(PP)、丙烯酸系樹脂(PMMA(PolymethylMethacrylate,聚甲基丙烯酸甲酯))、胺基甲酸酯(PU)等。 Examples of the thermosetting resin include polyimide (PI) and epoxy resin (EP). As the thermoplastic resin, for example, polyamidoamine (PA), polyamidoimine (PAI), polyetheretherketone (PEEK), polybenzimidazole (PBI), liquid crystal polymer (LCP), polyparaphenylene can be used. Ethylene diformate (PET), polyethylene naphthalate (PEN), polyether fluorene (PES), cyclic polyolefin (COP), polycarbonate (PC), polyvinyl chloride (PVC), polyethylene Ethylene (PE), polypropylene (PP), acrylic resin (PMMA (PolymethylMethacrylate, polymethylmethacrylate)), urethane (PU), and the like.

再者,樹脂層6可由光硬化性樹脂形成,亦可為共聚物或混合物。藉由捲對捲法進行之電子裝置之製造步驟有時包含伴有加熱處理之步驟,樹脂之耐熱溫度(可連續使用之溫度)較佳為100℃以上。作為耐熱溫度為100℃以上之樹脂,例如可列舉:聚醯亞胺(PI)、環氧樹脂(EP)、聚醯胺(PA)、聚醯胺醯亞胺(PAI)、聚醚醚酮(PEEK)、聚苯并咪唑(PBI)、聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯(PEN)、聚醚碸(PES)、環狀聚烯烴(COP)、聚碳酸酯(PC)、聚氯乙烯(PVC)、丙烯酸系樹脂(PMMA)、胺基甲酸酯(PU)等。 The resin layer 6 may be formed of a photocurable resin, or may be a copolymer or a mixture. The manufacturing steps of the electronic device by the roll-to-roll method sometimes include a step accompanied by a heat treatment, and the heat-resistant temperature (continuous use temperature) of the resin is preferably 100 ° C or higher. Examples of the resin having a heat-resistant temperature of 100 ° C or higher include polyimide (PI), epoxy resin (EP), polyimide (PA), polyimide (PAI), and polyetheretherketone. (PEEK), polybenzimidazole (PBI), polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polyether fluorene (PES), cyclic polyolefin (COP), Polycarbonate (PC), polyvinyl chloride (PVC), acrylic resin (PMMA), urethane (PU), etc.

其中,就本發明之效果更優異之方面而言,作為樹脂層6中之樹脂,較佳為聚醯亞胺、環氧樹脂,更佳為聚醯亞胺。 Among these, as the effect of the present invention is more excellent, as the resin in the resin layer 6, polyimide and epoxy resin are preferable, and polyimide is more preferable.

聚醯亞胺之結構並無特別限制,較佳為包含下述式(I)所表示之具有四羧酸類之殘基(X)與二胺類之殘基(A)的重複單元。再者,聚醯亞胺較佳為含有式(I)所表示之重複單元作為主成分(較佳為相對於全部重複單元為95莫耳%以上),亦可包含其以外之其他重複單元(例如後述式(2-1)或(2-2)所表示之重複單元)。 The structure of the polyfluoreneimide is not particularly limited, and it is preferably a repeating unit including a residue (X) having a tetracarboxylic acid type and a residue (A) having a diamine type represented by the following formula (I). In addition, the polyfluorene imide preferably contains a repeating unit represented by formula (I) as a main component (preferably 95 mol% or more with respect to all repeating units), and may also include other repeating units other than ( (For example, the repeating unit represented by Formula (2-1) or (2-2) mentioned later).

再者,所謂四羧酸類之殘基(X)意指自四羧酸類去除羧基所得之四羧酸殘基,所謂二胺類之殘基(A)意指自二胺類去除胺基所得之二胺殘基。 In addition, the residue (X) of the tetracarboxylic acid means a tetracarboxylic acid residue obtained by removing a carboxyl group from a tetracarboxylic acid, and the residue (A) of a diamine means a residue obtained by removing an amine group from a diamine. Diamine residue.

式(I)中,X表示自四羧酸類去除羧基所得之四羧酸殘基,A表示自二胺類去除胺基所得之二胺殘基。 In formula (I), X represents a tetracarboxylic acid residue obtained by removing a carboxyl group from a tetracarboxylic acid, and A represents a diamine residue obtained by removing an amine group from a diamine.

式(I)中,X表示自四羧酸類去除羧基所得之四羧酸殘基,較佳為包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基。其中,就本發明之效果更優異之方面而言,更佳為X之總數之50莫耳%以上(較佳為80~100莫耳%)包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基。進而較佳為X之總數之實質上全數(100莫耳%)包含選自由以下之式(X1)~(X4)所表示之基所組成之 群中之至少1種基。 In formula (I), X represents a tetracarboxylic acid residue obtained by removing a carboxyl group from a tetracarboxylic acid, and preferably contains at least 1 selected from the group consisting of the groups represented by the following formulae (X1) to (X4) Seed basis. Among them, as far as the effect of the present invention is more excellent, it is more preferably 50 mol% or more (preferably 80 to 100 mol%) of the total number of X, which is selected from the following formulae (X1) to (X4) At least one type of group in the group represented. It is further preferred that the substantially total number (100 mol%) of the total number of X is selected from the group consisting of the bases represented by the following formulae (X1) to (X4) At least one base in the group.

又,A表示自二胺類去除胺基所得之二胺殘基,較佳為包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。其中,就本發明之效果更優異之方面而言,更佳為A之總數之50莫耳%以上(較佳為80~100莫耳%)包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。進而較佳為A之總數之實質上全數(100莫耳%)包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。 In addition, A represents a diamine residue obtained by removing an amine group from a diamine, and preferably contains at least one group selected from the group consisting of the groups represented by the following formulae (A1) to (A8). Among them, in terms of more excellent effects of the present invention, it is more preferably 50 mol% or more (preferably 80 to 100 mol%) of the total number of A, which is selected from the following formulae (A1) to (A8) At least one type of group in the group represented. Furthermore, it is preferable that the substantially total number (100 mol%) of the total number of A includes at least one type selected from the group consisting of the following formulae (A1) to (A8).

再者,就本發明之效果更優異之方面而言,較佳為X之總數之80~100莫耳%包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基、且A之總數之80~100莫耳%包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基,更佳為X之總數之實質上全數(100莫耳%)包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基、且A之總數之實質上全數(100莫耳%)包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。 Furthermore, in terms of the effect of the present invention being more excellent, it is preferable that 80 to 100 mole% of the total number of X is selected from the group consisting of the bases represented by the following formulae (X1) to (X4). At least one kind of base, and 80 to 100 mole% of the total number of A includes at least one kind selected from the group consisting of the bases represented by the following formulae (A1) to (A8), and more preferably X Substantially all of the total (100 mole%) includes at least one kind of base selected from the group consisting of the bases represented by the following formulae (X1) to (X4), and substantially all of the total of A (100 moles) Ear%) contains at least one type of group selected from the group consisting of the groups represented by the following formulae (A1) to (A8).

其中,就本發明之效果更優異之方面而言,作為X,較佳為式(X1)所表示之基及式(X4)所表示之基,更佳為式(X1)所表示之基。 Among these, in terms of more excellent effects of the present invention, X is preferably a base represented by formula (X1) and a base represented by formula (X4), and more preferably a base represented by formula (X1).

又,就本發明之效果更優異之方面而言,作為A,較佳為式(A1)所表示之基及式(A6)所表示之基,更佳為式(A1)所表示之基。 In addition, in terms of more excellent effects of the present invention, A is preferably a base represented by formula (A1) and a base represented by formula (A6), and more preferably a base represented by formula (A1).

作為包含式(X1)~(X4)所表示之基與式(A1)~(A8)所表示之基之較佳組合的聚醯亞胺,可較佳地列舉:X為式(X1)所表示之基且A為式(A1)所表示之基的聚醯亞胺1、及X為式(X4)所表示之基且A為式(A6)所表示之基的聚醯亞胺2。於聚醯亞胺1之情形時,耐熱性更優異。又,於聚醯亞胺2之情形時,無色透明性之方面較佳。 As a polyimide containing a preferable combination of the bases represented by the formulas (X1) to (X4) and the bases represented by the formulas (A1) to (A8), preferably, X is the compound represented by the formula (X1) Polyfluoreneimine 1 having a group represented by Formula (A1) and A being a polyimide 2 having a group represented by Formula (X4) and A being a group represented by Formula (A6). In the case of polyimide 1, heat resistance is more excellent. In the case of polyimide 2, it is preferable in terms of colorless transparency.

聚醯亞胺中之上述式(I)所表示之重複單元之重複數(n)並無特別限制,較佳為2以上之整數,就本發明之效果更優異之方面而言,較佳為10~10000,更佳為15~1000。 The repeating number (n) of the repeating unit represented by the above-mentioned formula (I) in the polyimide is not particularly limited, and is preferably an integer of 2 or more. In terms of the effect of the present invention being more excellent, it is preferably 10 ~ 10000, more preferably 15 ~ 1000.

上述聚醯亞胺亦可於無損耐熱性之範圍內包含選自由下述所例示之基所組成之群中之1種以上作為四羧酸類之殘基(X)。又,亦可包含2種以上之下述所例示之基。 The polyfluoreneimide may include, as long as the heat resistance is not impaired, one or more types of residues (X) selected from the group consisting of the groups exemplified below as tetracarboxylic acids. In addition, two or more types of bases exemplified below may be included.

[化3] [Chemical 3]

又,上述聚醯亞胺亦可於無損耐熱性之範圍內包含選自由下述所例示之基所組成之群中之1種以上作為二胺類之殘基(A)。又,亦可包含2種以上之下述所例示之基。 Moreover, the said polyfluoreneimide may contain the residue (A) which is one or more types chosen from the group which consists of a base which is illustrated below as a diamine in the range which does not impair heat resistance. In addition, two or more types of bases exemplified below may be included.

[化4] [Chemical 4]

樹脂層6只要覆蓋欲抑制玻璃基板4之破裂之部分即可,亦可為覆蓋樹脂層6之一主面之至少一部分之形態。樹脂層6較佳為覆蓋玻璃基板4之一整個主面。再者,樹脂層6亦可自玻璃基板4之一主面伸出。 The resin layer 6 only needs to cover a portion where cracking of the glass substrate 4 is to be suppressed, and may be in a form of covering at least a part of one main surface of the resin layer 6. The resin layer 6 preferably covers the entire main surface of one of the glass substrates 4. In addition, the resin layer 6 may protrude from one of the main surfaces of the glass substrate 4.

樹脂層6之製造方法並無特別限制,根據所使用之材料而適當選擇最佳條件,就本發明之效果更優異之方面而言,可列舉於玻璃基板4上塗佈液狀之樹脂組合物並使之固化而形成樹脂層6之方法。 The method for producing the resin layer 6 is not particularly limited, and the optimum conditions are appropriately selected according to the materials used. In terms of the effect of the present invention being more excellent, a liquid resin composition can be applied to the glass substrate 4 A method of curing the resin to form the resin layer 6.

再者,製造包含上述聚醯亞胺之樹脂層(聚醯亞胺樹脂層)時之製造方法並無特別限制,較佳為使用藉由熱硬化而成為上述式(I)所表示之聚醯亞胺樹脂的硬化性樹脂之形態。 In addition, the manufacturing method when manufacturing the resin layer (polyimide resin layer) containing the said polyfluorene imine is not specifically limited, It is preferable to use the polyfluorene which is represented by said Formula (I) by thermosetting. The form of curable resin of imine resin.

以下,對聚醯亞胺樹脂層之製造方法之較佳形態進行詳細說 明。該製造方法較佳為具有以下之步驟(1)及步驟(2)。 Hereinafter, a preferred embodiment of a method for producing a polyimide resin layer will be described in detail. Bright. This manufacturing method preferably has the following steps (1) and (2).

步驟(1):將藉由熱硬化而成為上述式(I)所表示之聚醯亞胺樹脂的硬化性樹脂塗佈於玻璃基板4上而獲得塗膜之步驟 Step (1): A step of applying a curable resin that becomes a polyimide resin represented by the above formula (I) by thermal curing onto a glass substrate 4 to obtain a coating film

步驟(2):對塗膜實施加熱處理而形成聚醯亞胺樹脂層之步驟 Step (2): A step of applying a heat treatment to the coating film to form a polyimide resin layer

以下對各步驟之程序進行詳細說明。 The procedures of each step are described in detail below.

(步驟(1):塗膜形成步驟) (Step (1): Coating film forming step)

步驟(1)係將藉由熱硬化而成為具有上述式(I)所表示之重複單元之聚醯亞胺樹脂的硬化性樹脂塗佈於玻璃基板4上而獲得塗膜之步驟。 Step (1) is a step of applying a curable resin which becomes a polyimide resin having a repeating unit represented by the above formula (I) by thermosetting onto a glass substrate 4 to obtain a coating film.

再者,硬化性樹脂較佳為包含使四羧酸二酐與二胺類反應所獲得之聚醯胺酸,四羧酸二酐之至少一部分包含選自由下述式(Y1)~(Y4)所表示之化合物所組成之群中之至少1種四羧酸二酐,且二胺類之至少一部分包含選自由下述式(B1)~(B8)所表示之化合物所組成之群中之至少1種二胺類。 In addition, the curable resin preferably contains polyamine acid obtained by reacting a tetracarboxylic dianhydride with a diamine, and at least a part of the tetracarboxylic dianhydride includes a member selected from the following formulae (Y1) to (Y4) At least one type of tetracarboxylic dianhydride in the group consisting of the compounds represented, and at least a part of the diamines includes at least one selected from the group consisting of compounds represented by the following formulae (B1) to (B8) 1 type of diamine.

再者,聚醯胺酸通常係以包含以下之式(2-1)及/或式(2-2)所表示之重複單元之結構式表示。再者,式(2-1)及式(2-2)中,X、A之定義分別與式(I)中之X、A之定義含義相同。 The polyamic acid is generally represented by a structural formula including a repeating unit represented by the following formula (2-1) and / or formula (2-2). Furthermore, in the formulas (2-1) and (2-2), the definitions of X and A have the same meanings as the definitions of X and A in the formula (I), respectively.

四羧酸二酐與二胺類之反應條件並無特別限制,就可高效率地合成聚醯胺酸之方面而言,較佳為於-30~70℃(較佳為-20~40℃)下進行反應。 The reaction conditions of the tetracarboxylic dianhydride and diamine are not particularly limited, and in terms of efficient synthesis of polyamidic acid, it is preferably -30 to 70 ° C (preferably -20 to 40 ° C) ).

四羧酸二酐與二胺類之混合比率並無特別限制,可列舉:使相對於二胺類1莫耳而較佳為0.66~1.5莫耳、更佳為0.9~1.1莫耳、進而較佳為0.97~1.03莫耳之四羧酸二酐與之反應。 The mixing ratio of tetracarboxylic dianhydride and diamines is not particularly limited, and examples include: preferably 0.66 to 1.5 moles, more preferably 0.9 to 1.1 moles, and more preferably 1 mole to the diamines. It is preferably 0.97 to 1.03 mole of tetracarboxylic dianhydride to react with it.

於四羧酸二酐與二胺類之反應時亦可視需要使用有機溶劑。所 使用之有機溶劑之種類並無特別限制,例如可使用N-甲基-2-吡咯啶酮、N,N-二甲基乙醯胺、N,N-二乙基乙醯胺、N,N-二甲基甲醯胺、N,N-二乙基甲醯胺、N-甲基己內醯胺、六甲基磷醯胺、四亞甲基碸、二甲基亞碸、間甲酚、苯酚、對氯酚、2-氯-4-羥基甲苯、二乙二醇二甲醚、三乙二醇二甲醚、四乙二醇二甲醚、二烷、γ-丁內酯、二氧雜環戊烷、環己酮、環戊酮等,亦可將2種以上併用。 In the reaction of tetracarboxylic dianhydride with diamines, an organic solvent may be used as required. The type of the organic solvent used is not particularly limited, and for example, N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-diethylacetamide, N, N-dimethylformamide, N, N-diethylformamide, N-methylcaprolactam, hexamethylphosphoramidine, tetramethylenephosphonium, dimethylphosphonium, m-formyl Phenol, phenol, p-chlorophenol, 2-chloro-4-hydroxytoluene, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether, tetraethylene glycol dimethyl ether, diamine Alkane, γ-butyrolactone, dioxolane, cyclohexanone, cyclopentanone, and the like may be used in combination of two or more kinds.

上述反應時,亦可視需要併用除選自由上述式(Y1)~(Y4)所表示之化合物所組成之群中之四羧酸二酐以外之其他四羧酸二酐。 In the above-mentioned reaction, other tetracarboxylic dianhydrides other than the tetracarboxylic dianhydride selected from the group consisting of the compounds represented by the formulae (Y1) to (Y4) may be used in combination as necessary.

又,上述反應時,亦可視需要併用除選自由上述式(B1)~(B8)所表示之化合物所組成之群中之二胺類以外之其他二胺類。 In the above reaction, other diamines other than the diamines selected from the group consisting of the compounds represented by the formulae (B1) to (B8) may be used in combination when necessary.

又,本步驟中所使用之硬化性樹脂可使用除使上述四羧酸二酐與二胺類反應而獲得之聚醯胺酸以外亦添加有可與聚醯胺酸反應之四羧酸二酐或二胺類者。若除聚醯胺酸以外亦添加四羧酸二酐或二胺類,則可使2個以上之具有式(2-1)或式(2-2)所表示之重複單元之聚醯胺酸分子經由四羧酸二酐或二胺類鍵結。 In addition, as the curable resin used in this step, a polycarboxylic acid obtained by reacting the above-mentioned tetracarboxylic dianhydride with a diamine may be used, and a tetracarboxylic dianhydride capable of reacting with polyamino acid may be added. Or diamines. If tetracarboxylic dianhydride or diamine is added in addition to the polyamic acid, two or more polyamic acids having a repeating unit represented by the formula (2-1) or the formula (2-2) can be made. The molecules are bonded via tetracarboxylic dianhydride or diamine.

於聚醯胺酸於末端具有胺基之情形時,可添加四羧酸二酐,可以使羧基相對於聚醯胺酸1莫耳而成為0.9~1.1莫耳之方式添加。於聚醯胺酸於末端具有羧基之情形時,可添加二胺類,可以使胺基相對於聚醯胺酸1莫耳而成為0.9~1.1莫耳之方式添加。再者,於聚醯胺酸於末端具有羧基之情形時,酸末端亦可使用添加水或任意之醇而使末端之酸酐基開環所得者。 In the case where polyamic acid has an amine group at the terminal, tetracarboxylic dianhydride may be added, and the carboxyl group may be added in a manner of 0.9 to 1.1 mol relative to 1 mol of polyamic acid. When the polyamino acid has a carboxyl group at the terminal, a diamine may be added, and the amine group may be added in a manner of 0.9 to 1.1 mol relative to 1 mol of the polyamino acid. Furthermore, when polyamic acid has a carboxyl group at the terminal, an acid terminal may be obtained by adding water or an arbitrary alcohol to open the terminal acid anhydride group.

後續添加之四羧酸二酐更佳為式(Y1)~(Y4)所表示之化合物。後續添加之二胺類較佳為具有芳香環之二胺類,更佳為式(B1)~(B8)所表示之化合物。 The tetracarboxylic dianhydride added later is more preferably a compound represented by the formulae (Y1) to (Y4). The diamines to be added later are preferably diamines having an aromatic ring, and more preferably compounds represented by the formulae (B1) to (B8).

於後續添加四羧酸二酐類或二胺類之情形時,具有式(2-1)或式(2-2)所表示之重複單元之聚醯胺酸之聚合度(n)較佳為1~20。若聚合 度(n)為該範圍,則即便使硬化性樹脂溶液中之聚醯胺酸濃度成為30質量%以上,亦可使硬化性樹脂之溶液呈低黏度狀態。 When tetracarboxylic dianhydrides or diamines are subsequently added, the degree of polymerization (n) of the polyamic acid having a repeating unit represented by formula (2-1) or formula (2-2) is preferably 1 ~ 20. If polymerization When the degree (n) is within this range, even if the polyamic acid concentration in the curable resin solution is 30% by mass or more, the solution of the curable resin can be brought into a low viscosity state.

本步驟中亦可使用硬化性樹脂以外之成分。 In this step, components other than the curable resin may be used.

例如可使用溶劑。更具體而言,可使硬化性樹脂溶解於溶劑而以硬化性樹脂之溶液(硬化性樹脂溶液)之形態使用。作為溶劑,尤其就聚醯胺酸之溶解性之方面而言,較佳為有機溶劑。作為所使用之有機溶劑,可列舉上述反應時所使用之有機溶劑。 For example, a solvent can be used. More specifically, the curable resin can be dissolved in a solvent and used in the form of a solution (curable resin solution) of the curable resin. As a solvent, the organic solvent is preferable especially from the point of the solubility of a polyamic acid. Examples of the organic solvent used include organic solvents used in the above reaction.

再者,於硬化性樹脂溶液中包含有機溶劑之情形時,只要為可實現塗膜厚度之調整、塗佈性良好之量,則有機溶劑之含量並無特別限制,一般而言,相對於硬化性樹脂溶液總質量,較佳為5~95質量%,更佳為10~90質量%。 When an organic solvent is contained in the curable resin solution, the content of the organic solvent is not particularly limited as long as it can adjust the thickness of the coating film and have good coating properties. Generally speaking, it is relative to curing The total mass of the resin solution is preferably 5 to 95% by mass, and more preferably 10 to 90% by mass.

又,亦可視需要併用旨在促進聚醯胺酸之脫水閉環之脫水劑或脫水閉環觸媒。例如作為脫水劑,例如可使用乙酸酐、丙酸酐、三氟乙酸酐等酸酐。又,作為脫水閉環觸媒,例如可使用吡啶、三甲基吡啶、二甲基吡啶、三乙基胺等三級胺。 In addition, a dehydrating agent or a dehydrating closed-loop catalyst for promoting dehydration and closing of the polyamic acid may be used in combination as necessary. For example, as the dehydrating agent, for example, acid anhydrides such as acetic anhydride, propionic anhydride, and trifluoroacetic anhydride can be used. Further, as the dehydration ring-closing catalyst, for example, tertiary amines such as pyridine, trimethylpyridine, dimethylpyridine, and triethylamine can be used.

於玻璃基板表面上塗佈硬化性樹脂(或硬化性樹脂溶液)之方法並無特別限定,可使用公知之方法。例如可列舉:噴塗法、模嘴塗佈法、旋轉塗佈法、浸漬塗佈法、輥塗法、棒式塗佈法、網版印刷法、凹版塗佈法等。 A method of applying a curable resin (or a curable resin solution) on the surface of the glass substrate is not particularly limited, and a known method can be used. Examples include spray coating method, die coating method, spin coating method, dip coating method, roll coating method, bar coating method, screen printing method, and gravure coating method.

藉由上述處理而獲得之塗膜之厚度並無特別限制,可以獲得上述所需厚度之聚醯亞胺樹脂層之方式適當進行調整。 The thickness of the coating film obtained by the above-mentioned treatment is not particularly limited, and the manner in which the polyimide resin layer of the desired thickness can be obtained is appropriately adjusted.

(步驟(2):加熱處理步驟) (Step (2): Heat treatment step)

步驟(2)係對塗膜實施加熱處理而形成聚醯亞胺樹脂層之步驟。藉由實施本步驟,例如使硬化性樹脂所含之聚醯胺酸進行閉環反應而形成所需之樹脂層。 Step (2) is a step of applying heat treatment to the coating film to form a polyimide resin layer. By carrying out this step, for example, the polyamic acid contained in the curable resin is subjected to a ring-closing reaction to form a desired resin layer.

加熱處理之方法並無特別限制,適當使用公知之方法(例如將附 塗膜之支持基材靜置於加熱烘箱中進行加熱之方法)。 The method of heat treatment is not particularly limited, and a known method (such as (The method of heating the supporting substrate of the coating film by statically placing it in a heating oven).

加熱溫度並無特別限制,較佳為300~500℃,就殘留溶劑率變低並且醯亞胺化率進一步上升、本發明之效果更優異之方面而言,更佳為350~450℃。於上述加熱溫度下主要進行聚醯胺酸之閉環反應,因此以下亦將上述溫度稱為醯亞胺化溫度。再者,如後所述,就本發明之效果更優異之方面而言,較佳為使加熱溫度緩慢上升至醯亞胺化溫度。 The heating temperature is not particularly limited, but is preferably 300 to 500 ° C. From the viewpoint of lowering the residual solvent rate and further increasing the imidization rate and more excellent effects of the present invention, it is more preferably 350 to 450 ° C. The ring-closing reaction of polyamidic acid is mainly performed at the above-mentioned heating temperature. Therefore, the above-mentioned temperature is hereinafter also referred to as amidine imidization temperature. In addition, as described later, in terms of the effect of the present invention being more excellent, it is preferable that the heating temperature is gradually raised to the fluorene imidization temperature.

加熱時間並無特別限制,根據所使用之硬化性樹脂之結構而適當選擇最佳時間,就殘留溶劑率變低並且醯亞胺化率進一步上升、本發明之效果更優異之方面而言,自室溫至醯亞胺化溫度之升溫時間較佳為30~180分鐘,更佳為60~120分鐘。又,於實施後述乾燥加熱處理之情形時,自乾燥加熱處理時之溫度至醯亞胺化溫度之升溫時間只要處於上述範圍即可。再者,升溫時之升溫速度並無特別限制,較佳為以大致恆定之速度(恆定之升溫速度)進行升溫,較佳為用加熱開始溫度(於實施過乾燥加熱處理之情形時為乾燥溫度)與特定之醯亞胺化溫度之差除以特定之升溫時間所得之值。具體而言,於加熱開始溫度為120℃、醯亞胺化溫度為350℃、升溫時間為120分鐘之情形時,升溫速度較佳為(350-120)/120≒1.9℃/min左右。 There is no particular limitation on the heating time. The optimum time is appropriately selected according to the structure of the curable resin used. In terms of reducing the residual solvent rate and further increasing the imidization rate, and the effect of the present invention is more excellent, The heating time from warming to the imidization temperature is preferably 30 to 180 minutes, and more preferably 60 to 120 minutes. In the case of performing the dry heat treatment described later, the temperature increase time from the temperature at the time of the dry heat treatment to the amidation temperature may be within the above range. In addition, the heating rate during heating is not particularly limited, and it is preferred to increase the temperature at a substantially constant rate (constant heating rate), and it is preferable to use the heating start temperature (in the case of over-drying heat treatment, the drying temperature) ) The value obtained by dividing the difference between the specific imidization temperature and the specific heating time. Specifically, in the case where the heating start temperature is 120 ° C, the temperature of the imidization is 350 ° C, and the temperature rise time is 120 minutes, the temperature increase rate is preferably about (350-120) / 120 ° C to 1.9 ° C / min.

又,醯亞胺化溫度下之保持時間較佳為30~120分鐘。 The retention time at the fluorene imidization temperature is preferably 30 to 120 minutes.

加熱之環境並無特別限制,例如於大氣中、真空下或惰性氣體下實施。 The heating environment is not particularly limited, for example, it is performed in the atmosphere, under vacuum, or under an inert gas.

再者,加熱處理可於不同溫度下分階段實施。 Furthermore, the heat treatment can be performed in stages at different temperatures.

再者,於上述加熱溫度下之處理前亦可視需要實施用以去除塗膜中之揮發成分(溶劑)之乾燥加熱處理。乾燥加熱處理之溫度條件並無特別限制,就本發明之效果更優異之方面而言,較佳為40~200℃下之加熱處理。又,乾燥時間並無特別限制,就本發明之效果更優異 之方面而言,較佳為15~120分鐘,更佳為30~60分鐘。再者,乾燥加熱處理可於不同溫度下分階段實施。 Furthermore, before the treatment at the above heating temperature, a drying and heating treatment for removing volatile components (solvents) in the coating film may be performed as necessary. The temperature conditions of the dry heat treatment are not particularly limited, and in terms of the effect of the present invention being more excellent, the heat treatment at 40 to 200 ° C is preferred. The drying time is not particularly limited, and the effect of the present invention is more excellent. From the aspect, it is preferably 15 to 120 minutes, and more preferably 30 to 60 minutes. Furthermore, the drying and heating treatment can be performed in stages at different temperatures.

因此,作為本步驟(2)之較佳形態之一,可列舉於上述溫度下實施乾燥加熱處理後進而實施上述於350~450℃下之加熱處理之形態。 Therefore, as one of the preferred forms of this step (2), a form in which the above-mentioned heat treatment at 350 to 450 ° C. is performed after drying and heating treatment at the above-mentioned temperature can be cited.

藉由經過上述步驟(2)而形成包含聚醯亞胺樹脂之聚醯亞胺樹脂層。 A polyimide resin layer containing a polyimide resin is formed by going through the above step (2).

聚醯亞胺樹脂之醯亞胺化率並無特別限制,就本發明之效果更優異之方面而言,較佳為99.0%以上,更佳為99.5%以上。 There is no particular limitation on the fluorinated imidization rate of the polyfluorene imine resin. In terms of the effect of the present invention being more excellent, it is preferably 99.0% or more, more preferably 99.5% or more.

關於醯亞胺化率之測定方法,將於氮氣環境下對硬化性樹脂在350℃下進行2小時之加熱之情形設為醯亞胺化率100%,由硬化性樹脂之IR光譜中源自醯亞胺羰基之峰值:約1780cm-1之峰值強度相對於加熱處理前後不變之峰值強度(例如源自苯環之峰值:約1500cm-1)的強度比而求出。 Regarding the method for measuring the imidization ratio, the case where the curable resin is heated at 350 ° C. for 2 hours under a nitrogen atmosphere is set to be 100%, and it is derived from the IR spectrum of the curable resin. The peak value of the sulfonium imine carbonyl group: an intensity ratio of a peak intensity of about 1780 cm -1 to a peak intensity that does not change before and after heat treatment (for example, a peak derived from a benzene ring: about 1500 cm -1 ).

再者,上述步驟(1)中,將藉由熱硬化而成為具有上述式(I)所表示之重複單元之聚醯亞胺樹脂的硬化性樹脂塗佈於玻璃基板上而製造塗膜,但並不限定於該形態,例如亦可塗佈包含上述式(I)所表示之聚醯亞胺樹脂及溶劑之組合物而形成塗膜。 Furthermore, in the step (1), a curable resin that becomes a polyimide resin having a repeating unit represented by the formula (I) by thermal curing is applied to a glass substrate to produce a coating film, but The composition is not limited to this form, and for example, a composition including a polyimide resin represented by the formula (I) and a solvent may be applied to form a coating film.

<複合體及電子裝置> <Complex and electronic device>

上述複合體具備玻璃基板4與樹脂層6。 The composite includes a glass substrate 4 and a resin layer 6.

複合體之光線透過率並無特別限制,於應用於無需使光透過至背面基板之頂部發光之OLED用途之情形時,可為90%以下,80%以下亦無妨。 The light transmittance of the composite is not particularly limited. When it is used in an OLED application where light does not need to be transmitted to the top of the back substrate, it may be 90% or less, or 80% or less.

其次,對電子裝置進行說明。 Next, the electronic device will be described.

作為電子裝置,可列舉:圖像顯示面板、太陽電池、薄膜二次電池、攝像元件(CCD(Charge Coupled Device,電荷耦合元件)、CMOS(complementary metal oxide semiconductor,互補金氧半導體) 等)、壓力感測器、加速度感測器、生物感測器等。作為圖像顯示面板,可列舉:液晶面板(LCD)、電漿顯示面板(PDP)、有機EL面板(OLED)、電子紙等。電子裝置具有上述構成之複合體、及形成於複合體上之元件。 Examples of the electronic device include an image display panel, a solar cell, a thin film secondary battery, an imaging device (Charge Coupled Device (CCD), and a complementary metal oxide semiconductor (CMOS). Etc.), pressure sensor, acceleration sensor, biosensor, etc. Examples of the image display panel include a liquid crystal panel (LCD), a plasma display panel (PDP), an organic EL panel (OLED), and electronic paper. The electronic device includes a composite body having the above-mentioned structure and an element formed on the composite body.

圖3係表示本發明之一實施形態之有機EL面板(OLED)之圖。有機EL面板70例如由複合體2、像素電極72、有機層74、對向電極76及密封板78等構成。有機層74至少包含發光層,視需要包含電洞注入層、電洞傳輸層、電子傳輸層、電子注入層。例如有機層74自陽極側起依序包含電洞注入層、電洞傳輸層、發光層、電子傳輸層及電子注入層。由像素電極72、有機層74及對向電極76等構成頂部發光型有機EL元件71。再者,有機EL元件亦可為底部發光型。 FIG. 3 is a view showing an organic EL panel (OLED) according to an embodiment of the present invention. The organic EL panel 70 includes, for example, a composite body 2, a pixel electrode 72, an organic layer 74, a counter electrode 76, a sealing plate 78, and the like. The organic layer 74 includes at least a light emitting layer, and optionally includes a hole injection layer, a hole transport layer, an electron transport layer, and an electron injection layer. For example, the organic layer 74 includes a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer in this order from the anode side. The pixel electrode 72, the organic layer 74, the counter electrode 76, and the like constitute a top emission organic EL element 71. The organic EL element may be a bottom emission type.

圖4係表示本發明之一實施形態之液晶面板之圖。液晶面板80係由TFT基板82、CF基板84及液晶層86等構成。TFT基板82係於複合體2(構成複合體2之例如玻璃基板4)上圖案形成TFT元件(薄膜電晶體元件)83等而成。CF基板84係於另一複合體2(構成複合體2之例如玻璃基板4)上圖案形成彩色濾光片元件85而成。液晶層86係形成於TFT基板82與CF基板84之間。TFT基板82及CF基板84相當於申請專利範圍中記載之電子裝置。 FIG. 4 is a diagram showing a liquid crystal panel according to an embodiment of the present invention. The liquid crystal panel 80 is composed of a TFT substrate 82, a CF substrate 84, a liquid crystal layer 86, and the like. The TFT substrate 82 is formed by patterning TFT elements (thin film transistor elements) 83 and the like on the composite 2 (for example, the glass substrate 4 constituting the composite 2). The CF substrate 84 is formed by patterning a color filter element 85 on another composite body 2 (for example, the glass substrate 4 constituting the composite body 2). The liquid crystal layer 86 is formed between the TFT substrate 82 and the CF substrate 84. The TFT substrate 82 and the CF substrate 84 correspond to electronic devices described in the scope of the patent application.

圖5係表示本發明之一實施形態之太陽電池之圖。太陽電池90例如由複合體2、透明電極92、矽層94、反射電極96及密封板98等構成。矽層例如自陽極側起由p層(摻雜成p型之層)、i層(光吸收層)、n層(摻雜成n型之層)等構成。由透明電極92、矽層94及反射電極96等構成矽型太陽電池元件91。再者,太陽電池元件亦可為化合物型、色素增感型、量子點型等。 Fig. 5 is a diagram showing a solar cell according to an embodiment of the present invention. The solar cell 90 includes, for example, a composite body 2, a transparent electrode 92, a silicon layer 94, a reflective electrode 96, a sealing plate 98, and the like. The silicon layer is composed of, for example, a p-layer (a layer doped to a p-type), an i-layer (a light-absorbing layer), an n-layer (a layer doped to an n-type), and the like from the anode side. A silicon-type solar cell element 91 is constituted by a transparent electrode 92, a silicon layer 94, a reflective electrode 96, and the like. The solar cell element may be a compound type, a dye-sensitized type, a quantum dot type, or the like.

圖6係表示本發明之一實施形態之薄膜二次電池之圖。薄膜二次電池100例如由複合體2、透明電極102、電解質層104、集電層106、 密封層108及密封板109等構成。由透明電極102、電解質層104、集電層106及密封層108等構成薄膜二次電池元件101。再者,本實施形態之薄膜二次電池元件101為鋰離子型,亦可為鎳氫型、聚合物型、陶瓷電解質型等。 Fig. 6 is a view showing a thin film secondary battery according to an embodiment of the present invention. The thin film secondary battery 100 includes, for example, a composite body 2, a transparent electrode 102, an electrolyte layer 104, a current collecting layer 106, The sealing layer 108 and the sealing plate 109 are configured. The thin film secondary battery element 101 is composed of a transparent electrode 102, an electrolyte layer 104, a current collecting layer 106, a sealing layer 108, and the like. In addition, the thin film secondary battery element 101 of this embodiment is a lithium ion type, and may be a nickel-hydrogen type, a polymer type, a ceramic electrolyte type, or the like.

圖7係表示本發明之一實施形態之電子紙之圖。電子紙110例如由複合體2、TFT層112、包含電工學介質(例如微膠囊)之層114、透明電極116及前面板118構成。由TFT層112、包含電工學介質之層114及透明電極116等構成電子紙元件111。電子紙元件可為微膠囊型、橫向電場型、扭轉球型、粒子移動型、電子噴流型、聚合物網路型中之任意類型。 Fig. 7 is a diagram showing an electronic paper according to an embodiment of the present invention. The electronic paper 110 includes, for example, a composite body 2, a TFT layer 112, a layer 114 containing an electrical medium (for example, a microcapsule), a transparent electrode 116, and a front panel 118. The electronic paper element 111 is composed of a TFT layer 112, a layer 114 including an electrical medium, and a transparent electrode 116. The electronic paper element can be any of microcapsule type, transverse electric field type, twisted ball type, particle moving type, electronic jet type, and polymer network type.

[實施例] [Example]

以下藉由例等具體地說明本發明,但本發明並不限定於該等例。例1為實施例,例2及3為比較例。 Hereinafter, the present invention will be specifically described with examples, but the present invention is not limited to these examples. Example 1 is an example, and Examples 2 and 3 are comparative examples.

以下之例中,作為玻璃基板,使用玻璃基板X(平均厚度100μm,寬度方向厚度偏差1μm以下,無鹼玻璃,熱膨脹係數4×10-6/℃,拉伸彈性模數77GPa)。於玻璃基板X之表面上存在多處微小裂縫。微小裂縫之寬度W為10~100nm左右,深度d為10μm以下。 In the following examples, as the glass substrate, a glass substrate X (average thickness of 100 μm, thickness deviation in the width direction of 1 μm or less, alkali-free glass, thermal expansion coefficient of 4 × 10 −6 / ° C., and tensile elastic modulus of 77 GPa) was used. There are many small cracks on the surface of the glass substrate X. The micro-cracks have a width W of about 10 to 100 nm and a depth d of 10 μm or less.

再者,玻璃基板X係利用浮式法製作。具體而言,使熔融玻璃於熔融錫上流動而成形為帶板狀,待所成形之玻璃緩慢冷卻後,將已冷卻之玻璃切斷成所需尺寸。於緩冷步驟及切斷步驟中,利用壓縮空氣之空氣壓支持玻璃以使玻璃不與固體物接觸。切斷步驟中採用作為非接觸切斷法之雷射切斷法。 The glass substrate X is produced by a float method. Specifically, molten glass is formed by flowing on molten tin to form a strip shape. After the formed glass is slowly cooled, the cooled glass is cut to a desired size. In the slow cooling step and the cutting step, the glass is supported by the air pressure of the compressed air so that the glass is not in contact with solid objects. In the cutting step, a laser cutting method, which is a non-contact cutting method, is used.

<製造例1:聚醯胺酸溶液(P1)之製造> <Production Example 1: Production of Polyamic Acid Solution (P1)>

使對苯二胺(10.8g,0.1mol)溶解於1-甲基-2-吡咯啶酮(226.0g),於室溫下攪拌。向其中歷時1分鐘添加BPDA(3,3',4,4'-bisphenyltetracarboxylic dianhydride,3,3',4,4'-聯苯四羧酸二酐)(29.4 g,0.1mol),於室溫下攪拌2小時,獲得包含具有上述式(2-1)及/或式(2-2)所表示之重複單元之聚醯胺酸且固形物成分濃度20質量%之聚醯胺酸溶液(P1)。測定該溶液之黏度,結果於20℃下為3000厘泊。 P-phenylenediamine (10.8 g, 0.1 mol) was dissolved in 1-methyl-2-pyrrolidone (226.0 g) and stirred at room temperature. BPDA (3,3 ', 4,4'-bisphenyltetracarboxylic dianhydride, 3,3', 4,4'-biphenyltetracarboxylic dianhydride) was added thereto over 1 minute (29.4 g, 0.1 mol), and stirred at room temperature for 2 hours to obtain a polyamic acid having a repeating unit represented by the formula (2-1) and / or formula (2-2) and having a solid component concentration of 20 mass % Polyamine solution (P1). When the viscosity of this solution was measured, it was 3000 centipoise at 20 ° C.

黏度係使用Tokimec公司(股份)製造之DVL-BII型數位黏度計(B型黏度計),測定20℃下之旋轉黏度所得者。 The viscosity was obtained by measuring a rotational viscosity at 20 ° C. using a DVL-BII digital viscometer (B-type viscometer) manufactured by Tokimec (stock).

再者,聚醯胺酸中所含之式(2-1)及/或式(2-2)所表示之重複單元中之X為式(X1)所表示之基,A為式(A1)所表示之基。 Moreover, X in the repeating unit represented by Formula (2-1) and / or Formula (2-2) contained in polyamic acid is a base represented by Formula (X1), and A is Formula (A1) The indicated base.

<例1> <Example 1>

首先,對玻璃基板X進行純水清洗後,進而進行UV清洗而使之潔淨化。 First, the glass substrate X is cleaned by pure water cleaning and then UV cleaning.

繼而,利用旋轉塗佈機(轉數:2000rpm,15秒)將聚醯胺酸溶液(P1)塗佈於玻璃基板X之第1主面上,從而於玻璃基板X上設置包含聚醯胺酸之塗膜(塗膜量100g/m2)。 Next, a polyamic acid solution (P1) was applied on the first main surface of the glass substrate X by a spin coater (revolution number: 2000 rpm, 15 seconds), so that the glass substrate X was provided with polyamic acid. Coating film (coating film amount: 100g / m 2 ).

再者,上述聚醯胺酸係使上述式(Y1)所表示之化合物與式(B1)所表示之化合物反應而得之樹脂。 The polyamino acid is a resin obtained by reacting a compound represented by the formula (Y1) with a compound represented by the formula (B1).

其次,於大氣中、60℃下加熱30分鐘,其後於120℃下加熱30分鐘,進而歷時2小時升溫至350℃,於350℃下保持1小時,加熱塗膜而形成樹脂層(平均厚度:25μm)。所形成之樹脂層中包含具有下式所表示之重複單元之聚醯亞胺樹脂(式(I)中之X包含式(X1)所表示之基,A包含式(A1)所表示之基)。再者,醯亞胺化率為99.7%。 Next, it was heated in the air at 60 ° C for 30 minutes, and then heated at 120 ° C for 30 minutes, and then heated to 350 ° C over 2 hours and held at 350 ° C for 1 hour. The coating was heated to form a resin layer (average thickness) : 25 μm). The formed resin layer contains a polyimide resin having a repeating unit represented by the following formula (X in formula (I) contains a base represented by formula (X1), and A contains a base represented by formula (A1)) . Furthermore, the imidization rate of fluorene was 99.7%.

<例2> <Example 2>

將塗膜之加熱條件設為於60℃下加熱30分鐘,其後於120℃下加熱30分鐘,進而直接放入350℃之烘箱中加熱1小時,除此以外,利用與例1相同之方法獲得玻璃複合體。 The heating conditions of the coating film were set to be heated at 60 ° C for 30 minutes, and then heated at 120 ° C for 30 minutes, and then directly heated in an oven at 350 ° C for 1 hour, except that the same method as in Example 1 was used. A glass composite was obtained.

<例3> <Example 3>

利用與例1相同之方法成膜樹脂層(聚醯亞胺膜)後,暫時將聚醯亞胺膜剝離,使之與另一玻璃基板X重疊,使用三共製造之「HAL-TEC」,將壓入量設為1mm,於大氣下進行輥壓積層。 After the resin layer (polyimide film) was formed by the same method as in Example 1, the polyimide film was temporarily peeled to overlap with another glass substrate X. Using "HAL-TEC" manufactured by Sankyo, The press-in amount was set to 1 mm, and roll lamination was performed in the atmosphere.

<各種參數之測定> <Measurement of various parameters>

(「df/d」) (`` D f / d '')

微小裂縫之深度d係藉由對玻璃基板X實施後述破壞試驗後,利用光學顯微鏡直接觀察破壞起點而獲得。 The depth d of the micro-cracks is obtained by performing a damage test on the glass substrate X described later and then directly observing the damage origin with an optical microscope.

又,關於樹脂之深入深度df之測定,首先,藉由旋轉塗佈(2000rpm),於玻璃基板X之表面塗佈溶解有3-胺基丙基三乙氧基矽烷(KBM903)0.1質量%之異丙醇溶液。繼而,於80℃下乾燥10分鐘後,利用旋轉塗佈機(轉數:2000rpm,15秒)將包含螢光異硫氰酸鹽(濃度:0.01(mmol/l))與水溶性樹脂(聚乙烯醇)之水溶液塗佈於玻璃基板X之第1主面上。塗佈處理後,用純水對玻璃基板X進行3次沖洗,加以乾燥後,實施後述破壞試驗,其後使用螢光顯微鏡(Olympus)觀察破壞起點,觀察深入深度df。再者,上述水溶液中之聚乙烯醇之濃度係以使水溶液之黏度與上述聚醯胺酸溶液(P1)之黏度成為同等程度之方式進行調整。 For the measurement of the depth d f of the resin, first, by spin coating (2000 rpm), the surface of the glass substrate X was coated with 3-aminopropyltriethoxysilane (KBM903) dissolved in 0.1% by mass. Isopropanol solution. Then, after drying at 80 ° C for 10 minutes, a spin coater (revolution number: 2000 rpm, 15 seconds) was used to contain a fluorescent isothiocyanate (concentration: 0.01 (mmol / l)) and a water-soluble resin (poly An aqueous solution of vinyl alcohol) is applied to the first main surface of the glass substrate X. After the coating treatment, the glass substrate X was rinsed three times with pure water, dried, and then subjected to a damage test described later. Thereafter, the origin of the damage was observed using a fluorescence microscope (Olympus), and the depth d f was observed. The concentration of polyvinyl alcohol in the aqueous solution is adjusted so that the viscosity of the aqueous solution and the viscosity of the polyamic acid solution (P1) are the same.

又,上述揭示了利用螢光顯微鏡測定深入深度df之方法,對所獲得之複合體實施後述破壞試驗後,利用光學顯微鏡直接觀察破壞起點,結果觀測到與由上述螢光顯微鏡所獲得之深入深度df為同等程度 之值。 In addition, the method of measuring the depth d f by using a fluorescence microscope was disclosed above. After performing the damage test described below on the obtained composite, the origin of the damage was directly observed with an optical microscope. As a result, the depth obtained from the fluorescence microscope was observed. The depth d f is an equivalent value.

再者,於難以利用顯微鏡進行測定之情形時,根據破壞力學之基礎式d=(K/2σ)2(「陶瓷之破壞學」P68),由破壞應力、應力強度因數而求出理論值,並使用該值。 In addition, when it is difficult to measure with a microscope, the theoretical value is obtained from the fracture stress and stress intensity factor based on the basic formula of fracture mechanics d = (K / 2σ) 2 ("Ceramic Destruction" P68). And use that value.

(樹脂層之斷裂伸長率TE) (Elongation at break of resin layer TE)

樹脂層(聚醯亞胺樹脂層)之斷裂伸長率TE係依據ASTM D882-12進行測定。 The breaking elongation TE of the resin layer (polyimide resin layer) is measured in accordance with ASTM D882-12.

(樹脂層之降伏應力σS及拉伸彈性模數Eresin) (Residual stress σ S of resin layer and tensile elastic modulus E resin )

樹脂層(聚醯亞胺樹脂層)之降伏應力σS及拉伸彈性模數Eresin係依據JIS-C-2151:2006進行測定。 The yield stress σ S and the tensile elastic modulus E resin of the resin layer (polyimide resin layer) are measured in accordance with JIS-C-2151: 2006.

再者,關於樹脂層(聚醯亞胺樹脂層)之斷裂伸長率TE、樹脂層之降伏應力σS及樹脂層之拉伸彈性模數Eresin,自所獲得之複合體將樹脂層剝離後實施上述測定。於無法將樹脂層剝離之情形時,利用氫氟酸將玻璃基板溶解而獲得測定用樹脂層。 Furthermore, regarding the elongation at break TE of the resin layer (polyimide resin layer), the yield stress σ S of the resin layer, and the tensile elastic modulus E resin of the resin layer, the resin layer was peeled from the obtained composite. The above measurement was performed. When the resin layer cannot be peeled off, the glass substrate is dissolved with hydrofluoric acid to obtain a resin layer for measurement.

<評估(破壞試驗)> <Evaluation (damage test)>

藉由圖8之彎曲試驗裝置,對例1~3中準備之存在樹脂層之情形時之玻璃基板之平均破壞強度進行測定。 The average breaking strength of the glass substrate when the resin layer prepared in Examples 1 to 3 was prepared by the bending test apparatus of FIG. 8 was measured.

以下,首先,參照圖8,對不存在樹脂層之情形時之玻璃基板之平均破壞強度之測定方法進行說明。 Hereinafter, first, a method for measuring the average breaking strength of a glass substrate when a resin layer is not present will be described with reference to FIG. 8.

圖8係表示檢測本發明之玻璃基板之平均破壞強度之彎曲試驗裝置之圖。圖8中,若於實線所示之狀態下,下側支持盤相對於上側支持盤而向圖中左方向移動,則成為單點鏈線所示之狀態。 FIG. 8 is a diagram showing a bending test apparatus for detecting the average breaking strength of the glass substrate of the present invention. In FIG. 8, if the lower support plate moves to the left in the figure with respect to the upper support plate in the state shown by the solid line, it becomes the state shown by the single-dot chain line.

彎曲試驗裝置10如圖8所示,具備作為第1支持盤之上側支持盤14、作為第2支持盤之下側支持盤16,使試驗片材18於上側支持盤14與下側支持盤16之間彎曲。 As shown in FIG. 8, the bending test apparatus 10 includes an upper support tray 14 as a first support tray and a lower support tray 16 as a second support tray. The test sheet 18 is placed on the upper support tray 14 and the lower support tray 16. Bend between.

試驗片材18係對與欲知曉平均破壞強度之玻璃基板同一時間所 製作之玻璃基板進行加工而製成。同一時間製作之玻璃基板(例如同一批次之玻璃基板)可視為於表面具有同等程度之損傷。再者,試驗片材18亦可自欲知曉平均破壞強度之玻璃基板自身切割出。 The test sheet 18 was made at the same time as the glass substrate for which the average breaking strength was to be known. The produced glass substrate is processed and produced. Glass substrates made at the same time (for example, glass substrates of the same batch) can be regarded as having the same degree of damage on the surface. In addition, the test sheet 18 may be cut out by itself from a glass substrate that wants to know the average breaking strength.

試驗片材18於無外力之自然狀態下形成為矩形狀。試驗片材18之短邊長度為100mm,試驗片材18之長邊長度為150mm。 The test sheet 18 is formed in a rectangular shape in a natural state without external force. The short side length of the test sheet 18 is 100 mm, and the long side length of the test sheet 18 is 150 mm.

上側支持盤14支持試驗片材18。上側支持盤14之支持面14a為朝下之平坦面。於上側支持盤14之支持面14a例如利用膠帶等將試驗片材18之一短邊部加以固定。 The upper support plate 14 supports the test sheet 18. The support surface 14a of the upper support plate 14 is a flat surface facing downward. A short side portion of the test sheet 18 is fixed to the supporting surface 14 a of the upper supporting plate 14 by, for example, an adhesive tape or the like.

下側支持盤16與上側支持盤14同樣地支持試驗片材18。下側支持盤16之支持面16a為朝上之平坦面。於下側支持盤16之支持面16a載置矩形狀之試驗片材18之另一短邊部,利用靜止摩擦力加以固定。為了防止試驗片材18之位置偏移,而於下側支持盤16之支持面16a設置與試驗片材18之另一短邊部抵接之止動部17。 The lower support tray 16 supports the test sheet 18 in the same manner as the upper support tray 14. The support surface 16a of the lower support plate 16 is a flat surface facing upward. The other short side portion of the rectangular test sheet 18 is placed on the support surface 16 a of the lower support plate 16 and fixed by static friction. In order to prevent the positional deviation of the test sheet 18, a stopper 17 is provided on the support surface 16 a of the lower support plate 16 to be in contact with the other short side portion of the test sheet 18.

該彎曲試驗裝置10中,首先,作業人員對相互平行之上側支持盤14之支持面14a與下側支持盤16之支持面16a之間之間隔D進行調整,而使於上側支持盤14與下側支持盤16之間彎曲之試驗片材18產生特定之拉伸應力。 In this bending test apparatus 10, first, an operator adjusts the distance D between the support surface 14a of the upper support plate 14 and the support surface 16a of the lower support plate 16 in parallel with each other so that the upper support plate 14 and the lower The test sheet 18 bent between the side support discs 16 generates a specific tensile stress.

於試驗片材18之彎曲部之頂端(圖8中為試驗片材18之右端)產生之拉伸應力σ可基於下述式(2)算出。 The tensile stress σ generated at the tip of the curved portion of the test sheet 18 (the right end of the test sheet 18 in FIG. 8) can be calculated based on the following formula (2).

σ=A×E×t/(D-t)‧‧‧(2) σ = A × E × t / (D-t) ‧‧‧ (2)

上述式(2)中,A為本試驗中固有之常數(1.198),E為試驗片材18之拉伸彈性模數,t為試驗片材18之厚度。由式(2)明瞭,間隔D(D>2×t)越窄,則拉伸應力σ越大。 In the above formula (2), A is a constant (1.198) inherent in the test, E is a tensile elastic modulus of the test sheet 18, and t is a thickness of the test sheet 18. As is clear from the formula (2), the narrower the interval D (D> 2 × t), the larger the tensile stress σ.

繼而,作業人員於維持間隔D之狀態下,使相對於上側支持盤14之下側支持盤16之位置向特定方向移動1次。移動速度為10mm/s,移動距離為100mm,移動方向為與試驗片材18之短邊垂直之方向。 Then, the operator moves the position of the lower support disc 16 relative to the upper support disc 14 in a specific direction once while maintaining the interval D. The moving speed is 10 mm / s, the moving distance is 100 mm, and the moving direction is a direction perpendicular to the short side of the test sheet 18.

如此,由作業人員檢查於上側支持盤14與下側支持盤16之間彎曲之試驗片材18上是否形成裂縫。是否形成裂縫係利用檢測有無於形成裂縫時產生之AE(Acoustic Emission,聲波發射)波之AE感測器進行確認。 In this way, an operator checks whether a crack is formed in the test sheet 18 bent between the upper support pan 14 and the lower support disc 16. Whether or not a crack is formed is confirmed using an AE sensor that detects the presence of AE (Acoustic Emission) waves generated when a crack is formed.

於試驗片材18上未形成裂縫之情形時,作業人員將相互平行之上側支持盤14之支持面14a與下側支持盤16之支持面16a之間之間隔D縮窄。藉此,於上側支持盤14與下側支持盤16之間彎曲之試驗片材18產生高於前次之拉伸應力。 When no crack is formed in the test sheet 18, the operator narrows the interval D between the support surface 14a of the upper support plate 14 and the support surface 16a of the lower support plate 16 in parallel with each other. Thereby, the test sheet 18 bent between the upper support plate 14 and the lower support plate 16 generates a tensile stress higher than the previous time.

繼而,作業人員於維持間隔D之狀態下,使相對於上側支持盤14之下側支持盤16之位置發生移動,檢查於上側支持盤14與下側支持盤16之間彎曲之試驗片材18上是否形成裂縫。分階段縮窄間隔D而分階段增強對試驗片材18施加之拉伸應力σ,直至試驗片材18上形成裂縫,藉此得知試驗片材18之破壞強度。試驗片材18破裂時之拉伸應力σ係作為破壞強度使用。 Next, the operator moves the position relative to the lower support tray 16 relative to the upper support tray 14 while maintaining the interval D, and inspects the test sheet 18 bent between the upper support tray 14 and the lower support tray 16. Whether cracks are formed. The interval D is narrowed in stages and the tensile stress σ applied to the test sheet 18 is increased in stages until cracks are formed in the test sheet 18, thereby knowing the breaking strength of the test sheet 18. The tensile stress σ when the test sheet 18 is broken is used as the breaking strength.

5片試驗片材18之破壞強度之平均值係作為5片試驗片材18之平均破壞強度使用。 The average value of the breaking strength of the five test sheets 18 is used as the average breaking strength of the five test sheets 18.

其次,對具有樹脂層之複合體之平均破壞強度之測定方法進行說明。於存在樹脂層之情形時亦與不存在樹脂層之情形同樣地使用圖8所示之彎曲試驗裝置,進行彎曲試驗以使於玻璃基板之與樹脂層結合之主面產生拉伸應力。於玻璃基板之主面之彎曲部之頂端產生之拉伸應力σ可根據下述式(3)算出。 Next, a method for measuring the average breaking strength of a composite having a resin layer will be described. When the resin layer is present, the bending test apparatus shown in FIG. 8 is used in the same manner as in the case where the resin layer is not present, and a bending test is performed to generate tensile stress on the main surface of the glass substrate bonded to the resin layer. The tensile stress σ generated at the tip of the bent portion of the main surface of the glass substrate can be calculated by the following formula (3).

σ=A×E×t/(D'-t)‧‧‧(3) σ = A × E × t / (D'-t) ‧‧‧ (3)

上述式(3)中,A為本試驗中固有之常數(1.198),E為玻璃基板之拉伸彈性模數,t為玻璃基板之厚度,D'為由「D'=D-2×u」式所算出之值。u表示樹脂層之厚度。由於樹脂層之存在,玻璃基板之上端與下端之間隔較間隔D短2×u之量。再者,因樹脂層之存在而產生之 玻璃基板之中性面之位移量為玻璃基板厚度t之5%以下,幾乎不會對拉伸應力σ之計算結果造成影響,因此可忽視。所謂中性面係拉伸應力或壓縮應力均未產生之面,於不存在樹脂層之情形時為玻璃基板之板厚方向中心面。中性面之位移量可採用材料力學中通常之公式算出。玻璃基板破裂時之拉伸應力σb係作為破壞強度使用。 In the above formula (3), A is a constant (1.198) inherent in the test, E is the tensile elastic modulus of the glass substrate, t is the thickness of the glass substrate, and D ′ is given by “D '= D-2 × u ". u represents the thickness of the resin layer. Due to the presence of the resin layer, the distance between the upper end and the lower end of the glass substrate is shorter than the interval D by 2 × u. Furthermore, the amount of displacement of the neutral surface of the glass substrate due to the presence of the resin layer is 5% or less of the thickness t of the glass substrate, which hardly affects the calculation result of the tensile stress σ, so it can be ignored. The so-called neutral plane is a plane where neither tensile stress nor compressive stress is generated, and when there is no resin layer, it is the center plane in the thickness direction of the glass substrate. The amount of displacement of the neutral plane can be calculated using a formula commonly used in material mechanics. The tensile stress σ b when the glass substrate is broken is used as the breaking strength.

使用上述裝置,算出由補強層(樹脂層)之存在所實現之玻璃基板之平均破壞強度之提高率。該提高率係以不存在補強層之情形時之玻璃基板之平均破壞強度作為基準(100%)時之值。作為例1~3中之基準之平均破壞強度,使用玻璃基板X之平均破壞強度(154MPa)。 Using the above device, the improvement rate of the average breaking strength of the glass substrate realized by the presence of the reinforcing layer (resin layer) was calculated. The improvement rate is a value when the average breaking strength of the glass substrate in the case where there is no reinforcing layer is used as a reference (100%). As the reference average breaking strength in Examples 1 to 3, the average breaking strength (154 MPa) of the glass substrate X was used.

又,例1~3中所準備之複合體之可撓性係藉由複合體之撓曲剛度之上升率進行評估。此處,所謂「撓曲剛度之上升率」意指以不存在樹脂層之情形時之玻璃基板之撓曲剛度作為基準時之複合體之撓曲剛度之上升率。撓曲剛度可採用構造力學中通常之公式算出。撓曲剛度之上升率越低,則可撓性越佳。 In addition, the flexibility of the composites prepared in Examples 1 to 3 was evaluated by the increase rate of the flexural rigidity of the composites. Here, the "rise rate of flexural rigidity" means the rise rate of the flexural rigidity of the composite when the flexural rigidity of the glass substrate when the resin layer is not present is used as a reference. The deflection stiffness can be calculated using a formula commonly used in structural mechanics. The lower the rate of increase in flexural stiffness, the better the flexibility.

將評估結果示於表1。 The evaluation results are shown in Table 1.

如表1之例1所示,確認本發明之複合體展現出所期望之效果。又,撓曲剛度未太上升,因此可撓性未下降。 As shown in Example 1 of Table 1, it was confirmed that the composite of the present invention exhibited a desired effect. In addition, since the flexural rigidity did not increase too much, the flexibility did not decrease.

另一方面,不滿足本發明之要件之例2及3未獲得所期望之效 果。 On the other hand, Examples 2 and 3 which did not satisfy the requirements of the present invention did not achieve the desired effect. fruit.

以上說明了複合體等之實施形態,但本發明並不限定於上述實施形態。本發明可於申請專利範圍中所記載之主旨之範圍內加以變化或改良。 As mentioned above, although embodiment of a composite body etc. were described, this invention is not limited to the said embodiment. The present invention can be changed or improved within the scope of the subject matter described in the scope of patent application.

詳細地且參照特定之實施態樣說明了本發明,但業者明瞭,可於不脫離本發明之精神與範圍之情況下施加各種變更或修正。本申請案係基於2014年6月16日提出申請之日本專利申請(日本專利特願2014-123308)者,將其內容以參照之形式組入本說明書中。 The present invention has been described in detail and with reference to specific embodiments, but it is clear to those skilled in the art that various changes or modifications can be made without departing from the spirit and scope of the present invention. This application is based on a Japanese patent application filed on June 16, 2014 (Japanese Patent Application No. 2014-123308), the contents of which are incorporated herein by reference.

Claims (6)

一種複合體,其係具備表面存在微小裂縫之玻璃基板、與配置於上述玻璃基板上之樹脂層者,且上述樹脂層之樹脂深入至上述微小裂縫內部之至少一部分,上述樹脂距離上述玻璃基板表面之深入深度df相對於上述微小裂縫之深度d的比(df/d)、與上述樹脂層之斷裂伸長率TE(%)、及上述樹脂層之降伏應力σS(MPa)的乘積(比(df/d)×斷裂伸長率TE×降伏應力σS)為400MPa‧%以上,並且上述樹脂層之拉伸彈性模數Eresin為1.0GPa以上。A composite body comprising a glass substrate having microcracks on the surface and a resin layer disposed on the glass substrate, and the resin of the resin layer penetrates into at least a part of the interior of the microcracks, and the resin is distanced from the surface of the glass substrate The product of the ratio of the depth of deep d f to the depth d of the micro-cracks (d f / d), the elongation at break TE (%) of the resin layer, and the relief stress σ S (MPa) of the resin layer ( The ratio (d f / d) × elongation at break TE × drop stress σ S ) is 400 MPa ·% or more, and the tensile elastic modulus E resin of the resin layer is 1.0 GPa or more. 如請求項1之複合體,其中上述玻璃基板之平均厚度為10~200μm。For example, the composite of claim 1, wherein the average thickness of the glass substrate is 10 to 200 μm. 如請求項1之複合體,其中上述樹脂層之平均厚度為10~100μm。For example, the composite of claim 1, wherein the average thickness of the resin layer is 10 to 100 μm. 如請求項2之複合體,其中上述樹脂層之平均厚度為10~100μm。For example, the composite of claim 2, wherein the average thickness of the resin layer is 10 to 100 μm. 如請求項1至4中任一項之複合體,其中上述樹脂層包含聚醯亞胺。The composite according to any one of claims 1 to 4, wherein the resin layer contains polyimide. 一種電子裝置,其包含如請求項1至5中任一項之複合體、與形成於上述複合體之玻璃基板上之元件。An electronic device includes the composite according to any one of claims 1 to 5 and an element formed on a glass substrate of the composite.
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