TWI645194B - Probe module, probe device, and electronic component detection method and equipment using the probe device - Google Patents

Abstract

The invention provides a probe module, a probe device, and an electronic component detection method and device using the probe device. The probe module includes: a plurality of probes; a cover, provided with a plurality of chute slots, the A plurality of probes can be respectively slid in the corresponding chute; a base is provided below the casing, and a support is provided on the base; a plurality of elastic members are provided on the support, and one end of each elastic member The other end is in contact with the supporting base, and the other end is supported under the corresponding probe. The electronic component detection method includes: when the electronic component is transferred to the probe device by an intermittently rotating turntable, the moving mechanism is driven by the driving module. And the linkage probe module is displaced; when the plurality of probes contact the electronic component for characteristic detection, each of the plurality of probes is displaced in the corresponding chute to compress the corresponding elastic member.

Description

Probe module, probe device, and electronic component detection method and equipment using the probe device

The invention relates to a probe module, a probe device, and an electronic component detection method and equipment using the probe device, and more particularly, to a probe module, a probe device and a probe device capable of reducing the cost. Electronic component detection method and equipment.

According to the general electronic components have different physical characteristics, they often need to be packaged or sorted through testing and classification procedures. Patent No. M452344 "Electronic Component Testing Device" has disclosed a method for performing high voltage, high current and high voltage. A probe device for frequency detection, the probe structure of which is provided with a sheet-shaped probe, a strip-shaped, thicker and shorter detection rod, and a sheet-shaped, thinner and longer force connected between the two. Arm; the detection rod is arranged obliquely above the probe, the force arm extends obliquely upward from the upper surface of the probe to the bottom of the detection rod, so that the angle between the lower surface of the force arm and the upper surface of the probe is an acute angle, And a hollow buffer area is formed between the lower surface of the force arm and the upper surface of the probe; when the detection rod is in contact with the electronic component for detection, the detection rod applies the downward force to the inclined arm due to the weight of the electronic component. The pressure causes the force arm to bend downward to produce a slight deformation to achieve the effect of cushioning.

The conventional probe device uses a force arm to achieve the cushioning effect when detecting electronic components. However, because the weight of the electronic component is extremely light, the lower surface of the force arm must not only form an acute angle with the upper surface of the probe, and The force arm must have a certain length of length to ensure that the weight of the electronic components can slightly deform the force arm to achieve a cushioning effect; the probe rod of this probe structure is usually located above the probe obliquely, which will cause the probe structure The overall horizontal width increases due to electronic components Usually it is extremely small, and at least one electronic component must be tested by multiple probes at the same time. Therefore, the space configuration of the probe in the probe device becomes more complicated, which often makes the designer painstakingly carry out space planning, resulting in manufacturing costs. In addition, this probe structure is usually integrally formed, and the same arm cannot correspond to electronic components of different weights, so when testing electronic components of different weights, the designer must also redesign the arm to carry Weight and the operator must cooperate with the replacement of a different new probe structure, which also increases the use cost.

That is, the object of the present invention is to provide a probe module capable of reducing costs.

Another object of the present invention is to provide a probe device using the probe module provided by the object of the present invention.

Another object of the present invention is to provide an electronic component detection method using a probe device provided by another object of the present invention.

Another object of the present invention is to provide an electronic component detection device using the electronic component detection method provided by another object of the present invention.

Yet another object of the present invention is to provide an electronic component detection device using the probe device provided by another object of the present invention.

A probe module according to the purpose of the present invention includes: a plurality of probes; a cover provided with a plurality of slide grooves, the plurality of probes can be slid in the corresponding slide grooves respectively; a base provided in the Below the cover, a support seat is provided on the base; a plurality of elastic members are provided on the support seat, one end of each elastic member is in contact with the support seat, and the other end is supported under the corresponding probe.

According to another aspect of the present invention, a probe device using the probe module includes: a frame provided with a moving section; a moving mechanism provided in the moving section of the seat frame; the moving mechanism is provided with a A moving part and a supporting part; a driving module provided under the seat frame to move the moving mechanism up and down in the moving section; the probe module is provided on the supporting part and is linked by the moving mechanism And up and down reciprocating.

According to another object of the present invention, a method for detecting an electronic component, using the probe device as described, comprises: sliding a plurality of probes each in a corresponding chute, and supporting each corresponding elastic member in the chute; When the electronic component is carried over the probe device by an intermittently rotating turntable, the moving mechanism is driven by the driving module to move the probe module in linkage; when a plurality of probes contact the electronic component for characteristic testing, the plurality of probes are probed. The needles are each displaced in the corresponding chute to compress the corresponding elastic member.

An electronic component testing device according to another object of the present invention includes: a device for performing the electronic component testing method as described above.

According to still another object of the present invention, an electronic component detection device using the probe device includes: a work surface; a turntable provided on the work surface; the peripheral ring lines are arranged at equal intervals and outward openings are provided; The probe device is disposed below the work surface and used to detect an electronic component in the receiver.

In the probe module, the probe device, and the electronic component detection method and device using the probe device according to the embodiment of the present invention, the probe has a body portion, an extension portion, and a needle body portion with different horizontal widths, and the end faces of the three are all cut. Aligning the same vertical line can limit the overall horizontal width of the probe to the width of the body portion. This probe is relatively simple in spatial configuration and can reduce manufacturing costs; and the probe is in the probe module with its The guide part slides in the chute. When the probe device drives the probe module to displace the probe to contact the electronic component, the probe can compress the elastic member in the chute to buffer the pressure of the probe contacting the electronic component. It can replace the conventional force arm, and when testing electronic components with different weights, only the elastic parts corresponding to the elastic coefficients need to be replaced, without redesigning and replacing new probes, which can reduce the cost of use.

A‧‧‧ Probe

A1‧‧‧Body

A11‧‧‧Guide

A111‧‧‧first end face

A112‧‧‧Guide piece

A113‧‧‧Surface

A12‧‧‧side

A13‧‧‧Second end face

A14‧‧‧Fifth end face

A2‧‧‧ extension

A21‧‧‧Third end face

A22‧‧‧Fourth end face

A23‧‧‧Guide hole

A3‧‧‧Needle

A31‧‧‧Sixth end face

A32‧‧‧contact surface

B‧‧‧ Probe Module

B1‧‧‧Cover

B11‧‧‧Cover

B111‧‧‧spacer

B112‧‧‧Chute

B113‧‧‧long slot

B12‧‧‧ spacer

B13‧‧‧ Bolt

B14‧‧‧stop

B2‧‧‧base

B21‧‧‧Support

B22‧‧‧lack of slot

B3‧‧‧Elastic piece

C‧‧‧ Probe device

C1‧‧‧seat

C11‧‧‧First frame

C111‧‧‧ Pivot

C112‧‧‧Buffer

C113‧‧‧Slot

C12‧‧‧Second frame

C121‧‧‧through hole

C13‧‧‧moving interval

C131‧‧‧Guide

C2‧‧‧The first adjustment seat

C21‧‧‧Probe holder

C211‧‧‧ Probe hole seat

C212‧‧‧Probe hole

C22‧‧‧Fixed block

C221‧‧‧hole

C23‧‧‧First adjustment

C231‧‧‧eccentric

C232‧‧‧Shaft

C24‧‧‧Sliding part

C241‧‧‧ Pivot

C3‧‧‧ mobile agency

C31‧‧‧Mobile

C311‧‧‧Elastic piece

C312‧‧‧Receiving hole

C313‧‧‧Slot

C314‧‧‧Adjustment block

C315‧‧‧long slot

C316‧‧‧fine adjustment

C317‧‧‧eccentric

C318‧‧‧ Pivot

C32‧‧‧ support

C321‧‧‧hole

C4‧‧‧Second adjustment seat

C41‧‧‧Screw hole

C42‧‧‧Second adjustment

C421‧‧‧Thread

C422‧‧‧Card Insertion Section

C423‧‧‧Rotating part

C43‧‧‧Slot

C431‧‧‧ Pivot

C44‧‧‧Third adjustment

C441‧‧‧eccentric

C442‧‧‧Rotating part

C45‧‧‧Slot

C5‧‧‧Drive Module

C51‧‧‧Drive mechanism

C511‧‧‧Motor

C512‧‧‧cam

C52‧‧‧ Follower

C521‧‧‧Slide

C522‧‧‧Side panel

C523‧‧‧Slider

C524‧‧‧Top pin

C525‧‧‧ Follower

D‧‧‧Electronic component testing equipment

D1‧‧‧ work surface

D11‧‧‧Spigot

D2‧‧‧ Turntable

D21‧‧‧Tank

L1‧‧‧Horizontal

L2‧‧‧ vertical line

W‧‧‧Electronic components

FIG. 1 is a schematic perspective view of a probe in an embodiment of the present invention.

FIG. 2 is a schematic side view of a probe in an embodiment of the present invention.

FIG. 3 is a schematic perspective view of a probe module according to an embodiment of the present invention.

FIG. 4 is a three-dimensional exploded view of a probe module according to an embodiment of the present invention.

FIG. 5 is a schematic perspective view of a probe device according to an embodiment of the present invention.

6 is a schematic partial cross-sectional view of a probe device according to an embodiment of the present invention.

Fig. 7 is a schematic cross-sectional view taken along the line A-A of Fig. 6 in the embodiment of the present invention.

FIG. 8 is an exploded perspective view of the X, Y, and Z axis adjustment mechanisms of the probe device according to the embodiment of the present invention.

FIG. 9 is a three-dimensional exploded view of a probe device, a work surface, and a turntable of an electronic component detection device according to an embodiment of the present invention.

Please refer to FIGS. 1 and 2. A probe A according to an embodiment of the present invention includes: a body portion A1, a guide portion A11 protruding from a side surface A12 thereof, the guide portion A11 having a rectangular cross section and a guide portion; One of the first end faces A111 of A11 is flush with one of the second end faces A13 of the main body portion A1, and the two are aligned on the same horizontal line L1; the horizontal width of the guide portion A11 is slightly smaller than that of the main body portion A1 so that the side surface A12 can be partially It is revealed that a guide piece A112 and a blocking surface A113 are provided on the guide portion A11. The guide piece A112 can be screwed to the guide portion A11, and the screw can also make the wire (not shown) and the guide piece at the same time. A112 connection; an extension A2 extending upward from the body portion A1, provided with a third end face A21 and a fourth end face A22; the third end face A21 is flush with the fifth end face A14 of the body portion A1 opposite the second end face A13, Both are aligned on the same vertical line L2; the fourth end face A22 is inclined upward from the second end face A13 of the body portion A1 toward the third end face A21, so that the horizontal width of the extension portion A2 decreases upward; an extension portion A2 is provided with a The lead-through hole A23 can be connected to a wire (not shown) or a connecting piece (not shown). The connecting piece is a special For series or parallel with the time measurement probe A; A needle body portion A3 is provided above the extension portion A2. The needle body portion A3 has a rectangular cross section and a sixth end surface A31 is flush with the third end surface A21 of the extension portion A2 and the fifth end surface A14 of the main body portion A1. Cut the same vertical line L2; the needle body part A3 is provided with a rectangular contact surface A32; among them, the body part A1, the extension part A2 and the needle body part A3, the three have the same thickness but different vertical heights And horizontal width; the order of height from highest to lowest is body part A1> extension part A2> needle part A3; the order of width from wide to narrow is body part A1> extension part A2> needle part A3.

Please refer to FIGS. 3 and 4. The probe A of the embodiment of the present invention is used on the probe module B shown in the figure. The probe module B is provided with: a cover B1, which is provided with two The outer cover B11 and the two sheet spacers B12, the outer cover B11 and the spacer B12 are both insulating materials; inside each outer cover B11 is provided two parallel sliding grooves B112 separated by a one-piece spacer B111, and the outer cover B11 Two long slotted holes B113 are provided on the upper part for providing the lead piece A112 to pass through; two spacers B12 are sandwiched between the two covers B11 and passed through two pins B13 through the pins corresponding to the cover B11 and the spacer B12. The holes fix the two; the cover B1 is provided with two blocking members B14 of insulating material at the opening above the chute B112; four probes A are formed by two adjacent probes A having a mirrored symmetrical feature. The needle body parts A3 are arranged in a square matrix manner; the guide part A11 of the probe A can slide in the chute B112, and the blocking surface A113 on the guide part A11 can be blocked by the stopper B14 to guide. The portion A11 is kept sliding inside the cover B1, and the extension A2 and the needle body portion A3 are exposed outside the cover B1; each probe A is separated by a spacer B12 and a spacer B111 so that each Probe A will not cause detection errors due to contact; a base B2 is provided under the cover B1, a support base B21 of an insulating material is provided on the base B2, and a notch B22 is provided on one side of the base B2; four examples are A spring elastic member B3 is provided on the support base B21. One end of each elastic member B3 is in contact with the support base B21, and the other end is supported under the corresponding guide part A11 of the probe A. The probe A is supported by the elastic member B3. The top support is in contact with the stopper B14 with its blocking surface A113, so that each probe A can be maintained at the same level.

Please refer to FIGS. 5, 6, and 7. The probe module B according to the embodiment of the present invention is used on the probe device C shown in the figure. The probe device C is provided with: a rack C1, which is provided above A first frame C11 in an inverted L-shape and a second frame C12 in a horizontal position below the first frame C11 and the second frame C12 form a saddle-shaped seat C1. A moving section C13 is formed between the horizontal top of the body C11 and the second frame C12; a pivot seat C111 and a cushioning member C112 of a flexible material are arranged below the horizontal top of the first frame C11; a second frame C12 is provided with a A through-hole C121; a moving section C13 is provided with two guide members C131 parallel to each other in the Z-axis direction; a first adjusting seat C2 is provided above the horizontal top of the first frame C11, and a probe having a A probe holder C21 of the pinhole holder C211, which is provided with four probe holes C212 arranged in a square matrix; a moving mechanism C3 is provided in a moving section C13 of the holder C1, and the moving mechanism C3 is provided with a moving part C31 and a supporting part C32; a receiving part provided with an elastic member C311 such as a spring is arranged above the moving part C31 Hole C312, the elastic member C311 is located between the horizontal top of the first frame C11 and the moving portion C31, one end is pivoted on the pivot base C111 and the other end is located in the accommodation hole C312; a Z-axis direction is provided below the moving portion C31. Slot hole C313, and an adjustment block C314 is set in the slot hole C313. The adjustment block C314 is provided with a long slot hole C315, which can be inserted into the eccentric part C317 of the trimmer C316, and the trimmer C316 is rotated to adjust the adjustment block. The height of C314 in the slot C313; the moving part C31 is provided with two pivot holes C318 in the Z axis direction, and a guide C131 is provided to allow the moving mechanism C3 to move up and down in the moving section C13; the support A second adjusting seat C4 is provided on the part C32; a driving module C5 is provided under the seat frame C1, and the driving module C5 is provided with a driving mechanism C51 and a driven mechanism C52 driven by the driving mechanism C51; the driving mechanism C51 is provided with a motor C511 and a cam C512, and the motor C511 is provided on the second frame C12; the driven mechanism C52 is provided with a slide rail C521 Side plate C522 and a slider C523, the side plate C521 is provided on the second frame C12, and the slider C523 is provided with a top pin C524, which can pass through the through hole C121 of the second frame C12 and contact the moving mechanism C3. The adjusting block C314 and the bottom of the slider C523 are provided with a driven wheel C525 in contact with the cam C512. The driven mechanism C52 drives the cam C512 to rotate by the motor C511 to cause the slider C523 to reciprocate up and down on the slide C521. The top pin C524 is brought into contact with the adjustment block C314 of the moving mechanism C3, and the moving mechanism C3 is moved up and down in the moving section C13, and contacts the buffer C112 when the moving mechanism C3 moves upward; the probe module B is provided On the second adjustment base C4 of the support portion C32, the needle body portion A3 of the probe A can pass through the probe hole C212 by reciprocating up and down movement.

Please refer to FIG. 8. A horizontal axis C113 is provided on the horizontal top of the first frame C11, and a fixing block C22 is provided on the side of the first frame C11. An opening in the X-axis direction is provided on the fixing block C22. C221 communicates with the channel C113, and a first adjusting member C23 penetrates the channel C113 through the through hole C221. The first adjusting member C23 is provided with an eccentric portion C231 and a shaft portion C232; the first adjusting seat C2 is at A sliding portion C24 is protruded below, and a pivot hole C241 is provided on the sliding portion C24; a support C32 of the moving mechanism C3 is provided with a yoke C321 in the Y axis direction; a second adjustment seat C4 is provided with a screw in the Z axis direction The hole C41 can be provided with a second adjusting member C42. The second adjusting member C42 is provided with a threaded portion C421, an engaging portion C422, and a rotating portion C423. One side of the second adjusting seat C4 is provided with an X-axis direction. The channel C43, the supporting portion C32 is provided in the channel C43, the channel C43 is provided with a pivot hole C431, and a third adjusting member C44 is penetrated into the pivot hole C431 by the one of the support holes C32 through the hole C321. The third adjusting member C44 is provided with an eccentric portion C441 and a rotating portion C442; the other side of the second adjusting seat C4 is provided with a Z-axis direction Channel C45, probe module B is located in this channel C45; because probe A is not as flexible as the slender probe, it is necessary to adjust the position of probe A to make the needle of probe A The body A3 can be aligned with the probe hole C212 passing through the probe hole base C211, so that the contact surface A32 touches the bottom of the electronic component W; the probe device C can adjust the first adjustment base C2, the second adjustment base C4, and Adjust the X, Y, and Z axis directions of the probe device C with the relative position of the probe module B The first adjustment base C2 can be adjusted in the Y-axis direction. A sliding portion C24 below the first adjustment base C2 is installed in a channel C113 at the top of the first frame C11, so that the eccentric portion of the first adjustment piece C23 C231 is embedded in the pivot hole C241, and the first adjustment seat C2 is displaced in the Y-axis direction on the first frame C11 by rotating the shaft C232, and the first adjustment is performed by a plurality of screws when moving to a certain position The base C2 is fixed on the first frame C11; the probe module B can be adjusted in the X or Z axis direction. When the Z axis is adjusted, the probe module B side is abutted against the second adjustment base C4. In the channel C45 on the side, the engaging portion C422 of the second adjusting member C42 is inserted into the lacking groove B21 of the probe module B, and the threaded portion C421 is screwed into the screw hole C41 of the second adjusting seat C4. C423 performs the displacement of the probe module B on the second adjustment base C4 in the Z axis direction, and when moving to a certain position, fixes the position of the probe module B on the second adjustment base C4 with a plurality of screw fixtures; When adjusting in the X-axis direction, the support portion C32 abuts on the channel C43 on the other side of the second adjustment base C4, so that the eccentric portion C441 of the third adjustment member C44 Into the pivot hole C431, the second adjustment base C4 is displaced in the X-axis direction on the support portion C32 by rotating the rotating portion C442, and the second adjustment base C4 is fixed to the position by a plurality of screws when moving to a certain position. On the support portion C32.

Please refer to FIG. 9. The probe device C according to the embodiment of the present invention is used in the electronic component testing equipment D shown in the figure. The electronic component testing equipment D is provided with a work surface D1, which is horizontally disposed thereon. A cutout D11 is set up; a turntable D2 is set on the work surface D1, and a circumferential groove is arranged at equal intervals and an outward opening is provided in the groove D21, and the electronic component W flows intermittently in the groove D21 It is transported by the turntable D2; the probe device C is located below the work surface D1, and is used to detect the physical characteristics of the electronic component W in the tank D21. The probe holder C21 of the probe device C can extend into the opening D11. The middle of the probe hole base C211 is approximately aligned with the upper surface of the work surface D1.

In the implementation of the electronic component detection method of the embodiment of the present invention, four probes A are arranged in a square matrix manner, so that the guide portion A11 of each probe A can slide in the corresponding chute B112, and each is subject to sliding. The corresponding elastic piece B3 in the groove B112 is supported by the top; when the electronic component W is carried over the probe device C by an intermittently rotating turntable D2, the moving mechanism C3 is driven by the drive module C5 to move the probe module B upward. ; When each probe A performs physical property detection on the bottom of the electronic component W in the contact surface A32 of the needle body A3 top contact volume D21, the probe A uses its guide A11 due to the weight of the electronic component W The corresponding elastic member B3 is compressed and displaced downward in the corresponding chute B112 to achieve the buffer effect.

In the probe module, the probe device, and the electronic component detection method and device using the probe device according to the embodiment of the present invention, the probe A has a body portion A1, an extension portion A2, and a needle body portion A3 and three of different horizontal widths. The end faces A31, A21, and A14 are all aligned on the same vertical line L2, which can limit the overall horizontal width of the probe A to the width of the body portion A1. This probe A is simple in space configuration and can reduce manufacturing Cost; and the probe A slides in the chute B112 with its guide A11 in the probe module B. When the probe device C drives the probe module B to displace and makes the probe A contact the electronic component W The probe A can compress the elastic member B3 in the chute B112 to cushion the pressure of the probe A contacting the electronic component W. Not only can it replace the conventional force arm, but when testing electronic components with different weights, it only needs to be replaced. The elastic component B3 of the elastic coefficient does not need to be redesigned and replaced with a new probe A, which can reduce the cost of use.

However, the above are only the preferred embodiments of the present invention. When the scope of implementation of the present invention cannot be limited by this, that is, the simple equivalent changes and modifications made according to the scope of the patent application and the description of the invention, All are still within the scope of the invention patent.

Claims (11)

A probe module includes: a plurality of probes; a cover provided with a plurality of slide grooves, the plurality of probes can be slid in the corresponding slide grooves respectively; a base provided under the cover, The base is provided with a support base; a plurality of elastic members are arranged on the support base, one end of each elastic member is in contact with the support base, and the other end is supported under the corresponding probe. The probe module according to item 1 of the patent application scope, wherein the probe comprises: a body portion; an extension portion extending upward from the body portion; a needle body portion provided above the extension portion; the body The body part, the extension part and the needle body part respectively have different horizontal widths, and the width is sorted from wide to narrow as the body part> the extension part> the needle body part; one end face of the body part is flush with the One end surface of the extension portion and one end surface of the needle body portion are all aligned on the same vertical line. According to the probe module according to item 2 of the scope of patent application, the main body part is provided with a guide part on one side thereof, the guide part has a rectangular cross section and one end face of the guide part is flush with the main body part. One end face, both are aligned on the same horizontal line. According to the probe module according to item 3 of the patent application scope, a guiding member is provided on the guiding portion for connecting with the lead wire. The probe module according to item 2 of the scope of patent application, wherein the horizontal width of the extension portion decreases upward. The probe module according to item 2 of the scope of patent application, wherein the extension portion is provided with a lead-through hole for connecting with the lead wire. The probe module according to item 2 of the scope of patent application, wherein the needle body is provided with a rectangular contact surface. A probe device using the probe module according to any one of claims 1 to 7 of the scope of patent application, comprising: a frame provided with a moving section; a moving mechanism provided in the moving section of the seat frame, The moving mechanism is provided with a moving part and a supporting part; a driving module is arranged below the seat frame, so that the moving mechanism moves up and down in the moving section; the probe module is arranged on the supporting part, Reciprocated by the moving mechanism to move up and down. An electronic component detection method using the probe device described in item 8 of the scope of patent application, comprising: sliding a plurality of probes each in a corresponding chute, and each receiving a corresponding elastic member top support in the chute; When the electronic component is carried over the probe device by an intermittently rotating turntable, the moving mechanism is driven by the driving module to move the probe module in linkage; when a plurality of probes contact the electronic component for characteristic detection, the plurality of probes are The needles are each displaced in the corresponding chute to compress the corresponding elastic member. An electronic component testing device includes: a device for performing the electronic component testing method according to item 9 of the scope of patent application. An electronic component testing equipment using the probe device as described in item 8 of the scope of patent application, comprising: a work surface; a turntable provided on the work surface, the peripheral ring lines of which are arranged at equal intervals and are provided with outward openings Receptacle; the probe device is arranged below the work surface and used to detect an electronic component in the receptacle.