CN206178060U - Smart card chip test machine - Google Patents
Smart card chip test machine Download PDFInfo
- Publication number
- CN206178060U CN206178060U CN201621182009.XU CN201621182009U CN206178060U CN 206178060 U CN206178060 U CN 206178060U CN 201621182009 U CN201621182009 U CN 201621182009U CN 206178060 U CN206178060 U CN 206178060U
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- China
- Prior art keywords
- probe
- console
- smart card
- chip
- card chip
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Abstract
The utility model discloses a smart card chip test machine relates to chip testing technical field, be equipped with probe test board including having the control cabinet of power and place to await measuring and try the workstation of chip, corresponding above the workstation, be equipped with a plurality of probe on the probe test board, the probe test board links to each other with telescopic machanism, the control cabinet links to each other with the probe and the examination chip that awaits measuring respectively through the wire, and opening of telescopic machanism of control cabinet control is stopped, through the telescopic machanism drive probe and the examination chip contact of awaiting measuring. Through telescopic machanism drive probe test board up -and -down motion, make on the probe test board a plurality of probes simultaneously with the workstation on the examination chip contact of awaiting measuring, realize the functional test of tin piece on a plurality of chips, can once only accomplish the functional test of tin piece on all chips. Utilize the utility model discloses can shorten test time, convenient operation is swift, can save a large amount of manpower and materials, improves work efficiency greatly, reduction in production cost has satisfied mass production's needs.
Description
Technical field
The utility model is related to chip testing technology field, more particularly to a kind of smart card chip testing machine.
Background technology
At present, as the application of smart card is more and more extensive, its output is also increasing.Smart card be by layer of PVC and
Chip, coil are formed by lamination, punching, and as social demand is increased, present smart card is usually to be rushed on whole PVC core
Go out several placement holes coincideing with chip, chip be placed in placement hole, by butt-joint by the point tin at chip welding spot with
Coil the end of a thread is welded and fixed, then forms individual card by postorder lamination, punching.After chip and the welding of coil the end of a thread, in order to
Whether tin piece function in test chip after butt-joint normal, traditional method of testing be using the single head tester made by hand come
Test tin piece function.This method of testing needs manually to test tin piece on chip one by one, not only increased operating personnel
Labour intensity, also waste the plenty of time, operating efficiency is low, is unfavorable for producing in enormous quantities.
Utility model content
Technical problem to be solved in the utility model is to provide a kind of simple structure, easy to operate intelligent card chip and surveys
Test-run a machine, can realize testing tin piece on multiple chips simultaneously, improve operating efficiency, reduce labor intensity of operating staff.
In order to solve the above technical problems, technical solution adopted in the utility model is：
A kind of smart card chip testing machine, including the console with power supply and place PVC cores workbench, workbench
Top is correspondingly provided with probe test plate, and the probe test plate is provided with several probes, the probe test plate and telescopic machine
Structure is connected, and the console is connected with the chip to be tested on probe and PVC cores respectively by wire, and console control is flexible
The start and stop of mechanism, drive probe to be contacted with chip to be tested by telescoping mechanism.
Preferably, the probe is arranged in sleeve pipe, and described sleeve pipe is arranged on probe test plate, and the probe pin upper ends lead to
Spring is crossed to be connected with sleeve pipe.
Preferably, also including indicator lamp, the indicator lamp is arranged on the wire that probe is connected with console；The work
Platform is isolation material.
Preferably, the telescoping mechanism is cylinder, and the probe test plate is arranged on the piston rod end of cylinder, controls gas
The button of cylinder is arranged on console.
Preferably, the console is arranged on workbench top by support, and the cylinder block is arranged under console
On the installing plate of side.
Preferably, two adjacent sides of the workbench are provided with location-plate.
Preferably, the console is additionally provided with display screen.
It is using the beneficial effect produced by above-mentioned technical proposal：Probe test plate is driven to transport up and down by telescoping mechanism
It is dynamic, make some probes on probe test plate while being contacted with chip to be tested on workbench, realize that the function of multiple spot tin piece is surveyed
Examination, can disposably complete the functional test of tin piece on all chips.Can shorten testing time, easy to operate using the utility model
Fast, a large amount of manpower and materials can be saved, operating efficiency is greatly improved, production cost is reduced, the need of production in enormous quantities are met
Will.
Brief description of the drawings
The utility model is described in further detail with reference to the accompanying drawings and detailed description.
Fig. 1 is structural representation of the present utility model；
Fig. 2 is the top view of workbench；
Fig. 3 is the scheme of installation of Fig. 1 middle probes；
In figure：1- consoles, 2- workbench, 3- probe test plates, 4- probes, 5- telescoping mechanisms, 6- supports, 7- is installed
Plate, 8- location-plates, 9- display screens, 10- sleeve pipes, 11- springs, 12- guide pillars, 13- buttons, 14- wires, 15- chips to be tested,
16-PVC cores.
Specific embodiment
With reference to the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is carried out clearly
Chu, it is fully described by, it is clear that embodiments described below is only a part of embodiment of the present utility model, rather than complete
The embodiment in portion.Based on the embodiment in the utility model, those of ordinary skill in the art are not before creative work is made
The every other embodiment for being obtained is put, the scope of the utility model protection is belonged to.
A kind of smart card chip testing machine as shown in Figure 1, including the console 1 with power supply and placement PVC cores 16
Workbench 2, the top of workbench 2 is correspondingly provided with probe test plate 3, and the probe test plate 3 is provided with several probes 4, institute
Probe test plate 3 is stated to be connected with telescoping mechanism 5, the console 1 by wire respectively with probe 4 and PVC cores 16 on treat
Test chip 15 is connected, and console 1 controls the start and stop of telescoping mechanism 5, and probe 4 and chip to be tested are driven by telescoping mechanism 5
15 contacts；The workbench 2 is isolation material, it is to avoid the tin built-in testing on interference chip 15 to be tested.By telescoping mechanism 5
Oscilaltion, makes probe test plate 3 be contacted with tin piece on chip to be tested 15, is tested using probe 4 on chip to be tested 15
Tin piece function；Telescoping mechanism 5 is driven using console 1 simultaneously, tin can be intuitively embodied using the display screen 9 on console 1
Whether piece function is normal.
In order to slow down impulsive force suffered when probe 4 is contacted with chip to be tested 15, probe 4 is arranged on sleeve pipe by such as Fig. 3
In 10, described sleeve pipe 10 is arranged on probe test plate 3, and the upper end of the probe 4 is connected by spring 11 with sleeve pipe 10.With spy
Pin test board 3 is descending, and spring 11 is compressed, and probe 4 is fully contacted with chip；It is completed, probe test plate 3 is up,
In the presence of spring 11, the resilience of probe 4 resets.
In order to intuitively embody the place that tin piece function goes wrong, set on the wire 14 that probe 4 is connected with console 1
Put indicator lamp, it is also possible to install alarm additional in indicator lamp position, during the failure that goes wrong, send alarm, be more beneficial for operator
Member pinpoints the problems.
In a preferred embodiment of the present utility model, the telescoping mechanism 5 selects cylinder, the probe test plate 3
The piston rod end of cylinder is arranged on, controls the button 13 of cylinder to be arranged on console 1.Spy is driven by the lifting of cylinder
Pin test board 3 and its adjustment 4 are lifted, and realize the tin piece functional test to different chips to be tested 15.
In addition, operating personnel's operation for convenience, is arranged on console 1 the top and human arm highly matches,
The console 1 is arranged on the top of workbench 2 by support 6, and the cylinder block is arranged on the installing plate 7 of the lower section of console 1
On.In order to ensure that probe test plate 3 is lifted steadily, the guide pillar 12 coordinated with installing plate 7, peace are provided with the top of probe test plate 3
The dress correspondence guide pillar 12 of plate 7 position is provided with pilot hole.
In a specific embodiment of the present utility model, such as Fig. 2, in order to ensure the accurate positioning of chip to be tested 15
Property, two adjacent sides of the workbench 2 are provided with location-plate 8.After chip to be tested 15 completes test on a PVC core,
Lifted down from workbench 2, only next PVC core need to be abutted location-plate 8, it is possible to be easily located placement, it is convenient
Probe 4 is accurately positioned with chip to be tested 15, decreases operating personnel's debug time, improves operating efficiency, while also protecting
The degree of accuracy of test is demonstrate,proved.
In sum, the utility model has the advantages that simple structure, easy to operate, using air cylinder driven probe test plate
Move up and down, the tin piece of chips to be tested 15 multiple with workbench is contacted simultaneously to make some probes on probe test plate, real
The functional test of tin piece, can disposably complete the functional test of all tin pieces on chip on existing multiple chip.It is new using this practicality
Type can be realized testing multiple spot tin piece simultaneously, improve operating efficiency, reduce labor intensity of operating staff, while also improve surveying
Precision, especially adapts to produce in enormous quantities.
Many details are elaborated in superincumbent description in order to fully understand the utility model, but this practicality is new
Type can also be different from other manner described here using other be implemented, and those skilled in the art can be without prejudice to this reality
Similar popularization is done with the case of new intension, therefore the utility model is not limited by particular embodiments disclosed above.
Claims (7)
1. a kind of smart card chip testing machine, it is characterised in that：Including the console (1) with power supply and placement PVC cores
(16) workbench (2), workbench (2) top is correspondingly provided with probe test plate (3), and the probe test plate (3) is if be provided with
A dry probe (4), the probe test plate (3) is connected with telescoping mechanism (5), the console (1) by wire respectively with spy
Chip to be tested (15) on pin (4) and PVC cores (16) is connected, and the start and stop of console (1) control telescoping mechanism (5) pass through
Telescoping mechanism (5) drives probe (4) to be contacted with chip to be tested (15).
2. smart card chip testing machine according to claim 1, it is characterised in that：The probe (4) is installed in sleeve pipe
(10) in, on probe test plate (3), probe (4) upper end passes through spring (11) and sleeve pipe to described sleeve pipe (10)
(10) it is connected.
3. smart card chip testing machine according to claim 1, it is characterised in that：Also include indicator lamp, the indicator lamp
It is arranged on the wire (14) that probe (4) is connected with console (1)；The workbench (2) is isolation material.
4. smart card chip testing machine according to claim 3, it is characterised in that：The telescoping mechanism (5) is cylinder, institute
The piston rod end that probe test plate (3) is arranged on cylinder is stated, controls the button (13) of cylinder to be arranged on console (1).
5. smart card chip testing machine according to claim 4, it is characterised in that：The console (1) is by support (6)
Workbench (2) top is arranged on, the cylinder block is arranged on the installing plate (7) below console (1).
6. smart card chip testing machine according to claim 1, it is characterised in that：The adjacent both sides of the workbench (2)
While being provided with location-plate (8).
7. smart card chip testing machine according to claim 1, it is characterised in that：The console (1) is additionally provided with display
Screen (9).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621182009.XU CN206178060U (en) | 2016-10-27 | 2016-10-27 | Smart card chip test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621182009.XU CN206178060U (en) | 2016-10-27 | 2016-10-27 | Smart card chip test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206178060U true CN206178060U (en) | 2017-05-17 |
Family
ID=58682337
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621182009.XU Active CN206178060U (en) | 2016-10-27 | 2016-10-27 | Smart card chip test machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206178060U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107728041A (en) * | 2017-10-11 | 2018-02-23 | 李贺满 | A kind of electronic circuit board electric property detection device |
| CN107957549A (en) * | 2018-01-17 | 2018-04-24 | 浙江吉坤电气有限公司 | A kind of test device of omnipotent breaker |
| CN109254179A (en) * | 2017-07-12 | 2019-01-22 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| CN110836985A (en) * | 2018-08-15 | 2020-02-25 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| CN113791251A (en) * | 2021-11-15 | 2021-12-14 | 新恒汇电子股份有限公司 | Method, device and product for detecting failure of SIM card |
| CN113917319A (en) * | 2021-12-06 | 2022-01-11 | 新恒汇电子股份有限公司 | Chip packaging switching test device and method |
-
2016
- 2016-10-27 CN CN201621182009.XU patent/CN206178060U/en active Active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109254179A (en) * | 2017-07-12 | 2019-01-22 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| CN107728041A (en) * | 2017-10-11 | 2018-02-23 | 李贺满 | A kind of electronic circuit board electric property detection device |
| CN107957549A (en) * | 2018-01-17 | 2018-04-24 | 浙江吉坤电气有限公司 | A kind of test device of omnipotent breaker |
| CN110836985A (en) * | 2018-08-15 | 2020-02-25 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| CN113791251A (en) * | 2021-11-15 | 2021-12-14 | 新恒汇电子股份有限公司 | Method, device and product for detecting failure of SIM card |
| CN113791251B (en) * | 2021-11-15 | 2022-03-29 | 新恒汇电子股份有限公司 | Method, device and product for detecting failure of SIM card |
| CN113917319A (en) * | 2021-12-06 | 2022-01-11 | 新恒汇电子股份有限公司 | Chip packaging switching test device and method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder | ||
| CP02 | Change in the address of a patent holder |
Address after: 523000 No. 6 Zhenglongheng Street, Four Villages, Tangxia Town, Dongguan City, Guangdong Province Patentee after: Dongguan Hongtong Smart Card Co., Ltd. Address before: 523000 Workshop B (Second Floor) of No. 9 High-tech Second Road, Four Villages, Tangxia Town, Dongguan City, Guangdong Province Patentee before: Dongguan Hongtong Smart Card Co., Ltd. |