TWI623630B - Resistance material - Google Patents

Resistance material Download PDF

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TWI623630B
TWI623630B TW105100055A TW105100055A TWI623630B TW I623630 B TWI623630 B TW I623630B TW 105100055 A TW105100055 A TW 105100055A TW 105100055 A TW105100055 A TW 105100055A TW I623630 B TWI623630 B TW I623630B
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alloy
tcr
temperature side
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TW201631169A (en
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Wataru Shiomi
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Hitachi Metals Ltd
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    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/05Alloys based on copper with manganese as the next major constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C13/00Resistors not provided for elsewhere

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Abstract

本發明的電阻材料,係由含有Cu、6.20質量%以上且7.40質量%以下的Mn、以及0.15質量%以上且1.50質量%以下的Si之Cu合金所構成,在25℃至150℃的TCR絕對值係15ppm/K以下。 The electric resistance material of the present invention is composed of a Cu alloy containing Cu, 6.20% by mass or more and 7.40% by mass or less of Mn, and 0.15 mass% or more and 1.50 mass% or less of Si, and an absolute TCR at 25 ° C to 150 ° C. The value is 15 ppm/K or less.

Description

電阻材料 Resistance material

本發明係關於電阻材料。 The present invention relates to resistive materials.

電流感測器的電阻器等所使用電阻材料,係使用在室溫附近的電氣電阻之值(電阻值)變動較小的電阻材料。此種電阻材料一般已知有含有Cu、Mn及Ni的12Mn-4Ni-Cu合金、7Mn-2.3Sn-Cu系合金。又,其他的電阻用合金材料在日本專利特開2006-270078號公報、以及平山宏之著作的「電氣試驗所研究報告第618號相關精密電阻材料之研究」電氣試驗所、昭和36年(1961年)10月、p.52-55(以下稱「平山論文」)中已有揭示。 The resistor material used for the resistor of the current sensor or the like is a resistor material having a small variation in the value (resistance value) of the electric resistance near room temperature. Such a resistive material is generally known as a 12Mn-4Ni-Cu alloy containing Cu, Mn, and Ni, and a 7Mn-2.3Sn-Cu alloy. In addition, other alloy materials for electric resistance are disclosed in the "Electrical Laboratory Research Report No. 618 Related Precision Resistance Materials" Electric Test Laboratory, Showa 36 (1961) ) October, p.52-55 (hereinafter referred to as "Pingshan Paper") has been revealed.

日本專利特開2006-270078號公報揭示有:含有Cu、與6wt%以上且12wt%以下的Mn、1wt%以上且3wt%以下的Al、以及2wt%以上且3wt%以下的Sn之電阻用合金材料。該日本專利特開2006-270078號公報揭示有:電阻用合金材料從-55℃至25℃的低溫側TCR[Temperature Coefficient of Resistance(電阻溫度係數),將電阻材料因溫度變化所造成之電阻值變化的大小,依每1K的百萬分率所表示的值)、與從25℃至100℃的高溫側TCR。另一方面,日 本專利特開2006-270078號公報並未揭示含超過100℃之溫度區域的電阻用合金材料之TCR。 JP-A-2006-270078 discloses an alloy for electric resistance containing Cu, Mn of 6 wt% or more and 12 wt% or less, Al of 1 wt% or more and 3 wt% or less, and Sn of 2 wt% or more and 3 wt% or less. material. Japanese Laid-Open Patent Publication No. 2006-270078 discloses a low-temperature side TCR [Temperature Coefficient of Resistance) of an alloy material for electric resistance from -55 ° C to 25 ° C, and a resistance value of a resistive material due to temperature change. The magnitude of the change, expressed as a value per million of 1K, and the high temperature side TCR from 25 ° C to 100 ° C. On the other hand, day The TCR of an alloy material for electric resistance containing a temperature region exceeding 100 ° C is not disclosed in Japanese Laid-Open Patent Publication No. 2006-270078.

再者,平山論文揭示了含有:Cu、9wt%以上且14wt%以下的Mn、以及0.25wt%以上且2wt%以下的Si之電阻材料。該平山論文揭示有滿足上述組成的電阻材料溫度係數α25及β。 Further, the Hirayama paper discloses a resistive material containing: Cu, 9 wt% or more and 14 wt% or less of Mn, and 0.25 wt% or more and 2 wt% or less of Si. The Pingshan paper reveals temperature coefficient α 25 and β of the resistive material satisfying the above composition.

此處,特別係汽車電池的電流感測器所使用電阻器,因為電池剩餘量係利用在電阻器中流通的電流值積分計算出,因而當電阻器的溫度發生變化時,若電阻值的變動較大,則電流檢測產生誤差,結果有無法正確掌握電池剩餘量的問題。所以,高精度電流感測器所使用的電阻器,係要求不侷限於例如25℃至60℃的溫度範圍(以下稱「中溫側」),在例如-50℃至25℃的低溫側、以及例如25℃至150℃的高溫側等廣泛圍溫度範圍中,能降低TCR絕對值,而縮小電阻值的變動。特別係在電阻器周圍溫度容易上升的車用用途中,為了縮小高溫環境下的電阻值變動,熱切殷盼例如25℃至150℃的高溫側TCR絕對值能在15ppm/K以下。 Here, in particular, the resistor used in the current sensor of the automobile battery is used because the remaining amount of the battery is calculated by integrating the current value flowing in the resistor, and thus the resistance value changes when the temperature of the resistor changes. If it is large, the current detection generates an error, and as a result, there is a problem that the remaining amount of the battery cannot be correctly grasped. Therefore, the resistor used in the high-precision current sensor is not limited to, for example, a temperature range of 25 ° C to 60 ° C (hereinafter referred to as "medium temperature side"), and is, for example, a low temperature side of -50 ° C to 25 ° C, And in a wide temperature range such as a high temperature side of 25 ° C to 150 ° C, the absolute value of TCR can be lowered, and the variation of the resistance value can be reduced. In particular, in automotive applications where the temperature around the resistor is likely to rise, in order to reduce the variation in the resistance value in a high-temperature environment, it is expected that the absolute value of the TCR on the high-temperature side of, for example, 25 ° C to 150 ° C can be 15 ppm / K or less.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2006-270078號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2006-270078

[非專利文獻1]平山宏之、「電氣試驗所研究報告第618號 相關精密電阻材料之研究」電氣試驗所、昭和36年10月、p.52-55 [Non-Patent Document 1] Hirayama Hiroshi, "Electrical Laboratory Research Report No. 618 Research on Related Precision Resistance Materials", Electric Laboratory, Showa 36, October, p.52-55

然而,一般作為電阻材料使用的12Mn-4Ni-Cu合金、7Mn-2.3Sn-Cu系合金,雖在室溫附近的電阻值變動較小,但在遠離室溫的溫度範圍下,有電阻值變動變大的不良情況。特別係在包含超過100℃溫度區域的25℃至150℃高溫側,有TCR絕對值超過15ppm/K的不良情況。此現象已由本案發明人確認完畢。所以,在亦包含超過100℃溫度區域之例如25℃至150℃的廣溫度範圍中,有無法高精度檢測電流的問題。 However, the 12Mn-4Ni-Cu alloy and the 7Mn-2.3Sn-Cu alloy which are generally used as a resistive material have a small change in resistance value at room temperature, but have a resistance value change in a temperature range away from room temperature. The big problem is getting bigger. In particular, in the case of a high temperature side of 25 ° C to 150 ° C including a temperature region exceeding 100 ° C, there is a problem that the absolute value of TCR exceeds 15 ppm/K. This phenomenon has been confirmed by the inventor of this case. Therefore, in a wide temperature range including, for example, a temperature range of more than 100 ° C, for example, 25 ° C to 150 ° C, there is a problem that current cannot be detected with high precision.

再者,日本專利特開2006-270078號公報,如上述並未揭示包含超過100℃溫度區域的電阻用合金材料之TCR。所以,與12Mn-4Ni-Cu合金、7Mn-2.3Sn-Cu系合金同樣地,在包含超過100℃溫度區域之例如25℃至150℃溫度範圍中,電阻用合金材料的TCR絕對值超過15ppm/K,結果可認為在亦包含超過100℃溫度區域之例如25℃至150℃廣溫度範圍中,有無法高精度檢測電流的問題。 Further, Japanese Laid-Open Patent Publication No. 2006-270078, as described above, does not disclose a TCR of an alloy material for electric resistance including a temperature region exceeding 100 °C. Therefore, similarly to the 12Mn-4Ni-Cu alloy and the 7Mn-2.3Sn-Cu alloy, the absolute value of the TCR of the alloy material for electric resistance exceeds 15 ppm in a temperature range of, for example, 25 ° C to 150 ° C including a temperature region exceeding 100 ° C. K, as a result, it is considered that there is a problem that the current cannot be detected with high precision in a wide temperature range including, for example, a temperature range of more than 100 ° C, for example, 25 ° C to 150 ° C.

再者,平山論文所記載的電阻材料,亦在包含超過100℃溫度區域之例如25℃至150℃溫度範圍中,有TCR絕對值超過15ppm/K的不良情況。此現象已由本案發明人根據平山論文所記載的溫度係數α25及β確認完畢。所以,在亦包含超過100℃溫度區域之例如25℃至150℃的廣溫度範圍中,有無法高精度檢測電流的問題。 Further, the electric resistance material described in the Hirayama paper also has a problem that the absolute value of TCR exceeds 15 ppm/K in a temperature range of, for example, 25 ° C to 150 ° C including a temperature region exceeding 100 ° C. This phenomenon has been confirmed by the inventors of the present invention based on the temperature coefficients α 25 and β described in the Hirayama paper. Therefore, in a wide temperature range including, for example, a temperature range of more than 100 ° C, for example, 25 ° C to 150 ° C, there is a problem that current cannot be detected with high precision.

本發明係為了解決如上述問題而完成,本發明一目的在於提供:在包含超過100℃溫度區域之例如25℃至150℃的廣溫度範圍中,可將TCR絕對值降低至例如15ppm/K以下的電阻材料。 The present invention has been made to solve the above problems, and an object of the present invention is to provide that the absolute value of TCR can be lowered to, for example, 15 ppm/K or less in a wide temperature range including, for example, 25 ° C to 150 ° C in a temperature region exceeding 100 ° C. Resistance material.

本案發明人針對上述問題進行深入鑽研,結果發現藉由調整Mn含有量與Si含有量,可解決上述問題。即,根據本發明一佈局的電阻材料,係由含有Cu、6.20質量%以上且7.40質量%以下的Mn、以及0.15質量%以上且1.50質量%以下的Si之Cu合金構成,在25℃至150℃中的TCR絕對值係15ppm/K以下。 The inventors of the present invention conducted intensive studies on the above problems, and as a result, found that the above problems can be solved by adjusting the Mn content and the Si content. In other words, the resistive material according to the present invention is composed of a Cu alloy containing Cu, 6.20% by mass or more and 7.40% by mass or less of Mn, and 0.15% by mass or more and 1.50% by mass or less of Si, at 25 ° C to 150 ° C. The absolute value of TCR in °C is 15 ppm/K or less.

根據本發明一佈局的電阻材料,係藉由具有上述組成的Cu合金構成,且在25℃至150℃中的TCR絕對值在15ppm/K以下,即使在例如25℃至超過100℃的150℃高溫度區域中,仍可降低Cu合金的電阻值變動。又,可將例如-50℃至25℃低溫側的TCR絕對值降低至50ppm/K以下(藉由更適當調整組成亦可達30ppm/K以下),且可將例如25℃至60℃之中溫側的TCR絕對值降低至10ppm/K以下。藉此,在包含超過100℃溫度區域之例如-50℃至150℃的廣溫度範圍中,可降低TCR絕對值,故不僅中溫側,即使廣溫度範圍中均可降低Cu合金的電阻值變動。又,藉由具有上述組成的Cu合金構成,可將電阻材料的體積電阻率充分降低至40×10-8(Ω‧m)以下,故可抑制因Cu合金的體積電阻率較大而導致在電阻材料中流通電流時產生較大焦耳熱的情形。又,藉由由具有上述組成的Cu合金構成,可將對銅熱電動勢的絕對值充分降低至 2μV/K以下,故當電阻材料連接於主要由Cu構成的構件時,可抑制因電阻材料與構件間之溫度差而造成的熱電動勢變大的情形。另外,此等已由後述實施例確認完畢。該等結果,可獲得特別適合於例如汽車所使用電流感測器的電阻器般,在環境溫度由低溫至高溫之如-50℃至150℃廣溫度範圍中出現變動的用途中的電阻材料。 The resistive material according to a layout of the present invention is constituted by a Cu alloy having the above composition, and has an absolute value of TCR of 15 ppm/K or less at 25 ° C to 150 ° C, even at 150 ° C of, for example, 25 ° C to over 100 ° C. In the high temperature region, the resistance value variation of the Cu alloy can still be reduced. Further, the absolute value of the TCR on the low temperature side of, for example, -50 ° C to 25 ° C can be lowered to 50 ppm / K or less (the composition can be adjusted to 30 ppm / K or less by more appropriate adjustment), and can be, for example, between 25 ° C and 60 ° C. The absolute value of the TCR on the temperature side is reduced to below 10 ppm/K. Thereby, in a wide temperature range including a temperature range of more than 100 ° C, for example, -50 ° C to 150 ° C, the absolute value of TCR can be lowered, so that not only the intermediate temperature side but also the variation of the resistance value of the Cu alloy can be reduced even in a wide temperature range. . Further, by the Cu alloy having the above composition, the volume resistivity of the resistive material can be sufficiently reduced to 40 × 10 -8 (Ω·m) or less, so that the volume resistivity of the Cu alloy can be suppressed from being large. A situation in which a large amount of Joule heat is generated when a current flows in a resistive material. Further, by consisting of a Cu alloy having the above composition, the absolute value of the thermoelectromotive force of copper can be sufficiently reduced to 2 μV/K or less. Therefore, when the resistive material is connected to a member mainly composed of Cu, the resistive material and the resistive material can be suppressed. The thermoelectromotive force caused by the temperature difference between the members becomes large. In addition, these have been confirmed by the examples described later. As a result, a resistive material which is particularly suitable for use in, for example, a resistor of a current sensor used in an automobile, in a wide range of temperatures from a low temperature to a high temperature such as -50 ° C to 150 ° C can be obtained.

根據上述一佈局的電阻材料,較佳係Cu合金中,Mn含有量與Si含有量的合計係6.75質量%以上且8.40質量%以下。若依此構成,可確實地將25℃至150℃高溫側的TCR絕對值設定在15ppm/K以下。 In the Cu-based alloy, the total amount of the Mn content and the Si content in the Cu alloy is preferably 6.75 mass% or more and 8.40 mass% or less. According to this configuration, the absolute value of the TCR on the high temperature side of 25 ° C to 150 ° C can be surely set to 15 ppm / K or less.

根據上述一佈局的電阻材料,較佳係-50℃至25℃的TCR為0ppm/K以上且50ppm/K以下。若依此構成,在-50℃至25℃低溫側的溫度範圍中,可充分降低Cu合金的電阻值變動,因而可獲得不僅適合於高溫側,於低溫側亦能適用的電阻材料。 According to the above-described resistive material of a layout, it is preferable that the TCR of -50 ° C to 25 ° C is 0 ppm / K or more and 50 ppm / K or less. According to this configuration, in the temperature range of the low temperature side of -50 ° C to 25 ° C, the fluctuation of the resistance value of the Cu alloy can be sufficiently reduced, and thus a resistor material which is applicable not only to the high temperature side but also to the low temperature side can be obtained.

根據上述一佈局的電阻材料,較佳係25℃至60℃的TCR絕對值係10ppm/K以下。若依此構成,在25℃至60℃的中溫溫度範圍中,可充分降低Cu合金的電阻值變動,因而可獲得不僅適合於高溫側,於中溫側亦能適用的電阻材料。 According to the above-mentioned resistor material, it is preferable that the TCR absolute value of 25 ° C to 60 ° C is 10 ppm / K or less. According to this configuration, in the intermediate temperature range of 25 ° C to 60 ° C, the variation in the resistance value of the Cu alloy can be sufficiently reduced, and thus a resistor material which is applicable not only to the high temperature side but also to the intermediate temperature side can be obtained.

根據本發明,依如上述,可提供在包含超過100℃溫度區域之例如-50℃至150℃的廣溫度範圍中,能降低TCR的絕對值,特別 係將例如25℃至150℃高溫側的TCR絕對值降低至15ppm/K以下的電阻材料。 According to the present invention, as described above, it is possible to provide an absolute value of the TCR which can be lowered in a wide temperature range including, for example, -50 ° C to 150 ° C in a temperature region exceeding 100 ° C, in particular For example, the absolute value of the TCR on the high temperature side of 25 ° C to 150 ° C is lowered to a resistance material of 15 ppm / K or less.

圖1係用於確認本發明效果而施行的試驗結果圖。 Fig. 1 is a graph showing test results for confirming the effects of the present invention.

針對本發明的電阻材料進行詳細說明。 The resistive material of the present invention will be described in detail.

本發明的電阻材料係用於檢測例如利用引擎(內燃機)驅動的汽車之電池之電流、或包含油電混合式汽車在內的電動汽車之二次電池之電流,而採用的電流感測器之電阻器中所使用電阻材料。其中,汽車所使用的電流感測器,係即使配置於汽車之熱源(引擎、馬達等)附近等溫度變動幅度較大的地方時,必須仍可高精度檢測電流,抑制電池或二次電池之過充電、過放電。 The electric resistance material of the present invention is used for detecting a current of a battery of a vehicle driven by an engine (internal combustion engine) or a current of a secondary battery of an electric vehicle including a hybrid electric vehicle, and a current sensor is used. Resistive material used in resistors. Among them, the current sensor used in the automobile is required to detect the current with high precision and suppress the battery or the secondary battery even when it is placed in a place where the temperature of the vehicle is near the heat source (engine, motor, etc.). Overcharged, overdischarged.

此處,本發明的電阻材料係由含有6.20質量%以上且7.40質量%以下的Mn、及0.15質量%以上且1.50質量%以下的Si之Cu合金構成。該Cu合金係除了上述Mn、Si之外,亦可含有其他元素,例如:Ni、Fe、Sn、Ge及Mg等。 Here, the electric resistance material of the present invention is composed of a Cu alloy containing 6.20% by mass or more and 7.40% by mass or less of Mn, and 0.15% by mass or more and 1.50% by mass or less of Si. The Cu alloy may contain other elements in addition to the above-described Mn and Si, and examples thereof include Ni, Fe, Sn, Ge, and Mg.

藉此,在包含超過100℃溫度區域之例如-50℃至150℃的廣溫度範圍中,可降低電阻材料的TCR絕對值。具體而言,可將-50℃至25℃低溫側的TCR絕對值降低至約50ppm/K以下,將25℃至 60℃中溫側的TCR絕對值降低至約10ppm/K以下,且可將25℃至150℃高溫側的TCR絕對值降低至15ppm/K以下。藉此,在例如-50℃至150℃的廣溫度範圍中,可降低Cu合金的電阻值變動。其結果,含有使用了本發明電阻材料的電阻器之電流感測器,可在廣溫度範圍中高精度檢測電流。 Thereby, the absolute value of the TCR of the resistive material can be lowered in a wide temperature range including, for example, -50 ° C to 150 ° C in a temperature region exceeding 100 ° C. Specifically, the absolute value of the TCR on the low temperature side of -50 ° C to 25 ° C can be reduced to less than about 50 ppm / K, and 25 ° C to The absolute value of TCR on the medium temperature side of 60 ° C is lowered to about 10 ppm / K or less, and the absolute value of TCR on the high temperature side of 25 ° C to 150 ° C can be lowered to 15 ppm / K or less. Thereby, the resistance value variation of the Cu alloy can be lowered in a wide temperature range of, for example, -50 ° C to 150 ° C. As a result, a current sensor including a resistor using the resistive material of the present invention can detect a current with high precision in a wide temperature range.

再者,本發明電阻材料的體積電阻率係約40×10-8(Ω‧m)以下的充分小。藉此,可抑制因Cu合金的體積電阻率較大而導致在電阻器中流通電流時產生較大焦耳熱的情形。又,本發明電阻材料係在與電流感測器內連接於電阻器之主要由Cu所構成引線間之熱電動勢(對銅熱電動勢)約2μV/K以下的充分小。藉此,可抑制因電阻器與引線間之溫度差而造成熱電動勢變大的情形,故可抑制所產生的熱電動勢成為電流感測器的測定誤差。結果,電流感測器可高精度檢測電流。 Further, the volume resistivity of the resistive material of the present invention is sufficiently small to be about 40 × 10 -8 (Ω‧ m) or less. Thereby, it is possible to suppress a situation in which a large amount of Joule heat is generated when a current flows through the resistor due to a large volume resistivity of the Cu alloy. Further, the resistive material of the present invention is sufficiently smaller than the thermoelectromotive force (for the copper thermoelectromotive force) between the leads mainly composed of Cu and the resistor connected to the resistor in the current sensor to be about 2 μV/K or less. Thereby, it is possible to suppress a situation in which the thermoelectromotive force is increased due to the temperature difference between the resistor and the lead, and it is possible to suppress the generated thermoelectromotive force from becoming a measurement error of the current sensor. As a result, the current sensor can detect the current with high precision.

另外,當Cu合金的Mn含有率大於7.40質量%時,不僅Cu合金的體積電阻率,中溫側的TCR絕對值及高溫側的TCR絕對值均變大。又,當Cu合金的Mn含有率未滿6.20質量%時,Cu合金的中溫側及高溫側TCR絕對值變大。 In addition, when the Mn content of the Cu alloy is more than 7.40% by mass, not only the volume resistivity of the Cu alloy but also the absolute value of the TCR on the intermediate temperature side and the absolute value of the TCR on the high temperature side become large. In addition, when the Mn content of the Cu alloy is less than 6.20% by mass, the absolute value of the TCR on the intermediate temperature side and the high temperature side of the Cu alloy becomes large.

此處,本發明的電阻材料特別係為了降低高溫側的TCR絕對值,可更適當地調整Cu合金的Mn含有率。具體而言,構成本發明電阻材料的Cu合金較佳係含有6.20質量%以上且約7.30質量%以下的Mn。藉此可將高溫側的TCR絕對值降低至約12ppm/K以 下。又,Cu合金更佳係含有約6.30質量%以上且約6.87質量%以下的Mn。藉此可將高溫側的TCR絕對值更加降低至約5.5ppm/K以下。又,Cu合金特佳係含有約6.40質量%以上且約6.87質量%以下的Mn。藉此可將高溫側的TCR絕對值更加降低至約3ppm/K以下。又,Cu合金最佳係含有約6.60質量%以上且約6.70質量%以下的Mn。藉此可將高溫側的TCR絕對值更加降低至約2ppm/K以下。由該等Cu合金構成的電阻材料特別適合於在抑制低溫側的TCR絕對值及中溫側的TCR絕對值變大之下,能適合在廣溫度範圍中之25℃至150℃高溫側使用的電阻材料。 Here, in particular, in order to reduce the absolute value of the TCR on the high temperature side, the electric resistance material of the present invention can more appropriately adjust the Mn content of the Cu alloy. Specifically, the Cu alloy constituting the resistive material of the present invention preferably contains 6.20% by mass or more and 7.33% by mass or less of Mn. Thereby, the absolute value of the TCR on the high temperature side can be reduced to about 12 ppm/K. under. Further, the Cu alloy more preferably contains Mn of about 6.30% by mass or more and about 6.87% by mass or less. Thereby, the absolute value of the TCR on the high temperature side can be further reduced to about 5.5 ppm/K or less. Further, the Cu alloy is particularly preferably contained in an amount of about 6.40% by mass or more and about 6.87% by mass or less of Mn. Thereby, the absolute value of the TCR on the high temperature side can be further reduced to about 3 ppm/K or less. Further, the Cu alloy preferably contains Mn of about 6.60% by mass or more and about 6.70% by mass or less. Thereby, the absolute value of the TCR on the high temperature side can be further reduced to about 2 ppm/K or less. The resistive material composed of the Cu alloy is particularly suitable for use in suppressing the absolute value of the TCR on the low temperature side and the absolute value of the TCR on the intermediate temperature side, and is suitable for use at a high temperature side of 25 ° C to 150 ° C in a wide temperature range. Resistance material.

再者,當Cu合金的Si含有率大於1.50質量%時,可認為Cu合金的體積電阻率變大。又,若Cu合金的Si含有率未滿0.15質量%時,可認為Cu合金在低溫側、中溫側及高溫側的TCR絕對值均變大。 In addition, when the Si content of the Cu alloy is more than 1.50% by mass, it is considered that the volume resistivity of the Cu alloy becomes large. In addition, when the Si content of the Cu alloy is less than 0.15% by mass, it is considered that the absolute value of the TCR of the Cu alloy on the low temperature side, the intermediate temperature side, and the high temperature side is large.

再者,本發明的電阻材料特別係為了降低低溫側的TCR絕對值,因而可更加適當調整Cu合金的Si含有率。具體而言,構成本發明電阻材料的Cu合金較佳係含有約0.45質量%以上且1.50質量%以下的Si。藉此可在抑制中溫側的TCR絕對值及高溫側的TCR絕對值變大之下,將低溫側的TCR絕對值降低至約30ppm/K以下。 Further, in particular, in order to reduce the absolute value of the TCR on the low temperature side, the electric resistance material of the present invention can more appropriately adjust the Si content of the Cu alloy. Specifically, the Cu alloy constituting the resistive material of the present invention preferably contains Si of about 0.45 mass% or more and 1.50 mass% or less. Thereby, the absolute value of the TCR on the low temperature side can be lowered to about 30 ppm/K or less while suppressing the absolute value of the TCR on the intermediate temperature side and the absolute value of the TCR on the high temperature side.

再者,本發明的電阻材料特別係為了降低中溫側的TCR絕對值,最好一併調整構成本發明電阻材料的Cu合金中之Mn含有率與Si含有率。具體而言,Cu合金中,Mn含有率與Si含有率的合 計含有率較佳係約6.75質量%以上且約8.40質量%以下。又,Cu合金中,Mn含有率與Si含有率的合計含有率較佳係約6.90質量%以上且約8.40質量%以下。藉此可在抑制低溫側的TCR絕對值與高溫側的TCR絕對值變大之下,將中溫側的TCR絕對值降低至約7ppm/K以下。又,Cu合金中,Mn含有率與Si含有率的合計含有率更佳係約8.20質量%以上且約8.40質量%以下。藉此可在抑制高溫側的TCR絕對值變大之下,將低溫側的TCR絕對值降低至約12ppm/K以下,且將中溫側的TCR絕對值降低至約4ppm/K以下。 Further, in particular, in order to reduce the absolute value of the TCR on the intermediate temperature side, the electric resistance material of the present invention preferably adjusts the Mn content and the Si content in the Cu alloy constituting the electric resistance material of the present invention. Specifically, in the Cu alloy, the Mn content ratio and the Si content ratio are combined. The content ratio is preferably about 6.75 mass% or more and about 8.40 mass% or less. In the Cu alloy, the total content of the Mn content and the Si content is preferably about 6.90% by mass or more and about 8.40% by mass or less. Thereby, the absolute value of the TCR on the middle temperature side can be lowered to about 7 ppm/K or less while suppressing the absolute value of the TCR on the low temperature side and the absolute value of the TCR on the high temperature side. In the Cu alloy, the total content of the Mn content and the Si content is preferably about 8.20% by mass or more and about 8.40% by mass or less. Thereby, the absolute value of the TCR on the low temperature side can be lowered to about 12 ppm/K or less, and the absolute value of the TCR on the middle temperature side can be lowered to about 4 ppm/K or less, while suppressing the increase in the absolute value of the TCR on the high temperature side.

再者,本發明的電阻材料為了降低體積電阻率,最好一併調整構成本發明電阻材料的Cu合金中之Mn含有率與Si含有率。具體而言,Cu合金中,Mn含有率與Si含有率之合計含有率較佳係含有約6.75質量%以上且約7.00質量%以下的Mn。藉此可在抑制低溫側、中溫側及高溫側的TCR絕對值變大之下,將體積電阻率降低至約29.5×10-8Ω‧m以下。 Further, in order to lower the volume resistivity, the resistive material of the present invention preferably adjusts the Mn content and the Si content in the Cu alloy constituting the resistive material of the present invention. Specifically, in the Cu alloy, the total content of the Mn content and the Si content is preferably 6.75% by mass or more and about 7.00% by mass or less. Thereby, the volume resistivity can be lowered to about 29.5×10 -8 Ω·m or less while suppressing the increase in the absolute value of the TCR on the low temperature side, the medium temperature side, and the high temperature side.

再者,Cu合金係除了Mn、Si及Cu之外,亦可更進一步含有約0.10質量%以上且約1.00質量%以下的Fe。此時,Cu合金較佳係含有約0.50質量%以上且約1.00質量%以下的Fe。又,本發明的電阻材料中,為了降低TCR絕對值,最好一併調整構成本發明電阻材料的Cu合金中之Si含有率與Fe含有率。具體而言,Cu合金中,Si含有率與Fe含有率之合計含有率較佳係約1.00質量%以上且約1.70質量%以下。藉此可在廣溫度範圍中降低TCR的絕對值。 In addition to the Mn, Si, and Cu, the Cu alloy may further contain Fe in an amount of about 0.10% by mass or more and about 1.00% by mass or less. At this time, the Cu alloy preferably contains about 0.50% by mass or more and about 1.00% by mass or less of Fe. Further, in the electric resistance material of the present invention, in order to lower the absolute value of TCR, it is preferable to adjust the Si content and the Fe content in the Cu alloy constituting the electric resistance material of the present invention. Specifically, in the Cu alloy, the total content of the Si content and the Fe content is preferably about 1.00% by mass or more and about 1.70% by mass or less. Thereby, the absolute value of the TCR can be lowered over a wide temperature range.

再者,Cu合金亦可含有作為脫氧素材之約0.001質量%以上且約0.01質量%以下的微量Mg。 Further, the Cu alloy may contain a trace amount of Mg of about 0.001% by mass or more and about 0.01% by mass or less as a deoxidizing material.

再者,Cu合金為了提升耐蝕性,亦可含有約0.15質量%以上且約0.30質量%以下的Ni。 Further, the Cu alloy may contain Ni in an amount of about 0.15 mass% or more and about 0.30 mass% or less in order to improve corrosion resistance.

另外,本發明的電阻材料亦可使用於供於檢測汽車電池及二次電池電流用的電流感測器之電阻器以外的用途。另外,本發明的電阻材料特別適合於環境溫度在低溫至高溫的廣溫度範圍中變動之用途。 Further, the resistor material of the present invention can also be used for applications other than resistors for detecting current sensors for automotive batteries and secondary battery currents. Further, the resistive material of the present invention is particularly suitable for applications in which the ambient temperature fluctuates over a wide temperature range from low temperature to high temperature.

本發明之由Cu合金構成的電阻材料之製造方法,係將原材料投入於一般的真空熔解爐中予以熔融後施行冷卻,製作Cu合金的鑄錠(塊)。然後,藉由將Cu合金的鑄錠施行軋延、成形等,而成形為電阻器等電阻材料所使用的形狀。此處,本發明的Cu合金係例如7Mn-2.3Sn-Cu系合金般之未刻意含有Sn,所以幾乎不發生Sn偏析。結果,可抑制電阻材料的不均質,能抑制體積電阻值發生變動。另外,經軋延等之後,較佳係在惰性氣體環境下、且約600℃以上且約850℃以下的溫度環境下施行既定時間熱處理,而除去軋延等之時生成的內部應變。 In the method for producing a resistive material made of a Cu alloy according to the present invention, the raw material is placed in a general vacuum melting furnace, melted, and then cooled to produce an ingot (block) of a Cu alloy. Then, the ingot of the Cu alloy is rolled, formed, or the like into a shape used for a resistive material such as a resistor. Here, in the Cu alloy of the present invention, for example, the 7Mn-2.3Sn-Cu alloy is not intentionally contained in Sn, so that Sn segregation hardly occurs. As a result, the unevenness of the resistance material can be suppressed, and the variation in the volume resistance value can be suppressed. Further, after rolling or the like, it is preferred to carry out a predetermined time heat treatment in an inert gas atmosphere at a temperature of about 600 ° C or more and about 850 ° C or less to remove internal strain generated when rolling or the like.

(實施例) (Example)

其次,實際製作構成本發明電阻材料的Cu合金,並調查其特 性。 Next, the Cu alloy constituting the resistive material of the present invention is actually produced and investigated. Sex.

製作具有表1所示組成的實施例1~16、及比較例1與2的Cu合金。另外,表1中的「0.00」均係意指未滿0.01質量%。實施例1~16的Cu合金均含有6.20質量%以上且7.40質量%以下的Mn、及0.15質量%以上且1.50質量%以下的Si。另一方面,實施例1~16的Cu合金係未刻意含有Sn。相對於此,比較例1的Cu合金係含有未滿6.20質量%的Mn,比較例2的Cu合金係含有超過7.40質量%的Mn。又,比較例3與4的Cu合金係分別準備12Mn-4Ni-Cu合金與7Mn-2.3Sn-Cu系合金。該比較例3與4的Cu合金均係未刻意含有Si。 Cu alloys of Examples 1 to 16 and Comparative Examples 1 and 2 having the compositions shown in Table 1 were produced. In addition, "0.00" in Table 1 means less than 0.01% by mass. Each of the Cu alloys of Examples 1 to 16 contains 6.20% by mass or more and 7.40% by mass or less of Mn, and 0.15% by mass or more and 1.50% by mass or less of Si. On the other hand, the Cu alloys of Examples 1 to 16 did not intentionally contain Sn. On the other hand, the Cu alloy of Comparative Example 1 contained Mn of less than 6.20% by mass, and the Cu alloy of Comparative Example 2 contained Mn of more than 7.40% by mass. Further, in the Cu alloys of Comparative Examples 3 and 4, a 12Mn-4Ni-Cu alloy and a 7Mn-2.3Sn-Cu alloy were separately prepared. The Cu alloys of Comparative Examples 3 and 4 were not intentionally containing Si.

然後,分別取得實施例1~7及比較例1~4的Cu合金之體積電阻率、TCR及平均對銅熱電動勢。又,分別取得實施例8~16的體積電阻率及TCR。 Then, the volume resistivity, TCR, and average copper thermoelectromotive force of the Cu alloys of Examples 1 to 7 and Comparative Examples 1 to 4 were obtained, respectively. Further, the volume resistivity and TCR of Examples 8 to 16 were obtained, respectively.

體積電阻率的測定係根據JIS-C2525所規定的金屬電阻材料之導體電阻及體積電阻率試驗方法,針對由實施例1~16、比較例1~4之Cu合金構成之試驗片,計算出23℃±2℃下每單位面積及單位長度的電阻值,求得23℃的體積電阻率。 The volume resistivity was measured according to the conductor resistance and volume resistivity test method of the metal resistor material prescribed in JIS-C2525, and the test piece composed of the Cu alloys of Examples 1 to 16 and Comparative Examples 1 to 4 was calculated. The resistance value per unit area and unit length at °C ± 2 ° C, the volume resistivity at 23 ° C was obtained.

TCR的測定係根據JIS-C2526所規定的電阻-溫度特性試驗方法,針對由實施例1~16、比較例1~4的Cu合金所構成之試驗片,測定由-50℃溫度變化至150℃時的電阻值。該電阻值變化係如圖1所示。另外,圖1所示係以20℃為基準時的既定溫度T(-50℃≦T≦150℃)之電阻值變化率((=(在T下的電阻值-在20℃下的電阻值)/在20℃下的電阻值)×100)(%)圖。又,圖1中,實施例1~8的電阻值變化率係依粗線標示,比較例1~4的電阻值變化率係依細線標示。 The measurement of TCR was carried out according to the resistance-temperature characteristic test method specified in JIS-C2526, and the test piece composed of the Cu alloys of Examples 1 to 16 and Comparative Examples 1 to 4 was measured to have a temperature change from -50 ° C to 150 ° C. The resistance value at the time. The change in resistance value is shown in Figure 1. In addition, FIG. 1 shows the rate of change of the resistance value at a predetermined temperature T (-50 ° C ≦ T ≦ 150 ° C) based on 20 ° C ((= resistance value at T - resistance value at 20 ° C) ) / resistance value at 20 ° C) × 100) (%) map. Further, in Fig. 1, the resistance value change rates of the first to eighth embodiments are indicated by thick lines, and the resistance value change rates of the comparative examples 1 to 4 are indicated by thin lines.

然後,將25℃(基準溫度)下的電阻值(R25)與-50℃下的電阻值(R-50)之差,除以25℃與-50℃的溫度差(△TL=-75℃),而求得-50℃至25℃低溫側的TCR(=(R25-R-50)/△TL×106ppm/K)。又,將60℃下的電阻值(R60)與25℃下的電阻值(R25)之差,除以25℃與60℃的溫度差(△TM=35℃),而求得25℃至60℃中溫側的TCR(=(R60-R25)/△TM×106ppm/K)。又,將150℃下的電阻值(R150)與25℃下的電阻值(R25)之差,除以25℃與150℃的溫度差 (△TH=125℃),而求得25℃至150℃高溫側的TCR(=(R150-R25)/△TH×106ppm/K)。 Then, divide the difference between the resistance value (R 25 ) at 25 ° C (reference temperature) and the resistance value (R - 50 ) at -50 ° C by the temperature difference between 25 ° C and -50 ° C (△T L =- At 75 ° C), TCR (= (R 25 - R - 50 ) / ΔT L × 10 6 ppm / K) on the low temperature side of -50 ° C to 25 ° C was obtained. Further, the difference between the resistance value (R 60 ) at 60 ° C and the resistance value (R 25 ) at 25 ° C was divided by the temperature difference between 25 ° C and 60 ° C (ΔT M = 35 ° C) to obtain 25 TCR (=(R 60 -R 25 )/ΔT M ×10 6 ppm/K) on the medium temperature side from °C to 60 °C. Further, the difference between the resistance value (R 150 ) at 150 ° C and the resistance value (R 25 ) at 25 ° C was divided by the temperature difference between 25 ° C and 150 ° C (ΔT H = 125 ° C) to obtain 25 TCR (=(R 150 -R 25 )/ΔT H ×10 6 ppm/K) on the high temperature side from °C to 150 °C.

對銅熱電動勢的測定係根據JIS-C2527所規定的金屬電阻材料之熱電動勢試驗方法,測定在由實施例1~7、比較例1及2的Cu合金所構成之試驗片、與標準銅線之間產生的平均對銅熱電動勢。此時,將試驗片或標準銅線其中一者設為0℃、另一者設為100℃之狀態下所產生的對銅熱電動勢,除以溫度差(100℃),藉此分別針對實施例1~7、比較例1及2的Cu合金求得平均對銅熱電動勢(μV/K)。 The measurement of the copper thermoelectromotive force was carried out according to the thermoelectromotive force test method of the metal resistance material specified in JIS-C2527, and the test piece composed of the Cu alloys of Examples 1 to 7 and Comparative Examples 1 and 2 and the standard copper wire were measured. The average is generated between the copper thermoelectromotive force. At this time, the copper thermoelectromotive force generated in one of the test piece or the standard copper wire is set to 0 ° C and the other is set to 100 ° C, and the temperature difference (100 ° C) is divided by The Cu alloys of Examples 1 to 7 and Comparative Examples 1 and 2 were averaged to copper thermoelectromotive force (μV/K).

以下所示表2係實施例1~16及比較例1~4的Cu合金之體積電阻率、與低溫側、中溫側、高溫側的各TCR、及平均對銅熱電動勢。另外,相關實施例8~16的Cu合金並未求取平均對銅熱電動勢。 Table 2 below shows the volume resistivity of the Cu alloys of Examples 1 to 16 and Comparative Examples 1 to 4, the respective TCRs on the low temperature side, the medium temperature side, and the high temperature side, and the average copper thermoelectromotive force. Further, the Cu alloys of Examples 8 to 16 did not obtain an average copper thermoelectromotive force.

再者,表2記載有目標特性。該目標特性係本發明電阻材料(Cu合金)應滿足的低溫側、中溫側、高溫側各TCR、與平均對銅熱電動勢的值。另外,表2中,相關未滿足目標特性的數值係在數值周圍標註陰影線。 Furthermore, Table 2 describes the target characteristics. The target characteristics are the values of the TCR on the low temperature side, the medium temperature side, and the high temperature side, and the average on the copper thermoelectromotive force which the resistive material (Cu alloy) of the present invention should satisfy. In addition, in Table 2, the values that are not satisfied with the target characteristics are hatched around the values.

[表2] [Table 2]

再者,以下所示表3係平山論文所記載之含Si的16種Cu合金的組成、加工度及溫度係數α25及β。另外,將16種Cu合金分別設定為比較例11~26。又,以下所示表4係平山論文所記載之比較例11~26的Cu合金之體積電阻率及平均對銅熱電動勢(0℃~50℃)。 Further, Table 3 shown below is a composition, a workability, and temperature coefficients α 25 and β of 16 kinds of Cu alloys containing Si described in the Hirayama paper. Further, 16 kinds of Cu alloys were set as Comparative Examples 11 to 26, respectively. Further, Table 4 below shows the volume resistivity and the average versus copper thermoelectromotive force (0 ° C to 50 ° C) of the Cu alloys of Comparative Examples 11 to 26 described in the Hirayama paper.

然後,由平山論文所記載的溫度係數α25及β,計算出比較例11~26的Cu合金之低溫側、中溫側及高溫側的各TCR。具體的計算方法,溫度T(-50℃≦T≦150℃)下的電阻值RT(Ω)係使用溫度係數α25及β,依照以下二次式近似的式(1)計算出。 Then, from the temperature coefficients α 25 and β described in the Hirayama paper, the TCRs on the low temperature side, the medium temperature side, and the high temperature side of the Cu alloys of Comparative Examples 11 to 26 were calculated. In a specific calculation method, the resistance value R T (Ω) at a temperature T (-50 ° C ≦ T ≦ 150 ° C) is calculated using the temperature coefficients α 25 and β according to the following equation (1).

(數1)RT=R25(1+α25×(T-25)+β×(T-25)2)...(1) (Number 1) R T = R 25 (1 + α 25 × (T-25) + β × (T-25) 2 ) (1)

其中,R25係25℃下的電阻值(Ω)。 Among them, R 25 is a resistance value (Ω) at 25 ° C.

再者,以25℃為基準溫度時,在溫度T(-50℃、60℃及150℃)下的TCR(ppm/K)係依照下式(2)計算出。 Further, when 25 ° C is used as the reference temperature, the TCR (ppm/K) at the temperature T (-50 ° C, 60 ° C, and 150 ° C) is calculated according to the following formula (2).

(數2)TCR=((RT-R25)/(R25×(T-25)))×106‧‧‧(2) (Number 2) TCR=((R T -R 25 )/(R 25 ×(T-25)))×10 6 ‧‧‧(2)

藉由將上述式(1)代入上式(2)而計算出式(3)。 Formula (3) is calculated by substituting the above formula (1) into the above formula (2).

(數3)TCR=((α25×(T-25)+β×(T-25)2)/(T-25))×106‧‧‧(3) (Number 3) TCR=((α 25 ×(T-25)+β×(T-25) 2 )/(T-25))×10 6 ‧‧‧(3)

該式(3)係藉由分別代入比較例11~26的Cu合金之溫度係數α25與β、以及T(-50℃、60℃及150℃),而分別計算出比較例11~26的Cu合金之低溫側、中溫側、高溫側的TCR。結果如上述表4所示。另外,表4中,相關未滿足目標特性的數值係在數值周圍標註陰影線。 This formula (3) calculates the temperature coefficients α 25 and β, and T (-50 ° C, 60 ° C and 150 ° C) of the Cu alloys of Comparative Examples 11 to 26, respectively, to calculate Comparative Examples 11 to 26, respectively. The TCR of the low temperature side, the medium temperature side, and the high temperature side of the Cu alloy. The results are shown in Table 4 above. In addition, in Table 4, the values that are not satisfied with the target characteristics are hatched around the numerical values.

實施例的結果,首先由圖1所示圖,可確認到實施例1~8的Cu合金之電阻值變化率相對於溫度變化呈較小的傾向,另一方面,比較例1~4的Cu合金之電阻值變化率相對於溫度變化呈較大的傾向。 As a result of the examples, first, it can be confirmed from the graphs shown in Fig. 1 that the rate of change in the resistance value of the Cu alloys of Examples 1 to 8 tends to be small with respect to temperature change, and on the other hand, Cu of Comparative Examples 1 to 4. The rate of change in the resistance value of the alloy tends to be large with respect to temperature changes.

再者,由表2中得知,在含有6.20質量%以上且7.40質量%以下之Mn、與0.15質量%以上且1.50質量%以下之Si的實施例1~16 之Cu合金,可將低溫側的TCR絕對值設在50ppm/K以下、中溫側的TCR絕對值設在10ppm/K以下、且高溫側的TCR絕對值設在15ppm/K以下,由此結果可得知任一實施例1~16均滿足TCR的目標特性。由此現象可確認到實施例1~16的Cu合金在-50℃至150℃廣溫度範圍中的電阻值變動較小,其結果,將實施例1~16的Cu合金使用於電阻器的電流感測器可高精度檢測電流。 In addition, as shown in Table 2, Examples 1 to 16 containing 6.2% by mass or more and 7.40% by mass or less of Mn and 0.15% by mass or more and 1.50% by mass or less of Si. In the Cu alloy, the absolute value of the TCR on the low temperature side can be set to 50 ppm/K or less, the absolute value of the TCR on the intermediate temperature side is set to 10 ppm/K or less, and the absolute value of the TCR on the high temperature side is set to 15 ppm/K or less. It can be known that any of the embodiments 1 to 16 satisfies the target characteristics of the TCR. From this phenomenon, it was confirmed that the Cu alloys of Examples 1 to 16 exhibited small fluctuations in the resistance value in a wide temperature range of -50 ° C to 150 ° C. As a result, the Cu alloys of Examples 1 to 16 were used for the current of the resistor. The sensor detects current with high precision.

另一方面,得知未含Si的比較例3與4之Cu合金均高溫側的TCR絕對值超過15ppm/K,並未滿足目標特性。又,得知比較例3的Cu合金係低溫側的TCR絕對值超過50ppm/K,並未滿足目標特性。 On the other hand, it was found that the absolute values of TCR on the high temperature side of the Cu alloys of Comparative Examples 3 and 4 which did not contain Si exceeded 15 ppm/K, and the target characteristics were not satisfied. Further, it was found that the absolute value of the TCR on the low temperature side of the Cu alloy system of Comparative Example 3 exceeded 50 ppm/K, and the target characteristics were not satisfied.

所以,由實施例1~16與比較例3及4的結果,可確認到藉由構成電阻材料的Cu合金係含有Si,不僅低溫側、中溫側的TCR絕對值,高溫側的TCR絕對值亦可降低。 Therefore, from the results of Examples 1 to 16 and Comparative Examples 3 and 4, it was confirmed that Si is contained in the Cu alloy constituting the resistive material, and not only the absolute value of TCR on the low temperature side and the medium temperature side but also the absolute value of TCR on the high temperature side. Can also be reduced.

再者,即使含有Si的比較例1與2之Cu合金,由含有未滿6.20質量%之Mn的Cu合金所構成之比較例1、及由含有超過7.40質量%之Mn的Cu合金所構成之比較例2,均中溫側及高溫側的TCR未滿足目標特性。 Further, even in the Cu alloys of Comparative Examples 1 and 2 containing Si, Comparative Example 1 composed of a Cu alloy containing not more than 6.20% by mass of Mn, and Cu alloy containing Mn exceeding 7.4% by mass were used. In Comparative Example 2, the TCR on the medium temperature side and the high temperature side did not satisfy the target characteristics.

再者,由表3及4中得知,即使含有9質量%以上之Mn的平山論文所記載之比較例11~26的Cu合金,高溫側的TCR絕對值仍變大為超過15ppm/K,未滿足目標特性。又,比較例11~14、16~22、 24及26係除了高溫側之外,中溫側的TCR亦未滿足目標特性。又,比較例25係除了高溫側之外,低溫側的TCR亦未滿足目標特性。 In addition, as shown in Tables 3 and 4, even in the Cu alloy of Comparative Examples 11 to 26 described in the Hirayama paper containing 9% by mass or more of Mn, the absolute value of the TCR on the high temperature side is still larger than 15 ppm/K. The target characteristics are not met. Also, Comparative Examples 11 to 14, 16 to 22, In addition to the high temperature side of the 24 and 26 series, the TCR on the middle temperature side did not satisfy the target characteristics. Further, in Comparative Example 25, in addition to the high temperature side, the TCR on the low temperature side did not satisfy the target characteristics.

藉此,由實施例1~16、比較例1、2及11~26的結果,可確認到藉由構成電阻材料的Cu合金含有6.20質量%以上且7.40質量%以下的Mn、及0.15質量%以上且1.50質量%以下的Si,可降低低溫側、中溫側、高溫側的各TCR絕對值。 By the results of the examples 1 to 16 and the comparative examples 1, 2, and 11 to 26, it was confirmed that the Cu alloy constituting the resistive material contained 6.20% by mass or more and 7.40% by mass or less of Mn, and 0.15% by mass. The above Si and 1.50% by mass or less can reduce the absolute value of each TCR on the low temperature side, the medium temperature side, and the high temperature side.

再者,實施例1~16中任一者的Cu合金均體積電阻率在40×10-8(Ω‧m)以下,可確認到具有充分小的體積電阻率。藉此,可確認到於電流感測器中能抑制因Cu合金的體積電阻率較大而導致在電阻器中流通電流時產生較大焦耳熱的情形。又,實施例1~7任一者的Cu合金均平均對銅熱電動勢的絕對值在0.75μV/K以下(2μV/K以下),可確認到具有充分小的平均對銅熱電動勢。藉此可確認到將實施例1~7的Cu合金使用於電阻器的電流感測器中,能抑制在電阻器中流通電流時產生焦耳熱的情形。另外,實施例8~16的Cu合金均平均對銅熱電動勢的絕對值在2μV/K以下,推測將實施例8~16的Cu合金使用於電阻器的電流感測器,能抑制在電阻器中流通電流時產生焦耳熱的情形。 In addition, the volume resistivity of the Cu alloy of any of Examples 1 to 16 was 40 × 10 -8 (Ω·m·m) or less, and it was confirmed that the volume resistivity was sufficiently small. As a result, it was confirmed that the current sensor can suppress a large amount of Joule heat generated when a current flows through the resistor due to a large volume resistivity of the Cu alloy. Further, in the Cu alloys of any of Examples 1 to 7, the absolute value of the copper thermoelectromotive force was 0.75 μV/K or less (2 μV/K or less), and it was confirmed that the Cu-electromotive force was sufficiently small. From this, it was confirmed that the Cu alloys of Examples 1 to 7 were used in a current sensor of a resistor, and it was possible to suppress the occurrence of Joule heat when a current flows through the resistor. Further, in the Cu alloys of Examples 8 to 16, the absolute value of the Cu thermoelectromotive force was 2 μV/K or less on average, and it is presumed that the Cu alloys of Examples 8 to 16 were used for the current sensor of the resistor, and the resistor was suppressed. The case where Joule heat is generated when a current flows.

再者,由實施例1~16的結果得知,當Cu合金係含有6.20質量%以上且7.30質量%以下之Mn的情況(實施例1~4及6~16的情況),不同於含有超過7.30質量%之Mn的情況(實施例5),可將高溫側的TCR絕對值降低至12ppm/K以下。藉此可確認到藉由Cu 合金係含有6.20質量%以上且7.30質量%以下的Mn,可更加降低高溫側的各TCR絕對值。 In addition, as a result of Examples 1 to 16, when the Cu alloy contains 6.20% by mass or more and 7.30% by mass or less of Mn (in the cases of Examples 1 to 4 and 6 to 16), the content is different from In the case of 7.30 mass% of Mn (Example 5), the absolute value of the TCR on the high temperature side can be lowered to 12 ppm/K or less. This can be confirmed by Cu The alloy contains 6.20% by mass or more and 7.30% by mass or less of Mn, and the absolute value of each TCR on the high temperature side can be further reduced.

再者,由實施例1~4及6~16的結果得知,當Cu合金係含有6.30質量%以上且6.87質量%以下之Mn的情況(實施例1、4、6、8及13~15的情況),不同於含有未滿6.30質量%之Mn的情況(實施例3及16)、及含有超過6.87質量%之Mn的情況(實施例2、7及9~12),可將高溫側的TCR絕對值降低至5.5ppm/K以下。藉此可確認到藉由Cu合金係含有6.30質量%以上且6.87質量%以下的Mn,可更加降低高溫側的TCR絕對值。 Further, from the results of Examples 1 to 4 and 6 to 16, it is known that the Cu alloy contains 6.30% by mass or more and 6.87% by mass or less of Mn (Examples 1, 4, 6, 8, and 13 to 15). In the case of Mn containing less than 6.30 mass% (Examples 3 and 16) and Mn containing more than 6.87 mass% (Examples 2, 7, and 9 to 12), the high temperature side can be used. The absolute value of TCR is reduced to below 5.5 ppm/K. In this way, it is confirmed that the Cu alloy contains 6.30% by mass or more and 6.87% by mass or less of Mn, and the absolute value of the TCR on the high temperature side can be further lowered.

再者,由實施例1、4、6、8及13~15的結果得知,在Cu合金含有6.40質量%以上且6.87質量%以下之Mn的情況(實施例1、4、6、8、13及14的情況),不同於含有未滿6.40質量%之Mn的情況(實施例15),可將高溫側的TCR絕對值降低至3ppm/K以下。又,由實施例1、4、6、8、13及14的結果得知,在Cu合金係含有6.60質量%以上且6.70質量%以下之Mn的情況(實施例1及13的情況),不同於含有未滿6.60質量%之Mn的情況(實施例6與14)、及含有超過6.70質量%之Mn的情況(實施例4與8),可將高溫側的TCR絕對值降低至2ppm/K以下。藉此可確認到Cu合金係藉由含有6.40質量%以上且6.87質量%以下(更佳係6.60質量%以上且6.70質量%以下)的Mn,可更加降低高溫側的TCR絕對值。 Further, from the results of Examples 1, 4, 6, 8, and 13 to 15, it is known that the Cu alloy contains 6.40% by mass or more and 6.77% by mass or less of Mn (Examples 1, 4, 6, and 8, In the case of 13 and 14, in the case of containing Mn of less than 6.40% by mass (Example 15), the absolute value of the TCR on the high temperature side can be lowered to 3 ppm/K or less. Further, from the results of Examples 1, 4, 6, 8, 13, and 14, it is known that the Cu alloy contains 6.60% by mass or more and 6.70% by mass or less of Mn (in the cases of Examples 1 and 13), When the Mn content is less than 6.60% by mass (Examples 6 and 14) and the case where Mn is more than 6.70% by mass (Examples 4 and 8), the absolute value of the TCR on the high temperature side can be lowered to 2 ppm/K. the following. By this, it is confirmed that the Cu alloy is contained in an amount of 6.40% by mass or more and 6.87% by mass or less (more preferably 6.60% by mass or more and 6.70% by mass or less) of Mn, and the absolute value of the TCR on the high temperature side can be further lowered.

再者,由實施例1~16的結果得知,在Cu合金係含有0.45質 量%以上且1.50質量%以下之Si的情況(實施例1~8及10~16的情況),不同於含有未滿0.45質量%之Si的情況(實施例9),可將低溫側的TCR絕對值降低至30ppm/K以下。藉此可確認到藉由Cu合金係含有0.45質量%以上且1.50質量%以下的Si,可更加降低低溫側的TCR絕對值。 Further, from the results of Examples 1 to 16, it was found that the Cu alloy system contained 0.45 mass. When the amount of Si is 1.5% or more and 1.50% by mass or less (in the case of Examples 1 to 8 and 10 to 16), unlike the case where Si is less than 0.45% by mass (Example 9), the TCR on the low temperature side can be used. The absolute value is reduced to below 30 ppm/K. In this way, it is confirmed that Si is contained in an amount of 0.45 mass% or more and 1.50 mass% or less by the Cu alloy, and the absolute value of the TCR on the low temperature side can be further lowered.

再者,由實施例1~16、比較例1及2的結果得知,Cu合金中,在Mn含有率與Si含有率的合計含有率係6.75質量%以上且8.40質量%以下的情況(實施例1~16的情況),不同於合計含有率未滿6.75質量%的情況(比較例1)、及合計含有率超過8.40質量%的情況(比較例2),可滿足TCR的目標特性。 In addition, as a result of the results of the examples 1 to 16 and the comparative examples 1 and 2, the total content of the Mn content and the Si content in the Cu alloy is 6.75 mass% or more and 8.40 mass% or less. In the case of the examples 1 to 16 , the case where the total content ratio is less than 6.75 mass % (comparative example 1) and the total content ratio exceeds 8.40 mass % (comparative example 2), the target characteristics of the TCR can be satisfied.

再者,由實施例1~16的結果得知,Cu合金中,在Mn含有率與Si含有率的合計含有率係6.90質量%以上且8.40質量%以下的情況(實施例1~14的情況),不同於合計含有率未滿6.90質量%的情況(實施例15及16),可將中溫側的TCR絕對值更加降低至7ppm/K以下。另一方面,得知Cu合金中,在Mn含有率與Si含有率的合計含有率係6.75質量%以上且6.90質量%以下的情況(實施例15與16),可將體積電阻率降低至28.5×10-8Ω‧m以下。 In addition, as a result of the examples 1 to 16, the total content of the Mn content and the Si content in the Cu alloy is 6.90% by mass or more and 8.40% by mass or less (Examples 1 to 14) In the case where the total content ratio is less than 6.90% by mass (Examples 15 and 16), the absolute value of the TCR on the intermediate temperature side can be further reduced to 7 ppm/K or less. On the other hand, in the Cu alloy, when the total content of the Mn content and the Si content is 6.75 mass% or more and 6.90 mass% or less (Examples 15 and 16), the volume resistivity can be lowered to 28.5. ×10 -8 Ω‧m or less.

再者,由實施例1~14的結果得知,Cu合金中,Mn含有率與Si含有率的合計含有率係8.20質量%以上且8.40質量%以下的情況(實施例4與7的情況),不同於合計含有率未滿8.20質量%的情況時(實施例1~3、5、6及8~14),可將低溫側的TCR絕對值更加降 低至12ppm/K以下,且可將中溫側的TCR絕對值更加降低至4ppm/K以下。 In addition, as a result of Examples 1 to 14, the total content of the Mn content and the Si content in the Cu alloy is 8.20% by mass or more and 8.40% by mass or less (in the case of Examples 4 and 7). When the total content rate is less than 8.20% by mass (Examples 1 to 3, 5, 6, and 8 to 14), the absolute value of the TCR on the low temperature side can be further lowered. As low as 12ppm/K or less, the absolute value of TCR on the middle temperature side can be further reduced to below 4ppm/K.

再者,由實施例1~16的結果,Cu合金中,在Mn含有率與Si含有率的合計含有率係6.75質量%以上且7.00質量%以下的情況(實施例14~16的情況),不同於合計含有率超過7.00質量%的情況時(實施例1~13),可將體積電阻率降低至29.5×10-8Ω‧m以下。 In the Cu alloy, the total content of the Mn content and the Si content is 6.75 mass% or more and 7.00 mass% or less (in the case of the examples 14 to 16). When the total content ratio exceeds 7.00% by mass (Examples 1 to 13), the volume resistivity can be lowered to 29.5 × 10 -8 Ω ‧ m or less.

再者,由Si含有率為0.5質量%左右的實施例2、5及10~16之結果得知,在Cu合金係含有6.40質量%以上且6.70質量%以下之Mn的情況(實施例13與14的情況時),不同於含有未滿6.40質量%之Mn的情況(實施例15與16)、及含有超過6.70質量%之Mn的情況(實施例2、5及10~12的情況),可將高溫側的TCR絕對值更加降低至3ppm/K以下,且可將中溫側的TCR絕對值更加降低至4.5ppm/K以下。 In addition, as a result of Examples 2, 5, and 10 to 16 in which the Si content is about 0.5% by mass, it is found that the Cu alloy contains 6.40% by mass or more and 6.70% by mass or less of Mn (Example 13 and In the case of 14), it is different from the case where Mn is less than 6.40% by mass (Examples 15 and 16), and when Mn is more than 6.70% by mass (in the case of Examples 2, 5 and 10 to 12), The absolute value of the TCR on the high temperature side can be further reduced to 3 ppm/K or less, and the absolute value of the TCR on the middle temperature side can be further reduced to 4.5 ppm/K or less.

再者,由實施例8的結果可確認到即使是更進一步含有1.00質量%以下(0.72質量%)之Fe的Cu合金,仍可滿足目標特性。又,由實施例4與8的結果可確認到藉由將實施例4的Cu合金之部分Si利用Fe取代,則如實施例8的Cu合金,可在中溫側與高溫側的各TCR絕對值大小未約略變化之下,更加降低體積電阻率。藉此可認為Cu合金中,當在降低中溫側、高溫側的各TCR絕對值之下,降低體積電阻率時,最好取代Fe而含有Si。由此現象可認為在Cu合金中,當取代Fe而含有Si的情況,可降低中溫側、高溫側的各 TCR絕對值,且有降低體積電阻率的傾向。 In addition, it was confirmed from the results of Example 8 that the target characteristics can be satisfied even if the Cu alloy further contains 1.00% by mass or less (0.72% by mass) of Fe. Further, from the results of Examples 4 and 8, it was confirmed that the part of Si of the Cu alloy of Example 4 was replaced with Fe, and the Cu alloy of Example 8 was able to be absolutely constant for each TCR on the intermediate temperature side and the high temperature side. The value of the value does not change slightly, and the volume resistivity is further reduced. In the Cu alloy, when the volume resistivity is lowered below the absolute value of each TCR on the intermediate temperature side and the high temperature side, it is preferable to contain Si instead of Fe. In this case, it is considered that in the case of the Cu alloy, when Si is substituted for Fe, the intermediate temperature side and the high temperature side can be reduced. The absolute value of TCR has a tendency to reduce the volume resistivity.

再者,由實施例2與4的結果得知,Cu合金係含有1.50質量%之Si的情況(實施例4的情況),相較於Cu合金係含有0.50質量%之Si的情況(實施例2),Cu合金的體積電阻率變大。由此現象可確認到藉由於Cu合金中降低Si含有率,有降低體積電阻率的傾向。 Further, from the results of Examples 2 and 4, the case where the Cu alloy contains 1.50% by mass of Si (in the case of Example 4) and the case where the Cu alloy contains 0.50% by mass of Si (Example) 2) The volume resistivity of the Cu alloy becomes large. From this phenomenon, it was confirmed that the volume resistivity was lowered by lowering the Si content in the Cu alloy.

另一方面,由實施例1~16、比較例1與2可確認到根據有無Ni、及Ni含有率在0.30質量%以下並未造成明顯差異。另外,因為Ni具有耐蝕性,因而可認為有利於提升電阻材料的耐蝕性。 On the other hand, in Examples 1 to 16 and Comparative Examples 1 and 2, it was confirmed that there was no significant difference depending on the presence or absence of Ni and the Ni content of 0.30% by mass or less. In addition, since Ni has corrosion resistance, it can be considered to be advantageous for improving the corrosion resistance of the resistance material.

另外,本次所揭示的實施形態及實施例均僅止於例示而已,不應認為係屬限制。本發明的範圍並非上述實施形態及實施例的說明,而是依照申請專利範圍揭示,更涵蓋與申請專利範圍具均等涵義與範圍內的所有變更(變化例)。 In addition, the embodiments and examples disclosed herein are merely illustrative and should not be construed as limiting. The scope of the present invention is defined by the scope of the claims and the scope of the invention, and all the modifications (variations) within the meaning and scope of the claims.

(產業上之可利用性) (industrial availability)

本發明的電阻材料係適合於在包含超過100℃溫度區域之例如25℃至150℃廣溫度範圍中使用的電阻器。 The resistive material of the present invention is suitable for use in a resistor comprising a temperature range exceeding 100 ° C, for example, a wide temperature range of 25 ° C to 150 ° C.

Claims (4)

一種電阻材料,係由含有Cu、6.20質量%以上且7.40質量%以下的Mn、以及0.15質量%以上且1.50質量%以下的Si之Cu合金所構成,在25℃至150℃的TCR絕對值係15ppm/K以下。 A resistive material is composed of a Cu alloy containing Cu, 6.20% by mass or more and 7.40% by mass or less of Mn, and 0.15% by mass or more and 1.50% by mass or less of Si, and an absolute value of TCR at 25 ° C to 150 ° C. Below 15ppm/K. 如請求項1之電阻材料,其中,上述Cu合金中,Mn含有量與Si含有量的合計係6.75質量%以上且8.40質量%以下。 In the above-mentioned Cu alloy, the total amount of the Mn content and the Si content is 6.75 mass% or more and 8.40 mass% or less. 如請求項1或2之電阻材料,其中,-50℃至25℃的TCR係0ppm/K以上且50ppm/K以下。 The resistive material according to claim 1 or 2, wherein the TCR of -50 ° C to 25 ° C is 0 ppm / K or more and 50 ppm / K or less. 如請求項1或2之電阻材料,其中,25℃至60℃的TCR絕對值係10ppm/K以下。 The resistive material of claim 1 or 2, wherein the absolute value of TCR of 25 ° C to 60 ° C is 10 ppm / K or less.
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