TWI614741B - External compensation method and driver ic using the same - Google Patents
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Abstract
一種外部補償方法,用於一面板上的元件,該面板包含有複數個子畫素,該外部補償方法包含有在一第一期間內,透過一第一導線對該複數個子畫素之一第一子畫素中的一第一元件進行編程,並透過一第二導線對該第一元件進行感測;以及在一第二期間內,透過該第二導線對該複數個子畫素之一第二子畫素中的一第二元件進行編程,並透過該第一導線或一第三導線對該第二元件進行感測。An external compensation method for an element on a board, the panel comprising a plurality of sub-pixels, the external compensation method comprising: first, one of the plurality of sub-pixels through a first wire in a first period a first component of the subpixel is programmed to sense the first component through a second wire; and in the second period, the second plurality of subpixels are second through the second wire A second component of the subpixel is programmed and senses the second component through the first wire or a third wire.
Description
本發明係指一種外部補償方法及其驅動積體電路(Driver Integrated Circuit,Driver IC),尤指一種用於面板之外部補償方法以及可對面板執行外部補償方法之驅動積體電路。The present invention relates to an external compensation method and a driver integrated circuit (Driver IC) thereof, and more particularly to an external compensation method for a panel and a drive integrated circuit for performing an external compensation method on the panel.
有機發光二極體(Organic Light-Emitting Diode,OLED)為發光二極體(Light-Emitting Diode,LED)的一種,其電致發光層是由有機化合物所構成,該有機化合物可因接收到電流而發光。有機發光二極體廣泛應用於電子裝置之顯示設備,例如電視螢幕、電腦顯示器、各類可攜式裝置例如行動電話、手持式遊戲主機及個人數位助理(Personal Digital Assistant,PDA)等。其中,主動矩陣式有機發光二極體(Active Matrix OLED,AMOLED)為目前有機發光二極體顯示器的主流,主動矩陣式有機發光二極體可由薄膜電晶體(Thin-Film Transistor,TFT)來進行驅動,並包含儲存電容用來維持畫素的狀態,以應用於大尺寸及高解析度的顯示器。An Organic Light-Emitting Diode (OLED) is a type of Light-Emitting Diode (LED). The electroluminescent layer is composed of an organic compound that can receive current. And glow. Organic light-emitting diodes are widely used in display devices of electronic devices, such as television screens, computer monitors, various portable devices such as mobile phones, handheld game consoles, and personal digital assistants (PDAs). Among them, active matrix OLED (AMOLED) is the mainstream of the current organic light emitting diode display, and the active matrix organic light emitting diode can be performed by a thin film transistor (TFT). Driven, and contains storage capacitors to maintain the state of the pixels for large and high resolution displays.
在一般有機發光二極體顯示器中,每一畫素單元皆包含有三個子畫素,其中每一子畫素包含有可產生三原色其中一者的有機發光二極體,用來組成欲顯示在該畫素單元上的顏色。子畫素可從一驅動積體電路(Driver Integrated Circuit,Driver IC)接收一電壓訊號。接著,薄膜電晶體可將電壓訊號轉換為一驅動電流,以驅動有機發光二極體發光。有機發光二極體發光之亮度則由其通過之驅動電流來決定。然而,在有機發光二極體顯示器中,不同子畫素中的薄膜電晶體可能存在元件參數誤差或不匹配的情況,導致電壓/電流轉換效能產生差異,此外,有機發光二極體之發光效率也可能存在誤差。當有機發光二極體顯示器經過一段長時間的運作之後,可能面臨電壓/電流轉換及發光效率的衰減。在此情形下,有機發光二極體顯示器上各個位置可能存在不同程度的衰減,使得有機發光二極體顯示器的畫面一致性降低。In a general organic light emitting diode display, each pixel unit includes three sub-pixels, wherein each sub-pixel includes an organic light-emitting diode that can generate one of the three primary colors, and is configured to be displayed in the pixel. The color on the pixel unit. The sub-pixel can receive a voltage signal from a driver integrated circuit (Driver IC). Then, the thin film transistor converts the voltage signal into a driving current to drive the organic light emitting diode to emit light. The brightness of the organic light-emitting diode is determined by the driving current through which it passes. However, in an organic light-emitting diode display, a thin film transistor in different sub-pixels may have a component parameter error or mismatch, resulting in a difference in voltage/current conversion efficiency, and in addition, the luminous efficiency of the organic light-emitting diode. There may also be errors. When the organic light emitting diode display has been operated for a long period of time, it may face voltage/current conversion and attenuation of luminous efficiency. In this case, there may be different degrees of attenuation at various positions on the organic light emitting diode display, so that the picture consistency of the organic light emitting diode display is lowered.
為了改善有機發光二極體顯示器的畫面一致性,針對有機發光二極體及薄膜電晶體之參數的有效補償方法是必要的。外部補償是用於有機發光二極體顯示器之一種常見的補償方法。請參考第1圖,第1圖為進行常見外部補償方法的一面板100之示意圖。面板100包含有複數個子畫素,以矩陣形式配置。對每一行子畫素而言,一資料線(source line)將子畫素連接至一驅動積體電路(未繪示),使得顯示資料可透過資料線輸出至子畫素中的薄膜電晶體。同時,一感測線(sensing line)亦耦接於每一行子畫素及驅動積體電路之間。感測線可用來進行外部補償,其可將子畫素中薄膜電晶體或有機發光二極體之電氣特性傳送至驅動積體電路,使得驅動積體電路可根據接收到的電氣特性資料進行後續處理。在此情況下,每一行子畫素皆需要二條導線,用來與驅動積體電路進行溝通,使驅動積體電路存在大量的輸入輸出接腳,因而增加驅動積體電路的成本。若面板100包含有N行子畫素時,需要2N條導線來進行資料顯示及外部補償操作。舉例來說,一個full-HD高畫質有機發光二極體顯示器包含有1080行畫素,即1080×3行子畫素,因此,驅動積體電路需包含1080×6個用來連接導線之輸入輸出接腳(1080×3個用於資料線以及1080×3個用於感測線),如此大量的接腳會增加驅動積體電路的成本。有鑑於此,習知技術實有改進之必要。In order to improve the picture consistency of the organic light emitting diode display, an effective compensation method for the parameters of the organic light emitting diode and the thin film transistor is necessary. External compensation is a common compensation method for organic light-emitting diode displays. Please refer to FIG. 1 , which is a schematic diagram of a panel 100 for performing a common external compensation method. The panel 100 includes a plurality of sub-pixels, which are arranged in a matrix form. For each row of sub-pixels, a source line connects the sub-pixels to a driver integrated circuit (not shown), so that the display data can be output to the thin film transistor in the sub-pixel through the data line. . At the same time, a sensing line is also coupled between each row of sub-pixels and the driving integrated circuit. The sensing line can be used for external compensation, which can transmit the electrical characteristics of the thin film transistor or the organic light emitting diode in the subpixel to the driving integrated circuit, so that the driving integrated circuit can perform subsequent processing according to the received electrical characteristic data. . In this case, each row of pixels requires two wires for communicating with the driving integrated circuit, so that the driving integrated circuit has a large number of input and output pins, thereby increasing the cost of driving the integrated circuit. If the panel 100 contains N rows of sub-pixels, 2N wires are required for data display and external compensation operations. For example, a full-HD high-definition organic light-emitting diode display includes 1080 lines of pixels, that is, 1080×3 rows of sub-pixels. Therefore, the driver integrated circuit needs to include 1080×6 wires for connecting wires. Input and output pins (1080 × 3 for data lines and 1080 × 3 for sensing lines), such a large number of pins will increase the cost of driving the integrated circuit. In view of this, the prior art has been improved.
因此,本發明之主要目的即在於提供一種用於面板之外部補償方法以及可對面板執行外部補償方法之驅動積體電路(Driver Integrated Circuit,Driver IC),以解決上述問題。Accordingly, it is a primary object of the present invention to provide an external compensation method for a panel and a Driver Integrated Circuit (Driver IC) that can perform an external compensation method on the panel to solve the above problems.
本發明揭露一種外部補償方法,用於一面板上的元件,該面板包含有複數個子畫素,該外部補償方法包含有在一第一期間內,透過一第一導線對該複數個子畫素之一第一子畫素中的一第一元件進行編程,並透過一第二導線對該第一元件進行感測;以及在一第二期間內,透過該第二導線對該複數個子畫素之一第二子畫素中的一第二元件進行編程,並透過該第一導線或一第三導線對該第二元件進行感測。The present invention discloses an external compensation method for an element on a board, the panel comprising a plurality of sub-pixels, the external compensation method comprising, through a first wire, a plurality of sub-pixels in a first period a first component of a first sub-pixel is programmed and sensed by a second wire; and in a second period, the plurality of sub-pixels are transmitted through the second wire A second component of a second sub-pixel is programmed and sensed by the first wire or a third wire.
本發明另揭露一種用於一面板之驅動積體電路,用來對該面板執行外部補償,該驅動積體電路包含有複數條導線、一第一數位類比轉換器(Digital to Analog Converter,DAC)及一第一輸出緩衝器、一第二數位類比轉換器及一第二輸出緩衝器、一多工器及一類比數位轉換器(Analog to Digital Converter,ADC)。該第一數位類比轉換器及該第一輸出緩衝器耦接於該複數條導線中的一第一導線。該第二數位類比轉換器及該第二輸出緩衝器耦接於該複數條導線中的一第二導線。該類比數位轉換器透過該多工器耦接於該第一導線及該第二導線。The invention further discloses a driving integrated circuit for a panel for performing external compensation on the panel, the driving integrated circuit comprising a plurality of wires and a first digital to analog converter (DAC) And a first output buffer, a second digital analog converter and a second output buffer, a multiplexer and an analog to digital converter (ADC). The first digital analog converter and the first output buffer are coupled to a first one of the plurality of wires. The second digital analog converter and the second output buffer are coupled to a second one of the plurality of wires. The analog to digital converter is coupled to the first wire and the second wire through the multiplexer.
如上所述,若面板上包含N行子畫素時,需要2N條導線以用於資料顯示及外部補償操作。為了降低面板上的導線數量以及驅動積體電路(Driver Integrated Circuit,Driver IC)中相對應的接腳數量,位於不同行的子畫素可共用資料線(source line)及感測線(sensing line)。舉例來說,用於一子畫素之資料線可以是用於另一子畫素之感測線。As described above, if the panel contains N rows of sub-pixels, 2N wires are required for data display and external compensation operations. In order to reduce the number of wires on the panel and the corresponding number of pins in the driver integrated circuit (Driver IC), the sub-pixels located in different rows can share the source line and the sensing line. . For example, the data line for one sub-pixel can be a sensing line for another sub-pixel.
請參考第2圖,第2圖為本發明實施例一有機發光二極體(Organic Light-Emitting Diode,OLED)顯示器系統20之示意圖。如第2圖所示,有機發光二極體顯示器系統20包含有一面板200及一驅動積體電路210。面板200包含有複數個子畫素,以矩陣形式配置,面板200可透過複數條導線耦接至驅動積體電路210。為方便說明,第2圖中僅繪示4個子畫素P1~P4及5條導線L1~L5,但本領域具通常知識者應當了解,面板200可能包含數百或數千行子畫素及導線。Please refer to FIG. 2 , which is a schematic diagram of an Organic Light-Emitting Diode (OLED) display system 20 according to an embodiment of the present invention. As shown in FIG. 2, the organic light emitting diode display system 20 includes a panel 200 and a driving integrated circuit 210. The panel 200 includes a plurality of sub-pixels, which are arranged in a matrix form. The panel 200 can be coupled to the driving integrated circuit 210 through a plurality of wires. For convenience of description, only four sub-pixels P1 to P4 and five wires L1 to L5 are shown in FIG. 2, but those skilled in the art should understand that panel 200 may contain hundreds or thousands of rows of sub-pixels and wire.
如第2圖所示,每一子畫素具有2個接觸點,用以透過二條導線連接至驅動積體電路210。舉例來說,子畫素P1係透過導線L1及L2連接於驅動積體電路210,子畫素P2係透過導線L2及L3連接於驅動積體電路210,並依此類推。透過這樣的方式,每一條導線可由二相鄰子畫素共用。舉例來說,導線L2可由子畫素P1及P2共用,導線L3可由子畫素P2及P3共用,並依此類推。由於導線的共用,相較於第1圖中面板100的導線數量,面板200所需的導線數量可大幅降低。在此例中,若面板200上包含N行子畫素時,只需要N+1條導線即足以實現有機發光二極體顯示器系統20中的資料顯示及外部補償操作,同時,驅動積體電路210之接腳數量亦可大幅降低。As shown in FIG. 2, each sub-pixel has two contact points for connecting to the driving integrated circuit 210 through two wires. For example, the sub-pixel P1 is connected to the driving integrated circuit 210 through the wires L1 and L2, and the sub-pixel P2 is connected to the driving integrated circuit 210 through the wires L2 and L3, and so on. In this way, each wire can be shared by two adjacent sub-pixels. For example, the wire L2 can be shared by the sub-pixels P1 and P2, the wire L3 can be shared by the sub-pixels P2 and P3, and so on. Due to the sharing of the wires, the number of wires required for the panel 200 can be greatly reduced compared to the number of wires of the panel 100 in FIG. In this example, if the panel 200 contains N rows of sub-pixels, only N+1 wires are needed to realize data display and external compensation operation in the organic light-emitting diode display system 20, and at the same time, drive the integrated circuit. The number of pins on the 210 can also be greatly reduced.
在一顯示模式中,面板200可根據來自於驅動積體電路210的資料來顯示影像,此資料可透過每一行導線傳送至每一行子畫素以進行顯示。舉例來說,子畫素P1可從導線L1接收資料,子畫素P2可從導線L2接收資料,並依此類推。在一補償模式中,驅動積體電路210可對面板200上的元件執行外部補償,此時驅動積體電路210可透過一導線對一子畫素中的元件進行編程,並透過另一導線對該元件進行感測。舉例來說,驅動積體電路210可透過導線L1對子畫素P1中的元件進行編程,並透過導線L2對子畫素P1中的該元件進行感測;驅動積體電路210可透過導線L2對子畫素P2中的元件進行編程,並透過導線L3對子畫素P2中的該元件進行感測。In a display mode, the panel 200 can display an image according to the data from the driving integrated circuit 210, and the data can be transmitted to each row of sub-pixels through each row of wires for display. For example, subpixel P1 can receive data from wire L1, subpixel P2 can receive data from wire L2, and so on. In a compensation mode, the driver integrated circuit 210 can perform external compensation on the components on the panel 200. At this time, the driving integrated circuit 210 can program the components in a sub-pixel through a wire and pass through another pair of wires. This component is sensed. For example, the driving integrated circuit 210 can program the component in the sub-pixel P1 through the wire L1, and sense the component in the sub-pixel P1 through the wire L2; the driving integrated circuit 210 can transmit the wire L2. The component in subpixel P2 is programmed and sensed in subpixel P2 via conductor L3.
更明確來說,如第2圖所示,對子畫素P1而言,由導線L1出發並朝向子畫素P1之一接觸點的箭頭表示導線L1可作為一資料線,用來以一特定電壓訊號對子畫素P1中的元件進行編程;由子畫素P1之另一接觸點出發並朝向導線L2的箭頭表示導線L2可作為一感測線,用來接收子畫素P1中的該元件的電氣特性。對子畫素P2而言,由導線L2出發並朝向子畫素P2之一接觸點的箭頭表示導線L2可作為一資料線,用來以一特定電壓訊號對子畫素P2中的元件進行編程;由子畫素P2之另一接觸點出發並朝向導線L3的箭頭表示導線L3可作為一感測線,用來接收子畫素P2中的該元件的電氣特性。依此類推,根據第2圖所示之箭頭方向,本領域具通常知識者應可了解面板200上每一子畫素之編程及感測操作方式。More specifically, as shown in FIG. 2, for the sub-pixel P1, an arrow starting from the wire L1 and facing a contact point of the sub-pixel P1 indicates that the wire L1 can be used as a data line for a specific The voltage signal is used to program the component in the sub-pixel P1; the arrow starting from the other contact point of the sub-pixel P1 and facing the wire L2 indicates that the wire L2 can be used as a sensing line for receiving the component in the sub-pixel P1. Electrical characteristics. For the sub-pixel P2, the arrow starting from the wire L2 and facing the contact point of one of the sub-pixels P2 indicates that the wire L2 can be used as a data line for programming the components in the sub-pixel P2 with a specific voltage signal. The arrow starting from the other contact point of the sub-pixel P2 and facing the wire L3 indicates that the wire L3 can serve as a sensing line for receiving the electrical characteristics of the element in the sub-pixel P2. And so on, according to the direction of the arrow shown in FIG. 2, those skilled in the art should be able to understand the programming and sensing operation mode of each sub-pixel on the panel 200.
在此例中,除了第一行及最後一行導線以外的每一條導線皆可交替作為資料線及感測線。因此,整個面板200的編程及感測操作可在二段期間內完成。在第一期間內,驅動積體電路210可透過導線L1對子畫素P1中的元件進行編程,並透過導線L2對子畫素P1中的元件進行感測。因此,對子畫素P1而言,導線L1之編程操作以及導線L2之感測操作可在同一時間執行。同理,驅動積體電路210可在第一期間內,透過導線L3對子畫素P3中的元件進行編程,同時透過導線L4對子畫素P3中的元件進行感測。在第二期間內,驅動積體電路210可透過導線L2對子畫素P2中的元件進行編程,並透過導線L3對子畫素P2中的元件進行感測。因此,對子畫素P2而言,導線L2之編程操作以及導線L3之感測操作可在同一時間執行。同理,驅動積體電路210可在第二期間內,透過導線L4對子畫素P4中的元件進行編程,同時透過導線L5對子畫素P4中的元件進行感測。如第2圖所示,實線箭頭代表在第一期間內執行之編程或感測操作,而虛線箭頭代表在第二期間內執行之編程或感測操作。In this example, each of the wires except the first row and the last row of wires can be alternately used as the data line and the sensing line. Therefore, the programming and sensing operations of the entire panel 200 can be completed in two stages. In the first period, the driving integrated circuit 210 can program the elements in the sub-pixel P1 through the wire L1 and sense the elements in the sub-pixel P1 through the wire L2. Therefore, for the sub-pixel P1, the programming operation of the wire L1 and the sensing operation of the wire L2 can be performed at the same time. Similarly, the driving integrated circuit 210 can program the components in the sub-pixel P3 through the wire L3 during the first period while sensing the components in the sub-pixel P3 through the wire L4. In the second period, the driving integrated circuit 210 can program the elements in the sub-pixel P2 through the wire L2 and sense the elements in the sub-pixel P2 through the wire L3. Therefore, for the sub-pixel P2, the programming operation of the wire L2 and the sensing operation of the wire L3 can be performed at the same time. Similarly, the driving integrated circuit 210 can program the components in the sub-pixel P4 through the wire L4 during the second period while sensing the components in the sub-pixel P4 through the wire L5. As shown in FIG. 2, the solid arrows represent programming or sensing operations performed during the first period, and the dashed arrows represent programming or sensing operations performed during the second period.
在此情況下,面板200上的子畫素可區分為二組子畫素。位於第一組子畫素之元件係在第一期間內進行編程及感測,位於第二組子畫素之元件係在第二期間內進行編程及感測。在此例中,第一組子畫素包含有位於奇數行的子畫素,即子畫素P1、P3、...等,第二組子畫素包含有位於偶數行的子畫素,即子畫素P2、P4、...等。In this case, the sub-pixels on the panel 200 can be divided into two sets of sub-pixels. The components located in the first set of sub-pixels are programmed and sensed during the first period, and the components located in the second set of sub-pixels are programmed and sensed during the second period. In this example, the first group of sub-pixels includes sub-pixels located in odd-numbered lines, that is, sub-pixels P1, P3, ..., etc., and the second group of sub-pixels includes sub-pixels located in even lines. That is, sub-pixels P2, P4, ..., etc.
值得注意的是,上述關於編程及感測操作的配置方式僅為本發明眾多實施例當中的一種。舉例來說,在另一實施例中,位於偶數行的子畫素可在第一期間內進行編程及感測,而位於奇數行的子畫素則在第二期間內進行編程及感測。為了進一步降低驅動積體電路之接腳數量,可在驅動積體電路之輸入輸出接腳與對應於二行子畫素之二條導線之間設置一多工器(Multiplexer)。在此情況下,驅動積體電路之輸入輸出接腳可透過多工器,選擇性地與此二條導線進行溝通,此時整個面板的編程及感測操作需要更多時間來完成,如四段期間。如此一來,驅動積體電路之接腳數量可再減少一半,使得本發明藉由導線共用來實現之外部補償方法得以應用在小尺寸顯示系統,如智慧型手機之觸控螢幕。It should be noted that the above-described configuration for programming and sensing operations is only one of many embodiments of the present invention. For example, in another embodiment, sub-pixels located in even rows can be programmed and sensed during the first period, while sub-pixels located in odd rows are programmed and sensed during the second period. In order to further reduce the number of pins of the driving integrated circuit, a multiplexer may be disposed between the input and output pins of the driving integrated circuit and the two wires corresponding to the two rows of sub-pixels. In this case, the input and output pins of the driving integrated circuit can be selectively communicated with the two wires through the multiplexer, and the programming and sensing operations of the entire panel need more time to complete, such as four segments. period. In this way, the number of pins for driving the integrated circuit can be further reduced by half, so that the external compensation method implemented by the wire by the present invention can be applied to a small-sized display system, such as a touch screen of a smart phone.
另外需注意的是,第一期間及第二期間的長度皆可任意設定,換句話說,每一次的編程及感測操作可在任意時間長度之內執行。執行編程及感測之時間長度可根據系統需求預先設定,其可相同或不同於一畫素資料顯示的期間。It should also be noted that the lengths of the first period and the second period can be arbitrarily set. In other words, each programming and sensing operation can be performed within any length of time. The length of time for performing programming and sensing can be preset according to system requirements, which can be the same or different from the period during which a pixel data is displayed.
請參考第3圖,第3圖為本發明實施例另一有機發光二極體顯示器系統30之示意圖。如第3圖所示,有機發光二極體顯示器系統30包含有一面板300及一驅動積體電路310。面板300包含有複數個子畫素,以矩陣形式配置,面板300可透過複數條導線耦接至驅動積體電路310。為方便說明,第3圖中僅繪示4個子畫素P1’~P4’及4條導線L1’~L4’,但本領域具通常知識者應當了解,面板300可能包含數百或數千行子畫素及導線。面板300上的子畫素配置方式相似於面板200之配置,但兩者導線共用的方式並不相同。Please refer to FIG. 3, which is a schematic diagram of another organic light emitting diode display system 30 according to an embodiment of the present invention. As shown in FIG. 3, the organic light emitting diode display system 30 includes a panel 300 and a driving integrated circuit 310. The panel 300 includes a plurality of sub-pixels, which are arranged in a matrix form. The panel 300 can be coupled to the driving integrated circuit 310 through a plurality of wires. For convenience of explanation, only four sub-pixels P1' to P4' and four wires L1' to L4' are shown in FIG. 3, but those skilled in the art should understand that the panel 300 may contain hundreds or thousands of lines. Subpixels and wires. The sub-pixel configuration on the panel 300 is similar to the configuration of the panel 200, but the manner in which the two wires are shared is not the same.
在補償模式中,驅動積體電路310可透過導線L1’對子畫素P1’中的元件進行編程,並透過導線L2’對子畫素P1’中的該元件進行感測。在另一期間內,驅動積體電路310可透過導線L2’對子畫素P2’中的元件進行編程,並透過導線L1’對子畫素P2’中的該元件進行感測。透過這樣的方式,每二相鄰子畫素皆可共用二條相同導線。由於導線的共用,相較於第1圖中面板100的導線數量,面板300所需的導線數量可大幅降低。在此例中,若面板300上包含N行子畫素且N為偶數時,只需要N條導線即足以實現有機發光二極體顯示器系統30中的資料顯示及外部補償操作,同時,驅動積體電路310之接腳數量亦可大幅降低。In the compensation mode, the driver integrated circuit 310 can program the elements in the sub-pixel P1' through the wire L1' and sense the element in the sub-pixel P1' through the wire L2'. In another period, the driving integrated circuit 310 can program the elements in the sub-pixel P2' through the wire L2' and sense the element in the sub-pixel P2' through the wire L1'. In this way, two identical sub-pixels can share two identical wires. Due to the sharing of the wires, the number of wires required for the panel 300 can be greatly reduced compared to the number of wires of the panel 100 in FIG. In this example, if the panel 300 includes N rows of sub-pixels and N is even, only N wires are needed to realize data display and external compensation operation in the organic light-emitting diode display system 30, and at the same time, the driving product. The number of pins of the body circuit 310 can also be greatly reduced.
更明確來說,如第3圖所示,對子畫素P1’而言,由導線L1’出發並朝向子畫素P1’之一接觸點的箭頭表示導線L1’可作為一資料線,用來以一特定電壓訊號對子畫素P1’中的元件進行編程;由子畫素P1’之另一接觸點出發並朝向導線L2’的箭頭表示導線L2’可作為一感測線,用來接收子畫素P1’中的該元件的電氣特性。對子畫素P2’而言,由導線L2’出發並朝向子畫素P2’之一接觸點的箭頭表示導線L2’可作為一資料線,用來以一特定電壓訊號對子畫素P2’中的元件進行編程;由子畫素P2’之另一接觸點出發並朝向導線L1’的箭頭表示導線L1’可作為一感測線,用來接收子畫素P2’中的該元件的電氣特性。依此類推,根據第3圖所示之箭頭方向,本領域具通常知識者應可了解面板300上每一子畫素之編程及感測操作方式。More specifically, as shown in FIG. 3, for the sub-pixel P1', an arrow starting from the wire L1' and facing a contact point of the sub-pixel P1' indicates that the wire L1' can be used as a data line. To program the component in the sub-pixel P1' with a specific voltage signal; the arrow starting from the other contact point of the sub-pixel P1' and facing the wire L2' indicates that the wire L2' can be used as a sensing line for receiving the sub-pixel The electrical characteristics of the component in pixel P1'. For the sub-pixel P2', the arrow starting from the wire L2' and facing the contact point of one of the sub-pixels P2' indicates that the wire L2' can be used as a data line for the sub-pixel P2' with a specific voltage signal. The component in the programming is programmed; the arrow starting from the other contact point of the sub-pixel P2' and facing the wire L1' indicates that the wire L1' can serve as a sensing line for receiving the electrical characteristics of the component in the sub-pixel P2'. And so on, according to the direction of the arrow shown in FIG. 3, those skilled in the art should be able to understand the programming and sensing operation mode of each sub-pixel on the panel 300.
同樣地,每一條導線皆可交替作為資料線及感測線,而整個面板300的編程及感測操作可在二段期間內完成。如第3圖所示,實線箭頭代表在第一期間內執行之編程或感測操作,而虛線箭頭代表在第二期間內執行之編程或感測操作。本領域具通常知識者可根據上述段落及第3圖之說明,了解面板300之詳細編程及感測操作方式,於此不贅述。Similarly, each wire can be alternately used as a data line and a sensing line, and the programming and sensing operations of the entire panel 300 can be completed in two stages. As shown in FIG. 3, the solid arrows represent programming or sensing operations performed during the first period, while the dashed arrows represent programming or sensing operations performed during the second period. Those skilled in the art can understand the detailed programming and sensing operation modes of the panel 300 according to the above paragraphs and the description of FIG. 3, and details are not described herein.
為實現上述編程及感測方法,本發明之驅動積體電路(例如驅動積體電路210或310)可透過以下方式實現。請參考第4圖,第4圖為本發明實施例一有機發光二極體顯示器系統40及其驅動積體電路之電路結構示意圖。有機發光二極體顯示器系統40包含有一面板400及一驅動積體電路410,其中,驅動積體電路410之詳細電路結構繪示於第4圖。如第4圖所示,驅動積體電路410包含有複數條導線,耦接於面板上相對應之導線及子畫素。驅動積體電路410另包含複數個數位類比轉換器(Digital to Analog Converter,DAC)及輸出緩衝器,用來對面板上子畫素中的元件進行編程,同時包含複數個類比數位轉換器(Analog to Digital Converter,ADC)及多工器,用來對面板上子畫素中的元件進行感測。這些電路元件皆可透過開關器耦接至導線。為方便說明,第4圖中僅繪示4條導線DL1~DL4及其相對應之4個數位類比轉換器DAC1~DAC4、4個輸出緩衝器B1~B4、2個類比數位轉換器ADC1~ADC2、2個多工器MUX1~MUX2及8個開關器SW1~SW8,但本領域具通常知識者應當了解,驅動積體電路410可能包含數百或數千條導線及其相對應的電路元件。To implement the above programming and sensing methods, the driving integrated circuit of the present invention (e.g., driving integrated circuit 210 or 310) can be implemented in the following manner. Please refer to FIG. 4 , which is a schematic diagram of a circuit structure of an organic light emitting diode display system 40 and a driving integrated circuit thereof according to an embodiment of the present invention. The OLED display system 40 includes a panel 400 and a driving integrated circuit 410. The detailed circuit structure of the driving integrated circuit 410 is shown in FIG. As shown in FIG. 4, the driving integrated circuit 410 includes a plurality of wires coupled to the corresponding wires and sub-pixels on the panel. The driving integrated circuit 410 further includes a plurality of digital to analog converters (DACs) and an output buffer for programming components in the sub-pixels on the panel, and includes a plurality of analog digital converters (Analog) To Digital Converter, ADC) and multiplexer for sensing components in sub-pixels on the panel. These circuit components are all coupled to the wires through the switch. For convenience of explanation, only four wires DL1 to DL4 and their corresponding four digital analog converters DAC1 to DAC4, four output buffers B1 to B4, and two analog digital converters ADC1 to ADC2 are shown in FIG. Two multiplexers MUX1 to MUX2 and eight switches SW1 to SW8, but those skilled in the art should understand that the driving integrated circuit 410 may contain hundreds or thousands of wires and their corresponding circuit components.
詳細來說,為描述驅動積體電路410之電路結構,以下說明以導線DL1~DL2及其相對應的電路元件為例。數位類比轉換器DAC1及輸出緩衝器B1耦接於導線DL1,數位類比轉換器DAC2及輸出緩衝器B2耦接於導線DL2,類比數位轉換器ADC1透過多工器MUX1耦接於導線DL1及DL2。此外,開關器SW1耦接於導線DL1及輸出緩衝器B1之間,開關器SW2耦接於導線DL1及多工器MUX1之間,開關器SW3耦接於導線DL2及多工器MUX1之間,開關器SW4耦接於導線DL2及輸出緩衝器B2之間。In detail, in order to describe the circuit configuration of the driving integrated circuit 410, the following description will be made by taking the wires DL1 to DL2 and their corresponding circuit elements as an example. The digital analog converter DAC1 and the output buffer B1 are coupled to the wire DL1. The digital analog converter DAC2 and the output buffer B2 are coupled to the wire DL2. The analog digital converter ADC1 is coupled to the wires DL1 and DL2 through the multiplexer MUX1. In addition, the switch SW1 is coupled between the wire DL1 and the output buffer B1, the switch SW2 is coupled between the wire DL1 and the multiplexer MUX1, and the switch SW3 is coupled between the wire DL2 and the multiplexer MUX1. The switch SW4 is coupled between the wire DL2 and the output buffer B2.
在顯示模式中,驅動積體電路410可發送顯示資料至面板400,以進行影像顯示。因此,開關器SW1及SW4會導通,使經由數位類比轉換器DAC1~DAC2及輸出緩衝器B1~B2傳送的顯示資料通過,此時開關器SW2及SW3則斷開。In the display mode, the drive integrated circuit 410 can transmit display data to the panel 400 for image display. Therefore, the switches SW1 and SW4 are turned on, and the display data transmitted through the digital analog converters DAC1 to DAC2 and the output buffers B1 to B2 are passed, and at this time, the switches SW2 and SW3 are turned off.
在補償模式中,驅動積體電路410對面板400執行外部補償。此時,數位類比轉換器DAC1~DAC2及輸出緩衝器B1~B2可輸出電壓訊號,以對面板400上的元件進行編程。類比數位轉換器ADC1可對該元件進行感測,以從面板400接收該元件的電氣特性。開關器SW1~SW4及多工器MUX1則控制驅動積體電路410選擇性地執行面板400上元件之編程或感測。假設面板400之導線配置方式相似於面板300之配置,在第一期間內,開關器SW1~SW4及多工器MUX1可控制驅動積體電路410透過導線DL1(如第3圖所示之導線L1’)對面板400上一第一子畫素之一第一元件(如第3圖所示面板300上的子畫素P1’中的元件)進行編程,並透過導線DL2(如第3圖所示之導線L2’)對該第一元件進行感測。接著,在第二期間內,開關器SW1~SW4及多工器MUX1可控制驅動積體電路410透過導線DL2(如第3圖所示之導線L2’)對面板400上一第二子畫素之一第二元件(如第3圖所示面板300上的子畫素P2’中的元件)進行編程,並透過導線DL1(如第3圖所示之導線L1’)對該第二元件進行感測。值得注意的是,第4圖中電路元件之配置方式亦可用於第2圖之面板200上的元件及子畫素配置,並依照相似的方式執行編程及感測操作。在此情況下,第二元件可透過導線DL2進行編程並透過導線DL3(如第2圖所示之導線L3)進行感測。In the compensation mode, the drive integrated circuit 410 performs external compensation on the panel 400. At this time, the digital analog converters DAC1 to DAC2 and the output buffers B1 to B2 can output voltage signals to program the components on the panel 400. The analog digital converter ADC1 can sense the component to receive electrical characteristics of the component from panel 400. The switches SW1 to SW4 and the multiplexer MUX1 control the drive integrated circuit 410 to selectively perform programming or sensing of components on the panel 400. Assuming that the wire arrangement of the panel 400 is similar to the configuration of the panel 300, during the first period, the switches SW1 SW SW4 and the multiplexer MUX 1 can control the driving integrated circuit 410 to pass through the wire DL1 (such as the wire L1 shown in FIG. 3). ') programming one of the first elements of the first sub-pixel on the panel 400 (such as the element in the sub-pixel P1' on the panel 300 shown in FIG. 3) and passing through the wire DL2 (as shown in FIG. 3) The wire L2') is shown to sense the first component. Then, in the second period, the switches SW1 SW SW4 and the multiplexer MUX1 can control the driving integrated circuit 410 to pass through the wire DL2 (such as the wire L2 shown in FIG. 3) to a second sub-pixel on the panel 400. A second component (such as the component in the sub-pixel P2' on the panel 300 shown in FIG. 3) is programmed and is passed through the wire DL1 (such as the wire L1' shown in FIG. 3). Sensing. It should be noted that the arrangement of the circuit elements in FIG. 4 can also be applied to the component and sub-pixel configuration on the panel 200 of FIG. 2, and the programming and sensing operations are performed in a similar manner. In this case, the second component can be programmed through the wire DL2 and sensed through the wire DL3 (such as the wire L3 shown in FIG. 2).
第5圖繪示第4圖之開關器SW1~SW4的波形。假定控制訊號位於較高準位時可控制開關器導通,位於較低準位時可控制開關器斷開。在第一期間內,開關器SW1及SW3導通且開關器SW2及SW4斷開。因此,耦接於輸出緩衝器B1之導線DL1可作為資料線,使數位類比轉換器DAC1及輸出緩衝器B1對面板400上子畫素中的元件進行編程;耦接於多工器MUX1之導線DL2可作為感測線,使類比數位轉換器ADC1接收該元件之電氣特性。在第二期間內,開關器SW2及SW4導通且開關器SW1及SW3斷開。因此,耦接於多工器MUX1之導線DL1可作為感測線,使類比數位轉換器ADC1接收面板400上子畫素中的元件之電氣特性;耦接於輸出緩衝器B2之導線DL2可作為資料線,使數位類比轉換器DAC2及輸出緩衝器B2對該元件進行編程。Fig. 5 is a view showing waveforms of the switches SW1 to SW4 of Fig. 4. It is assumed that the control signal is turned on when the control signal is at a higher level and the switch is turned off when it is at a lower level. During the first period, the switches SW1 and SW3 are turned on and the switches SW2 and SW4 are turned off. Therefore, the wire DL1 coupled to the output buffer B1 can be used as a data line, so that the digital analog converter DAC1 and the output buffer B1 can program the components in the sub-pixel on the panel 400; the wires coupled to the multiplexer MUX1 The DL2 acts as a sense line, allowing the analog to digital converter ADC1 to receive the electrical characteristics of the component. During the second period, the switches SW2 and SW4 are turned on and the switches SW1 and SW3 are turned off. Therefore, the wire DL1 coupled to the multiplexer MUX1 can serve as a sensing line, so that the analog digital converter ADC1 receives the electrical characteristics of the components in the sub-pixel on the panel 400; the wire DL2 coupled to the output buffer B2 can be used as the data. The line is programmed by the digital analog converter DAC2 and the output buffer B2.
值得注意的是,開關器SW1~SW4之運作方式可類推至開關器SW5~SW8以及驅動積體電路410中其它開關器。在此情況下,驅動積體電路410中的導線可區分為二組導線,第一組導線中的每一導線皆與第二組導線中的一導線相鄰。在第一期間內,第一組導線(即位於奇數行的導線,如DL1及DL3)可作為資料線,用來對第一組子畫素(位於奇數行的子畫素)中的元件進行編程,第二組導線(即位於偶數行的導線,如DL2及DL4)可作為感測線,用來對第一組子畫素中的元件進行感測。在第二期間內,第一組導線可作為感測線,用來對第二組子畫素(位於偶數行的子畫素)中的元件進行感測,第二組導線可作為資料線,用來對第二組子畫素中的元件進行編程。如此一來,整個面板的編程及感測操作可在二段期間內完成。It should be noted that the operation modes of the switches SW1 SW SW4 can be analogized to the switches SW5 SW SW 8 and the other switches in the driving integrated circuit 410 . In this case, the wires in the drive integrated circuit 410 can be divided into two sets of wires, each of the first set of wires being adjacent to one of the second set of wires. During the first period, the first set of wires (ie, the wires in the odd rows, such as DL1 and DL3) can be used as data lines for the components in the first set of subpixels (subpixels in odd rows). Programming, a second set of wires (ie, wires in even rows, such as DL2 and DL4) can be used as sense lines to sense components in the first set of subpixels. During the second period, the first set of wires can be used as a sensing line for sensing components in the second set of sub-pixels (sub-pixels in even rows), and the second set of wires can be used as data lines. To program the components in the second set of subpixels. In this way, the programming and sensing operations of the entire panel can be completed in two periods.
另外需注意的是,在本發明中,驅動積體電路可對數位資料進行處理,並透過數位類比轉換器轉換為類比資料之後再加以輸出,同時,來自於面板之感測資料透過類比數位轉換器轉換之後,可由驅動積體電路接收。因此,數位類比轉換器及類比數位轉換器皆是驅動積體電路中必要的元件。然而,第4圖中驅動積體電路410之電路結構僅為本發明眾多實施方式當中之一種。舉例來說,在另一實施例中,輸出緩衝器可整合於相對應之數位類比轉換器。在又一實施例中,開關器SW2及SW3可整合於多工器MUX1,且開關器SW6及SW7可整合於多工器MUX2。此外,開關器可透過任何方式來實現,例如單一電晶體或傳輸閘(transmission gate),但不限於此。In addition, in the present invention, the driving integrated circuit can process the digital data and convert it into analog data through the digital analog converter, and then output the sensing data from the panel through the analog digital conversion. After the converter is converted, it can be received by the driver integrated circuit. Therefore, the digital analog converter and the analog digital converter are all necessary components for driving the integrated circuit. However, the circuit structure of the drive integrated circuit 410 in Fig. 4 is only one of many embodiments of the present invention. For example, in another embodiment, the output buffer can be integrated into a corresponding digital analog converter. In yet another embodiment, the switches SW2 and SW3 can be integrated into the multiplexer MUX1, and the switches SW6 and SW7 can be integrated into the multiplexer MUX2. Further, the switch can be implemented by any means, such as a single transistor or a transmission gate, but is not limited thereto.
針對面板上子畫素的外部補償,欲進行感測之元件可以是有機發光二極體或薄膜電晶體(Thin-Film Transistor,TFT)。驅動積體電路可根據這些元件的感測結果,在產生顯示資料時對有機發光二極體以及薄膜電晶體的參數進行補償。請參考第6A~6D圖,第6A~6D圖為第2圖中子畫素之詳細編程及感測操作之示意圖。第6A~6D圖繪示子畫素P1~P3及其對應的導線L1~L4,導線L1~L4耦接於一驅動積體電路(未繪示)。每一子畫素P1~P3包含有一有機發光二極體LED1、一驅動薄膜電晶體T1、一電容以及數個功用如同開關器之控制薄膜電晶體。子畫素P1~P3具有P型結構,其中,驅動薄膜電晶體T1為P型金氧半場效電晶體(P-type Metal-Oxide Semiconductor Field-Effect Transistor,PMOSFET)。For the external compensation of the sub-pixel on the panel, the component to be sensed may be an organic light-emitting diode or a thin film-transistor (TFT). The driving integrated circuit can compensate the parameters of the organic light emitting diode and the thin film transistor when generating display data according to the sensing result of these components. Please refer to Figures 6A to 6D. Figures 6A to 6D are schematic diagrams showing the detailed programming and sensing operations of the sub-pixels in Figure 2. 6A to 6D are diagrams showing subpixels P1 to P3 and their corresponding wires L1 to L4, and the wires L1 to L4 are coupled to a driving integrated circuit (not shown). Each of the sub-pixels P1 to P3 includes an organic light-emitting diode LED 1, a driving thin film transistor T1, a capacitor, and a plurality of control thin film transistors functioning as a switch. The sub-pixels P1 to P3 have a P-type structure in which the driving film transistor T1 is a P-type Metal-Oxide Semiconductor Field-Effect Transistor (PMOSFET).
如第6A圖所示,驅動積體電路透過導線L1及L3以一極低的電壓對子畫素P1及P3進行編程,以透過導線L2及L4對有機發光二極體LED1進行感測。在此例中,感測操作係在子畫素P1及P3中的有機發光二極體LED1上進行。詳細來說,在補償模式中,控制訊號Scan[N]及FB[N]開啟對應的控制薄膜電晶體,控制訊號EM[N]關閉對應的控制薄膜電晶體。因此,從導線L1及L3輸入之極低電壓傳送至驅動薄膜電晶體T1之閘極,以開啟驅動薄膜電晶體T1並使驅動薄膜電晶體T1操作在線性區(linear region),此時驅動薄膜電晶體T1可視為完全導通的開關器。在此情況下,從導線L2及L4輸入之感測訊號可通過驅動薄膜電晶體T1進入子畫素P1及P3中的有機發光二極體LED1,以取得有機發光二極體LED1之電氣特性。舉例來說,驅動積體電路可在感測線L2上產生一電壓訊號,以感測通過有機發光二極體LED1的電流,或者在感測線L2上產生一電流訊號,以感測有機發光二極體LED1之電壓。As shown in FIG. 6A, the driving integrated circuit programs the sub-pixels P1 and P3 through the wires L1 and L3 at a very low voltage to sense the organic light-emitting diode LED1 through the wires L2 and L4. In this example, the sensing operation is performed on the organic light-emitting diode LEDs 1 in the sub-pixels P1 and P3. In detail, in the compensation mode, the control signals Scan[N] and FB[N] turn on the corresponding control film transistor, and the control signal EM[N] turns off the corresponding control film transistor. Therefore, the extremely low voltage input from the wires L1 and L3 is transmitted to the gate of the driving film transistor T1 to turn on the driving film transistor T1 and operate the driving film transistor T1 in a linear region, at this time driving the film Transistor T1 can be considered a fully conductive switch. In this case, the sensing signals input from the wires L2 and L4 can be driven into the organic light-emitting diodes LED1 of the sub-pixels P1 and P3 by driving the thin film transistor T1 to obtain the electrical characteristics of the organic light-emitting diode LED1. For example, the driving integrated circuit can generate a voltage signal on the sensing line L2 to sense the current through the organic light emitting diode LED1 or generate a current signal on the sensing line L2 to sense the organic light emitting diode. The voltage of the body LED1.
值得注意的是,上述感測操作會在感測線(如導線L2及L4)上產生較高電壓,此較高電壓會關閉相鄰於欲感測子畫素之子畫素(如子畫素P2)中的驅動薄膜電晶體。除此之外,在非感測子畫素中,驅動薄膜電晶體之閘極和電容可隔離感測線上的感測訊號,因而不會干擾欲感測子畫素中的感測操作。舉例來說,在第6A圖之子畫素P2中,感測訊號傳送至驅動薄膜電晶體T1之閘極和電容,並不會影響感測結果,且驅動薄膜電晶體T1接收到較高電壓而關閉,使得從導線L3輸入之編程訊號不會進入子畫素P2中的有機發光二極體LED1。如第6A~6D圖所示,標記在薄膜電晶體上的『叉號』代表該薄膜電晶體斷開或關閉。因此,子畫素P2可隔離子畫素P1及P3中的編程及感測操作,可避免不同子畫素之運作互相干擾。It is worth noting that the above sensing operation produces a higher voltage on the sensing lines (such as wires L2 and L4), which will turn off the sub-pixels adjacent to the sub-pixels to be sensed (eg, sub-pixel P2). Driving the thin film transistor. In addition, in the non-sensing sub-pixel, the gate and the capacitor of the driving thin film transistor can isolate the sensing signal on the sensing line, and thus do not interfere with the sensing operation in the sub-pixel to be sensed. For example, in the sub-pixel P2 of FIG. 6A, the sensing signal is transmitted to the gate and the capacitor of the driving thin film transistor T1, and the sensing result is not affected, and the driving thin film transistor T1 receives the higher voltage. The turn-off is such that the programming signal input from the line L3 does not enter the organic light-emitting diode LED 1 in the sub-pixel P2. As shown in Figures 6A to 6D, the "cross" on the thin film transistor indicates that the thin film transistor is turned off or off. Therefore, the sub-pixel P2 can isolate the programming and sensing operations in the sub-pixels P1 and P3, and can prevent the operation of different sub-pixels from interfering with each other.
在本發明之一範例實施例中,電源電壓VDD為8V而接地電壓VSS為0V。從導線L1及L3輸入之編程訊號為一極低的電壓,如0V,使得子畫素P1及P3中的驅動薄膜電晶體操作在線性區。導線L2及L4上感測訊號的電壓等於6V。在此例中,編程及感測操作係針對位於奇數行的子畫素中的有機發光二極體LED1。In an exemplary embodiment of the invention, the supply voltage VDD is 8V and the ground voltage VSS is 0V. The programming signal input from the wires L1 and L3 is a very low voltage, such as 0V, so that the driving thin film transistors in the sub-pixels P1 and P3 operate in the linear region. The voltage of the sense signal on conductors L2 and L4 is equal to 6V. In this example, the programming and sensing operations are for the organic light-emitting diode LEDs 1 located in the sub-pixels of the odd rows.
如第6B圖所示,驅動積體電路透過導線L1及L3以一相對低的電壓對子畫素P1及P3進行編程,以透過導線L2及L4對驅動薄膜電晶體T1進行感測。在此例中,感測操作係在子畫素P1及P3中的驅動薄膜電晶體T1上進行。詳細來說,在補償模式中,控制訊號Scan[N]及FB[N]開啟對應的控制薄膜電晶體,控制訊號EM[N]關閉對應的控制薄膜電晶體。因此,從導線L1及L3輸入之相對低電壓傳送至驅動薄膜電晶體T1之閘極,以開啟驅動薄膜電晶體T1並使驅動薄膜電晶體T1操作在飽和區(saturation region)。在此情況下,從導線L2及L4輸入之感測訊號可通過驅動薄膜電晶體T1進入子畫素P1及P3中的有機發光二極體LED1,而感測電壓及電流會遵循操作在飽和區的金氧半場效電晶體之電流/電壓特性。因此,驅動積體電路可同時取得驅動薄膜電晶體T1及有機發光二極體LED1之電氣特性。藉由減去有機發光二極體LED1的部分(其可在第6A圖之實施例中取得),驅動積體電路可取得驅動薄膜電晶體T1之電氣特性。As shown in FIG. 6B, the driving integrated circuit programs the sub-pixels P1 and P3 through the wires L1 and L3 at a relatively low voltage to sense the driving film transistor T1 through the wires L2 and L4. In this example, the sensing operation is performed on the driving thin film transistor T1 in the sub-pixels P1 and P3. In detail, in the compensation mode, the control signals Scan[N] and FB[N] turn on the corresponding control film transistor, and the control signal EM[N] turns off the corresponding control film transistor. Therefore, the relatively low voltage input from the wires L1 and L3 is transmitted to the gate of the driving thin film transistor T1 to turn on the driving thin film transistor T1 and operate the driving thin film transistor T1 in the saturation region. In this case, the sensing signals input from the wires L2 and L4 can be driven into the organic light-emitting diodes LED1 in the sub-pixels P1 and P3 by driving the thin film transistor T1, and the sensing voltage and current will follow the operation in the saturation region. The current/voltage characteristics of the metal oxide half field effect transistor. Therefore, the driving integrated circuit can simultaneously obtain the electrical characteristics of the driving thin film transistor T1 and the organic light emitting diode LED 1. By subtracting the portion of the organic light-emitting diode LED 1 (which can be obtained in the embodiment of FIG. 6A), the integrated circuit can be driven to obtain the electrical characteristics of the driving thin film transistor T1.
同樣地,在第6B圖所示之子畫素P2中,具有較高電壓的感測訊號傳送至驅動薄膜電晶體T1之閘極和電容,其不會影響感測結果,且驅動薄膜電晶體T1接收到較高電壓而關閉,使得從導線L3輸入之編程訊號不會進入子畫素P2中的有機發光二極體LED1。因此,子畫素P2可隔離子畫素P1及P3中的編程及感測操作,可避免不同子畫素之運作互相干擾。Similarly, in the sub-pixel P2 shown in FIG. 6B, the sensing signal having a higher voltage is transmitted to the gate and the capacitor of the driving thin film transistor T1, which does not affect the sensing result, and drives the thin film transistor T1. The higher voltage is received and turned off, so that the programming signal input from the wire L3 does not enter the organic light emitting diode LED1 in the subpixel P2. Therefore, the sub-pixel P2 can isolate the programming and sensing operations in the sub-pixels P1 and P3, and can prevent the operation of different sub-pixels from interfering with each other.
在本發明之一範例實施例中,電源電壓VDD為8V而接地電壓VSS為0V。從導線L1及L3輸入之編程訊號為一相對低的電壓,如4V,使得子畫素P1及P3中的驅動薄膜電晶體操作在飽和區。導線L2及L4上感測訊號的電壓等於6V。在此例中,編程及感測操作係針對位於奇數行的子畫素中的驅動薄膜電晶體T1及有機發光二極體LED1,減去有機發光二極體LED1的部分之後即可取得驅動薄膜電晶體T1之相關資訊。In an exemplary embodiment of the invention, the supply voltage VDD is 8V and the ground voltage VSS is 0V. The programming signal input from the wires L1 and L3 is a relatively low voltage, such as 4V, so that the driving thin film transistors in the subpixels P1 and P3 operate in the saturation region. The voltage of the sense signal on conductors L2 and L4 is equal to 6V. In this example, the programming and sensing operations are performed on the driving thin film transistor T1 and the organic light emitting diode LED1 in the sub-pixels of the odd rows, and the driving thin film can be obtained after subtracting the portion of the organic light emitting diode LED1. Information about transistor T1.
如第6C圖所示,驅動積體電路透過導線L2以一極低的電壓對子畫素P2進行編程,以透過導線L3對有機發光二極體LED1進行感測。在此例中,感測操作係在子畫素P2中的有機發光二極體LED1上進行。更明確來說,編程及感測操作係針對位於偶數行的子畫素中的有機發光二極體LED1。相較於第6A圖之實施例而言,在第6C圖之實施例中導線扮演不同角色,亦即,位於奇數行的導線(如L1、L3、...等)可作為感測線,用來接收位於偶數行的子畫素中的有機發光二極體LED1之電氣特性,位於偶數行的導線(如L2、L4、...等)可作為資料線,用來對位於偶數行的子畫素進行編程。根據第6C圖的內容及上述說明,本領域具通常知識者應可推知位於偶數行的子畫素中的有機發光二極體LED1之詳細編程及感測操作方式,在此不贅述。As shown in FIG. 6C, the driving integrated circuit programs the sub-pixel P2 through the wire L2 at a very low voltage to sense the organic light-emitting diode LED1 through the wire L3. In this example, the sensing operation is performed on the organic light-emitting diode LED 1 in the sub-pixel P2. More specifically, the programming and sensing operations are directed to the organic light-emitting diode LEDs 1 located in the sub-pixels of the even rows. Compared with the embodiment of FIG. 6A, in the embodiment of FIG. 6C, the wires play different roles, that is, the wires (eg, L1, L3, ..., etc.) located in the odd rows can be used as the sensing lines. To receive the electrical characteristics of the organic light-emitting diode LED1 in the sub-pixels of the even-numbered rows, the wires (such as L2, L4, ..., etc.) located in even rows can be used as data lines for the sub-rows. The pixels are programmed. According to the content of FIG. 6C and the above description, those skilled in the art should be able to infer the detailed programming and sensing operation modes of the organic light-emitting diode LED 1 in the sub-pixels of the even-numbered rows, and details are not described herein.
如第6D圖所示,驅動積體電路透過導線L2以一相對低的電壓對子畫素P2進行編程,以透過導線L3對驅動薄膜電晶體T1進行感測。在此例中,感測操作係在子畫素P2中的驅動薄膜電晶體T1上進行。更明確來說,編程及感測操作係針對位於偶數行的子畫素中的驅動薄膜電晶體T1。相較於第6B圖之實施例而言,在第6D圖之實施例中導線扮演不同角色,亦即,位於奇數行的導線(如L1、L3、...等)可作為感測線,用來接收位於偶數行的子畫素中的驅動薄膜電晶體T1之電氣特性,位於偶數行的導線(如L2、L4、...等)可作為資料線,用來對位於偶數行的子畫素進行編程。根據第6D圖的內容及上述說明,本領域具通常知識者應可推知位於偶數行的子畫素中的驅動薄膜電晶體T1之詳細編程及感測操作方式,在此不贅述。As shown in Fig. 6D, the driving integrated circuit programs the sub-pixel P2 at a relatively low voltage through the wire L2 to sense the driving film transistor T1 through the wire L3. In this example, the sensing operation is performed on the driving thin film transistor T1 in the sub-pixel P2. More specifically, the programming and sensing operations are directed to the driving thin film transistor T1 located in the sub-pixels of the even rows. Compared with the embodiment of FIG. 6B, in the embodiment of FIG. 6D, the wires play different roles, that is, the wires (such as L1, L3, ..., etc.) located in the odd rows can be used as the sensing lines. To receive the electrical characteristics of the driving film transistor T1 in the sub-pixels of the even rows, the wires in the even rows (such as L2, L4, ..., etc.) can be used as data lines for sub-pictures located in even rows. Programming. According to the content of FIG. 6D and the above description, those skilled in the art should be able to infer the detailed programming and sensing operation modes of the driving thin film transistor T1 in the sub-pixels of the even rows, and details are not described herein.
值得注意的是,本發明之編程及感測操作亦適用於具有N型結構的子畫素,詳述如下。It should be noted that the programming and sensing operations of the present invention are also applicable to sub-pixels having an N-type structure, as detailed below.
請參考第7A~7D圖,第7A~7D圖為第2圖中子畫素之詳細編程及感測操作之示意圖。第7A~7D圖繪示子畫素P1~P3及其對應的導線L1~L4,導線L1~L4耦接於一驅動積體電路(未繪示)。每一子畫素P1~P3包含有一有機發光二極體LED2、一驅動薄膜電晶體T2、一電容以及數個功用如同開關器之控制薄膜電晶體。子畫素P1~P3具有N型結構,其中,驅動薄膜電晶體T2為N型金氧半場效電晶體(N-type Metal-Oxide Semiconductor Field-Effect Transistor,NMOSFET)。Please refer to the 7A-7D drawings, and the 7A-7D diagram is a schematic diagram of the detailed programming and sensing operation of the sub-pixel in FIG. 7A to 7D are diagrams showing subpixels P1 to P3 and their corresponding wires L1 to L4, and wires L1 to L4 are coupled to a driving integrated circuit (not shown). Each of the sub-pixels P1 to P3 includes an organic light-emitting diode LED 2, a driving thin film transistor T2, a capacitor, and a plurality of control thin film transistors functioning as a switch. The sub-pixels P1 to P3 have an N-type structure in which the driving film transistor T2 is an N-type Metal-Oxide Semiconductor Field-Effect Transistor (NMOSFET).
如第7A圖所示,驅動積體電路透過導線L1及L3以一相對低的電壓對子畫素P1及P3進行編程,以透過導線L2及L4對有機發光二極體LED2進行感測。在此例中,感測操作係在子畫素P1及P3中的有機發光二極體LED2上進行。詳細來說,在補償模式中,控制訊號Scan[N]及FB_O[N]開啟對應的控制薄膜電晶體,控制訊號FB_E[N]關閉對應的控制薄膜電晶體。因此,從導線L1及L3輸入之相對低電壓傳送至驅動薄膜電晶體T2之閘極,以關閉驅動薄膜電晶體T2並使驅動薄膜電晶體T2操作在截止區(cut-off region),此時驅動薄膜電晶體T2可視為完全斷開的開關器。在此情況下,從導線L2及L4輸入之感測訊號可進入子畫素P1及P3中的有機發光二極體LED2,而不會受到驅動薄膜電晶體T2的干擾,進而取得有機發光二極體LED2之電氣特性。As shown in FIG. 7A, the driving integrated circuit programs the sub-pixels P1 and P3 through the wires L1 and L3 at a relatively low voltage to sense the organic light-emitting diode LED 2 through the wires L2 and L4. In this example, the sensing operation is performed on the organic light-emitting diode LEDs 2 in the sub-pixels P1 and P3. In detail, in the compensation mode, the control signals Scan[N] and FB_O[N] turn on the corresponding control film transistor, and the control signal FB_E[N] turns off the corresponding control film transistor. Therefore, the relatively low voltage input from the wires L1 and L3 is transmitted to the gate of the driving film transistor T2 to turn off the driving film transistor T2 and operate the driving film transistor T2 in the cut-off region. The driving film transistor T2 can be regarded as a completely disconnected switch. In this case, the sensing signals input from the wires L2 and L4 can enter the organic light-emitting diode LEDs 2 in the sub-pixels P1 and P3 without being disturbed by the driving film transistor T2, thereby obtaining the organic light-emitting diode. The electrical characteristics of the body LED2.
值得注意的是,上述感測操作會在感測線(如導線L2及L4)上產生較高電壓,此較高電壓會開啟相鄰於欲感測子畫素之子畫素(如子畫素P2)中的驅動薄膜電晶體。然而,控制訊號FB_E[N]可關閉其對應的控制薄膜電晶體,以避免編程訊號進入非感測子畫素。除此之外,在非感測子畫素中,驅動薄膜電晶體之閘極和電容可隔離感測線上的感測訊號,因而不會干擾欲感測子畫素中的感測操作。舉例來說,在第7A圖之子畫素P2中,感測訊號傳送至驅動薄膜電晶體T2之閘極和電容,並不會影響感測結果,且子畫素P2中最右側的控制薄膜電晶體受控於控制訊號FB_E[N]而關閉,使得從導線L3輸入之編程訊號不會進入子畫素P2中的有機發光二極體LED2。同樣地,如第7A~7D圖所示,標記在薄膜電晶體上的『叉號』代表該薄膜電晶體斷開或關閉。因此,子畫素P2可隔離子畫素P1及P3中的編程及感測操作,可避免不同子畫素之運作互相干擾。It is worth noting that the above sensing operation produces a higher voltage on the sensing lines (such as wires L2 and L4), which will turn on the sub-pixels adjacent to the sub-pixels to be sensed (eg, sub-pixel P2). Driving the thin film transistor. However, the control signal FB_E[N] can turn off its corresponding control film transistor to prevent the programming signal from entering the non-sensing sub-pixel. In addition, in the non-sensing sub-pixel, the gate and the capacitor of the driving thin film transistor can isolate the sensing signal on the sensing line, and thus do not interfere with the sensing operation in the sub-pixel to be sensed. For example, in the sub-pixel P2 of FIG. 7A, the sensing signal is transmitted to the gate and the capacitor of the driving thin film transistor T2, and the sensing result is not affected, and the rightmost control film in the sub-pixel P2 is electrically The crystal is turned off by the control signal FB_E[N] so that the programming signal input from the wire L3 does not enter the organic light-emitting diode LED 2 in the sub-pixel P2. Similarly, as shown in Figures 7A to 7D, the "cross" on the thin film transistor indicates that the thin film transistor is turned off or off. Therefore, the sub-pixel P2 can isolate the programming and sensing operations in the sub-pixels P1 and P3, and can prevent the operation of different sub-pixels from interfering with each other.
在本發明之一範例實施例中,電源電壓VDD為8V而接地電壓VSS為0V。從導線L1及L3輸入之編程訊號為一相對低的電壓,如3V,其關閉子畫素P1及P3中的驅動薄膜電晶體。導線L2及L4上感測訊號的電壓等於5V。在此例中,編程及感測操作係針對位於奇數行的子畫素中的有機發光二極體LED2。In an exemplary embodiment of the invention, the supply voltage VDD is 8V and the ground voltage VSS is 0V. The programming signal input from the wires L1 and L3 is a relatively low voltage, such as 3V, which turns off the driving thin film transistors in the sub-pixels P1 and P3. The voltage of the sense signal on conductors L2 and L4 is equal to 5V. In this example, the programming and sensing operations are for the organic light-emitting diode LEDs 2 located in the sub-pixels of the odd rows.
如第7B圖所示,驅動積體電路透過導線L1及L3以一相對高的電壓對子畫素P1及P3進行編程,以透過導線L2及L4對驅動薄膜電晶體T2進行感測。在此例中,感測操作係在子畫素P1及P3中的驅動薄膜電晶體T2上進行。詳細來說,在補償模式中,控制訊號Scan[N]及FB_O[N]開啟對應的控制薄膜電晶體,控制訊號FB_E[N]關閉對應的控制薄膜電晶體。因此,從導線L1及L3輸入之相對高電壓傳送至驅動薄膜電晶體T2之閘極,以開啟驅動薄膜電晶體T2並使驅動薄膜電晶體T2操作在飽和區。在此情況下,從導線L2及L4輸入之感測訊號可進入子畫素P1及P3中的驅動薄膜電晶體T2,而感測電壓及電流會遵循操作在飽和區的金氧半場效電晶體之電流/電壓特性。因此,驅動積體電路可取得驅動薄膜電晶體T2之電氣特性。As shown in FIG. 7B, the driving integrated circuit programs the sub-pixels P1 and P3 through the wires L1 and L3 at a relatively high voltage to sense the driving film transistor T2 through the wires L2 and L4. In this example, the sensing operation is performed on the driving thin film transistor T2 in the sub-pixels P1 and P3. In detail, in the compensation mode, the control signals Scan[N] and FB_O[N] turn on the corresponding control film transistor, and the control signal FB_E[N] turns off the corresponding control film transistor. Therefore, the relatively high voltage input from the wires L1 and L3 is transmitted to the gate of the driving film transistor T2 to turn on the driving film transistor T2 and operate the driving film transistor T2 in the saturation region. In this case, the sensing signals input from the wires L2 and L4 can enter the driving film transistor T2 in the sub-pixels P1 and P3, and the sensing voltage and current follow the gold-oxygen half-field effect transistor operating in the saturation region. Current/voltage characteristics. Therefore, the driving integrated circuit can obtain the electrical characteristics of the driving thin film transistor T2.
值得注意的是,上述感測操作會在感測線(如導線L2及L4)上產生較低電壓,此較低電壓會關閉相鄰於欲感測子畫素之子畫素(如子畫素P2)中的驅動薄膜電晶體。除此之外,在非感測子畫素中,驅動薄膜電晶體之閘極和電容可隔離感測線上的感測訊號,因而不會干擾欲感測子畫素中的感測操作。舉例來說,在第7B圖之子畫素P2中,具有較低電壓的感測訊號傳送至驅動薄膜電晶體T2之閘極和電容,並不會影響感測結果,且驅動薄膜電晶體T2接收到較低電壓而關閉,受控於控制訊號FB_E[N]之控制薄膜電晶體亦關閉,使得從導線L3輸入之編程訊號不會進入子畫素P2。因此,子畫素P2可隔離子畫素P1及P3中的編程及感測操作,可避免不同子畫素之運作互相干擾。It is worth noting that the above sensing operation produces a lower voltage on the sensing lines (such as wires L2 and L4), which lowers the sub-pixels adjacent to the sub-pixels to be sensed (eg, sub-pixel P2). Driving the thin film transistor. In addition, in the non-sensing sub-pixel, the gate and the capacitor of the driving thin film transistor can isolate the sensing signal on the sensing line, and thus do not interfere with the sensing operation in the sub-pixel to be sensed. For example, in the sub-pixel P2 of FIG. 7B, the sensing signal with a lower voltage is transmitted to the gate and the capacitor of the driving thin film transistor T2, and does not affect the sensing result, and drives the thin film transistor T2 to receive. When it is turned off to a lower voltage, the control film transistor controlled by the control signal FB_E[N] is also turned off, so that the programming signal input from the wire L3 does not enter the sub-pixel P2. Therefore, the sub-pixel P2 can isolate the programming and sensing operations in the sub-pixels P1 and P3, and can prevent the operation of different sub-pixels from interfering with each other.
在本發明之一範例實施例中,電源電壓VDD為8V而接地電壓VSS為0V。從導線L1及L3輸入之編程訊號為一相對高的電壓,如5V,使得子畫素P1及P3中的驅動薄膜電晶體操作在飽和區。導線L2及L4上感測訊號的電壓等於3V。在此例中,編程及感測操作係針對位於奇數行的子畫素中的驅動薄膜電晶體T2。In an exemplary embodiment of the invention, the supply voltage VDD is 8V and the ground voltage VSS is 0V. The programming signal input from the wires L1 and L3 is a relatively high voltage, such as 5V, so that the driving thin film transistors in the subpixels P1 and P3 operate in the saturation region. The voltage of the sense signal on conductors L2 and L4 is equal to 3V. In this example, the programming and sensing operations are directed to the driving thin film transistor T2 located in the sub-pixels of the odd rows.
如第7C圖所示,驅動積體電路透過導線L2以一相對低的電壓對子畫素P2進行編程,以透過導線L3對有機發光二極體LED2進行感測。在此例中,感測操作係在子畫素P2中的有機發光二極體LED2上進行。更明確來說,編程及感測操作係針對位於偶數行的子畫素中的有機發光二極體LED2。相較於第7A圖之實施例而言,在第7C圖之實施例中導線扮演不同角色,亦即,位於奇數行的導線(如L1、L3、...等)可作為感測線,用來接收位於偶數行的子畫素中的有機發光二極體LED2之電氣特性,位於偶數行的導線(如L2、L4、...等)可作為資料線,用來對位於偶數行的子畫素進行編程。根據第7C圖的內容及上述說明,本領域具通常知識者應可推知位於偶數行的子畫素中的有機發光二極體LED2之詳細編程及感測操作方式,在此不贅述。As shown in FIG. 7C, the driving integrated circuit programs the sub-pixel P2 through the wire L2 at a relatively low voltage to sense the organic light-emitting diode LED 2 through the wire L3. In this example, the sensing operation is performed on the organic light-emitting diode LED 2 in the sub-pixel P2. More specifically, the programming and sensing operations are for organic light-emitting diode LEDs 2 located in sub-pixels of even rows. Compared with the embodiment of FIG. 7A, in the embodiment of FIG. 7C, the wires play different roles, that is, the wires (eg, L1, L3, ..., etc.) located in the odd rows can be used as the sensing lines. To receive the electrical characteristics of the organic light-emitting diode LED2 in the sub-pixels of the even-numbered rows, the wires (such as L2, L4, ..., etc.) located in even rows can be used as data lines for the sub-rows. The pixels are programmed. According to the content of FIG. 7C and the above description, those skilled in the art should be able to infer the detailed programming and sensing operation modes of the organic light-emitting diode LED 2 located in the sub-pixels of the even-numbered rows, and details are not described herein.
如第7D圖所示,驅動積體電路透過導線L2以一相對高的電壓對子畫素P2進行編程,以透過導線L3對驅動薄膜電晶體T2進行感測。在此例中,感測操作係在子畫素P2中的驅動薄膜電晶體T2上進行。更明確來說,編程及感測操作係針對位於偶數行的子畫素中的驅動薄膜電晶體T2。相較於第7B圖之實施例而言,在第7D圖之實施例中導線扮演不同角色,亦即,位於奇數行的導線(如L1、L3、...等)可作為感測線,用來接收位於偶數行的子畫素中的驅動薄膜電晶體T2之電氣特性,位於偶數行的導線(如L2、L4、...等)可作為資料線,用來對位於偶數行的子畫素進行編程。根據第7D圖的內容及上述說明,本領域具通常知識者應可推知位於偶數行的子畫素中的驅動薄膜電晶體T2之詳細編程及感測操作方式,在此不贅述。As shown in Fig. 7D, the drive integrated circuit programs the sub-pixel P2 through a relatively high voltage through the wire L2 to sense the drive film transistor T2 through the wire L3. In this example, the sensing operation is performed on the driving film transistor T2 in the sub-pixel P2. More specifically, the programming and sensing operations are directed to driving thin film transistors T2 located in sub-pixels of even rows. Compared with the embodiment of FIG. 7B, in the embodiment of FIG. 7D, the wires play different roles, that is, the wires (such as L1, L3, ..., etc.) located in the odd rows can be used as the sensing lines. To receive the electrical characteristics of the driving film transistor T2 in the sub-pixels of the even rows, the wires in the even rows (such as L2, L4, ..., etc.) can be used as data lines for sub-pictures located in even rows. Programming. According to the content of the 7D figure and the above description, those skilled in the art should be able to infer the detailed programming and sensing operation modes of the driving film transistor T2 in the sub-pixels of the even-numbered rows, and details are not described herein.
上述關於有機發光二極體顯示器系統之編程及感測操作可歸納為一外部補償流程80,如第8圖所示。外部補償流程80可在驅動積體電路中執行,其包含以下步驟:The programming and sensing operations described above with respect to the organic light emitting diode display system can be summarized as an external compensation process 80, as shown in FIG. The external compensation process 80 can be performed in a drive integrated circuit that includes the following steps:
步驟800: 開始。Step 800: Start.
步驟802: 在一第一期間內,透過一第一導線對複數個子畫素之一第一子畫素中的一第一元件進行編程,並透過一第二導線對該第一元件進行感測。Step 802: program, in a first period, a first component of the first sub-pixel of the plurality of sub-pixels through a first wire, and sense the first component through a second wire .
步驟804: 在一第二期間內,透過第二導線對複數個子畫素之一第二子畫素中的一第二元件進行編程,並透過第一導線或一第三導線對該第二元件進行感測。Step 804: program, in a second period, a second component of the second sub-pixel of the plurality of sub-pixels through the second wire, and pass the first wire or a third wire to the second component Perform sensing.
步驟806: 結束。Step 806: End.
外部補償流程80之詳細操作及變化方式可參考上述說明,於此不贅述。For detailed operations and changes of the external compensation process 80, reference may be made to the above description, and details are not described herein.
綜上所述,本發明提供了一種用於面板之外部補償方法以及可對面板執行外部補償方法之驅動積體電路。根據外部補償方法,每一行導線可作為資料線或感測線,由相鄰子畫素共用。位於奇數行子畫素的元件以及位於偶數行子畫素的元件交替地進行編程及感測操作。換句話說,位於奇數行子畫素的元件可在第一期間內進行編程及感測,而位於偶數行子畫素的元件可在第二期間內進行編程及感測。在驅動積體電路中,類比數位轉換器可由二相鄰導線共用,可降低驅動積體電路中的類比數位轉換器數量,進而降低驅動積體電路之成本。除此之外,本發明之外部補償方法可用於任何結構之子畫素,如P型結構或N型結構。透過本發明之外部補償方法,若面板上包含N行子畫素時,只需要N或N+1條導線即足以實現資料顯示及外部補償操作,同時,驅動積體電路之接腳數量亦可大幅降低。 以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。In summary, the present invention provides an external compensation method for a panel and a drive integrated circuit that can perform an external compensation method on the panel. According to the external compensation method, each row of wires can be used as a data line or a sensing line, which is shared by adjacent sub-pixels. The components located in the odd row subpixels and the components located in the even row subpixels are alternately programmed and sensed. In other words, elements located in odd-line sub-pixels can be programmed and sensed during the first period, while elements located in even-numbered sub-pixels can be programmed and sensed during the second period. In the driving integrated circuit, the analog digital converter can be shared by two adjacent wires, which can reduce the number of analog digital converters in the driving integrated circuit, thereby reducing the cost of driving the integrated circuit. In addition to this, the external compensation method of the present invention can be applied to sub-pixels of any structure, such as a P-type structure or an N-type structure. According to the external compensation method of the present invention, if the panel contains N rows of sub-pixels, only N or N+1 wires are needed to realize data display and external compensation operation, and the number of pins for driving the integrated circuit can also be significantly reduce. The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.
<TABLE border="1" borderColor="#000000" width="85%"><TBODY><tr><td> 100 </td><td> 面板 </td></tr><tr><td> 20 </td><td> 有機發光二極體顯示器系統 </td></tr><tr><td> 200 </td><td> 面板 </td></tr><tr><td> 210 </td><td> 驅動積體電路 </td></tr><tr><td> L1~L5 </td><td> 導線 </td></tr><tr><td> P1~P4 </td><td> 子畫素 </td></tr><tr><td> 30 </td><td> 有機發光二極體顯示器系統 </td></tr><tr><td> 300 </td><td> 面板 </td></tr><tr><td> 310 </td><td> 驅動積體電路 </td></tr><tr><td> L1’~L4’ </td><td> 導線 </td></tr><tr><td> P1’~P4’ </td><td> 子畫素 </td></tr><tr><td> 40 </td><td> 有機發光二極體顯示器系統 </td></tr><tr><td> 400 </td><td> 面板 </td></tr><tr><td> 410 </td><td> 驅動積體電路 </td></tr><tr><td> DL1~DL4 </td><td> 導線 </td></tr><tr><td> B1~B4 </td><td> 輸出緩衝器 </td></tr><tr><td> DAC1~DAC4 </td><td> 數位類比轉換器 </td></tr><tr><td> ADC1~ADC2 </td><td> 類比數位轉換器 </td></tr><tr><td> MUX1~MUX2 </td><td> 多工器 </td></tr><tr><td> SW1~SW8 </td><td> 開關器 </td></tr><tr><td> LED1、LED2 </td><td> 有機發光二極體 </td></tr><tr><td> T1、T2 </td><td> 驅動薄膜電晶體 </td></tr><tr><td> Scan[N]、EM[N]、FB[N]、FB_O[N]、FB_E[N] </td><td> 控制訊號 </td></tr><tr><td> VDD </td><td> 電源電壓 </td></tr><tr><td> VSS </td><td> 接地電壓 </td></tr><tr><td> 80 </td><td> 外部補償流程 </td></tr><tr><td> 800~806 </td><td> 步驟 </td></tr></TBODY></TABLE><TABLE border="1" borderColor="#000000" width="85%"><TBODY><tr><td> 100 </td><td> panel</td></tr><tr>< Td> 20 </td><td> Organic Light Emitting Diode Display System</td></tr><tr><td> 200 </td><td> Panel</td></tr><tr ><td> 210 </td><td> Drive Integrated Circuit</td></tr><tr><td> L1~L5 </td><td> Conductor</td></tr>< Tr><td> P1~P4 </td><td> Subpixels</td></tr><tr><td> 30 </td><td> Organic Light Emitting Diode Display System</td ></tr><tr><td> 300 </td><td> Panel</td></tr><tr><td> 310 </td><td> Drive Integrated Circuit</td> </tr><tr><td> L1'~L4' </td><td> wire</td></tr><tr><td> P1'~P4' </td><td> Pixel</td></tr><tr><td> 40 </td><td> Organic Light Emitting Diode Display System</td></tr><tr><td> 400 </td> <td> panel</td></tr><tr><td> 410 </td><td> drive integrated circuit</td></tr><tr><td> DL1~DL4 </td ><td> Wire</td></tr><tr><td> B1~B4 </td><td> Output Buffer</td></tr><tr><td> DAC1~DAC4 < /td><td> Digital Analog Converter</td></tr><tr><td> ADC1~ADC2 </td><td> Analog Digital Converter</td></tr ><tr><td> MUX1~MUX2 </td><td> Multiplexer</td></tr><tr><td> SW1~SW8 </td><td> Switch</td> </tr><tr><td> LED1, LED2 </td><td> Organic Light Emitting Diodes</td></tr><tr><td> T1, T2 </td><td> Thin film transistor </td></tr><tr><td> Scan[N], EM[N], FB[N], FB_O[N], FB_E[N] </td><td> control signal </td></tr><tr><td> VDD </td><td> Power Supply Voltage </td></tr><tr><td> VSS </td><td> Ground Voltage </ Td></tr><tr><td> 80 </td><td> External Compensation Process</td></tr><tr><td> 800~806 </td><td> Step </ Td></tr></TBODY></TABLE>
第1圖為進行常見外部補償方法的一面板之示意圖。 第2圖為本發明實施例一有機發光二極體顯示器系統之示意圖。 第3圖為本發明實施例另一有機發光二極體顯示器系統之示意圖。 第4圖為本發明實施例一有機發光二極體顯示器系統及其驅動積體電路之電路結構示意圖。 第5圖為第4圖之開關器的波形圖。 第6A~6D圖為第2圖中子畫素之詳細編程及感測操作之示意圖。 第7A~7D圖為第2圖中子畫素之詳細編程及感測操作之示意圖。 第8圖為本發明實施例一外部補償流程之示意圖。Figure 1 is a schematic diagram of a panel for performing common external compensation methods. FIG. 2 is a schematic diagram of an organic light emitting diode display system according to an embodiment of the present invention. FIG. 3 is a schematic diagram of another organic light emitting diode display system according to an embodiment of the present invention. 4 is a schematic diagram showing the circuit structure of an organic light emitting diode display system and a driving integrated circuit thereof according to an embodiment of the present invention. Figure 5 is a waveform diagram of the switch of Figure 4. Figures 6A to 6D are schematic diagrams showing the detailed programming and sensing operations of the sub-pixels in Figure 2. Figures 7A to 7D are schematic diagrams showing the detailed programming and sensing operations of the sub-pixels in Figure 2. Figure 8 is a schematic diagram of an external compensation process according to an embodiment of the present invention.
<TABLE border="1" borderColor="#000000" width="85%"><TBODY><tr><td> 80 </td><td> 外部補償流程 </td></tr><tr><td> 800~806 </td><td> 步驟 </td></tr></TBODY></TABLE><TABLE border="1" borderColor="#000000" width="85%"><TBODY><tr><td> 80 </td><td> External Compensation Process</td></tr><tr ><td> 800~806 </td><td> Steps</td></tr></TBODY></TABLE>
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CN104658474A (en) * | 2013-11-20 | 2015-05-27 | 乐金显示有限公司 | Organic light emitting display and method of compensation for threshold voltage thereof |
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CN102968954A (en) * | 2011-08-30 | 2013-03-13 | 乐金显示有限公司 | Organic light emitting diode display device for sensing pixel current and method for sensing pixel current thereof |
CN103177685B (en) * | 2011-12-26 | 2015-06-03 | 乐金显示有限公司 | OLED display device and method for sensing characteristic parameters of pixel driving circuits |
CN103236237B (en) * | 2013-04-26 | 2015-04-08 | 京东方科技集团股份有限公司 | Pixel unit circuit and compensating method of pixel unit circuit as well as display device |
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