TWI609445B - Laminated substrate separating device and method for separating laminated substrates - Google Patents
Laminated substrate separating device and method for separating laminated substrates Download PDFInfo
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Description
本揭露是有關於一種複層基板的分離裝置與分離方法。 The present disclosure relates to a separation device and a separation method for a multi-layer substrate.
由於電子裝置被要求具有輕薄、可撓曲、耐衝擊、安全性高以及方便攜帶等特性,因此利用可撓性基板或是薄型基板來製作電子裝置成為未來的發展趨勢。在這樣的基板上製作電子元件可大致上分為兩種方式:其中一種方式是直接製作將電子元件於可撓性或薄型基板上,另一種方式為間接轉貼電子元件於可撓性或薄型基板上。 Since electronic devices are required to have characteristics such as being thin, flexible, impact resistant, high in safety, and convenient to carry, it is a future development trend to manufacture electronic devices using flexible substrates or thin substrates. The fabrication of electronic components on such substrates can be broadly divided into two ways: one is to directly fabricate the electronic components on a flexible or thin substrate, and the other is to indirectly transfer electronic components to a flexible or thin substrate. on.
若欲直接製作電子元件於可撓性或薄型基板上,需先將可撓性或薄型基板貼附於機械性質較為堅硬的承載基板上,進而形成複層基板後,才能適用傳統的滾輪與機械手臂傳輸。之後,再於可撓性或薄型基板上製作所需之電子元件。元件完成之後,必須將可撓性或薄型基板及形成於可撓性或薄型基板上的電子元 件從硬質的承載基板上取下。可撓性或薄型基板往往透過黏著層而緊密地貼附在硬質承載基板上以避免電子元件的製作過程中發生基板位移。但是,此舉也使得欲將複層基板予以完整的分離並不容易。 If you want to directly make electronic components on a flexible or thin substrate, you need to attach the flexible or thin substrate to the hard-working carrier substrate to form a multi-layer substrate before you can apply traditional rollers and machinery. Arm transmission. The desired electronic components are then fabricated on a flexible or thin substrate. After the component is completed, the flexible or thin substrate and the electron elements formed on the flexible or thin substrate must be The piece is removed from the rigid carrier substrate. A flexible or thin substrate is often closely attached to the rigid carrier substrate through the adhesive layer to avoid substrate displacement during the fabrication of the electronic component. However, this also makes it difficult to completely separate the multi-layer substrate.
本揭露提供一種複層基板的分離裝置與複層基板的分離方法,以將複層基板的不同基板相互分離。 The present disclosure provides a method for separating a separation device of a multi-layer substrate from a multi-layer substrate to separate different substrates of the multi-layer substrate from each other.
本揭露提供一種複層基板分離裝置,用以分離複層基板的第一基板與第二基板。第一基板與第二基板於複層基板的至少一邊緣處彼此錯位(misaligned)。複層基板分離裝置包括基座與分離工具,其中基座用以放置複層基板,且複層基板暴露出該錯位處。分離工具沿一軸可移動地配置於基座上,並抵壓錯位處以在第一基板與第二基板之間產生縫隙,並進一步地嵌入於縫隙而分離第一基板與第二基板。 The present disclosure provides a multi-layer substrate separating apparatus for separating a first substrate and a second substrate of a multi-layer substrate. The first substrate and the second substrate are misaligned with each other at at least one edge of the multi-layer substrate. The multi-layer substrate separating device comprises a base and a separating tool, wherein the base is used to place the multi-layer substrate, and the multi-layer substrate exposes the misalignment. The separating tool is movably disposed on the base along one axis, and presses the misalignment to create a gap between the first substrate and the second substrate, and is further embedded in the slit to separate the first substrate from the second substrate.
本揭露提供一種複層基板的分離方法,用以分離複層基板的第一基板與第二基板。第一基板與第二基板於複層基板的至少一邊緣處彼此錯位。複層基板的分離方法包括:放置複層基板於基座上,且複層基板暴露出錯位處;以分離工具抵壓該錯位處而分離該錯位處的第一基板與第二基板。 The present disclosure provides a method for separating a multi-layer substrate for separating a first substrate and a second substrate of a multi-layer substrate. The first substrate and the second substrate are offset from each other at at least one edge of the multi-layer substrate. The method for separating the multi-layer substrate comprises: placing the multi-layer substrate on the pedestal, and exposing the multiplexed substrate to the erroneous position; and separating the first substrate and the second substrate at the dislocation with the separation tool pressing the misalignment.
基於上述,在本揭露的上述實施例中,藉由分離工具在第一基板與第二基板的錯位處對第一基板進行抵壓,以讓第一基 板能在此處因受力變形而相對於第二基板產生縫隙,進而讓分離工具能嵌入此縫隙中,據以讓該處的第一基板與第二基板得以分離。此舉讓薄形的複層基板能以簡單方式便能提供足以造成分離的施力,而無須使用額外功能的裝置及對複層基板施以複雜的結構設計。 Based on the above, in the above embodiment of the present disclosure, the first substrate is pressed against the misalignment of the first substrate and the second substrate by the separating tool to allow the first base Here, the plate can be cracked relative to the second substrate due to the force deformation, so that the separation tool can be inserted into the gap, so that the first substrate and the second substrate are separated therefrom. This allows the thin multi-layer substrate to provide a force sufficient to cause separation in a simple manner without the need for additional functions and the complicated structural design of the multi-layer substrate.
為讓本揭露的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 The above described features and advantages of the present invention will be more apparent from the following description.
100、400、500A、500B、500C、500D‧‧‧複層基板分離裝置 100, 400, 500A, 500B, 500C, 500D‧‧‧ multi-layer substrate separation device
110‧‧‧基座 110‧‧‧Base
120、410、420、510、520‧‧‧滾輪 120, 410, 420, 510, 520‧‧‧ wheels
122‧‧‧第一開孔 122‧‧‧First opening
130‧‧‧分離工具 130‧‧‧Separation tools
132‧‧‧第三開孔 132‧‧‧ third opening
140‧‧‧流體操作模組 140‧‧‧Fluid operation module
142‧‧‧真空單元 142‧‧‧vacuum unit
144‧‧‧氣壓單元 144‧‧‧Pneumatic unit
150‧‧‧承載台 150‧‧‧bearing station
152‧‧‧第二開孔 152‧‧‧Second opening
160‧‧‧控制模組 160‧‧‧Control Module
170‧‧‧移動單元 170‧‧‧Mobile unit
200、200A、200B、200C‧‧‧複層基板 200, 200A, 200B, 200C‧‧‧Multilayer substrates
210、210A、210B、210C、210D‧‧‧第一基板 210, 210A, 210B, 210C, 210D‧‧‧ first substrate
220、220A、220B、220C、220D‧‧‧第二基板 220, 220A, 220B, 220C, 220D‧‧‧ second substrate
310‧‧‧夾持治具 310‧‧‧Clamping fixture
320‧‧‧靜電產生器 320‧‧‧Electrostatic generator
330、340‧‧‧移動治具 330, 340‧‧‧Mobile fixtures
331、332‧‧‧旋轉臂 331, 332‧‧‧ rotating arm
530‧‧‧夾持塊 530‧‧‧Clamping block
540‧‧‧傳動輪組 540‧‧‧Drive wheel set
541、542‧‧‧滑輪 541, 542‧‧‧ pulley
543‧‧‧皮帶 543‧‧‧Land
E1‧‧‧尖銳邊緣 E1‧‧‧ sharp edges
F1、F2、F3‧‧‧受力 F1, F2, F3‧‧‧ force
G1‧‧‧縫隙 G1‧‧‧ gap
G2‧‧‧空隙 G2‧‧‧ gap
L‧‧‧錯位處 L‧‧‧ Misplaced
O‧‧‧軸心 O‧‧‧Axis
S1‧‧‧底面 S1‧‧‧ bottom
S2‧‧‧頂推面 S2‧‧‧ pushing surface
S3‧‧‧平面 S3‧‧ plane
S4‧‧‧傾斜面 S4‧‧‧ sloped surface
α‧‧‧夾角 ‧‧‧‧ angle
x‧‧‧尺寸 X‧‧‧ size
r‧‧‧半徑 R‧‧‧ Radius
t‧‧‧厚度 T‧‧‧thickness
θ‧‧‧角度 Θ‧‧‧ angle
X-Y-Z‧‧‧座標 X-Y-Z‧‧‧ coordinates
S110~S180‧‧‧步驟 S110~S180‧‧‧Steps
圖1是依據本揭露實施例的複層基板分離裝置的示意圖。 1 is a schematic view of a multi-layer substrate separating apparatus in accordance with an embodiment of the present disclosure.
圖2繪示複層基板分離裝置之相關構件的連接關係。 FIG. 2 illustrates the connection relationship of related components of the multi-layer substrate separating apparatus.
圖3繪示複層基板的分離流程。 FIG. 3 illustrates a separation process of a multi-layer substrate.
圖4是圖1的複層基板分離裝置的局部放大側視圖。 Fig. 4 is a partially enlarged side elevational view of the multi-layer substrate separating apparatus of Fig. 1.
圖5、圖6分別繪示複層基板於分離過程中的部分示意圖。 FIG. 5 and FIG. 6 respectively show partial schematic views of the multi-layer substrate during the separation process.
圖7繪示圖1的複層基板分離裝置與複層基板之間的尺寸關係示意圖。 FIG. 7 is a schematic view showing the relationship between the size of the multi-layer substrate separating device and the multi-layer substrate of FIG. 1. FIG.
圖8與圖9分別繪示本揭露其中兩個實施例的複層基板與分離工具的示意圖。 8 and 9 are schematic views respectively showing a multi-layer substrate and a separation tool according to two embodiments of the present disclosure.
圖10與圖11分別依據不同實施例繪示複層基板放置於承載台上的示意圖。 FIG. 10 and FIG. 11 are schematic diagrams showing the placement of a multi-layer substrate on a carrier according to different embodiments.
圖12與圖13分別繪示不同實施例分離複層基板的示意圖。 12 and 13 respectively illustrate schematic views of separating a multi-layer substrate according to different embodiments.
圖14是本揭露另一實施例複層基板分離裝置的示意圖。 FIG. 14 is a schematic diagram of a multi-layer substrate separating apparatus according to another embodiment of the present disclosure.
圖15至圖18分別依據不同實施例而繪示保持分離後第二基板的方式。 15 to 18 illustrate the manner in which the second substrate after separation is maintained, according to various embodiments.
圖1是依據本揭露實施例的複層基板分離裝置的示意圖。圖2繪示複層基板分離裝置之相關構件的連接關係。圖3繪示複層基板的分離流程。圖4是圖1的複層基板分離裝置的局部放大側視圖。請先參考圖1、圖2與圖4,在本實施例中,複層基板分離裝置100包括基座110、滾輪120與分離工具130,其中基座110上設置有承載台150,而欲進行的複層基板200置於承載台150上。滾輪120與分離工具130分別沿Y軸可移動地配置於基座110上,而能相對於基座110呈現如圖示雙箭號方向的來回移動,其中滾輪120能相對於X軸進行轉動。 1 is a schematic view of a multi-layer substrate separating apparatus in accordance with an embodiment of the present disclosure. FIG. 2 illustrates the connection relationship of related components of the multi-layer substrate separating apparatus. FIG. 3 illustrates a separation process of a multi-layer substrate. Fig. 4 is a partially enlarged side elevational view of the multi-layer substrate separating apparatus of Fig. 1. Referring to FIG. 1 , FIG. 2 and FIG. 4 , in the embodiment, the multi-layer substrate separating apparatus 100 includes a base 110 , a roller 120 and a separating tool 130 , wherein the base 110 is provided with a carrying platform 150 The multi-layer substrate 200 is placed on the carrier 150. The roller 120 and the separating tool 130 are respectively movably disposed on the base 110 along the Y-axis, and are capable of moving back and forth with respect to the base 110 in the direction of the double arrow shown in the figure, wherein the roller 120 is rotatable relative to the X-axis.
如前述的複層基板並不易進行分離,因此,本揭露藉由所述複層基板分離裝置100而得以簡單方式但有效地將複層基板200完全分離。在此需先說明的是,本實施例的複層基板200是由第一基板210與第二基板220彼此貼附而成,其中第一基板210為硬質或厚度較厚的承載基板,而第二基板220為具有可撓性的薄形基板(例如是超薄玻璃,其平均厚度小於200μm)。值得注意的是,本實施例的第一基板210與第二基板220在複層基板200的至少一邊緣處存在彼此錯位(misaligned)的狀態,亦即如圖4 所繪示,在錯位處L的第一基板210與第二基板220是相互不對齊的。 Since the above-mentioned multi-layer substrate is not easily separated, the present disclosure can completely separate the multi-layer substrate 200 in a simple manner but effectively by the multi-layer substrate separating apparatus 100. It should be noted that the multi-layer substrate 200 of the present embodiment is formed by attaching the first substrate 210 and the second substrate 220 to each other, wherein the first substrate 210 is a hard or thick-bearing carrier substrate, and The two substrates 220 are thin substrates having flexibility (for example, ultra-thin glass having an average thickness of less than 200 μm). It should be noted that the first substrate 210 and the second substrate 220 of the present embodiment have a misaligned state at least one edge of the multi-layer substrate 200, that is, as shown in FIG. 4 . It is shown that the first substrate 210 and the second substrate 220 at the misalignment L are not aligned with each other.
另一方面,複層基板分離裝置100還包括控制模組160、多個移動單元170、真空單元142與氣壓單元144,其中移動單元170、真空單元142與氣壓單元144分別電性連接至控制模組160。如圖2所示,分離工具130與滾輪120分別藉由移動單元170而組裝於基座110上,且受控於控制模組160而得以相對於基座110移動。 On the other hand, the multi-layer substrate separating apparatus 100 further includes a control module 160, a plurality of moving units 170, a vacuum unit 142 and a pneumatic unit 144, wherein the moving unit 170, the vacuum unit 142 and the air pressure unit 144 are electrically connected to the control module, respectively. Group 160. As shown in FIG. 2, the separating tool 130 and the roller 120 are respectively assembled on the base 110 by the moving unit 170, and are controlled to move relative to the base 110 by the control module 160.
再者,滾輪120的結構為空心且其表面具有多個第一開孔122,因而得以與真空單元142連接以提供吸附力。類似地,承載台150的表面亦具有多個第二開孔152,其亦連通於真空單元142,以在複層基板200置於承載台150上時能以真空吸附方式而固定在承載台150上。 Further, the roller 120 has a hollow structure and a plurality of first openings 122 on its surface, thereby being connected to the vacuum unit 142 to provide an adsorption force. Similarly, the surface of the carrier 150 also has a plurality of second openings 152 that are also in communication with the vacuum unit 142 to be fixed to the carrier 150 by vacuum adsorption when the multilayer substrate 200 is placed on the carrier 150. on.
圖5、圖6分別繪示複層基板於分離過程中的部分示意圖。請同時參考圖3的流程圖並對應圖4至圖6,首先,在本實施例的步驟S110中,先將複層基板200放置於基座110上,其中第一基板210位於承載台150的表面,並藉由真空單元142而吸附、固定在承載台150上。第二基板220實質上疊置在第一基板210上,且在前述的錯位處L,第一基板210會從第二基板220暴露出來,亦即如圖4於錯位處L的情形,當複層基板200置於承載台150後,第一基板210於錯位處L的部分實質上不會被第二基板220所遮蔽。換句話說,當將使用者複層基板200放置於基座 110上時,需將複層基板200的錯位處L朝向分離工具130。 FIG. 5 and FIG. 6 respectively show partial schematic views of the multi-layer substrate during the separation process. Referring to the flowchart of FIG. 3 and FIG. 4 to FIG. 6 , firstly, in step S110 of the embodiment, the multi-layer substrate 200 is first placed on the susceptor 110 , wherein the first substrate 210 is located on the loading platform 150 . The surface is adsorbed and fixed on the stage 150 by the vacuum unit 142. The second substrate 220 is substantially superposed on the first substrate 210, and at the foregoing offset L, the first substrate 210 is exposed from the second substrate 220, that is, as in the case of the misalignment L in FIG. After the layer substrate 200 is placed on the stage 150, the portion of the first substrate 210 at the offset L is substantially not obscured by the second substrate 220. In other words, when the user's multi-layer substrate 200 is placed on the pedestal At the time of 110, the misalignment L of the multi-layer substrate 200 is directed toward the separation tool 130.
接著,在步驟S120中,分別移動分離工具130與滾輪120至錯位處L;而在步驟S130中,以分離工具130沿負Z軸方向抵壓於複層基板200上,在此需注意的是,分離工具130是抵壓在第一基板210上,亦即是在前述錯位處L第一基板210暴露出第二基板220的部分,如圖5所示。據此,第一基板210受壓後便會朝向負Z軸方向變形,而所述壓力大於第一基板210與第二基板220之間的貼附力,並足以讓第一基板210與第二基板220在錯位處L形成縫隙(crevice或gap)G1。 Next, in step S120, the separation tool 130 and the roller 120 are respectively moved to the misalignment L; and in step S130, the separation tool 130 is pressed against the multi-layer substrate 200 in the negative Z-axis direction, which is noted here. The separating tool 130 is pressed against the first substrate 210, that is, the portion of the first substrate 210 exposing the second substrate 220 at the aforementioned misalignment, as shown in FIG. Accordingly, after the first substrate 210 is pressed, it is deformed toward the negative Z-axis direction, and the pressure is greater than the adhesion between the first substrate 210 and the second substrate 220, and is sufficient for the first substrate 210 and the second substrate 210 The substrate 220 forms a crevice or gap G1 at the misalignment L.
值得注意的是,本實施例的承載台150具有平面S3與傾斜面S4,其中複層基板200的大部分置於平面S3上並藉由前述第二開孔152而被吸附、固定在平面S3上。在此,平面S3實質上是平行於X-Y平面。傾斜面S4鄰接於平面S3但與平面S3夾一角度,如圖4至圖6所示,複層基板200的錯位處L實際上是位於傾斜面S4的上方,而使其與傾斜面S4之間存在空隙(gap)G2。據此,當上述第一基板210受分離工具130的施力而往負Z軸方向變形時,所述空隙G2便提供第一基板210變形的空間,以讓第一基板210暴露出第二基板220的部份(即受壓的部份)得以朝向傾斜面S4變形。 It should be noted that the loading platform 150 of the present embodiment has a plane S3 and an inclined surface S4, wherein a majority of the multi-layer substrate 200 is placed on the plane S3 and is adsorbed and fixed on the plane S3 by the second opening 152. on. Here, the plane S3 is substantially parallel to the X-Y plane. The inclined surface S4 is adjacent to the plane S3 but at an angle to the plane S3. As shown in FIGS. 4 to 6, the offset portion L of the multi-layer substrate 200 is actually located above the inclined surface S4 so as to be opposite to the inclined surface S4. There is a gap G2 between them. According to this, when the first substrate 210 is deformed in the negative Z-axis direction by the urging force of the separating tool 130, the gap G2 provides a space for the first substrate 210 to deform, so that the first substrate 210 exposes the second substrate. The portion of 220 (i.e., the pressed portion) is deformed toward the inclined surface S4.
在本實施例中,分離工具130例如是具有刀尖外形的構件,其具有底面S1、頂推面S2以及尖銳邊緣E1,其中尖銳邊緣E1實質上鄰接於底面S1與頂推面S2之間。在上述步驟S130中, 分離工具130是以其底面S1抵壓在第一基板210上,而在縫隙G1產生之後,便能在步驟S140中,以分離工具130的尖銳邊緣E1沿Y軸移動而嵌入縫隙G1中,而使第二基板220實質上抵接在頂推面S2上。如此,所述縫隙G1便能形成後續進行基板分離的起點位置。 In the present embodiment, the separating tool 130 is, for example, a member having a blade tip shape having a bottom surface S1, a pushing surface S2, and a sharp edge E1, wherein the sharp edge E1 is substantially adjacent between the bottom surface S1 and the pushing surface S2. In the above step S130, The separating tool 130 is pressed against the first substrate 210 by its bottom surface S1, and after the gap G1 is generated, in step S140, the sharp edge E1 of the separating tool 130 is moved along the Y axis to be embedded in the slit G1. The second substrate 220 is substantially abutted on the pushing surface S2. Thus, the gap G1 can form a starting position for subsequent substrate separation.
此外,分離工具130還具有位於頂推面S2上的多個第三開孔132(繪示於圖1),其連通於前述的氣壓單元144(如圖2所示),在本實施例中,氣壓單元144得以受控於控制模組160而提供壓縮氣流從第三開孔132流出分離工具130。因此,接續前述步驟S140所述分離工具130以其尖銳邊緣E1嵌入縫隙G1之後,在步驟S150中,藉由所述壓縮氣流能將原本抵接在頂推面S2的第二基板220進一步地推向滾輪120的表面。再者,如前所述,滾輪120與真空單元142連接而能經由第一開孔122提供吸附力,據此,在步驟S160中,便能藉由真空單元142在第一開孔122處因氣體流動而對第二基板220提供吸附效果。如此一來,第二基板220經由步驟S150、S160便能順利地從分離工具130的頂推面S2移至滾輪120的表面,進而被吸附、固定在滾輪120上。 In addition, the separating tool 130 further has a plurality of third openings 132 (shown in FIG. 1) on the pushing surface S2, which are connected to the aforementioned air pressure unit 144 (shown in FIG. 2), in this embodiment. The air pressure unit 144 is controlled by the control module 160 to provide a compressed air flow from the third opening 132 out of the separation tool 130. Therefore, after the separation tool 130 is inserted into the gap G1 with the sharp edge E1 in the foregoing step S140, the second substrate 220 originally contacting the thrust surface S2 can be further pushed by the compressed air flow in step S150. To the surface of the roller 120. Furthermore, as described above, the roller 120 is coupled to the vacuum unit 142 to provide an adsorption force via the first opening 122. Accordingly, in step S160, the vacuum unit 142 can be used at the first opening 122. The gas flows to provide an adsorption effect to the second substrate 220. In this way, the second substrate 220 can be smoothly moved from the pushing surface S2 of the separating tool 130 to the surface of the roller 120 via steps S150 and S160, and then adsorbed and fixed on the roller 120.
另,本實施例的氣壓單元144與真空單元142形成流體操作模組140,由於兩者均是藉由流體(氣體)的調整而產生吸附力或推力,因此能藉由單一模組同時驅動氣壓單元144與真空單元142而以同一管路設計達到流體調節的效果,例如當於分離工具130處產生壓縮氣流時,其即能於滾輪120處產生真空吸附, 以達到所需吸附或頂推的效果。 In addition, the air pressure unit 144 and the vacuum unit 142 of the embodiment form a fluid operation module 140. Since both of them are adsorbed or thrust by the adjustment of the fluid (gas), the air pressure can be simultaneously driven by a single module. The unit 144 and the vacuum unit 142 are designed to achieve a fluid adjustment effect in the same piping design, for example, when a compressed air flow is generated at the separation tool 130, it can generate vacuum adsorption at the roller 120. In order to achieve the desired adsorption or push effect.
需再說明的是,本實施例的圖4至圖6中分別以F1、F2與F3分別代表三種因氣體流動而對複層基板200產生的受力(包含吸力或推力),其中F2代表分離工具130上的壓縮氣流將第二基板220頂推向滾輪120的頂推力;F1代表真空單元144在第一開孔122藉由氣體流動而產生的吸附力;F3則代表真空單元144在承載台150上對複層基板200產生的吸附力(相當於對第一基板210的吸附力)。 It should be noted that, in FIGS. 4 to 6 of the present embodiment, F1, F2 and F3 respectively represent three kinds of forces (including suction or thrust) generated on the multi-layer substrate 200 due to gas flow, wherein F2 represents separation. The compressed airflow on the tool 130 pushes the second substrate 220 toward the top thrust of the roller 120; F1 represents the adsorption force generated by the vacuum unit 144 in the first opening 122 by the gas flow; and F3 represents the vacuum unit 144 on the carrying platform. The adsorption force (corresponding to the adsorption force to the first substrate 210) generated on the cladding substrate 200 at 150.
接著,在步驟S170中,當縫隙G1處的第二基板220已被吸附並固定於滾輪120之後,持續轉動滾輪120以讓第二基板220能被捲繞於滾輪120上,而使第二基板220逐漸從第一基板210上分離。在此需說明的是,當執行步驟S170時,前述步驟S150、S160仍在持續進行中,直至步驟S180,當第二基板220完全從第一基板210分離後,方結束步驟S140至S150,並將第一基板210與第二基板220分別從基座110與滾輪120上移除,而完成本揭露的最終目的。 Next, in step S170, after the second substrate 220 at the slit G1 has been adsorbed and fixed to the roller 120, the roller 120 is continuously rotated to enable the second substrate 220 to be wound on the roller 120, and the second substrate is made. 220 is gradually separated from the first substrate 210. It should be noted that, when step S170 is performed, the foregoing steps S150 and S160 are still in progress until step S180, when the second substrate 220 is completely separated from the first substrate 210, the steps S140 to S150 are ended, and The first substrate 210 and the second substrate 220 are removed from the susceptor 110 and the roller 120, respectively, to accomplish the ultimate goal of the present disclosure.
圖7繪示圖1的複層基板分離裝置與複層基板之間的尺寸關係示意圖。請參考圖7,在本實施例中能藉由相關構件與複層基板200之間的對應關係,而得知分離工具130於尖銳邊緣E1處所需的夾角條件(即底面S1與頂推面S2之間的夾角α)。如下定義:分離工具130沿Y軸嵌入縫隙G距離軸心O投影至複層基板200的距離為x,滾輪120的半徑為r,第二基板220的厚度為t, θ為滾輪120對應於分離工具130嵌入縫隙G1的角度,則:θ=tan-1[x/(r+t)],且α≦2θ。使用者由此算式即能據以推算所需分離工具130的形式。舉例來說,當欲使分離工具130沿Y軸嵌入縫隙G的尺寸x=20mm,滾輪120的半徑r=125mm,且第二基板220的厚度t=0.1mm,由此算式能得知θ=9.1°。故,分離工具130所需在尖銳邊緣E1處的夾角α即是小於或等於18.2°。 FIG. 7 is a schematic view showing the relationship between the size of the multi-layer substrate separating device and the multi-layer substrate of FIG. 1. FIG. Referring to FIG. 7 , in the embodiment, the angle between the relevant member and the multi-layer substrate 200 can be obtained, and the angle of the separation tool 130 at the sharp edge E1 is required (ie, the bottom surface S1 and the top surface). The angle between S2 is α). The definition is as follows: the separation tool 130 is embedded along the Y-axis with a gap G. The distance from the axis O is projected to the multi-layer substrate 200 by a distance x, the radius of the roller 120 is r, the thickness of the second substrate 220 is t, and θ is the separation of the roller 120. The tool 130 is embedded in the angle of the slit G1, then: θ = tan -1 [x / (r + t)], and α ≦ 2θ. The user can then derive the form of the desired separation tool 130 from this calculation. For example, when the size of the slit G to be inserted into the slit G along the Y-axis is x=20 mm, the radius r of the roller 120 is 125 mm, and the thickness of the second substrate 220 is t=0.1 mm, the equation can be known as θ= 9.1°. Therefore, the angle α required by the separating tool 130 at the sharp edge E1 is less than or equal to 18.2°.
另外,圖8與圖9分別繪示本揭露其中兩個實施例的複層基板與分離工具的示意圖。請先參考圖8,複層基板200A的第一基板210A與第二基板220A均呈多邊形(如圖8所示四邊形為例),且其中三個邊緣處皆存在錯位情形,因此在本實施例中,分離工具130得以從所繪示之三個錯位處擇一進行上述的分離動作,而其中較佳的是,分離工具130的移動方向(如圖示箭號)正對於多邊形的其中一角,即複層基板200A之貼附力最薄弱之處,因而得以上述步驟順利地分離複層基板200A。 In addition, FIG. 8 and FIG. 9 respectively illustrate schematic views of a multi-layer substrate and a separation tool according to two embodiments of the present disclosure. Referring to FIG. 8 , the first substrate 210A and the second substrate 220A of the multi-layer substrate 200A are both polygonal (as shown in the example of the quadrilateral in FIG. 8 ), and there are misalignment situations at three edges, so in this embodiment. The separating tool 130 is configured to perform the above-mentioned separating action from the three misalignments shown, wherein it is preferable that the moving direction of the separating tool 130 (such as the arrow) is directed to one corner of the polygon. That is, the adhesion of the multi-layer substrate 200A is the weakest, and thus the multi-layer substrate 200A is smoothly separated by the above steps.
圖9繪示的複層基板是以呈圓形的第一基板與第二基板相互貼附而成,如圖所示,複層基板200B的第一基板210B與第二基板220B均存在圖示圓形輪廓的情形下,大部分的圓周處均存在錯位的情形,因而在本實施例中,舉凡分離工具130朝向複層基板200B的移動方向(如圖示箭號)能與呈圓形的第二基板220B的其中一切線(如圖示虛線)正交,便能達到以上述方式將複層基板200B分離的效果,而其中較佳的是,分離工具130的移動方向實質上正對於所述呈圓形之第二基板220B的圓心。 The multi-layer substrate shown in FIG. 9 is formed by attaching a first substrate and a second substrate in a circular shape. As shown in the figure, the first substrate 210B and the second substrate 220B of the multi-layer substrate 200B are both illustrated. In the case of a circular profile, most of the circumferences are misaligned, so in the present embodiment, the direction of movement of the separation tool 130 toward the multi-layer substrate 200B (such as an arrow) can be circular. The lines of the second substrate 220B are orthogonal to each other (as indicated by a broken line in the figure), so that the effect of separating the multi-layer substrate 200B in the above manner can be achieved, and it is preferable that the moving direction of the separating tool 130 is substantially correct. The center of the circular second substrate 220B is described.
圖10與圖11分別依據不同實施例繪示複層基板放置於承載台上的示意圖。請先參考圖10,基座110還包括組裝在承載台150上的夾持治具310,因而使放置在承載台150上的複層基板200得以被夾持且固定其上,其中夾持治具310實質上抵壓在第一基板210。請參考圖11,在本實施例中,複層基板200則是藉由靜電產生器320而得以被固定在承載台150上,即讓靜電產生器320對承載平台150形成特定的靜電極性而達到吸附複層基板200的目的。據此,本揭露並未限定複層基板200固定於承載台150上的方式。在另一位繪示的實施例中,複層基板200亦可藉由暫態接著的方式而固定於承載台150上,即,在接著過程中藉由複層基板200與基座110之間形成凡德瓦爾力(van der Waals force,)、共價鍵結(covalent bonding force)或化學鍵結(chemical bonding force)等方式達到結合的效果,而當第二基板220從第一基板210移離之後,第一基板210再藉由解除上述結合力而從基座110卸除。 FIG. 10 and FIG. 11 are schematic diagrams showing the placement of a multi-layer substrate on a carrier according to different embodiments. Referring first to FIG. 10, the base 110 further includes a clamping fixture 310 assembled on the carrier 150, thereby allowing the multi-layer substrate 200 placed on the carrier 150 to be clamped and fixed thereon. The device 310 is substantially pressed against the first substrate 210. Referring to FIG. 11 , in the embodiment, the multi-layer substrate 200 is fixed on the carrying platform 150 by the electrostatic generator 320 , that is, the electrostatic generator 320 is formed to form a specific electrostatic polarity to the carrying platform 150. The purpose of adsorbing the multi-layer substrate 200. Accordingly, the present disclosure does not limit the manner in which the multi-layer substrate 200 is fixed to the stage 150. In another embodiment, the multi-layer substrate 200 can also be fixed to the carrier 150 by a transient connection, that is, between the multi-layer substrate 200 and the pedestal 110 in the subsequent process. Forming a van der Waals force, a covalent bonding force, or a chemical bonding force to achieve a bonding effect, and when the second substrate 220 is removed from the first substrate 210 Thereafter, the first substrate 210 is further removed from the susceptor 110 by releasing the bonding force.
圖12與圖13分別繪示不同實施例分離複層基板的示意圖。請先參考圖12,本實施例的基座110還包括移動治具330,其包括旋轉臂331與332,其中旋轉臂331樞接於基座110的支架112,而旋轉臂332配置於旋轉臂331上且從其一端朝向背離支架112的方向延伸,以讓旋轉臂331、332均能相對於基座110(沿X軸)進行旋轉。此外,移動治具330亦連接至真空單元142(繪示於圖2)以對第二基板220提供真空吸附力。據此,第二基板220 便能被吸附在旋轉臂331、332上。當分離工具130沿Y軸移動並插入縫隙G1後(如前述),第二基板200便能藉由轉動旋轉臂331、332而從第一基板210分離。請參考圖13,其與圖12不同的是,移動治具340是沿Z軸而以平行於X-Y平面的方式移動,而不同於前述分離治具330的轉動。另需說明的是,所述移動治具可如圖12為裝置之部分結構,亦可如圖13作為裝置之分離式結構,而僅在分離過程中由使用者手持為之,在此並不限定其方式,即,能以本揭露所述方式達到分離第二基板者,均可適用於本揭露的實施例中。 12 and 13 respectively illustrate schematic views of separating a multi-layer substrate according to different embodiments. Referring to FIG. 12, the susceptor 110 of the present embodiment further includes a moving jig 330 including rotating arms 331 and 332, wherein the rotating arm 331 is pivotally connected to the bracket 112 of the base 110, and the rotating arm 332 is disposed on the rotating arm. The 331 extends from one end thereof toward the direction away from the bracket 112 to allow the rotating arms 331, 332 to rotate relative to the base 110 (along the X axis). In addition, the mobile jig 330 is also coupled to a vacuum unit 142 (shown in FIG. 2) to provide vacuum adsorption to the second substrate 220. Accordingly, the second substrate 220 It can be adsorbed on the rotating arms 331, 332. After the separation tool 130 is moved along the Y axis and inserted into the slit G1 (as described above), the second substrate 200 can be separated from the first substrate 210 by rotating the rotating arms 331, 332. Referring to FIG. 13, which differs from FIG. 12, the moving jig 340 is moved along the Z-axis in a manner parallel to the X-Y plane, unlike the rotation of the separation jig 330 described above. It should be noted that the mobile jig can be partially constructed as shown in FIG. 12 or as a separate structure of the device as shown in FIG. 13 , and is only held by the user during the separation process, and is not The manner in which the second substrate can be separated in the manner described in the present disclosure can be applied to the embodiments of the present disclosure.
在另一實施例中,前述圖12、圖13中的分離工具130亦可連接至氣壓單元144(繪示於圖2),以讓沿著楔形表面產生的壓縮氣流能將第二基板220推離而有利於其分離過程。 In another embodiment, the separation tool 130 of the foregoing FIGS. 12 and 13 can also be coupled to the air pressure unit 144 (shown in FIG. 2) to allow the compressed airflow generated along the wedge surface to push the second substrate 220. It is beneficial to its separation process.
圖14是本揭露另一實施例複層基板分離裝置的示意圖。請參考圖14,複層基板分離裝置400適配以捲對捲(roll-to-roll)結構,而適用於複層基板200C中均具有可撓性的第一基板210C與第二基板220C。在本實施例中,複層基板分離裝置400包括基座110、分離工具130以及多個滾輪120、410與420,其中基座110、分離工具130與滾輪120如同前述,在此便不再贅述。滾輪420則是用以釋放尚呈捲狀且未分離的複層基板200C,而滾輪410則是當第二基板220C從第一基板210C分離後,用以捲收第一基板210C。 FIG. 14 is a schematic diagram of a multi-layer substrate separating apparatus according to another embodiment of the present disclosure. Referring to FIG. 14, the multi-layer substrate separating apparatus 400 is adapted to have a roll-to-roll structure, and is applicable to the first substrate 210C and the second substrate 220C which are flexible in the multi-layer substrate 200C. In this embodiment, the multi-layer substrate separating apparatus 400 includes a susceptor 110, a separating tool 130, and a plurality of rollers 120, 410 and 420, wherein the pedestal 110, the separating tool 130 and the roller 120 are as described above, and will not be described herein. . The roller 420 is for releasing the multi-layer substrate 200C which is still in a roll shape and is not separated, and the roller 410 is used for winding the first substrate 210C after the second substrate 220C is separated from the first substrate 210C.
圖15至圖18分別依據不同實施例而繪示保持分離後第 二基板的方式,所述方式用以避免分離後的第二基板從滾輪120處翹起的情形發生。請先參考圖15,複層基板分離裝置500A還包括滾輪510,配置在滾輪120旁,以夾持並支托已從第一基板210D分離的第二基板220D,以讓第二基板220D能緊密地吸附於滾輪120的表面。 15 to 18 are respectively shown after maintaining separation according to different embodiments. The manner of the two substrates is to prevent the second substrate after separation from being lifted from the roller 120. Referring to FIG. 15, the multi-layer substrate separating apparatus 500A further includes a roller 510 disposed beside the roller 120 to clamp and support the second substrate 220D that has been separated from the first substrate 210D to make the second substrate 220D compact. The ground is adsorbed on the surface of the roller 120.
請參考圖16,與圖15不同的是,複層基板分離裝置500B的滾輪520是可移動地配置在滾輪120旁,以使滾輪520除了(沿X軸)自轉之外,尚能相對於滾輪120進行公轉。 Referring to FIG. 16, different from FIG. 15, the roller 520 of the multi-layer substrate separating device 500B is movably disposed beside the roller 120, so that the roller 520 can be rotated relative to the roller (in addition to the X-axis). 120 for a revolution.
請參考圖17,本實施例的複層基板分離裝置500C是以夾持塊530取代前述的滾輪510、520,且所述夾持塊530並未沿X軸自轉,而是以滾輪120為中心進行公轉。再者,夾持塊530還能以其較大的接觸面用以將已分離的第二基板220D支托或夾持於滾輪120的表面,即第二基板220D是可移動地被夾持在接觸面與滾輪120之間,其中接觸面的表面輪廓與滾輪120的表面輪廓彼此互補。 Referring to FIG. 17, the multi-layer substrate separating device 500C of the present embodiment replaces the aforementioned rollers 510, 520 with a clamping block 530, and the clamping block 530 does not rotate along the X-axis, but is centered on the roller 120. Make a revolution. Moreover, the clamping block 530 can also support or clamp the separated second substrate 220D to the surface of the roller 120 with its larger contact surface, that is, the second substrate 220D is movably clamped at Between the contact surface and the roller 120, wherein the surface contour of the contact surface and the surface contour of the roller 120 are complementary to each other.
請參考圖18,複層基板分離裝置500D還包括傳動輪組540,其包括一對滑輪541、542與環繞其上的皮帶543。當第二基板220D從第一基板210D分離之後,第二基板220D除了被真空吸附在滾輪120上之外,還能受到皮帶543的夾持與支托,其中滑輪541、542之間的間距能與以適當地調整以讓皮帶543提供適當的支撐力於第二基板220D上。 Referring to FIG. 18, the multi-layer substrate separating apparatus 500D further includes a transmission wheel set 540 including a pair of pulleys 541, 542 and a belt 543 surrounding the same. After the second substrate 220D is separated from the first substrate 210D, the second substrate 220D can be clamped and supported by the belt 543 in addition to being vacuum-adsorbed on the roller 120, wherein the spacing between the pulleys 541 and 542 can be And to adjust appropriately to allow the belt 543 to provide an appropriate supporting force on the second substrate 220D.
在本揭露的上述實施例中,由於複層基板的第一基板與 第二基板於邊緣處存在錯位,因而使分離裝置得以其分離工具抵壓所述錯位處的第一基板,讓第一基板相對於第二基板產生變形,並進而讓第一基板與第二基板之間形成縫隙。據此,分離工具便能以其尖銳邊緣嵌入於縫隙之中,而使第二基板被分離工具向上頂推;同時,藉由真空單元在滾輪表面產生對第二基板的吸附效果,以及藉由氣壓單元在分離工具的表面對第二基板產生頂推的效果,進而得以讓第二基板固定於滾輪上。據此,當滾輪持續轉動時,第二基板會隨之捲繞在滾輪上,同時也代表著第二基板會逐漸與第一基板分離。如此一來,最終便能完成將複層基板分離的效果。此舉藉由分離裝置的對應於複層基板的相關機構,而達到以簡易但有效的方式分離複層基板的效果。 In the above embodiment of the present disclosure, the first substrate of the multi-layer substrate The second substrate is misaligned at the edge, thereby causing the separating device to be pressed by the separating tool against the first substrate at the dislocation, causing the first substrate to be deformed relative to the second substrate, and further the first substrate and the second substrate A gap is formed between them. According to this, the separating tool can be embedded in the slit with its sharp edge, so that the second substrate is pushed up by the separating tool; at the same time, the adsorption effect on the second substrate is generated on the surface of the roller by the vacuum unit, and by The air pressure unit exerts an effect of pushing the second substrate on the surface of the separating tool, thereby allowing the second substrate to be fixed to the roller. Accordingly, when the roller continues to rotate, the second substrate is wound on the roller, and also represents that the second substrate is gradually separated from the first substrate. In this way, the effect of separating the multi-layer substrate can be finally completed. This achieves the effect of separating the multi-layer substrate in a simple but effective manner by the associated mechanism of the separation device corresponding to the multi-layer substrate.
雖然本揭露已以實施例揭露如上,然其並非用以限定本揭露,任何所屬技術領域中具有通常知識者,在不脫離本揭露的精神和範圍內,當可作些許的更動與潤飾,故本揭露的保護範圍當視後附的申請專利範圍所界定者為準。 The present disclosure has been disclosed in the above embodiments, but it is not intended to limit the disclosure, and any person skilled in the art can make some changes and refinements without departing from the spirit and scope of the disclosure. The scope of protection of this disclosure is subject to the definition of the scope of the appended claims.
100‧‧‧複層基板分離裝置 100‧‧‧Multilayer substrate separation device
110‧‧‧基座 110‧‧‧Base
120‧‧‧滾輪 120‧‧‧Roller
122‧‧‧第一開孔 122‧‧‧First opening
130‧‧‧分離工具 130‧‧‧Separation tools
132‧‧‧第三開孔 132‧‧‧ third opening
150‧‧‧承載台 150‧‧‧bearing station
152‧‧‧第二開孔 152‧‧‧Second opening
200‧‧‧複層基板 200‧‧‧Multilayer substrate
O‧‧‧軸心 O‧‧‧Axis
X-Y-Z‧‧‧座標 X-Y-Z‧‧‧ coordinates
Claims (25)
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US14/830,745 US9751293B2 (en) | 2014-12-04 | 2015-08-20 | Laminated substrate separating device and method for separating laminated substrate |
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US201462087762P | 2014-12-04 | 2014-12-04 |
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CN1264156A (en) * | 1999-02-02 | 2000-08-23 | 佳能株式会社 | Compound element, substrate laminate and separation method, laminate transfer and substrate manufacture method |
TW201119930A (en) * | 2009-12-10 | 2011-06-16 | Ind Tech Res Inst | Lamination device for flexible substrate |
TW201141774A (en) * | 2010-05-26 | 2011-12-01 | Discovery High Technology Co Ltd | Substrate-separating fixture and method for separating substrates |
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CN1264156A (en) * | 1999-02-02 | 2000-08-23 | 佳能株式会社 | Compound element, substrate laminate and separation method, laminate transfer and substrate manufacture method |
TW201119930A (en) * | 2009-12-10 | 2011-06-16 | Ind Tech Res Inst | Lamination device for flexible substrate |
TW201141774A (en) * | 2010-05-26 | 2011-12-01 | Discovery High Technology Co Ltd | Substrate-separating fixture and method for separating substrates |
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