TWI602443B - Testing socket of microphone device and testing apparatus thereof - Google Patents

Description

Microphone component test socket and test device thereof

The invention relates to a microphone component test socket and a test device thereof, in particular to a microphone component test socket and a test device thereof for improving audio by using a test channel.

Everyday life is filled with a variety of electronic products, each of which uses semiconductor components to achieve specific functions, such as lighting with LEDs, temperature sensors and pressure sensors to measure changes in the external environment, etc. Before the components are mounted on the product, reliability testing and functional testing are required to ensure that the functions of the semiconductor components can be performed normally.

Referring to FIG. 1 , which is a schematic diagram of a conventional microphone component testing device, the conventional microphone component testing device includes a test cavity 40 , a sound source 41 , a reference microphone 42 , a microphone component 43 , a sound source 41 and a reference microphone 42 . At the test cavity 40 and in communication with the test cavity 40, the microphone element 43 has a sound hole 431 and is electrically connected to a plurality of probe pins (not shown).

The test method is that after the microphone component 43 is placed in the test cavity 40, a test signal is output through the sound source 41, and the test signal is transmitted from the test cavity 40 to the sound hole 431 of the microphone component 43 and the reference microphone 42 through analysis. The device compares the difference between the signal received by the microphone component 43 and the signal received by the reference microphone 42, thereby knowing whether the microphone component 43 is functioning properly and the quality of the signal.

When testing sound signals, the degree of distortion is generally determined by total harmonic distortion (THD: Total Harmonic Distortion), which is the extra harmonic component of the output signal when input with a signal source. In terms of percentage, in general, the total harmonic distortion at 1000 Hz is the smallest, so many tests use the distortion of 1000 Hz as an indicator, and the smaller the value of total harmonic distortion, the better.

As a result, the conventional microphone component testing device requires the microphone component 43 to be placed in the test cavity 40, so that the test cavity 40 needs to be sized to match the size of the microphone component 43, and the size of the test cavity 40 affects the distortion. To the extent that, in order to reduce the degree of distortion during testing, the inventors have conceived a microphone component test socket and its testing device based on the spirit of active invention and creation, and reduced the total harmonics by using the structural design of the test pedestal and the test channel. The purpose of the distortion and the modularization of the test device has been to complete the present invention after several research experiments.

The main object of the present invention is to solve the above problems, and provide a microphone component test socket and a test carrier thereof, which achieve the purpose of reducing total harmonic distortion and modularizing the test device.

To achieve the above objective, the microphone component test socket of the present invention comprises: a test base, a sound source, a reference microphone, a press seat and a plurality of probe pins. The test base includes at least one first test portion, a first mounting portion, a second mounting portion, and a test channel. The test channel is connected to the at least one first test portion, the first mounting portion, and the second mounting portion, and the sound source is disposed. In the first mounting portion, the reference microphone is disposed on the second mounting portion, and the pressure seat is pressed to the test base, and has at least one second test portion, and the at least one first test portion and the at least one second test portion form at least one component to be tested. The space is placed, and the plurality of probe pins are connected to at least one of the components to be tested.

The microphone component test socket of the present invention may further comprise at least one airtight member that abuts at least one of the first test portion and the at least one second test portion.

The microphone component test socket of the present invention may further comprise at least one vacuum adsorption channel communicating with at least one component placement space.

The microphone component test socket of the present invention may further comprise a test carrier having a uniform aperture, the test pedestal may be disposed on the test carrier, and at least one of the first mounting portion and the sound source may pass through the through hole.

The microphone component test socket of the present invention may further comprise a press carrier plate provided with a press seat.

The test channel includes at least one first sound channel, at least one second sound channel, and at least one third sound channel. The at least one first sound channel can be in communication with the at least one first test portion, and the at least one second sound channel can be coupled to The first mounting portion is in communication, and the at least one third sound channel is connectable to the second mounting portion.

The plurality of probe pins can be threaded through the test base.

The plurality of probe pins can be passed through the press seat.

The at least one first test portion may form at least one convex portion that communicates with the at least one first sound passage, and the at least one second test portion may form at least one concave portion corresponding to the at least one convex portion.

The at least one first test portion may form at least one recess connected to the at least one first sound passage, and the at least one second test portion may form at least one protrusion corresponding to the at least one recess.

The microphone component testing device of the present invention comprises: a test carrier, a plurality of microphone component test pads and a press carrier. The test carrier has at least a uniform hole, and at least the common hole forms a first receiving area, and the plurality of microphone component test seats in the first receiving area are adjacent to each other, and each of the microphone component test seats includes a test base, a sound source, a reference microphone, a press seat and a plurality of probe pins, the test base is disposed on the test carrier, the test base includes at least a first test portion, a first mounting portion, a second mounting portion and a test channel, the test channel is connected to the at least one first test portion, the first mounting portion and the second mounting portion, and the sound source is disposed on the first mounting portion, and each of the first mounting portions and each of the sound sources is at least One of the corresponding holes is respectively disposed, the reference microphone is disposed on the second mounting portion, and the pressure seat is pressed to the test base, and has at least one second test portion, and the at least one first test portion and the at least one second test portion form at least A device to be tested is placed in the space, and the plurality of probe pins are connected to at least one component to be tested, and the pressure seat is disposed on the pressure carrier.

The microphone component testing device of the present invention may further include a Handler for carrying a device under test (DUT).

The at least one of the plurality of apertures may form a second accommodating area, and the plurality of microphone element test seats located in the second accommodating area are separated from the reference microphone extending from the first accommodating area.

The at least one of the consistent holes may form a third receiving area, and the plurality of microphone component test seats located in the third receiving area are adjacent, and the reference microphone in the first receiving area extends in the direction of the third receiving area. The reference microphone extends in the opposite direction.

The at least one of the consistent holes may form a fourth receiving area, and the plurality of microphone component test seats located in the fourth receiving area are separated from the reference microphone extending from the third receiving area.

The test channel includes at least one first sound channel, at least one second sound channel, and at least one third sound channel. The at least one first sound channel can be in communication with the at least one first test portion, and the at least one second sound channel can be coupled to The first mounting portion is in communication, and the at least one third sound channel is connectable to the second mounting portion.

Each of the microphone element test sockets further includes at least one airtight member that abuts at least one of the first test portion and the at least one second test portion.

Each of the microphone element test sockets further includes at least one vacuum adsorption channel that communicates with at least one of the components to be tested.

The above summary and the following detailed description are intended to be illustrative of the scope of the invention, and the scope of the invention Explain it.

1‧‧‧Microphone component test stand

10,30‧‧‧Test carrier

101,301‧‧‧through holes

11,31‧‧‧Test base

111,311‧‧‧First Test Department

111a‧‧‧ convex

311a‧‧‧Depression

112, 312‧‧‧First Installation Department

113‧‧‧Second Installation Department

114,314‧‧‧Test channel

1141, 3141‧‧‧ first sound channel

1142, 3142‧‧‧second sound channel

1143, 3143‧‧‧ third sound channel

12,32‧‧‧ source

13,33‧‧‧ reference microphone

14,34‧‧‧ pressure seat

141,341‧‧‧Second Test Department

141a‧‧‧ recess

341a‧‧‧Protruding

15,35‧‧‧pressure seat carrier

16,36‧‧‧ probe pin

17,37‧‧‧ airtight components

18,38‧‧‧vacuum adsorption channel

19,39‧‧‧Device under test

191,391‧‧‧Contacts

192,392‧‧‧ sound hole

20‧‧‧ processor

21‧‧‧Sound test equipment

22‧‧‧Source output device

23‧‧‧Reference microphone test equipment

24‧‧‧Vacuum adsorption equipment

40‧‧‧Test cavity

41‧‧‧ source

42‧‧‧Reference microphone

43‧‧‧Microphone components

431‧‧‧ sound hole

S1~S2‧‧‧Measurement component placement space

R1‧‧‧First Capacity Zone

R2‧‧‧Second Capacity Zone

R3‧‧‧The third housing area

R4‧‧‧4th District

Figure 1 is a schematic diagram of a conventional microphone component testing device.

2 is a schematic structural view of a first embodiment of a microphone component test socket of the present invention.

Fig. 3 is a schematic exploded view showing the first embodiment of the microphone component test socket of the present invention.

Figure 4 is a schematic cross-sectional view taken along line A-A of Figure 2.

Fig. 5 is a schematic view showing the structure of a second embodiment of the microphone component test socket of the present invention.

Fig. 6 is a schematic exploded view showing the second embodiment of the microphone component test socket of the present invention.

Figure 7 is a schematic cross-sectional view taken along line B-B of Figure 5.

FIG. 8 is a detailed structural diagram of a microphone component testing device according to a preferred embodiment of the present invention.

Figure 9 is a partially exploded perspective view of a microphone component testing device in accordance with a preferred embodiment of the present invention.

Figure 10 is a top plan view of a test carrier of a microphone component testing device in accordance with a preferred embodiment of the present invention.

2 to FIG. 4 are respectively a schematic structural view, a structural exploded view of the first embodiment of the microphone component test socket of the present invention, and a cross-sectional view taken along line A-A of FIG. 2 .

The first embodiment of the microphone component test socket of the present invention comprises: a test carrier 10, a test pedestal 11, a sound source 12, a reference microphone 13, a pressure seat 14, a pressure carrier board 15, and four probes. The pin 16, the airtight member 17, a vacuum suction passage 18, and a member to be tested 19.

The test carrier 10 has a uniform hole 101. The test base 11 includes a first test portion 111, a first mounting portion 112, a second mounting portion 113, and a test channel 114. The test channel 114 is connected to the first test portion 111. The first mounting portion 112 and the second mounting portion 113, the sound source 12 is disposed on the first mounting portion 112, the reference microphone 13 is disposed in the second mounting portion 113, and the sound source 12 is disposed through the through hole 101 and coupled to a sound source output device (not shown) The electrical connection is to provide a sound signal required for testing, and the reference microphone 13 is electrically coupled to a reference microphone test device (not shown) to analyze the received sound signal.

The test channel 114 includes a first sound channel 1141, a second sound channel 1142, and a third sound channel 1143. The first sound channel 1141 is in communication with the first test portion 111, and the second sound channel 1142 is first mounted. The portion 112 is in communication, and the third sound channel 1143 is in communication with the second mounting portion 113 (see FIG. 4). The structure design is such that the sound signal of the sound source 12 is transmitted to the first sound channel 1141 and the third through the second sound channel 1142, respectively. The sound channel 1143 performs the test of the sound signal. The first sound channel 1141 is designed as a longitudinal channel, and the second sound channel 1142 and the third sound channel 1143 are designed as a lateral channel. However, the present invention is not limited thereto. The angle, direction, shape, size, and connection position of the first sound channel 1141, the second sound channel 1142, and the third sound channel 1143 can be changed according to actual needs.

The pressure seat 14 is disposed on the pressure carrier board 15 and presses the test base 11 to have a second test portion 141. The first test portion 111 and the second test portion 141 form a device placement space S1, and the first The test portion 111 forms a convex portion 111a that communicates with the first sound channel 1141, and the second test portion 141 forms a concave portion 141a corresponding to the convex portion 111a. The four probe pins 16 pass through the press seat 14 and the press carrier 15 to communicate with The component to be tested is placed in the space S1 and electrically coupled to a sound testing device (not shown), and the signal generated by the component to be tested 19 is output to the sound testing device for analysis.

When the pressure seat 14 presses the test base 11, the airtight member 17 abuts against the first test portion 111 and the second test portion 141, whereby the element to be tested 19 is positioned in the convex portion 111a and the concave portion 141a. While the space to be tested is placed in the space S1, the airtight member 17 is used to maintain the airtightness of the component placement space S1, and the airtight member 17 is a gas-tight member having a high compression property and composed of a rubber material. It can ensure that the test base 11 and the pressure seat 14 are tightly pressed to improve the distortion of the signal test caused by the air flow.

Under the above-mentioned structural design, a vacuum adsorption device (not shown) is used to adsorb the component 19 to be tested by the vacuum adsorption channel 18 through which the pressure seat 14 and the pressure carrier plate 15 are connected and communicated to the component placement space S1. The dents 141 are disposed at the same time, and the four contacts 191 of the device 19 to be tested are respectively positioned to abut the four probe pins 16, and the pressure base 14 is pressed against the test pedestal 11 to make the sound hole 192 of the component 19 to be tested. In communication with the first sound channel 1141, the sound signal emitted by the sound source 12 can be sequentially transmitted to the sound hole 192 via the second sound channel 1142 and the first sound channel 1141, and the device under test 19 receives the sound signal from the sound hole 192 and generates a signal. It is transmitted to the sound test equipment for analysis via the four contacts 191 and the four probe pins 16 in sequence.

Therefore, in the first embodiment of the microphone component test socket of the present invention, the component 19 to be tested does not need to be placed in the test channel 114, so that the structural design of the test channel 114 can be reduced, and the sound signal output by the sound source 12 needs to be utilized. The space is minimized, and the signal can be transmitted to the reference microphone 13 and the device under test 19 with a minimum degree of distortion, thereby reducing the total harmonic distortion value and improving the quality of the signal test.

5 to FIG. 7 are respectively a schematic structural view, a structural exploded view of the second embodiment of the microphone component test socket of the present invention, and a cross-sectional view taken along line B-B of FIG. 5.

The second embodiment of the microphone component test socket of the present invention comprises: a test carrier 30, a test pedestal 31, a sound source 32, a reference microphone 33, a pressure seat 34, a pressure carrier plate 35, and an eight-expansion The pin 36, the two airtight members 37, the two vacuum adsorption channels 38, and the two components to be tested 39.

The test carrier 30 has a uniform hole 301. The test base 31 includes two first test portions 311, a first mounting portion 312, and a second mounting portion (not shown due to the viewing angle and the cross-sectional position, and the structure thereof can be referred to. The second mounting portion 113 of FIG. 4 and a test channel 314, the test channel 314 is connected to the first test portion 311, the first mounting portion 312, and the second mounting portion. The sound source 32 is disposed on the first mounting portion 312, and the reference microphone 33 The first mounting portion 312 and the sound source 32 are disposed through the through hole 301. The functions of the sound source 32 and the reference microphone 33 are the same as those of the first embodiment of the microphone element test socket, and the description thereof is omitted here.

The test channel 314 includes two first sound channels 3141, three second sound channels 3142, and three third sound channels 3143. The first sound channel 3141 and the two first test portions 311 respectively communicate with each other. The channel 3142 is in communication with the first mounting portion 312, and the third third sound channel 3143 is in communication with the second mounting portion. The sound signal of the sound source 32 is transmitted to the two first sound channels 3141 through the three second sound channels 3142, respectively. And the third third sound channel 3143 performs the test of the sound signal. Here, the first sound channel 3141 is designed as an L-shaped channel, the third sound channel 3142 is a longitudinal channel structure, and the third third sound channel 3143 is The structural design of the transverse channel is not limited thereto. The angle, direction, shape, size, connection position and number of the first sound channel 3141, the second sound channel 3142 and the third sound channel 3143 may vary according to actual needs.

The pressure seat 34 is disposed on the press base carrier 35 and presses the test base 31, and has two second test portions 341. The first test portion 311 and the second test portion 341 respectively form two test component placement spaces S2. And the two first testing portions 311 respectively corresponding to the recessed portions 311a of the two communicating first sound channels 3141, and the second testing portions 341 respectively corresponding to the protruding portions 341a of the two corresponding two recessed portions 311a, and the eight probe pins 36 are worn. The pressure seat 34 and the pressure carrier board 35 are respectively connected to the two to-be-tested component placement spaces S2 and electrically connected to a sound testing device, and the signals generated by the two components to be tested 39 are output to the sound testing device for analysis.

When the pressure seat 34 presses the test base 31, the two airtight members 37 and the two first test portions 311 and the second test portions 341 respectively abut each other, thereby positioning the two components to be tested 39 in the recess. While the two parts to be tested are formed by the portion 311a and the protruding portion 341a, the airtightness of the two components to be tested S2 is maintained by the two airtight members 37, and the function of the two airtight members 37 and the microphone component are maintained. The first embodiment of the test stand is the same, and the description thereof is omitted here.

The second embodiment of the microphone component test socket of the present invention is different from the first embodiment in that the test base 31 of the second embodiment has two first test portions 311 and two recessed portions 311a, and the pressure seat 34 has The second test portion 341 forms two protrusions 341a, that is, the microphone element test socket of the second embodiment can perform the signal test of the two elements to be tested 39 at a time, and the first sound channel 3141 of the test channel 314 The number of the second sound channel 3142 and the third sound channel 3143 also varies according to the number of the first test portions 311, which is a variation application of the first embodiment, and the signal design for the microphone component can be improved by the structural design of the second embodiment. Capacity.

In the first embodiment and the second embodiment of the microphone element test socket, the first test portion 111 of the first embodiment forms the protrusion 111a, the second test portion 141 forms the recess portion 141a corresponding to the protrusion 111a, and the second embodiment The first test portion 311 of the example forms a recessed portion 311a, and the second test portion 341 forms a pair The projections 341a of the recessed portion 311a, that is, the first test portions 111, 311 and the second test portions 141, 341 may be designed so as to correspond to each other and be pressed.

In the first embodiment and the second embodiment of the microphone component test socket, the probe pin 36 is passed through the press seat 34 and the press base carrier 35, and the contact between the top side of the device under test 39 and the component to be tested 39 is 391. Abutting to transmit a signal, but the present invention is not limited thereto. When the contact 391 is located on the bottom side of the element to be tested 39 (the contact 391 and the sound hole 392 are located on the same side of the element to be tested 39), the probe pin 36 can also be designed. The test carrier 30 and the test pedestal 31 are electrically connected to the contact 391 so as to be compatible with the structure of the component to be tested 39. In addition to the vacuum adsorption channel 38 for adsorbing the component to be tested 39, A processor is used to set the device under test 39 to the first test portion 311 and the second test portion 341, and then the signal test of the device under test 39 is performed.

8 to FIG. 10 are a detailed structural diagram, a partial structural exploded view, and a top view of a test carrier of a microphone component testing device according to a preferred embodiment of the present invention. Here, the structure of the first embodiment of the microphone component test socket is taken as an example. Therefore, FIG. 9 omits part of the structure to clearly show the characteristics of the microphone component testing device of the present invention. Please refer to FIG. 2 to FIG. 4 together.

The microphone component testing device of the present invention is coupled to a sound testing device 21, a sound source output device 22, a reference microphone testing device 23, and a vacuum adsorption device 24. The microphone component testing device includes: a sixteen microphone component test socket 1, The carrier board 10, a press carrier board 15 and a processor 20 are tested.

The test carrier 10 has nine through holes 101, and the nine through holes 101 respectively form a first receiving area R1, a second receiving area R2, a third receiving area R3 and a fourth receiving area R4. The four microphone component test sockets 1 located in the first housing area R1 are adjacent, and each microphone component test socket 1 includes a test base 11, a sound source 12, a reference microphone 13, a press seat 14, and a four-probe pin. 16, an airtight The test base 11 is disposed on the test carrier 10, and the test base 11 includes a first test portion 111, a first mounting portion 112, a second mounting portion 113, and a test channel. The test channel 114 is connected to the first test portion 111, the first mounting portion 112, and the second mounting portion 113. The sound source 12 is disposed on the first mounting portion 112, and at least one of each of the first mounting portions 112 and each of the sound sources 12. The reference microphone 13 is disposed on the second mounting portion 113, and the pressure seat 14 is pressed against the test base 11 to have a second test portion 141. The first test portion 111 and the second test portion 141 are formed. A test component placement space S1, the four probe pins 16 are connected to the component placement space S1 to be tested and electrically connected to the sound testing device 21, and the pressure seat 14 is disposed on the compression carrier 15 for the processor 20 to handle The measuring component 19, the sound source 12 is electrically coupled with the sound source output device 22 to provide a sound signal required for testing, and the reference microphone 13 is electrically coupled to the reference microphone testing device 23 to analyze the received sound signal, the vacuum adsorption channel 18 and the vacuum adsorption. Device 24 is connected.

The test channel 114 includes a first sound channel 1141, a second sound channel 1142, and a third sound channel 1143. The first sound channel 1141 is in communication with the first test portion 111, and the second sound channel 1142 is connected to the first mounting portion 112. The third sound channel 1143 is in communication with the second mounting portion 113. The functions of the first sound channel 1141, the second sound channel 1142, and the third sound channel 1143 of the test channel 114 are the same as those of the first embodiment of the microphone component test socket. This is omitted.

The airtight member 17 abuts against the first testing portion 111 and the second testing portion 141, and the vacuum adsorption channel 18 adsorbs the component to be tested 19 for testing, and the function of the airtight member 17 and the vacuum adsorption channel 18 and the microphone component test seat The first embodiment is the same, and the description thereof is omitted here, and the microphone component testing device of the present invention can use the processor 20 to set the device to be tested 19 to be used in addition to the vacuum adsorption channel 18 for adsorbing the device 19 to be tested. At the first test portion 111 and the second test portion 141, the signal test of the device under test 19 is performed, and the device under test 19 is not limited to being disposed by the vacuum adsorption channel 18.

The microphone component testing device of the present invention is characterized in that the through hole 101 of the first receiving region R1 forms a long through hole, so that the four microphone component test sockets 1 located in the first receiving region R1 can be adjacently arranged. The four receiving areas R2 have four through holes 101, and the four microphone element test sockets 1 located in the second receiving area R2 are separated from the reference microphone 13 extending from the first receiving area R1. The number of the microphone component test socket 1 in the first accommodation area R1 and the second accommodation area R2 can be maximized, and the test capacity of the microphone component test apparatus can be improved.

The third receiving area R3 and the first receiving area R1 share the long through hole 101, so that the four microphone component test sockets 1 located in the third receiving area R3 can be adjacently arranged and located in the first receiving area R1. The extending direction of the reference microphone 13 is opposite to the extending direction of the reference microphone 13 located in the third receiving area R3, and the through holes 101 of the fourth receiving area R4 are four (like the four holes of the second receiving area R2) 101), and the four microphone component test sockets 1 located in the fourth housing area R4 are separated from the reference microphone 13 extending from the third housing area R3, thereby configuring the microphone component test socket 1 in the third The accommodating area R3 and the fourth accommodating area R4 are arranged symmetrically with the first accommodating area R1 and the second accommodating area R2 to optimize the space utilization, and further improve the testing capacity of the microphone component testing device. And forming the through hole 101 of the first receiving area R1, the second receiving area R2, the third receiving area R3 and the fourth receiving area R4, so that the wiring of the sound source 12 disposed on the microphone component test stand 1 can be passed through , the wiring in the microphone component testing device is neat, and the shape of the through hole 101 is not particularly limited. The through holes 101 of the first receiving area R1 and the third receiving area R3 may not share the long through hole 101, but may be the four through holes 101 of the second receiving area R2 and the fourth receiving area R4. The number and shape of the through holes 101 can be varied depending on actual needs.

It can be seen from the above that the microphone component test socket of the present invention uses the test base 11 to press the pressure seat 14 to position and set the component 19 to be tested in the component placement space S1 to be tested, and then to test the test channel 114 of the base 11. a first sound channel 1141, a second sound channel 1142, and a third sound channel The structure design of 1143 can greatly reduce the total harmonic distortion generated when the component 19 under test is subjected to the sound test, and the modular design of the test pedestal 11 and the pressure seat 14 can be matched with different sizes and quantities according to the test requirements. The components to be tested 19 are respectively designed correspondingly, and the microphone component testing device of the present invention optimizes space utilization and improves the test capacity of the microphone component test.

The above-mentioned embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments.

10‧‧‧Test carrier

11‧‧‧Test base

111‧‧‧First Test Department

111a‧‧‧ convex

112‧‧‧First Installation Department

113‧‧‧Second Installation Department

114‧‧‧Test channel

1141‧‧‧First sound channel

1142‧‧‧Second sound channel

1143‧‧‧ third sound channel

12‧‧‧ source

13‧‧‧Reference microphone

14‧‧‧压座

141‧‧‧Second Test Department

141a‧‧‧ recess

15‧‧‧pressure seat carrier

16‧‧‧Probe pin

17‧‧‧ airtight components

18‧‧‧Vacuum adsorption channel

19‧‧‧Device under test

192‧‧‧ sound hole

S1‧‧‧Measurement component placement space

Claims (14)

A microphone component test socket includes: a test base comprising at least a first test portion, a first mounting portion, a second mounting portion, and a test channel, the test channel including at least one first sound channel The at least one first sound channel is in communication with the at least one first test portion, and the at least one second sound channel is in communication with the first mounting portion, the at least one second sound channel is in communication with the first mounting portion, The at least one third sound channel is in communication with the second mounting portion; a sound source is disposed in the first mounting portion; a reference microphone is disposed on the second mounting portion; and a press seat is pressed to the test base a seat having at least one second test portion, the at least one first test portion and the at least one second test portion forming at least one component placement space to be tested, wherein the at least one component to be tested is placed in the space a sound hole of the device to be tested, the sound hole and the at least one first sound channel communicate with each other and form a sealed space with the test channel; and the plurality of probe pins are connected to the at least one device to be tested. The microphone component test socket of claim 1, further comprising at least one airtight member that abuts the at least one first test portion and the at least one second test portion. The microphone component test socket of claim 1, further comprising at least one vacuum adsorption channel that communicates with the at least one component to be tested. The microphone component test socket of claim 1, wherein the plurality of probe pins are threaded through the pressure seat. The microphone component test socket of claim 1, further comprising a test carrier having a consistent hole, the test base being disposed on the test carrier, the first mounting portion and the sound source being at least The through hole is worn through the system. The microphone component test socket of claim 1, further comprising a press carrier for setting the pressure seat. The microphone component test socket of claim 1, wherein the at least one first test portion forms at least one convex portion that communicates with the at least one first sound channel, and the at least one second test portion forms at least A pair of recesses that should be at least one convex portion. The microphone component test socket of claim 1, wherein the at least one first test portion forms at least one recess connected to the at least one first sound channel, and the at least one second test portion forms at least A pair of protrusions that should be at least one recessed portion. A microphone component testing device includes: a test carrier having at least a consistent aperture, the at least consistent aperture forming a first receiving region; a plurality of microphone component test sockets, the plurality of microphone components located in the first receiving region The test socket is adjacent, and each of the microphone component test sockets includes a test base, a sound source, a reference microphone, a press seat and a plurality of probe pins, and the test base is disposed on the test carrier, the test The base includes at least one first test portion, a first mounting portion, a second mounting portion, and a test channel, the test channel includes at least one first sound channel, at least one second sound channel, and at least a third a sound channel, the at least one first sound channel is in communication with the at least one first test portion, the at least one second sound channel is in communication with the first mounting portion, the at least one third sound channel is connected to the second Connected to each other, the sound source is disposed in the first mounting portion, and each of the first mounting portions and each of the sound sources respectively respectively pass through the respective holes, and the reference microphone system is disposed on a second mounting portion, the pressure seat is press-fitted to the test base, and has at least one second test portion, the at least one first test portion and the at least one second test portion forming at least one component placement space to be tested, the at least A device to be tested having a sound hole is disposed in a space to be tested, the sound hole and the at least one first sound channel communicate with each other and form a sealed space with the test channel, and the plurality of probe pins are connected to Locating at least one component to be tested; A press carrier is disposed on the press carrier. The microphone component testing device of claim 9, wherein the at least one continuous hole further forms a second receiving area, and the plurality of microphone component test seats located in the second receiving area are spaced apart from each other. The reference microphone of the first receiving area. The microphone component testing device of claim 9, wherein the at least one of the consistent holes further forms a third receiving area, and the plurality of microphone component test seats located in the third receiving area are adjacent and located The extending direction of the reference microphone of the first receiving area is opposite to the extending direction of the reference microphone located in the third receiving area. The microphone component testing device of claim 11, wherein the at least one of the continuous apertures further forms a fourth receiving area, and the plurality of microphone component test seats located in the fourth receiving area are spaced apart from each other. The reference microphone of the third receiving area. The microphone component testing device of claim 9, wherein each of the microphone component test sockets further comprises at least one airtight contact with the at least one first test portion and the at least one second test portion member. The microphone component testing device of claim 9, wherein each of the microphone component test sockets further comprises at least one vacuum adsorption channel that communicates with the at least one component to be tested.