TWI593838B - Arrangement method of seed crystals and manufacturing method of monocrystalline-like ingot - Google Patents

Arrangement method of seed crystals and manufacturing method of monocrystalline-like ingot Download PDF

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TWI593838B
TWI593838B TW105124746A TW105124746A TWI593838B TW I593838 B TWI593838 B TW I593838B TW 105124746 A TW105124746 A TW 105124746A TW 105124746 A TW105124746 A TW 105124746A TW I593838 B TWI593838 B TW I593838B
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single crystal
crystal
blocks
orientation
peripheral
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TW201805493A (en
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藍崇文
翁敬閎
楊承叡
張元嘯
楊瑜民
余文懷
施英汝
許松林
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中美矽晶製品股份有限公司
藍崇文
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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B11/00Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
    • C30B11/14Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method characterised by the seed, e.g. its crystallographic orientation
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon

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  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

晶種的鋪設方法及類單晶晶錠之製作方法 Method for laying seed crystals and method for producing single crystal ingot

本揭露係關於一種晶種的鋪設方法及類單晶晶錠之製作方法。 The disclosure relates to a method for laying a seed crystal and a method for producing a single crystal ingot.

太陽能電池是一種藉由吸收太陽光並利用光伏效應(photovoltaic effect)進行光電轉換以產生電能的光電元件。目前太陽能電池的材料大部份都是以矽材為主,主要是因矽材為目前地球上最容易取到的第二多元素,其具有材料成本低廉、沒有毒性、穩定性高等優點,且其在半導體的應用上已有深厚的基礎。 A solar cell is a photovoltaic element that generates electrical energy by absorbing sunlight and performing photoelectric conversion using a photovoltaic effect. At present, most of the materials of solar cells are mainly coffins, mainly because coffins are the second most easily available elements on the earth, and they have the advantages of low material cost, no toxicity, high stability, and the like. It has a solid foundation in the application of semiconductors.

目前矽材料中應用最普遍的是晶體矽材料,包括單晶矽和多晶矽兩大類,其中單晶矽晶錠主要是以拉晶法(Czochralski method,CZ method)或浮動區域法(floating zone method,FZ method)加以備製,而多晶矽晶錠主要是以定向凝固法(Directional Solidification method)加以備製。相較於單晶矽的製備方法,定向凝固法所生產的多晶矽晶錠具有製程簡單、生產成本 低以及具有較大晶錠尺寸等優點而廣泛地被應用。相較於單晶矽晶錠,多晶矽晶錠雖然製作成本較低,但多晶矽晶錠中存在大量的晶界和位錯缺陷,故導致多晶矽太陽能電池的光電轉換效率不如單晶矽太陽能電池。因此,兼顧生產成本與光電轉換效率成為多晶矽太陽能電池發展上的重要挑戰。 At present, the most common application in germanium materials is crystalline germanium materials, including single crystal germanium and polycrystalline germanium. The single crystal germanium ingot is mainly a Czochralski method (CZ method) or a floating region method (floating zone method). The FZ method is prepared, and the polycrystalline germanium ingot is mainly prepared by a Directional Solidification method. Compared with the preparation method of single crystal germanium, the polycrystalline germanium ingot produced by the directional solidification method has a simple process and a production cost. It is widely used because of its low and large ingot size. Compared with the single crystal twin ingot, the polycrystalline germanium ingot has a low production cost, but a large number of grain boundaries and dislocation defects exist in the polycrystalline germanium ingot, so that the photoelectric conversion efficiency of the polycrystalline germanium solar cell is not as good as that of the single crystal germanium solar cell. Therefore, both production cost and photoelectric conversion efficiency have become important challenges in the development of polycrystalline silicon solar cells.

本揭露之一實施例提供一種晶種的鋪設方法,包括鋪設一拼接晶種層於一長晶容器之底部。上述拼接晶種層包括複數個單晶塊以及複數個單晶擋片,單晶塊經配置而位於長晶容器之底部且彼此不接觸,單晶擋片係分別夾設於相鄰之單晶塊之間的間隙並分別與相鄰之單晶塊接觸,且單晶擋片之寬度小於單晶塊之寬度。單晶塊的晶向相同且朝向同一方向,單晶擋片的主要晶向與單晶塊的主要晶向相同,且各單晶擋片的次要晶向與單晶塊的次要晶向分別具有一不為0度的夾角。 One embodiment of the present disclosure provides a method of laying a seed crystal comprising laying a spliced seed layer on the bottom of a long crystal container. The spliced seed layer comprises a plurality of single crystal blocks and a plurality of single crystal blocks, and the single crystal blocks are arranged at the bottom of the elongated crystal container and are not in contact with each other, and the single crystal blocking sheets are respectively sandwiched between adjacent single crystals. The gap between the blocks is respectively in contact with the adjacent single crystal block, and the width of the single crystal block is smaller than the width of the single crystal block. The crystal orientations of the single crystal blocks are the same and face the same direction. The main crystal orientation of the single crystal blank is the same as the main crystal orientation of the single crystal block, and the secondary crystal orientation of the single crystal blank and the secondary crystal orientation of the single crystal block. Each has an angle other than 0 degrees.

本揭露之另一實施例提供一種類單晶晶錠之製作方法,包括鋪設一拼接晶種層於一長晶容器之底部、形成一熔湯於拼接晶種層上,以及冷卻熔湯以使晶粒由拼接晶種層上成長以形成一類單晶晶錠。上述拼接晶種層包括複數個單晶塊以及複數個單晶擋片,單晶塊經配置而位於長晶容器之底部且彼此不接觸,單晶擋片係分別夾設於相鄰之單晶塊之間的間隙並分別與相鄰之單晶塊接觸,且單晶擋片之寬度小於單晶塊之寬度。單晶塊的晶向相同且朝向同一方向,單晶擋片的主要晶向與單晶塊的主要晶 向相同,且各單晶擋片的次要晶向與單晶塊的次要晶向分別具有一不為0度的夾角。 Another embodiment of the present disclosure provides a method for fabricating a single crystal-like ingot, comprising laying a spliced seed layer on the bottom of a long crystal container, forming a melt on the spliced seed layer, and cooling the melt so that The grains are grown from the spliced seed layer to form a type of single crystal ingot. The spliced seed layer comprises a plurality of single crystal blocks and a plurality of single crystal blocks, and the single crystal blocks are arranged at the bottom of the elongated crystal container and are not in contact with each other, and the single crystal blocking sheets are respectively sandwiched between adjacent single crystals. The gap between the blocks is respectively in contact with the adjacent single crystal block, and the width of the single crystal block is smaller than the width of the single crystal block. The crystal orientation of the single crystal block is the same and faces in the same direction. The main crystal orientation of the single crystal block and the main crystal of the single crystal block The same direction, and the minor crystal orientation of each of the single crystal blanks and the secondary crystal orientation of the single crystal block respectively have an angle of not more than 0 degrees.

本揭露之方法利用拼接晶種層製作類單晶晶錠,其中拼接晶種層包括單晶塊與單晶擋片,且單晶擋片的主要晶向與單晶塊的主要晶向相同但各單晶擋片的次要晶向與單晶塊的次要晶向分別具有一不為0度的夾角,藉此可抑制相鄰的單晶塊所成長出的晶錠之間產生晶界與位錯,進而大幅減少缺陷面積比。 The method of the present disclosure utilizes a spliced seed layer to produce a single crystal ingot, wherein the spliced seed layer comprises a single crystal block and a single crystal baffle, and the main crystal orientation of the single crystal baffle is the same as the main crystal orientation of the single crystal block but The minor crystal orientation of each of the single crystal blanks and the secondary crystal orientation of the single crystal block respectively have an angle of not more than 0 degrees, thereby suppressing generation of grain boundaries between the ingots grown by the adjacent single crystal blocks And dislocations, which in turn significantly reduce the defect area ratio.

10‧‧‧長晶容器 10‧‧‧Long crystal container

12‧‧‧拼接晶種層 12‧‧‧Splicing seed layer

12A‧‧‧單晶塊 12A‧‧‧ single crystal block

12B‧‧‧單晶擋片 12B‧‧‧Single crystal blank

12B1‧‧‧單晶擋片 12B1‧‧‧Single film blank

12B2‧‧‧單晶擋片 12B2‧‧‧Single crystal blank

12G‧‧‧間隙 12G‧‧‧ gap

A‧‧‧主要晶向 A‧‧‧ main crystal orientation

B1‧‧‧次要晶向 B1‧‧‧ secondary crystal orientation

B2‧‧‧次要晶向 B2‧‧‧ secondary crystal orientation

14‧‧‧熔湯 14‧‧‧ molten soup

16‧‧‧類單晶晶錠 16‧‧‧ class of single crystal ingots

V‧‧‧長晶方向 V‧‧‧Long Crystal Direction

12C‧‧‧第一外圍擋片 12C‧‧‧First peripheral blank

12D‧‧‧第二外圍擋片 12D‧‧‧Second peripheral blank

12E‧‧‧第三外圍擋片 12E‧‧‧ third peripheral flap

由以下詳細說明與附隨圖式得以最佳了解本申請案揭示內容之各方面。注意,根據產業之標準實施方式,各種特徵並非依比例繪示。實際上,為了清楚討論,可任意增大或縮小各種特徵的尺寸。 The aspects of the disclosure of the present application are best understood from the following detailed description and the accompanying drawings. Note that various features are not drawn to scale in accordance with standard implementations of the industry. In fact, the dimensions of the various features may be arbitrarily increased or decreased for clarity of discussion.

第1圖至第4圖例示本揭露之一實施例之晶種的鋪設方法。 1 to 4 illustrate a method of laying seed crystals according to an embodiment of the present disclosure.

第4A圖例示本揭露之一實施例之單晶塊的主要晶向與次要晶向的示意圖。 4A is a schematic view showing the main crystal orientation and the secondary crystal orientation of the single crystal block of one embodiment of the present disclosure.

第4B圖例示本揭露之一實施例之單晶擋片的主要晶向與次要晶向的示意圖。 Figure 4B is a schematic view showing the main crystal orientation and the secondary crystal orientation of the single crystal blank of one embodiment of the present disclosure.

第5圖至第8圖例示本揭露之一實施例之類單晶晶錠之製作方法。 5 to 8 illustrate a method of fabricating a single crystal ingot such as an embodiment of the present disclosure.

第9圖例示本揭露之一變化實施例之晶種的鋪設方法。 Fig. 9 is a view showing a method of laying seed crystals according to a variant embodiment of the present disclosure.

第10圖至第13圖例示本揭露之另一實施例之類單晶晶錠之製作方法。 10 to 13 illustrate a method of fabricating a single crystal ingot such as another embodiment of the present disclosure.

第14圖例示本揭露之一變化實施例之晶種的鋪設方法。 Fig. 14 is a view showing a method of laying seed crystals according to a variant embodiment of the present disclosure.

第15圖例示本揭露之又一實施例之晶種的鋪設方法。 Fig. 15 is a view showing a method of laying a seed crystal according to still another embodiment of the present disclosure.

第16圖為本揭露之實施例與對照例分別製作出之類單晶矽晶錠之缺陷面積比與晶錠高度之關係圖。 Fig. 16 is a graph showing the relationship between the defect area ratio and the height of the ingot of a single crystal twin ingot prepared in the examples and the comparative examples of the present disclosure.

本案之一些實施例揭露一種晶種的鋪設方法,包括鋪設由單晶塊與單晶擋片所組合成的拼接晶種層於長晶容器的底部,其中單晶塊經配置而位於長晶容器之底部且彼此不接觸,且單晶塊的晶向相同且朝向同一方向,而單晶擋片係配置於相鄰之單晶塊之間的間隙並與相鄰之單晶塊接觸,且單晶擋片之寬度小於單晶塊之寬度。單晶擋片的主要晶向與單晶塊的主要晶向相同但單晶擋片的次要晶向與單晶塊的次要晶向具有一不為0度的夾角。 Some embodiments of the present invention disclose a method for laying a seed crystal, comprising laying a spliced seed layer formed by combining a single crystal block and a single crystal baffle at the bottom of the elongated crystal container, wherein the single crystal block is configured to be located in the long crystal container The bottom portions are not in contact with each other, and the crystal orientations of the single crystal blocks are the same and face the same direction, and the single crystal blank is disposed in the gap between the adjacent single crystal blocks and is in contact with the adjacent single crystal blocks, and the single The width of the crystal stop sheet is smaller than the width of the single crystal block. The main crystal orientation of the single crystal blank is the same as the main crystal orientation of the single crystal block, but the secondary crystal orientation of the single crystal blank has an angle of not more than 0 degrees with the secondary crystal orientation of the single crystal block.

本案之另一些實施例揭露一種類單晶晶錠的製作方法,其利用前述拼接的單晶晶種層以鑄錠方式製作出類單晶(monocrystalline-like,或稱為近單晶、準單晶)晶錠。進一步說明,本案的方法是利用拼接單晶矽作為晶種,並使用類似多晶矽晶錠的鑄錠技術例如定向凝固法的製作方法,以製作出類單晶晶錠,因此其製作成本與多晶晶錠的製作成本接近,且製作出的類單晶晶錠具有與單晶晶錠類似的品質與特性。在本案之類單晶晶錠的製作方法中,拼接晶種層的單晶塊具有相同的晶向(例如{100}晶 向)且朝向同一方向,因此由單晶塊所成長出的晶錠也會是單晶且其晶向會朝向相同的方向。另一方面,單晶擋片的主要晶向與單晶塊的主要晶向相同,因此由單晶擋片所成長出的晶錠與單晶塊所成長出的晶錠會具有相同的成長速度,但由於兩者的次要晶向係朝向不同的方向,因此單晶擋片具有抑制晶界與位錯產生的作用,可以減少長晶過程中缺陷的數量,因此可以提升晶錠的光電轉換效率。簡而言之,本案之方法所備製出的類單晶晶錠,兼顧單晶晶錠的低缺陷、可利用鹼性溶液進行溼蝕刻以形成粗糙化表面與可利用鑽石切割線(diamond wire)進行切割等優點以及多晶晶錠的低成本優勢,因此可加速太陽能電池的發展進程。 Other embodiments of the present invention disclose a method for fabricating a single crystal-like ingot, which uses the spliced single crystal seed layer to form a monocrystalline-like, or near-single-crystal, quasi-single Crystal) ingot. Further, the method of the present invention is to use a spliced single crystal germanium as a seed crystal, and use an ingot casting technique similar to a polycrystalline germanium ingot, such as a directional solidification method, to produce a single crystal ingot, so that the production cost and polycrystalline The production cost of the ingot is close, and the produced single crystal ingot has similar qualities and characteristics as the single crystal ingot. In the method of fabricating a single crystal ingot such as the present invention, the single crystal blocks of the spliced seed layer have the same crystal orientation (for example, {100} crystal In the same direction, the ingot grown from the single crystal block will also be a single crystal and its crystal orientation will be in the same direction. On the other hand, the main crystal orientation of the single crystal blank is the same as the main crystal orientation of the single crystal block, so that the ingot grown from the single crystal blank has the same growth rate as the ingot grown from the single crystal block. However, since the secondary crystal orientations of the two are oriented in different directions, the single crystal blank has the effect of suppressing the generation of grain boundaries and dislocations, and can reduce the number of defects in the crystal growth process, thereby improving the photoelectric conversion of the ingot. effectiveness. In short, the single crystal ingot prepared by the method of the present invention takes into account the low defects of the single crystal ingot, can be wet etched with an alkaline solution to form a roughened surface and a diamond cutting wire (diamond wire) The advantages of cutting and the low cost advantages of polycrystalline ingots can accelerate the development of solar cells.

請參考第1圖至第4圖。第1圖至第4圖例示本揭露之一實施例之晶種的鋪設方法,其中第1圖與第3圖係以上視圖型式繪示,而第2圖係沿第1圖之剖面線1-1繪示的剖面示意圖,第4圖係沿第3圖之剖線2-2繪示的剖面示意圖。如第1圖與第2圖所示,首先提供一長晶容器10。長晶容器10可以是坩堝或其它耐熱材質例如石英、石墨、氮化矽或碳化矽構成的模具。長晶容器10的尺寸(包括底部面積及高度)及形狀可視欲製作的晶錠的尺寸與形狀加以調整。在本實施例中,長晶容器10為一方形槽體,可用以製作具有長方柱狀體的晶錠。在其它實施例中,長晶容器10也可具有其它形狀,例如圓柱槽體或其它幾何形狀的槽體。 Please refer to Figures 1 to 4. 1 to 4 illustrate a method for laying a seed crystal according to an embodiment of the present disclosure, wherein the first and third figures are shown in the above view, and the second figure is taken along the line 1 in the first figure. 1 is a schematic cross-sectional view, and FIG. 4 is a schematic cross-sectional view taken along line 2-2 of FIG. As shown in Figs. 1 and 2, a long crystal container 10 is first provided. The crystal growth vessel 10 may be a mold of tantalum or other heat resistant material such as quartz, graphite, tantalum nitride or tantalum carbide. The size (including the bottom area and height) and shape of the crystal growth vessel 10 can be adjusted depending on the size and shape of the ingot to be produced. In the present embodiment, the crystal growth vessel 10 is a square tank body which can be used to produce an ingot having a rectangular columnar body. In other embodiments, the elongated container 10 can have other shapes, such as a cylindrical trough or other geometric shaped trough.

如第3圖與第4圖所示,接著鋪設一拼接晶種層12於長晶容器10之底部,其中拼接晶種層12包括複數個單晶塊12A以及 複數個單晶擋片12B。單晶塊12A經配置而位於長晶容器10之底部,其中單晶塊12A的數目、長度、寬度、厚度與形狀等可以視長晶容器10的底部面積、單晶塊12A的備製方式或其它因素考量而加以調整。本實施例係以四塊具有相同面積的正方形單晶塊拼接成2*2矩陣圖案為範例說明,但不以此為限。在其它實施例中,可利用其它數目或形狀的單晶塊拼接成任意的圖案,例如5*5矩陣圖案、6*6矩陣圖案、圓形圖案或其它圖案。在一些實施例中,單晶塊12A可由拉晶法或浮動區域法所製作出的單晶柱體所切割而獲致,但不以此為限。本實施例之單晶塊12A具有相同的晶向(例如{100}晶向),但不以此為限,且單晶塊12A在鋪設在長晶容器10之底部時係經配置而使得所有的單晶塊12A的晶向朝向同一方向。此外,單晶塊12A彼此不接觸,也就是說,任兩相鄰的單晶塊12A的相對側壁之間存在間隙12G。舉例而言,本實施例之四塊單晶塊12A係鋪設於長晶容器10之底部的四個角落,藉此單晶塊12A之間會存在十字形的間隙12G。 As shown in Figures 3 and 4, a spliced seed layer 12 is then applied to the bottom of the elongated container 10, wherein the spliced seed layer 12 includes a plurality of single crystal blocks 12A and A plurality of single crystal blanks 12B. The single crystal block 12A is disposed at the bottom of the elongated crystal container 10, wherein the number, length, width, thickness, shape, and the like of the single crystal block 12A may depend on the bottom area of the crystal growth vessel 10, the preparation method of the single crystal block 12A, or Other factors are considered to adjust. In this embodiment, four square single crystal blocks having the same area are spliced into a 2*2 matrix pattern as an example, but not limited thereto. In other embodiments, other numbers or shapes of single crystal blocks may be spliced into any pattern, such as a 5*5 matrix pattern, a 6*6 matrix pattern, a circular pattern, or other pattern. In some embodiments, the single crystal block 12A can be obtained by cutting a single crystal cylinder made by a crystal pulling method or a floating region method, but is not limited thereto. The single crystal block 12A of the present embodiment has the same crystal orientation (for example, {100} crystal orientation), but is not limited thereto, and the single crystal block 12A is configured to be disposed at the bottom of the elongated crystal container 10 to make all The crystal orientation of the single crystal block 12A faces in the same direction. Further, the single crystal blocks 12A are not in contact with each other, that is, there is a gap 12G between the opposite side walls of any two adjacent single crystal blocks 12A. For example, the four single crystal blocks 12A of the present embodiment are laid at four corners of the bottom of the elongated crystal container 10, whereby a cross-shaped gap 12G exists between the single crystal blocks 12A.

另一方面,將單晶擋片12B鋪設於長晶容器10之底部並使得單晶擋片12B分別夾設於相鄰之單晶塊12A之間的間隙12G並分別與相鄰之單晶塊12A接觸,其中單晶擋片12B的數目、長度、寬度、厚度與形狀等可以視長晶容器10的底部面積、單晶擋片12B的製備方式、單晶塊12A的形狀與尺寸或其它因素考量而加以調整。對應單晶塊12A的配置,本實施例係以四條長方形的單晶擋片12B分別夾設於兩相鄰的單晶塊12A之間的間隙12G內,但不以此 為限。在一些實施例中,單晶擋片12B可由拉晶法或浮動區域法所製作出的單晶柱體所切割而獲致,藉此單晶擋片12B與單晶塊12A會具有相同的主要晶向,且沿不同方向切割單晶柱體的作法可以使得單晶擋片12B與單晶塊12A具有不同的次要晶向。請參閱第4A圖與第4B圖。第4A圖例示本揭露之一實施例之單晶塊的主要晶向與次要晶向的示意圖,且第4B圖例示本揭露之一實施例之單晶擋片的主要晶向與次要晶向的示意圖。如第4A圖與第4B圖所示,單晶塊12A與單晶擋片12B可由同一單晶柱體切割所獲致,因此單晶塊12A與單晶擋片12B會具有相同的主要晶向A,且沿不同方向切割單晶柱體的作法可以使得單晶塊12A具有次要晶向B1及使單晶擋片12B具有次要晶向B2。在一些實施例中,單晶擋片12B係利用鑽石線切割所獲致,其中線切割的切片角度較佳係介於1度至40度,且更較佳係介於10度至30度,例如10度、20度或30度,但不以此為限。因此,單晶檔片12B之次要晶向B2和單晶塊12A之次要晶向B1的夾角較佳介於1度至40度之間,且更較佳介於10度至30度,但不以此為限。在本發明的方法中,只要使單晶檔片12B之次要晶向B2和單晶塊12A之次要晶向B1的夾角不為0度,即可以具有抑制相鄰的單晶塊12A所成長出的晶錠之間產生晶界與位錯的作用。另外值得說明的是,單晶檔片12B之次要晶向B2和單晶塊12A之次要晶向B1的夾角為0度或90度實質上是一樣的角度,也就是說,單晶檔片12B之次要晶向B2和單晶塊12A之次要晶向B1的夾角係介於0度至45度實質上即等於單晶檔片12B之次要晶向B2和單晶 塊12A之次要晶向B1的夾角係介於45度至90度。在一些實施例中,面積較大的單晶塊12A可先鋪設於長晶容器10的底部,再將面積較小的單晶擋片12B填入單晶塊12A之間的間隙12G內,但不以此為限。在其它實施例中,亦可先將單晶擋片12B鋪設於長晶容器10的底部,再將單晶塊12A鋪設於長晶容器10的底部;或者,可先將單晶塊12A與單晶擋片12B組合成拼接晶種層12再同時鋪設於長晶容器10的底部。 On the other hand, the single crystal blank 12B is laid on the bottom of the elongated crystal container 10 such that the single crystal blanks 12B are respectively sandwiched between the gaps 12G between the adjacent single crystal blocks 12A and respectively adjacent to the adjacent single crystal blocks. 12A contact, wherein the number, length, width, thickness and shape of the single crystal baffle 12B may depend on the bottom area of the crystal growth vessel 10, the preparation mode of the single crystal baffle 12B, the shape and size of the single crystal block 12A, or other factors. Adjust with consideration. Corresponding to the arrangement of the single crystal block 12A, in this embodiment, four rectangular single crystal blanks 12B are respectively interposed in the gap 12G between the adjacent single crystal blocks 12A, but not Limited. In some embodiments, the single crystal blank 12B can be obtained by cutting a single crystal cylinder made by a crystal pulling method or a floating region method, whereby the single crystal blank 12B and the single crystal block 12A have the same main crystal. The process of cutting the single crystal cylinders in different directions may cause the single crystal blank 12B and the single crystal block 12A to have different secondary crystal orientations. Please refer to Figures 4A and 4B. 4A is a schematic view showing a main crystal orientation and a secondary crystal orientation of a single crystal block according to an embodiment of the present disclosure, and FIG. 4B is a view showing a main crystal orientation and a secondary crystal of a single crystal blank according to an embodiment of the present disclosure. Schematic diagram of the direction. As shown in FIGS. 4A and 4B, the single crystal block 12A and the single crystal blank 12B can be obtained by cutting the same single crystal cylinder, so that the single crystal block 12A and the single crystal blank 12B have the same main crystal orientation A. And cutting the single crystal cylinder in different directions may cause the single crystal block 12A to have a secondary crystal orientation B1 and the single crystal blank 12B to have a secondary crystal orientation B2. In some embodiments, the single crystal blank 12B is obtained by diamond wire cutting, wherein the wire cutting slice angle is preferably between 1 and 40 degrees, and more preferably between 10 and 30 degrees, for example. 10 degrees, 20 degrees or 30 degrees, but not limited to this. Therefore, the angle between the minor crystal orientation of the single crystal sheet 12B and the minor crystal orientation B1 of the single crystal block 12A is preferably between 1 and 40 degrees, and more preferably between 10 and 30 degrees, but not This is limited to this. In the method of the present invention, as long as the minor crystal grain of the single crystal piece 12B and the minor crystal grain of the single crystal piece 12A are not 0 degrees, the adjacent single crystal block 12A can be suppressed. Grain boundaries and dislocations occur between the ingots that grow. In addition, it is worth noting that the secondary crystal grain of the single crystal piece 12B and the minor crystal of the single crystal piece 12A are substantially the same angle of 0 degree or 90 degree to the B1, that is, the single crystal file. The minor crystal orientation of the sheet 12B and the minor crystal orientation of the single crystal block 12A to the B1 are between 0 and 45 degrees, which is substantially equal to the secondary crystal orientation B2 and the single crystal of the single crystal sheet 12B. The minor angle of the block 12A to B1 is between 45 and 90 degrees. In some embodiments, the larger-area single crystal block 12A may be first laid on the bottom of the elongated crystal container 10, and the smaller single-crystal blank 12B is filled into the gap 12G between the single crystal blocks 12A, but Not limited to this. In other embodiments, the single crystal baffle 12B may be first laid on the bottom of the crystal growth vessel 10, and then the single crystal block 12A may be laid on the bottom of the crystal growth vessel 10; or, the single crystal block 12A and the single crystal may be first The crystal stop sheets 12B are combined into a spliced seed layer 12 and simultaneously laid on the bottom of the elongated crystal container 10.

在一些實施例中,不同的單晶擋片12B的次要晶向可朝向不同的方向鋪設,也就是說,不同的單晶擋片12B與單晶塊12A的次要晶向可具有不同的夾角,且相接觸的單晶擋片12B的次要晶向也會朝向不同的方向,藉此相鄰的單晶擋片12B對應的位置所成長出的晶錠也會因為晶向的方向不同而使得晶界與位錯受到抑制,進而減少長晶過程中缺陷的數量。 In some embodiments, the secondary crystal orientations of the different single crystal blanks 12B may be laid in different directions, that is, the different single crystal blanks 12B may have different secondary crystal orientations from the single crystal bulk 12A. The angles of the adjacent single crystal blanks 12B are also oriented in different directions, whereby the ingots grown by the positions corresponding to the adjacent single crystal blanks 12B are also different in direction of the crystal orientation. The grain boundaries and dislocations are suppressed, thereby reducing the number of defects in the crystal growth process.

在一些實施例中,單晶塊12A與單晶擋片12B的材料為矽,但不以此為限。 In some embodiments, the material of the single crystal block 12A and the single crystal blank 12B is germanium, but not limited thereto.

請接續第1圖至第4圖參閱第5圖至第8圖。第5圖至第8圖例示本揭露之一實施例之類單晶(monocrystalline-like)晶錠之製作方法,其中第5圖與第7圖係以上視圖型式繪示,而第6圖係沿第5圖之剖面線3-3繪示的剖面示意圖,第8圖係沿第7圖之剖面線4-4繪示的剖面示意圖。如第5圖與第6圖所示,鋪設拼接晶種層12於長晶容器10之底部之後,接著形成一熔湯14於拼接晶種層12上。本實施例係以類單晶矽之製作方法為例,因此拼接晶種層12 的材料係選用矽,且熔湯14的材料亦為矽。在本實施例中,熔湯14可利用下列方式形成。將矽原料放入長晶容器10內並堆放於拼接晶種層12的表面。之後,將裝有矽原料的長晶容器10放入定向凝固系統長晶爐或其它長晶設備內並將矽原料加熱以熔化成熔湯14。在其它實施例中,可先將矽原料熔化成熔湯14再將熔湯14倒入長晶容器10內。 Please refer to Figures 5 to 8 for the first to fourth figures. 5 to 8 illustrate a method of fabricating a monocrystalline-like ingot according to an embodiment of the present disclosure, wherein the fifth and seventh figures are shown in the above view, and the sixth figure is along the line. Fig. 5 is a schematic cross-sectional view taken along line 3-3 of Fig. 5, and Fig. 8 is a schematic cross-sectional view taken along line 4-4 of Fig. 7. As shown in FIGS. 5 and 6, after the spliced seed layer 12 is laid on the bottom of the elongated container 10, a melt 14 is formed on the spliced seed layer 12. In this embodiment, a method for manufacturing a single crystal germanium is taken as an example, and thus the seed layer 12 is spliced. The material used is enamel, and the material of fused soup 14 is also 矽. In the present embodiment, the melt 14 can be formed in the following manner. The tantalum raw material is placed in the growth vessel 10 and stacked on the surface of the spliced seed layer 12. Thereafter, the crystal growth vessel 10 containing the niobium material is placed in a directional solidification system crystal growth furnace or other crystal growth apparatus and the crucible material is heated to melt into the melt soup 14. In other embodiments, the crucible material may be first melted into melt 14 and the melt 14 poured into the growth vessel 10.

如第7圖與第8圖所示,接著進行方向性凝固製程冷卻熔湯14,以使晶粒逐漸沿一長晶方向V成長而形成類單晶晶錠16。在本實施例中,藉由拼接晶種層12的鋪設,由於單晶擋片12B與單晶塊12A具有相同的晶向,因此由單晶擋片12B沿長晶方向V所成長出的晶錠與單晶塊12A沿長晶方向V所成長出的晶錠會具有近似的成長速度,且由於單晶擋片12B與單晶塊12A兩者的次要晶向係朝向不同的方向,因此由單晶擋片12B所成長出的晶錠可以抑制由位於其兩側之單晶塊12A所成長出的晶錠之間產生晶界與位錯,進而減少長晶過程中缺陷的數量。 As shown in Figs. 7 and 8, the directional solidification process is followed by cooling the melt 14 so that the crystal grains gradually grow in a crystal growth direction V to form a single crystal-like crystal ingot 16. In the present embodiment, since the single crystal blank 12B and the single crystal block 12A have the same crystal orientation by the splicing of the seed layer 12, the crystal grown from the single crystal blank 12B along the crystal growth direction V The ingot in which the ingot and the single crystal block 12A grow in the crystal growth direction V has an approximate growth rate, and since the secondary crystal orientation of both the single crystal blank 12B and the single crystal block 12A faces in different directions, The ingot grown from the single crystal blank 12B can suppress the occurrence of grain boundaries and dislocations between the ingots grown by the single crystal block 12A located on both sides thereof, thereby reducing the number of defects in the crystal growth process.

此外,由於單晶擋片12B所成長出的晶錠的次要晶向與單晶塊12A所成長出的晶錠的次要晶向係朝向不同方向,故在晶錠外觀上仍會造成不一致的視覺效果。因此在設計拼接晶種層12的圖案時,單晶擋片12B之寬度係小於單晶塊12A之寬度,藉此單晶擋片12B可提供抑制晶界與位錯的效果,但又不致對於類單晶晶錠16的外觀產生明顯的影響。舉例而言,單晶擋片12B之寬度約介於0.5mm與4mm之間,而單晶塊12A之寬度約介於142mm與 155.5mm之間,但不以此為限。在一些實施例中,單晶擋片12B之寬度與單晶塊12A之寬度的比值實質上係介於0.32%與2.82%之間,且較佳介於0.65%與2.46%之間,藉此可兼顧減少缺陷產生的功能與外觀一致性。在一些實施例中,單晶擋片12B的面積約佔長晶容器10之底部面積的2%至20%,且較佳介於2.3%至15.02%之間,但不以此為限。 Further, since the secondary crystal orientation of the ingot grown by the single crystal stopper 12B faces the secondary crystal orientation of the ingot grown by the single crystal block 12A in different directions, the appearance of the ingot still causes inconsistency. Visual effects. Therefore, when designing the pattern of the spliced seed layer 12, the width of the single crystal slab 12B is smaller than the width of the single crystal block 12A, whereby the single crystal slab 12B can provide the effect of suppressing grain boundaries and dislocations, but not for The appearance of the single crystal ingot 16 has a significant effect. For example, the width of the single crystal blank 12B is between about 0.5 mm and 4 mm, and the width of the single crystal block 12A is about 142 mm. Between 155.5mm, but not limited to this. In some embodiments, the ratio of the width of the single crystal blank 12B to the width of the single crystal block 12A is substantially between 0.32% and 2.82%, and preferably between 0.65% and 2.46%. Take into account the function and appearance consistency of reducing defects. In some embodiments, the area of the single crystal blank 12B is between about 2% and 20% of the area of the bottom of the crystal growth vessel 10, and preferably between 2.3% and 15.02%, but not limited thereto.

本實施例之類單晶晶錠16可進一步切割成類單晶晶棒(crystal brick)與類單晶晶片,進而作為太陽能電池或其它光電元件的基材。本實施例之方法製作出的類單晶晶錠16具有類似單晶晶錠的低缺陷優勢,因此所製作出的太陽能電池可具有較高的光電轉換效率。此外,本實施例之類單晶晶錠16係利用類似於多晶矽晶錠的鑄錠方式形成,具有低製作成本與可利用鑽石切割線(diamond wire)進行切割的優點。另外,為了增加光利用率,可對太陽能電池的表面進行粗糙化,相較於必須使用乾蝕刻方式形成粗糙化表面的以多晶晶錠,本實施例之類單晶晶錠16所切割出的類單晶晶片可利用鹼性溶液進行溼蝕刻以形成粗糙化表面,更可進一步降低成本。 The single crystal ingot 16 of this embodiment can be further cut into a crystal-like crystal brick and a single crystal-like wafer, and further used as a substrate for a solar cell or other photovoltaic element. The single crystal-like ingot 16 produced by the method of the present embodiment has a low defect advantage similar to that of a single crystal ingot, so that the produced solar cell can have high photoelectric conversion efficiency. Further, the single crystal ingot 16 of the present embodiment is formed by an ingot forming method similar to a polycrystalline germanium ingot, and has an advantage of low manufacturing cost and cutting by a diamond wire. In addition, in order to increase the light utilization efficiency, the surface of the solar cell may be roughened, and the single crystal ingot 16 of the present embodiment is cut out compared to a polycrystalline ingot which must be formed by a dry etching method to form a roughened surface. The single crystal-like wafer can be wet etched using an alkaline solution to form a roughened surface, which further reduces the cost.

在一些實施例中,單晶擋片12B的設置除了抑制所成長出的晶錠之間產生晶界與位錯的作用之外,更可具有增加美觀與顯示資訊之用。進一步說明,由於單晶擋片12B次要晶向與單晶塊12A次要晶向係朝向不同方向而使得兩者在晶錠外觀上有所差異,因此若透過單晶塊12A與單晶擋片12B的圖案搭配設計,可使 得製作出的類單晶晶錠16的晶粒具有預定的排列規則,藉此所製作出的晶片在經過鹼性溶液蝕刻後可顯示出預定的花紋或文字,而可增加太陽能電池的應用範圍。 In some embodiments, the arrangement of the single crystal blank 12B may have the effect of increasing aesthetics and display information in addition to inhibiting the effect of grain boundaries and dislocations between the grown ingots. Further, since the secondary crystal grain 12B secondary crystal orientation and the single crystal block 12A minor crystal orientation are oriented in different directions so that the two are different in the appearance of the ingot, if the single crystal block 12A and the single crystal block are transmitted through The pattern design of the piece 12B can make The crystal grains of the single crystal-like ingot 16 to be produced have a predetermined arrangement rule, whereby the prepared wafer can exhibit a predetermined pattern or text after being etched by the alkaline solution, thereby increasing the application range of the solar cell. .

下文將針對本案之不同實施例進行說明,且為簡化說明,以下說明主要針對各實施例不同之處進行詳述,而不再對相同之處作重覆贅述。此外,本案之各實施例中相同之元件係以相同之標號進行標示,以利於各實施例間互相對照。 The different embodiments of the present invention are described below, and in order to simplify the description, the following description is mainly directed to the differences of the embodiments, and the details are not repeated. In addition, the same elements in the embodiments of the present invention are denoted by the same reference numerals to facilitate the comparison between the embodiments.

請參考第9圖。第9圖例示本揭露之一變化實施例之晶種的鋪設方法。如第9圖所示,不同於前述實施例,在本實施例之拼接晶種層12中,兩相鄰之單晶塊12A之間的間隙12G內鋪設有兩個或以上的單晶擋片12B1、12B2,其中單晶擋片12B1、12B2可彼此相鄰並接觸,且可具有相同或不同的次要晶向。 Please refer to Figure 9. Fig. 9 is a view showing a method of laying seed crystals according to a variant embodiment of the present disclosure. As shown in FIG. 9, unlike the foregoing embodiment, in the spliced seed layer 12 of the present embodiment, two or more single crystal blanks are laid in the gap 12G between two adjacent single crystal blocks 12A. 12B1, 12B2, wherein the single crystal blanks 12B1, 12B2 may be adjacent to each other and in contact, and may have the same or different secondary crystal orientations.

請參考第10圖至第13圖。第10圖至第13圖例示本揭露之另一實施例之類單晶晶錠之製作方法,其中第10圖與第12圖係以上視圖型式繪示,而第11圖係沿第10圖之剖面線5-5繪示的剖面示意圖,第13圖係沿第12圖之剖面線6-6繪示的剖面示意圖。如第10圖與第11圖所示,不同於前述實施例,本實施例之拼接晶種層12除了單晶塊12A與單晶擋片12B之外,更進一步包括第一外圍擋片12C與第二外圍擋片12D。第一外圍擋片12C鋪設於長晶容器10之底部且位於長晶容器10之內壁與單晶塊12A之間,而第二外圍擋片12D鋪設於長晶容器10之底部且位於長晶容器10之內壁與第一外圍擋片12C之間。 Please refer to Figures 10 to 13. 10 to 13 illustrate a method of fabricating a single crystal ingot according to another embodiment of the present disclosure, wherein the 10th and 12th drawings are shown in the above view, and the 11th is along the 10th. A cross-sectional view taken along line 5-5, and a thirteenth view is a cross-sectional view taken along line 6-6 of Fig. 12. As shown in FIGS. 10 and 11, in addition to the foregoing embodiment, the spliced seed layer 12 of the present embodiment further includes a first peripheral dam 12C in addition to the single crystal block 12A and the single crystal blank 12B. The second peripheral flap 12D. The first peripheral flap 12C is laid at the bottom of the elongated container 10 and located between the inner wall of the elongated container 10 and the single crystal block 12A, and the second peripheral blank 12D is laid at the bottom of the elongated container 10 and located in the elongated crystal. The inner wall of the container 10 is between the first peripheral flap 12C.

第一外圍擋片12C可以是一環狀擋片(例如中空矩形環)環繞單晶塊12A與單晶擋片12B,或是由複數個直條狀擋片組成並環繞單晶塊12A與單晶擋片12B。在一些實施例中,第一外圍擋片12C為單晶結構,例如單晶矽,且第一外圍擋片12C的主要晶向與單晶塊12A的主要晶向相同(例如{100}晶向),但不以此為限。此外,第一外圍擋片12C的次要晶向與單晶塊12A的次要晶向係朝向不同方向,亦即第一外圍擋片12C的次要晶向與單晶塊12A的次要晶向具有一第二夾角,其中第二夾角較佳可介於1度至40度之間,例如第二夾角為20度,但不以此為限。 The first peripheral blocking piece 12C may be an annular blocking piece (for example, a hollow rectangular ring) surrounding the single crystal block 12A and the single crystal blocking piece 12B, or composed of a plurality of straight strip-shaped blocking pieces and surrounding the single crystal block 12A and the single The crystal piece 12B. In some embodiments, the first peripheral blank 12C is a single crystal structure, such as a single crystal germanium, and the main crystal orientation of the first peripheral blank 12C is the same as the main crystal orientation of the single crystal bulk 12A (for example, {100} crystal orientation ), but not limited to this. In addition, the secondary crystal orientation of the first peripheral blank 12C faces the secondary crystal orientation of the single crystal block 12A in a different direction, that is, the secondary crystal orientation of the first peripheral blank 12C and the secondary crystal of the single crystal block 12A. The direction has a second angle, wherein the second angle is preferably between 1 and 40 degrees, for example, the second angle is 20 degrees, but not limited thereto.

第二外圍擋片12D可以是一環狀擋片(例如中空矩形環)環繞第一外圍擋片12C,或是由複數個直條狀擋片組成並環繞第一外圍擋片12C。在一些實施例中,第二外圍擋片12D為單晶結構,例如單晶矽,其主要晶向與單晶塊12A的主要晶向相同(例如{100}晶向),但不以此為限。此外,第二外圍擋片12D的次要晶向與第一外圍擋片12C的次要晶向係朝向不同方向,亦即第二外圍擋片12D的次要晶向與第一外圍擋片12C的次要晶向具有一第三夾角,且第三夾角係為例如36.8度,但不以此為限。 The second peripheral flap 12D may be an annular flap (for example, a hollow rectangular ring) surrounding the first peripheral flap 12C or composed of a plurality of straight strips and surrounding the first peripheral flap 12C. In some embodiments, the second peripheral blank 12D is a single crystal structure, such as a single crystal germanium, whose main crystal orientation is the same as the main crystal orientation of the single crystal block 12A (for example, {100} crystal orientation), but is not limit. In addition, the secondary crystal orientation of the second peripheral flap 12D faces the secondary crystal orientation of the first peripheral flap 12C in a different direction, that is, the secondary crystal orientation of the second peripheral flap 12D and the first peripheral flap 12C. The secondary crystal orientation has a third angle, and the third angle is, for example, 36.8 degrees, but is not limited thereto.

如第12圖與第13圖所示,接著形成熔湯於拼接晶種層12上並利用定向凝固系統長晶爐進行方向性凝固製程冷卻熔湯,以使晶粒逐漸沿長晶方向V成長而形成類單晶晶錠16。 As shown in Fig. 12 and Fig. 13, the melt is then formed on the spliced seed layer 12 and the directional solidification process is used to carry out the directional solidification process to cool the melt so that the crystal grains gradually grow along the crystal growth direction V. A single crystal ingot 16 is formed.

在本實施例中,拼接晶種層12係由單晶塊12A與單晶擋片12B、第一外圍擋片12C與第二外圍擋片12D所拼接而成,其 中單晶塊12A與單晶擋片12B的配置及其在長晶過程中提供的功效與前述實施例相同,在此不再贅述。在本實施例中,第一外圍擋片12C與第二外圍擋片12D經配置用以抑制在長晶過程中由長晶容器10之內壁所導致的缺陷。進一步說明,第二外圍擋片12D係位於長晶容器10之內壁與第一外圍擋片12C之間,因此於長晶過程中由第二外圍擋片12D沿長晶方向V所成長出的晶錠會具有較多的缺陷。設置於第二外圍擋片12D與單晶塊12A之間的第一外圍擋片12C可以避免第二外圍擋片12D沿長晶方向V所成長出的晶錠內的缺陷向內側成長而影響單晶塊12A沿長晶方向V所成長出的晶錠,確保單晶塊12A沿長晶方向V所成長出的晶錠的品質。為了達到上述阻擋缺陷的作用,本實施例的第二外圍擋片12D的次要晶向與第一外圍擋片12C的次要晶向具有第三夾角,其中第三夾角可以根據第二外圍擋片12D的晶向與第一外圍擋片12C的次要晶向加以調整。舉例而言,當第二外圍擋片12D的主要晶向與第一外圍擋片12C的主要晶向為{100}晶向時,則第三夾角可選用36.8度,但不以此為限。 In this embodiment, the spliced seed layer 12 is formed by splicing the single crystal block 12A and the single crystal baffle 12B, the first outer baffle 12C and the second outer baffle 12D. The configuration of the medium single crystal block 12A and the single crystal blank 12B and the effects thereof provided in the crystal growth process are the same as those of the foregoing embodiment, and will not be described herein. In the present embodiment, the first peripheral flap 12C and the second peripheral flap 12D are configured to suppress defects caused by the inner wall of the crystal growth vessel 10 during the growth process. Further, the second peripheral blank 12D is located between the inner wall of the elongated container 10 and the first peripheral blank 12C, and thus is grown by the second peripheral blank 12D along the crystal growth direction V during the growth process. The ingot will have more defects. The first peripheral blocking piece 12C disposed between the second peripheral blocking piece 12D and the single crystal block 12A can prevent the defect in the ingot growing in the crystal growth direction V of the second peripheral blocking piece 12D from growing inwardly and affecting the single The ingot grown in the crystal growth direction V of the ingot 12A ensures the quality of the ingot grown in the crystal growth direction V of the single crystal block 12A. In order to achieve the above-mentioned blocking defect, the secondary crystal orientation of the second peripheral blank 12D of the present embodiment has a third angle with the secondary crystal orientation of the first peripheral blank 12C, wherein the third included angle can be according to the second peripheral The crystal orientation of the sheet 12D is adjusted to the secondary crystal orientation of the first peripheral flap 12C. For example, when the main crystal orientation of the second peripheral flap 12D and the main crystal orientation of the first peripheral flap 12C are {100} crystal orientation, the third angle may be selected to be 36.8 degrees, but not limited thereto.

本實施例之拼接晶種層12包括單晶塊12A與單晶擋片12B、第一外圍擋片12C與第二外圍擋片12D,其中單晶擋片12B係用以抑制相鄰的單晶塊12A所成長出的晶錠之間產生晶界與位錯而可減少長晶過程中缺陷的數量,而第一外圍擋片12C與第二外圍擋片12D則係用以阻擋在長晶過程中由長晶容器10之內壁所導致的缺陷向內延伸至單晶塊12A,藉此本實施例之方法可以製作出 具有品質良好的類單晶晶錠。 The spliced seed layer 12 of the present embodiment includes a single crystal block 12A and a single crystal baffle 12B, a first peripheral baffle 12C and a second peripheral baffle 12D, wherein the single crystal baffle 12B is used to suppress adjacent single crystals Grain boundaries and dislocations are generated between the ingots grown in block 12A to reduce the number of defects in the crystal growth process, and the first peripheral blank 12C and the second peripheral blank 12D are used to block the growth process. The defect caused by the inner wall of the crystal growth vessel 10 extends inwardly to the single crystal block 12A, whereby the method of the embodiment can be fabricated It has a good quality single crystal ingot.

請參考第14圖。第14圖例示本揭露之一變化實施例之晶種的鋪設方法。如第14圖所示,不同於第10圖至第13圖之實施例,本實施例之拼接晶種層12除了單晶塊12A與單晶擋片12B、第一外圍擋片12C與第二外圍擋片12D之外,更進一步包括一第三外圍擋片12E,鋪設於第一外圍擋片12C與第二外圍擋片12D之間。第三外圍擋片12E可以是一環狀擋片(例如中空矩形環),或是由複數個直條狀擋片組成。在一些實施例中,第三外圍擋片12E為單晶結構,例如單晶矽,其主要晶向與單晶塊12A的主要晶向相同(例如{100}晶向),但不以此為限。此外,第三外圍擋片12E的次要晶向與第一外圍擋片12C的次要晶向係朝向不同方向,亦即第三外圍擋片12E的次要晶向與第一外圍擋片12C的次要晶向具有一第四夾角,且第四夾角係為例如36.8度,但不以此為限。 Please refer to Figure 14. Fig. 14 is a view showing a method of laying seed crystals according to a variant embodiment of the present disclosure. As shown in FIG. 14, unlike the embodiment of FIGS. 10 to 13, the spliced seed layer 12 of the present embodiment is identical to the single crystal block 12A and the single crystal block 12B, the first peripheral cover 12C and the second. In addition to the peripheral flap 12D, a third peripheral flap 12E is further disposed between the first peripheral flap 12C and the second peripheral flap 12D. The third peripheral flap 12E may be an annular flap (for example, a hollow rectangular ring) or a plurality of straight strips. In some embodiments, the third peripheral blank 12E is a single crystal structure, such as a single crystal germanium, whose main crystal orientation is the same as the main crystal orientation of the single crystal block 12A (for example, {100} crystal orientation), but is not limit. In addition, the secondary crystal orientation of the third peripheral flap 12E faces the secondary crystal orientation of the first peripheral flap 12C in a different direction, that is, the secondary crystal orientation of the third peripheral flap 12E and the first peripheral flap 12C. The secondary crystal orientation has a fourth angle, and the fourth angle is, for example, 36.8 degrees, but is not limited thereto.

請參考第15圖。第15圖例示本揭露之又一實施例之晶種的鋪設方法。如第15圖所示,不同於前述實施例,本實施例長晶容器10為一圓柱槽體,且拼接晶種層12係為一圓形圖案。拼接晶種層12包括四塊扇形的單晶塊12A鋪設於圓形的長晶容器10之底部、四條長方形的單晶擋片12B分別夾設於兩相鄰的單晶塊12A之間、一圓環形的第一外圍擋片12C位於長晶容器10之內壁與單晶塊12A之間,以及一第二外圍擋片12D位於長晶容器10之內壁與第一外圍擋片12C之間。 Please refer to Figure 15. Fig. 15 is a view showing a method of laying a seed crystal according to still another embodiment of the present disclosure. As shown in Fig. 15, unlike the foregoing embodiment, the crystal growth vessel 10 of the present embodiment is a cylindrical tank body, and the spliced seed layer 12 is a circular pattern. The spliced seed layer 12 includes four fan-shaped single crystal blocks 12A laid at the bottom of the circular elongated crystal container 10, and four rectangular single crystal blanks 12B are respectively sandwiched between two adjacent single crystal blocks 12A, one The first annular outer peripheral flap 12C is located between the inner wall of the elongated crystal container 10 and the single crystal block 12A, and a second outer peripheral flap 12D is located at the inner wall of the elongated crystal container 10 and the first outer peripheral flap 12C. between.

單晶擋片12B的主要晶向與單晶塊12A的主要晶向 相同,例如單晶擋片12B與單晶塊12A兩者的主要晶向均為{100}晶向,且各單晶擋片12B的次要晶向與單晶塊12A的次要晶向分別具有一不為0度的夾角。在一些實施例中,各單晶擋片12B與單晶塊12A的次要晶向的夾角係介於1度至40度之間,且較佳介於10度至30度之間,但不以此為限。第一外圍擋片12C的主要晶向與單晶塊12A的主要晶向相同(例如{100}晶向),但不以此為限。此外,外圍擋片12C的次要晶向與單晶塊12A的次要晶向係朝向不同方向,亦即第一外圍擋片12C的次要晶向與單晶塊12A的次要晶向具有一第二夾角,且第二夾角係介於1度至40度之間,例如第二夾角為20度,但不以此為限。在一些實施例中,第二外圍擋片12D為單晶結構,例如單晶矽,其主要晶向與單晶塊12A的主要晶向相同(例如{100}晶向),但不以此為限。此外,第二外圍擋片12D的次要晶向與第一外圍擋片12C的次要晶向係朝向不同方向,亦即第二外圍擋片12D的次要晶向與第一外圍擋片12C的次要晶向具有一第三夾角,且第三夾角係為例如36.8度,但不以此為限。本實施例之拼接晶種層12可利用前述鑄錠方式製作出類單晶晶錠,其詳述製程如前述實施例所揭露,在此不再贅述。 The main crystal orientation of the single crystal blank 12B and the main crystal orientation of the single crystal block 12A Similarly, for example, the main crystal orientations of both the single crystal blank 12B and the single crystal bulk 12A are both {100} crystal orientation, and the secondary crystal orientation of each of the single crystal blanks 12B and the secondary crystal orientation of the single crystal bulk 12A are respectively different. It has an angle of not more than 0 degrees. In some embodiments, the angle between the minor crystal grains of the single crystal blank 12B and the single crystal block 12A is between 1 and 40 degrees, and preferably between 10 and 30 degrees, but not This is limited. The main crystal orientation of the first peripheral blank 12C is the same as the main crystal orientation of the single crystal block 12A (for example, {100} crystal orientation), but is not limited thereto. Further, the secondary crystal orientation of the peripheral blank 12C faces the secondary crystal orientation of the single crystal block 12A in a different direction, that is, the secondary crystal orientation of the first peripheral blank 12C and the secondary crystal orientation of the single crystal block 12A have a second angle, and the second angle is between 1 and 40 degrees, for example, the second angle is 20 degrees, but not limited thereto. In some embodiments, the second peripheral blank 12D is a single crystal structure, such as a single crystal germanium, whose main crystal orientation is the same as the main crystal orientation of the single crystal block 12A (for example, {100} crystal orientation), but is not limit. In addition, the secondary crystal orientation of the second peripheral flap 12D faces the secondary crystal orientation of the first peripheral flap 12C in a different direction, that is, the secondary crystal orientation of the second peripheral flap 12D and the first peripheral flap 12C. The secondary crystal orientation has a third angle, and the third angle is, for example, 36.8 degrees, but is not limited thereto. The spliced seed layer 12 of the present embodiment can be used to produce a single crystal-like ingot by the foregoing ingot casting method. The detailed process is disclosed in the foregoing embodiment, and details are not described herein again.

請參閱第16圖。第16圖為本揭露之實施例與對照例分別製作出之類單晶矽晶錠之缺陷面積比與晶錠高度之關係圖,其中樣本2、3為本揭露之實施例製作出之類單晶矽晶錠,其係使用包含單晶塊與單晶擋片作為拼接晶種層;樣本1為對照例製作出之類單晶矽晶錠,其未使用包含單晶塊與單晶擋片作為拼接晶種 層。請一併參考表1、表2與表3。表1列示了一對照例(樣本1)之方法製作出之類單晶矽晶錠之缺陷面積分布的量測結果,而表2及表3列示了本揭露之兩實施例(樣本2及樣本3)之方法製作出之類單晶矽晶錠之缺陷面積分布的量測結果。 Please refer to Figure 16. Figure 16 is a graph showing the relationship between the defect area ratio and the height of the ingot of the single crystal twin ingot prepared by the embodiment of the present disclosure and the comparative example, wherein the samples 2 and 3 are made in the embodiment of the disclosure. A crystal ingot comprising a single crystal block and a single crystal blank as a spliced seed layer; Sample 1 is a comparative example to produce a single crystal twin ingot, which does not contain a single crystal block and a single crystal blank. As a splicing seed Floor. Please refer to Table 1, Table 2 and Table 3 together. Table 1 shows the measurement results of the defect area distribution of a single crystal twin ingot produced by the method of a comparative example (Sample 1), and Table 2 and Table 3 show two examples of the present disclosure (Sample 2) And the method of sample 3) produces a measurement result of the defect area distribution of a single crystal twin ingot.

如表1所示,對照例(樣本1)之類單晶矽晶錠在高度為38mm、84.9mm、125.6mm與250mm的位置的缺陷面積比分別為0.567%、2.40%、7.98%與24.6%,也就是說,以高度為38mm的位置為基準,在高度為84.9mm時,類單晶矽晶錠的缺陷面積比成長了4.23倍,在高度為125.6mm的位置,類單晶矽晶錠的缺陷面積比成長了14.07倍,在高度為250mm的位置,類單晶矽晶錠的缺陷面積比成長了43.39倍。因此,對照例之方法製作出之類單晶矽晶錠在長晶方向上的缺陷面積比明顯地以倍數成長。 As shown in Table 1, the defect area ratios of the single crystal twin ingots such as the comparative example (sample 1) at positions of 38 mm, 84.9 mm, 125.6 mm, and 250 mm were 0.567%, 2.40%, 7.98%, and 24.6%, respectively. That is to say, at a height of 84.9 mm, the defect area ratio of the single crystal twin ingot is 4.23 times higher than that at the height of 38 mm, and the single crystal twin ingot is at a height of 125.6 mm. The defect area ratio was increased by 14.07 times, and at a height of 250 mm, the defect area ratio of the single crystal twin ingot was increased by 43.39 times. Therefore, the defect area ratio of the single crystal twin ingot produced in the method of the comparative example was significantly increased in multiples in the crystal growth direction.

表3 table 3

如表2所示,本實施例之樣本2的類單晶矽晶錠在高度為38mm、84.9mm與125.6mm的位置的缺陷面積比分別為0.141%、0.409%與1.206%,也就是說,以高度為38mm的位置為基準,在高度為84.9mm時,類單晶矽晶錠的缺陷面積比僅成長了2.90倍,而在高度為125.6mm的位置,類單晶矽晶錠的缺陷面積比僅成長了8.55倍。如表3所示,本實施例之樣本3的類單晶矽晶錠在高度為50.4mm、87.9mm、125.4mm、162.9mm、200.4mm與240.5mm的位置的缺陷面積比分別為0.149%、0.398%、0.241%、0.324%、0.455%與1.385%,也就是說,以高度為50.4mm的位置為基準,在高度為87.9mm時,類單晶矽晶錠的缺陷面積比僅成長了2.67倍,在高度為125.4mm的位置,類單晶矽晶錠的缺陷面積比僅成長了1.61倍,在高度為162.9mm的位置,類單晶矽晶錠的缺陷面積比僅成長了2.17倍,在高度為200.4mm的位置,類單晶矽晶錠的缺陷面積比僅成長了3.05倍,在高度為240.5mm的位置,類單晶矽晶錠的 缺陷面積比成長了9.29倍。因此,相較於對照例(樣本1),本實施例(樣本2及樣本3)之方法製作出之類單晶矽晶錠在長晶方向上的缺陷面積成長明顯較慢,顯示了單晶塊、單晶擋片與外圍擋片確實可有效抑制缺陷面積的成長。 As shown in Table 2, the defect area ratio of the single crystal twin ingot of the sample 2 of the present embodiment at positions of 38 mm, 84.9 mm, and 125.6 mm in height was 0.141%, 0.409%, and 1.206%, respectively, that is, Based on the position of 38 mm in height, the defect area ratio of the single crystal twin ingot grows only 2.90 times at a height of 84.9 mm, and the defect area of the single crystal twin ingot at a height of 125.6 mm. It grew by 8.55 times. As shown in Table 3, the defect area ratio of the single crystal twin ingot of the sample 3 of the present embodiment at positions of heights of 50.4 mm, 87.9 mm, 125.4 mm, 162.9 mm, 200.4 mm, and 240.5 mm, respectively, was 0.149%. 0.398%, 0.241%, 0.324%, 0.455%, and 1.385%, that is, the defect area ratio of the single crystal twin ingot grew by only 2.67 at a height of 87.9 mm. At a height of 125.4 mm, the defect area ratio of the single crystal twin ingot is only 1.61 times, and at a height of 162.9 mm, the defect area ratio of the single crystal twin ingot is only 2.17 times. At a height of 200.4 mm, the defect-area ratio of the single crystal-like germanium ingot is only 3.05 times higher, and at a height of 240.5 mm, the single crystal twin ingot is ingot. The defect area ratio grew by 9.29 times. Therefore, compared with the comparative example (sample 1), the method of the present example (sample 2 and sample 3) produced a single crystal twin ingot, and the defect area growth in the crystal growth direction was significantly slower, showing a single crystal. Blocks, single crystal blanks and peripheral blanks can effectively suppress the growth of defective areas.

本揭露之方法利用拼接晶種層製作類單晶晶錠,其中拼接晶種層包括單晶塊與單晶擋片,且單晶擋片的主要晶向與單晶塊的主要晶向相同但各單晶擋片的次要晶向與單晶塊的次要晶向分別具有一不為0度的夾角,藉此可抑制相鄰的單晶塊所成長出的晶錠之間產生晶界與位錯,進而大幅減少缺陷面積比。另外,拼接晶種層可進一步包括外圍擋片,用以阻擋在長晶過程中由長晶容器之內壁所導致的缺陷向內延伸。 The method of the present disclosure utilizes a spliced seed layer to produce a single crystal ingot, wherein the spliced seed layer comprises a single crystal block and a single crystal baffle, and the main crystal orientation of the single crystal baffle is the same as the main crystal orientation of the single crystal block but The minor crystal orientation of each of the single crystal blanks and the secondary crystal orientation of the single crystal block respectively have an angle of not more than 0 degrees, thereby suppressing generation of grain boundaries between the ingots grown by the adjacent single crystal blocks And dislocations, which in turn significantly reduce the defect area ratio. Additionally, the spliced seed layer may further include a peripheral baffle to block inwardly extending defects caused by the inner wall of the crystal growth vessel during the growth process.

綜上所述,本實施例之方法製作出的類單晶晶錠同時具有單晶晶錠的低缺陷優勢以及多晶晶錠的低製作成本優勢。此外,相較於多晶晶錠,本實施例之方法製作出的類單晶晶錠可利用鑽石切割線進行切割以及可利用鹼性溶液進行溼蝕刻以形成粗糙化表面的特點,更可進一步降低成本。再者,本實施例之方法製作出的類單晶晶錠的晶粒具有預定的排列規則,藉此所製作出的類單晶晶片在經過鹼性溶液蝕刻後可顯示出預定的花紋或文字,而可增加太陽能電池的應用範圍。 In summary, the single crystal ingot produced by the method of the present embodiment has both the low defect advantage of the single crystal ingot and the low manufacturing cost advantage of the polycrystalline ingot. In addition, compared with the polycrystalline ingot, the single crystal ingot prepared by the method of the present embodiment can be cut by using a diamond cutting line and wet etching by using an alkaline solution to form a roughened surface, and further can be further cut costs. Furthermore, the crystal grains of the single-crystal-like crystal ingot produced by the method of the present embodiment have a predetermined arrangement rule, whereby the prepared single crystal-like wafer can exhibit a predetermined pattern or text after being etched by the alkaline solution. , can increase the range of applications of solar cells.

10‧‧‧長晶容器 10‧‧‧Long crystal container

12‧‧‧拼接晶種層 12‧‧‧Splicing seed layer

12A‧‧‧單晶塊 12A‧‧‧ single crystal block

12B‧‧‧單晶擋片 12B‧‧‧Single crystal blank

12C‧‧‧第一外圍擋片 12C‧‧‧First peripheral blank

12D‧‧‧第二外圍擋片 12D‧‧‧Second peripheral blank

Claims (24)

一種晶種的鋪設方法,包括:鋪設一拼接晶種層於一長晶容器之底部,其中該拼接晶種層包括複數個單晶塊以及複數個單晶擋片,該等單晶塊經配置而位於該長晶容器之底部且彼此不接觸,該等單晶擋片係分別夾設於相鄰之該等單晶塊之間的間隙並分別與相鄰之至少一該等單晶塊接觸,該單晶擋片之寬度小於該單晶塊之寬度,該等單晶塊的晶向相同且朝向同一方向,該等單晶擋片的主要晶向與該等單晶塊的主要晶向相同,且各該單晶擋片的次要晶向與該等單晶塊的次要晶向分別具有一不為0度的夾角。 A method for laying a seed crystal, comprising: laying a spliced seed layer on a bottom of a long crystal container, wherein the spliced seed layer comprises a plurality of single crystal blocks and a plurality of single crystal blocks, the single crystal blocks being configured Located at the bottom of the crystal growth vessel and not in contact with each other, the single crystal blanks are respectively sandwiched between the adjacent spaces of the single crystal blocks and respectively contacted with at least one of the adjacent single crystal blocks. The width of the single crystal block is smaller than the width of the single crystal block, and the crystal directions of the single crystal blocks are the same and face the same direction, and the main crystal orientation of the single crystal blocks and the main crystal orientation of the single crystal blocks The same, and the minor crystal orientation of each of the single crystal blanks and the secondary crystal orientation of the single crystal blocks respectively have an angle of not more than 0 degrees. 根據申請專利範圍第1項所述之鋪設方法,其中各該單晶擋片的次要晶向與該等單晶塊的次要晶向的夾角係介於1度至40度之間。 The laying method according to claim 1, wherein an angle between a minor crystal orientation of each of the single crystal blanks and a minor crystal orientation of the single crystal blocks is between 1 and 40 degrees. 根據申請專利範圍第1項所述之鋪設方法,其中該等單晶塊與該等單晶擋片的主要晶向為{100}。 The laying method according to claim 1, wherein the main crystal orientation of the single crystal block and the single crystal blank is {100}. 根據申請專利範圍第1項所述之鋪設方法,其中該等單晶塊與該等單晶擋片的材料包括矽。 The laying method according to claim 1, wherein the material of the single crystal block and the single crystal blank comprises ruthenium. 根據申請專利範圍第1項所述之鋪設方法,其中該單晶擋片之寬度與該單晶塊之寬度的比值係介於0.32%與2.82%之間。 The laying method according to claim 1, wherein a ratio of a width of the single crystal block to a width of the single crystal block is between 0.32% and 2.82%. 根據申請專利範圍第1項所述之鋪設方法,其中該單晶擋片之寬度係介於0.5mm與4mm之間。 The laying method according to claim 1, wherein the single crystal blank has a width of between 0.5 mm and 4 mm. 根據申請專利範圍第1項所述之鋪設方法,其中該單晶擋片之 面積與該長晶容器之底部面積的比值係介於2%與20%之間。 The laying method according to the first aspect of the patent application, wherein the single crystal blank The ratio of the area to the bottom area of the crystal growth vessel is between 2% and 20%. 根據申請專利範圍第1項所述之鋪設方法,其中兩相鄰之該等單晶塊之間的間隙內鋪設有兩個或以上的該等單晶擋片。 The laying method according to claim 1, wherein two or more of the single crystal blanks are laid in a gap between two adjacent ones of the single crystal blocks. 根據申請專利範圍第1項所述之鋪設方法,其中該拼接晶種層另包括:一第一外圍擋片鋪設於該長晶容器之底部且位於該長晶容器之內壁與該等單晶塊之間;以及一第二外圍擋片鋪設於該長晶容器之底部且位於該長晶容器之內壁與該第一外圍擋片之間。 According to the laying method of claim 1, wherein the splicing seed layer further comprises: a first peripheral baffle laid on the bottom of the crystal growth vessel and located on the inner wall of the crystal growth vessel and the single crystal Between the blocks; and a second peripheral flap disposed at the bottom of the elongated container and between the inner wall of the elongated container and the first peripheral flap. 根據申請專利範圍第9項所述之鋪設方法,其中該第一外圍擋片為單晶結構,其主要晶向與該等單晶塊的主要晶向相同,該第一外圍擋片的次要晶向與該等單晶塊的次要晶向具有一第二夾角,且該第二夾角係介於1度至40度之間。 The laying method according to claim 9, wherein the first peripheral baffle is a single crystal structure, the main crystal orientation of which is the same as the main crystal orientation of the single crystal blocks, and the second peripheral baffle is secondary The crystal orientation has a second angle with the minor crystal orientation of the single crystal blocks, and the second angle is between 1 and 40 degrees. 根據申請專利範圍第9項所述之鋪設方法,其中該第二外圍擋片為單晶結構,其主要晶向與該等單晶塊的主要晶向相同,該第二外圍擋片的次要晶向與該第一外圍擋片的次要晶向具有一第三夾角,且該第三夾角係為36.8度。 The laying method according to claim 9, wherein the second peripheral baffle is a single crystal structure whose main crystal orientation is the same as the main crystal orientation of the single crystal blocks, and the second peripheral baffle is secondary. The crystal orientation has a third angle with the minor crystal orientation of the first peripheral flap, and the third angle is 36.8 degrees. 根據申請專利範圍第9項所述之鋪設方法,其中該拼接晶種層另包括一第三外圍擋片,設置於該第一外圍擋片與該第二外圍擋片之間,該第三外圍擋片為單晶結構,其主要晶向與該等單晶塊的主要晶向相同,該第三外圍擋片的次要晶向與該第一外圍擋片的次要晶向具有一第四夾角,且該第四夾角係為36.8度。 The splicing seed layer further includes a third peripheral lining disposed between the first peripheral lining and the second peripheral lining, the third periphery The baffle is a single crystal structure, the main crystal orientation of which is the same as the main crystal orientation of the single crystal blocks, and the minor crystal orientation of the third peripheral baffle has a fourth with the secondary crystal orientation of the first peripheral baffle The angle is included, and the fourth angle is 36.8 degrees. 一種類單晶(monocrystalline-like)晶錠之製作方法,包括:鋪設一拼接晶種層於一長晶容器之底部,其中該拼接晶種層包括複數個單晶塊以及複數個單晶擋片,該等單晶塊經配置而位於該長晶容器之底部且彼此不接觸,該等單晶擋片係分別夾設於相鄰之該等單晶塊之間的間隙並分別與相鄰之該等單晶塊接觸,該單晶擋片之寬度小於該單晶塊之寬度,該等單晶塊的晶向相同且朝向同一方向,該等單晶擋片的主要晶向與該等單晶塊的主要晶向相同,且各該單晶擋片的次要晶向與該等單晶塊的次要晶向分別具有一不為0度的夾角;形成一熔湯於該拼接晶種層上;以及冷卻該熔湯以使晶粒由該拼接晶種層上成長以形成一類單晶晶錠。 A method for fabricating a monocrystalline-like ingot comprises: laying a spliced seed layer on a bottom of a long crystal container, wherein the spliced seed layer comprises a plurality of single crystal blocks and a plurality of single crystal blanks The single crystal blocks are disposed at the bottom of the crystal growth vessel and are not in contact with each other. The single crystal blanks are respectively sandwiched between the adjacent spaces of the single crystal blocks and respectively adjacent to each other. The single crystal block contacts, the width of the single crystal block is smaller than the width of the single crystal block, the crystal directions of the single crystal blocks are the same and face the same direction, the main crystal orientation of the single crystal blocks and the single The main crystal orientations of the ingots are the same, and the minor crystal orientations of the single crystal blanks and the minor crystal orientations of the single crystal blocks respectively have an angle of not more than 0 degrees; forming a molten soup in the splice seed crystal And cooling the melt to grow crystal grains from the spliced seed layer to form a type of single crystal ingot. 根據申請專利範圍第13項所述之製作方法,其中各該單晶擋片的次要晶向與該等單晶塊的次要晶向的夾角係介於1度至40度之間。 The manufacturing method according to claim 13, wherein an angle between a minor crystal orientation of each of the single crystal blanks and a minor crystal orientation of the single crystal blocks is between 1 and 40 degrees. 根據申請專利範圍第13項所述之製作方法,其中該等單晶塊與該等單晶擋片的主要晶向為{100}。 The manufacturing method according to claim 13, wherein the main crystal orientation of the single crystal block and the single crystal blank is {100}. 根據申請專利範圍第13項所述之製作方法,其中該等單晶塊與該等單晶擋片的材料包括矽。 The manufacturing method according to claim 13, wherein the material of the single crystal block and the single crystal blank includes ruthenium. 根據申請專利範圍第13項所述之製作方法,其中該單晶擋片之寬度與該單晶塊之寬度的比值係介於0.32%與2.82%之間。 The manufacturing method according to claim 13, wherein a ratio of a width of the single crystal blank to a width of the single crystal block is between 0.32% and 2.82%. 根據申請專利範圍第13項所述之製作方法,其中該單晶擋片之寬度係介於0.5mm與4mm之間。 The manufacturing method according to claim 13, wherein the single crystal blank has a width of between 0.5 mm and 4 mm. 根據申請專利範圍第13項所述之製作方法,其中該單晶擋片之面積與該長晶容器之底部面積的比值係介於2%與20%之間。 The manufacturing method according to claim 13, wherein a ratio of an area of the single crystal baffle to a bottom area of the crystal growth vessel is between 2% and 20%. 根據申請專利範圍第13項所述之製作方法,其中兩相鄰之該等單晶塊之間的間隙內鋪設有兩個或以上的該等單晶擋片。 The manufacturing method according to claim 13, wherein two or more of the single crystal blanks are laid in a gap between two adjacent ones of the single crystal blocks. 根據申請專利範圍第13項所述之製作方法,其中該拼接晶種層另包括:一第一外圍擋片鋪設於該長晶容器之底部且位於該長晶容器之內壁與該等單晶塊之間;以及一第二外圍擋片鋪設於該長晶容器之底部且位於該長晶容器之內壁與該第一外圍擋片之間。 According to the manufacturing method of claim 13, wherein the splicing seed layer further comprises: a first outer lining is laid on the bottom of the crystal growth vessel and located on the inner wall of the crystal growth vessel and the single crystal Between the blocks; and a second peripheral flap disposed at the bottom of the elongated container and between the inner wall of the elongated container and the first peripheral flap. 根據申請專利範圍第21項所述之製作方法,其中該第一外圍擋片為單晶結構,其主要晶向與該等單晶塊的主要晶向相同,該第一外圍擋片的次要晶向與該等單晶塊的次要晶向具有一第二夾角,且該第二夾角係介於1度至40度之間。 The manufacturing method according to claim 21, wherein the first peripheral baffle is a single crystal structure whose main crystal orientation is the same as the main crystal orientation of the single crystal blocks, and the first peripheral baffle is secondary. The crystal orientation has a second angle with the minor crystal orientation of the single crystal blocks, and the second angle is between 1 and 40 degrees. 根據申請專利範圍第21項所述之製作方法,其中該第二外圍擋片為單晶結構,其主要晶向與該等單晶塊的主要晶向相同,該第二外圍擋片的次要晶向與該第一外圍擋片的次要晶向具有一第三夾角,且該第三夾角係為36.8度。 The manufacturing method according to claim 21, wherein the second peripheral baffle is a single crystal structure whose main crystal orientation is the same as the main crystal orientation of the single crystal blocks, and the second peripheral baffle is secondary. The crystal orientation has a third angle with the minor crystal orientation of the first peripheral flap, and the third angle is 36.8 degrees. 根據申請專利範圍第21項所述之製作方法,其中該拼接晶種層另包括一第三外圍擋片,設置於該第一外圍擋片與該第二外圍擋片之間,該第三外圍擋片為單晶結構,其主要晶向與該等單晶塊的主要晶向相同,該第三外圍擋片的次要晶向與 該第一外圍擋片的次要晶向具有一第四夾角,且該第四夾角係為36.8度。 The manufacturing method of claim 21, wherein the splicing seed layer further comprises a third outer lining disposed between the first outer lining and the second outer lining, the third outer periphery The baffle is a single crystal structure, the main crystal orientation of which is the same as the main crystal orientation of the single crystal blocks, and the secondary crystal orientation of the third peripheral baffle The minor orientation of the first peripheral flap has a fourth angle, and the fourth angle is 36.8 degrees.
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