TWI591809B - 光感測裝置及其應用 - Google Patents

光感測裝置及其應用 Download PDF

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TWI591809B
TWI591809B TW104125266A TW104125266A TWI591809B TW I591809 B TWI591809 B TW I591809B TW 104125266 A TW104125266 A TW 104125266A TW 104125266 A TW104125266 A TW 104125266A TW I591809 B TWI591809 B TW I591809B
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light
sensing device
light sensing
nanochannel
transistor
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楊裕雄
陳建宏
林志衡
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國立交通大學
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Priority to CN201510553484.7A priority patent/CN106449860B/zh
Priority to US14/958,917 priority patent/US10381495B2/en
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Priority to US16/450,992 priority patent/US10770600B2/en

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    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/112Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor
    • H01L31/1127Devices with PN heterojunction gate
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    • H01L31/02Details
    • H01L31/0232Optical elements or arrangements associated with the device
    • H01L31/02327Optical elements or arrangements associated with the device the optical elements being integrated or being directly associated to the device, e.g. back reflectors
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    • H01L31/03685Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including polycrystalline semiconductors including only elements of Group IV of the Periodic Table including microcrystalline silicon, uc-Si

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Description

光感測裝置及其應用
本發明是有關於一種光感測裝置及其應用,特別是有關於一種光感測裝置及利用其進行光感測的方法。
光感測器(Photosensor/Photodetector)為現今電子產品最常用到元件之一,例如:數位相機、光感應器及光計數器等。光感測器是利用光敏元件將光訊號轉換為電訊號的感測器,而光敏元件目前常見的有感光二極體(Photodiode)、光導體(Photoconductor)及接面光二極體(Junction photodiode)等。光導體主要為一個半導體材料,在材料兩端具有歐姆接觸,當入射光照到半導體表面時,會產生電子電洞對,導致傳導係數的增加,而光電流(Iph)也隨之著增加。感光二極體係由光子照射到二極體空乏區,其產生之電子電洞對受到兩端電位的相反,使電子電洞分離並移動,因而形成光電流的現象,在外部整合電流放大器即可準確量測光電流,並可推估出電流大小和吸收的光子數目。接面光二極體主要設計目的是用於光通訊上,並利用不同材料如磷化銦(InP)及砷化銦鎵(InGaAs)的能隙差 異,將光能量所產生的電子電洞對分離,並讓電子往n+端移動成光電流。
然而,光感測器的特性往往受製造過程中使用之材料所限制,故常需選用不同的光感測器以進行光感測。在實際應用上,大多應用需要使用不同的光感測器進行實驗。舉例而言,利用光感測器進行生物的螢光反應實驗時,會同時需要高靈敏度的光感測器與寬光波段的光感測器進行實驗。然而,高靈敏度的光感測器運用於正常光源的觀測下很容易訊號飽和,而運用一般靈敏度的光感測器觀測微弱的螢光反應時,往往都需要將光感測器的曝光時間或積分時間加高,才可擷取到所需要的資訊,但也有很多的實驗結果是因為過度調整曝光時間或積分時間,而造成量測到的都是雜訊資料。以現階段的技術而言,大部份皆透過外部光學的設計或是加裝其他配件如光電倍增管(photomultiplier tube)來達到效果,此系列設備往往需要較大的實驗空間與環境,故在實驗的實施上有一定的限制。
因此,目前需要發展一種光感測裝置,其可調整本身不同的參數,以提升光感測裝置之靈敏度,進而達到多方面的應用領域。
本發明之一態樣係提供一種光感測裝置,包含電晶體、矽奈米通道以及濾光染料層。電晶體包含源極、汲極及閘極。矽奈米通道連接源極與汲極設置用於接收光照。 濾光染料層位於矽奈米通道接收光照的表面上。
在本發明之一實施方式中,電晶體為背閘極式電晶體、側閘極式電晶體或液體閘極電晶體。
在本發明之一實施方式中,矽奈米通道之材料為多晶矽。
在本發明之一實施方式中,矽奈米通道之寬度約為50~100nm。
在本發明之一實施方式中,矽奈米通道之厚度約為1~100nm。
在本發明之一實施方式中,光感測裝置更包含隔離層,位於閘極與矽奈米通道之間。
本發明之另一態樣係提供一種利用前述之光感測裝置進行光感測的方法,包含以光線照射光感測裝置之濾光染料層,藉由透過濾光染料層之波長範圍的光使矽奈米通道中之電子及電洞位置重新排列。電子及該電洞之位置重新排列改變源極與汲極之間的電流,以產生電流差。藉由電流差計算光線之強度。
在本發明之一實施方式中,方法更包含將樣品與受體反應以產生光線。
在本發明之一實施方式中,更包含將受體修飾於濾光染料層上。
在本發明之一實施方式中,方法更包含於光線照射光感測裝置之濾光染料層前,對閘極施加電壓以使矽奈 米通道中之電子及電洞位置重新排列,以於源極與汲極之間形成穩定電流。
本發明之光感測裝置以及利用其進行光感測的方法係利用矽奈米通道接收光照,進而改變電晶體的電流,將光訊號轉換為電訊號,並藉由電訊號計算光照之強度,藉此感測光。
100、400、500‧‧‧光感測裝置
110、410、510‧‧‧電晶體
112、412、512‧‧‧源極
114、414、514‧‧‧汲極
116、416、516‧‧‧閘極
120、420‧‧‧矽奈米通道
130、430、530‧‧‧濾光染料層
140、440、540‧‧‧隔離層
150‧‧‧電子電洞對
152‧‧‧電洞
154‧‧‧電子
200‧‧‧光線
300‧‧‧量測系統
402、502‧‧‧基板
450‧‧‧溶液
520‧‧‧矽奈米線通道
為使本發明之特徵、優點與實施例能更明顯易懂,所附圖式之說明如下:第1圖係繪示本發明一實施方式之光感測裝置的剖視圖;第2圖係繪示本發明一實施方式之光感測裝置以量測系統進行量測的示意圖;第3A~3B圖係繪示本發明一實施方式之光感測裝置之矽奈米通道接收光照前後之電子及電洞位置的排列示意圖;第4A~4B圖係繪示本發明一實施方式之光感測裝置之矽奈米通道接收光照前後之電子及電洞位置的排列示意圖;第5圖係繪示本發明一實施方式之光感測裝置的剖視圖;第6A~6B圖係分別繪示本發明一實施方式之光感測裝置的側視圖及上視圖;第7圖係繪示本發明實施例之光感測裝置的電流-電壓關係圖;以及 第8圖係繪示本發明實施例之光感測裝置以不同光能量照射的電流-時間關係圖。
為了使本揭示內容的敘述更加詳盡與完備,下文將參照附隨圖式來描述本發明之實施態樣與具體實施例;但這並非實施或運用本發明具體實施例的唯一形式。以下所揭露的各實施例,在有益的情形下可相互組合或取代,也可在一實施例中附加其他的實施例,而無須進一步的記載或說明。在以下描述中,將詳細敘述許多特定細節以使讀者能夠充分理解以下的實施例。然而,可在無此等特定細節之情況下實踐本發明之實施例。
請參照第1圖,其係繪示本發明一實施方式之光感測裝置100的剖視圖。光感測裝置100包含電晶體110、矽奈米通道120、濾光染料層130以及隔離層140。電晶體110包含源極112、汲極114及閘極116。矽奈米通道120連接源極112與汲極114,其係設置用於接收光照。濾光染料層130位於矽奈米通道120接收光照的表面上。隔離層140位於閘極116與矽奈米通道120之間。
第1圖所繪示之閘極116係位於源極112與汲極114之背面,亦即電晶體110為背閘極式(back-gated)電晶體。根據一實施方式,電晶體110為場效電晶體(field-effect transistor,FET)。
根據一實施方式,矽奈米通道120之材料為多 晶矽。多晶矽(polycrystalline silicon)係由細小的單晶矽構成的材料,可用於半導體、平面顯示器或太陽能電池的製造,利於大量製程與發展。矽奈米通道120可為矽奈米線(nanowire)通道、矽奈米薄膜(nanofilm)通道或矽奈米帶(nanobelt)通道。
當矽奈米通道120為矽奈米線時,其寬度約為50~100nm,例如可為50、55、60、65、70、75、80、85、90、95或100nm。
在本發明之一實施方式中,矽奈米通道120之厚度約為1~100nm,例如可為1、5、10、15、20、25、30、35、40、45、50、55、60、65、70、75、80、85、90、95或100nm。
濾光染料層130係使特定波長範圍之光線通過,其目的在於將光線聚集至矽奈米通道120,可進一歩提升光感測裝置100的靈敏度。矽奈米通道120接收特定波長範圍之光後,其內之電子及電洞位置重新排列,進而改變源極112與汲極114之間的電流大小。根據一實施方式,濾光染料層130之材料為二氧化矽和五氧化二鉭(SiO2+Ta2O5)。
本發明之光感測裝置係可調整參數式光感測裝置,其可透過矽奈米通道接收光照及/或於電晶體之閘極施加電壓,調控電晶體之矽奈米通道兩端的源極與汲極之間的電流大小。藉由光線照射前後之電流差,即可獲得矽奈米通道所接收之光照強度,且透過「光能量」的調控可以提供一 個「非接觸」式的調控機制,更可以增加未來的應用領域。本發明之光感測裝置可應用於偵測低光強度之應用領域上,例如生物螢光、冷光實驗、夜視系統等。未來再透過半導體製程可進行大量的製作,並直接整合現行的半導體IC設計。
請參照第2圖,其係繪示本發明一實施方式之光感測裝置100以量測系統300進行量測的示意圖。當光線200照射在光感測裝置100上時,光感測裝置100藉由矽奈米通道及電晶體,將光訊號轉換為電訊號。此時透過量測系統300對電訊號進行參數量測,經計算即可獲得光感測裝置100所接收之光照強度。
光線200之來源可為生物螢光、冷光、自體發光源等。生物螢光可利用生物系統配對原理,例如:抗原(antigen)-抗體(antibody)、生物素(biotin)-卵白素(avidin)、受質(substrate)-受器(receptor)或酵素(enzyme),經由兩者反應後所產生。舉例而言,生物素-卵白素為常見之生物分子配對系統,利用生物素可偵測樣品中卵白素的含量,其中生物素可選擇性地經修飾而固定在濾光染料層上。前述之原理亦可應用於類似的組合,使本發明之光感測裝置可作為多種類之高靈敏度的生物分子感測元件,相似的組合例如:抗原-抗體、蛋白質-受質(例如:生長激素、神經傳導物質等)及蛋白質-細胞(例如:癌細胞、病毒等),其能運用至各種臨床醫學上的診斷步驟。
量測系統300係用以量測並分析電晶體所產生之電訊號,其可為示波器(oscilloscope)、頻譜分析儀(spectrum analyzer)等用於尋找電性分析儀器。
請參照第3A~3B圖,其係分別繪示本發明一實施方式之光感測裝置100之矽奈米通道120接收光照前後的電子及電洞位置的排列示意圖,其中圖中僅繪示出光感測裝置100之矽奈米通道120及濾光染料層130。請參照第3A圖,當光線尚未照射前,矽奈米通道120呈電中性狀態,其內之電子與電洞配對成電子電洞對150,並水平排列。請參照第3B圖,當光線200照射到濾光染料層130並透過特定波長範圍的光時,此時矽奈米通道120內的電子電洞對150開始產生變化,電子154向光線200照射之表面移動,而電洞152則往相反方向移動。電子154及電洞152位置重新排列使得電晶體的電流狀況開始改變,藉此感測所照射之光線200的強度。第3A~3B圖顯示出本發明之光感測裝置利用矽奈米通道感光的一種機制。
電子154向光線200照射之表面移動的原因在於能階。由於能階的關係,電子154較電洞152容易吸收光線200的能量而被激發。
本發明中矽奈米通道是建製在電晶體之架構下,因此可以透過電晶體的原理進行矽奈米通道電性改變,為另一種利用矽奈米通道感光的機制。請參照第4A~4B圖,其係分別繪示本發明另一實施方式之光感測裝置100之矽奈米通道120接收光照前後的電子及電洞位置的排列示意圖,其 中圖中僅繪示出光感測裝置100之矽奈米通道120及濾光染料層130。請參照第4A圖,當電晶體給與一個閘極電壓(n-type,正閘極電壓)時,影響矽奈米通道120內的電子電洞對150,使其轉方向並排列於靠近閘極之表面,讓電流可以流過,此時電流為穩定狀態。請參照第4B圖,如此時再受到光線200的照射,矽奈米通道120將會依閘極電壓的影響使電子電洞對150的排列有所差異。部分電子154向光線200照射之表面移動,部分電洞152則往相反方向移動,而部分仍維持配對型態(即電子電洞對150)。電子154及電洞152位置重新排列使得電晶體的電流狀況改變,藉此感測所照射之光線200的強度。因此,本發明之光感測裝置中矽奈米通道接收光照所產生的特性變化亦可透過電晶體原理方式進行調控,靈敏度佳,增加光感測裝置的應用性與變化性。
光感測裝置的應用相當的廣泛,小從手機用的相機,大到遙測衛星用影像感測器,開發新型的光感測裝置與提高光靈敏度、穩定度等參數一直是產業界重點發展方向。本發明利用矽奈米通道的高靈敏度的特性,使光能量改變矽奈米通道內電子及電洞的特性,藉此感測光線,為一種新型的光感測裝置。有別其它裝置,本發明之光感測裝置係將矽奈米通道架設與建立在電晶體的設計上,此架構可讓本發明之光感測裝置不只可受光線照射而改變元件特性,亦可透過電晶體的原理藉由閘極電壓控制元件特性。更進一步而言,本發明之光感測裝置可以使用光感測與電晶體的原理同時調控元件特性,藉此可以進行靈敏度或其它參數調整與其它延伸應用。
請參照第5圖,其係繪示本發明一實施方式之光感測裝置400的剖視圖。光感測裝置400包含基板402、電晶體410、矽奈米通道420、濾光染料層430、隔離層440以及溶液450。電晶體410包含源極412、汲極414及閘極416。矽奈米通道420連接源極412與汲極414,其係設置用於接收光照。濾光染料層430位於矽奈米通道420接收光照的表面上。隔離層440位於閘極416與矽奈米通道420之間。溶液450覆蓋源極412、汲極414及濾光染料層430,並包覆閘極416。
第5圖所繪示之閘極416係包覆於溶液450內,亦即電晶體410為液體閘極(liquid-gated)電晶體。在此實施方式中,閘極416可為針狀,插入溶液450中。根據一實施方式,溶液450為離子性溶液,例如可為N,N-二乙基-N-甲基-N-甲氧乙烷基的四氟硼酸鹽(DEME-BF4)溶液、N,N-二乙基-N-甲基-N-甲氧乙烷基二(三氟甲基磺酸)亞酰胺鹽(DEME-TFSI)溶液、1,3-二[三(羥甲基)甲氨基]丙烷(Bis-Tris propane)、三羥甲基氨基甲烷鹽酸鹽(Tris-HCl)溶液、2-嗎啉乙磺酸(MES)、磷酸鹽溶液、碳酸鹽溶液、硼酸鹽溶液、醋酸鹽溶液、檸檬酸鹽溶液或其組合。
光感測裝置400與光感測裝置100的不同之處在於閘極416之位置,而此不同之處並不影響各個元件之特性,故光感測裝置400具有與光感測裝置100相同之優點與功能。
請參照第6A~6B圖,其係分別繪示本發明一實施 方式之光感測裝置500的側視圖及上視圖。光感測裝置500包含基板502、電晶體510、兩條矽奈米線通道520、濾光染料層530以及隔離層540。電晶體510包含源極512、汲極514及閘極516。閘極516位於兩條矽奈米線通道520之側邊。矽奈米線通道520連接源極512與汲極514,其係設置用於接收光照。濾光染料層530位於矽奈米通道520接收光照的表面上。隔離層540位於閘極516與矽奈米通道520之間。
第6A~6B圖所繪示之閘極516係位於矽奈米線通道520之側邊,亦即電晶體510為側閘極式(side-gated)電晶體。
光感測裝置500與光感測裝置100的不同之處在於閘極516之位置,而此不同之處並不影響各個元件之特性,故光感測裝置500具有與光感測裝置100相同之優點與功能。
本發明之另一態樣係提供一種利用前述之光感測裝置進行光感測的方法,包含以光線照射光感測裝置之濾光染料層,藉由透過濾光染料層之特定波長範圍的光使矽奈米通道中之電子及電洞位置重新排列。電子及該電洞之位置重新排列改變源極與汲極之間的電流,以產生電流差。藉由電流差計算光線之強度。
本發明之光感測的方法可用以偵測生物螢光,可藉由樣品所欲偵測之生物分子與受體反應後產生光線,並透過上述步驟所計算出之光線強度獲得生物分子於樣品中 之濃度。生物分子與受體係生物分子配對系統,其可為前述所列舉之組合。在一實施方式中,受體係修飾於濾光染料層上,與樣品反應後所產生光線可直接照射光感測裝置之濾光染料層,進而使特定波長範圍的光通過濾光染料層並由矽奈米通道接收。在另一實施方式中,受體並未修飾於濾光染料層上,而是將其與樣品反應後所產生之光線靠近光感測裝置,使光線照射濾光染料層,進而使特定波長範圍的光通過濾光染料層並由矽奈米通道接收。
根據一實施方式,光感測的方法更包含於光線照射光感測裝置之濾光染料層前,對閘極施加電壓以使矽奈米通道中之電子及電洞位置重新排列,以於源極與汲極之間形成穩定電流。之後,以光線照射光感測裝置之濾光染料層,使矽奈米通道內之電子及電洞位置再次重新排列,而改變本來穩定之電流狀態。藉由所產生之電流差可計算光線之強度。
本發明之利用光感測裝置進行光感測的方法係利用矽奈米通道對光具有高靈敏度的特性,讓光線直接照射在濾光染料層上,藉由透過濾光染料層之光能量改變矽奈米通道的元件特性,藉此感測光線,為一種新型的光感測方式。此外,本發明之方法可選擇性地透過電晶體之閘極電壓調控矽奈米通道的元件特性,達成多元化的應用,也藉此進一歩提高光感測的靈敏度。
如前所述,大部份光感測器經由半導體廠製作封裝後,光感測器的元件特性已被固定,而光能量影響元件的變 化亦往往受到限制,故應用領域較為局限。舉例而言,高靈敏度的光感測器無法具有大的動態範圍,而一般靈敏度的光感測器觀測微弱光線時,往往需要長時間的曝光或時間,方可擷取到所需要的資訊。
本發明之光感測裝置及利用其進行光感測的方法之技術特點在於採用對光具有高靈敏度的矽奈米通道,藉由光能量直接改變矽奈米通道的其元件電性,並透過所測得之電訊號得知光照情形。此外,由於矽奈米通道係架構於電晶體的結構上,故矽奈米通道本身的電性亦可透過電晶體外加電壓而進行調控。本發明提出之光感測裝置除了可讓光照影響元件特性外,亦可利用電晶體調控機制改變元件本身的特性,最後可透過交叉的使用增加光感測裝置的應用範疇。本發明之光感測裝置具有高靈敏度,又可動態的進行元件參數調整,具有廣大的應用領域與市場。
光感測裝置的製造方法
本發明一實施方式之光感測裝置的製造方法包含以下步驟:
1.於基板上形成閘極。在一實施方式中,基板為矽晶圓,閘極之材料為多晶矽。閘極係藉由沉積形成,例如可為化學氣相沉積(chemical vapor deposition,CVD)、常壓化學氣相沉積(atmospheric pressure CVD,APCVD)、低壓化學氣相沉積(low-pressure CVD,LPCVD)、電漿 增強化學氣相沉積(plasma enhanced CVD,PECVD)、原子層沉積(atomic layer deposition,ALD)等。
2.於閘極上沉積隔離層作為閘極介電層。在一實施方式中,沉積之方法為化學氣相沉積法。隔離層可由單層氧化物或由一層氧化物及一層氮化物所組成。
3.於隔離層上沉積多晶矽。沉積之方法可參照步驟1中所敘述之方法。
4.蝕刻多晶矽以形成矽奈米線作為電晶體通道,並同時形成源極及汲極。在一實施方式中,蝕刻之方法為乾式蝕刻。此步驟係藉由定義源極及汲極之同一道光罩及製程,形成多晶矽奈米線通道。多晶矽奈米線通道係在定義源極及汲極的同時,自對準形成。
5.於矽奈米線通道上形成濾光染料層,即可獲得本發明之光感測裝置,其結構可參照第1圖。
將以上述方法製得之光感測裝置用於進行以下測試。
可靠性測試
請參照第7圖,其係繪示本發明實施例之光感測裝置的電流-電壓關係圖。此測試係取用50個製作出的光感測裝置並量測其電性特性,其中電晶體係n型(n-type)電晶體。如第7圖所示,50個光感測裝置皆可在閘極電壓(VG, 單位:伏特V)上升的同時,汲極電流(ID,單位:安培A)也一起上升,呈現n型電晶體的電性特性。本發明之光感測裝置係經由長時間測試,根據大量的製作與比對其電性反應的結果顯示,本發明之光感測裝置確實具有可再現性,且可靠性佳。
靈敏度測試
請參照第8圖,其係繪示本發明實施例之光感測裝置以不同光能量照射的電流-時間關係圖。此測試係利用不同光強度照射元件表面,並同一時間量測反應電流變化,其中電晶體係p型(p-type)電晶體。不同的光能量包含0.118、1.018、9.98以及258微瓦(μW),並以未照光所測得之電流作為對照。如第8圖所示,光能量約1μW就可讓光感測裝置的電流上升,其電流可以隨著光線強度的增加而上升。之後,將光線能量降低,而光感測裝置的電流也隨之下降。此測試結果顯示出本發明之光感測裝置對光線的反應與其穩定性,靈敏度佳。
綜上所述,本發明提出利用半導體製程製作成矽奈米通道結構,並在基底設計為電晶體的架構。透過光能量可以直接影響矽奈米通道內電子及電洞的分佈,造成矽奈米通道之特性變化,將光能量轉換為電訊號,並藉由電訊號量測方式取得訊號的變化。另外,可以利用電晶體原理調控矽奈米通之特性,並運用於未來在光訊號量測的參數調整, 因此,本發明所提出的設計可以同時透過光能量與電晶體調控方式而達成多元化的應用,也藉此提高光感測的特性。本發明之光感測裝置及利用其進行光感測的方法可應用於多種產業,例如:光電產業、生醫產業、電子產業、能源產業等,並可用以開發多種產品,例如:光感測器、生物螢光感測器、影像感測器、相機、工業檢測器等。
雖然本發明已以實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。
100‧‧‧光感測裝置
110‧‧‧電晶體
112‧‧‧源極
114‧‧‧汲極
116‧‧‧閘極
120‧‧‧矽奈米通道
130‧‧‧濾光染料層
140‧‧‧隔離層

Claims (10)

  1. 一種光感測裝置,包含:一電晶體,包含一源極、一汲極及一閘極;一矽奈米通道,連接該源極與該汲極設置用於接收光照;以及一濾光染料層,位於該矽奈米通道接收光照的一表面上。
  2. 如申請專利範圍第1項所述之光感測裝置,其中該電晶體為背閘極式電晶體、側閘極式電晶體或液體閘極電晶體。
  3. 如申請專利範圍第1項所述之光感測裝置,其中該矽奈米通道之材料為多晶矽。
  4. 如申請專利範圍第1項所述之光感測裝置,其中該矽奈米通道之寬度約為50~100nm。
  5. 如申請專利範圍第1項所述之光感測裝置,其中該矽奈米通道之厚度約為1~100nm。
  6. 如申請專利範圍第1項所述之光感測裝置,更包含一隔離層,位於該閘極與該矽奈米通道之間。
  7. 一種利用如請求項1所述之光感測裝置進 行光感測的方法,包含:以一光線照射該光感測裝置之該濾光染料層,藉由透過該濾光染料層之一波長範圍的光使該矽奈米通道中之電子及電洞位置重新排列;該電子及該電洞之位置重新排列改變該源極與該汲極之間的電流,以產生一電流差;以及藉由該電流差計算該光線之強度。
  8. 如申請專利範圍第7項所述之方法,更包含將一樣品與一受體反應以產生該光線。
  9. 如申請專利範圍第8項所述之方法,更包含將該受體修飾於該濾光染料層上。
  10. 如申請專利範圍第7項所述之方法,更包含於該光線照射該光感測裝置之該濾光染料層前,對該閘極施加一電壓以使該矽奈米通道中之該電子以及該電洞位置重新排列,並於該源極與該汲極之間形成一穩定電流。
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