TWI582867B - Chip packaging process - Google Patents
Chip packaging process Download PDFInfo
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- TWI582867B TWI582867B TW104124061A TW104124061A TWI582867B TW I582867 B TWI582867 B TW I582867B TW 104124061 A TW104124061 A TW 104124061A TW 104124061 A TW104124061 A TW 104124061A TW I582867 B TWI582867 B TW I582867B
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- packaging process
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- flexible wiring
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- 238000012858 packaging process Methods 0.000 title claims description 26
- 235000012431 wafers Nutrition 0.000 claims description 65
- 239000008393 encapsulating agent Substances 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 15
- 239000012790 adhesive layer Substances 0.000 claims description 7
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- 238000010438 heat treatment Methods 0.000 claims 1
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- 239000013256 coordination polymer Substances 0.000 description 8
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- 239000007788 liquid Substances 0.000 description 7
- 238000007789 sealing Methods 0.000 description 6
- 229910000679 solder Inorganic materials 0.000 description 5
- 230000008602 contraction Effects 0.000 description 4
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- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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- 238000003466 welding Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/568—Temporary substrate used as encapsulation process aid
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15313—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a land array, e.g. LGA
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Dicing (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Description
本發明是有關於一種封裝製程及封裝體，且特別是有關於一種晶片封裝製程及晶片封裝體。 The present invention relates to a package process and package, and more particularly to a chip package process and a chip package.
於半導體的封裝製程中，大致上可分為晶圓切割、覆晶接合或打線接合以及封膠(molding)等步驟。在進行封膠步驟時，其係先將模具置於基板上。此時，基板上已設置有晶片或電子元件。接著，將固態的封膠塑料(epoxy molding compound,EMC)加熱溶融成液態，經由柱塞(plunger)施予壓力進入模具之模穴內，使得溶融成液態的封膠塑料密封住位於模穴內的晶片或電子元件。待溶融成液態的封膠塑料固化之後，進行脫模完成封膠製程。至此，封膠步驟已大致完成。在基板上形成包覆晶片或電子元件的封膠主要係防止濕氣由外部侵入，並使晶片或電子元件與外部電氣絕緣。 In the semiconductor packaging process, it can be roughly divided into steps such as wafer dicing, flip chip bonding or wire bonding, and molding. When the encapsulation step is performed, the mold is first placed on the substrate. At this time, a wafer or an electronic component is already disposed on the substrate. Then, the solid epoxy molding compound (EMC) is heated and melted into a liquid state, and the pressure is applied to the mold cavity through the plunger, so that the sealing plastic melted into the liquid is sealed in the cavity. Wafer or electronic component. After the sealant plastic to be dissolved into a liquid is solidified, the mold release process is completed. At this point, the sealing step has been substantially completed. The encapsulant forming the coated wafer or electronic component on the substrate mainly prevents moisture from intruding from the outside and electrically insulates the wafer or electronic component from the outside.
然而，由於在進行封膠步驟時所使用的封膠塑料的熱膨脹係數與基板的熱膨脹係數不同，因此在固化溶融成液態的封膠 塑料時，基板與封膠塑料間會隨著溫度變化而產生不同的膨脹或收縮量，進而導致基板產生應力而翹曲(warpage)，尤其是厚度越薄且具可撓性的基板，其翹曲的情況越趨嚴重，相當不利於目前電子元件體積薄化。 However, since the coefficient of thermal expansion of the sealant plastic used in the step of sealing is different from the coefficient of thermal expansion of the substrate, the sealant which melts into a liquid is solidified. In plastics, the substrate and the sealant plastic will have different expansion or contraction amounts with temperature changes, which will cause stress and warpage of the substrate, especially the thinner and flexible substrate. The more serious the situation of the music, it is quite unfavorable for the current thinning of electronic components.
本發明提供一種晶片封裝製程及晶片封裝體，可改善可撓性線路載板於製造過程中產生翹曲的問題，藉以提升製程及產品良率。 The invention provides a chip packaging process and a chip package, which can improve the problem of warpage of the flexible circuit carrier during the manufacturing process, thereby improving the process and the product yield.
本發明提出一種晶片封裝製程，其包括以下步驟。提供可撓性線路載板。可撓性線路載板具有第一表面、相對於第一表面之第二表面、形成於第二表面上的多個外接墊以及形成於第一表面上的多個線路單元。這些線路單元呈行列配置。各個線路單元分別包含有圖案化線路。任兩行相鄰或任兩列相鄰的線路單元之間由切割道分隔開來。提供承載體。承載體全面地覆設於可撓性線路載板之第二表面上。電性連接多個晶片至這些線路單元上。形成封裝膠體於第一表面上，並使封裝膠體全面地包覆這些晶片以及這些線路單元。移除承載體，以暴露出第二表面上之這些外接墊。沿切割道進行單體化切割，以形成多個彼此分離的晶片封裝體。 The present invention provides a wafer packaging process that includes the following steps. A flexible line carrier is provided. The flexible wiring carrier has a first surface, a second surface opposite the first surface, a plurality of external pads formed on the second surface, and a plurality of wiring units formed on the first surface. These line units are arranged in rows and columns. Each line unit contains a patterned line. Any two adjacent rows or any two adjacent rows of line units are separated by a scribe line. Provide a carrier. The carrier is entirely overlaid on the second surface of the flexible circuit carrier. Electrically connecting a plurality of wafers to the line units. Forming the encapsulant on the first surface and causing the encapsulant to completely coat the wafers and the line units. The carrier is removed to expose the external pads on the second surface. The singulation cut is performed along the scribe line to form a plurality of wafer packages separated from each other.
在本發明的一實施例中，上述的電性連接這些晶片至這些線路單元上的方法包括使各個晶片以主動表面朝向第一表面， 並透過主動表面上的多個凸塊接合至對應的線路單元的圖案化線路。 In an embodiment of the invention, the method for electrically connecting the wafers to the line units includes directing each of the wafers toward the first surface with an active surface. And bonding to the patterned lines of the corresponding line unit through a plurality of bumps on the active surface.
在本發明的一實施例中，上述的晶片封裝製程更包括在使各個晶片透過主動表面上的凸塊接合至對應的線路單元的圖案化線路之後，形成底膠(underfill)於各個晶片的主動表面與可撓性線路載板的第一表面之間，以包覆各個晶片的主動表面上的凸塊。 In an embodiment of the invention, the chip packaging process further includes forming an underfill on each of the wafers after bonding the respective wafers through the bumps on the active surface to the patterned lines of the corresponding line units. The surface is between the first surface of the flexible wiring carrier to cover the bumps on the active surface of each of the wafers.
在本發明的一實施例中，上述的電性連接這些晶片至這些線路單元上的方法包括使各個晶片以其背面朝向第一表面，並透過絕緣膠層使各個晶片連接至可撓性線路載板的第一表面。接著，透過多條焊線接合各個晶片中相對於背面的主動表面與對應的線路單元的圖案化線路。 In an embodiment of the invention, the method for electrically connecting the wafers to the line units includes directing the respective wafers with their back faces toward the first surface and transmitting the respective wafers to the flexible lines through the insulating layer. The first surface of the board. Next, the patterned lines of the active surface and the corresponding line unit in the respective wafers are bonded through a plurality of bonding wires.
在本發明的一實施例中，上述的移除該承載體的方法包括將承載體自可撓性線路載板的第二表面撕離。 In an embodiment of the invention, the method of removing the carrier includes tearing the carrier away from the second surface of the flexible wiring carrier.
在本發明的一實施例中，上述的承載體的至少一邊緣形成有延伸部，以及施力於延伸部以將承載體自可撓性線路載板的第二表面撕離。 In an embodiment of the invention, at least one edge of the carrier body is formed with an extension portion and a force is applied to the extension portion to tear the carrier body away from the second surface of the flexible circuit carrier.
在本發明的一實施例中，上述的承載體的至少一邊緣形成有缺口，以及施力於缺口以將承載體自可撓性線路載板的第二表面撕離。 In an embodiment of the invention, at least one edge of the carrier body is formed with a notch, and a force is applied to the notch to tear the carrier away from the second surface of the flexible circuit carrier.
在本發明的一實施例中，上述的移除承載體的方法包括對承載體照射紫外光線或對承載體烘烤加熱。 In an embodiment of the invention, the method for removing the carrier includes irradiating the carrier with ultraviolet light or baking the carrier.
在本發明的一實施例中，上述的承載體為膠膜或由板體 與形成板體上黏膠層所組成。承載體的尺寸大於或等於可撓性線路載板的尺寸。 In an embodiment of the invention, the carrier is a film or a plate It is composed of an adhesive layer formed on the plate body. The size of the carrier is greater than or equal to the size of the flexible circuit carrier.
本發明另提出一種透過前述晶片封裝製程製作所的晶片封裝體。 The present invention further provides a chip package manufactured by the above-described chip packaging process.
基於上述，本發明的晶片封裝製程係在進行封膠步驟之前先於可撓性線路載板的第二表面覆設承載體。此時，承載體與晶片分別位於可撓性線路載板的相對兩側。接著，形成封裝膠體於可撓性線路載板的第一表面上，並使封裝膠體全面地包覆位於可撓性線路載板的第一表面上的晶片以及線路單元。由於在形成封裝膠體時所使用的封膠塑料的熱膨脹係數與可撓性線路載板的熱膨脹係數不同，因此在固化溶融成液態的封膠塑料以形成封裝膠體時，可撓性線路載板與封裝膠體間會隨著溫度變化而產生不同的膨脹或收縮量，進而導致可撓性線路載板產生應力。然而，本發明可透過覆設於可撓性線路載板的第二表面上的承載來抵抗前述應力，藉以改善可撓性線路載板產生翹曲的問題，並提升本發明的晶片封裝製程的製程及產品良率。 Based on the above, the wafer packaging process of the present invention covers the carrier before the second surface of the flexible wiring carrier before performing the sealing step. At this time, the carrier and the wafer are respectively located on opposite sides of the flexible circuit carrier. Next, an encapsulant is formed on the first surface of the flexible wiring carrier, and the encapsulant is entirely coated on the wafer and the wiring unit on the first surface of the flexible wiring carrier. Since the coefficient of thermal expansion of the sealant plastic used in forming the encapsulant is different from the coefficient of thermal expansion of the flexible circuit carrier, the flexible circuit carrier is formed when the sealant is melted into a liquid to form an encapsulant. There is a different amount of expansion or contraction between the encapsulants as the temperature changes, which in turn causes stress on the flexible wiring carrier. However, the present invention can resist the aforementioned stress by the load placed on the second surface of the flexible wiring carrier, thereby improving the problem of warpage of the flexible wiring carrier and improving the wafer packaging process of the present invention. Process and product yield.
為讓本發明的上述特徵和優點能更明顯易懂，下文特舉實施例，並配合所附圖式作詳細說明如下。 The above described features and advantages of the invention will be apparent from the following description.
100a、100b‧‧‧晶片封裝體 100a, 100b‧‧‧ chip package
110‧‧‧可撓性線路載板 110‧‧‧Flexible line carrier
111‧‧‧第一表面 111‧‧‧ first surface
112‧‧‧第二表面 112‧‧‧ second surface
113‧‧‧線路單元 113‧‧‧Line unit
114‧‧‧接墊 114‧‧‧ pads
115‧‧‧外接墊 115‧‧‧External mat
120、120a‧‧‧承載體 120, 120a‧‧‧ carrier
121‧‧‧延伸部 121‧‧‧Extension
122‧‧‧缺口 122‧‧‧ gap
130‧‧‧晶片 130‧‧‧ wafer
131‧‧‧主動表面 131‧‧‧Active surface
132‧‧‧背面 132‧‧‧Back
133‧‧‧焊球 133‧‧‧ solder balls
134‧‧‧焊線 134‧‧‧welding line
140‧‧‧封裝膠體 140‧‧‧Package colloid
150‧‧‧底膠 150‧‧‧Bottom glue
160‧‧‧絕緣膠層 160‧‧‧Insulating rubber layer
CP‧‧‧切割道 CP‧‧‧ cutting road
圖1A是本發明一實施例的可撓性線路載板的局部俯視示意 圖。 1A is a partial plan view of a flexible circuit carrier according to an embodiment of the present invention. Figure.
圖1B是圖1A的可撓性線路載板沿剖線I-I的局部剖面示意圖。 1B is a partial cross-sectional view of the flexible circuit carrier of FIG. 1A taken along line I-I.
圖2A至圖2E是本發明一實施例應用圖1B的可撓性線路載板的晶片封裝製程的局部剖面示意圖。 2A-2E are partial cross-sectional views showing a wafer packaging process for applying the flexible wiring carrier of FIG. 1B according to an embodiment of the present invention.
圖3A至圖3D是本發明另一實施例應用圖1B的可撓性線路載板的晶片封裝製程的局部剖面示意圖。 3A-3D are partial cross-sectional views showing a wafer packaging process for applying the flexible wiring carrier of FIG. 1B according to another embodiment of the present invention.
圖4是本發明另一實施例的承載體覆設於圖1B的可撓性線路載板的局部剖面示意圖。 4 is a partial cross-sectional view showing a flexible carrier board of FIG. 1B with a carrier attached to another embodiment of the present invention.
圖1A是本發明一實施例的可撓性線路載板的局部俯視示意圖。圖1B是圖1A的可撓性線路載板沿剖線I-I的局部剖面示意圖。請參考圖1A與圖1B，在本實施例中，可撓性線路載板110的基材的材質例如是印刷電路板的基材所通常採用的材質，例如是FR4、FR5或BT材料。然而，可撓性線路載板110的基材的材質並不限定於前述FR4、FR5或BT等材料，亦可為聚醯亞胺(PI)、聚乙烯對苯二甲酸酯(PET)、聚醚(PES)、碳酸脂(PC)或其他適合的可撓性材料。 1A is a partial top plan view of a flexible wiring carrier according to an embodiment of the present invention. 1B is a partial cross-sectional view of the flexible circuit carrier of FIG. 1A taken along line I-I. Referring to FIG. 1A and FIG. 1B , in the present embodiment, the material of the substrate of the flexible wiring carrier 110 is, for example, a material commonly used for a substrate of a printed circuit board, such as FR 4 , FR 5 or BT material. However, the material of the base material of the flexible wiring carrier 110 is not limited to the above-mentioned materials such as FR4, FR5 or BT, and may be polyimine (PI) or polyethylene terephthalate (PET). Polyether (PES), carbonate (PC) or other suitable flexible material.
可撓性線路載板110可具有第一表面111、相對於第一表面111的第二表面112以及形成於第一表面111上的多個線路單元113。各個線路單元113分別包含有圖案化線路，其中前述圖案化 線路例如是由多個接墊114所構成。在此，各個線路單元113的接墊114可呈行列配置，且接墊114的材質可包括銅、金、銀、鋁或上述金屬的合金。如圖1A所示，各個線路單元113的接墊114可排列成兩行三列，惟本發明對於各個線路單元113的接墊114排列而成的行數與列數並不加以限定。舉例來說，各個線路單元113的接墊114的排列方式至少一行一列，亦可為一行兩列、兩行一列或其他適當的行數與列數。另一方面，可撓性線路載板110還具有形成於第二表面112上的多個外接墊115，這些外接墊115與線路單元113電性連通。 The flexible wiring carrier 110 may have a first surface 111, a second surface 112 relative to the first surface 111, and a plurality of wiring units 113 formed on the first surface 111. Each of the line units 113 respectively includes a patterned line, wherein the aforementioned patterning The line is formed, for example, by a plurality of pads 114. Here, the pads 114 of the respective line units 113 may be arranged in a row, and the material of the pads 114 may include copper, gold, silver, aluminum or an alloy of the above metals. As shown in FIG. 1A, the pads 114 of the respective line units 113 can be arranged in two rows and three columns. However, the number of rows and the number of columns in which the pads 114 of the respective line units 113 are arranged in the present invention is not limited. For example, the pads 114 of the respective line units 113 are arranged in at least one row, and may be one row or two columns, two rows and one column, or other suitable number of rows and columns. On the other hand, the flexible circuit carrier 110 further has a plurality of external pads 115 formed on the second surface 112. The external pads 115 are in electrical communication with the line unit 113.
如圖1A所示，這些線路單元113是由形成於可撓性線路載板110的第一表面111上的切割道CP分隔開來。由於本實例的切割道CP例如是行列交錯的溝渠，因此由切割道CP分隔開來的這些線路單元113可以是行列配置於可撓性線路載板110的第一表面111上。換個角度來說，任兩行相鄰或任兩列相鄰的線路單元113之間可由切割道CP分隔開來。 As shown in FIG. 1A, these line units 113 are separated by a scribe line CP formed on the first surface 111 of the flexible line carrier 110. Since the scribe lines CP of the present example are, for example, rows and columns of staggered trenches, the line units 113 separated by the scribe lines CP may be arranged in a row on the first surface 111 of the flexible wiring carrier 110. In other words, any two adjacent rows or any two adjacent rows of line units 113 may be separated by a scribe line CP.
以下將針對應用可撓性線路載板110的晶片封裝製程舉例說明。 The wafer packaging process for applying the flexible wiring carrier 110 will be exemplified below.
圖2A至圖2E是本發明一實施例應用圖1B的可撓性線路載板的晶片封裝製程的局部剖面示意圖。請參考圖2A，分別提供可撓性線路載板110與承載體120，並使承載體120全面地覆設於可撓性線路載板110的第二表面112上。此時，承載體120與線路單元113分別位於可撓性線路載板110的相對兩側。在本實 施例中，承載體120可為具黏性之膠膜，以在覆設於可撓性線路載板110的第二表面112上時黏貼於可撓性線路載板110。在另一實施例中，承載體120可由板體與形成板體上黏膠層所組成，以在覆設於可撓性線路載板110的第二表面112上時透過前述黏膠層黏貼於可撓性線路載板110。詳細而言，承載體120是暫時性地黏貼於可撓性線路載板110的第二表面112上，用以承載可撓性線路載板110，並覆蓋位於第二表面112上的外接墊115。 2A-2E are partial cross-sectional views showing a wafer packaging process for applying the flexible wiring carrier of FIG. 1B according to an embodiment of the present invention. Referring to FIG. 2A, the flexible circuit carrier 110 and the carrier 120 are respectively provided, and the carrier 120 is entirely covered on the second surface 112 of the flexible circuit carrier 110. At this time, the carrier 120 and the line unit 113 are respectively located on opposite sides of the flexible circuit carrier 110. In this reality In the embodiment, the carrier 120 can be a viscous film for adhering to the flexible circuit carrier 110 when overlying the second surface 112 of the flexible circuit carrier 110. In another embodiment, the carrier 120 may be composed of a plate body and an adhesive layer forming the plate body to adhere to the adhesive layer through the adhesive layer when being disposed on the second surface 112 of the flexible circuit carrier 110. Flexible line carrier 110. In detail, the carrier 120 is temporarily adhered to the second surface 112 of the flexible circuit carrier 110 for carrying the flexible circuit carrier 110 and covering the external pad 115 on the second surface 112. .
舉例來說，承載體120的尺寸可大於或等於可撓性線路載板110的尺寸，藉以全面地覆設於可撓性線路載板110的第二表面112上。如圖2A所示，本實施例的承載體120的尺寸例如是大於可撓性線路載板110的尺寸，而在承載體120的至少一邊緣形成有一突出於可撓性線路載板110的側表面的延伸部121。 For example, the carrier 120 may be sized larger than or equal to the size of the flexible circuit carrier 110 to be fully overlaid on the second surface 112 of the flexible circuit carrier 110. As shown in FIG. 2A, the size of the carrier 120 of the present embodiment is, for example, larger than the size of the flexible circuit carrier 110, and at least one edge of the carrier 120 is formed with a side protruding from the flexible circuit carrier 110. An extension 121 of the surface.
接著，請參考圖2B，電性連接多個晶片130至這些線路單元113上。在本實施例中，電性連接多個晶片130至這些線路單元113上的方法例如是先使各個晶片130以其主動表面131朝向可撓性線路載板110的第一表面111，並使各個晶片130的主動表面131上的多個凸塊抵接於對應的線路單元113的接墊114(即圖案化線路)。之後，迴焊(refolw)前述各個凸塊以形成接合至對應的接墊114(即圖案化線路)的焊球133。換言之，本實施例可透過覆晶接合的方式以使各個晶片130電性連接於對應的線路單元113。 Next, referring to FIG. 2B, a plurality of wafers 130 are electrically connected to the line units 113. In the present embodiment, the method of electrically connecting the plurality of wafers 130 to the line units 113 is, for example, first causing the respective wafers 130 to face the first surface 111 of the flexible wiring carrier 110 with their active surfaces 131, and A plurality of bumps on the active surface 131 of the wafer 130 abut the pads 114 (ie, patterned lines) of the corresponding line unit 113. Thereafter, each of the aforementioned bumps is reflowed to form solder balls 133 bonded to corresponding pads 114 (ie, patterned lines). In other words, in this embodiment, each of the wafers 130 can be electrically connected to the corresponding line unit 113 through a flip chip bonding manner.
在使各個晶片130透過覆晶接合的方式電性連接於對應 的線路單元113之後，可選擇性地形成底膠150於各個晶片130的主動表面131與可撓性線路載板110的第一表面111之間，以包覆各個晶片130的主動表面131上的焊球133(即經迴焊後的凸塊)。底膠150可用以保護焊球133以及接墊114，並同時緩衝可撓性線路載板110與晶片130在受熱時，可撓性線路載板110與晶片130之間所產生熱應變(thermal strain)不匹配的現象。 Electrically connecting the respective wafers 130 to each other through flip chip bonding After the line unit 113, a primer 150 is selectively formed between the active surface 131 of each of the wafers 130 and the first surface 111 of the flexible wiring carrier 110 to cover the active surface 131 of each of the wafers 130. Solder ball 133 (ie, bump after reflow). The primer 150 can be used to protect the solder balls 133 and the pads 114 while buffering the thermal strain between the flexible circuit carrier 110 and the wafer 130 when the flexible wiring carrier 110 and the wafer 130 are heated. ) The phenomenon of mismatch.
接著，請參考圖2C，形成封裝膠體140於可撓性線路載板110的第一表面111上，並使封裝膠體140全面地包覆這些晶片130以及這些線路單元113。由於在形成封裝膠體140時所使用的封膠塑料的熱膨脹係數與可撓性線路載板110的熱膨脹係數不同，因此在固化溶融成液態的封膠塑料以形成封裝膠體140時，可撓性線路載板110與封裝膠體140間會隨著溫度變化而產生不同的膨脹或收縮量，進而導致可撓性線路載板110產生應力。然而，在本實施例中，覆設於可撓性線路載板110的第二表面112上的承載體120可用以抵抗前述應力，藉以改善可撓性線路載板110產生翹曲的問題。 Next, referring to FIG. 2C, the encapsulant 140 is formed on the first surface 111 of the flexible wiring carrier 110, and the encapsulant 140 is completely covered by the wafers 130 and the wiring units 113. Since the thermal expansion coefficient of the sealant plastic used in forming the encapsulant 140 is different from the thermal expansion coefficient of the flexible wiring carrier 110, the flexible circuit is formed when the gelatin plastic which is melted into a liquid is solidified to form the encapsulant 140. The expansion and contraction amount of the carrier 110 and the encapsulant 140 may change with temperature, thereby causing stress on the flexible wiring carrier 110. However, in the present embodiment, the carrier 120 disposed on the second surface 112 of the flexible wiring carrier 110 can be used to resist the aforementioned stress, thereby improving the problem of warpage of the flexible wiring carrier 110.
在利用承載體120抵抗封膠步驟中可撓性線路載板110所產生的應力以防止可撓性線路載板110產生翹曲後，便可將暫時性地黏貼於可撓性線路載板110的第二表面112上的承載體120予以移除，如圖2D所示。移除承載體120的方法可以是施力於延伸部121，以將承載體120自可撓性線路載板110的第二表面112撕離。換言之，本實施例將承載體120的尺寸設置大於可撓性線 路載板110的尺寸，有助於操作者透過突出於可撓性線路載板110的側表面的延伸部121順利地將承載體120自可撓性線路載板110的第二表面112撕離。在其他實施例中，亦可透過對承載體120照射紫外光線或對承載體120烘烤加熱等方式，以降低膠膜或黏膠層的黏性。如此一來，便可使承載體120自可撓性線路載板110的第二表面112脫落，以暴露出第二表面112上之外接墊115。之後，再依製程所需於外接墊115進行植球之步驟，以形成球格陣列封裝(BGA)或是形成平面網格陣列封裝(LGA)。球格陣列封裝(BGA)或平面網格陣列封裝(LGA)可用以與外部端子電性連接，惟外接墊115與外部端子之接合形式不限於此。 After the carrier 120 is used to resist the stress generated by the flexible wiring carrier 110 in the sealing step to prevent the flexible wiring carrier 110 from being warped, the flexible wiring carrier 110 can be temporarily adhered to the flexible wiring carrier 110. The carrier 120 on the second surface 112 is removed, as shown in Figure 2D. The method of removing the carrier 120 may be to apply a force to the extension 121 to tear the carrier 120 away from the second surface 112 of the flexible wiring carrier 110. In other words, the embodiment sets the size of the carrier 120 to be larger than the flexible line. The size of the road carrier 110 helps the operator to smoothly tear the carrier 120 from the second surface 112 of the flexible wiring carrier 110 through the extension 121 protruding from the side surface of the flexible wiring carrier 110. . In other embodiments, the adhesive body 120 may be irradiated with ultraviolet light or the carrier 120 may be baked and heated to reduce the viscosity of the adhesive film or the adhesive layer. As such, the carrier 120 can be detached from the second surface 112 of the flexible wiring carrier 110 to expose the external pads 115 on the second surface 112. Thereafter, the step of implanting the ball by the external pad 115 is performed according to the process to form a ball grid array package (BGA) or form a planar grid array package (LGA). A ball grid array package (BGA) or a planar grid array package (LGA) may be used to electrically connect to an external terminal, but the form of engagement of the external pad 115 and the external terminal is not limited thereto.
請繼續參考圖2D，在移除承載體120後，沿切割道CP進行單體化切割，以形成多個彼此分離的晶片封裝體100a。圖2E繪示出其中一個晶片封裝體100a以示意。通常而言，沿切割道CP進行單體化切割可透過雷射切割或機械切割等方式實施。 With continued reference to FIG. 2D, after the carrier 120 is removed, a singulation cut is performed along the scribe line CP to form a plurality of wafer packages 100a separated from each other. FIG. 2E illustrates one of the chip packages 100a to be illustrated. In general, singulation cutting along the cutting channel CP can be carried out by means of laser cutting or mechanical cutting.
以下將列舉其他實施例以作為說明。在此必須說明的是，下述實施例沿用前述實施例的元件標號與部分內容，其中採用相同的標號來表示相同或近似的元件，並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例，下述實施例不再重複贅述。 Other embodiments are listed below for illustration. It is to be noted that the following embodiments use the same reference numerals and parts of the above-mentioned embodiments, and the same reference numerals are used to refer to the same or similar elements, and the description of the same technical content is omitted. For the description of the omitted portions, reference may be made to the foregoing embodiments, and the following embodiments are not repeated.
圖3A至圖3D是本發明另一實施例應用圖1B的可撓性線路載板的晶片封裝製程的局部剖面示意圖。不同於上述實施例的晶片封裝製程的是，本實施例是在將承載體120全面地覆設於 可撓性線路載板110的第二表面112上(如圖2A所示)的步驟後，透過打線接合的方式來使各個晶片130電性連接於對應的線路單元113，如圖3A所示。 3A-3D are partial cross-sectional views showing a wafer packaging process for applying the flexible wiring carrier of FIG. 1B according to another embodiment of the present invention. Different from the wafer packaging process of the above embodiment, the present embodiment is to completely cover the carrier 120 After the step of the second surface 112 of the flexible wiring carrier 110 (shown in FIG. 2A), the respective wafers 130 are electrically connected to the corresponding wiring unit 113 by wire bonding, as shown in FIG. 3A.
詳細而言，透過打線接合的方式來使各個晶片130電性連接於對應的線路單元113例如是先使各個晶片130以其背面132朝向可撓性線路載板110的第一表面111，並透過絕緣膠層160連接各個晶片130的背面132與可撓性線路載板110的第一表面111。接著，透過多條焊線134接合各個晶片130中相對於背面132的主動表面131與對應的線路單元130的接墊114(即圖案化線路)。 In detail, each of the wafers 130 is electrically connected to the corresponding line unit 113 by wire bonding, for example, the respective wafers 130 are directed toward the first surface 111 of the flexible circuit carrier 110 with the back surface 132 thereof, and are transmitted through The insulating adhesive layer 160 connects the back surface 132 of each of the wafers 130 with the first surface 111 of the flexible wiring carrier 110. Next, the pads 114 (ie, patterned lines) of the active surface 131 of the respective wafers 130 and the corresponding line cells 130 are bonded through the plurality of bonding wires 134.
接著，如圖3B至圖3C所示，本實施例的晶片封裝製程中的形成封裝膠體140於可撓性線路載板110的第一表面111上、移除承載體120以及單體化切割等步驟大致與上述實施例相同，於此便不再贅述。最後，即可製作得到如圖3D所示的晶片封裝體100b。 Next, as shown in FIG. 3B to FIG. 3C, the encapsulant 140 is formed on the first surface 111 of the flexible wiring carrier 110, the carrier 120 is removed, and the singulation is cut, etc., in the wafer packaging process of the present embodiment. The steps are substantially the same as those of the above embodiment, and will not be described again. Finally, the chip package 100b as shown in FIG. 3D can be fabricated.
圖4是本發明另一實施例的承載體覆設於圖1B的可撓性線路載板的局部剖面示意圖。請參考圖4，有別於上述實施例的承載體120的是，本實施例的承載體120a的尺寸大致上等於可撓性線路載板110尺寸。為便於操作者順利地將承載體120a自可撓性線路載板110的第二表面112撕離，可在承載體120a的至少一邊緣形成有一略微內縮於可撓性線路載板110的側表面的缺口122。藉此，操作者可施力於缺口122，以將承載體120a自可撓性線路載板110的第二表面112撕離。 4 is a partial cross-sectional view showing a flexible carrier board of FIG. 1B with a carrier attached to another embodiment of the present invention. Referring to FIG. 4, different from the carrier 120 of the above embodiment, the carrier 120a of the present embodiment has a size substantially equal to the size of the flexible circuit carrier 110. In order to facilitate the operator to smoothly tear the carrier 120a from the second surface 112 of the flexible circuit carrier 110, a side slightly recessed on the flexible circuit carrier 110 may be formed on at least one edge of the carrier 120a. The gap 122 of the surface. Thereby, the operator can apply force to the notch 122 to tear the carrier 120a away from the second surface 112 of the flexible circuit carrier 110.
綜上所述，本發明的晶片封裝製程係在進行封膠步驟之前先於可撓性線路載板的第二表面貼覆一承載體。此時，承載體與晶片分別位於可撓性線路載板的相對兩側。接著，形成封裝膠體於可撓性線路載板的第一表面上，並使封裝膠體全面地包覆位於可撓性線路載板的第一表面上的晶片以及線路單元。由於在形成封裝膠體時所使用的封膠塑料的熱膨脹係數與可撓性線路載板的熱膨脹係數不同，因此在固化溶融成液態的封膠塑料以形成封裝膠體時，可撓性線路載板與封裝膠體間會隨著溫度變化而產生不同的膨脹或收縮量，進而導致可撓性線路載板產生應力。然而，本發明可透過覆設於可撓性線路載板的第二表面上的承載體來抵抗前述應力，藉以改善可撓性線路載板產生翹曲的問題，並提升本發明的晶片封裝製程的製程及產品良率。 In summary, the chip packaging process of the present invention applies a carrier to the second surface of the flexible wiring carrier before performing the sealing step. At this time, the carrier and the wafer are respectively located on opposite sides of the flexible circuit carrier. Next, an encapsulant is formed on the first surface of the flexible wiring carrier, and the encapsulant is entirely coated on the wafer and the wiring unit on the first surface of the flexible wiring carrier. Since the coefficient of thermal expansion of the sealant plastic used in forming the encapsulant is different from the coefficient of thermal expansion of the flexible circuit carrier, the flexible circuit carrier is formed when the sealant is melted into a liquid to form an encapsulant. There is a different amount of expansion or contraction between the encapsulants as the temperature changes, which in turn causes stress on the flexible wiring carrier. However, the present invention can resist the aforementioned stress by the carrier disposed on the second surface of the flexible wiring carrier, thereby improving the problem of warpage of the flexible wiring carrier and improving the wafer packaging process of the present invention. Process and product yield.
雖然本發明已以實施例揭露如上，然其並非用以限定本發明，任何所屬技術領域中具有通常知識者，在不脫離本發明的精神和範圍內，當可作些許的更動與潤飾，故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.
110‧‧‧可撓性線路載板 110‧‧‧Flexible line carrier
111‧‧‧第一表面 111‧‧‧ first surface
112‧‧‧第二表面 112‧‧‧ second surface
113‧‧‧線路單元 113‧‧‧Line unit
114‧‧‧接墊 114‧‧‧ pads
115‧‧‧外接墊 115‧‧‧External mat
120‧‧‧承載體 120‧‧‧Carrier
121‧‧‧延伸部 121‧‧‧Extension
130‧‧‧晶片 130‧‧‧ wafer
131‧‧‧主動表面 131‧‧‧Active surface
133‧‧‧焊球 133‧‧‧ solder balls
140‧‧‧封裝膠體 140‧‧‧Package colloid
150‧‧‧底膠 150‧‧‧Bottom glue
CP‧‧‧切割道 CP‧‧‧ cutting road
Claims (9)
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| TW104124061A TWI582867B (en) | 2015-07-24 | 2015-07-24 | Chip packaging process |
| CN201510583464.4A CN106373896A (en) | 2015-07-24 | 2015-09-15 | Chip packaging process and chip package |
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| TW104124061A TWI582867B (en) | 2015-07-24 | 2015-07-24 | Chip packaging process |
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| TW201836084A (en) * | 2017-03-16 | 2018-10-01 | 力成科技股份有限公司 | Manufacturing method of semiconductor package structure |
| CN111095580A (en) * | 2019-03-22 | 2020-05-01 | 厦门三安光电有限公司 | Flexible LED (light-emitting diode) surface light source, manufacturing method and light-emitting equipment |
| CN110690126A (en) * | 2019-09-26 | 2020-01-14 | 厦门市三安集成电路有限公司 | Method for resisting bending of substrate and packaging process of filter product |
| TW202143401A (en) * | 2020-05-08 | 2021-11-16 | 力成科技股份有限公司 | Semiconductor packaging method and structure thereof |
| CN113764546A (en) * | 2021-08-30 | 2021-12-07 | 东莞市中麒光电技术有限公司 | Mini-LED device, LED display module and manufacturing method thereof |
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| TW200644264A (en) * | 2005-06-08 | 2006-12-16 | Chipmos Technologies Inc | Stacked chip package structure, chip package and fabricating method thereof |
| TW201113959A (en) * | 2009-10-13 | 2011-04-16 | Unimicron Technology Corp | Method of fabricating package structure |
| TW201407694A (en) * | 2012-08-07 | 2014-02-16 | Alpha & Omega Semiconductor | A method of molded wafer level chip size package |
| CN104517950A (en) * | 2013-09-30 | 2015-04-15 | 南茂科技股份有限公司 | Multi-chip tape coiling packaging structure |
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| US8378498B2 (en) * | 2010-09-09 | 2013-02-19 | International Business Machines Corporation | Chip assembly with a coreless substrate employing a patterned adhesive layer |
| KR101906408B1 (en) * | 2011-10-04 | 2018-10-11 | 삼성전자주식회사 | Semiconductor package and method of manufacturing the same |
| KR101970291B1 (en) * | 2012-08-03 | 2019-04-18 | 삼성전자주식회사 | Methods of manufacturing semiconductor packages |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| TW200644264A (en) * | 2005-06-08 | 2006-12-16 | Chipmos Technologies Inc | Stacked chip package structure, chip package and fabricating method thereof |
| TW201113959A (en) * | 2009-10-13 | 2011-04-16 | Unimicron Technology Corp | Method of fabricating package structure |
| TW201407694A (en) * | 2012-08-07 | 2014-02-16 | Alpha & Omega Semiconductor | A method of molded wafer level chip size package |
| CN104517950A (en) * | 2013-09-30 | 2015-04-15 | 南茂科技股份有限公司 | Multi-chip tape coiling packaging structure |
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