TWI565596B - Transfer film for in-mold molding and manufacturing method thereof - Google Patents

Transfer film for in-mold molding and manufacturing method thereof Download PDF

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TWI565596B
TWI565596B TW104132399A TW104132399A TWI565596B TW I565596 B TWI565596 B TW I565596B TW 104132399 A TW104132399 A TW 104132399A TW 104132399 A TW104132399 A TW 104132399A TW I565596 B TWI565596 B TW I565596B
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layer
resin
film
voids
peeling
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TW201632351A (en
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金內和彦
中川英秋
芝田岳永
井上知之
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松下知識產權經營股份有限公司
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Description

模內成形用轉印薄膜及其製造方法 Transfer film for in-mold forming and method of producing the same

本發明係關於被使用在模內成形的轉印薄膜及其製造方法。 The present invention relates to a transfer film used for in-mold forming and a method of manufacturing the same.

近年來使用多數電視、行動機器用顯示器、汽車導航系統用顯示器、觸控面板顯示器等顯示器。在該等顯示器的表面,一般施行反射防止(Anti-Reflection,以下稱為AR)處理,俾以減低因外光所致之表面反射光且抑制反射眩光。以AR處理方法而言,係使用:在顯示器所使用的基材表面直接塗敷AR材料的方法、藉由蒸鍍、濺鍍等來進行處理的方法、使經AR處理的薄膜轉印在基材表面的方法等。依用途來使用如上所示之各式各樣的AR處理法。 In recent years, most televisions, displays for mobile devices, displays for car navigation systems, and displays for touch panel displays have been used. Anti-Reflection (hereinafter referred to as AR) processing is generally performed on the surface of the display to reduce surface reflected light due to external light and to suppress reflected glare. In the AR treatment method, a method of directly applying an AR material to a surface of a substrate used for a display, a method of performing treatment by vapor deposition, sputtering, or the like, and transferring the AR-treated film to the base are used. The method of the surface of the material, etc. A variety of AR processing methods as described above are used depending on the application.

其中,在樹脂成形品的顯示器或蓋透鏡,近年來以廉價且可大量生產的方法之一而言,適用插入成形法。在插入成形法中,首先,使用預成形用模具,將預先經AR處理的聚對苯二甲酸乙二酯(PET)薄膜進行預成形。之後,將經預成形之附AR的PET薄膜安置在射出成形用的 模具內。接著,使附AR的PET薄膜以一體成形轉印在聚碳酸酯(PC)樹脂等射出成形樹脂的表面。 Among them, in the display of a resin molded article or a cover lens, in one of the methods which are inexpensive and mass-produced in recent years, an insert molding method is applied. In the insert molding method, first, a preformed polyethylene terephthalate (PET) film is preformed using a preform molding die. Thereafter, the preformed AR film with AR is placed for injection molding. Inside the mold. Next, the PET film with AR is integrally molded and transferred onto the surface of the injection molding resin such as polycarbonate (PC) resin.

一邊參照圖7,一邊說明在插入成形中所使用的一般插入成形用AR薄膜。圖7係習知之插入成形用的AR薄膜100的剖面圖。AR薄膜100係具有:基底薄膜101、AR層102、硬塗層103、及接著層104。 The AR film for general insertion molding used in the insert molding will be described with reference to Fig. 7 . Fig. 7 is a cross-sectional view showing a conventional AR film 100 for insert molding. The AR film 100 has a base film 101, an AR layer 102, a hard coat layer 103, and an adhesive layer 104.

基底薄膜101係以PET或丙烯酸薄膜所形成。AR層102係具有減少在成形品的最表面的外光反射的功能。AR層102亦可由折射率不同的複數層所形成。硬塗層103係作為用以使AR層102賦予強度及硬度的保護層來發揮功能。接著層104係發揮使熔融後的樹脂接著在基底薄膜101的作用。如以上所示AR薄膜100係由複數層所構成。 The base film 101 is formed of a PET or acrylic film. The AR layer 102 has a function of reducing external light reflection on the outermost surface of the molded article. The AR layer 102 can also be formed of a plurality of layers having different refractive indices. The hard coat layer 103 functions as a protective layer for imparting strength and hardness to the AR layer 102. Next, the layer 104 functions to cause the molten resin to adhere to the underlying film 101. As described above, the AR film 100 is composed of a plurality of layers.

接著,一邊參照圖7、圖8,一邊說明使AR薄膜100轉印在成形品表面的製程。圖8係按每個工程說明插入成形的製程的圖。 Next, a process of transferring the AR film 100 onto the surface of the molded article will be described with reference to FIGS. 7 and 8. Fig. 8 is a view showing a process of insert molding in accordance with each engineering description.

在工程A-1中,首先,在預成形用的固定模1A與可動模2A之間配置AR薄膜100。AR薄膜100為單片薄膜。此時,AR薄膜100係以AR層102朝向可動模2A的方式作配置。此外,以在可動模2A形成開口的吸引孔4吸引AR薄膜100。接著,在工程A-2,使可動模2A運轉,進行合模,將AR薄膜100進行預成形。之後,在工程A-3中,將可動模2A恢復成原來,將經預成形的AR薄膜100由模內取出。 In the case of the work A-1, first, the AR film 100 is disposed between the fixed mold 1A for preforming and the movable mold 2A. The AR film 100 is a single film. At this time, the AR film 100 is disposed such that the AR layer 102 faces the movable mold 2A. Further, the AR film 100 is attracted by the suction holes 4 that form an opening in the movable mold 2A. Next, in the operation A-2, the movable mold 2A is operated to perform mold clamping, and the AR film 100 is preformed. Thereafter, in the work A-3, the movable mold 2A is returned to the original, and the preformed AR film 100 is taken out from the mold.

接著,在工程B-1中,將經預成形的AR薄膜100配置在正式成形用的可動模2B與固定模1B之間。此時,AR薄膜100係AR層102以朝向形成有吸引孔4之開口的可動模2B的方式作配置。此時,以吸引孔4吸引經預成形的AR薄膜100。接著,在工程B-2中進行合模。在工程B-3中,由在固定模1B空出的澆口5,將熔融的樹脂6流入至模內,與設在與AR薄膜100的AR層102為相反面的接著層104相接著。在工程B-4中,進行開模,且以未圖示的突出銷,由模內取出與AR薄膜100一體成形的插入成形品105。 Next, in the item B-1, the preformed AR film 100 is placed between the movable mold 2B for the main molding and the fixed mold 1B. At this time, the AR film 100 is disposed such that the AR layer 102 faces the movable mold 2B in which the opening of the suction hole 4 is formed. At this time, the preformed AR film 100 is attracted by the suction holes 4. Next, the mold clamping is performed in the project B-2. In the case of the work B-3, the molten resin 6 is poured into the mold by the gate 5 vacated in the fixed mold 1B, and is followed by the adhesive layer 104 provided on the opposite side to the AR layer 102 of the AR film 100. In the case of the work B-4, the mold is opened, and the insert molded article 105 integrally formed with the AR film 100 is taken out from the mold by a protruding pin (not shown).

接著,在工程C-1中,將插入成形品105的端部的不需要的薄膜部位,以專用的切割器106進行修整。在修整結束的工程C-2中,最終之附AR的插入成形品105C即完成。 Next, in the item C-1, the unnecessary film portion inserted into the end portion of the molded article 105 is trimmed by a dedicated cutter 106. In the finishing work C-2, the final AR molded insert 105C is completed.

以作為基底薄膜101所使用的PET薄膜而言,主要採用2軸延伸薄膜。2軸延伸薄膜係一邊朝向與進給方向呈垂直的寬幅方向施加延伸一邊予以製造。因此,在薄膜內部容易殘留殘留應力,在PET薄膜的面內,殘留應力分布容易變得不均一。若有殘留應力大的部位、及小的部位,在PET薄膜內部會產生折射率差。在殘留應力大的部位,由於在PET薄膜內部,折射率差大,因此光的反射大。另一方面,在殘留應力小的部位,相較於殘留應力大的部位,PET薄膜內部的折射率差較小,光的反射量亦較小。 As the PET film used as the base film 101, a 2-axis stretch film is mainly used. The two-axis stretch film is produced while being stretched in a direction perpendicular to the feed direction. Therefore, residual stress is likely to remain in the inside of the film, and the residual stress distribution tends to be uneven in the surface of the PET film. If there is a portion with a large residual stress and a small portion, a refractive index difference occurs inside the PET film. In the portion where the residual stress is large, since the refractive index difference is large inside the PET film, the reflection of light is large. On the other hand, in a portion where the residual stress is small, the difference in refractive index inside the PET film is small compared to the portion where the residual stress is large, and the amount of reflection of light is also small.

若在蓋透鏡使用包含如上所示之PET薄膜作為基底薄膜101的AR薄膜100,會產生如下所示之問題。亦即,若使影像由顯示器的內側投影,當由內側入射至蓋透鏡內的光進入至PET薄膜時,在殘留應力大的場所與小的場所,光的反射方式會改變。結果,若通過殘留應力大的部位與殘留應力小的部位的光分別進入至人的眼腈時,各個部位的光的反射量的差在顯示器上形成為顏色不均被辨識。 If the AR film 100 including the PET film as described above is used as the base film 101 in the cover lens, the following problems occur. In other words, when the image is projected from the inside of the display, when the light incident on the inside of the cover lens from the inside enters the PET film, the reflection mode of the light changes in a place where the residual stress is large and in a small place. As a result, when the portion where the residual stress is large and the portion where the residual stress is small enters the human eye nitrile, respectively, the difference in the amount of reflection of light at each portion is formed on the display to be recognized as color unevenness.

因此,存在殘留應力大的部位的AR薄膜並無法使用,被作為不良品進行處理。此外,若為插入成形,成形工程亦包含依序進行預成形工程、正式成形工程、修整工程等眾多工程。 Therefore, the AR film having a portion where the residual stress is large cannot be used, and is treated as a defective product. In addition, in the case of insert molding, the forming process also includes a number of projects such as pre-forming, formal forming, and finishing.

為解決上述課題,有使用不需要進行預成形及修整工程且未使薄膜轉印而僅使AR層轉印的模內成形方式的情形。 In order to solve the above problems, there is a case where an in-mold forming method in which only the AR layer is transferred without transferring the film without performing pre-forming and trimming is used.

接著,一邊參照圖9,一邊說明在模內成形中所使用的一般轉印型AR薄膜的構成。圖9係一般轉印型的AR薄膜301的剖面圖。AR薄膜301為連續薄膜。AR薄膜301大致區分為由未被轉印至成形品的載體層302、及被轉印至成形品的表面的轉印層303所構成。載體層302係具有:基底薄膜201、及剝離層202。轉印層303係具有:AR層203、硬塗層204、及接著層205的功能膜層。 Next, the configuration of the general transfer type AR film used in the in-mold molding will be described with reference to Fig. 9 . Fig. 9 is a cross-sectional view showing a general transfer type AR film 301. The AR film 301 is a continuous film. The AR film 301 is roughly divided into a carrier layer 302 that has not been transferred to a molded article, and a transfer layer 303 that is transferred to the surface of the molded article. The carrier layer 302 has a base film 201 and a peeling layer 202. The transfer layer 303 has a functional layer of an AR layer 203, a hard coat layer 204, and an adhesive layer 205.

基底薄膜201係以PET或丙烯酸薄膜等所形成,發揮將AR薄膜301連續供給至模具內的作用。剝離層202 係發揮使基底薄膜201及被轉印至成形品的轉印層303剝離的作用。AR層203係減少外光在成形品的最表面的反射。硬塗層204係用以使AR層203賦予強度及硬度的保護層。接著層205係發揮使經熔融的樹脂接著在轉印層303的作用。其中,若硬塗層204亦具有與熔融樹脂的接著功能,接著層205並不需要特別重新形成。如以上所示AR薄膜301係由複數層所構成。 The base film 201 is formed of PET, an acrylic film, or the like, and functions to continuously supply the AR film 301 into the mold. Peeling layer 202 This serves to peel off the base film 201 and the transfer layer 303 transferred to the molded article. The AR layer 203 reduces reflection of external light on the outermost surface of the molded article. The hard coat layer 204 is a protective layer for imparting strength and hardness to the AR layer 203. Next, the layer 205 functions to cause the molten resin to adhere to the transfer layer 303. Wherein, if the hard coat layer 204 also has an adhesive function with the molten resin, the subsequent layer 205 does not need to be specially reformed. As described above, the AR film 301 is composed of a plurality of layers.

接著,一邊參照圖9、圖10,一邊說明使AR薄膜301以模內成形工法轉印在成形品表面的製程。圖10係按每個工程說明連續模內成形的製程的圖。 Next, a process of transferring the AR film 301 onto the surface of the molded article by an in-mold forming method will be described with reference to Figs. 9 and 10 . Figure 10 is a diagram showing the process of continuous in-mold forming for each project.

在工程A中,首先,在固定模1與可動模2之間,使用進給裝置3將AR薄膜301傳送至預定位置。此時,AR薄膜301係以基底薄膜201朝向可動模2的方式作配置。此外,亦可以AR薄膜301容易在模具成型的方式,將AR薄膜301以未圖示的加熱器預熱之後,再送入至模具內。在將AR薄膜301送至預定位置之後,在工程B中,係以在可動模2的空腔面所空出的吸引孔4來吸引AR薄膜301,且對可動模2的空腔面將AR薄膜301進行成型。此時,以未圖示的薄膜按壓機構,將AR薄膜301的外周固定定位。之後,在工程C中,移動可動模2來進行合模。接著,在工程D中,由固定模1的澆口5,朝向AR薄膜301的接著層205注入經熔融的樹脂6,在模具內的空腔內填充經熔融的樹脂6。 In the work A, first, between the fixed mold 1 and the movable mold 2, the AR film 301 is conveyed to a predetermined position by using the feeding device 3. At this time, the AR film 301 is disposed such that the base film 201 faces the movable mold 2. Further, the AR film 301 may be easily heated in a mold, and the AR film 301 may be preheated by a heater (not shown) and then fed into the mold. After the AR film 301 is sent to a predetermined position, in the engineering B, the AR film 301 is attracted by the suction holes 4 vacated in the cavity surface of the movable mold 2, and the cavity surface of the movable mold 2 is AR. The film 301 is molded. At this time, the outer circumference of the AR film 301 is fixedly positioned by a film pressing mechanism (not shown). Thereafter, in the project C, the movable mold 2 is moved to perform mold clamping. Next, in the process D, the molten resin 6 is injected from the gate 5 of the fixed mold 1 toward the adhesive layer 205 of the AR film 301, and the molten resin 6 is filled in the cavity in the mold.

經熔融的樹脂6的填充一完成,在工程E中,將經熔 融的樹脂6冷卻至預定溫度。在工程F中,使可動模2運轉而開模,且取出模內成形品7。此時,AR薄膜301的載體層302由模內成形品7被剝落,僅被轉印轉印層303。結果,在模內成形品7的最表面被轉印AR層203。之後,在工程G中,推出被設在固定模1的突出銷8,由模具內取出模內成形品7。在工程H中,首先,阻止藉由吸引孔4而將AR薄膜301的載體層302吸附至可動模2的空腔內,以備接下來的成形。接著,藉由進給裝置3,將在AR薄膜301中使用在接下來的成形的部分傳送至預定位置。反覆以上的一連串動作來連續成形。 After the filling of the molten resin 6 is completed, in the engineering E, the melt will be melted. The molten resin 6 is cooled to a predetermined temperature. In the work F, the movable mold 2 is operated to open the mold, and the in-mold molded article 7 is taken out. At this time, the carrier layer 302 of the AR film 301 is peeled off from the in-mold molded article 7, and only the transfer layer 303 is transferred. As a result, the AR layer 203 is transferred on the outermost surface of the in-mold molded article 7. Thereafter, in the project G, the protruding pin 8 provided in the fixed mold 1 is pushed out, and the in-mold molded article 7 is taken out from the mold. In the work H, first, the carrier layer 302 of the AR film 301 is prevented from being adsorbed into the cavity of the movable mold 2 by the suction holes 4 for the subsequent molding. Next, by using the feeding device 3, the portion to be formed in the AR film 301 to be conveyed to the next position is transferred to a predetermined position. Repeat the above series of actions to form continuously.

若為模內成形方式,作為基底薄膜201的PET等係作為用以將轉印層303送入至模具內的載體來發揮功能。亦即,基底薄膜201並未被轉印至模內成形品7。因此,在上述插入成形中成為課題的PET內的殘留應力的問題即被解決。此外,在模具內從最初即直接送入AR薄膜301進行射出成形,僅由模內取出模內成形品7,即可使轉印層303轉印在模內成形品7的表面。因此,不需要薄膜的預成形及成形後的修整工程。因此,模內成形方式係生產性高,比插入成形方式為更高效率(參照例如日本特開2012-096412號公報)。 In the case of the in-mold forming method, PET or the like as the base film 201 functions as a carrier for feeding the transfer layer 303 into the mold. That is, the base film 201 is not transferred to the in-mold molded article 7. Therefore, the problem of the residual stress in the PET which is a problem in the above-described insert molding is solved. Further, the AR film 301 is directly fed into the mold from the first place to be injection-molded, and the transfer layer 303 is transferred onto the surface of the in-mold molded article 7 only by taking out the in-mold molded article 7 from the inside of the mold. Therefore, pre-forming of the film and finishing work after forming are not required. Therefore, the in-mold forming method has high productivity and is more efficient than the insert molding method (see, for example, Japanese Laid-Open Patent Publication No. 2012-096412).

本發明係提供可將剝離層與功能層之間的剝離強度輕易地最適化的模內成形用的轉印薄膜及其製造方法。 The present invention provides a transfer film for in-mold forming which can easily optimize the peel strength between a release layer and a functional layer, and a method for producing the same.

本發明之模內成形用轉印薄膜係具有:基底薄膜、剝離層、及反射防止層。剝離層係具有:與基底薄膜相接的第1面、及該第1面的背側的第2面。反射防止層係與剝離層的第2面相接。反射防止層係具有:具有有機鏈的第1樹脂;及包含在該第1樹脂中,折射率比第1樹脂為較低的複數低折射率微粒子。在反射防止層中,至少在與剝離層的界面,設有第1樹脂的有機鏈的一部分被分解而形成的複數空隙。空隙的各個係比低折射率微粒子的各個為較小。 The transfer film for in-mold forming of the present invention has a base film, a release layer, and an antireflection layer. The peeling layer has a first surface that is in contact with the base film and a second surface that is on the back side of the first surface. The antireflection layer is in contact with the second surface of the release layer. The antireflection layer has a first resin having an organic chain, and a plurality of low refractive index fine particles having a lower refractive index than the first resin in the first resin. In the antireflection layer, at least at the interface with the release layer, a plurality of voids in which a part of the organic chain of the first resin is decomposed are provided. Each of the voids is smaller than each of the low refractive index microparticles.

此外,在本發明之轉印型薄膜之製造方法中,首先,依序積層:基底薄膜、剝離層、在具有有機鏈的第1樹脂中包含折射率比第1樹脂為較低的複數低折射率微粒子的反射防止層、及光觸媒層。接著,對光觸媒層照射紫外線而在反射防止層中至少與剝離層的界面形成比低折射率微粒子的各個為較小的複數空隙。此時,藉由紫外線的照射,在光觸媒層生成電子,電子進入至前述反射防止層,將有機鏈的一部分分解而形成空隙。調整藉由此時的紫外線的照射量所形成的空隙的量。 Further, in the method for producing a transfer film of the present invention, first, a base film, a release layer, and a first resin having an organic chain are included in a plurality of low refractive indexes having a lower refractive index than that of the first resin. Rate the antireflection layer of the microparticles and the photocatalyst layer. Next, the photocatalyst layer is irradiated with ultraviolet rays, and at least the voids of the low refractive index microparticles are formed in the antireflection layer at least at the interface with the peeling layer. At this time, electrons are generated in the photocatalyst layer by irradiation of ultraviolet rays, and electrons enter the antireflection layer, and a part of the organic chain is decomposed to form a void. The amount of voids formed by the amount of irradiation of ultraviolet rays at this time is adjusted.

如以上所示,藉由本發明之轉印薄膜及轉印薄膜之製造方法,不易發生模內成形時對成形品表面的轉印不良,可使剝離層與AR層等功能層之間的剝離強度成為最適。而且,可進行剝離層與功能層之間的剝離強度的微調整。 As described above, according to the method for producing a transfer film and a transfer film of the present invention, it is less likely to cause a transfer failure on the surface of the molded article during in-mold molding, and the peeling strength between the release layer and the functional layer such as the AR layer can be obtained. Be the best. Moreover, fine adjustment of the peel strength between the peeling layer and the functional layer can be performed.

1‧‧‧固定模 1‧‧‧Fixed mode

1A‧‧‧固定模 1A‧‧‧Fixed mode

1B‧‧‧固定模 1B‧‧‧Fixed mode

2‧‧‧可動模 2‧‧‧ movable mold

2A‧‧‧可動模 2A‧‧‧ movable mold

2B‧‧‧可動模 2B‧‧‧ movable mold

3‧‧‧進給裝置 3‧‧‧Feeding device

4‧‧‧吸引孔 4‧‧‧Attraction hole

5‧‧‧澆口 5‧‧‧Gate

6‧‧‧樹脂 6‧‧‧Resin

7‧‧‧模內成形品 7‧‧‧In-mold molded products

8‧‧‧突出銷 8‧‧‧Highlight

100‧‧‧AR薄膜 100‧‧‧AR film

101‧‧‧基底薄膜 101‧‧‧Base film

102‧‧‧AR層 102‧‧‧AR layer

103‧‧‧硬塗層 103‧‧‧hard coating

104‧‧‧接著層 104‧‧‧Next layer

105‧‧‧插入成形品 105‧‧‧Insert molded products

105C‧‧‧附AR的插入成形品 105C‧‧‧ Inserted molded article with AR

106‧‧‧切割器 106‧‧‧Cutter

110‧‧‧轉印型AR薄膜(AR薄膜) 110‧‧‧Transfer type AR film (AR film)

111‧‧‧AR層 111‧‧‧AR layer

112‧‧‧光觸媒層 112‧‧‧Photocatalyst layer

113‧‧‧引體層 113‧‧‧ Pull-up layer

114‧‧‧低折射率微粒子(第1粒子) 114‧‧‧Low-refractive-index microparticles (first particle)

115A‧‧‧樹脂基質 115A‧‧‧Resin matrix

115B‧‧‧樹脂基質 115B‧‧‧Resin matrix

116‧‧‧光觸媒微粒子(第2粒子) 116‧‧‧Photocatalyst particles (2nd particle)

117‧‧‧有機鏈 117‧‧ organic chain

118‧‧‧電子 118‧‧‧Electronics

119‧‧‧空隙 119‧‧‧ gap

120‧‧‧放捲部 120‧‧‧Reeling Department

121‧‧‧收捲部 121‧‧‧Winding Department

122‧‧‧凹版滾筒 122‧‧‧gravure cylinder

123‧‧‧刮刀 123‧‧‧ scraper

124‧‧‧液皿 124‧‧‧ liquid dish

125‧‧‧導引滾筒 125‧‧‧Guide roller

126‧‧‧轉印型AR薄膜(AR薄膜) 126‧‧‧Transfer type AR film (AR film)

127‧‧‧光觸媒層 127‧‧‧Photocatalyst layer

201‧‧‧基底薄膜 201‧‧‧Base film

202‧‧‧剝離層 202‧‧‧ peeling layer

203‧‧‧AR層 203‧‧‧AR layer

204‧‧‧硬塗層 204‧‧‧hard coating

205‧‧‧接著層 205‧‧‧Next layer

210‧‧‧基底薄膜 210‧‧‧Base film

211‧‧‧熱乾燥爐 211‧‧‧heat drying oven

212‧‧‧紫外線照射部 212‧‧‧UV irradiation department

213‧‧‧金屬鹵素燈 213‧‧‧Metal halogen lamp

214‧‧‧紫外線 214‧‧‧ UV

301‧‧‧AR薄膜 301‧‧‧AR film

302‧‧‧載體層 302‧‧‧ Carrier layer

303‧‧‧轉印層 303‧‧‧Transfer layer

圖1A係本發明之實施形態1中的轉印型AR薄膜的剖面圖。 Fig. 1A is a cross-sectional view showing a transfer type AR film in the first embodiment of the present invention.

圖1B係本發明之實施形態1中的轉印型AR薄膜的層構成的剖面圖。 Fig. 1B is a cross-sectional view showing a layer configuration of a transfer type AR film in the first embodiment of the present invention.

圖2係顯示本發明之實施形態1中的AR層的塗佈裝置的構成的圖。 Fig. 2 is a view showing the configuration of a coating device for an AR layer in the first embodiment of the present invention.

圖3係顯示本發明之實施形態1中的光觸媒層的塗佈裝置的構成的圖。 Fig. 3 is a view showing the configuration of a coating device for a photocatalyst layer in the first embodiment of the present invention.

圖4係按每個工程說明本發明之實施形態1中的空隙的形成製程的圖。 Fig. 4 is a view for explaining a process of forming a void in the first embodiment of the present invention for each project.

圖5係本發明之實施形態1中的最終形態的轉印型AR薄膜的剖面圖。 Fig. 5 is a cross-sectional view showing a transfer type AR film of a final form in the first embodiment of the present invention.

圖6係說明本發明之實施形態2中的光觸媒層的塗佈工程的圖。 Fig. 6 is a view for explaining a coating process of a photocatalyst layer in the second embodiment of the present invention.

圖7係習知之插入成形用AR薄膜的剖面圖。 Fig. 7 is a cross-sectional view showing a conventional AR film for insert molding.

圖8係按每個工程說明插入成形的製程的圖。 Fig. 8 is a view showing a process of insert molding in accordance with each engineering description.

圖9係一般的轉印型AR薄膜的剖面圖。 Figure 9 is a cross-sectional view showing a general transfer type AR film.

圖10係按每個工程說明連續模內成形的製程的圖。 Figure 10 is a diagram showing the process of continuous in-mold forming for each project.

在說明本發明之實施形態之前,簡單說明習知之轉印型AR薄膜中的問題點。在前述的一般轉印型的AR薄膜301中,由耐候性、塗膜強度的觀點來看,有以作為無機系材料的矽氧樹脂等熱硬化性樹脂來形成AR層203的情 形。在如上所示之情形下,適用溶膠凝膠法作為AR材料用的塗敷液。若使用以溶膠凝膠法所形成的塗敷液,可以濕式塗敷形成AR層203。亦即,可以凹版塗敷、模具塗敷等來形成100nm左右的薄層AR層203。 Before explaining the embodiment of the present invention, a problem in the conventional transfer type AR film will be briefly described. In the above-described general transfer type AR film 301, the AR layer 203 is formed of a thermosetting resin such as a silicone resin as an inorganic material from the viewpoint of weather resistance and film strength. shape. In the case as described above, the sol-gel method is applied as a coating liquid for an AR material. When the coating liquid formed by the sol-gel method is used, the AR layer 203 can be formed by wet coating. That is, the thin layer AR layer 203 of about 100 nm can be formed by gravure coating, die coating, or the like.

若在剝離層202上塗佈AR材料,AR材料中所含有的熱硬化性的矽氧樹脂會起熱硬化反應,若反應進行,形成3次元交聯構造。此時,AR材料進入至存在於剝離層202上的微細凹凸,若熱硬化反應進行,藉由存在於剝離層202上或剝離層202內的微細凹凸,在剝離層202與AR層203之間,接點會增加。結果,剝離層202與AR層203的密接性變佳,AR層203難以由剝離層202剝落。若剝離層202與AR層203之間的剝離強度變得過大,在成形時應被轉印在成形樹脂表面的AR層203未順利地由剝離層202剝離,AR層203未完全由剝離層202脫模,在剝離層202上殘留AR層203的一部分,容易發生轉印不良。 When the AR material is applied to the release layer 202, the thermosetting epoxy resin contained in the AR material undergoes a thermosetting reaction, and when the reaction proceeds, a three-dimensional crosslinked structure is formed. At this time, the AR material enters the fine concavities and convexities existing on the peeling layer 202, and if the thermosetting reaction proceeds, the fine concavities and convexities existing on the peeling layer 202 or in the peeling layer 202 are between the peeling layer 202 and the AR layer 203. The contacts will increase. As a result, the adhesion between the peeling layer 202 and the AR layer 203 is improved, and the AR layer 203 is less likely to be peeled off by the peeling layer 202. If the peeling strength between the peeling layer 202 and the AR layer 203 becomes excessively large, the AR layer 203 which should be transferred to the surface of the molding resin at the time of molding is not smoothly peeled off by the peeling layer 202, and the AR layer 203 is not completely removed by the peeling layer 202. When the mold is released, a part of the AR layer 203 remains on the peeling layer 202, and transfer failure easily occurs.

如上所示,若在成形時,剝離層202與AR層203之間的剝離強度過大,AR層203未漂亮地被轉印至成形品表面時,必須進行減小剝離層202與AR層203之間的剝離強度的調整。以習知之AR薄膜301減小剝離層202與AR層203之間的剝離強度時,一般而言,藉由變更剝離層202的材料組成、或變更剝離層202的厚度,來調整剝離層202的剝離強度。因此,必須按積層在剝離層202上的每個材料,每次進行最適化。在該最適化時,特定積層 在剝離層202上的材料,以不斷試驗及失敗來反覆變更剝離層202的材料組成及厚度。因此,至最適化為止耗費時間。亦即,無法依各式各樣的條件,即時且具有自由度地調整剝離強度,若一旦決定組成等,即無法調整剝離強度,且無法輕易地將剝離強度最適化。 As described above, when the peeling strength between the peeling layer 202 and the AR layer 203 is excessively large at the time of molding, and the AR layer 203 is not beautifully transferred to the surface of the molded article, it is necessary to reduce the peeling layer 202 and the AR layer 203. The adjustment of the peel strength between. When the conventional AR film 301 reduces the peel strength between the peeling layer 202 and the AR layer 203, generally, the peeling layer 202 is adjusted by changing the material composition of the peeling layer 202 or changing the thickness of the peeling layer 202. Peel strength. Therefore, it is necessary to optimize each time the material is laminated on the peeling layer 202. At the time of optimization, a specific layer The material on the release layer 202 is repeatedly altered in material composition and thickness by continuous testing and failure. Therefore, it takes time to optimize. In other words, the peel strength cannot be adjusted in an instant and with a degree of freedom according to various conditions. If the composition is determined, the peel strength cannot be adjusted, and the peel strength cannot be easily optimized.

以下一邊參照圖示,一邊說明本發明之實施形態。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.

(實施形態1) (Embodiment 1)

圖1A、圖1B分別為本發明之實施形態1中的轉印型AR薄膜(以下為AR薄膜)110、126的剖面圖。AR薄膜110係分別具有光觸媒層112及硬塗層204,圖1A係亦顯示AR層111及光觸媒層112的放大圖。AR薄膜126係具有亦作為硬塗層來發揮功能的光觸媒層127,圖1B係亦顯示光觸媒層127及AR層111的放大圖。在圖1A、圖1B中,關於與圖7~圖9為相同的構成要素,係使用相同符號,且省略說明。 1A and 1B are cross-sectional views showing transfer-type AR thin films (hereinafter referred to as AR thin films) 110 and 126 in the first embodiment of the present invention. The AR film 110 has a photocatalyst layer 112 and a hard coat layer 204, respectively, and FIG. 1A also shows an enlarged view of the AR layer 111 and the photocatalyst layer 112. The AR film 126 has a photocatalyst layer 127 that also functions as a hard coat layer, and FIG. 1B also shows an enlarged view of the photocatalyst layer 127 and the AR layer 111. In FIGS. 1A and 1B, the same components as those in FIGS. 7 to 9 are denoted by the same reference numerals, and description thereof will be omitted.

圖1A所示之AR薄膜110基本上具有:基底薄膜201、剝離層202、作為反射防止層的AR層111、光觸媒層112、後硬化型的硬塗層204、引體層113、接著層205,該等層係依該順序作積層。此外,在基底薄膜201之與AR層111為相反側,亦可視需要而設置帶電防止層。 The AR film 110 shown in FIG. 1A basically has a base film 201, a peeling layer 202, an AR layer 111 as an antireflection layer, a photocatalyst layer 112, a post-hardening type hard coat layer 204, a puller layer 113, and an adhesive layer 205. The layers are laminated in this order. Further, on the side opposite to the AR layer 111 of the base film 201, a charging prevention layer may be provided as needed.

一般而言,以基底薄膜201而言,係可使用平均厚度20~100μm的PET薄膜或丙烯酸薄膜等。在以下說明 中,係使用平均厚度50μm的PET薄膜。 In general, as the base film 201, a PET film or an acrylic film having an average thickness of 20 to 100 μm can be used. In the following description Among them, a PET film having an average thickness of 50 μm was used.

剝離層202以一般的三聚氰胺樹脂、烯烴樹脂等所形成,其平均厚度為0.03~0.15μm。在以下說明中,係使用三聚氰胺樹脂而形成為平均厚度1μm。 The peeling layer 202 is formed of a general melamine resin, an olefin resin, or the like, and has an average thickness of 0.03 to 0.15 μm. In the following description, a melamine resin was used to form an average thickness of 1 μm.

接著說明AR層111。如圖1A的部分放大圖所示,AR層111係具有:由第1樹脂所形成的樹脂基質115A;及在樹脂基質115A含有(分散),由無機材料所形成的複數低折射率微粒子(以下為第1粒子)114。 Next, the AR layer 111 will be described. As shown in a partially enlarged view of FIG. 1A, the AR layer 111 has a resin matrix 115A formed of a first resin, and a plurality of low refractive index fine particles (hereinafter, dispersed and formed of an inorganic material in the resin matrix 115A (hereinafter It is the first particle) 114.

第1粒子114係具有比構成樹脂基質115A的第1樹脂為更低的折射率。具體而言,第1粒子114的折射率為1.2以上、1.4以下。以第1粒子114的材質而言,可列舉:多孔質二氧化矽、中空二氧化矽、氟化鎂、冰晶石等。除了該等之外,若呈現同樣的低折射率,即不需要限定於該等。此外,亦可將該等單獨使用或併用2種類以上。 The first particles 114 have a lower refractive index than the first resin constituting the resin matrix 115A. Specifically, the refractive index of the first particles 114 is 1.2 or more and 1.4 or less. Examples of the material of the first particles 114 include porous ceria, hollow ceria, magnesium fluoride, and cryolite. In addition to these, if the same low refractive index is exhibited, it is not necessary to be limited to these. Further, these may be used alone or in combination of two or more types.

第1樹脂為例如硬化性樹脂的矽氧樹脂。亦可以單體使用在分子內具有有機鏈的例如烷基矽氧樹脂而形成樹脂基質115A。或者,亦可併用複數在分子內具有不同種類的有機鏈的矽氧樹脂而形成樹脂基質115A。以在分子內具有有機鏈的矽氧樹脂而言,係列舉具有加水分解性甲矽烷基的矽氧樹脂。如上所示之矽氧樹脂係可由有機加水分解縮合物及其部分加水分解物之中至少一方進行調製。在加水分解縮合性化合物的分子,係具有有機鏈、及與該有機鏈的兩末端的各個相鍵結的加水分解性甲矽烷基。此 外,在有機鏈亦可鍵結取代基。以有機鏈而言,列舉:伸烷基、氟化伸烷基、醚基、乙烯基、環氧基、胺基、甲基丙烯基、巰基等,亦可使用具有該等的矽氧樹脂作為第1樹脂。此外,亦可以不含有有機鏈的矽氧樹脂為主體,併用具有有機鏈的矽烷偶合劑。亦可單獨或併用2種類以上之具有該等有機鏈的矽氧樹脂而作為第1樹脂來使用。亦可單獨使用不含有有機鏈的矽氧樹脂與具有有機鏈的矽烷偶合劑,或者併用2種類以上的具有不同種類的有機鏈的矽烷偶合劑。此外,亦可對AR層111同時賦予其他功能,例如防污及耐指紋性等。此時,亦可一起添加氟矽氧樹脂等撥水劑、帶電防止劑及具有帶電防止效果的金屬氧化物微粒子等添加劑。 The first resin is a silicone resin such as a curable resin. The resin matrix 115A may also be formed by using, for example, an alkyloxy resin having an organic chain in the molecule. Alternatively, the resin matrix 115A may be formed by using a plurality of oxime resins having different kinds of organic chains in the molecule. As the oxime resin having an organic chain in the molecule, a series of oxime resins having a hydrolyzable formyl group are mentioned. The above-described oxime resin can be prepared by at least one of an organic hydrolyzed condensate and a partial hydrolyzate thereof. The molecule which hydrolyzes the condensable compound has an organic chain and a hydrolyzable formyl group bonded to each phase of both ends of the organic chain. this In addition, a substituent may be bonded to the organic chain. In terms of the organic chain, an alkyl group, a fluorinated alkyl group, an ether group, a vinyl group, an epoxy group, an amine group, a methacryl group, a fluorenyl group, etc. may be mentioned, and a phthalocyanine resin having the same may be used. The first resin. Further, a decane coupling agent having an organic chain may be used as a main component of the oxirane resin having no organic chain. Two or more types of oxime resins having these organic chains may be used alone or in combination as the first resin. A decane coupling agent having no organic chain and a decane coupling agent having an organic chain may be used alone, or two or more types of decane coupling agents having different types of organic chains may be used in combination. In addition, the AR layer 111 can be simultaneously provided with other functions such as antifouling and fingerprint resistance. In this case, an additive such as a water repellent agent such as a fluorocarbon resin, a charge prevention agent, and a metal oxide fine particle having a charge prevention effect may be added together.

AR層111的平均厚度為0.05μm以上、0.15μm以下,較佳為以0.08μm以上、0.12μm以下所形成為宜。若平均厚度比0.05μm為更薄,AR層111的膜的強度容易變弱,若比0.15μm為更厚,在可見光域的AR層111的反射率變高,無法獲得反射防止的效果。 The average thickness of the AR layer 111 is preferably 0.05 μm or more and 0.15 μm or less, and more preferably 0.08 μm or more and 0.12 μm or less. When the average thickness is thinner than 0.05 μm, the strength of the film of the AR layer 111 tends to be weak, and if it is thicker than 0.15 μm, the reflectance of the AR layer 111 in the visible light region becomes high, and the effect of preventing reflection cannot be obtained.

在AR層111中,第1粒子114對第1樹脂的重量比係決定AR層111的折射率。若使用具有0.04μm的平均粒子徑的多孔質二氧化矽作為第1粒子114,若以固形分100質量%比率進行換算,上述重量比係以30質量%以上、85質量%以下為宜。較佳為40質量%以上、80質量%以下。若使第1粒子114在40質量%以上、80質量%以下的範圍含有,AR層111本身的折射率係成為1.31~ 1.38左右。 In the AR layer 111, the weight ratio of the first particles 114 to the first resin determines the refractive index of the AR layer 111. When the porous ceria having an average particle diameter of 0.04 μm is used as the first particles 114, the weight ratio is preferably 30% by mass or more and 85% by mass or less based on 100% by mass of the solid content. It is preferably 40% by mass or more and 80% by mass or less. When the first particles 114 are contained in a range of 40% by mass or more and 80% by mass or less, the refractive index of the AR layer 111 itself is 1.31. 1.38 or so.

若上述重量比少於30質量%,AR層111未充分低折射率化,難以發揮所需的反射防止性能。此外,若多孔質二氧化矽的重量比多於85質量%,AR層111的機械強度變弱,且耐磨性降低。亦即,無法獲得充分的塗膜強度。 When the weight ratio is less than 30% by mass, the AR layer 111 is not sufficiently lowered in refractive index, and it is difficult to exhibit desired reflection preventing performance. Further, when the weight ratio of the porous ceria is more than 85% by mass, the mechanical strength of the AR layer 111 becomes weak, and the abrasion resistance is lowered. That is, sufficient film strength cannot be obtained.

以被分散在樹脂基質115A中的第1粒子114而言,係可使用溶膠類型、球狀類型、多孔質類型等。第1粒子114的平均粒子徑係以0.01μm以上、0.1μm以下為宜。若平均粒子徑小於0.01μm,難以將AR層111的折射率調整為預定之期望的值。若平均粒子徑大於0.1μm,當將AR層111以凹版塗敷機等進行塗佈時,容易發生第1粒子114的凝集物,在所塗佈的薄膜上的塗膜面,容易發生因凝集物而起的外觀不良。 For the first particles 114 dispersed in the resin matrix 115A, a sol type, a spherical type, a porous type, or the like can be used. The average particle diameter of the first particles 114 is preferably 0.01 μm or more and 0.1 μm or less. If the average particle diameter is less than 0.01 μm, it is difficult to adjust the refractive index of the AR layer 111 to a predetermined desired value. When the average particle diameter is larger than 0.1 μm, when the AR layer 111 is applied by a gravure coater or the like, aggregates of the first particles 114 are likely to occur, and the coating film surface on the applied film is likely to be agglomerated. The appearance of the object is poor.

接著,說明光觸媒層112。如圖1A的部分放大圖所示,光觸媒層112係具有:以第2樹脂形成的樹脂基質115B;及在樹脂基質115B含有(分散)的複數光觸媒微粒子(以下為第2粒子)116。以第2粒子116而言,係以使用例如可相較容易取得的氧化鈦、氧化鋅為佳。但是,以光觸媒而言,除了氧化錫、氧化鐵、氧化鋯、氧化鎢、氧化鉻、氧化鉬、氧化釕、氧化鍺、氧化鉛、氧化鎘、氧化銅、氧化釩、氧化鈮、氧化鉭、氧化錳、氧化鈷、氧化銠、氧化鎳、氧化錸等金屬氧化物之外,亦可以鈦酸鍶等代用。但是,除了該等之外,若為達成相同效果的材料,並不需要限定於該等。此外,可將該等第2粒子 116單獨或併用二種類以上。 Next, the photocatalyst layer 112 will be described. As shown in a partially enlarged view of FIG. 1A, the photocatalyst layer 112 has a resin matrix 115B formed of a second resin, and a plurality of photocatalyst fine particles (hereinafter referred to as second particles) 116 contained (dispersed) in the resin matrix 115B. In the second particle 116, for example, titanium oxide or zinc oxide which can be easily obtained is preferably used. However, in the case of photocatalyst, in addition to tin oxide, iron oxide, zirconium oxide, tungsten oxide, chromium oxide, molybdenum oxide, cerium oxide, cerium oxide, lead oxide, cadmium oxide, copper oxide, vanadium oxide, cerium oxide, cerium oxide, In addition to metal oxides such as manganese oxide, cobalt oxide, cerium oxide, nickel oxide, and cerium oxide, barium titanate or the like may be substituted. However, in addition to these, it is not necessary to be limited to these materials in order to achieve the same effect. In addition, the second particles can be 116 alone or in combination of two or more types.

構成樹脂基質115B的第2樹脂為例如未含有有機鏈的矽氧樹脂等。由光觸媒層112的折射率的觀點來看,若欲製作更為高折射率的光觸媒層112,亦可將其他金屬烷氧化物(例如鈦、二氧化鋯等)等單獨或併用而形成樹脂基質115B。 The second resin constituting the resin matrix 115B is, for example, a silicone resin containing no organic chain. From the viewpoint of the refractive index of the photocatalyst layer 112, if a photocatalyst layer 112 having a higher refractive index is to be formed, other metal alkoxides (for example, titanium, zirconia, etc.) may be used alone or in combination to form a resin matrix. 115B.

光觸媒層112的平均厚度係以0.01μm以上、0.3μm以下為佳,較佳為0.03μm以上、0.15μm以下。若平均厚度比0.01μm為更薄,光觸媒層112的光觸媒作用會變弱,如後所述在將AR層111內的有機物分解時,並不充分。此外,使用無機系的熱硬化性樹脂作為第2樹脂,若平均厚度大於0.3μm,光觸媒層112的可撓性會降低,在模內成形時破損而容易發生微小裂痕。 The average thickness of the photocatalyst layer 112 is preferably 0.01 μm or more and 0.3 μm or less, and more preferably 0.03 μm or more and 0.15 μm or less. If the average thickness is thinner than 0.01 μm, the photocatalytic action of the photocatalyst layer 112 becomes weak, and when the organic matter in the AR layer 111 is decomposed as described later, it is not sufficient. Further, when an inorganic thermosetting resin is used as the second resin, when the average thickness is more than 0.3 μm, the flexibility of the photocatalyst layer 112 is lowered, and it is broken during molding in the mold, and micro cracks are likely to occur.

在光觸媒層112中,第2粒子116對第2樹脂的重量比係決定光觸媒作用及折射率。若使用直徑為0.05μm的氧化鈦作為第2粒子116,若以固形分100質量%比率進行換算,上述重量比係以20質量%以上、90質量%以下為宜。較佳為50質量%以上、80質量%以下。若上述重量比少於20質量%,光觸媒層112的光觸媒作用未被充分呈現。此外,若上述重量比多於90質量%,樹脂分變少,與其他層的密接性等機械強度會降低。 In the photocatalyst layer 112, the weight ratio of the second particles 116 to the second resin determines the photocatalytic action and the refractive index. When titanium oxide having a diameter of 0.05 μm is used as the second particles 116, the weight ratio is preferably 20% by mass or more and 90% by mass or less based on 100% by mass of the solid content. It is preferably 50% by mass or more and 80% by mass or less. If the above weight ratio is less than 20% by mass, the photocatalytic action of the photocatalyst layer 112 is not sufficiently exhibited. In addition, when the weight ratio is more than 90% by mass, the resin is less converted, and the mechanical strength such as adhesion to other layers is lowered.

以第2粒子116而言,藉由使用相較容易取得的氧化鈦、氧化鋅,光觸媒層112的折射率亦可較高,高折射率層可配置在AR層111的下部。因此,在光學設計上,以 AR薄膜110而言,可製作外光反射率較低、且對表面的反射眩光較少的轉印型AR薄膜。 In the second particle 116, the refractive index of the photocatalyst layer 112 can be made high by using titanium oxide or zinc oxide which are relatively easy to obtain, and the high refractive index layer can be disposed in the lower portion of the AR layer 111. Therefore, in optical design, In the AR film 110, a transfer type AR film having a low external light reflectance and less glare on the surface can be produced.

此外,以被分散在樹脂基質115B中的第2粒子116而言,亦可使用溶膠類型、球狀類型、多孔質類型等。第2粒子116的平均粒子徑係以0.01μm以上、0.1μm以下為宜。若平均粒子徑小於0.01μm,難以充分獲得光觸媒層112的光觸媒效果。若平均粒子徑大於0.1μm,當以凹版塗敷機等塗佈光觸媒層112時,第2粒子116的凝集物容易形成,在薄膜上成為因第2粒子116而起的外觀不良發生的要因。 Further, as the second particles 116 dispersed in the resin matrix 115B, a sol type, a spherical type, a porous type or the like can be used. The average particle diameter of the second particles 116 is preferably 0.01 μm or more and 0.1 μm or less. If the average particle diameter is less than 0.01 μm, it is difficult to sufficiently obtain the photocatalytic effect of the photocatalyst layer 112. When the average particle diameter is larger than 0.1 μm, when the photocatalyst layer 112 is applied by a gravure coater or the like, aggregates of the second particles 116 are likely to be formed, and the appearance of defects due to the second particles 116 is caused on the film.

硬塗層204係紫外線硬化型的後硬化型,以乾燥後的平均厚度為2μm以上、10μm以下的方式形成。若硬塗層204的平均厚度小於2μm,成形後無法獲得充分硬度。此外,若大於10μm,在模內成形時難以切開,成為發生毛邊的原因。紫外線硬化型的後硬化型的硬塗層204係藉由在模內成形後照射紫外線而硬化。因此,在模內成形前的AR薄膜110的狀態下,構成硬塗層204的紫外線硬化型的樹脂並未完全被光硬化(聚合),在未硬化或半硬化的狀態下存在。硬塗層204係在模內成形後使用金屬鹵素燈而被光硬化(聚合)。引體層113與接著層205係分別以乾燥後的平均厚度成為1μm以上、10μm以下的方式形成。此外,關於該等層,可由單層亦可由複數層形成,並不成問題。 The hard coat layer 204 is an ultraviolet curable post-curing type, and is formed so that the average thickness after drying is 2 μm or more and 10 μm or less. If the average thickness of the hard coat layer 204 is less than 2 μm, sufficient hardness cannot be obtained after the formation. Further, when it is more than 10 μm, it is difficult to cut during molding in the mold, which causes burrs. The ultraviolet curable post-hardening type hard coat layer 204 is cured by being irradiated with ultraviolet rays after molding in the mold. Therefore, in the state of the AR film 110 before the in-mold forming, the ultraviolet curable resin constituting the hard coat layer 204 is not completely photohardened (polymerized), and is present in an unhardened or semi-hardened state. The hard coat layer 204 is photohardened (polymerized) using a metal halide lamp after molding in the mold. The puller layer 113 and the adhesive layer 205 are each formed so that the average thickness after drying becomes 1 μm or more and 10 μm or less. Further, with regard to the layers, it is possible to form the single layer or the plural layer, which is not a problem.

若欲賦予設計性、隱蔽性等,係可在引體層113與接 著層205之間,適當視需要,以適當厚度形成未圖示的裝飾用印刷層。引體層113、印刷層、接著層205係可利用凹版塗敷機、缺角輪塗敷機、滾筒塗敷、凹版印刷、網版印刷、噴墨印刷等來形成。此外,印刷層係可藉由墨水以外的金屬蒸鍍、濺鍍、塗裝等藉由所求的設計,每次以適當的工法形成。亦可形成為在硬塗層204亦賦予引體層113、接著層205的功能,而省略引體層113、接著層205的構成。 If you want to give design, concealment, etc., you can connect with the pull-up layer 113. Between the layers 205, a decorative printed layer (not shown) is formed with an appropriate thickness as appropriate. The puller layer 113, the print layer, and the adhesive layer 205 can be formed by a gravure coater, a knurling wheel coater, roll coating, gravure printing, screen printing, inkjet printing, or the like. Further, the printed layer can be formed by an appropriate method each time by a desired design by metal deposition, sputtering, painting, or the like other than ink. The function of the primer layer 113 and the adhesion layer 205 may be also applied to the hard coat layer 204, and the configuration of the puller layer 113 and the adhesion layer 205 may be omitted.

另一方面,如前所述,圖1B所示之AR薄膜126係具有:兼用圖1A所示的光觸媒層112及硬塗層204的光觸媒層127。亦即,光觸媒層127係含有第2粒子116,亦作為保護層或硬塗層來發揮功能。如部分放大圖所示,光觸媒層127係在AR層111之上,形成為比AR層111為更厚。其平均厚度係以2μm以上、10μm以下為宜。若平均厚度比2μm為更薄,難以出現用以支撐AR層111的充分硬度,若比10μm為更厚,在轉印時難以切開,容易發生毛邊。 On the other hand, as described above, the AR film 126 shown in FIG. 1B has a photocatalyst layer 127 which also uses the photocatalyst layer 112 and the hard coat layer 204 shown in FIG. 1A. That is, the photocatalyst layer 127 contains the second particles 116 and functions as a protective layer or a hard coat layer. As shown in a partially enlarged view, the photocatalyst layer 127 is formed on the AR layer 111 and is formed thicker than the AR layer 111. The average thickness is preferably 2 μm or more and 10 μm or less. If the average thickness is thinner than 2 μm, sufficient hardness for supporting the AR layer 111 is hard to occur, and if it is thicker than 10 μm, it is difficult to cut at the time of transfer, and burrs are likely to occur.

光觸媒層127係比AR層111充分厚,即使以藉由第2粒子116所得之光觸媒作用,亦難以分解。因此,亦可使用熱可塑性、熱硬化性、紫外線及電子線硬化系的丙烯酸樹脂等為相對耐久性較高的有機樹脂,來形成光觸媒層127。此外,若欲賦予設計性、隱蔽性等,與圖1A同樣地,可在引體層113與接著層205之間,適當視需要,以適當厚度形成未圖示的裝飾用印刷層。形成引體層113、 印刷層、接著層205的方法係如前所述。 The photocatalyst layer 127 is sufficiently thicker than the AR layer 111, and it is difficult to decompose even by the photocatalytic action obtained by the second particles 116. Therefore, the photocatalyst layer 127 can be formed by using an organic resin having high durability, such as thermoplasticity, thermosetting property, ultraviolet ray, and electron beam curing acrylic resin. In addition, in the same manner as in FIG. 1A, a decorative printed layer (not shown) may be formed between the puller layer 113 and the adhesive layer 205 as appropriate, as appropriate. Forming the puller layer 113, The method of printing the layer and the subsequent layer 205 is as described above.

接著,一邊參照圖1A~圖2,一邊說明製作AR層111時的AR液的塗佈製程。圖2係顯示AR薄膜110中的AR液的塗佈裝置的構成的圖。在圖2中,關於與圖1A、圖1B及圖7~圖9為相同的構成要素,係使用相同符號,且省略說明。 Next, a coating process of the AR liquid when the AR layer 111 is formed will be described with reference to FIGS. 1A to 2 . FIG. 2 is a view showing the configuration of a coating device for an AR liquid in the AR film 110. In FIG. 2, the same components as those in FIGS. 1A, 1B, and 7 to 9 are denoted by the same reference numerals, and description thereof will be omitted.

首先,準備附剝離層的基底薄膜210,將剝離層朝向塗佈面作配置。塗佈裝置係具有:基底薄膜210的放捲部120、及收捲部121。放捲部120係為了塗佈AR液而連續供給基底薄膜210。收捲部121係捲繞被塗佈AR液的基底薄膜210。基底薄膜210係連續以圖2中以X1、X2所示方向被搬送。此外,為了防止因搬送時的剝離帶電所致之對基底薄膜210的皺褶發生,在基底薄膜210中與剝離層為相反側的面預先形成有帶電防止層(未圖示)。 First, the base film 210 with the release layer is prepared, and the release layer is placed toward the coated surface. The coating device includes a unwinding portion 120 of the base film 210 and a winding portion 121. The unwinding unit 120 continuously supplies the base film 210 in order to apply the AR liquid. The winding unit 121 winds the base film 210 to which the AR liquid is applied. The base film 210 is continuously conveyed in the directions indicated by X1 and X2 in Fig. 2 . In addition, in order to prevent the occurrence of wrinkles on the base film 210 due to peeling and charging during conveyance, a charging prevention layer (not shown) is formed in advance on the surface of the base film 210 opposite to the peeling layer.

基底薄膜210係例如以PET薄膜所形成。除此之外,亦可使用聚丙烯氰、聚胺酯、聚烯烴、聚碳酸酯、三醋酸纖維素等素材所形成的塑膠膜或塑膠片等。構成基底薄膜210的PET薄膜的平均厚度係依目的而作適當選擇,惟在捲撓式(roll-to-roll)塗佈中使用時的平均厚度係以20μm以上、250μm以下為佳。若平均厚度小於20μm,搬送時的張力控制較難,PET薄膜塑性變形而產生延伸皺褶。或者,當在基底薄膜210上積層各種層時,因塗劑乾燥時的熱硬化收縮等,PET薄膜容易翹曲,在後工程的處理變得較難。此外,若平均厚度大於250μm,在 捲筒製作時,塗佈長度變長,捲筒捲繞時的捲筒的捲繞芯徑會過大。因此,在後工程中難以處理或作為PET薄膜的成本亦變高。但是,亦可不限於上述範圍,而依需求、用途,使用上述範圍以外的平均厚度的PET薄膜、其他樹脂薄膜,亦不成問題。在本實施形態中,係以捲撓式塗佈設備塗佈AR層111,且使用平均厚度50μm的PET薄膜作為基底薄膜210。 The base film 210 is formed, for example, of a PET film. In addition, a plastic film or a plastic sheet formed of a material such as polyacrylonitrile, polyurethane, polyolefin, polycarbonate, or cellulose triacetate may be used. The average thickness of the PET film constituting the base film 210 is appropriately selected depending on the purpose, and the average thickness when used in roll-to-roll coating is preferably 20 μm or more and 250 μm or less. If the average thickness is less than 20 μm, the tension control during transportation is difficult, and the PET film is plastically deformed to cause extended wrinkles. Alternatively, when various layers are laminated on the base film 210, the PET film is easily warped due to heat hardening shrinkage during drying of the coating agent, and handling in the post-engineering process becomes difficult. In addition, if the average thickness is greater than 250 μm, When the reel is produced, the coating length becomes long, and the winding core diameter of the reel when the reel is wound is excessively large. Therefore, the cost of being difficult to handle or as a PET film in post-engineering is also high. However, it is not limited to the above range, and it is not a problem to use a PET film or another resin film having an average thickness other than the above range depending on the demand and use. In the present embodiment, the AR layer 111 is applied by a roll coating apparatus, and a PET film having an average thickness of 50 μm is used as the base film 210.

對基底薄膜210中設有剝離層202的面塗佈AR液。因此,使用凹版塗敷機進行塗佈。塗佈部係由:用以將AR液塗佈在剝離層202上的凹版滾筒122、及導引滾筒125所構成。導引滾筒125係當以凹版滾筒122對基底薄膜210轉印AR液時,對基底薄膜210施加張力。因此,導引滾筒125與凹版滾筒122係以在該等之間夾著基底薄膜210的方式作配置。導引滾筒125係此外亦為了引導基底薄膜210、或為了維持張力而被配置在所需部位等。在凹版滾筒122係以螺旋狀形成有未圖示的深度數十μm的溝槽,AR液被供給至該溝槽之中。此外,凹版滾筒122係如圖2所示順時鐘旋轉。凹版滾筒122浸在液皿124內的AR液時,AR液被供給至凹版滾筒122的螺旋狀溝槽。接著,刮刀123由凹版滾筒122的表面刮取AR液至預定液量,在與剝離層202相接觸之前,AR液係成為僅殘留在凹版滾筒122的溝槽之中的狀態。之後,凹版滾筒122與剝離層202相接觸時,凹版滾筒122的溝槽內的AR液被轉印至剝離層202上,在剝離層202上形成AR 液的濕式狀態的膜。如上所示,形成均一擴展在基底薄膜210之上的AR層111。 The AR liquid is applied to the surface of the base film 210 where the peeling layer 202 is provided. Therefore, coating was performed using a gravure coater. The coating portion is composed of a gravure cylinder 122 for applying the AR liquid to the separation layer 202, and a guide roller 125. The guide roller 125 applies tension to the base film 210 when the AR liquid is transferred to the base film 210 by the gravure cylinder 122. Therefore, the guide roller 125 and the intaglio cylinder 122 are disposed to sandwich the base film 210 therebetween. The guide roller 125 is also disposed at a desired portion or the like in order to guide the base film 210 or to maintain tension. A groove having a depth of several tens of μm (not shown) is spirally formed in the gravure cylinder 122, and the AR liquid is supplied into the groove. Further, the gravure cylinder 122 is rotated clockwise as shown in FIG. When the gravure cylinder 122 is immersed in the AR liquid in the liquid dish 124, the AR liquid is supplied to the spiral groove of the gravure cylinder 122. Next, the doctor blade 123 scrapes the AR liquid from the surface of the gravure cylinder 122 to a predetermined liquid amount, and the AR liquid is in a state of remaining only in the groove of the gravure cylinder 122 before coming into contact with the peeling layer 202. Thereafter, when the gravure cylinder 122 comes into contact with the peeling layer 202, the AR liquid in the groove of the gravure cylinder 122 is transferred onto the peeling layer 202, and an AR is formed on the peeling layer 202. A film of a wet state of liquid. As shown above, the AR layer 111 uniformly spread over the base film 210 is formed.

其中,以AR液的塗佈方法而言,除了凹版印刷以外,亦可使用模具塗敷、壓延塗敷(calendar coating)、滾筒塗敷等其他所有塗佈方式。 In addition, in the coating method of the AR liquid, in addition to gravure printing, all other coating methods such as die coating, calendar coating, and roll coating may be used.

在接下來的工程中,為了使剝離層202上的AR液熱硬化,基底薄膜210係被搬送至熱乾燥爐211。以熱乾燥爐211而言,係可使用溫風爐或紅外線加熱器(IR)爐、或併用熱風及IR的熱乾燥爐等一般裝置。在本實施形態中,係使用熱風循環爐,將AR層111以150℃熱乾燥1分鐘,並且使其熱硬化。如上所示將折射率為1.36、乾燥後的平均厚度為0.1μm的AR層111形成在剝離層202上。 In the next process, in order to thermally cure the AR liquid on the peeling layer 202, the base film 210 is transferred to the thermal drying furnace 211. In the heat drying furnace 211, a general apparatus such as a hot air furnace or an infrared heater (IR) furnace or a hot air drying furnace in combination with hot air and IR can be used. In the present embodiment, the AR layer 111 is thermally dried at 150 ° C for 1 minute using a hot air circulating furnace, and is thermally cured. The AR layer 111 having a refractive index of 1.36 and an average thickness after drying of 0.1 μm was formed on the peeling layer 202 as shown above.

在本實施形態中所使用的AR液係包含多孔質二氧化矽溶膠作為第1粒子114,包含烷基矽烷作為結合劑。使該等分散在水中,添加硝酸進行加水分解,且以固形分成為5%的方式以異丙醇稀釋而調製AR液。因此,在該例中,AR層111係含有少量的矽氧烷鍵。 The AR liquid used in the present embodiment contains a porous ceria sol as the first particles 114 and contains alkyl decane as a binder. These were dispersed in water, added with nitric acid to be hydrolyzed, and diluted with isopropyl alcohol so that the solid content became 5% to prepare an AR liquid. Therefore, in this example, the AR layer 111 contains a small amount of a decane bond.

接著,一邊參照圖1A、圖1B、圖3、圖4,一邊說明光觸媒塗料的塗佈製程。圖3係顯示光觸媒層112的塗佈裝置的構成的圖。圖4係按每個工程來說明空隙形成製程的圖。在圖3、圖4中,針對與圖1A~圖2及圖7~圖9為相同的構成要素,係使用相同符號,且省略說明。在圖3中,與圖2的AR液的塗佈製程同樣地,光觸媒塗料 的塗佈製程亦以捲撓式方式的凹版塗敷機進行塗佈。 Next, the coating process of the photocatalyst coating material will be described with reference to FIGS. 1A, 1B, 3, and 4. FIG. 3 is a view showing the configuration of a coating device of the photocatalyst layer 112. Fig. 4 is a view for explaining the void formation process for each project. In FIGS. 3 and 4, the same components as those in FIGS. 1A to 2 and 7 to 9 are denoted by the same reference numerals, and description thereof will be omitted. In Fig. 3, similar to the coating process of the AR liquid of Fig. 2, photocatalyst coating The coating process is also applied by a gravure coater.

首先,在放捲部120,以AR層111成為塗佈面的方式配置塗佈有AR層111的基底薄膜210。接著,將光觸媒塗料塗佈在基底薄膜210的AR層111上。光觸媒塗料係主要含有氧化鈦作為第2粒子116,含有矽氧樹脂作為結合劑。在以乾燥後的平均厚度為0.12μm的方式以凹版塗敷機塗佈光觸媒塗料之後,藉由熱乾燥爐211,以150℃熱乾燥2分鐘,並且使其熱硬化。光觸媒層112的折射率為1.80。如上所示,在AR層111上,均一地形成光觸媒層112。 First, in the unwinding unit 120, the base film 210 coated with the AR layer 111 is placed such that the AR layer 111 serves as a coating surface. Next, a photocatalyst coating is applied onto the AR layer 111 of the base film 210. The photocatalyst coating system mainly contains titanium oxide as the second particles 116 and contains a cerium oxide resin as a binder. After coating the photocatalyst coating with a gravure coater so that the average thickness after drying was 0.12 μm, it was thermally dried at 150 ° C for 2 minutes by a heat drying oven 211, and thermally cured. The refractive index of the photocatalyst layer 112 is 1.80. As described above, the photocatalyst layer 112 is uniformly formed on the AR layer 111.

之後,以被配置在熱乾燥爐211之後的紫外線照射部212,藉由金屬鹵素燈213,對光觸媒層112照射紫外線。以紫外線燈而言,亦可使用低壓水銀、高壓水銀、LED-UV燈等。 Thereafter, the photocatalyst layer 112 is irradiated with ultraviolet rays by the metal halide lamp 213, which is disposed in the ultraviolet irradiation unit 212 after the thermal drying furnace 211. In the case of ultraviolet lamps, low-pressure mercury, high-pressure mercury, LED-UV lamps, and the like can also be used.

接著,一邊參照圖4,一邊說明可進行基底薄膜210上的剝離層202與AR層111之間的剝離強度的調整的機制。在圖3中,若基底薄膜210被搬送至紫外線照射部212,如工程(a)所示,紫外線214由金屬鹵素燈213被照射至光觸媒層112。此時,如工程(b)所示,反應性高的電子118由光觸媒層112中的第2粒子116被大量放出至外部,因此,形成為在光觸媒層112內發生多數反應性高的電子118的狀態。在形成光觸媒層112的樹脂基質115B並不存在有機鏈,而僅存在矽氧烷鍵。電子118由於能量小於矽氧烷鍵,因此在光觸媒層112內,係在樹脂 基質115B與電子118之間並不會發生氧化還原反應。因此,被放出的電子118係在光觸媒層112中到處移動,移動至鄰接的AR層111內。 Next, a mechanism for adjusting the peel strength between the peeling layer 202 and the AR layer 111 on the base film 210 will be described with reference to FIG. 4 . In FIG. 3, when the base film 210 is conveyed to the ultraviolet ray irradiation unit 212, as shown in the item (a), the ultraviolet ray 214 is irradiated to the photocatalyst layer 112 by the metal halide lamp 213. At this time, as shown in the item (b), the electrons 118 having high reactivity are largely discharged to the outside by the second particles 116 in the photocatalyst layer 112. Therefore, most of the electrons 118 having high reactivity are formed in the photocatalyst layer 112. status. The resin matrix 115B forming the photocatalyst layer 112 does not have an organic chain, but only a decane bond. The electron 118 is in the photocatalyst layer 112 because it has less energy than the decane bond. The redox reaction does not occur between the matrix 115B and the electrons 118. Therefore, the emitted electrons 118 move around in the photocatalyst layer 112 and move into the adjacent AR layer 111.

構成AR層111的樹脂基質115A中的有機鏈的鍵結能係小於矽氧烷鍵,而且亦小於電子118所具有的能量。因此,在能量高的電子118、與鍵結能小於電子118的能量的有機鏈117之間係發生氧化還原反應,由有機鏈117奪取+電荷,電子118即安定化。結果,被奪取+電荷的有機鏈117的鍵結會在樹脂基質115A內脫落。亦即,樹脂基質115A中的有機鏈117被分解。由第2粒子116出現的大量電子118在與AR層111中的有機鏈117之間反覆氧化還原反應,反覆由AR層111中的樹脂基質115A所存在的有機鏈117奪取+電子。結果,在AR層111內,樹脂基質115A的有機鏈117的分子鍵結接連被切斷,AR層111中的有機鏈117的分解進展。 The bonding energy of the organic chain in the resin matrix 115A constituting the AR layer 111 is smaller than that of the decane bond, and is also smaller than the energy of the electron 118. Therefore, an oxidation-reduction reaction occurs between the electron 118 having high energy and the organic chain 117 having a bonding energy smaller than the energy of the electron 118, and the + electric charge is taken up by the organic chain 117, and the electron 118 is stabilized. As a result, the bond of the organic chain 117 which is captured + charged is detached in the resin matrix 115A. That is, the organic chain 117 in the resin matrix 115A is decomposed. A large amount of electrons 118 appearing from the second particles 116 overlap the redox reaction with the organic chain 117 in the AR layer 111, and the + electrons are repeatedly taken up by the organic chain 117 existing in the resin matrix 115A in the AR layer 111. As a result, in the AR layer 111, the molecular bonding of the organic chain 117 of the resin matrix 115A is successively cut, and the decomposition of the organic chain 117 in the AR layer 111 progresses.

藉由如上所示之反應,在最終照射完特定積算光量的紫外線214的工程(c)中,係可在AR層111內的樹脂基質115A中的有機鏈117被分解的部位形成空隙119。結果,在AR層111內生成比第1粒子114的大小更為微小的無數空隙119。如上所示,在微觀的視點中,在有機鏈117被分解而消失的部位,在AR層111內發生空隙119。因此,空隙119的各個結果係存在於2個有機鏈117的各個的末端之間。第1粒子114及空隙119的大小係指第1粒子114及空隙119中的直徑成為最大的部分的 長度。 By the reaction shown above, in the process (c) of finally irradiating the ultraviolet ray 214 of the specific integrated light amount, the void 119 can be formed in the portion where the organic chain 117 in the resin matrix 115A in the AR layer 111 is decomposed. As a result, innumerable voids 119 which are smaller than the size of the first particles 114 are generated in the AR layer 111. As described above, in the microscopic viewpoint, the void 119 is generated in the AR layer 111 at the portion where the organic chain 117 is decomposed and disappears. Therefore, the respective results of the voids 119 exist between the respective ends of the two organic chains 117. The size of the first particles 114 and the voids 119 is the portion where the diameter of the first particles 114 and the voids 119 is the largest. length.

藉由如上所示所生成的空隙119,在剝離層202與AR層111之間形成不具接點的部位,剝離層202與AR層111之間的密接性會降低。如上所示,在AR薄膜110,係以在剝離層202與AR層111之間所生成的空隙119的效果,剝離層202與AR層111之間的剝離強度會變小。AR層111中的有機鏈117的分解量係關係到剝離層202與AR層111之間的剝離強度。因此,藉由適當調整被照射在光觸媒層112的紫外線214的能量,可調整AR層111中的有機鏈117的分解量,且可調整空隙119的形成量。 By the voids 119 formed as described above, a portion having no contact between the peeling layer 202 and the AR layer 111 is formed, and the adhesion between the peeling layer 202 and the AR layer 111 is lowered. As described above, in the AR film 110, the peeling strength between the peeling layer 202 and the AR layer 111 is reduced by the effect of the voids 119 formed between the peeling layer 202 and the AR layer 111. The amount of decomposition of the organic chain 117 in the AR layer 111 is related to the peel strength between the peeling layer 202 and the AR layer 111. Therefore, by appropriately adjusting the energy of the ultraviolet ray 214 irradiated on the photocatalyst layer 112, the amount of decomposition of the organic chain 117 in the AR layer 111 can be adjusted, and the amount of formation of the void 119 can be adjusted.

接著,說明AR層111中的有機鏈117的分解量的其他調整方法。 Next, another adjustment method of the amount of decomposition of the organic chain 117 in the AR layer 111 will be described.

在該方法中,係以2種類矽氧樹脂的混合物構成AR層111的樹脂基質。其中一方矽氧樹脂係在AR層111熱硬化反應後,形成含有有機鏈117的分子構造。另一方矽氧樹脂係在AR層111熱硬化反應後,形成不含有有機鏈117的分子構造。後者的矽氧樹脂之例係包含矽酸甲酯或四乙氧基矽烷。 In this method, a resin matrix of the AR layer 111 is composed of a mixture of two types of epoxy resins. One of the oxime resins forms a molecular structure containing the organic chain 117 after the AR layer 111 is thermally hardened. The other epoxy resin forms a molecular structure which does not contain the organic chain 117 after the AR layer 111 is thermally hardened. An example of the latter epoxy resin is methyl decanoate or tetraethoxy decane.

若形成如上所示之樹脂基質,由於熱硬化反應已經在熱乾燥爐211結束,因此在以矽酸甲酯或四乙氧基矽烷形成有AR層111中的樹脂基質的部位並沒有有機鏈117。因此,即使對光觸媒層112照射紫外線214,在熱硬化反應後成為不含有有機鏈117的分子構造的矽氧樹脂並不會 被分解。另一方面,藉由對光觸媒層112照射紫外線214,在熱硬化反應後成為含有有機鏈117的分子構造的矽氧樹脂即被分解。 If the resin matrix as shown above is formed, since the thermosetting reaction has already ended in the thermal drying furnace 211, there is no organic chain 117 in the portion where the resin matrix in the AR layer 111 is formed with methyl decanoate or tetraethoxysilane. . Therefore, even if the photocatalyst layer 112 is irradiated with the ultraviolet ray 214, the epoxy resin which does not contain the molecular structure of the organic chain 117 after the thermosetting reaction does not Decomposed. On the other hand, by irradiating the photocatalyst layer 112 with the ultraviolet ray 214, the oxime resin which has a molecular structure containing the organic chain 117 after the thermosetting reaction is decomposed.

如上所示,藉由在熱硬化反應後含有有機鏈117的矽氧樹脂、及成為在熱硬化反應後未含有有機鏈117的分子構造的矽氧樹脂的混合物,構成AR層111的樹脂基質,可調整AR層111中的空隙量。 As described above, the resin matrix of the AR layer 111 is constituted by a mixture of a cerium oxide resin containing the organic chain 117 after the thermosetting reaction and a cerium oxide resin having a molecular structure which does not contain the organic chain 117 after the thermosetting reaction. The amount of voids in the AR layer 111 can be adjusted.

此外,為了使AR層111中的有機鏈117的分解更有效率地促進,亦可使第2粒子116含有至剝離層202。如此一來,在對圖4的光觸媒層112照射紫外線214時,光觸媒作用由剝離層202與光觸媒層112的2方向朝AR層111發揮作用,AR層111中的有機鏈可在短時間內效率佳地分解。其中,若欲將剝離層202保持平滑,以構成剝離層202的樹脂而言,若使用矽氧樹脂等無機系樹脂即可。此時,可由藉由第2粒子116所致之光觸媒作用,來防止剝離層202分解。 Further, in order to promote the decomposition of the organic chain 117 in the AR layer 111 more efficiently, the second particles 116 may be contained in the release layer 202. As a result, when the photocatalyst layer 112 of FIG. 4 is irradiated with the ultraviolet ray 214, the photocatalytic action acts on the AR layer 111 from the two directions of the peeling layer 202 and the photocatalyst layer 112, and the organic chain in the AR layer 111 can be efficiently in a short time. Good decomposition. In order to keep the peeling layer 202 smooth, it is sufficient to use an inorganic resin such as a silicone resin for the resin constituting the peeling layer 202. At this time, the peeling layer 202 can be prevented from being decomposed by the photocatalytic action by the second particles 116.

在本實施形態中,在製作光觸媒層112之後,以紫外線照射部212照射由金屬鹵素燈213所發生的紫外線214。此時,將紫外線214的波長設為365nm,以積算光量成為1200mJ/cm2的方式調整照射時間。照射至光觸媒層112的紫外線的積算光量係以700mJ/cm2以上、5000mJ/cm2以下為宜。若積算光量比700mJ/cm2為更少,不會發生在以藉由光觸媒層112所致之光觸媒作用使AR層111內的有機鏈117分解時為充分數量的電子118。此 外,若積算光量大於5000mJ/cm2,成為基底薄膜201劣化的要因。但是,積算光量並非被限定在上述範圍,若藉由所使用的基底薄膜201的種類、光觸媒層112內所包含的第2粒子116的量、AR層111內的有機鏈117的含有量及所求出的AR層111內的有機鏈117的分解量來適當調整即可。若可得藉由形成空隙119所得之效果,積算光量即使在上述範圍外亦不會有問題。 In the present embodiment, after the photocatalyst layer 112 is formed, the ultraviolet ray 214 generated by the metal halide lamp 213 is irradiated with the ultraviolet ray irradiation unit 212. At this time, the wavelength of the ultraviolet ray 214 was set to 365 nm, and the irradiation time was adjusted so that the integrated light amount became 1200 mJ/cm 2 . The integrated light amount of the ultraviolet ray irradiated to the photocatalyst layer 112 is preferably 700 mJ/cm 2 or more and 5000 mJ/cm 2 or less. If the integrated light amount is less than 700 mJ/cm 2 , a sufficient number of electrons 118 are not generated when the organic chain 117 in the AR layer 111 is decomposed by the photocatalytic action by the photocatalyst layer 112. Further, if the integrated light amount is more than 5000 mJ/cm 2 , the base film 201 is deteriorated. However, the amount of integrated light is not limited to the above range, and the type of the base film 201 to be used, the amount of the second particles 116 contained in the photocatalyst layer 112, and the content of the organic chain 117 in the AR layer 111 and The amount of decomposition of the organic chain 117 in the obtained AR layer 111 may be appropriately adjusted. If the effect obtained by forming the voids 119 is available, there is no problem even if the integrated light amount is outside the above range.

在圖4所示之工程(c)之後,與一邊參照圖2一邊說明的AR層111的塗佈製程相同地,以乾燥後的平均厚度成為5μm的方式以凹版塗敷機塗佈後硬化型的硬塗層204。之後,以成為乾燥後的平均厚度2μm的方式以凹版塗敷機塗佈可與射出成形用樹脂的聚碳酸酯相接著的接著層205。 After the process (c) shown in FIG. 4, the post-curing type is applied by a gravure coater so that the average thickness after drying is 5 μm, similarly to the coating process of the AR layer 111 described with reference to FIG. Hard coating 204. Thereafter, the adhesive layer 205 which can be bonded to the polycarbonate of the injection molding resin was applied by a gravure coater so as to have an average thickness of 2 μm after drying.

將以上製程所形成之AR薄膜110的剖面圖顯示於圖5。在AR薄膜110,係在剝離層202與AR層111的界面,在AR層111存在比第1粒子114的大小更為微小的無數空隙119。在形成無數空隙119的區域中,在剝離層202與AR層111之間沒有接點,因此成為密接性低的狀態。結果,在AR薄膜110中,藉由在剝離層202與AR層111之間無數存在的空隙119,剝離層202與AR層111之間的剝離強度比習知之轉印型AR薄膜為更小。此外,藉由所照射的紫外線量,可調整所形成的空隙119的量,因此可輕易調整剝離強度,且使剝離強度為最適。 A cross-sectional view of the AR film 110 formed by the above process is shown in FIG. In the AR thin film 110, at the interface between the peeling layer 202 and the AR layer 111, there are innumerable voids 119 in the AR layer 111 which are smaller than the size of the first particles 114. In the region where the voids 119 are formed, there is no contact between the peeling layer 202 and the AR layer 111, and thus the adhesion is low. As a result, in the AR film 110, the peel strength between the peeling layer 202 and the AR layer 111 is smaller than that of the conventional transfer type AR film by the voids 119 which are present innumerable between the peeling layer 202 and the AR layer 111. Further, since the amount of the voids 119 formed can be adjusted by the amount of ultraviolet rays to be irradiated, the peel strength can be easily adjusted, and the peel strength can be optimized.

此外,藉由在AR層111內所形成的無數空隙119, 在AR層111內形成空氣層,AR層111的折射率係變得更小。此外,在AR層111與光觸媒層112的界面,在空隙119中,被配置在AR層111之上的光觸媒層112的一部分形成為由AR層111露出的狀態。藉此,在AR層111被轉印至成形品之後,若使紫外線照射至AR層111的表面,藉由光觸媒層112的光觸媒效果,亦可使附在AR層111的表面的有機物等汚染物分解。此外,在AR層111被轉印至成形品之後,若欲由光觸媒層112的光觸媒作用保護硬塗層204,在光觸媒層112與硬塗層204之間視需要以適當厚度設置1層由無機材料所形成的防護層(未圖示)即可。藉由設置防護層,硬塗層204並不會受到光觸媒層112的光觸媒作用的影響。 In addition, by the innumerable voids 119 formed in the AR layer 111, An air layer is formed in the AR layer 111, and the refractive index of the AR layer 111 becomes smaller. Further, at the interface between the AR layer 111 and the photocatalyst layer 112, in the space 119, a part of the photocatalyst layer 112 disposed on the AR layer 111 is formed to be exposed by the AR layer 111. Thereby, after the AR layer 111 is transferred to the molded article, if ultraviolet rays are irradiated onto the surface of the AR layer 111, the photocatalytic effect of the photocatalyst layer 112 can also cause contaminants such as organic substances attached to the surface of the AR layer 111. break down. Further, after the AR layer 111 is transferred to the molded article, if the hard coat layer 204 is to be protected by the photocatalytic action of the photocatalyst layer 112, a layer of inorganic layer is disposed between the photocatalyst layer 112 and the hard coat layer 204 as needed. The protective layer (not shown) formed by the material may be used. The hard coat layer 204 is not affected by the photocatalytic action of the photocatalyst layer 112 by providing a protective layer.

相較於不具光觸媒層112之習知之轉印型AR薄膜,剝離層202與AR層111之間的剝離強度小,因此若使用AR薄膜110,藉由聚碳酸酯樹脂來實施模內成形時,當由剝離層202將AR層111脫模時,難以發生AR層111對成形品的轉印不良,可安定地轉印AR層111。 The peeling strength between the peeling layer 202 and the AR layer 111 is small compared to the conventional transfer type AR film having no photocatalyst layer 112. Therefore, when the AR film 110 is used, when in-mold forming is performed by a polycarbonate resin, When the AR layer 111 is released from the peeling layer 202, transfer failure of the AR layer 111 to the molded article is less likely to occur, and the AR layer 111 can be stably transferred.

(實施形態2) (Embodiment 2)

在轉印型AR薄膜中,轉印至成形品之部位的剝離層與AR層之間的剝離強度係被設定為相對較小的狀態。但是,若未被轉印的部位的剝離層與AR層之間的剝離強度小,轉印層容易由剝離層被剝落,在使轉印型AR薄膜的寬幅相一致時,藉由狹縫工程,包含AR層的轉印層由剝 離層被剝落,成為因轉印層而起的粉飛散的要因。如上所示之粉飛散至薄膜的狹縫時,若一部分混入至狹縫加工中的轉印型AR薄膜捲筒內,其會形成為異物,混入的粉會附著在轉印型AR薄膜面。若在如上所示之狀態下,轉印型AR薄膜直接被捲繞,該部位的轉印層會變形成凹凸,發生印刷不良。因此,進行狹縫加工的部位的剝離層與AR層之間的剝離強度係以保持為比被轉印的部位為更大為佳。 In the transfer type AR film, the peeling strength between the peeling layer and the AR layer transferred to the portion of the molded article is set to a relatively small state. However, if the peeling strength between the peeling layer and the AR layer of the portion not to be transferred is small, the transfer layer is easily peeled off by the peeling layer, and when the width of the transfer type AR film is made uniform, the slit is used. Engineering, including the transfer layer of the AR layer by stripping The peeling layer is peeled off and becomes a factor of powder scattering due to the transfer layer. When the powder as described above is scattered to the slit of the film, if a part of the powder is mixed into the transfer type AR film roll during the slit processing, it is formed as a foreign matter, and the mixed powder adheres to the transfer type AR film surface. In the state as described above, the transfer type AR film is directly wound, and the transfer layer at the portion becomes uneven, and printing defects occur. Therefore, the peeling strength between the peeling layer and the AR layer at the portion where the slit processing is performed is preferably kept larger than the portion to be transferred.

但是,在習知之剝離層與AR層之間的剝離強度的調整法中,形成有剝離層的薄膜全體的剝離強度基本上在面內被調整為相同。因此,若欲在薄膜面內變更轉印型AR薄膜的剝離強度,形成在同一薄膜上的剝離層與AR層之間的剝離強度係成為相同程度的值。因此,要在轉印型AR薄膜面內改變僅有特定部位的剝離層與AR層之間的剝離強度乃極為困難。 However, in the conventional method for adjusting the peel strength between the peeling layer and the AR layer, the peel strength of the entire film on which the peeling layer is formed is substantially the same in the plane. Therefore, in order to change the peeling strength of the transfer type AR film in the film surface, the peel strength between the peeling layer formed on the same film and the AR layer is the same value. Therefore, it is extremely difficult to change the peel strength between the peeling layer and the AR layer of only a specific portion in the plane of the transfer type AR film.

在本發明之實施形態2中,一邊參照圖1A、圖6,一邊說明將剝離層與AR層之間的剝離強度輕易地最適化,並且亦解決如上所述之課題之轉印薄膜及轉印薄膜之製造方法。 In the second embodiment of the present invention, the peeling strength between the peeling layer and the AR layer is easily optimized, and the transfer film and transfer which solve the above problems are also described with reference to FIGS. 1A and 6 . A method of manufacturing a film.

圖6係說明本實施形態中之光觸媒層之塗佈工程的圖。在圖6中,針對與圖1A~圖4及圖7~圖9相同的構成要素,係使用相同符號,且省略說明。 Fig. 6 is a view for explaining a coating process of the photocatalyst layer in the embodiment. In FIG. 6, the same components as those in FIGS. 1A to 4 and 7 to 9 are denoted by the same reference numerals, and description thereof will be omitted.

使用與圖3所示之實施形態1相同之附剝離層的基底薄膜210,至塗佈AR層111的工程為止係與實施形態1 為相同,以捲撓式(Roll to Roll)的凹版塗敷機,將AR層111塗佈在基底薄膜210的剝離層。在光觸媒層112的塗佈中,在光觸媒層112的熱乾燥工程後,以紫外線照射部212的金屬鹵素燈213對光觸媒層112照射紫外線214的工程係以接下來的製程進行。在圖6中,以顯示在紫外線照射部212內對光觸媒層112照射紫外線214的樣子的部分放大圖而言,顯示(a)及(b)之2種構成。部分放大圖(a)、(b)係由與紫外線214的照射方向呈正交的方向觀看照射紫外線214時的紫外線照射部212的內部的平面圖。以下將與以箭號所示之基底薄膜210的進給方向呈垂直的方向稱為寬幅方向。 The base film 210 with the peeling layer similar to the first embodiment shown in FIG. 3 is used, and the process of applying the AR layer 111 is the same as that of the first embodiment. To the same, the AR layer 111 was applied to the release layer of the base film 210 in a roll to roll gravure coater. In the application of the photocatalyst layer 112, after the thermal drying process of the photocatalyst layer 112, the engineering system in which the photocatalyst layer 112 is irradiated with the ultraviolet ray 214 by the metal halide lamp 213 of the ultraviolet ray irradiation unit 212 is performed in the next process. In FIG. 6, a partial enlarged view showing the manner in which the photocatalyst layer 112 is irradiated with the ultraviolet ray 214 in the ultraviolet ray irradiation unit 212 is shown in two configurations (a) and (b). Partial enlarged views (a) and (b) are plan views showing the inside of the ultraviolet ray irradiation unit 212 when the ultraviolet ray 214 is irradiated in a direction orthogonal to the irradiation direction of the ultraviolet ray 214. Hereinafter, a direction perpendicular to the feeding direction of the base film 210 indicated by an arrow is referred to as a wide direction.

當以凹版塗敷機塗佈時,在寬幅方向的兩端部,相較於中心部,塗劑的塗佈量較多。因此,在寬幅方向的中心部及端部,塗膜的厚度不同。為了在完成品的轉印型AR薄膜的中心部及端部,使高度(厚度)相一致,必須將轉印型AR薄膜薄膜進行狹縫加工。亦即,轉印型AR薄膜完成後,將基底薄膜210的兩端進行狹縫加工而使轉印型AR薄膜的表面的凸部消失。如上所示,將轉印型AR薄膜捲筒的中心部與端部的高度,亦即轉印型AR薄膜捲筒的中心部與端部的厚度相配合。 When applied by a gravure coater, the coating amount of the coating agent is larger than the center portion at both end portions in the wide direction. Therefore, the thickness of the coating film differs in the center portion and the end portion in the wide direction. In order to match the height (thickness) at the center portion and the end portion of the transfer type AR film of the finished product, it is necessary to perform slit processing on the transfer type AR film film. That is, after the transfer type AR film is completed, both ends of the base film 210 are subjected to slit processing to eliminate the convex portion on the surface of the transfer type AR film. As described above, the height of the center portion and the end portion of the transfer type AR film roll, that is, the thickness of the center portion and the end portion of the transfer type AR film roll are matched.

在狹縫加工時,AR層111由剝離層202剝離,包含AR層111的轉印層的一部分由剝離層202被剝落,成為粉而在周圍飛散即為問題。如上所述,若飛散的粉混入至狹縫加工中的轉印型AR薄膜捲筒內,在混入粉的部位, 因粉而形成凹凸,使轉印型AR薄膜的轉印層變形、或在後工程的裝飾印刷及成形工程成為異物,而發生不良品。因此,為防止發生粉,以剝離層202與AR層111之間的剝離強度較大為佳。 At the time of slit processing, the AR layer 111 is peeled off by the peeling layer 202, and a part of the transfer layer including the AR layer 111 is peeled off by the peeling layer 202, and is scattered as a powder and is a problem. As described above, if the scattered powder is mixed into the transfer type AR film roll in the slit processing, at the portion where the powder is mixed, The unevenness is formed by the powder, the transfer layer of the transfer type AR film is deformed, or the decorative printing and the forming process of the post-engineering process become foreign matter, and a defective product occurs. Therefore, in order to prevent generation of powder, it is preferable that the peeling strength between the peeling layer 202 and the AR layer 111 is large.

在本實施形態中,為了抑制在轉印型AR薄膜的狹縫加工時發生粉,如圖6(a)所示,使用比形成有AR層111及光觸媒層112的基底薄膜210的塗佈寬幅為更小的寬幅的金屬鹵素燈213,將紫外線214照射至光觸媒層112。或者,使用照射強度相較於中心部的紫外線照射量(照度),以端部的紫外線照射量(照度)為較弱的金屬鹵素燈213。藉由使用如上所示之金屬鹵素燈213,將藉由光觸媒層112所致之AR層111中的有機鏈117的分解量,相較於中心部,以在兩端部較為減少。藉此在寬幅方向的兩端部,可將剝離層202與AR層111之間的剝離強度,保持在比寬幅方向的中心部為較大的狀態。因此,在狹縫加工時,難以由剝離層202剝落包含AR層111的轉印層,抑制粉的發生。藉此,可減低在狹縫加工之對轉印型AR薄膜捲筒內混入粉。 In the present embodiment, in order to suppress generation of powder during slit processing of the transfer type AR film, as shown in Fig. 6(a), a coating width larger than that of the base film 210 in which the AR layer 111 and the photocatalyst layer 112 are formed is used. The wide-width metal halide lamp 213 is irradiated with ultraviolet rays 214 to the photocatalyst layer 112. Alternatively, the irradiation intensity is higher than the ultraviolet irradiation amount (illuminance) of the center portion, and the ultraviolet irradiation amount (illuminance) at the end portion is a weak metal halide lamp 213. By using the metal halide lamp 213 as described above, the amount of decomposition of the organic chain 117 in the AR layer 111 by the photocatalyst layer 112 is reduced at both end portions as compared with the central portion. Thereby, the peeling strength between the peeling layer 202 and the AR layer 111 can be maintained in a state larger than the center portion in the width direction at both end portions in the wide direction. Therefore, at the time of slit processing, it is difficult to peel off the transfer layer containing the AR layer 111 by the peeling layer 202, and the occurrence of powder is suppressed. Thereby, it is possible to reduce the mixing of the powder into the transfer type AR film roll in the slit processing.

此外,有使用寬幅大的基底薄膜210來加大塗佈寬幅,例如在轉印型AR薄膜完成後,寬幅方向的中心部亦進行狹縫加工,以寬幅方向分割成2個以上的情形。在如上所示之情形下,如圖6(b)所示,以對端部與中心部的光觸媒層112的紫外線照射量減少的方式配合狹縫寬幅,設置2個金屬鹵素燈213。或者,使用1個金屬鹵素 燈213,僅有中心部調整紫外線量。因此,亦可在金屬鹵素燈213中,在相當於進行狹縫加工的場所之處,附上可調整為特定紫外線能量的紫外線截止濾波器,對光觸媒層112照射紫外線214。藉此,在轉印型AR薄膜的寬幅方向的兩端部與中心部,可減少AR層111中的有機鏈117的分解量。結果,可將該部位的剝離層202與AR層111之間的剝離強度保持在比轉印的其他部位為更大的狀態。藉此,與圖6(a)所示構成同樣地,在狹縫加工時,可抑制因在狹縫部位由剝離層202剝落之包含AR層111的轉印層所致之粉的發生。因此,可防止狹縫加工時的粉飛散,且可防止因狹縫加工中對轉印型AR薄膜捲筒內的粉飛散所致之異物混入。 Further, the base film 210 having a large width is used to increase the coating width. For example, after the transfer type AR film is completed, the center portion in the wide direction is also subjected to slit processing, and is divided into two or more in the wide direction. The situation. In the case shown above, as shown in FIG. 6(b), the slit width is matched so that the amount of ultraviolet irradiation of the photocatalyst layer 112 at the end portion and the center portion is reduced, and two metal halide lamps 213 are provided. Or, use 1 metal halide The lamp 213 has only the center portion to adjust the amount of ultraviolet rays. Therefore, in the metal halide lamp 213, an ultraviolet cut filter that can be adjusted to a specific ultraviolet energy is attached to a place corresponding to the slit processing, and the photocatalyst layer 112 is irradiated with the ultraviolet ray 214. Thereby, the amount of decomposition of the organic chain 117 in the AR layer 111 can be reduced at both end portions and the center portion of the transfer type AR film in the width direction. As a result, the peeling strength between the peeling layer 202 of the portion and the AR layer 111 can be maintained at a state larger than the other portions of the transfer. Thereby, similarly to the configuration shown in FIG. 6(a), at the time of slit processing, generation of powder due to the transfer layer containing the AR layer 111 peeled off by the peeling layer 202 at the slit portion can be suppressed. Therefore, it is possible to prevent the powder from scattering during the slit processing, and it is possible to prevent the foreign matter from being mixed due to the scattering of the powder in the transfer type AR film roll during the slit processing.

如上所示,可一邊輕易地將剝離層202與AR層111之間的剝離強度最適化,一邊在AR薄膜110的狹縫加工時,防止粉飛散。 As described above, the peeling strength between the peeling layer 202 and the AR layer 111 can be easily optimized, and the powder scattering can be prevented during the slit processing of the AR film 110.

其中,在本實施形態中,係在寬幅方向的中央部及兩端部調整紫外線214的照射量,但是亦可紫外線214的照射量為一定,在中央部及端部改變AR層111中的有機鏈117的量,藉此調整剝離強度。 In the present embodiment, the irradiation amount of the ultraviolet ray 214 is adjusted in the central portion and the both end portions in the wide direction. However, the irradiation amount of the ultraviolet ray 214 may be constant, and the central portion and the end portion may be changed in the AR layer 111. The amount of the organic chain 117 is thereby adjusted for the peel strength.

如以上所示,藉由本實施形態所得之模內成形用轉印薄膜亦即AR薄膜110(126)係具有:基底薄膜201、剝離層202、及作為反射防止層的AR層111。剝離層202係具有:與基底薄膜201相接的第1面、及該第1面的背側的第2面。AR層111係與剝離層202的第2面相接。 AR層111係具有:具有有機鏈117的第1樹脂(樹脂基質115A);及包含在該第1樹脂中且折射率比第1樹脂為較低的複數低折射率微粒子114。在AR層111中,至少在與剝離層202的界面,設有第1樹脂的有機鏈117的一部分被分解而形成的複數空隙119。空隙119的各個係比低折射率微粒子114的各個為更小。 As described above, the AR film 110 (126), which is a transfer film for in-mold forming obtained in the present embodiment, has a base film 201, a peeling layer 202, and an AR layer 111 as an antireflection layer. The peeling layer 202 has a first surface that is in contact with the base film 201 and a second surface that is on the back side of the first surface. The AR layer 111 is in contact with the second surface of the peeling layer 202. The AR layer 111 has a first resin (resin matrix 115A) having an organic chain 117, and a plurality of low refractive index fine particles 114 included in the first resin and having a lower refractive index than the first resin. In the AR layer 111, at least at the interface with the peeling layer 202, a plurality of voids 119 in which a part of the organic chain 117 of the first resin is decomposed are provided. Each of the voids 119 is smaller than each of the low refractive index microparticles 114.

AR薄膜110(126)較佳為另外具有:與相對AR層111之與剝離層202相接的表面的背面相接,具有大於有機鏈117的鍵結能的鍵結能的第2樹脂(樹脂基質115B);及第2樹脂中所含有的光觸媒微粒子116的光觸媒層112(127)。第2樹脂係以具有矽氧烷鍵為更佳,亦以空隙119亦被形成在AR層111與光觸媒層112的界面,藉由空隙119,光觸媒層112由AR層111露出為更佳。 The AR film 110 (126) preferably further has a second resin (resin having a bonding energy larger than the bonding energy of the organic chain 117, which is in contact with the back surface of the surface of the opposite AR layer 111 which is in contact with the peeling layer 202. The substrate 115B); and the photocatalyst layer 112 (127) of the photocatalyst fine particles 116 contained in the second resin. It is more preferable that the second resin has a decane bond, and the void 119 is also formed at the interface between the AR layer 111 and the photocatalyst layer 112, and the photocatalyst layer 112 is preferably exposed by the AR layer 111 by the voids 119.

此外,AR層111的平均厚度係以0.05μm以上、0.15μm以下為佳,其折射率係以1.31以上、1.38以下為佳。 Further, the average thickness of the AR layer 111 is preferably 0.05 μm or more and 0.15 μm or less, and the refractive index thereof is preferably 1.31 or more and 1.38 or less.

此外,剝離層202亦以含有光觸媒微粒子116為佳。 Further, the release layer 202 is preferably containing photocatalyst particles 116.

此外,剝離層202與AR層111之間的剝離強度以相較於1個寬幅方向中的中心部,在兩端部為較大為佳,AR層111亦以相較於上述寬幅方向中的中心部,以在兩端部,在第1樹脂中含有較多有機鏈117為佳。 Further, the peeling strength between the peeling layer 202 and the AR layer 111 is preferably larger at both end portions than the center portion in one wide width direction, and the AR layer 111 is also larger than the above-mentioned width direction. It is preferable that the center portion of the middle portion contains a large number of organic chains 117 in the first resin at both end portions.

在藉由本實施形態所為之轉印型薄膜之製造方法中,首先,依序積層:基底薄膜201;剝離層202;在具有有 機鏈117的第1樹脂中包含折射率低於第1樹脂的複數低折射率微粒子114的AR層111;及光觸媒層112。接著,對光觸媒層112照射紫外線而在AR層111中之至少與剝離層202的界面,形成小於低折射率微粒子114的各個的複數空隙119。此時,藉由紫外線的照射,在光觸媒層112生成電子,電子進入至AR層111而將有機鏈117的一部分分解而形成空隙119。藉由此時的紫外線的照射量,調整所形成的空隙119的量。 In the method for producing a transfer film according to the present embodiment, first, a base film 201, a peeling layer 202, and a layer are sequentially laminated; The first resin of the chain 117 includes an AR layer 111 having a lower refractive index than the plurality of low refractive index fine particles 114 of the first resin, and a photocatalyst layer 112. Next, the photocatalyst layer 112 is irradiated with ultraviolet rays, and at least the interface with the peeling layer 202 in the AR layer 111 forms a plurality of voids 119 smaller than each of the low refractive index fine particles 114. At this time, electrons are generated in the photocatalyst layer 112 by irradiation of ultraviolet rays, and electrons enter the AR layer 111 to decompose a part of the organic chain 117 to form a void 119. The amount of the voids 119 formed is adjusted by the amount of ultraviolet rays irradiated at this time.

其中,在光觸媒層112之被照射紫外線的面,設置紫外線的照射量互相不同的第1部位及第2部位。藉此,可以和AR層111與剝離層202的界面呈平行的方向,使在對應第1部位的部分所形成的空隙119的量、與在對應第2部位的部分所形成的空隙119的量不同。 Among them, the first portion and the second portion in which the amounts of irradiation of ultraviolet rays are different from each other are provided on the surface of the photocatalyst layer 112 to be irradiated with ultraviolet rays. Thereby, the amount of the void 119 formed in the portion corresponding to the first portion and the amount of the void 119 formed in the portion corresponding to the second portion can be made in a direction parallel to the interface between the AR layer 111 and the peeling layer 202. different.

如以上所示,藉由本發明,可將剝離層與功能層之間的剝離強度調整為最適。因此,有用於在模內成形所使用的轉印薄膜及其製造方法等。 As described above, according to the present invention, the peel strength between the peeling layer and the functional layer can be adjusted to be optimum. Therefore, there are a transfer film used for molding in a mold, a method for producing the same, and the like.

111‧‧‧AR層 111‧‧‧AR layer

112‧‧‧光觸媒層 112‧‧‧Photocatalyst layer

114‧‧‧低折射率微粒子(第1粒子) 114‧‧‧Low-refractive-index microparticles (first particle)

115A‧‧‧樹脂基質 115A‧‧‧Resin matrix

115B‧‧‧樹脂基質 115B‧‧‧Resin matrix

116‧‧‧光觸媒微粒子(第2粒子) 116‧‧‧Photocatalyst particles (2nd particle)

117‧‧‧有機鏈 117‧‧ organic chain

118‧‧‧電子 118‧‧‧Electronics

119‧‧‧空隙 119‧‧‧ gap

201‧‧‧基底薄膜 201‧‧‧Base film

202‧‧‧剝離層 202‧‧‧ peeling layer

210‧‧‧基底薄膜 210‧‧‧Base film

213‧‧‧金屬鹵素燈 213‧‧‧Metal halogen lamp

214‧‧‧紫外線 214‧‧‧ UV

Claims (9)

一種模內成形用轉印薄膜,其係具備有:基底薄膜;剝離層,其係具有:與前述基底薄膜相接的第1面、及前述第1面的背側的第2面;反射防止層,其係具有:與前述剝離層的前述第2面相接,且具有有機鏈的第1樹脂;及包含在前述第1樹脂中,且折射率比前述第1樹脂為較低的複數低折射率微粒子;及光觸媒層,其係具有:與相對前述反射防止層之與前述剝離層相接的表面的背面相接,且具有比前述有機鏈的鍵結能為較大的鍵結能的第2樹脂;及第2樹脂中所含有的光觸媒微粒子,在前述反射防止層中,至少在與前述剝離層的界面設有前述有機鏈的一部分被分解而形成的複數空隙,前述複數空隙的各個係比前述複數低折射率微粒子的各個為較小。 A transfer film for in-mold molding, comprising: a base film; and a release layer comprising: a first surface that is in contact with the base film; and a second surface on the back side of the first surface; and reflection prevention a layer comprising: a first resin having an organic chain that is in contact with the second surface of the release layer; and a first resin that is included in the first resin and having a lower refractive index than the first resin And a photocatalyst layer having a surface opposite to a surface of the anti-reflection layer that is in contact with the release layer, and having a bonding energy greater than a bond energy of the organic chain; In the second catalyst; and the photocatalyst fine particles contained in the second resin, at least at a portion of the antireflection layer, a plurality of voids in which a part of the organic chain is decomposed are provided at an interface with the peeling layer, and each of the plurality of voids Each of the plurality of low refractive index microparticles is smaller than the foregoing. 如申請專利範圍第1項之模內成形用轉印薄膜,其中,前述第2樹脂係具有矽氧烷鍵。 The transfer film for in-mold forming according to the first aspect of the invention, wherein the second resin has a decane bond. 如申請專利範圍第1項之模內成形用轉印薄膜,其中,前述空隙係亦形成在前述反射防止層與前述光觸媒層的界面,藉由前述空隙,前述光觸媒層由前述反射防止層露出。 The transfer film for in-mold forming according to the first aspect of the invention, wherein the gap is formed at an interface between the antireflection layer and the photocatalyst layer, and the photocatalyst layer is exposed by the antireflection layer by the void. 一種模內成形用轉印薄膜,其係具備有: 基底薄膜;剝離層,其係具有:與前述基底薄膜相接的第1面、及前述第1面的背側的第2面;及反射防止層,其係具有:與前述剝離層的前述第2面相接,且具有有機鏈的第1樹脂;及包含在前述第1樹脂中,且折射率比前述第1樹脂為較低的複數低折射率微粒子,在前述反射防止層中,至少在與前述剝離層的界面設有前述有機鏈的一部分被分解而形成的複數空隙,前述複數空隙的各個係比前述複數低折射率微粒子的各個為較小,前述反射防止層的平均厚度為0.05μm以上、0.15μm以下,前述反射防止層的折射率為1.31以上、1.38以下。 A transfer film for in-mold forming, which is provided with: a base film; the peeling layer comprising: a first surface that is in contact with the base film; and a second surface on the back side of the first surface; and an antireflection layer that has the first layer and the peeling layer a first resin having two sides and having an organic chain; and a plurality of low refractive index fine particles included in the first resin and having a lower refractive index than the first resin, wherein the antireflection layer is at least a plurality of voids formed by decomposing a part of the organic chain are provided at an interface with the peeling layer, and each of the plurality of voids is smaller than each of the plurality of low refractive index microparticles, and an average thickness of the antireflection layer is 0.05 μm. Above 0.15 μm or less, the refractive index of the antireflection layer is 1.31 or more and 1.38 or less. 一種模內成形用轉印薄膜,其係具備有:基底薄膜;剝離層,其係具有:與前述基底薄膜相接的第1面、及前述第1面的背側的第2面;及反射防止層,其係具有:與前述剝離層的前述第2面相接,且具有有機鏈的第1樹脂;及包含在前述第1樹脂中,且折射率比前述第1樹脂為較低的複數低折射率微粒子,在前述反射防止層中,至少在與前述剝離層的界面設有前述有機鏈的一部分被分解而形成的複數空隙, 前述複數空隙的各個係比前述複數低折射率微粒子的各個為較小,前述剝離層含有光觸媒微粒子。 A transfer film for in-mold molding, comprising: a base film; and a release layer comprising: a first surface that is in contact with the base film; and a second surface on the back side of the first surface; and a reflection a preventive layer comprising: a first resin having an organic chain in contact with the second surface of the release layer; and a plurality of particles included in the first resin and having a lower refractive index than the first resin In the low-refractive-index fine particles, at least at the interface with the peeling layer, a plurality of voids in which a part of the organic chain is decomposed are provided in the anti-reflection layer. Each of the plurality of voids is smaller than each of the plurality of low-refractive-index fine particles, and the peeling layer contains photocatalyst fine particles. 一種模內成形用轉印薄膜,其係具備有:基底薄膜;剝離層,其係具有:與前述基底薄膜相接的第1面、及前述第1面的背側的第2面;及反射防止層,其係具有:與前述剝離層的前述第2面相接,且具有有機鏈的第1樹脂;及包含在前述第1樹脂中,且折射率比前述第1樹脂為較低的複數低折射率微粒子,在前述反射防止層中,至少在與前述剝離層的界面設有前述有機鏈的一部分被分解而形成的複數空隙,前述複數空隙的各個係比前述複數低折射率微粒子的各個為較小,前述剝離層與前述反射防止層之間的剝離強度相較於1個寬幅方向中的中心部,以在兩端部為較大。 A transfer film for in-mold molding, comprising: a base film; and a release layer comprising: a first surface that is in contact with the base film; and a second surface on the back side of the first surface; and a reflection a preventive layer comprising: a first resin having an organic chain in contact with the second surface of the release layer; and a plurality of particles included in the first resin and having a lower refractive index than the first resin In the low-refractive-index fine particles, at least at a boundary with the peeling layer, a plurality of voids in which a part of the organic chain is decomposed are provided, and each of the plurality of voids is larger than each of the plurality of low-refractive-index fine particles. In the smaller portion, the peeling strength between the peeling layer and the antireflection layer is larger at the both end portions than the center portion in one wide width direction. 一種模內成形用轉印薄膜,其係具備有:基底薄膜;剝離層,其係具有:與前述基底薄膜相接的第1面、及前述第1面的背側的第2面;及反射防止層,其係具有:與前述剝離層的前述第2面相接,且具有有機鏈的第1樹脂;及包含在前述第1樹脂中,且折射率比前述第1樹脂為較低的複數低折射率微粒 子,在前述反射防止層中,至少在與前述剝離層的界面設有前述有機鏈的一部分被分解而形成的複數空隙,前述複數空隙的各個係比前述複數低折射率微粒子的各個為較小,前述反射防止層係相較於1個寬幅方向中的中心部,在兩端部,在前述第1樹脂中含有較多前述有機鏈。 A transfer film for in-mold molding, comprising: a base film; and a release layer comprising: a first surface that is in contact with the base film; and a second surface on the back side of the first surface; and a reflection a preventive layer comprising: a first resin having an organic chain in contact with the second surface of the release layer; and a plurality of particles included in the first resin and having a lower refractive index than the first resin Low refractive index particles In the antireflection layer, a plurality of voids in which a part of the organic chain is decomposed are provided at least at an interface with the peeling layer, and each of the plurality of voids is smaller than each of the plurality of low refractive index fine particles. The antireflection layer contains a large amount of the organic chain in the first resin at both end portions than the central portion in one wide direction. 一種模內成形用轉印薄膜之製造方法,其係具備有:依序積層:基底薄膜、剝離層、及在具有有機鏈的第1樹脂中包含折射率比前述第1樹脂為較低的複數低折射率微粒子的反射防止層、及光觸媒層的步驟;及對前述光觸媒層照射紫外線而在前述反射防止層中至少與前述剝離層的界面形成比前述複數低折射率微粒子的各個為較小的複數空隙的步驟,藉由前述紫外線的照射,在前述光觸媒層生成電子,前述電子進入至前述反射防止層,將前述有機鏈的一部分分解而形成前述空隙,且調整藉由前述紫外線的照射量所形成的前述空隙的量。 A method for producing a transfer film for in-mold molding, comprising: sequentially laminating: a base film, a release layer, and a first resin having an organic chain; and a refractive index lower than that of the first resin; a step of preventing the antireflection layer of the low refractive index fine particles and the photocatalyst layer; and irradiating the photocatalyst layer with ultraviolet rays, and forming at least an interface with the peeling layer in the antireflection layer is smaller than each of the plurality of low refractive index fine particles In the step of a plurality of voids, electrons are generated in the photocatalyst layer by the irradiation of the ultraviolet rays, and the electrons enter the antireflection layer, and a part of the organic chain is decomposed to form the voids, and the amount of ultraviolet rays is adjusted. The amount of the aforementioned voids formed. 如申請專利範圍第8項之模內成形用轉印薄膜之製造方法,其中,在前述光觸媒層之被照射前述紫外線的面,設置前述紫外線的照射量為互相不同的第1部位及第2部位,藉此在與前述反射防止層與前述剝離層的界面呈平行的方向,使在對應前述第1部位的部分所形成的前述 空隙的量、及在對應前述第2部位的部分所形成的前述空隙的量為不同。 The method for producing a transfer film for in-mold forming according to the eighth aspect of the invention, wherein the surface of the photocatalyst layer to which the ultraviolet ray is irradiated is provided with the first portion and the second portion which are different in irradiation amount of the ultraviolet ray Thereby, the aforementioned portion formed in the portion corresponding to the first portion is formed in a direction parallel to the interface between the antireflection layer and the peeling layer. The amount of the voids and the amount of the voids formed in the portion corresponding to the second portion are different.
TW104132399A 2014-11-13 2015-10-01 Transfer film for in-mold molding and manufacturing method thereof TWI565596B (en)

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