TWI561919B - Ordering block copolymers - Google Patents
Ordering block copolymersInfo
- Publication number
- TWI561919B TWI561919B TW104108158A TW104108158A TWI561919B TW I561919 B TWI561919 B TW I561919B TW 104108158 A TW104108158 A TW 104108158A TW 104108158 A TW104108158 A TW 104108158A TW I561919 B TWI561919 B TW I561919B
- Authority
- TW
- Taiwan
- Prior art keywords
- block copolymers
- ordering block
- ordering
- copolymers
- block
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D153/00—Coating compositions based on block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Coating compositions based on derivatives of such polymers
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D153/00—Coating compositions based on block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Coating compositions based on derivatives of such polymers
- C09D153/005—Modified block copolymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00023—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems without movable or flexible elements
- B81C1/00031—Regular or irregular arrays of nanoscale structures, e.g. etch mask layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0147—Film patterning
- B81C2201/0149—Forming nanoscale microstructures using auto-arranging or self-assembling material
Landscapes
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Materials For Photolithography (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201461953836P | 2014-03-15 | 2014-03-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201600929A TW201600929A (zh) | 2016-01-01 |
TWI561919B true TWI561919B (en) | 2016-12-11 |
Family
ID=52727472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104108158A TWI561919B (en) | 2014-03-15 | 2015-03-13 | Ordering block copolymers |
Country Status (6)
Country | Link |
---|---|
US (2) | US9557640B2 (zh) |
JP (1) | JP6650879B2 (zh) |
KR (1) | KR20160133511A (zh) |
CN (1) | CN106462055A (zh) |
TW (1) | TWI561919B (zh) |
WO (1) | WO2015142641A1 (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BR112015029548B1 (pt) * | 2013-06-27 | 2021-06-01 | Intel Corporation | Método de fabricação e substrato de circuito integrado |
WO2016080972A1 (en) * | 2014-11-18 | 2016-05-26 | Seagate Technology Llc | Methods and apparatuses for directed self-assembly |
US9738765B2 (en) * | 2015-02-19 | 2017-08-22 | International Business Machines Corporation | Hybrid topographical and chemical pre-patterns for directed self-assembly of block copolymers |
JP6039028B1 (ja) * | 2015-09-11 | 2016-12-07 | 株式会社東芝 | 自己組織化材料及びパターン形成方法 |
US9910355B2 (en) * | 2016-07-29 | 2018-03-06 | Rohm And Haas Electronic Materials Llc | Method of negative tone development using a copolymer multilayer electrolyte and articles made therefrom |
US10755942B2 (en) * | 2016-11-02 | 2020-08-25 | Massachusetts Institute Of Technology | Method of forming topcoat for patterning |
FR3074180B1 (fr) * | 2017-11-24 | 2021-01-01 | Arkema France | Procede de controle de la planeite d'un empilement polymerique |
FR3074179B1 (fr) * | 2017-11-24 | 2021-01-01 | Arkema France | Procede de controle de la planeite d'un empilement polymerique |
AU2019275675A1 (en) * | 2018-06-29 | 2020-01-16 | Illumina Cambridge Limited | Flow cells |
FR3105793B1 (fr) * | 2019-12-31 | 2023-11-17 | Arkema France | Composition prepolymere destinee a former une couche de contraste et procede de structuration d’un materiau d’interface |
FR3105786A1 (fr) * | 2019-12-31 | 2021-07-02 | Arkema France | Procédé de nanostructuration d’un substrat |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5545509A (en) * | 1992-11-24 | 1996-08-13 | International Business Machines Corporation | Photoresist composition with photosensitive base generator |
TW200949446A (en) * | 2008-03-07 | 2009-12-01 | Fujifilm Corp | Photomask material, photomask and method of producing photomask |
US20110147984A1 (en) * | 2009-12-18 | 2011-06-23 | Joy Cheng | Methods of directed self-assembly, and layered structures formed therefrom |
TW201319148A (zh) * | 2011-09-23 | 2013-05-16 | Az Electronic Materials Usa | 用於導向自組裝嵌段共聚物之中性層組合物及其方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8083953B2 (en) * | 2007-03-06 | 2011-12-27 | Micron Technology, Inc. | Registered structure formation via the application of directed thermal energy to diblock copolymer films |
US7790350B2 (en) * | 2007-07-30 | 2010-09-07 | International Business Machines Corporation | Method and materials for patterning a neutral surface |
US7989026B2 (en) * | 2008-01-12 | 2011-08-02 | International Business Machines Corporation | Method of use of epoxy-containing cycloaliphatic acrylic polymers as orientation control layers for block copolymer thin films |
JP2010184371A (ja) * | 2009-02-10 | 2010-08-26 | Canon Inc | 印刷装置及び印刷方法 |
JP6035017B2 (ja) * | 2010-10-04 | 2016-11-30 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | 下層組成物および下層を像形成する方法 |
JP5820676B2 (ja) * | 2010-10-04 | 2015-11-24 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | 下層組成物および下層を像形成する方法 |
US9314819B2 (en) * | 2012-02-10 | 2016-04-19 | Board Of Regents, The University Of Texas System | Anhydride copolymer top coats for orientation control of thin film block copolymers |
WO2013119832A1 (en) * | 2012-02-10 | 2013-08-15 | Board Of Regents, The University Of Texas System | Anhydride copolymer top coats for orientation control of thin film block copolymers |
JP6118573B2 (ja) * | 2012-03-14 | 2017-04-19 | 東京応化工業株式会社 | 下地剤、ブロックコポリマーを含む層のパターン形成方法 |
JP5642731B2 (ja) * | 2012-04-27 | 2014-12-17 | 信越化学工業株式会社 | パターン形成方法 |
JP5710546B2 (ja) * | 2012-04-27 | 2015-04-30 | 信越化学工業株式会社 | パターン形成方法 |
US20140065379A1 (en) | 2012-08-31 | 2014-03-06 | Wisconsin Alumni Research Foundation | Topcoat surfaces for directing the assembly of block copolymer films on chemically patterned surfaces |
JP5752655B2 (ja) * | 2012-09-10 | 2015-07-22 | 株式会社東芝 | パターン形成方法 |
JP6027912B2 (ja) * | 2013-02-22 | 2016-11-16 | 東京応化工業株式会社 | 相分離構造を含む構造体の製造方法、及びパターン形成方法、並びにトップコート材料 |
CN104749905B (zh) * | 2013-12-31 | 2018-02-13 | 罗门哈斯电子材料有限公司 | 定向自组装图案形成方法和组合物 |
CN104788598A (zh) * | 2013-12-31 | 2015-07-22 | 陶氏环球技术有限公司 | 可交联聚合物和底层组合物 |
US20150303055A1 (en) * | 2014-04-16 | 2015-10-22 | GlobalFoundries, Inc. | Methods for fabricating integrated circuits including surface treating for directed self-assembly |
US9556353B2 (en) * | 2014-10-29 | 2017-01-31 | International Business Machines Corporation | Orientation control materials for block copolymers used in directed self-assembly applications |
-
2015
- 2015-03-13 JP JP2016556766A patent/JP6650879B2/ja not_active Expired - Fee Related
- 2015-03-13 TW TW104108158A patent/TWI561919B/zh not_active IP Right Cessation
- 2015-03-13 WO PCT/US2015/020417 patent/WO2015142641A1/en active Application Filing
- 2015-03-13 CN CN201580020461.8A patent/CN106462055A/zh active Pending
- 2015-03-13 KR KR1020167028314A patent/KR20160133511A/ko unknown
- 2015-03-13 US US14/656,753 patent/US9557640B2/en active Active
-
2017
- 2017-01-18 US US15/409,125 patent/US9823568B2/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5545509A (en) * | 1992-11-24 | 1996-08-13 | International Business Machines Corporation | Photoresist composition with photosensitive base generator |
TW200949446A (en) * | 2008-03-07 | 2009-12-01 | Fujifilm Corp | Photomask material, photomask and method of producing photomask |
US20110147984A1 (en) * | 2009-12-18 | 2011-06-23 | Joy Cheng | Methods of directed self-assembly, and layered structures formed therefrom |
TW201319148A (zh) * | 2011-09-23 | 2013-05-16 | Az Electronic Materials Usa | 用於導向自組裝嵌段共聚物之中性層組合物及其方法 |
Also Published As
Publication number | Publication date |
---|---|
US20170139326A1 (en) | 2017-05-18 |
TW201600929A (zh) | 2016-01-01 |
US9823568B2 (en) | 2017-11-21 |
JP2017514671A (ja) | 2017-06-08 |
KR20160133511A (ko) | 2016-11-22 |
JP6650879B2 (ja) | 2020-02-19 |
CN106462055A (zh) | 2017-02-22 |
US20150261090A1 (en) | 2015-09-17 |
WO2015142641A8 (en) | 2017-02-23 |
US9557640B2 (en) | 2017-01-31 |
WO2015142641A1 (en) | 2015-09-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |