TWI560451B - Probe card for circuit-testing - Google Patents
Probe card for circuit-testingInfo
- Publication number
- TWI560451B TWI560451B TW103135303A TW103135303A TWI560451B TW I560451 B TWI560451 B TW I560451B TW 103135303 A TW103135303 A TW 103135303A TW 103135303 A TW103135303 A TW 103135303A TW I560451 B TWI560451 B TW I560451B
- Authority
- TW
- Taiwan
- Prior art keywords
- testing
- circuit
- probe card
- probe
- card
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW103135303A TWI560451B (en) | 2012-09-28 | 2012-09-28 | Probe card for circuit-testing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW103135303A TWI560451B (en) | 2012-09-28 | 2012-09-28 | Probe card for circuit-testing |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201506409A TW201506409A (en) | 2015-02-16 |
TWI560451B true TWI560451B (en) | 2016-12-01 |
Family
ID=53019337
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103135303A TWI560451B (en) | 2012-09-28 | 2012-09-28 | Probe card for circuit-testing |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI560451B (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201038949A (en) * | 2009-04-27 | 2010-11-01 | Mpi Corp | Test probe apparatus for multiple chips |
US20110089967A1 (en) * | 2008-04-21 | 2011-04-21 | Sanghee Kim | Mems probe card and manufacturing method thereof |
TWM421505U (en) * | 2011-04-26 | 2012-01-21 | Win Way Technology Co Ltd | Test probe card |
TWM423836U (en) * | 2011-10-03 | 2012-03-01 | Hermes Testing Solutions Inc | Probe card for circuit-testing and structure of probe substrate thereof |
TW201224463A (en) * | 2010-08-30 | 2012-06-16 | Advantest Corp | Individuating board for testing, probe and semiconductor wafer testing apparatus |
-
2012
- 2012-09-28 TW TW103135303A patent/TWI560451B/en not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110089967A1 (en) * | 2008-04-21 | 2011-04-21 | Sanghee Kim | Mems probe card and manufacturing method thereof |
TW201038949A (en) * | 2009-04-27 | 2010-11-01 | Mpi Corp | Test probe apparatus for multiple chips |
TW201224463A (en) * | 2010-08-30 | 2012-06-16 | Advantest Corp | Individuating board for testing, probe and semiconductor wafer testing apparatus |
TWM421505U (en) * | 2011-04-26 | 2012-01-21 | Win Way Technology Co Ltd | Test probe card |
TWM423836U (en) * | 2011-10-03 | 2012-03-01 | Hermes Testing Solutions Inc | Probe card for circuit-testing and structure of probe substrate thereof |
Also Published As
Publication number | Publication date |
---|---|
TW201506409A (en) | 2015-02-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB2521959B (en) | Measurement system | |
GB201201727D0 (en) | Indicating locations | |
EP2930491A4 (en) | Test device | |
GB2504570B (en) | Microtome having an auto-rocking mode | |
IL227016B (en) | Graphic interface for multi-spine probe | |
EP2930707A4 (en) | Test device | |
GB201212415D0 (en) | RFID probe | |
EP2875838A4 (en) | Liquid-administering instrument | |
GB2507283B (en) | Probe | |
AU348311S (en) | Comparison card | |
GB2507980B (en) | Inspection arrangement | |
EP2929303A4 (en) | Probe spacing element | |
EP2857816A4 (en) | Mechanical-quantity measuring device | |
EP2832302A4 (en) | Probe | |
EP2843379A4 (en) | Scale device | |
EP2851884A4 (en) | Measurement system | |
EP2713144A4 (en) | Measurement device | |
SG11201403273RA (en) | Reflection probe | |
EP2826412A4 (en) | Probe | |
EP2823747A4 (en) | Measurement probe | |
GB2505193B (en) | Probe | |
SG11201500206PA (en) | Transponder device | |
PL2831563T3 (en) | Measuring device | |
EP2835001A4 (en) | Identification for apparatuses | |
TWI560452B (en) | Probe card for circuit-testing |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |