TWI534978B - Chip package structure - Google Patents

Chip package structure Download PDF

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TWI534978B
TWI534978B TW102133536A TW102133536A TWI534978B TW I534978 B TWI534978 B TW I534978B TW 102133536 A TW102133536 A TW 102133536A TW 102133536 A TW102133536 A TW 102133536A TW I534978 B TWI534978 B TW I534978B
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chip
package structure
module
gold
gold bumps
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TW102133536A
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Chinese (zh)
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TW201513292A (en
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林久順
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奇景光電股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16135Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/16145Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32135Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/32145Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Description

晶片封裝結構 Chip package structure

本發明是有關於一種封裝結構,且特別是有關於一種多晶片的封裝結構。 The present invention relates to a package structure, and more particularly to a package structure for a multi-wafer.

隨著半導體封裝技術的演進、電子產品之微小化以及高運作速度需求的增加,各種不同型態的封裝結構紛紛應運而生,例如直接在封裝基板中嵌埋半導體晶片;或是多晶片模組化的封裝結構,也就是將兩個或兩個以上之晶片組合在單一封裝結構中,以縮減整體體積。 With the evolution of semiconductor packaging technology, the miniaturization of electronic products and the increasing demand for high operating speeds, various types of package structures have emerged, such as embedding semiconductor wafers directly in package substrates; or multi-chip modules. The package structure, that is, two or more wafers are combined in a single package structure to reduce the overall volume.

傳統的多晶片封裝結構通常採用平行架構,將兩個以上之晶片安裝於同一平面上。晶片與基板上導體之間通常由導線焊接(Wire Bonding)在一起。然而,傳統的多晶片封裝結構的體積,會隨著晶片數目增加而變大,無法適用於小型電子產品;傳統的多晶片封裝結構也沒辦法將製程相異的晶片整合在一起。再者,在傳統的封裝結構當中,晶片與晶片之間通常由錫凸塊(Solder Bump)焊接在一起,錫凸塊會佔用較大的體積,導致晶片封裝結構的體積進一步增加。 Conventional multi-chip package structures typically employ a parallel architecture that mounts more than two wafers on the same plane. The wafer is typically wire bonded together with the conductors on the substrate. However, the volume of conventional multi-chip package structures will increase as the number of wafers increases, making it impossible to apply to small electronic products; conventional multi-chip package structures cannot integrate wafers with different process variations. Moreover, in the conventional package structure, the wafer and the wafer are usually soldered together by a solder bump, and the tin bumps occupy a large volume, resulting in a further increase in the volume of the chip package structure.

因此需要一種晶片封裝結構,能夠將製程相異的晶 片封裝組合在一起、減小晶片封裝結構的面積,以應用於小型電子產品上。 Therefore, there is a need for a chip package structure capable of crystals having different processes. The chip packages are combined to reduce the area of the chip package structure for use in small electronic products.

因此,本發明之一方面提供一種晶片封裝結構,能夠一次封裝多個晶片,尤其是製程相異的晶片,同時能夠縮小整體晶片封裝結構之體積,適用於小型電子裝置之上。 Therefore, an aspect of the present invention provides a chip package structure capable of packaging a plurality of wafers at a time, in particular, wafers having different processes, and capable of reducing the volume of the entire chip package structure, and being suitable for use on a small electronic device.

依照本發明之一實施例,晶片封裝結構含有一第一晶片模組、複數個第一金凸塊(Au Bump)、一第二晶片模組、複數個第二金凸塊,以及非導電性黏著劑(Non-conductive Paste)。第一晶片模組具有複數個第一金屬焊墊(Bonding Pad);複數個第一金凸塊位於一部分的第一金屬焊墊上;第二晶片模組堆疊於第一晶片模組上,此第二晶片模組具有複數個第二金屬焊墊。複數個第二金凸塊位於第二金屬焊墊之上,其中這些第二金凸塊藉由超音波振盪方式(Ultrasonic Bonding)與第一金凸塊對接。非導電性黏著劑填充於第一晶片模組與第二晶片模組之間,以黏結第一晶片模組與第二晶片模組。 According to an embodiment of the invention, a chip package structure includes a first wafer module, a plurality of first gold bumps, a second wafer module, a plurality of second gold bumps, and a non-conductive layer. Non-conductive Paste. The first chip module has a plurality of first bonding pads; the plurality of first gold bumps are located on a portion of the first metal pads; the second chip module is stacked on the first chip module, the first The two wafer module has a plurality of second metal pads. A plurality of second gold bumps are located on the second metal pad, wherein the second gold bumps are docked with the first gold bumps by ultrasonic bonding. A non-conductive adhesive is filled between the first wafer module and the second wafer module to bond the first wafer module and the second wafer module.

以上實施例的晶片封裝結構,利用立體架構來封裝多個晶片,這些晶片具有不同的製程,其間係以金凸塊來連接,兩金凸塊之間的距離可以縮短,因此可進一步減小整體封裝結構的體積,適用於小型電子產品。 In the chip package structure of the above embodiment, a plurality of wafers are packaged by using a three-dimensional structure, and the wafers have different processes, and the gold bumps are connected therebetween, and the distance between the two gold bumps can be shortened, thereby further reducing the overall The size of the package structure is suitable for small electronic products.

100‧‧‧晶片封裝結構 100‧‧‧ Chip package structure

101‧‧‧基板 101‧‧‧Substrate

103‧‧‧金打線 103‧‧‧Gold line

105‧‧‧黏膠層 105‧‧‧Adhesive layer

107‧‧‧第一晶片模組 107‧‧‧First chip module

109‧‧‧第一金屬焊墊 109‧‧‧First metal pad

111‧‧‧第三金凸塊 111‧‧‧ third gold bump

113‧‧‧第一金凸塊 113‧‧‧ first gold bump

115‧‧‧第二金凸塊 115‧‧‧second gold bump

117‧‧‧非導電性黏著劑 117‧‧‧ Non-conductive adhesive

119‧‧‧第二晶片模組 119‧‧‧second chip module

121‧‧‧第二金屬焊墊 121‧‧‧Second metal pad

125‧‧‧第三金屬焊墊 125‧‧‧ Third metal pad

200‧‧‧晶片封裝結構 200‧‧‧ Chip package structure

201‧‧‧第一金凸塊 201‧‧‧ first gold bump

201a‧‧‧第一區塊 201a‧‧‧ first block

201b‧‧‧第二區塊 201b‧‧‧Second block

203‧‧‧壓模膠 203‧‧‧Molded adhesive

第1圖係繪示本發明一實施例晶片封裝結構之示意剖面圖。 1 is a schematic cross-sectional view showing a chip package structure according to an embodiment of the present invention.

第2圖係繪示本發明另一實施例晶片封裝結構之示意剖面圖。 2 is a schematic cross-sectional view showing a chip package structure according to another embodiment of the present invention.

以下實施例的晶片封裝結構,將兩個或是兩個以上之晶片組合在單一封裝結構中,尤其可以整合製程相異的晶片,使晶片之間的路徑縮短來提昇電性功能,這些晶片之間以金凸塊來連接,兩金凸塊之間的距離可以縮短,因此可進一步減小整體封裝結構的體積,適用於小型電子產品。 In the chip package structure of the following embodiments, two or more wafers are combined in a single package structure, in particular, wafers having different processes can be integrated, and paths between the wafers can be shortened to improve electrical functions. The gold bumps are connected to each other, and the distance between the two gold bumps can be shortened, so that the volume of the overall package structure can be further reduced, which is suitable for small electronic products.

第1圖係繪示本發明一實施例晶片封裝結構之示意剖面圖。晶片封裝結構100含有第一晶片模組107、數個第一金凸塊(Au Bump)113、第二晶片模組119、數個第二金凸塊115,以及非導電性黏著劑117。 1 is a schematic cross-sectional view showing a chip package structure according to an embodiment of the present invention. The chip package structure 100 includes a first wafer module 107, a plurality of first gold bumps (Au Bump) 113, a second wafer module 119, a plurality of second gold bumps 115, and a non-conductive adhesive 117.

第二晶片模組119堆疊於第一晶片模組107上,第二晶片模組119之正面朝向第一晶片模組107之正面,為了方便打線,此兩晶片模組係以階梯狀之形式進行堆疊。第一晶片模組107與第二晶片模組119是製程相異的兩種晶片,第一晶片模組107可以是邏輯(Logic)製程所製造的邏輯電路晶片,例如控制晶片或是遊戲(Game)裝置晶片;第二晶片模組119則可能是記憶體電路晶片,例如快閃記憶體晶片(Flash memory chip)或動態隨機存取記憶體晶片 (Dynamic Random Access Memory,DRAM)等。第一晶片模組107與第二晶片模組119的位置可以對調,第二晶片模組119不一定要在第一晶片模組107上層。 The second chip module 119 is stacked on the first chip module 107, and the front surface of the second chip module 119 faces the front surface of the first chip module 107. The two chip modules are stepped in order to facilitate wire bonding. Stacking. The first chip module 107 and the second chip module 119 are two kinds of wafers having different processes. The first chip module 107 can be a logic circuit chip manufactured by a logic process, such as a control chip or a game (Game). The device chip; the second chip module 119 may be a memory circuit chip, such as a flash memory chip or a dynamic random access memory chip. (Dynamic Random Access Memory, DRAM), etc. The positions of the first chip module 107 and the second chip module 119 can be reversed, and the second chip module 119 does not have to be on the first wafer module 107.

第一晶片模組107與第二晶片模組119分別具有數個第一金屬焊墊(Bonding Pad)109或是數個第二金屬焊墊121,這些金屬焊墊為鋁(Al)焊墊,內嵌於第一晶片模組107或是第二晶片模組119當中。第一金屬焊墊109或是第二金屬焊墊121的寬度會小於第一金凸塊113或是第二金凸塊115的寬度。 The first chip module 107 and the second chip module 119 respectively have a plurality of first bonding pads 109 or a plurality of second metal pads 121, and the metal pads are aluminum (Al) pads. Embedded in the first wafer module 107 or the second wafer module 119. The width of the first metal pad 109 or the second metal pad 121 may be smaller than the width of the first gold bump 113 or the second gold bump 115.

第一金凸塊113位於一部分的第一金屬焊墊109上。數個第二金凸塊115位於第二金屬焊墊121之上。由於第二金凸塊115與第一金凸塊113之材質為金(Au;Gold),因此可以採用超音波振盪的方式來對接,金凸塊之間的間距可以縮小。在兩種金凸塊對接之前,會先將非導電性黏著劑(Non-Conductive Paste)117填充於第一晶片模組107與第二晶片模組119之間,以黏結第一晶片模組107與第二晶片模組119,並包覆第一金凸塊113與第二金凸塊115,之後才進行超音波振盪對接。由於採用非導電性黏著劑,晶片與晶片之間、金凸塊與金凸塊之間不再需要預留空間來灌入壓模膠(Molding compound),進一步縮小了封裝結構的體積。 The first gold bump 113 is located on a portion of the first metal pad 109. A plurality of second gold bumps 115 are located on the second metal pad 121. Since the material of the second gold bumps 115 and the first gold bumps 113 is gold (Au; Gold), ultrasonic wave oscillation can be used for docking, and the pitch between the gold bumps can be reduced. Before the two gold bumps are butted, a non-conductive adhesive (Non-Conductive Paste) 117 is filled between the first wafer module 107 and the second wafer module 119 to bond the first wafer module 107. And the second chip module 119, and covering the first gold bump 113 and the second gold bump 115, and then ultrasonic wave oscillation docking. Due to the use of a non-conductive adhesive, there is no need to reserve space between the wafer and the wafer, between the gold bumps and the gold bumps to fill the molding compound, which further reduces the volume of the package structure.

在此一實施例當中,第一金凸塊113的寬度均一,且其寬度與第二金凸塊115的寬度相等,兩種金凸塊可以互相貼合在一起,不會有突出的部份產生。兩第一金凸塊 113之間的間距L介於10um至30um之間,較佳的間距L則介於18um至20um之間。相較於傳統架構中間距為40um至50um,甚至為100um,採用金凸塊的本發明此一實施例的間距已經縮短許多,連帶使得封裝結構的體積也縮小。 In this embodiment, the width of the first gold bumps 113 is uniform, and the width thereof is equal to the width of the second gold bumps 115. The two gold bumps can be attached to each other without protruding portions. produce. Two first gold bumps The spacing L between 113 is between 10 um and 30 um, and the preferred spacing L is between 18 um and 20 um. Compared to the conventional architecture, the pitch is 40um to 50um, or even 100um, and the pitch of this embodiment of the present invention using gold bumps has been shortened a lot, and the package structure is also reduced in size.

在此一實施例當中,晶片封裝結構100更含基板101以及黏膠層105。黏膠層105將第一晶片模組107黏著於基板101上,黏膠層105之材質可為環氧樹脂(Epoxy)、丙烯酸(Acrylic)聚酯類等熱固性或熱塑性膠材,可利用加溫加壓製程進行貼附。基板101具有數個第三金屬焊墊(Bonding Pad)125,以連接金打線(Au wire)103之一端;金打線103之另一端連接於第三金凸塊111。 In this embodiment, the chip package structure 100 further includes a substrate 101 and an adhesive layer 105. The adhesive layer 105 adheres the first wafer module 107 to the substrate 101. The material of the adhesive layer 105 can be a thermosetting or thermoplastic adhesive such as epoxy resin or acrylic resin. Add a press to attach. The substrate 101 has a plurality of third bonding pads 125 connected to one end of the Au wire 103; the other end of the gold bonding wires 103 is connected to the third gold bumps 111.

藉由此一封裝結構,可一次封裝多個晶片,使晶片之間的連結路徑縮短,提升導電特性以及信號傳遞效率,金凸塊之間的間距也被縮短,進一步縮小封裝結構的體積,適用於小型電子裝置。 By using the package structure, a plurality of wafers can be packaged at one time, the connection path between the wafers is shortened, the conductive characteristics and the signal transmission efficiency are improved, the spacing between the gold bumps is also shortened, and the volume of the package structure is further reduced. For small electronic devices.

第2圖係繪示本發明另一實施例晶片封裝結構之示意剖面圖。在此一實施例當中,封裝結構200的組成大致上與第1圖的實施例相同,但此一實施例增加了壓模膠(Molding Compound)來進行包覆,且採用造型不同的金凸塊來銜接晶片模組。 2 is a schematic cross-sectional view showing a chip package structure according to another embodiment of the present invention. In this embodiment, the composition of the package structure 200 is substantially the same as that of the embodiment of FIG. 1, but this embodiment adds a molding compound to cover the gold bumps of different shapes. To connect the chip modules.

晶片封裝結構200含有基板101、第一晶片模組107、數個第一金凸塊(Au Bump)201、第二晶片模組119、數個第二金凸塊115,非導電性黏著劑117、金打線103,以及壓模膠203。 The chip package structure 200 includes a substrate 101, a first wafer module 107, a plurality of first gold bumps (Au Bump) 201, a second wafer module 119, and a plurality of second gold bumps 115, and a non-conductive adhesive 117. , gold wire 103, and molding compound 203.

第一金凸塊201具有第一區塊201a以及第二區塊201b,這兩種區塊會分成兩個階段來製作。第一區塊201a接觸第一金屬焊墊109,此第一區塊201a之截面積大於第一金屬焊墊109之截面積;第二區塊201b銜接於第一區塊201a以及第二金凸塊115之間,第二區塊201b之截面積小於第一區塊201a之截面積。兩個第一金凸塊201之間的間距則約略為10um至30um,甚至可縮短至18um至20um之間。 The first gold bump 201 has a first block 201a and a second block 201b, which are fabricated in two stages. The first block 201a is in contact with the first metal pad 109. The cross-sectional area of the first block 201a is larger than the cross-sectional area of the first metal pad 109. The second block 201b is connected to the first block 201a and the second gold bump. Between the blocks 115, the cross-sectional area of the second block 201b is smaller than the cross-sectional area of the first block 201a. The spacing between the two first gold bumps 201 is approximately 10 um to 30 um, and may even be shortened to between 18 um and 20 um.

壓模膠203包覆第一晶片模組107、第二晶片模組119、金打線103,以及非導電性黏著劑117,以進行封裝,保護焊接完成的金打線103,避免金打線103斷裂或是脫落。此壓模膠203之材質主要為環氧樹脂(Epoxy),或是其它熱固性(Thermosetting)材質。 The molding die 203 covers the first wafer module 107, the second wafer module 119, the gold bonding wire 103, and the non-conductive adhesive 117 for packaging to protect the welded gold wire 103, thereby preventing the gold wire 103 from being broken or It is falling off. The material of the molding compound 203 is mainly epoxy resin (Epoxy) or other thermosetting materials.

以上實施例的晶片封裝結構,將兩個或兩個以上之晶片,尤其是製程不同的晶片組合在單一封裝結構中,使晶片之間的路徑縮短來提昇電性功能,這些晶片之間以金凸塊經過超音波振盪來連接,兩金凸塊之間的距離可以縮短,因此可進一步減小整體封裝結構的體積,適用於小型電子產品。 In the wafer package structure of the above embodiment, two or more wafers, especially wafers having different processes, are combined in a single package structure, so that the path between the wafers is shortened to enhance electrical functions, and gold between the wafers is used. The bumps are connected by ultrasonic oscillation, and the distance between the two gold bumps can be shortened, thereby further reducing the volume of the overall package structure and being suitable for small electronic products.

101‧‧‧基板 101‧‧‧Substrate

103‧‧‧金打線 103‧‧‧Gold line

105‧‧‧黏膠層 105‧‧‧Adhesive layer

107‧‧‧第一晶片模組 107‧‧‧First chip module

109‧‧‧第一金屬焊墊 109‧‧‧First metal pad

111‧‧‧第三金凸塊 111‧‧‧ third gold bump

115‧‧‧第二金凸塊 115‧‧‧second gold bump

117‧‧‧非導電性黏著劑 117‧‧‧ Non-conductive adhesive

119‧‧‧第二晶片模組 119‧‧‧second chip module

121‧‧‧第二金屬焊墊 121‧‧‧Second metal pad

125‧‧‧第三金屬焊墊 125‧‧‧ Third metal pad

200‧‧‧晶片封裝結構 200‧‧‧ Chip package structure

201‧‧‧第一金凸塊 201‧‧‧ first gold bump

201a‧‧‧第一區塊 201a‧‧‧ first block

201b‧‧‧第二區塊 201b‧‧‧Second block

203‧‧‧壓模膠 203‧‧‧Molded adhesive

Claims (10)

一種晶片封裝結構,包含:一第一晶片模組,具有複數個第一金屬焊墊;複數個第一金凸塊,位於一部分的該些第一金屬焊墊上;一第二晶片模組,堆疊於該第一晶片模組上,該第二晶片模組具有複數個第二金屬焊墊;複數個第二金凸塊,位於該些第二金屬焊墊之上,其中該些第二金凸塊藉由超音波振盪方式與該些第一金凸塊對接;以及非導電性黏著劑,填充於該第一晶片模組與該第二晶片模組之間,以黏結該第一晶片模組與該第二晶片模組。 A chip package structure comprising: a first chip module having a plurality of first metal pads; a plurality of first gold bumps on a portion of the first metal pads; a second chip module stacked On the first chip module, the second chip module has a plurality of second metal pads; a plurality of second gold bumps are disposed on the second metal pads, wherein the second gold bumps The block is connected to the first gold bumps by means of ultrasonic oscillation; and a non-conductive adhesive is filled between the first chip module and the second chip module to bond the first chip module And the second wafer module. 如申請專利範圍第1項所述之晶片封裝結構,其中該些第一金凸塊之間距介於10um至30um之間。 The chip package structure of claim 1, wherein the distance between the first gold bumps is between 10 um and 30 um. 如申請專利範圍第1項所述之晶片封裝結構,其中各個第一金凸塊包含:一第一區塊,接觸該些第一金屬焊墊其中之一,該第一區塊之截面積大於該第一金屬焊墊之截面積;以及一第二區塊,銜接於該第一區塊以及該些第二金凸塊其一之間,該第二區塊之截面積小於該第一區塊之截面積。 The chip package structure of claim 1, wherein each of the first gold bumps comprises: a first block contacting one of the first metal pads, the cross-sectional area of the first block being greater than a cross-sectional area of the first metal pad; and a second block coupled between the first block and the second gold bumps, the cross-sectional area of the second block being smaller than the first area The cross-sectional area of the block. 如申請專利範圍第1項所述之晶片封裝結構,其中該第二晶片模組之正面朝向該第一晶片模組之正面。 The chip package structure of claim 1, wherein the front surface of the second chip module faces the front surface of the first wafer module. 如申請專利範圍第1項所述之晶片封裝結構,其中該第一晶片模組以及該第二晶片模組分別為邏輯電路晶片與記憶體電路晶片。 The chip package structure of claim 1, wherein the first chip module and the second chip module are a logic circuit chip and a memory circuit chip, respectively. 如申請專利範圍第1項所述之晶片封裝結構,其中該些第一金屬焊墊以及該些第二金屬焊墊係為鋁焊墊,內嵌於該第一晶片模組或是該第二晶片模組。 The chip package structure of claim 1, wherein the first metal pads and the second metal pads are aluminum pads embedded in the first chip module or the second Wafer module. 如申請專利範圍第1項所述之晶片封裝結構,更包含:複數個第三金凸塊,設置於該第一晶片模組之該些第一金屬焊墊上;以及複數條金打線,該些金打線之一端連接於該些第三金凸塊。 The chip package structure of claim 1, further comprising: a plurality of third gold bumps disposed on the first metal pads of the first chip module; and a plurality of gold wires, One end of the gold wire is connected to the third gold bumps. 如申請專利範圍第7項所述之晶片封裝結構,更包含:一基板,具有複數個第三金屬焊墊,以連接該些金打線之另一端;以及一黏膠層,以將該第一晶片模組黏著於該基板上。 The chip package structure of claim 7, further comprising: a substrate having a plurality of third metal pads for connecting the other ends of the gold wires; and an adhesive layer to The wafer module is adhered to the substrate. 如申請專利範圍第8項所述之晶片封裝結構,更包含:一壓模膠,包覆該第一晶片模組、該第二晶片模組、該些金打線,以及該非導電性黏著劑,以進行封裝。 The chip package structure of claim 8, further comprising: a molding die, covering the first wafer module, the second wafer module, the gold wires, and the non-conductive adhesive, For packaging. 如申請專利範圍第9項所述之晶片封裝結構,其中該壓模膠之材質為環氧樹脂。 The chip package structure according to claim 9, wherein the material of the mold compound is epoxy resin.
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