TWI534914B - A bonding method for chips - Google Patents
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- TWI534914B TWI534914B TW102144306A TW102144306A TWI534914B TW I534914 B TWI534914 B TW I534914B TW 102144306 A TW102144306 A TW 102144306A TW 102144306 A TW102144306 A TW 102144306A TW I534914 B TWI534914 B TW I534914B
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- 238000000034 method Methods 0.000 title claims description 32
- 239000000758 substrate Substances 0.000 claims description 80
- 239000000853 adhesive Substances 0.000 claims description 47
- 230000001070 adhesive effect Effects 0.000 claims description 47
- 238000000016 photochemical curing Methods 0.000 claims description 15
- 238000004528 spin coating Methods 0.000 claims description 8
- 238000003825 pressing Methods 0.000 claims description 4
- 239000003795 chemical substances by application Substances 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims 2
- 235000012431 wafers Nutrition 0.000 description 26
- 239000010410 layer Substances 0.000 description 24
- 239000003292 glue Substances 0.000 description 14
- 239000012790 adhesive layer Substances 0.000 description 6
- 238000001514 detection method Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000004026 adhesive bonding Methods 0.000 description 3
- 238000011031 large-scale manufacturing process Methods 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 239000012491 analyte Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 201000010099 disease Diseases 0.000 description 2
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000003848 UV Light-Curing Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000000084 colloidal system Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 210000003298 dental enamel Anatomy 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
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Description
本發明係關於一種晶片的結合方法,特別指一種具有多階段UV光照射的晶片的結合方法。 The present invention relates to a method of bonding a wafer, and more particularly to a method of bonding a wafer having multi-stage UV light irradiation.
在醫療檢測技術中,生物細胞檢測技術乃是極為關鍵的項目之一。現今的生物細胞檢測技術為了減少檢測花費的時間及提高偵測的準確性下,會利用拋棄式的生醫用晶片取代培養皿做為新型疾病及重大疾病的檢測平台。然而,為了防止分析物在晶片的流道內受到外在的影響,還有避免分析物外漏的問題,所以生醫用晶片會利用兩個或兩個以上的基板密閉封裝而成,以確保檢測數據的準確性。 Among the medical detection technologies, biological cell detection technology is one of the most critical projects. In order to reduce the time spent on detection and improve the accuracy of detection, today's biological cell detection technology replaces the culture dish with a disposable biomedical wafer as a detection platform for new diseases and major diseases. However, in order to prevent the analyte from being externally affected in the flow path of the wafer, and to avoid the problem of leakage of the analyte, the biomedical wafer is sealed by two or more substrates to ensure Detect the accuracy of the data.
在現有的晶片結合技術中,最常使用的熱壓結合的方式或UV膠的黏著方式來封裝晶片。其中,熱壓結合的過程中容易使基板結構產生變形,且熱壓結合的過程也耗時較長,所以不利於晶片大規模的生產製造。相較於熱壓結合基板的方式,使用UV膠來密封基板的製程時間較短,也不易使基板結構產生變形,所以UV膠的黏著方式有利於生醫用晶片大規模的生產製造。另外,在有關於UV膠黏著技術的文獻中,例如「UV ADHESIVE BONDING TECHNIQUES IN ROOM TEMPERATURE FOR PLASTIC LAB-ON-A-CHIPS」,此文獻是使用刮板(squeegee)將UV膠塗佈到下方基板表面上。之後,將上方基板與塗佈好UV膠的下方基板進行貼合,最後照射UV光固化UV膠即完成整個封裝的製程。但是,使用刮板將UV膠均勻塗佈的方式沒有辦法確保UV膠體厚度的均勻。此外,上方基板與下方基板結合時亦會有液態狀的UV膠滲入流道中之可能。 In the existing wafer bonding technology, the most commonly used thermocompression bonding method or UV adhesive bonding method is used to package the wafer. Among them, the process of thermocompression bonding tends to cause deformation of the substrate structure, and the process of thermocompression bonding takes a long time, which is disadvantageous for large-scale production and manufacture of the wafer. Compared with the method of hot-pressing and bonding the substrate, the process time of sealing the substrate by using the UV glue is short, and the substrate structure is not easily deformed. Therefore, the adhesion mode of the UV glue is advantageous for large-scale production of the medical wafer. In addition, in the literature on UV bonding technology, for example, "UV ADHESIVE BONDING TECHNIQUES IN ROOM TEMPERATURE FOR PLASTIC LAB-ON-A-CHIPS", which uses a squeegee to apply UV glue to the surface of the underlying substrate. After that, the upper substrate is bonded to the lower substrate coated with the UV glue, and finally the UV light curing UV glue is completed to complete the entire packaging process. However, there is no way to uniformly coat the UV glue using a squeegee to ensure uniform UV thickness. In addition, when the upper substrate is combined with the lower substrate, liquid UV glue may also penetrate into the flow channel.
因此,在將晶片結合的過程中,如何使UV膠達到薄且平坦,又能夠減少UV膠滲入流道內,便是值得本領域具有通常知識者去思考的。 Therefore, in the process of bonding the wafers, how to make the UV glue thin and flat, and to reduce the penetration of the UV glue into the flow channel, is worthy of consideration by those having ordinary knowledge in the field.
一種晶片的結合方法,包括以下步驟:首先,提供一第一基板,第一基板的其中一面為一第一貼合面。接著,在第一基板的第一貼合面形成一光硬化接著劑薄層。之後,以一第一燈具對光硬化接著劑薄層進行照射,以使光硬化接著劑薄層初步固化。然後,提供一第二基板,第二基板的其中一面為一第二貼合面,將第二貼合面貼合在第一基板的第一貼合面上。之後,以一第二燈具對光硬化接著劑薄層進行照射,以使光硬化接著劑薄層完全固化。其中,第二燈具的瓦數值會高於第一燈具的瓦數值。在本發明中,光硬化接著劑是指當受到某一波長範圍內的光照射後會產生化學反應,進而產生固化的膠體。上述的第一燈具與第二燈具所發出的光,是落在能讓光硬化接著劑固化的波長範圍。上述光硬化接著劑例如為UV膠,光硬化接著劑薄層例如為UV膠薄層,而第一燈具及第二燈則例如為UV燈。 A method for bonding a wafer includes the following steps: First, a first substrate is provided, one of the first substrates being a first bonding surface. Next, a thin layer of photocurable adhesive is formed on the first bonding surface of the first substrate. Thereafter, the thin layer of the photohardenable adhesive is irradiated with a first luminaire to preliminarily cure the thin layer of the photohardenable adhesive. Then, a second substrate is provided, one of the second substrates is a second bonding surface, and the second bonding surface is bonded to the first bonding surface of the first substrate. Thereafter, the thin layer of the photohardenable adhesive is irradiated with a second luminaire to completely cure the thin layer of the photohardenable adhesive. Wherein, the wattage value of the second luminaire will be higher than the wattage value of the first luminaire. In the present invention, a photocurable adhesive refers to a colloid which, upon being irradiated with light in a certain wavelength range, generates a chemical reaction, thereby producing a solidification. The light emitted by the first luminaire and the second luminaire described above falls in a wavelength range in which the photohardening adhesive can be cured. The photohardening adhesive is, for example, a UV glue, and the thin layer of the photocurable adhesive is, for example, a thin layer of UV glue, and the first lamp and the second lamp are, for example, UV lamps.
在上述之一種晶片的結合方法,在步驟b中,光硬化接著劑薄層是以旋轉塗佈的方式形成在第一基板材的第一貼合面上。 In the above method of bonding a wafer, in step b, the photohardenable adhesive thin layer is formed on the first bonding surface of the first substrate by spin coating.
在上述一種晶片的結合方法,在步驟d中還包括下述步驟:在貼合後的第一基板及第二基板上均勻施於壓力。 In the above method for bonding a wafer, the step d further includes the step of uniformly applying pressure to the bonded first substrate and the second substrate.
在上述之一種晶片的結合方法,其中第二基板的第二貼合面上具有多個微結構,當第二基板與第一基板貼合後,微結構能使第二基板與第一基板保持一定距離。 In the above method for bonding a wafer, wherein the second bonding surface of the second substrate has a plurality of microstructures, and when the second substrate is bonded to the first substrate, the microstructure can maintain the second substrate and the first substrate a certain distance.
在上述之一種晶片的結合方法,其中第二基板的第二貼合面上設有至少一個流道。 In the above method of bonding a wafer, at least one flow path is provided on the second bonding surface of the second substrate.
在上述之一種晶片的結合方法,其中旋轉塗佈的方式是以第一階段與第二階段的方式進行,第一階段是使用第一轉速值對該第一基板進行旋轉,第二階段是使用第二轉速值對該第一基板進行旋轉,第二轉速值高於該第一轉速值。 In the above method for bonding a wafer, the method of spin coating is performed in a first stage and a second stage, the first stage is to rotate the first substrate using the first rotation speed value, and the second stage is to use The second rotational speed value rotates the first substrate, and the second rotational speed value is higher than the first rotational speed value.
在上述之一種晶片的結合方法,第一燈具的瓦數值為36瓦,第二燈具的瓦數值為400瓦。 In the above method of bonding a wafer, the wattage of the first luminaire is 36 watts, and the wattage of the second luminaire is 400 watts.
以上之關於本發明內容之說明及以下之實施方式之說明係用以示範與解釋本發明之原理,並且提供本發明之專利申請範圍更進一步之解釋。 The above description of the present invention and the following description of the embodiments of the present invention are intended to illustrate and explain the principles of the invention.
10‧‧‧晶片 10‧‧‧ wafer
101‧‧‧第一基板 101‧‧‧First substrate
101A‧‧‧第一貼合面 101A‧‧‧ first fit surface
102‧‧‧第二基板 102‧‧‧second substrate
102A‧‧‧第二貼合面 102A‧‧‧Second mating surface
1021‧‧‧流道 1021‧‧‧ runner
1022‧‧‧微結構 1022‧‧‧Microstructure
103‧‧‧光硬化接著劑 103‧‧‧Light hardening adhesive
103’‧‧‧光硬化接著劑薄層 103'‧‧‧Light hardening adhesive thin layer
12‧‧‧旋轉塗佈機 12‧‧‧Rot coating machine
121‧‧‧真空吸盤 121‧‧‧vacuum suction cup
20‧‧‧第一燈具 20‧‧‧First lamps
30‧‧‧第二燈具 30‧‧‧second luminaire
圖1~圖7所繪示為本實施例之晶片10的結合方法。 1 to 7 illustrate a bonding method of the wafer 10 of the present embodiment.
請參閱圖1~圖7,圖1~圖7所繪示為本實施例之晶片10之組合 方法。首先,如圖1所繪示,提供一第一基板101,將第一基板101設置在一旋轉塗佈機12(Spin Coater)的真空吸盤121上,第一基板101未被真空吸盤121吸附的那一面為一第一貼合面101A。 之後,將適量光硬化接著劑103(例如為UV膠,黏滯係數為3200cps)倒入第一基板101的第一貼合面101A的中央處,在本實施例中,所倒入的光硬化接著劑103量為1mL。上述中,第一基板101的材質例如為陶瓷、塑膠、矽樹脂、橡膠或金屬等。此外,倒入光硬化接著劑103的多寡可依據第一貼合面101A的面積大小而有所增減。 Please refer to FIG. 1 to FIG. 7 . FIG. 1 to FIG. 7 illustrate the combination of the wafer 10 of the embodiment. method. First, as shown in FIG. 1, a first substrate 101 is provided, and the first substrate 101 is disposed on a vacuum chuck 121 of a spin coater 12, and the first substrate 101 is not adsorbed by the vacuum chuck 121. That side is a first bonding surface 101A. Thereafter, an appropriate amount of photocuring adhesive 103 (for example, UV glue, viscous coefficient of 3200 cps) is poured into the center of the first bonding surface 101A of the first substrate 101. In the present embodiment, the light hardening is poured. The amount of the subsequent agent 103 was 1 mL. In the above, the material of the first substrate 101 is, for example, ceramic, plastic, enamel resin, rubber or metal. Further, the amount of the photo-curing adhesive 103 may be increased or decreased depending on the size of the first bonding surface 101A.
接著,如圖2所繪示,旋轉塗佈機12開始將第一基板101的第一貼合面101A進行第一階段的光硬化接著劑103旋轉塗佈,在第一階段時會使用一第一轉速值對第一基板101進行旋轉,在本實施例中其第一轉速值為200轉/分鐘,並持續運轉25秒。此時,可看到光硬化接著劑103緩緩在第一貼合面101A上擴散開來。之後,如圖3所繪示,結束第一階段的光硬化接著劑103旋轉塗佈後,旋轉塗佈機12立即進入第二階段的光硬化接著劑103旋轉塗佈,在第二階段時會使用一第二轉速值對第一基板101進行旋轉,且該第二轉速值會大於該第一轉速值,在本實施例中第二轉速值為1000轉/分鐘,並持續運轉12秒。第一貼合面101A經過第一階段及第二階段的光硬化接著劑103旋轉塗佈後,第一貼合面101A上會形成一均勻的液態狀光硬化接著劑薄層103’(例如為UV膠薄層,厚度約55um)。相較於文獻「UV ADHESIVE BONDING TECHNIQUES IN ROOM TEMPERATURE FOR PLASTIC LAB-ON-A-CHIPS」是使用刮板的方式塗佈UV膠,本實施例之晶片 10之組合方法使用兩階段旋轉塗佈的方式更能使光硬化接著劑103達到薄且平坦的效果。在本實施例中,是以兩階段旋轉塗佈的方式製作光硬化接著劑薄層103’,但本領域通常知識者也能只以一階段旋轉塗佈的方式完成光硬化接著劑薄層103’的製作,或者用其他的方式來形成光硬化接著劑薄層103’。 Next, as shown in FIG. 2, the spin coater 12 starts to spin-coat the first bonding surface 101A of the first substrate 101 to the first-stage photo-curing adhesive 103, and uses a first stage in the first stage. The first substrate 101 is rotated by a rotational speed value. In the present embodiment, the first rotational speed value is 200 rpm, and the operation is continued for 25 seconds. At this time, it can be seen that the photo-curing adhesive 103 gradually spreads over the first bonding surface 101A. Thereafter, as shown in FIG. 3, after the first stage of the photo-curing adhesive 103 is spin-coated, the spin coater 12 immediately enters the second-stage photo-curing adhesive 103 to be spin-coated, and in the second stage, The first substrate 101 is rotated using a second rotational speed value, and the second rotational speed value is greater than the first rotational speed value. In the present embodiment, the second rotational speed value is 1000 rpm, and the operation is continued for 12 seconds. After the first bonding surface 101A is spin-coated by the first and second stages of the photo-curing adhesive 103, a uniform liquid photo-curing adhesive thin layer 103' is formed on the first bonding surface 101A (for example, A thin layer of UV glue with a thickness of about 55um). Compared with the literature "UV ADHESIVE BONDING TECHNIQUES IN ROOM TEMPERATURE FOR PLASTIC LAB-ON-A-CHIPS" is a method of coating a UV glue using a squeegee, the wafer of this embodiment The combination of 10 uses a two-stage spin coating to further achieve a thin and flat effect of the photohardenable adhesive 103. In the present embodiment, the photocurable adhesive thin layer 103' is formed by two-stage spin coating, but those skilled in the art can also complete the photocurable adhesive thin layer 103 by only one-stage spin coating. 'Making, or otherwise forming a thin layer 103' of photohardenable adhesive.
然後,如圖4所繪示,使用一第一燈具20對光硬化接著劑薄層103’進行照射,在本實施例中第一燈具20例如為36W的UV燈,其照射光硬化接著劑薄層103’的時間為8~10秒。第一燈具20所發出光線會使光硬化接著劑薄層103’初步固化,以降低光硬化接著劑薄層103’的流動性。之後,如圖5所繪示,提供一第二基板102,第二基板102其中一面為一第二貼合面102A,並於第二貼合面102A上形成多個凹槽作為流道1021,而流道1021可以用微機電細加工技術或其他習知技術形成。然後,將第二基板102的第二貼合面102A貼合在第一基板101的光硬化接著劑薄層103’上。由於光硬化接著劑薄層103’經第一燈具20照射後已降低其流動性,所以第二基板102貼合在第一基板101時,光硬化接著劑薄層103’即使受到第一基板101及第二基板102的擠壓也不易流入至第二貼合面102A的流道1021內,這樣就能確保流道1021不會受到流入其內之光硬化接著劑103的阻礙。上述中,第二基板102的第二貼合面102A上除了具有流道1021以外,第二貼合面102A更包括多個微結構1022(請再參閱圖5),當第二基板102與第一基板101貼合後,微結構1022能使第二基板102與第一基板101保持一定的距離,該距離也是用於防止光硬化接著劑薄層103’過度擠壓而流入流道1021內。 Then, as shown in FIG. 4, the photo-curing adhesive thin layer 103' is irradiated with a first luminaire 20, which in this embodiment is, for example, a 36W UV lamp, which is irradiated with a light-hardening adhesive. The time of layer 103' is 8 to 10 seconds. The light emitted by the first luminaire 20 causes the photohardenable adhesive layer 103' to be initially cured to reduce the fluidity of the photohardenable adhesive layer 103'. Then, as shown in FIG. 5, a second substrate 102 is provided. One of the second substrate 102 is a second bonding surface 102A, and a plurality of grooves are formed on the second bonding surface 102A as the flow channel 1021. The flow channel 1021 can be formed using microelectromechanical fine processing techniques or other conventional techniques. Then, the second bonding surface 102A of the second substrate 102 is bonded to the photo-curable adhesive thin layer 103' of the first substrate 101. Since the photocurable adhesive thin layer 103' has been reduced in fluidity after being irradiated by the first lamp 20, when the second substrate 102 is attached to the first substrate 101, the photohardenable adhesive thin layer 103' is received by the first substrate 101. The pressing of the second substrate 102 also does not easily flow into the flow path 1021 of the second bonding surface 102A, so that the flow path 1021 can be prevented from being hindered by the light-hardening adhesive 103 flowing therein. In the above, the second bonding surface 102A of the second substrate 102 has a plurality of microstructures 1022 (see FIG. 5), in addition to the flow channel 1021, when the second substrate 102 and the second substrate 102 After the substrate 101 is bonded, the microstructure 1022 can maintain the second substrate 102 at a certain distance from the first substrate 101, and the distance is also used to prevent the photo-curing adhesive thin layer 103' from being excessively squeezed into the flow path 1021.
接著,如圖6所繪示,在第一基板101及第二基板102未被貼合的那一面上均勻的施予壓力,以確保第一基板101與第二基板102能緊密貼合。之後,使用一第二燈具30對光硬化接著劑薄層103’進行照射,第二燈具30的瓦數值要高於第一燈具20的瓦數值,在本實施例中第二燈具30例如為400W的UV燈,其照射光硬化接著劑薄層103’的時間為30秒。第二燈具30所發出的光線會使光硬化接著劑薄層103’快速固化,當光硬化接著劑薄層103’完全固化後便完成晶片10的製作。在本實施例中,不同瓦數的燈具是分成兩個階段照射著硬化接著劑薄層103’,但本領域通常者也能在此兩階段之間再使用其他瓦數的燈具去照射光硬化接著劑薄層103’,這樣可避免第一階段的燈具照射後,光硬化接著劑薄層103’的流動性還是偏高的情況發生。 Next, as shown in FIG. 6, the pressure is uniformly applied to the unbonded side of the first substrate 101 and the second substrate 102 to ensure that the first substrate 101 and the second substrate 102 can be closely adhered. Thereafter, the photo-curing adhesive thin layer 103' is irradiated with a second luminaire 30. The wattage value of the second luminaire 30 is higher than the wattage value of the first luminaire 20, and in the present embodiment, the second luminaire 30 is, for example, 400 W. The UV lamp was irradiated with a light-hardening adhesive layer 103' for 30 seconds. The light emitted by the second lamp 30 causes the photohardenable adhesive layer 103' to be rapidly cured, and the wafer 10 is completed after the photohardenable adhesive layer 103' is fully cured. In this embodiment, the lamps of different wattages are irradiated with the hardened adhesive thin layer 103' in two stages, but in the art, other wattage lamps can be used to illuminate the light hardening between the two stages. The thin layer 103' is then applied to avoid the occurrence of high mobility of the photohardenable adhesive layer 103' after the first stage of illumination.
相較於習知的晶片之組合方法,本實施例之晶片10之組合方法具有下列優點: The combination method of the wafer 10 of the present embodiment has the following advantages compared to the conventional method of combining wafers:
1.利用兩階段旋轉塗佈的方式能使光硬化接著劑103均勻且平坦的塗佈在第一基板101的第一貼合面101A上。 1. The photocurable adhesive 103 is uniformly and evenly applied onto the first bonding surface 101A of the first substrate 101 by means of two-stage spin coating.
2.受到第一燈具20(低功率)照射的光硬化接著劑103會降低其流動性,所以第一基板101與第二基板102貼合時,光硬化接著劑103不易流入第二基板102的流道1021內。 2. The photo-curing adhesive 103 irradiated by the first lamp 20 (low power) reduces the fluidity, so that when the first substrate 101 and the second substrate 102 are bonded, the photo-curing adhesive 103 does not easily flow into the second substrate 102. Inside the flow path 1021.
3.受到均勻施壓的第一基板101與第二基板102會使封裝完成的晶片10的密合度更高,整體結構更扎實。 3. The first substrate 101 and the second substrate 102 which are uniformly pressed cause a higher degree of adhesion of the packaged wafer 10, and the overall structure is more solid.
4.利用兩基板間的微結構1022控制距離,防止兩基板間過度擠壓導致光硬化接著劑103流入流道1021。 4. The distance is controlled by the microstructure 1022 between the two substrates to prevent excessive pressing between the two substrates, causing the photo-curing adhesive 103 to flow into the flow path 1021.
雖然本創作已以較佳實施例揭露如上,然其並非用以限定本創作,任何所屬技術領域中具有通常知識者,在不脫離本創作之精神和範圍內,當可作些許之更動與潤飾,因此本創作之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the present invention, and any person skilled in the art can make some changes and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of this creation is subject to the definition of the scope of the patent application attached.
10‧‧‧晶片 10‧‧‧ wafer
103’‧‧‧光硬化接著劑薄層 103'‧‧‧Light hardening adhesive thin layer
30‧‧‧第二燈具 30‧‧‧second luminaire
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