TWI517446B - 發光二極體發光增益結構 - Google Patents
發光二極體發光增益結構 Download PDFInfo
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- TWI517446B TWI517446B TW102135532A TW102135532A TWI517446B TW I517446 B TWI517446 B TW I517446B TW 102135532 A TW102135532 A TW 102135532A TW 102135532 A TW102135532 A TW 102135532A TW I517446 B TWI517446 B TW I517446B
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- 230000002708 enhancing effect Effects 0.000 title 1
- 238000007747 plating Methods 0.000 claims description 61
- 239000010410 layer Substances 0.000 claims description 25
- 239000000463 material Substances 0.000 claims description 11
- 229910010272 inorganic material Inorganic materials 0.000 claims description 8
- 239000007769 metal material Substances 0.000 claims description 8
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 8
- 150000002484 inorganic compounds Chemical class 0.000 claims description 7
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 6
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims description 6
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 claims description 6
- 239000002861 polymer material Substances 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 239000010931 gold Substances 0.000 claims description 4
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 229910052709 silver Inorganic materials 0.000 claims description 4
- 239000004332 silver Substances 0.000 claims description 4
- 239000002356 single layer Substances 0.000 claims description 4
- 229910052725 zinc Inorganic materials 0.000 claims description 4
- 239000011701 zinc Substances 0.000 claims description 4
- 230000000903 blocking effect Effects 0.000 claims description 3
- 229910000420 cerium oxide Inorganic materials 0.000 claims description 3
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 3
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims description 3
- 238000002955 isolation Methods 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 description 16
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
- H01L33/46—Reflective coating, e.g. dielectric Bragg reflector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
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- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/58—Optical field-shaping elements
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- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
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- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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Description
一種發光二極體的發光增益結構,尤其是指一種發光二極體的正向光增益結構。
發光二極體逐漸受到照明產業的重視,其能耗、發光效率及生命週期等特性皆優於傳統照明裝置;且其能使用光微影(Photolithography)技術製作,故能與積體電路(IC)的製程高度整合。因此在現代的電子器件中,以發光二極體為背光源相當常見。
發光二極體基本包含無機發光二極體和有機發光二極體。有機發光二極體因先天材料的限制,其發光效率及信賴度等特性仍無法及於無機發光二極體,因此目前在照明應用方面仍以無機發光二極體為大宗。
習知無機發光二極體由多層半導體層所組成。而在一最基本的無機發光二極體結構中,大致具有一P型半導體層及一N型半導體層。P型半導體層及一N型半導體層相接合而形成一P-N接面(P-N JUNCTION)。透過外界電流
的驅動,由P型半導體層提供的電子及由N型半導體層提供的電洞結合於P-N接面而發光。
上述之無機發光二極體中,由P-N接面所發射出之光線包含正向光及側向光。然而,受限於製程及幾何結構,實際上正向光之發光強度會大於側向光之發光強度。因此如何對正向光之增益為一必需考慮之課題。
為增益正向光,各種習知技術被開發出來。例如有利用額外增設之一反射結構與原有之發光二極體晶粒結合,藉以使側向光路徑被反射而朝正向光方向集中,進而增加發光亮度;或改變發光二極體晶粒本體之結構,使由P-N接面發射之光線朝正向光方向集中。
在上述的發光二極體發光增益結構中,不論是額外增設之反射結構,或使發光二極體本體晶粒本體之結構產生變化,其製程甚為複雜且需增加額外的設備,此皆導致製造成本的提高。
為解決上述問題,本發明提供一種發光二極體發光增益結構。直接在一發光二極體單元除出光面外之部分表面上形成至少一鍍覆膜。鍍覆膜可以是單層或多層結構,其可阻擋或反射發光二極體單元發射之側向光,進而可減少側向之雜散光或使側向光路徑改變朝向出光面方向,藉此增加發光二極體單元的發光強度。
本發明之一態樣在提供一種發光二極體發光增益
結構,包含一發光二極體單元以及至少一鍍覆膜。發光二極體單元包含若干表面及一出光面。至少一鍍覆膜形成於部分之表面上,且鍍覆膜阻擋或反射發光二極體單元發射之部分光線,進而增益發光二極體單元透過出光面發射之光線。
在一實施例中,鍍覆膜為單層或二層以上於部分表面上依序形成之鍍覆膜。其中,各鍍覆膜之厚度可介於0.1微米至20微米,且此些鍍覆膜厚度總合亦介於0.2微米至20微米。另外,鍍覆膜材質為一高分子材質、無機化合物材質或金屬材質。為金屬材質時,可為鋁、白金、黃金、銀、鋅或銅。無機化合物材質可為氧化鋯、二氧化鈦、硫酸鋇、二氧化矽、氮化鋁、氧化鋁。
在另一實施例中,發光二極體單元發射至少一正向光及一側向光,且隔離膜阻擋或反射發光二極體單元發射之側向光。此外,發光二極體單元可為一垂直電極型發光二極體單元、一水平電極型發光二極體單元或一覆晶型發光二極體單元。另外,若干表面中之部分表面可為一傾斜面或一垂直面。
100‧‧‧發光二極體發光增益結構
110‧‧‧發光二極體單元
110a~110e‧‧‧表面
110f‧‧‧出光面
111‧‧‧P型半導體層
112‧‧‧N型半導體層
120‧‧‧鍍覆膜
121‧‧‧鍍覆膜
122‧‧‧鍍覆膜
123‧‧‧鍍覆膜
131‧‧‧電極
132‧‧‧電極
A‧‧‧PN接面
L1‧‧‧正向光
L2‧‧‧側向光
第1圖繪示依據本發明一實施例之發光二極體發光增益結構立體示意圖。
第2A圖繪示依據第1圖之發光二極體發光增益結構另一實
施例之剖視圖。
第2B圖繪示依據第2A圖中之發光二極體單元所發射光線之另一實施例示意圖。
第3圖繪示依據第2A圖之發光二極體發光增益結構之另一實施例示意圖。
第4圖繪示依據第2A圖之發光二極體發光增益結構之再一實施例示意圖。
第5圖繪示依據第2A圖之發光二極體發光增益結構之又一實施例示意圖。
請參照第1圖及,第1圖繪示依據本發明一實施例之發光二極體發光增益結構100立體示意圖。發光二極體發光增益結構100包含一發光二極體單元110以及至少一鍍覆膜120。
發光二極體單元110可為垂直電極型或水平電極型。第1圖中以一水平電極型發光二極體單元110為例示。發光二極體單元110並包含電極131及電極132以為導電之用。發光二極體單元110可包含一基板(未繪示)或無基板。
發光二極體單元110由多層半導體疊合而成,其至少包含一P型半導體層111及一N型半導體層112。一PN接面A形成於P型半導體層111及一N型半導體層112接合處。
發光二極體單元110形成一六面體結構,其包含五個表面110a~110e及一出光面110f。在此等結構中,表面110a~110d大致垂直於PN接面A,而出光面110f及表面110e大致平行於PN接面A。以此視之,表面110a~110d可視為發光二極體單元110所形成之六面體結構之側表面,而出光面110f及表面110e則分別為六面體結構的上下表面。
鍍覆膜120形成的方式可用蒸鍍、濺鍍或其他方式形成於表面110a~110d上,其材質可為一高分子材質、無機材質或金屬材質。當使用金屬材質時,可為鋁、白金、黃金、銀、鋅或銅。鍍覆膜120目的為阻擋或反射發光二極體單元110的部分出光,其厚度介於0.1微米至20微米。在此厚度區間內,具有良好的阻擋或反射光線的效果。
請參照第2A圖,第2A圖繪示依據第1圖之發光二極體發光增益結構100另一實施例之剖視圖。本發明之鍍覆膜層數不受限制,可為單層膜結構或多層膜結構。較佳地,如第2A圖所繪示,係使用一三層膜結構。在如第1圖中的表面110a~110d上,形成有第一鍍覆膜121、第二鍍覆膜122以及第三鍍覆膜123。第一鍍覆膜121、第二鍍覆膜122以及第三鍍覆膜123分別依序疊合於表面110a~110d上。
第一鍍覆膜121、第二鍍覆膜122以及第三鍍覆膜123各別可為高分子材質、無機化合物材質或金屬材質。較佳地,第一鍍覆膜121及第三鍍覆膜123選取高分子材質,
而第二鍍覆膜122選取一金屬材質。當使用金屬材質時,可為鋁、白金、黃金、銀、鋅或銅。第一鍍覆膜121、第二鍍覆膜122或第三鍍覆膜123亦可選用無機化合物材質,無機化合物材質可為氧化鋯、二氧化鈦、硫酸鋇、二氧化矽、氮化鋁或氧化鋁。
第一鍍覆膜121及第三鍍覆膜123選取高分子材質時,可達到保護效果(如電性絕緣、抗溼及抗氧等),藉此對發光二極體單元110及第二鍍覆膜122形成抗溼、抗氧化的保護作用,增加發光二極體單元110的壽命。
大致上,發光二極體單元110由PN接面A發出一正向光L1及一側向光L2。在此實施例中的配置,當側向光L2發射至第一、第二或第三鍍覆膜(121、122、123)時,為第一、第二或第三鍍覆膜(121、122、123)所阻擋,而抑制了側向光L2的出光。更精確言之,主要是受到第二鍍覆膜122的阻擋。此時,正向光L1基於側向光L2被抑制,進而減少了雜散光的影響,而促進了正向光L1的發光強度。第一鍍覆膜121、第二鍍覆膜122以及第三鍍覆膜123各別厚度可介於0.1微米至20微米。當使用三層鍍覆膜結構時,其總厚度控制在0.2微米至20微米,藉此得到較佳的擋光效果。
請參照第2B圖,第2B圖依據第2A圖中之發光二極體單元110所發射光線之另一實施例示意圖。在第2B圖中,當側向光L2發射至第一、第二或第三鍍覆膜(121、122、123)時,為第一、第二或第三鍍覆膜(121、122、123)所反
射,而改變了側向光L2的光線路徑。更精確言之,主要是受到第二鍍覆膜122的反射而改變了光線的路徑,使側向光L2往正向光L1方向集中,藉此可增加發光強度。在第2B圖中,第一、第二或第三鍍覆膜(121、122、123)各層的材質、厚度如前述第2A圖中的實施例所提及,此不再贅述。
請參照第3圖,第3圖繪示依據第2A圖之發光二極體發光增益結構100之另一實施例示意圖。在第3圖中,發光二極體單元110採用一覆晶型發光二極體的形式。與第2A圖不同的是,由PN接面A的發出的正向光L1為與電極131及電極132所在面的相反方向,藉此避免光線被電極131及電極132阻擋,可獲致更好的發光強度。第一、第二或第三鍍覆膜(121、122、123)可阻擋或反射側向光L2以增加正向光L1的發光強度,其各層的材質、厚度如前述實施例所提及,此不再贅述。
請參照第4圖,第4圖繪示依據第2A圖之發光二極體發光增益結構100之再一實施例示意圖。在本發明中,發光二極體單元110的電極布置型式未受到限制。可使用如第2A圖中所繪示的平面電極型或如本實施例所示之垂直電極型。在第4圖中,電極131及電極132作為導電之用。第一、第二或第三鍍覆膜(121、122、123)可阻擋或反射側向光L2以增加正向光L1的發光強度,其各層的材質、厚度如前述實施例所提及,此不再贅述。
請參照第5圖,第5圖繪示依據第2A圖之發光二極體發光增益結構100又一實施例示意圖。第5圖中,為
了得到更好的光增益效果,表面110a~110d可設計成傾斜面,可具有多種反射角度變化,藉此得到更好的反射效果。
綜合以上,本發明提供一種發光二極體發光增益結構。發光二極體發光增益結構包含一發光二極體單元以及至少一鍍覆膜。鍍覆膜形成於發光二極體單元之部分表面上,供阻擋或反射由PN接面發射出之側向光,以增加正向光發光強度而提高發光效率。本發明的發光二極體發光增益結構製程簡易,直接以市售之發光二極體晶粒即可製作而成,不需再額外治具,可降低製作成本及工時。
110‧‧‧發光二極體單元
110b‧‧‧表面
110d‧‧‧表面
110e‧‧‧表面
110f‧‧‧出光面
111‧‧‧P型半導體層
112‧‧‧N型半導體層
121‧‧‧鍍覆膜
122‧‧‧鍍覆膜
123‧‧‧鍍覆膜
131‧‧‧電極
132‧‧‧電極
A‧‧‧PN接面
L1‧‧‧正向光
L2‧‧‧側向光
Claims (10)
- 一種發光二極體發光增益結構,包含:一發光二極體單元,其包含若干表面及一出光面;以及至少一鍍覆膜,形成於部分之該些表面上,該鍍覆膜阻擋或反射該發光二極體單元發射之部分光線,進而增益該發光二極體單元透過該出光面發射之光線。
- 如請求項1之發光二極體發光增益結構,其中該鍍覆膜為單層或二層以上於部分該些表面上依序形成之鍍覆膜。
- 如請求項2之發光二極體發光增益結構,其中該些鍍覆膜厚度總合介於0.2微米至20微米。
- 如請求項1之發光二極體發光增益結構,其中各該鍍覆膜厚度介於0.1微米至20微米。
- 如請求項1或2之發光二極體發光增益結構,其中該些鍍覆膜材質為一高分子材質、無機化合物材質或金屬材質。
- 如請求項5之發光二極體發光增益結構,其中該金屬材質為鋁、白金、黃金、銀、鋅或銅。
- 如請求項5之發光二極體發光增益結構,其中該無機化合物材質為氧化鋯、二氧化鈦、硫酸鋇、二氧化矽、氮化鋁、氧化鋁。
- 如請求項1之發光二極體發光增益結構,其中該發光二極體單元發射至少一正向光及一側向光,且該些隔離膜阻擋或反射該發光二極體單元發射之該側向光。
- 如請求項1之發光二極體發光增益結構,其中該發光二極體單元為一垂直電極型發光二極體單元、一水平電極型發光二極體單元或一覆晶型發光二極體單元。
- 如請求項1之發光二極體發光增益結構,其中該些表面中部分表面為一傾斜面或一垂直面。
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