TWI509996B - Successive-approximation-register analog-to-digital converter (sar adc) with programmable gain of amplitude of input signal and method therefor - Google Patents

Successive-approximation-register analog-to-digital converter (sar adc) with programmable gain of amplitude of input signal and method therefor Download PDF

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TWI509996B
TWI509996B TW102117287A TW102117287A TWI509996B TW I509996 B TWI509996 B TW I509996B TW 102117287 A TW102117287 A TW 102117287A TW 102117287 A TW102117287 A TW 102117287A TW I509996 B TWI509996 B TW I509996B
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capacitors
input signal
capacitor
differential input
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TW201444297A (en
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Jun Yang
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Realtek Semiconductor Corp
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可編程放大輸入信號振幅之逐漸逼近式類比數位轉換器(SAR ADC)及其方法Programmable amplified input signal amplitude gradually approximating analog digital converter (SAR ADC) and method thereof

本發明是關於一種逐漸逼近式類比數位轉換器(successive-approximation-register analog-to-digital converter;SAR ADC),特別是關於一種可編程放大輸入信號振幅之SAR ADC及其方法。The present invention relates to a progressive-approximation-register analog-to-digital converter (SAR ADC), and more particularly to a SAR ADC and method for amplifying an input signal amplitude.

類比數位轉換器(analog-to-digital converter;ADC)有多種架構,例如:快閃式(flash)ADC、管路式(pipelined)ADC、逐漸逼近式(successive-approximation-register;SAR)ADC等。這些架構各有各的優點,通常會依據不同的應用需求來選定。其中,SAR ADC較其他架構消耗較低功率、較小面積及較低成本。Analog-to-digital converters (ADCs) have a variety of architectures, such as: flash ADC, pipelined ADC, successive-approximation-register (SAR) ADC, etc. . Each of these architectures has its own advantages and is usually chosen for different application needs. Among them, SAR ADC consumes lower power, smaller area and lower cost than other architectures.

SAR ADC的運作始於取樣階段(sampling phase)。在取樣階段期間,取樣保持電路對類比輸入信號進行取樣存取。接著,SAR ADC進入位元循環階段(bit-cycling phase),以決定數位碼的轉換輸出。The operation of the SAR ADC begins in the sampling phase. During the sampling phase, the sample and hold circuit samples and accesses the analog input signal. The SAR ADC then enters the bit-cycling phase to determine the conversion output of the digital code.

N位元(N-bit)SAR ADC通常包括一取樣保持(S/H)電路、一N位元數位類比轉換器(digital-to-analog converter;DAC)、一電壓比較器以及一SAR控制電路。An N-bit SAR ADC typically includes a sample-and-hold (S/H) circuit, an N-bit digital-to-analog converter (DAC), a voltage comparator, and a SAR control circuit. .

輸入電壓經由取樣保持電路提供穩定電壓給電壓比較器,並且電壓比較器將此穩定電壓與N位元DAC的輸出電壓做比較。SAR控制電路使用二元搜索演算法(binary search algorithm)控制N位元DAC的輸出。The input voltage provides a regulated voltage to the voltage comparator via the sample and hold circuit, and the voltage comparator compares this regulated voltage to the output voltage of the N-bit DAC. The SAR control circuit uses a binary search algorithm to control the output of the N-bit DAC.

其中,取樣保持電路及N位元DAC一般是以電容陣列組成之電容式DAC實現。SAR控制電路透過控制電容式DAC中的開關元件的開關來調整N位元DAC的輸出。Among them, the sample and hold circuit and the N-bit DAC are generally implemented by a capacitive DAC composed of a capacitor array. The SAR control circuit adjusts the output of the N-bit DAC by controlling the switching of the switching elements in the capacitive DAC.

為了抑制電源雜訊和共模雜訊,常見的SAR ADC會採用全差分結構。常見的全差分結構的SAR ADC主要有兩種:一種採用上極板取樣,一種採用下極板取樣。也就是說,在取樣階段期間,電容陣列的上極板均耦接至輸入信號或電容陣列的下極板均耦接至輸入信號,以取樣輸入信號。To suppress power noise and common mode noise, common SAR ADCs use a fully differential architecture. There are two main types of SAR ADCs with common fully differential structures: one with upper plate sampling and one with lower plate sampling. That is, during the sampling phase, the upper plate of the capacitor array is coupled to the input signal or the lower plate of the capacitor array is coupled to the input signal to sample the input signal.

由於受到電容的取樣雜訊(KT/C noise)的限制,SAR ADC的取樣電容的大小通常是與輸入信號的振幅的平方成反比。因此,若能將輸入信號的振幅增大,則可大幅減小取樣電容的大小。現有技術主要是使用可編程增益放大器(programmable gain amplifier;PGA)來實現對輸入信號的振幅進行放大,但PGA本身會消耗晶片面積,並且會帶來額外的雜訊(noise)。Due to the limitation of the capacitive sampling noise (KT/C noise), the sampling capacitance of the SAR ADC is usually inversely proportional to the square of the amplitude of the input signal. Therefore, if the amplitude of the input signal can be increased, the size of the sampling capacitor can be greatly reduced. The prior art mainly uses a programmable gain amplifier (PGA) to amplify the amplitude of the input signal, but the PGA itself consumes the chip area and brings additional noise.

在一實施例中,一種可編程放大輸入信號振幅之逐漸逼近式類比數位轉換器包括一第一端點、一第二端點、一第三端點、一第四端點、一第五端點、一比較器、一SAR控制電路、一選擇模組以及一電容模組。選擇模組包括複數個第一切換單元UA1、UA2~UA(N-1)、複數個第二切換單元UB1、UB2~UB(N-1))、一第一開關SW1以及一第二開關SW2。電容模組170包括複數個第一電容CA1、CA2~CA(N-1)以及複數個第二電容CB1、CB2~CB(N-1)。In an embodiment, a progressive approximation analog-to-digital converter having a programmable amplified input signal amplitude includes a first end point, a second end point, a third end point, a fourth end point, and a fifth end A point, a comparator, a SAR control circuit, a selection module, and a capacitor module. The selection module includes a plurality of first switching units UA1, UA2~UA(N-1), a plurality of second switching units UB1, UB2~UB(N-1), a first switch SW1 and a second switch SW2. . The capacitor module 170 includes a plurality of first capacitors CA1, CA2~CA(N-1) and a plurality of second capacitors CB1, CB2~CB(N-1).

第一端點用以接收一差動輸入信號中之一者、第二端點用以接收此差動輸入信號中之另一者、第三端點用以接收正相參考電壓、第四端點用以接收反相參考電壓、以及第五端點用以接收共模電壓。The first end is configured to receive one of the differential input signals, the second end is configured to receive the other of the differential input signals, the third end is configured to receive the positive phase reference voltage, and the fourth end The point is for receiving the inverted reference voltage, and the fifth terminal is for receiving the common mode voltage.

SAR控制電路耦接比較器的輸出端,並根據比較器的輸出產生第一控制信號、第二控制信號以及數位信號。於此,第一切換單元受控於第一控制信號,而第二切換單元受控於第二控制信號。The SAR control circuit is coupled to the output of the comparator and generates a first control signal, a second control signal, and a digital signal according to the output of the comparator. Here, the first switching unit is controlled by the first control signal, and the second switching unit is controlled by the second control signal.

第一開關耦接在比較器的第一輸入端與第一端點之間,並且第二開關耦接在比較器的第二輸入端與第二端點之間。The first switch is coupled between the first input of the comparator and the first end, and the second switch is coupled between the second input and the second end of the comparator.

第一電容分別對應第一切換單元,並且耦接在比較器的第一輸入端與對應之第一切換單元之間。其中,各第一電容經由對應之第一切換單元耦接至第三端點、第 四端點及第五端點,並且至少一第一電容更經由對應之第一切換單元耦接至第二端點。The first capacitors respectively correspond to the first switching unit, and are coupled between the first input end of the comparator and the corresponding first switching unit. The first capacitors are coupled to the third endpoint via the corresponding first switching unit, The fourth end point and the fifth end point, and the at least one first capacitor is further coupled to the second end point via the corresponding first switching unit.

第二電容分別對應第二切換單元,並且耦接在比較器的第二輸入端與對應之第二切換單元之間。其中,各第二電容經由對應之第二切換單元耦接至第三端點、第四端點及第五端點。The second capacitors respectively correspond to the second switching unit, and are coupled between the second input end of the comparator and the corresponding second switching unit. The second capacitors are coupled to the third endpoint, the fourth endpoint, and the fifth endpoint via the corresponding second switching unit.

在一實施例中,一種可編程放大輸入信號振幅之SAR類比數位轉換方法,包括:依序執行之一取樣階段、一保持階段以及一位元循環階段。In one embodiment, a SAR analog-to-digital conversion method for programmable amplification of an input signal amplitude includes: sequentially performing one sampling phase, one holding phase, and one bit cycle phase.

在取樣階段期間的步驟包括:利用電容模組中的複數個第一電容的上極板取樣一差動輸入信號中之一者、利用此些第一電容中之至少一第一電容的下極板取樣此差動輸入信號中之另一者、以及利用電容模組中的複數個第二電容的上極板取樣此差動輸入信號中之另一者。其中,此些第二電容分別對應此些第一電容。The step of the sampling phase includes: sampling one of the differential input signals by using the upper plates of the plurality of first capacitors in the capacitor module, and utilizing the lower pole of the at least one of the first capacitors The board samples the other of the differential input signals and samples the other of the differential input signals using an upper plate of the plurality of second capacitors in the capacitive module. The second capacitors respectively correspond to the first capacitors.

在保持階段期間的步驟包括:將第一電容及第二電容的上極板與差動輸入信號斷開,以及將第一電容的下極板置位至電性連接一共模電壓。The step during the hold phase includes disconnecting the upper plate of the first capacitor and the second capacitor from the differential input signal, and setting the lower plate of the first capacitor to electrically connect a common mode voltage.

於位元循環階段期間的步驟包括:利用一比較器比較第一電容之上極板的端電壓與第二電容之上極板的端電壓、依序根據比較器的輸出將一第一電容的下極板及對應之第二電容的下極板由電性連接共模電壓切換成分別電性連接差動參考電壓,並於每次切換後再次利用比較器比較第一電容之上極板的端電壓與第二電容之上極板的端 電壓、以及根據比較器的輸出產生一數位信號。The step during the bit cycle phase includes: comparing a terminal voltage of the upper plate of the first capacitor with a terminal voltage of the upper plate of the second capacitor by using a comparator, sequentially, according to an output of the comparator, a first capacitor The lower plate of the lower plate and the corresponding second capacitor are electrically connected to the common mode voltage to be respectively electrically connected to the differential reference voltage, and after each switching, the comparator is used to compare the upper plate of the first capacitor. Terminal voltage and the end of the second capacitor The voltage, and a digital signal is generated based on the output of the comparator.

在一些實施例中,在取樣階段期間更包括:利用此些第二電容中之至少一者的下極板取樣差動輸入信號中之一者。並且,在保持階段期間更包括:將此些第二電容的下極板置位至電性連接共模電壓。In some embodiments, during the sampling phase, the method further includes sampling the one of the differential input signals with a lower plate of at least one of the second capacitors. Moreover, during the maintaining phase, the method further includes: setting the lower plates of the second capacitors to electrically connect the common mode voltage.

綜上,根據本發明之可編程放大輸入信號振幅之逐漸逼近式類比數位轉換器及其方法利用電容的上下極板同時取樣,因而能同時放大輸入信號的振幅,以致於在同樣程度的雜訊的考慮下,所需的取樣電容會更小,或者,對於相同的取樣電容,所帶來的雜訊會更小。並且,對於偽差動輸入信號,在經過取樣以後,就將偽差動輸入信號自動轉換成全差動輸入信號,藉以抑制電源雜訊和共模雜訊。In summary, the progressive approximation analog-to-digital converter of the amplitude of the programmable amplified input signal according to the present invention and the method thereof use the upper and lower plates of the capacitor to simultaneously sample, thereby simultaneously amplifying the amplitude of the input signal so as to be at the same level of noise. The sampling capacitance required will be smaller, or the noise will be smaller for the same sampling capacitor. Moreover, for the pseudo-differential input signal, after the sampling, the pseudo-differential input signal is automatically converted into a fully differential input signal, thereby suppressing power noise and common mode noise.

10‧‧‧逐漸逼近式類比數位轉換器10‧‧‧Frequent approximation analog digital converter

110‧‧‧比較器110‧‧‧ comparator

130‧‧‧SAR控制電路130‧‧‧SAR control circuit

150‧‧‧電容模組150‧‧‧Capacitor Module

170‧‧‧選擇模組170‧‧‧Selection module

N1‧‧‧第一端點N1‧‧‧ first endpoint

N2‧‧‧第二端點N2‧‧‧ second endpoint

N3‧‧‧第三端點N3‧‧‧ third endpoint

N4‧‧‧第四端點N4‧‧‧ fourth endpoint

N5‧‧‧第五端點N5‧‧‧ fifth endpoint

UA1~UA(N-1)‧‧‧第一切換單元UA1~UA(N-1)‧‧‧ first switching unit

UB1~UB(N-1)‧‧‧第二切換單元UB1~UB(N-1)‧‧‧Second switching unit

SW1‧‧‧第一開關SW1‧‧‧ first switch

SW2‧‧‧第二開關SW2‧‧‧second switch

CA1~CA(N-1)‧‧‧第一電容CA1~CA(N-1)‧‧‧first capacitor

CB1~CB(N-1)‧‧‧第二電容CB1~CB(N-1)‧‧‧second capacitor

CKin‧‧‧時脈信號CKin‧‧‧ clock signal

IN1‧‧‧第一輸入端IN1‧‧‧ first input

IN2‧‧‧第二輸入端IN2‧‧‧ second input

OUT‧‧‧輸出端OUT‧‧‧ output

ScA0~ScA(N-1)‧‧‧第一控制信號ScA0~ScA(N-1)‧‧‧ first control signal

ScB0~ScB(N-1)‧‧‧第二控制信號ScB0~ScB(N-1)‧‧‧second control signal

B1~BN‧‧‧數位碼B1~BN‧‧‧digit code

Vip‧‧‧正相輸入信號Vip‧‧ positive input signal

Vin‧‧‧反相輸入信號Vin‧‧‧Inverting input signal

Vrp‧‧‧正相參考電壓Vrp‧‧‧ positive phase reference voltage

Vrn‧‧‧反相參考電壓Vrn‧‧‧inverted reference voltage

Vcm‧‧‧共模電壓Vcm‧‧‧ Common mode voltage

CAN‧‧‧第三電容CAN‧‧‧ third capacitor

CBN‧‧‧第四電容CBN‧‧‧fourth capacitor

VA‧‧‧端電壓VA‧‧‧ terminal voltage

VB‧‧‧端電壓VB‧‧‧ terminal voltage

C‧‧‧電容C‧‧‧ capacitor

SW3‧‧‧開關SW3‧‧‧ switch

SW4‧‧‧開關SW4‧‧‧ switch

SW5‧‧‧開關SW5‧‧‧ switch

SW6‧‧‧開關SW6‧‧‧ switch

第1圖為根據本發明一實施例之可編程放大輸入信號振幅之逐漸逼近式類比數位轉換器(SAR ADC)的概要示意圖。1 is a schematic diagram showing a progressive approximation analog-to-digital converter (SAR ADC) of a programmable amplified input signal amplitude in accordance with an embodiment of the present invention.

第2圖為於取樣階段期間第1圖中之可編程放大輸入信號振幅之SAR ADC的一示範性狀態之示意圖。Figure 2 is a schematic illustration of an exemplary state of a SAR ADC of the programmable amplified input signal amplitude in Figure 1 during the sampling phase.

第3圖為於保持階段及位元循環階段之第1次比較期間第1圖中之可編程放大輸入信號振幅之SAR ADC的一示範性狀態之示意圖。Figure 3 is a diagram showing an exemplary state of a SAR ADC of the programmable amplified input signal amplitude in Figure 1 during the first comparison period of the hold phase and the bit cycle phase.

第4圖為於位元循環階段之第2次比較期間第1圖中 之可編程放大輸入信號振幅之SAR ADC的一示範性狀態之示意圖。Figure 4 is the first comparison period in the first cycle of the bit cycle. A schematic diagram of an exemplary state of a SAR ADC that can amplify an input signal amplitude.

第5圖為於位元循環階段之第2次比較期間第1圖中之可編程放大輸入信號振幅之SAR ADC的另一示範性狀態之示意圖。Figure 5 is a diagram showing another exemplary state of the SAR ADC of the programmable amplified input signal amplitude in Figure 1 during the second comparison period of the bit cycle phase.

第6圖為於位元循環階段之第3次比較期間第1圖中之可編程放大輸入信號振幅之SAR ADC的一示範性狀態之局部示意圖。Figure 6 is a partial schematic diagram of an exemplary state of a SAR ADC of the programmable amplified input signal amplitude in Figure 1 during the third comparison period of the bit cycle phase.

第7圖為於位元循環階段之第3次比較期間第1圖中之可編程放大輸入信號振幅之SAR ADC的另一示範性狀態之局部示意圖。Figure 7 is a partial schematic diagram of another exemplary state of the SAR ADC of the programmable amplified input signal amplitude in Figure 1 during the third comparison period of the bit cycle phase.

第8圖為根據本發明另一實施例之可編程放大輸入信號振幅之SAR ADC的局部示意圖。Figure 8 is a partial schematic diagram of a SAR ADC that can amplify the amplitude of an input signal in accordance with another embodiment of the present invention.

第9圖為於取樣階段期間第8圖中之可編程放大輸入信號振幅之SAR ADC的一示範性狀態之局部示意圖。Figure 9 is a partial schematic diagram of an exemplary state of a SAR ADC of the programmable amplified input signal amplitude in Figure 8 during the sampling phase.

第10圖為於保持階段及位元循環階段之第1次比較期間第8圖中之可編程放大輸入信號振幅之SAR ADC的一示範性狀態之局部示意圖。Figure 10 is a partial schematic diagram of an exemplary state of a SAR ADC of the programmable amplified input signal amplitude in Figure 8 during the first comparison period of the hold phase and the bit cycle phase.

第11圖為切換單元的一示範性結構之示意圖。Figure 11 is a schematic diagram of an exemplary structure of the switching unit.

第12圖為切換單元的另一示範性結構之示意圖。Fig. 12 is a schematic diagram showing another exemplary structure of the switching unit.

以下述及之「第一」、「第二」等術語,其係用以區別所指之元件,而非用以排序或限定所指元件之差異性,且亦非用以限制本發明之範圍。In the following terms, "first", "second" and the like, are used to distinguish the elements that are referred to, and are not intended to limit or limit the differences of the elements referred to, and are not intended to limit the scope of the present invention. .

參照第1圖,可編程放大輸入信號振幅之逐漸逼近式類比數位轉換器(successive-approximation-register analog-to-digital converter;SAR ADC)10包括一第一端點N1、一第二端點N2、一第三端點N3、一第四端點N4、一第五端點N5、一比較器110、一SAR控制電路130、一選擇模組170以及一電容模組150。Referring to FIG. 1, a progressive-approximation-register analog-to-digital converter (SAR ADC) 10 includes a first endpoint N1 and a second endpoint N2. A third endpoint N3, a fourth endpoint N4, a fifth endpoint N5, a comparator 110, a SAR control circuit 130, a selection module 170, and a capacitor module 150.

選擇模組170包括複數個切換單元(以下稱之為第一切換單元UA1、UA2~UA(N-1)以及第二切換單元UB1、UB2~UB(N-1))以及二輸入開關(以下稱之為第一開關SW1以及第二開關SW2)。電容模組150包括複數個電容(以下稱之為第一電容CA1、CA2~CA(N-1)以及第二電容CB1、CB2~CB(N-1))。於此,第一電容CA1、CA2~CA(N-1)分別對應於第一切換單元UA1、UA2~UA(N-1),而第二電容CB1、CB2~CB(N-1)分別對應於第二切換單元UB1、UB2~UB(N-1)。其中,N為大於1之正整數。在一些實施例中,此些切換單元與電容構成一開關切換電容陣列(switched-capacitor array(SCA))。The selection module 170 includes a plurality of switching units (hereinafter referred to as first switching units UA1, UA2 UA UA (N-1) and second switching units UB1, UB2 UB UB(N-1)) and two input switches (below) It is referred to as a first switch SW1 and a second switch SW2). The capacitor module 150 includes a plurality of capacitors (hereinafter referred to as first capacitors CA1, CA2 to CA(N-1) and second capacitors CB1, CB2 to CB(N-1)). Here, the first capacitors CA1, CA2~CA(N-1) correspond to the first switching units UA1, UA2~UA(N-1), respectively, and the second capacitors CB1, CB2~CB(N-1) respectively correspond to The second switching unit UB1, UB2~UB(N-1). Where N is a positive integer greater than one. In some embodiments, the switching units and capacitors form a switched-capacitor array (SCA).

第一電容CA1、CA2~CA(N-1)的下極板均經由對應之第一切換單元UA1、UA2~UA(N-1)耦接至第二端點N2、第三端點N3、第四端點N4及第五端點N5。舉例來說,第一電容CA1的下極板經由對應之第一切換單元UA1耦接至第二端點N2、第三端點N3、第四端點N4及第五端點N5。即,第一切換單元UA1耦接在第一電容CA1的下極板與第二端點N2之間、在第一電容CA1的下極板 與第三端點N3之間、在第一電容CA1的下極板與第四端點N4之間、以及在第一電容CA1的下極板與第五端點N5之間。同樣地,第一電容CA2的下極板則經由對應之第一切換單元UA2耦接至第二端點N2、第三端點N3、第四端點N4及第五端點N5。依此類推,第一電容CA(N-1)的下極板則經由對應之第一切換單元UA(N-1)耦接至第二端點N2、第三端點N3、第四端點N4及第五端點N5。The lower plates of the first capacitors CA1, CA2~CA(N-1) are coupled to the second end point N2 and the third end point N3 via the corresponding first switching units UA1, UA2~UA(N-1), The fourth endpoint N4 and the fifth endpoint N5. For example, the lower plate of the first capacitor CA1 is coupled to the second end point N2, the third end point N3, the fourth end point N4, and the fifth end point N5 via the corresponding first switching unit UA1. That is, the first switching unit UA1 is coupled between the lower plate of the first capacitor CA1 and the second end point N2 at the lower plate of the first capacitor CA1. Between the third terminal N3, between the lower plate and the fourth end point N4 of the first capacitor CA1, and between the lower plate and the fifth end point N5 of the first capacitor CA1. Similarly, the lower plate of the first capacitor CA2 is coupled to the second end point N2, the third end point N3, the fourth end point N4, and the fifth end point N5 via the corresponding first switching unit UA2. And so on, the lower plate of the first capacitor CA(N-1) is coupled to the second end point N2, the third end point N3, and the fourth end point via the corresponding first switching unit UA(N-1) N4 and fifth endpoint N5.

第二電容CB1、CB2~CB(N-1)的下極板均經由對應之第二切換單元UB1、UB2~UB(N-1)耦接至第一端點N1、第三端點N3、第四端點N4及第五端點N5。舉例來說,第二電容CB1的下極板經由對應之第二切換單元UB1耦接至第一端點N1、第三端點N3、第四端點N4及第五端點N5。即,第二切換單元UB1耦接在第二電容CB1的下極板與第一端點N1之間、在第二電容CB1的下極板與第三端點N3之間、在第二電容CB1的下極板與第四端點N4之間、以及在第二電容CB1的下極板與第五端點N5之間。同樣地,第二電容CB2的下極板則經由對應之第二切換單元UA2耦接至第一端點N1、第三端點N3、第四端點N4及第五端點N5。依此類推,第二電容CB(N-1)的下極板則經由對應之第二切換單元UB(N-1)耦接至第一端點N1、第三端點N3、第四端點N4及第五端點N5。The lower plates of the second capacitors CB1, CB2~CB(N-1) are coupled to the first end point N1 and the third end point N3 via the corresponding second switching units UB1, UB2 UB UB(N-1), The fourth endpoint N4 and the fifth endpoint N5. For example, the lower plate of the second capacitor CB1 is coupled to the first end point N1, the third end point N3, the fourth end point N4, and the fifth end point N5 via the corresponding second switching unit UB1. That is, the second switching unit UB1 is coupled between the lower plate of the second capacitor CB1 and the first terminal N1, between the lower plate and the third terminal N3 of the second capacitor CB1, and at the second capacitor CB1. Between the lower plate and the fourth end point N4, and between the lower plate and the fifth end point N5 of the second capacitor CB1. Similarly, the lower plate of the second capacitor CB2 is coupled to the first end point N1, the third end point N3, the fourth end point N4, and the fifth end point N5 via the corresponding second switching unit UA2. And so on, the lower plate of the second capacitor CB(N-1) is coupled to the first end point N1, the third end point N3, and the fourth end point via the corresponding second switching unit UB(N-1) N4 and fifth endpoint N5.

在一些實施例中,於電容量上,第一電容CA1、CA2~CA(N-1)分別對應於第二電容CB1、CB2~CB(N-1)。即,第一電容CAj的電容量等於第二電容 CBj的電容量。再者,第一電容CAj的電容量等於2倍的第一電容CA(j+1)的電容量,而第二電容CBj的電容量等於2倍的第二電容CB(j+1)的電容量。其中,j=1~N-2。In some embodiments, the first capacitors CA1, CA2~CA(N-1) correspond to the second capacitors CB1, CB2~CB(N-1), respectively, in terms of capacitance. That is, the capacitance of the first capacitor CAj is equal to the second capacitor CBj's capacitance. Furthermore, the capacitance of the first capacitor CAj is equal to twice the capacitance of the first capacitor CA(j+1), and the capacitance of the second capacitor CBj is equal to twice the capacitance of the second capacitor CB(j+1) capacity. Among them, j=1~N-2.

比較器110的第一輸入端IN1電性耦接第一開關SW1的一端以及第一電容CA1、CA2~CA(N-1)的上極板。比較器110的第二輸入端IN2電性耦接第二開關SW2的一端以及第二電容CB1、CB2~CB(N-1)的上極板。比較器110的輸出端OUT電性耦接至SAR控制電路130。第一開關SW1的另一端電性耦接第一端點N1,並且第二開關SW2的另一端電性耦接第二端點N2。換言之,第一開關SW1耦接在比較器110的第一輸入端IN1與第一端點N1之間,而第二開關SW2耦接在比較器110的第二輸入端IN2與第二端點N2之間。The first input terminal IN1 of the comparator 110 is electrically coupled to one end of the first switch SW1 and the upper plate of the first capacitors CA1, CA2~CA(N-1). The second input terminal IN2 of the comparator 110 is electrically coupled to one end of the second switch SW2 and the upper plate of the second capacitors CB1, CB2 C CB (N-1). The output terminal OUT of the comparator 110 is electrically coupled to the SAR control circuit 130. The other end of the first switch SW1 is electrically coupled to the first end point N1, and the other end of the second switch SW2 is electrically coupled to the second end point N2. In other words, the first switch SW1 is coupled between the first input terminal IN1 of the comparator 110 and the first terminal N1, and the second switch SW2 is coupled to the second input terminal IN2 and the second terminal end N2 of the comparator 110. between.

SAR控制電路130耦接在比較器110的輸出端OUT與選擇模組170的控制端之間,並且在時脈信號CKin的控制下根據比較器130的輸出產生第一控制信號ScA0~ScA(N-1)、第二控制信號ScB0~ScB(N-1)以及數位信號(即數位碼B1~BN)。The SAR control circuit 130 is coupled between the output terminal OUT of the comparator 110 and the control terminal of the selection module 170, and generates a first control signal ScA0~ScA according to the output of the comparator 130 under the control of the clock signal CKin. -1), second control signals ScB0~ScB(N-1) and digital signals (ie, digital code B1~BN).

於此,第一端點N1用以接收正相輸入信號Vip、第二端點N2用以接收反相輸入信號Vin、第三端點N3用以接收正相參考電壓Vrp、第四端點N4用以接收反相參考電壓Vrn、以及第五端點N5用以接收共模電壓Vcm。其中,正相輸入信號Vin與反相輸入信號Vip為一差動輸入信號(Vi)。正相參考電壓Vrp與反相參考電壓 Vrn為一差動參考電壓(Vref)。Here, the first end point N1 is for receiving the normal phase input signal Vip, the second end point N2 is for receiving the inverting input signal Vin, the third end point N3 is for receiving the positive phase reference voltage Vrp, and the fourth end point N4 And receiving the inverted reference voltage Vrn and the fifth terminal N5 for receiving the common mode voltage Vcm. The positive phase input signal Vin and the inverted input signal Vip are a differential input signal (Vi). Positive phase reference voltage Vrp and inverting reference voltage Vrn is a differential reference voltage (Vref).

在一些實施例中,電容模組150更具有一第三電容CAN以及一第四電容CBN。第三電容CAN耦接在比較器110的第一輸入端IN1與第五端點N5之間。第四電容CBN耦接在比較器110的第二輸入端IN2與第五端點N5之間。In some embodiments, the capacitor module 150 further has a third capacitor CAN and a fourth capacitor CBN. The third capacitor CAN is coupled between the first input terminal IN1 and the fifth terminal end N5 of the comparator 110. The fourth capacitor CBN is coupled between the second input terminal IN2 of the comparator 110 and the fifth terminal end N5.

在一些實施例中,於電容量上,第三電容CAN對應第四電容CBN。即,第三電容CAN的電容量等於第四電容CBN的電容量。再者,第三電容CAN的電容量等於第一電容CA(N-1)的電容量,而第四電容CBN的電容量等於第二電容CB(N-1)的電容量。In some embodiments, the third capacitor CAN corresponds to the fourth capacitor CBN in terms of capacitance. That is, the capacitance of the third capacitor CAN is equal to the capacitance of the fourth capacitor CBN. Furthermore, the capacitance of the third capacitor CAN is equal to the capacitance of the first capacitor CA(N-1), and the capacitance of the fourth capacitor CBN is equal to the capacitance of the second capacitor CB(N-1).

於運作時,SAR ADC 10首先進入一取樣階段。參照第2圖,於取樣階段期間,SAR控制電路130輸出第一控制信號ScA1~ScA(N-1)至所有第一切換單元UA1、UA2~UA(N-1)的控制端,以致使第一切換單元UA1、UA2~UA(N-1)分別響應第一控制信號ScA1~ScA(N-1)而將第一電容CA1、CA2~CA(N-1)的下極板電性連接至第二端點N2。In operation, the SAR ADC 10 first enters a sampling phase. Referring to FIG. 2, during the sampling phase, the SAR control circuit 130 outputs the first control signals ScA1~ScA(N-1) to the control terminals of all the first switching units UA1, UA2~UA(N-1), so as to cause A switching unit UA1, UA2~UA(N-1) electrically connects the lower plates of the first capacitors CA1, CA2~CA(N-1) to the first control signals ScA1~ScA(N-1), respectively. The second endpoint N2.

SAR控制電路130輸出第二控制信號ScB1~ScB(N-1)至所有第二切換單元UB1、UB2~UB(N-1)的控制端,以致使第二切換單元UB1、UB2~UB(N-1)分別響應第二控制信號ScB1~ScB(N-1)而將第二電容CB1、CB2~CB(N-1)的下極板電性連接至第一端點N1。The SAR control circuit 130 outputs the second control signals ScB1 SScB(N-1) to the control terminals of all the second switching units UB1, UB2 UB UB(N-1) to cause the second switching units UB1, UB2 UB UB (N -1) Electrically connecting the lower plates of the second capacitors CB1, CB2~CB(N-1) to the first terminal N1 in response to the second control signals ScB1 to ScB(N-1), respectively.

並且,SAR控制電路130分別輸出第一控制信 號ScA0與第二控制信號ScB0至第一開關SW1和第二開關SW2的控制端,以致使第一開關SW1響應第一控制信號ScA0將第一電容CA1、CA2~CA(N-1)的上極板電性連接第一端點N1,而第二開關SW2響應第二控制信號ScB0將第二電容CB1、CB2~CB(N-1)的上極板電性連接第二端點N2。And, the SAR control circuit 130 outputs the first control signal respectively. No. ScA0 and the second control signal ScB0 to the control ends of the first switch SW1 and the second switch SW2, so that the first switch SW1 responds to the first control signal ScA0 to the first capacitors CA1, CA2~CA(N-1) The plate is electrically connected to the first end point N1, and the second switch SW2 is electrically connected to the second end point N2 of the second capacitor CB1, CB2~CB(N-1) in response to the second control signal ScB0.

此時,第一電容CA1、CA2~CA(N-1)的上極板以及第二電容CB1、CB2~CB(N-1)的下極板經由第一端點N1接收正相輸入信號Vip並對正相輸入信號Vip進行取樣。第一電容CA1、CA2~CA(N-1)的下極板以及第二電容CB1、CB2~CB(N-1)的上極板經由第二端點N2接收反相輸入信號Vin並對反相輸入信號Vin進行取樣。At this time, the upper plates of the first capacitors CA1, CA2~CA(N-1) and the lower plates of the second capacitors CB1, CB2~CB(N-1) receive the positive phase input signal Vip via the first terminal N1. The positive phase input signal Vip is sampled. The lower plates of the first capacitors CA1, CA2~CA(N-1) and the upper plates of the second capacitors CB1, CB2~CB(N-1) receive the inverted input signal Vin via the second terminal N2 and counter The phase input signal Vin is sampled.

然後,SAR ADC 10由取樣階段進入一保持階段。參照第3圖,於保持階段期間,SAR控制電路130輸出第一控制信號ScA1~ScA(N-1)至所有第一切換單元UA1、UA2~UA(N-1)的控制端,以致使第一切換單元UA1、UA2~UA(N-1)分別響應第一控制信號ScA1~ScA(N-1)而將第一電容CA1、CA2~CA(N-1)的下極板從電性連接第二端點N2切換成電性連接第五端點N5。The SAR ADC 10 then enters a hold phase from the sampling phase. Referring to FIG. 3, during the hold phase, the SAR control circuit 130 outputs the first control signals ScA1~ScA(N-1) to the control terminals of all the first switching units UA1, UA2~UA(N-1), so as to cause A switching unit UA1, UA2~UA(N-1) electrically connects the lower plates of the first capacitors CA1, CA2~CA(N-1) in response to the first control signals ScA1~ScA(N-1), respectively. The second endpoint N2 is switched to electrically connect to the fifth endpoint N5.

SAR控制電路130輸出第二控制信號ScB1~ScB(N-1)至所有第二切換單元UB1、UB2~UB(N-1)的控制端,以致使第二切換單元UB1、UB2~UB(N-1)分別響應第二控制信號ScB1~ScB(N-1)而將第二電容CB1、CB2~CB(N-1)的下極板從電性連接第一端點N1切換成電 性連接第五端點N5。The SAR control circuit 130 outputs the second control signals ScB1 SScB(N-1) to the control terminals of all the second switching units UB1, UB2 UB UB(N-1) to cause the second switching units UB1, UB2 UB UB (N -1) switching the lower plates of the second capacitors CB1, CB2~CB(N-1) from the electrically connected first terminal N1 to the electrical respectively in response to the second control signals ScB1~ScB(N-1) The fifth terminal N5 is connected sexually.

並且,SAR控制電路130分別輸出第一控制信號ScA0與第二控制信號ScB0至第一開關SW1和第二開關SW2的控制端,以致使第一開關SW1響應第一控制信號ScA0將第一電容CA1、CA2~CA(N-1)的上極板與第一端點N1斷開,而第二開關SW2響應第二控制信號ScB0將第二電容CB1、CB2~CB(N-1)的上極板與第二端點N2斷開。Moreover, the SAR control circuit 130 outputs the first control signal ScA0 and the second control signal ScB0 to the control ends of the first switch SW1 and the second switch SW2, respectively, to cause the first switch SW1 to pass the first capacitor CA1 in response to the first control signal ScA0. The upper plate of CA2~CA(N-1) is disconnected from the first terminal N1, and the second switch SW2 is responsive to the second control signal ScB0 to the upper pole of the second capacitor CB1, CB2~CB(N-1) The board is disconnected from the second end point N2.

然後,SAR ADC 10由保持階段進入位元循環階段。於位元循環階段期間,比較器110開始第1次比較。此時,比較器110比較第一電容CA1、CA2~CA(N-1)之上極板的端電壓VA(即,第一輸入端IN1所接收到的電壓)與第二電容CB1、CB2~CB(N-1)之上極板的端電壓VB(即,第二輸入端IN2所接收到的電壓)。The SAR ADC 10 then enters the bit cycle phase from the hold phase. During the bit cycle phase, comparator 110 begins the first comparison. At this time, the comparator 110 compares the terminal voltage VA of the upper plate of the first capacitors CA1, CA2~CA(N-1) (that is, the voltage received by the first input terminal IN1) and the second capacitors CB1, CB2~. The terminal voltage VB of the upper plate of CB(N-1) (ie, the voltage received by the second input terminal IN2).

接著,SAR控制電路130根據比較器110的輸出(即,端電壓VA與端電壓VB的第1次比較結果)設定欲輸出之數位信號中之第1位元的數位碼B1,並且根據比較器110的輸出產生第一控制信號ScA1~ScA(N-1)至第一切換單元UA1、UA2~UA(N-1)的控制端以及產生第二控制信號ScB1~ScB(N-1)至第二切換單元UB1、UB2~UB(N-1)的控制端,以致使第一切換單元UA1響應第一控制信號ScA1將第一電容CA1、CA2~CA(N-1)中之最大電容(即,第一電容CA1)的下極板由電性連接共模電壓Vcm切換成電性連接正相參考電壓Vrp及反相參考電壓Vrn其中之一 者,而第二切換單元UB1響應第二控制信號ScB1將第二電容CB1、CB2~CB(N-1)中之對應第一電容CA1者(即,最大之第二電容CB1)的下極板由電性連接共模電壓Vcm切換成電性連接正相參考電壓Vrp及反相參考電壓Vrn其中之另一者。此時,其餘電容(第一電容CA2~CA(N-1)及第二電容CB2~CB(N-1))的下極板則維持不變,即電性連接共模電壓Vcm。Next, the SAR control circuit 130 sets the digital code B1 of the first bit of the digital signal to be output according to the output of the comparator 110 (ie, the first comparison result of the terminal voltage VA and the terminal voltage VB), and according to the comparator The output of 110 generates first control signals ScA1~ScA(N-1) to the control terminals of the first switching units UA1, UA2~UA(N-1) and generates second control signals ScB1~ScB(N-1) to The switching ends of the switching units UB1, UB2 UB UB(N-1) are such that the first switching unit UA1 responds to the first control signal ScA1 with the maximum capacitance of the first capacitors CA1, CA2~CA(N-1) (ie The lower plate of the first capacitor CA1) is switched from the electrically connected common mode voltage Vcm to one of the positive phase reference voltage Vrp and the inverted reference voltage Vrn. The second switching unit UB1 responds to the second control signal ScB1 with the lower plate of the second capacitor CB1, CB2~CB(N-1) corresponding to the first capacitor CA1 (ie, the largest second capacitor CB1). The electrical connection common mode voltage Vcm is switched to electrically connect the other of the positive phase reference voltage Vrp and the inverted reference voltage Vrn. At this time, the lower plates of the remaining capacitors (the first capacitors CA2~CA(N-1) and the second capacitors CB2~CB(N-1)) remain unchanged, that is, the common mode voltage Vcm is electrically connected.

舉例來說,參照第4圖,當端電壓VA大於端電壓VB時,SAR控制電路130將欲輸出之數位信號中之第1位元的數位碼B1設定為「1」,並且控制第一切換單元UA1將第一電容CA1的下極板電性連接至反相參考電壓Vrn以及控制第二切換單元UB1將第二電容CB1的下極板電性連接至正相參考電壓Vrp。並且,其餘電容的下極板的電性連接關係則維持不變。For example, referring to FIG. 4, when the terminal voltage VA is greater than the terminal voltage VB, the SAR control circuit 130 sets the digital code B1 of the first bit of the digital signal to be output to "1", and controls the first switching. The unit UA1 electrically connects the lower plate of the first capacitor CA1 to the inverted reference voltage Vrn and controls the second switching unit UB1 to electrically connect the lower plate of the second capacitor CB1 to the positive phase reference voltage Vrp. Moreover, the electrical connection relationship of the lower plates of the remaining capacitors remains unchanged.

參照第5圖,當端電壓VA不大於端電壓VB時,SAR控制電路130將欲輸出之數位信號中之第1位元的數位碼B1設定為「0」,並且控制第一切換單元UA1將第一電容CA1的下極板電性連接至正相參考電壓Vrp以及控制第二切換單元UB1將第二電容CB1的下極板電性連接至反相參考電壓Vrn。並且,其餘電容的下極板的電性連接關係則維持不變。Referring to FIG. 5, when the terminal voltage VA is not greater than the terminal voltage VB, the SAR control circuit 130 sets the digital code B1 of the first bit of the digital signal to be output to "0", and controls the first switching unit UA1 to The lower plate of the first capacitor CA1 is electrically connected to the positive phase reference voltage Vrp and the second switching unit UB1 is electrically connected to the lower plate of the second capacitor CB1 to the inverted reference voltage Vrn. Moreover, the electrical connection relationship of the lower plates of the remaining capacitors remains unchanged.

然後,比較器110再次比較第一電容CA1、CA2~CA(N-1)之上極板的端電壓VA與第二電容CB1、CB2~CB(N-1)之上極板的端電壓VB(即,進行第2次比 較)。Then, the comparator 110 compares the terminal voltage VA of the upper plate of the first capacitors CA1, CA2~CA(N-1) and the terminal voltage VB of the upper plate of the second capacitors CB1, CB2~CB(N-1) again. (ie, the second ratio More).

然後,SAR控制電路130再根據比較器110的輸出(即,端電壓VA與端電壓VB的第2次比較結果)設定欲輸出之數位信號中之第2位元的數位碼B2,並且根據比較器110的輸出產生第一控制信號ScA1~ScA(N-1)至第一切換單元UA1、UA2~UA(N-1)的控制端以及產生第二控制信號ScB1~ScB(N-1)至第二切換單元UB1、UB2~UB(N-1)的控制端,以致使第一切換單元UA2響應第一控制信號ScA2將第一電容CA1、CA2~CA(N-1)中之次大之第一電容CA2的下極板由電性連接共模電壓Vcm切換成電性連接正相參考電壓Vrp及反相參考電壓Vrn其中之一者,而第二切換單元UB2響應第二控制信號ScB2將第二電容CB1、CB2~CB(N-1)中之對應第一電容CA2者(即,次大之第二電容CB2)的下極板由電性連接共模電壓Vcm切換成電性連接正相參考電壓Vrp及反相參考電壓Vrn其中之另一者。此時,其餘電容(第一電容CA1、CA3~CA(N-1)及第二電容CB1、CB3~CB(N-1))的下極板則維持不變,即第一電容CA1與第二電容CB1維持分別電性連接正相參考電壓Vrp及反相參考電壓Vrn,而第一電容CA3~CA(N-1)及第二電容CB3~CB(N-1)維持電性連接共模電壓Vcm。Then, the SAR control circuit 130 further sets the digital code B2 of the second bit of the digital signal to be output according to the output of the comparator 110 (ie, the second comparison result of the terminal voltage VA and the terminal voltage VB), and according to the comparison. The output of the device 110 generates first control signals ScA1~ScA(N-1) to the control terminals of the first switching units UA1, UA2~UA(N-1) and generates second control signals ScB1~ScB(N-1) to a control end of the second switching unit UB1, UB2~UB(N-1) such that the first switching unit UA2 sends the second of the first capacitors CA1, CA2~CA(N-1) in response to the first control signal ScA2 The lower plate of the first capacitor CA2 is switched from the electrically connected common mode voltage Vcm to one of the positive phase reference voltage Vrp and the inverted reference voltage Vrn, and the second switching unit UB2 is responsive to the second control signal ScB2. The lower plate of the second capacitor CB1, CB2~CB(N-1) corresponding to the first capacitor CA2 (ie, the second largest capacitor CB2) is switched from the electrically connected common mode voltage Vcm to the electrical connection. The other of the phase reference voltage Vrp and the inverted reference voltage Vrn. At this time, the lower plates of the remaining capacitors (the first capacitors CA1, CA3~CA(N-1) and the second capacitors CB1, CB3~CB(N-1)) remain unchanged, that is, the first capacitor CA1 and the first capacitor The two capacitors CB1 are electrically connected to the positive phase reference voltage Vrp and the inverted reference voltage Vrn, respectively, and the first capacitors CA3~CA(N-1) and the second capacitors CB3~CB(N-1) are electrically connected to the common mode. Voltage Vcm.

於此,同樣地,參照第6圖(於此,假設第1次比較結果為端電壓VA大於端電壓VB),當端電壓VA大於端電壓VB時,SAR控制電路130將欲輸出之數位信號中之第2位元的數位碼B2設定為「1」,並且控制第一切 換單元UA2將第一電容CA2的下極板電性連接至反相參考電壓Vrn以及控制第二切換單元UB2將第二電容CB2的下極板電性連接至正相參考電壓Vrp。並且,其餘電容的下極板的電性連接關係則維持不變。Here, similarly, referring to FIG. 6 (here, assuming that the first comparison result is that the terminal voltage VA is greater than the terminal voltage VB), when the terminal voltage VA is greater than the terminal voltage VB, the SAR control circuit 130 will output the digital signal to be output. The digit code B2 of the second bit in the middle is set to "1", and the first slice is controlled. The switching unit UA2 electrically connects the lower plate of the first capacitor CA2 to the inverted reference voltage Vrn and controls the second switching unit UB2 to electrically connect the lower plate of the second capacitor CB2 to the positive phase reference voltage Vrp. Moreover, the electrical connection relationship of the lower plates of the remaining capacitors remains unchanged.

參照第7圖(於此,假設第1次比較結果為端電壓VA大於端電壓VB),當端電壓VA不大於端電壓VB時,SAR控制電路130將欲輸出之數位信號中之第2位元的數位碼B2設定為「0」,並且控制第一切換單元UA2將第一電容CA2的下極板電性連接至正相參考電壓Vrp以及控制第二切換單元UB2將第二電容CB2的下極板電性連接至反相參考電壓Vrn。並且,其餘電容的下極板的電性連接關係則維持不變。Referring to FIG. 7 (here, assuming that the first comparison result is that the terminal voltage VA is greater than the terminal voltage VB), when the terminal voltage VA is not greater than the terminal voltage VB, the SAR control circuit 130 will be the second bit of the digital signal to be output. The digit code B2 of the element is set to "0", and the first switching unit UA2 is controlled to electrically connect the lower plate of the first capacitor CA2 to the positive phase reference voltage Vrp and control the second switching unit UB2 to lower the second capacitor CB2. The plate is electrically connected to the inverting reference voltage Vrn. Moreover, the electrical connection relationship of the lower plates of the remaining capacitors remains unchanged.

換言之,每一次比較結果依序對應於一第一電容、依序對應於一第二電容,並且依序對應於數位信號的一位元。因此,於每次比較後,SAR控制電路130均會根據比較器110的輸出設定數位信號中對應位元之數位碼的值以及控制對應第一電容及對應第二電容的下極板的電壓準位(即,電性連接關係)。透過反覆進行比較、設定及控制,直至完成最後一位元的數位碼BN的設定為止。In other words, each comparison result sequentially corresponds to a first capacitor, sequentially corresponds to a second capacitor, and sequentially corresponds to a bit of the digit signal. Therefore, after each comparison, the SAR control circuit 130 sets the value of the digital code of the corresponding bit in the digital signal according to the output of the comparator 110 and controls the voltage level of the lower plate corresponding to the first capacitor and the corresponding second capacitor. Bit (ie, electrical connection relationship). By repeating comparison, setting and control until the last digit of the digit code BN is set.

於完成最後一位元的數位碼BN的設定後,SAR控制電路130會將數位信號(即所設定之所有數位碼B1~BN)輸出給下一級。After the setting of the last bit digital code BN is completed, the SAR control circuit 130 outputs the digital signal (i.e., all the digital code B1~BN set) to the next stage.

於此些實施例中,SAR ADC 10於取樣結束後,比較器130的輸入端的壓差為2(Vip-Vin),因此輸入 至比較器130的信號的振幅為差動輸入信號(Vi)的振幅的2倍。換言之,SAR ADC 10是將輸入信號(Vi)放大一倍後才進行比較。再者,在根據本發明之SAR ADC 10中,對於偽差動輸入信號,經過取樣以後就將偽差動輸入信號自動轉換成全差動輸入信號。例如:在偽差動輸入信號(正相輸入信號Vip及反相輸入信號Vin)中,反相輸入信號Vin始終為Vcmin,而正相輸入信號Vip則為Vcmin+△V。在取樣結束後,比較器130的第一輸入端IN1的輸入電壓(端電壓VA)為Vcm+△V,而比較器130的第二輸入端IN2的輸入電壓(端電壓VB)為Vcm-△V。In these embodiments, after the sampling is completed, the SAR ADC 10 has a voltage difference of 2 (Vip-Vin) at the input of the comparator 130, so the input The amplitude of the signal to the comparator 130 is twice the amplitude of the differential input signal (Vi). In other words, the SAR ADC 10 compares the input signal (Vi) by a factor of two. Furthermore, in the SAR ADC 10 according to the present invention, for the pseudo differential input signal, the pseudo differential input signal is automatically converted into a fully differential input signal after being sampled. For example, in the pseudo differential input signal (the positive phase input signal Vip and the inverted input signal Vin), the inverted input signal Vin is always Vcmin, and the positive phase input signal Vip is Vcmin + ΔV. After the sampling is completed, the input voltage (terminal voltage VA) of the first input terminal IN1 of the comparator 130 is Vcm + ΔV, and the input voltage (terminal voltage VB) of the second input terminal IN2 of the comparator 130 is Vcm - ΔV. .

再者,透過只提供部分電容的下極板可選擇電性連接輸入信號,來決定差動輸入信號(Vi)的振幅的放大倍率(在1倍至2倍之間)。Furthermore, the magnification of the amplitude of the differential input signal (Vi) (between 1 and 2 times) can be determined by electrically connecting the input signal to the lower plate that provides only a portion of the capacitance.

在一些實施例中,參照第8圖,第一電容CA1、CA2~CA(N-1)的下極板均經由對應之第一切換單元UA1、UA2~UA(N-1)耦接至第三端點N3、第四端點N4及第五端點N5。第二電容CB1、CB2~CB(N-1)的下極板均經由對應之第二切換單元UB1、UB2~UB(N-1)耦接至第三端點N3、第四端點N4及第五端點N5。In some embodiments, referring to FIG. 8, the lower plates of the first capacitors CA1, CA2~CA(N-1) are coupled to the first switching unit UA1, UA2~UA(N-1) to the first The three endpoints N3, the fourth endpoint N4, and the fifth endpoint N5. The lower plates of the second capacitors CB1, CB2~CB(N-1) are coupled to the third end point N3 and the fourth end point N4 via the corresponding second switching units UB1, UB2 UB UB(N-1) and The fifth endpoint N5.

其中,第一電容CA1、CA2~CA(N-1)中之至少一者的下極板更經由對應之第一切換單元耦接至第二端點N2,而其餘之第一電容所對應之第一切換單元則不與第二端點N2耦接。The lower plate of at least one of the first capacitors CA1, CA2~CA(N-1) is further coupled to the second end point N2 via the corresponding first switching unit, and the remaining first capacitors are corresponding to The first switching unit is not coupled to the second endpoint N2.

在一些實施例中,第二電容CB1、CB2~CB(N-1) 中之至少一者的下極板更經由對應之第二切換單元耦接至第一端點N1,而其餘之第二電容所對應之第二切換單元則不與第一端點N1耦接。In some embodiments, the second capacitor CB1, CB2~CB(N-1) The lower plate of at least one of the second switching units is coupled to the first end point N1 via the corresponding second switching unit, and the second switching unit corresponding to the remaining second capacitor is not coupled to the first end point N1.

舉例來說,在第8圖所示之SAR ADC 10的結構中,只有二第一電容CA1、CA3經由對應之第一切換單元UA1、UA3耦接至第二端點N2以及二第二電容CB1、CB3經由對應之第二切換單元UB1、UB3耦接至第一端點N1。其餘電容所對應之切換單元均不與第一端點N1和第二端點N2耦接。For example, in the structure of the SAR ADC 10 shown in FIG. 8, only the two first capacitors CA1 and CA3 are coupled to the second terminal N2 and the second capacitor CB1 via the corresponding first switching units UA1 and UA3. The CB3 is coupled to the first endpoint N1 via the corresponding second switching unit UB1, UB3. The switching units corresponding to the remaining capacitors are not coupled to the first terminal N1 and the second terminal N2.

於此,參照第9圖,於取樣階段期間,SAR控制電路130輸出第一控制信號ScA1~ScA(N-1)至所有第一切換單元UA1、UA2~UA(N-1)的控制端,以致使第一切換單元UA1、UA3分別響應第一控制信號ScA1、ScA3而將第一電容CA1、CA3的下極板電性連接至第二端點N2,並且第一切換單元UA2、UA4~UA(N-1)則分別響應第一控制信號ScA2、ScA4~ScA(N-1)而將第一電容CA2、CA4~CA(N-1)的下極板電性連接至第五端點N5。Here, referring to FIG. 9, during the sampling phase, the SAR control circuit 130 outputs the first control signals ScA1 to ScA(N-1) to the control terminals of all the first switching units UA1, UA2 to UA(N-1). So that the first switching unit UA1, UA3 electrically connects the lower plates of the first capacitors CA1, CA3 to the second end point N2 in response to the first control signals ScA1, ScA3, respectively, and the first switching unit UA2, UA4~UA (N-1) electrically connecting the lower plates of the first capacitors CA2, CA4~CA(N-1) to the fifth terminal N5 in response to the first control signals ScA2, ScA4~ScA(N-1), respectively. .

同時,SAR控制電路130輸出第二控制信號ScB1~ScB(N-1)至所有第二切換單元UB1、UB2~UB(N-1)的控制端,以致使第二切換單元UB1、UB3分別響應第二控制信號ScB1、ScB3而將第二電容CB1、CB3的下極板電性連接至第一端點N1,並且第二切換單元UB2、UB4~UB(N-1)則分別響應第二控制信號ScB2、ScB4~ScB(N-1)而將第二電容CB2、CB4~CB(N-1)的下極板 電性連接至第五端點N5。At the same time, the SAR control circuit 130 outputs the second control signals ScB1~ScB(N-1) to the control terminals of all the second switching units UB1, UB2~UB(N-1), so that the second switching units UB1, UB3 respectively respond The second control signals ScB1, ScB3 electrically connect the lower plates of the second capacitors CB1, CB3 to the first end point N1, and the second switching units UB2, UB4~UB(N-1) respectively respond to the second control Signals ScB2, ScB4~ScB(N-1) and the lower plates of the second capacitors CB2, CB4~CB(N-1) Electrically connected to the fifth terminal N5.

並且,SAR控制電路130分別輸出第一控制信號ScA0與第二控制信號ScB0至第一開關SW1和第二開關SW2的控制端,以致使第一開關SW1響應第一控制信號ScA0將第一電容CA1、CA2~CA(N-1)的上極板電性連接第一端點N1,而第二開關SW2響應第二控制信號ScB0將第二電容CB1、CB2~CB(N-1)的上極板電性連接第二端點N2。Moreover, the SAR control circuit 130 outputs the first control signal ScA0 and the second control signal ScB0 to the control ends of the first switch SW1 and the second switch SW2, respectively, to cause the first switch SW1 to pass the first capacitor CA1 in response to the first control signal ScA0. The upper plate of CA2~CA(N-1) is electrically connected to the first end point N1, and the second switch SW2 is connected to the upper end of the second capacitor CB1, CB2~CB(N-1) in response to the second control signal ScB0. The board is electrically connected to the second end point N2.

此時,第一電容CA1、CA2~CA(N-1)的上極板接收正相輸入信號Vip並對正相輸入信號Vip進行取樣。第二電容CB1、CB2~CB(N-1)的上極板經由第二端點N2接收反相輸入信號Vin並對反相輸入信號Vin進行取樣。而僅第一電容CA1、CA3的下極板經由第二端點N2接收反相輸入信號Vin並對反相輸入信號Vin進行取樣,以及第二電容CB1、CB3的下極板經由第一端點N1接收正相輸入信號Vip並對正相輸入信號Vip進行取樣。其餘電容(第一電容CA2、CA4~CA(N-1)以及第二電容CB2、CB4~CB(N-1))的下極板均不對輸入信號(正相輸入信號Vip或反相輸入信號Vin)進行取樣。At this time, the upper plates of the first capacitors CA1, CA2 to CA(N-1) receive the positive phase input signal Vip and sample the normal phase input signal Vip. The upper plates of the second capacitors CB1, CB2 to CB(N-1) receive the inverted input signal Vin via the second terminal N2 and sample the inverted input signal Vin. Only the lower plates of the first capacitors CA1, CA3 receive the inverted input signal Vin and sample the inverted input signal Vin via the second terminal N2, and the lower plates of the second capacitors CB1, CB3 pass through the first terminal N1 receives the positive phase input signal Vip and samples the positive phase input signal Vip. The lower plates of the remaining capacitors (the first capacitors CA2, CA4~CA(N-1) and the second capacitors CB2, CB4~CB(N-1)) do not have an input signal (positive phase input signal Vip or inverted input signal). Vin) for sampling.

於取樣結束後,參照第10圖,於保持階段期間,在SAR控制電路130的控制下,所有電容(第一電容CA1~CA(N-1)及第二電容CB1~CB(N-1))的下極板均置位至電性連接第五端點N5,並且所有電容的上極板均與差動輸入信號(正相輸入信號Vip或反相輸入信號Vin)斷開。After the sampling is completed, referring to FIG. 10, during the holding phase, under the control of the SAR control circuit 130, all the capacitors (the first capacitor CA1~CA(N-1) and the second capacitor CB1~CB(N-1) The lower plates are all set to be electrically connected to the fifth terminal N5, and the upper plates of all the capacitors are disconnected from the differential input signal (the positive phase input signal Vip or the inverted input signal Vin).

於位元循環階段期間,SAR ADC 10的運作則與上述實施例相同,故不再贅述。During the bit cycle phase, the operation of the SAR ADC 10 is the same as that of the above embodiment, and therefore will not be described again.

於此架構下,SAR ADC 10於取樣結束後,比較器130的輸入端的壓差為M(Vip-Vin),即SAR ADC 10能差動輸入信號的振幅放大M倍。其中,M介於1~2之間。Under this architecture, after the sampling is completed, the voltage difference at the input of the comparator 130 is M (Vip-Vin), that is, the amplitude of the differential input signal of the SAR ADC 10 is amplified by M times. Among them, M is between 1 and 2.

於此,雖然是以相對應之第一電容與第二電容同時以其下極板對輸入信號進行取樣,但本發明不限於此,即亦相對應之第一電容與第二電容可僅其中一者的下極板對輸入信號進行取樣。In this case, although the corresponding first capacitor and the second capacitor simultaneously sample the input signal with the lower plate thereof, the present invention is not limited thereto, that is, the corresponding first capacitor and second capacitor may be only included therein. The lower plate of one samples the input signal.

換言之,透過調整下極板可對輸入信號進行取樣的電容位置及數量可產生不同放大倍率之差動輸入信號(Vi)的振幅。In other words, the position and number of capacitors that can sample the input signal by adjusting the lower plate can produce amplitudes of the differential input signal (Vi) at different magnifications.

在一些實施例中,第一切換單元UA1、UA2~UA(N-1)和第二切換單元UB1、UB2~UB(N-1)中的每一者(以下通稱切換單元UB)是由複數個開關所構成。In some embodiments, each of the first switching units UA1, UA2 UA UA (N-1) and the second switching units UB1, UB2 UB UB(N-1) (hereinafter collectively referred to as switching unit UB) is plural The switch is composed of.

參照第11圖,對於下極板需對輸入信號進行取樣之電容C(即,第一電容CA1~CA(N-1)及第二電容CB1~CB(N-1)中之一),其所對應的切換單元UB可包括四個開關SW3、SW4、SW5、SW6。Referring to FIG. 11, a capacitor C (ie, one of the first capacitors CA1 to CA(N-1) and the second capacitors CB1 to CB(N-1)) for sampling the input signal of the lower plate, The corresponding switching unit UB may include four switches SW3, SW4, SW5, SW6.

開關SW3耦接在第五端點N5與電容C的下極板之間。開關SW4耦接在第四端點N4與電容C的下極板之間。開關SW5耦接在第三端點N3與電容C的下極板之間。開關SW6耦接在第一端點N1或第二端點N2與電容C的下極板之間。The switch SW3 is coupled between the fifth terminal N5 and the lower plate of the capacitor C. The switch SW4 is coupled between the fourth terminal N4 and the lower plate of the capacitor C. The switch SW5 is coupled between the third terminal N3 and the lower plate of the capacitor C. The switch SW6 is coupled between the first terminal N1 or the second terminal N2 and the lower plate of the capacitor C.

此些開關SW3、SW4、SW5、SW6的控制端耦接SAR控制電路130。換言之,每一個電容所耦接之此些開關SW3、SW4、SW5、SW6的開關(ON/OFF)是由對應之控制信號(即,第一控制信號ScA1~ScA(N-1)及第二控制信號ScB1~ScB(N-1)中之一)所控制。The control terminals of the switches SW3, SW4, SW5, and SW6 are coupled to the SAR control circuit 130. In other words, the switches (ON/OFF) of the switches SW3, SW4, SW5, and SW6 to which each capacitor is coupled are controlled by corresponding signals (ie, the first control signals ScA1~ScA(N-1) and the second Controlled by one of the control signals ScB1 to ScB(N-1).

參照第12圖,對於下極板不需對輸入信號進行取樣之電容C(即,第一電容CA1~CA(N-1)及第二電容CB1~CB(N-1)中之一),其所對應的切換單元UB則不需要開關SW6,即只包括三個開關SW3、SW4、SW5。Referring to FIG. 12, for the lower plate, the capacitor C (ie, one of the first capacitors CA1 to CA(N-1) and the second capacitors CB1 to CB(N-1)) is not required to sample the input signal, The corresponding switching unit UB does not need the switch SW6, that is, only three switches SW3, SW4, SW5 are included.

在一些實施例中,第一控制信號scA0~ScA(N-1)可以單一信號實現,亦可以多個信號實現。同樣地,第二控制信號ScB0~ScB(N-1)可以單一信號實現,亦可以多個信號實現。In some embodiments, the first control signals scA0~ScA(N-1) may be implemented as a single signal or as multiple signals. Similarly, the second control signals ScB0~ScB(N-1) may be implemented as a single signal or as multiple signals.

由於SAR控制電路130的結構與運作原理係為本領域之技術入員所熟知,故於此不再贅述。Since the structure and operation principle of the SAR control circuit 130 are well known to those skilled in the art, no further details are provided herein.

綜上,根據本發明之可編程放大輸入信號振幅之逐漸逼近式類比數位轉換器及其方法於取樣階段期間將電容陣列中至少一電容的下極板電性連接至輸入信號,以由電容陣列對輸入信號進行取樣及放大,藉以降低所需之取樣電容,或減少雜訊的產生。換言之,根據本發明之可編程放大輸入信號振幅之逐漸逼近式類比數位轉換器及其方法利用電容的上下極板同時取樣,因而能同時放大輸入信號的振幅,以致於在同樣程度的雜訊的考慮下,所需的取樣電容會更小,或者,對於相同的取樣電容,所帶來的 雜訊會更小。並且,對於偽差動輸入信號,在經過取樣以後,就將偽差動輸入信號自動轉換成全差動輸入信號,藉以抑制電源雜訊和共模雜訊。In summary, a progressive approximation analog-to-digital converter of a programmable amplified input signal amplitude and method thereof according to the present invention electrically connects a lower plate of at least one capacitor in a capacitor array to an input signal during a sampling phase to be used by a capacitor array The input signal is sampled and amplified to reduce the required sampling capacitance or to reduce noise generation. In other words, the progressive approximation analog-to-digital converter of the amplitude of the programmable amplified input signal according to the present invention and the method thereof use the upper and lower plates of the capacitor to simultaneously sample, thereby simultaneously amplifying the amplitude of the input signal so as to be at the same level of noise. Consider that the required sampling capacitance will be smaller, or, for the same sampling capacitor, The noise will be smaller. Moreover, for the pseudo-differential input signal, after the sampling, the pseudo-differential input signal is automatically converted into a fully differential input signal, thereby suppressing power noise and common mode noise.

雖然本發明以前述之實施例揭露如上,然其並非用以限定本發明,任何熟習相像技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。While the present invention has been described above in the foregoing embodiments, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope of patent protection shall be subject to the definition of the scope of the patent application attached to this specification.

10‧‧‧逐漸逼近式類比數位轉換器10‧‧‧Frequent approximation analog digital converter

110‧‧‧比較器110‧‧‧ comparator

130‧‧‧SAR控制電路130‧‧‧SAR control circuit

150‧‧‧電容模組150‧‧‧Capacitor Module

170‧‧‧選擇模組170‧‧‧Selection module

N1‧‧‧第一端點N1‧‧‧ first endpoint

N2‧‧‧第二端點N2‧‧‧ second endpoint

N3‧‧‧第三端點N3‧‧‧ third endpoint

N4‧‧‧第四端點N4‧‧‧ fourth endpoint

N5‧‧‧第五端點N5‧‧‧ fifth endpoint

UA1~UA(N-1)‧‧‧第一切換單元UA1~UA(N-1)‧‧‧ first switching unit

UB1~UB(N-1)‧‧‧第二切換單元UB1~UB(N-1)‧‧‧Second switching unit

SW1‧‧‧第一開關SW1‧‧‧ first switch

SW2‧‧‧第二開關SW2‧‧‧second switch

CA1~CA(N-1)‧‧‧第一電容CA1~CA(N-1)‧‧‧first capacitor

CB1~CB(N-1)‧‧‧第二電容CB1~CB(N-1)‧‧‧second capacitor

CKin‧‧‧時脈信號CKin‧‧‧ clock signal

IN1‧‧‧第一輸入端IN1‧‧‧ first input

IN2‧‧‧第二輸入端IN2‧‧‧ second input

OUT‧‧‧輸出端OUT‧‧‧ output

ScA0~ScA(N-1)‧‧‧第一控制信號ScA0~ScA(N-1)‧‧‧ first control signal

ScB0~ScB(N-1)‧‧‧第二控制信號ScB0~ScB(N-1)‧‧‧second control signal

B1~BN‧‧‧數位碼B1~BN‧‧‧digit code

Vip‧‧‧正相輸入信號Vip‧‧ positive input signal

Vin‧‧‧反相輸入信號Vin‧‧‧Inverting input signal

Vrp‧‧‧正相參考電壓Vrp‧‧‧ positive phase reference voltage

Vrn‧‧‧反相參考電壓Vrn‧‧‧inverted reference voltage

Vcm‧‧‧共模電壓Vcm‧‧‧ Common mode voltage

CAN‧‧‧第三電容CAN‧‧‧ third capacitor

CBN‧‧‧第四電容CBN‧‧‧fourth capacitor

VA‧‧‧端電壓VA‧‧‧ terminal voltage

VB‧‧‧端電壓VB‧‧‧ terminal voltage

Claims (17)

一種可編程放大輸入信號振幅之逐漸逼近式(SAR)類比數位轉換器,包括:一第一端點,用以接收一差動輸入信號中之一者;一第二端點,用以接收該差動輸入信號中之另一者;一第三端點,用以接收一正相參考電壓;一第四端點,用以接收一反相參考電壓;一第五端點,用以接收一共模電壓;一比較器,具有一第一輸入端、一第二輸入端以及一輸出端;一SAR控制電路,耦接該輸出端,以根據該比較器的輸出產生一第一控制信號、一第二控制信號以及一數位信號;一選擇模組,包括:複數個第一切換單元,受控於該第一控制信號;複數個第二切換單元,受控於該第二控制信號;一第一開關,耦接在該第一輸入端與該第一端點之間;以及一第二開關,耦接在該第二輸入端與該第二端點之間;以及一電容模組,包括: 複數個第一電容,分別對應該些第一切換單元,耦接在該第一輸入端與對應之該第一切換單元之間,其中各該第一電容經由對應之該第一切換單元耦接至該第三端點、該第四端點及該第五端點,並且該些第一電容中之至少一者更經由對應之該第一切換單元耦接至該第二端點;以及複數個第二電容,分別對應該些第二切換單元,耦接在該第二輸入端與對應之該第二切換單元之間,其中各該第二電容經由對應之該第二切換單元耦接至該第三端點、該第四端點及該第五端點。A progressive approximation (SAR) analog-to-digital converter capable of amplifying an input signal amplitude, comprising: a first end point for receiving one of a differential input signal; and a second end point for receiving the The other of the differential input signals; a third terminal for receiving a positive phase reference voltage; a fourth terminal for receiving an inverted reference voltage; and a fifth terminal for receiving a total of a comparator having a first input terminal, a second input terminal, and an output terminal; a SAR control circuit coupled to the output terminal for generating a first control signal according to an output of the comparator a second control signal and a digital signal; a selection module comprising: a plurality of first switching units controlled by the first control signal; a plurality of second switching units controlled by the second control signal; a switch coupled between the first input end and the first end point; and a second switch coupled between the second input end and the second end point; and a capacitor module including : a plurality of first capacitors respectively corresponding to the first switching unit, coupled between the first input end and the corresponding first switching unit, wherein each of the first capacitors is coupled via the corresponding first switching unit Up to the third end point, the fourth end point, and the fifth end point, and at least one of the first capacitors is coupled to the second end point via the corresponding first switching unit; a second capacitor, corresponding to the second switching unit, coupled between the second input terminal and the corresponding second switching unit, wherein each of the second capacitors is coupled to the second switching unit via the corresponding second switching unit The third endpoint, the fourth endpoint, and the fifth endpoint. 如請求項1所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中該些第一電容均經由對應之該第一切換單元耦接至該第一端點。The SAR analog-to-digital converter of the programmable amplifying input signal amplitude of claim 1, wherein the first capacitors are coupled to the first end point via the corresponding first switching unit. 如請求項2所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中於取樣階段期間,該些第一電容的上極板取樣該差動輸入信號中之該者,且該些第一電容的下極板取樣該差動輸入信號中之該另一者。The SAR analog-to-digital converter of the programmable amplified input signal amplitude of claim 2, wherein during the sampling phase, the upper plates of the first capacitors sample the one of the differential input signals, and the A lower plate of a capacitor samples the other of the differential input signals. 如請求項1或2所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中該些第二電容均經由對應之該第二切換單元耦接至該第二端點。The SAR analog-to-digital converter of the programmable amplifying input signal amplitude of claim 1 or 2, wherein the second capacitors are coupled to the second end point via the corresponding second switching unit. 如請求項4所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中於取樣階段期間,該些第二電容的上極板取樣該差動輸入信號中之該另一者、以及該些第二電容的下極板取樣該差動輸入信號中之該者。The SAR analog-to-digital converter of the programmable amplified input signal amplitude of claim 4, wherein during the sampling phase, the upper plates of the second capacitors sample the other of the differential input signals, and The lower plates of the second capacitors sample the one of the differential input signals. 如請求項1或2所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中該些第二電容中之至少一者更經由對應之該第二切換單元耦接至該第一端點The SAR analog-to-digital converter of the programmable amplifying input signal amplitude according to claim 1 or 2, wherein at least one of the second capacitors is further coupled to the first end point via the corresponding second switching unit 如請求項6所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中於取樣階段期間,該些第二電容的上極板取樣該差動輸入信號中之該另一者,該些第二電容中之該至少一者的下極板取樣該差動輸入信號中之該者、以及該些第二電容中之其餘者的下極板接收該共模電壓。The SAR analog-to-digital converter of the programmable amplified input signal amplitude of claim 6, wherein during the sampling phase, the upper plates of the second capacitors sample the other of the differential input signals, A lower plate of the at least one of the second capacitors samples the one of the differential input signals and the lower plate of the remaining ones of the second capacitors receives the common mode voltage. 如請求項1所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中該電容模組更包括:一第三電容,耦接在該第一輸入端與該第五端點之間;以及一第四電容,耦接在該第二輸入端與該第五端點之間。The SAR analog-to-digital converter of claim 1, wherein the capacitor module further includes: a third capacitor coupled between the first input end and the fifth end point; And a fourth capacitor coupled between the second input terminal and the fifth terminal end. 如請求項1所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中該些第一切換單元和該些第二切換單元中的每一者是由複數個開關所構成。The SAR analog-to-digital converter of the programmable amplified input signal amplitude as claimed in claim 1, wherein each of the first switching unit and the second switching units is composed of a plurality of switches. 如請求項1所述之可編程放大輸入信號振幅之SAR類比數位轉換器,其中於取樣階段期間,該些第一電容的上極板取樣該差動輸入信號中之該者、該些第一電容中之至少一者的下極板取樣該差動輸入信號中之該另一者、且該些第一電容中之其餘者的下極板接收至該共模電壓。The SAR analog-to-digital converter of the programmable amplified input signal amplitude according to claim 1, wherein during the sampling phase, the upper plates of the first capacitors sample the one of the differential input signals, the first A lower plate of at least one of the capacitors samples the other of the differential input signals, and a lower plate of the remaining ones of the first capacitors receives the common mode voltage. 一種可編程放大輸入信號振幅之SAR類比數位轉換方 法,包括:在一取樣階段期間包括:利用該電容模組中的複數個第一電容的上極板取樣一差動輸入信號中之一者;利用該些第一電容中之至少一者的下極板取樣該差動輸入信號中之另一者;以及利用該電容模組中的複數個第二電容的上極板取樣該差動輸入信號中之該另一者,其中該些第二電容分別對應該些第一電容;由該取樣階段進入一保持階段,在該保持階段期間包括:將該些第一電容的該些上極板與該差動輸入信號中之該者斷開;將該些第一電容的該些下極板置位至電性連接一共模電壓;以及將該些第二電容的該些上極板與該差動輸入信號中之該另一者斷開;以及由該保持階段進入一位元循環階段,於該位元循環階段期間包括:利用一比較器比較該些第一電容之該些上極板的端電壓與該些第二電容之該些上極板的端電壓;依序根據該比較器的輸出將該些第一電容中之一的該下極板及該些第二電容中之對應者的該 下極板由電性連接該共模電壓切換成分別電性連接一差動參考電壓,並於每次切換後再次利用該比較器比較該些第一電容之該些上極板的該端電壓與該些第二電容之該些上極板的該端電壓;以及根據該比較器的該些輸出產生一數位信號。SAR analog digital conversion method for programmable amplification of input signal amplitude The method includes: sampling, during a sampling phase, one of a differential input signal by using an upper plate of the plurality of first capacitors in the capacitor module; utilizing at least one of the first capacitors The lower plate samples the other of the differential input signals; and samples the other of the differential input signals by using an upper plate of the plurality of second capacitors in the capacitor module, wherein the second The capacitors respectively correspond to the first capacitors; and the sampling phase enters a holding phase, during which the first plates of the first capacitors are disconnected from the differential input signal; Setting the lower plates of the first capacitors to be electrically connected to a common mode voltage; and disconnecting the upper plates of the second capacitors from the other of the differential input signals; And entering, by the holding phase, a one-bit looping phase, during which the comparing, by using a comparator, the terminal voltages of the upper plates of the first capacitors and the second capacitors The terminal voltage of the plate; in accordance with the comparator The more that the lower plate of the first one of the plurality of capacitors and a second capacitance corresponding to those of The lower plate is electrically connected to the common mode voltage to be electrically connected to a differential reference voltage, and is used again to compare the terminal voltages of the upper plates of the first capacitors after each switching. And the terminal voltages of the upper plates of the second capacitors; and generating a digital signal according to the outputs of the comparators. 如請求項11所述之可編程放大輸入信號振幅之SAR類比數位轉換方法,其中利用該些第一電容中之至少一者的下極板取樣該差動輸入信號中之另一者的該步驟包括:將該些第一電容中之該至少一者的該些下極板均電性連接至該差動輸入信號中之該另一者;以及將該些第一電容中之其餘者的下極板電性連接至該共模電壓。The SAR analog-to-digital conversion method of the programmable amplified input signal amplitude according to claim 11, wherein the step of sampling the other of the differential input signals by using a lower plate of at least one of the first capacitors The method further includes: electrically connecting the lower plates of the at least one of the first capacitors to the other one of the differential input signals; and lowering the rest of the first capacitors The plates are electrically connected to the common mode voltage. 如請求項11所述之可編程放大輸入信號振幅之SAR類比數位轉換方法,其中利用該些第一電容中之至少一者的下極板取樣該差動輸入信號中之另一者的該步驟包括:將該些第一電容的該些下極板均電性連接至該差動輸入信號中之該另一者。The SAR analog-to-digital conversion method of the programmable amplified input signal amplitude according to claim 11, wherein the step of sampling the other of the differential input signals by using a lower plate of at least one of the first capacitors The method includes: electrically connecting the lower plates of the first capacitors to the other one of the differential input signals. 如請求項11至13中之任一者所述之可編程放大輸入信號振幅之SAR類比數位轉換方法,其中在該取樣階段期間更包括:利用該些第二電容中之至少一者的下極板取樣該差動輸入信號中之該者;以及其中在該保持階段期間更包括:將該些第二電容的該些下極板置位至電性 連接該共模電壓。The SAR analog-to-digital conversion method of the programmable amplified input signal amplitude of any one of claims 11 to 13, wherein the sampling phase further comprises: utilizing a lower pole of at least one of the second capacitors The board samples the one of the differential input signals; and wherein during the maintaining phase, the method further includes: setting the lower plates of the second capacitors to electrical Connect the common mode voltage. 如請求項14所述之可編程放大輸入信號振幅之SAR類比數位轉換方法,其中利用該些第二電容中之至少一者的下極板取樣該差動輸入信號中之該者的該步驟包括:將該些第二電容中之該至少一者的該些下極板均電性連接至該差動輸入信號中之該者;以及將該些第二電容中之其餘者的下極板電性連接至該共模電壓。The SAR analog-to-digital conversion method of the programmable amplified input signal amplitude of claim 14, wherein the step of sampling the differential input signal by using a lower plate of at least one of the second capacitors comprises: And electrically connecting the lower plates of the at least one of the second capacitors to the one of the differential input signals; and electrically charging the lower plates of the remaining of the second capacitors Connected to the common mode voltage. 如請求項14所述之可編程放大輸入信號振幅之SAR類比數位轉換方法,其中利用該些第二電容中之至少一者的下極板取樣該差動輸入信號中之該者的該步驟包括:將該些第二電容的該些下極板均電性連接至該差動輸入信號中之該者。The SAR analog-to-digital conversion method of the programmable amplified input signal amplitude of claim 14, wherein the step of sampling the differential input signal by using a lower plate of at least one of the second capacitors comprises: And electrically connecting the lower plates of the second capacitors to the one of the differential input signals. 如請求項11所述之可編程放大輸入信號振幅之SAR類比數位轉換方法,其中該電容模組更包括耦接在該比較器的第一輸入端與該共模電壓之間之一第三電容,以及耦接在該比較器的第二輸入端與該共模電壓之間一第四電容。The method of claim 11, wherein the capacitor module further comprises a third capacitor coupled between the first input end of the comparator and the common mode voltage. And a fourth capacitor coupled between the second input of the comparator and the common mode voltage.
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