TWI506286B - - Google Patents

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Publication number
TWI506286B
TWI506286B TW103134598A TW103134598A TWI506286B TW I506286 B TWI506286 B TW I506286B TW 103134598 A TW103134598 A TW 103134598A TW 103134598 A TW103134598 A TW 103134598A TW I506286 B TWI506286 B TW I506286B
Authority
TW
Taiwan
Application number
TW103134598A
Other languages
Chinese (zh)
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TW201614246A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to TW103134598A priority Critical patent/TW201614246A/en
Application granted granted Critical
Publication of TWI506286B publication Critical patent/TWI506286B/zh
Publication of TW201614246A publication Critical patent/TW201614246A/en

Links

TW103134598A 2014-10-03 2014-10-03 Temperature control device of crimping device of test equipment and temperature control method thereof TW201614246A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW103134598A TW201614246A (en) 2014-10-03 2014-10-03 Temperature control device of crimping device of test equipment and temperature control method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103134598A TW201614246A (en) 2014-10-03 2014-10-03 Temperature control device of crimping device of test equipment and temperature control method thereof

Publications (2)

Publication Number Publication Date
TWI506286B true TWI506286B (en) 2015-11-01
TW201614246A TW201614246A (en) 2016-04-16

Family

ID=55220065

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103134598A TW201614246A (en) 2014-10-03 2014-10-03 Temperature control device of crimping device of test equipment and temperature control method thereof

Country Status (1)

Country Link
TW (1) TW201614246A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI641842B (en) * 2017-08-14 2018-11-21 鴻勁精密股份有限公司 Crimp of electronic component crimping mechanism and test classification device
CN111583988A (en) * 2019-02-15 2020-08-25 优匹益株式会社 Apparatus for testing integrated circuit device and method thereof
TWI741491B (en) * 2020-02-07 2021-10-01 孫偉志 Processor heat dissipation module with 3-dimension heat dissipation, burning-in device, and method of using the same
TWI769627B (en) * 2020-12-18 2022-07-01 鴻勁精密股份有限公司 Temperature controlling unit and operating apparatus using the same

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI613448B (en) * 2017-04-06 2018-02-01 致茂電子股份有限公司 Device for pressing electronic component with different downward forces
TWI634336B (en) * 2017-08-29 2018-09-01 京元電子股份有限公司 Floating temperature sensor and semiconductor element test module using the same
TWI632843B (en) * 2017-12-01 2018-08-11 微星科技股份有限公司 Profile and identity recognizing device
TWI682270B (en) * 2018-07-24 2020-01-11 致茂電子股份有限公司 High/low-temperature testing apparatus and method
CN110749783B (en) * 2018-07-24 2022-05-10 致茂电子股份有限公司 High-low temperature test equipment and test method thereof
CN113447748B (en) * 2021-06-29 2023-03-24 贵州航天电子科技有限公司 Device for high and low temperature test of electronic product
TWI827473B (en) * 2023-02-22 2023-12-21 鴻勁精密股份有限公司 Processing machine of electronic component

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6034978A (en) * 1999-05-12 2000-03-07 Cymer, Inc. Gas discharge laser with gas temperature control
TWI247399B (en) * 2004-06-01 2006-01-11 Via Tech Inc Package and temperature-control method of electronic device with active temperature control
CN201152650Y (en) * 2007-12-18 2008-11-19 华南理工大学 Cold-hot transformation apparatus having solid multi-lattice
TWM376907U (en) * 2009-09-29 2010-03-21 Shen-Quan Zheng LED lamp with ceramic thermoelectric heat-dissipation substrate
TWI368651B (en) * 2008-10-24 2012-07-21 Quanta Comp Inc Temperature variation apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6034978A (en) * 1999-05-12 2000-03-07 Cymer, Inc. Gas discharge laser with gas temperature control
TWI247399B (en) * 2004-06-01 2006-01-11 Via Tech Inc Package and temperature-control method of electronic device with active temperature control
CN201152650Y (en) * 2007-12-18 2008-11-19 华南理工大学 Cold-hot transformation apparatus having solid multi-lattice
TWI368651B (en) * 2008-10-24 2012-07-21 Quanta Comp Inc Temperature variation apparatus
TWM376907U (en) * 2009-09-29 2010-03-21 Shen-Quan Zheng LED lamp with ceramic thermoelectric heat-dissipation substrate

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI641842B (en) * 2017-08-14 2018-11-21 鴻勁精密股份有限公司 Crimp of electronic component crimping mechanism and test classification device
CN111583988A (en) * 2019-02-15 2020-08-25 优匹益株式会社 Apparatus for testing integrated circuit device and method thereof
TWI741491B (en) * 2020-02-07 2021-10-01 孫偉志 Processor heat dissipation module with 3-dimension heat dissipation, burning-in device, and method of using the same
TWI769627B (en) * 2020-12-18 2022-07-01 鴻勁精密股份有限公司 Temperature controlling unit and operating apparatus using the same

Also Published As

Publication number Publication date
TW201614246A (en) 2016-04-16

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