TWI472714B - Shaped surface contact of the oil film thickness analysis device - Google Patents

Description

Oil film thickness analysis device for wedge surface contact

The invention relates to an oil film thickness analysis device for wedge surface contact, in particular to an oil opaque material capable of analyzing and measuring oil film thickness, and an optical module capable of expanding an oil film suitable for a market transparent material. An oil film thickness analyzing device for wedge surface contact measurement by thickness analysis.

Grinding is a cross-domain technology that studies the performance of interface. It is precision machinery, electronics, optoelectronics, chemical, construction, environmental protection, micro-electromechanical, energy and other parts (bearings, shaft seals, cams, gears, ball screws, sliding). Techniques and methods for solving friction, wear and lubrication related problems of rails, grinding, cutting, coating, conveying, robotic arms, artificial joints, artificial eyeballs, medical inspection discs, and the like. It can be seen that the application of the grinding instrument is extensive and cross-industry.

How any component is controlled in the best design area of the Strykerk diagram (known in the industry) can operate stably and efficiently, which is an important key to the performance and life of the relevant device, that is, the reason for the design and manufacture of the grinding instrument. .

Regarding the related prior art, the following is briefly described as follows: In 1962, Kirk et al. first applied the optical interference method to the experimental study of the elastic lubrication test, and successfully measured the shape of the elastic lubricating oil film.

In 1968, Foord et al. plated a transparent reflective chrome film on the glass surface to make the light interference fringes clearer.

In 1987, Spikes and Gao et al. used Al2O3, which is similar in optical properties to the lubricating oil film, to coat the surface of the glass, replacing the thickness of the film with the thickness of the film, and measuring the thickness of the film by optical interferometry. It is smaller, but it also has the problem that the coating is not easy and the measurement error is large.

In 2007, KH Storage, RP Grosvenor and Spikees used JChoo, RPGlovnea, and Spikies to measure the thickness of the oil film by point-to-line contact, but the parallelism and inclination angle of the two contact planes. The problem is that the measurement range is limited.

That is to say, at present, the device can only measure the thickness of the oil film with a light-transmitting material and an optical measuring device, and the coating film is not easy, and the measurement error is large.

At present, there is no device for calculating the thickness of the oil film by measuring the contact resistance value with an opaque material.

In view of this, it is necessary to develop a technique that can solve the above disadvantages.

An object of the present invention is to provide an oil film thickness analyzing device for wedge-shaped surface contact, which can also measure and measure the thickness of the oil film while having an opaque material, and can be expanded to be suitable for a commercially available light-transmitting material by adding an optical component. Oil film thickness analysis and other advantages. In particular, the problem to be solved by the present invention is that there is currently no problem such as a device for calculating the thickness of the oil film by measuring the contact resistance value with an opaque material.

The technical means for solving the above problems is to provide a wedge type surface contact oil film thickness analyzing device, comprising: a machine having a working hole; a rotating table pivotally disposed on the working hole, the rotating table Including one a fixing portion and a driving component; the fixing portion is provided with a turntable, the turntable comprises a substrate and a conductor film plated on the substrate, the conductor film is provided with an oil film, and the driving component is used for driving the turntable Rotating; a conductor slider is disposed on the machine; a force applying portion is disposed on the machine for fixing and having an inclination angle between the conductor slider and the turntable; The conductor slider can apply a working force to the turntable through the oil film; a measuring component electrically connects the turntable and the conductor slider, and instantly captures the contact resistance value therebetween; a central device is electrically connected Connecting the driving component and the measuring component to capture the contact resistance value; thereby, when controlling the rotation speed of the rotating disk to be slower and slower, the thickness of the oil film is thinned and thickened respectively, thereby The contact resistance values become smaller and larger, respectively. When the control work force becomes smaller and larger, the thickness of the oil film is thickened and thinned, respectively, and the contact resistance values become larger and smaller, respectively.

The above objects and advantages of the present invention will be readily understood from the following detailed description of the preferred embodiments illustrated herein.

The invention will be described in detail in the following examples in conjunction with the drawings:

10‧‧‧ machine

11‧‧‧Working holes

20‧‧‧Rotating table

21‧‧‧ Fixed Department

211‧‧‧ Turntable

21A‧‧‧Substrate

21B‧‧‧Conductor film

22‧‧‧Drive components

221‧‧Power Department

222‧‧‧ Transmission structure

30‧‧‧Conductor Slider

40‧‧‧ Force Department

41‧‧‧ force arm

411‧‧‧ pivot end

412‧‧‧ fixed end

42‧‧‧ fixed seat

43‧‧‧Adjustment rod

50‧‧‧Measuring components

51‧‧‧ positive part

52‧‧‧Negative part

53‧‧‧ External Linkage Department

60‧‧‧Central installation

61‧‧‧Display device

70‧‧‧Optical components

71‧‧‧ Monochrome light source generation department

711‧‧‧Monochrome beam

72‧‧‧Image capture device

721‧‧‧Working images

91‧‧‧ oil film

θ‧‧‧Tilt angle

F‧‧‧Working power

L1‧‧‧ first curve

L2‧‧‧ second curve

L3‧‧‧ third curve

L4‧‧‧ fourth curve

θ 1‧‧‧ first angle

The first figure is an exploded view of the first embodiment of the present invention.

The second figure is a schematic diagram of a part of the structure of the first figure

The third graph is a graph showing the corresponding relationship between the rotational speed of the turntable and the thickness of the oil film-contact resistance of the present invention.

The fourth graph is a graph showing the correspondence between the working force-oil film thickness-contact resistance value of the present invention.

The fifth drawing is an exploded view of the second embodiment of the present invention.

The sixth figure is a schematic diagram of part of the structure of the fifth figure

The seventh figure is a partial enlarged view of the sixth figure

Referring to the first, second and seventh figures, the present invention is a wedge type surface contact oil film thickness analyzing device, comprising: a machine table 10, which is provided with a working hole 11; a rotating table 20, which is pivoted On the working hole 11, the rotating table 20 includes a fixing portion 21 and a driving assembly 22; the fixing portion 21 is provided with a turntable 211, and the rotating plate 211 includes a substrate 21A and a conductor plated on the substrate 21A. The film 21B, the conductor film 21B is provided with an oil film 91, the driving component 22 is used to drive the turntable 211 to rotate; a conductor slider 30 is attached to the machine table 10; a force applying portion 40 is It is disposed on the machine table 10 for fixing and has an inclination angle θ between the conductor slider 30 and the turntable 211; and the conductor slider 30 can pass the oil film 91 to apply a work to the turntable 211. a measuring unit 50 electrically connecting the turntable 211 and the conductor slider 30 to instantly capture the contact resistance value therebetween; a central device 60 electrically connecting the driving component 22 and the measuring The component 50 is configured to capture the contact resistance value; thereby, when the speed of the turntable 211 is controlled to be slow and slow (See third chart), The thickness of the oil film 91 is thinned and thickened, respectively, so that the contact resistance value becomes smaller and larger, respectively; and when the control work force F becomes smaller and larger (refer to the fourth figure), The thickness of the oil film 91 is thickened and thinned, respectively, and the contact resistance value is made larger and smaller, respectively.

In a first embodiment of the present invention, the fixing portion 21 can be a bearing structure and interposed between the working hole 11 and the turntable 211, and is driven by the driving assembly 22 to drive the turntable 211 to rotate. .

The substrate 21A may be a quartz glass disk.

The conductor film 21B may include a ruthenium dioxide ( SiO ₂ ) plating film and a chromium (Chromium, abbreviated as Cr) plating film. A cerium oxide ( SiO ₂ ) plating film is interposed between the substrate 21A and the chrome plating film.

The driving unit 22 includes a power unit 221 electrically connected to the central unit 60. A transmission structure 222 is coupled between the power unit 221 and the fixing unit 21 for outputting the power of the power unit 221. And the fixing portion 21 is driven.

The conductor slider 30 can be a steel structure for making a bearing.

The urging portion 40 includes a urging arm 41 having a pivoting end 411 and a fixed end 412. The pivoting end 411 is pivotally connected to the machine table 10; the fixed end 312 is corresponding to the working hole 11 a fixing base 42 for fixing the conductor slider 30; a plurality of adjusting rods 43 respectively connected between the fixing end 412 and the fixing base 42 for adjusting between the fixing base 42 and the rotating plate 211 The inclination angle θ.

Each of the adjustment rods 43 can be a fine adjustment screw.

The measuring component 50 includes a positive electrode portion 51, a negative electrode portion 52 and an external link. The portion 53 is electrically connected to the turntable 211; the negative portion 52 is electrically connected to the conductor slider 30, so that the measuring component 50 can immediately measure the contact resistance value; the external connecting portion 53 is The central device 60 is electrically connected to output a contact resistance value.

Regarding the manner of use of the first embodiment, as follows: Referring to the second figure, the power unit 221 is activated, and the power unit 221 is rotated by the transmission structure 222. Referring to the third figure, regarding the rotation speed of the turntable-oil film The correspondence between the thickness-contact resistance values is such that the rotational speed of the turntable 211 is increased from about 10 mm/s (slow speed) to about 50 mm/s (fast).

The oil film thickness of the oil film 91 is thickened from about 625 nm to about 2000 nm (as shown by the first curve L1).

The contact resistance value is increased from about 7.5 Ω to about 25 Ω (as shown by the second curve L2).

That is, in the case where the working force F is constant, the faster the rotational speed is, the thicker the oil film is, and the larger the relative contact resistance value is.

Of course, regarding the corresponding relationship between the rotational speed and the thickness of the oil film, the relevant data can be obtained in advance by mechanical, electronic or optical means, and then corresponding to the contact resistance.

In addition, when the force applying arm 41 is pressed downward (for example, a weight is placed), a working force F is applied to the turntable 211 via the conductor slider 30 and the oil film 91, and the working force-oil film thickness-contact resistance value is used. The correspondence is as shown in the fourth figure: when the working force F increases from about 2 (Kpa) to about 12 (Kpa).

The oil film thickness of the oil film 91 is thinned from about 2000 nm to about 1100 nm (as in the first The three curve L3 is shown).

The contact resistance value is reduced from about 18 Ω to about 12 Ω (as shown by the fourth curve L4).

That is, in the case where the rotational speed is constant, the larger the working force F is, the thinner the oil film thickness is, and the lower the relative contact resistance value is.

Similarly, regarding the corresponding relationship between the rotational speed and the thickness of the oil film, the relevant data can be obtained in advance by mechanical, electronic or optical means, and then corresponding to the contact resistance.

The central device 60 further includes a display device 61 for displaying the captured data (e.g., display graph).

Referring to the fifth and sixth embodiments, the second embodiment of the present invention differs from the first embodiment only in that the conductive film 21B is plated on the substrate 21A, and the turntable 211 has a light transmitting structure.

The conductor slider 30 is ground to have a roughness of 120-170 nm, and further includes: an optical component 70 having a monochromatic light source generating portion 71 and an image capturing device 72; the monochromatic light source is generated The portion 71 generates a monochromatic light beam 711 which penetrates the turntable 211 from a bottom to a top at a first angle θ 1 and passes through the oil film 91 to reach the conductor slider 30 and then reflects back down to the optical component. 70, in which an optical interference phenomenon occurs, so that the image capturing device 72 can capture a working image 721, which includes an optical interference image; thereby utilizing the change of the optical interference image, The oil film thickness is calculated according to the equal thickness interference theory; the rotation speed of the turntable 211 is controlled to be slower and faster, and the thickness of the oil film 91 is changed respectively. Thin and thick, and the contact resistance becomes smaller and larger, respectively, the optical interference image changes accordingly, and when the oil film thickness reaches the nanometer unit, the optical interference image is still clear.

The advantages and functions of the present invention are as follows:

[1] The opaque material can also be used for the analysis of oil film thickness. According to the invention, a conductor film can be plated on the turntable, and then the change of the contact resistance value between the conductor film and the conductor slider can be measured, and the thickness of the oil film can be reversed. Therefore. The thickness of the oil film can be measured by opaque material analysis.

[2] The optical component can be added to expand the oil film thickness measurement and measurement applicable to the market transparent material. The invention only applies a conductor film on the market transparent material turntable (quartz glass disk), and can measure the contact resistance value, and does not need to develop a special device, and the original optical oil film thickness analysis function can still be used normally. . Therefore, it can be directly applied to the market surface light material analysis to measure the oil film thickness.

The present invention has been described in detail with reference to the preferred embodiments of the present invention, without departing from the spirit and scope of the invention.

10‧‧‧ machine

11‧‧‧Working holes

20‧‧‧Rotating table

21‧‧‧ Fixed Department

211‧‧‧ Turntable

21A‧‧‧Substrate

21B‧‧‧Conductor film

22‧‧‧Drive components

221‧‧Power Department

222‧‧‧ Transmission structure

30‧‧‧Conductor Slider

40‧‧‧ Force Department

41‧‧‧ force arm

411‧‧‧ pivot end

412‧‧‧ fixed end

42‧‧‧ fixed seat

43‧‧‧Adjustment rod

50‧‧‧Measuring components

51‧‧‧ positive part

52‧‧‧Negative part

53‧‧‧ External Linkage Department

60‧‧‧Central installation

61‧‧‧Display device

91‧‧‧ oil film

θ‧‧‧Tilt angle

F‧‧‧Working power

Claims (9)

An oil film thickness analyzing device for wedge surface contact includes: a machine having a working hole; a rotating table pivotally disposed on the working hole, the rotating table comprising a fixing portion and a driving assembly The fixing portion is provided with a turntable, the turntable comprises a substrate and a conductor film plated on the substrate, the conductor film is provided with an oil film, the driving component is used for driving the turntable to rotate; a conductor slider a force-applying portion is disposed on the machine for fixing and having an inclination angle between the conductor slider and the turntable; and the conductor slider can pass the The oil film applies a working force to the turntable; a measuring component electrically connects the turntable and the conductor slider to instantly capture the contact resistance value therebetween; and a central device electrically connects the driving component and the The measuring component is configured to capture the contact resistance value; thereby, when the rotation speed of the rotating disk is controlled to be slower and slower, the thickness of the oil film is thinned and thickened respectively, thereby making the contact resistance value smaller And become bigger; and when controlling the work force Small and large, the film thickness of the lines are thick and thin, so that the contact resistance value becomes larger and smaller, respectively. The oil film thickness analyzing device of the wedge type surface contact according to the first aspect of the invention, wherein the fixing portion is a bearing structure, and is interposed between the working hole and the turntable, and is driven by the driving component, and Drive the turntable to rotate. The oil film thickness analyzing device for wedge-shaped surface contact according to claim 1, wherein the substrate is a quartz glass disk. The oil film thickness analysis device of the wedge type surface contact according to the first aspect of the invention, wherein the conductor film system comprises a ruthenium dioxide coating film and a chrome plating film; the ruthenium dioxide coating film is interposed between the substrate and the chrome plating film. . The oil film thickness analyzing device of the wedge type surface contact according to the first aspect of the invention, wherein the driving component comprises: a power portion electrically connected to the central device; and a transmission structure coupled to the power portion And the fixing portion is configured to output the power of the power portion to transmit the fixing portion. The oil film thickness analyzing device for wedge-shaped surface contact according to the first aspect of the invention, wherein the conductor slider is a steel structure for manufacturing a bearing. The oil film thickness analyzing device of the wedge type surface contact according to the first aspect of the invention, wherein the force applying portion comprises: a force applying arm having a pivot end and a fixed end; the pivot end pivoting Connected to the machine; the fixed end corresponds to the working hole; a fixing seat is used for fixing the conductor slider; a plurality of adjusting rods are respectively connected between the fixed end and the fixing seat for adjusting The angle of inclination between the mount and the turntable. The oil film thickness analyzing device of the wedge type surface contact according to the first aspect of the invention, wherein the measuring component comprises a positive electrode portion, a negative electrode portion and an outer connecting portion, wherein the positive electrode portion is kept in electrical contact with the positive electrode portion. a turntable; the negative portion is electrically connected to the conductor slider, so that the measuring component can be The contact resistance value is measured instantaneously; the external connection portion is electrically connected to the central device for outputting a contact resistance value. The oil film thickness analysis device of the wedge type surface contact according to the first aspect of the invention, wherein: after the conductor film is plated on the substrate, the turntable has a light transmitting structure; the conductor slider is ground and has a roughness of 120 to 170 nm, and further comprising: an optical component having a monochromatic light source generating portion and an image capturing device; the monochromatic light source generating portion generating a monochromatic light beam from bottom to top a first angle penetrates the turntable and passes through the oil film to reach the conductor slider, and then reflects back down to the optical component, thereby causing optical interference phenomenon, so that the image capturing device can capture a working image The working image includes an optical interference image; thereby, the thickness of the optical interference image is used, and the thickness of the oil film is calculated by using an equal thickness interference theory; and the rotation speed of the rotating disk is controlled to be slower and faster, respectively The thickness becomes thinner and thicker, and the contact resistance becomes smaller and larger, respectively, and the optical interference image changes accordingly, and when the oil film thickness reaches the nanometer unit, the optical interference image is still clear.