WO2017033567A1 - Film thickness distribution measuring device - Google Patents
Film thickness distribution measuring device Download PDFInfo
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- WO2017033567A1 WO2017033567A1 PCT/JP2016/069425 JP2016069425W WO2017033567A1 WO 2017033567 A1 WO2017033567 A1 WO 2017033567A1 JP 2016069425 W JP2016069425 W JP 2016069425W WO 2017033567 A1 WO2017033567 A1 WO 2017033567A1
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- film thickness
- unit
- thickness distribution
- substrate
- image
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Definitions
- the present invention relates to a film thickness distribution measuring apparatus for measuring a film thickness distribution of a lubricant at a contact portion of a rotating body or a sliding object rotating through a lubricant with respect to a rotating or reciprocating substrate.
- a ball (one object) lubricated with lubricating oil and an outer ring or inner ring (the other object) are in line contact or point contact.
- the object since the load concentrates on the contact portion between the objects, the object is elastically deformed, and the elastic fluid lubrication state (EHL state: Elasto-hydrodynamic Lubrication) in which the lubricating oil becomes high pressure and high viscosity is obtained.
- EHL state Elasto-hydrodynamic Lubrication
- a disk-shaped disk and a steel ball are arranged so as to rotate or slide relative to each other, and the contact portion of the disk and the steel ball is lubricated with a lubricating oil.
- a technology that measures the film thickness of lubricant based on the wavelength of white stripes and the wavelength of black stripes by generating line-shaped interference fringes by irradiating the contact area with lubricating oil while scanning the line-shaped light Is known (for example, Patent Document 1).
- a reflective film and a spacer film are sequentially formed, a light-transmitting substrate that contacts the sample with the spacer film, irradiation means for irradiating the light-transmitting substrate with white light from the opposite side of the spacer film, and reflected light of white light
- An interference image is obtained using a film thickness measuring device having a light receiving means for receiving light and a color information obtaining means for obtaining color information from reflected light, and the hue information is obtained by converting the color information into an HSV color space,
- Patent Document 2 A technique for visualizing a true contact portion corresponding to a gap thickness or zero film thickness based on a calibration result with a gap thickness between two surfaces is known (for example, Patent Document 2).
- an oil film dielectric breakdown evaluation apparatus that examines the dielectric breakdown of an oil film by applying a voltage between two objects sandwiching the oil film, one object is a transparent body, and visible light is on the contact surface side with the other object.
- a technique is known in which an oil film thickness of a contact surface is measured by an optical interferometry in a state where a load is applied using an electrode that transmits light (for example, a transparent conductive film) (for example, Patent Document 3).
- Non-Patent Document 1 describes that a film thickness range of 8 ⁇ m can be expected by a combination of blue: 470 nm, green: 560 nm, and red: 600 nm, and a film thickness of 4 ⁇ m can be measured by an experiment using an actual sample. Yes.
- Patent Document 3 a two-color light source obtained by superimposing two colors of monochromatic light having different wavelengths of 555 nm (green) and 630 nm (red), and a gap in which the relationship between the actual oil film thickness and color is known in advance.
- the film thickness is measured from the color of the optical interference image on the basis of the relational data verified using. Therefore, as in Patent Document 2, it is necessary to calibrate the relationship between each color information and the film thickness value.
- Patent Document 4 describes that it can be applied to on-line measurement of the film thickness of a film sheet that runs continuously in a film manufacturing process.
- Non-Patent Document 1 a film of a silicon oxide film on a silicon wafer is described. Although it is described that the thickness, the air gap of the Newton ring plate, and the film thickness of the soap film can be measured, there is no mention of a specific means for measuring the film thickness distribution of the lubricant in the EHL state such as a bearing. .
- the present invention has an object to provide an apparatus capable of measuring transient film thickness fluctuation and film thickness distribution of a lubricant that lubricates a contact portion between substances in an EHL state without calibration in a wide film thickness range. To do.
- a film thickness distribution measuring apparatus for measuring a film thickness distribution of a lubricant that lubricates a contact portion between objects in an EHL state, A substrate with optical transparency; A contact piece that contacts the substrate via a lubricant; A moving mechanism for relatively moving the substrate and the contact piece; A load applying mechanism for applying a load by pressing the contact piece on the substrate side; A light source that emits light of at least three wavelengths toward the contact portion of the substrate and the contact piece; An interference color imaging unit that images light reflected from the contact portion of the substrate and the contact piece as an interference color image with a color camera through the substrate; It has a computer part, In the computer part, An image recording unit for recording an interference color image captured by the interference color imaging unit; Among the interference color images recorded in the image recording unit, the luminance value is calculated by color-separating at least three types of light from the color information of each point included in the selected interference color image, and the luminance value From the phase for each wavelength,
- the two-dimensional distribution of the lubricant film thickness can be measured at a high speed, a transitional film thickness distribution change (for example, acceleration / deceleration evaluation, fracture process evaluation, etc.) becomes possible.
- a transitional film thickness distribution change for example, acceleration / deceleration evaluation, fracture process evaluation, etc.
- self-calibration since calibration is performed from the interference image obtained by imaging the target substrate by the wide-area model fitting method (so-called self-calibration is performed), it is not necessary to calibrate the relationship between each color information and the film thickness value. -If the three wavelengths of red are used, the film thickness distribution can be measured in a wide film thickness range of about 4 to 8 ⁇ m.
- the horizontal direction is expressed as the x direction and the y direction
- the direction perpendicular to the xy plane that is, the gravity direction
- the direction against gravity is expressed as up
- the direction in which gravity works is expressed as down.
- FIG. 1 is a schematic diagram showing an overall configuration of an example of a form embodying the present invention.
- FIG. 2 is a partially enlarged view showing an enlarged part of an example embodying the present invention.
- FIG. 3 is a functional block diagram showing the connection of each device in an example embodying the present invention.
- the film thickness distribution measuring apparatus 1 measures the film thickness distribution of the lubricant LB that lubricates the contact portion SP of the substrate 2 and the contact piece 3 in the EHL state. Specifically, the film thickness distribution measuring apparatus 1 captures an interference color image and measures the film thickness distribution of the lubricant LB based on the interference color image. More specifically, the film thickness distribution measuring apparatus 1 includes a substrate 2, a contact piece 3, a moving mechanism 4, a rotating body rotating mechanism 5, a load applying mechanism 6, a light source unit 7, an interference color imaging unit 8, and a computer unit 9. The display unit 10 and the like are provided.
- the substrate 2 is made of a material having optical transparency.
- the substrate 2 can be exemplified by a transparent glass disc 20 that is flat in the xy direction and has a predetermined thickness in the z direction. More specifically, a metal thin film 21 such as chrome (Cr) is formed on the lower surface of the disc 20, and further on the lower surface thereof is approximately the same as the lubricant LB such as silicon oxide (SiO 2). A transparent film 22 having a refractive index is formed.
- the contact piece 3 rotates while contacting the substrate 2 via the lubricant LB.
- a steel ball 30 which is a type of rotating body is illustrated.
- a shaft 31 is connected to the steel ball 30.
- the shaft 31 has a predetermined length in a direction parallel to the xy plane (x direction in FIG. 1), and is connected to a rotating body rotating mechanism 5 described later.
- the steel ball 30 is in contact with the transparent film 22 on the lower surface of the disk 20 through the lubricant LB.
- An oil pan P for storing the lubricant LB is provided below the steel ball 30.
- the lubricant LB accumulated in the oil pan P moves upward due to its own viscosity, and the excess lubricant falls downward. Therefore, an appropriate amount of lubricant LB is supplied to the contact portion SP between the disk 20 and the steel ball 30.
- the moving mechanism 4 moves the substrate 2 and the contact piece 3 relative to each other.
- the moving mechanism 4 can be configured by a rotary motor 40.
- the rotary motor 40 rotates the disk 20 at a predetermined speed in a direction indicated by an arrow 2d with an axis perpendicular to the xy direction as a rotation center, or stops at a predetermined speed in a direction opposite to the arrow 2d. It is intended to rotate.
- the rotary motor 40 includes a main body portion and a rotor (not shown) incorporated inside the main body portion, and the disk 20 and the rotor are connected by a connecting member 41.
- the rotation motor 40 is connected to a computer unit 9 described later in detail through a motor amplifier unit (not shown), and the rotation direction and rotation speed of the disk 20 are appropriately controlled.
- the rotating body rotating mechanism 5 rotates a steel ball 30 that is a rotating body. Specifically, the rotating body rotating mechanism 5 rotates or stops the steel ball 30 and the shaft 31 at a predetermined speed in the direction of the arrow 3d, or rotates at a predetermined speed in the direction opposite to the arrow 3d. It is something to be made. More specifically, the rotating body rotating mechanism 5 includes a rotating motor 50 and a shaft 51 connected to the rotor of the rotating motor 50.
- the rotation motor 50 is connected to a computer unit 9 described later in detail through a motor amplifier unit (not shown), and the rotation direction and rotation speed of the shaft 51 are appropriately controlled.
- the load applying mechanism 6 applies a load when the steel ball 30 is brought into contact with the disk 20. Specifically, the load application mechanism 6 pushes the steel ball 30 disposed below the disk 20 upward. More specifically, the load application mechanism 6 includes an actuator 60 and a holder 63.
- the actuator 60 is such that the movable element 61 moves up and down by air, hydraulic pressure, and electric power.
- the main body of the actuator 60 is attached to the apparatus frame 1 f, and the holder 63 is attached to the movable element 61.
- the actuator 60 is connected to a pressing load control unit 17 described later.
- the rotational speed of the disc 20, the rotational speed of the steel ball 30, the pressing load by the actuator 60 of the load applying mechanism 6, and the like are set or assumed to reproduce the state in which the bearing is actually used. Set according to usage conditions. By doing so, the environmental condition of the contact part in the bearing which rotates in an EHL state can be set.
- the light source unit 7 emits light L1 of at least three types of wavelengths toward the contact portion SP of the substrate 2 and the contact piece 3. Specifically, the light source unit 7 includes an illumination unit 70 and an illumination power source 75.
- the illumination unit 70 emits light of at least three types of wavelengths necessary for capturing an interference color image.
- the illumination unit 70 includes a white lamp 70, a reflection plate 71, and a three-wavelength band filter 73.
- the white lamp 70 emits light in a wide band (so-called broad wavelength band) including blue: 470 nm, green: 560 nm, and red: 600 nm.
- a halogen lamp can be exemplified.
- the reflection plate 71 reflects the visible light emitted from the white lamp 70 and increases the amount of the light L1 that is irradiated to the outside.
- the three-wavelength band filter 73 passes at least three types of wavelength components (here, red, green, and blue are exemplified) of the light emitted from the white lamp 70 and attenuates other wavelength components. It is. More specifically, the three-wavelength band filter 73 is a so-called three-wavelength bandpass filter in which a plurality of thin films are formed on the surface of a glass or quartz substrate.
- the illumination power supply 75 supplies power necessary for light emission to the white lamp 70 of the illumination unit 70.
- the interference color imaging unit 8 captures the light L3 reflected from the contact portion SP of the substrate 2 and the contact piece 3 as an interference color image with the color camera 80 through the substrate 2.
- the interference color imaging unit 8 includes a color camera 80 and a lens unit 81.
- the light L3 reflected from the contact portion SP between the substrate 2 and the contact piece 3 referred to here is light reflected at the interface between the substrate 20 and the metal thin film 21 (so-called surface reflected light), and the lubricant LB. And the light reflected at the interface between the steel ball 30 (so-called back surface reflected light).
- the color camera 80 outputs a video signal (analog signal) and video data (digital signal) corresponding to the captured color image to the outside, and includes a color filter 85 and an image sensor 86.
- the lens unit 81 forms an image of the contact portion SP of the substrate 2 and the contact piece 3 on the image sensor 86 of the color camera 80.
- the lens unit 81 in this embodiment also has a role of irradiating light emitted from the light source 7 toward the imaging target, and makes the illumination light the same as the imaging optical axis (that is, a coaxial tilting method). Can do.
- the lens unit 81 includes a half mirror 82, an objective lens 83, and an imaging lens 84.
- the lens unit 81 reflects the light L1 irradiated from the light source unit 7 by the half mirror 82 and irradiates the measurement target region R of the film thickness as the illumination light L2, so that the contact portion between the substrate 2 and the contact piece 3 Of the light L3 reflected from the SP, the light L4 that has passed through the objective lens 83 and the half mirror 82 can be imaged on the image sensor 86 of the color camera 80 by the imaging lens 84.
- the computer unit 9 inputs and outputs signals and data, stores data, performs arithmetic processing on the input or stored data, inputs and stores images, image processing on these images, determination processing based on image processing, and image conversion Processing, determination results, image output after image processing, and the like are performed.
- the computer unit 9 includes an input unit, an information recording unit, a numerical calculation processing unit, an image processing unit, and an output unit. More specifically, the computer unit 9 includes a computer (hardware) having an image processing function and an execution program (software) thereof.
- the computer unit 9 includes information input devices such as a keyboard, a mouse, and a track pad, and is connected to a display unit 10 described later.
- the computer unit 9 includes an image recording unit 11 and a film thickness distribution estimation unit 12. Further, the computer unit 9 includes a thinnest film thickness information recording unit 13, a traction coefficient calculation unit 15, and a slip rate control unit 16.
- the interference color image captured by the image recording unit 11 and the interference color imaging unit 8 is recorded.
- the image recording unit 11 includes an information recording unit (for example, a magnetic recording medium such as a hard disk, a semiconductor memory, or the like) of the computer unit 9.
- the film thickness distribution estimation unit 12 performs color separation for each light of at least three wavelengths from the color information of each point included in the selected interference color image among the interference color images recorded in the image recording unit 11.
- a luminance value is calculated
- a phase for each wavelength is calculated from the luminance value
- a plurality of film thickness candidates are calculated from the phase for each wavelength
- the substrate 2 and the contact piece 3 are calculated from the calculated plurality of film thickness candidates.
- the film thickness distribution of the lubricant LB at the contact portion SP is estimated.
- the film thickness distribution estimation unit 12 includes an image processing unit and a numerical calculation processing unit (hardware) of the computer unit 9 and an execution program (software) thereof.
- the computer unit 9 performs predetermined image processing based on the execution program,
- the film thickness distribution can be estimated by storing an image in the recording unit 11, reading an image from the image recording unit 11, or performing predetermined image processing or numerical calculation processing in the film thickness distribution estimating unit 12. it can.
- the film thickness distribution estimation unit 12 estimates the film thickness distribution by performing wavelength estimation processing based on interference fringe model matching described in Patent Document 4 on each point in the image. To do. More specifically, the film thickness distribution estimation unit 12 Illumination light including monochromatic light of multiple wavelengths is irradiated onto the transparent film to be measured, and n or more selected points are selected from the interference image generated by the reflected light on the surface and the back surface of the transparent film The wavelength ⁇ (j) of the wavelength number j is known to the interference luminance signal of the wavelength number j corresponding to the i point among the n selected points, and the average luminance a (j) of the wavelength number j is interferometric modulated.
- the average luminance a (j) and the interference modulation degree b (j) of the known wavelength number j obtained in claim 1 and the luminance g of each wavelength at the point k are obtained.
- a process for obtaining the film thickness t (k) at the point k from the obtained plurality of phases.
- FIG. 4 is an image diagram illustrating an example of an interference color image input to the film thickness distribution estimation unit 12.
- FIG. 4 shows an interference color image when the disk 20 and the steel ball 30 are stationary. Although the image diagram originally includes color information, it is substituted with one expressed in black and white shading due to the limitations of the attached drawings (hereinafter the same).
- FIG. 5 is an image diagram showing an example after the interference color image is separated into three colors.
- FIGS. 5A, 5B, and 5C are image diagrams showing an example of an image after the color interference color image is separated into three colors and converted into a single color image of blue, green, and red. It is.
- the film thickness distribution estimation unit 12 separates the color interference color image into three colors by performing phase calculation processing from the luminance values of the blue, green, and red points of the color camera, and the blue / green Convert each red color into a single color gray image, perform phase calculation by the above-mentioned ACOS method, and calculate a film thickness candidate. For each point, the estimated film thickness is calculated from the film thickness candidates for each color by the matching method (that is, the film thickness estimation calculation process).
- the thinnest film thickness information recording unit 13 records the position and film thickness of the thinnest film thickness in the film thickness distribution of the lubricant LB at the contact portion SP of the substrate 2 and the contact piece 3. .
- the thinnest film thickness information recording unit 13 is composed of an information recording unit of the computer unit 9.
- the pressing load measuring unit 65 measures a load when the steel ball 30 is pressed against the disc 20.
- the pressing load measuring unit 65 includes a load cell and an amplifier unit (not shown).
- the load cell is disposed between the mover 61 of the load applying mechanism 6 and the holder 63, measures the amount of strain in the load cell caused by the load when the steel ball 30 is pressed against the disk 20, and corresponds to this strain amount. This signal is output to the amplifier unit.
- the amplifier unit converts the strain amount into a load value (or stress value), displays the load value, and outputs signals and data corresponding to the load value to the computer 9 or later. Output to an external device such as the pressing load control unit 17.
- the torque measuring unit 14 measures the transmission torque T during rotation of the steel ball 30 that is a rotating body. Specifically, the torque measuring unit 14 exemplifies a configuration including a torque meter 55 disposed between the shaft 31 connected to the steel ball 30 and the shaft 51 of the rotating body rotating mechanism 5.
- the torque meter 55 includes a main body portion 56 and a shaft 57, and measures a transmission torque T acting on the shaft 57. Specifically, since the shaft 57 is twisted as it rotates, the torque meter 55 measures the amount of distortion of the shaft 57 caused by this twist, converts it into a transmission torque T that transmits the shaft 57, and outputs it. .
- the torque meter 55 can measure the transmission torque during rotation of the steel ball 30 that is a rotating body by measuring the transmission torque T of the shaft 57. Further, the torque meter 55 can output a signal and data corresponding to the measured transmission torque T to the computer 9 directly or via another device.
- the traction coefficient calculator 15 calculates the traction coefficient ⁇ .
- the traction coefficient ⁇ referred to here is also called a drive coefficient, and represents the degree of friction generated between the disk 20 and the steel ball 30 as a rotating body in a non-dimensional manner.
- the traction coefficient calculation unit 15 transmits the transmission torque T during the rotation of the steel ball 30 (that is, the transmission torque transmitted through the shaft 57 measured by the torque measurement unit 14) and the steel ball 30 that is a rotating body.
- the traction coefficient ⁇ is calculated on the basis of the rotation radius RB and the load Wb for pressing the steel ball 30 as the rotating body. Note that the equation for calculating the traction coefficient ⁇ can be obtained by Equation (1).
- the traction coefficient calculation unit 15 includes a numerical calculation processing unit (hardware) of the computer unit 9 and an execution program (software) thereof.
- the slip ratio control unit 16 controls at least one of the moving speed of the moving mechanism 4 and the rotating speed of the rotating body rotating mechanism 5 to control the slip ratio between the substrate 2 and the rotating body.
- the rotation speed of the disk 20 corresponding to the movement speed of the moving mechanism 4 is the number of rotations per unit time of the disk 20 and the position where the steel ball 30 contacts from the rotation center of the disk 20. Calculate from distance.
- the rotation speed of the rotating body rotating mechanism 5 is determined by the number of rotations per unit time of the shaft 51 connected to the steel ball 30 and the distance from the rotation center of the steel ball 30 to the place where the steel ball 30 contacts (that is, , From the radius of rotation RB of the steel ball.
- the rotational speed of the disc 20 and the rotational speed of the shaft 51 are controlled so as to achieve a desired slip rate.
- the slip rate is 0%, and if either one is stationary, the slip rate is 100%.
- the pressing load control unit 17 controls the pressing load that presses the contact piece 3 against the substrate 2 side in the load applying mechanism 5. Specifically, the pressing load control unit 17 inputs a signal corresponding to a load value or a stress value from the pressing load measurement unit 65, compares it with a preset reference value, and compares the actuator 60 of the load applying mechanism 6 with the actuator 60. To control the load that presses the steel ball 30 against the disk 20. More specifically, the pressing load control unit 17 is configured by a dedicated control unit, and inputs a reference value of the pressing load from the computer unit 9 or outputs a current value of the pressing load to the computer unit 9. Can do. Therefore, the pressing load can be automatically controlled, and a constant load can be continuously applied during the film thickness distribution measurement time.
- the display unit 10 is also called an information display or a display monitor.
- a video signal output from the computer unit 9 is input, characters, graphic information, and the like are displayed corresponding to the video signal.
- the display unit 10 1) The interference color image selected from the interference color images recorded in the image recording unit 11 2) The image showing the film thickness distribution of the lubricant LB estimated by the film thickness distribution estimation unit 12 as a two-dimensional distribution 3 ) While displaying at least one of the three-dimensional images of the film thickness distribution of the lubricant LB estimated by the film thickness distribution estimation unit 12, 4)
- the position information and film thickness information of the thinnest film thickness recorded in the thinnest film thickness information recording unit 13 are also displayed together (that is, displayed at once).
- FIG. 6 is an image diagram showing an example of an image showing an example of an interference color image.
- FIG. 7 is an image diagram showing an example of an image representing the measurement result of the film thickness distribution in a two-dimensional distribution.
- FIG. 8 is an image diagram showing an example of an image that three-dimensionally represents the measurement result of the film thickness distribution.
- FIG. 9 is an image diagram showing an example of the measurement result profile of the film thickness distribution in the X direction and the Y direction, the position information of the thinnest film thickness, and the film thickness information.
- the film thickness distribution measuring apparatus 1 Since the film thickness distribution measuring apparatus 1 according to the present invention has such a configuration, the relative relationship between the substrate 2 and the contact piece 3 (in the above example, the disk 20 and the steel ball 30 which is a rotating body is illustrated). Regardless of the speed fluctuation, the film thickness distribution of the lubricant LB that lubricates the contact portion SP between the substances in the EHL state can be measured in a wide range. At this time, the film thickness distribution is measured in a wide film thickness range of about 4 ⁇ m to 8 ⁇ m by irradiating light including three wavelengths of red, green, and blue from the light source unit 7. can do.
- the film thickness distribution measuring apparatus is not limited to the above-described configuration, and may be in the form exemplified below.
- the display unit 10 described above may display the number of rotations of the disc 20, the number of rotations of the steel ball 30 as a rotating body, pressing load, rotational torque, traction coefficient, slip rate, and the like as necessary.
- the operator may operate the information input device of the computer unit 9 to read an interference color image at an arbitrary time from the image recording unit 11 and display the interference color image on the display unit 10.
- the film thickness distribution measuring apparatus 1 may display the film thickness distribution measurement result for the interference color image and other information on the display unit 10 together.
- the film thickness distribution measuring apparatus may include a temperature measurement unit 18 and a temperature recording unit 19 in addition to the above-described configuration.
- the temperature measuring unit 18 measures the temperature of the contact portion SP between the substrate 2 and the contact piece 3. Specifically, the temperature measurement unit 18 measures the temperature of the lubricant LB that lubricates the contact portion SP between the disk 20 and the steel ball 30 from the upper side of the disk 20 through the disk 20 in a non-contact manner. Is. More specifically, the temperature measurement unit 18 includes an infrared temperature sensor, and has a function of displaying the measured temperature and outputting a signal and data corresponding to the measured temperature to the outside.
- the temperature recording unit 19 inputs signals and data output from the temperature measuring unit 18 and records the temperature each time.
- the temperature recording unit 19 is configured as a part of the computer unit 9 or an independent device such as a data logger, and records the temperature at a preset interval or based on an external trigger signal. The temperature can be recorded as appropriate.
- the temperature recording unit 19 can also record the date and time as necessary when recording the temperature.
- the temperature of the contact portion SP can be measured and recorded during the film thickness distribution measurement time. It can be used for analyzing the behavior of the state.
- the temperature measurement unit 18 is not limited to the configuration in which the temperature is measured in a non-contact manner through the disk 20 using the infrared temperature sensor as described above, but by a thermocouple probe or the like disposed below the disk 20.
- the structure which directly measures the temperature of the steel ball 30 or the temperature of the lubricant LB may be used.
- the substrate 2 is a flat glass disk 20, and a metal thin film 21 such as chromium and a transparent film 22 such as silicon oxide are formed on the lower surface thereof, and contact with the contact piece 3.
- a metal thin film 21 such as chromium and a transparent film 22 such as silicon oxide are formed on the lower surface thereof, and contact with the contact piece 3.
- An example in which the portion SP is a flat surface is shown.
- the shape of the contact portion of the substrate 2 is not limited to such a shape, and may be a curved surface, or may be a flat surface or a groove formed on the curved surface.
- the shape of the contact portion may be a shape that reproduces or models the shape of a bearing or a sliding object for which the film thickness distribution of the lubricant LB is to be measured.
- the material of the substrate 2 is not limited to glass, but may be other materials such as sapphire, silicon, and resin.
- the metal thin film 21 on the lower surface of the substrate 2 is not limited to the above-described chromium, but may be a film (also referred to as coating) formed of a thin film such as aluminum, copper, silver, or gold.
- the metal thin film 21 is for generating so-called surface reflected light for obtaining an interference color image. Therefore, the metal thin film 21 may not be formed as long as reflected light is obtained from the interface between the substrate 2 and the lubricant LB.
- the transparent film 22 on the lower surface of the substrate 2 is not limited to the above-described silicon oxide, and may be a film formed of a transparent material close to the refractive index of the lubricant LB.
- the transparent film 22 is measured so that the apparent film thickness is thick in order to increase the measurement resolution, and the film thickness of the transparent film 22 is subtracted later. It is for performing such processing. Therefore, the transparent film 22 on the lower surface of the substrate 2 may not be formed if the thickness of the lubricant LB can provide a desired measurement resolution.
- the contact piece 3 is an example of a steel ball 30 that is a type of rotating body in order to reproduce the contact portion in the ball bearing.
- the contact piece 3 is not limited to a steel sphere as a rotating body, and may be other materials (for example, aluminum, ceramic, resin, etc.), and have other shapes (for example, a cylinder, a cone, etc.). Also good.
- the contact piece 3 may be constituted not only by a rotating body but also by a sliding object such as a flat plate piece 35 (that is, a non-rotating object).
- the flat piece 35 can be suitably selected from arbitrary materials, such as steel, aluminum, a ceramic, and resin.
- the moving mechanism 4 has exemplified the configuration for rotating the disk 20 around the rotation axis of the rotary motor 40.
- the moving mechanism according to the present invention includes an actuator that reciprocates along a straight track, and reciprocates the disk 20 or a non-circular substrate (for example, a rectangle, hexagon, octagon, etc.). It may be.
- the slip ratio control for controlling the slip ratio between the substrate 2 and the steel ball 30 as the rotating body by controlling at least one of the moving speed of the moving mechanism 4 and the rotating speed of the rotating body rotating mechanism 5.
- the structure provided with the part 16 was illustrated. According to this configuration, it is possible to measure the film thickness distribution of the lubricant LB by setting an arbitrary slip rate.
- the slip ratio control unit 16 is not an essential component for embodying the present invention, and may be configured without this.
- the steel ball 30 while rotating the substrate 2 at a constant speed, 1) The steel ball 30 is rotated at a constant speed. 2) The steel ball 30 is passively rotated in accordance with the rotation of the substrate 2. 3) The steel ball 30 is set to be stationary or switched manually. Can be set.
- the pressing load control unit 17 is not an essential component for embodying the present invention, and is omitted.
- the position is changed by an external signal while using an elastic body such as a spring or rubber instead of an automatic control system.
- a configuration (so-called semi-automatic operation method) including an actuator 60 that can perform the above-described operation may be used.
- the actuator 60 may be omitted, and the contact piece 3 may be adjusted in the z direction by shim adjustment, fixing screw position adjustment, rotation adjustment, or the like to change the pressing load (so-called manual adjustment method).
- the thinnest film thickness information recording for recording the position and film thickness of the thinnest film thickness in the film thickness distribution of the lubricant LB at the contact portion SP of the contact piece 3 with the substrate 2 is performed.
- the structure provided with the part 13 was illustrated.
- the thinnest film thickness information recording unit 13 is not an essential component for embodying the present invention, and may have a configuration in which this is omitted.
- the structure provided with the display part 10 in the film thickness distribution measuring apparatus 1 was illustrated.
- the display unit 10 is not an essential component for embodying the present invention, and may be configured without this.
- the film thickness distribution measuring apparatus according to the present invention may be configured to output data including the result of measuring the film thickness distribution to an external apparatus or device regardless of whether or not the display unit 10 is provided. good.
- the white lamp 70 constituting the light source unit 7 is not limited to the halogen lamp described above, and may be a metal halide lamp, a xenon lamp, a mercury lamp, a white LED, or the like.
- the three-wavelength band filter 73 constituting the light source unit 7 is not limited to the configuration disposed between the white lamp 70 and the half mirror 82 as described above, but between the objective lens 83 and the substrate 2, the half mirror 82, and the like.
- a configuration in which the lens is disposed between the imaging lens 84 or between the imaging lens 84 and the imaging camera 80 may be employed.
- the light source unit 7 is not limited to the configuration including the white lamp 70, the reflection plate 71, and the three-wavelength band filter 73 as described above, but the LED that emits red light, the LED that emits green light, and the light that emits blue light. It is good also as a structure provided with the light emission unit provided with LED to perform. In this case, one or more LEDs of each color are provided, and the illumination power supply is configured to supply a predetermined DC voltage and current to each LED. Alternatively, instead of the LED that emits light of each color, a laser diode that emits light of each color or a laser diode that emits light of three wavelengths simultaneously and a power source that drives the laser diode may be provided.
- the light source unit 7 is exemplified by a configuration that irradiates light of three types of wavelengths of blue: 470 nm, green: 560 nm, and red: 600 nm.
- the light source unit according to the present invention is not limited to such a configuration, and a part or all of the light source unit may be replaced with light of other wavelengths.
- examples of light of other wavelengths emitted from the light source unit include near infrared light, orange light, and blue-green light.
- the wavelengths of light emitted from the light source unit 7 may be four types in total, or may be more types.
- Thickness distribution measuring device 1 Thickness distribution measuring device 2 Substrate 2d Arrow (substrate movement direction, disc rotation direction) 3 Contact piece 3d Arrow (movement direction of contact piece, rotation direction of rotating body) DESCRIPTION OF SYMBOLS 4 Movement mechanism 5 Rotating body rotation mechanism 6 Load application mechanism 7 Light source part 8 Interference color imaging part 9 Computer part 10 Display part 11 Image recording part 12 Film thickness distribution estimation part 13 Thinnest film thickness information recording part 14 Torque measurement part 15 Traction coefficient calculation unit 16 Slip rate control unit 17 Push load control unit 18 Temperature measurement unit 19 Temperature recording unit 20 Disc (one type of substrate) 21 Metal thin film 22 Transparent film 30 Steel ball (contact piece / one type of rotating body) 31 Shaft 40 Rotating motor 41 Connecting member 50 Rotating motor 51 Shaft 55 Torque measuring section 56 Main body section 57 Shaft 60 Actuator 61 Movable element 63 Bearing section 65 Pushing load measuring section (load cell) 70 White lamp 75 Illumination power supply 80 Imaging camera 81 Lens unit 82 Half mirror 83 Objective
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Abstract
The objective of the present invention is to provide a device with which it is possible to measure the film thickness distribution of a lubricating agent which lubricates contacting parts of substances in a state of elasto-hydrodynamic lubrication (EHL), over a wide range, irrespective of whether the relative speed between a base plate and a rotating body changes. More specifically, this film thickness distribution measuring device for measuring the film thickness of a lubricating agent which lubricates contacting parts of objects in an EHL state is provided with: an optically transparent base plate; a contacting piece which is in contact with the base plate with the lubricating agent therebetween; a movement mechanism which causes the base plate and the contacting piece to move relative to one another; a load imparting mechanism; a light source; an interference color image-capturing unit; and a computer; wherein the computer is provided with, an image recording unit which records interference color images captured by the interference color image-capturing unit, and a film thickness distribution estimating unit which, from the color information of each point contained in selected interference color images from among the interference color images recorded in the image recording unit, performs color separation to obtain light of at least three wavelengths and calculates the brightness values thereof, calculates the phase of each wavelength, and calculates a plurality of film thickness candidates, and which estimates the film thickness distribution of the lubricating agent at the contacting part between the base plate and the contacting piece from the calculated plurality of film thickness candidates.
Description
本発明は、回転や往復移動する基板に対して潤滑剤を介して回転している回転体又は摺動する物体の接触部分の潤滑剤の膜厚分布を計測する膜厚分布測定装置に関する。
The present invention relates to a film thickness distribution measuring apparatus for measuring a film thickness distribution of a lubricant at a contact portion of a rotating body or a sliding object rotating through a lubricant with respect to a rotating or reciprocating substrate.
例えばベアリングにおいては、互いに潤滑油で潤滑されているボール(一方の物体)と、外輪リング、或いは内輪リング(他方の物体)が、線接触または点接触している。このとき、互いの物体の接触部分には荷重が集中するため、物体が弾性変形するとともに、潤滑油が高圧・高粘度となる弾性流体潤滑状態(EHL状態:Elasto-hydrodynamic Lubrication)になる。
For example, in a bearing, a ball (one object) lubricated with lubricating oil and an outer ring or inner ring (the other object) are in line contact or point contact. At this time, since the load concentrates on the contact portion between the objects, the object is elastically deformed, and the elastic fluid lubrication state (EHL state: Elasto-hydrodynamic Lubrication) in which the lubricating oil becomes high pressure and high viscosity is obtained.
このようなベアリングのEHL状態を観察する従来の方法として、円盤状のディスク及び鋼球を相対的に回転又は摺動するように配置し、そのディスク及び鋼球の接触部分を潤滑油で潤滑しておくとともに、接触部分の潤滑油にライン状の光を走査しながら照射して白黒の干渉縞を発生させ、白縞の波長および黒縞の波長に基づいて潤滑剤の膜厚を測定する技術が知られている(例えば、特許文献1)。
As a conventional method for observing the EHL state of such a bearing, a disk-shaped disk and a steel ball are arranged so as to rotate or slide relative to each other, and the contact portion of the disk and the steel ball is lubricated with a lubricating oil. A technology that measures the film thickness of lubricant based on the wavelength of white stripes and the wavelength of black stripes by generating line-shaped interference fringes by irradiating the contact area with lubricating oil while scanning the line-shaped light Is known (for example, Patent Document 1).
また、反射膜とスペーサ膜を順次形成し、スペーサ膜を試料に接する光透過性基板と、スペーサ膜とは反対側から光透過性基板に白色光を照射する照射手段と、白色光の反射光を受光する受光手段と、反射光から色彩情報を取得する色彩情報取得手段を有する膜厚測定装置を用いて干渉画像を取得し、その色情報をHSV色空間に変換して色相値を求め、二面間のすきまの厚さとの校正結果に基づき、すきまの厚さあるいは膜厚ゼロに相当する真実接触部を可視化する技術が知られている(例えば、特許文献2)。
In addition, a reflective film and a spacer film are sequentially formed, a light-transmitting substrate that contacts the sample with the spacer film, irradiation means for irradiating the light-transmitting substrate with white light from the opposite side of the spacer film, and reflected light of white light An interference image is obtained using a film thickness measuring device having a light receiving means for receiving light and a color information obtaining means for obtaining color information from reflected light, and the hue information is obtained by converting the color information into an HSV color space, A technique for visualizing a true contact portion corresponding to a gap thickness or zero film thickness based on a calibration result with a gap thickness between two surfaces is known (for example, Patent Document 2).
また、油膜を挟んだ2つの物体間に電圧を印加して油膜の絶縁破壊を調べる油膜絶縁破壊評価装置において、一方の物体を透明体とし、かつ、他方の物体との接触面側に可視光を透過する電極(例えば、透明導電膜)を用い、荷重をかけた状態で接触面の油膜厚さを光干渉法で実測する技術が知られている(例えば、特許文献3)。
Also, in an oil film dielectric breakdown evaluation apparatus that examines the dielectric breakdown of an oil film by applying a voltage between two objects sandwiching the oil film, one object is a transparent body, and visible light is on the contact surface side with the other object. A technique is known in which an oil film thickness of a contact surface is measured by an optical interferometry in a state where a load is applied using an electrode that transmits light (for example, a transparent conductive film) (for example, Patent Document 3).
また、透明膜に向けて複数波長からなる光を照射し、当該透明膜の表面反射光及び裏面反射光により生成されるカラーの干渉縞画像を撮像し、当該画像に干渉縞モデルを適合することで複数点の膜厚を一括して測定(つまり、各色情報と膜厚値との関係付けの校正を必要とせずに、膜厚分布を測定)する技術が知られている(例えば、特許文献4、非特許文献1)。さらに、非特許文献1には、青色:470nm、緑色:560nm、赤色:600nmの組合せで8μmの膜厚レンジ測定が期待でき、実試料による実験で4μmの膜厚測定ができる旨が記載されている。
Also, irradiate light with multiple wavelengths toward the transparent film, capture a color interference fringe image generated by the surface reflection light and back surface reflection light of the transparent film, and fit the interference fringe model to the image A technique is known in which film thicknesses at a plurality of points are collectively measured (that is, a film thickness distribution is measured without requiring calibration of the relationship between each color information and a film thickness value) (for example, Patent Documents) 4, Non-Patent Document 1). Further, Non-Patent Document 1 describes that a film thickness range of 8 μm can be expected by a combination of blue: 470 nm, green: 560 nm, and red: 600 nm, and a film thickness of 4 μm can be measured by an experiment using an actual sample. Yes.
しかし、特許文献1の技術では、ライン走査により面の膜厚分布を測定しているため、経時的な膜厚分布の変化が生じない状況にあるもの(例えば、一定速度で回転や摺動するもの)しか、測定ができなかった。
However, in the technique of Patent Document 1, since the film thickness distribution of the surface is measured by line scanning, the film thickness distribution does not change over time (for example, rotating or sliding at a constant speed). However, measurement was not possible.
一方、特許文献2の技術では、膜厚の二次元分布の測定が可能であるが、各色情報と膜厚値との関係付けの校正が必要であり、その関係が照明系、光学系、対象表面など多くの要因で変化する。さらに、色情報(BGR値)を色相に変換しているが、色相が膜厚約260nmの周期のため、膜厚測定レンジが限定されるという課題があった。
On the other hand, in the technique of Patent Document 2, it is possible to measure the two-dimensional distribution of the film thickness, but it is necessary to calibrate the relationship between each color information and the film thickness value. It varies depending on many factors such as the surface. Furthermore, although the color information (BGR value) is converted into a hue, there is a problem that the film thickness measurement range is limited because the hue is a period of about 260 nm in film thickness.
一方、特許文献3の技術では、555nm(緑色)と630nm(赤色)の波長の異なる単色光を2色重ねた2色光源を用い、実際の油膜厚さと色との関係をあらかじめ分かっている隙間を用いて検定した関係データに基づいて、光干渉画像の色から膜厚を測定している。そのため、特許文献2と同様、各色情報と膜厚値との関係付けの校正が必要となる。
On the other hand, in the technique of Patent Document 3, a two-color light source obtained by superimposing two colors of monochromatic light having different wavelengths of 555 nm (green) and 630 nm (red), and a gap in which the relationship between the actual oil film thickness and color is known in advance. The film thickness is measured from the color of the optical interference image on the basis of the relational data verified using. Therefore, as in Patent Document 2, it is necessary to calibrate the relationship between each color information and the film thickness value.
一方、特許文献4では、フィルム製造プロセスにおいて連続走行するフィルムシートの膜厚をオンライン計測することに適用可能な旨が記載されており、非特許文献1では、シリコンウエハ上のシリコン酸化膜の膜厚、ニュートンリング板の空気間隙、シャボン膜の膜厚を測定できる旨が記載されているが、ベアリングなどのEHL状態にある潤滑剤の膜厚分布を測定する具体的手段までは言及されていない。
On the other hand, Patent Document 4 describes that it can be applied to on-line measurement of the film thickness of a film sheet that runs continuously in a film manufacturing process. In Non-Patent Document 1, a film of a silicon oxide film on a silicon wafer is described. Although it is described that the thickness, the air gap of the Newton ring plate, and the film thickness of the soap film can be measured, there is no mention of a specific means for measuring the film thickness distribution of the lubricant in the EHL state such as a bearing. .
そこで本発明は、EHL状態の物質同士の接触部分を潤滑する潤滑剤の過渡的な膜厚変動や膜厚分布を、幅広い膜厚レンジで校正なしに測定ができる装置を提供することを目的とする。
Therefore, the present invention has an object to provide an apparatus capable of measuring transient film thickness fluctuation and film thickness distribution of a lubricant that lubricates a contact portion between substances in an EHL state without calibration in a wide film thickness range. To do.
以上の課題を解決するために、本発明に係る一態様は、
EHL状態の物体同士の接触部分を潤滑する潤滑剤の膜厚分布を測定する膜厚分布測定装置であって、
光透過性を備えた基板と、
基板に潤滑剤を介して接触する接触個片と、
基板と接触個片を相対移動させる移動機構と、
基板側に接触個片を押し付けて荷重を付与する荷重付与機構と、
基板と接触個片の接触部分に向けて少なくとも3種類の波長の光を照射する光源と、
基板と接触個片の接触部分から反射された光を、基板越しにカラーカメラにて干渉色画像として撮像する干渉色撮像部と、
コンピュータ部を備え、
コンピュータ部には、
干渉色撮像部で撮像された干渉色画像を記録する画像記録部と、
画像記録部に記録された干渉色画像のうち、選択された干渉色画像に含まれる各点の色情報から少なくとも3種類の波長の光毎に色分離して輝度値を算出し、当該輝度値から波長毎の位相を算出し、当該波長毎の位相から複数の膜厚候補を算出し、当該算出された複数の膜厚候補から基板と接触個片の接触部分の潤滑剤の膜厚分布を推定する膜厚分布推定部を備える。 In order to solve the above problems, an aspect of the present invention is as follows.
A film thickness distribution measuring apparatus for measuring a film thickness distribution of a lubricant that lubricates a contact portion between objects in an EHL state,
A substrate with optical transparency;
A contact piece that contacts the substrate via a lubricant;
A moving mechanism for relatively moving the substrate and the contact piece;
A load applying mechanism for applying a load by pressing the contact piece on the substrate side;
A light source that emits light of at least three wavelengths toward the contact portion of the substrate and the contact piece;
An interference color imaging unit that images light reflected from the contact portion of the substrate and the contact piece as an interference color image with a color camera through the substrate;
It has a computer part,
In the computer part,
An image recording unit for recording an interference color image captured by the interference color imaging unit;
Among the interference color images recorded in the image recording unit, the luminance value is calculated by color-separating at least three types of light from the color information of each point included in the selected interference color image, and the luminance value From the phase for each wavelength, a plurality of film thickness candidates are calculated, and from the calculated plurality of film thickness candidates, the lubricant film thickness distribution at the contact portion between the substrate and the contact piece is calculated. A film thickness distribution estimation unit for estimation is provided.
EHL状態の物体同士の接触部分を潤滑する潤滑剤の膜厚分布を測定する膜厚分布測定装置であって、
光透過性を備えた基板と、
基板に潤滑剤を介して接触する接触個片と、
基板と接触個片を相対移動させる移動機構と、
基板側に接触個片を押し付けて荷重を付与する荷重付与機構と、
基板と接触個片の接触部分に向けて少なくとも3種類の波長の光を照射する光源と、
基板と接触個片の接触部分から反射された光を、基板越しにカラーカメラにて干渉色画像として撮像する干渉色撮像部と、
コンピュータ部を備え、
コンピュータ部には、
干渉色撮像部で撮像された干渉色画像を記録する画像記録部と、
画像記録部に記録された干渉色画像のうち、選択された干渉色画像に含まれる各点の色情報から少なくとも3種類の波長の光毎に色分離して輝度値を算出し、当該輝度値から波長毎の位相を算出し、当該波長毎の位相から複数の膜厚候補を算出し、当該算出された複数の膜厚候補から基板と接触個片の接触部分の潤滑剤の膜厚分布を推定する膜厚分布推定部を備える。 In order to solve the above problems, an aspect of the present invention is as follows.
A film thickness distribution measuring apparatus for measuring a film thickness distribution of a lubricant that lubricates a contact portion between objects in an EHL state,
A substrate with optical transparency;
A contact piece that contacts the substrate via a lubricant;
A moving mechanism for relatively moving the substrate and the contact piece;
A load applying mechanism for applying a load by pressing the contact piece on the substrate side;
A light source that emits light of at least three wavelengths toward the contact portion of the substrate and the contact piece;
An interference color imaging unit that images light reflected from the contact portion of the substrate and the contact piece as an interference color image with a color camera through the substrate;
It has a computer part,
In the computer part,
An image recording unit for recording an interference color image captured by the interference color imaging unit;
Among the interference color images recorded in the image recording unit, the luminance value is calculated by color-separating at least three types of light from the color information of each point included in the selected interference color image, and the luminance value From the phase for each wavelength, a plurality of film thickness candidates are calculated, and from the calculated plurality of film thickness candidates, the lubricant film thickness distribution at the contact portion between the substrate and the contact piece is calculated. A film thickness distribution estimation unit for estimation is provided.
この態様によれば、高速で潤滑剤の膜厚の二次元分布の測定ができるため、過渡的な膜厚分布の変化(例えば、加減速評価や破断プロセス評価など)が可能となる。そのうえ、広域モデル適合法により、対象基板を撮像した干渉画像から校正を行う(いわゆる、セルフキャリブレーションを行う)ため、各色情報と膜厚値との関係づけの校正が不要であり、青・緑・赤色の3波長を用いれば、4μmないし8μm程度の幅広い膜厚レンジで、膜厚分布の測定が可能となる。
According to this aspect, since the two-dimensional distribution of the lubricant film thickness can be measured at a high speed, a transitional film thickness distribution change (for example, acceleration / deceleration evaluation, fracture process evaluation, etc.) becomes possible. In addition, since calibration is performed from the interference image obtained by imaging the target substrate by the wide-area model fitting method (so-called self-calibration is performed), it is not necessary to calibrate the relationship between each color information and the film thickness value. -If the three wavelengths of red are used, the film thickness distribution can be measured in a wide film thickness range of about 4 to 8 μm.
EHL状態の物質同士の接触部分を潤滑する潤滑剤の過渡的な膜厚変動や膜厚分布を、幅広い膜厚レンジで校正なしに測定ができる。
¡Transient film thickness fluctuations and film thickness distribution of lubricants that lubricate contact parts between substances in EHL state can be measured without calibration over a wide film thickness range.
以下に、本発明を実施するための形態について、図を用いながら説明する。なお各図では、水平方向をx方向、y方向と表現し、xy平面に垂直な方向(つまり、重力方向)をz方向と表現する。また、重力に逆らう方向を上、重力がはたらく方向を下と表現する。
Hereinafter, embodiments for carrying out the present invention will be described with reference to the drawings. In each figure, the horizontal direction is expressed as the x direction and the y direction, and the direction perpendicular to the xy plane (that is, the gravity direction) is expressed as the z direction. Also, the direction against gravity is expressed as up, and the direction in which gravity works is expressed as down.
図1は、本発明を具現化する形態の一例の全体構成を示す概略図である。
図2は、本発明を具現化する形態の一例の一部を拡大して示した部分拡大図である。
図3は、本発明を具現化する形態の一例における各機器のつながりを示す機能ブロック図である。 FIG. 1 is a schematic diagram showing an overall configuration of an example of a form embodying the present invention.
FIG. 2 is a partially enlarged view showing an enlarged part of an example embodying the present invention.
FIG. 3 is a functional block diagram showing the connection of each device in an example embodying the present invention.
図2は、本発明を具現化する形態の一例の一部を拡大して示した部分拡大図である。
図3は、本発明を具現化する形態の一例における各機器のつながりを示す機能ブロック図である。 FIG. 1 is a schematic diagram showing an overall configuration of an example of a form embodying the present invention.
FIG. 2 is a partially enlarged view showing an enlarged part of an example embodying the present invention.
FIG. 3 is a functional block diagram showing the connection of each device in an example embodying the present invention.
本発明に係る膜厚分布測定装置1は、EHL状態の基板2と接触個片3の接触部分SPを潤滑する潤滑剤LBの膜厚分布を測定するものである。具体的には、膜厚分布測定装置1は、干渉色画像を撮像し、この干渉色画像に基づいて、潤滑剤LBの膜厚分布を測定する。より具体的には、膜厚分布測定装置1は、基板2、接触個片3、移動機構4、回転体回転機構5、荷重付与機構6、光源部7、干渉色撮像部8、コンピュータ部9、表示部10等を備えて構成されている。
The film thickness distribution measuring apparatus 1 according to the present invention measures the film thickness distribution of the lubricant LB that lubricates the contact portion SP of the substrate 2 and the contact piece 3 in the EHL state. Specifically, the film thickness distribution measuring apparatus 1 captures an interference color image and measures the film thickness distribution of the lubricant LB based on the interference color image. More specifically, the film thickness distribution measuring apparatus 1 includes a substrate 2, a contact piece 3, a moving mechanism 4, a rotating body rotating mechanism 5, a load applying mechanism 6, a light source unit 7, an interference color imaging unit 8, and a computer unit 9. The display unit 10 and the like are provided.
基板2は、光透過性を備えた材料で構成されている。具体的には、基板2は、xy方向に平坦で、z方向に所定の厚みをもった、透明なガラス製の円板20を例示できる。より具体的には、円板20の下面には、クロム(Cr)などの金属薄膜21が成膜されており、さらにその下面には、酸化シリコン(SiO2)などの潤滑剤LBと同程度の屈折率の透明膜22が成膜されている。
The substrate 2 is made of a material having optical transparency. Specifically, the substrate 2 can be exemplified by a transparent glass disc 20 that is flat in the xy direction and has a predetermined thickness in the z direction. More specifically, a metal thin film 21 such as chrome (Cr) is formed on the lower surface of the disc 20, and further on the lower surface thereof is approximately the same as the lubricant LB such as silicon oxide (SiO 2). A transparent film 22 having a refractive index is formed.
接触個片3は、基板2に潤滑剤LBを介して接触しながら回転するものである。具体的には、接触個片3として、回転体の一類型である鋼球30を例示する。鋼球30には、シャフト31が連結されている。シャフト31は、xy平面に平行な方向(図1ではx方向)に所定の長さを有し、後述する回転体回転機構5と連結されている。
The contact piece 3 rotates while contacting the substrate 2 via the lubricant LB. Specifically, as the contact piece 3, a steel ball 30 which is a type of rotating body is illustrated. A shaft 31 is connected to the steel ball 30. The shaft 31 has a predetermined length in a direction parallel to the xy plane (x direction in FIG. 1), and is connected to a rotating body rotating mechanism 5 described later.
鋼球30は、潤滑剤LBを介して円板20の下面の透明膜22と接触している。また、鋼球30の下方には、潤滑剤LBを貯めておくオイルパンPが備えられいる。そして、鋼球30が回転すると、オイルパンPに溜まっている潤滑剤LBがそれ自身の粘性により上方へ移動し、余剰となった潤滑剤は下方へ落ちる。そのため、円板20と鋼球30との接触部分SPに適量の潤滑剤LBが供給される。
The steel ball 30 is in contact with the transparent film 22 on the lower surface of the disk 20 through the lubricant LB. An oil pan P for storing the lubricant LB is provided below the steel ball 30. When the steel ball 30 rotates, the lubricant LB accumulated in the oil pan P moves upward due to its own viscosity, and the excess lubricant falls downward. Therefore, an appropriate amount of lubricant LB is supplied to the contact portion SP between the disk 20 and the steel ball 30.
移動機構4は、基板2と接触個片3を相対移動させるものである。具体的には、移動機構4は、回転モータ40により構成することができる。回転モータ40は、円板20をxy方向と垂直な軸を回転中心として矢印2dに示す方向に所定の速さで回転させたり、静止させたり、矢印2dとは逆方向に所定の速さで回転させるものである。より具体的には、回転モータ40は、本体部と本体部の内側に組み込まれたロータ(不図示)を備えており、円板20とロータとが連結部材41にて連結されている。回転モータ40は、モータアンプユニット(不図示)を介して、詳細を後述するコンピュータ部9と接続され、円板20の回転方向および回転速度が適宜制御される。
The moving mechanism 4 moves the substrate 2 and the contact piece 3 relative to each other. Specifically, the moving mechanism 4 can be configured by a rotary motor 40. The rotary motor 40 rotates the disk 20 at a predetermined speed in a direction indicated by an arrow 2d with an axis perpendicular to the xy direction as a rotation center, or stops at a predetermined speed in a direction opposite to the arrow 2d. It is intended to rotate. More specifically, the rotary motor 40 includes a main body portion and a rotor (not shown) incorporated inside the main body portion, and the disk 20 and the rotor are connected by a connecting member 41. The rotation motor 40 is connected to a computer unit 9 described later in detail through a motor amplifier unit (not shown), and the rotation direction and rotation speed of the disk 20 are appropriately controlled.
回転体回転機構5は、回転体である鋼球30を回転させるものである。具体的には、回転体回転機構5は、鋼球30とシャフト31を矢印3dの方向に所定の速さで回転させたり、静止させたり、矢印3dとは逆方向に所定の速さで回転させるものである。
より具体的には、回転体回転機構5は、回転モータ50と、回転モータ50のロータに連結されたシャフト51を備えている。 The rotatingbody rotating mechanism 5 rotates a steel ball 30 that is a rotating body. Specifically, the rotating body rotating mechanism 5 rotates or stops the steel ball 30 and the shaft 31 at a predetermined speed in the direction of the arrow 3d, or rotates at a predetermined speed in the direction opposite to the arrow 3d. It is something to be made.
More specifically, the rotatingbody rotating mechanism 5 includes a rotating motor 50 and a shaft 51 connected to the rotor of the rotating motor 50.
より具体的には、回転体回転機構5は、回転モータ50と、回転モータ50のロータに連結されたシャフト51を備えている。 The rotating
More specifically, the rotating
回転モータ50は、モータアンプユニット(不図示)を介して、詳細を後述するコンピュータ部9と接続され、シャフト51の回転方向および回転速度が適宜制御される。
The rotation motor 50 is connected to a computer unit 9 described later in detail through a motor amplifier unit (not shown), and the rotation direction and rotation speed of the shaft 51 are appropriately controlled.
荷重付与機構6は、鋼球30を円板20に接触させる際に、荷重を付与するものである。具体的には、荷重付与機構6は、円板20の下方に配置された鋼球30を、上向きに押し上げるものである。より具体的には、荷重付与機構6は、アクチュエータ60と、ホルダ63を備えて構成されている。アクチュエータ60は、エアや油圧、電動で可動子61が上下動するものであり、アクチュエータ60の本体部は装置フレーム1fに取り付けられており、可動子61にホルダ63が取り付けられている。アクチュエータ60は、後述する押付荷重制御部17と接続されている。
The load applying mechanism 6 applies a load when the steel ball 30 is brought into contact with the disk 20. Specifically, the load application mechanism 6 pushes the steel ball 30 disposed below the disk 20 upward. More specifically, the load application mechanism 6 includes an actuator 60 and a holder 63. The actuator 60 is such that the movable element 61 moves up and down by air, hydraulic pressure, and electric power. The main body of the actuator 60 is attached to the apparatus frame 1 f, and the holder 63 is attached to the movable element 61. The actuator 60 is connected to a pressing load control unit 17 described later.
なお、円板20の回転速度や、鋼球30の回転速度、荷重付与機構6のアクチュエータ60による押付荷重等は、ベアリングが実際に使用される状態を再現するように設定したり、想定される使用状態に合わせて設定したりする。そうすることで、EHL状態で回転するベアリング内の接触部分の環境条件を設定することができる。
In addition, the rotational speed of the disc 20, the rotational speed of the steel ball 30, the pressing load by the actuator 60 of the load applying mechanism 6, and the like are set or assumed to reproduce the state in which the bearing is actually used. Set according to usage conditions. By doing so, the environmental condition of the contact part in the bearing which rotates in an EHL state can be set.
光源部7は、基板2と接触個片3の接触部分SPに向けて少なくとも3種類の波長の光L1を照射するものである。具体的には、光源部7は、照明ユニット70と、照明用電源75を備えている。
The light source unit 7 emits light L1 of at least three types of wavelengths toward the contact portion SP of the substrate 2 and the contact piece 3. Specifically, the light source unit 7 includes an illumination unit 70 and an illumination power source 75.
照明ユニット70は、干渉色画像の撮像に必要な、少なくとも3種類の波長の光を発するものである。具体的には、照明ユニット70は、白色ランプ70と、反射板71と、3波長帯域フィルタ73を備えている。白色ランプ70は、青色:470nm、緑色:560nm、赤色:600nmを含む広い帯域(いわゆる、ブロードな波長帯域)の光を放出するものであり、具体的にはハロゲンランプが例示できる。反射板71は、白色ランプ70から放出された可視光を反射し、外部に照射する光L1の量を増やすものである。3波長帯域フィルタ73は、白色ランプ70から放出された光のうち、少なくとも3種類の波長成分(ここでは、赤色・緑色・青色を例示する)を通過させ、それ以外の波長成分を減衰させるものである。より具体的には、3波長帯域フィルタ73は、ガラスや石英基板の表面に複数の薄膜が形成された、いわゆる3波長バンドパスフィルターで構成されている。
The illumination unit 70 emits light of at least three types of wavelengths necessary for capturing an interference color image. Specifically, the illumination unit 70 includes a white lamp 70, a reflection plate 71, and a three-wavelength band filter 73. The white lamp 70 emits light in a wide band (so-called broad wavelength band) including blue: 470 nm, green: 560 nm, and red: 600 nm. Specifically, a halogen lamp can be exemplified. The reflection plate 71 reflects the visible light emitted from the white lamp 70 and increases the amount of the light L1 that is irradiated to the outside. The three-wavelength band filter 73 passes at least three types of wavelength components (here, red, green, and blue are exemplified) of the light emitted from the white lamp 70 and attenuates other wavelength components. It is. More specifically, the three-wavelength band filter 73 is a so-called three-wavelength bandpass filter in which a plurality of thin films are formed on the surface of a glass or quartz substrate.
照明用電源75は、照明ユニット70の白色ランプ70に対して、発光に必要な電力を供給するものである。
The illumination power supply 75 supplies power necessary for light emission to the white lamp 70 of the illumination unit 70.
干渉色撮像部8は、基板2と接触個片3の接触部分SPから反射された光L3を、基板2越しにカラーカメラ80にて干渉色画像として撮像するものである。具体的には、干渉色撮像部8は、カラーカメラ80と、レンズユニット81を備えている。なお、ここで言う、基板2と接触個片3の接触部分SPから反射された光L3とは、基板20と金属薄膜21の界面で反射した光(いわゆる、表面反射光)と、潤滑剤LBと鋼球30との界面で反射した光(いわゆる、裏面反射光)とが合成されたものである。
The interference color imaging unit 8 captures the light L3 reflected from the contact portion SP of the substrate 2 and the contact piece 3 as an interference color image with the color camera 80 through the substrate 2. Specifically, the interference color imaging unit 8 includes a color camera 80 and a lens unit 81. The light L3 reflected from the contact portion SP between the substrate 2 and the contact piece 3 referred to here is light reflected at the interface between the substrate 20 and the metal thin film 21 (so-called surface reflected light), and the lubricant LB. And the light reflected at the interface between the steel ball 30 (so-called back surface reflected light).
カラーカメラ80は、撮像されたカラー画像に対応した映像信号(アナログ信号)や映像データ(デジタル信号)を外部に出力するものであり、カラーフィルタ85と、撮像素子86を備えている。
The color camera 80 outputs a video signal (analog signal) and video data (digital signal) corresponding to the captured color image to the outside, and includes a color filter 85 and an image sensor 86.
レンズユニット81は、基板2と接触個片3の接触部分SPの像を、カラーカメラ80の撮像素子86に結像させるものである。また、本実施例におけるレンズユニット81は、光源7から照射された光を、撮像対象に向けて照射する役割も併せ持ち、照明光を撮像光軸と同じ(つまり、同軸落斜方式)にすることができる。具体的には、レンズユニット81は、ハーフミラー82、対物レンズ83、結像レンズ84を備えている。そのため、レンズユニット81は、光源部7から照射された光L1を、ハーフミラー82で反射させて照明光L2として膜厚の測定対象領域Rに照射し、基板2と接触個片3の接触部分SPから反射された光L3のうち、対物レンズ83とハーフミラー82を通過した光L4を結像レンズ84にてカラーカメラ80の撮像素子86に結像させることができる。
The lens unit 81 forms an image of the contact portion SP of the substrate 2 and the contact piece 3 on the image sensor 86 of the color camera 80. In addition, the lens unit 81 in this embodiment also has a role of irradiating light emitted from the light source 7 toward the imaging target, and makes the illumination light the same as the imaging optical axis (that is, a coaxial tilting method). Can do. Specifically, the lens unit 81 includes a half mirror 82, an objective lens 83, and an imaging lens 84. Therefore, the lens unit 81 reflects the light L1 irradiated from the light source unit 7 by the half mirror 82 and irradiates the measurement target region R of the film thickness as the illumination light L2, so that the contact portion between the substrate 2 and the contact piece 3 Of the light L3 reflected from the SP, the light L4 that has passed through the objective lens 83 and the half mirror 82 can be imaged on the image sensor 86 of the color camera 80 by the imaging lens 84.
コンピュータ部9は、信号やデータの入力や出力、データの記憶、入力または記憶されたデータに対する演算処理のほか、画像の入力や記憶、これら画像に対する画像処理、画像処理に基づく判定処理や画像変換処理、判定結果や画像処理後の画像の出力などを行うものである。具体的には、コンピュータ部9は、入力部、情報記録部、数値演算処理部、画像処理部、出力部を備えている。より具体的には、コンピュータ部9は、画像処理機能を備えたコンピュータ(ハードウェア)とその実行プログラム(ソフトウェア)により構成されている。また、コンピュータ部9は、キーボードやマウス、トラックパッドなどの情報入力デバイスを備え、後述する表示部10と接続されている。
The computer unit 9 inputs and outputs signals and data, stores data, performs arithmetic processing on the input or stored data, inputs and stores images, image processing on these images, determination processing based on image processing, and image conversion Processing, determination results, image output after image processing, and the like are performed. Specifically, the computer unit 9 includes an input unit, an information recording unit, a numerical calculation processing unit, an image processing unit, and an output unit. More specifically, the computer unit 9 includes a computer (hardware) having an image processing function and an execution program (software) thereof. The computer unit 9 includes information input devices such as a keyboard, a mouse, and a track pad, and is connected to a display unit 10 described later.
コンピュータ部9は、画像記録部11、膜厚分布推定部12を備えている。さらに、コンピュータ部9は、膜厚最薄部情報記録部13、トラクション係数算出部15、すべり率制御部16を備えている。
The computer unit 9 includes an image recording unit 11 and a film thickness distribution estimation unit 12. Further, the computer unit 9 includes a thinnest film thickness information recording unit 13, a traction coefficient calculation unit 15, and a slip rate control unit 16.
画像記録部11、干渉色撮像部8で撮像された干渉色画像を記録するものである。具体的には、画像記録部11は、コンピュータ部9の情報記録部(例えば、ハードディスクなどの磁気記録媒体や、半導体メモリーなど)で構成されている。
The interference color image captured by the image recording unit 11 and the interference color imaging unit 8 is recorded. Specifically, the image recording unit 11 includes an information recording unit (for example, a magnetic recording medium such as a hard disk, a semiconductor memory, or the like) of the computer unit 9.
膜厚分布推定部12は、画像記録部11に記録された干渉色画像のうち、選択された干渉色画像に含まれる各点の色情報から少なくとも3種類の波長の光毎に色分離して輝度値を算出し、当該輝度値から波長毎の位相を算出し、当該波長毎の位相から複数の膜厚候補を算出し、当該算出された複数の膜厚候補から基板2と接触個片3の接触部分SPの潤滑剤LBの膜厚分布を推定するものである。具体的には、膜厚分布推定部12は、コンピュータ部9の画像処理部や数値演算処理部(ハードウェア)と、その実行プログラム(ソフトウェア)で構成されている。
The film thickness distribution estimation unit 12 performs color separation for each light of at least three wavelengths from the color information of each point included in the selected interference color image among the interference color images recorded in the image recording unit 11. A luminance value is calculated, a phase for each wavelength is calculated from the luminance value, a plurality of film thickness candidates are calculated from the phase for each wavelength, and the substrate 2 and the contact piece 3 are calculated from the calculated plurality of film thickness candidates. The film thickness distribution of the lubricant LB at the contact portion SP is estimated. Specifically, the film thickness distribution estimation unit 12 includes an image processing unit and a numerical calculation processing unit (hardware) of the computer unit 9 and an execution program (software) thereof.
そのため、コンピュータ部9は、干渉色撮像部8から出力された映像信号(アナログ信号)や映像データ(デジタル信号)が入力されると、実行プログラムに基づいて、所定の画像処理を行ったり、画像記録部11に画像を保存したり、画像記録部11から画像を読み出したり、膜厚分布推定部12にて所定の画像処理や数値演算処理をしたりして、膜厚分布を推定することができる。
Therefore, when the video signal (analog signal) or video data (digital signal) output from the interference color imaging unit 8 is input, the computer unit 9 performs predetermined image processing based on the execution program, The film thickness distribution can be estimated by storing an image in the recording unit 11, reading an image from the image recording unit 11, or performing predetermined image processing or numerical calculation processing in the film thickness distribution estimating unit 12. it can.
具体的には、膜厚分布推定部12は、特許文献4に記載されているような干渉縞モデル適合による波長推定処理を、画像内の各点に対して行うことで、膜厚分布を推定するものである。より具体的には、膜厚分布推定部12は、
複数の波長の単色光を含む照明光を測定対象である透明膜に照射し、透明膜の表面の反射光と裏面の反射光により生成される干渉画像から1点以上の選択点をn点選択し、n点の選択点の内のi点に対応する波長番号jの干渉輝度信号に、波長番号jの波長λ(j)を既知とし、波長番号jの平均輝度a(j)、干渉変調度b(j)、および点iの膜厚t(i)のすべて、あるいは、一部を未知パラメータとし、残りを既知パラメータとして、点iに対応する波長番号jの輝度g(i,j)が、次式
g(i,j)=a(j)[1+b(j)×cos{4πt(i)/λ(j)}]
で表される干渉縞モデルを適合することにより、未知パラメータを求める処理(つまり、膜厚推定演算処理)を行う。 Specifically, the film thicknessdistribution estimation unit 12 estimates the film thickness distribution by performing wavelength estimation processing based on interference fringe model matching described in Patent Document 4 on each point in the image. To do. More specifically, the film thickness distribution estimation unit 12
Illumination light including monochromatic light of multiple wavelengths is irradiated onto the transparent film to be measured, and n or more selected points are selected from the interference image generated by the reflected light on the surface and the back surface of the transparent film The wavelength λ (j) of the wavelength number j is known to the interference luminance signal of the wavelength number j corresponding to the i point among the n selected points, and the average luminance a (j) of the wavelength number j is interferometric modulated. The brightness g (i, j) of the wavelength number j corresponding to the point i with the degree b (j) and the film thickness t (i) of the point i all or part of them as unknown parameters and the rest as known parameters G (i, j) = a (j) [1 + b (j) × cos {4πt (i) / λ (j)}]
By matching the interference fringe model expressed by the following, processing for obtaining an unknown parameter (that is, film thickness estimation calculation processing) is performed.
複数の波長の単色光を含む照明光を測定対象である透明膜に照射し、透明膜の表面の反射光と裏面の反射光により生成される干渉画像から1点以上の選択点をn点選択し、n点の選択点の内のi点に対応する波長番号jの干渉輝度信号に、波長番号jの波長λ(j)を既知とし、波長番号jの平均輝度a(j)、干渉変調度b(j)、および点iの膜厚t(i)のすべて、あるいは、一部を未知パラメータとし、残りを既知パラメータとして、点iに対応する波長番号jの輝度g(i,j)が、次式
g(i,j)=a(j)[1+b(j)×cos{4πt(i)/λ(j)}]
で表される干渉縞モデルを適合することにより、未知パラメータを求める処理(つまり、膜厚推定演算処理)を行う。 Specifically, the film thickness
Illumination light including monochromatic light of multiple wavelengths is irradiated onto the transparent film to be measured, and n or more selected points are selected from the interference image generated by the reflected light on the surface and the back surface of the transparent film The wavelength λ (j) of the wavelength number j is known to the interference luminance signal of the wavelength number j corresponding to the i point among the n selected points, and the average luminance a (j) of the wavelength number j is interferometric modulated. The brightness g (i, j) of the wavelength number j corresponding to the point i with the degree b (j) and the film thickness t (i) of the point i all or part of them as unknown parameters and the rest as known parameters G (i, j) = a (j) [1 + b (j) × cos {4πt (i) / λ (j)}]
By matching the interference fringe model expressed by the following, processing for obtaining an unknown parameter (that is, film thickness estimation calculation processing) is performed.
さらに、干渉画像内の任意の点kに関し、請求項1で得られた、既知の波長番号jの平均輝度a(j)および干渉変調度b(j)と、点kの各波長の輝度g(k,j)とから、点kにおける波長番号jの位相φ(k,j)を、次式
φ(k,j)=cos-1[{g(k,j)/a(j)-1}/b(j)]
により求め、得られた複数の位相から点kの膜厚t(k)を求める処理(いわゆる、ACOS法)を行う。 Further, for an arbitrary point k in the interference image, the average luminance a (j) and the interference modulation degree b (j) of the known wavelength number j obtained inclaim 1 and the luminance g of each wavelength at the point k are obtained. From (k, j), the phase φ (k, j) of the wavelength number j at the point k is expressed by the following equation φ (k, j) = cos −1 [{g (k, j) / a (j) − 1} / b (j)]
And a process (so-called ACOS method) for obtaining the film thickness t (k) at the point k from the obtained plurality of phases.
φ(k,j)=cos-1[{g(k,j)/a(j)-1}/b(j)]
により求め、得られた複数の位相から点kの膜厚t(k)を求める処理(いわゆる、ACOS法)を行う。 Further, for an arbitrary point k in the interference image, the average luminance a (j) and the interference modulation degree b (j) of the known wavelength number j obtained in
And a process (so-called ACOS method) for obtaining the film thickness t (k) at the point k from the obtained plurality of phases.
図4は、膜厚分布推定部12に入力される干渉色画像の一例を示す画像図である。図4には、円板20と鋼球30が静止しているときの干渉色画像が示されている。なお画像図には、本来カラー情報も含まれるが、添付図面としての制約上、白黒の濃淡にて表現したもので代用する(以下同様)。
FIG. 4 is an image diagram illustrating an example of an interference color image input to the film thickness distribution estimation unit 12. FIG. 4 shows an interference color image when the disk 20 and the steel ball 30 are stationary. Although the image diagram originally includes color information, it is substituted with one expressed in black and white shading due to the limitations of the attached drawings (hereinafter the same).
図5は、干渉色画像を三色分離した後の一例を示す画像図である。図5(a)、図5(b)、図5(c)は、カラー干渉色画像を三色分離して、青・緑・赤色の単色画像に変換した後の画像の一例を示す画像図である。具体的には、膜厚分布推定部12では、カラーカメラの青・緑・赤色の各点の輝度値から位相計算処理を行うことで、カラー干渉色画像を三色分離して、青・緑・赤色毎に単色の濃淡画像に変換し、上述のACOS法により位相計算を行い、膜厚候補を算出する。そして各点について、各色の膜厚候補から合致法により推定膜厚を算出(つまり、膜厚推定演算処理)している。
FIG. 5 is an image diagram showing an example after the interference color image is separated into three colors. FIGS. 5A, 5B, and 5C are image diagrams showing an example of an image after the color interference color image is separated into three colors and converted into a single color image of blue, green, and red. It is. Specifically, the film thickness distribution estimation unit 12 separates the color interference color image into three colors by performing phase calculation processing from the luminance values of the blue, green, and red points of the color camera, and the blue / green Convert each red color into a single color gray image, perform phase calculation by the above-mentioned ACOS method, and calculate a film thickness candidate. For each point, the estimated film thickness is calculated from the film thickness candidates for each color by the matching method (that is, the film thickness estimation calculation process).
膜厚最薄部情報記録部13は、基板2と接触個片3の接触部分SPの潤滑剤LBの膜厚分布の中の、膜厚最薄部の位置および膜厚を記録するものである。具体的には、膜厚最薄部情報記録部13は、コンピュータ部9の情報記録部で構成されている。
The thinnest film thickness information recording unit 13 records the position and film thickness of the thinnest film thickness in the film thickness distribution of the lubricant LB at the contact portion SP of the substrate 2 and the contact piece 3. . Specifically, the thinnest film thickness information recording unit 13 is composed of an information recording unit of the computer unit 9.
さらに、本実施形態では、押付荷重測定部65と、トルク測定部14と、トラクション係数算出部15を備えた構成を例示する。
Furthermore, in this embodiment, the structure provided with the pressing load measurement part 65, the torque measurement part 14, and the traction coefficient calculation part 15 is illustrated.
押付荷重測定部65は、円板20に鋼球30を押し付けたときの荷重を測定するものである。具体的には、押付荷重測定部65は、ロードセルとアンプ部(不図示)を備えている。ロードセルは、荷重付与機構6の可動子61とホルダ63との間に配置され、鋼球30を円板20に押し付けたときの荷重により生じるロードセル内のひずみ量を計測し、このひずみ量に対応した信号をアンプ部に出力するものである。アンプ部は、ロードセルから出力された信号が入力されると、ひずみ量を荷重値(または応力値)に変換し、荷重値を表示したり、荷重値に応じた信号やデータをコンピュータ9や後述する押付荷重制御部17などの外部機器に出力するものである。
The pressing load measuring unit 65 measures a load when the steel ball 30 is pressed against the disc 20. Specifically, the pressing load measuring unit 65 includes a load cell and an amplifier unit (not shown). The load cell is disposed between the mover 61 of the load applying mechanism 6 and the holder 63, measures the amount of strain in the load cell caused by the load when the steel ball 30 is pressed against the disk 20, and corresponds to this strain amount. This signal is output to the amplifier unit. When the signal output from the load cell is input, the amplifier unit converts the strain amount into a load value (or stress value), displays the load value, and outputs signals and data corresponding to the load value to the computer 9 or later. Output to an external device such as the pressing load control unit 17.
トルク測定部14は、回転体である鋼球30の回転中の伝達トルクTを測定するものである。具体的には、トルク測定部14は、鋼球30に連結されたシャフト31と、回転体回転機構5のシャフト51との間に配置された、トルクメータ55を備えた構成を例示する。トルクメータ55は、本体部56とシャフト57を備えて構成されており、シャフト57に作用する伝達トルクTを測定するものである。具体的には、シャフト57が回転する際にねじれるため、トルクメータ55は、このねじれにより生じるシャフト57のひずみ量を測定し、シャフト57を伝達する伝達トルクTに変換して出力するものである。シャフト57は、一端がカップリング52を介してシャフト51と、他端がカップリング53を介してシャフト31と連結されており、すべりは生じない。そのため、トルクメータ55は、シャフト57の伝達トルクTを測定することで、回転体である鋼球30の回転中の伝達トルクをT測定することができる。また、トルクメータ55は、測定した伝達トルクTに対応した信号やデータを直接又は他の機器を介してコンピュータ9に出力することができる。
The torque measuring unit 14 measures the transmission torque T during rotation of the steel ball 30 that is a rotating body. Specifically, the torque measuring unit 14 exemplifies a configuration including a torque meter 55 disposed between the shaft 31 connected to the steel ball 30 and the shaft 51 of the rotating body rotating mechanism 5. The torque meter 55 includes a main body portion 56 and a shaft 57, and measures a transmission torque T acting on the shaft 57. Specifically, since the shaft 57 is twisted as it rotates, the torque meter 55 measures the amount of distortion of the shaft 57 caused by this twist, converts it into a transmission torque T that transmits the shaft 57, and outputs it. . One end of the shaft 57 is connected to the shaft 51 via the coupling 52 and the other end is connected to the shaft 31 via the coupling 53, and no slip occurs. Therefore, the torque meter 55 can measure the transmission torque during rotation of the steel ball 30 that is a rotating body by measuring the transmission torque T of the shaft 57. Further, the torque meter 55 can output a signal and data corresponding to the measured transmission torque T to the computer 9 directly or via another device.
トラクション係数算出部15は、トラクション係数μの算出を行うものである。ここで言うトラクション係数μとは、駆動係数とも呼ばれ、円板20と、回転体である鋼球30との間に生じる摩擦の度合いを無次元化して表したものである。具体的には、トラクション係数算出部15は、鋼球30の回転中の伝達トルクT(つまり、トルク測定部14で測定されたシャフト57を伝達する伝達トルク)と、回転体である鋼球30の回転半径RBと、回転体である鋼球30を押し付ける荷重Wbとに基づいて、トラクション係数μを算出する。なお、トラクション係数μを算出する式は、数式(1)で求めることができる。より具体的には、トラクション係数算出部15は、コンピュータ部9の数値演算処理部(ハードウェア)と、その実行プログラム(ソフトウェア)で構成されている。
The traction coefficient calculator 15 calculates the traction coefficient μ. The traction coefficient μ referred to here is also called a drive coefficient, and represents the degree of friction generated between the disk 20 and the steel ball 30 as a rotating body in a non-dimensional manner. Specifically, the traction coefficient calculation unit 15 transmits the transmission torque T during the rotation of the steel ball 30 (that is, the transmission torque transmitted through the shaft 57 measured by the torque measurement unit 14) and the steel ball 30 that is a rotating body. The traction coefficient μ is calculated on the basis of the rotation radius RB and the load Wb for pressing the steel ball 30 as the rotating body. Note that the equation for calculating the traction coefficient μ can be obtained by Equation (1). More specifically, the traction coefficient calculation unit 15 includes a numerical calculation processing unit (hardware) of the computer unit 9 and an execution program (software) thereof.
すべり率制御部16は、移動機構4の移動速度および回転体回転機構5の回転速度のうち少なくとも一方の速度を制御して、基板2と回転体とのすべり率を制御するものである。具体的には、移動機構4の移動速度に相当する円板20の回転速度は、円板20の単位時間あたりの回転数と、円板20の回転中心から鋼球30が接触する場所までの距離から算出する。一方、回転体回転機構5の回転速度は、鋼球30に連結されているシャフト51の単位時間あたりの回転数と、鋼球30の回転中心から鋼球30が接触する場所までの距離(つまり、鋼球の回転半径RB)から算出する。そして、所望のすべり率となるように、円板20の回転速度とシャフト51の回転速度をそれぞれ制御する。このとき、円板20と鋼球30とが同じ速度で回転していればすべり率は0%となり、どちらか一方が静止していればすべり率は100%となる。
The slip ratio control unit 16 controls at least one of the moving speed of the moving mechanism 4 and the rotating speed of the rotating body rotating mechanism 5 to control the slip ratio between the substrate 2 and the rotating body. Specifically, the rotation speed of the disk 20 corresponding to the movement speed of the moving mechanism 4 is the number of rotations per unit time of the disk 20 and the position where the steel ball 30 contacts from the rotation center of the disk 20. Calculate from distance. On the other hand, the rotation speed of the rotating body rotating mechanism 5 is determined by the number of rotations per unit time of the shaft 51 connected to the steel ball 30 and the distance from the rotation center of the steel ball 30 to the place where the steel ball 30 contacts (that is, , From the radius of rotation RB of the steel ball. Then, the rotational speed of the disc 20 and the rotational speed of the shaft 51 are controlled so as to achieve a desired slip rate. At this time, if the disk 20 and the steel ball 30 are rotating at the same speed, the slip rate is 0%, and if either one is stationary, the slip rate is 100%.
押付荷重制御部17は、荷重付与機構5における基板2側に接触個片3を押し付ける押付荷重を制御するものである。具体的には、押付荷重制御部17は、押付荷重測定部65から荷重値や応力値に対応した信号を入力し、予め設定しておいた基準値と比較し、荷重付与機構6のアクチュエータ60を制御して、円板20に鋼球30を押し付ける荷重を制御するものである。より具体的には、押付荷重制御部17は、専用のコントロールユニットで構成され、コンピュータ部9から押付荷重の基準値を入力したり、コンピュータ部9に押付荷重の現在値を出力したりすることができる。そのため、押付荷重を自動制御して、膜厚分布測定の時間中、一定の荷重を付与し続けることができる。
The pressing load control unit 17 controls the pressing load that presses the contact piece 3 against the substrate 2 side in the load applying mechanism 5. Specifically, the pressing load control unit 17 inputs a signal corresponding to a load value or a stress value from the pressing load measurement unit 65, compares it with a preset reference value, and compares the actuator 60 of the load applying mechanism 6 with the actuator 60. To control the load that presses the steel ball 30 against the disk 20. More specifically, the pressing load control unit 17 is configured by a dedicated control unit, and inputs a reference value of the pressing load from the computer unit 9 or outputs a current value of the pressing load to the computer unit 9. Can do. Therefore, the pressing load can be automatically controlled, and a constant load can be continuously applied during the film thickness distribution measurement time.
表示部10は、インフォメーションディスプレイ、表示モニタとも呼ばれ、コンピュータ部9から出力された映像信号が入力されると、映像信号に対応して文字や図形情報などが表示されるものである。具体的には、表示部10は、
1)画像記録部11に記録された干渉色画像のうち、選択された干渉色画像
2)膜厚分布推定部12で推定された潤滑剤LBの膜厚分布を二次元分布で表した画像
3)膜厚分布推定部12で推定された潤滑剤LBの膜厚分布を三次元的に表した画像
のうち、少なくともいずれか1つの画像を表示すると共に、
4)膜厚最薄部情報記録部13に記録された膜厚最薄部の位置情報および膜厚情報も併せて表示(つまり、一度に表示)するものである。 Thedisplay unit 10 is also called an information display or a display monitor. When a video signal output from the computer unit 9 is input, characters, graphic information, and the like are displayed corresponding to the video signal. Specifically, the display unit 10
1) The interference color image selected from the interference color images recorded in theimage recording unit 11 2) The image showing the film thickness distribution of the lubricant LB estimated by the film thickness distribution estimation unit 12 as a two-dimensional distribution 3 ) While displaying at least one of the three-dimensional images of the film thickness distribution of the lubricant LB estimated by the film thickness distribution estimation unit 12,
4) The position information and film thickness information of the thinnest film thickness recorded in the thinnest film thicknessinformation recording unit 13 are also displayed together (that is, displayed at once).
1)画像記録部11に記録された干渉色画像のうち、選択された干渉色画像
2)膜厚分布推定部12で推定された潤滑剤LBの膜厚分布を二次元分布で表した画像
3)膜厚分布推定部12で推定された潤滑剤LBの膜厚分布を三次元的に表した画像
のうち、少なくともいずれか1つの画像を表示すると共に、
4)膜厚最薄部情報記録部13に記録された膜厚最薄部の位置情報および膜厚情報も併せて表示(つまり、一度に表示)するものである。 The
1) The interference color image selected from the interference color images recorded in the
4) The position information and film thickness information of the thinnest film thickness recorded in the thinnest film thickness
図6は、干渉色画像の一例を示した画像の一例を示す画像図である。
FIG. 6 is an image diagram showing an example of an image showing an example of an interference color image.
図7は、膜厚分布の測定結果を二次元分布で表した画像の一例を示す画像図である。
FIG. 7 is an image diagram showing an example of an image representing the measurement result of the film thickness distribution in a two-dimensional distribution.
図8は、膜厚分布の測定結果を三次元的に表した画像の一例を示す画像図である。
FIG. 8 is an image diagram showing an example of an image that three-dimensionally represents the measurement result of the film thickness distribution.
図9は、X方向およびY方向の膜厚分布の測定結果プロファイル並びに膜厚最薄部の位置情報および膜厚情報の一例を示す画像図である。
FIG. 9 is an image diagram showing an example of the measurement result profile of the film thickness distribution in the X direction and the Y direction, the position information of the thinnest film thickness, and the film thickness information.
本発明に係る膜厚分布測定装置1は、この様な構成をしているため、基板2と接触個片3(上述では、円板20と回転体である鋼球30を例示)との相対速度の変動の有無に関わらず、幅広いレンジで、EHL状態の物質同士の接触部分SPを潤滑する潤滑剤LBの膜厚分布測定ができる。このとき、光源部7から赤色・緑色・青色の3種類の波長を含んだ光を照射することで、潤滑剤LBの膜厚が4μmないし8μm程度の幅広い膜厚レンジで、膜厚分布を測定することができる。
Since the film thickness distribution measuring apparatus 1 according to the present invention has such a configuration, the relative relationship between the substrate 2 and the contact piece 3 (in the above example, the disk 20 and the steel ball 30 which is a rotating body is illustrated). Regardless of the speed fluctuation, the film thickness distribution of the lubricant LB that lubricates the contact portion SP between the substances in the EHL state can be measured in a wide range. At this time, the film thickness distribution is measured in a wide film thickness range of about 4 μm to 8 μm by irradiating light including three wavelengths of red, green, and blue from the light source unit 7. can do.
[別の形態]
また、本発明を具現化する上で膜厚分布測定装置は、上述の構成に限らず、以下に例示するような形態であっても良い。 [Another form]
Further, in realizing the present invention, the film thickness distribution measuring apparatus is not limited to the above-described configuration, and may be in the form exemplified below.
また、本発明を具現化する上で膜厚分布測定装置は、上述の構成に限らず、以下に例示するような形態であっても良い。 [Another form]
Further, in realizing the present invention, the film thickness distribution measuring apparatus is not limited to the above-described configuration, and may be in the form exemplified below.
例えば、上述の表示部10は、必要に応じて円板20の回転数、回転体である鋼球30の回転数、押付荷重、回転トルク、トラクション係数、すべり率などを表示させても良い。また、作業者がコンピュータ部9の情報入力デバイスを操作して、画像記録部11から任意の時刻における干渉色画像を読み出し、その干渉色画像を表示部10に表示させても良い。さらに、膜厚分布測定装置1は、この干渉色画像に対する膜厚分布の測定結果やその他の情報を併せて、表示部10に表示させても良い。
For example, the display unit 10 described above may display the number of rotations of the disc 20, the number of rotations of the steel ball 30 as a rotating body, pressing load, rotational torque, traction coefficient, slip rate, and the like as necessary. Alternatively, the operator may operate the information input device of the computer unit 9 to read an interference color image at an arbitrary time from the image recording unit 11 and display the interference color image on the display unit 10. Furthermore, the film thickness distribution measuring apparatus 1 may display the film thickness distribution measurement result for the interference color image and other information on the display unit 10 together.
[潤滑剤の温度計測]
本発明に係る膜厚分布測定装置は、上述の構成に加え、温度測定部18と温度記録部19を備えた構成としても良い。 [Lubricant temperature measurement]
The film thickness distribution measuring apparatus according to the present invention may include atemperature measurement unit 18 and a temperature recording unit 19 in addition to the above-described configuration.
本発明に係る膜厚分布測定装置は、上述の構成に加え、温度測定部18と温度記録部19を備えた構成としても良い。 [Lubricant temperature measurement]
The film thickness distribution measuring apparatus according to the present invention may include a
温度測定部18は、基板2と接触個片3の接触部分SPの温度を測定するものである。具体的には、温度測定部18は、円板20と鋼球30との接触部分SPを潤滑する潤滑剤LBの温度を、円板20の斜め上方から円板20越しに非接触で測定するものである。より具体的には、温度測定部18は、赤外線式の温度センサを備え、測定した温度を表示したり、測定した温度に対応する信号やデータを外部へ出力したりする機能を備えている。
The temperature measuring unit 18 measures the temperature of the contact portion SP between the substrate 2 and the contact piece 3. Specifically, the temperature measurement unit 18 measures the temperature of the lubricant LB that lubricates the contact portion SP between the disk 20 and the steel ball 30 from the upper side of the disk 20 through the disk 20 in a non-contact manner. Is. More specifically, the temperature measurement unit 18 includes an infrared temperature sensor, and has a function of displaying the measured temperature and outputting a signal and data corresponding to the measured temperature to the outside.
温度記録部19は、温度測定部18から出力された信号やデータを入力し、その都度、温度を記録するものである。具体的には、温度記録部19は、コンピュータ部9の一部として又はデータロガーなどの独立した機器で構成され、予め設定された間隔で温度を記録したり、外部からのトリガ信号に基づいて適宜温度を記録することができる。また、温度記録部19は、温度を記録する際に、必要に応じて日付や時刻も記録することができる。
The temperature recording unit 19 inputs signals and data output from the temperature measuring unit 18 and records the temperature each time. Specifically, the temperature recording unit 19 is configured as a part of the computer unit 9 or an independent device such as a data logger, and records the temperature at a preset interval or based on an external trigger signal. The temperature can be recorded as appropriate. The temperature recording unit 19 can also record the date and time as necessary when recording the temperature.
このような温度測定部18と温度記録部を備えることで、膜厚分布測定の時間中、接触部分SPの温度を測定・記録することができ、膜厚に関する情報と共に後から参照して、EHL状態の挙動解析に役立てることができる。
By providing such a temperature measuring unit 18 and a temperature recording unit, the temperature of the contact portion SP can be measured and recorded during the film thickness distribution measurement time. It can be used for analyzing the behavior of the state.
なお、温度測定部18は、上述のような赤外線式の温度センサを用いて円板20越しに非接触で温度を測定する構成に限らず、円板20の下方に配置した熱電対プローブなどにより鋼球30の温度や潤滑剤LBの温度を直接測定する構成であっても良い。
The temperature measurement unit 18 is not limited to the configuration in which the temperature is measured in a non-contact manner through the disk 20 using the infrared temperature sensor as described above, but by a thermocouple probe or the like disposed below the disk 20. The structure which directly measures the temperature of the steel ball 30 or the temperature of the lubricant LB may be used.
[基板の変形例]
また上述では、基板2は、平坦なガラスの円板20であって、その下面にクロムなどの金属薄膜21と酸化シリコンなどの透明膜22が成膜されており、接触個片3との接触部分SPが平坦な面である例を示した。しかし、基板2の接触部分の形状は、このような形状に限らず、湾曲面で構成したり、平面または湾曲面に溝部が形成されたものでも良い。この接触部分の形状は、潤滑剤LBの膜厚分布を測定したいベアリングや摺動する物体などの形状を再現したりモデル化した形状とすれば良い。また、基板2の材料は、ガラスに限らず、サファイヤやシリコン、樹脂など、他の材料でも良い。 [Modification of substrate]
Further, in the above description, thesubstrate 2 is a flat glass disk 20, and a metal thin film 21 such as chromium and a transparent film 22 such as silicon oxide are formed on the lower surface thereof, and contact with the contact piece 3. An example in which the portion SP is a flat surface is shown. However, the shape of the contact portion of the substrate 2 is not limited to such a shape, and may be a curved surface, or may be a flat surface or a groove formed on the curved surface. The shape of the contact portion may be a shape that reproduces or models the shape of a bearing or a sliding object for which the film thickness distribution of the lubricant LB is to be measured. The material of the substrate 2 is not limited to glass, but may be other materials such as sapphire, silicon, and resin.
また上述では、基板2は、平坦なガラスの円板20であって、その下面にクロムなどの金属薄膜21と酸化シリコンなどの透明膜22が成膜されており、接触個片3との接触部分SPが平坦な面である例を示した。しかし、基板2の接触部分の形状は、このような形状に限らず、湾曲面で構成したり、平面または湾曲面に溝部が形成されたものでも良い。この接触部分の形状は、潤滑剤LBの膜厚分布を測定したいベアリングや摺動する物体などの形状を再現したりモデル化した形状とすれば良い。また、基板2の材料は、ガラスに限らず、サファイヤやシリコン、樹脂など、他の材料でも良い。 [Modification of substrate]
Further, in the above description, the
また、基板2の下面の金属薄膜21は、上述したクロムに限らず、アルミや銅、銀、金などの薄膜を成膜(コーティングとも言う)したものでも良い。なお、本発明を実施する上で、金属薄膜21は、干渉色画像を取得するためのいわゆる表面反射光を発生させるためのものである。そのため、基板2と潤滑剤LBとの界面から反射光が得られれば、金属薄膜21は成膜されていなくても良い。
Further, the metal thin film 21 on the lower surface of the substrate 2 is not limited to the above-described chromium, but may be a film (also referred to as coating) formed of a thin film such as aluminum, copper, silver, or gold. In carrying out the present invention, the metal thin film 21 is for generating so-called surface reflected light for obtaining an interference color image. Therefore, the metal thin film 21 may not be formed as long as reflected light is obtained from the interface between the substrate 2 and the lubricant LB.
また、基板2の下面の透明膜22は、上述した酸化シリコンに限らず、潤滑剤LBの屈折率に近い透明な材料を成膜したものでも良い。なお、透明膜22は、潤滑剤LBの膜厚が薄い場合であっても、測定分解能を高めるために見かけ上の膜厚が厚く測定されるようにし、後に透明膜22の膜厚分を差し引くといった処理を行うためのものである。そのため、潤滑剤LBの厚みが所望の測定分解能を得られる場合であれば、基板2の下面の透明膜22は成膜されていなくても良い。
The transparent film 22 on the lower surface of the substrate 2 is not limited to the above-described silicon oxide, and may be a film formed of a transparent material close to the refractive index of the lubricant LB. In addition, even if the film thickness of the lubricant LB is thin, the transparent film 22 is measured so that the apparent film thickness is thick in order to increase the measurement resolution, and the film thickness of the transparent film 22 is subtracted later. It is for performing such processing. Therefore, the transparent film 22 on the lower surface of the substrate 2 may not be formed if the thickness of the lubricant LB can provide a desired measurement resolution.
[接触個片の変形例]
また上述では、接触個片3は、ボールベアリング内の接触部分を再現するために回転体の一類型である鋼球30である例を示した。しかし、接触個片3は、回転体として鋼鉄製の球体に限定されず、他の材料(例えば、アルミやセラミック、樹脂など)でも良く、他の形状(例えば、円柱や円錐など)であっても良い。さらに、接触個片3は、回転体のみならず、平板個片35などの摺動物体(つまり、非回転の物体)で構成しても良い。そして、平板個片35は、鋼鉄、アルミ、セラミック、樹脂など、任意の材料から適宜選定し得る。 [Modification of contact piece]
In the above description, thecontact piece 3 is an example of a steel ball 30 that is a type of rotating body in order to reproduce the contact portion in the ball bearing. However, the contact piece 3 is not limited to a steel sphere as a rotating body, and may be other materials (for example, aluminum, ceramic, resin, etc.), and have other shapes (for example, a cylinder, a cone, etc.). Also good. Further, the contact piece 3 may be constituted not only by a rotating body but also by a sliding object such as a flat plate piece 35 (that is, a non-rotating object). And the flat piece 35 can be suitably selected from arbitrary materials, such as steel, aluminum, a ceramic, and resin.
また上述では、接触個片3は、ボールベアリング内の接触部分を再現するために回転体の一類型である鋼球30である例を示した。しかし、接触個片3は、回転体として鋼鉄製の球体に限定されず、他の材料(例えば、アルミやセラミック、樹脂など)でも良く、他の形状(例えば、円柱や円錐など)であっても良い。さらに、接触個片3は、回転体のみならず、平板個片35などの摺動物体(つまり、非回転の物体)で構成しても良い。そして、平板個片35は、鋼鉄、アルミ、セラミック、樹脂など、任意の材料から適宜選定し得る。 [Modification of contact piece]
In the above description, the
[移動機構の変形例]
また上述では、移動機構4は、回転モータ40の回転軸を中心として、円板20を回転させる構成を例示した。しかし、本発明に係る移動機構としては、直線軌道に沿って往復動作をするアクチュエータを備えて、円板20または非円形の基板(例えば、矩形や六角形、八角形など)を往復動作させる構成であっても良い。 [Modification of moving mechanism]
In the above description, the movingmechanism 4 has exemplified the configuration for rotating the disk 20 around the rotation axis of the rotary motor 40. However, the moving mechanism according to the present invention includes an actuator that reciprocates along a straight track, and reciprocates the disk 20 or a non-circular substrate (for example, a rectangle, hexagon, octagon, etc.). It may be.
また上述では、移動機構4は、回転モータ40の回転軸を中心として、円板20を回転させる構成を例示した。しかし、本発明に係る移動機構としては、直線軌道に沿って往復動作をするアクチュエータを備えて、円板20または非円形の基板(例えば、矩形や六角形、八角形など)を往復動作させる構成であっても良い。 [Modification of moving mechanism]
In the above description, the moving
[別の形態]
また上述では、接触個片3として回転体の一類型である鋼球30を備え、さらに回転体回転機構5を用いた例を示した。しかし、回転体回転機構5は、本発明を具現化する上で必須の構成要素ではなく、これを省いた構成であっても良い。そのため、回転体回転機構5を省いた構成においては、上述のトルク測定部55、トラクション係数算出部15、すべり率制御部16は不要なため、これらを省いた構成とする。 [Another form]
In the above description, an example in which thecontact piece 3 is provided with the steel ball 30 which is a type of the rotating body and the rotating body rotating mechanism 5 is used is shown. However, the rotating body rotating mechanism 5 is not an essential component for embodying the present invention, and may be configured without this. Therefore, in the configuration in which the rotating body rotating mechanism 5 is omitted, the torque measuring unit 55, the traction coefficient calculating unit 15, and the slip rate control unit 16 described above are unnecessary, and thus are omitted.
また上述では、接触個片3として回転体の一類型である鋼球30を備え、さらに回転体回転機構5を用いた例を示した。しかし、回転体回転機構5は、本発明を具現化する上で必須の構成要素ではなく、これを省いた構成であっても良い。そのため、回転体回転機構5を省いた構成においては、上述のトルク測定部55、トラクション係数算出部15、すべり率制御部16は不要なため、これらを省いた構成とする。 [Another form]
In the above description, an example in which the
[別の形態]
また上述では、移動機構4の移動速度および回転体回転機構5の回転速度のうち少なくとも一方の速度を制御して、基板2と回転体である鋼球30とのすべり率を制御するすべり率制御部16を備えた構成を例示した。この構成によれば、任意のすべり率の状態に設定して、潤滑剤LBの膜厚分布を測定することが可能となる。 [Another form]
Further, in the above description, the slip ratio control for controlling the slip ratio between thesubstrate 2 and the steel ball 30 as the rotating body by controlling at least one of the moving speed of the moving mechanism 4 and the rotating speed of the rotating body rotating mechanism 5. The structure provided with the part 16 was illustrated. According to this configuration, it is possible to measure the film thickness distribution of the lubricant LB by setting an arbitrary slip rate.
また上述では、移動機構4の移動速度および回転体回転機構5の回転速度のうち少なくとも一方の速度を制御して、基板2と回転体である鋼球30とのすべり率を制御するすべり率制御部16を備えた構成を例示した。この構成によれば、任意のすべり率の状態に設定して、潤滑剤LBの膜厚分布を測定することが可能となる。 [Another form]
Further, in the above description, the slip ratio control for controlling the slip ratio between the
しかし、すべり率制御部16は、本発明を具現化する上で必須の構成要素ではなく、これを省いた構成としても良い。この場合、基板2を一定の速度で回転させつつ、
1)鋼球30を一定速度で回転させる
2)鋼球30を、基板2の回転に合わせて受動的に回転させる
3)鋼球30を静止させる
のいずれかに設定したり、手動にて切り換えて設定したりすることができる。 However, the slipratio control unit 16 is not an essential component for embodying the present invention, and may be configured without this. In this case, while rotating the substrate 2 at a constant speed,
1) Thesteel ball 30 is rotated at a constant speed. 2) The steel ball 30 is passively rotated in accordance with the rotation of the substrate 2. 3) The steel ball 30 is set to be stationary or switched manually. Can be set.
1)鋼球30を一定速度で回転させる
2)鋼球30を、基板2の回転に合わせて受動的に回転させる
3)鋼球30を静止させる
のいずれかに設定したり、手動にて切り換えて設定したりすることができる。 However, the slip
1) The
[別の形態]
また上述では、接触個片3を基板2に押し付ける荷重を調節するためのアクチュエータ60と、押付荷重を制御するための押付荷重制御部17を備えた構成(いわゆる、自動制御方式)を例示した。しかし、押付荷重制御部17は、上述のような専用のコントロールユニットではなく、コンピュータ部9の一部に組み込んだ構成としても良い。 [Another form]
In the above description, the configuration (so-called automatic control method) including theactuator 60 for adjusting the load for pressing the contact piece 3 against the substrate 2 and the pressing load control unit 17 for controlling the pressing load is illustrated. However, the pressing load control unit 17 may be configured to be incorporated in a part of the computer unit 9 instead of the dedicated control unit as described above.
また上述では、接触個片3を基板2に押し付ける荷重を調節するためのアクチュエータ60と、押付荷重を制御するための押付荷重制御部17を備えた構成(いわゆる、自動制御方式)を例示した。しかし、押付荷重制御部17は、上述のような専用のコントロールユニットではなく、コンピュータ部9の一部に組み込んだ構成としても良い。 [Another form]
In the above description, the configuration (so-called automatic control method) including the
また、押付荷重制御部17は、本発明を具現化する上で必須の構成要素ではなく、これを省き、自動制御方式ではなく、バネやゴムなどの弾性体を用いつつ、外部信号により位置変更ができるアクチュエータ60を備えた構成(いわゆる、半自動操作方式)であっても良い。或いは、アクチュエータ60も省き、接触個片3を、シム調節や固定ネジの位置調節や回転調節などによりz方向に位置調節し、押付荷重を変更する構成(いわゆる、手動調節方式)としても良い。
In addition, the pressing load control unit 17 is not an essential component for embodying the present invention, and is omitted. The position is changed by an external signal while using an elastic body such as a spring or rubber instead of an automatic control system. A configuration (so-called semi-automatic operation method) including an actuator 60 that can perform the above-described operation may be used. Alternatively, the actuator 60 may be omitted, and the contact piece 3 may be adjusted in the z direction by shim adjustment, fixing screw position adjustment, rotation adjustment, or the like to change the pressing load (so-called manual adjustment method).
[別の形態]
上述では、コンピュータ部9に、基板2と接触個片3の接触部分SPの潤滑剤LBの膜厚分布の中の膜厚最薄部の位置および膜厚を記録する膜厚最薄部情報記録部13を備えた構成を例示した。しかし、膜厚最薄部情報記録部13は、本発明を具現化する上で必須の構成要素ではなく、これを省いた構成であっても良い。 [Another form]
In the above description, the thinnest film thickness information recording for recording the position and film thickness of the thinnest film thickness in the film thickness distribution of the lubricant LB at the contact portion SP of thecontact piece 3 with the substrate 2 is performed. The structure provided with the part 13 was illustrated. However, the thinnest film thickness information recording unit 13 is not an essential component for embodying the present invention, and may have a configuration in which this is omitted.
上述では、コンピュータ部9に、基板2と接触個片3の接触部分SPの潤滑剤LBの膜厚分布の中の膜厚最薄部の位置および膜厚を記録する膜厚最薄部情報記録部13を備えた構成を例示した。しかし、膜厚最薄部情報記録部13は、本発明を具現化する上で必須の構成要素ではなく、これを省いた構成であっても良い。 [Another form]
In the above description, the thinnest film thickness information recording for recording the position and film thickness of the thinnest film thickness in the film thickness distribution of the lubricant LB at the contact portion SP of the
[別の形態]
また上述では、膜厚分布測定装置1に表示部10を備えた構成を例示した。しかし、表示部10は、本発明を具現化する上で必須の構成要素ではなく、これを省いた構成としても良い。また、本発明に係る膜厚分布測定装置は、表示部10を備える/備えないに関わらず、外部の装置や機器に、膜厚分布を測定した結果が含まれたデータを出力する構成としても良い。 [Another form]
Moreover, in the above, the structure provided with thedisplay part 10 in the film thickness distribution measuring apparatus 1 was illustrated. However, the display unit 10 is not an essential component for embodying the present invention, and may be configured without this. Moreover, the film thickness distribution measuring apparatus according to the present invention may be configured to output data including the result of measuring the film thickness distribution to an external apparatus or device regardless of whether or not the display unit 10 is provided. good.
また上述では、膜厚分布測定装置1に表示部10を備えた構成を例示した。しかし、表示部10は、本発明を具現化する上で必須の構成要素ではなく、これを省いた構成としても良い。また、本発明に係る膜厚分布測定装置は、表示部10を備える/備えないに関わらず、外部の装置や機器に、膜厚分布を測定した結果が含まれたデータを出力する構成としても良い。 [Another form]
Moreover, in the above, the structure provided with the
[光源部の変形例]
また、光源部7を構成する白色ランプ70は、上述のハロゲンランプに限らず、メタルハライドランプ、キセノンランプ、水銀ランプ、白色LEDなどで構成しても良い。 [Modification of light source section]
Thewhite lamp 70 constituting the light source unit 7 is not limited to the halogen lamp described above, and may be a metal halide lamp, a xenon lamp, a mercury lamp, a white LED, or the like.
また、光源部7を構成する白色ランプ70は、上述のハロゲンランプに限らず、メタルハライドランプ、キセノンランプ、水銀ランプ、白色LEDなどで構成しても良い。 [Modification of light source section]
The
また、光源部7を構成する3波長帯域フィルタ73は、上述のような白色ランプ70とハーフミラー82の間に配置された構成に限らず、対物レンズ83と基板2の間、ハーフミラー82と結像レンズ84の間、結像レンズ84と撮像カメラ80の間などに配置した構成としても良い。
The three-wavelength band filter 73 constituting the light source unit 7 is not limited to the configuration disposed between the white lamp 70 and the half mirror 82 as described above, but between the objective lens 83 and the substrate 2, the half mirror 82, and the like. A configuration in which the lens is disposed between the imaging lens 84 or between the imaging lens 84 and the imaging camera 80 may be employed.
また光源部7は、上述のような白色ランプ70と、反射板71と、3波長帯域フィルタ73を備えた構成に限らず、赤色に発光するLEDと、緑色に発光するLEDと、青色に発光するLEDとを備えた発光ユニットを備えた構成としても良い。この場合、各色のLEDは、1個ずつないし複数備えた構成とし、照明用電源は、各LEDに所定の直流電圧と電流を供給する構成としておく。或いは、各色で発光するLEDに代えて、各色で発光するレーザダイオードまたは3波長が同時発光するレーザダイオードと、そのレーザダイオードを駆動させる電源を備えた構成としても良い。
The light source unit 7 is not limited to the configuration including the white lamp 70, the reflection plate 71, and the three-wavelength band filter 73 as described above, but the LED that emits red light, the LED that emits green light, and the light that emits blue light. It is good also as a structure provided with the light emission unit provided with LED to perform. In this case, one or more LEDs of each color are provided, and the illumination power supply is configured to supply a predetermined DC voltage and current to each LED. Alternatively, instead of the LED that emits light of each color, a laser diode that emits light of each color or a laser diode that emits light of three wavelengths simultaneously and a power source that drives the laser diode may be provided.
また上述では、光源部7として、青色:470nm、緑色:560nm、赤色:600nmの3種類の波長の光を照射する構成を例示した。しかし、本発明に係る光源部は、このような構成に限定されず、一部又は全部を他の波長の光に代えた構成としても良い。この場合、光源部から照射される他の波長の光としては、近赤外線の光、橙色の光、青緑色の光などが例示できる。また、光源部7から照射される光の波長は、全部で4種類としても良いし、それ以上の種類としても良い。
Also, in the above description, the light source unit 7 is exemplified by a configuration that irradiates light of three types of wavelengths of blue: 470 nm, green: 560 nm, and red: 600 nm. However, the light source unit according to the present invention is not limited to such a configuration, and a part or all of the light source unit may be replaced with light of other wavelengths. In this case, examples of light of other wavelengths emitted from the light source unit include near infrared light, orange light, and blue-green light. Further, the wavelengths of light emitted from the light source unit 7 may be four types in total, or may be more types.
1 膜厚分布測定装置
2 基板
2d 矢印(基板の移動方向,円板の回転方向)
3 接触個片
3d 矢印(接触個片の移動方向,回転体の回転方向)
4 移動機構
5 回転体回転機構
6 荷重付与機構
7 光源部
8 干渉色撮像部
9 コンピュータ部
10 表示部
11 画像記録部
12 膜厚分布推定部
13 膜厚最薄部情報記録部
14 トルク測定部
15 トラクション係数算出部
16 すべり率制御部
17 押付荷重制御部
18 温度測定部
19 温度記録部
20 円板(基板の一類型)
21 金属薄膜
22 透明膜
30 鋼球(接触個片/回転体の一類型)
31 シャフト
40 回転モータ
41 連結部材
50 回転モータ
51 シャフト
55 トルク測定部
56 本体部
57 シャフト
60 アクチュエータ
61 可動子
63 軸受部
65 押付荷重測定部(ロードセル)
70 白色ランプ
75 照明用電源
80 撮像カメラ
81 レンズユニット
82 ハーフミラー
83 対物レンズ
84 結像レンズ
85 カラーフィルタ
86 撮像素子
LB 潤滑剤
SP 基板と鋼球の接触部分
RB 鋼球の回転半径
R 膜厚の測定対象領域
L1 光源部から照射された光
L2 膜厚の測定対象領域に照射された光
L3 膜厚の測定対象領域から反射された光(干渉光)
L4 ハーフミラーを通過した光(撮像される干渉光)
μ トラクション係数(摩擦係数)
T 伝達トルク
Wb 押付荷重 1 Thicknessdistribution measuring device 2 Substrate 2d Arrow (substrate movement direction, disc rotation direction)
3Contact piece 3d Arrow (movement direction of contact piece, rotation direction of rotating body)
DESCRIPTION OFSYMBOLS 4 Movement mechanism 5 Rotating body rotation mechanism 6 Load application mechanism 7 Light source part 8 Interference color imaging part 9 Computer part 10 Display part 11 Image recording part 12 Film thickness distribution estimation part 13 Thinnest film thickness information recording part 14 Torque measurement part 15 Traction coefficient calculation unit 16 Slip rate control unit 17 Push load control unit 18 Temperature measurement unit 19 Temperature recording unit 20 Disc (one type of substrate)
21 Metalthin film 22 Transparent film 30 Steel ball (contact piece / one type of rotating body)
31Shaft 40 Rotating motor 41 Connecting member 50 Rotating motor 51 Shaft 55 Torque measuring section 56 Main body section 57 Shaft 60 Actuator 61 Movable element 63 Bearing section 65 Pushing load measuring section (load cell)
70White lamp 75 Illumination power supply 80 Imaging camera 81 Lens unit 82 Half mirror 83 Objective lens 84 Imaging lens 85 Color filter 86 Image sensor LB Lubricant SP Contact portion of substrate and steel ball RB Turning radius of steel ball R Thickness of film thickness Measurement target region L1 Light irradiated from the light source unit L2 Light irradiated on the measurement target region of film thickness L3 Light reflected from the measurement target region of film thickness (interference light)
Light that passed through the L4 half mirror (interference light to be imaged)
μ Traction coefficient (friction coefficient)
T Transmission torque Wb Pressing load
2 基板
2d 矢印(基板の移動方向,円板の回転方向)
3 接触個片
3d 矢印(接触個片の移動方向,回転体の回転方向)
4 移動機構
5 回転体回転機構
6 荷重付与機構
7 光源部
8 干渉色撮像部
9 コンピュータ部
10 表示部
11 画像記録部
12 膜厚分布推定部
13 膜厚最薄部情報記録部
14 トルク測定部
15 トラクション係数算出部
16 すべり率制御部
17 押付荷重制御部
18 温度測定部
19 温度記録部
20 円板(基板の一類型)
21 金属薄膜
22 透明膜
30 鋼球(接触個片/回転体の一類型)
31 シャフト
40 回転モータ
41 連結部材
50 回転モータ
51 シャフト
55 トルク測定部
56 本体部
57 シャフト
60 アクチュエータ
61 可動子
63 軸受部
65 押付荷重測定部(ロードセル)
70 白色ランプ
75 照明用電源
80 撮像カメラ
81 レンズユニット
82 ハーフミラー
83 対物レンズ
84 結像レンズ
85 カラーフィルタ
86 撮像素子
LB 潤滑剤
SP 基板と鋼球の接触部分
RB 鋼球の回転半径
R 膜厚の測定対象領域
L1 光源部から照射された光
L2 膜厚の測定対象領域に照射された光
L3 膜厚の測定対象領域から反射された光(干渉光)
L4 ハーフミラーを通過した光(撮像される干渉光)
μ トラクション係数(摩擦係数)
T 伝達トルク
Wb 押付荷重 1 Thickness
3
DESCRIPTION OF
21 Metal
31
70
Light that passed through the L4 half mirror (interference light to be imaged)
μ Traction coefficient (friction coefficient)
T Transmission torque Wb Pressing load
Claims (8)
- EHL状態の物体同士の接触部分を潤滑する潤滑剤の膜厚分布を測定する膜厚分布測定装置であって、
光透過性を備えた基板と、
前記基板に前記潤滑剤を介して接触する接触個片と、
前記基板と前記接触個片を相対移動させる移動機構と、
前記基板側に前記接触個片を押し付けて荷重を付与する荷重付与機構と、
前記基板と前記接触個片の接触部分に向けて少なくとも3種類の波長の光を照射する光源部と、
前記基板と前記接触個片の接触部分から反射された光を、前記基板越しに画像を撮像し、カラーの干渉縞を干渉色画像として取得する干渉色撮像部と、
コンピュータ部を備え、
前記コンピュータ部には、
前記干渉色撮像部で撮像された干渉色画像を記録する画像記録部と、
前記画像記録部に記録された前記干渉色画像のうち、選択された干渉色画像に含まれる各点の色情報から前記少なくとも3種類の波長の光毎に色分離して輝度値を算出し、当該輝度値から前記波長毎の位相を算出し、当該波長毎の位相から複数の膜厚候補を算出し、当該算出された複数の膜厚候補から前記基板と前記接触個片の接触部分の潤滑剤の膜厚分布を推定する膜厚分布推定部を備えた、膜厚分布測定装置。 A film thickness distribution measuring apparatus for measuring a film thickness distribution of a lubricant that lubricates a contact portion between objects in an EHL state,
A substrate with optical transparency;
A contact piece that contacts the substrate via the lubricant;
A moving mechanism for relatively moving the substrate and the contact piece;
A load applying mechanism for applying a load by pressing the contact piece on the substrate side;
A light source unit that emits light of at least three types of wavelengths toward the contact portion of the substrate and the contact piece;
An interference color imaging unit that captures an image of the light reflected from the contact portion of the substrate and the contact piece through the substrate and acquires a color interference fringe as an interference color image;
It has a computer part,
In the computer part,
An image recording unit that records an interference color image captured by the interference color imaging unit;
Of the interference color images recorded in the image recording unit, color separation is performed for each light of the at least three wavelengths from the color information of each point included in the selected interference color image, and a luminance value is calculated. The phase for each wavelength is calculated from the luminance value, a plurality of film thickness candidates are calculated from the phase for each wavelength, and the contact portion between the substrate and the contact piece is lubricated from the calculated plurality of film thickness candidates. A film thickness distribution measuring apparatus comprising a film thickness distribution estimating unit for estimating the film thickness distribution of the agent. - コンピュータ部には、前記基板と前記接触個片の接触部分の潤滑剤の膜厚分布の中の膜厚最薄部の位置および膜厚を記録する膜厚最薄部情報記録部を備えた
ことを特徴とする、請求項1に記載の膜厚分布測定装置。 The computer unit includes a thinnest film thickness information recording unit for recording the position and film thickness of the thinnest film thickness in the lubricant film thickness distribution at the contact portion between the substrate and the contact piece. The film thickness distribution measuring apparatus according to claim 1, wherein: - 前記選択された干渉色画像、前記膜厚分布推定部で推定された前記潤滑剤の膜厚分布を二次元分布で表した画像及び三次元的に表した画像のうち、少なくともいずれか1つの画像、並びに、前記膜厚最薄部情報記録部に記録された膜厚最薄部の位置情報および膜厚情報を、一度に表示する表示部を備えた
ことを特徴とする、請求項2に記載の膜厚分布測定装置。 At least one of the selected interference color image, an image representing the film thickness distribution of the lubricant estimated by the film thickness distribution estimation unit in a two-dimensional distribution, and an image represented in a three-dimensional manner And a display unit for displaying the position information and the film thickness information of the thinnest film thickness recorded in the thinnest film thickness information recording unit at a time. Film thickness distribution measuring device. - 前記接触個片は、前記基板に前記潤滑剤を介して接触しながら回転する回転体であり、
前記回転体を回転させる回転体回転機構を備えた
えたことを特徴とする、請求項1~3のいずれかに記載の膜厚分布測定装置。 The contact piece is a rotating body that rotates while contacting the substrate via the lubricant,
The film thickness distribution measuring apparatus according to any one of claims 1 to 3, further comprising a rotating body rotating mechanism for rotating the rotating body. - 前記基板に前記接触個片を押し付ける押付荷重を測定する押付荷重測定部と、
前記回転体と前記回転体回転機構との間に配置されて、前記回転体の回転中の伝達トルクを測定するトルク測定部と、
前記トルク測定部で測定された前記伝達トルクと、前記回転体の回転半径と、前記押付荷重とに基づいて、トラクション係数を算出するトラクション係数算出部を備え、
前記膜厚測定と前記トラクション係数の算出が同時に行われる
ことを特徴とする、請求項4に記載の膜厚分布測定装置。 A pressing load measuring unit for measuring a pressing load pressing the contact piece against the substrate;
A torque measuring unit disposed between the rotating body and the rotating body rotating mechanism to measure a transmission torque during rotation of the rotating body;
A traction coefficient calculation unit that calculates a traction coefficient based on the transmission torque measured by the torque measurement unit, the rotation radius of the rotating body, and the pressing load;
The film thickness distribution measuring apparatus according to claim 4, wherein the film thickness measurement and the calculation of the traction coefficient are performed simultaneously. - 前記移動機構の移動速度および前記回転体回転機構の回転速度のうち少なくとも一方の速度を制御して、前記基板と前記回転体とのすべり率を制御するすべり率制御部を備えたことを特徴とする、請求項4又は請求項5に記載の膜厚分布測定装置。 And a slip ratio control unit that controls a slip ratio between the substrate and the rotating body by controlling at least one of a moving speed of the moving mechanism and a rotating speed of the rotating body rotating mechanism. The film thickness distribution measuring apparatus according to claim 4 or 5.
- 前記荷重付与機構における前記基板側に前記接触個片を押し付ける押付荷重を制御する押付荷重制御部を備えた
ことを特徴とする、請求項1~6のいずれかに記載の膜厚分布測定装置。 7. The film thickness distribution measuring apparatus according to claim 1, further comprising a pressing load control unit that controls a pressing load that presses the contact piece against the substrate side in the load applying mechanism. - 前記基板と前記接触個片の接触部分を潤滑する潤滑剤の温度を測定する温度測定部と、
前記温度測定部で測定した前記潤滑剤の温度を記録する温度記録部を備えた
ことを特徴とする、請求項1~7のいずれかに記載の膜厚分布測定装置。 A temperature measuring unit for measuring a temperature of a lubricant that lubricates a contact portion between the substrate and the contact piece;
The film thickness distribution measuring apparatus according to any one of claims 1 to 7, further comprising a temperature recording unit that records a temperature of the lubricant measured by the temperature measuring unit.
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112068399A (en) * | 2019-06-10 | 2020-12-11 | 东京毅力科创株式会社 | Substrate inspection system, substrate inspection method, and storage medium |
CN113834428A (en) * | 2021-07-29 | 2021-12-24 | 阿里巴巴达摩院(杭州)科技有限公司 | Metal body thickness identification method and system, storage medium and electronic equipment |
TWI853368B (en) | 2022-12-13 | 2024-08-21 | 易發精機股份有限公司 | Linear scanning device for automatic optical inspection equipment |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102421732B1 (en) | 2018-04-20 | 2022-07-18 | 삼성전자주식회사 | Semiconductor substrate measuring apparatus and plasma treatment apparatus using the same |
WO2019230632A1 (en) | 2018-05-31 | 2019-12-05 | 東レ株式会社 | Liquid film thickness measurement method, measurement device, film production method |
WO2020039113A1 (en) * | 2018-08-21 | 2020-02-27 | Wärtsilä Finland Oy | Method and apparatus for plain bearing crush height measurement |
JP7288271B2 (en) * | 2018-11-29 | 2023-06-07 | 国立大学法人埼玉大学 | Film thickness distribution measuring device |
CN113607069B (en) * | 2021-10-09 | 2022-02-08 | 如东福瑞机电设备有限公司 | Lubricant film thickness measuring instrument |
WO2024047945A1 (en) * | 2022-08-31 | 2024-03-07 | 浜松ホトニクス株式会社 | Light irradiation apparatus, measuring apparatus, observation apparatus, and film thickness measuring apparatus |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007327949A (en) * | 2006-05-11 | 2007-12-20 | Nsk Ltd | Lubricant coating measurement method and apparatus |
JP2008241383A (en) * | 2007-03-27 | 2008-10-09 | Yaskawa Electric Corp | Oil film dielectric breakdown evaluation device |
JP2011185761A (en) * | 2010-03-09 | 2011-09-22 | Ntn Corp | Device for measuring traction characteristic of lubricant |
JP2012189406A (en) * | 2011-03-10 | 2012-10-04 | Technos Kk | Film thickness measuring method and film thickness measuring apparatus |
JP2013145229A (en) * | 2011-12-16 | 2013-07-25 | Toray Eng Co Ltd | Film thickness measurement method and device based on interference color model conformity |
JP2014126459A (en) * | 2012-12-26 | 2014-07-07 | National Fisheries Univ | State monitoring system of reciprocating mechanical device, and method and program thereof |
JP2015507060A (en) * | 2013-02-05 | 2015-03-05 | ケムチュア コーポレイション | Frozen oil and composition having hydrocarbon refrigerant |
-
2015
- 2015-08-27 JP JP2015167328A patent/JP2017044587A/en active Pending
-
2016
- 2016-06-30 WO PCT/JP2016/069425 patent/WO2017033567A1/en active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007327949A (en) * | 2006-05-11 | 2007-12-20 | Nsk Ltd | Lubricant coating measurement method and apparatus |
JP2008241383A (en) * | 2007-03-27 | 2008-10-09 | Yaskawa Electric Corp | Oil film dielectric breakdown evaluation device |
JP2011185761A (en) * | 2010-03-09 | 2011-09-22 | Ntn Corp | Device for measuring traction characteristic of lubricant |
JP2012189406A (en) * | 2011-03-10 | 2012-10-04 | Technos Kk | Film thickness measuring method and film thickness measuring apparatus |
JP2013145229A (en) * | 2011-12-16 | 2013-07-25 | Toray Eng Co Ltd | Film thickness measurement method and device based on interference color model conformity |
JP2014126459A (en) * | 2012-12-26 | 2014-07-07 | National Fisheries Univ | State monitoring system of reciprocating mechanical device, and method and program thereof |
JP2015507060A (en) * | 2013-02-05 | 2015-03-05 | ケムチュア コーポレイション | Frozen oil and composition having hydrocarbon refrigerant |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112068399A (en) * | 2019-06-10 | 2020-12-11 | 东京毅力科创株式会社 | Substrate inspection system, substrate inspection method, and storage medium |
CN113834428A (en) * | 2021-07-29 | 2021-12-24 | 阿里巴巴达摩院(杭州)科技有限公司 | Metal body thickness identification method and system, storage medium and electronic equipment |
CN113834428B (en) * | 2021-07-29 | 2024-05-14 | 阿里巴巴达摩院(杭州)科技有限公司 | Metal body thickness identification method, system, storage medium and electronic equipment |
TWI853368B (en) | 2022-12-13 | 2024-08-21 | 易發精機股份有限公司 | Linear scanning device for automatic optical inspection equipment |
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