TWI471555B - Optical inspection device and array test apparatus having the same - Google Patents

Optical inspection device and array test apparatus having the same Download PDF

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TWI471555B
TWI471555B TW100131243A TW100131243A TWI471555B TW I471555 B TWI471555 B TW I471555B TW 100131243 A TW100131243 A TW 100131243A TW 100131243 A TW100131243 A TW 100131243A TW I471555 B TWI471555 B TW I471555B
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light
lens
barrel
optical detecting
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TW201248139A (en
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Jun Ho Ban
Dong Hyun Jung
Young Wook Lee
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Top Eng Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513Liquid crystal panels

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
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  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
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  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)

Description

陣列測試裝置及其光學檢測單元Array test device and optical detection unit thereof

本發明係關於一種可測試並量測一玻璃面板之一光學檢測單元,以及具有該光學檢測單元之一陣列測試裝置。The present invention relates to an optical detecting unit capable of testing and measuring a glass panel, and an array testing device having the optical detecting unit.

就大眾所知,平面顯示器係一種輕薄型的影像顯示器,它比傳統使用陰極射線管的顯示器更輕、更薄。平面顯示器的種類繁多,目前已經被發展並使用的例如為液晶顯示器、電漿顯示器、場發射顯示器、有機發光二極體顯示器等。As far as the public is concerned, a flat panel display is a thin and light image display that is lighter and thinner than conventional cathode ray tube displays. A wide variety of flat panel displays have been developed and used, for example, liquid crystal displays, plasma displays, field emission displays, organic light emitting diode displays, and the like.

其中,液晶顯示器具有複數液晶單元陣列設置,並依據影像資料提供資料訊號至各液晶單元以控制各液晶單元之光線穿透率進而顯示畫面。由於其薄型化、輕量化、低耗電以及低操作電壓等優點,液晶顯示器已被廣泛的使用。在液晶顯示面板的製造過程中,需要有一檢測程序來檢驗一基板(以下皆稱為玻璃面板,其上設置有薄膜電晶體及畫素電極)是否有缺陷存在,例如檢測設置於基板之資料線或掃描線的電性連接是否良好、或是檢測畫素單元之色彩的精確度。The liquid crystal display has a plurality of liquid crystal cell arrays, and provides data signals to the liquid crystal cells according to the image data to control the light transmittance of each liquid crystal cell to display the image. Liquid crystal displays have been widely used due to their advantages of thinness, light weight, low power consumption, and low operating voltage. In the manufacturing process of the liquid crystal display panel, a detection program is required to inspect whether a substrate (hereinafter referred to as a glass panel on which a thin film transistor and a pixel electrode are provided) has defects, such as detecting a data line disposed on the substrate. Or whether the electrical connection of the scan line is good or the accuracy of the color of the pixel unit is detected.

一般係使用一陣列測試裝置來測試玻璃面板。陣列測試裝置包含複數一測試單元、一載入單元以及一卸載單元。測試單元係測試玻璃面板,載入單元係將玻璃面板載入至測試單元,卸載單元係將玻璃面板從測試單元上卸載下來。An array test device is typically used to test the glass panel. The array test apparatus includes a plurality of test units, a load unit, and an unload unit. The test unit is a test glass panel, the loading unit loads the glass panel to the test unit, and the unloading unit unloads the glass panel from the test unit.

此外,測試單元包含一光學檢測單元,其係檢測玻璃面板之外觀缺陷,例如玻璃面板上之一電路圖案之缺陷、或表面缺陷。光學檢測單元包含一光學系統以及一攝像單元,光學系統包含複數透鏡,當玻璃面板經過光學系統時,攝像單元對玻璃面板進行攝像。In addition, the test unit includes an optical detection unit that detects defects in the appearance of the glass panel, such as defects in one of the circuit patterns on the glass panel, or surface defects. The optical detecting unit comprises an optical system and an imaging unit. The optical system comprises a plurality of lenses. When the glass panel passes through the optical system, the imaging unit images the glass panel.

較佳者係光學檢測單元之光學系統的放大倍率可改變的範圍越大越好,如此玻璃面板可以在所需的解析度下來檢測。特別地,光學系統可以在一較低的放大倍率以及一較高的放大倍率將玻璃面板投影至攝像單元,好能夠在玻璃面板上找到所要檢測之部分並將其放大。為此,就需要使用一物鏡(object lens)更換方法,以更換面對玻璃面板之物鏡、或是使用一鏡筒透鏡(tube lens)更換方法,以更換位於物鏡與攝像單元之間之鏡筒透鏡。然而,上述方法需要設置一驅動單元與物鏡或鏡筒透鏡連結,且驅動單元之結構較複雜。此外,當驅動單元作動時,雜質(foreign substance)會產生並污染光學系統或玻璃面板。Preferably, the magnification of the optical system of the optical detecting unit can be changed as much as possible, so that the glass panel can be detected at a desired resolution. In particular, the optical system can project the glass panel to the camera unit at a lower magnification and a higher magnification so that the portion to be detected can be found on the glass panel and magnified. To do this, it is necessary to use an object lens replacement method to replace the objective lens facing the glass panel, or to use a tube lens replacement method to replace the lens barrel between the objective lens and the camera unit. lens. However, the above method requires a driving unit to be coupled with the objective lens or the lens barrel, and the structure of the driving unit is complicated. In addition, foreign matter can create and contaminate the optical system or glass panel when the drive unit is actuated.

有鑒於上述課題,本發明之一目的在於提供一種光學檢測單元以及一種具有光學檢測單元之陣列測試裝置,以簡化光學系統之放大倍率之一調整結構,並避免當調整光學系統之放大倍率時產生雜質,進而避免光學系統或一玻璃面板被雜質所污染。In view of the above problems, it is an object of the present invention to provide an optical detecting unit and an array testing device having an optical detecting unit to simplify the structure of one of the magnifications of the optical system and avoid generation when adjusting the magnification of the optical system. Impurities, thereby preventing the optical system or a glass panel from being contaminated by impurities.

為達上述目的,依據本發明之一種光學檢測單元包含一物鏡、複數鏡筒透鏡、一攝像單元以及一切換單元。物鏡係面對一玻璃面板設置。鏡筒透鏡具有不同放大倍率,並且從物鏡穿出之光線係進入該等鏡筒透鏡。攝像單元係攝取從該等鏡筒透鏡之其中之一穿出之光線之一影像。切換單元係選擇性地切換光路徑,使得從該物鏡穿出之光線進入所選定之一鏡筒透鏡。To achieve the above object, an optical detecting unit according to the present invention comprises an objective lens, a plurality of lens barrel lenses, an image pickup unit, and a switching unit. The objective lens is placed facing a glass panel. The barrel lenses have different magnifications, and the light that exits the objective lens enters the barrel lenses. The camera unit picks up an image of light that is passed through one of the lens barrels. The switching unit selectively switches the light path such that light exiting the objective lens enters the selected one of the lens barrels.

為達上述目的,依據本發明之一種光學檢測單元包含一物鏡、複數鏡筒透鏡、一攝像單元以及一切換單元。物鏡係面對一玻璃面板設置。鏡筒透鏡具有不同放大倍率,並且從物鏡穿出之光線係進入該等鏡筒透鏡;。攝像單元係攝取從該等鏡筒透鏡穿出之其中一光線之一影像。切換單元係選擇性地切換光路徑,使得從選定之該鏡筒透鏡穿出之光線進入該攝像單元。To achieve the above object, an optical detecting unit according to the present invention comprises an objective lens, a plurality of lens barrel lenses, an image pickup unit, and a switching unit. The objective lens is placed facing a glass panel. The lens barrel lenses have different magnifications, and the light that exits the objective lens enters the lens barrels; The camera unit picks up an image of one of the rays that are passed through the lens barrels. The switching unit selectively switches the light path such that light that exits from the selected lens barrel enters the camera unit.

在一實施例中,藉由光阻擋元件之簡單的移動作業,即可控制進入攝像單元之光線的放大倍率。因此,與習知需要更換物鏡或鏡筒透鏡來控制影像的放大倍率相比較,本發明之光學檢測單元之結構以及影像放大倍率之控制更為簡單。In one embodiment, the magnification of the light entering the camera unit can be controlled by a simple moving operation of the light blocking element. Therefore, the structure of the optical detecting unit of the present invention and the control of the image magnification are simpler than the conventional need to replace the objective lens or the lens barrel to control the magnification of the image.

此外,本發明之光學檢測單元可包含複數穿透率轉換單元,當被施加能量時,該等穿透率轉換單元係進入一第一狀態以使光線通過,而當被中止施加能量時,該等穿透率轉換單元係進入一第二狀態以阻擋光線通過。在此狀況下,藉由施加能量給選定之穿透率轉換單元並且中止施加能量給另一者,攝像單元所攝取之影像的放大倍率可輕易地得到控制。此外,本發明之光學檢測單元在攝像單元所攝取之影像的放大倍率的控制上,不需要使一構件移動之驅動元件,因而能避免由於構件移動或驅動元件之作動所產生的雜質,進而避免雜質污染光學系統或玻璃面板。Furthermore, the optical detecting unit of the present invention may comprise a plurality of transmittance conversion units that, when energized, enter a first state to pass light, and when energy is suspended, The equal transmittance conversion unit enters a second state to block the passage of light. In this case, by applying energy to the selected transmittance conversion unit and suspending the application of energy to the other, the magnification of the image taken by the camera unit can be easily controlled. In addition, the optical detecting unit of the present invention does not require a driving element for moving a member in the control of the magnification of the image taken by the image capturing unit, thereby avoiding impurities generated by the movement of the member or the actuation of the driving member, thereby avoiding Impurities contaminate optical systems or glass panels.

以下將參照相關圖式,說明依據本發明較佳實施例之一種陣列測試裝置及其光學檢測單元,其中相同的元件將以相同的參照符號加以說明。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an array test apparatus and an optical detecting unit thereof according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings, wherein the same elements will be described with the same reference numerals.

本發明較佳實施例之一種陣列測試裝置包含一基座10、一載入單元30、一測試單元20以及一卸載單元40。載入單元30係載入一玻璃面板P,測試單元20係測試載入之玻璃面板P,卸載單元40係將測試單元20所測試過之玻璃面板P從載入單元30卸載下來。An array test apparatus according to a preferred embodiment of the present invention includes a base 10, a loading unit 30, a test unit 20, and an unloading unit 40. The loading unit 30 is loaded with a glass panel P, and the testing unit 20 tests the loaded glass panel P. The unloading unit 40 unloads the glass panel P tested by the testing unit 20 from the loading unit 30.

測試單元20係測試玻璃面板P之電性缺陷,並包含一透光支撐件21、一測試模組22、一探針組件23以及一控制單元(圖未顯示)。玻璃面板P被載入單元30載入並設置於透光支撐件21上。測試模組22係測試位於透光支撐件21上之玻璃面板P是否具有電性缺陷。探針組件23施加電訊號給位於透光支撐件21上之玻璃面板P之電極。控制單元控制測試模組22與探針組件23。The test unit 20 tests the electrical defects of the glass panel P and includes a transparent support member 21, a test module 22, a probe assembly 23, and a control unit (not shown). The glass panel P is loaded by the loading unit 30 and disposed on the light-transmitting support member 21. The test module 22 tests whether the glass panel P located on the light-transmitting support member 21 has an electrical defect. The probe assembly 23 applies an electrical signal to the electrodes of the glass panel P on the light-transmissive support member 21. The control unit controls the test module 22 and the probe assembly 23.

此外,一測試模組支撐框架223設置於透光支撐件21之上,並沿一Y軸方向延伸一預設長度。測試模組22設置於測試模組支撐框架223並可沿Y軸方向移動。本實施例可包含複數測試模組22,其係設置於測試模組支撐框架223,並沿測試模組支撐框架223所延伸之方向(Y軸方向)排列。玻璃面板P位於透光支撐件21上,測試模組22設置於玻璃面板P之上並測試玻璃面板P是否具有電性缺陷。測試模組22各包含一調製器單元221以及一攝像單元222。調製器單元221接近玻璃面板P。攝像單元222對調製器單元221進行攝像。In addition, a test module support frame 223 is disposed on the light-transmitting support member 21 and extends in a Y-axis direction by a predetermined length. The test module 22 is disposed on the test module support frame 223 and movable in the Y-axis direction. The embodiment may include a plurality of test modules 22 disposed on the test module support frame 223 and arranged along a direction in which the test module support frame 223 extends (Y-axis direction). The glass panel P is located on the transparent support 21, and the test module 22 is disposed on the glass panel P and tests whether the glass panel P has electrical defects. The test modules 22 each include a modulator unit 221 and an imaging unit 222. The modulator unit 221 is close to the glass panel P. The imaging unit 222 images the modulator unit 221.

陣列測試裝置可分為反光式與透光式。在反光式的態樣中,一光源設置於測試模組21,並且一反射層(圖未顯示)設置於測試模組22之調製器單元221。因此,在光源發出光線進入調製器單元221之後,藉由量測被調製器單元221之反射層所反射之光量即可判斷玻璃面板P是否具有缺陷。The array test device can be classified into a reflective type and a light transmitting type. In the reflective mode, a light source is disposed in the test module 21, and a reflective layer (not shown) is disposed in the modulator unit 221 of the test module 22. Therefore, after the light source emits light into the modulator unit 221, it is determined whether the glass panel P has a defect by measuring the amount of light reflected by the reflective layer of the modulator unit 221.

測試單元20可分為反光式與透光式。在反光式的態樣中,一光源設置於測試模組21,並且一反射層設置於透光支撐件21。因此,在光源所發出光線被透光支撐件21之反射層所反射之後,藉由量測穿透調製器單元221之光量即可判斷玻璃面板P是否具有缺陷。在透光式的態樣中,一光源設置於透光支撐件21之下。因此,在光源發出光線之後,藉由量測穿透調製器單元221之光量即可判斷玻璃面板P是否具有缺陷。反光式或透光式的態樣皆可應用於本實施例之陣列測試裝置。The test unit 20 can be classified into a reflective type and a light transmitting type. In the reflective form, a light source is disposed in the test module 21, and a reflective layer is disposed on the light transmissive support 21. Therefore, after the light emitted from the light source is reflected by the reflective layer of the light-transmitting support member 21, it can be determined whether the glass panel P has a defect by measuring the amount of light passing through the modulator unit 221. In the light transmissive aspect, a light source is disposed under the light transmissive support member 21. Therefore, after the light source emits light, it is judged whether or not the glass panel P has a defect by measuring the amount of light passing through the modulator unit 221. Reflective or light transmissive aspects can be applied to the array test apparatus of this embodiment.

此外,測試單元20可更包含一光學檢測單元70,其係檢測玻璃面板P之外觀缺陷,例如檢測玻面板P上之一電路圖案或表面缺陷。光學檢測單元70設置於測試模組22並可隨測試模組22沿Y軸方向移動,以檢測玻璃面板P之外觀缺陷。光學檢測單元70可設置於各測試模組22、或者僅設置於一些測試模組22。In addition, the testing unit 20 may further include an optical detecting unit 70 that detects an appearance defect of the glass panel P, for example, detecting a circuit pattern or surface defect on the glass panel P. The optical detecting unit 70 is disposed in the test module 22 and can move along the Y-axis direction with the test module 22 to detect the appearance defect of the glass panel P. The optical detecting unit 70 can be disposed in each test module 22 or only in some test modules 22 .

測試模組22之調製器單元221具有一電光材料層,其可依據在玻璃面板P與調製器單元221之間之電場強度而變化反光率(在反光式態樣中)或透光率(在透光式態樣中)。電光材料層係由具有特定物理特性之材料構成,當施加電力給玻璃面板P與調製器單元221時,該材料之物理特性係隨著所產生之電場大小而變化,以致進入調製器單元221之光線的反射率或透光率產生變化。The modulator unit 221 of the test module 22 has a layer of electro-optic material which can vary the reflectance (in the reflective state) or the transmittance according to the electric field strength between the glass panel P and the modulator unit 221 (in In the light transmission pattern). The electro-optic material layer is composed of a material having specific physical properties. When power is applied to the glass panel P and the modulator unit 221, the physical properties of the material vary with the magnitude of the generated electric field, so that the modulator unit 221 is entered. The reflectance or transmittance of the light changes.

探針組件23包含一探針組件支撐框架231以及複數探針頭233。探針組件支撐框架231係沿Y軸方向延伸一預設長度。探針頭233係沿探針組件支撐框架231之長軸方向(Y軸方向)以固定間距排列。各探針頭233具有複數探針(圖未顯示)。The probe assembly 23 includes a probe assembly support frame 231 and a plurality of probe heads 233. The probe assembly support frame 231 extends a predetermined length in the Y-axis direction. The probe heads 233 are arranged at a fixed pitch along the long axis direction (Y-axis direction) of the probe assembly supporting frame 231. Each probe head 233 has a plurality of probes (not shown).

探針組件支撐框架231係與一X軸驅動單元235連結,使得探針組件支撐框架231可藉由X軸驅動單元235而沿X軸方向移動,X軸方向係與探針組件支撐框架231之長軸方向(Y軸方向)呈水平垂直。此外,一Y軸驅動單元236係設置於探針組件支撐框架231與探針頭233之間。Y軸驅動單元236係使探針頭233沿Y軸方向移動。多種線性驅動構件,例如一線性馬達、一滾珠絲杠構件(ball screw)等等,可用來作為X軸驅動單元235及/或Y軸驅動單元236。The probe assembly support frame 231 is coupled to an X-axis drive unit 235 such that the probe assembly support frame 231 can be moved in the X-axis direction by the X-axis drive unit 235, and the X-axis direction is coupled to the probe assembly support frame 231. The long axis direction (Y axis direction) is horizontal and vertical. Further, a Y-axis driving unit 236 is disposed between the probe assembly supporting frame 231 and the probe head 233. The Y-axis driving unit 236 moves the probe head 233 in the Y-axis direction. A variety of linear drive members, such as a linear motor, a ball screw, etc., can be used as the X-axis drive unit 235 and/or the Y-axis drive unit 236.

載入單元30支撐待測試之玻璃面板P並將玻璃面板P承載至測試單元20。卸載單元40支撐已測試過之玻璃面板P並從測試單元20承載玻璃面板P而使其離開陣列測試裝置。載入單元30與卸載單元40各包含複數支撐板50以及一玻璃面板輸送單元60。支撐板50係以固定間距間隔設置並支撐玻璃面板P於其上。玻璃面板輸送單元60係承載玻璃面板P。The loading unit 30 supports the glass panel P to be tested and carries the glass panel P to the test unit 20. The unloading unit 40 supports the glass panel P that has been tested and carries the glass panel P from the test unit 20 away from the array test device. The loading unit 30 and the unloading unit 40 each include a plurality of support plates 50 and a glass panel transport unit 60. The support plates 50 are disposed at regular intervals and support the glass panel P thereon. The glass panel transport unit 60 carries the glass panel P.

各支撐板50可具有複數吹氣孔51,以吹出氣體使玻璃面板懸浮。吹氣孔51連接於一氣體供應單元(圖未顯示),氣體供應單元係供應氣體至吹氣孔。Each of the support plates 50 may have a plurality of blow holes 51 to blow out the gas to suspend the glass panel. The blow hole 51 is connected to a gas supply unit (not shown), and the gas supply unit supplies a gas to the blow hole.

以下請參照圖2至圖6以說明本發明第一實施例之一種光學檢測裝置。Hereinafter, an optical detecting apparatus according to a first embodiment of the present invention will be described with reference to Figs. 2 to 6 .

如圖2與圖3所示,光學檢測單元70包含一物鏡71、一發光單元72、複數鏡筒透鏡73、一攝像單元74、一光分佈單元75、一導光單元76、一切換單元77以及一框體80。物鏡71面對玻璃面板P而設置。發光單元72提供光線至物鏡71。該等鏡筒透鏡73具有不同放大倍率並間隔設置,且設置的位置可使經過物鏡71之光線進入對應的鏡筒透鏡73。攝像單元74可對穿過任一鏡筒透鏡73之光線進行攝像。光分佈單元75設置於物鏡71與鏡筒透鏡73之間,以將經過物鏡71之光線分佈至鏡筒透鏡73。導光單元76將經過其中一鏡筒透鏡73之光線導引至攝像單元74。切換單元77可選擇性切換光路徑,使得經過物鏡71之光線只能進入一鏡筒透鏡73。框體80至少容置並支撐鏡筒透鏡73。As shown in FIG. 2 and FIG. 3 , the optical detecting unit 70 includes an objective lens 71 , an illumination unit 72 , a plurality of barrel lenses 73 , an imaging unit 74 , a light distribution unit 75 , a light guiding unit 76 , and a switching unit 77 . And a frame 80. The objective lens 71 is disposed facing the glass panel P. The light unit 72 provides light to the objective lens 71. The barrel lenses 73 have different magnifications and are spaced apart, and are disposed at positions such that light passing through the objective lens 71 enters the corresponding barrel lens 73. The imaging unit 74 can image light passing through any of the lens barrels 73. The light distribution unit 75 is disposed between the objective lens 71 and the lens barrel 73 to distribute the light passing through the objective lens 71 to the lens barrel 73. The light guiding unit 76 guides the light passing through one of the lens barrels 73 to the imaging unit 74. The switching unit 77 can selectively switch the light path such that the light passing through the objective lens 71 can only enter a barrel lens 73. The frame 80 houses and supports at least the lens barrel 73.

鏡筒透鏡73可包含一第一鏡筒透鏡731以及一第二鏡筒透鏡732,第二鏡筒透鏡732鄰設第一鏡筒透鏡731。上述第一鏡筒透鏡731以及第二鏡筒透鏡732僅為舉例說明,本發明之鏡筒透鏡73可包含三個以上之鏡筒透鏡。鏡筒透鏡73具有不同的放大倍率。各鏡筒透鏡73較佳者係具有複數光學透鏡排成一列。The barrel lens 73 may include a first barrel lens 731 and a second barrel lens 732, and the second barrel lens 732 is adjacent to the first barrel lens 731. The first barrel lens 731 and the second barrel lens 732 are merely illustrative, and the barrel lens 73 of the present invention may include three or more barrel lenses. The barrel lens 73 has a different magnification. Each of the barrel lenses 73 preferably has a plurality of optical lenses arranged in a line.

攝像單元74可包含一照相機,其具有電荷耦合元件(Charge Coupled Device,CCD)。The camera unit 74 can include a camera having a Charge Coupled Device (CCD).

光分佈單元75包含一第一半反射鏡751以及一第一反射鏡752。第一半反射鏡751設置於物鏡71與第一鏡筒透鏡731之間。第一反射鏡752鄰設第一半反射鏡751並將被第一半反射鏡751反射之光線反射至第二鏡筒透鏡732。藉此,部分光線在穿透物鏡71之後,係經由第一半反射鏡751而進入第一鏡筒透鏡731。其餘穿透物鏡71之光線係被第一半反射鏡751與第一反射鏡752反射而進入第二鏡筒透鏡732。The light distribution unit 75 includes a first half mirror 751 and a first mirror 752. The first half mirror 751 is disposed between the objective lens 71 and the first barrel lens 731. The first mirror 752 is adjacent to the first half mirror 751 and reflects the light reflected by the first half mirror 751 to the second barrel lens 732. Thereby, part of the light enters the first barrel lens 731 via the first half mirror 751 after penetrating the objective lens 71. The remaining light passing through the objective lens 71 is reflected by the first half mirror 751 and the first mirror 752 into the second barrel lens 732.

導光單元76包含一第二半反射鏡761以及一第二反射鏡762。第一半反射鏡761設置於攝像單元74與第二鏡筒透鏡732之間。第二反射鏡762鄰設第二半反射鏡761並將穿過第一鏡筒透鏡731之光線反射至第二半反射鏡761。藉此,穿過第一鏡筒透鏡731之光線係被第二反射鏡762與第二半反射鏡761反射而進入攝像單元74。穿過第二鏡筒透鏡732之光線係經由第二半反射鏡761而入攝像單元74。The light guiding unit 76 includes a second half mirror 761 and a second mirror 762. The first half mirror 761 is disposed between the imaging unit 74 and the second barrel lens 732. The second mirror 762 is adjacent to the second half mirror 761 and reflects the light passing through the first barrel lens 731 to the second half mirror 761. Thereby, the light passing through the first barrel lens 731 is reflected by the second mirror 762 and the second half mirror 761 to enter the imaging unit 74. The light that has passed through the second barrel lens 732 enters the imaging unit 74 via the second half mirror 761.

發光單元72包含一光源721、一第三反射鏡722以及一第三半反射鏡723。第三反射鏡722反射光源721所發出之光線。第三半反射鏡723係將被第三反射鏡722反射之光線反射至物鏡71。The light unit 72 includes a light source 721, a third mirror 722, and a third half mirror 723. The third mirror 722 reflects the light emitted by the light source 721. The third half mirror 723 reflects the light reflected by the third mirror 722 to the objective lens 71.

如圖2至圖4所示,切換單元77包含一光阻擋元件771以及一驅動單元772。光阻擋元件771可在物鏡71與第一鏡筒透鏡731之間之一區域以及物鏡71與第二鏡筒透鏡732之間之一區域之間來移動,以避免光線進入非選定之第一鏡筒透鏡731或第二鏡筒透鏡732。驅動單元772使光阻擋元件771移動。As shown in FIG. 2 to FIG. 4, the switching unit 77 includes a light blocking element 771 and a driving unit 772. The light blocking member 771 is movable between an area between the objective lens 71 and the first barrel lens 731 and a region between the objective lens 71 and the second barrel lens 732 to prevent light from entering the unselected first mirror The barrel lens 731 or the second barrel lens 732. The drive unit 772 moves the light blocking element 771.

細部來說,光阻擋元件771可選擇性地位於第一半反射鏡751與第一鏡筒透鏡731之間或位於第一反射鏡752與第二鏡筒透鏡732之間。因此,如圖5所示,當光阻擋元件771位於第一反射鏡752與第二鏡筒透鏡732之間時,穿過物鏡71之光線係進入第一鏡筒透鏡731但會被阻擋而無法進入第二鏡筒透鏡732。反過來說,如圖6所示,當光阻擋元件771位於第一半反射鏡751與第一鏡筒透鏡731之間時,穿過物鏡71之光線係進入第二鏡筒透鏡732但會被阻擋而無法進入第一鏡筒透鏡731。如此,光阻擋元件771之位置可被調整,使得光線只進入所選定之第一鏡筒透鏡731或第二鏡筒透鏡732,且第一鏡筒透鏡731與第二鏡筒透鏡732具有不同的放大倍率。因此,藉由調整光阻擋元件771這樣簡單的作業,可控制攝像單元74所攝之影像的放大倍率。In detail, the light blocking element 771 can be selectively located between the first half mirror 751 and the first barrel lens 731 or between the first mirror 752 and the second barrel lens 732. Therefore, as shown in FIG. 5, when the light blocking member 771 is located between the first mirror 752 and the second barrel lens 732, the light passing through the objective lens 71 enters the first barrel lens 731 but is blocked. The second lens barrel lens 732 is entered. Conversely, as shown in FIG. 6, when the light blocking member 771 is located between the first half mirror 751 and the first barrel lens 731, the light passing through the objective lens 71 enters the second barrel lens 732 but is Blocked and unable to enter the first barrel lens 731. As such, the position of the light blocking element 771 can be adjusted such that light enters only the selected first barrel lens 731 or second barrel lens 732, and the first barrel lens 731 and the second barrel lens 732 have different Magnification. Therefore, the magnification of the image captured by the image pickup unit 74 can be controlled by a simple operation of adjusting the light blocking member 771.

如圖4所示,驅動單元722包含一致動器773、一連接元件774、一移動塊775、一連接桿776以及一導軌777。致動器773設置於框體80之一外表面。一狹縫81形成於框體80之該外表面。連接元件774係穿過框體80之狹縫81並連接光阻擋元件771。移動塊775連接於連接元件774。連接桿776連接於移動塊775與致動器773之間。導軌777位於框體80之該外表面,以導引移動塊775之移動。致動器773可包含一氣壓或液壓缸體。在本發明中,因為致動器773設置於框體80外,因此即使雜質在致動器773作動中產生,雜質也無法進入框體80內。因此,可避免光路徑被雜質所污染。另外,本發明不限於上述結構,驅動單元722可具有多種變化態樣,例如線性馬達、滾珠絲杠構件等等線性驅動構件或其他可驅使光阻擋元件771線性移動者,皆可用以作為驅動單元722。As shown in FIG. 4, the driving unit 722 includes an actuator 773, a connecting member 774, a moving block 775, a connecting rod 776, and a guide rail 777. The actuator 773 is disposed on an outer surface of the frame 80. A slit 81 is formed on the outer surface of the frame 80. The connecting member 774 passes through the slit 81 of the frame 80 and is connected to the light blocking member 771. Mobile block 775 is coupled to connection element 774. A connecting rod 776 is coupled between the moving block 775 and the actuator 773. A guide rail 777 is located on the outer surface of the frame 80 to guide the movement of the moving block 775. Actuator 773 can include a pneumatic or hydraulic cylinder. In the present invention, since the actuator 773 is disposed outside the frame 80, even if impurities are generated during the actuation of the actuator 773, impurities cannot enter the frame 80. Therefore, it is possible to prevent the light path from being contaminated by impurities. In addition, the present invention is not limited to the above structure, and the driving unit 722 can have various variations, such as a linear motor, a ball screw member, or the like, or a linear driving member that can drive the light blocking member 771 to move linearly, and can be used as a driving unit. 722.

如上所述,在本發明第一實施例之光學檢測單元70中,藉由光阻擋元件771之簡單的移動作業,即可控制進入攝像單元74之光線的放大倍率。因此,與習知需要更換物鏡或鏡筒透鏡來控制影像的放大倍率相比較,本實施例之光學檢測單元70之結構以及影像放大倍率之控制更為簡單。As described above, in the optical detecting unit 70 of the first embodiment of the present invention, the magnification of the light entering the image pickup unit 74 can be controlled by the simple moving operation of the light blocking member 771. Therefore, the structure of the optical detecting unit 70 of the present embodiment and the control of the image magnification are simpler than the conventional need to replace the objective lens or the lens barrel to control the magnification of the image.

此外,在本實施例之光學檢測單元70中,驅動光阻擋元件771之驅動單元772係設置於框體80外,因此,即使雜質在驅動單元772之作動中產生,雜質亦無法進入框體80。因此,光學系統可被保護而免於被雜質污染。In addition, in the optical detecting unit 70 of the present embodiment, the driving unit 772 that drives the light blocking element 771 is disposed outside the frame 80, so that even if impurities are generated in the operation of the driving unit 772, impurities cannot enter the frame 80. . Therefore, the optical system can be protected from contamination by impurities.

以下,請參照圖7與圖8以說明本發明第二實施例之一種光學檢測單元。在本實施例中,與第一實施例相同的構件係使用與第一實施例相同的標號,並且就不加以詳細說明。Hereinafter, please refer to FIG. 7 and FIG. 8 for explaining an optical detecting unit according to a second embodiment of the present invention. In the present embodiment, the same members as those of the first embodiment are given the same reference numerals as those of the first embodiment, and will not be described in detail.

如圖7與圖8所示,光學檢測單元70包含一物鏡71、一發光單元72、複數鏡筒透鏡73、一攝像單元74、一光分佈單元75、一導光單元76、一切換單元77以及一框體80。物鏡71面對玻璃面板P而設置。發光單元72提供光線至物鏡71。該等鏡筒透鏡73具有不同放大倍率並間隔設置,且設置的位置可使經過物鏡71之光線進入對應的鏡筒透鏡73。攝像單元74可對穿過任一鏡筒透鏡73之光線進行攝像。光分佈單元75設置於物鏡71與鏡筒透鏡73之間,以將經過物鏡71之光線分佈至鏡筒透鏡73。導光單元76將經過其中一鏡筒透鏡73之光線導引至攝像單元74。切換單元77可選擇性切換光路徑,使得僅有穿過該等鏡筒透鏡73之其中之一的光線進入攝像單元74。框體80至少容置並支撐鏡筒透鏡73。As shown in FIG. 7 and FIG. 8 , the optical detecting unit 70 includes an objective lens 71 , an illumination unit 72 , a plurality of barrel lenses 73 , an imaging unit 74 , a light distribution unit 75 , a light guiding unit 76 , and a switching unit 77 . And a frame 80. The objective lens 71 is disposed facing the glass panel P. The light unit 72 provides light to the objective lens 71. The barrel lenses 73 have different magnifications and are spaced apart, and are disposed at positions such that light passing through the objective lens 71 enters the corresponding barrel lens 73. The imaging unit 74 can image light passing through any of the lens barrels 73. The light distribution unit 75 is disposed between the objective lens 71 and the lens barrel 73 to distribute the light passing through the objective lens 71 to the lens barrel 73. The light guiding unit 76 guides the light passing through one of the lens barrels 73 to the imaging unit 74. The switching unit 77 can selectively switch the light paths such that only light passing through one of the lens barrels 73 enters the imaging unit 74. The frame 80 houses and supports at least the lens barrel 73.

鏡筒透鏡73可包含一第一鏡筒透鏡731以及一第二鏡筒透鏡732,第二鏡筒透鏡732鄰設第一鏡筒透鏡731。上述第一鏡筒透鏡731以及第二鏡筒透鏡732僅為舉例說明,本發明之鏡筒透鏡73可包含三個以上之鏡筒透鏡。The barrel lens 73 may include a first barrel lens 731 and a second barrel lens 732, and the second barrel lens 732 is adjacent to the first barrel lens 731. The first barrel lens 731 and the second barrel lens 732 are merely illustrative, and the barrel lens 73 of the present invention may include three or more barrel lenses.

切換單元77包含一光阻擋元件771以及一驅動單元772。光阻擋元件771可在攝像單元74與第一鏡筒透鏡731之間的區域以及攝像單元74與第二鏡筒透鏡732之間的區域之間滑動,使得僅從選定之第一鏡筒透鏡731或第二鏡筒透鏡732穿出之光線進入攝像單元74。驅動單元772使光阻擋元件771移動。The switching unit 77 includes a light blocking element 771 and a driving unit 772. The light blocking member 771 is slidable between a region between the image pickup unit 74 and the first barrel lens 731 and a region between the image pickup unit 74 and the second barrel lens 732 such that only the selected first lens barrel 731 is selected. Or the light that the second barrel lens 732 passes out enters the imaging unit 74. The drive unit 772 moves the light blocking element 771.

細部來說,光阻擋元件771可選擇性地位於第二半反射鏡761與第二鏡筒透鏡732之間或位於第二反射鏡762與第一鏡筒透鏡731之間。因此,如圖7所示,當光阻擋元件771位於第二反射鏡762與第一鏡筒透鏡731之間時,穿過第二鏡筒透鏡732之光線係進入攝像單元74,但穿過第一鏡筒透鏡731之光線會被阻擋而無法進入攝像單元74。反過來說,如圖8所示,當光阻擋元件771位於第二半反射鏡761與第二鏡筒透鏡732之間時,穿過第一鏡筒透鏡731之光線係進入攝像單元74,但穿過第二鏡筒透鏡732之光線會被阻擋而無法進入攝像單元74。如此,光阻擋元件771之位置可被調整,使得僅有所選定之從第一鏡筒透鏡731穿出之光線、或從第二鏡筒透鏡732穿出之光線能進入攝像單元74,並且第一鏡筒透鏡731與第二鏡筒透鏡732具有不同的放大倍率。因此,藉由調整光阻擋元件771這樣簡單的作業,可控制攝像單元74所攝之影像的放大倍率。In detail, the light blocking element 771 can be selectively located between the second half mirror 761 and the second barrel lens 732 or between the second mirror 762 and the first barrel lens 731. Therefore, as shown in FIG. 7, when the light blocking member 771 is located between the second mirror 762 and the first barrel lens 731, the light passing through the second barrel lens 732 enters the imaging unit 74, but passes through the The light of one of the barrel lenses 731 is blocked from entering the image pickup unit 74. Conversely, as shown in FIG. 8, when the light blocking member 771 is located between the second half mirror 761 and the second barrel lens 732, the light passing through the first barrel lens 731 enters the imaging unit 74, but Light passing through the second barrel lens 732 is blocked from entering the imaging unit 74. As such, the position of the light blocking member 771 can be adjusted such that only the light that is selected to pass through the first barrel lens 731 or the light that is emitted from the second barrel lens 732 can enter the imaging unit 74, and A barrel lens 731 and a second barrel lens 732 have different magnifications. Therefore, the magnification of the image captured by the image pickup unit 74 can be controlled by a simple operation of adjusting the light blocking member 771.

第二實施例之驅動單元772可與第一實施例相同。The driving unit 772 of the second embodiment can be the same as the first embodiment.

如上所述,在本實施例之光學檢測單元70中,藉由調整光阻擋元件771這樣簡單的作業,可控制進入攝像單元74之光線的放大倍率。因此,與習知需要更換物鏡或鏡筒透鏡來控制影像的放大倍率相比較,本實施例之光學檢測單元70之結構以及影像放大倍率之控制更為簡單。As described above, in the optical detecting unit 70 of the present embodiment, the magnification of the light entering the imaging unit 74 can be controlled by a simple operation of adjusting the light blocking member 771. Therefore, the structure of the optical detecting unit 70 of the present embodiment and the control of the image magnification are simpler than the conventional need to replace the objective lens or the lens barrel to control the magnification of the image.

以下,請參照圖9至圖11以說明本發明第三實施例之一種光學檢測單元。在本實施例中,與第一實施例或第二實施例相同的構件係使用相同的標號,並且就不加以詳細說明。Hereinafter, an optical detecting unit according to a third embodiment of the present invention will be described with reference to FIGS. 9 to 11. In the present embodiment, the same members as those of the first embodiment or the second embodiment are given the same reference numerals and will not be described in detail.

如圖9所示,本實施例之光學檢測單元70包含一物鏡71、一發光單元72、複數鏡筒透鏡73、一攝像單元74、一光分佈單元75、一導光單元76以及一切換單元90。物鏡71面對玻璃面板P而設置。發光單元72提供光線至物鏡71。該等鏡筒透鏡73具有不同放大倍率並間隔設置,且設置的位置可使經過物鏡71之光線進入對應的鏡筒透鏡73。攝像單元74可對穿過任一鏡筒透鏡73之光線進行攝像。光分佈單元75設置於物鏡71與鏡筒透鏡73之間,以將經過物鏡71之光線分佈至鏡筒透鏡73。導光單元76將經過其中一鏡筒透鏡73之光線導引至攝像單元74。切換單元90可選擇性切換光路徑,使得經過物鏡71之光線一次只能進入其中一鏡筒透鏡73。As shown in FIG. 9 , the optical detecting unit 70 of the present embodiment includes an objective lens 71 , an illumination unit 72 , a plurality of barrel lenses 73 , an imaging unit 74 , a light distribution unit 75 , a light guiding unit 76 , and a switching unit . 90. The objective lens 71 is disposed facing the glass panel P. The light unit 72 provides light to the objective lens 71. The barrel lenses 73 have different magnifications and are spaced apart, and are disposed at positions such that light passing through the objective lens 71 enters the corresponding barrel lens 73. The imaging unit 74 can image light passing through any of the lens barrels 73. The light distribution unit 75 is disposed between the objective lens 71 and the lens barrel 73 to distribute the light passing through the objective lens 71 to the lens barrel 73. The light guiding unit 76 guides the light passing through one of the lens barrels 73 to the imaging unit 74. The switching unit 90 can selectively switch the light path such that the light passing through the objective lens 71 can enter only one of the lens barrels 73 at a time.

鏡筒透鏡73可包含一第一鏡筒透鏡731以及一第二鏡筒透鏡732,第二鏡筒透鏡732鄰設第一鏡筒透鏡731。上述第一鏡筒透鏡731以及第二鏡筒透鏡732僅為舉例說明,本發明之鏡筒透鏡73可包含三個以上之鏡筒透鏡。The barrel lens 73 may include a first barrel lens 731 and a second barrel lens 732, and the second barrel lens 732 is adjacent to the first barrel lens 731. The first barrel lens 731 and the second barrel lens 732 are merely illustrative, and the barrel lens 73 of the present invention may include three or more barrel lenses.

切換單元90可包含複數穿透率轉換單元91、92,穿透率轉換單元91、92分別對應一鏡筒透鏡73設置。細部來說,在本實施例中,切換單元90包含一第一穿透率轉換單元91、一第二穿透率轉換單元92以及一能量施加單元93。第一穿透率轉換單元91設置於第一半反射鏡751與第一鏡筒透鏡731之間,第二穿透率轉換單元92設置於第一反射鏡752與第二鏡筒透鏡732之間,能量施加單元93可選擇性地施加能量給第一穿透率轉換單元91與第二穿透率轉換單元92。The switching unit 90 may include a plurality of transmittance conversion units 91, 92 that are respectively disposed corresponding to a barrel lens 73. In detail, in the embodiment, the switching unit 90 includes a first transmittance conversion unit 91, a second transmittance conversion unit 92, and an energy application unit 93. The first transmittance conversion unit 91 is disposed between the first half mirror 751 and the first barrel lens 731 , and the second transmittance conversion unit 92 is disposed between the first mirror 752 and the second barrel lens 732 . The energy application unit 93 can selectively apply energy to the first transmittance conversion unit 91 and the second transmittance conversion unit 92.

能量施加單元93包含一能量供應器931、一連接線932以及一切換器933。連接線932係將能量供應器931連接至第一穿透率轉換單元91與第二穿透率轉換單元92。切換器933設置於連接線932並可選擇性地施加能量給第一穿透率轉換單元91與第二穿透率轉換單元92。The energy application unit 93 includes an energy supply 931, a connection line 932, and a switch 933. The connection line 932 connects the energy supply 931 to the first transmittance conversion unit 91 and the second transmittance conversion unit 92. The switch 933 is disposed on the connection line 932 and can selectively apply energy to the first transmittance conversion unit 91 and the second transmittance conversion unit 92.

如圖10與圖11所示,第一穿透率轉換單元91與第二穿透率轉換單元92各包含一對玻璃基板97、一穿透率轉換元件99以及一電極層98。穿透率轉換元件99設置於二玻璃面板97之間。二電極層98分別設置於穿透率轉換元件99與玻璃基板97之間。穿透率轉換元件99可包含一高分子分散液晶(polymer dispersed liquid crystal,PDLC)。高分子分散液晶係均勻分佈於一高分子基質(polymer matrix)中。As shown in FIGS. 10 and 11, the first transmittance conversion unit 91 and the second transmittance conversion unit 92 each include a pair of glass substrates 97, a transmittance conversion element 99, and an electrode layer 98. The transmittance conversion element 99 is disposed between the two glass panels 97. The two electrode layers 98 are respectively disposed between the transmittance conversion element 99 and the glass substrate 97. The transmittance conversion element 99 may comprise a polymer dispersed liquid crystal (PDLC). The polymer dispersed liquid crystal system is uniformly distributed in a polymer matrix.

如圖11所示,在穿透率轉換元件99中,當能量施加給電極層98時,液晶藉由電場的作用而沿一方向轉向,該方向係對應高分子基質之折射率的排列。藉此穿透率轉換元件99係進入一第一狀態,該第一狀態係使含有一物體形狀之光線穿過穿透率轉換元件99。如圖10所示,當能量中止施加給電極層98,穿透率轉換元件99係進入一第二狀態,該第二狀態係避免光線穿過穿透率轉換元件99。As shown in FIG. 11, in the transmittance conversion element 99, when energy is applied to the electrode layer 98, the liquid crystal is steered in one direction by the action of an electric field corresponding to the arrangement of the refractive indices of the polymer matrix. Thereby, the transmittance conversion element 99 enters a first state which causes light containing an object shape to pass through the transmittance conversion element 99. As shown in FIG. 10, when energy is applied to the electrode layer 98, the transmittance conversion element 99 enters a second state that prevents light from passing through the transmittance conversion element 99.

此外,各穿透率轉換單元91、92使用高分子分散液晶作為穿透率轉換元件99僅為舉例說明,並非用以限制本發明。舉例而言,一液晶亦可使用作為穿透率轉換元件99。Further, the use of the polymer-dispersed liquid crystal as the transmittance conversion element 99 for each of the transmittance conversion units 91 and 92 is merely illustrative and is not intended to limit the present invention. For example, a liquid crystal can also be used as the transmittance conversion element 99.

此外,各穿透率轉換單元91、92可有多種結構上的變化態樣,例如液晶可為KDP(KH2PO4)、ADP(NH4H2PO4)、BSO(Bi12SiO20)、BTO(Bi12TiO20)或LiNbO3。並且光線之穿透與否可依據一些特定條件,例如能量的施加或一電場的形成。In addition, each of the transmittance conversion units 91, 92 may have various structural variations, for example, the liquid crystal may be KDP (KH2PO4), ADP (NH4H2PO4), BSO (Bi12SiO20), BTO (Bi12TiO20) or LiNbO3. And the penetration of light can be based on certain specific conditions, such as the application of energy or the formation of an electric field.

因此,當第一穿透率轉換單元91藉由施加能量而進入第一狀態並且第二穿透率轉換單元92藉由中止施加能量而進入第二狀態時,已穿過物鏡71之光線係進入第一鏡筒透鏡731,但會被阻擋而無法進入第二鏡筒透鏡732。在此狀況下,光路徑係如圖9之路徑A所示。反過來說,當第一穿透率轉換單元91藉由中止施加能量而進入第二狀態並且第二穿透率轉換單元92藉由施加能量而進入第一狀態時,已穿過物鏡71之光線係進入第二鏡筒透鏡732,但會被阻擋而無法進入第一鏡筒透鏡731。在此狀況下,光路徑係如圖9之路徑B所示。Therefore, when the first transmittance conversion unit 91 enters the first state by applying energy and the second transmittance conversion unit 92 enters the second state by suspending the application of energy, the light that has passed through the objective lens 71 enters The first barrel lens 731 is blocked but cannot enter the second barrel lens 732. In this case, the optical path is as shown by path A of FIG. Conversely, when the first transmittance conversion unit 91 enters the second state by suspending the application of energy and the second transmittance conversion unit 92 enters the first state by applying energy, the light that has passed through the objective lens 71 It enters the second barrel lens 732 but is blocked from entering the first barrel lens 731. In this case, the optical path is as shown by path B in FIG.

如上所述,在本實施例之光學檢測單元70中,藉由施加能量給第一或第二穿透率轉換單元91或92並且中止施加能量給另一者,可使得光線進入所選定之第一鏡筒透鏡731或第二鏡筒透鏡732,其中第一鏡筒透鏡731與第二鏡筒透鏡732具有不同的放大倍率。因此,攝像單元74所攝取的影像之放大倍率可輕易地得到控制。As described above, in the optical detecting unit 70 of the present embodiment, by applying energy to the first or second transmittance conversion unit 91 or 92 and suspending the application of energy to the other, the light can be made to enter the selected first A barrel lens 731 or a second barrel lens 732, wherein the first barrel lens 731 and the second barrel lens 732 have different magnifications. Therefore, the magnification of the image taken by the image pickup unit 74 can be easily controlled.

此外,本實施例之光學檢測單元70在攝像單元74所攝取之影像的放大倍率的控制上,不需要使一構件移動之驅動元件,因而能避免由於構件移動或驅動元件之作動所產生的雜質,進而避免雜質污染光學系統或玻璃面板P。In addition, the optical detecting unit 70 of the present embodiment does not require a driving element for moving a member in the control of the magnification of the image taken by the imaging unit 74, thereby avoiding impurities generated by the movement of the member or the actuation of the driving member. In order to avoid contamination of the optical system or the glass panel P by impurities.

以下,請參照圖12以說明本發明第四實施例之一種光學檢測單元。在本實施例中,與第一、第二或第三實施例相同的構件係使用相同的標號,並且就不加以詳細說明。Hereinafter, please refer to FIG. 12 to explain an optical detecting unit according to a fourth embodiment of the present invention. In the present embodiment, the same members as those of the first, second or third embodiment are given the same reference numerals and will not be described in detail.

如圖12所示,本實施例之光學檢測單元70包含一物鏡71、一發光單元72、複數鏡筒透鏡73、一攝像單元74、一光分佈單元75、一導光單元76以及一切換單元90。物鏡71面對玻璃面板P而設置。發光單元72提供光線至物鏡71。該等鏡筒透鏡73具有不同放大倍率並間隔設置,且設置的位置可使經過物鏡71之光線進入對應的鏡筒透鏡73。攝像單元74可對穿過任一鏡筒透鏡73之光線進行攝像。光分佈單元75設置於物鏡71與鏡筒透鏡73之間,以將經過物鏡71之光線分佈至鏡筒透鏡73。導光單元76將經過其中一鏡筒透鏡73之光線導引至攝像單元74。切換單元90可選擇性切換光路徑,使得僅有穿過該等鏡筒透鏡73之其中之一的光線進入攝像單元74。As shown in FIG. 12, the optical detecting unit 70 of the present embodiment includes an objective lens 71, an illumination unit 72, a plurality of barrel lenses 73, an imaging unit 74, a light distribution unit 75, a light guiding unit 76, and a switching unit. 90. The objective lens 71 is disposed facing the glass panel P. The light unit 72 provides light to the objective lens 71. The barrel lenses 73 have different magnifications and are spaced apart, and are disposed at positions such that light passing through the objective lens 71 enters the corresponding barrel lens 73. The imaging unit 74 can image light passing through any of the lens barrels 73. The light distribution unit 75 is disposed between the objective lens 71 and the lens barrel 73 to distribute the light passing through the objective lens 71 to the lens barrel 73. The light guiding unit 76 guides the light passing through one of the lens barrels 73 to the imaging unit 74. The switching unit 90 can selectively switch the light path such that only light passing through one of the lens barrels 73 enters the imaging unit 74.

鏡筒透鏡73可包含一第一鏡筒透鏡731以及一第二鏡筒透鏡732,第二鏡筒透鏡732鄰設第一鏡筒透鏡731。上述第一鏡筒透鏡731以及第二鏡筒透鏡732僅為舉例說明,本發明之鏡筒透鏡73可包含三個以上之鏡筒透鏡。The barrel lens 73 may include a first barrel lens 731 and a second barrel lens 732, and the second barrel lens 732 is adjacent to the first barrel lens 731. The first barrel lens 731 and the second barrel lens 732 are merely illustrative, and the barrel lens 73 of the present invention may include three or more barrel lenses.

切換單元90可包含複數穿透率轉換單元91、92,穿透率轉換單元91、92分別對應一鏡筒透鏡73設置。細部來說,在本實施例中,切換單元90包含一第一穿透率轉換單元91、一第二穿透率轉換單元92以及一能量施加單元93。第一穿透率轉換單元91設置於第二反射鏡762與第一鏡筒透鏡731之間,第二穿透率轉換單元92設置於第二半反射鏡761與第二鏡筒透鏡732之間,能量施加單元93可選擇性地施加能量給第一穿透率轉換單元91與第二穿透率轉換單元92。第一穿透率轉換單元91、第二穿透率轉換單元92與能量施加單元93係與第三實施例相同。The switching unit 90 may include a plurality of transmittance conversion units 91, 92 that are respectively disposed corresponding to a barrel lens 73. In detail, in the embodiment, the switching unit 90 includes a first transmittance conversion unit 91, a second transmittance conversion unit 92, and an energy application unit 93. The first transmittance conversion unit 91 is disposed between the second mirror 762 and the first barrel lens 731 , and the second transmittance conversion unit 92 is disposed between the second half mirror 761 and the second barrel lens 732 . The energy application unit 93 can selectively apply energy to the first transmittance conversion unit 91 and the second transmittance conversion unit 92. The first transmittance conversion unit 91, the second transmittance conversion unit 92, and the energy application unit 93 are the same as the third embodiment.

因此,當第一穿透率轉換單元91藉由施加能量而進入第一狀態並且第二穿透率轉換單元92藉由中止施加能量而進入第二狀態時,已穿過第一鏡筒透鏡731之光線係進入攝像單元74,但穿過第二鏡筒透鏡732之光線係被阻擋而無法進入攝像單元74。在此狀況下,光路徑係如圖12之路徑A所示。反過來說,當第一穿透率轉換單元91藉由中止施加能量而進入第二狀態並且第二穿透率轉換單元92藉由施加能量而進入第一狀態時,已穿過第二鏡筒透鏡732之光線係進入攝像單元74,但穿過第一鏡筒透鏡731之光線係被阻擋而無法進入攝像單元74。在此狀況下,光路徑係如圖12之路徑B所示。Therefore, when the first transmittance conversion unit 91 enters the first state by applying energy and the second transmittance conversion unit 92 enters the second state by suspending the application of energy, the first lens barrel 731 has passed through. The light enters the imaging unit 74, but the light passing through the second barrel lens 732 is blocked from entering the imaging unit 74. In this case, the optical path is as shown by path A of FIG. Conversely, when the first transmittance conversion unit 91 enters the second state by suspending the application of energy and the second transmittance conversion unit 92 enters the first state by applying energy, it has passed through the second lens barrel. The light of the lens 732 enters the imaging unit 74, but the light passing through the first barrel lens 731 is blocked from entering the imaging unit 74. In this case, the optical path is as shown by path B in FIG.

如上所述,在本實施例之光學檢測單元70中,藉由施加能量給第一或第二穿透率轉換單元91或92並且中止施加能量給另一者,可使得僅有從選定之第一鏡筒透鏡731或第二鏡筒透鏡732穿出之光線能夠進入攝像單元74,其中第一鏡筒透鏡731與第二鏡筒透鏡732具有不同的放大倍率。因此,攝像單元74所攝取的影像之放大倍率可輕易地得到控制。As described above, in the optical detecting unit 70 of the present embodiment, by applying energy to the first or second transmittance conversion unit 91 or 92 and suspending the application of energy to the other, it is possible to make only the selected one The light that is passed through the one of the barrel lens 731 or the second barrel lens 732 can enter the imaging unit 74, wherein the first barrel lens 731 and the second barrel lens 732 have different magnifications. Therefore, the magnification of the image taken by the image pickup unit 74 can be easily controlled.

此外,本實施例之光學檢測單元70在攝像單元74所攝取之影像的放大倍率的控制上,不需要使一構件移動之驅動元件,因而能避免由於構件移動或驅動元件之作動所產生的雜質,進而避免雜質污染光學系統或玻璃面板P。In addition, the optical detecting unit 70 of the present embodiment does not require a driving element for moving a member in the control of the magnification of the image taken by the imaging unit 74, thereby avoiding impurities generated by the movement of the member or the actuation of the driving member. In order to avoid contamination of the optical system or the glass panel P by impurities.

本發明所有實施例之技術特徵可單獨實施或合併實施。此外,本發明之光學檢測單元可應用於多種裝置,例如液晶顯示裝置之玻璃面板之測試裝置、或半導體基板之測試裝置。The technical features of all embodiments of the present invention may be implemented separately or in combination. Further, the optical detecting unit of the present invention can be applied to various devices such as a test device for a glass panel of a liquid crystal display device or a test device for a semiconductor substrate.

以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.

10...基座10. . . Pedestal

20...測試單元20. . . Test unit

21...透光支撐件twenty one. . . Light-transmitting support

22...測試模組twenty two. . . Test module

221...調製器單元221. . . Modulator unit

222...攝像單元222. . . Camera unit

223...測試模組支撐框架223. . . Test module support frame

23...探針組件twenty three. . . Probe assembly

231...探針組件支撐框架231. . . Probe assembly support frame

233...探針頭233. . . Probe head

235...X軸驅動單元235. . . X-axis drive unit

236...Y軸驅動單元236. . . Y-axis drive unit

30...載入單元30. . . Loading unit

40...卸載單元40. . . Unloading unit

50...支撐板50. . . Support plate

51...吹氣孔51. . . Blow hole

60...玻璃面板輸送單元60. . . Glass panel transport unit

70...光學檢測單元70. . . Optical detection unit

71...物鏡71. . . Objective lens

72...發光單元72. . . Light unit

721...光源721. . . light source

722...第三反射鏡722. . . Third mirror

723...第三半反射鏡723. . . Third half mirror

73...鏡筒透鏡73. . . Barrel lens

731...第一鏡筒透鏡731. . . First barrel lens

732...第二鏡筒透鏡732. . . Second barrel lens

74...攝像單元74. . . Camera unit

75...光分佈單元75. . . Light distribution unit

751...第一半反射鏡751. . . First half mirror

752...第一反射鏡752. . . First mirror

76...導光單元76. . . Light guide unit

761...第二半反射鏡761. . . Second half mirror

762...第二反射鏡762. . . Second mirror

77...切換單元77. . . Switching unit

771...光阻擋元件771. . . Light blocking element

772...驅動單元772. . . Drive unit

773...致動器773. . . Actuator

774...連接元件774. . . Connecting element

775...移動塊775. . . Moving block

776...連接桿776. . . Connecting rod

777...導軌777. . . guide

80...框體80. . . framework

81...狹縫81. . . Slit

90...切換單元90. . . Switching unit

91...第一穿透率轉換單元91. . . First transmittance conversion unit

92...第二穿透率轉換單元92. . . Second transmittance conversion unit

93...能量施加單元93. . . Energy application unit

931...能量供應器931. . . Energy supply

932...連接線932. . . Cable

933...切換器933. . . Switcher

97...玻璃基板97. . . glass substrate

99...穿透率轉換元件99. . . Transmission rate conversion element

98...電極層98. . . Electrode layer

A...路徑A. . . path

B...路徑B. . . path

P...玻璃面板P. . . Glass panel

圖1為本發明較佳實施例之一種具有一光學檢測單元之陣列測試裝置的立體示意圖;1 is a perspective view of an array test apparatus having an optical detecting unit according to a preferred embodiment of the present invention;

圖2為本發明第一實施例之一種光學檢測單元的立體示意圖;2 is a perspective view of an optical detecting unit according to a first embodiment of the present invention;

圖3為圖2所示之光學檢測單元的示意圖;Figure 3 is a schematic view of the optical detecting unit shown in Figure 2;

圖4為圖2所示之光學檢測單元之一切換單元的示意圖;4 is a schematic diagram of a switching unit of one of the optical detecting units shown in FIG. 2;

圖5與圖6為圖2所示之光學檢測單元的作動示意圖;5 and FIG. 6 are schematic diagrams showing the operation of the optical detecting unit shown in FIG. 2;

圖7與圖8為本發明第二實施例之一種光學檢測單元的示意圖;7 and FIG. 8 are schematic diagrams showing an optical detecting unit according to a second embodiment of the present invention;

圖9為本發明第三實施例之一種光學檢測單元的示意圖;FIG. 9 is a schematic diagram of an optical detecting unit according to a third embodiment of the present invention; FIG.

圖10與圖11為圖9所示之光學檢測單元之一穿透率轉換單元的示意圖;以及10 and FIG. 11 are schematic diagrams showing a transmittance conversion unit of the optical detecting unit shown in FIG. 9;

圖12為本發明第四實施例之一種光學檢測單元的示意圖。FIG. 12 is a schematic diagram of an optical detecting unit according to a fourth embodiment of the present invention.

70...光學檢測單元70. . . Optical detection unit

71...物鏡71. . . Objective lens

72...發光單元72. . . Light unit

721...光源721. . . light source

722...第三反射鏡722. . . Third mirror

723...第三半反射鏡723. . . Third half mirror

73...鏡筒透鏡73. . . Barrel lens

731...第一鏡筒透鏡731. . . First barrel lens

732...第二鏡筒透鏡732. . . Second barrel lens

74...攝像單元74. . . Camera unit

75...光分佈單元75. . . Light distribution unit

751...第一半反射鏡751. . . First half mirror

752...第一反射鏡752. . . First mirror

76...導光單元76. . . Light guide unit

761...第二半反射鏡761. . . Second half mirror

762...第二反射鏡762. . . Second mirror

771...光阻擋元件771. . . Light blocking element

80...框體80. . . framework

P...玻璃面板P. . . Glass panel

Claims (9)

一種光學檢測單元,包含:一物鏡,係面對一玻璃面板設置;複數鏡筒透鏡,具有不同放大倍率,並且從物鏡穿出之光線係進入該等鏡筒透鏡;一攝像單元,係攝取從該等鏡筒透鏡之其中之一穿出之光線之一影像;以及一切換單元,係選擇性地切換光路徑,使得從該物鏡穿出之光線進入所選定之一鏡筒透鏡。An optical detecting unit comprises: an objective lens disposed facing a glass panel; a plurality of lens barrels having different magnifications, and the light passing through the objective lens enters the lens barrel; and an imaging unit is taken from An image of one of the light passing through one of the lens barrels; and a switching unit that selectively switches the light path such that light exiting the objective lens enters the selected one of the lens barrels. 如申請專利範圍第1項所述之光學檢測單元,其中該切換單元包含:一光阻擋元件,係可在該物鏡與該等鏡筒透鏡之間移動,並阻擋從該物鏡穿出之光線進入非選定之一鏡筒透鏡;以及一驅動單元,使該光阻擋元件移動。The optical detecting unit of claim 1, wherein the switching unit comprises: a light blocking member movable between the objective lens and the lens barrel and blocking light entering from the objective lens One of the lens barrels is not selected; and a driving unit moves the light blocking element. 如申請專利範圍第2項所述之光學檢測單元,其中該驅動單元包含:一致動器,設置於一框體之一外表面上,該框體容置該等鏡筒透鏡;一連接元件,係穿過該框體之該外表面之一狹縫,並與該光阻擋元件連接;一移動塊,連接於該連接元件;以及一連接桿,將該移動塊連接於該致動器。The optical detecting unit of claim 2, wherein the driving unit comprises: an actuator disposed on an outer surface of a frame, the frame receiving the lens barrel; a connecting component, Passing through a slit of the outer surface of the frame and connecting with the light blocking member; a moving block connected to the connecting member; and a connecting rod connecting the moving block to the actuator. 如申請專利範圍第1項所述之光學檢測單元,其中該切換單元包含:複數穿透率轉換單元,設置於該物鏡與該等鏡筒透鏡之間,並分別位於光線進入該等鏡筒透鏡之路徑上,當被施加能量時,該等穿透率轉換單元係進入一第一狀態以使光線通過,而當被中止施加能量時,該等穿透率轉換單元係進入一第二狀態以阻擋光線通過;以及一能量施加單元,選擇性地施加能量給所選定之該穿透率轉換單元。The optical detecting unit of claim 1, wherein the switching unit comprises: a plurality of transmittance conversion units disposed between the objective lens and the lens barrels, and respectively located in the light entering the lens barrels In the path, when the energy is applied, the transmittance conversion units enter a first state to pass the light, and when the energy is suspended, the transmittance conversion units enter a second state to Blocking light passage; and an energy application unit selectively applying energy to the selected transmittance conversion unit. 一種光學檢測單元,包含:一物鏡,係面對一玻璃面板設置;複數鏡筒透鏡,具有不同放大倍率,並且從物鏡穿出之光線係進入該等鏡筒透鏡;一攝像單元,係攝取從該等鏡筒透鏡穿出之其中一光線之一影像;以及一切換單元,係選擇性地切換光路徑,使得從所選定之該鏡筒透鏡穿出之光線進入該攝像單元。An optical detecting unit comprises: an objective lens disposed facing a glass panel; a plurality of lens barrels having different magnifications, and the light passing through the objective lens enters the lens barrel; and an imaging unit is taken from The lens lens passes through one of the light rays; and a switching unit selectively switches the light path such that light from the selected lens barrel enters the camera unit. 如申請專利範圍第5項所述之光學檢測單元,其中該切換單元包含:一光阻擋元件,係可在該等鏡筒透鏡與該攝像單元之間移動,並阻擋從非選定之該鏡筒透鏡穿出之光線進入該攝像單元;以及一驅動單元,使該光阻擋元件移動。The optical detecting unit of claim 5, wherein the switching unit comprises: a light blocking member movable between the lens barrel and the camera unit, and blocking the lens from being unselected The light that the lens passes out enters the camera unit; and a driving unit moves the light blocking element. 如申請專利範圍第6項所述之光學檢測單元,其中該驅動單元包含:一致動器,設置於一框體之一外表面上,該框體容置該等鏡筒透鏡;一連接元件,係穿過該框體之該外表面之一狹縫,並與該光阻擋元件連接;一移動塊,連接於該連接元件;以及一連接桿,將該移動塊連接於該致動器。The optical detecting unit of claim 6, wherein the driving unit comprises: an actuator disposed on an outer surface of a frame, the frame receiving the lens barrel; a connecting component, Passing through a slit of the outer surface of the frame and connecting with the light blocking member; a moving block connected to the connecting member; and a connecting rod connecting the moving block to the actuator. 如申請專利範圍第5項所述之光學檢測單元,其中該切換單元包含:複數穿透率轉換單元,設置於該等鏡筒透鏡與該攝像單元之間,並分別位於光線從等鏡筒透鏡穿出之路徑上,當被施加能量時,該等穿透率轉換單元係進入一第一狀態以使光線通過,而當被中止施加能量時,該等穿透率轉換單元係進入一第二狀態以阻擋光線通過;以及一能量施加單元,選擇性地施加能量給所選定之該穿透率轉換單元。The optical detecting unit of claim 5, wherein the switching unit comprises: a plurality of transmittance conversion units disposed between the lens barrels and the imaging unit, and respectively located in the light from the equal lens barrel In the path of the penetration, when the energy is applied, the transmittance conversion units enter a first state to pass the light, and when the energy is suspended, the transmittance conversion units enter a second a state to block light passage; and an energy application unit to selectively apply energy to the selected transmittance conversion unit. 一種陣列測試裝置,包含:一測試模組,係面對一玻璃面板設置,以測試該玻璃面板之缺陷,並且該測試模組包含如申請專利範圍第1項至第8項任一項所述之光學檢測單元。An array test apparatus comprising: a test module disposed facing a glass panel to test defects of the glass panel, and the test module comprises the method of any one of claims 1 to 8 Optical detection unit.
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Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9164043B2 (en) 2012-12-10 2015-10-20 Shenzhen China Star Optoelectronics Technology Co., Ltd. Detecting method and detecting device
CN102980897A (en) * 2012-12-10 2013-03-20 深圳市华星光电技术有限公司 Detection method and detection device
TWI498545B (en) * 2013-10-30 2015-09-01 Utechzone Co Ltd Optical inspection machine
US9291826B2 (en) * 2013-11-20 2016-03-22 Christie Digital Systems Usa, Inc. System for variable distribution of light to a plurality of projectors
CN108593259B (en) * 2018-03-26 2023-12-22 镇江市建设工程质量检测中心有限公司 Door and window daylighting performance check out test set
KR102011417B1 (en) * 2018-06-04 2019-08-16 주식회사 옵티바이오 Triple magnification type machine vision inspection module
KR102644919B1 (en) * 2021-10-12 2024-03-07 한국광기술원 Display Panel Inspection System and inspection method thereof
KR102534342B1 (en) 2022-09-07 2023-05-26 주식회사 다솔솔루션 Optical inspection device including a light blocking member for easy exchange
CN116678340B (en) * 2023-07-28 2023-12-12 华能澜沧江水电股份有限公司 Tension wire measuring device and control method thereof

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070216896A1 (en) * 2006-03-14 2007-09-20 Hitachi High-Technologies Corporation Defect inspecting apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3363703B2 (en) * 1996-05-16 2003-01-08 株式会社ミツトヨ Optical measuring device
US6813071B2 (en) * 2001-03-23 2004-11-02 Olympus Optical Co., Ltd. Inverted microscope
CN100416333C (en) * 2004-03-31 2008-09-03 奥林巴斯株式会社 Observing device and fluorescent light observing device
KR20060106256A (en) * 2005-04-07 2006-10-12 범광기전(주) Apparatus for obtaining image
JP2007085978A (en) * 2005-09-26 2007-04-05 Shimadzu Corp Microspectro system
JP4825172B2 (en) * 2007-06-08 2011-11-30 株式会社新川 Imaging apparatus for bonding apparatus and imaging method
JP4825171B2 (en) * 2007-06-08 2011-11-30 株式会社新川 Imaging apparatus for bonding apparatus and imaging method
KR100945206B1 (en) * 2008-04-10 2010-03-03 주식회사 에이치앤씨 Optical mesurement apparatus and inspection apparatus including the same
CN201471840U (en) * 2009-08-10 2010-05-19 深圳市网印巨星机电设备有限公司 Light curing machine and shutter device thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070216896A1 (en) * 2006-03-14 2007-09-20 Hitachi High-Technologies Corporation Defect inspecting apparatus

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